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WO2008102872A1 - カラムオーブン二重温調 - Google Patents

カラムオーブン二重温調 Download PDF

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Publication number
WO2008102872A1
WO2008102872A1 PCT/JP2008/053068 JP2008053068W WO2008102872A1 WO 2008102872 A1 WO2008102872 A1 WO 2008102872A1 JP 2008053068 W JP2008053068 W JP 2008053068W WO 2008102872 A1 WO2008102872 A1 WO 2008102872A1
Authority
WO
WIPO (PCT)
Prior art keywords
temperature
chamber
inner chamber
outer chamber
column oven
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/053068
Other languages
English (en)
French (fr)
Inventor
Toru Satoh
Tadanori Sugimoto
Minoru Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tosoh Corp
Original Assignee
Tosoh Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tosoh Corp filed Critical Tosoh Corp
Priority to KR1020097017353A priority Critical patent/KR101415277B1/ko
Priority to US12/528,220 priority patent/US8319155B2/en
Priority to JP2009500248A priority patent/JP5040990B2/ja
Priority to EP08711839.4A priority patent/EP2113768B1/en
Priority to CN2008800059046A priority patent/CN101622535B/zh
Publication of WO2008102872A1 publication Critical patent/WO2008102872A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/26—Conditioning of the fluid carrier; Flow patterns
    • G01N30/28—Control of physical parameters of the fluid carrier
    • G01N30/30—Control of physical parameters of the fluid carrier of temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/26—Conditioning of the fluid carrier; Flow patterns
    • G01N30/38—Flow patterns
    • G01N30/46—Flow patterns using more than one column
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/74—Optical detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/26—Conditioning of the fluid carrier; Flow patterns
    • G01N30/28—Control of physical parameters of the fluid carrier
    • G01N30/30—Control of physical parameters of the fluid carrier of temperature
    • G01N2030/3084—Control of physical parameters of the fluid carrier of temperature ovens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/50—Conditioning of the sorbent material or stationary liquid
    • G01N30/52—Physical parameters
    • G01N30/54—Temperature

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Electric Stoves And Ranges (AREA)

Abstract

　本発明の解決すべき課題は装置の置かれた環境温度変化に関わらず、きわめて高い温度安定性を維持することのできるカラムオーブンを提供することにある。 　外室１２と、該外室１２内に配置された内室１４と、を有し、前記内室１４内にカラム１６が配置されるカラムオーブン１０であって、 前記外室内にはヒーター１８と、該ヒーター１８により熱せられた空気を循環する外室ファン２０と、外室内温度を検出する外室温度センサー２２とが備えられ、 前記内室１４内には内室ファン２４と、内室内温度を検出する内室温度センサー２６が備えられ、 前記内室外壁は、外室内壁と離隔しており、 前記内室温度センサー２６の検出温度に基づき外室内温度の目標温度が設定され、外室温度センサー２２の検出温度によりヒーター１８の通電制御を行う温度制御器２８が設けられていることを特徴とするカラムオーブン。 　 　
PCT/JP2008/053068 2007-02-23 2008-02-22 カラムオーブン二重温調 Ceased WO2008102872A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020097017353A KR101415277B1 (ko) 2007-02-23 2008-02-22 이중 온도 조절식 칼럼 오븐
US12/528,220 US8319155B2 (en) 2007-02-23 2008-02-22 Column oven with double temperature control
JP2009500248A JP5040990B2 (ja) 2007-02-23 2008-02-22 カラムオーブン二重温調
EP08711839.4A EP2113768B1 (en) 2007-02-23 2008-02-22 Column oven with double temperature control
CN2008800059046A CN101622535B (zh) 2007-02-23 2008-02-22 双重温控柱温箱

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007044379 2007-02-23
JP2007-044379 2007-02-23

Publications (1)

Publication Number Publication Date
WO2008102872A1 true WO2008102872A1 (ja) 2008-08-28

Family

ID=39710143

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/053068 Ceased WO2008102872A1 (ja) 2007-02-23 2008-02-22 カラムオーブン二重温調

Country Status (6)

Country Link
US (1) US8319155B2 (ja)
EP (1) EP2113768B1 (ja)
JP (1) JP5040990B2 (ja)
KR (1) KR101415277B1 (ja)
CN (1) CN101622535B (ja)
WO (1) WO2008102872A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008209156A (ja) * 2007-02-23 2008-09-11 Tosoh Corp Ｒｉ背圧の変化防止方法
JP2012013560A (ja) * 2010-07-01 2012-01-19 Shimadzu Corp 液体クロマトグラフ装置
WO2015118668A1 (ja) * 2014-02-07 2015-08-13 株式会社島津製作所 示差屈折率計を用いた測定方法、その測定方法を使用する示差屈折率計及び液体クロマトグラフ
WO2019058476A1 (ja) * 2017-09-21 2019-03-28 株式会社島津製作所 カラムオーブン

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101806310A (zh) * 2010-03-11 2010-08-18 何振俊 温度调节控制箱
JP5644187B2 (ja) 2010-05-31 2014-12-24 株式会社島津製作所 カラムオーブン
JP5561033B2 (ja) * 2010-08-31 2014-07-30 株式会社島津製作所 ガスクロマトグラフ
JP5406809B2 (ja) * 2010-09-17 2014-02-05 株式会社日立ハイテクノロジーズ クロマトグラフ装置
CN102654489A (zh) * 2012-05-02 2012-09-05 辽宁科技大学 一种模拟移动床色谱中、低温控温装置
JP5949934B2 (ja) * 2012-10-25 2016-07-13 株式会社島津製作所 ガスクロマトグラフ装置
CN102914141A (zh) * 2012-11-22 2013-02-06 昆山市大金机械设备厂 温控型烘箱的温控方法
JP6107538B2 (ja) * 2013-08-27 2017-04-05 株式会社島津製作所 カラムオーブン及び液体クロマトグラフ
KR101645284B1 (ko) * 2014-05-02 2016-08-04 한경대학교 산학협력단 유사이동층 장치 및 그의 온도제어 방법
CN106124651B (zh) * 2016-06-15 2018-09-14 深圳市华星光电技术有限公司 一种色谱仪
CN109406694A (zh) * 2018-12-19 2019-03-01 江苏汉邦科技有限公司 一种用于超临界流体色谱系统的色谱柱温控装置
CN110018264A (zh) * 2019-05-13 2019-07-16 河南工业大学 多通道集成液相色谱柱装置及进行液相制备的方法
DE102021106086A1 (de) 2021-03-12 2022-09-15 Agilent Technologies, Inc. - A Delaware Corporation - Temperierung einer chromatografischen Säule
CN114280183B (zh) * 2021-12-23 2024-02-23 华谱科仪(北京)科技有限公司 液相色谱仪柱温箱的温度控制装置和方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4875697U (ja) * 1971-12-22 1973-09-19
JPS4985188U (ja) * 1972-11-09 1974-07-24
JPS5547613U (ja) * 1978-09-25 1980-03-28
JPH0587793A (ja) 1991-09-30 1993-04-06 Yokogawa Electric Corp ガスクロマトグラフの昇温オ―ブン
JPH11201957A (ja) * 1998-01-16 1999-07-30 Yokogawa Electric Corp 恒温槽
JP2001013126A (ja) 1999-06-30 2001-01-19 Shimadzu Corp カラム恒温槽
JP2002055094A (ja) * 2000-08-10 2002-02-20 Shimadzu Corp クロマトグラフ用カラムオーブン
JP2005140505A (ja) 2003-11-04 2005-06-02 Hitachi High-Technologies Corp 液体クロマトグラフ用カラムオーブン
JP2007044379A (ja) 2005-08-11 2007-02-22 Aruze Corp 遊技機

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4875697A (ja) 1972-01-14 1973-10-12
US3846074A (en) * 1972-03-22 1974-11-05 Standard Oil Co Determination of p2o5
JPS5143519B2 (ja) 1972-12-11 1976-11-22
FR2298792A1 (fr) * 1975-01-22 1976-08-20 Anvar Refractometre differentiel perfectionne pour la chromatographie liquide
IN150729B (ja) 1978-09-22 1982-11-27 Lever Hindustan Ltd
IT1101295B (it) * 1978-11-22 1985-09-28 Erba Strumentazione Camera gas-cromatografica
JPH0718850B2 (ja) * 1985-12-03 1995-03-06 株式会社島津製作所 ガスクロマトグラフ
US6485543B1 (en) 2000-09-16 2002-11-26 Stephen J. MacDonald Gas chromatography oven heaters
JP4821851B2 (ja) * 2006-05-30 2011-11-24 株式会社島津製作所 恒温槽

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4875697U (ja) * 1971-12-22 1973-09-19
JPS4985188U (ja) * 1972-11-09 1974-07-24
JPS5547613U (ja) * 1978-09-25 1980-03-28
JPH0587793A (ja) 1991-09-30 1993-04-06 Yokogawa Electric Corp ガスクロマトグラフの昇温オ―ブン
JPH11201957A (ja) * 1998-01-16 1999-07-30 Yokogawa Electric Corp 恒温槽
JP2001013126A (ja) 1999-06-30 2001-01-19 Shimadzu Corp カラム恒温槽
JP2002055094A (ja) * 2000-08-10 2002-02-20 Shimadzu Corp クロマトグラフ用カラムオーブン
JP2005140505A (ja) 2003-11-04 2005-06-02 Hitachi High-Technologies Corp 液体クロマトグラフ用カラムオーブン
JP2007044379A (ja) 2005-08-11 2007-02-22 Aruze Corp 遊技機

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2113768A4

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008209156A (ja) * 2007-02-23 2008-09-11 Tosoh Corp Ｒｉ背圧の変化防止方法
JP2012013560A (ja) * 2010-07-01 2012-01-19 Shimadzu Corp 液体クロマトグラフ装置
WO2015118668A1 (ja) * 2014-02-07 2015-08-13 株式会社島津製作所 示差屈折率計を用いた測定方法、その測定方法を使用する示差屈折率計及び液体クロマトグラフ
JP6037057B2 (ja) * 2014-02-07 2016-11-30 株式会社島津製作所 示差屈折率計を用いた測定方法、その測定方法を使用する示差屈折率計及び液体クロマトグラフ
US10024789B2 (en) 2014-02-07 2018-07-17 Shimadzu Corporation Measurement method using differential refractometer, differential refractometer using the measurement method, and liquid chromatograph
WO2019058476A1 (ja) * 2017-09-21 2019-03-28 株式会社島津製作所 カラムオーブン

Also Published As

Publication number Publication date
US20100096380A1 (en) 2010-04-22
JPWO2008102872A1 (ja) 2010-05-27
EP2113768A4 (en) 2010-03-10
EP2113768A1 (en) 2009-11-04
CN101622535A (zh) 2010-01-06
KR20090121287A (ko) 2009-11-25
EP2113768B1 (en) 2015-07-01
CN101622535B (zh) 2013-09-11
KR101415277B1 (ko) 2014-07-04
US8319155B2 (en) 2012-11-27
JP5040990B2 (ja) 2012-10-03

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