WO2005001467A1 - Procede et dispositif d'imagerie magneto-optique - Google Patents
Procede et dispositif d'imagerie magneto-optique Download PDFInfo
- Publication number
- WO2005001467A1 WO2005001467A1 PCT/FR2004/001602 FR2004001602W WO2005001467A1 WO 2005001467 A1 WO2005001467 A1 WO 2005001467A1 FR 2004001602 W FR2004001602 W FR 2004001602W WO 2005001467 A1 WO2005001467 A1 WO 2005001467A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- magnetic field
- active material
- target material
- faraday
- target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
- G01R33/0322—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect using the Faraday or Voigt effect
Definitions
- the invention relates to the field of magneto-optical imaging methods and devices. More particularly, the invention relates to a magneto-optical imaging method comprising: - the positioning, near a target material, of a substantially planar face of a magnetic active material suitable for generating a Faraday rotation in a beam polarized light, - the generation of a pulsating excitation magnetic field ⁇ in the target material, - the projection of a polarized light incident beam, through the active material, towards the target material, - detection, by means photo-detectors, of a reflected beam corresponding to the reflection on a reflecting surface located between the active material and the target material, and - the observation of the Faraday rotation angle in the reflected beam, with respect to the incident beam , created in the active material by a magnetic disturbance field generated by the target material.
- the invention provides in particular a process which, in addition to the characteristics already mentioned, is characterized by the fact that: - the Faraday rotation of the active material is substantially proportional to its magnetic magnetization when it is subjected to a magnetic disturbance field, perpendicular to said face and varying in a minimum range ranging between substantially -1 Oersteds and substantially +1 Oersteds, and that - we determine, from the value of the angle of rotation Faraday , the value of the magnetization of the active material, under the effect of the disturbance magnetic field.
- the invention and in particular thanks to the use of an active material whose Faraday rotation is proportional to the field in which it bathes, it is possible to determine, from a local light intensity, the value, in module and in phase, of the characteristic magnetic disturbance field due to defects in the target material. We can thus access, in real time, a map of the target material precisely characterizing the defects (corrosion depth, dimension cracks, etc.), in particular when the method according to the invention is combined with modeling of the means for generating the excitatory magnetic field.
- the method according to the invention may also include one and / or the other of the following arrangements: - the exciting magnetic field is generated by means of an inductor supplied by a variable exciting current; - It includes a measurement, by synchronous detection, of the variation of the phase of the magnetic disturbance field compared to that of the excitation current; - the amplitude of the disturbance magnetic field is measured from the light intensity of the reflected beam; - The incident beam is amplitude modulated at the same frequency as that of the excitation field.
- the invention relates to a magneto-optical imaging device, for forming an image of a target material, this device comprising: - an active material, having a substantially planar, magnetic face and suitable for generating a rotation Faraday in a polarized light beam, - means generating a pulsating excitation magnetic field ⁇ in the active material and in the target material when the imaging device is placed near this target material, - a light source for projecting an incident light beam polarized, through the active material, towards the target material, when the imaging device is placed near this target material, - photo-detector means, for detecting a reflected beam corresponding to the reflection after crossing of the active material, of the incident beam on a reflecting surface, characterized in that the Faraday rotation of the active material is substantially proportional to its magnetic magnetization when it is subjected to a disturbing magnetic field generated in the target material, perpendicular to said face and varying in a minimum range ranging between substantially -1 Oersteds and substantially +1
- the device according to the invention may also comprise one and / or the other of the following provisions: - it comprises an inductor supplied by a variable excitation current, to generate the excitatory magnetic field, - it comprises modulation means of the incident beam to modulate it in amplitude at the same frequency as that of the excitation field; and - it comprises calculation means for determining, from the value of the angle of rotation Faraday, the value of the magnetization of the active material, under the effect of a disturbing magnetic field generated in the material active, by the target material when the imaging device is placed near this target material.
- FIG. 1 shows schematically in perspective a magneto-optical imaging device according to the present invention
- - Figure 2 schematically shows the principle of magneto-optical modulation of the device shown in Figure 1
- - Figure 3 shows the magnetization cycle of the active material used in the constitution of the device shown in Figure 1
- - Figure 4 shows an image of the real part of the component of the disturbance magnetic field divided by the average light intensity, this image having been produced with a device of the type shown in Figure 1
- FIG. 5 represents an image of the imaginary part of the magnetic disturbance field, divided by the average light intensity, this image having been produced with a device of the type of that represented in FIG. 1.
- the device comprises: - a housing 1 adapted to be moved on the surface of a target material 2 that l 'we wish to analyze, - an optical device 3, - means for generating excitatory magnetic field 5, - photodetector means 7. More specifically, the optical device 3 comprises a light source 9, a polarizer 11 and an analyzer 13. The polarizer 11 and the analyzer 13 are of a type known to those skilled in the art.
- the light source 9 is for example made up of a light-emitting diode. Strong diodes Brightnesses are commercially available for various wavelengths.
- a red diode 10 mm in diameter and of high brightness will be chosen (reference TLRH190P from the company TOSHIBA).
- An optically active material 15 is interposed between the polarizer 11 and the analyzer 13, on the optical path.
- This polarizer / active material / analyzer assembly constitutes a magneto-optical light modulator.
- the principle of this magneto-optical modulator is illustrated in FIG. 2.
- the polarizer 11 and the analyzer 13 are crossed at an angle v. This angle v is advantageously chosen between 45 and 90 degrees.
- the plane of polarization rotates under the effect of the Faraday rotation by an angle p.
- the optically active material 15 is for example a ferrimagnetic garnet having a soft, linear magnetization cycle and with little hysteresis. It is for example a compound (GdPrBiTm) 3 (AlFe) 5 0 ⁇ 2 deposited in a film 5.9 ⁇ m thick, by epitaxy in liquid phase at 768 ° C, on a SGGG substrate [(GdCa ) 3 (Ga gZr) 5 0 ⁇ 2 ] of an inch in diameter.
- the direction of easy magnetization is normal to the plane of the film.
- the Bi 3+ and Pr 3+ ions make it possible to obtain a high Faraday rotation.
- the magnetic domains of this type of garnet are small compared to the size of the pixels of the photodetector means 7, which makes it possible to average the contributions of the domains of opposite direction of magnetization.
- the magnetization curve of such a garnet has a substantially linear part between -100 Oersteds and +100 Oersteds approximately.
- the hysteresis is negligible and that, very advantageously, the slope, in the linear part, is greater than 1 degree / Am -1 .
- the frequency f is for example 100 kHz.
- the magnetic field generating means 5 are for example constituted by an inductor plate 17 adapted to induce eddy currents in the target 2 (see FIG. 1).
- This inductor plate 17 is supplied with a sinusoidal current I having an effective value of 120A and a frequency f of 100kHz.
- This inductor plate 17 is made of copper.
- the magnetic field produced by the induction plate is approximately lkA / m.
- the induction plate 17 is parallel to the film of active material 15.
- a disturbance field H 0 is observed normal to the surface scanned with the face of the housing 1 parallel to the inductor plate 17.
- the photodetector means 7 advantageously consist of a matrix, rather than a single sensor associated with a mechanical scanning device.
- An analog CCD camera associated with a video capture card is appropriate. This is for example the model XC-75CE from the company SONY.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Power Engineering (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA2530197A CA2530197C (fr) | 2003-06-27 | 2004-06-24 | Procede et dispositif d'imagerie magneto-optique |
| EP04767451A EP1639359A1 (fr) | 2003-06-27 | 2004-06-24 | Procede et dispositif d imagerie magneto-optique |
| US10/562,560 US7271900B2 (en) | 2003-06-27 | 2004-06-24 | Magneto-optical imaging method and device |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0307850A FR2856791B1 (fr) | 2003-06-27 | 2003-06-27 | Procede et dispositif d'imagerie magneto-optique |
| FR03/07850 | 2003-06-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2005001467A1 true WO2005001467A1 (fr) | 2005-01-06 |
| WO2005001467A8 WO2005001467A8 (fr) | 2005-05-06 |
Family
ID=33515498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/FR2004/001602 Ceased WO2005001467A1 (fr) | 2003-06-27 | 2004-06-24 | Procede et dispositif d'imagerie magneto-optique |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7271900B2 (fr) |
| EP (1) | EP1639359A1 (fr) |
| CA (1) | CA2530197C (fr) |
| FR (1) | FR2856791B1 (fr) |
| WO (1) | WO2005001467A1 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2955666A1 (fr) * | 2010-01-26 | 2011-07-29 | Centre Nat Rech Scient | Procede d'estimation de defauts dans un objet et dispositif de mise en oeuvre |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2901025B1 (fr) | 2006-05-12 | 2008-12-26 | Centre Nat Rech Scient | Procede et dispositif d'imagerie a courant de foucault pour la detection et la caracterisation de defauts enfouis dans des structures complexes. |
| US8659291B2 (en) * | 2008-12-31 | 2014-02-25 | Infinitum Solutions, Inc. | Magneto-optical detection of a field produced by a sub-resolution magnetic structure |
| US8289818B2 (en) | 2008-12-31 | 2012-10-16 | Infinitum Solutions, Inc. | Magneto-optic write-head characterization using the recording medium as a transducer layer |
| US8427929B2 (en) | 2010-09-08 | 2013-04-23 | Infinitum Solutions, Inc. | Sub-optical-resolution kerr signal detection for perpendicular write-head characterization |
| WO2012049538A1 (fr) * | 2010-10-12 | 2012-04-19 | Indian Institute Of Technology Kanpur | Systèmes et procédés pour la capture d'images des caractéristiques d'un échantillon et pour l'identification de régions endommagées dans l'échantillon |
| JP6037386B2 (ja) | 2013-02-13 | 2016-12-07 | 株式会社日立製作所 | 検査装置および検査方法 |
| JP6484051B2 (ja) * | 2015-02-10 | 2019-03-13 | 浜松ホトニクス株式会社 | 検査方法及び検査装置 |
| JP6632327B2 (ja) * | 2015-10-30 | 2020-01-22 | 浜松ホトニクス株式会社 | 画像生成方法、画像生成装置、画像生成プログラム及び記録媒体 |
| EP3290997B1 (fr) * | 2016-09-02 | 2020-07-01 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Modulateur de lumiere magneto-optique |
| US12078692B2 (en) * | 2022-07-20 | 2024-09-03 | General Electric Company | Apparatus and method for visualizing defects using a magneto-optical effect |
| CN119666757B (zh) * | 2025-02-19 | 2025-06-27 | 中国石油大学(华东) | 一种磁光成像集成探头及其参数自调整方法 |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4625167A (en) * | 1983-07-05 | 1986-11-25 | Sigma Research, Inc. | Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization |
| US4755752A (en) * | 1983-07-05 | 1988-07-05 | Gerald L. Fitzpatrick | Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization |
| JPH01209356A (ja) * | 1988-02-18 | 1989-08-23 | Maakutetsuku Kk | 長尺鋼材の磁気探傷装置 |
| EP0351171A2 (fr) * | 1988-07-09 | 1990-01-17 | Ngk Insulators, Ltd. | Méthode et appareil pour la mesure optique de quantités électriques et magnétiques |
| US4896103A (en) * | 1985-06-29 | 1990-01-23 | Kabushiki Kaisha Toshiba | Current measuring magnetic field sensor having magnetooptic element with its easy axis of magnetization at right angles to the magnetic field generated by the current |
| US5053704A (en) * | 1990-01-11 | 1991-10-01 | Pri Instrumentation, Inc. | Flow imager for conductive materials |
| DE4021359A1 (de) * | 1990-07-05 | 1992-01-09 | Siemens Ag | Verfahren zur detektion von in einem koerper verdeckt verlaufenden strompfaden sowie vorrichtung zur durchfuehrung dieses verfahrens |
| EP0510621A2 (fr) * | 1991-04-25 | 1992-10-28 | Matsushita Electric Industrial Co., Ltd. | Elément magnéto-optique et dispositif de mesure des champs magnétiques |
| US5446378A (en) * | 1993-12-15 | 1995-08-29 | Grumman Aerospace Corporation | Magneto-optic eddy current imaging apparatus and method including dithering the image relative to the sensor |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4410277A (en) * | 1978-11-01 | 1983-10-18 | Hitachi, Ltd. | Apparatus for detecting magneto-optical anisotropy |
-
2003
- 2003-06-27 FR FR0307850A patent/FR2856791B1/fr not_active Expired - Lifetime
-
2004
- 2004-06-24 CA CA2530197A patent/CA2530197C/fr not_active Expired - Fee Related
- 2004-06-24 US US10/562,560 patent/US7271900B2/en not_active Expired - Fee Related
- 2004-06-24 EP EP04767451A patent/EP1639359A1/fr not_active Withdrawn
- 2004-06-24 WO PCT/FR2004/001602 patent/WO2005001467A1/fr not_active Ceased
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4625167A (en) * | 1983-07-05 | 1986-11-25 | Sigma Research, Inc. | Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization |
| US4755752A (en) * | 1983-07-05 | 1988-07-05 | Gerald L. Fitzpatrick | Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization |
| US4896103A (en) * | 1985-06-29 | 1990-01-23 | Kabushiki Kaisha Toshiba | Current measuring magnetic field sensor having magnetooptic element with its easy axis of magnetization at right angles to the magnetic field generated by the current |
| JPH01209356A (ja) * | 1988-02-18 | 1989-08-23 | Maakutetsuku Kk | 長尺鋼材の磁気探傷装置 |
| EP0351171A2 (fr) * | 1988-07-09 | 1990-01-17 | Ngk Insulators, Ltd. | Méthode et appareil pour la mesure optique de quantités électriques et magnétiques |
| US5053704A (en) * | 1990-01-11 | 1991-10-01 | Pri Instrumentation, Inc. | Flow imager for conductive materials |
| DE4021359A1 (de) * | 1990-07-05 | 1992-01-09 | Siemens Ag | Verfahren zur detektion von in einem koerper verdeckt verlaufenden strompfaden sowie vorrichtung zur durchfuehrung dieses verfahrens |
| EP0510621A2 (fr) * | 1991-04-25 | 1992-10-28 | Matsushita Electric Industrial Co., Ltd. | Elément magnéto-optique et dispositif de mesure des champs magnétiques |
| US5446378A (en) * | 1993-12-15 | 1995-08-29 | Grumman Aerospace Corporation | Magneto-optic eddy current imaging apparatus and method including dithering the image relative to the sensor |
Non-Patent Citations (1)
| Title |
|---|
| PATENT ABSTRACTS OF JAPAN vol. 0135, no. 17 (P - 962) 20 November 1989 (1989-11-20) * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2955666A1 (fr) * | 2010-01-26 | 2011-07-29 | Centre Nat Rech Scient | Procede d'estimation de defauts dans un objet et dispositif de mise en oeuvre |
| WO2011091932A1 (fr) | 2010-01-26 | 2011-08-04 | Centre National De La Recherche Scientifique (Cnrs) | Procede d'estimation de defauts dans un objet et dispositif de mise en oeuvre |
| US8818075B2 (en) | 2010-01-26 | 2014-08-26 | Centre National De La Recherche Scientifique (Cnrs) | Method for estimating defects in an object and device for implementing same |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005001467A8 (fr) | 2005-05-06 |
| EP1639359A1 (fr) | 2006-03-29 |
| CA2530197A1 (fr) | 2005-01-16 |
| US20060146328A1 (en) | 2006-07-06 |
| US7271900B2 (en) | 2007-09-18 |
| FR2856791B1 (fr) | 2005-11-04 |
| CA2530197C (fr) | 2014-04-22 |
| FR2856791A1 (fr) | 2004-12-31 |
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