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WO2008146230A3 - Comptage de photons avec détection d'un maximum local - Google Patents

Comptage de photons avec détection d'un maximum local Download PDF

Info

Publication number
WO2008146230A3
WO2008146230A3 PCT/IB2008/052058 IB2008052058W WO2008146230A3 WO 2008146230 A3 WO2008146230 A3 WO 2008146230A3 IB 2008052058 W IB2008052058 W IB 2008052058W WO 2008146230 A3 WO2008146230 A3 WO 2008146230A3
Authority
WO
WIPO (PCT)
Prior art keywords
photon counting
photon
detection
local maxima
counters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/IB2008/052058
Other languages
English (en)
Other versions
WO2008146230A2 (fr
Inventor
Booker Roger Steadman
Cristoph Herrmann
Christian Baeumer
Guenter Zeitler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Intellectual Property and Standards GmbH
Koninklijke Philips NV
Original Assignee
Philips Intellectual Property and Standards GmbH
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH, Koninklijke Philips Electronics NV filed Critical Philips Intellectual Property and Standards GmbH
Publication of WO2008146230A2 publication Critical patent/WO2008146230A2/fr
Publication of WO2008146230A3 publication Critical patent/WO2008146230A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G01T1/171—Compensation of dead-time counting losses
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

L'invention concerne un appareil de comptage de photons qui comprend un détecteur de rayonnement (100) et des éléments de circuit de conditionnement de signal (102). Un compteur de vitesse de photon (106) produit une valeur de compte indicative d'un nombre total de photons reçus par le détecteur (100). Un ou plusieurs compteurs de photons (1101+N) produisent des valeurs de compte indicatives de photons ayant des caractéristiques énergétiques variables. Les compteurs (1101+n) négligent les impulsions d'empilement.
PCT/IB2008/052058 2007-05-29 2008-05-26 Comptage de photons avec détection d'un maximum local Ceased WO2008146230A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07109082.3 2007-05-29
EP07109082 2007-05-29

Publications (2)

Publication Number Publication Date
WO2008146230A2 WO2008146230A2 (fr) 2008-12-04
WO2008146230A3 true WO2008146230A3 (fr) 2009-07-23

Family

ID=40075616

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2008/052058 Ceased WO2008146230A2 (fr) 2007-05-29 2008-05-26 Comptage de photons avec détection d'un maximum local

Country Status (1)

Country Link
WO (1) WO2008146230A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11988785B2 (en) 2019-03-14 2024-05-21 Koninklijke Philips N.V. Charge sharing compensation with sampled discriminators

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010141101A1 (fr) * 2009-06-05 2010-12-09 Sentinel Scanning Corporation Système et procédé d'inspection d'un conteneur de transport
FI122647B (fi) * 2009-06-09 2012-05-15 Planmeca Oy Digitaaliröntgenanturijärjestely ja digitaalinen röntgenkuvantamismenetelmä
EP2751594B1 (fr) * 2011-12-21 2018-08-08 Koninklijke Philips N.V. Appareil de détection pour détection de photons prenant en compte le phénomène d'empilement
JP5917157B2 (ja) * 2012-01-13 2016-05-11 株式会社東芝 Ｘ線ｃｔ装置
RU2014143012A (ru) * 2012-03-27 2016-05-20 Конинклейке Филипс Н.В. Электронное устройство детектора подсчета фотонов в потоке высокой интенсивности
US9029748B2 (en) 2013-03-15 2015-05-12 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence Method and apparatus for photon counting with optical space spreading
JP2016522891A (ja) 2013-04-24 2016-08-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 訂正手段を備えたパルス処理回路
US10499869B2 (en) * 2016-02-05 2019-12-10 Toshiba Medical Systems Corporation Apparatus and method for material decomposition of spectrally resolved projection data using singles counts
FR3050282B1 (fr) * 2016-04-14 2020-09-18 Commissariat Energie Atomique Dispositif de comptage de particules pour detecteur de rayonnement
US11029425B2 (en) 2016-06-16 2021-06-08 Koninklijke Philips N.V. Photon-counting in a spectral radiation detector
US11187584B2 (en) * 2017-04-13 2021-11-30 Captl Llc Photon counting and spectroscopy
DE102020208000B4 (de) * 2020-06-29 2025-06-18 Siemens Healthineers Ag Photonenzählender Röntgendetektor, medizinisches Bildgebungsgerät und Verfahren zur Erzeugung eines Röntgenbilddatensatzes

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5873054A (en) * 1995-08-14 1999-02-16 William K. Warburton Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer
WO2007049168A2 (fr) * 2005-10-28 2007-05-03 Koninklijke Philips Electronics, N.V. Procede et appareil de tomographie spectrale par ordinateur

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5873054A (en) * 1995-08-14 1999-02-16 William K. Warburton Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer
WO2007049168A2 (fr) * 2005-10-28 2007-05-03 Koninklijke Philips Electronics, N.V. Procede et appareil de tomographie spectrale par ordinateur

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11988785B2 (en) 2019-03-14 2024-05-21 Koninklijke Philips N.V. Charge sharing compensation with sampled discriminators

Also Published As

Publication number Publication date
WO2008146230A2 (fr) 2008-12-04

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