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WO2009054042A1 - 光または放射線検出器およびそれを製造する方法 - Google Patents

光または放射線検出器およびそれを製造する方法 Download PDF

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Publication number
WO2009054042A1
WO2009054042A1 PCT/JP2007/070609 JP2007070609W WO2009054042A1 WO 2009054042 A1 WO2009054042 A1 WO 2009054042A1 JP 2007070609 W JP2007070609 W JP 2007070609W WO 2009054042 A1 WO2009054042 A1 WO 2009054042A1
Authority
WO
WIPO (PCT)
Prior art keywords
resistance
light
radiation detector
mold structure
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/070609
Other languages
English (en)
French (fr)
Inventor
Toshinori Yoshimuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to US12/738,315 priority Critical patent/US8357909B2/en
Priority to AT07830343T priority patent/ATE537467T1/de
Priority to JP2009537846A priority patent/JP4569712B2/ja
Priority to EP07830343A priority patent/EP2209021B1/en
Priority to HRP20100286AA priority patent/HRP20100286B1/hr
Priority to PCT/JP2007/070609 priority patent/WO2009054042A1/ja
Priority to CN2007800535033A priority patent/CN101688919B/zh
Publication of WO2009054042A1 publication Critical patent/WO2009054042A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/804—Containers or encapsulations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10—Methods of surface bonding and/or assembly therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

　この発明の放射線検出器は、変換層と電圧印加電極とを保護するためのモールド構造の抵抗が、そのモールド構造の（光または放射線の）入射面側に積層形成された面状の導電性の緩衝材からなる第１部材の抵抗よりも大きく、かつ、上述した第１部材の抵抗が、第１部材の入射面側に積層形成された面状の導電性の部材からなる第２部材の抵抗よりも大きくなるように、モールド構造、第１部材および第２部材をそれぞれ構成しているので、静電気によるノイズの発生を抑えることができる。
PCT/JP2007/070609 2007-10-23 2007-10-23 光または放射線検出器およびそれを製造する方法 Ceased WO2009054042A1 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
US12/738,315 US8357909B2 (en) 2007-10-23 2007-10-23 Light or radiation detector and method of manufacturing the same
AT07830343T ATE537467T1 (de) 2007-10-23 2007-10-23 Licht- oder strahlungsdetektor und verfahren zu seiner herstellung
JP2009537846A JP4569712B2 (ja) 2007-10-23 2007-10-23 光または放射線検出器およびそれを製造する方法
EP07830343A EP2209021B1 (en) 2007-10-23 2007-10-23 Light or radiation detector, and method for manufacturing the same
HRP20100286AA HRP20100286B1 (hr) 2007-10-23 2007-10-23 Detektor svjetla ili radijacije i metoda za njegovu proizvodnju
PCT/JP2007/070609 WO2009054042A1 (ja) 2007-10-23 2007-10-23 光または放射線検出器およびそれを製造する方法
CN2007800535033A CN101688919B (zh) 2007-10-23 2007-10-23 光或放射线检测器及其制造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/070609 WO2009054042A1 (ja) 2007-10-23 2007-10-23 光または放射線検出器およびそれを製造する方法

Publications (1)

Publication Number Publication Date
WO2009054042A1 true WO2009054042A1 (ja) 2009-04-30

Family

ID=40579152

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/070609 Ceased WO2009054042A1 (ja) 2007-10-23 2007-10-23 光または放射線検出器およびそれを製造する方法

Country Status (7)

Country Link
US (1) US8357909B2 (ja)
EP (1) EP2209021B1 (ja)
JP (1) JP4569712B2 (ja)
CN (1) CN101688919B (ja)
AT (1) ATE537467T1 (ja)
HR (1) HRP20100286B1 (ja)
WO (1) WO2009054042A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013088325A (ja) * 2011-10-19 2013-05-13 Fujifilm Corp 放射線画像撮影装置
JP2018004570A (ja) * 2016-07-07 2018-01-11 キヤノン株式会社 放射線検出装置及び放射線検出システム
JP2020098709A (ja) * 2018-12-18 2020-06-25 キヤノン株式会社 検出器

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010070759A1 (ja) * 2008-12-18 2010-06-24 株式会社島津製作所 光マトリックスデバイスの製造方法
US10481280B2 (en) * 2016-07-07 2019-11-19 Canon Kabushiki Kaisha Radiation detecting apparatus, radiation detecting system, and manufacturing method for radiation detecting apparatus

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003046075A (ja) 2001-04-23 2003-02-14 Toshiba Corp Ｘ線平面検出器
JP2004268271A (ja) 2003-03-05 2004-09-30 Brother Ind Ltd 記録媒体カセット
JP2005241334A (ja) 2004-02-25 2005-09-08 Shimadzu Corp 放射線検出装置
JP2005268271A (ja) * 2004-03-16 2005-09-29 Shimadzu Corp 光または放射線用二次元検出器
JP2007139604A (ja) * 2005-11-18 2007-06-07 Konica Minolta Medical & Graphic Inc 放射線用シンチレータプレート

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3737343B2 (ja) * 1999-09-08 2006-01-18 シャープ株式会社 二次元画像検出器
US6681992B2 (en) * 2000-08-03 2004-01-27 Tomomi Iihama Image reading apparatus
JP3678162B2 (ja) * 2001-04-12 2005-08-03 株式会社島津製作所 放射線検出装置
JP3932857B2 (ja) * 2001-10-22 2007-06-20 株式会社島津製作所 放射線検出装置
JP4211435B2 (ja) * 2002-08-30 2009-01-21 株式会社島津製作所 放射線検出器
US20050184244A1 (en) * 2004-02-25 2005-08-25 Shimadzu Corporation Radiation detector and light or radiation detector

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003046075A (ja) 2001-04-23 2003-02-14 Toshiba Corp Ｘ線平面検出器
JP2004268271A (ja) 2003-03-05 2004-09-30 Brother Ind Ltd 記録媒体カセット
JP2005241334A (ja) 2004-02-25 2005-09-08 Shimadzu Corp 放射線検出装置
JP2005268271A (ja) * 2004-03-16 2005-09-29 Shimadzu Corp 光または放射線用二次元検出器
JP2007139604A (ja) * 2005-11-18 2007-06-07 Konica Minolta Medical & Graphic Inc 放射線用シンチレータプレート

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013088325A (ja) * 2011-10-19 2013-05-13 Fujifilm Corp 放射線画像撮影装置
JP2018004570A (ja) * 2016-07-07 2018-01-11 キヤノン株式会社 放射線検出装置及び放射線検出システム
JP2020098709A (ja) * 2018-12-18 2020-06-25 キヤノン株式会社 検出器
JP7292868B2 (ja) 2018-12-18 2023-06-19 キヤノン株式会社 検出器

Also Published As

Publication number Publication date
EP2209021A1 (en) 2010-07-21
EP2209021A4 (en) 2011-02-16
CN101688919B (zh) 2012-10-17
HRP20100286A2 (hr) 2010-09-30
ATE537467T1 (de) 2011-12-15
JP4569712B2 (ja) 2010-10-27
EP2209021B1 (en) 2011-12-14
CN101688919A (zh) 2010-03-31
JPWO2009054042A1 (ja) 2011-03-03
US20100243893A1 (en) 2010-09-30
HRP20100286B1 (hr) 2013-03-31
US8357909B2 (en) 2013-01-22

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