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WO2006138441A3 - Dispositifs d'acceleration et procedes d'utilisation correspondants - Google Patents

Dispositifs d'acceleration et procedes d'utilisation correspondants Download PDF

Info

Publication number
WO2006138441A3
WO2006138441A3 PCT/US2006/023277 US2006023277W WO2006138441A3 WO 2006138441 A3 WO2006138441 A3 WO 2006138441A3 US 2006023277 W US2006023277 W US 2006023277W WO 2006138441 A3 WO2006138441 A3 WO 2006138441A3
Authority
WO
WIPO (PCT)
Prior art keywords
boost device
methods
flame
plasma
provide additional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2006/023277
Other languages
English (en)
Other versions
WO2006138441A2 (fr
Inventor
Peter J Morrisroe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Revvity Inc
Original Assignee
PerkinElmer Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/156,274 external-priority patent/US7742167B2/en
Priority claimed from US11/156,249 external-priority patent/US8622735B2/en
Application filed by PerkinElmer Inc filed Critical PerkinElmer Inc
Priority to CN200680021600XA priority Critical patent/CN101198846B/zh
Priority to AU2006259381A priority patent/AU2006259381B2/en
Priority to EP06784915A priority patent/EP1891407A4/fr
Priority to JP2008517097A priority patent/JP2008544454A/ja
Priority to CA2608528A priority patent/CA2608528C/fr
Publication of WO2006138441A2 publication Critical patent/WO2006138441A2/fr
Publication of WO2006138441A3 publication Critical patent/WO2006138441A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/26—Plasma torches
    • H05H1/30—Plasma torches using applied electromagnetic fields, e.g. high frequency or microwave energy
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
    • B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
    • B23K20/106—Features related to sonotrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/72—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flame burners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7246—Nebulising, aerosol formation or ionisation by pneumatic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273—Desolvation chambers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mechanical Engineering (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Plasma Technology (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)

Abstract

L'invention concerne un dispositif d'accélération configuré pour communiquer une énergie supplémentaire à une source d'atomisation telle qu'une flamme ou un plasma. Dans certains exemples, un dispositif d'accélération peut être utilisé avec une flamme ou un plasma pour communiquer à la flamme ou au plasma une énergie supplémentaire afin d'en améliorer la désolvatation, l'atomisation et/ou l'ionisation. Dans d'autres exemples, le dispositif d'accélération peut être configuré pour fournir de l'énergie additionnelle à des fins d'excitation d'espèces. L'invention concerne des instruments et des dispositifs comprenant au moins un dispositif d'accélération.
PCT/US2006/023277 2005-06-17 2006-06-15 Dispositifs d'acceleration et procedes d'utilisation correspondants Ceased WO2006138441A2 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN200680021600XA CN101198846B (zh) 2005-06-17 2006-06-15 原子化装置
AU2006259381A AU2006259381B2 (en) 2005-06-17 2006-06-15 Boost devices and methods of using them
EP06784915A EP1891407A4 (fr) 2005-06-17 2006-06-15 Dispositifs d'acceleration et procedes d'utilisation correspondants
JP2008517097A JP2008544454A (ja) 2005-06-17 2006-06-15 増強装置及びその使用方法
CA2608528A CA2608528C (fr) 2005-06-17 2006-06-15 Dispositifs d'acceleration et procedes d'utilisation correspondants

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11/156,274 US7742167B2 (en) 2005-06-17 2005-06-17 Optical emission device with boost device
US11/156,249 2005-06-17
US11/156,249 US8622735B2 (en) 2005-06-17 2005-06-17 Boost devices and methods of using them
US11/156,274 2005-06-17

Publications (2)

Publication Number Publication Date
WO2006138441A2 WO2006138441A2 (fr) 2006-12-28
WO2006138441A3 true WO2006138441A3 (fr) 2007-11-08

Family

ID=37571144

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/023277 Ceased WO2006138441A2 (fr) 2005-06-17 2006-06-15 Dispositifs d'acceleration et procedes d'utilisation correspondants

Country Status (6)

Country Link
EP (1) EP1891407A4 (fr)
JP (1) JP2008544454A (fr)
CN (1) CN102291921B (fr)
AU (1) AU2006259381B2 (fr)
CA (1) CA2608528C (fr)
WO (1) WO2006138441A2 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7511246B2 (en) 2002-12-12 2009-03-31 Perkinelmer Las Inc. Induction device for generating a plasma
US7742167B2 (en) 2005-06-17 2010-06-22 Perkinelmer Health Sciences, Inc. Optical emission device with boost device
US8622735B2 (en) 2005-06-17 2014-01-07 Perkinelmer Health Sciences, Inc. Boost devices and methods of using them
DE102009004410B4 (de) * 2009-01-13 2011-06-01 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Vorrichtung und Verfahren von in einer Elektrolytlösung enthaltenen Analytsubstanzen
CN102843851B (zh) * 2012-05-04 2015-01-28 上海华力微电子有限公司 一种等离子发生装置及方法
CA2879076C (fr) 2012-07-13 2020-11-10 Perkinelmer Health Sciences, Inc. Torches et procedes d'utilisation de celles-ci
JP5962854B2 (ja) * 2013-05-17 2016-08-03 株式会社島津製作所 電子捕獲検出器
US10475626B2 (en) 2015-03-17 2019-11-12 Applied Materials, Inc. Ion-ion plasma atomic layer etch process and reactor
CN115178388B (zh) * 2017-03-21 2024-05-17 诺信公司 改装灯组件和具有集成或改装灯的粉末喷枪
CN109443406B (zh) * 2018-10-19 2021-04-09 中国科学院深圳先进技术研究院 声学流体传感器
CN112782174A (zh) * 2020-12-25 2021-05-11 西南化工研究设计院有限公司 一种高频无极氩放电离子化检测器及气体中硫、磷化合物的分析方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4300834A (en) * 1980-05-22 1981-11-17 Baird Corporation Inductively coupled plasma atomic fluorescence spectrometer
US4362936A (en) * 1979-11-26 1982-12-07 Leybold-Heraeus Gmbh Apparatus for monitoring and/or controlling plasma processes

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US3492074A (en) * 1967-11-24 1970-01-27 Hewlett Packard Co Atomic absorption spectroscopy system having sample dissociation energy control
JPS5532317A (en) * 1978-08-28 1980-03-07 Asahi Chemical Ind High frequency magnetic field coupling arc plasma reactor
JPS61161138A (ja) * 1985-01-09 1986-07-21 Natl Inst For Res In Inorg Mater プラズマ利用化学反応装置
DE3521529A1 (de) * 1985-06-15 1987-01-02 Harald Dipl Chem Dr Berndt Vorrichtung zum zerstaeuben von probenfluessigkeit fuer spektroskopische zwecke
JPS62213056A (ja) * 1986-03-14 1987-09-18 Yokogawa Electric Corp 高周波誘導結合プラズマを用いた分析装置
JPH0624112B2 (ja) * 1986-04-16 1994-03-30 横河電機株式会社 高周波誘導結合プラズマ・質量分析計
JPS62273047A (ja) * 1986-05-22 1987-11-27 Natl Inst For Res In Inorg Mater 燃焼炎複合高周波熱プラズマ発生装置
US4955717A (en) * 1986-12-02 1990-09-11 Geochemical Services, Inc. Demand modulated atomization apparatus and method for plasma spectroscopy
JPS63158799A (ja) * 1986-12-22 1988-07-01 日本高周波株式会社 多段無電極高周波プラズマ反応装置
JPH0781953B2 (ja) * 1990-02-07 1995-09-06 川崎製鉄株式会社 分析試料の原子化方法
GB9226335D0 (en) * 1992-12-17 1993-02-10 Fisons Plc Inductively coupled plasma spectrometers and radio-frequency power supply therefor
US5194731A (en) * 1990-07-24 1993-03-16 Varian Associates, Inc. Inductively coupled plasma spectroscopy
JPH05119006A (ja) * 1991-10-30 1993-05-14 Mitsubishi Heavy Ind Ltd 炭化水素濃度測定装置
JPH05142200A (ja) * 1991-11-20 1993-06-08 Sumitomo Electric Ind Ltd 元素分析法
US5217362A (en) * 1991-12-30 1993-06-08 Thompson Richard E Method for enhanced atomization of liquids
JP3116151B2 (ja) * 1993-03-05 2000-12-11 セイコーインスツルメンツ株式会社 加熱気化誘導結合プラズマ質量分析装置
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JP2003168594A (ja) * 2001-11-29 2003-06-13 High Frequency Heattreat Co Ltd 高周波熱プラズマ装置
JP2003168595A (ja) * 2001-11-29 2003-06-13 High Frequency Heattreat Co Ltd 高周波熱プラズマ装置
JP4636800B2 (ja) * 2002-03-08 2011-02-23 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． プラズマ質量分析計
JP2005525234A (ja) * 2002-05-08 2005-08-25 ダナ・コーポレーション プラズマの支援によりガスを生成する方法および装置

Patent Citations (2)

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US4362936A (en) * 1979-11-26 1982-12-07 Leybold-Heraeus Gmbh Apparatus for monitoring and/or controlling plasma processes
US4300834A (en) * 1980-05-22 1981-11-17 Baird Corporation Inductively coupled plasma atomic fluorescence spectrometer

Non-Patent Citations (1)

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Title
See also references of EP1891407A4 *

Also Published As

Publication number Publication date
AU2006259381B2 (en) 2012-01-19
CN102291921B (zh) 2014-09-17
EP1891407A2 (fr) 2008-02-27
CA2608528C (fr) 2014-12-23
WO2006138441A2 (fr) 2006-12-28
CA2608528A1 (fr) 2006-12-28
EP1891407A4 (fr) 2009-09-23
JP2008544454A (ja) 2008-12-04
CN102291921A (zh) 2011-12-21
AU2006259381A1 (en) 2006-12-28

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