WO2005082050A2 - Analysis and screening of solid forms using the atomic pair distribution function - Google Patents
Analysis and screening of solid forms using the atomic pair distribution function Download PDFInfo
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- WO2005082050A2 WO2005082050A2 PCT/US2005/006114 US2005006114W WO2005082050A2 WO 2005082050 A2 WO2005082050 A2 WO 2005082050A2 US 2005006114 W US2005006114 W US 2005006114W WO 2005082050 A2 WO2005082050 A2 WO 2005082050A2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Definitions
- This invention relates to the analysis and screening of solid forms using the atomic pair distribution function ("PDF").
- PDF atomic pair distribution function
- One embodiment of the invention is a method that comprises providing a PDF trace of a first sample of a substance, providing a PDF trace of a second sample of the substance, and comparing the PDF traces to determine whether the substance of the first sample and the substance of the second sample have the same or different solid forms.
- the PDF trace is derived from the X-ray powder diffraction ("XRPD”) pattern of the solid substance.
- This and other embodiments of the invention may be used, for example, to distinguish one solid form of a compound from another, to screen for new solid forms of a compound, or to determine whether a disordered crystalline compound has the same solid form as another crystalline sample of the compound.
- the embodiments of the invention may be applied, for example, to a substance that is a chemical compound, for instance a pharmaceutical compound.
- the embodiments of the invention may also be applied, for example, to a substance that is a mixture of chemical compounds, for instance a co-crystal.
- FIG. 1 illustrates a block diagram of an exemplary system environment consistent with the present invention.
- FIG. 2 illustrates XRPD patterns of a disordered crystalline solid substance (top) and a highly crystalline solid substance (bottom).
- FIG. 1 illustrates a block diagram of an exemplary system environment consistent with the present invention.
- FIG. 2 illustrates XRPD patterns of a disordered crystalline solid substance (top) and a highly crystalline solid substance (bottom).
- FIG. 3 illustrates PDF traces of the highly crystalline solid substance (top) and the disordered crystalline solid substance (bottom) having the same solid form.
- FIG. 4 illustrates XRPD patterns of a substance before cryogrinding (top), after 12 minutes of cryogrinding (middle) and after 30 minutes of cryogrinding (bottom).
- FIG. 5 illustrates PDF traces of a substance before cryogrinding (top), after 12 minutes of cryogrinding (middle) and after 30 minutes of cryogrinding (bottom).
- the substances used in the invention include chemical compounds, for example, pharmaceutical compounds. They include salts of chemical compounds, for instance pharmaceutical compounds as pharmaceutically acceptable salts. They also include mixtures of two or more chemical compounds, for instance cocrystals.
- the substances of the invention include amorphous solid forms as well as crystalline solid forms. They may be, for example, cocrystals, hydrates, solvates, polymorphs, dehydrated hydrates, desolvated solvates, molecular complexes, and clathrates.
- the term "crystalline" as used herein includes polycrystalline, microcrystalline, nanocrystalline, mesocrystalline, liquid crystalline, mesophases, and partially or wholly crystalline substances, as well as disordered crystalline substances.
- the solid forms of the invention may be generated in any suitable manner. For example, a plurality of samples of a substance can be generated in capillary tubes or in wells of a well-plate. The samples may be crystallized in different environments, for instance using different solvents, different temperatures, different humidities, or different pressures. One skilled in the art will appreciate the variety of approaches that may be taken to generate different solid forms of a substance.
- the PDF trace is derived from the XRPD pattern of a solid form.
- An X-ray powder diffractometer such as the Siemens D-500 X-ray Powder Diffractometer-Kristalloflex and the Shimadzu XRD-6000 X-ray powder diffractometer, using Cu-K ⁇ radiation, may be used to generate an XRPD pattern.
- An embodiment of the invention is a method that comprises providing a PDF trace of a first sample of a substance, providing a PDF trace of a second sample of the substance, and comparing the PDF traces to determine whether the substance of the first sample and the substance of the second sample have the same or different solid forms.
- This and other embodiments of the invention may be performed in a system environment such as one illustrated in FIG. 1.
- Computing platform 110 may be adapted to process input information received from input module 120. Computing platform 110 may be further adapted to provide output information to output module 130. Additionally, computing platform 110 may be adapted to access data stored in storage module 140. [017] In performing methods consistent with the present invention, PDF traces of substances can be provided in computing platform 110.
- Computing platform 110 may comprise, for example, a general purpose computer (e.g., a personal computer, network computer, server, mainframe computer, etc.) having a processor that may be selectively activated or configured by a computer program to perform one or more methods consistent with the present invention. Alternatively, computing platform 110 may be specifically constructed to carry out methods consistent with the present invention. Computing platform 110 may be implemented on a single platform, such as a stand-alone computer.
- computing platform 110 may be implemented on a distributed network, such as a network of computers connected, e.g., by a LAN, WAN, etc., or the Internet.
- the PDF trace of a substance may be provided to computing platform 110 from input module 120.
- the XRPD pattern of a substance may be provided to computing platform 110 from input module 120, and computing platform 110 calculates the PDF trace from the XRPD pattern.
- the PDF traces or XRPD patterns may be received from, for example, storage device 124 or a computer readable medium or media linked to input interface 126.
- Computing platform 110 may then store any information received from input module 120 in storage module 140.
- Input module 120 may include an input device 122, a storage device 124, and/or an input interface 126.
- Input device 122 may be implemented using any user interface adapted for data entry.
- input device 122 may be implemented using a keyboard, mouse, speech recognition device, etc.
- Storage device 124 may include a computer readable medium or media that contains instructions to configure computing platform 110 to perform one or more methods consistent with the present invention.
- a computer readable medium may be any type of media (e.g., RAM, ROM, etc.) that is capable of carrying information that may be used to configure computing platform 110 to perform methods consistent with the present invention.
- Computer readable media may be implemented using physical media (e.g., a punch card), magnetic media (e.g., a magnetic disk or tape), optical media (e.g., an optical disk), a carrier wave (e.g., from a computer network, such as the Internet), etc.
- Computing platform 110 may calculate the PDF trace from an XRPD pattern as detailed in Peterson et al., "Improved measures of quality for the atomic pair distribution function," J. Appl. Cryst, vol. 36, pp. 53-64 (2003), the contents of which are incorporated by reference herein.
- the PDF is the instantaneous atomic density-density correlation function, which describes the atomic arrangements in materials.
- the PDF trace is the derivation of the total structure factor S(Q) from the measured XRPD pattern. All instrumental and known thermal contributions to the measured intensity in the XRPD pattern should be removed from the measured intensity along with the true instrumental background. Removal of the true instrumental background is desired, since one should not remove any diffuse scattering or broad intensity features generated by the sample of interest. [024] The instrumentally corrected data is converted into Q-space and then reduced to remove the average electronic form factor.
- the operator or algorithm may then validate the nature of the reduced structure factor.
- the large molecule scale factors of density (weight) and size(width) mentioned above can be varied to give a reduced structure factor with the appropriate form.
- the reduced structure factor should approach zero asymptotically with no abrupt truncation.
- the reduced structure factor is zero at zero Q and should exhibit a general trend that smoothly drops negative before slowly rising towards positive values.
- the sum of Q * F(Q) over a valid experimental region should be normalized to give the constant value -2pi * average_number_density. [027]
- the operator or algorithm may then apply the PDF transform:
- the sin transform can be evaluated over an artificial range of "r" values not determined by the measurement range.
- the PDF can be reconstructed using an "r" step size of 0.2 Angstroms, which is equivalent to measuring out to 180 degrees 2Theta using an x-ray wavelength of 1.0 Angstroms.
- the resulting PDF is reconstructed over the range of inter atomic distances of interest and displayed in real space Angstroms.
- the PDF trace provides a unique finger-print of the inter-atomic distances that define a particular solid form. As such, it provides a valuable tool to match solid forms and, more particularly, to identify relationships between disordered crystalline and other crystalline substances.
- PDF peak positions correspond to atom - atom distances and the relative peak intensities correspond to the number of atoms having that specific separation. Both the peak positions and relative peak intensities should match between PDF traces of the same solid form, within experimental limitations. However, when matching crystalline and disordered crystalline substances, relative peak intensities of intermolecular peaks should be adjusted because of loss of order.
- the degree of sameness between PDF traces should be determined using only those inter-atomic distances best defined by the measurement range and resolution. For laboratory measurements, the short inter-atomic distances ⁇ 5.0 Angstroms can be disregarded. For matching crystalline solid forms, it is usually sufficient to only include inter-atomic distances out to the 3 rd or 4 th coordination sphere. When matching disordered forms, the maximum inter-atomic distance considered should be reduced to be consistent with the typical molecule to molecule coordination distance.
- Correlation length (A) (K lambda) / (beta cos(theta)), where beta is the increase in peak width at half height in radians, theta is the Bragg angle of the broadened peak, lambda is the x-ray wavelength and K is a shape constant -0.9.
- the PDF trace itself will rapidly drop to a constant value over very short distances, which can be as small as the first coordination sphere also for amorphous materials.
- An automatic matching algorithm for PDF traces from laboratory X- ray powder diffraction data may be provided to score the degree of sameness by matching peak position and relative peak intensities over a range of inter-atomic distances from 5.0 Angstroms out to 50 Angstroms, for example. For disordered materials, the larger inter-atomic distance cut-off can be automatically reduced as the degree of disorder increases.
- Results of operations performed by computing platform 110 may be stored, for example, in storage module 140.
- PDF traces may be stored in a PDF trace database 154
- Results of the comparison of PDF traces may also be stored in storage module 140.
- Storage module 140 may be implemented as any appropriate type of computer readable medium or media.
- Storage module 140 may be used to store XRPD patterns in pattern database 150, for instance in XRPD patterns database 152.
- PDF traces and results of the comparison of PDF traces may also be provided to output module 130.
- Output module 130 may include a printer 132, an output interface 134, and/or a display 136.
- Output interface 134 may be used to provide stored information or results to a user via a computer network, the Internet, or to save such information on a computer readable medium or media (not shown).
- Display 136 may provide information or results to the user of the system, e.g., via a computer screen.
- An embodiment of the invention comprises generating a plurality of solid samples of a substance, such as a chemical compound, preparing XRPD patterns of the solid samples, calculating the corresponding PDF traces of the solid samples, and grouping the plurality of PDF traces by similarly into two or more groups.
- the PDF traces may be grouped, for example, using hierarchical cluster analysis.
- the grouping of PDF traces by similarity into different groups can identify those samples likely having the same solid form (within each group) and those likely having different solid forms (between groups).
- the pattern matching technique disclosed in US 2004/0103130 A1 may be used to group together PDF traces that most likely represent the same solid form.
- a subsequent step could involve practicing an aspect of the embodiment of Example 4 of comparing the PDF trace of one or more of the resulting solid forms to the PDF trace of a known solid form of the substance to determine whether any of the solid forms of the substance made in a production run are new.
- This method as well as that of Example 1 , may be implemented, for example, to manually or in an automated fashion match or distinguish solid forms of samples made in a production run.
- a subsequent step could involve practicing an aspect of the embodiment of Example 4 of comparing the PDF trace of one or more of the resulting solid forms to the PDF trace of a known solid form of the substance to determine whether any of the solid forms of the substance made in a production run are new.
- Example 3 Another embodiment of the invention comprises generating a plurality of solid samples of a substance, such as a chemical compound, preparing XRPD patterns of the solid samples, grouping the plurality of XRPD patterns of the substance by similarly into two or more groups, creating a composite XRPD pattern for each group, calculating the corresponding PDF trace of each of the composite XRPD patterns, and comparing the PDF traces to determine whether the groups of samples represent the same or different solid form of the substance.
- the XRPD patterns may be grouped by similarity using the pattern matching technique disclosed US 2004/0103130 A1.
- a subsequent step could involve practicing an aspect of the embodiment of Example 4 of comparing the PDF trace of one or more of the resulting solid forms to the PDF trace of a known solid form of the substance to determine whether any of the solid forms of the substance made in a production run are new.
- Example 4 Another embodiment of the invention comprises generating one or more solid test samples of a substance, such as a chemical compound, preparing XRPD patterns of the one or more solid test samples, calculating the corresponding PDF traces of the one or more solid test samples, and comparing one or more of the PDF traces of the test samples to the PDF trace of a known solid form of the substance to determine whether the test samples are of the same or different solid form as the known solid form.
- This embodiment may be used, for example, to determine if a solid form produced from a production run is a disordered relative of a known solid form, or if it is a new solid form. This embodiment may also be used to screen various solid forms on the basis of their PDF trace.
- the present invention comprises a method of screening for new solid forms of a substance, which comprises providing the PDF trace of each of a plurality of samples of the substance, comparing the PDF traces of the samples to the PDF traces of one or more known solid forms of the substance, and identifying those samples that have a PDF trace different from that of the known solid forms.
- Example 5 It is often desirable to know which crystalline solid form is the parent of a given disordered crystalline material.
- Another embodiment of the invention therefore comprises calculating the PDF trace of a disordered crystalline solid form of a substance and comparing it to the PDF trace of the another crystalline sample of the substance, for example one having a known crystalline solid form, to determine whether the two substances have the same solid form, being related through disorder, or whether the two have different solid forms.
- the range of the PDF transform in real space should be truncated to below the average crystal size in the disordered material in order to maximize the match score. Inspection of the PDF transform from the disordered material may identify the maximum real space range to be matched.
- the pattern comparison system may set the maximum range to the real space distance where the PDF transform for the disordered material falls to a flat zero line. Typically for most small and medium organic molecules this distance is between 15 Angstroms and 30 Angstroms for very disordered material.
- FIG. 2 illustrates a typical disordered XRPD pattern (top) and how it compares to the XRPD pattern of a highly crystalline compound (bottom). It is difficult to determine the exact relationship between the two purely through visual inspection of the XRPD patterns, as the peaks in the disordered pattern are quite broad.
- FIG. 2 illustrates a typical disordered XRPD pattern (top) and how it compares to the XRPD pattern of a highly crystalline compound (bottom). It is difficult to determine the exact relationship between the two purely through visual inspection of the XRPD patterns, as the peaks in the disordered pattern are quite broad.
- FIG. 2 illustrates a typical disordered XRPD pattern (top) and how it compares to the XRP
- Example 6 [047] Another embodiment of the invention comprises identifying residual crystalline "memory" within an amorphous matrix of a substance.
- FIG. 4 illustrates XRPD patterns of a compound before cryogrinding (top, 0 minutes), after 12 minutes of cryogrinding (middle) and after 30 minutes of cryogrinding (bottom).
- FIG. 5 illustrates the corresponding PDF traces of the materials before cryogrinding (top) after 12 minutes of cryogrinding (middle) and after 30 minutes of cryogrinding (bottom). A comparison of the PDF traces clearly shows that the two cryoground substances retain residual crystallinity of the original crystalline substance.
- Example 7 Another embodiment of the invention comprises determining the crystalline correlation length of a disordered crystalline substance.
- a PDF trace derived from an XRPD pattern of a disordered crystalline substance will show a fall off in signal at larger atom-atom distances. By tracing the signal fall off to the base line, an estimation of the crystalline correlation length can be achieved. This correlation length can be contrasted to the length scale extracted from the observed peak broadening in the XRPD pattern using the Scherrer equation.
- a regression analysis of PDF peak signal values can be used to determine the crystal correlation lengths (crystal size or crystal perfection) by 1 ) determining peak signal in PDF peaks as a function of atom-atom distance, 2) performing linear regression least squares best estimate of line through the peak signal values, and 3) determining atom-atom distance where the best estimate line crosses the base line of the PDF plot.
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Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP05723818A EP1751527A2 (en) | 2004-02-24 | 2005-02-24 | Analysis and screening of solid forms using the atomic pair distribution function |
| US10/590,204 US20070243620A1 (en) | 2004-02-24 | 2005-02-24 | Analysis and Screening of Solid Forms Using the Atomic Pair Distribution Function |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US54697604P | 2004-02-24 | 2004-02-24 | |
| US60/546,976 | 2004-02-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2005082050A2 true WO2005082050A2 (en) | 2005-09-09 |
| WO2005082050A3 WO2005082050A3 (en) | 2007-08-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/US2005/006114 Ceased WO2005082050A2 (en) | 2004-02-24 | 2005-02-24 | Analysis and screening of solid forms using the atomic pair distribution function |
| PCT/US2005/005914 Ceased WO2005082012A2 (en) | 2004-02-24 | 2005-02-24 | Analysis and screening of solid forms using the atomic pair distribution function |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/US2005/005914 Ceased WO2005082012A2 (en) | 2004-02-24 | 2005-02-24 | Analysis and screening of solid forms using the atomic pair distribution function |
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| EP (1) | EP1751527A2 (en) |
| WO (2) | WO2005082050A2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007038398A1 (en) * | 2005-09-26 | 2007-04-05 | Ssci, Inc. | Methods of characterizing compositions |
| EP2666774A1 (en) | 2008-01-18 | 2013-11-27 | Merck Sharp & Dohme Corp. | Beta-lactamase Inhibitors |
-
2005
- 2005-02-24 WO PCT/US2005/006114 patent/WO2005082050A2/en not_active Ceased
- 2005-02-24 EP EP05723818A patent/EP1751527A2/en not_active Ceased
- 2005-02-24 WO PCT/US2005/005914 patent/WO2005082012A2/en not_active Ceased
Non-Patent Citations (8)
| Title |
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| BIZID A ET AL: "Study by diffraction of X-rays of liquid gallium between +50 and 110[deg.]C" PHYSICA STATUS SOLIDI A EAST GERMANY, vol. 23, no. 1, 16 May 1974 (1974-05-16), pages 135-145, XP002427512 ISSN: 0031-8965 * |
| HATTORI T ET AL: "Structure of liquid GaSb under pressure" JOURNAL OF NON-CRYSTALLINE SOLIDS, NORTH-HOLLAND PHYSICS PUBLISHING. AMSTERDAM, NL, vol. 312-314, October 2002 (2002-10), pages 26-29, XP004382656 ISSN: 0022-3093 * |
| HERMANN A ET AL: "Conformations and structures of desflurane and isoflurane" JOURNAL OF FLUORINE CHEMISTRY, ELSEVIER SEQUOIA, LAUSANNE, CH, vol. 101, no. 2, February 2000 (2000-02), pages 223-231, XP004244522 ISSN: 0022-1139 * |
| IKEYA T ET AL: "Change in the structure of niobium pentoxide due to mechanical and thermal treatments" JOURNAL OF NON-CRYSTALLINE SOLIDS NETHERLANDS, vol. 105, no. 3, November 1988 (1988-11), pages 243-250, XP002427513 ISSN: 0022-3093 * |
| MARTIN U. SCHMIDT: "The Role of Qualitative and Quantitative Analyses" WORKSHOP "PHARMACEUTICAL APPLICATIONS OF X-RAY POWDER DIFFRACTION", [Online] 31 August 2006 (2006-08-31), pages 1-24, XP002427515 Geneva Retrieved from the Internet: URL:http://www.anorg.chemie.uni-frankfurt.de/AK_Schmidt/epdic.pdf> [retrieved on 2007-03-30] * |
| See also references of EP1751527A2 * |
| SHETH, BATES, MULLER, GRANT: "Polymorphism in Piroxicam" CRYSTAL GROWTH & DESIGN, vol. 4, no. 6, 1 September 2004 (2004-09-01), pages 1091-1098, XP002427514 * |
| YAMAMURA SHIGEO ET AL: "Change of the microstructure of microcrystalline cellulose with grinding and compression" JOURNAL OF PHARMACY AND PHARMACOLOGY, vol. 49, no. 12, December 1997 (1997-12), pages 1178-1181, XP009081503 ISSN: 0022-3573 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007038398A1 (en) * | 2005-09-26 | 2007-04-05 | Ssci, Inc. | Methods of characterizing compositions |
| EP2666774A1 (en) | 2008-01-18 | 2013-11-27 | Merck Sharp & Dohme Corp. | Beta-lactamase Inhibitors |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005082050A3 (en) | 2007-08-30 |
| EP1751527A2 (en) | 2007-02-14 |
| WO2005082012A2 (en) | 2005-09-09 |
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