WO2008099526A1 - Thin film transistor, and display device - Google Patents
Thin film transistor, and display device Download PDFInfo
- Publication number
- WO2008099526A1 WO2008099526A1 PCT/JP2007/067050 JP2007067050W WO2008099526A1 WO 2008099526 A1 WO2008099526 A1 WO 2008099526A1 JP 2007067050 W JP2007067050 W JP 2007067050W WO 2008099526 A1 WO2008099526 A1 WO 2008099526A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- region
- thin film
- film transistor
- display device
- crystal growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0221—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies
- H10D86/0223—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies comprising crystallisation of amorphous, microcrystalline or polycrystalline semiconductor materials
- H10D86/0229—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies comprising crystallisation of amorphous, microcrystalline or polycrystalline semiconductor materials characterised by control of the annealing or irradiation parameters
Landscapes
- Thin Film Transistor (AREA)
Abstract
Provided is a thin film transistor (11) comprising a crystal growth region having crystal-grown in two-dimensional directions on a plane, a source region (S) and a drain region (D) formed in the crystal growth region, and a gate electrode (G) formed through a gate insulating film over a channel region between the source region and the drain region. The thin film transistor is characterized in that the side end portion (E) of the channel region of the source region or the drain region is positioned at the position of 1 μm to 3.5 μm from a crystal growth starting position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/252,910 US20090057764A1 (en) | 2007-02-16 | 2008-10-16 | Thin film transistor and display apparatus |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007-037029 | 2007-02-16 | ||
| JP2007037029 | 2007-02-16 | ||
| JP2007221417A JP2008227445A (en) | 2007-02-16 | 2007-08-28 | Thin film transistor and display device |
| JP2007-221417 | 2007-08-28 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/252,910 Continuation US20090057764A1 (en) | 2007-02-16 | 2008-10-16 | Thin film transistor and display apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2008099526A1 true WO2008099526A1 (en) | 2008-08-21 |
Family
ID=39689783
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2007/067050 Ceased WO2008099526A1 (en) | 2007-02-16 | 2007-08-31 | Thin film transistor, and display device |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2008099526A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8009345B2 (en) | 2007-03-23 | 2011-08-30 | Advanced Lcd Technologies Development Center Co., Ltd. | Crystallization apparatus, crystallization method, device, and light modulation element |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004266063A (en) * | 2003-02-28 | 2004-09-24 | Seiko Epson Corp | Complementary thin film transistor circuit, electro-optical device, electronic equipment |
| JP2005235811A (en) * | 2004-02-17 | 2005-09-02 | Nikon Corp | Semiconductor thin film forming equipment |
-
2007
- 2007-08-31 WO PCT/JP2007/067050 patent/WO2008099526A1/en not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004266063A (en) * | 2003-02-28 | 2004-09-24 | Seiko Epson Corp | Complementary thin film transistor circuit, electro-optical device, electronic equipment |
| JP2005235811A (en) * | 2004-02-17 | 2005-09-02 | Nikon Corp | Semiconductor thin film forming equipment |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8009345B2 (en) | 2007-03-23 | 2011-08-30 | Advanced Lcd Technologies Development Center Co., Ltd. | Crystallization apparatus, crystallization method, device, and light modulation element |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
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