WO2009078124A1 - エピタキシャル成長方法 - Google Patents
エピタキシャル成長方法 Download PDFInfo
- Publication number
- WO2009078124A1 WO2009078124A1 PCT/JP2008/003359 JP2008003359W WO2009078124A1 WO 2009078124 A1 WO2009078124 A1 WO 2009078124A1 JP 2008003359 W JP2008003359 W JP 2008003359W WO 2009078124 A1 WO2009078124 A1 WO 2009078124A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- reaction chamber
- growth method
- crystal substrate
- upper wall
- epitaxial growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/08—Reaction chambers; Selection of materials therefor
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020107012967A KR101526895B1 (ko) | 2007-12-14 | 2008-11-18 | 에피텍셜 성장방법 |
| DE112008003330.7T DE112008003330B4 (de) | 2007-12-14 | 2008-11-18 | Epitaktisches Wachstumsverfahren |
| US12/743,976 US8038793B2 (en) | 2007-12-14 | 2008-11-18 | Epitaxial growth method |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007322814A JP5029340B2 (ja) | 2007-12-14 | 2007-12-14 | エピタキシャル成長方法 |
| JP2007-322814 | 2007-12-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2009078124A1 true WO2009078124A1 (ja) | 2009-06-25 |
Family
ID=40795248
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/003359 Ceased WO2009078124A1 (ja) | 2007-12-14 | 2008-11-18 | エピタキシャル成長方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8038793B2 (ja) |
| JP (1) | JP5029340B2 (ja) |
| KR (1) | KR101526895B1 (ja) |
| DE (1) | DE112008003330B4 (ja) |
| TW (1) | TWI445053B (ja) |
| WO (1) | WO2009078124A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI706446B (zh) * | 2017-12-25 | 2020-10-01 | 日商Sumco股份有限公司 | 磊晶成長裝置及使用此裝置的半導體磊晶晶圓的製造方法 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008034260B4 (de) | 2008-07-16 | 2014-06-26 | Siltronic Ag | Verfahren zum Abscheiden einer Schicht auf einer Halbleiterscheibe mittels CVD in einer Kammer und Kammer zum Abscheiden einer Schicht auf einer Halbleiterscheibe mittels CVD |
| JP6052070B2 (ja) * | 2013-06-17 | 2016-12-27 | 株式会社Sumco | エピタキシャルウェーハの製造方法及びその製造装置 |
| DE102016225137A1 (de) | 2016-12-15 | 2018-06-21 | Siltronic Ag | Vorrichtung und Verfahren zum Abscheiden einer von Prozessgas stammenden Materialschicht auf einer Substratscheibe |
| CN110277304A (zh) * | 2018-03-14 | 2019-09-24 | 胜高股份有限公司 | 外延晶片的制造方法及其制造装置 |
| CN109273378B (zh) * | 2018-09-20 | 2021-11-02 | 长江存储科技有限责任公司 | 平衡晶圆弯曲度分布的方法 |
| US12084770B2 (en) * | 2020-08-18 | 2024-09-10 | Globalwafers Co., Ltd. | Window for chemical vapor deposition systems and related methods |
| US20240254654A1 (en) * | 2023-01-26 | 2024-08-01 | Applied Materials, Inc. | Epi isolation plate with gap and angle adjustment for process tuning |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001044125A (ja) * | 1999-07-29 | 2001-02-16 | Applied Materials Inc | エピタキシャル成長装置及び方法 |
| JP2001512901A (ja) * | 1997-08-06 | 2001-08-28 | アプライド マテリアルズ インコーポレイテッド | 大気圧又は大気圧以上で応力が減少したドーム型ウェハリアクタ容器窓 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4322592A (en) * | 1980-08-22 | 1982-03-30 | Rca Corporation | Susceptor for heating semiconductor substrates |
| JP2714802B2 (ja) * | 1988-03-18 | 1998-02-16 | 三菱化学株式会社 | 有機金属化学気相反応装置 |
-
2007
- 2007-12-14 JP JP2007322814A patent/JP5029340B2/ja active Active
-
2008
- 2008-11-18 WO PCT/JP2008/003359 patent/WO2009078124A1/ja not_active Ceased
- 2008-11-18 DE DE112008003330.7T patent/DE112008003330B4/de active Active
- 2008-11-18 US US12/743,976 patent/US8038793B2/en active Active
- 2008-11-18 KR KR1020107012967A patent/KR101526895B1/ko active Active
- 2008-11-24 TW TW097145390A patent/TWI445053B/zh active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001512901A (ja) * | 1997-08-06 | 2001-08-28 | アプライド マテリアルズ インコーポレイテッド | 大気圧又は大気圧以上で応力が減少したドーム型ウェハリアクタ容器窓 |
| JP2001044125A (ja) * | 1999-07-29 | 2001-02-16 | Applied Materials Inc | エピタキシャル成長装置及び方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI706446B (zh) * | 2017-12-25 | 2020-10-01 | 日商Sumco股份有限公司 | 磊晶成長裝置及使用此裝置的半導體磊晶晶圓的製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE112008003330B4 (de) | 2017-11-30 |
| TWI445053B (zh) | 2014-07-11 |
| KR101526895B1 (ko) | 2015-06-08 |
| DE112008003330T5 (de) | 2010-12-02 |
| TW200947520A (en) | 2009-11-16 |
| KR20100093563A (ko) | 2010-08-25 |
| JP2009147105A (ja) | 2009-07-02 |
| US8038793B2 (en) | 2011-10-18 |
| JP5029340B2 (ja) | 2012-09-19 |
| US20100251958A1 (en) | 2010-10-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2009078124A1 (ja) | エピタキシャル成長方法 | |
| US20140113439A1 (en) | Method of depositing an amorphous silicon film | |
| TW200802552A (en) | Method of manufacturing epitaxial silicon wafer and apparatus thereof | |
| WO2012118947A3 (en) | Apparatus and process for atomic layer deposition | |
| WO2007021692A3 (en) | Method and apparatus to control semiconductor film deposition characteristics | |
| WO2008085474A3 (en) | Delivery device for thin film deposition | |
| TW200802547A (en) | Selective deposition | |
| WO2009114764A3 (en) | Floating sheet production apparatus and method | |
| WO2010039363A3 (en) | Methods for forming silicon nitride based film or silicon carbon based film | |
| WO2009043777A3 (de) | Verfahren zur herstellung eines leichtblechs | |
| WO2012134092A3 (en) | Method of manufacturing single crystal ingot, and single crystal ingot and wafer manufactured thereby | |
| WO2008154446A3 (en) | An apparatus for depositing a uniform silicon film and methods for manufacturing the same | |
| WO2011156657A3 (en) | High productivity thin film deposition method and system | |
| WO2007047888A3 (en) | Method and apparatus for converting precursor layers into photovoltaic absorbers | |
| WO2009117565A3 (en) | Method and apparatus of a substrate etching system and process | |
| TW200733196A (en) | Vaporizer, semiconductor manufacturing apparatus and manufacturing method thereof | |
| WO2009005825A8 (en) | Methods for fabricating thin film iii-v compound solar cell | |
| WO2013003522A3 (en) | Semiconductor substrate and method of forming | |
| MY159272A (en) | Silicon thin film solar cell having improved haze and methods of making the same | |
| WO2013019425A3 (en) | Sputter-etch tool and liners | |
| WO2008055067A3 (en) | Method and apparatus for forming a silicon wafer | |
| WO2008155992A1 (ja) | 水素分離装置及びその製造方法 | |
| TW200723365A (en) | Method for producing III-N layers, and III-N layers or III-N substrates, and devices based thereon | |
| WO2008090701A1 (ja) | マイクロチップの製造方法、及びマイクロチップ基板の接合装置 | |
| WO2020112537A8 (en) | Methods for forming asymmetric glass laminates using separation powder and laminates made therefrom |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 08861388 Country of ref document: EP Kind code of ref document: A1 |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 12743976 Country of ref document: US |
|
| ENP | Entry into the national phase |
Ref document number: 20107012967 Country of ref document: KR Kind code of ref document: A |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 1120080033307 Country of ref document: DE |
|
| RET | De translation (de og part 6b) |
Ref document number: 112008003330 Country of ref document: DE Date of ref document: 20101202 Kind code of ref document: P |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 08861388 Country of ref document: EP Kind code of ref document: A1 |