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WO2005022076A3 - Part inspection apparatus - Google Patents

Part inspection apparatus Download PDF

Info

Publication number
WO2005022076A3
WO2005022076A3 PCT/US2004/027488 US2004027488W WO2005022076A3 WO 2005022076 A3 WO2005022076 A3 WO 2005022076A3 US 2004027488 W US2004027488 W US 2004027488W WO 2005022076 A3 WO2005022076 A3 WO 2005022076A3
Authority
WO
WIPO (PCT)
Prior art keywords
light
responsive
beams
line
occlusion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2004/027488
Other languages
French (fr)
Other versions
WO2005022076A2 (en
Inventor
David Crowther
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Inspection LLC
Original Assignee
General Inspection LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Inspection LLC filed Critical General Inspection LLC
Publication of WO2005022076A2 publication Critical patent/WO2005022076A2/en
Publication of WO2005022076A3 publication Critical patent/WO2005022076A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

A plurality of light line generators (72) generate associated beams of light (26) that intersect a part (14) to be inspected. Each beam of light (26) illuminates at least one side of the part (14) with a line of light occluded by the part (14), and at least three light responsive sensors (104) provide for generating a signal (24) responsive to an occlusion of a corresponding line of light on a corresponding side of at least one side of the part (14), wherein each of the light responsive sensors is responsive to an occlusion at a different azimuthal locations. A processor (28) analyzes the signals (24) in relation to a measure of relative location of the part (14) from a motion (18) or position sensor. The part (14) may released from a clamp (52) to drop through the beams of light (26), or the beams of light (26) may be moved relative to the part (14).
PCT/US2004/027488 2003-08-23 2004-08-23 Part inspection apparatus Ceased WO2005022076A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US49721703P 2003-08-23 2003-08-23
US60/497,217 2003-08-23

Publications (2)

Publication Number Publication Date
WO2005022076A2 WO2005022076A2 (en) 2005-03-10
WO2005022076A3 true WO2005022076A3 (en) 2005-07-28

Family

ID=34272545

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/027488 Ceased WO2005022076A2 (en) 2003-08-23 2004-08-23 Part inspection apparatus

Country Status (1)

Country Link
WO (1) WO2005022076A2 (en)

Families Citing this family (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050226489A1 (en) 2004-03-04 2005-10-13 Glenn Beach Machine vision system for identifying and sorting projectiles and other objects
US9424634B2 (en) 2004-03-04 2016-08-23 Cybernet Systems Corporation Machine vision system for identifying and sorting projectiles and other objects
US7633635B2 (en) 2006-08-07 2009-12-15 GII Acquisitions, LLC Method and system for automatically identifying non-labeled, manufactured parts
US7684054B2 (en) 2006-08-25 2010-03-23 Gii Acquisition, Llc Profile inspection system for threaded and axial components
DE102007017747B4 (en) * 2007-04-12 2009-05-07 V & M Deutschland Gmbh Method and device for the optical measurement of external threads
US7403872B1 (en) 2007-04-13 2008-07-22 Gii Acquisition, Llc Method and system for inspecting manufactured parts and sorting the inspected parts
US7738088B2 (en) 2007-10-23 2010-06-15 Gii Acquisition, Llc Optical method and system for generating calibration data for use in calibrating a part inspection system
US7920278B2 (en) 2007-10-23 2011-04-05 Gii Acquisition, Llc Non-contact method and system for inspecting parts
US7777900B2 (en) 2007-10-23 2010-08-17 Gii Acquisition, Llc Method and system for optically inspecting parts
US8132802B2 (en) 2007-10-23 2012-03-13 Gii Acquisition, Llc Apparatus for quickly retaining and releasing parts to be optically measured
US7633046B2 (en) 2007-10-23 2009-12-15 Gii Acquisition Llc Method for estimating thread parameters of a part
US8550444B2 (en) 2007-10-23 2013-10-08 Gii Acquisition, Llc Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station
US7738121B2 (en) 2007-10-23 2010-06-15 Gii Acquisition, Llc Method and inspection head apparatus for optically measuring geometric dimensions of a part
US8237935B2 (en) 2007-10-23 2012-08-07 Gii Acquisition, Llc Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts
US7755754B2 (en) 2007-10-23 2010-07-13 Gii Acquisition, Llc Calibration device for use in an optical part measuring system
US7812970B2 (en) 2007-10-23 2010-10-12 Gii Acquisition, Llc Method and system for inspecting parts utilizing triangulation
US7796278B2 (en) 2008-09-19 2010-09-14 Gii Acquisition, Llc Method for precisely measuring position of a part to be inspected at a part inspection station
GB2465024B (en) * 2008-11-08 2011-01-12 Adaptive Automation Ltd Shadow sensing apparatus
US8004694B2 (en) 2009-03-27 2011-08-23 Gll Acquistion LLC System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station
ES2460952T3 (en) 2009-12-10 2014-05-16 Instituto Tecnológico De Informática Device and method for the acquisition and reconstruction of objects
CN103492834B (en) * 2010-09-15 2016-03-30 吴乃恩 Automatic apparatus and inspection method for inspecting the quality of rotating parts
US8416403B2 (en) 2010-10-29 2013-04-09 GII Acquisitiom, LLC Method and system for high-speed, high-resolution 3-D imaging of manufactured parts of various sizes
TWM404739U (en) * 2010-11-22 2011-06-01 Ching Chan Optical Technology Co Ltd Screw detection device
US8390826B2 (en) 2011-04-20 2013-03-05 Gii Acquisition, Llc Method and system for optically inspecting parts
US10209200B2 (en) 2012-03-07 2019-02-19 Gil Acquisition, LLC High-speed, 3-D method and system for optically inspecting parts
US9047657B2 (en) 2011-05-17 2015-06-02 Gii Acquisition, Lcc Method and system for optically inspecting outer peripheral surfaces of parts
US8570504B2 (en) 2011-05-17 2013-10-29 Gii Acquisition, Llc Method and system for optically inspecting parts
US9575013B2 (en) 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US9228957B2 (en) 2013-05-24 2016-01-05 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts
US9372160B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US8723068B2 (en) 2011-09-08 2014-05-13 Michael G. Nygaard Method and system for optically inspecting manufactured rounds of ammunition or cylindrical components of the rounds to obtain rounds which exhibit superior accuracy when fired
US8896844B2 (en) 2012-12-14 2014-11-25 Gii Acquisition, Llc High-speed, 3-D method and system for optically measuring a geometric dimension of manufactured parts
US8993914B2 (en) 2012-12-14 2015-03-31 Gii Acquisition, Llc High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US9486840B2 (en) 2013-05-24 2016-11-08 Gii Acquisition, Llc High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
PL223633B1 (en) 2013-04-08 2016-10-31 Int Tobacco Machinery Poland Spółka Z Ograniczoną Odpowiedzialnością Method and a device for detecting the turned segments in a movable shaft in a multi-segment in the machine used in the tobacco industry
WO2014178936A2 (en) * 2013-04-30 2014-11-06 Gii Acquisition, Llc Dba General Inspection, Llc Method and system for optically inspecting outer peripheral surfaces of parts
US9539619B2 (en) 2013-05-24 2017-01-10 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts at a pair of inspection stations
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US9372077B2 (en) 2013-08-21 2016-06-21 Gii Acquistion, Llc High-resolution imaging and processing method and system for determining a geometric dimension of a part
US9377297B2 (en) 2013-08-21 2016-06-28 Gii Acquisition, Llc High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined
US10300510B2 (en) 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
WO2017044747A1 (en) 2015-09-11 2017-03-16 Berkshire Grey Inc. Robotic systems and methods for identifying and processing a variety of objects
US10625305B2 (en) 2015-12-04 2020-04-21 Berkshire Grey, Inc. Systems and methods for dynamic processing of objects
US10730078B2 (en) 2015-12-04 2020-08-04 Berkshire Grey, Inc. Systems and methods for dynamic sortation of objects
US9937532B2 (en) 2015-12-18 2018-04-10 Berkshire Grey Inc. Perception systems and methods for identifying and processing a variety of objects
US12350713B2 (en) * 2015-12-18 2025-07-08 Berkshire Grey Operating Company, Inc. Perception systems and methods for identifying and processing a variety of objects
JP6878781B2 (en) * 2016-06-30 2021-06-02 オムロン株式会社 Inspection system
ES2844349T3 (en) 2017-06-21 2021-07-21 Inst Tecnologico De Informatica Device for the acquisition and reconstruction of objects by visual inspection
CN116577343B (en) * 2023-07-11 2023-09-15 欧亦姆半导体设备科技(靖江)有限公司 Material surface defect detection equipment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6139800A (en) * 1997-06-23 2000-10-31 Luminex Corporation Interlaced lasers for multiple fluorescence measurement

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6139800A (en) * 1997-06-23 2000-10-31 Luminex Corporation Interlaced lasers for multiple fluorescence measurement

Also Published As

Publication number Publication date
WO2005022076A2 (en) 2005-03-10

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