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WO2008010718A3 - Method for sample preparation for cryoelectron microscopy (cem), microreactor and loading platform - Google Patents

Method for sample preparation for cryoelectron microscopy (cem), microreactor and loading platform Download PDF

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Publication number
WO2008010718A3
WO2008010718A3 PCT/NL2007/050364 NL2007050364W WO2008010718A3 WO 2008010718 A3 WO2008010718 A3 WO 2008010718A3 NL 2007050364 W NL2007050364 W NL 2007050364W WO 2008010718 A3 WO2008010718 A3 WO 2008010718A3
Authority
WO
WIPO (PCT)
Prior art keywords
microreactor
cem
sample preparation
cryoelectron microscopy
loading platform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/NL2007/050364
Other languages
French (fr)
Other versions
WO2008010718A2 (en
Inventor
Hendrik Willem Zandbergen
Chi-Won Ahn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Technische Universiteit Delft
Original Assignee
Technische Universiteit Delft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technische Universiteit Delft filed Critical Technische Universiteit Delft
Publication of WO2008010718A2 publication Critical patent/WO2008010718A2/en
Publication of WO2008010718A3 publication Critical patent/WO2008010718A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/42—Low-temperature sample treatment, e.g. cryofixation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

A method for sample preparation for cryoelectron microscopy (CEM), wherein the sample is held in a microreactor, wherein the conditions in the microreactor are regulated relative to the environment, wherein the sample in the microreactor is frozen according to a quench freeze process, whereupon the sample, in frozen condition, is placed in the electron microscope. A microreactor for use with cryoelectron microscopy (CEM), comprising a first and second membrane, which membranes, at least in a condition of use, enclose a chamber, while the membranes are configured to last until at least the beginning of a quench freeze process.
PCT/NL2007/050364 2006-07-21 2007-07-23 Method for sample preparation for cryoelectron microscopy (cem), microreactor and loading platform Ceased WO2008010718A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1032224 2006-07-21
NL1032224A NL1032224C2 (en) 2006-07-21 2006-07-21 Method for sample preparation for cryo-electron microscopy (CEM), microreactor and loading dock.

Publications (2)

Publication Number Publication Date
WO2008010718A2 WO2008010718A2 (en) 2008-01-24
WO2008010718A3 true WO2008010718A3 (en) 2008-04-10

Family

ID=37734980

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/NL2007/050364 Ceased WO2008010718A2 (en) 2006-07-21 2007-07-23 Method for sample preparation for cryoelectron microscopy (cem), microreactor and loading platform

Country Status (2)

Country Link
NL (1) NL1032224C2 (en)
WO (1) WO2008010718A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2626884A1 (en) * 2012-02-10 2013-08-14 Danmarks Tekniske Universitet - DTU Microfluidic chip for high resolution transmission electron microscopy
JP6002946B2 (en) * 2012-07-23 2016-10-05 国立研究開発法人産業技術総合研究所 Sample holder and electron microscope image observation method
KR102484315B1 (en) 2016-12-06 2023-01-02 브랜데이스 유니버시티 Freezeable Fluid Cells for Cryogenic Electron Microscopy
CN110006934A (en) 2017-12-28 2019-07-12 Fei 公司 Pass through the methods, devices and systems of plasma focus Ion Beam Treatment biology cryogenic sample
NL2020995B1 (en) * 2018-05-28 2019-12-03 Univ Delft Tech Nanoreactor comprising a membrane condenser
US10921268B1 (en) * 2019-09-09 2021-02-16 Fei Company Methods and devices for preparing sample for cryogenic electron microscopy
GB2613733A (en) * 2020-08-11 2023-06-14 Univ Xiamen Transmission electron microscope high-resolution in-situ fluid freezing chip and preparation method therefor
CN111879796B (en) * 2020-08-11 2025-05-23 厦门大学 A transmission electron microscope high-resolution in-situ fluid freezing chip and its preparation method
NL2026627B1 (en) * 2020-10-05 2022-06-03 Bruker Nederland B V A MEMS device for transmission microscopy, and a method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60127646A (en) * 1983-12-14 1985-07-08 Jeol Ltd Sample exchanging unit of vacuum device
US4797261A (en) * 1987-11-03 1989-01-10 Gatan Inc. Multiple specimen cryotransfer holder for electron microscopes
US5352898A (en) * 1993-05-18 1994-10-04 Atlantic Richfield Company Method and apparatus for preparing slurry specimens for cryo-scanning electron microscopy
US5493865A (en) * 1993-08-03 1996-02-27 Wohlwend; Martin Method and apparatus for vitrification of water or moisture-containing test samples, particularly biological samples
WO1996020495A2 (en) * 1994-12-28 1996-07-04 Technische Universiteit Delft Specimen holder for an electron microscope and device and method for mounting a specimen in an electron microscope
WO2002046719A2 (en) * 2000-12-07 2002-06-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Cryostorage method and device
DE10251668A1 (en) * 2002-11-06 2004-05-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sample holder unit, for cryogenic storage under very low temperatures, comprises a data store to be scanned for identification of the samples held in the suspended sample chambers
WO2005001439A1 (en) * 2003-06-26 2005-01-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sample holding device and method for the production thereof

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60127646A (en) * 1983-12-14 1985-07-08 Jeol Ltd Sample exchanging unit of vacuum device
US4797261A (en) * 1987-11-03 1989-01-10 Gatan Inc. Multiple specimen cryotransfer holder for electron microscopes
US5352898A (en) * 1993-05-18 1994-10-04 Atlantic Richfield Company Method and apparatus for preparing slurry specimens for cryo-scanning electron microscopy
US5493865A (en) * 1993-08-03 1996-02-27 Wohlwend; Martin Method and apparatus for vitrification of water or moisture-containing test samples, particularly biological samples
WO1996020495A2 (en) * 1994-12-28 1996-07-04 Technische Universiteit Delft Specimen holder for an electron microscope and device and method for mounting a specimen in an electron microscope
WO2002046719A2 (en) * 2000-12-07 2002-06-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Cryostorage method and device
DE10251668A1 (en) * 2002-11-06 2004-05-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sample holder unit, for cryogenic storage under very low temperatures, comprises a data store to be scanned for identification of the samples held in the suspended sample chambers
WO2005001439A1 (en) * 2003-06-26 2005-01-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sample holding device and method for the production thereof

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
DENKOV: "method for the controlled formation of vitrified films for CEM", ULTRAMICROSCOPY, no. 66, 1996, pages 147 - 158, XP002421329 *
GYOBU ET AL: "improved specimen preparation for cryo-electron microscopy", JOURNAL OF STRUCTURAL BIOLOGY, vol. 146, 2004, pages 325 - 333, XP002421328 *

Also Published As

Publication number Publication date
NL1032224C2 (en) 2008-01-22
WO2008010718A2 (en) 2008-01-24

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