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WO2009001602A1 - Gas-filled capillary and sample placement method - Google Patents

Gas-filled capillary and sample placement method Download PDF

Info

Publication number
WO2009001602A1
WO2009001602A1 PCT/JP2008/057067 JP2008057067W WO2009001602A1 WO 2009001602 A1 WO2009001602 A1 WO 2009001602A1 JP 2008057067 W JP2008057067 W JP 2008057067W WO 2009001602 A1 WO2009001602 A1 WO 2009001602A1
Authority
WO
WIPO (PCT)
Prior art keywords
gas
tubular section
section
capillary
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/057067
Other languages
French (fr)
Japanese (ja)
Inventor
Noriyuki Imayoshi
Kenji Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SAI Corp
Original Assignee
SAI Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SAI Corp filed Critical SAI Corp
Priority to JP2009520387A priority Critical patent/JP4521788B2/en
Publication of WO2009001602A1 publication Critical patent/WO2009001602A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

A capillary (10) includes a tubular section (12) having open opposite ends and also includes a hole section (14) having an opening. The hole section (14) is provided at one end of the tubular section (12). A continuous hole (32) is formed leading from the opening of the hole section (14) to the inside of the tubular section (12). In the capillary (10), a sample (56) can be easily placed into the tubular section (12) by introducing gas into the capillary (10) from the opening (22) of the hole section (14) with the other end of the tubular section (12) closed by a gas pervious member (38). Preferably, the hole section (14) should be constructed so that it can be directly attached to a Gonio head. In the capillary (10),introducing the gas from the one end side of the tubular section (12) produces a gas flow moving from the one end to the other end of the tubular section (12), and the gas flow moves the sample to the other end side of the tubular section (12) and places the sample in place.
PCT/JP2008/057067 2007-06-25 2008-04-10 Gas-filled capillary and sample placement method Ceased WO2009001602A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009520387A JP4521788B2 (en) 2007-06-25 2008-04-10 Gas-filled capillary and sample filling method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-165741 2007-06-25
JP2007165741 2007-06-25

Publications (1)

Publication Number Publication Date
WO2009001602A1 true WO2009001602A1 (en) 2008-12-31

Family

ID=40185425

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/057067 Ceased WO2009001602A1 (en) 2007-06-25 2008-04-10 Gas-filled capillary and sample placement method

Country Status (2)

Country Link
JP (1) JP4521788B2 (en)
WO (1) WO2009001602A1 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020105716A1 (en) * 2018-11-21 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis device and method, and sample holder therefor
WO2020105727A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Sample holder unit for single-crystal x-ray structural analysis devices
WO2020105726A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis device sample holder, sample holder unit, and occlusion method
WO2020105728A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Sample holder unit for single-crystal x-ray structural analysis devices
WO2020105718A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis system
CN111948238A (en) * 2020-09-08 2020-11-17 天津大学 A kind of sealing tube for protecting air-sensitive samples, preparation method and application thereof

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7135582B2 (en) * 2018-02-19 2022-09-13 住友金属鉱山株式会社 Capillary holder and X-ray diffraction measurement method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6363966A (en) * 1986-09-04 1988-03-22 Akifumi Yamada Method for measuring concentration of chloride using silver hexacyanoferrate (iii)
JP2002277356A (en) * 2001-03-21 2002-09-25 Sumitomo Chem Co Ltd Method of introducing sample into glass capillary and method of preparing measurement sample for differential scanning calorimeter
JP2005291817A (en) * 2004-03-31 2005-10-20 Rigaku Corp Fine sample inserting container, fine sample mounting fixture, x-ray diffraction device, method for forming fine sample inserting container and fine sample mounting method
JP2006500377A (en) * 2002-06-21 2006-01-05 トランスフォーム・ファーマシューティカルズ・インコーポレイテッド Pharmaceutical composition having improved solubility

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6363966A (en) * 1986-09-04 1988-03-22 Akifumi Yamada Method for measuring concentration of chloride using silver hexacyanoferrate (iii)
JP2002277356A (en) * 2001-03-21 2002-09-25 Sumitomo Chem Co Ltd Method of introducing sample into glass capillary and method of preparing measurement sample for differential scanning calorimeter
JP2006500377A (en) * 2002-06-21 2006-01-05 トランスフォーム・ファーマシューティカルズ・インコーポレイテッド Pharmaceutical composition having improved solubility
JP2005291817A (en) * 2004-03-31 2005-10-20 Rigaku Corp Fine sample inserting container, fine sample mounting fixture, x-ray diffraction device, method for forming fine sample inserting container and fine sample mounting method

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020105716A1 (en) * 2018-11-21 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis device and method, and sample holder therefor
CN113056669A (en) * 2018-11-21 2021-06-29 株式会社理学 Single crystal X-ray structure analysis device and method, and sample holder used for the same
WO2020105728A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Sample holder unit for single-crystal x-ray structural analysis devices
WO2020105726A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis device sample holder, sample holder unit, and occlusion method
WO2020105718A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis system
WO2020105727A1 (en) * 2018-11-22 2020-05-28 株式会社リガク Sample holder unit for single-crystal x-ray structural analysis devices
JPWO2020105726A1 (en) * 2018-11-22 2021-10-07 株式会社リガク Sample holder for single crystal X-ray structure analyzer, sample holder unit and occlusion method
JPWO2020105728A1 (en) * 2018-11-22 2021-10-07 株式会社リガク Sample holder unit for single crystal X-ray structure analyzer
JPWO2020105727A1 (en) * 2018-11-22 2021-10-07 株式会社リガク Sample holder unit for single crystal X-ray structure analyzer
JP7278528B2 (en) 2018-11-22 2023-05-22 株式会社リガク Sample holder unit for single crystal X-ray structure analysis equipment
JP7278527B2 (en) 2018-11-22 2023-05-22 株式会社リガク Sample holder unit for single crystal X-ray structure analysis equipment
JP7462164B2 (en) 2018-11-22 2024-04-05 株式会社リガク Sample holder for single crystal X-ray structure analysis apparatus, sample holder unit, and storage method
CN111948238A (en) * 2020-09-08 2020-11-17 天津大学 A kind of sealing tube for protecting air-sensitive samples, preparation method and application thereof

Also Published As

Publication number Publication date
JP4521788B2 (en) 2010-08-11
JPWO2009001602A1 (en) 2010-08-26

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