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WO2009001519A1 - メモリコントローラ、不揮発性記憶装置、アクセス装置、及び不揮発性記憶システム - Google Patents

メモリコントローラ、不揮発性記憶装置、アクセス装置、及び不揮発性記憶システム Download PDF

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Publication number
WO2009001519A1
WO2009001519A1 PCT/JP2008/001501 JP2008001501W WO2009001519A1 WO 2009001519 A1 WO2009001519 A1 WO 2009001519A1 JP 2008001501 W JP2008001501 W JP 2008001501W WO 2009001519 A1 WO2009001519 A1 WO 2009001519A1
Authority
WO
WIPO (PCT)
Prior art keywords
mode
nonvolatile storage
service life
write
memory controller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/001501
Other languages
English (en)
French (fr)
Inventor
Masahiro Nakanishi
Takuji Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Panasonic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp filed Critical Panasonic Corp
Priority to JP2009520299A priority Critical patent/JPWO2009001519A1/ja
Priority to US12/527,882 priority patent/US20110264842A1/en
Publication of WO2009001519A1 publication Critical patent/WO2009001519A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)

Abstract

　寿命パラメータ生成部１２８が不揮発性記憶装置１１０の寿命に係る寿命パラメータを生成する。寿命時期が近くなると、モード切替部１２９が読み書き制御部１２４の読み書きモードをリライタブルモードからライトワンスモードに切り替えるとともに、アクセス装置１００にライトワンスモードに切り替わったことを通知する。こうすれば不揮発性メモリを内蔵した機器が使用できなくなる時期を簡便にユーザが認識でき、しかも寿命が尽きる直前で書き込みが一度しかできないライトワンスモードに自動的に切り換えることができる。
PCT/JP2008/001501 2007-06-22 2008-06-12 メモリコントローラ、不揮発性記憶装置、アクセス装置、及び不揮発性記憶システム Ceased WO2009001519A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009520299A JPWO2009001519A1 (ja) 2007-06-22 2008-06-12 メモリコントローラ、不揮発性記憶装置、アクセス装置、及び不揮発性記憶システム
US12/527,882 US20110264842A1 (en) 2007-06-22 2008-06-12 Memory controller, nonvolatile memory device, access device, and nonvolatile memory system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-165384 2007-06-22
JP2007165384 2007-06-22

Publications (1)

Publication Number Publication Date
WO2009001519A1 true WO2009001519A1 (ja) 2008-12-31

Family

ID=40185346

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/001501 Ceased WO2009001519A1 (ja) 2007-06-22 2008-06-12 メモリコントローラ、不揮発性記憶装置、アクセス装置、及び不揮発性記憶システム

Country Status (3)

Country Link
US (1) US20110264842A1 (ja)
JP (1) JPWO2009001519A1 (ja)
WO (1) WO2009001519A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110176017A1 (en) * 2010-01-15 2011-07-21 Canon Kabushiki Kaisha Data recording apparatus and control method thereof
US8625968B2 (en) 2010-02-03 2014-01-07 Canon Kabushiki Kaisha Recording apparatus and control method thereof
US8730348B2 (en) 2010-02-03 2014-05-20 Canon Kabushiki Kaisha Recording apparatus and control method thereof
CN103890724A (zh) * 2011-08-19 2014-06-25 株式会社东芝 信息处理设备、用于控制信息处理设备的方法、存储控制工具的非临时记录介质、主机装置、存储性能评估工具的非临时记录介质、以及用于外部存储装置的性能评估方法
US9064579B2 (en) 2012-07-16 2015-06-23 Kabushiki Kaisha Toshiba Semiconductor memory apparatus, data transmission device, and recording method
WO2016117026A1 (ja) * 2015-01-20 2016-07-28 株式会社日立製作所 ストレージシステム

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8327066B2 (en) 2008-09-30 2012-12-04 Samsung Electronics Co., Ltd. Method of managing a solid state drive, associated systems and implementations
JP5455689B2 (ja) * 2010-02-03 2014-03-26 キヤノン株式会社 記録装置及び方法
JP5002719B1 (ja) 2011-03-10 2012-08-15 株式会社東芝 情報処理装置、外部記憶装置、ホスト装置、中継装置、制御プログラム及び情報処理装置の制御方法
US8638600B2 (en) 2011-04-22 2014-01-28 Hewlett-Packard Development Company, L.P. Random-access memory with dynamically adjustable endurance and retention
US20120272036A1 (en) * 2011-04-22 2012-10-25 Naveen Muralimanohar Adaptive memory system
US9317211B2 (en) * 2014-05-02 2016-04-19 Avago Technologies General Ip (Singapore) Pte. Ltd. System and method of life management for low endurance SSD NAND devices used as secondary cache
JP2018097817A (ja) * 2016-12-16 2018-06-21 富士通株式会社 情報処理装置、情報処理方法及びプログラム
JP2018106791A (ja) 2016-12-28 2018-07-05 東芝メモリ株式会社 抵抗変化型メモリ装置の制御方法
US10318416B2 (en) * 2017-05-18 2019-06-11 Nxp B.V. Method and system for implementing a non-volatile counter using non-volatile memory
CN113467703B (zh) * 2020-03-31 2024-06-14 杭州海康存储科技有限公司 存储介质的管理方法、装置及设备
JP2022143789A (ja) 2021-03-18 2022-10-03 株式会社東芝 磁気ディスク装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001291394A (ja) * 2000-03-31 2001-10-19 Sharp Corp 半導体記憶装置およびその救済方法
JP2004348332A (ja) * 2003-05-21 2004-12-09 Matsushita Electric Ind Co Ltd コンピュータ装置、当該コンピュータ装置を備える部品実装装置、記憶装置の寿命診断方法、及びハードディスクドライブユニットの寿命診断用プログラム
JP2008015769A (ja) * 2006-07-05 2008-01-24 Hitachi Ltd ストレージシステム及び書き込み分散方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7778077B2 (en) * 2006-05-15 2010-08-17 Sandisk Corporation Non-volatile memory system with end of life calculation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001291394A (ja) * 2000-03-31 2001-10-19 Sharp Corp 半導体記憶装置およびその救済方法
JP2004348332A (ja) * 2003-05-21 2004-12-09 Matsushita Electric Ind Co Ltd コンピュータ装置、当該コンピュータ装置を備える部品実装装置、記憶装置の寿命診断方法、及びハードディスクドライブユニットの寿命診断用プログラム
JP2008015769A (ja) * 2006-07-05 2008-01-24 Hitachi Ltd ストレージシステム及び書き込み分散方法

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110176017A1 (en) * 2010-01-15 2011-07-21 Canon Kabushiki Kaisha Data recording apparatus and control method thereof
US8711240B2 (en) * 2010-01-15 2014-04-29 Canon Kabushiki Kaisha Data recording apparatus with recording control based on defect block and control method thereof
US8625968B2 (en) 2010-02-03 2014-01-07 Canon Kabushiki Kaisha Recording apparatus and control method thereof
US8730348B2 (en) 2010-02-03 2014-05-20 Canon Kabushiki Kaisha Recording apparatus and control method thereof
CN103890724A (zh) * 2011-08-19 2014-06-25 株式会社东芝 信息处理设备、用于控制信息处理设备的方法、存储控制工具的非临时记录介质、主机装置、存储性能评估工具的非临时记录介质、以及用于外部存储装置的性能评估方法
US9064579B2 (en) 2012-07-16 2015-06-23 Kabushiki Kaisha Toshiba Semiconductor memory apparatus, data transmission device, and recording method
US9412457B2 (en) 2012-07-16 2016-08-09 Kabushiki Kaisha Toshiba Semiconductor memory apparatus, data transmission device, and recording method
WO2016117026A1 (ja) * 2015-01-20 2016-07-28 株式会社日立製作所 ストレージシステム
JPWO2016117026A1 (ja) * 2015-01-20 2017-08-24 株式会社日立製作所 ストレージシステム

Also Published As

Publication number Publication date
US20110264842A1 (en) 2011-10-27
JPWO2009001519A1 (ja) 2010-08-26

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