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WO2008102575A1 - 撮像装置及び撮像装置の製造方法 - Google Patents

撮像装置及び撮像装置の製造方法 Download PDF

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Publication number
WO2008102575A1
WO2008102575A1 PCT/JP2008/050333 JP2008050333W WO2008102575A1 WO 2008102575 A1 WO2008102575 A1 WO 2008102575A1 JP 2008050333 W JP2008050333 W JP 2008050333W WO 2008102575 A1 WO2008102575 A1 WO 2008102575A1
Authority
WO
WIPO (PCT)
Prior art keywords
imaging
mirror frame
imaging device
manufacturing
photoelectric converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/050333
Other languages
English (en)
French (fr)
Inventor
Masashi Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Opto Inc
Original Assignee
Konica Minolta Opto Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Opto Inc filed Critical Konica Minolta Opto Inc
Priority to EP08703197A priority Critical patent/EP2124432A4/en
Priority to CN2008800054042A priority patent/CN101632294B/zh
Priority to US12/526,259 priority patent/US20100315546A1/en
Priority to JP2009500101A priority patent/JPWO2008102575A1/ja
Publication of WO2008102575A1 publication Critical patent/WO2008102575A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/55—Optical parts specially adapted for electronic image sensors; Mounting thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/024—Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/804—Containers or encapsulations
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554—External layer
    • H01L2224/05573—Single external layer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061—Disposition
    • H01L2224/0612—Layout
    • H01L2224/0615—Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/805—Coatings
    • H10F39/8057—Optical shielding
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49815—Disassembling
    • Y10T29/49817—Disassembling with other than ancillary treating or assembling

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
  • Lens Barrels (AREA)

Abstract

　本発明は撮像素子を容易にシールド可能な撮像装置に関する。 　本発明は、導電性の鏡枠と、光電変換部を備えた撮像素子を含む素子ユニットと、前記鏡枠内に取り付けられ、前記撮像素子の前記光電変換部に被写体像を結像させる撮像レンズと、を有し、前記素子ユニットには前記鏡枠に接触可能な導電部材が露出していることを特徴とする。
PCT/JP2008/050333 2007-02-21 2008-01-15 撮像装置及び撮像装置の製造方法 Ceased WO2008102575A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08703197A EP2124432A4 (en) 2007-02-21 2008-01-15 PICTURE GENERATING DEVICE AND METHOD FOR PRODUCING THE EQUIPMENT
CN2008800054042A CN101632294B (zh) 2007-02-21 2008-01-15 摄像装置及摄像装置的制造方法
US12/526,259 US20100315546A1 (en) 2007-02-21 2008-01-15 Imaging Device and Manufacturing method therefor
JP2009500101A JPWO2008102575A1 (ja) 2007-02-21 2008-01-15 撮像装置及び撮像装置の製造方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-040671 2007-02-21
JP2007040671 2007-02-21

Publications (1)

Publication Number Publication Date
WO2008102575A1 true WO2008102575A1 (ja) 2008-08-28

Family

ID=39709855

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/050333 Ceased WO2008102575A1 (ja) 2007-02-21 2008-01-15 撮像装置及び撮像装置の製造方法

Country Status (5)

Country Link
US (1) US20100315546A1 (ja)
EP (1) EP2124432A4 (ja)
JP (1) JPWO2008102575A1 (ja)
CN (1) CN101632294B (ja)
WO (1) WO2008102575A1 (ja)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010232593A (ja) * 2009-03-30 2010-10-14 Sony Corp 半導体装置の製造方法および半導体装置
JP2011027867A (ja) * 2009-07-23 2011-02-10 Konica Minolta Opto Inc 光学部品、光学部品の製造方法、レンズ集合体及びレンズ集合体の製造方法
US20110176021A1 (en) * 2010-01-21 2011-07-21 Mao Bang Electronic Co., Ltd. Image-Processing Integrated Circuit
JP2011147091A (ja) * 2010-01-18 2011-07-28 Sharp Corp カメラモジュールおよびその製造方法、電子情報機器
JP2011199829A (ja) * 2010-02-26 2011-10-06 Sharp Corp カメラモジュール
WO2014178260A1 (ja) * 2013-05-01 2014-11-06 富士フイルム株式会社 カメラモジュール及びその製造方法
JP2018200423A (ja) * 2017-05-29 2018-12-20 ソニーセミコンダクタソリューションズ株式会社 撮像装置、および電子機器
JP2019509512A (ja) * 2016-02-18 2019-04-04 ニンボー サニー オプテック カンパニー，リミテッド 一体パッケージングプロセスベースのカメラモジュール、その一体ベース部品、およびその製造方法
US11309344B2 (en) 2017-05-29 2022-04-19 Sony Semiconductor Solutions Corporation Imaging device, solid state image sensor, and electronic device
US12127732B2 (en) 2019-04-23 2024-10-29 Olympus Corporation Distal end unit for endoscope and endoscope

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102712515B (zh) * 2010-02-01 2015-07-01 柯尼卡美能达先进多层薄膜株式会社 透镜单元的制造方法、摄像装置、模具的制造方法、成型模具以及玻璃透镜阵列的成型方法
FR2965103B1 (fr) * 2010-09-17 2013-06-28 Commissariat Energie Atomique Systeme optique d'imagerie a ftm amelioree
US9640709B2 (en) * 2013-09-10 2017-05-02 Heptagon Micro Optics Pte. Ltd. Compact opto-electronic modules and fabrication methods for such modules
US9749509B2 (en) * 2014-03-13 2017-08-29 Magna Electronics Inc. Camera with lens for vehicle vision system
JP2016100573A (ja) * 2014-11-26 2016-05-30 株式会社東芝 電子モジュール、及びカメラモジュール
CN108857315B (zh) * 2018-07-23 2019-12-31 遂宁市维美电子科技有限公司 一种手机镜头自动盖镜片装置
US11871100B2 (en) * 2019-04-02 2024-01-09 Ningbo Sunny Opotech Co., Ltd. Camera module and blocking-type photosensitive assembly, manufacturing method thereof, and electronic device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002314856A (ja) * 2001-04-17 2002-10-25 Seiko Precision Inc 携帯機器用カメラ
JP2004200965A (ja) 2002-12-18 2004-07-15 Sanyo Electric Co Ltd カメラモジュール及びその製造方法
JP2004229167A (ja) * 2003-01-27 2004-08-12 Sanyo Electric Co Ltd カメラモジュールの製造方法
JP2005176185A (ja) * 2003-12-15 2005-06-30 Nec Access Technica Ltd カメラモジュール実装構造
JP2006005211A (ja) * 2004-06-18 2006-01-05 Iwate Toshiba Electronics Co Ltd 固体撮像装置及びその製造方法

Family Cites Families (10)

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JP3846158B2 (ja) * 2000-05-24 2006-11-15 松下電工株式会社 鏡筒及びこれを用いた撮像装置
JP3738824B2 (ja) * 2000-12-26 2006-01-25 セイコーエプソン株式会社 光学装置及びその製造方法並びに電子機器
JP2002329850A (ja) * 2001-05-01 2002-11-15 Canon Inc チップサイズパッケージおよびその製造方法
JP2004104078A (ja) * 2002-06-28 2004-04-02 Sanyo Electric Co Ltd カメラモジュールおよびその製造方法
US7105931B2 (en) * 2003-01-07 2006-09-12 Abbas Ismail Attarwala Electronic package and method
JP4441211B2 (ja) * 2003-08-13 2010-03-31 シチズン電子株式会社 小型撮像モジュール
JP2006165624A (ja) * 2004-12-02 2006-06-22 Konica Minolta Opto Inc 撮像装置及び該撮像装置を有する携帯端末
WO2006088051A1 (ja) * 2005-02-16 2006-08-24 Konica Minolta Opto, Inc. カメラモジュール
JP4304163B2 (ja) * 2005-03-09 2009-07-29 パナソニック株式会社 撮像モジュールおよびその製造方法
EP1915859A4 (en) * 2006-08-22 2010-03-10 Lg Innotek Co Ltd CAMERA MODULE

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002314856A (ja) * 2001-04-17 2002-10-25 Seiko Precision Inc 携帯機器用カメラ
JP2004200965A (ja) 2002-12-18 2004-07-15 Sanyo Electric Co Ltd カメラモジュール及びその製造方法
JP2004229167A (ja) * 2003-01-27 2004-08-12 Sanyo Electric Co Ltd カメラモジュールの製造方法
JP2005176185A (ja) * 2003-12-15 2005-06-30 Nec Access Technica Ltd カメラモジュール実装構造
JP2006005211A (ja) * 2004-06-18 2006-01-05 Iwate Toshiba Electronics Co Ltd 固体撮像装置及びその製造方法

Non-Patent Citations (1)

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Title
See also references of EP2124432A4

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010232593A (ja) * 2009-03-30 2010-10-14 Sony Corp 半導体装置の製造方法および半導体装置
JP2011027867A (ja) * 2009-07-23 2011-02-10 Konica Minolta Opto Inc 光学部品、光学部品の製造方法、レンズ集合体及びレンズ集合体の製造方法
JP2011147091A (ja) * 2010-01-18 2011-07-28 Sharp Corp カメラモジュールおよびその製造方法、電子情報機器
US20110176021A1 (en) * 2010-01-21 2011-07-21 Mao Bang Electronic Co., Ltd. Image-Processing Integrated Circuit
JP2011199829A (ja) * 2010-02-26 2011-10-06 Sharp Corp カメラモジュール
WO2014178260A1 (ja) * 2013-05-01 2014-11-06 富士フイルム株式会社 カメラモジュール及びその製造方法
JP2019509512A (ja) * 2016-02-18 2019-04-04 ニンボー サニー オプテック カンパニー，リミテッド 一体パッケージングプロセスベースのカメラモジュール、その一体ベース部品、およびその製造方法
US11877044B2 (en) 2016-02-18 2024-01-16 Ningbo Sunny Opotech Co., Ltd. Integral packaging process-based camera module, integral base component of same, and manufacturing method thereof
JP2018200423A (ja) * 2017-05-29 2018-12-20 ソニーセミコンダクタソリューションズ株式会社 撮像装置、および電子機器
US11309344B2 (en) 2017-05-29 2022-04-19 Sony Semiconductor Solutions Corporation Imaging device, solid state image sensor, and electronic device
US11810935B2 (en) 2017-05-29 2023-11-07 Sony Semiconductor Solutions Corporation Imaging device, solid state image sensor, and electronic device
US12127732B2 (en) 2019-04-23 2024-10-29 Olympus Corporation Distal end unit for endoscope and endoscope

Also Published As

Publication number Publication date
US20100315546A1 (en) 2010-12-16
CN101632294A (zh) 2010-01-20
CN101632294B (zh) 2012-08-22
JPWO2008102575A1 (ja) 2010-05-27
EP2124432A4 (en) 2012-03-21
EP2124432A1 (en) 2009-11-25

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