WO2006049330A1 - Exposure equipment - Google Patents
Exposure equipment Download PDFInfo
- Publication number
- WO2006049330A1 WO2006049330A1 PCT/JP2005/020679 JP2005020679W WO2006049330A1 WO 2006049330 A1 WO2006049330 A1 WO 2006049330A1 JP 2005020679 W JP2005020679 W JP 2005020679W WO 2006049330 A1 WO2006049330 A1 WO 2006049330A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- exposure
- support
- peeling
- photosensitive material
- photosensitive layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70991—Connection with other apparatus, e.g. multiple exposure stations, particular arrangement of exposure apparatus and pre-exposure and/or post-exposure apparatus; Shared apparatus, e.g. having shared radiation source, shared mask or workpiece stage, shared base-plate; Utilities, e.g. cable, pipe or wireless arrangements for data, power, fluids or vacuum
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2051—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70791—Large workpieces, e.g. glass substrates for flat panel displays or solar panels
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70983—Optical system protection, e.g. pellicles or removable covers for protection of mask
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0073—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces
- H05K3/0082—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces characterised by the exposure method of radiation-sensitive masks
Definitions
- the present invention provides an exposure for exposing a predetermined pattern such as a wiring pattern of a printed wiring board to a photosensitive layer of a plate-like laminate formed by laminating a photosensitive layer and a support by a light beam emitted from a laser light source. It relates to the device. Background art
- a photosensitive film in which a photosensitive layer such as a resist layer or a color filter layer is laminated on a support.
- a photosensitive film has a photosensitive layer side attached to, for example, a glass substrate. After forming a plate-like laminate, the support is peeled off from the plate-like laminate, and only the photosensitive layer is laminated on the glass substrate.
- the support is peeled off from the plate-like laminate and only the resist layer is formed on the glass substrate.
- the laminated film is put into the exposure process and the photosensitive film constituting the plate-like laminate is a laminate of a color filter layer as a photosensitive layer, the support is peeled off from the plate-like laminate. Then, only the color filter layer is laminated on the glass substrate, and it is put into the next exposure process. --Then, a photopolymerization reaction occurs in the exposed portion of the photosensitive layer by the exposure process, and the photosensitive layer is cured. Then, a pattern is formed on the substrate by development and etching.
- the support also called force per film or protective film
- the present invention has been made in view of the above circumstances, and an object of the present invention is to minimize the reaction of the photosensitive layer with oxygen in the plate-like laminate having the support peeled off.
- An exposure apparatus exposes a predetermined pattern to a photosensitive layer in a plate-like laminate formed by laminating a photosensitive film formed by laminating a photosensitive layer and a support on a substrate. Exposure means to perform,
- a transport unit that transports the plate-shaped laminate to the exposure unit along a predetermined transport path; and the support body that is provided on the upstream side of the exposure unit in the predetermined transport path. It has the peeling means which peels.
- the exposure apparatus further includes oxygen partial pressure reducing means for reducing the oxygen partial pressure in the vicinity of the photosensitive layer after peeling off the support to 80% or less of the atmospheric oxygen partial pressure. You may do it.
- the oxygen partial pressure reducing means may be means for reducing the pressure in the apparatus.
- oxygen partial pressure reducing means may be a means for ejecting an inert gas toward the plate-like laminate.
- the peeling means for peeling the support from the plate-like laminate is provided upstream of the exposure means in the exposure apparatus, the plate-like laminate from which the support has been peeled is immediately transported to the exposure means. Will be.
- the plate-like laminate with the support peeled off is exposed to the atmosphere.
- the reaction of the photosensitive layer with oxygen can be minimized. Therefore, the sensitivity of the photosensitive layer to light can be prevented from decreasing, and the pattern can be exposed satisfactorily.
- reaction between the photosensitive layer and oxygen can be further reduced by setting the oxygen partial pressure in the vicinity of the photosensitive layer after peeling the support to 80% or less of the oxygen partial pressure at atmospheric pressure.
- FIG. 1 is a perspective view showing the appearance of an exposure apparatus according to an embodiment of the present invention.
- Figure 2 is an enlarged cross-sectional view of the photosensitive material.
- FIG. 3 is a diagram showing a configuration of a peeling portion of the peeling device.
- 4A to 4D are diagrams showing a process of peeling a support with an adhesive roll.
- FIG. 5 is a perspective view showing a scanner used in the exposure apparatus of FIG.
- 6A and 6B are a plan view A showing exposed areas formed on the photosensitive material, and a figure B showing the arrangement of exposure areas by each exposure head.
- FIG. 7 is a perspective view showing a schematic configuration of an exposure head in the exposure apparatus of FIG.
- FIG. 8 is a cross-sectional view along the optical axis showing the configuration of the exposure head shown in FIG. Fig. 9 is a partially enlarged view of a digital micromirror device (DMD).
- DMD digital micromirror device
- FIG. 10A and FIG. 10B are explanatory diagrams for explaining the operation of the DMD.
- Fig. 11 is a diagram showing the configuration of a scanner provided with nozzles that eject inert gas. -Preferred form for carrying out the invention
- FIG. 1 is a perspective view showing the appearance of an exposure apparatus according to an embodiment of the present invention.
- the exposure apparatus 1 according to the present embodiment includes a plate-like stage 15 2 that adsorbs and holds a sheet-like photosensitive material 150 on the surface.
- two guides 1 5 8 extending along the stage moving direction are installed on the upper surface of the thick plate-like installation table 1 5 6 supported by the four legs 15 4.
- the stage 15 2 is arranged so that the longitudinal direction thereof faces the stage moving direction, and is supported by the guide 15 8 so as to be reciprocally movable.
- the exposure apparatus 1 is provided with a drive device (not shown) for driving the stage 15 2 along the guide 15 8.
- a U-shaped gate 160 is provided at the center of the installation table 1556 so as to straddle the movement path of the stage 1552. Each of the ends of the U-shaped gate 160 is fixed to both side surfaces of the installation table 1556.
- a scanner 1 62 and a peeling device 1 80 are provided on one side of the gate 1 60 and a plurality of photosensitive materials 1 5 0 are detected on the other side. There are (for example, two) detection sensors 1 6 4.
- the scanner 1 6 2 and the detection sensor 1 6 4 are respectively attached to the gate 1 60 and fixedly arranged above the moving path of the stage 1 5 2.
- the peeling device 1 80 is attached to the gate 1 60 via the scanner 1 6 2 and fixedly arranged above the moving path of the stage 1 5 2.
- the scanner 162, the detection sensor 1664, and the peeling apparatus 180 are connected to a controller (not shown) that controls them.
- a cover 120 for shielding the photosensitive material 150 and the atmosphere is provided above the installation table 1556. Stage 15 2, guide 1 5 8, part of gate 1 6 0, scanner 1 6 2, detection sensor 1 6 4 and peeling device 1 80 will be installed in cover 1 2 0 . Further, a vacuum pump 1 2 2 for reducing the pressure in the cover 1 2 0 is connected to the force par 1 2 0. The vacuum pump 1 2 2 uses a controller (not shown) to depressurize the space in the cover 1 2 0, and the oxygen partial pressure in the vicinity of the photosensitive material 1 5 0 after the support 4 3 is peeled off. It is controlled so that it is 80% or less.
- FIG. 2 is an enlarged cross-sectional view of the photosensitive material 150 used in this embodiment.
- the photosensitive material 1 50 is composed of a resist film 4 2, which is a photosensitive layer that is cured by light irradiation, and a support 4 3. It is configured by sticking the side on the substrate 41.
- the substrate 41 is made of glass, and the support 4 3 is made of a PET resin film.
- FIG. 3 is a diagram showing the configuration of the peeling portion of the peeling apparatus 180
- FIG. 4 is a diagram showing the process of peeling the support with an adhesive roll.
- Peeling device 1 80 is designed so that each of the adhesive rolls 2 3 with outer peripheral surface 2 4 made of adhesive material and each adhesive roll 2 3 can rotate around each axis 2 3 C
- the adhesive rolls 2 3 are arranged in a ferris wheel around the rotary shaft 3 5, and the adhesive roll rotation transfer unit 30 for rotating and transferring the adhesive rolls 2 3 around the rotary shaft 3 5 It has.
- the peeling device 1 80 includes a support removing part 10 for removing the support 4 3 scraped off from the adhesive roll 23 after the peeling operation and the support 4 3 from the adhesive roll 23. And a cleaning section 15 for cleaning the removed adhesive roll 2 3.
- the adhesive roll rotation transfer unit 30 is disposed on the upper side of the conveyance path of the photosensitive material 15 50, and a pair of turret plates 3 4 disposed opposite to both sides in the width direction of the photosensitive material 15 50 to be conveyed. Equipped.
- the rotary shaft 35 supports the turret plate 34 in a rotatable manner by a rotary motor (not shown) through a bearing (not shown).
- leg portions 3 6 are projected at equal intervals on the peripheral portion of the turret plate 3 4, and the adhesive roll 2 3 is spaced between the opposite ends of the leg portions 3 6 and the photosensitive material 1 5 0, respectively. It is pivotally supported so as to be in contact with the direction.
- the support removing roll 1 1 constituting the support removing part 1 0 is formed by applying a highly adhesive material, for example, an outer peripheral surface coated with an adhesive having a high adhesive force, and transferring the adhesive roll.
- the feeding unit 30 is arranged directly above the rotating shaft 35 (support removal position H in FIG. 3) so that it can come into contact with each adhesive roll 23 from above. It is configured to rotate clockwise (in the direction of the arrow in the figure) by a drive unit (not shown). Therefore, the support body 4 3 peeled off by each adhesive roll 23 and wound around its peripheral surface is adhered to the support body removal position H shown in FIG. It is attached and peeled off from the peripheral surface of the adhesive roll 23.
- the cleaning roll 1 6 constituting the cleaning unit 15 is located directly beside the rotary shaft 3 5, that is, at the same level in the side view of FIG. 3, and more sensitive than the adhesive rolls 2 3. Arranged upstream in the conveying direction, that is, upstream of the separation execution position J, and rotated clockwise in FIG. 3 by a drive unit (not shown).
- the support 4 is supported by the support removing roll 11.
- the adhesive rolls 23 from which the 3 has been peeled off are interviewed from the horizontal direction to remove dust adhering to the surfaces of the adhesive rolls 23 and maintain and improve the degree of adhesion.
- the scanner 1 6 2 includes a plurality of (eg, 14) exposure heads 1 6 6 arranged in a matrix of m rows and n columns (eg, 3 rows and 5 columns). I have. In this example, four exposure heads 1 6 6 are arranged in the third row in relation to the width of the photosensitive material 150. Is placed. When individual exposure heads are arranged in the m-th row and the n-th column, they are expressed as exposure head 16 6 mn .
- the exposure area 1 6 8 by the exposure head 1 6 6 has a rectangular shape with the short side in the sub-scanning direction. Therefore, as the stage 15 2 moves, a strip-shaped exposed region 170 is formed in the photosensitive material 150 for each exposure head 16 6. In addition, when the exposure area by each exposure head arranged in the m-th row and the n-th column is indicated, it is expressed as an exposure area 1 68 8 mn .
- each of the exposure heads of each row arranged in a line is arranged so that the strip-shaped exposed areas 170 are aligned without gaps in the direction orthogonal to the sub-scanning direction. They are arranged at predetermined intervals in the column direction (natural number times the long side of the exposure area, twice in this embodiment). For this reason, the portion between the exposure area 1 6 8 ⁇ in the first row and the exposure area 1 6 8 1 2 that cannot be exposed is the exposure area 1 6 8 2 1 in the second row and the exposure area 1 6 in the third row. 8 3 1 and exposure is possible.
- each of the exposure heads 1 6 6 ⁇ ⁇ to 1 6 6 mn is a spatial light modulator that modulates the incident light beam for each pixel in accordance with image data. Equipped with a digital 'micromirror' device (DMD) 50.
- DMD 50 is connected to a controller (not shown) having a data processing unit and a mirror drive control unit. The data processing section of this controller uses each input head 1 based on the input image data.
- a control signal for driving and controlling each micromirror in the region to be controlled of DMD 50 is generated every 6th.
- the area to be controlled will be described later.
- the mirror drive control unit controls the angle of the reflection surface of each micromirror of the DMD 50 for each exposure head 16 6 based on the control signal generated by the image data processing unit. The control of the angle of the reflecting surface will be described later.
- DM D 50 On the light incident side of DM D 50, there is one mercury lamp 6 6 and a lens system 6 that collects the light emitted from this mercury lamp 6 6 on the DM D 50 after collecting the light intensity distribution. 7.
- a mirror 69 that reflects the light passing through the lens system 67 toward the DMD 50 is arranged in this order. In FIG. 7, the lens system 67 is schematically shown.
- the lens system 6 7 includes a collimator lens 7 1 that collimates the light emitted from the filament 6 6 a of the mercury lamp 6 6 and collected on the front side by the reflector 6 6 b.
- Micro-block inserted in the optical path of the light that passed through this collimator lens 71 Raiai lens 7 2, another micro fly's eye lens 7 3 arranged facing this micro fly's eye lens 72, and the front of this micro fly's eye lens 73, that is, the mirror 6 9 side Consists of a yield lens 7-4.
- Microphone mouth fly-eye lenses 7 2 and 7 3 have many microlens cells arranged vertically and horizontally.
- the light that has passed through each of these micro lens cells is incident on the D MD 50 in a state where they overlap each other, the light quantity distribution of the light that irradiates the D MD 50 becomes uniform.
- a lens system 51 that images the light reflected by DMD 50 on the scanning surface (exposed surface) 56 of the photosensitive material 15 50 is disposed on the light reflection side of D M D 50.
- the lens system 5 1 is arranged so that D M D 50 and the exposed surface 56 have a conjugate relationship. This lesbian 5 1
- the enlarged imaging optical system including two lenses 5 2 and 5 4 and two lenses 5 7 and 5 8 is composed of an image forming optical system, a microlens array 55 inserted between these optical systems, and an aperture array 59.
- the above-described microlens array 55 includes a large number of microphone opening lenses 55a corresponding to the respective pixels of the DMD 50. Aperture 7 "Ray 5 9
- .5 is formed by forming a large number of 7 "notches 59a corresponding to the respective microphone mouth lenses 55a of the microphone mouth lens array 55.
- the DMD 50 is formed by placing a minute mirror (micromirror) 6 2 on a SR AM cell (memory cell) 60 supported by a support.
- This is a mirror device configured by arranging a large number of (for example, 600 ⁇ 800) micro-mirrors constituting a pixel in a f-shape.
- Each pixel is provided with a microphone mirror 62 supported on a support column at the top, and a highly reflective material such as aluminum is deposited on the surface of the micromirror 62.
- the reflectivity of the micromirror 62 is 90% or more.
- a silicon gate CMOS SRAM cell 60 manufactured by a normal semiconductor memory manufacturing process is arranged via a pillar including a hinge and a yoke. It is structured monolithically (integrated).
- the micromirror 6 2 supported by the support column has a soil ⁇ degree (with respect to the substrate side on which the D MD 50 is placed centered on the diagonal line ( For example, it can be tilted within a range of ⁇ 10 degrees.
- Fig. 10 0 ⁇ shows a state tilted to + ⁇ degrees when the micro mirror 6 2 is on
- Fig. 10 B shows that the micro mirror 6 2 is off. It shows a state tilted at a certain ⁇ degree. Therefore, according to the image signal, the inclination of the micromirror 62 in each pixel of the DMD 50 is controlled as shown in FIG. 9.
- FIG. 9 shows an example in which a part of the DMD 50 is enlarged and the micromirror 6 ′ 2 is controlled to + ⁇ degrees or once.
- the on / off control of each micromirror 62 is performed by a controller (not shown) connected to the DMD 50.
- a light absorber (not shown) is arranged in the direction in which the light beam is reflected by the off-state micromirror 62.
- the force component 1 is adjusted so that the oxygen partial pressure in the vicinity of the photosensitive material 1 5 0 after peeling the support 4 3 is 80% or less of the oxygen partial pressure of atmospheric pressure. 2 Depressurize the space inside O.
- the stage 1 5 2 having the photosensitive material 1 5 50 adsorbed on the surface is moved at a constant speed from the upstream side to the downstream side of the gate 1 6 6 along the guide 1 58 by a driving device I (not shown). Then, when the stage 15 2 passes under the peeling device 180, the support 4 3 is peeled off. As shown in FIGS. 4A to 4D, the adhesive roll 23 rotates in the direction of the arrow shown in the figure, and peels off the support 4 3 constituting the photosensitive material 1 5 50 that is adsorbed to the stage 1 5 2 and conveyed. (See Figure 4A). After that, 1 occupying port 2 3 continues to scrape off the support 4 3 peeled while pressing the photosensitive material 1 5 0 (see Fig.
- the light in the wave 3 60 to 4 20 nm band emitted from the mercury lamp 66 shown in FIG. 7 and FIG. 8 passes through the lens system 67 as described above, and the light quantity distribution is made uniform.
- DMD 50 is irradiated.
- Image data corresponding to the exposure pattern is input to a controller (not shown) connected to the DMD 50 and stored in a frame memory in the controller. 5
- This image data is the data representing the density of each pixel composing the image in binary (whether or not dots are recorded).
- the detection sensor 1 6 4 attached to the gate 1 6 When the leading edge of the material 150 is detected, the image data stored in the frame memory is sequentially read out for a plurality of lines, and each exposure is performed by the data processing unit based on the read image data. A control signal is generated for each head 1 6 6. Then, the mirror drive control unit performs on / off control of each of the micro mirrors of the DMD 50 for each exposure head 16 6 based on the generated control signal.
- the light reflected by the micromirror in the DMD 50 ON state .5 is collected by the lens system 51 and is then photosensitive material 15 Focus on the exposed surface 5 6 of 0.
- the light emitted from the mercury lamp 6 6 power is turned on / off for each microphone opening mirror of the DMD 50, and the pixel unit is approximately the same number as the number of pixels used in the photosensitive material 15 500 DMD 50.
- the exposure is performed in (exposure area 1 6 8).
- the photosensitive material 1 5 0 is moved together with the stage 1 5 2 at a constant speed, so that the photosensitive material 1 5 ⁇ is sub-scanned in the direction opposite to the stage moving direction by the scanner 1 6
- a strip-shaped exposed region 1 7 0 is formed every 1 6 6.
- stage 1 5 2 is not shown in the figure. Returns to the origin on the most upstream side of the gate 1 6 0 along the guide 1 5 8 and is again moved at a constant speed from the upstream side to the downstream side of the gate 1 60 along the guide 1 5 8.
- the exposed photosensitive material 150 is developed and further etched to form a wiring pattern.
- the peeling device 1 80 is provided on the upstream side in the transport direction of the photosensitive material 1 50 of the scanner 1 6 2 in the exposure device 1, so The photosensitive material 1 5 0 is immediately exposed.
- the reaction between the resist layer and oxygen can be reduced. Is possible.
- the oxygen partial pressure of atmospheric pressure is 80% or less.
- an inert gas such as nitrogen gas onto the photosensitive material 1 5 0 from which the support 4 3 was peeled off
- the oxygen partial pressure in the vicinity of the photosensitive material 150 may be 80% or less of the oxygen partial pressure at atmospheric pressure.
- an inert gas supply device 1 90 and a nozzle 1 9 1 connected to the inert gas nozzle 5 for ejecting inert gas are provided, and an inert gas supply device is provided by a controller (not shown).
- the photosensitive material after the support 4 3 is peeled off by controlling the driving of the photosensitive material 1 5 0 from the nozzle 1 9 1 so that the oxygen partial pressure in the vicinity of 80 is equal to or less than 80% of the atmospheric oxygen partial pressure. Inert gas is spouted toward 1 5 0.
- the oxygen partial pressure in the vicinity of the photosensitive material 1 5 0 after peeling off the support body 0 4 3 can be reduced to atmospheric pressure oxygen by ejecting an inert gas toward the photosensitive material 1 5 0.
- the partial pressure can be reduced to 80% or less, whereby the reaction between the resist layer 42 and oxygen can be further reduced.
- the photosensitive material 150 for producing a printed wiring board is used.
- a color filter for a liquid crystal panel in which a glass substrate is laminated as a substrate and a color filter film is laminated as a photosensitive layer.
- a predetermined pattern can be exposed on the color filter film immediately after the support is peeled off, as in the above embodiment.
- the pattern is exposed using the light beam.
- the light emitted from the surface exposure light source using a mask having a transmissive portion corresponding to the pattern shape and the surface exposure light source is used. Is applied to the photosensitive material 1 5 0 through the mask to obtain the photosensitive material 1 5
- the pattern may be exposed to zero.
- a mercury lamp is used as the light source of the exposure apparatus 1, but a laser light source may be used.
- an exposure apparatus that performs exposure on a printed wiring board has been described.
- the present invention is not limited to this, and color filters, pillar materials, rib materials, spacers, partition walls, and the like are not limited thereto.
- the exposure apparatus of the present invention can also be applied to the case of exposing a recording material for pattern formation such as a display material, a hologram, or a micromachine opto-proof.
- the present invention is not limited to the above-described embodiment, and as an optical scanning optical system as disclosed in Japanese Patent Application Laid-Open No. 2 00 0-2 2 7 6 6 1, a laser light source, a laser light source Various modifications can be made without departing from the scope of the present invention, such as an exposure apparatus using an AOM that performs optical modulation and a polygon mirror.
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Abstract
Description
明細書 Specification
露光装置 技術分野 Technical field of exposure equipment
本発明は、 レーザ光源から発せられた光ビーム等によりプリント配線板の配線パター ン等の所定のパターンを、 感光層と支持体とを積層してなる板状積層体の感光層に露光 する露光装置に関するものである。 背景技術 The present invention provides an exposure for exposing a predetermined pattern such as a wiring pattern of a printed wiring board to a photosensitive layer of a plate-like laminate formed by laminating a photosensitive layer and a support by a light beam emitted from a laser light source. It relates to the device. Background art
従来より、 レジスト層あるいはカラーフィルタ層等の感光層を支持体上に積層した感 光フィルムが知られており、 このような感光フィルムは、 感光層の側が、 例えばガラス 基板上に貼り付けられて板状の積層体とされた後、 この板状積層体から支持体を剥離し て、 ガラス基板に感光層のみが積層された状態で利用されている。 Conventionally, there has been known a photosensitive film in which a photosensitive layer such as a resist layer or a color filter layer is laminated on a support. Such a photosensitive film has a photosensitive layer side attached to, for example, a glass substrate. After forming a plate-like laminate, the support is peeled off from the plate-like laminate, and only the photosensitive layer is laminated on the glass substrate.
例えば、 上記板状積層体を構成する感光フィルムが感光層としてレジスト層を積層し たものである場合には、 この板状積層体から支持体が剥離されてガラス基板上にレジス ト層のみが積層された状態で露光工程に投入され、 また、 板状積層体を構成する感光フ イルムが感光層としてカラーフィルタ層を積層したものである場合には、 この板状積層 体から支持体が剥離されてガラス基板上にカラーフィルタ層のみが積層された状態で次 の露光工程に投入される。 - - そして露光工程により感光層における露光がなされた部分において光重合反応が生じ、 これにより感光層が硬化する。 さらにその後、 現像およびエッチングにより、 基板にパ ターンが形成される。 For example, when the photosensitive film constituting the plate-like laminate is a laminate of a resist layer as a photosensitive layer, the support is peeled off from the plate-like laminate and only the resist layer is formed on the glass substrate. When the laminated film is put into the exposure process and the photosensitive film constituting the plate-like laminate is a laminate of a color filter layer as a photosensitive layer, the support is peeled off from the plate-like laminate. Then, only the color filter layer is laminated on the glass substrate, and it is put into the next exposure process. --Then, a photopolymerization reaction occurs in the exposed portion of the photosensitive layer by the exposure process, and the photosensitive layer is cured. Then, a pattern is formed on the substrate by development and etching.
ところで、 上記のように基板の表面に支持体 (力パーフィルム、 あるいは保護フィル ムともいう) が積層された板状積層体においては、 露光工程において支持体が不要とな るため、 板状積層体から支持体を剥離する必要がある。 By the way, in the plate-like laminate in which the support (also called force per film or protective film) is laminated on the surface of the substrate as described above, the support is not necessary in the exposure process. It is necessary to peel the support from the body.
このように板状積層体から支持体を剥離する方式として、 搬送される板状積層体の支 持体の側を粘着口ールの外周面で粘着し剥離して支持体をこの粘着口一ルに卷き取るも のが知られている (特開 2 0 0 1— 2 4 0 3 0 5号公報、 特開平 6— 2 8 2 0 7 6号公 報参照) 。 また、 従来、 デジタル'マイクロミラー 'デバイス (D MD ) 等の空間光変調素子を 利用して、 画像データに応じて変調された光ビームにより画像露光を行う露光装置が種 々提案されている。 このような露光装置の用途の一つとして、 プリント配線板の製造ェ 程における利用が知られている (例えば特開 2 0 0 4— 1 2 4 4号公報参照) 。 As a method of peeling the support from the plate-like laminate in this way, the support side of the plate-like laminate to be conveyed is adhered and peeled off with the outer peripheral surface of the adhesive mouthpiece, and the support is removed from the adhesive mouth. (See Japanese Laid-Open Patent Publication Nos. 2000-201 and 2005-6-28076). Conventionally, various exposure apparatuses that perform image exposure using a light beam modulated in accordance with image data using a spatial light modulator such as a digital 'micromirror' device (DMD) have been proposed. As one of the applications of such an exposure apparatus, use in a manufacturing process of a printed wiring board is known (see, for example, Japanese Patent Laid-Open No. 2000-0124 44).
ところで、 板状積層体から支持体を剥離すると、 感光層が大気に晒されるため、 感光 層が酸素と反応してしまうことから、 露光工程において感光層の光重合反応が阻害され てしまうという問題がある。 このため、 剥離装置により支持体を剥離した後は、 できる だけ早く露光工程に板状積層体を搬送する必要がある。 しかしながら、 搬送中において も板状積層体は大気に晒されてしまうことから、 感光層の酸素との反応を完全に防止す ることはできなかった。 発明の開示 By the way, if the support is peeled off from the plate-like laminate, the photosensitive layer is exposed to the atmosphere, and the photosensitive layer reacts with oxygen, so that the photopolymerization reaction of the photosensitive layer is hindered in the exposure process. There is. For this reason, after peeling a support body with a peeling apparatus, it is necessary to convey a plate-shaped laminated body to an exposure process as soon as possible. However, since the plate-like laminate is exposed to the atmosphere even during transportation, the reaction of the photosensitive layer with oxygen could not be completely prevented. Disclosure of the invention
本発明は上記事情に鑑みなされたものであり、 支持体が剥離された板状積層体におけ る感光層の酸素との反応をできるだけ小さくすることを目的とする。 The present invention has been made in view of the above circumstances, and an object of the present invention is to minimize the reaction of the photosensitive layer with oxygen in the plate-like laminate having the support peeled off.
本発明による露光装置は、 感光層と支持体とを積層してなる感光フィルムを前記感光 層の側を基板上に貼り付けて構成した板状積層体における該感光層に、 所定のパターン を露光する露光手段と、 An exposure apparatus according to the present invention exposes a predetermined pattern to a photosensitive layer in a plate-like laminate formed by laminating a photosensitive film formed by laminating a photosensitive layer and a support on a substrate. Exposure means to perform,
所定の搬送経路に沿って該露光手段に前記板状積層体を搬送する搬送手段と、 前記所定の搬送経路における前記露光手段の上流側に設けられた、 前記板状積層体か ら前記支持体を剥離する剥離手段とを備えたことを特徴とするものである。 A transport unit that transports the plate-shaped laminate to the exposure unit along a predetermined transport path; and the support body that is provided on the upstream side of the exposure unit in the predetermined transport path. It has the peeling means which peels.
なお、 本発明による露光装置においては、 前記支持体を剥離した後の前記感光層近傍 の酸素分圧を大気圧の酸素分圧の 8 0 %以下に低減する酸素分圧低減手段をさらに備え るようにしてもよい。 The exposure apparatus according to the present invention further includes oxygen partial pressure reducing means for reducing the oxygen partial pressure in the vicinity of the photosensitive layer after peeling off the support to 80% or less of the atmospheric oxygen partial pressure. You may do it.
この場合、 前記酸素分圧低減手段を、 装置内を減圧する手段としてもよい。 In this case, the oxygen partial pressure reducing means may be means for reducing the pressure in the apparatus.
また、 前記酸素分圧低減手段を、 前記板状積層体に向けて不活性ガスを噴出する手段 としてもよ 、。 Further, the oxygen partial pressure reducing means may be a means for ejecting an inert gas toward the plate-like laminate.
本発明によれば、 板状積層体から支持体を剥離する剥離手段を、 露光装置内における 露光手段の上流側に設けたため、 支持体が剥離された板状積層体は露光手段へ直ちに搬 送されることとなる。 これにより、 支持体が剥離された板状積層体が大気に晒される時 間を極力少なくすることができ、 その結果、 感光層の酸素との反応をできるだけ少なく することができる。 したがって、 感光層の光に対する感度の低下を防止し、 パターンの 露光を良好に行うことができる。 According to the present invention, since the peeling means for peeling the support from the plate-like laminate is provided upstream of the exposure means in the exposure apparatus, the plate-like laminate from which the support has been peeled is immediately transported to the exposure means. Will be. As a result, when the plate-like laminate with the support peeled off is exposed to the atmosphere. As a result, the reaction of the photosensitive layer with oxygen can be minimized. Therefore, the sensitivity of the photosensitive layer to light can be prevented from decreasing, and the pattern can be exposed satisfactorily.
とくに、 支持体を剥離した後の感光層近傍の酸素分圧を大気圧の酸素分圧の 8 0 %以 下とすることにより、 感光層と酸素との反応をより少なくすることができる。 図面の簡単な説明 In particular, the reaction between the photosensitive layer and oxygen can be further reduced by setting the oxygen partial pressure in the vicinity of the photosensitive layer after peeling the support to 80% or less of the oxygen partial pressure at atmospheric pressure. Brief Description of Drawings
図 1は、 本発明の実施の形態による露光装置の外観を示す斜視図。 FIG. 1 is a perspective view showing the appearance of an exposure apparatus according to an embodiment of the present invention.
図 2は、 感光材料の拡大断面図。 Figure 2 is an enlarged cross-sectional view of the photosensitive material.
図 3は、 剥離装置の剥離部分における構成を示す図。 FIG. 3 is a diagram showing a configuration of a peeling portion of the peeling device.
図 4 Aから図 4 Dは、 粘着ロールで支持体を剥離していく過程を示す図。 4A to 4D are diagrams showing a process of peeling a support with an adhesive roll.
図 5は、 図 1の露光装置に用いられるスキャナを示す斜視図。 FIG. 5 is a perspective view showing a scanner used in the exposure apparatus of FIG.
図 6 Aと図 6 Bは、 感光材料に形成される露光済み領域を示す平面図 Aと、 各露光へ ッドによる露光エリアの配列を示す図 B。 6A and 6B are a plan view A showing exposed areas formed on the photosensitive material, and a figure B showing the arrangement of exposure areas by each exposure head.
図 7は、 図 1の露光装置における露光ヘッドの概略構成を示す斜視図。 FIG. 7 is a perspective view showing a schematic configuration of an exposure head in the exposure apparatus of FIG.
図 8は、 図 7に示す露光へッドの構成を示す光軸に沿った副走查方向の断面図。 図 9は、 デジタルマイクロミラーデバイス (D MD ) の部分拡大図。 FIG. 8 is a cross-sectional view along the optical axis showing the configuration of the exposure head shown in FIG. Fig. 9 is a partially enlarged view of a digital micromirror device (DMD).
図 1 0 Aと図 1 0 Bは、 D MDの動作を説明する説明図。 FIG. 10A and FIG. 10B are explanatory diagrams for explaining the operation of the DMD.
図 1 1は、 不活性ガスを噴出するノズルを設けたスキャナの構成を示す図。 - 発明を実施するための好ましい形態 Fig. 11 is a diagram showing the configuration of a scanner provided with nozzles that eject inert gas. -Preferred form for carrying out the invention
以下、 図面を参照して本発明の実施形態について説明する。 図 1は本発明の実施形態 による露光装置の外観を示す斜視図である。 図 1に示すように、 本実施形態による露光 装置 1は、 シート状の感光材料 1 5 0を表面に吸着して保持する平板状のステ ジ 1 5 2を備えている。 また 4本の脚部 1 5 4に支持された厚い板状の設置台 1 5 6の上面に は、 ステージ移動方向に沿って延びた 2本のガイド 1 5 8が設置されている。 ステージ 1 5 2は、 その長手方向がステージ移動方向を向くように配置されると共に、 ガイ ド 1 5 8によって往復移動可能に支持されている。 なお、 この露光装置 1には、 ステージ 1 5 2をガイ ド 1 5 8に沿って駆動するための図示しない駆動装置が設けられている。 設置台 1 5 6の中央部には、 ステージ 1 5 2の移動経路を跨ぐようにコ字状のゲート 1 6 0が設けられている。 コ字状のゲート 1 6 0の端部の各々は、 設置台 1 5 6の両側 面に固定されている。 このゲート 1 6 0を挟んで一方の側にはスキャナ 1 6 2および剥 離装置 1 8 0が設けられ、 他方の側には感光材料 1 5 0の先端おょぴ後端を検知する複 数 (例えば 2個) の検知センサ 1 6 4が設けられている。 スキャナ 1 6 2およぴ検知セ ンサ 1 6 4は各々ゲート 1 6 0に取り付けられて、 ステージ 1 5 2の移動経路の上方に 固定配置されている。 また、 剥離装置 1 8 0はスキャナ 1 6 2を介してゲート 1 6 0に 取り付けられて、 ステージ 1 5 2の移動経路の上方に固定配置されている。 なお、 スキ ャナ 1 6 2、 検知センサ 1 6 4および剥離装置 1 8 0は、 これらを制御する図示しない コントロ一ラに接続されている。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view showing the appearance of an exposure apparatus according to an embodiment of the present invention. As shown in FIG. 1, the exposure apparatus 1 according to the present embodiment includes a plate-like stage 15 2 that adsorbs and holds a sheet-like photosensitive material 150 on the surface. In addition, two guides 1 5 8 extending along the stage moving direction are installed on the upper surface of the thick plate-like installation table 1 5 6 supported by the four legs 15 4. The stage 15 2 is arranged so that the longitudinal direction thereof faces the stage moving direction, and is supported by the guide 15 8 so as to be reciprocally movable. The exposure apparatus 1 is provided with a drive device (not shown) for driving the stage 15 2 along the guide 15 8. A U-shaped gate 160 is provided at the center of the installation table 1556 so as to straddle the movement path of the stage 1552. Each of the ends of the U-shaped gate 160 is fixed to both side surfaces of the installation table 1556. A scanner 1 62 and a peeling device 1 80 are provided on one side of the gate 1 60 and a plurality of photosensitive materials 1 5 0 are detected on the other side. There are (for example, two) detection sensors 1 6 4. The scanner 1 6 2 and the detection sensor 1 6 4 are respectively attached to the gate 1 60 and fixedly arranged above the moving path of the stage 1 5 2. Further, the peeling device 1 80 is attached to the gate 1 60 via the scanner 1 6 2 and fixedly arranged above the moving path of the stage 1 5 2. The scanner 162, the detection sensor 1664, and the peeling apparatus 180 are connected to a controller (not shown) that controls them.
また、 設置台 1 5 6の上方には、 感光材料 1 5 0と大気とを遮蔽するためのカバー 1 2 0が設けられている。 ステージ 1 5 2、 ガイ ド 1 5 8、 ゲート 1 6 0の一部、 スキヤ ナ 1 6 2、 検知センサ 1 6 4および剥離装置 1 8 0は、 カバー 1 2 0内に設けられるこ ととなる。 また、 力パー 1 2 0にはカバー 1 2 0内の空間を減圧するための真空ポンプ 1 2 2が接続されている。 真空ポンプ 1 2 2は不図示のコントローラにより、 カバー 1 2 0内の空間を減圧して、 支持体 4 3を剥離した後の感光材料 1 5 0近傍の酸素分圧を 大気圧の酸素分圧の 8 0 %以下とするように制御される。 A cover 120 for shielding the photosensitive material 150 and the atmosphere is provided above the installation table 1556. Stage 15 2, guide 1 5 8, part of gate 1 6 0, scanner 1 6 2, detection sensor 1 6 4 and peeling device 1 80 will be installed in cover 1 2 0 . Further, a vacuum pump 1 2 2 for reducing the pressure in the cover 1 2 0 is connected to the force par 1 2 0. The vacuum pump 1 2 2 uses a controller (not shown) to depressurize the space in the cover 1 2 0, and the oxygen partial pressure in the vicinity of the photosensitive material 1 5 0 after the support 4 3 is peeled off. It is controlled so that it is 80% or less.
図 2は本実施形態において使用される感光材料 1 5 0の拡大断面図である。 図 2に示 すように、 感光材料 1 5 0は、 光の照射による硬化する感光層であるレジスト層 4 2と 支持体 4 3とを積層してなる感光フィルム 4 5をレジスト層 4 2の側を基板 4 1上に貼 り付けることにより構成されている。 なお、 基板 4 1はガラス、 支持体 4 3は P E T榭 脂製のフィルムからなる。 FIG. 2 is an enlarged cross-sectional view of the photosensitive material 150 used in this embodiment. As shown in FIG. 2, the photosensitive material 1 50 is composed of a resist film 4 2, which is a photosensitive layer that is cured by light irradiation, and a support 4 3. It is configured by sticking the side on the substrate 41. The substrate 41 is made of glass, and the support 4 3 is made of a PET resin film.
次いで、 剥離装置 1 8 0について説明する。 Next, the peeling apparatus 180 will be described.
図 3は剥離装置 1 8 0の剥離部分における構成を示す図、 図 4は粘着ロールで支持体 を剥離していく過程を示す図である。 FIG. 3 is a diagram showing the configuration of the peeling portion of the peeling apparatus 180, and FIG. 4 is a diagram showing the process of peeling the support with an adhesive roll.
剥離装置 1 8 0は、 外周面 2 4が粘着材料で構成された 4つの粘着口ール 2 3と、 各 粘着ロール 2 3のそれぞれが各軸芯 2 3 Cの周りに回転可能となるようにして各粘着口 ール 2 3を回転軸 3 5の周りに観覧車状に配置してなる、 各粘着ロール 2 3を回転軸 3 5の周りに回転移送する粘着ロール回転移送部 3 0とを備えている。 また、 剥離装置 1 8 0は、 剥離動作を終了した粘着ロール 2 3に卷き取られた支持体 4 3を、 この粘着ロール 2 3から取り外す支持体取外し部 1 0と、 支持体 4 3が取り外 された粘着ロール 2 3をクリーニングするクリーユング部 1 5とを備えている。 Peeling device 1 80 is designed so that each of the adhesive rolls 2 3 with outer peripheral surface 2 4 made of adhesive material and each adhesive roll 2 3 can rotate around each axis 2 3 C The adhesive rolls 2 3 are arranged in a ferris wheel around the rotary shaft 3 5, and the adhesive roll rotation transfer unit 30 for rotating and transferring the adhesive rolls 2 3 around the rotary shaft 3 5 It has. Further, the peeling device 1 80 includes a support removing part 10 for removing the support 4 3 scraped off from the adhesive roll 23 after the peeling operation and the support 4 3 from the adhesive roll 23. And a cleaning section 15 for cleaning the removed adhesive roll 2 3.
粘着ロール回転移送部 3 0は、 感光材料 1 5 0の搬送経路上側に配設されており、 搬 送される感光材料 1 5 0の幅方向両側に対向配設された一対のターレツト板 3 4を備え る。 回転軸 3 5はターレット板 3 4を不図示のベアリングを介して、 不図示の回転モー タにより回転自在に支持するものである。 The adhesive roll rotation transfer unit 30 is disposed on the upper side of the conveyance path of the photosensitive material 15 50, and a pair of turret plates 3 4 disposed opposite to both sides in the width direction of the photosensitive material 15 50 to be conveyed. Equipped. The rotary shaft 35 supports the turret plate 34 in a rotatable manner by a rotary motor (not shown) through a bearing (not shown).
ターレット板 3 4の周縁部には脚部 3 6が等間隔に 4個突設されており、 対向する各 脚部 3 6の先端間には粘着ロール 2 3がそれぞれ感光材料 1 5 0と幅方向に接するよう に回転自在に軸支されている。 Four leg portions 3 6 are projected at equal intervals on the peripheral portion of the turret plate 3 4, and the adhesive roll 2 3 is spaced between the opposite ends of the leg portions 3 6 and the photosensitive material 1 5 0, respectively. It is pivotally supported so as to be in contact with the direction.
支持体取外し部 1 0を構成する支持体取外しロール 1 1は高粘着質の材料、 例えば外 周面に高い粘着力を有する接着剤が塗布されて成形されたものであって、 粘着ロール回 転移送部 3 0においては、 各粘着ロール 2 3に上方から接触可能になるように、 回転軸 3 5の真上 (図 3の支持体取外し位置 H) に配設されており、 図 3の反時計方向 (図示 の矢印方向) に、 図示しない駆動部によって回転するように構成されている。 したがつ て、 各粘着ロール 2 3によって剥離されその周面に卷回された支持体 4 3は、 上方から 接触してくる支持体取外しロール 1 1によって、 図示の支持体取外し位置 Hにおいて粘 着され、 粘着ロール 2 3の周面から剥ぎ取られるものである。 The support removing roll 1 1 constituting the support removing part 1 0 is formed by applying a highly adhesive material, for example, an outer peripheral surface coated with an adhesive having a high adhesive force, and transferring the adhesive roll. The feeding unit 30 is arranged directly above the rotating shaft 35 (support removal position H in FIG. 3) so that it can come into contact with each adhesive roll 23 from above. It is configured to rotate clockwise (in the direction of the arrow in the figure) by a drive unit (not shown). Therefore, the support body 4 3 peeled off by each adhesive roll 23 and wound around its peripheral surface is adhered to the support body removal position H shown in FIG. It is attached and peeled off from the peripheral surface of the adhesive roll 23.
クリーニング部 1 5を構成するクリーニングロール 1 6は、 回転軸 3 5の真横、 すな わち図 3の側面視で同レベルに位置し、 かつ各粘着ロール 2 3よりも感光材料 1 5 0の 搬送方向上流側、 すなわち、 剥離実施位置 Jの上流側に配設されて、 図示しない駆動部 によって、 図 3において時計方向に回転させられており、 支持体取外しロール 1 1によ つて支持体 4 3が剥ぎ取られた各粘着ロール 2 3に水平方向から面接して、 各粘着ロー ル 2 3の表面に付着したゴミなどを除去し、 その粘着度を維持向上させるようになって いる。 The cleaning roll 1 6 constituting the cleaning unit 15 is located directly beside the rotary shaft 3 5, that is, at the same level in the side view of FIG. 3, and more sensitive than the adhesive rolls 2 3. Arranged upstream in the conveying direction, that is, upstream of the separation execution position J, and rotated clockwise in FIG. 3 by a drive unit (not shown). The support 4 is supported by the support removing roll 11. The adhesive rolls 23 from which the 3 has been peeled off are interviewed from the horizontal direction to remove dust adhering to the surfaces of the adhesive rolls 23 and maintain and improve the degree of adhesion.
次いで、 スキャナ 1 6 2の構成について説明する。 Next, the configuration of the scanner 16 2 will be described.
スキャナ 1 6 2は、 図 5および図 6 Bに示すように、 m行 n列 (例えば 3行 5列) の 略マトリックス状に配列された複数 (例えば 1 4個) の露光ヘッド 1 6 6を備えている。 この例では、 感光材料 1 5 0の幅との関係で、 3行目には 4個の露光へッド 1 6 6が配 置されている。 なお、 m行目の n列目に配列された個々の露光ヘッドを示す場合は、 露 光へッド 1 6 6 m nと表記する。 As shown in FIG. 5 and FIG. 6B, the scanner 1 6 2 includes a plurality of (eg, 14) exposure heads 1 6 6 arranged in a matrix of m rows and n columns (eg, 3 rows and 5 columns). I have. In this example, four exposure heads 1 6 6 are arranged in the third row in relation to the width of the photosensitive material 150. Is placed. When individual exposure heads are arranged in the m-th row and the n-th column, they are expressed as exposure head 16 6 mn .
露光へッド 1 6 6による露光エリア 1 6 8は、 副走査方向を短辺とする矩形状である。 したがって、 ステージ 1 5 2の移動に伴い、 感光材料 1 5 0には各露光へッド 1 6 6毎 に帯状の露光済み領域 1 7 0が形成される。 なお、 m行目の n列目に配列された個々の 露光へッドによる露光エリアを示す場合は、 露光エリア 1 6 8 m nと表記する。 The exposure area 1 6 8 by the exposure head 1 6 6 has a rectangular shape with the short side in the sub-scanning direction. Therefore, as the stage 15 2 moves, a strip-shaped exposed region 170 is formed in the photosensitive material 150 for each exposure head 16 6. In addition, when the exposure area by each exposure head arranged in the m-th row and the n-th column is indicated, it is expressed as an exposure area 1 68 8 mn .
また、 図 6 Aおよび Bに示すように、 帯状の露光済み領域 1 7 0が副走査方向と直交 する方向に隙間無く並ぶように、 ライン状に配列された各行の露光ヘッドの各々は、 配 列方向に所定間隔 (露光エリアの長辺の自然数倍、 本実施の形態では 2倍) ずらして配 置されている。 このため、 1行目の露光エリア 1 6 8 ^と露光エリア 1 6 8 1 2との間 の露光できない部分は、 2行目の露光エリア 1 6 8 2 1と 3行目の露光エリァ 1 6 8 3 1 とにより露光することができる。 Further, as shown in FIGS. 6A and 6B, each of the exposure heads of each row arranged in a line is arranged so that the strip-shaped exposed areas 170 are aligned without gaps in the direction orthogonal to the sub-scanning direction. They are arranged at predetermined intervals in the column direction (natural number times the long side of the exposure area, twice in this embodiment). For this reason, the portion between the exposure area 1 6 8 ^ in the first row and the exposure area 1 6 8 1 2 that cannot be exposed is the exposure area 1 6 8 2 1 in the second row and the exposure area 1 6 in the third row. 8 3 1 and exposure is possible.
露光へッド 1 6 6 ι ι〜 1 6 6 m nの各々は、 図 7および図 8に示すように、 入射され た光ビームを画像データに応じて各画素毎に変調する空間光変調素子として、 デジタル 'マイクロミラー 'デバイス (D MD ) 5 0を備えている。 この D MD 5 0は、 データ 処理部とミラー駆動制御部とを備えた図示しないコントローラに接続されている。 この コントローラのデータ処理部では、 入力された画像データに基づいて、 各露光ヘッド 1As shown in FIGS. 7 and 8, each of the exposure heads 1 6 6 ι ι to 1 6 6 mn is a spatial light modulator that modulates the incident light beam for each pixel in accordance with image data. Equipped with a digital 'micromirror' device (DMD) 50. This DMD 50 is connected to a controller (not shown) having a data processing unit and a mirror drive control unit. The data processing section of this controller uses each input head 1 based on the input image data.
6 6毎に D MD 5 0の制御すべき領域内の各マイクロミラーを駆動制御する制御信号を 生成する。 なお、 制御すべき領域については後述する。 また、 ミラー駆動制御部では、 画像データ処理部で生成した制御信号に基づいて、 各露光へッド 1 6 6毎に D MD 5 0 の各マイクロミラーの反射面の角度を制御する。 なお、 反射面の角度の制御については 後述する。 6 A control signal for driving and controlling each micromirror in the region to be controlled of DMD 50 is generated every 6th. The area to be controlled will be described later. In addition, the mirror drive control unit controls the angle of the reflection surface of each micromirror of the DMD 50 for each exposure head 16 6 based on the control signal generated by the image data processing unit. The control of the angle of the reflecting surface will be described later.
DM D 5 0の光入射側には、 1個の水銀ランプ 6 6、 この水銀ランプ 6 6から発せら れた光を光量分布捕正した上で DM D 5 0上に集光するレンズ系 6 7、 このレンズ系 6 7を通過した光を D MD 5 0に向けて反射させるミラー 6 9がこの順に配置されている。 なお図 7ではレンズ系 6 7を概略的に示してある。 On the light incident side of DM D 50, there is one mercury lamp 6 6 and a lens system 6 that collects the light emitted from this mercury lamp 6 6 on the DM D 50 after collecting the light intensity distribution. 7. A mirror 69 that reflects the light passing through the lens system 67 toward the DMD 50 is arranged in this order. In FIG. 7, the lens system 67 is schematically shown.
上記レンズ系 6 7は、 図 8に示すように、 水銀ランプ 6 6のフィラメント 6 6 aから 出射してリフレタター 6 6 bにより前方側に集められた光を平行光化するコリメ一ター レンズ 7 1、 このコリメーターレンズ 7 1を通過した光の光路に挿入されたマイクロブ ライアイレンズ 7 2、 このマイクロフライアイレンズ 7 2と向かい合う状態に配設され た別のマイクロフライアイレンズ 7 3、 およびこのマイクロフライアイレンズ 7 3の前 方つまりミラー 6 9側に配置されたブイールドレンズ 7 4から構成されている。 マイク 口フライアイレンズ 7 2および 7 3は、 微小レンズセルが縦横に多数配置さ てなるもAs shown in FIG. 8, the lens system 6 7 includes a collimator lens 7 1 that collimates the light emitted from the filament 6 6 a of the mercury lamp 6 6 and collected on the front side by the reflector 6 6 b. Micro-block inserted in the optical path of the light that passed through this collimator lens 71 Raiai lens 7 2, another micro fly's eye lens 7 3 arranged facing this micro fly's eye lens 72, and the front of this micro fly's eye lens 73, that is, the mirror 6 9 side Consists of a yield lens 7-4. Microphone mouth fly-eye lenses 7 2 and 7 3 have many microlens cells arranged vertically and horizontally.
5 のであり、 それらの微小レンズセルの各々を通過した光がそれぞれ D MD 5 0 に互いに 重なる状態で入射するので、 D MD 5 0を照射する光の光量分布が均一化さ;^る。 また D M D 5 0の光反射側には、 DMD 5 0で反射した光を感光材料 1 5 0 の走査面 (被露光面) 5 6上に結像するレンズ系 5 1が配置されている。 レンズ系 5 1 は、 D M D 5 0と被露光面 5 6とが共役な関係となるように配置されている。 このレ ズ系 5 1Since the light that has passed through each of these micro lens cells is incident on the D MD 50 in a state where they overlap each other, the light quantity distribution of the light that irradiates the D MD 50 becomes uniform. On the light reflection side of D M D 50, a lens system 51 that images the light reflected by DMD 50 on the scanning surface (exposed surface) 56 of the photosensitive material 15 50 is disposed. The lens system 5 1 is arranged so that D M D 50 and the exposed surface 56 have a conjugate relationship. This lesbian 5 1
0 は、 図 7では概略的に示してあるが、 図 8に詳細を示すように、 2枚のレンズ、 5 2, 5 4からなる拡大結像光学系と、 2枚のレンズ 5 7 , 5 8からなる結像光学系と、 これら の光学系の間に挿入されたマイクロレンズアレイ 5 5と、 アパーチャアレイ 5 9とから 構成されている。 上記のマイクロレンズアレイ 5 5は、 D MD 5 0の各画素 ίこ対応する 多数のマイク口レンズ 5 5 aが配置されてなるものである。 またアパーチャ 7"レイ 5 9Although 0 is schematically shown in FIG. 7, as shown in detail in FIG. 8, the enlarged imaging optical system including two lenses 5 2 and 5 4 and two lenses 5 7 and 5 8 is composed of an image forming optical system, a microlens array 55 inserted between these optical systems, and an aperture array 59. The above-described microlens array 55 includes a large number of microphone opening lenses 55a corresponding to the respective pixels of the DMD 50. Aperture 7 "Ray 5 9
.5 は、 マイク口レンズァレイ 5 5の各マイク口レンズ 5 5 aに対応する多数の 7"ノ ーチヤ 5 9 aが形成されてなるものである。 .5 is formed by forming a large number of 7 "notches 59a corresponding to the respective microphone mouth lenses 55a of the microphone mouth lens array 55.
D MD 5 0は、 図 9に示すように、 S R AMセル (メモリセル) 6 0上に、 微小ミラ 一 (マイクロミラー) 6 2が支柱により支持されて配置されたものであり、 面素 (ピク セル) を構成する多数の (例えば、 6 0 0個 X 8 0 0個) の微小ミラ を格 f状に配列 ίθ して構成されたミラーデバイスである。 各ピクセルには、 最上部に支柱に支 られたマ イク口ミラー 6 2が設けられており'、 マイクロミラー 6 2の表面にはアルミニウム等の 反射率の高い材料が蒸着されている。 なお、 マイクロミラー 6 2の反射率は 9 0 %以上 である。 また、 マイクロミラー 6 2の直下には、 ヒンジおよびヨークを含む 柱を介し て通常の半導体メモリの製造プロセスで製造されるシリコンゲートの C MO Sの S R A Mセル 6 0が配置されており、 全体はモノリシック (一体型) に構成されてレヽる。 As shown in FIG. 9, the DMD 50 is formed by placing a minute mirror (micromirror) 6 2 on a SR AM cell (memory cell) 60 supported by a support. This is a mirror device configured by arranging a large number of (for example, 600 × 800) micro-mirrors constituting a pixel in a f-shape. Each pixel is provided with a microphone mirror 62 supported on a support column at the top, and a highly reflective material such as aluminum is deposited on the surface of the micromirror 62. The reflectivity of the micromirror 62 is 90% or more. Directly under the micromirror 62, a silicon gate CMOS SRAM cell 60 manufactured by a normal semiconductor memory manufacturing process is arranged via a pillar including a hinge and a yoke. It is structured monolithically (integrated).
D MD 5 0の S R AMセル 6 0にデジタル信号が書き込まれると、 支柱に支えられた マイクロミラー 6 2が、 対角線を中心として D MD 5 0が配置された基板側に対して土 α度 (例えば ± 1 0度) の範囲で傾けられる。 図 1 0 Αは、 マイクロミラー 6 2がオン 状態である + α度に傾いた状態を示し、 図 1 0 Bは、 マイクロミラー 6 2がオフ状態で ある一 α度に傾いた状態を示す。 したがって、 画像信号に応じて、 D MD 5 0の各ピク セルにおけるマイクロミラー 6 2の傾きを、 図 9に示すように制御すること ίこよって、 D MD 5 0に入射された光はそれぞれのマイクロミラー 6 2の傾き方向へ反衬される。 なお、 図 9には、 D MD 5 0の一部を拡大し、 マイクロミラー 6' 2が + α度又は一ひ 度に制御されている状態の一例を示す。 それぞれのマイクロミラー 6 2のオンオフ制御 は、 D MD 5 0に接続された図示しないコントローラによって行われる。 なお、 オフ状 態のマイクロミラー 6 2により光ビームが反射される方向には、 光吸収体 (図示せず) が配置されている。 When a digital signal is written in the SR AM cell 60 of the D MD 50, the micromirror 6 2 supported by the support column has a soil α degree (with respect to the substrate side on which the D MD 50 is placed centered on the diagonal line ( For example, it can be tilted within a range of ± 10 degrees. Fig. 10 0 Α shows a state tilted to + α degrees when the micro mirror 6 2 is on, and Fig. 10 B shows that the micro mirror 6 2 is off. It shows a state tilted at a certain α degree. Therefore, according to the image signal, the inclination of the micromirror 62 in each pixel of the DMD 50 is controlled as shown in FIG. 9. It is repelled in the tilt direction of the micro mirror 62. FIG. 9 shows an example in which a part of the DMD 50 is enlarged and the micromirror 6 ′ 2 is controlled to + α degrees or once. The on / off control of each micromirror 62 is performed by a controller (not shown) connected to the DMD 50. Note that a light absorber (not shown) is arranged in the direction in which the light beam is reflected by the off-state micromirror 62.
次いで、 本実施形態による露光装置の動作について説明する。 まず、 剥離装置 1 8 0 による支持体 4 3の剥離の動作について説明する。 Next, the operation of the exposure apparatus according to the present embodiment will be described. First, the peeling operation of the support 4 3 by the peeling device 1 80 will be described.
真空ポンプ i 2 2を駆動することにより、 支持体 4 3を剥離した後の感光材料 1 5 0 近傍の酸素分圧を大気圧の酸素分圧の 8 0 %以下とするように、 力パー 1 2 O内の空間 を減圧する。 By driving the vacuum pump i 2 2, the force component 1 is adjusted so that the oxygen partial pressure in the vicinity of the photosensitive material 1 5 0 after peeling the support 4 3 is 80% or less of the oxygen partial pressure of atmospheric pressure. 2 Depressurize the space inside O.
感光材料 1 5 0を表面に吸着したステージ 1 5 2は、 図示しない駆動装置 Iこより、 ガ イド 1 5 8に沿ってゲート 1 6 0の上流側から下流側に一定速度で移動される。 そして、 ステージ 1 5 2が剥離装置 1 8 0の下を通過する際に、 支持体 4 3の剥離が行われる。 図 4 A〜Dに示すように、 粘着ロール 2 3は図示の矢印方向に回転し、 ステージ 1 5 2に吸着されて搬送される感光材料 1 5 0を構成する支持体 4 3の剥離を開女合する (図 4 A参照) 。 その後、 1占着口"ル 2 3が感光材料 1 5 0を押圧しながら剥離させた支持 体 4 3の卷き取りを続け (図 4 Β参照) 、 感光材料 1 5 0の搬送方向最上流 端部まで 粘着ロール 2 3による感光材料 1 5 0の搬送が行われることにより (図 4 C参照) 、 感 光材料 1 5 0から支持体 4 3を全量剥離する。 なお、 図 4 Dに示すように、 全量剥離さ れ粘着ロール 2 3に卷き取られた支持体 4 3の後端は下方に垂れ下がった状態となり、 この支持体 4 3の後端の下方に垂れ下がった終端部が把持されて支持体取り外し部 1 0 において粘着ロール 2 3から支持体 4 3が取り外される。 その後、 クリーニング部 1 5 において粘着ロール 2 3の表面がクリーニングされる。 支持体 4 3が剥離された感光材 料 1 5 0は、 ステージ 1 5 2に吸着された状態でさらにスキャナ 1 6 2に向けて搬送さ れる。 The stage 1 5 2 having the photosensitive material 1 5 50 adsorbed on the surface is moved at a constant speed from the upstream side to the downstream side of the gate 1 6 6 along the guide 1 58 by a driving device I (not shown). Then, when the stage 15 2 passes under the peeling device 180, the support 4 3 is peeled off. As shown in FIGS. 4A to 4D, the adhesive roll 23 rotates in the direction of the arrow shown in the figure, and peels off the support 4 3 constituting the photosensitive material 1 5 50 that is adsorbed to the stage 1 5 2 and conveyed. (See Figure 4A). After that, 1 occupying port 2 3 continues to scrape off the support 4 3 peeled while pressing the photosensitive material 1 5 0 (see Fig. 4 4), and the upstream of the photosensitive material 1 5 0 in the transport direction When the photosensitive material 15 50 is conveyed to the end by the adhesive roll 23 (see FIG. 4C), the entire support 4 3 is peeled off from the photosensitive material 150. Note that FIG. In this way, the rear end of the support 4 3 that has been peeled off and peeled off by the adhesive roll 2 3 is in a state of hanging downward, and the terminal end that is suspended below the rear end of the support 4 3 is gripped. Then, the support 4 3 is removed from the adhesive roll 2 3 at the support removing part 10. Then, the surface of the adhesive roll 2 3 is cleaned at the cleaning part 15 5. The photosensitive material from which the support 4 3 has been peeled off. 1 5 0 is transported further toward scanner 1 6 2 while being attracted to stage 1 5 2 It is.
次いで、 スキャナ 1 6 2の動作について説明する。 図 7および図 8に示す水銀ランプ 6 6から発せられた例えば波 3 6 0〜4 2 0 n m 帯の光は、 前述のようにレンズ系 6 7を通して、 光量分布が均一ィ匕された上で D M D 5 0に照射される。 この D MD 5 0に接続された図示外のコントローラには、 露光パター ンに応じた画像データが入力され、 コントローラ内のフレームメモリにー且記憶される。 5 この画像データは、 画像を構成する各画素の濃度を 2値 (ドットの記録の有無) で表し たデータである。 Next, the operation of the scanner 16 2 will be described. For example, the light in the wave 3 60 to 4 20 nm band emitted from the mercury lamp 66 shown in FIG. 7 and FIG. 8 passes through the lens system 67 as described above, and the light quantity distribution is made uniform. DMD 50 is irradiated. Image data corresponding to the exposure pattern is input to a controller (not shown) connected to the DMD 50 and stored in a frame memory in the controller. 5 This image data is the data representing the density of each pixel composing the image in binary (whether or not dots are recorded).
また、 支持体 4 3が剥離された感光材料 1 5 0を吸着したステージ 1 5 2がゲート 1 6 0下を通過する際に、 ゲート 1 6 0に取り付けられた検知センサ 1 6 4により感光材 料 1 5 0の先端が検出されると、 上記フレームメモリに記憶されている画像データが複 0 数ライン分ずつ順次読み出され、 この読み出された画像データに基づいてデータ処理部 で各露光へッド 1 6 6毎に制御信号が生成される。 そして、 ミラ一駆動制御部により、 生成された制御信号に基づいて各露光ヘッド 1 6 6毎にD MD 5 0のマイクロミラーの 各々がオンオフ制御される。 Further, when the stage 1 5 2 that has adsorbed the photosensitive material 1 5 0 from which the support 4 3 has been peeled passes under the gate 1 60, the detection sensor 1 6 4 attached to the gate 1 6 When the leading edge of the material 150 is detected, the image data stored in the frame memory is sequentially read out for a plurality of lines, and each exposure is performed by the data processing unit based on the read image data. A control signal is generated for each head 1 6 6. Then, the mirror drive control unit performs on / off control of each of the micro mirrors of the DMD 50 for each exposure head 16 6 based on the generated control signal.
水銀ランプ 6 6からの光が D MD 5 0に照射されているとき、 D M D 5 0のオン状態 .5 のマイクロミラーで反射した光は、 レンズ系 5 1により集光されて、 感光材料 1 5 0の 被露光面 5 6上で集束する。 このようにして、 水銀ランプ 6 6力、ら出射した光が D MD 5 0の各マイク口ミラー毎にオンオフされて、 感光材料 1 5 0カ D M D 5 0の使用画素 数と略同数の画素単位 (露光エリア 1 6 8 ) で露光される。 また、 感光材料 1 5 0がス テージ 1 5 2と共に 定速度で移動されることにより、 感光材 1 5 Όがスキャナ 1 6 ίθ 2によりステージ移動方向と反対の方向に副走査され、 各露光ヘッド 1 6 6毎に帯状の 露光済み領域 1 7 0が形成される。 When the light from the mercury lamp 6 6 is applied to the DMD 50, the light reflected by the micromirror in the DMD 50 ON state .5 is collected by the lens system 51 and is then photosensitive material 15 Focus on the exposed surface 5 6 of 0. In this way, the light emitted from the mercury lamp 6 6 power is turned on / off for each microphone opening mirror of the DMD 50, and the pixel unit is approximately the same number as the number of pixels used in the photosensitive material 15 500 DMD 50. The exposure is performed in (exposure area 1 6 8). In addition, the photosensitive material 1 5 0 is moved together with the stage 1 5 2 at a constant speed, so that the photosensitive material 1 5 Ό is sub-scanned in the direction opposite to the stage moving direction by the scanner 1 6 A strip-shaped exposed region 1 7 0 is formed every 1 6 6.
スキャナ 1 6 2による感光材料 1 5 0の副走査が終了し、 検知センサ 1 6 4で感光材 料 1 5 0の後端が検出されると、 ステージ 1 5 2は、 図示しな ヽ駆動装置により、 ガイ ド 1 5 8に沿ってゲート 1 6 0の最上流側にある原点に復帰し、 再度、 ガイド 1 5 8に 沿ってゲート 1 6 0の上流側から下流側に一定速度で移動される。 When the scanning of the photosensitive material 1 5 0 by the scanner 1 6 2 is completed and the trailing edge of the photosensitive material 1 5 0 is detected by the detection sensor 1 6 4, the stage 1 5 2 is not shown in the figure. Returns to the origin on the most upstream side of the gate 1 6 0 along the guide 1 5 8 and is again moved at a constant speed from the upstream side to the downstream side of the gate 1 60 along the guide 1 5 8. The
なお、 露光が終了した感光材料 1 5 0は現像され、 さらにェゾチングされて配線パタ ーンが形成される。 The exposed photosensitive material 150 is developed and further etched to form a wiring pattern.
このように、 本実施形態においては、 剥離装置 1 8 0を露光装置 1におけるスキャナ 1 6 2の感光材料 1 5 0の搬送方向上流側に設けたため、 支持 4 3が剥離された感光 材料感光材料 1 5 0は直ちに露光がなされることとなる。 これにより、 支持体 4 3が剥 離された感光材料 1 5 0のレジスト層 4 2が大気に晒される時間を極力少なくすること ができ、 その結果、 レジスト層 4 2の酸素との反応をできるだけ少なくすることができ る。 したがって、 レジスト層 4 2の光に対する感度の低下を防止し、 スキャナ 1 6 2に 5 よるパターンの露光を良好に行うことができる。 Thus, in the present embodiment, the peeling device 1 80 is provided on the upstream side in the transport direction of the photosensitive material 1 50 of the scanner 1 6 2 in the exposure device 1, so The photosensitive material 1 5 0 is immediately exposed. As a result, it is possible to minimize the time during which the resist layer 42 of the photosensitive material 150 having the support 43 peeled off is exposed to the atmosphere, and as a result, the reaction of the resist layer 42 with oxygen can be minimized. Can be reduced. Therefore, the sensitivity of the resist layer 42 to light can be prevented from being lowered, and the pattern can be satisfactorily exposed by the scanner 16 2.
とくに、 支持体 4 3を剥離した後の感光材料 1 5 0近傍の酸素分圧を大気圧の酸素分 圧の 8 0 %以下とすることにより、 レジスト層と酸素との反応をより少なくすることが できる。 In particular, by reducing the oxygen partial pressure in the vicinity of the photosensitive material 15 50 after peeling off the support 43 to 80% or less of the atmospheric oxygen partial pressure, the reaction between the resist layer and oxygen can be reduced. Is possible.
なお、 上記実施形態においては、 真空ポンプ 1 2 2を設けて、 カバー 1 2 0内の空間 0 を減圧することにより、 支持体 4 3を剥離した後の感光材料 1 5 0近傍の酸素分圧を大 気圧の酸素分圧の 8 0 %以下としているが、 支持体 4 3が剥離された感光材料 1 5 0に 窒素ガス等の不活性ガスを吹き付けることにより、 支持体 4 3を剥離した後の感光材料 1 5 0近傍の酸素分圧を大気圧の酸素分圧の 8 0 %以下としてもよい。 In the above-described embodiment, the oxygen partial pressure in the vicinity of the photosensitive material 15 50 after the support 4 3 is peeled off by providing the vacuum pump 1 2 2 and reducing the space 0 in the cover 12 20. The oxygen partial pressure of atmospheric pressure is 80% or less. However, after peeling off the support 4 3 by blowing an inert gas such as nitrogen gas onto the photosensitive material 1 5 0 from which the support 4 3 was peeled off The oxygen partial pressure in the vicinity of the photosensitive material 150 may be 80% or less of the oxygen partial pressure at atmospheric pressure.
この場合、 図 1 1に示すように、 不活性ガス供給装置 1 9 0およびこれに接続されて 5 不活性ガスを噴出するノズル 1 9 1を設け、 不図示のコントローラにより不活性ガス供 給装置の駆動を制御して、 支持体 4 3を剥離した後の感光材料 1 5 0近傍の酸素分圧を 大気圧の酸素分圧の 8 0 %以下となるように、 ノズル 1 9 1から感光材料 1 5 0に向け て不活性ガスを噴出する。 In this case, as shown in FIG. 11, an inert gas supply device 1 90 and a nozzle 1 9 1 connected to the inert gas nozzle 5 for ejecting inert gas are provided, and an inert gas supply device is provided by a controller (not shown). The photosensitive material after the support 4 3 is peeled off by controlling the driving of the photosensitive material 1 5 0 from the nozzle 1 9 1 so that the oxygen partial pressure in the vicinity of 80 is equal to or less than 80% of the atmospheric oxygen partial pressure. Inert gas is spouted toward 1 5 0.
このように、 不活性ガスを感光材料 1 5 0に向けて噴出することによつても、 支持体 :0 4 3を剥離した後の感光材料 1 5 0近傍の酸素分圧を大気圧の酸素分圧の 8 0 %以下と することができ、 これにより、 レジスト層 4 2と酸素との反応をより少なくすることが できる。 In this way, the oxygen partial pressure in the vicinity of the photosensitive material 1 5 0 after peeling off the support body 0 4 3 can be reduced to atmospheric pressure oxygen by ejecting an inert gas toward the photosensitive material 1 5 0. The partial pressure can be reduced to 80% or less, whereby the reaction between the resist layer 42 and oxygen can be further reduced.
また、 上記実施形態においては、 プリント配線板作成用の感光材料 1 5 0を用いてい るが、 基板としてガラス基板、 感光層としてカラーフィルタフィルムを積層した液晶パ !5 ネルのカラーフィルタ作成用の感光材料であっても、 上記実施形態と同様に、 支持体を 剥離した直後にカラーフィルタフィルムに所定のパターンを露光することが可能である。 また、 上記実施形態においては、 光ビームを用いてパターンを露光しているが、 パタ ーン形状に対応する透過部分を有するマスクおよび面露光光源を使用し、 面露光光源か ら発せられた光をマスクを介して感光材料 1 5 0に照射することにより、 感光材料 1 5 0にパターンを露光するようにしてもよい。 In the above embodiment, the photosensitive material 150 for producing a printed wiring board is used. However, for producing a color filter for a liquid crystal panel in which a glass substrate is laminated as a substrate and a color filter film is laminated as a photosensitive layer. Even in the case of a photosensitive material, a predetermined pattern can be exposed on the color filter film immediately after the support is peeled off, as in the above embodiment. In the above embodiment, the pattern is exposed using the light beam. However, the light emitted from the surface exposure light source using a mask having a transmissive portion corresponding to the pattern shape and the surface exposure light source is used. Is applied to the photosensitive material 1 5 0 through the mask to obtain the photosensitive material 1 5 The pattern may be exposed to zero.
また、 上記実施形態においては、 露光装置 1の光源として水銀ランプを用いているが、 レーザ光源を用いてもよい。 In the above embodiment, a mercury lamp is used as the light source of the exposure apparatus 1, but a laser light source may be used.
また、 上記実施形態においては、 プリント配線板に露光を行う露光装置について説明 しているが、 これに限定されるものではなく、 カラーフィルタや、 柱材、 リブ材、 スぺ ーサおよび隔壁等のディスプレイ材料、 あるいはホログラム、 マイクロマシンおょぴプ ルーフ等のパターン形成用の記録媒体を露光する場合にも、 本発明の露光装置を適用で きることはもちろんである。 In the above embodiment, an exposure apparatus that performs exposure on a printed wiring board has been described. However, the present invention is not limited to this, and color filters, pillar materials, rib materials, spacers, partition walls, and the like are not limited thereto. Of course, the exposure apparatus of the present invention can also be applied to the case of exposing a recording material for pattern formation such as a display material, a hologram, or a micromachine opto-proof.
また、 本発明は上記実施形態に限られるものではなく、 特開 2 0 0 0— 2 2 7 6 6 1 号公報に開示されているような、 光走査光学系として、 レーザ光源、 レーザ光源の光変 調を行う A O Mおよびポリ ゴンミラーを用いた露光装置等、 本発明の要旨を逸脱しない 範囲で種々変形して実施することができる。 Further, the present invention is not limited to the above-described embodiment, and as an optical scanning optical system as disclosed in Japanese Patent Application Laid-Open No. 2 00 0-2 2 7 6 6 1, a laser light source, a laser light source Various modifications can be made without departing from the scope of the present invention, such as an exposure apparatus using an AOM that performs optical modulation and a polygon mirror.
Claims
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/667,188 US20080013067A1 (en) | 2004-11-08 | 2005-11-04 | Exposure Apparatus |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004-323698 | 2004-11-08 | ||
| JP2004323698A JP2006133593A (en) | 2004-11-08 | 2004-11-08 | Exposure device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2006049330A1 true WO2006049330A1 (en) | 2006-05-11 |
Family
ID=36319318
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2005/020679 Ceased WO2006049330A1 (en) | 2004-11-08 | 2005-11-04 | Exposure equipment |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20080013067A1 (en) |
| JP (1) | JP2006133593A (en) |
| KR (1) | KR20070073891A (en) |
| CN (1) | CN101057315A (en) |
| TW (1) | TWI306183B (en) |
| WO (1) | WO2006049330A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI547222B (en) * | 2015-09-03 | 2016-08-21 | 旭東機械工業股份有限公司 | Laser direct imaging system and method suitable for liquid photo imagable solder mask |
| CN108803252B (en) * | 2018-06-27 | 2020-10-16 | 合肥泰沃达智能装备有限公司 | Light guide plate production and processing technology and coating exposure equipment thereof |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05152720A (en) * | 1991-11-29 | 1993-06-18 | Cmk Corp | Manufacture of printed wiring board |
| JPH05265221A (en) * | 1992-03-23 | 1993-10-15 | Toppan Printing Co Ltd | Color filter exposure method and color filter exposure apparatus |
| JPH05335227A (en) * | 1992-06-04 | 1993-12-17 | Nec Corp | Semiconductor-substrate treatment apparatus |
| JPH08262699A (en) * | 1995-03-28 | 1996-10-11 | Canon Inc | Resist composition, resist processing method and apparatus |
| JPH0912215A (en) * | 1995-06-28 | 1997-01-14 | Fuji Photo Film Co Ltd | Film separator and method of separating film locally from long laminated sheet |
| JPH1063001A (en) * | 1996-08-14 | 1998-03-06 | Sony Corp | Resist pattern formation method |
| JP2005283778A (en) * | 2004-03-29 | 2005-10-13 | Fuji Photo Film Co Ltd | Method for making printing plate and exposure apparatus for printing plate |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5866294A (en) * | 1993-10-26 | 1999-02-02 | Toray Industries, Inc. | Water-less quinonediazide lithographic raw plate |
| US6238852B1 (en) * | 1999-01-04 | 2001-05-29 | Anvik Corporation | Maskless lithography system and method with doubled throughput |
-
2004
- 2004-11-08 JP JP2004323698A patent/JP2006133593A/en not_active Withdrawn
-
2005
- 2005-11-04 CN CNA2005800378758A patent/CN101057315A/en active Pending
- 2005-11-04 KR KR1020077010448A patent/KR20070073891A/en not_active Withdrawn
- 2005-11-04 US US11/667,188 patent/US20080013067A1/en not_active Abandoned
- 2005-11-04 WO PCT/JP2005/020679 patent/WO2006049330A1/en not_active Ceased
- 2005-11-08 TW TW094139046A patent/TWI306183B/en active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05152720A (en) * | 1991-11-29 | 1993-06-18 | Cmk Corp | Manufacture of printed wiring board |
| JPH05265221A (en) * | 1992-03-23 | 1993-10-15 | Toppan Printing Co Ltd | Color filter exposure method and color filter exposure apparatus |
| JPH05335227A (en) * | 1992-06-04 | 1993-12-17 | Nec Corp | Semiconductor-substrate treatment apparatus |
| JPH08262699A (en) * | 1995-03-28 | 1996-10-11 | Canon Inc | Resist composition, resist processing method and apparatus |
| JPH0912215A (en) * | 1995-06-28 | 1997-01-14 | Fuji Photo Film Co Ltd | Film separator and method of separating film locally from long laminated sheet |
| JPH1063001A (en) * | 1996-08-14 | 1998-03-06 | Sony Corp | Resist pattern formation method |
| JP2005283778A (en) * | 2004-03-29 | 2005-10-13 | Fuji Photo Film Co Ltd | Method for making printing plate and exposure apparatus for printing plate |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070073891A (en) | 2007-07-10 |
| TW200625019A (en) | 2006-07-16 |
| US20080013067A1 (en) | 2008-01-17 |
| TWI306183B (en) | 2009-02-11 |
| CN101057315A (en) | 2007-10-17 |
| JP2006133593A (en) | 2006-05-25 |
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