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WO2007129495A1 - Procédé d'ionisation de gouttelettes, spectrométrie de masse et appareil associé - Google Patents

Procédé d'ionisation de gouttelettes, spectrométrie de masse et appareil associé Download PDF

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Publication number
WO2007129495A1
WO2007129495A1 PCT/JP2007/052973 JP2007052973W WO2007129495A1 WO 2007129495 A1 WO2007129495 A1 WO 2007129495A1 JP 2007052973 W JP2007052973 W JP 2007052973W WO 2007129495 A1 WO2007129495 A1 WO 2007129495A1
Authority
WO
WIPO (PCT)
Prior art keywords
sample
droplet
liquid sample
laser
ionization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/052973
Other languages
English (en)
Japanese (ja)
Inventor
Takashi Korenaga
Masayoshi Ito
Tatsuhiro Nishide
Takuya Masunaga
Tadayoshi Matsuyama
Yukinobu Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Metropolitan Public University Corp
Original Assignee
Tokyo Metropolitan Public University Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Metropolitan Public University Corp filed Critical Tokyo Metropolitan Public University Corp
Publication of WO2007129495A1 publication Critical patent/WO2007129495A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Definitions

  • the present invention relates to mass spectrometry of a substance, and more particularly, to an ion ion of a sample prior to mass spectrometry.
  • MALDI Matrix Assisted Laser Desorption / Ionization Method
  • the electrospray ionization method (ESI) and the atmospheric pressure ionization method (APCI) can be applied to a relatively large number of target samples.
  • ESI electrospray ionization method
  • APCI atmospheric pressure ionization method
  • IAMS ion attachment mass spectrometer
  • Suspended particulate matter (SPM) in the atmosphere which is attracting international attention for human effects, is widely distributed in particle diameters ranging from several tens / zm force to several nm. Among them, nanoparticles with a particle size of less than 0.1 ⁇ m may be taken into the body directly by lungs due to respiration.
  • SPM composition analysis it is difficult to detect all constituent molecules of fine particles as they are, and multi-component simultaneous measurement is desired.
  • As for suspended particles there is a problem in the force pretreatment that has reached the level where it is possible to measure one particle in the US and Europe, and only the main components can be identified, and simple inorganic components can be identified.
  • Organic arsenic compounds are a recent representative example of environmental substances that are difficult to perform mass spectrometry.
  • environmental substances are forces that exist in the environment in various forms such as gas 'floating particles' droplets containing solids. Ion has been carried out by dropping the solution onto the substrate and irradiating it with laser light.
  • the laser beam is irradiated on the droplet only for evaporation, and ionic liquid has a drawback in that a separate device is required. It was.
  • Non-Patent Document 1 1P030, Development of a droplet laser evaporation mass spectrometer (Kampon Lab., Ltd. 1, Toyoda Inst. jp / "bkinfo I 2004 /proglp.html) Disclosure of the invention
  • An object of the present invention is to immediately ionize a sample by irradiating the sample with a laser, guide the ionized sample to a mass spectrometer, and achieve sample identification with a simpler apparatus. .
  • the liquid droplet sample is evaporated and ionized by accurately irradiating a laser beam to the drop position of the liquid droplet sample.
  • Non-Patent Document 1 since the droplet sample can be directly ionized by laser light, the apparatus shown in Non-Patent Document 1 requires a necessary ionization apparatus. Therefore, it is possible to obtain a mass spectrometer that is simpler and cheaper than the above apparatus.
  • FIG. 1 is a schematic diagram of an apparatus according to the present invention.
  • FIG. 2 State change diagram of a droplet by laser irradiation according to the method of the present invention
  • the analyzer is roughly divided into three parts: an ionization part 1, an ion guide part 2, and a time-of-flight measurement part (TOF) 3.
  • the droplet 5 is introduced from the droplet introduction device 4.
  • a droplet supply method a method of dropping the supply nozzle force and a method of pushing upward from the nozzle can be considered.
  • the droplet introduction device is an off-the-shelf microdrop generator that generates droplets with a diameter of 70 m.
  • This droplet is irradiated with a laser beam.
  • the laser may be a long panoreth laser with a panorace width longer than that of a 355 nm wavelength Nd-YAG laser or YAG laser.
  • FIG. 2 shows the state change of the droplet when the droplet is irradiated with the YAG laser light.
  • the laser beam was emitted from the left side of the photo. After 20 ns, a picture of the process of droplet explosion and evaporation is shown. When the droplet is irradiated with laser light, the droplet force S ion is generated and light is emitted.
  • Figure 3 compares the TOF signal when the acetone solution is used as the sample and the laser beam is proved to be effective, and the case where the laser beam is not effectively applied to the droplet.
  • Fig. 3 (A) shows the signal waveform when effective irradiation is performed
  • Fig. 3 (B) shows the signal waveform when irradiation is not effective.
  • the signal intensity is proportional to the total number of ions detected.
  • mass analysis with a large SZN ratio can be performed by irradiating the center of the droplet with laser light.
  • the timing of irradiating the droplets with the laser light can be determined by experiment in consideration of the droplet ejection conditions from the droplet supply device and the laser irradiation conditions.

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

La présente invention concerne un procédé permettant d'irradier un échantillon au laser afin d'atteindre une ionisation immédiate de l'échantillon et de guider l'échantillon ionisé vers un spectrographe de masse dans le but de réaliser une identification de l'échantillon au moyen d'un appareil simple. On a démontré que lorsqu'une gouttelette qui tombe en son centre est irradiée par des faisceaux laser, la gouttelette subit une vaporisation instantanée et est simultanément ionisée. L'invention concerne par conséquent un procédé permettant d'irradier avec précision un échantillon en gouttelette en sa position de chute avec des faisceaux laser afin que l'échantillon en gouttelette soit simultanément vaporisé et ionisé.
PCT/JP2007/052973 2006-05-08 2007-02-19 Procédé d'ionisation de gouttelettes, spectrométrie de masse et appareil associé Ceased WO2007129495A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006-129603 2006-05-08
JP2006129603A JP2007303840A (ja) 2006-05-08 2006-05-08 液滴イオン化法、質量分析法及びそれらの装置

Publications (1)

Publication Number Publication Date
WO2007129495A1 true WO2007129495A1 (fr) 2007-11-15

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/052973 Ceased WO2007129495A1 (fr) 2006-05-08 2007-02-19 Procédé d'ionisation de gouttelettes, spectrométrie de masse et appareil associé

Country Status (2)

Country Link
JP (1) JP2007303840A (fr)
WO (1) WO2007129495A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009128070A (ja) * 2007-11-20 2009-06-11 Tokyo Metropolitan Univ 微小液滴生成方法及び微小液滴生成装置
JP2010014539A (ja) * 2008-07-03 2010-01-21 Tokyo Metropolitan Univ 液体試料イオン化法、質量分析法及びそれらの装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61200663A (ja) * 1985-02-28 1986-09-05 Shimadzu Corp 有機物質のイオン化方法及び装置
JPH03105841A (ja) * 1989-09-20 1991-05-02 Hitachi Ltd 質量分析方法
JP2000146914A (ja) * 1998-11-09 2000-05-26 Jeol Ltd Ｆｒｉｔ−レーザーイオン源

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61200663A (ja) * 1985-02-28 1986-09-05 Shimadzu Corp 有機物質のイオン化方法及び装置
JPH03105841A (ja) * 1989-09-20 1991-05-02 Hitachi Ltd 質量分析方法
JP2000146914A (ja) * 1998-11-09 2000-05-26 Jeol Ltd Ｆｒｉｔ−レーザーイオン源

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
CHEN L. ET AL.: "The study about analyzing organoarsenic compounds using Ion Attachment Mass Spectrometry", TOKYO CONFERENCE 2004 KOEN YOSHISHU, 31 August 2004 (2004-08-31) *
HARA K. ET AL.: "Ekiso Ion Fukaho o Mochiita Aerosol Shitsuryo Bunseki", DAI 23 KAI AEROSOL KAGAKU.GIJUTSU KENKYU TORONKAI RONBUNSHU, 8 August 2006 (2006-08-08), pages 155 - 156 *
SAKATA K. ET AL.: "Ion Fuchaku o Mochiita LD-TOFMS Kaihatsu", THE JAPAN SOCIETY FOR ANALYTICAL CHEMISTRY DAI 54 NENKAI KOEN YOSHISHU, 31 August 2005 (2005-08-31), pages 149 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009128070A (ja) * 2007-11-20 2009-06-11 Tokyo Metropolitan Univ 微小液滴生成方法及び微小液滴生成装置
JP2010014539A (ja) * 2008-07-03 2010-01-21 Tokyo Metropolitan Univ 液体試料イオン化法、質量分析法及びそれらの装置

Also Published As

Publication number Publication date
JP2007303840A (ja) 2007-11-22

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