WO2004084597A1 - Material for multilayer printed circuit board with built-in capacitor, substrate for multilayer printed circuit board, multilayer printed circuit board and methods for producing those - Google Patents
Material for multilayer printed circuit board with built-in capacitor, substrate for multilayer printed circuit board, multilayer printed circuit board and methods for producing those Download PDFInfo
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- WO2004084597A1 WO2004084597A1 PCT/JP2004/003729 JP2004003729W WO2004084597A1 WO 2004084597 A1 WO2004084597 A1 WO 2004084597A1 JP 2004003729 W JP2004003729 W JP 2004003729W WO 2004084597 A1 WO2004084597 A1 WO 2004084597A1
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- WIPO (PCT)
- Prior art keywords
- capacitor
- built
- wiring board
- multilayer wiring
- thin film
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/162—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed capacitors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/09509—Blind vias, i.e. vias having one side closed
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4602—Manufacturing multilayer circuits characterized by a special circuit board as base or central core whereon additional circuit layers are built or additional circuit boards are laminated
Definitions
- the present invention relates to a multilayer wiring board material having a built-in capacitor, a multilayer wiring board substrate and a multilayer wiring board, and a method of manufacturing these.
- the capacitance of the capacitor built in the multilayer wiring board is several hundred pF to several / xF, and a capacitance density of 500 pF / mm 2 or more is required.
- the dielectric of the capacitor there are a method using a resin and a composite material of a high dielectric constant inorganic filler and a method using an inorganic thin film material. In order to form a capacitor with a high capacitance density, it is effective to 1) use a dielectric having a high relative dielectric constant and 2) use a dielectric having a small thickness.
- the resin itself has a relatively low dielectric constant, so there is a limit in increasing the dielectric constant; 2) an insulating film with no leakage current and a film thickness of several / level is formed.
- a method of incorporating a thin film capacitor in a multilayer wiring board using a resin there is a method using a CVD method (see page 4 and FIG.
- FIG. 1 of JP-A-5-191503; FIG. 4, page 4 of Japanese Laid-Open Patent Application No. 5-222684, and a method using a sputtering method page 6, page 2 of Japanese Patent Application Laid-Open No. 2002-2525.
- Fig. 1 or a method using the sol-gel method (see page 12 of JP-A-8-213375, Fig. 21; Fig. 21 of JP-A-8-213375).
- the present invention provides a multilayer wiring board with a built-in capacitor, wherein a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 am is provided on a surface of a metal foil.
- the present invention relates to a material for use, a substrate for a multilayer wiring board with a built-in capacitor, and a method for manufacturing a multilayer wiring board with a built-in capacitor.
- the present invention relates to the following embodiments.
- the dielectric thin film is made of barium titanate, strontium titanate, titanate Calcium, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, barium strontium titanate, lead zirconate titanate, lead magnesium niobate, lead monotitanate (1)
- One or more metal films selected from the group consisting of chromium, molybdenum, titanium, and nickel are provided as the metal whose metal foil is made of copper and forms a stable self-oxidizing film on its surface.
- the metal foil has a surface roughness of 0.01 to 0.5 m (1)
- a material for a multilayer wiring board with a built-in capacitor characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m is formed on the surface of a metal foil by a vacuum evaporation method. Manufacturing method.
- a material for a multilayer wiring board with a built-in capacitor characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is formed on a metal foil surface by an ion plating method. Manufacturing method.
- the dielectric constant is 10 to 2000 and the film thickness is 0.05 to 2 on the surface of the metal foil.
- a method for producing a material for a multilayer wiring board with a built-in capacitor, comprising forming a ⁇ m dielectric thin film by a sputtering method.
- the dielectric thin film is formed by using a rolled metal foil and moving the metal foil continuously in a heating furnace whose temperature is controlled to be constant. (6) to (10) Manufacturing method of multilayer wiring board material with built-in capacitor.
- the metal foil is made of copper, and is selected from the group consisting of platinum, gold, silver, palladium, ruthenium, and iridium as a metal that forms a copper oxidation protection film on the surface on which the dielectric thin film is formed.
- the metal foil is made of copper, and at least one metal film selected from the group consisting of chromium, molybdenum, titanium, and nickel is provided as a metal that forms a stable self-oxidizing film on its surface.
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductor circuit via a pre-predader; 2) a surface of a dielectric thin film. 3) a step of forming a desired capacitor electrode 1 by etching away leaving an arbitrary portion of the metal layer, and 4) at least a capacitor electrode of a dielectric thin film.
- Etching to form the desired capacitor dielectric leaving any portion, including 1), and5) removing the dielectric thin film, leaving at least any portion of the exposed metal layer including the capacitor dielectric.
- a manufacturing method comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; and 2) 0.1 to 5 3) a step of forming a metal plating resist while leaving any part including the capacitor electrode 1), and 4) forming a 10 to 50 m capacitor electrode 1 by metal plating.
- a method for producing a multilayer wiring board with a built-in capacitor comprising a step of forming a pattern.
- a manufacturing method comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader, and 2) chemically coating an arbitrary portion of the surface of the dielectric thin film.
- Desired capacitor electrode 2 Method of manufacturing a capacitor built multilayer wiring board characterized by having a step of forming a including conductor patterns.
- the metal particles of the conductive paste which are metallized by a chemical reaction contain at least ⁇ or more metals selected from the group consisting of gold, platinum, silver, copper, palladium and ruthenium, and their average particle size
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising a step of forming an arbitrary conductor pattern electrically insulated from a desired capacitor electrode 1, capacitor electrode 2, and capacitor electrode.
- the surface of the metal foil and the conductive circuit which is a material for a multilayer wiring board with a built-in capacitor, has a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m provided on the surface of the metal foil.
- a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m provided on the surface of the metal foil.
- a step of forming a metal layer 3) a step of forming a desired capacitor electrode 1 by etching and removing any part of the metal layer; and 4) an arbitrary part of the dielectric thin film including at least the capacitor electrode 1. 5) forming a desired capacitor dielectric by etching away while leaving a thin film, and 5) removing any part of the metal layer appearing by removing the dielectric thin film to expose the hardened insulating layer of the pre-preda.
- a multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor that has a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m on the surface of a metal foil A manufacturing method, comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; and 2) 0.1 to 5 on a surface of a dielectric thin film. m) forming a metal layer, 3) forming a metal-plated resist while leaving any part including the capacitor electrode 1, and 4) forming a 10-50 / m capacitor electrode 1 by metal-plated.
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising a step of forming a conductor pattern including a capacitor electrode 2.
- a desired capacitor electrode 1 by forming a metal layer of 10 to 50 m using a conductive paste which is metallized by an appropriate reaction; 3) any dielectric layer including at least the capacitor electrode 1 of a dielectric thin film 4) removing the dielectric thin film to remove the dielectric thin film and etching away any exposed portions of the metal layer to expose the cured insulating layer of the pre-preda.
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising a step of forming a conductor pattern including a desired capacitor electrode 2 by etching and removing an arbitrary portion including the same.
- the metal particles of the conductive paste that are metallized by a chemical reaction contain at least one metal selected from the group consisting of gold, platinum, silver, copper, palladium, and ruthenium, and have an average particle size of the metal particles.
- (31) The method for producing a multilayer wiring board with built-in capacitors according to (31), wherein the diameter is 0.1 to 1 Onm. '
- a manufacturing method comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predeer, and 2) etching away leaving any part of the dielectric thin film.
- Forming a desired capacitor dielectric 3) removing the dielectric thin film and etching away any part of the metal layer that has appeared, thereby exposing the cured insulating layer of the pre-predator, 4). Removing the insulating layer exposed by the laser irradiation to form a hole and exposing the inner conductor circuit; and5) forming a hole of 10 to 50 m on the surface of the substrate on which the capacitor dielectric is formed and the surface of the hole.
- a metal foil surface of a multilayer wiring board material with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on the surface of the metal foil.
- the circuit board is characterized in that there are two or more conductor layers on the board, and the circuit pattern of the adjacent conductor layer is connected at any location by holes made into conductors.
- the method of etching and removing the dielectric thin film is characterized in that it is any one of an ion beam etching method, an RIE (Reactive Ion Etching) method, and a solution etching method. (16) to (34) ) The method for manufacturing a multilayer wiring board with a built-in capacitor as described in the above.
- the substrate has a via hole that connects the conductive layers inside the substrate and has a smooth metal layer on the surface.
- the surface of the substrate has a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m.
- the dielectric thin film is any of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, or The film according to any one of (1) to (4), characterized in that the film is a film composed of two or more solid solutions containing any of these, or a laminate of two or more containing any of these. Substrate for multilayer wiring board with built-in capacitor.
- the method of forming a dielectric thin film is any one of a vacuum deposition method, an ion plating method, a CVD (Chemical Vapor Deposition) method, a sputtering method, and a sol-gel method (1) to (5).
- the substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (7), wherein the insulating material of the substrate comprises a resin and a glass woven fabric or a glass nonwoven fabric.
- the resin used for the insulating material of the substrate is a thermosetting resin, and its glass transition point temperature is 170 ° C or higher.
- the substrate for a multilayer wiring board with a built-in capacitor according to any one of (9) to (9).
- (1) a step of forming a desired capacitor dielectric by etching away leaving an arbitrary portion including the capacitor electrode of (1); and4) an optional metal layer including at least the capacitor dielectric of a metal layer that appears after removing the dielectric thin film.
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising a step of forming a conductor pattern including a desired second capacitor electrode by etching and removing a part of the multilayer wiring board.
- a method for producing a multilayer wiring board with a built-in capacitor wherein the substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (12) is used as an inner layer board. 1) forming a metal layer of 1 to 5; 2) forming a metal plating resist while leaving an arbitrary portion including the first capacitor electrode; and 3) forming a metal plating resist of 10 to 50 by metal plating.
- a method for producing a multilayer wiring board with a built-in capacitor comprising a step of forming a conductor pattern including a desired second capacitor electrode by removing a chip.
- the metal particles of the conductive paste that are metallized by a chemical reaction include at least one metal selected from the group consisting of gold, platinum, silver, copper, palladium, and ruthenium, and (18) The method for manufacturing a multilayer wiring board with a built-in capacitor, wherein the particle size is 0.1 to 10 nm.
- Etsu leaving any part A multi-layer wiring board with a built-in capacitor, comprising a step of forming an arbitrary conductor pattern electrically insulated from a desired first capacitor electrode, second capacitor electrode, and capacitor electrode by removing a ring. Manufacturing method.
- the method for etching and removing a dielectric thin film is any one of an ion beam etching method, an RIE (Reactive Ion Etching) method, and a solution etching method. (13) to (20) The method for manufacturing a multilayer wiring board with a built-in capacitor described in Crab.
- a multilayer wiring board having a plurality of insulating layers, a plurality of conductive layers, and conductive via holes electrically connecting the conductive layers, and a dielectric constant of at least one insulating layer of 20 or more.
- a multilayer wiring board having a plurality of insulating layers, a plurality of conductive layers, and conductive via holes electrically connecting the conductive layers, and having a dielectric constant of at least one insulating layer of 20 or more.
- This is a dielectric thin film with a thickness of 0.1 to 1 m and a thickness of 0.1 to 1 m.
- It is a multilayer wiring board with a built-in capacitor that has electrodes facing the insulating layer.
- a first capacitor electrode included in the projection surface of the body thin film, and 2) a conductor layer forming the first capacitor electrode is electrically connected to the second capacitor electrode at all ends of the dielectric thin film.
- a multilayer wiring board with a built-in capacitor (25) The multilayer wiring board with a built-in capacitor according to (23) or (24), wherein the second capacitor electrode is a ground layer or a power supply layer of the multilayer wiring board.
- the dielectric thin film is made of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, or lead zirconate. Or a film comprising two or more solid solutions containing any of these, or a laminate consisting of two or more solid solutions containing any of them.
- (23) to (25) A multilayer wiring board with a built-in capacitor according to the description.
- the second capacitor electrode is made of copper, and has on its surface at least one kind selected from the group consisting of platinum, gold, silver, palladium, ruthenium, iridium, chromium, molybdenum, titanium, and nickel.
- the first capacitor electrode includes at least one metal layer selected from the group consisting of copper, silver, tin, nickel, zinc, chromium, molybdenum, titanium, and nickel.
- the multilayer wiring board with a built-in capacitor according to any one of (30) to (30).
- the metal foil comes in contact with the insulating material on a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 im is provided on one side of the metal foil.
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising:
- the concentration of the chelating agent of the etchant is 0.001 to 0.5 mo 1 Z1, the concentration of hydrogen peroxide is 1 to 5 Owt%, and the pH of the etchant is 2 to 7 (1)
- the method for producing a multilayer wiring board with a built-in capacitor is 0.001 to 0.5 mo 1 Z1, the concentration of hydrogen peroxide is 1 to 5 Owt%, and the pH of the etchant is 2 to 7
- the chelating agent is selected from the group consisting of ethylenediaminetetraacetic acid (EDTA), hydroxyethyliminodiacetic acid (HI DA), imino diacetic acid (IDA;), dihydroxyethyl lysine (DHEG), and alkali salts thereof.
- EDTA ethylenediaminetetraacetic acid
- HI DA hydroxyethyliminodiacetic acid
- IDA imino diacetic acid
- DHEG dihydroxyethyl lysine
- a substrate provided on at least one side of an insulating material so as to be in contact with
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising: 1) forming a metal layer serving as a capacitor electrode at a predetermined position on a dielectric thin film on a substrate surface; and 2) forming a metal layer on at least the metal layer on a substrate surface.
- the photosensitive dry film is characterized in that the thickness of the photosensitive dry film is 1 to 3 times the thickness of the metal layer serving as a capacitor electrode which is protected from wet etching by the etching resist formed by the photosensitive dry film.
- (6) A method for manufacturing a multilayer wiring board with a built-in capacitor.
- the dielectric thin film is made of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, and lead zirconate.
- One side of metal foil A has a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to
- a method for manufacturing a multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor provided with a 2 / m dielectric thin film comprising: 1) a metal foil A of a material for a multilayer wiring board with a built-in capacitor; A step of laminating a metal foil B via an insulating material to form a substrate; 2) a step of etching and removing an arbitrary portion of the metal foil B to expose an insulating layer formed of the insulating material; and 3) a laser.
- Irradiation removes the exposed insulating layer to form a hole, exposing the metal foil A; 4) forming metal layers on both sides of the board surface including the inside of the hole; 5) multilayer capacitor built-in A step of etching a capacitor electrode of an arbitrary shape from a metal layer on a dielectric thin film of a wiring board material and a pattern, and 6) a capacitor dielectric of an arbitrary shape including a capacitor electrode A pattern from the exposed dielectric thin film.
- D 7) A capacitor characterized by having a step of etching a capacitor electrode B of an arbitrary shape including a capacitor dielectric pattern from a metal foil A that has appeared after removing the dielectric thin film. Manufacturing method of built-in multilayer wiring board.
- a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 II m is provided on one side of the metal foil A is used.
- a method of manufacturing a multilayer wiring board with a built-in capacitor comprising: 1) a through-hole is provided at an arbitrary position on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor, and the through-hole is formed of a thermosetting resin and a metal; A step of laminating a metal foil B via an insulating material filled with a conductive paste containing a filler to form a substrate; 2) a step of forming a metal layer on at least the dielectric thin film side of the substrate surface; and 3) a capacitor.
- the capacitor electrode A pattern of any shape can be etched from the metal layer on A) forming a capacitor dielectric of an arbitrary shape including a capacitor electrode A pattern from the exposed dielectric thin film by etching; and 5) removing a metal foil A that has appeared by removing the dielectric thin film.
- a method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a capacitor electrode B of an arbitrary shape including a capacitor dielectric pattern by etching.
- a method for producing a multilayer wiring board with a built-in capacitor comprising the steps of:
- a manufacturing method comprising: 1) laminating a metal foil B on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; and 2) a laser at an arbitrary position of the metal foil B. By irradiating, the metal foil B and the insulating layer formed of the above-mentioned insulating material are simultaneously removed to form a hole, and the metal foil A is exposed.
- a multilayer wiring board with a built-in capacitor that uses a dielectric thin film with a dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 zm provided on one side of metal foil
- a multilayer wiring board with a built-in capacitor that uses a dielectric thin film with a dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 / zm on one side of metal foil A) A conductive base in which a through-hole is provided at an arbitrary position on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through-hole is metallized by a chemical reaction.
- Step of removing metal-coated resist 6) Etching and removing the 0.1 to 5 m metal layer exposed on the substrate surface; and 7) Etching capacitor dielectric of any shape including capacitor electrode A pattern from the exposed dielectric thin film.
- a capacitor electrode B of any shape including the capacitor dielectric pattern was formed by etching, and the exposed metal foil B was removed.
- At least 0.1 to 5 im of the metal layer formed on the surface of the dielectric thin film is: at least one metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel; At least one metal layer selected from the group consisting of silver, tin, nickel and zinc; or at least one metal layer selected from the group consisting of chromium, molybdenum, titanium and nickel and copper
- the conductor pattern formed by metal plating includes at least one metal selected from the group consisting of copper, silver, tin, nickel and zinc. (9) to ( 13) The method for producing a multilayer wiring board with a built-in capacitor according to any one of the above.
- a multilayer wiring board material with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on one side of metal foil A.
- a through hole is provided at an arbitrary position on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through hole is made of a conductive paste containing a thermosetting resin and a metal filler.
- Capacitor electrode B of any shape including capacitor dielectric pattern is formed from metal foil A by etching, and circuit is formed by etching exposed metal foil B. Manufacturing method of wiring board.
- One side of metal foil A has a relative dielectric constant of 10 to 2000 and a film thickness of 0.05
- a method for manufacturing a multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor provided with a dielectric thin film of up to 2 m comprising: 1) a metal foil A of a material for a multilayer wiring board with a built-in capacitor; A step of laminating a metal foil B via an insulating material filled with a conductive paste in which a through-hole is provided at a location and filled with a conductive paste by a chemical reaction, and 2) dielectric A step of forming a desired capacitor electrode A by forming a metal layer using a conductive paste which is metallized by a chemical reaction on an arbitrary portion of the surface of the body thin film; 4) A step of forming a desired capacitor dielectric by etching and removing an arbitrary portion including the capacitor electrode A; and 4) etching the capacitor dielectric pattern from the metal foil A that
- the manufacturing method includes: 1) a step of laminating a metal foil B, which is a material for a multilayer wiring board with a built-in capacitor, on a surface of a metal foil B via an insulating material to form a substrate; and 2) an arbitrary portion of a dielectric thin film.
- Multilayer wiring with built-in capacitor A step of laminating a metal foil B on a surface of a metal foil A of a plate via an insulating material to form a substrate; 2) etching and removing an arbitrary portion of the dielectric thin film to leave a desired capacitor dielectric; 3) Irradiating a laser on an arbitrary portion of the metal foil B, thereby simultaneously removing the metal foil B and the insulating layer formed from the above insulating material to form a hole, thereby exposing the metal foil A.
- a method for producing a multilayer wiring board with a built-in capacitor comprising a step of forming a capacitor electrode B.
- a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 ⁇ m is provided on one surface of a metal foil A.
- the method for manufacturing a multilayer wiring board with a built-in capacitor to be used is as follows: 1) A through-hole is provided at an arbitrary position on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor, and the through-hole is formed of a thermosetting resin and a metal.
- Step of forming capacitor electrode A and capacitor electrode B A method for producing a multilayer wiring board with a built-in capacitor, comprising:
- a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on one side of a metal foil A is used.
- This is a method for manufacturing a multilayer wiring board with a built-in capacitor. Laminating a metal foil B via a dielectric material filled with a conductive paste to be used as a substrate, and 2) etching and removing any desired portion of the dielectric thin film to obtain a desired capacitor dielectric.
- a method for manufacturing a multilayer wiring board with a built-in capacitor comprising a step of forming desired capacitor electrodes A and capacitor electrodes B by etching and removing any portions of the metal layer and the metal foil A.
- the conductive paste to be metallized by a chemical reaction contains at least one or more metal particles selected from the group consisting of gold, platinum, silver, copper, palladium and ruthenium; and The method for producing a multilayer wiring board with a built-in capacitor according to (6), (12), (15), (16) or (20), wherein the average particle diameter is 0.1 to 10 nm.
- the method for etching and removing the dielectric thin film is any one of an ion beam etching method, an RIE (Reactive Ion Etching) method, and a solution etching method.
- the insulating material used for forming the insulating layer of the substrate is a pre-preda containing a thermosetting resin as a resin, and the glass transition temperature of the thermosetting resin is 170 or more.
- the dielectric thin film is made of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, titanium Any one of barium bromide, lead zirconate titanate and lead magnesium magnesium niobate-lead titanate, or a solid containing at least two of them (1)
- the capacitor according to any one of (1) to (25), wherein a material for a multilayer wiring board with a built-in capacitor, which is a film made of a solution or a laminated body containing at least two of these, is used. Manufacturing method of built-in multilayer wiring board.
- Metal foil A is made of copper, and is selected from the group consisting of platinum, gold, silver, palladium, ruthenium, and iridium as a metal that serves as a copper oxide protective film on the surface on which the dielectric thin film is formed.
- a material for a multilayer wiring board with a built-in capacitor wherein the surface roughness of the surface of the metal foil A on which the dielectric thin film is formed is 0.01 to 0.5 / zm.
- FIG. 1 is a cross-sectional view showing a material for a multilayer wiring board with a built-in capacitor according to an embodiment of the present invention.
- FIG. 2 is a cross-sectional view showing the process of Example A-1, Example A-2, and Example A-5.
- FIG. 3 is a cross-sectional view showing a process of Example A-3.
- FIG. 4 is a cross-sectional view showing the process of Example A-4.
- Figure 5 shows FIG. 9 is a cross-sectional view showing a process of Example A-6.
- FIG. 6 is a sectional view showing a process of Example A-7.
- FIG. 7 is a cross-sectional view showing a process of Example A-8.
- FIG. 8 is a cross-sectional view showing a process of Comparative Example A_1.
- FIG. 9 to 11 are cross-sectional views showing the inner substrate used in Example B of the present invention.
- FIG. 12 is a cross-sectional view showing a part of the process of Example B-1 and the processes of Examples B-4 and B-5.
- FIG. 13 is a cross-sectional view showing a process of Example B-6.
- FIG. 14 is a cross-sectional view showing the process of Example B-7.
- FIG. 15 is a cross-sectional view showing a process of Example B-8.
- FIG. 16 is a cross-sectional view showing a process of Comparative Example B-1.
- FIGS. 17 to 19 are cross-sectional views showing manufacturing steps of Experimental Examples C-11 to C-19.
- FIG. 20 is a cross-sectional view showing the process of Example D-1.
- FIG. 21 is a cross-sectional view showing a process of Example D-2.
- FIG. 22 is a cross-sectional view showing a process of Example D-3.
- FIG. 23 is a cross-sectional view showing a process of Example D-4 and Example D_5.
- FIG. 24 is a cross-sectional view showing a process of Example D-6.
- FIG. 25 is a cross-sectional view showing a process of Example D-7.
- FIG. 26 is a cross-sectional view showing the process of Example D-8 and Example D-9.
- FIG. 27 is a cross-sectional view showing a process of Example D_10 and Example D-11.
- FIG. 28 is a cross-sectional view showing a process of Example D-12.
- FIG. 29 is a cross-sectional view showing a process of Example D-13.
- FIG. 30 is a cross-sectional view showing a process of Example D-14 and Example D-15.
- FIG. 31 is a cross-sectional view illustrating a process of Comparative Example D-1.
- One embodiment of the present invention is characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 ⁇ m is provided on the surface of the metal foil.
- Capacitor It relates to a material for a built-in multilayer wiring board. With this multilayer wiring board material, it is easy to obtain a dielectric thin film having a uniform film thickness because the dielectric thin film is formed on the surface of the metal foil.
- the thickness of the dielectric thin film is preferably at least 0.05 m, more preferably at least 0.1 im, in order to secure insulation and suppress leakage current.
- the film thickness is preferably 2 m or less, more preferably 1 or less. Therefore, the film thickness is preferably from 0.05 to 2 m, more preferably from 0.1 to lm.
- the relative dielectric constant required to obtain a capacitance density of 500 pF / mm 2 or more is 2.9 or more when the film thickness is 0.05 m, 5.7 or more when the film thickness is 0.1 m, and 1 2] It is 57 or more for 1 and 113 or more for 2 m.
- a thin film capacitor of 500 pF / mm 2 can be formed with a thickness of 0.05 to 2 m.
- the higher the relative dielectric constant of the thin film dielectric the more advantageous the miniaturization of the built-in capacity, and is preferably 10 to 2000, more preferably 20 to 2000.
- the relative permittivity indicates a value measured at a frequency of 1 MHz in accordance with IPC-650 2.5.5.2 in an environment controlled at 25 ° C.
- the value of the film thickness can be obtained by using a device capable of observing a cross section of the capacitor on which the electrodes are formed, such as a scanning electron microscope, capable of observing a thickness of less than 0.05 m.
- the dielectric thin film is not limited as long as it can form a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 am, but barium titanate, strontium titanate, and calcium titanate , Magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, barium strontium titanate, lead zirconate titanate, lead magnesium niobate and lead monotitanate It is preferable to use a film made of a dielectric such as. At this time, two or more types of solid solutions and laminates can be used.
- metal oxides having a belovskite crystal structure are known to exhibit a high dielectric constant, and can be preferably used.
- the metal foil include a copper foil, a silver foil, a tin foil, a nickel foil, and a zinc foil. Among them, copper foil is preferable in consideration of electrical characteristics and economy.
- the thickness of the metal foil is preferably from 10 to 50 / m.
- a copper foil it is preferable to provide a metal layer that forms an oxidation protective film of copper and / or a metal layer that forms a stable self-oxidizing film on the surface of the copper foil. These coatings are preferably between 0.1 and 3 tm.
- a metal film such as platinum, gold, silver, palladium, ruthenium, and iridium is preferable.
- copper foil is used as the metal foil, if a dielectric thin film of metal oxide is formed directly on the surface of copper, oxygen is supplied from the metal oxide to copper and copper oxide is generated at the interface, reducing adhesion Let it. Therefore, it is preferable to form an oxidation protection film that blocks oxygen supplied from the metal oxide and ensures adhesion to copper.
- a metal film of chromium, molybdenum, titanium, nickel or the like is preferable.
- the adhesion may be reduced due to the generation of copper oxide.Therefore, the oxygen supplied from the metal oxide dielectric thin film is blocked, and the adhesion to copper is reduced. It is preferable to form a self-oxidizing film to secure.
- the metal foil preferably has a surface roughness of 0.01 to 0.5 m.
- the thickness of the dielectric thin film is as described above (preferably, 0.05 to 2 m, more preferably 0.1 to l zm.
- the surface roughness of the substrate on which the dielectric thin film is formed is at least dielectric constant. It is necessary that the thickness be smaller than the thickness of the body thin film, and in order to ensure reliability as an insulating film such as leakage current, the thickness is preferably less than 50% of the thickness of the dielectric thin film. ⁇ Therefore, a surface roughness of 0.025 to 0.5 xm is preferable, but a surface roughness of 0.01 to 0.5 m is most preferable for securing reliability.
- the surface roughness refers to the average value of the difference in unevenness at any ten points when the surface is observed using a scanning microscope.
- Methods for forming a dielectric thin film on a metal foil include, for example, a vacuum deposition method and an ion plate. It may be formed by a sputtering method, a CVD (Chemical Vapor Deposition) method, a sputtering method, or a sol-gel method.
- Vacuum deposition method 1. a thin film material is heated evaporation in a high vacuum of 3 X 10- 4 P a, it is a technique for forming a dielectric thin film by adhering the vapor particles onto the substrate.
- the ion plating method is a technique for forming a dielectric thin film by ionizing vaporized particles, accelerating them by an electric field, and then adhering them to the substrate in order to increase the strength of adhesion of the vacuum deposited film to the substrate.
- the CVD method involves the thermal decomposition, oxidation, reduction, polymerization, or gas phase chemical reaction of halides, sulfides, hydrides, organometallic compounds, etc., containing the elements that form the thin film, at high temperatures or in plasma.
- This technology forms a dielectric thin film by depositing a thin film composition on a substrate.
- the sputtering method is a technique of irradiating a target with ions and depositing a sputter-evaporated target material on a substrate to form a dielectric thin film.
- the sol-gel method is a technique in which a sol solution containing an element for forming a thin film is coated on a substrate, gelled by a condensation reaction, and then annealed at a high temperature to form a dielectric thin film.
- the substrate has a via hole for connecting conductive layers inside the substrate, and has a relative dielectric constant of 10 to 2,000 on the surface of the substrate having a smooth metal layer on the surface, and
- the present invention relates to a multilayer wiring board substrate with a built-in capacitor on which a dielectric thin film having a thickness of 0.05 to 2 m is formed.
- this embodiment it is possible to arbitrarily design a wiring pattern connected to a capacitor electrode by using a substrate having a via hole inside the substrate.
- a uniform thin film is formed on the surface of the metal layer with a smooth surface. It is easy to obtain a dielectric thin film with a large thickness, and there is little variation in capacitor capacitance.
- the metal layer is preferably copper, and it is preferable to provide an oxidation protective film and / or a self-oxidizing film on the surface of the copper foil to prevent oxidation of copper.
- the dielectric thin film the same as the dielectric thin film used for the material for the multilayer wiring board with a built-in capacitor can be used, and can be formed in the same manner as described above.
- connection between the conductor layers by via holes can be made by metal plating or conductive paste.
- Metals such as copper, silver, nickel, sub forceps, tin, and alloys thereof can be used as the metal plating.
- the method of connection between layers by metal plating is: 1) Through holes are formed by drilling or laser drilling in metal-clad laminates, 2) Plating catalyst, 3) Thin electroless plating, 4) Thickening Electric plating, 5) Filling the through holes with thermosetting resin, 6) Curing thermosetting resin, 7) Polishing for smoothing of substrate surface, 8) Applying plating catalyst, 9) Thin Electroless plating, 10) Thickening may be performed by a method of electrical plating. The thick electric plating may be replaced with a thick electric plating.
- Examples of the conductive paste include a conductive paste composed of a metal filler and a resin, and a conductive paste that is metallized by a chemical reaction.
- the conductive paste made of the metal filler (metal powder) and the resin is preferably made of a metal filler and a thermosetting resin.
- the metal filler include silver, copper, tin, zinc, and alloys thereof. Its particle size is between 0.5 and 10 m.
- the thermosetting resin include a phenol resin, an epoxy resin, and a sanne resin.
- the content of the metal filler in the conductive paste is preferably 60 to 80% by volume.
- conductive pastes composed of a thermosetting resin and a metal filler include DD paste (trade name, manufactured by Tatta System Electronics Co., Ltd.), Spotifyite (trade name, manufactured by Fujikura Kasei Co., Ltd.), Use a conductive paste such as a conductive paste (trade name, manufactured by Namics Corporation) Can be
- a conductive paste that is metallized by a chemical reaction has a lower volume resistivity than a conductive paste composed of a thermosetting resin and a metal foil, and is advantageous in electrical characteristics.
- a conductive paste include a paste made of fine metal particles, a dispersant, and a solvent.
- the content of the metal particles in the conductive paste is preferably 60 to 80% by weight.
- the metal particles of the conductive paste that are metallized by a chemical reaction include gold, platinum, silver, copper, palladium, ruthenium, and the like.
- the average particle size is 0.1 to 10 nm.
- This conductive paste behaves almost the same as a liquid at room temperature because very fine metal particles formed by gas evaporation method are protected by a dispersant.Printing, coating, impregnation It is possible to form a circuit or the like.
- the supplementary substance When heated to a certain temperature (150 ° C to 200 ° C), the supplementary substance is activated, and the fine metal particles are brought into contact by a chemical reaction such as removal of the dispersant, and fusion and fusion occur.
- a chemical reaction such as removal of the dispersant, and fusion and fusion occur.
- metal particles such as gold, platinum, silver, copper, palladium, and ruthenium, which are hardly oxidized metals.
- nanopaste trade name, manufactured by Harima Chemicals, Inc.
- the conductive paste is not limited to this.
- the method of connecting layers using conductive paste is as follows: 1) a step of forming a through-hole by drilling or laser drilling in the pre-preda to be an insulating layer; 2) a step of filling the through-hole with a conductive paste; )
- the method may include a step of sandwiching between metal foils, heating under pressure, and curing.
- the heating temperature is preferably from 25 ° C. to 350 ° C. If the temperature exceeds 350 ° C, thermal decomposition occurs in general resins.
- 2 For connection between layers by both metal plating and conductive paste, 2
- the present invention is not limited to a layer substrate, and even in a substrate having three or more layers, via holes for connecting conductor layers may be electrically connected to the inside of the substrate by metal.
- the insulating material used for the substrate is preferably made of resin and glass woven fabric or glass nonwoven fabric.
- an insulating material consisting of resin and glass woven fabric or glass nonwoven fabric rather than an insulating material consisting only of resin and inorganic filler or an insulating material consisting of resin and paper such as cellulose or synthetic resin. It is. It is also possible to use a sheet of a thermoplastic resin such as a fluororesin or a polyetheretherketone having a high heat resistance, or a thermosetting resin such as a polyimide-polyamideimide, but it is economically inferior.
- the material of the woven fabric / nonwoven fabric is not limited as long as it has high rigidity at high temperature, that is, a material having a high elastic modulus, and D glass, E glass, S glass and the like can be used.
- the resin used for the insulating material of the substrate is a thermosetting resin, and preferably has a glass transition temperature of 170 ° C or higher. Substrates using an insulating material made of thermosetting resin and glass woven fabric or glass nonwoven fabric are excellent in workability and economy. Further, when the glass transition point temperature is 170 ° C or more, it is possible to suppress deterioration due to heat during the formation of the dielectric thin film.
- the thermosetting resin having a glass transition temperature of 170 ° C. or more include epoxy resin, modified polyimide resin, modified triazine resin, modified polyphenylene oxide resin, modified polyphenylene ether resin, and modified shear resin. Nate ester resins and the like can be used, but are not limited.
- substrate materials using epoxy resin include MCL-E-679, MCL-E-679F (these are Hitachi Chemical Industries, Ltd., trade names), R-1755, R-1515 (Matsushita Electric Works, Ltd., trade name), ELC-4781 (Sumitomo Bakelite Co., Ltd., trade name), CS-3665, CS—3365S, CS-3287 (Rissho Kogyo Co., Ltd.) , Product name) can be used.
- a commercially available copper-clad laminate using a modified polyimide resin is available from MCL-1-671 (Hitachi Chemical Industry Co., Ltd.).
- R-4705 made by Matsushita Electric Works, Ltd.
- the copper-clad laminate using the modified triazine resin commercially available products such as CCL-830, CCL-832, CCL-832HS (the above names, manufactured by Mitsubishi Gas Chemical Company, Ltd.) can be used.
- Examples of copper-clad laminates using a modified polyphenylene ether resin include CS-3376B (trade name, manufactured by Risho Kogyo Co., Ltd.) and TLC-W-596 (trade name, manufactured by Kyocera Chemical Corporation). Can be used.
- Multi-layered insulating materials (pre-leaders) corresponding to each of the above-mentioned copper-clad laminates are also commercially available from each manufacturer and can be used. (Multilayer wiring board with built-in capacitor)
- the multilayer wiring board with a built-in capacitor uses the above-mentioned material for a multilayer wiring board with a built-in capacitor, and laminates a substrate having a conductor circuit on the copper foil surface via an insulating layer to form a capacitor, and form the copper foil and the conductive pattern. It may be manufactured by conducting the above.
- the multilayer wiring board with a built-in capacitor may be manufactured by forming a capacitor using the above-described substrate for a multilayer wiring board with a built-in capacitor.
- metal foil B a metal foil (hereinafter, referred to as metal foil B) is laminated on a metal foil (hereinafter, referred to as metal foil A) of the above-mentioned material for a multilayer wiring board with a built-in capacitor via an insulating layer to form a capacitor. It may be manufactured by conducting the metal foil A and the metal foil B. These are described below.
- a capacitor electrode (hereinafter, referred to as a first capacitor electrode) is formed on a dielectric thin film on a substrate surface.
- the thickness of the first capacitor electrode is preferably from 10 to 50. If the thickness is less than 10, when a non-through hole is provided as a lead-out pattern of the electrode when an insulating layer is further formed on the outer layer of the electrode 1, the metal layer below the dielectric thin film is damaged by laser processing. And the problem of easy damage. On the other hand, if it exceeds 5, processing accuracy when forming an electrode pattern by etching may be poor. You.
- a method of forming the first capacitor electrode at a predetermined position on the dielectric thin film a method in which a metal layer is formed on the entire surface of the dielectric thin film and then formed by etching (
- Method 1 metal plating after plating resist formation (second method), and printing with conductive paste (third method).
- the first method may include a step of forming a metal layer of 10 to 50 m by metal plating or sputtering, and a step of etching and removing an arbitrary portion.
- Various metals can be used as the metal layer to be the first capacitor electrode, but copper is preferable in consideration of electrical characteristics and economy. If copper is used as the metal layer, the metal layer may further include chromium, molybdenum, titanium, nickel, or the like, or the metal layer and the dielectric may be used to prevent oxidation of the copper due to transfer of oxygen from the dielectric thin film. It is preferable to provide a metal layer serving as a self-oxidizing film such as chromium, molybdenum, titanium, or nickel between the thin films.
- the second method includes a step of forming a metal layer of 0.1 to 5 / xm on the surface of the dielectric thin film, and a step of forming a metal-plated resist while leaving an arbitrary portion including the first capacitor electrode.
- Examples of the metal layer of 0.1 to 5 include various metals, and copper is preferable in consideration of electrical characteristics and economy.
- the metal layer forming the self-oxidizing film is preferably a metal layer of chromium, molybdenum, titanium, nickel or the like. It is preferable that the metal layer of 10 to 50 m formed by metal plating contains copper, silver, tin, nickel, or zinc in consideration of electrical characteristics and economy.
- the plating resist for example, Photek H-9330 (trade name, manufactured by Hitachi Chemical Co., Ltd.) can be used.
- As the etching solution for the metal layer of m a known solution can be used.
- the third method may include a step of printing and hardening a conductive paste to be metallized by a chemical reaction at an arbitrary position on the dielectric thin film where the first capacitor electrode is to be formed. Further, a conductive paste may be printed on a portion including a portion to be the first capacitor electrode, and an unnecessary portion may be etched to form the first capacitor electrode.
- the conductive paste which is metallized by a chemical reaction the above-mentioned conductive paste which can be used for a substrate for a multilayer wiring board with a built-in capacitor can be used. Are preferred.
- the first capacitor electrode can be formed without using a plating process with many processing steps, and the number of days for manufacturing a multilayer wiring board with a built-in capacitor is reduced. Can be.
- the material for the multilayer wiring board with a built-in capacitor or the dielectric thin film of the substrate is removed by etching while leaving a portion serving as a capacitor dielectric, thereby forming a capacitor dielectric.
- Examples of the etching removal method include an ion beam etching method, an R I (Reactiv e IonEtching) method, and an etching method.
- the ion beam etching method is a technique in which ions of an inert gas such as argon are accelerated by an electric field and then irradiated on a substrate to remove a dielectric thin film.
- the RIE method is a technique in which a reactive gas plasma such as a fluorocarbon-based gas is generated under a reduced pressure and a strong electric field, thereby removing the dielectric thin film.
- the wet etching method is a technique for removing a dielectric thin film using an etching solution (etchant) such as an etching solution (etchant) capable of dissolving a dielectric.
- etching solution etchant
- etchants can be used, and examples thereof include a solution containing hydrofluoric acid, an aqueous solution containing ammonia and hydrogen peroxide, and an aqueous solution containing EDTA, ammonia and hydrogen peroxide.
- hydrofluoric acid is dangerous because of its high reactivity.
- Aqueous solutions containing ammonia and hydrogen peroxide, and aqueous solutions containing EDTA, ammonia and hydrogen peroxide are alkaline.
- the dielectric thin film may be etched by a method using an etch by the following two methods.
- the two methods include a method using an etchant containing a chelating agent and hydrogen peroxide (first method), and at least one acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid, and acetic acid, and hydrogen peroxide.
- first method a method using an etchant containing a chelating agent and hydrogen peroxide
- second method uses an etchant containing Etching of the dielectric thin film performed in the first and second methods is wet etching, and has higher productivity than etching by a dry process. It is economical because it can handle large substrates.
- the use of an alkali-developed etching resist used in the normal photolithography process eliminates the need for special equipment, and does not use special chemicals, so it is inexpensive and can perform thin film patterning efficiently. It is possible.
- an etchant containing a chelating agent and hydrogen peroxide is used as an etchant for a dielectric thin film.
- the etchant is an aqueous solution. Since the dielectric thin film can be etched with an aqueous solution containing a chelating agent and hydrogen peroxide without using hydrofluoric acid, handling of the chemical solution is easy and danger can be reduced.
- the chelating agent—hydrogen peroxide is used in a normal printed wiring board manufacturing process, and does not require a large new load when used.
- the chelant concentration of the etchant is between 0.001 and 0.5 mol Zl.
- etching of the dielectric thin film at least 0.001mo1 is required : it can be arbitrarily set up to the limit concentration of 0.5mo1. More desirably, the stability is set to 0.1 to 0.3 mo 11. Good etching rate can be obtained. It is desirable that the concentration of hydrogen peroxide be 1 to 5 O wt%. The etching rate can be adjusted by arbitrarily setting the concentration of hydrogen peroxide within this range. At least lwt% of hydrogen peroxide is necessary to obtain the minimum etch rate for use, and it can be set arbitrarily within the range up to 5 O wt% where there is no problem in handling chemicals. I can do it.
- the etchant controlled to the concentration described above is an acidic etchant, and the pH of the etchant is desirably controlled in the range of 2 to 7. It is also possible to adjust the pH to the alkaline side by using a buffer solution.However, in this case, it is necessary to use an alkali-resistant etching resist, and a resist having alkali resistance generally requires special equipment and a chemical solution. It is. Therefore, for the above reason, it is desirable that the pH of the etchant is controlled in the range of 2 to 7.
- the chelating agent used in the present invention is at least one selected from the group consisting of ethylenediaminetetraacetic acid (EDTA), hydroxyethyliminodiacetic acid (HIDA), iminoniacetic acid (IDA), dihydroxyethylglycine (DHEG) and alkali salts thereof. It is preferably a chelating agent. Since the chelating agent is a water soluble, NH 4 0H, the N a 0 H such as Al force Li solution such need used Le ⁇ which is effective for obtaining an acidic Etsuchanto described above, Regis Bok of In addition to being easy to select, it also contributes to reducing chemical solution costs.
- the etchant of the dielectric thin film used in the second method contains an acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid and acetic acid and hydrogen peroxide, and is usually an aqueous solution.
- the above-mentioned acids are also used in the manufacture of ordinary wiring boards, and are easier to handle than hydrofluoric acid.
- the aqueous solution of these acids and hydrogen peroxide makes it possible to easily etch the dielectric thin film.
- the concentration of at least one acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid and acetic acid is 1 to 30 wt%. Higher concentration The higher the etching rate, the higher the etching rate, but the more difficult it is to handle chemicals. Therefore, the concentration is preferably set to 3 O wt% as the upper limit. Further, in order to obtain an etching rate which is at least allowable in use, it is preferable that the content be lwt% or more. More preferably, by setting the content to 5 to 3 wt%, it is possible to obtain excellent etching characteristics and an appropriate etching rate.
- an etching resist is formed on at least a metal layer serving as a capacitor electrode formed at a predetermined position on the substrate surface.
- a commercially available photosensitive dry film or an alkali developing type resist ink can be used, but it is preferable to use a photosensitive dry film.
- Photosensitive dry film is the most versatile resist material in the printed wiring board manufacturing process. Not only is it possible to form low-cost resists, but it also has excellent workability.
- the etching resist to be used is not particularly limited. ), H-940 (manufactured by Hitachi Chemical Co., Ltd., trade name) and the like.
- Examples of commercially available alkaline development type resist inks include PER-20 (trade name, manufactured by Taiyo Ink Mfg. Co., Ltd.).
- An etching resist is formed on the metal layer to be the capacitor electrode on the substrate surface and on the dielectric thin film, and the circuit pattern is baked and developed.
- An aqueous sodium carbonate solution can be used for development, and an aqueous sodium hydroxide solution can be used for stripping the etching resist, which is also characterized by a small environmental load.
- an etching resist may be formed only on the metal layer serving as the capacitor electrode by using an ink-like etching resist by screen printing or the like.
- the thickness of the metal layer to be the capacitor electrode is desirably 1 to 3 times the thickness of the metal layer to be the capacitor electrode. If the thickness of the metal layer to be protected is smaller than the thickness of the metal layer to be etched, the gap between the metal layer and the surface of the layer to be etched is poorly embedded and voids are generated. And cause poor etching. On the other hand, when the ratio is more than three times, the etching property is reduced, so that it is difficult to miniaturize the pattern. More desirably, the thickness is two to three times the metal layer. By setting it to 2 to 3 times, it has good followability to steps and excellent etching properties.
- the method is a method for manufacturing a multilayer wiring board with a built-in capacitor, in which the dielectric thin film is etched at 20 to 45 ° C. If the temperature is lower than 20 ° C, the etching rate is remarkably reduced, so that a large amount of time is required for etching, which is uneconomical. On the other hand, if it exceeds 45 t :, the adhesiveness of the resist is reduced, and etching failure is likely to occur. Therefore, the etching temperature is preferably 20 to 45 ° C. More preferably, by setting the temperature to 20 to 30 ° C., a good etching rate and resist adhesion can be achieved at the same time, and workability and yield can be improved.
- a metal layer between the dielectric thin film and the first capacitor electrode as the above-mentioned oxidation protective film or self-oxidizing film.
- the same material as that used for the material for the multilayer wiring board with a built-in capacitor can be used.
- a capacitor electrode (second capacitor electrode) is obtained by etching a metal foil or a metal layer contained in the above-mentioned material for a multilayer wiring board with a built-in capacitor or a substrate for a multilayer wiring board with a built-in capacitor, leaving an arbitrary portion. be able to. Etching can be performed by a known method.
- the formation of the second capacitor electrode may be performed simultaneously with the formation of the first capacitor electrode or after the formation of the first capacitor electrode.
- the manufacturing process is simplified, the number of manufacturing days is reduced, and the economy is excellent.
- a capacitor dielectric is formed, a metal layer to be a first capacitor electrode is formed thereon, and then the first and second capacitor electrodes are simultaneously etched.
- the second capacitor electrode is common to the ground layer or power layer of the multilayer wiring board, use the second capacitor electrode as the ground layer or power layer.
- the pattern of the ground layer or the power supply layer has a larger area than the wiring pattern.
- the area of the capacitor electrode manufactured in the present invention is formed by patterning the metal layer covering the substrate surface when forming the dielectric thin film more than the first capacitor electrode formed on the dielectric thin film. Since the second capacitor electrode becomes larger, it is preferable to use the second capacitor electrode in a ground layer or a power supply layer.
- the capacitor A substrate having a conductive circuit may be laminated on the copper foil surface of the built-in multilayer wiring board material via an insulating layer.
- the connection between the second capacitor electrode and the conductor circuit may be performed by removing the insulating layer and connecting by electrolytic plating (first method); The connection may be made by using an insulating layer in which the paste is filled in the through holes (second method).
- the first method is a step of forming a hole by removing the insulating layer exposed by laser irradiation after forming the first and second capacitor electrodes and the capacitor dielectric, and exposing a conductor circuit serving as an inner layer.
- the method may include a step of etching and removing an arbitrary portion including a denser dielectric and a hole converted into a conductor.
- the metal layer the plating resist, and the like, those similar to those used for the first capacitor electrode can be used.
- the second method involves forming a through-hole with a drill laser in an insulating material, such as a pre-preda, which is to be an insulating layer, and printing a conductive paste that is metallized by a chemical reaction on a screen. And filling the through-holes using the holes.
- an insulating material such as a pre-preda, which is to be an insulating layer
- a conductive paste that is metallized by a chemical reaction on a screen.
- the conductive paste the same conductive paste as that used for the above-described multilayer array substrate with a built-in capacitor can be used.
- an insulating layer is interposed on the copper foil surface of the capacitor internal multilayer wiring board material.
- Metal foil B can be laminated.
- a connection may be made by forming a metal layer in the hole (first method); May be connected by using an insulating layer filled in a through hole.
- the insulating layer can be removed by a laser, and the metal foil B can be removed by a laser or etching. If holes are formed by removing the metal foil B and the insulating layer at the same time using a laser, the manufacturing process is simplified, the number of manufacturing days is reduced, and the economy is excellent.
- the metal foil B that enables such a manufacturing method is preferably subjected to a process that easily absorbs the energy of laser light.
- such a treatment is effective for surface roughening treatment such as copper oxide treatment, microetching treatment, roughening plating treatment, and the surface roughness is 0.1 to 3 xm. preferable.
- the thickness of the copper foil is preferably from 1 to 18 ⁇ m. Copper foil less than l ⁇ m is inferior in handleability, and copper foil exceeding 18 / im is inferior in workability.
- a metal layer such as nickel which easily absorbs laser light may be provided on the surface. Examples of a method for forming such a metal layer or a metal layer on the surface of a substrate include a sputter ring method, an electroless plating method, an electrolytic plating method, and a combination thereof.
- the metal foil B and the metal foil A can be electrically connected.
- This electrical connection can be made, for example, by electroplating or by forming a conductive paste.
- the first method is to form a metal layer of 0.1 to 5 m on both sides of the substrate including the inside of the hole, and to form a metal-plated resist on the surface of the substrate except for an arbitrary portion including the hole.
- Process forming a conductive pattern in a portion including a hole by metal plating, removing unnecessary metal-coated resist, and forming a 0.1 to 5 m metal layer in an unnecessary portion. Removing step.
- the metal layer, the plating resist, and the like the same ones as those used for the first capacitor electrode can be used.
- the formation of the metal layer in the hole and the first capacitor is preferable because the formation of the metal layer serving as the electrode is performed simultaneously.
- the metal layer is formed by forming a metal layer of 0.1 to 5 im on both sides of the substrate including the inside of the hole, and forming a metal plating resist on the surface of the substrate except for an arbitrary portion including the hole. Forming a conductive pattern in a portion including a hole by metal plating, removing a metal-plated resist, and etching the metal layer of 0.1 to 5 im exposed on the substrate surface. Removing step. Further, the electrical connection between the metal foil B and the metal foil A (capacitor electrode) may be performed by the conductive base described above.
- the conductive paste is the same as the conductive paste used for the above-mentioned substrate for a multilayer array with a built-in capacitor.
- one or more circuit layers are formed on both sides or one side of the substrate with an insulating layer interposed therebetween, so that three or more layers with built-in capacitors can be obtained.
- a layer wiring board can be obtained.
- the pattern of the conductor layer forming the first capacitor electrode forms all the electrodes of the capacitor, and the projection surface of the dielectric thin film is formed of the first capacitor electrode.
- the conductor layer including the projection surface and forming the second capacitor electrode may include a second capacitor electrode and at least one pattern electrically insulated from the second capacitor electrode.
- the metal layer forming the second capacitor electrode is formed below the metal layer pattern forming the first capacitor electrode. There is a pattern. Therefore, if a wiring pattern is formed on the metal layer that forms the first capacitor electrode, a parasitic capacitance is generated between the metal layer and the metal layer that forms the second capacitor electrode, and the electrical signal transmission characteristics deteriorate. This is not preferable. Therefore, it is preferable that the wiring pattern is provided on the metal layer of the second capacitor electrode.
- the first capacitor electrode included in the projection surface of the dielectric thin film forming the dielectric of the capacitor is provided.
- the conductor layer forming the first capacitor electrode may be electrically connected to the second capacitor electrode at all ends of the dielectric thin film. According to this, it is a multilayer wiring board with a built-in capacitor that simplifies the manufacturing process steps, reduces manufacturing days, and is economical.
- a semiconductor chip may be mounted on a multilayer wiring board with a built-in capacitor manufactured by these manufacturing methods. Since the capacitor is built into the board, the number of components to be mounted can be reduced, and a small semiconductor device can be provided.
- a method for manufacturing a multilayer wiring board with a built-in capacitor will be specifically described.
- the following manufacturing method uses a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.5 to 2 is provided on the surface of a metal foil. This is a specific example of a method for manufacturing a multilayer wiring board with a built-in capacitor.
- (a-2) 1) a step of laminating on a substrate having a conductor circuit via a pre-preder on a metal foil surface of a material for a multilayer wiring board with a built-in capacitor; and Forming a metal layer; 3) forming a metal-plated resist while leaving any portion including the first capacitor electrode; and 4) forming a first capacitor of 10 to 50 z ⁇ m by metal-plated. Forming an electrode; 5) removing a metal-plated resist; 6) etching away a 0.1 to 5 / m metal layer formed on the surface of the dielectric thin film; and 7) dielectric.
- (a-3)) 1) a step of laminating a metal foil surface of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; Forming a desired first capacitor electrode by forming a metal layer of 10 to 50 m using a conductive paste which is metallized by a reaction; and3) at least a first capacitor electrode of a dielectric thin film. Removing the etching to form a desired capacitor dielectric while leaving any part including the following; and 4) removing the dielectric thin film and leaving at least any part of the metal foil that has appeared containing the capacitor dielectric. Forming a conductor pattern including a desired second capacitor electrode by etching.
- (a-4) 1) laminating on a substrate having a conductive circuit via a pre-preder on a metal foil surface of a material for a multilayer wiring board with a built-in capacitor; and 2) etching and removing any part of the dielectric thin film while leaving it 3) forming a metal layer of 10 to 50 xm on the surface of the substrate on which the capacitor dielectric has been formed, and 4) etching leaving any part of the metal layer. Removing to form a desired first capacitor electrode, second capacitor electrode, and any conductive pattern electrically insulated from the capacitor electrode.
- (a-7) 1) a step of laminating a metal foil surface of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; A step of forming a desired first capacitor electrode by forming a metal layer of 10 to 50 m using a conductive paste which is metallized by the reaction, and 3) including at least a first capacitor electrode of a dielectric thin film A step of forming a desired capacitor dielectric by etching while leaving an arbitrary portion; and 4) an insulating layer of a pre-preda cured by etching and removing an arbitrary portion of a metal foil that appears by removing a dielectric thin film.
- the substrate has a via hole for connecting the conductor layers inside the substrate, has a smooth metal layer on the surface, has a relative dielectric constant of 10 to 2,000, and has a film thickness of 0.
- This is a specific example of a method for manufacturing a multilayer wiring board with a built-in capacitor, which uses a substrate for a multilayer wiring board with a built-in capacitor characterized by forming a dielectric thin film of 05 to 2 m as an inner layer board.
- the metal layer that has appeared is etched away leaving at least an arbitrary portion including the capacitor dielectric to obtain a desired second capacitor.
- (b-2) 1) a step of forming a metal layer of 0.1 to 5 on the surface of the dielectric thin film; and 2) a step of forming a metal plating resist while leaving any part including the first capacitor electrode. 3) a step of forming a 10 to 50 m first capacitor electrode by metal plating; 4) a step of removing the metal plating resist; and 5) a 0.1 to 5 m formed on the surface of the dielectric thin film. 6) etching away the metal layer of 6), forming a desired capacitor dielectric by etching away the dielectric thin film leaving at least an arbitrary portion including at least the first capacitor electrode, and 7) forming the dielectric thin film. Forming a conductive pattern including a desired second capacitor electrode by removing the film by etching away leaving at least an arbitrary portion of the exposed metal layer including the capacitor dielectric.
- (b-4) 1) a step of forming a desired capacitor dielectric by etching and removing any part of the dielectric thin film; and 2) a 10-50 metal layer on the surface of the substrate on which the capacitor dielectric is formed. And 3) a desired first capacitor electrode, a second capacitor electrode, and any conductor pattern electrically insulated from the capacitor electrode by etching away leaving any portion of the metal layer. Forming a step.
- the method for manufacturing a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 / m is provided on one side of a metal foil The present invention relates to a specific example of a method for manufacturing a multilayer wiring board with a built-in capacitor using a substrate provided on at least one surface of an insulating material such that a metal foil is in contact with the insulating material.
- (c-1) 1) a step of forming a metal layer to be a capacitor electrode at a predetermined position on the dielectric thin film on the substrate surface; and 2) a step of forming an etching resist on at least the metal layer on the substrate surface. And 3) a step of wet-etching the dielectric thin film with an etchant containing a chelating agent and hydrogen peroxide; and 4) a step of removing the etching resist after wet-etching.
- (c-1) 1) a step of forming a metal layer serving as a capacitor electrode at a predetermined position on the dielectric thin film on the substrate surface; and 2) a step of forming an etching resist on at least the metal layer on the substrate surface.
- the following manufacturing method uses a multilayer wiring board with a built-in capacitor that uses a dielectric multilayer board with a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m on one side of metal foil A. It is a specific example of a method for manufacturing a wiring board.
- (d-2) 1) a process of laminating a metal foil B on the surface of the metal foil A of the material for the multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; Irradiating the metal foil B and the insulating layer formed from the insulating material at the same time to form a hole, thereby exposing the metal foil A; and 3) forming a hole on both sides of the substrate surface including the inside of the hole.
- a through-hole is provided at an arbitrary location on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor, and the through-hole is filled with a conductive paste containing a thermosetting resin and a metal filler.
- (d-4) 1) A conductive paste in which a through-hole is provided at an arbitrary point on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through-hole is metallized by a chemical reaction.
- (d-5)) A process of laminating a metal foil B on the surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate, and 2) Etching an arbitrary portion of the metal foil B. Removing to expose the insulating layer formed from the insulating material; 3) removing the insulating layer exposed by laser irradiation to form a hole, thereby exposing the metal foil A; 4). A step of forming a 0.1 to 5 m metal layer on both sides of the substrate including the inside of the hole, and 5) a metal-plated resist on the surface of the substrate except for a portion serving as the first capacitor electrode and an arbitrary portion including the hole.
- (d-6) 1) a process of laminating a metal foil B on the surface of the metal foil A of the material for the multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; By irradiating, the metal foil B and the insulating layer formed from the insulating material are simultaneously removed to form a hole, thereby exposing the metal foil A. 4) a step of forming a metal layer of 1 to 5; 4) a step of forming a metal plating resist on the surface of the substrate except for a portion to be a first capacitor electrode and any portion including a hole. ) A step of forming a conductive pattern on the portion including the first capacitor electrode and the portion including the hole by metal plating; and 6) metal plating.
- a through hole is provided at an arbitrary position, and the through hole is filled with a conductive paste containing a thermosetting resin and a metal filler.
- a capacitor of any shape including the first capacitor electrode pattern From the thin film, a capacitor of any shape including the first capacitor electrode pattern 8) A step of forming a dielectric by etching, and 8) A second capacitor electrode having an arbitrary shape including a capacitor dielectric pattern is formed by etching from the metal foil A that has appeared after removing the dielectric thin film, and is exposed. Forming a circuit by etching the metal foil B thus etched.
- the second capacitor electrode is formed, and the exposed metal foil B is formed by etching.
- a through hole is provided at an arbitrary position on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor, and the through hole is made of a conductive paste containing a thermosetting resin and a metal filler.
- Circuit formation by etching B The step of performing (d—1 1) ⁇ ) A process of laminating a metal foil B on the surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate, and 2) an arbitrary portion of a dielectric thin film.
- (d-12) 1) A step of laminating a metal foil B on the surface of the metal foil A, which is a material for a multilayer wiring board with a built-in capacitor, via an insulating material to form a substrate, and 2) leaving any part of the dielectric thin film 3) irradiating a laser on an arbitrary portion of the metal foil B, thereby simultaneously removing the metal foil B and the insulating layer formed from the insulating material.
- Forming a hole to expose the metal foil A 4) forming a metal layer on both sides of the substrate surface including the inside of the hole, and 5) etching leaving an arbitrary portion of the metal layer and the metal foil A. Removing to form desired first and second capacitor electrodes.
- a through hole is provided at an arbitrary position on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor, and the through hole is metallized by a chemical reaction.
- a 0.2-meter ruthenium thin film 103 was formed on the surface of rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) having a thickness of 35 xm, which is a copper foil 102, by DC sputtering.
- the substrate surface was subjected to microwave plasma CVD using titanium tetraisopropoxide, zircon tetrabutyrate butoxide, dipivaloyl methane lead complex, and nitrogen dioxide at a substrate temperature of 350 ° C. 0.5? 11? Two (lead zirconate titanate) thin films 101 were formed (Fig. 1 (b)).
- the surface of copper foil 102 of multilayer wiring board material with built-in capacitor A-2 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding.
- Figure 2 (a) 0.2mm thick double-sided copper foil-clad glass epoxy laminated board MCL—E—679F (trade name, manufactured by Hitachi Chemical Co., Ltd.)
- the surface of the double-sided substrate 104 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer adhesion.
- a 0.05 m chromium thin film 1.08 was formed on the surface of the PZT thin film by DC sputtering. Furthermore, a 20-meter metal layer 109 was formed on the surface by electrolytic copper plating (Fig. 2 (c)). A desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is removed by etching using an aqueous ferric chloride solution, and a chromium metal layer is removed by etching using an aqueous ferricyanide force solution. And the first capacitor A pole pattern was formed (Fig. 2 (d)). Next, a resist with the desired pattern was formed, and the PZT thin film and the ruthenium thin film were etched away by RIE using CF 4 gas (Fig.
- a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is removed by etching using an aqueous solution of ferric chloride to form a window hole having a diameter of 0.1 mm at a desired position.
- laser drilling 1-10 was performed under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots (Fig. 2 (f )).
- a catalyst was applied, adhesion was promoted, and then electroless copper plating was performed to form a 0.5 im copper thin film.
- a desired plating resist 111 was formed on the surface of the substrate, copper electroplating was performed, and a metal layer for electrically connecting the inner circuit conductor and the conductor layer on the substrate surface was formed.
- the circuit surface of this circuit board was subjected to a roughening treatment with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion.
- an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion.
- a desired etching resist is formed on the surface of this substrate, and the unnecessary copper foil is removed by etching using a ferric chloride aqueous solution to obtain a desired portion.
- a cleaning catalyst is applied, adhesion is promoted, and then electroless copper plating is performed.Approximately 20 electroless copper plating is applied to the inner wall of the laser hole and the copper foil surface. A layer was formed. An etching resist was formed on necessary parts such as pads and circuit patterns on the surface of this substrate, and unnecessary copper was removed by etching to form an outer layer circuit.
- a solder resist PSR-4000 AUS5 (Taiyo Ink Manufacturing Co., Ltd., trade name) was applied to the surface of the substrate 30 by a roll coater, dried, exposed and developed to form a solder resist 113 at a desired position. After that, 3 m of electroless nickel plating and 0.1 m of electroless gold plating were formed on the exposed surface of the outer circuit pattern to obtain a multilayer wiring board with built-in capacitors (Fig. 2 (i)).
- a multilayer wiring board with a built-in capacitor was obtained by the same process as in Example A_1 except that the material A-2 for a multilayer wiring board with a built-in capacitor was changed to the material A-3 for a multilayer wiring board with a built-in capacitor.
- Example A-3
- the surface of copper foil 102 of multilayer wiring board material with built-in capacitor A-3 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding.
- an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding.
- Figure 3 (a) Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding, and then one surface was insulated.
- CZ-8100B trade name, manufactured by MEC Corporation
- 100-meter-thick glass substrate 107 Insulates 18m thick copper foil GTS-18 (Furukawa Circuit Oil Co., Ltd.) through POXY Prepreda GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) and the other side
- the above-mentioned material for a multilayer wiring board with a built-in capacitor is distributed via a resin epoxy material GEA-679F (trade name) manufactured by Hitachi Chemical Co., Ltd.
- the layers were integrated under a press condition of 1.5 MPa in pressure and 60 minutes in heating and pressing time (Fig. 3 (b)).
- 105 is plated copper and 106 is filling resin.
- a 0.05 m chromium thin film 108 was formed on the surface of the PZT thin film 101 by a DC sputtering method. After applying a catalyst to the surface and promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5. A desired plating resist was formed on the surface of the substrate, and copper electroplating was performed to form a metal layer 109 serving as a first capacitor electrode having a thickness of 20 m (FIG. 3 (c)). After removing the plating resist, the copper thin film of 0.5111 and the chromium thin film of 0.05 m on the substrate surface were removed by etching to form the first capacitor electrode pattern (Fig. 3 (d)).
- a resist of a desired pattern was formed, and the PZT thin film and the ruthenium thin film were removed by etching by RIE using CF 4 gas (FIG. 3 (e)).
- a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to form a window hole having a diameter of 0.1 mm at a desired position.
- laser drilling was performed on the condition of output power 26mJ, pulse width 100s, and 4 shots (Fig. 3 ( ⁇ )). .
- a catalyst was applied, adhesion was promoted, and electroless copper plating was performed to form a copper thin film of 0.
- a desired plating resist 111 was formed on the surface of the substrate, and electroplating was performed, thereby forming a metal layer for electrically connecting the inner circuit conductor and the conductor layer on the substrate surface (FIG. 3 (g). )).
- the copper thin film of 0.5 on the substrate surface is etched away, and then a desired etching resist is formed, and an unnecessary copper metal layer is etched away with a ferric chloride solution.
- a circuit board including the second capacitor electrode was formed to produce a circuit board (Fig.
- Example A-4 Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor through the same steps as in Example A-1 (FIG. 3 (i)).
- 112 is an insulating resin base material
- 113 is a solder resist.
- Example A-4
- the copper foil surface 102 of the multilayer wiring board material A-3 with a built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding.
- an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding.
- Figure 4 (a) Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was subjected to a roughening treatment using an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding, and then one surface was insulated.
- CZ-8100B trade name, manufactured by Mec Co., Ltd.
- a resin base material 107 18 m thick copper foil GTS—18 (Furukawa Saichi Kit Oil Co., Ltd.) via 100 / m thick glass epoxy prepredder GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) On the other side, and a 100 m-thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd., trade name) as an insulating resin substrate 107 on the other side.
- Arrange materials for board temperature 170 ° C, pressure 1. Lamination and integration were performed under press conditions of 5 MPa and a heating and pressing time of 60 minutes (Fig. 4 (b)).
- 105 is plated copper
- 106 is a filling resin.
- nano paste (Rima Chemical Co., Ltd.), a conductive paste that is metallized by a chemical reaction, is screen-printed at a desired location on the surface of the PZT thin film with a thickness of 40 m. Then, the substrate was baked at a temperature of 200 ° C for a heating time of 1 hour, and the conductive paste was metallized to form a first capacitor electrode pattern (Fig. 4 (c)). Subsequently, a resist having a desired pattern was formed, and the PZT thin film and the ruthenium thin film were removed by etching by RIE using CF 4 gas. (Fig. 4 (d)).
- a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is etched and removed using an aqueous ferric chloride solution to form a ⁇ 0.1 mm window hole at a desired position.
- laser drilling 110 was performed under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots (Fig. 4 ( e)).
- a catalyst was applied, and after promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5 / zm.
- the desired plating resist 111 was formed on the surface of the substrate, and copper electroplating was performed to form a metal layer for electrically connecting the inner layer circuit conductor and the conductor layer on the substrate surface (FIG. 4 (f) )).
- the copper thin film of 0.5 / zm on the substrate surface is removed by etching, and then a desired etching resist is formed, and the unnecessary copper metal layer is etched with a ferric chloride solution.
- a circuit pattern including a second capacitor electrode was formed to produce a circuit board (Fig. 4 (g)).
- Subsequent processing of the multilayer wiring board was performed in the same process as in Example A-1, and a multilayer wiring board with a built-in capacitor was obtained (FIG. 4 (h)).
- 1 12 is an insulating resin base material
- 1 13 is a solder resist.
- the method of removing the PZT thin film and the ruthenium thin film using the material A-3 for the multilayer wiring board with a built-in capacitor is not the RIE method. Instead, the PZT thin film is 20% aluminum bifluoride (NH 4 F-HF) )
- a multilayer wiring board with a built-in capacitor was obtained by the same process as in Example A-1 except that the aqueous solution and ruthenium thin film were etched using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name). (Fig. 2 (i)).
- a resin substrate 107 As a resin substrate 107, a copper foil GTS—18 (Furukawa Saichi Kit Oil Co., Ltd., product) with a thickness of 18 via glass epoxy prepreg GEA-679F (product name, manufactured by Hitachi Chemical Co., Ltd.)
- glass epoxy prepreg GEA-679F product name, manufactured by Hitachi Chemical Co., Ltd.
- GEA-679F product name, manufactured by Hitachi Chemical Co., Ltd.
- 105 is plated copper, and 106 is a filling resin.
- a resist having a desired pattern is formed, and the PZT thin film is removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F ⁇ HF).
- a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd. The PZT thin film was patterned by removing the ruthenium thin film by etching (Fig. 5 (c)).
- a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is removed by etching using an aqueous solution of ferric chloride to form a window hole having a diameter of 0.1 mm at a desired position.
- laser drilling 110 was performed under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots (Fig. 5 (d) )).
- a 0.05 m chromium thin film 108 was formed by DC sputtering.
- 20 metal layers 109 were formed on the surface by copper electroplating (Fig. 5 (e)). At this time, a copper metal layer was formed on the surface of the thin-film dielectric layer and inside the laser hole.
- a desired etching register is provided on the surface of the substrate.
- a first capacitor electrode and a second capacitor are formed by etching an unnecessary copper metal layer using an aqueous ferric chloride solution and etching away a chromium metal layer using a potassium ferricyanide aqueous solution.
- Circuit boards were fabricated by forming electrodes and other wiring patterns (Fig. 5 (f)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example A-1, and a multilayer wiring board with a built-in capacitor was obtained (FIG. 5 (g)).
- 112 is an insulating resin base material
- 113 is a solder resist.
- the copper foil surface 102 of the multilayer wiring board material A-3 with a built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding.
- an organic acid-based micro-etching agent CZ-8100B trade name, manufactured by Mec Co., Ltd.
- a pretreatment for multi-layer bonding Fig. 6 (a)
- Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are
- the prepared double-sided substrate 104 was subjected to a roughening treatment using an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding, and then one surface was insulated.
- a resin base material 107 As a resin base material 107, a 18 m thick copper foil GTS-18 (Furukawa Circuit Oil Co., Ltd., trade name) via a 100 m thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) ) And on the other side as insulating resin substrate 107, through a 100-mm-thick glass epoxy pre-preda GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) and the above-mentioned multilayer wiring board with a built-in capacitor. For materials, temperature 170, pressure 1.5 The laminate was integrated under the press conditions of MPa and heating and pressing time of 60 minutes (Fig. 6 (b)).
- 105 is plated copper
- 106 is a filling resin.
- This prepreg is prepared by applying a 25 m thick polyethylene terephthalate (PET) film on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. After drilling the desired location, screen printing In this method, copper paste NF 2000 (Tatsuyu System Electronics Co., Ltd., trade name) 116 was used, and the PET film on the surface was peeled off. A 0.05-m thick chromium thin film 108 was formed on the PZT thin film surface of this substrate by DC sputtering. Furthermore, a 20-meter metal layer 109 was formed on the surface by electrolytic copper plating (Fig.
- a desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is removed using an aqueous ferric chloride solution, and a chromium metal layer is removed using an aqueous potassium ferricyanide solution.
- a first capacitor electrode pattern was formed (FIG. 6 (d)).
- a resist with a desired pattern was formed, and the PZT thin film and the ruthenium thin film were etched away by RIE using CF 4 gas (Fig. 6 (e)).
- a desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including a second capacitor electrode is formed.
- Example A-8 A circuit board was fabricated (Fig. 6 ( ⁇ )). Subsequent application of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor in the same process as in Example II-1 (FIG. 6 (g)).
- 1 12 is an insulating resin base material
- 1 13 is a solder resist.
- Example A-8
- the copper foil surface 102 of the multilayer wiring board material A-3 with a built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding.
- Figure 7 (a) Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding.
- 105 is copper plating and 106 is filling resin.
- This prepreder is a 25 m thick polyethylene terephthalate (PET) film attached on both sides by a hot press with a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. Is filled with a conductive paste that is metallized by a chemical reaction, 117, a nanopaste (VJ Ma Kasei Co., Ltd., trade name), and then PET on the surface. The one from which the film was peeled was used. The subsequent processing of the capacitor and the processing of the multilayer wiring board were performed in the same steps as in Example A-1, and a multilayer wiring board with a built-in capacitor was obtained (Fig. 7 (c)).
- Reference numeral 112 denotes an insulating resin substrate
- reference numeral 113 denotes a solder resist. Comparative Example A-1
- a 100 m thick glass epoxy prepreg GE A—679 F (Hitachi Chemical Co., Ltd.) based on a 0.2 mm thick double-sided copper foil clad glass epoxy laminate MCL—E—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.)
- a trade name (manufactured by Kogyo Co., Ltd.)
- a 0.2 m ruthenium thin film was formed by DC sputtering on the surface of a four-layer substrate in which conductive holes and circuit patterns were formed at desired locations. 8 (a)).
- 102 is a copper foil
- 105 is a plated copper
- 106 is a filling resin
- 107 is a non-greasy base material.
- a resist having a desired pattern is formed, the ruthenium thin film 103 is removed by etching by RIE, and then the copper metal layer on the inner substrate surface is removed by etching using an aqueous ferric chloride solution, and the second capacitor electrode is removed.
- a circuit pattern was formed (Fig. 8 (b)).
- a ferroelectric substance The thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied and pre-baked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times. Thereafter, a heat treatment was performed at a temperature of 250 ° C for 1 hour to form a PZT thin film 101 having a thickness of 5 m (Fig.
- a 0.05 m chromium thin film was formed on the surface of the PZT thin film by DC sputtering. Furthermore, a metal layer 109 of 20 m was formed on the surface by electroplating copper (Fig. 8 (d)).
- a desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is etched and removed using a ferric chloride aqueous solution, and a chromium metal layer is etched and removed using a potassium ferricyanide aqueous solution.
- a circuit board was fabricated by forming the pattern of the capacitor electrode in Fig. 1 (Fig. 8 (e)).
- Example A_1 Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor through the same steps as in Example A_1 (FIG. 8 (f)).
- 112 is an insulating resin base material
- 113 is a solder resist.
- the test method is as follows.
- the dielectric film thickness was measured by cutting the capacitor with the electrodes formed using a Focused Ion Bearn system (FIB: FB-2000A, manufactured by Hitachi, Ltd., trade name). The measurement was performed using a microscope, and the five-point average of the distance between the electrodes sandwiching the membrane was taken.
- FIB Focused Ion Bearn system
- the relative permittivity was obtained by measuring at a frequency of 1 MHz according to IPC-650 2.5.5.2 in a temperature controlled environment of 25 ° C.
- the capacitance of the capacitor is measured by the impedance analyzer 4291 B (Agilent Noology Co., Ltd., trade name) connected to a high frequency signal measurement probe MI CROPROBE ACP 50 (GSG250, Cascade, trade name) via a 50 ⁇ coaxial cable SUCOFLEX104 / 100 (SUHNER, trade name).
- a measurement system was used.
- the electrode size of the capacitor was 1 mm and the capacity of 1 GHz was measured.
- the number of measurement samples was 5. table 1
- Examples A_1 to A-8 are all characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 ⁇ m is provided on the surface of the metal foil.
- This is a substrate with built-in capacitors manufactured using the material for multilayer wiring boards with built-in capacitors. Variations in the capacitance of the manufactured capacitors were all less than ⁇ 10%, and uniform and good capacitors could be manufactured.
- Comparative Example A-1 is a capacitor built-in substrate in which a dielectric thin film is formed on the surface of a substrate on which a metal layer is patterned, so that the film thickness varies greatly. As a result, the variation of the capacitor capacitance was as large as 54% at the maximum.
- a multilayer wiring having a capacitor having a dielectric constant of 20 to 2000, a film thickness of 0.1 to lm, and a small capacitance variation is provided.
- Board can be provided.
- Drill a desired hole (diameter 200 xm) in a double-sided copper foil-clad glass epoxy laminate MCL—E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) with a copper foil thickness of 3 zm and a thickness of 0.2 mm. went. After removing the carbonized resin residue from the substrate using ultrasonic cleaning and alkali permanganate solution, applying a catalyst and promoting adhesion, electroless copper plating was performed, and the inner wall of the drill hole and the copper foil surface were removed. Then, an electroless copper plating layer 204 of about 15 / m was formed.
- the surface of the obtained substrate was subjected to a roughening treatment by a blackening treatment containing sodium hypochlorite as a main component and a reduction treatment containing dimethylaminoporan as a main component. Then, paste-type thermosetting insulating material HRP-700 BA (manufactured by Taiyo Ink Mfg. Co., Ltd., trade name) is filled into the drilled holes of this board by screen printing as filling resin 203, and heat treatment is performed at 170 ° C for 60 minutes. And cured. This substrate was polished with a puff brush to remove excess insulating material.
- HRP-700 BA manufactured by Taiyo Ink Mfg. Co., Ltd., trade name
- FIG. 9 shows a cross-sectional view of the manufactured inner layer substrate.
- 202 indicates an insulating resin base material
- 201 indicates a copper foil.
- FIG. 10 shows a cross-sectional view of the manufactured inner layer substrate.
- Inner layer substrate B-3 Inner layer substrate B-3
- a 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 12 (a)).
- Two (lead zirconate titanate) thin films 208 were formed (Fig. 12 (b)).
- a 0.05 m chromium thin film 209 was formed on the PZT thin film surface by a DC sputtering method.
- a two-layered metal layer 210 was formed on the surface by copper electroplating (Fig. 12 (c)).
- a desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer 210 is removed by etching using an aqueous ferric chloride solution, and a chromium metal layer 209 is removed by etching using a potassium ferricyanide aqueous solution.
- a pattern of the first capacitor electrode 217 was formed (FIG. 12D).
- a resist having a desired pattern was formed, and the PZT thin film 208 and the ruthenium thin film 207 were etched away by RIE using CF 4 gas (FIG. 12 (e)).
- a desired etching resist is further formed, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including the second capacitor electrode 218 is formed to form a multilayer wiring with a built-in capacitor.
- An inner layer plate 219 used for the plate was produced (FIG. 12 (f)).
- the circuit surface of the inner layer plate was subjected to a roughening treatment by a blackening treatment mainly containing sodium hypochlorite and a reduction treatment mainly containing dimethylaminoporan.
- a blackening treatment mainly containing sodium hypochlorite and a reduction treatment mainly containing dimethylaminoporan were subjected to a roughening treatment by a blackening treatment mainly containing sodium hypochlorite and a reduction treatment mainly containing dimethylaminoporan.
- 35-thick copper foil with 35 carrier copper foil MT35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.)
- Insulating resin base material 2 1 1 100 m thick glass-filled glass epoxy Pre-Preda GE A—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.)
- Inner plate 219 (4) Insulating resin substrate 2 1 1 100 m thick glass epoxy containing filler Pre-Preda GEA—6
- a desired etching resist is formed on the surface of this substrate, the unnecessary copper foil is removed by etching, and a window hole having a diameter of 0.15 mm is formed at a desired position. Formed. Laser holes were drilled in the window holes provided on the substrate surface using a ML 505 GT type carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 Ms, and four shots. .
- An outer layer circuit 213 was formed by forming an etching resist on a required portion such as a pad and a circuit pattern on the surface of the substrate, and removing unnecessary copper by etching.
- solder resist PSR-4000 AUS 5 (trade name, manufactured by Taiyo Ink Mfg. Co., Ltd.) on the surface of the substrate for 30 m by mouth and mouth, and then dry and expose. * Image and solder resist at desired locations 212 was formed. After that, electroless nickel plating 3 and electroless gold plating of 0.1 m were formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 4 (g)).
- PSR-4000 AUS 5 trade name, manufactured by Taiyo Ink Mfg. Co., Ltd.
- Example B-3 A multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example B-1, except that the inner substrate B-1 was changed to the inner substrate B-2.
- Example B-3 A multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example B-1, except that the inner substrate B-1 was changed to the inner substrate B-2.
- Example B-4 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 12 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the surface of the substrate, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes.
- PZT ferroelectric thin film forming material
- Example B-5 The application and pre-bake were repeated five more times, followed by heat treatment at a temperature of 250 ° C for a heating time of 1 hour to form a 0.5 m thick PZT thin film 208 (Fig. 12 (b) ). Subsequent processing of the capacitor and processing of the multilayer wiring board were performed in the same steps as in Example B-1, and a multilayer wiring board with a built-in capacitor was obtained (FIG. 12 (g)).
- Example B-5 Example B-5
- the method of removing the PZT thin film 208 and the ruthenium thin film 207 by etching is not the RIE method, but a 20% by weight aqueous solution of ammonium bifluoride (NH 4 F-HF) for the PZT thin film and the ruthenium etching solution REC—for the ruthenium thin film.
- a multilayer wiring board with a built-in capacitor was obtained by the same process as in Example B-4 except that etching was performed using 01 (manufactured by Kanto Chemical Co., Ltd., trade name) (Fig. 12 (g)).
- a 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 13 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the surface of the substrate, and prebaked at a temperature of 150 ° C. for a heating time of 30 minutes. The application and pre-bake were repeated five more times, and then heat treatment was performed at a temperature of 250 ° C for 1 hour to form a 0.5-m thick PZT thin film 208 (Fig. 13 (b) ).
- PZT trade name, manufactured by Kanto Chemical Co., Ltd.
- a 0.05 / m chromium thin film 209 was formed on the surface of the PZT thin film by DC sputtering. After cleaning the surface, applying a catalyst and promoting adhesion, electroless copper plating was performed to form a 0.5 m copper thin film.
- a desired plating resist 215 is formed on the surface of this substrate, and electroplating is performed. Then, a metal layer 214 serving as a first capacitor electrode having a thickness of 20 / m was formed (FIG. 13 (c)). After removing the plating resist 215, the 0.5 m copper thin film and the 0.05 m chromium thin film on the substrate surface were removed by etching to form the pattern of the first capacitor electrode 217 (Fig. 13 (d)). .
- a resist having a desired pattern is formed, and the PZT thin film 208 is removed by etching using a 20% by weight aqueous solution of ammonium bifluoride (NF'HF), and a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd.) Ruthenium thin film 207 was removed by etching (Fig. 13 (e)).
- NF'HF ammonium bifluoride
- REC-01 ruthenium etching solution
- Ruthenium thin film 207 was removed by etching (Fig. 13 (e)).
- a desired etching resist is further formed, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including the second capacitor electrode 218 is formed to form the inner plate 219. It was fabricated (Fig. 13 (f)).
- Subsequent processing of the multilayer wiring board was performed in the same process as in Example B-1 to obtain a multilayer wiring board 220 with a built-in capacitor (FI
- a 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 14 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, followed by a heat treatment at a temperature of 250 ° C. for a heating time of 1 hour to form a 5 m-thick PZT thin film 208 (FIG. 14 (b)).
- PZT trade name, manufactured by Kanto Chemical Co., Ltd.
- nano-paste 216 a conductive paste that is metallized by a chemical reaction at a desired position on the surface of the PZT thin film by screen chemical printing (trade name, manufactured by Hachiriima Kasei Co., Ltd.) with a thickness of 40 m, Then, baking was performed at a temperature of 200 nC for a heating time of 1 hour, and the conductive paste was metallized to form a pattern of the first capacitor electrode 217 (FIG. 14 (c)).
- a resist having a desired pattern is formed, and the PZT thin film is etched and removed using a 20% by weight aqueous solution of ammonium bifluoride (NH 4 F'HF), and a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd.) Made by company, The ruthenium thin film was removed by etching (product name) (Fig. 14 (d)).
- a desired etching resist is further formed, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including the second capacitor electrode 218 is formed to form the inner layer plate 219. It was fabricated (Fig. 14 (e)).
- Subsequent processing of the multilayer wiring board was performed in the same process as in Example B-1 to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 14 ( ⁇ ).
- Example ⁇ -8 Example ⁇ -8
- a 0.2 m ruthenium thin film 207 was formed on the surface of the inner layer substrate 1 by DC sputtering (FIG. 15 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The coating and prebaking were repeated five more times, and then a heat treatment was performed at 250 at a heating time of 1 hour to form a 0.5 m thick PZT thin film 208 (Fig. 15 (b)). .
- PZT trade name, manufactured by Kanto Chemical Co., Ltd.
- a desired resist pattern is formed, and the PZT thin film 208 is removed by etching using a 20% by weight aqueous solution of ammonium bifluoride (NF / HF).
- the PZT thin film was patterned by etching the ruthenium thin film using a company (trade name) (Fig. 15 (c)).
- a 0.05 zm chromium thin film 209 was formed on the PZT thin film surface by DC sputtering.
- a 20-meter metal layer 210 was formed on the surface by copper electroplating (Fig. 15 (d)).
- a desired etching resist is formed on the surface of this substrate, an unnecessary copper metal layer is removed by etching using an aqueous ferric chloride solution, and a chromium metal layer is removed by etching using an aqueous potassium ferricyanide solution.
- the first capacitor electrode 217, the second capacitor electrode 218, and other wiring patterns were formed to produce an inner layer plate 219 (FIG. 15 (e)).
- Subsequent processing of the multilayer wiring board was performed in the same process as in Example B-1, to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 15 (f)). Comparative Example B-1
- a 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 16 (a)).
- a resist having a desired pattern is formed, the ruthenium thin film 207 is etched and removed by RIE, and then the copper metal layer on the inner substrate surface is etched and removed using an aqueous ferric chloride solution, and the second capacitor electrode 218 is included.
- a circuit pattern was formed (Fig. 16 (b)).
- a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes.
- a heat treatment was performed at a temperature of 250 ° C for a heating time of 1 hour to form a PZT thin film 208 having a thickness of 0.5 m (Fig. 16 (c)).
- a 0.05 zm chromium thin film 209 was formed on the surface of the PZT thin film by DC sputtering.
- a 20 urn metal layer 210 was formed on the surface by copper electroplating (Fig. 16 (d)).
- a desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is etched and removed using an aqueous ferric chloride solution, and a chromium metal layer is etched and removed using an aqueous potassium ferricyanide solution.
- An inner layer plate 219 was formed by forming a pattern of the first capacitor electrode 217 (FIG. 16 (e)).
- Subsequent processing of the multilayer wiring board yielded a multilayer wiring board 220 with a built-in capacitor by the same steps as in Example B-1 (FIG. 16 (f)).
- tests were performed on the dielectric film thickness, non-dielectric constant, and capacitor capacity. The test method is the same as described above.
- the dielectric constant was 10 to 20 on the surface of the substrate having via holes for connecting conductive layers inside the substrate and having a smooth metal layer on the surface.
- This is a capacitor built-in substrate manufactured by forming a dielectric thin film having a thickness of 0.00 and a thickness of 0.05 to 2 m. Variations in the capacitance of the manufactured capacitors were all less than ⁇ 10%, and uniform and good capacitors could be manufactured.
- Comparative Example B-1 since the dielectric thin film was a substrate with a built-in capacitor formed on the surface of the substrate on which the metal layer was patterned, the thickness variation was large, and as a result, the variation in the capacitor capacitance was also maximum. It was as large as 54%.
- a material C-11 for a multilayer wiring board with a built-in capacitor in which a PZT thin film 101 (dielectric thin film) was provided on one side of a copper foil 2 (metal foil) 102 via a ruthenium thin film 103 (FIG. 1).
- the relative dielectric constant of the PZT thin film thus obtained was 100.
- a 0.2 m ruthenium thin film 103 was formed on the surface of a rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Mining & Smelting Co., Ltd.) 102 having a thickness of 35 by DC sputtering.
- the surface is subjected to microwave plasma CVD using titanium tetraisopropoxide, zircon tetratert-butoxide, dipivaloyl methane lead complex, and nitrogen dioxide at a substrate temperature of 350 ° C. 0.5 of 111?
- Two (lead zirconate titanate) thin films 101 were formed to obtain a material C-12 for a multilayer wiring board with a built-in capacitor.
- the relative permittivity of the PZT thin film thus obtained was 70.
- Thin film etchant 1 Thin film etchant 1
- Echirenjiamin tetraacetate 'disodium salt (EDTA ⁇ 2Na), hydrogen peroxide (H 2 ⁇ 2), were mixed with water, EDTA' to 2Na 0. lmo l / l, and H 2 ⁇ 2 30 wt% and component pH4
- An aqueous solution was prepared.
- FIG. 17 the copper foil is shown as 303, the ruthenium thin film is shown as 302, and the PZT thin film 301 is shown.
- the copper foil 303 has a surface of 18 m in thickness through a 100 im thick glass epoxy pre-preda GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes an insulating resin substrate 304 (insulating material) on the surface.
- Copper foil 5GTS—18 (Furukawa Circuit Oil Co., Ltd., trade name) 305, laminated at a temperature of 170 ° C, pressure of 1.5MPa, and heating and pressing time of 60 minutes to obtain a board and obtain a substrate (See Fig. 17 (a)). Furthermore, a 0.05 m chromium film 306 is formed on the surface of the PZT thin film 301 by DC sputtering. did. Next, a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the copper foil 305 of the substrate, exposed to a desired negative pattern, developed with an aqueous sodium carbonate solution, An etching resist was formed.
- a resist was formed. Further, after the unnecessary adhered copper 309 is removed by etching using an aqueous ferric chloride solution, the resist is stripped off using an aqueous sodium hydroxide solution, and the chromium film 306 is etched and removed using an aqueous potassium ferricyanide solution. A capacitor electrode (metal layer) 310 pattern was formed (see FIG. 18 (a)). Next, a 40-im-thick dry film resist H—9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.), which becomes the etching resist 311, is laminated on the first capacitor electrode 310 side of this substrate (see FIG.
- the desired negative pattern was exposed and developed with an aqueous sodium carbonate solution to form an etching resist 311 on the first capacitor electrode 310 (see FIG. 18 (c)).
- the PZT thin film 301 was etched away at 20 ° C using a thin film etchant (1), and the ruthenium thin film 302 was removed using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name). Remove by etching (Fig. 18 (d) ), And the etching resist 311 was removed with an aqueous sodium hydroxide solution (see FIG. 18E).
- a dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on the substrate, exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate to form an etching resist. Subsequently, after unnecessary copper foil 303, unnecessary copper foil 305 and plated copper 309 thereon are removed by etching with an aqueous ferric chloride solution, the resist is peeled off with an aqueous sodium hydroxide solution to form copper foil 303.
- a circuit board including the second capacitor electrode 312 was formed to produce a circuit board (see FIG. 19 (a)).
- the circuit surface of this circuit board was subjected to a roughening treatment with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion.
- an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion.
- (1) 3 / xm thick copper foil with 35 m carrier copper foil MT 35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.)
- Glass epoxy prepreader GEA—679 F manufactured by Hitachi Chemical Co., Ltd., trade name
- circuit board (4) glass epoxy pre-preda with filler 100 m thick GEA_679F, (5) 3 m thick copper with 35 m carrier copper foil Foil MT 35 S 3 (made by Mitsui Kinzoku Mining Co., Ltd., trade name) in the order of 170 ° (pressure 1.5MPa, heating and pressurizing
- a copper foil 314 was laminated on both sides of the board via an insulating resin substrate 313.
- the carrier copper foil was peeled off, and unnecessary board edges were cut off (see FIG. 19 (b)).
- Laminate Life-Ilm Resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) and expose the desired negative pattern.
- unnecessary copper foil 314 was removed by etching using an aqueous solution of ferric chloride to form a 0.15 mm window hole at a desired location.
- a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is used to form an etching resist on necessary parts such as pads and circuit patterns on the circuit board surface, and unnecessary copper is removed by etching. Then, an outer layer circuit formed of copper foil 314 and plated copper 315 was formed (see FIG. 19 (d)).
- a multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental example C-11, except that the material C-11 for the multilayer wiring board with a built-in capacitor was replaced with the material C-2 for the multilayer wiring board with a built-in capacitor.
- a multilayer wiring board with a built-in capacitor was obtained by the same process as in Experimental Example C-1, except that the thin film etchant (1) was replaced with the thin film etchant (2).
- a multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental Example C-11, except that the thin film etchant (1) was replaced with the thin film etchant (3) and used at 30 ° C.
- Experimental example C-1 5 A multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental example C-11, except that the thin film etchant (1) was replaced with the thin film etchant (4).
- a multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental Example C-11, except that the thin film etchant (1) was replaced with the thin film etchant (5).
- the surface of the copper foil 303 of C-11 a material for multilayer wiring boards with built-in capacitors, was roughened with an organic acid-based microetching agent CZ_8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding.
- This copper foil 303 has a thickness of 18 through a 100 m thick glass epoxy pre-predeer GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes an insulating resin substrate 304 (insulating material) on the surface.
- 5GTS-18 Fluukawa Circuit Oil Co., Ltd., trade name
- a chromium film 306 of 0.05 zm was formed on the surface of the PZT thin film 301 by DC sputtering.
- a dry film resist H_9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the copper foil 305 of this substrate, exposed to a desired negative pattern, developed with an aqueous solution of sodium carbonate, and etched. Was formed.
- unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to form a window hole 307 having a diameter of 0.1 mm at a desired position (see FIG. 17 (b)). The resist was stripped off.
- laser holes 308 were drilled in the 7 windows using Mitsubishi Electric Corporation ML 505 GT carbon dioxide laser under the conditions of 26 mJ output power, 100 S pulse width, and 4 shots. (See Figure 17 (c)). After that, remove the resin residue carbonized by ultrasonic cleaning and alkaline permanganate solution, apply catalyst, promote adhesion, and perform electroless copper plating. Formed. Furthermore, electrolytic copper plating was performed on the substrate surface, and a metal layer made of plated copper 309 was formed to electrically connect the inner layer circuit conductor and the conductor layer on the substrate surface (see FIG. 17 (d)). .
- a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on the surface of the substrate, exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate to form an etching resist. . Further, after unnecessary plating copper 309 is removed by etching using an aqueous ferric chloride solution, the resist is stripped with an aqueous sodium hydroxide solution, and the chromium film 306 is etched and removed using an aqueous potassium ferricyanide solution. The pattern of the first capacitor electrode 310 was formed (see FIG. 18A). Next, an alkali-developable resist PER-20 (manufactured by Taiyo Ink Mfg.
- the etching resist 311 is applied to the first capacitor electrode 310 side of this substrate for 20 m (see FIG. 18 (b)). After pre-baking at 100 ° C for 15 minutes, the desired negative pattern is exposed, dried at 130 ° C for 30 minutes, developed with an aqueous solution of sodium carbonate, and an etching resist 311 is formed on the first capacitor electrode 310. Formed (see Fig. 18 (c)).
- the PZT thin film 301 was etched away at 20 ° C using a thin film etchant (1), and the ruthenium thin film 302 was etched away using a ruthenium etchant REC-01 (trade name, manufactured by Kanto Kagaku Co., Ltd.).
- the etching resist 311 was peeled off with an aqueous sodium hydroxide solution (see FIG. 18 (d)).
- the substrate was laminated with a dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.), exposed to a desired negative pattern, and developed with an aqueous sodium carbonate solution to form an etching resist.
- the surface of the copper foil 303 of C-11 a material for multilayer wiring boards with built-in capacitors, was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. .
- the copper foil 303 has a thickness of 18 G through a glass epoxy pre-preder GE A—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes an insulating resin substrate 304 on the surface of the copper foil 303.
- Furukawa Circuit Oil Co., Ltd. was distributed and laminated at a temperature of 170 ° (Pressure: 1.5MPa, heating and pressing time: 60 minutes) to obtain a substrate (Fig.
- a 0.05 m chromium film 306 was formed by DC sputtering on the surface of the PZT thin film 301. Then, a dry film resist H-9030 (Hitachi Chemical Industries, Ltd.) was formed on the surface of the copper foil 305 of this substrate. (Trade name, manufactured by the company), exposed to the desired negative pattern, developed with an aqueous solution of sodium carbonate to form an etching resist, and then etched unnecessary copper foil with an aqueous solution of ferric chloride. Remove and remove ⁇ 0.1mm A hole 307 was formed, and the resist was stripped with an aqueous sodium hydroxide solution (see Fig.
- a ML 505 GT type carbon dioxide laser manufactured by Mitsubishi Electric Corporation was used at the window hole 307.
- the laser hole 308 was drilled under the conditions of an output power of 26 mJ, a pulse width of 100 is, and four shots (see Fig. 17 (c)).
- electroless copper plating was performed to form a copper thin film of 0.5 on both sides of the substrate.
- a metal layer made of plated copper 309 was formed to electrically connect the conductor layer on the substrate surface (see Fig.
- a dry film resist H-9030 (Hitachi Chemical Industries, Ltd.) (Trade name, manufactured by Co., Ltd.) was exposed and developed with an aqueous solution of sodium carbonate to form an etching resist, and unnecessary plating copper 309 was removed by etching using an aqueous solution of ferric chloride.
- the resist was stripped off with an aqueous solution of sodium hydroxide, and the chromium film 306 was removed by etching using an aqueous solution of ferricyanation power to form a pattern of the first capacitor electrodes 31, 0 (see FIG. 18 (a)). ).
- the ruthenium thin film 302 was etched away using a ruthenium etchant REC-01 (trade name, manufactured by Kanto Chemical Co., Ltd.) (see (d) in FIG. 3), and the AZ rim bar 700 (Clariant Japan Stock) Made by company, product name) Etching resist 3 11 (See Fig. 18 (e).)
- a dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on this substrate, exposed to a desired negative pattern, and developed with an aqueous sodium carbonate solution.
- unnecessary copper foil 303, unnecessary copper foil 305 and plated copper 309 thereon were removed by etching with an aqueous ferric chloride solution, and then the resist was stripped with an aqueous sodium hydroxide solution. Then, a circuit pattern including the second capacitor electrode 312 formed from the copper foil 303 was formed to produce a circuit board (see FIG. 19A).
- the circuit surface of this circuit board was subjected to a roughening treatment with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion.
- an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion.
- Thickness 3 copper foil MT 35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) with 35 m carrier copper foil
- Board (4) 100 m thick glass epoxy pre-preda with filler, GE A-679 F
- 35 m copper foil with carrier copper foil 3 m thickness MT 35 S 3 (three Ii Metal Mining Co., Ltd., product name), temperature 170 ° (:, pressure 1.5MPa, heating and pressurizing time 60min
- a copper foil 314 was laminated via an insulating resin base material 313.
- the carrier copper foil was peeled off, and unnecessary substrate edges were cut off (see FIG. 19 (b)).
- Laminate 9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.), expose the desired negative pattern, and develop with sodium carbonate aqueous solution to form an etching resist. Etching was removed using an aqueous solution of ferric chloride to form a 0.15 mm window hole at the desired location
- the ML 505 GT carbonate manufactured by Mitsubishi Electric Corporation was placed at the window hole provided on the surface of this circuit board. Using a gas laser, output power 26mJ, pulse width 100Ms, (Refer to Fig.
- Electroless copper plating was performed to form an electroless copper plating layer of about 20 m on the inner wall of the laser hole and the copper foil surface Dry film resist H-9030 on necessary parts such as pads and circuit patterns on the circuit board surface (Hitachi Kasei Kogyo Co., Ltd., product name) to form an etching resist and remove unnecessary copper by etching to form an outer layer circuit formed from copper foil 314 and plated copper 315 (Fig.
- Solder resist PSR—4000 AUS5 (manufactured by Taiyo Ink Manufacturing Co., Ltd., trade name) is applied to the surface of this circuit board for 30 m with a roll coater, dried, exposed and developed. Then, solder resist 316 was formed at the position shown in FIG. Electroless nickel plating and 0.1 m of electroless gold plating (NiZAu plating 17) were formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board with a built-in capacitor (Fig. 19 ( e)) Experimental example C-9
- the copper foil 303 has an 18 m thick copper foil 5GTS through a glass epoxy pre-preder GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) which becomes an insulating resin substrate 304 on the surface. 18 (Furukawa Saichifuto Oil Co., Ltd., product name), and laminated and integrated under the pressing conditions of a temperature of 170 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 60 minutes to obtain a substrate (Fig. 17 (a)).
- a 0.05 m chromium film 306 was formed on the surface of the FZT thin film 301 by DC sputtering.
- a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the copper foil 305 of this substrate, exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate. An etching resist was formed.
- unnecessary copper foil was removed by etching using an aqueous ferric chloride solution to form a window hole 307 having a diameter of 0.1 mm at a desired position, and the resist was stripped with an aqueous sodium hydroxide solution (FIG. 17). (b)).
- a laser hole 308 was drilled at the window hole 307 using a Mitsubishi Electric ML 505 GT type carbon dioxide gas laser with an output power of 26 mJ, a pulse width of 100 s, and four shots. (See Figure 17 (c)).
- the resin residue carbonized by ultrasonic cleaning and Argali permanganate solution was removed, and after applying a catalyst and promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5 on both sides of the substrate.
- the surface of the substrate was plated with copper, and a metal layer made of plated copper 309 was formed to electrically connect the inner layer circuit conductor and the conductor layer on the substrate surface (see Fig. 1 (d)). .
- a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on the surface of the substrate, exposed to a desired negative pattern, developed with an aqueous solution of sodium carbonate, and the etching resist was removed. Formed. Further, after unnecessary plating copper 309 is removed by etching using an aqueous ferric chloride solution, the resist is peeled off using an aqueous solution of sodium hydroxide, and the chromium film 306 is formed using an aqueous solution of ferricyanation power. By etching and removing, a pattern of the first capacitor electrode 310 was formed (see FIG. 18A).
- a solvent-developable resist AZ to be an etching resist 311 is formed on the first capacitor electrode 310 side of the substrate.
- 9245 Cosmetic Japan Co., Ltd., product name
- AZ400K Developer trade name, manufactured by Clariant Japan Co., Ltd.
- etching resist 311 was removed (see FIG. 18 (e)).
- This substrate was laminated with a dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.), exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate to form an etching resist.
- the unnecessary copper foil 303, unnecessary copper foil 305 and the plated copper 309 thereon are removed by etching with an aqueous ferric chloride solution, and then the resist is peeled off with an aqueous sodium hydroxide solution to form the copper foil 303.
- a circuit board including the second capacitor electrode 312 thus formed was formed to produce a circuit board (see FIG. 19 (a)).
- a 0.2 m ruthenium thin film was formed on the surface of a 18-im thick rolled copper foil M—BNH-18 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) by DC sputtering.
- the thickness of the substrate was reduced to 350 ° C by microwave plasma CVD on the substrate surface using titanium tetraisopropoxide, zirconte tertiary butoxide, dipivaloyl methane lead complex, and nitrogen dioxide.
- a 5 tm PZT (lead zirconate titanate) thin film was formed.
- a material D—2 for a multilayer wiring board with a built-in capacitor in which the PZT thin film 101 (dielectric thin film) was provided on one side of the copper foil 102 (metal foil A) via the ruthenium thin film 103 ( Figure 1 (b).
- a 0.2 m ruthenium thin film was formed on the surface of a rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) having a thickness of 18 ⁇ m by DC sputtering. Further, a ferroelectric thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied to the surface, and prebaking was performed at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, followed by heat treatment at a temperature of 350 for 1 hour to form a 5 m-thick PZT thin film.
- the copper foil 402 which is a material for a multilayer wiring board with a built-in capacitor, a 100 m-thick glass epoxy pre-predeer GEA-679F (made by Hitachi Chemical Co., Ltd., which becomes an insulating resin base material 404 (insulation layer), 12m thick copper foil 405 (metal foil B) GTS-12 (Furukawa Circuit Oil Co., Ltd., trade name) via the product name), temperature 180 ° C, pressure 1.5MPa, heating The substrates were integrated under a press condition of 60 minutes to obtain a substrate (Fig. 20 (b)).
- a 100 m-thick glass epoxy pre-predeer GEA-679F made by Hitachi Chemical Co., Ltd., which becomes an insulating resin base material 404 (insulation layer)
- 12m thick copper foil 405 metal foil B
- GTS-12 Fluukawa Circuit Oil Co., Ltd., trade name
- a desired etching resist is formed on both sides of the substrate, and unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to form a ⁇ 0.15 mm window hole 405 ′ at a desired position.
- a ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation was used at the window hole 405 ', laser irradiation was performed under the conditions of an output power of 26mJ, a noise width of 100 / s, and four shots.
- a laser hole 406 was drilled, and resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 20 (d)).
- a 0.05 mm chromium thin film 407 was formed on the surface of the PZT thin film 401 (dielectric thin film) by DC sputtering.
- a catalyst-imparting agent Naeog an th 843, manufactured by Atotech Japan Co., Ltd., trade name
- an adhesion promoter Naeog an th WA, manufactured by Atotech Japan Co., Ltd.
- electroless copper plating is performed, a 0.5 m. Copper thin film is formed, and a 2 O ⁇ m metal layer is formed on both surfaces of the substrate by electrolytic copper plating.
- a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402, the copper foil 405, and the plated copper 408 are removed by etching using an aqueous ferric chloride solution, thereby forming a second capacitor.
- a circuit board including the electrode 410 was formed to produce a circuit board (Fig. 20 (h)). .
- the circuit surface of this circuit board was subjected to a roughening treatment using an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding.
- CZ-8100B organic acid-based microetching agent
- a desired etching resist is formed on the surface of the substrate, and the unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to obtain a desired etching resist.
- a hole with a diameter of 0.15 mm was formed at the location.
- the laser was operated under the conditions of an output power of 26 mJ, a noise width of 100 S, and four shots. Drilled. Ultrasonic cleaning and removal of carbonized resin residue with permanganate solution, application of cleaning catalyst, adhesion promotion and electroless copper plating Then, about 20 electroless copper plating layers were formed on the inner wall of the laser hole and the copper foil surface. An etching resist was formed on necessary parts such as pads and circuit patterns on the surface of this substrate, and unnecessary copper was removed by etching to form an outer layer circuit.
- Solder resist PSR-4000 AUS5 (Taiyo Ink Mfg. Co., Ltd., trade name) was applied to the surface of the substrate by a roll coater for 30 m, dried and exposed and developed to form a solder resist 411 at a desired position. Then, 3 m electroless nickel plating and 0.1 m electroless gold plating (Ni-Au plating 420) were formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board with built-in capacitors ( Figure 20 (i)).
- Example D-2
- the surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multilayer bonding.
- an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multilayer bonding.
- Figure 21 (a) A 100-zm-thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) serving as an insulating resin base material 404 is provided on the surface of the copper foil 402, which is a material for a multilayer wiring board containing a capacitor.
- a 12 m thick copper foil 5 GTS-12 (Furukawa Circuit Oil Co., Ltd., trade name) is placed at a temperature of 180 ° (Pressure: 1.5 MPa, heating and pressurizing time: 60 minutes under press conditions)
- a desired etching resist was formed on both sides of this substrate, and unnecessary copper foil was removed by etching using an aqueous ferric chloride solution.
- a window hole 405 'with a diameter of 0.15mm was formed at the desired location (Fig. 21 (c))
- a ML505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation was used at the window hole 405'.
- a desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 are removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricyanide solution.
- a pattern of the first capacitor electrode 409 was formed (FIG. 21 (f)).
- a resist having a desired pattern was formed, and unnecessary portions of the PZT thin film 401 and the ruthenium thin film 403 were removed by etching by RIE using CF 4 gas to form a capacitor dielectric 401 ′ (FIG. 21 (g )).
- Example D-3 a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402, the copper foil 405, and the plated copper 408 are removed by etching using an aqueous ferric chloride solution to form a second capacitor electrode.
- a circuit board was fabricated by forming a circuit pattern including 410 (Fig. 21 (h)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-1 (FIG. 21 (i)).
- Example D-3
- the surface of the copper foil 402 of the multilayer wiring board material with built-in capacitor D-2 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. (Fig. 22 (a)).
- an organic acid-based microetching agent CZ-8100B trade name, manufactured by MEC Corporation
- a glass epoxy pre-predeer GE A-679F (Hitachi Chemical Industry Co., Ltd.
- Thick copper foil 5 MT 35M3 (trade name, manufactured by Mitsui Mining & Smelting Co., Ltd.) with 35 carrier copper foil, temperature 180 ° C, pressure 1.5MPa, heating and pressurizing time
- the substrates were laminated and integrated under the press conditions for 60 minutes to form a substrate ( Figure 22 (b)).
- the output power was 30 mJ on the surface of the copper foil 405 on the board using Mitsubishi Electric Corporation ML 505 GT carbon dioxide laser. Laser drilling under conditions of several 6 times Then, a laser hole 406 having a diameter of 15 mm was manufactured. After that, the resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 22 (c)).
- a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by a DC sputtering method. Then, a catalyst is applied to both sides of the substrate, electroless copper plating is performed after promoting adhesion, a copper thin film of 0.5 is formed, and a 20 m metal layer is formed on both surfaces of the substrate by electrolytic copper plating. A metal layer consisting of was formed (Fig. 22 (d)).
- a desired etching resist is formed on the surface of this substrate, an unnecessary portion of the metal layer made of plated copper 408 is removed by etching using an aqueous solution of ferric chloride, and the chromium thin film 40 exposed using an aqueous solution of potassium ferricyanide is removed. 7 was removed by etching to form a pattern of the first capacitor electrode 409 (FIG. 22 (e)). Subsequently, a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium fluoride (NH 4 F-HF) to pattern the PZT thin film. A dielectric 401 'was formed (FIG. 22 (f)).
- NH 4 F-HF ammonium fluoride
- the surface of copper foil 402 of C-3 a material for multilayer wiring boards with built-in capacitors, is roughened with an organic acid-based micro-etching agent CZ-8100B (Mec Co., Ltd., made by Todo Co., Ltd.) as a pretreatment for multi-layer bonding. (Fig. 23 (a)).
- an organic acid-based micro-etching agent CZ-8100B Moc Co., Ltd., made by Todo Co., Ltd.
- a thickness 1 serving as an insulating resin base material 404 is provided on the surface of the copper foil 402 of the material for a multilayer wiring board with a built-in capacitor.
- This prepreder is a 25-zm-thick polyethylene terephthalate (PET) film attached on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes.
- PET polyethylene terephthalate
- a conductive paste 13 AE 1650 (Tatsuyu System Electronics Co., Ltd., trade name) in which copper powder is dispersed in a thermosetting resin by screen printing.
- the PET film was peeled off.
- a 0.05 m chromium thin film 407 is formed on the surface of the PZT thin film 401 by DC sputtering, and then a metal layer made of 20 m plated copper 408 is formed on both sides of the substrate by electrolytic copper plating. (Fig. 23 (c)).
- a desired etching resist is formed on the surface of the substrate, an unnecessary portion of the metal layer made of plated copper 408 is removed by etching using an aqueous ferric chloride solution, and the exposed chromium is exposed using an aqueous solution of lithium ferricyanide.
- the thin film 7 was removed by etching to form a pattern of the first capacitor electrode 409 (FIG. 23D).
- a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F-HF) to perform patterning of the PZT thin film.
- NH 4 F-HF ammonium bifluoride
- Example D-6 a conductive paste that is metalized by a chemical reaction into the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors
- a multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example D-4, except that the replacement was performed.
- Example D-6
- the surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding.
- Figure 24 (a) A 100 m thick glass epoxy prepreg GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.), which becomes an insulating resin base material 404, is provided on the surface of the copper foil 402 of the material for the multilayer wiring board with a built-in capacitor.
- Carrier copper foil with thickness 5MT3 5S3 (made by Mitsui Mining & Smelting Co., Ltd., trade name), laminated under pressing conditions of temperature 180, pressure 1.5MPa, heating and pressing time 60 minutes They were integrated to form a substrate (Fig. 24 (b)).
- a desired etching resist is formed on the surface of the copper foil 405 of the substrate from which the carrier copper foil has been peeled off, and unnecessary copper foil is removed by etching using an aqueous ferric chloride solution, and ⁇ A window hole 405 ′ of 0.15 mm was formed (FIG. 24 (c)).
- a laser beam was applied to the window hole 405 ′ using the ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 zs, and a number of shots of 4 times.
- the resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 24 (d)).
- a 0.05 im chromium thin film 407 was formed on the surface of the PZT thin film 401 by DC sputtering.
- a catalyst was applied to both surfaces of the substrate, and after promoting adhesion, electroless copper plating was performed to form a copper thin film 19 of 0.5 m.
- the thus formed 0.55 im chromium thin film 407 and 0.5 m copper thin film 419 are A base metal layer (metal layer having a thickness of 0.1 to 5) is formed by a semi-additive method.
- a desired plating resist 414 is formed on both sides of the substrate, and electro-copper plating is performed.
- a conductive pattern made of plated copper 415 which becomes a circuit including the first capacitor electrode 409 having a thickness of 20 m and the laser hole 406. was formed (Fig. 24 (e)).
- a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by a DC sputtering method. Furthermore, a catalyst was applied to both sides of this substrate, and after promoting adhesion, electroless copper plating was performed.
- a copper thin film 419 was formed.
- the thus formed 0.05 m thin chromium film 407 and 0.5 m thin copper film 419 form a semi-additive base metal layer (metal layer having a thickness of l to 5 zm).
- a desired plating resist 414 is formed on the surface of this substrate, electrolytic copper plating is performed, and the plated copper 415 which becomes a circuit of the portion including the first capacitor electrode 409 having a thickness of 20 m and the laser hole 406 is formed.
- a conductive pattern was formed (Fig. 25 (d)).
- the exposed portions of the 0.5 copper thin film 419 and 0.05 zm chromium thin film 407 exposed on the substrate surface are removed by etching to include the first capacitor electrode 409 and the laser hole 406. Partial circuit patterns were formed. At this time, a 3 m thick copper foil 405 was also patterned to form a circuit (Fig. 25 (e)). Subsequently, a resist having a desired pattern is formed, and the PZT thin film 401 is removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F ⁇ HF) to perform patterning of the PZT thin film 401, thereby forming a capacitor dielectric.
- NH 4 F ⁇ HF ammonium bifluoride
- the body 401 ' was formed (FIG. 25 (f)). Then, the exposed part of the ruthenium thin film 403 was etched away using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 25 (g)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402 are removed by etching using an aqueous solution of ferric chloride, and a circuit including the second capacitor electrode. A circuit board was fabricated by forming a pattern (Fig. 25 (h)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example D-1. A multilayer wiring board was obtained (Fig. 25 (i)). Example D-8
- the substrate was formed by laminating and unifying under press conditions of 60 minutes (Fig. 26 (b)).
- This pre-predeer was prepared by applying a 25 / im thick polyethylene terephthalate (PET) film to both sides at a temperature of 10 0 ° (: Pressure 1.5MPa, heating and pressurizing time 10 minutes after applying by hot press, drilling at desired location, then thermosetting by screen printing Conductive paste in which copper powder is dispersed in resin 1 3A E 1650 (Tutter System Electronics Co., Ltd., trade name)
- a 0.05 m-thick chromium thin film 407 was formed on the surface of the PZT thin film 401 by a DC sputtering method.
- electroless copper plating was performed to form a 0.5 m copper thin film 419.
- the thus formed 0.05 m chromium thin films 407 and 0 A 5 m copper thin film 4 19 forms a base metal layer (metal layer with a thickness of 1 to 5 m) by the semi-additive method, and then a desired plating resist 414 is formed on both sides of the substrate.
- Electroplated copper was used to form a conductor pattern to become the first capacitor electrode 409 with a thickness of 20 m (Fig. 26 (c)) After the plating resist 414 was peeled off, the surface of the substrate was exposed.
- the 5 m copper thin film 419 was etched away with an aqueous ferric chloride solution, and the exposed 0.05 ⁇ chromium thin film 407 was removed. And Etchingu removed using cyanide Kariumu solution Thus, a pattern of the first capacitor electrode 409 was formed (FIG. 26 (d)). Subsequently, a resist of a desired pattern, 20% bifluoride Anmoniumu - perform patterning of the PZT thin film 401 and unnecessary portions of the PZT thin film 401 is etched away using (NJ 4 F HF) aqueous solution, the capacitor dielectric The body 401 'was formed (Fig. 26 (e)).
- Example D-10 Replaced the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors with a nano paste (Hachirima Kasei Co., Ltd., trade name), a conductive paste that is metallized by a chemical reaction. Except for this, a multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example D-8.
- Example D-10 Example D-10
- the surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multilayer bonding.
- CZ-8100B organic acid-based microetching agent
- Fig. 27 (a) A 100-meter-thick glass epoxy prepreg GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes the insulating resin base material 404 on the surface of the copper foil 402, which is a material for a multilayer wiring board with a built-in capacitor.
- nano-paste (Harima Chemical Co., Ltd., a trade name), which is a conductive paste that is metallized by a chemical reaction by screen printing, with a thickness of 40 m.
- baking was performed at a temperature of 200 ° C. for a heating time of 1 hour, and the conductive paste was metallized to form a pattern of the first capacitor electrode 416 (FIG. 27 (c)).
- a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F * HF), and the PZT thin film is patterned to perform capacitor dielectric.
- a ruthenium etchant REC-01 Kelvin Chemical Co., Ltd., trade name
- Nano paste (Harima Kasei Co., Ltd.), a conductive paste that is metalized by a chemical reaction into the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors
- a multilayer wiring board with a built-in capacitor was obtained by the same steps as in Example D-10 except for the change.
- Example D-12
- the copper foil 402 which is a material for a multilayer wiring board with a built-in capacitor
- a 100 m thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.), which becomes the insulating resin base material 404
- 12 Gm-thick copper foil 5GTS-12 (Furukawa Circuit Oil Co., Ltd., trade name) is placed, and laminated under the press conditions of temperature 180 ° C, pressure 1.5MPa, heating and pressurizing time 60 minutes.
- the substrates were integrated to form a substrate (FIG. 28 (b)).
- a resist having a desired pattern is formed, and the PZT thin film 401 is removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F ⁇ HF), and the PZT thin film is patterned to perform capacitor dielectric.
- the ruthenium thin film 403 was etched away using a ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 28 (c)).
- a desired etching resist was formed on both sides of the substrate, and unnecessary portions of the copper foil 405 were removed by etching using an aqueous ferric chloride solution to form window holes 405 'having a diameter of 0.15 mm at desired positions.
- Fig. 28 (d) laser irradiation was performed at the window hole 405 'using a ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots.
- a hole 406 was drilled, and resin residue carbonized with ultrasonic cleaning and an alkali permanganate solution was removed (Fig. 28 (e)).
- a 0.05 thin chromium film 407 was formed on the surface of the substrate on the side of the capacitor dielectric 401 'by DC sputtering.
- electroless copper plating is performed after applying a catalyst and promoting adhesion to form a copper thin film of 0.5, and then a 20 m metal layer is formed thereon by electrolytic copper plating.
- a metal layer made of plated copper 408 was formed (FIG. 28 (f)).
- a desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and the exposed portion is exposed using an aqueous ferricyanide force aqueous solution.
- the surface of copper foil 402 of material D-3 with built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding.
- CZ-8100B organic acid-based micro-etching agent
- Fig. 29 (a) 0 A 100 m thick glass epoxy prepreg GEA-679F (Hitachi Chemical Industry Co., Ltd.) Through the company, brand name), 35 carrier copper foil with thickness 3 copper foil 5MT
- 35M3 manufactured by Mitsui Kinzoku Mining Co., Ltd., trade name
- a pressing condition of temperature 180 ° C, pressure 1.5MPa, heating and pressing time 60 minutes to obtain a substrate
- a resist having a desired pattern is formed, and the PZT thin film 401 is etched and removed using a 20% aqueous solution of ammonium bifluoride (NH 4 F′HF), and the PZT thin film is patterned to form a capacitor dielectric 401.
- NH 4 F′HF ammonium bifluoride
- the exposed part of the ruthenium thin film 403 was etched away using the ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 29 (c)).
- the specified surface of the copper foil 405 was output using a Mitsubishi Electric Corporation ML 505 GT carbon dioxide laser with an output power of 30 mJ, a pulse width of 15 S, and six shots. Laser irradiation was performed to produce a laser hole 406 having a diameter of 0.15 mm. After that, resin residue carbonized by ultrasonic cleaning and alkaline permanganate solution was removed (Fig. 29 (d)). Furthermore, the capacitor dielectric of the substrate
- a 0.05 m chromium thin film 407 was formed by DC sputtering. After that, catalyst is applied to both sides of the substrate, and after promoting adhesion, electroless Copper plating was performed, a copper thin film of 0.5 was formed, a metal layer of 20 m was formed thereon by electrolytic copper plating, and a metal layer of plated copper 408 was formed (FIG. 29 (e) ).
- a desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricyanide solution. Further, the exposed copper foil 402 was removed by etching using an aqueous ferric chloride solution to form a circuit pattern including the first capacitor electrode 409 and the second capacitor electrode 410 (FIG. 29 (f)). ). Subsequent application of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-1 (Fig. 29 (g)).
- the surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 is roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. (Fig. 30 (a)).
- the copper foil 402 which is a material for a multilayer wiring board with a built-in capacitor, a 100-m-thick glass epoxy pre-predeer GE A—679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes the insulating resin base material 40 Via a 35 / m carrier copper foil with 3 m thick copper foil 5 MT 3553 (Mitsui Mining Co., Ltd., trade name), temperature 180 ° C, pressure 1.5M Pa, heating and pressurizing time 60 The substrates were laminated and integrated under the same pressing conditions to obtain a substrate (Fig. 30 (b);).
- This pre-predeer is prepared by applying a 25-thick polyethylene terephthalate (PET) film on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. After drilling holes, conductive paste AE 1650 (Tutter System Electronics Co., Ltd., trade name) in which copper powder is dispersed in thermosetting resin is filled by screen printing! ⁇ Then, the PET film on the surface was peeled off.
- PET polyethylene terephthalate
- a 0.05 m chromium thin film 407 is formed on the surface of the capacitor dielectric 401 ′ of the substrate by a DC sputtering method, then a catalyst is applied, adhesion is promoted, and then electroless copper plating is performed. A copper thin film was formed. Furthermore, a metal layer made of plated copper 408 of 20 m was formed on both sides of the substrate by electrolytic copper plating (Fig. 30 (d)). A desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and the chromium thin film is exposed using an aqueous potassium fluoric acid solution.
- Example D-15 Example D-15
- Example D-14 Replaced the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors with a nano paste (Hachierima Kasei Co., Ltd., trade name), a conductive paste that is metallized by a chemical reaction. Except for this, a multilayer wiring board with a built-in capacitor was obtained by the same steps as in Example D-14. Comparative Example D-1
- a 0.2 mm-thick double-sided circuit board (Fig. 31 (a)) having conductor holes for connecting circuit patterns on both sides (the inside of the hole was filled with resin 418) was prepared.
- a 0.2 m ruthenium thin film 403 was formed by DC sputtering. Form resist of desired pattern, and by RIE method, The ruthenium thin film 403 other than on the circuit was removed by etching to form a circuit pattern including the second capacitor electrode 421 (FIG. 31 (b)).
- a ferroelectric thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes.
- a heat treatment was performed at a temperature of 250 ° C for a heating time of 1 hour to form a 0.5 m thick PZT thin film 401 (Fig. 31 (c) ). Further, a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by DC sputtering. Further, a metal layer made of plated copper 408 having a thickness of 20 rn was formed on the surface by electrolytic copper plating (FIG. 31 (d)).
- a desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 are removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricinated solution. Then, a circuit board was fabricated by forming a pattern of the first capacitor electrode 422 (FIG. 31 (e)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-1 (FIG. 31 (f);).
- a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2_im was provided on the surface of the metal foil.
- This is a substrate with a built-in capacitor manufactured using a material for a multilayer wiring board with a built-in capacitor. Variations in the capacitance of the manufactured capacitors were all less than ⁇ 10%, and uniform and good capacitors could be manufactured.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Laminated Bodies (AREA)
Abstract
Description
明 細 書 Specification
コンデンサを内蔵した多層配線板用材料、 多層配線板用基板および多層配線板 とこれらの製造方法 技術分野 Material for multilayer wiring board with built-in capacitor, substrate for multilayer wiring board, multilayer wiring board, and manufacturing method thereof
本発明は、 コンデンサを内蔵した多層配線板用材料、 多層配線板用基板およ び多層配線板と、 これらの製造方法に関する。 背景技術 The present invention relates to a multilayer wiring board material having a built-in capacitor, a multilayer wiring board substrate and a multilayer wiring board, and a method of manufacturing these. Background art
近年、 電子機器は小型化 ·高機能化の要求が益々高まっている。 機器の高機 能化に伴い、 搭載する半導体チップやコンデンサをはじめとする受動素子など の電子部品点数は増加し、 従来の高密度化技術では小型化への対応が非常に困 難となってきている。 そこで、 より効率的な実装を行うため搭載部品の一部を 配線板内部に内蔵化する必要性が出てきた。 In recent years, the demand for smaller and more sophisticated electronic devices has been increasing. As the functionality of devices increases, the number of electronic components such as passive elements such as semiconductor chips and capacitors mounted increases, and it becomes extremely difficult to respond to miniaturization with conventional high-density technology. ing. Therefore, it has become necessary to incorporate some of the mounted components inside the wiring board for more efficient mounting.
多層配線板に内蔵されるコンデンサの容量は数百 p F〜数/ x Fレベルであり、 5 0 0 p F /mm2以上の容量密度が必要となる。 コンデンサの誘電体として は、 樹脂と高誘電率無機フイラ一のコンポジット材料を用いる方法と無機薄膜 材料を用いる方法とがある。 高い容量密度のコンデンサを形成するためには、 1 ) 比誘電率の高い誘電体を用いること、 2 ) 厚みの薄い誘電体を用いること が効果的である。 前者のコンポジット材料では、 1 ) 樹脂自体は比較的誘電率 が低いために高誘電率化に限界があること、 2 ) リーク電流がなく、 かつ膜厚 が数/ レベルの絶縁膜を形成することは技術的に難しいことから、 5 0 0 p F /mm2以上の容量密度を有するコンデンサを得ることは難しかった。 した がって、 5 0 0 p F /mm2以上の容量密度を有するコンデンサを得るために は、 膜厚を数 m以下で形成可能な無機薄膜を利用することが必要である。 樹脂を用いた多層配線板の中に薄膜コンデンサを内蔵化する手法としては、 C VD法を用いた方法 (特開平 5— 1 9 1 0 5 3号公報の第 4頁、 第 1図;特 開平 5— 2 2 6 8 4 4号公報の第 4頁、 第 1図) や、 スパッタリング法を用い た方法(特開 2 0 0 2 - 2 5 2 2 9 7号公報の第 6頁、 第 1図)、 あるいはゾル. ゲル法を用いる方法 (特開平 8— 2 1 3 7 5 4号公報の第 1 2頁、 第 2 1図; 特開平 8— 2 1 3 7 5 8号公報の第 1 4頁、第 2 1図)などが提案されている。 これらの手法により、 樹脂を用いた多層配線板の中に膜厚が薄い誘電体薄膜を 形成することができる。 The capacitance of the capacitor built in the multilayer wiring board is several hundred pF to several / xF, and a capacitance density of 500 pF / mm 2 or more is required. As the dielectric of the capacitor, there are a method using a resin and a composite material of a high dielectric constant inorganic filler and a method using an inorganic thin film material. In order to form a capacitor with a high capacitance density, it is effective to 1) use a dielectric having a high relative dielectric constant and 2) use a dielectric having a small thickness. With the former composite material, 1) the resin itself has a relatively low dielectric constant, so there is a limit in increasing the dielectric constant; 2) an insulating film with no leakage current and a film thickness of several / level is formed. Is technically difficult, it has been difficult to obtain a capacitor having a capacitance density of 500 pF / mm 2 or more. Therefore, in order to obtain a capacitor having a capacitance density of 500 pF / mm 2 or more, it is necessary to use an inorganic thin film that can be formed with a film thickness of several meters or less. As a method of incorporating a thin film capacitor in a multilayer wiring board using a resin, there is a method using a CVD method (see page 4 and FIG. 1 of JP-A-5-191503; FIG. 4, page 4 of Japanese Laid-Open Patent Application No. 5-222684, and a method using a sputtering method (page 6, page 2 of Japanese Patent Application Laid-Open No. 2002-2525). (Fig. 1), or a method using the sol-gel method (see page 12 of JP-A-8-213375, Fig. 21; Fig. 21 of JP-A-8-213375). 14 page, Fig. 21) and so on. By these techniques, a thin dielectric thin film can be formed in a multilayer wiring board using a resin.
しかし、 特開平 5— 1 9 1 0 5 3号公報および特開平 5— 2 2 6 8 4 4号公 報に開示された手法ではコンデンサ電極に対して任意の位置に引き出しパター ンを形成できないために高密度配線化に限界があった。 また、 回路パターン上 に薄膜を形成するために薄膜厚みの制御が難しかった。 また、 特開 2 0 0 2— 2 5 2 2 9 7号公報に開示された手法では、 任意の位置に引き出しパターンを 形成しょうとすると工程が複雑になり、 経済性が悪かった。 さらに、 特開平 8 - 2 1 3 7 5 4号公報および特開平 8— 2 1 3 7 5 8号公報に開示された手法 では同一平面上に独立した電源パターンを形成することが困難だった。 発明の開示 However, according to the methods disclosed in JP-A-5-191503 and JP-A-5-226684, a draw-out pattern cannot be formed at an arbitrary position with respect to the capacitor electrode. There was a limit to high-density wiring. Also, it was difficult to control the thickness of the thin film because a thin film was formed on the circuit pattern. Also, in the method disclosed in Japanese Patent Application Laid-Open No. 2002-252922, if a drawing pattern is to be formed at an arbitrary position, the process becomes complicated, and the economic efficiency is poor. Further, it is difficult to form independent power supply patterns on the same plane by the methods disclosed in Japanese Patent Application Laid-Open Nos. Hei 8-2-13754 and Hei 8-213758. Disclosure of the invention
本発明は、 金属箔の表面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 5 〜2 a mの誘電体薄膜が設けられたことを特徴とするコンデンサ内蔵多層配線 板用材料、 コンデンサ内蔵多層配線板用基板およびコンデンサ内蔵多層配線板 の製造方法に関する。 The present invention provides a multilayer wiring board with a built-in capacitor, wherein a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 am is provided on a surface of a metal foil. The present invention relates to a material for use, a substrate for a multilayer wiring board with a built-in capacitor, and a method for manufacturing a multilayer wiring board with a built-in capacitor.
本発明の実施形態によると、 膜厚が均一で容量のばらつきが小さいコンデン サ内蔵多層配線板を提供することができる。 According to the embodiment of the present invention, it is possible to provide a multilayer wiring board with a built-in capacitor having a uniform thickness and a small variation in capacitance.
A. 本発明は、 以下の実施形態に関する。 A. The present invention relates to the following embodiments.
( 1 ) 金属箔の表面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 5〜 2 mの誘電体薄膜が設けられたことを特徴とするコンデンサ内蔵多層配線板用 材料。 (1) For a multilayer wiring board with a built-in capacitor, wherein a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 m is provided on the surface of a metal foil. material.
( 2 ) 誘電体薄膜がチタン酸バリウム、 チタン酸ストロンチウム、 チタン酸 カルシウム、 チタン酸マグネシウム、 チタン酸鉛、 チタン酸ビスマス、 二酸化 チタン、 ジルコン酸バリウム、 ジルコン酸カルシウム、 ジルコン酸鉛、 チタン 酸バリウムストロンチウム、 チタン酸ジルコン酸鉛、 ニオブ酸マグネシウム酸 鉛一チタン酸鉛のいずれか、あるいはこれらのいずれか 2種以上を含む固溶体、 あるいはこれらのいずれか 2種以上を含む積層体からなる膜であることを特徴 とする (1) のコンデンサ内蔵多層配線板用材料。 (2) The dielectric thin film is made of barium titanate, strontium titanate, titanate Calcium, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, barium strontium titanate, lead zirconate titanate, lead magnesium niobate, lead monotitanate (1) The material for a multilayer wiring board with a built-in capacitor, wherein the material is a film formed of any one of them, a solid solution containing any two or more of these, or a laminate containing any two or more of these.
(3) 金属箔が銅からなり、 かつ誘電体薄膜が形成される面に銅の酸化保護 皮膜となる金属として、 白金、 金、 銀、 パラジウム、 ルテニウム、 イリジウム からなる群から選ばれた 1種以上の金属膜を設けたことを特徴とする (1) お よび (2) のコンデンサ内蔵多層配線板用材料。 (3) A metal selected from the group consisting of platinum, gold, silver, palladium, ruthenium, and iridium, as a metal that is made of copper and that serves as a copper oxidation protective film on the surface on which the dielectric thin film is formed. (1) The material for a multilayer wiring board with a built-in capacitor according to (1) or (2), wherein the metal film is provided.
(4) 金属箔が銅からなり、 力つその表面に安定した自己酸化皮膜を形成す る金属として、 クロム、 モリブデン、 チタン、 ニッケルからなる群から選ばれ た 1種以上の金属膜を設けたことを特徴とする (1) および (2) に記載のコ ンデンサ内蔵多層配線板用材料。 (4) One or more metal films selected from the group consisting of chromium, molybdenum, titanium, and nickel are provided as the metal whose metal foil is made of copper and forms a stable self-oxidizing film on its surface. A material for a multilayer wiring board with a built-in capacitor according to (1) or (2), characterized in that:
(5) 金属箔の表面粗さが 0. 01〜0. 5 mであることを特徴とする(1) (5) The metal foil has a surface roughness of 0.01 to 0.5 m (1)
〜 (4) のコンデンサ内蔵多層配線板用材料。 (4) Materials for multilayer wiring boards with built-in capacitors.
( 6 ) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜を真空蒸着法により形成することを特徴とするコンデンサ内 蔵多層配線板用材料の製造方法。 (6) A material for a multilayer wiring board with a built-in capacitor, characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m is formed on the surface of a metal foil by a vacuum evaporation method. Manufacturing method.
(7) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜をイオンプレーティング法により形成することを特徴とする コンデンサ内蔵多層配線板用材料の製造方法。 (7) A material for a multilayer wiring board with a built-in capacitor, characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is formed on a metal foil surface by an ion plating method. Manufacturing method.
(8) 金属箔の表面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜2 mの誘電体薄膜を C VD (Ch em i c a 1 Va o r De p o s i t i on) 法により形成することを特徴とするコンデンサ内蔵多層配線板用材'料 の.製造方法。 (8) The formation of a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m on the surface of metal foil by CVD (Chemica 1 Va or Deposition) method. Manufacturing method of material for multilayer wiring boards with built-in capacitors.
( 9 ) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 β mの誘電体薄膜をスパッ夕リング法により形成することを特徴とするコンデ ンサ内蔵多層配線板用材料の製造方法。 (9) The dielectric constant is 10 to 2000 and the film thickness is 0.05 to 2 on the surface of the metal foil. A method for producing a material for a multilayer wiring board with a built-in capacitor, comprising forming a βm dielectric thin film by a sputtering method.
(10) 金属箔の表面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜をゾルゲル法により形成することを特徴とするコンデンサ 内蔵多層配線板用材料の製造方法。 (10) Manufacture of materials for multilayer wiring boards with built-in capacitors, characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is formed on the surface of a metal foil by a sol-gel method. Method.
(11) ロール状の金属箔を用い、 かつ温度が一定に管理された加熱炉内を 連続的に金属箔を移動させながら誘電体薄膜を形成することを特徴とする( 6 ) 〜 (10) のコンデンサ内蔵多層配線板材料の製造方法。 (11) The dielectric thin film is formed by using a rolled metal foil and moving the metal foil continuously in a heating furnace whose temperature is controlled to be constant. (6) to (10) Manufacturing method of multilayer wiring board material with built-in capacitor.
(12) 誘電体薄膜がチタン酸バリウム、 チタン酸ストロンチウム、 チタン 酸カルシウム、 チタン酸マグネシウム、 チタン酸鉛、 チタン酸ビスマス、 二酸 化チタン、 ジルコン酸バリウム、 ジルコン酸カルシウム、 ジルコン酸鉛、 チタ ン酸バリウムストロンチウム、 チタン酸ジルコ 酸鉛、 ニオブ酸マグネシウム 酸鉛一チタン酸鉛のいずれか、 あるいはこれらのいずれか 2種以上を含む固溶 体、 あるいはこれらのいずれか 2種以上を含む積層体からなる膜であることを 特徴とする (6) 〜 (11) のコンデンサ内蔵多層配線板用材料の製造方法。 (12) Barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, titanate Any of barium strontium oxide, lead zirconate titanate, lead magnesium niobate and lead monotitanate, or a solid solution containing any two or more of these, or a laminate containing any two or more of these (6) The method for producing a material for a multilayer wiring board with a built-in capacitor according to any one of (6) to (11).
(13) 金属箔が銅からなり、 かつ誘電体薄膜が形成される面に銅の酸化保 護皮膜となる金属として、 白金、 金、 銀、 パラジウム、 ルテニウム、 イリジゥ ムからなる群から選ばれた 1種以上の金属膜を設けたことを特徴とする ( 6 ) 〜 (12) に記載のコンデンサ内蔵多層配線板用材料の製造方法。 (13) The metal foil is made of copper, and is selected from the group consisting of platinum, gold, silver, palladium, ruthenium, and iridium as a metal that forms a copper oxidation protection film on the surface on which the dielectric thin film is formed. The method for producing a material for a multilayer wiring board with a built-in capacitor according to any one of (6) to (12), wherein at least one kind of metal film is provided.
(1 ) 金属箔が銅からなり、 かつその表面に安定した自己酸化皮膜を形成 する金属として、 クロム、 モリブデン、 チタン、 ニッケルからなる群から選ば れた 1種以上の金属膜を設けたことを特徴とする (6) 〜 (12) に記載のコ ンデンサ内蔵多層配線板用材料の製造方法。 (1) The metal foil is made of copper, and at least one metal film selected from the group consisting of chromium, molybdenum, titanium, and nickel is provided as a metal that forms a stable self-oxidizing film on its surface. The method for producing a material for a multilayer wiring board with a built-in capacitor according to any one of (6) to (12).
(15) 金属箔の表面粗さが 0. 01〜0. 5 mであることを特徴とする (6) 〜 (14) 記載のコンデンサ内蔵多層配線板用材料の製造方法。 (15) The method for producing a material for a multilayer wiring board with a built-in capacitor according to (6) to (14), wherein the surface roughness of the metal foil is 0.01 to 0.5 m.
(16 ) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2)誘電体薄膜の表面に 10〜50 mの金属層を形成する工程と、 3) その金属層の任意の部分を残してエッチング除去して所望のコンデンサ電極 1 を形成する工程と、 4) 誘電体薄膜の少なくともコンデンサ電極 1を含む任意 の部分を残してエッチング除去して所望のコンデンサ誘電体を形^する工程と、 5) 誘電体薄膜を除去して現れた金属層の少なくともコンデンサ誘電体を含む 任意の部分を残してエッチング除去して所望のコンデンサ電極 2を含む導体パ ターンを形成する工程を有することを特徴とするコンデンサ内蔵多層配線板の 製造方法。 (16) Use a multilayer wiring board material with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m is provided on the surface of a metal foil. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductor circuit via a pre-predader; 2) a surface of a dielectric thin film. 3) a step of forming a desired capacitor electrode 1 by etching away leaving an arbitrary portion of the metal layer, and 4) at least a capacitor electrode of a dielectric thin film. Etching to form the desired capacitor dielectric, leaving any portion, including 1), and5) removing the dielectric thin film, leaving at least any portion of the exposed metal layer including the capacitor dielectric. Forming a conductor pattern including the desired capacitor electrode 2 by etching and removing the conductor pattern by etching.
(17) 誘電体薄膜の表面に形成する金属層がクロム、モリブデン、チタン、 ニッケルからなる群から選ばれた 1種以上の金属層を少なくとも含むことを特 徴とする (16) のコンデンサ内蔵多層配線板の製造方法。 (17) The multi-layer with a built-in capacitor according to (16), wherein the metal layer formed on the surface of the dielectric thin film includes at least one or more metal layers selected from the group consisting of chromium, molybdenum, titanium, and nickel. Manufacturing method of wiring board.
(18) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 zmの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2) 誘電体薄膜の表面に 0. 1〜 5 の金属層を形成する工程と、 3) コンデンサ電極 1を含む任意の部分を残して金属めつきレジストを形成するェ 程と、 4) 金属めつきにより 10〜50 mのコンデンサ電極 1を形成するェ 程と、 5) 金属めつきレジストを除去する工程と、 6) 誘電体薄膜の表面に形 成した 0. 1〜5 mの金属層をエッチング除去する工程と、 7) 誘電体薄膜 の少なくともコンデンサ電極 1を含む任意の部分を残してエッチング除去して 所望のコンデンサ誘電体を形成する工程と、 8) 誘電体薄膜を除去して現れた 金属層の少なくともコンデンサ誘電体を含む任意の部分を残してエッチ.ング除 去レて所望のコンデンサ電極 2を含む導体パターンを形成する工程を有するこ とを特徴とするコンデンサ内蔵多層配線板の製造方法。 (19) 誘電体薄膜の表面に形成する金属層がクロム、モリブデン、チタン、 ニッケルからなる群から選ばれた少なくとも 1種以上の金属層を含むことを特 徴とする (1.8) 記載のコンデンサ内蔵多層配線板の製造方法。 (18) A multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 zm is provided on the surface of a metal foil A manufacturing method, comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; and 2) 0.1 to 5 3) a step of forming a metal plating resist while leaving any part including the capacitor electrode 1), and 4) forming a 10 to 50 m capacitor electrode 1 by metal plating. 5) removing the metal-plated resist; 6) etching away the 0.1 to 5 m metal layer formed on the surface of the dielectric thin film; and 7) removing at least the dielectric thin film. Etch and remove any part including capacitor electrode 1 to obtain the desired capacitor. 8) a conductor including the desired capacitor electrode 2 by removing the dielectric thin film and removing the dielectric thin film by etching except for at least an arbitrary portion including the capacitor dielectric of the exposed metal layer. A method for producing a multilayer wiring board with a built-in capacitor, comprising a step of forming a pattern. (19) The capacitor according to (1.8), wherein the metal layer formed on the surface of the dielectric thin film includes at least one metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel. A method for manufacturing a multilayer wiring board.
(20) 金属めつきが銅、 銀、 錫、 ニッケル、 亜鉛からなる群から選ばれた 少なくとも 1種以上の金属を含むことを特徴とする (18)、 (19) 記載のコ ンデンサ内蔵多層配線板の製造方法。 (20) The multilayer wiring with a built-in capacitor according to (18) or (19), wherein the metal plating includes at least one metal selected from the group consisting of copper, silver, tin, nickel and zinc. Plate manufacturing method.
(21) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2) 誘電体薄膜の表面の任意の部分に化学的な反応により金属化される 導電性ペース卜を用いて 10〜50 mの金属層を形成して所望のコンデンサ 電極 1を形成する工程と、 3) 誘電体薄膜の少なくともコンデンサ電極 1を含 む任意の部分を残してエッチング除去して所望のコンデンサ誘電体を形成する 工程と、 4) 誘電体薄膜を除去して現れた金属層の少なくともコンデンサ誘電 体を含む任意の部分を残してエッチング除去して所望のコンデンサ電極 2を含 む導体パターンを形成する工程を有することを特徴とするコンデンサ内蔵多層 配線板の製造方法。 (21) A multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m is provided on the surface of a metal foil A manufacturing method, comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader, and 2) chemically coating an arbitrary portion of the surface of the dielectric thin film. Forming a desired capacitor electrode 1 by forming a metal layer of 10 to 50 m using a conductive paste that is metallized by a typical reaction; and3) including at least the capacitor electrode 1 of a dielectric thin film. Forming a desired capacitor dielectric by etching away leaving an arbitrary portion; and4) etching away by removing the dielectric thin film while leaving at least an arbitrary portion including the capacitor dielectric of the exposed metal layer. Desired capacitor electrode 2 Method of manufacturing a capacitor built multilayer wiring board characterized by having a step of forming a including conductor patterns.
(22) 化学的な反応により金属化される導電性ペーストの金属粒子が金、 白金、 銀、 銅、 パラジウム、 ルテニウムからなる群から選ばれた少なくとも Ί 種以上の金属を含み、 かつその平均粒径が 0. 1〜10 nmであることを特徴 とする (21) のコンデンサ内蔵多層配線板の製造方法。 (22) The metal particles of the conductive paste which are metallized by a chemical reaction contain at least 金属 or more metals selected from the group consisting of gold, platinum, silver, copper, palladium and ruthenium, and their average particle size (21) The method for producing a multilayer wiring board with a built-in capacitor according to (21), wherein the diameter is 0.1 to 10 nm.
(23) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0.· 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用 料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2) 誘電体薄膜の任意の部分を残してエッチング除去して所望のコンデ ンサ誘電体を形成する工程と、 3) コンデンサ誘電体を形成した基板表面に 1 0〜50 mの金属層を形成する工程と、 4) その金属層の任意の部分を残し てエッチング除去して所望のコンデンサ電極 1、 コンデンサ電極 2およびコン デンサ電極と電気的に絶縁された任意の導体パターンを形成する工程を有する ことを特徴とするコンデンサ内蔵多層配線板の製造方法。 (23) Multilayer wiring board with built-in capacitors using a material for multi-layer wiring boards with built-in capacitors in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m is provided on the surface of metal foil 1) laminating a metal foil surface of a multilayer wiring board material with a built-in capacitor on a substrate having a conductor circuit via a pre-predder, and 2) leaving an arbitrary portion of a dielectric thin film. Remove the desired condition by etching 3) forming a 10-50 m metal layer on the surface of the substrate on which the capacitor dielectric is formed, and 4) etching away the metal layer while leaving any part of the metal layer. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming an arbitrary conductor pattern electrically insulated from a desired capacitor electrode 1, capacitor electrode 2, and capacitor electrode.
(24) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料の金属箔の 面と導体回路を有する基板とを介して積層するプリプレダにおいて、 任意の箇 所に絶縁材料の貫通穴が設けられ、 かつその貫通穴が熱硬化性樹脂と金属フィ ラーを含む導電性ペーストで充填されていることを特徴とする (16) 〜 (2 3) 記載のコンデンサ内蔵多層配線板の製造方法。 (24) The surface of the metal foil and the conductive circuit, which is a material for a multilayer wiring board with a built-in capacitor, has a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m provided on the surface of the metal foil. In the pre-predger that is laminated with a substrate having a through hole, it is required that through-holes of insulating material are provided at arbitrary locations, and that the through-holes are filled with a conductive paste containing a thermosetting resin and a metal filler. The method for producing a multilayer wiring board with a built-in capacitor according to any one of (16) to (23).
(25) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料の金属箔の 面と導体回路を有する基板とを介して積層するプリプレダにおいて、 任意の箇 所に絶縁材料の貫通穴が設けられ、 かつその貫通穴が化学的な反応により金属 化される導電性ペーストで充填されていることを特徴とする (16) 〜(23) 記載のコンデンサ内蔵多層配線板の製造方法。 (25) The metal foil surface and the conductor circuit of the multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on the surface of the metal foil In a pre-predger that is laminated via a substrate that has a through hole, through holes of insulating material are provided at arbitrary locations, and the through holes are filled with a conductive paste that is metallized by a chemical reaction. (16) The method for producing a multilayer wiring board with a built-in capacitor according to any one of (16) to (23).
(26) . 金属箔の表面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜 2 の誘電体薄膜が設けられた ήンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2)誘電体薄膜の表面に 10〜50 の金属層を形成する工程と、 3) その金属層の任意の部分を残してエッチング除去して所望のコンデンサ電極 1 を形成する工程と、 4) 誘電体薄膜の少なくともコンデンサ電極 1を含む任意 の部分を残してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 5) 誘電体薄膜を除去して現れた金属層の任意の箇所をエッチング除去して硬 化したプリプレダの絶縁層を露出させる工程と、 6) レーザ照射により露出さ れた絶縁層を除去して穴を形成し、 内層となっている導体回路を露出させるェ 程と、 7) その基板表面に 0. 1〜5 mの金属層を形成する工程と、 8) 穴 を含む任意の箇所を除いてめつきレジストを形成する工程と、 9_) めっきレジ ストを形成した箇所以外の基板表面に 10〜50 / mの金属層を形成して層間 の回路パ夕一ンを電気的に接続させる工程と、 10) 基板表面に形成した 0. 1〜5 mの金属層をエッチング除去する工程と、 11) 少なくともコンデン サ誘電体と導体化された穴を含む任意の部分を残してエッチング除去して所望 のコンデンサ電極 2を含む導体パターンを形成する工程を有することを特徴と するコンデンサ内蔵多層配線板の製造方法。 (26). Multilayer wiring board with a built-in capacitor using a material for a multi-layer wiring board with a built-in capacitor, provided with a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 on the surface of the metal foil 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predder, and 2) forming a 10-50 layer on a surface of a dielectric thin film. A step of forming a metal layer; 3) a step of forming a desired capacitor electrode 1 by etching and removing any part of the metal layer; and 4) an arbitrary part of the dielectric thin film including at least the capacitor electrode 1. 5) forming a desired capacitor dielectric by etching away while leaving a thin film, and 5) removing any part of the metal layer appearing by removing the dielectric thin film to expose the hardened insulating layer of the pre-preda. 6) Exposed by laser irradiation Removing the removed insulating layer to form a hole and exposing the inner conductor circuit; 7) forming a 0.1 to 5 m metal layer on the substrate surface; and8) 9_) A process of forming a plating resist excluding any part including holes, and 9_) Forming a metal layer of 10 to 50 / m on the substrate surface other than the part where the plating resist was formed, 10) etching away the 0.1 to 5 m metal layer formed on the substrate surface; and11) any process including at least a capacitor dielectric and a hole made conductive. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a conductor pattern including a desired capacitor electrode 2 by etching and removing a portion thereof.
(27) 誘電体薄膜の表面に形成する金属層がクロム、モリブデン、チタン、 二ッゲルからなる群から選ばれた 1種以上の金属層を少なくとも含むことを特 徴とする (26) のコンデンサ内蔵多層配線板の製造方法。 (27) The capacitor according to (26), wherein the metal layer formed on the surface of the dielectric thin film includes at least one or more metal layers selected from the group consisting of chromium, molybdenum, titanium, and Nigel. A method for manufacturing a multilayer wiring board.
(28) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2)誘電体薄膜の表面に 0. 1〜 5 mの金属層を形成する工程と、 3) コンデンサ電極 1を含む任意の部分を残して金属めつきレジストを形成するェ 程と、 4) 金属めつきにより 10〜50 /mのコンデンサ電極 1を形成するェ 程と、 5) 金属めつきレジストを除去する工程と、 6) 誘電体薄膜の表面に形 成した 0. 1〜5 mの金属層をエッチング除去する工程と、 7) 誘電体薄膜 の少なくともコンデンサ電極 1を含む任意の部分を残してエッチング除去して 所望のコンデンサ誘電体を形成する工程と、 8) 誘電体薄膜を除去して現れた 金属層の任意の箇所をエツチング除去して硬化したプリプレグの絶縁層を露出 · させる工程と、 9)レーザ照射により露出された絶縁層を除去して穴を形成し、 · 内.層となっている導体回路を露出させる工程と、 10) その基板表面に 0. 1 〜 5 mの金属層を形成する工程と、 1 1) 穴を含む任意の箇所を除いてめつ きレジス卜を形成する工程と、 12) めっきレジストを形成した箇所以外の基 板表面に 10〜50 / mの金属層を形成して層間の回路パターンを電気的に接 続させる工程と'、 13) 基板表面に形成した 0. 1〜5 mの金属層をエッチ ング除去する工程と、 14) 少なくともコンデンサ誘電体と導体化された穴を 含む任意の部分を残してエッチング除去して所望のコンデンサ電極 2を含む導 体パターンを形成する工程を有することを特徴とするコンデンサ内蔵多層配線 板の製造方法。 (28) A multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor that has a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m on the surface of a metal foil A manufacturing method, comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; and 2) 0.1 to 5 on a surface of a dielectric thin film. m) forming a metal layer, 3) forming a metal-plated resist while leaving any part including the capacitor electrode 1, and 4) forming a 10-50 / m capacitor electrode 1 by metal-plated. 5) a step of removing the metal-plated resist; 6) a step of etching away a 0.1 to 5 m metal layer formed on the surface of the dielectric thin film; and 7) a dielectric thin film. To remove a desired part including at least a part including the capacitor electrode 1 by etching. 8) A step of exposing the cured insulating layer of the prepreg by removing any part of the metal layer that has appeared by removing the dielectric thin film, and 9) Exposing by laser irradiation. Forming a hole by removing the insulating layer, and exposing a conductive circuit which is a layer; 10) forming a 0.1 to 5 m metal layer on the substrate surface; 1 1) Except for any part including holes 12) forming a metal layer of 10 to 50 / m on the surface of the substrate other than where the plating resist is formed, and electrically connecting the circuit patterns between the layers. 13) Etching and removing the 0.1 to 5 m metal layer formed on the substrate surface; and14) Etching and removing the desired portion by leaving at least an arbitrary portion including at least the capacitor dielectric and conductive holes. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a conductor pattern including a capacitor electrode 2.
(29) 誘電体薄膜の表面に形成する金属層がクロム、モリブデン、チタン、 二ッケルからなる群から選ばれた少なくとも 1種以上の金属層を含むことを特 徴とする (28) のコンデンサ内蔵多層配線板の製造方法。 (29) The capacitor according to (28), wherein the metal layer formed on the surface of the dielectric thin film includes at least one metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel. A method for manufacturing a multilayer wiring board.
(30) 金属めつきが銅、 銀、 錫、 ニッケル、 亜鉛からなる群から選ばれた 少なくとも 1種以上の金属を含むことを特徴とする (28)、 (29) 記載のコ ンデンサ内蔵多層配線板の製造方法。 (30) The multilayer wiring with a built-in capacitor according to (28) or (29), wherein the metal plating includes at least one metal selected from the group consisting of copper, silver, tin, nickel and zinc. Plate manufacturing method.
(31) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 の誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2) 誘電体薄膜の表面の任意の部分に化学的な反応により金属化される 導電性ペーストを用いて 10〜50 mの金属層を形成して所望のコンデンサ 電極 1を形成する工程と、 3) 誘電体薄膜の少なくともコンデンサ電極 1を含 む任意の部分を残してエッチング除去して所望のコンデンサ誘電体を形成する 工程と、 4) 誘電体薄膜を除去して現れた金属層の任意の箇所をエッチング除 去して硬化したプリプレダの絶縁層を露出させる工程と、 5) レーザ照射によ り露出された絶縁層を除去して穴を形成し、 内層となっている導体回路を露出 させる工程と、 6)その基板表面に 0. 1〜5 imの金属層を形成する工程と、 7) 穴を含む任意の箇所を除いてめつきレジストを形成する工程と、 8) めつ きレジストを形成した箇所以外の基板表面に 10〜5 O^mの金属層を形成し て層間の回路パターンを電気的に接続させる工程と、 9) 基板表面に形成した 0. 1〜 5 mの金属層をエッチング除去する工程と、 10) 少なくともコン デンサ誘電体と導体化された穴を含む任意の部分を残してエッチング除去して 所望のコンデンサ電極 2を含む導体パターンを形成する工程を有することを特 徵とするコンデンサ内蔵多層配線板の製造方法。 (31) Manufacture of multilayer board with built-in capacitor using material for multilayer board with built-in capacitor in which dielectric thin film with relative dielectric constant of 10 to 2000 and thickness of 0.05 to 2 is provided on the surface of metal foil A method of laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader, and 2) a method of chemically coating an arbitrary part of the surface of a dielectric thin film. Forming a desired capacitor electrode 1 by forming a metal layer of 10 to 50 m using a conductive paste which is metallized by an appropriate reaction; 3) any dielectric layer including at least the capacitor electrode 1 of a dielectric thin film 4) removing the dielectric thin film to remove the dielectric thin film and etching away any exposed portions of the metal layer to expose the cured insulating layer of the pre-preda. 5) Laser irradiation Removing the more exposed insulating layer to form a hole to expose the inner conductor circuit; 6) forming a 0.1 to 5 im metal layer on the substrate surface; 7) A step of forming a plating resist except for an arbitrary portion including a hole; and 8) A 10-5 O ^ m metal layer is formed on the substrate surface other than the portion where the resist is formed. 9) a step of electrically removing the 0.1 to 5 m metal layer formed on the surface of the substrate by etching, and 10) a hole made of at least a capacitor dielectric and a conductor. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a conductor pattern including a desired capacitor electrode 2 by etching and removing an arbitrary portion including the same.
(32) 化学的な反応により金属化される導電性ペーストの金属粒子が金、 白金、 銀、 銅、 パラジウム、 ルテニウムからなる群から選ばれた少なくとも 1 種以上の金属を含み、 かつその平均粒径が 0. 1〜1 Onmであることを特徴 とする (31) のコンデンサ内蔵多層配線板の製造方法。 ' (32) The metal particles of the conductive paste that are metallized by a chemical reaction contain at least one metal selected from the group consisting of gold, platinum, silver, copper, palladium, and ruthenium, and have an average particle size of the metal particles. (31) The method for producing a multilayer wiring board with built-in capacitors according to (31), wherein the diameter is 0.1 to 1 Onm. '
(33) 金属箔の表面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜 2 zmの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔の面にプリプレダを介して導体回路を有する基板に積層するェ 程と、 2) 誘電体薄膜任意の部分を残してエッチング除去して所望のコンデン サ誘電体を形成する工程と、 3) 誘電体薄膜を除去して現れた金属層の任意の 箇所をエッチング除去して硬化したプリプレダの絶縁層を露出させる工程と、 4) レーザ照射により露出された絶縁層を除去して穴を形成し、 内層となって いる導体回路を露出させる工程と、 5) コンデンサ誘電体を形成した基板表面 と穴内の表面に 10〜 50 mの金属層を形成する工程と、 6) 少なくともコ ンデンサ誘電体と導体化された穴を含む任意の部分を残してエッチング除去し て所望のコンデンサ電極 2を含む導体パターンを形成する工程を有することを 特徴とするコンデンサ内蔵多層配線板の製造方法。 (33) A multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 zm is provided on the surface of a metal foil A manufacturing method, comprising: 1) laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predeer, and 2) etching away leaving any part of the dielectric thin film. Forming a desired capacitor dielectric, 3) removing the dielectric thin film and etching away any part of the metal layer that has appeared, thereby exposing the cured insulating layer of the pre-predator, 4). Removing the insulating layer exposed by the laser irradiation to form a hole and exposing the inner conductor circuit; and5) forming a hole of 10 to 50 m on the surface of the substrate on which the capacitor dielectric is formed and the surface of the hole. Forming a metal layer, 6) at least A method of manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a conductor pattern including a desired capacitor electrode 2 by etching and removing an arbitrary portion including a capacitor dielectric and a hole formed as a conductor. .
(34) 金属箔の表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料の金属箔の 面にプリプレダを介して積層する導体回路を有する基板において、 基板の導体 層が 2層以上あり、 かつその隣接する導体層の回路パターンが任意の箇所で導 体化された穴により接続された基板であることを特徴とする (16) 〜(33) 記載のコンデンサ内蔵多層配線板の製造方法。 (34) Via a pre-preparer, a metal foil surface of a multilayer wiring board material with a built-in capacitor, in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on the surface of the metal foil. The circuit board is characterized in that there are two or more conductor layers on the board, and the circuit pattern of the adjacent conductor layer is connected at any location by holes made into conductors. (16)-(33) A method for producing the multilayer wiring board with a built-in capacitor according to the above.
(35) 誘電体薄膜をエッチング除去する方法がイオンビームエッチング法、 R I E (Re a c t i ve I on E t c h i ng) 法または溶液エツチン グ法のいずれかであることを特徴とする (16) 〜 (34) 記載のコンデンサ 内蔵多層配線板の製造方法。 (35) The method of etching and removing the dielectric thin film is characterized in that it is any one of an ion beam etching method, an RIE (Reactive Ion Etching) method, and a solution etching method. (16) to (34) ) The method for manufacturing a multilayer wiring board with a built-in capacitor as described in the above.
(36) コンデンサ電極 2が多層配線板のグランド層または電濾層であるこ とを特徴とする (16) 〜 (35) 記載のコンデンサ内蔵多層配線板の製造方 法。 (36) The method for producing a multilayer wiring board with a built-in capacitor according to any one of (16) to (35), wherein the capacitor electrode 2 is a ground layer or an electrofiltration layer of the multilayer wiring board.
(37) 基板の絶縁材料が樹脂とガラス織^ Tまたはガラス不織布からなるこ とを特徴とする (16) 〜 (36) 記載のコンデンサ内蔵多層配線板の製造方 法。 . (37) The method for producing a multilayer wiring board with a built-in capacitor according to any one of (16) to (36), wherein the insulating material of the substrate comprises a resin and glass woven T or glass non-woven fabric. .
(38) 基板の絶縁材料に用いられている樹脂が熱硬化性樹脂であり、 その ガラス転移点温度が 170°C以上であることを特徴とする (16) 〜 (37) 記載のコンデンサ内蔵多層配線板の製造方法。 (38) The multi-layer capacitor with a built-in capacitor according to (16) to (37), wherein the resin used as the insulating material of the substrate is a thermosetting resin, and has a glass transition temperature of 170 ° C. or higher. Manufacturing method of wiring board.
B. さらに、 本発明は、 以下の実施形態に関する。 B. Further, the present invention relates to the following embodiments.
(1) 基板内部に導体層間を接続するバイァホールを有し, かつ、 表面に平滑 な金属層を有する基板の表面に比誘電率が 10〜2000で、かつ、膜厚が 0. 05〜2 mの誘電体薄膜を形成したことを特徴とするコンデンサ内蔵多層配 線板用基板。 (1) The substrate has a via hole that connects the conductive layers inside the substrate and has a smooth metal layer on the surface. The surface of the substrate has a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m. A substrate for a multilayer wiring board with a built-in capacitor, characterized in that a dielectric thin film is formed.
(2) 基板内部に導体層間を接続するバイァホールが金属めつきにより電気 的に接続されていることを特徴とする (1) のコンデンサ内蔵多層配線板用基 板。 (2) The substrate for a multilayer wiring board with a built-in capacitor according to (1), wherein via holes for connecting the conductor layers are electrically connected to the inside of the substrate by metal plating.
( 3 ) 基板内部に導体層間を接続するバイァホールが金属粉と樹脂とからな る導電性べ一ストにより電気的に接続されていることを特徴とする (1) のコ ンデンサ内蔵多層配線板用基板。 (3) For a multilayer wiring board with a built-in capacitor according to (1), wherein via holes for connecting conductive layers inside the substrate are electrically connected by a conductive paste made of metal powder and resin. substrate.
(4) 基板内部に導体層間を接続するバイァホールが化学的な反応により金 属化される導電性ペーストにより電気的に接続されていることを特徴とする (1) または (3) のコンデンサ内蔵多層配線板用基板。 (4) The via holes connecting the conductor layers inside the substrate are electrically connected by a conductive paste which is metallized by a chemical reaction. Substrate for multilayer wiring board with built-in capacitor of (1) or (3).
(5) 誘電体薄膜がチタン酸バリウム、 チタン酸ストロンチウム、 チタン酸 カルシウム、 チタン酸マグネシウム、 チタン酸鉛、 チタン酸ビスマス、 二酸化 チタン、 ジルコン酸バリウム、 ジルコン酸カルシウム、 ジルコン酸鉛のいずれ か、 あるいはこれらのいずれかを含む 2種以上の固溶体、 あるいはこれらのい ずれかを含む 2種以上の積層体からなる膜であることを特徴とする (1) ない し (4) のいずれかに記載のコンデンサ内蔵多層配線板用基板。 (5) The dielectric thin film is any of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, or The film according to any one of (1) to (4), characterized in that the film is a film composed of two or more solid solutions containing any of these, or a laminate of two or more containing any of these. Substrate for multilayer wiring board with built-in capacitor.
(6) 誘電体薄膜の形成方法が真空蒸着法、 イオンプレーティング法、 CV D (Chemical Vapor Deposition) 法、 スパッタリング法、 ゾルゲル法のいずれ かであることを特徴とする (1) ないし (5) のいずれかに記載のコンデンサ 内蔵多層配線板用基板。 (6) The method of forming a dielectric thin film is any one of a vacuum deposition method, an ion plating method, a CVD (Chemical Vapor Deposition) method, a sputtering method, and a sol-gel method (1) to (5). A substrate for a multilayer wiring board with a built-in capacitor according to any one of the above.
(7) 誘電体薄膜の形成時の基板温度が 25° (〜 350°Cであることを特徴 とする (1) ないし (6) のいずれかに記載のコンデンサ内蔵多層配線板用基 板。 (7) The substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (6), wherein the substrate temperature at the time of forming the dielectric thin film is 25 ° C. (to 350 ° C.).
(8) 基板の絶縁材料が樹脂とガラス織布またはガラス不織布からなること を特徴とする (1) ないし (7) のいずれかに記載のコンデンサ内蔵多層配線 板用基板。 (8) The substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (7), wherein the insulating material of the substrate comprises a resin and a glass woven fabric or a glass nonwoven fabric.
(9) 基板の絶縁材料に用いられている樹脂が熱硬化性樹脂であり, そのガ ラス転移点温度が 170°C以上であることを特徴とする (1) ないし (8) の いずれかに記載のコンデンサ内蔵多層配線板用基板。 (9) The resin used for the insulating material of the substrate is a thermosetting resin, and its glass transition point temperature is 170 ° C or higher. A substrate for a multilayer wiring board with a built-in capacitor as described in the above.
(10) 基板表面の金属層が銅からなり, かつその表面に銅の酸化保護皮膜 となる金属として、 白金、 金、 銀、 パラジウム、 ルテニウム、 イリジウムから なる群から選ばれた 1種以上の金属膜を設けることを特徴とする (1) ないし (10) One or more metals selected from the group consisting of platinum, gold, silver, palladium, ruthenium, and iridium, as the metal on the surface of the substrate being made of copper and being a copper oxide protective film on the surface. Characterized by providing a film (1) or
( 9 ) のいずれかに記載のコンデンサ内蔵多層配線板用基板。 The substrate for a multilayer wiring board with a built-in capacitor according to any one of (9) to (9).
(1 1) 基板表面の金属層が銅からなり, かつその表面に安定した自己酸化 皮 を形成する金属として、 クロム、 モリブデン、 チタン、 ニッケルからなる 群から選ばれた少なくとも 1種以上の金属膜を設けることを特徴とする ( 1 ) ないし (9) のいずれかに記載のコンデンサ内蔵多層配線板用基板。 (11) At least one metal film selected from the group consisting of chromium, molybdenum, titanium, and nickel as a metal whose surface metal layer is made of copper and forms a stable self-oxidizing skin on its surface. (1) A substrate for a multilayer wiring board with a built-in capacitor according to any one of (9) to (9).
(12) 基板表面の金属層の表面粗さが 0. 01〜0. 5 mであることを 特徴とする (1) ないし (11) のいずれかに記載のコンデンサ内蔵多層配線 板用基板。 (12) The substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (11), wherein the surface roughness of the metal layer on the surface of the substrate is 0.01 to 0.5 m.
(13) (1) ないし (12) のいずれかに記載のコンデンサ内蔵多層配線 板用基板を内層板として用いるコンデンサ内蔵多層配線板の製造方法であって、 1) 誘電体薄膜の表面に 10〜 5 O ^mの金属層を形成する工程と、 2) その 金属層の任意の部分を残してエッチング除去して所望の第 1のコンデンサ電極 を形成する工程と、 3) 誘電体薄膜の少なくとも第 1のコンデンサ電極を含む 任意の部分を残してエッチング除去して所望のコンデンサ誘電体を形成するェ 程と、 4) 誘電体薄膜を除去して現れた金属層の少なくともコンデンサ誘電体 を含む任意の部分を残してエッチング除去して所望の第 2のコンデンサ電極を 含む導体パターンを形成する工程を有することを特徴とするコンデンサ内蔵多 層配線板の製造方法。 (13) A method for producing a multilayer wiring board with a built-in capacitor using the substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (12) as an inner layer board, wherein: Forming a 5 O ^ m metal layer; 2) forming a desired first capacitor electrode by etching away leaving an arbitrary portion of the metal layer; and 3) forming at least a layer of the dielectric thin film. (1) a step of forming a desired capacitor dielectric by etching away leaving an arbitrary portion including the capacitor electrode of (1); and4) an optional metal layer including at least the capacitor dielectric of a metal layer that appears after removing the dielectric thin film. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a conductor pattern including a desired second capacitor electrode by etching and removing a part of the multilayer wiring board.
(14) 誘電体薄膜の表面に形成する金属層がクロム、モリブデン、チタン、 ニッケルからなる群から選ばれた少なくとも 1種以上の金属層を含むことを特 徴とする (13) のコンデンサ内蔵多層配線板の製造方法。 (14) The multi-layer with built-in capacitor according to (13), wherein the metal layer formed on the surface of the dielectric thin film includes at least one metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel. Manufacturing method of wiring board.
(15) (1) ないし (12) のいずれかに記載のコンデンサ内蔵多層配線 板用基板を内層板として用いるコンデンサ内蔵多層配線板の製造方法であって、 1) 誘電体薄膜の表面に 0. 1〜5 の金属層を形成する工程と、 2) 第 1 のコンデンサ電極を含む任意の部分を残して金属めつきレジストを形成するェ 程と、 3) 金属めつきにより 10〜 50 の第 1のコンデンサ電極を形成す る工程と、 4) 金属めつきレジストを除去する工程と、 5) 誘電体薄膜の表面 に形成した 0. 1〜5 mの金属層をエッチング除去する工程と、 6) 誘電体 薄膜の少なくとも第 1のコンデンサ電極を含む任意の部分を残してエッチング 去して所望のコンデンサ誘電体を形成する工程と、 7) 誘電体薄膜を除去し て現れた金属層の少なくともコンデンサ誘電体を含む任意の部分を残してエツ チング除去して所望の第 2のコンデンサ電極を含む導体パターンを形成するェ 程を有することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (15) A method for producing a multilayer wiring board with a built-in capacitor, wherein the substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (12) is used as an inner layer board. 1) forming a metal layer of 1 to 5; 2) forming a metal plating resist while leaving an arbitrary portion including the first capacitor electrode; and 3) forming a metal plating resist of 10 to 50 by metal plating. 4) a step of removing the metal-plated resist; 5) a step of etching away a 0.1 to 5 m metal layer formed on the surface of the dielectric thin film; 6) Forming a desired capacitor dielectric by etching away any portion of the dielectric thin film, including at least the first capacitor electrode; and7) removing at least the capacitor dielectric of the metal layer that has emerged by removing the dielectric thin film. Etsu leaving any part including the body A method for producing a multilayer wiring board with a built-in capacitor, comprising a step of forming a conductor pattern including a desired second capacitor electrode by removing a chip.
(16) 誘電体薄膜の表面に形成する金属層がクロム、モリブデン、チタン、 二ッケルからなる群から選ばれた少なくとも 1種以上の金属層を含むことを特 徴とする (15) のコンデンサ内蔵多層配線板の製造方法。 (16) The built-in capacitor of (15), wherein the metal layer formed on the surface of the dielectric thin film includes at least one metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel. A method for manufacturing a multilayer wiring board.
(17) 金属めつきが銅、 銀、 錫、 ニッケル、 亜鉛からなる群がら選ばれた 少なくとも 1種以上の金属を含むことを特徴とする (15) または (16) に 記載のコンデンサ内蔵多層配線板の製造方法。 (17) The multilayer wiring board with a built-in capacitor according to (15) or (16), wherein the metal plating contains at least one metal selected from the group consisting of copper, silver, tin, nickel and zinc. Manufacturing method.
(18) (1) ないし (12) のいずれかに記載のコンデンサ内蔵多層配線 板用基板を内層板として用いるコンデンサ内蔵多層配線板の製造方法であって、 (18) A method for producing a multilayer wiring board with a built-in capacitor using the substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (12) as an inner layer board,
1) 誘電体薄膜の表面の任意の部分に化学的な反応により金属化される導電性 ペ一ストを用いて 10〜50 1のコンデンサ 電極を形成する工程と、 2) 誘電体薄膜の少なくとも第 1のコンデンサ電極を 含む任意の部分を残してエッチング除去して所望のコンデンサ誘電体を形成す る工程と、 3) 誘電体薄膜を除去して現れた金属層の少なくともコンデンサ誘 電体を含む任意の部分を残してエッチング除去して所望の第 2のコンデンサ電 極を含む導体パターンを形成する工程を有することを特徴とするコンデンサ内 蔵多層配線板の製造方法。 1) Use a conductive paste that is metallized on any part of the surface of the dielectric thin film by a chemical reaction. (1) a step of forming a capacitor electrode; (2) a step of forming a desired capacitor dielectric by etching and removing at least an arbitrary portion of the dielectric thin film including at least the first capacitor electrode; and (3) a dielectric. Forming a conductor pattern including a desired second capacitor electrode by removing the thin film by etching while leaving at least an arbitrary portion including the capacitor dielectric of the metal layer appearing. Manufacturing method of multilayer wiring board with built-in capacitor.
(19) 化学的な反応により金属化される導電性ペーストの金属粒子が金, 白金, 銀, 銅, パラジウム、 ルテニウムからなる群から選ばれた少なくとも 1 種以上の金属を含み、 かつ、 その平均粒径が 0. 1〜10 nmであることを特 徴とする (18) のコンデンサ内蔵多層配線板の製造方法。 (19) The metal particles of the conductive paste that are metallized by a chemical reaction include at least one metal selected from the group consisting of gold, platinum, silver, copper, palladium, and ruthenium, and (18) The method for manufacturing a multilayer wiring board with a built-in capacitor, wherein the particle size is 0.1 to 10 nm.
(20) (1) ないし (12) のいずれかに記載のコデンサ内蔵多層配線板 用基板を内層板として用いるコンデンサ内蔵多層配線板の製造方法であって、 1) 誘電体薄膜の任意の部分を残してエッチング除去して所望のコンデンサ誘 電 f本を形成する工程と、 2) コンデンサ誘電体を形成した基板表面に 10〜 5 0 mの金属層を形成する工程と、 3) その金属層の任意の部分を残してエツ チング除去して所望の第 1のコンデンサ電極、 第 2のコンデンサ電極およびコ ンデンサ電極と電気的に絶縁された任意の導体パターンを形成する工程を有す ることを特徴とするコンデンサ内蔵多層配線板の製造方法。 (20) A method of manufacturing a multilayer wiring board with a built-in capacitor using the substrate for a multilayer wiring board with a built-in capacitor according to any one of (1) to (12) as an inner layer board, comprising the steps of: Forming a desired capacitor dielectric by removing and etching the remaining capacitor; 2) forming a 10 to 50 m metal layer on the surface of the substrate on which the capacitor dielectric is formed; and 3) forming the metal layer. Etsu leaving any part A multi-layer wiring board with a built-in capacitor, comprising a step of forming an arbitrary conductor pattern electrically insulated from a desired first capacitor electrode, second capacitor electrode, and capacitor electrode by removing a ring. Manufacturing method.
(21) 誘電体薄膜をエッチング除去する方法がイオンビームエッチング法、 R I E (Re a c t i v e I on E t c h i n g) 法または溶液エツチン グ法のいずれかであることを特徴とする (13) ないし (20) いずれかに記 載のコンデンサ内蔵多層配線板の製造方法。 (21) The method for etching and removing a dielectric thin film is any one of an ion beam etching method, an RIE (Reactive Ion Etching) method, and a solution etching method. (13) to (20) The method for manufacturing a multilayer wiring board with a built-in capacitor described in Crab.
(22) 第 2のコンデンサ電極が多層配線板のグランド層または電源層であ ることを特徴とする (13) ないし (21) のいずれかに記載のコンデンサ内 蔵多層配線板の製造方法。 (22) The method for manufacturing a multilayer wiring board with a built-in capacitor according to any one of (13) to (21), wherein the second capacitor electrode is a ground layer or a power supply layer of the multilayer wiring board.
(23) 複数の絶縁層と複数の導体層と前記導体層を電気的に接続する導体 化されたバイァホールを有する多層配線板であり、 かつ、 少なくとも 1層の絶 縁層の比誘電率が 20〜 2000、 かつ、 膜厚が 0. 1〜 1 mの誘電体薄膜 であり、 その絶縁層に対向した電極を備えたコンデンサ内蔵多層配線板であつ て、 1) 第 1のコンデンサ電極を形成する導体層のパターンは全てコンデンサ の電極を形成し、 2) 誘電体薄膜の投影面は第 1のコンデンサ電極の投影面を 含み、 3) 第 2のコンデンサ電極を形成する導体層には第 2のコンデンサ電極 とこの電極と電気的に絶縁された少なくとも 1つのパターンを有することを特 徴とするコンデンサ内蔵多層配線板。 (23) A multilayer wiring board having a plurality of insulating layers, a plurality of conductive layers, and conductive via holes electrically connecting the conductive layers, and a dielectric constant of at least one insulating layer of 20 or more. A dielectric thin film with a thickness of 0.1 to 1 m and a thickness of 0.1 to 1 m, which is a multilayer wiring board with built-in capacitors having electrodes facing the insulating layer.1) Form the first capacitor electrode The pattern of the conductor layer forms all the electrodes of the capacitor, 2) the projection surface of the dielectric thin film includes the projection surface of the first capacitor electrode, and 3) the second layer is formed on the conductor layer forming the second capacitor electrode. A multilayer wiring board with a built-in capacitor, characterized by having a capacitor electrode and at least one pattern electrically insulated from the electrode.
(24) 複数の絶縁層と複数の導体層と前記導体層を電気的に接続する導体 化されたバイァホールを有する多層配線板であり、 かつ、 少なくとも 1層の絶 縁層の比誘電率が 20〜 2000、 かつ、 膜厚が 0. 1〜 1 mの誘電体薄膜 であり、 その絶縁層に対向した電極を備えたコンデンサ内蔵多層配線板であつ て、 1) コンデンサの誘電体を形成する誘電体薄膜の投影面に含まれる第 1の コンデンサ電極を有し、 2) 誘電体薄膜の端部は全て第 1のコンデンサ電極を 形成する導体層が第 2のコンデンサ電極に電気的に接続されたことを特徴とす るコンデンサ内蔵多層配線板。 (25) 第 2のコンデンサ電極が多層配線板のグランド層または電源層であ ることを特徴とする (23) または (24) に記載のコンデンサ内蔵多層配線 板。 (24) A multilayer wiring board having a plurality of insulating layers, a plurality of conductive layers, and conductive via holes electrically connecting the conductive layers, and having a dielectric constant of at least one insulating layer of 20 or more. This is a dielectric thin film with a thickness of 0.1 to 1 m and a thickness of 0.1 to 1 m.It is a multilayer wiring board with a built-in capacitor that has electrodes facing the insulating layer. A first capacitor electrode included in the projection surface of the body thin film, and 2) a conductor layer forming the first capacitor electrode is electrically connected to the second capacitor electrode at all ends of the dielectric thin film. A multilayer wiring board with a built-in capacitor. (25) The multilayer wiring board with a built-in capacitor according to (23) or (24), wherein the second capacitor electrode is a ground layer or a power supply layer of the multilayer wiring board.
(26) 誘電体薄膜がチタン酸バリウム、 チタン酸ストロンチウム、 チタン 酸カルシウム、 チタン酸マグネシウム、 チタン酸鉛、 チタン酸ビスマス、 二酸 化チタン、 ジルコン酸バリウム、 ジルコン酸カルシウム、 ジルコン酸鉛のいず れか、 あるいはこれらのいずれかを含む 2種以上の固溶体、 あるいはこれらの いずれかを含む 2種以上の積層体からなる膜であることを特徴とする (23) ないし (25) のいずれかに記載のコンデンサ内蔵多層配線板。 (26) The dielectric thin film is made of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, or lead zirconate. Or a film comprising two or more solid solutions containing any of these, or a laminate consisting of two or more solid solutions containing any of them. (23) to (25) A multilayer wiring board with a built-in capacitor according to the description.
(27) 基板の絶縁材料が樹脂とガラス織布またはガラス不織布からなるこ とを特徴とする (23) ないし (26) のいずれかに記載のコンデンサ内蔵多 層配線板。 (27) The multilayer wiring board with a built-in capacitor according to any one of (23) to (26), wherein the insulating material of the substrate is made of resin and glass woven fabric or glass nonwoven fabric.
(28) 基板の絶縁材料に用いられている樹脂が熱硬化性樹脂であり, その ガラス転移点温度が 1 70°C以上であることを特徴とする (23) ないし (2 7) のいずれかに記載のコンデンサ内蔵多層配線板。 (28) Any of (23) to (27), characterized in that the resin used as the insulating material of the substrate is a thermosetting resin and has a glass transition temperature of 170 ° C or more. 2. The multilayer wiring board with a built-in capacitor according to the item 1.
(29) 第 2のコンデンサ電極が銅からなり, かつ、その表面に、 白金、金、 銀、 パラジウム、 ルテニウム、 イリジウム、 クロム、 モリブデン、 チタン、 二 ッケルからなる群から選ばれた少なくとも 1種以上の金属層を含むことを特徴 とする (23) ないし (28) いずれかに記載のコンデンサ内蔵多層配線板。 (30) 第 2のコンデンサ電極の表面粗さが 0. 0 1〜0. 5 mであるこ とを特徴とする (23) ないし (29) のいずれかに記載のコンデンサ内蔵多 層配線板。 (29) The second capacitor electrode is made of copper, and has on its surface at least one kind selected from the group consisting of platinum, gold, silver, palladium, ruthenium, iridium, chromium, molybdenum, titanium, and nickel. (22) The multilayer wiring board with a built-in capacitor according to any one of (23) to (28). (30) The multilayer wiring board with a built-in capacitor according to any one of (23) to (29), wherein the surface roughness of the second capacitor electrode is 0.01 to 0.5 m.
(3 1) 第 1のコンデンサ電極が銅、 銀、 錫、 ニッケル、 亜鉛、 クロム、 モ リブデン、 チタン、 ニッケルからなる群から選ばれた少なくとも 1種以上の金 属層を含むことを特徴とする (23) ないし (30) のいずれかに記載のコン デ.ンサ内蔵多層配線板。 (3 1) The first capacitor electrode includes at least one metal layer selected from the group consisting of copper, silver, tin, nickel, zinc, chromium, molybdenum, titanium, and nickel. (23) The multilayer wiring board with a built-in capacitor according to any one of (30) to (30).
(32) 第 1のコンデンサ電極が化学的な反応により金属化された導電性べ 一ストからなり、 その金属が白金, 金, 銀, 銅, 錫, パラジウム、 ルテニウム からなる群から選ばれた少なくとも 1 種以上の金属を含むことを特徴とする (23) ないし (30) のいずれかに記載のコンデンサ内蔵多層配線板。 (33) (23) ないし (32) のいずれかに記載のコンデンサ内蔵多層配 線板に半導体チップを搭載させたことを特徴とする半導体装置。 (32) The conductive capacitor whose first capacitor electrode is metallized by a chemical reaction (23) to (30), wherein the metal comprises at least one metal selected from the group consisting of platinum, gold, silver, copper, tin, palladium, and ruthenium. A multilayer wiring board with a built-in capacitor according to the item (1). (33) A semiconductor device having a semiconductor chip mounted on the multilayer wiring board with a built-in capacitor according to any of (23) to (32).
C. さらに、 本発明は次の実施形態に関する。 C. Further, the present invention relates to the following embodiments.
( 1 ) 金属箔の片面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 imの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を、 金属箔が 絶縁材料と接するように絶縁材料の少なくとも片面に設けた基板を用いるコン デンサ内蔵多層配線板の製造方法であって、 1) 基板表面の誘電体薄膜上の所 定の位置にコンデンサ電極となる金属層を形成する工程と、 2) 少なくとも基 板表面の前記金属層上にエッチングレジストを形成する工程と、 3) キレート 剤と過酸化水素を含むエツチャントによって、 誘電体薄膜をゥエツトエツチン グする工程と、 4) ウエットエッチング後にエッチングレジストを除去するェ 程とを有することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (1) The metal foil comes in contact with the insulating material on a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 im is provided on one side of the metal foil. Is a method for manufacturing a multilayer wiring board with a built-in capacitor using a substrate provided on at least one side of an insulating material as described above.1) Forming a metal layer to be a capacitor electrode at a predetermined position on a dielectric thin film on the surface of the substrate 2) a step of forming an etching resist on at least the metal layer on the substrate surface; 3) a step of wet-etching the dielectric thin film with an etchant containing a chelating agent and hydrogen peroxide; and 4) a wet etching. Removing the etching resist later. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising:
(2) エツチャントのキレート剤濃度が 0. 001〜0. 5 mo 1 Z 1であ り、 かつ、 過酸化水素濃度が 1〜5 Owt %であり、 かつ、 エツチャントの p Hが 2〜 7の範囲であることを特徴とする (1) のコンデンサ内蔵多層配線板 の製造方法。 (2) The concentration of the chelating agent of the etchant is 0.001 to 0.5 mo 1 Z1, the concentration of hydrogen peroxide is 1 to 5 Owt%, and the pH of the etchant is 2 to 7 (1) The method for producing a multilayer wiring board with a built-in capacitor.
(3) キレ一ト剤が、 エチレンジァミン四酢酸 (EDTA)、 ヒドロキシェチ ルイミノ二酢酸 (H I DA)、 イミノニ酢酸 (I DA;)、 ジヒドロキシェチルダ リシン (DHEG) 及びこれらのアルカリ塩からなる群から選ばれる少なくと も 1つであることを特徴とする (1) 又は (2) に記載のコンデンサ内蔵多層 配線板の製造方法。 (3) The chelating agent is selected from the group consisting of ethylenediaminetetraacetic acid (EDTA), hydroxyethyliminodiacetic acid (HI DA), imino diacetic acid (IDA;), dihydroxyethyl lysine (DHEG), and alkali salts thereof. The method for producing a multilayer wiring board with a built-in capacitor according to (1) or (2), wherein at least one is provided.
(4) 金属箔の片面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜2 ] ^1の誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を、 金属箔が 絶縁材料と接するように絶縁材料の少なくとも片面に設けた基板を用いるコン デンサ内蔵多層配線板の製造方法であって、 1) 基板表面の誘電体薄膜上の所 定の位置にコンデンサ電極となる金属層を形成する工程と、 2) 少なくとも基 板表面の前記金属層上にエッチングレジストを形成する工程と、 3) 硫酸、 塩 酸、 りん酸、 硝酸及び酢酸からなる群から選ばれる少なくとも 1つの酸と過酸 化水素を含むエツチャントによって、 誘電体薄膜をウエットエッチングするェ 程と、 4) ウエットエッチング後にエッチングレジストを除去す ¾工程とを有 することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (4) A material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2] ^ 1 is provided on one side of the metal foil. Using a substrate provided on at least one side of an insulating material so as to be in contact with A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising: 1) forming a metal layer serving as a capacitor electrode at a predetermined position on a dielectric thin film on a substrate surface; and 2) forming a metal layer on at least the metal layer on a substrate surface. 3) wet etching the dielectric thin film with an etchant containing hydrogen peroxide and at least one acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid, and acetic acid. And 4) a step of removing the etching resist after the wet etching.
(5) エツチャントの酸の濃度が 1〜3 Owt %であり、 かつ、 過酸化水素 濃度が 1〜5 Owt %であることを特徴とする (4) のコンデンサ内蔵多層配 線板の製造方法。 (5) The method for producing a multilayer wiring board with a built-in capacitor according to (4), wherein the acid concentration of the etchant is 1 to 3 Owt% and the hydrogen peroxide concentration is 1 to 5 Owt%.
(6) エッチングレジストとして感光性ドライフィルムを用いることを特徴 とする(1)〜(5)いずれかに記載のコンデンサ内蔵多層配線板の製造方法。 (6) The method for producing a multilayer wiring board with a built-in capacitor according to any one of (1) to (5), wherein a photosensitive dry film is used as an etching resist.
(7) 感光性ドライフィルムの膜厚が、 感光性ドライフィルムによって形成 されたエッチングレジストによりゥエツトエッチングから保護されるコンデン サ電極となる金属層の厚みの 1〜3倍であることを特徴とする (6) のコンデ ンサ内蔵多層配線板の製造方法。 (7) The photosensitive dry film is characterized in that the thickness of the photosensitive dry film is 1 to 3 times the thickness of the metal layer serving as a capacitor electrode which is protected from wet etching by the etching resist formed by the photosensitive dry film. (6) A method for manufacturing a multilayer wiring board with a built-in capacitor.
(8) 誘電体薄膜のウエットエッチングが、 液温 20〜45t:のエッチヤン 卜で行われることを特徴とする (1) 〜 (7) いずれかに記載のコンデンサ内 蔵多層配線板の製造方法。 (8) The method for producing a multilayer wiring board with a built-in capacitor according to any one of (1) to (7), wherein the wet etching of the dielectric thin film is performed at an etching temperature of 20 to 45 t :.
(9) 誘電体薄膜が、 チタン酸バリウム、 チタン酸ストロンチウム、 チタン 酸カルシウム、 チタン酸マグネシウム、 チタン酸鉛、 チタン酸ビスマス、 二酸 化チタン、 ジルコン酸バリウム、 ジルコン酸カルシウム及びジルコン酸鉛のい ずれか、 あるいはこれらのいずれか 2種以上を含む固溶体、 あるいはこれらの いずれか 2種以上を含む積層体からなる膜であることを特徴とする( 1 )〜( 8 ) いずれかに記載のコンデンサ内蔵多層配線板の製造方法。 (9) The dielectric thin film is made of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, and lead zirconate. (1) The capacitor according to any one of (1) to (8), which is a film formed of a solid solution containing any two or more of these, or a laminate containing any two or more of these. Manufacturing method of built-in multilayer wiring board.
D. さらに、 本発明は以下の実施形態に関する。 D. Further, the present invention relates to the following embodiments.
( 1 ) 金属箔 Aの片面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 / mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配辕板の製造方法であって、 1 ) コンデンサ内蔵多層配線板 用材料の金属箔 Aの面に絶縁材料を介して金属箔 Bを積層し基板とする工程と、 2 ) 金属箔 Bの任意の箇所をエッチング除去して、 上記絶縁材料から形成され た絶縁層を露出させる工程と、 3 ) レーザ照射により、 露出された絶縁層を除 去して穴を形成し、 金属箔 Aを露出させる工程と、 4 ) 穴内を含む基板表面の 両面に金属層を形成する工程と、 5 ) コンデンサ内蔵多層配線板用材料の誘電 体薄膜上の金属層から任意の形状のコンデンサ電極 Αパターンをエッチングで 形成する工程と、 6 ) 露出された誘電体薄膜からコンデンサ電極 Aパターンを 含む任意の形状のコンデンサ誘電体をエッチングで形成する工程と、 7 ) 誘電 体薄膜を除去して現れた金属箔 Aからコンデンサ誘電体パターンを含む任意の 形状のコンデンサ電極 Bをエッチングで形成する工程を有することを特徴とす るコンデンサ内蔵多層配線板の製造方法。 (1) One side of metal foil A has a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to A method for manufacturing a multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor provided with a 2 / m dielectric thin film, comprising: 1) a metal foil A of a material for a multilayer wiring board with a built-in capacitor; A step of laminating a metal foil B via an insulating material to form a substrate; 2) a step of etching and removing an arbitrary portion of the metal foil B to expose an insulating layer formed of the insulating material; and 3) a laser. Irradiation removes the exposed insulating layer to form a hole, exposing the metal foil A; 4) forming metal layers on both sides of the board surface including the inside of the hole; 5) multilayer capacitor built-in A step of etching a capacitor electrode of an arbitrary shape from a metal layer on a dielectric thin film of a wiring board material and a pattern, and 6) a capacitor dielectric of an arbitrary shape including a capacitor electrode A pattern from the exposed dielectric thin film. D 7) A capacitor characterized by having a step of etching a capacitor electrode B of an arbitrary shape including a capacitor dielectric pattern from a metal foil A that has appeared after removing the dielectric thin film. Manufacturing method of built-in multilayer wiring board.
( 2 ) ( 1 ) のコンデンサ内蔵多層配線板の製造方法であって、 5 ) 又は 7 ) のエッチング工程において、 基板の金属箔 Bを積層した面に任意の形状の回路 を形成することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (2) The method for manufacturing a multilayer wiring board with a built-in capacitor according to (1), wherein in the etching step (5) or (7), a circuit having an arbitrary shape is formed on the surface of the substrate on which the metal foil B is laminated. Of manufacturing a multilayer wiring board with a built-in capacitor.
( 3 ) 金属箔 Aの片面に比誘電率が 1 0〜2 0 0 0でかつ膜厚が 0 . 0 5〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1 ) コンデンサ内蔵多層配線板 用材料の金属箔 Aの面に絶縁材料を介して金属箔 Bを積層し基板とする工程と、 2 ) 金属箔 Bの任意の箇所にレーザ照射することにより、 金属箔 Bと上記絶縁 材料から形成された絶縁層とを同時に除去して穴を形成し、 金属箔 Aを露出さ せる工程と、 3 ) 穴内を含む基板表面の両面に金属層を形成する工程と、 4 ) コンデンサ内蔵多層配線板用材料の誘電体薄膜上の金属層から任意の形状のコ ンデンサ電極 Aパターンをエッチングで形成する工程と、 5 ) 露出された誘電 体薄膜からコンデンサ電極 Aパターンを含む任意の形状のコンデンサ誘電体を エッチングで形成する工程と、 6 ) 誘電体薄膜を除去して現れた金属箔 Aから コンデンサ誘電体パターンを含む任意の形状のコンデンサ電極 Bをエッチング で形成する工程を有することを特徴とするコンデンサ内蔵多層配線板の製造方 法。 (3) Use a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 m is provided on one side of the metal foil A. 1) a process of laminating a metal foil B on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate, and 2) a metal foil B. Irradiating a laser beam to an arbitrary part of the metal foil B and the insulating layer formed of the above insulating material at the same time to form a hole, thereby exposing the metal foil A, and 3) including the inside of the hole A) forming a metal layer on both sides of the substrate surface; 4) forming a capacitor electrode A pattern of any shape by etching from the metal layer on a dielectric thin film of a material for a multilayer wiring board with a built-in capacitor; 5). From the exposed dielectric thin film, any shape including capacitor electrode A pattern Forming a capacitor dielectric by etching, 6) of a metal foil A appearing by removing a dielectric thin film A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a capacitor electrode B of an arbitrary shape including a capacitor dielectric pattern by etching.
( 4 ) ( 3 ) のコンデンサ内蔵多層配線板の製造方法であって、 4 ) 又は 6 ) のエッチング工程において、 基板の金属箔 Bを積層した面に任意の形状の回路 を形成することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (4) The method for producing a multilayer wiring board with a built-in capacitor according to (3), wherein in the etching step (4) or (6), a circuit having an arbitrary shape is formed on the surface of the substrate on which the metal foil B is laminated. Of manufacturing a multilayer wiring board with a built-in capacitor.
( 5 ) 金属箔 Aの片面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 5〜 2 II mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1 ) コンデンサ内蔵多層配線板 用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が熱 硬化性樹脂と金属フィラーを含む導電性ペーストで充填されている絶縁材料を 介して金属箔 Bを積層し基板とする工程と、 2 ) 基板表面の少なくとも誘電体 薄膜側に金属層を形成する工程と、 3 ) コンデンサ内蔵多層配線板用材料の誘 電体薄膜上の金属層から任意の形状のコンデンサ電極 Aパターンをエッチング で形成する工程と、 4 ) 露出された誘電体薄膜からコンデンサ電極 Aパターン を含む任意の形状のコンデンサ誘電体をエッチングで形成する工程と、 5 ) 誘 電体薄膜を除去して現れた金属箔 Aにコンデンサ誘電体パターンを含む任意の 形状のコンデンサ電極 Bをエッチングで形成する工程を有することを特徴とす るコンデンサ内蔵多層配線板の製造方法。 (5) A material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 II m is provided on one side of the metal foil A is used. A method of manufacturing a multilayer wiring board with a built-in capacitor, comprising: 1) a through-hole is provided at an arbitrary position on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor, and the through-hole is formed of a thermosetting resin and a metal; A step of laminating a metal foil B via an insulating material filled with a conductive paste containing a filler to form a substrate; 2) a step of forming a metal layer on at least the dielectric thin film side of the substrate surface; and 3) a capacitor. A step of etching a capacitor electrode A pattern of an arbitrary shape from a metal layer on a dielectric thin film of a material for a built-in multilayer wiring board; and4) an arbitrary shape including a capacitor electrode A pattern from an exposed dielectric thin film. Etching capacitor dielectric And 5) etching of the capacitor electrode B of any shape including the capacitor dielectric pattern on the metal foil A that has appeared by removing the dielectric thin film. A method for manufacturing a multilayer wiring board.
( 6 ) 金属箔 Aの片面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 5〜 2 の誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1 ) コンデンサ内蔵多層配線板 用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が化 学的な反応により金属化される導電性ペース卜で充填されている絶縁材料を介 して金属箔 Bを積層し基板とする工程と、 2 ) 基板表面の少なくとも誘電体薄 膜.側に金属層を形成する工程と、 3 ) コンデンサ内蔵多層配線板用材料の誘電 体薄膜上の金属層から任意の形状のコンデンサ電極 Aパターンをエッチングで 形成する工程と、 4) 露出された誘電体薄膜からコンデンサ電極 Aパターンを 含む任意の形状のコンデンサ誘電体をエッチングで形成する工程と、 5) 誘電 体薄膜を除去して現れた金属箔 Aからコンデンサ誘電体パターンを含む任意の 形状のコンデンサ電極 Bをエッチングで形成する工程を有することを特徴とす るコンデンサ内蔵多層配線板の製造方法。 (6) A capacitor using a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 100 to 200 and a film thickness of 0.05 to 2 is provided on one side of a metal foil A. This is a method of manufacturing a built-in multilayer wiring board. Laminating a metal foil B via an insulating material filled with a conductive paste to be formed into a substrate; 2) forming a metal layer on at least the dielectric thin film side of the substrate surface; 3) The capacitor electrode A pattern of any shape can be etched from the metal layer on A) forming a capacitor dielectric of an arbitrary shape including a capacitor electrode A pattern from the exposed dielectric thin film by etching; and 5) removing a metal foil A that has appeared by removing the dielectric thin film. A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming a capacitor electrode B of an arbitrary shape including a capacitor dielectric pattern by etching.
(7) (5) 又は (6) のコンデンサ内蔵多層配線板の製造方法であって、 3) 又は 5) のエッチング工程において、 基板の金属箔 Bを積層した面に任意 の形状の回路を形成することを特徴とするコンデンサ内蔵多層配線板の製造方 法。 (7) The method for manufacturing a multilayer wiring board with a built-in capacitor according to (5) or (6), wherein in the etching step 3) or 5), a circuit having an arbitrary shape is formed on the surface of the substrate on which the metal foil B is laminated. A method for manufacturing a multilayer wiring board with a built-in capacitor.
(8) 上記誘電体薄膜と上記金属層との間に、 クロム、 モリブデン、 チタン 及びニッケルからなる群から選ばれた少なくとも 1種の他の金属層を形成する 工程を含むことを特徴とする (1) 〜 (7) いずれかに記載のコンデンサ内蔵 多層配線板の製造方法。 (8) A step of forming at least one other metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel between the dielectric thin film and the metal layer. 1) to (7) The method for producing a multilayer wiring board with a built-in capacitor according to any one of the above.
( 9 ) 金属箔 Aの片面に比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 zmの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いるコ ンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線板 用材料の金属箔 Aの面に絶縁材料を介して金属箔 Bを積層し基板とする工程と、 2) 金属箔 Bの任意の箇所をエッチング除去して、 上記絶縁材料から形成され た絶縁層を露出させる工程と、 3) レーザ照射により露出された絶縁層を除去 して穴を形成し、 金属箔 Aを露出させる工程と、 4) 穴内を含む基板の両面に 0. 1〜 5 mの金属層を形成する工程と、 5) コンデンサ電極 Aとなる部分 と穴部を含む任意の部分を残して基板表面に金属めつきレジストを形成するェ 程と、 6) 金属めつきにより、 上記のコンデンサ電極 Aとなる部分と穴部を含 む部分に導体パターンを形成する工程と、 7) 金属めつきレジストを除去する 工程と、 8) 基板表面に露出された 0. 1〜5 mの金属層をエッチング除去 す 工程と、 9) 露出された誘電体薄膜からコンデンサ零極 Aパターンを含む 任意の形状のコンデンサ誘電体をエッチングで形成する工程と、 10) 誘電体 薄膜を除去して現れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パ ターンを含む任意の形状のコンデンサ電極 Bを形成する工程と、 11) 露出さ れた金属箔 Bをエッチングにより回路形成する工程を有することを特徴とする コンデンサ内蔵多層配線板の製造方法。 (9) Multilayer wiring board with built-in capacitor using a material for multi-layer wiring board with built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 zm is provided on one side of metal foil A 1) a step of laminating a metal foil B on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor and a metal foil B via an insulating material to form a substrate; A step of exposing the insulating layer formed from the insulating material by etching and removing; 3) a step of removing the insulating layer exposed by laser irradiation to form a hole and exposing the metal foil A; 4) Forming a metal layer of 0.1 to 5 m on both sides of the substrate including the inside of the hole, and 5) forming a metal-plated resist on the surface of the substrate except for the part to be the capacitor electrode A and any part including the hole 6) Due to the metal plating, the above-mentioned part that becomes the capacitor electrode A and the hole A) forming a conductive pattern in a portion including a metal layer; 7) removing a metal-plated resist; and 8) etching away a 0.1 to 5 m metal layer exposed on the substrate surface. ) Etching the capacitor dielectric of any shape including the capacitor zero-pole A pattern from the exposed dielectric thin film, and 10) the dielectric. A step of forming a capacitor electrode B of an arbitrary shape including a capacitor dielectric pattern by etching from the metal foil A that appears after removing the thin film; and11) forming a circuit by etching the exposed metal foil B. A method for producing a multilayer wiring board with a built-in capacitor, comprising the steps of:
(10) 金属箔 Aの片面に比誘電率が 10〜 2000でかつ膜厚が 0. 05 〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に絶縁材料を介して金属箔 Bを積層し基板とする工程 と、 2) 金属箔 Bの任意の箇所にレーザ照射することにより、 金属箔 Bと上記 の絶縁材料から形成された絶縁層とを同時に除去して穴を形成し、 金属箔 Aを 露出させる工程と、 3) 穴内を含む基板の両面に 0. l〜5 zmの金属層を形 成する工程と、 4) コンデンサ電極 Aとなる部分と穴部を含む任意の部分を残 して基板表面に金属めつきレジストを形成する工程と、 5 )金属めつきにより、 上記のコンデンサ電極 Aとなる部分と穴部を含む部分に導体パターンを形成す る工程と、 6) 金属めつきレジストを除去する工程と、 7) 基板表面に露出さ れた 0. 1〜5 mの金属層をエッチング除去する工程と、 8) 露出された誘 電体薄膜から、 コンデンサ電極 Aパターンを含む任意の形状'のコンデンサ誘電 体をエッチングで形成する工程と、 9) 誘電体薄膜を除去して現れた金属箔 A から、 コンデンサ誘電体パターンを含む任意の形状のコンデンサ電極 Bを形成 する工程と、 10) 露出された金属箔 Bをエッチングにより回路形成する工程 を有することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (10) Use a multilayer wiring board material with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on one side of metal foil A. A manufacturing method comprising: 1) laminating a metal foil B on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; and 2) a laser at an arbitrary position of the metal foil B. By irradiating, the metal foil B and the insulating layer formed of the above-mentioned insulating material are simultaneously removed to form a hole, and the metal foil A is exposed. a) forming a metal layer of l to 5 zm; 4) forming a metal-plated resist on the substrate surface except for a portion serving as the capacitor electrode A and an arbitrary portion including a hole; 5) metal Due to the plating, the conductor pattern is formed on the part that becomes the capacitor electrode A and the part that includes the hole. 6) removing the metal-plated resist; 7) etching away the 0.1 to 5 m metal layer exposed on the substrate surface; and 8) exposing the dielectric. A process of etching a capacitor dielectric of an arbitrary shape including the capacitor electrode A pattern from the thin film by etching; and 9) an arbitrary shape including the capacitor dielectric pattern from the metal foil A that appears after removing the dielectric thin film. Forming a capacitor electrode B, and 10) forming a circuit by etching the exposed metal foil B. A method for manufacturing a multilayer wiring board with a built-in capacitor.
(1 1) 金属箔 Aの片面に比誘電率が 10〜 2000でかつ膜厚が 0. 05 〜 2 z mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が 熱 化性樹脂と金属フィラーを含む導電性ペーストで充填されているプリプレ グを介して金属箔 Bを積層し基板とする工程と、 2) 基板の少なくとも誘電体 薄膜側の表面に 0. 1〜5 imの金属層を形成する工程と、 3) コンデンサ電 極 Aとなる部分を含む任意の部分を残して基板表面に金属めつきレジストを形 成する工程と、 4) 金属めつきによりコンデンサ電極 Aとなる部分を含む部分 に導体パターンを形成する工程と、 5)金属めつきレジストを除去する工程と、 6) 基板表面に露出された 0. 1〜 5 mの金属層をエッチング除去する工程 と、 7) 露出された誘電体薄膜から、 コンデンサ電極 Aパターンを含む任意の 形状のコンデンサ誘電体をエッチングで形成する工程と、 8) 誘電体薄膜を除 去して現れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パターンを 含む任意の'形状のコンデンサ電極 Bを形成し、 露出された金属箔 Bをエツチン グにより回路形成する工程を有することを特徴とするコンデンサ内蔵多層配線 板の製造方法。 (1 1) A multilayer wiring board with a built-in capacitor that uses a dielectric thin film with a dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 zm provided on one side of metal foil A 1) A conductive paste containing a thermosetting resin and a metal filler, wherein a through hole is provided at an arbitrary position on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor. Laminating a metal foil B via a prepreg filled with A step of forming a metal layer of 0.1 to 5 im on the surface on the thin film side; and3) a step of forming a metal-plated resist on the substrate surface except for an arbitrary part including a part to be the capacitor electrode A. 4) a step of forming a conductor pattern on a portion including the portion that becomes the capacitor electrode A by metal plating; 5) a step of removing the metal-plated resist; and 6) 0.1-5 exposed on the substrate surface. 7) Etching a metal layer of m in thickness, 7) Etching a capacitor dielectric of any shape including the capacitor electrode A pattern from the exposed dielectric thin film, and 8) Removing the dielectric thin film Forming a capacitor electrode B having an arbitrary shape including a capacitor dielectric pattern by etching from the metal foil A that appears, and forming a circuit by etching the exposed metal foil B. To be Method of manufacturing a capacitor built-in multilayer wiring board.
(12) 金属箔 Aの片面に比誘電率が 10〜2000でかつ膜厚が 0. 05 〜 2 /zmの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が 化学的な反応により金属化される導電性べ一ストで充填されているプリプレダ を介して金属箔 Bを積層し基板とする工程と、 2) 基板の少なくとも誘電体薄 膜側の表面に 0. 1〜5 /mの金属層を形成する工程と、 3) コンデンサ電極 Aとなる部分を含む任意の部分を残して基板表面に金属めつきレジストを形成 する工程と、 4) 金属めつきによりコンデンサ電極 Aとなる部分を含む部分に 導体パ夕一ンを形成する工程と、 5) 金属めつきレジストを除去する工程と、 6) 基板表面に露出された 0. 1〜5 mの金属層をエッチング除去する工程 と、 7) 露出された誘電体薄膜から、 コンデンサ電極 Aパターンを含む任意の 形状のコンデンサ誘電体をエッチングで形成する工程と、 8) 誘電体薄膜を除 去して現れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パターンを 含む任意の形状のコンデンサ電極 Bを形成し、 露出された金属箔 Bをエツチン グにより回路形成する工程を有することを特徴とするコンデンサ内蔵多層配線 板の製造方法。 (12) A multilayer wiring board with a built-in capacitor that uses a dielectric thin film with a dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 / zm on one side of metal foil A 1) A conductive base in which a through-hole is provided at an arbitrary position on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through-hole is metallized by a chemical reaction. Laminating a metal foil B via a pre-filler filled in a single step to form a substrate; 2) forming a 0.1 to 5 / m metal layer on at least the surface of the substrate on the side of the dielectric thin film 3) a step of forming a metal-plated resist on the surface of the substrate while leaving an arbitrary part including a part to be the capacitor electrode A; and 4) a conductor path to the part including the part to be the capacitor electrode A due to the metallization. 5) Step of removing metal-coated resist 6) Etching and removing the 0.1 to 5 m metal layer exposed on the substrate surface; and 7) Etching capacitor dielectric of any shape including capacitor electrode A pattern from the exposed dielectric thin film. 8) From the metal foil A that appeared after removing the dielectric thin film, a capacitor electrode B of any shape including the capacitor dielectric pattern was formed by etching, and the exposed metal foil B was removed. A multilayer wiring with a built-in capacitor, characterized by having a step of forming a circuit by etching. Plate manufacturing method.
(13) 少なくとも誘電体薄膜の表面に形成する 0. l〜5 imの金属層が.: クロム、 モリブデン、 チタン及びニッケルからなる群から選ばれた少なくとも 1種の金属層であるか;銅、 銀、 錫、 ニッケル及び亜鉛からなる群から選ばれ た少なくとも 1種の金属層であるか;又は、 クロム、 モリブデン、 チタン及び ニッケルからなる群から選ばれた少なくとも 1種の金属層と銅、 艮、 錫、 ニッ. ゲル及び亜鉛からなる群から選ばれた少なくとも 1種の金属層とを含むもので あることを特徴とする (9) 〜 (12) のいずれかに記載のコンデンサ内蔵多 層配線板の製造方法。 (13) At least 0.1 to 5 im of the metal layer formed on the surface of the dielectric thin film is: at least one metal layer selected from the group consisting of chromium, molybdenum, titanium, and nickel; At least one metal layer selected from the group consisting of silver, tin, nickel and zinc; or at least one metal layer selected from the group consisting of chromium, molybdenum, titanium and nickel and copper The multilayer wiring with a built-in capacitor according to any one of (9) to (12), wherein the multilayer wiring includes at least one metal layer selected from the group consisting of tin, ni, gel and zinc. Plate manufacturing method.
(14) 金属めつきにより形成される導体パターンが、 銅、 銀、 錫、 ニッケ ル及び亜鉛からなる群から選ばれた少なくとも 1種以上の金属を含むことを特 徴とする (9) 〜 (13) いずれかに記載のコンデンサ内蔵多層配線板の製造 方法。 (14) The conductor pattern formed by metal plating includes at least one metal selected from the group consisting of copper, silver, tin, nickel and zinc. (9) to ( 13) The method for producing a multilayer wiring board with a built-in capacitor according to any one of the above.
(15) 金属箔 Aの片面に比誘電率が 10〜 2000でかつ膜厚が 0. 05 〜2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が 熱硬化性樹脂と金属フィラーを含む導電性ペーストで充填されている絶縁材料 を介して金属箔 Bを積層し基板とする工程と、 2) 誘電体薄膜の表面の任意の 部分に化学的な反応により金属化される導電性ペーストを用いて金属層を形成 して所望のコンデンサ電極 Aを形成する工程と、 3) 誘電体薄膜の少なくとも コンデンサ電極 Aを含む任意の部分を残してエッチング除去して所望のコンデ ンサ誘電体を形成する工程と、 4 )誘電体薄膜を除去して現れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パターンを含む任意の形状のコンデンサ 電極 Bを形成し、 露出された金属箔 Bをエッチングにより回路形成する工程を 有.することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (15) Use a multilayer wiring board material with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on one side of metal foil A. 1) A through hole is provided at an arbitrary position on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through hole is made of a conductive paste containing a thermosetting resin and a metal filler. Laminating a metal foil B via a filled insulating material to form a substrate; and 2) a metal layer using a conductive paste that is metallized by chemical reaction on any part of the surface of the dielectric thin film. Forming a desired capacitor electrode A, and 3) forming a desired capacitor dielectric by etching and removing at least an arbitrary portion of the dielectric thin film including at least the capacitor electrode A. 4) ) Gold that appeared after removing the dielectric thin film Capacitor electrode B of any shape including capacitor dielectric pattern is formed from metal foil A by etching, and circuit is formed by etching exposed metal foil B. Manufacturing method of wiring board.
(16) 金属箔 Aの片面に比誘電率が 10〜2000でかつ膜厚が 0. 05 〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が 化学的な反応により金属化される導電性ペーストで充填されている絶縁材料を 介して金属箔 Bを積層し基板とする工程と、 2) 誘電体薄膜の表面の任意の部 分に化学的な反応により金属化される導電性ペーストを用いて金属層を形成し て所望のコンデンサ電極 Aを形成する工程と、 3) 誘電体薄膜の少なくともコ ンデンサ電極 Aを含む任意の部分を残してエッチング除去して所望のコンデン サ誘電体を形成する工程と、 4) 誘電体薄膜を除去して現れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パターンを含む任意の形状のコンデンサ 電極 Bを形成し、 露出された金属箔 Bをエッチングにより回路形成する工程を 有することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (16) One side of metal foil A has a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 A method for manufacturing a multilayer wiring board with a built-in capacitor using a material for a multilayer wiring board with a built-in capacitor provided with a dielectric thin film of up to 2 m, comprising: 1) a metal foil A of a material for a multilayer wiring board with a built-in capacitor; A step of laminating a metal foil B via an insulating material filled with a conductive paste in which a through-hole is provided at a location and filled with a conductive paste by a chemical reaction, and 2) dielectric A step of forming a desired capacitor electrode A by forming a metal layer using a conductive paste which is metallized by a chemical reaction on an arbitrary portion of the surface of the body thin film; 4) A step of forming a desired capacitor dielectric by etching and removing an arbitrary portion including the capacitor electrode A; and 4) etching the capacitor dielectric pattern from the metal foil A that appears after removing the dielectric thin film. Any capacitor electrode B are formed of shape, method of manufacturing the capacitor built-in multilayer wiring board characterized by having a step of the exposed metal foil B are circuit formed by etching including.
(17) 金属箔 Aの表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05 〜 2 i mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 絶縁材料を介して金属箔 Bを積層し基板とするェ 程と、 2) 誘電体薄膜の任意の部分を残してエッチング除去して所望のコンデ ンサ誘電体を形成する工程と、 3) 金属箔 Bの任意の箇所をエッチング除去し て、 上記絶縁材料から形成された絶縁層を露出させる工程と、 4) レーザ照射 により露出された絶縁層を除去して穴を形成し、金属箔 Aを露出させる工程と、 5) 穴内を含む基板表面の両面に金属層を形成する工程と、 6) その金属層及 び金属箔 Aの任意の部分を残してエッチング除去して、 所望のコンデンサ電極 A及びコンデンサ電極 Bを形成する工程を有することを特徴とするコンデンサ 内蔵多層配線板の製造方法。 (17) Use a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 im is provided on the surface of the metal foil A. The manufacturing method includes: 1) a step of laminating a metal foil B, which is a material for a multilayer wiring board with a built-in capacitor, on a surface of a metal foil B via an insulating material to form a substrate; and 2) an arbitrary portion of a dielectric thin film. 3) a step of forming a desired capacitor dielectric by etching away while leaving a portion, 3) a step of exposing an arbitrary portion of the metal foil B to expose an insulating layer formed from the insulating material; ) Removing the insulating layer exposed by laser irradiation to form a hole and exposing the metal foil A; 5) forming metal layers on both surfaces of the substrate surface including the inside of the hole; and 6) forming the metal layer. And etching to remove the desired portion of the metal foil A, leaving the desired core. Method of manufacturing a capacitor built multilayer wiring board characterized by having a capacitor electrode A and the step of forming the capacitor electrode B.
(18) 金属箔 Aの表面に比誘電率が 10〜 2000でかつ膜厚が 0. 05 〜 ; timの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に絶縁材料を介して金属箔 Bを積層し基板とする工程 と、 2 ) 誘電体薄膜の任意の部分を残してエッチング除去して所望のコンデン サ誘電体を形成する工程と、 3 ) 金属箔 Bの任意の箇所にレーザ照射すること により、 金属箔 Bと上記絶縁材料から形成された絶縁層を同時に除去して穴を 形成して金属箔 Aを露出させる工程と、 4 ) 穴内を含む基板表面の両面に金属 層を形成する工程と、 5 ) その金属層及び金属箔 Aの任意の部分; έ残してエツ チング除去して、 所望のコンデンサ電極 Α及びコンデンサ電極 Bを形成するェ 程を有することを特徴とするコンデンサ内蔵多層配線板の製造方法。 (18) Use a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film with a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to; tim is provided on the surface of the metal foil A. 1) Multilayer wiring with built-in capacitor A step of laminating a metal foil B on a surface of a metal foil A of a plate via an insulating material to form a substrate; 2) etching and removing an arbitrary portion of the dielectric thin film to leave a desired capacitor dielectric; 3) Irradiating a laser on an arbitrary portion of the metal foil B, thereby simultaneously removing the metal foil B and the insulating layer formed from the above insulating material to form a hole, thereby exposing the metal foil A. And 4) a step of forming a metal layer on both sides of the substrate surface including the inside of the hole; and 5) an arbitrary portion of the metal layer and the metal foil A; A method for producing a multilayer wiring board with a built-in capacitor, comprising a step of forming a capacitor electrode B.
( 1 9 ) 金属箔 Aの片面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 5 〜 2 ^ mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1 ) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が 熱硬化性樹脂と金属フィラ一を含む導電性ペーストで充填されている絶縁材料 を介して金属箔 Bを積層し基板とする工程と、 2 ) 誘電体薄膜の任意の部分を 残してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 3 ) 基 板の少なくともコンデンサ誘電体を有する表面に金属層を形成する工程と、 4 ) その金属層及び金属箔 Aの任意の部分を残してエッチング除去して、 所望のコ ンデンサ電極 A及びコンデンサ電極 Bを形成する工程を有することを特徴とす るコンデンサ内蔵多層配線板の製造方法。 (19) A material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 ^ m is provided on one surface of a metal foil A. The method for manufacturing a multilayer wiring board with a built-in capacitor to be used is as follows: 1) A through-hole is provided at an arbitrary position on a surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor, and the through-hole is formed of a thermosetting resin and a metal. Laminating a metal foil B via an insulating material filled with a conductive paste containing a filler to form a substrate; 2) etching and removing any part of the dielectric thin film to obtain a desired capacitor dielectric 3) forming a metal layer on at least the surface of the substrate having the capacitor dielectric, and 4) etching away the metal layer and any portion of the metal foil A to remove the desired portion. Step of forming capacitor electrode A and capacitor electrode B A method for producing a multilayer wiring board with a built-in capacitor, comprising:
( 2 0 ) 金属箔 Aの片面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 5 〜 2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用いる コンデンサ内蔵多層配線板の製造方法であって、 1 ) コンデンサ内蔵多層配線 板用材料の金属箔 Aの面に、 任意の箇所に貫通穴が設けられかつその貫通穴が 化学的な反応により金属化される導電性ペーストで充填されている絶縁材料を 介して金属箔 Bを積層し基板とする工程と、 2 ) 誘電体薄膜の任意の部分を残 してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 3 ) 基板 の少なくともコンデンサ誘電体を有する表面に金属層を形成する工程と、 4 ) その金属層及び金属箔 Aの任意の部分を残してエッチング除去して、 所望のコ ンデンサ電極 A及びコンデンサ電極 Bを形成する工程を有することを特徴とす るコンデンサ内蔵多層配線板の製造方法。 (20) A material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 m is provided on one side of a metal foil A is used. This is a method for manufacturing a multilayer wiring board with a built-in capacitor. Laminating a metal foil B via a dielectric material filled with a conductive paste to be used as a substrate, and 2) etching and removing any desired portion of the dielectric thin film to obtain a desired capacitor dielectric. Forming a metal layer on at least the surface of the substrate having the capacitor dielectric; 4) A method for manufacturing a multilayer wiring board with a built-in capacitor, comprising a step of forming desired capacitor electrodes A and capacitor electrodes B by etching and removing any portions of the metal layer and the metal foil A.
(21) 化学的な反応により金属化される導電性ペーストが、金、 白金、銀、 銅、 パラジウム及びルテニウムからなる群から選ばれた少なくとも 1種以上の 金属粒子を含み、 かつその金属粒子の平均粒径が 0. l〜10 nmであること を特徴とする (6)、 (12)、 (15)、 (16) 又は (20) に記載のコンデン サ内蔵多層配線板の製造方法。 (21) The conductive paste to be metallized by a chemical reaction contains at least one or more metal particles selected from the group consisting of gold, platinum, silver, copper, palladium and ruthenium; and The method for producing a multilayer wiring board with a built-in capacitor according to (6), (12), (15), (16) or (20), wherein the average particle diameter is 0.1 to 10 nm.
(22) 誘電体薄膜をエッチング除去する方法が、 イオンビームエッチング 法、 R I E (Re ac t i ve I on E t c h i ng) 法又は溶液エッチ ング法のいずれかであることを特徴とする (1) 〜 (21) いずれかに記載の コンデンサ内蔵多層配線板の製造方法。 (22) The method for etching and removing the dielectric thin film is any one of an ion beam etching method, an RIE (Reactive Ion Etching) method, and a solution etching method. (21) The method for manufacturing a multilayer wiring board with a built-in capacitor according to any one of (1) to (4).
(23) コンデンサ電極 Bが多層配線板のグランド層又は電源層であること を特徴とする (1) 〜 (22) いずれかに記載のコンデンサ内蔵多層配線板の 製造方法。 (23) The method for manufacturing a multilayer wiring board with a built-in capacitor according to any one of (1) to (22), wherein the capacitor electrode B is a ground layer or a power supply layer of the multilayer wiring board.
(24) 基板の絶縁層の形成に用いられる絶縁材料が樹脂とガラス織布又は ガラス不織布からなるプリプレダであることを特徴とする (1) 〜 (23) い ずれかに記載のコンデンサ内蔵多層配線板の製造方法。 (24) The multilayer wiring with a built-in capacitor according to any one of (1) to (23), wherein the insulating material used for forming the insulating layer of the substrate is a pre-predader made of resin and glass woven fabric or glass non-woven fabric. Plate manufacturing method.
(25) 基板の絶縁層の形成に用いられる絶縁材料が、 樹脂として熱硬化性 樹脂を含有するプリプレダであって、 その熱硬化性樹脂のガラス転移点温度が 170 以上であることを特徴とする (1) 〜 (24) いずれかに記載のコン デンサ内蔵多層配線板の製造方法。 (25) The insulating material used for forming the insulating layer of the substrate is a pre-preda containing a thermosetting resin as a resin, and the glass transition temperature of the thermosetting resin is 170 or more. (1) The method for producing a multilayer wiring board with a built-in capacitor according to any one of (1) to (24).
(26) 誘電体薄膜がチタン酸バリウム、 チタン酸ストロンチウム、 チタン 酸カルシウム、 チタン酸マグネシウム、 チタン酸鉛、 チタン酸ビスマス、 二酸 化チタン、 ジルコン酸バリウム、 ジルコン酸カルシウム、 ジルコン酸鉛、 チタ ン バリゥムスト口ンチウム、 チタン酸ジルコン酸鉛及びニオブ酸マグネシゥ ム酸鉛一チタン酸鉛のいずれか、 あるいはこれらのいずれか 2種以上を含む固 溶体、 あるいはこれらのいずれか 2種以上を含む積層体からなる膜であるコン デンサ内蔵多層配線板用材料を用いたことを特徴とする (1) 〜 (25) いず れかに記載のコンデンサ内蔵多層配線板の製造方法。 (26) The dielectric thin film is made of barium titanate, strontium titanate, calcium titanate, magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, titanium Any one of barium bromide, lead zirconate titanate and lead magnesium magnesium niobate-lead titanate, or a solid containing at least two of them (1) The capacitor according to any one of (1) to (25), wherein a material for a multilayer wiring board with a built-in capacitor, which is a film made of a solution or a laminated body containing at least two of these, is used. Manufacturing method of built-in multilayer wiring board.
(27) 金属箔 Aが銅からなり、 力、つ誘電体薄膜が形成される面に銅の酸化 保護皮膜となる金属として、 白金、 金、 銀、 パラジウム、 ルテニウム及びイリ ジゥムからなる群から選ばれた 1種以上の金属膜を設けたコンデンサ内蔵多層 配線板用材料を用いたことを特徴とする (1) 〜 (26) いずれかに記載のコ ンデンサ内蔵多層配線板の製造方法。 (27) Metal foil A is made of copper, and is selected from the group consisting of platinum, gold, silver, palladium, ruthenium, and iridium as a metal that serves as a copper oxide protective film on the surface on which the dielectric thin film is formed. The method for producing a multilayer wiring board with a built-in capacitor according to any one of (1) to (26), wherein the material for a multilayer wiring board with a built-in capacitor provided with at least one kind of metal film is used.
(28) 金属箔 Aが銅からなり、 かつ誘電体薄膜が形成される面に安定した 自己酸化皮膜を形成する金属として、 クロム、 モリブデン、 チタン及びニッケ ルからなる群から選ばれた 1種以上の金属膜を設けたコンデンサ内蔵多層配線 板用材料を用いたことを特徴とする (1) 〜 (26) いずれかに記載のコンデ ンサ内蔵多層配線板の製造方法。 (28) One or more metals selected from the group consisting of chromium, molybdenum, titanium, and nickel as a metal in which the metal foil A is made of copper and forms a stable self-oxidizing film on the surface on which the dielectric thin film is formed. The method for manufacturing a multilayer wiring board with a built-in capacitor according to any one of (1) to (26), wherein a material for a multilayer wiring board with a built-in capacitor provided with a metal film is used.
(29) 金属箔 Aの誘電体薄膜が形成される面の表面粗さが 0. 01〜0. 5 /zmであるコンデンサ内蔵多層配線板用材料を用いたことを特徴とする(1) 〜 (28) いずれかに記載のコンデンサ内蔵多層配線板の製造方法。 (29) A material for a multilayer wiring board with a built-in capacitor, wherein the surface roughness of the surface of the metal foil A on which the dielectric thin film is formed is 0.01 to 0.5 / zm. (28) The method for producing a multilayer wiring board with a built-in capacitor according to any of the above.
本明細書において開示の内容は、 日本国特許出願 2003— 077695 (出願日 2003年 3月 20日)、 2003-078324 (出願日 2003年 3月 20日)、 2003-368857 (出願曰 2003年 10月 29日)およ び 2003— 376604 (出願日 2003年 11月 6日) に含まれる主題に 関するものであって、 これらを、 全体を本明細書の一部として組み込む。 図面の簡単な説明 The contents disclosed in this specification are Japanese Patent Application 2003-077695 (filing date: March 20, 2003), 2003-078324 (filing date: March 20, 2003), 2003-368857 (filing date: Oct. 2003 29) and 2003—376604 (filing date November 6, 2003), which are incorporated herein in their entirety. BRIEF DESCRIPTION OF THE FIGURES
第 1図は、 本発明の実施例におけるコンデンサ内蔵多層配線板用材料を示す 断面図である。 第 2図は、 実施例 A— 1と実施例 A— 2及び実施例 A— 5のプ 口セスを示す断面図である。 第 3図は、 実施例 A— 3のプロセスを示す断面図 である。 第 4図は、 実施例 A— 4のプロセスを示す断面図である。 第 5図は、 実施例 A— 6のプロセスを示す断面図である。 第 6図は、 実施例 A— 7のプロ セスを示す断面図である。 第 7図は、 実施例 A— 8のプロセスを示す断面図で ある。 第 8図は、 比較例 A _ 1のプロセスを示す断面図である。 FIG. 1 is a cross-sectional view showing a material for a multilayer wiring board with a built-in capacitor according to an embodiment of the present invention. FIG. 2 is a cross-sectional view showing the process of Example A-1, Example A-2, and Example A-5. FIG. 3 is a cross-sectional view showing a process of Example A-3. FIG. 4 is a cross-sectional view showing the process of Example A-4. Figure 5 shows FIG. 9 is a cross-sectional view showing a process of Example A-6. FIG. 6 is a sectional view showing a process of Example A-7. FIG. 7 is a cross-sectional view showing a process of Example A-8. FIG. 8 is a cross-sectional view showing a process of Comparative Example A_1.
また、 第 9図から第 1 1図は、 本発明の実施例 Bに用いた内層基板を示す断 面図である。 第 1 2図は、 実施例 B— 1のプロセス及び実施例 B— 4と B— 5 のプロセスの一部を示す断面図である。 第 1 3図は、 実施例 B— 6のプロセス を示す断面図である。 第 1 4図は、 実施例 B— 7のプロセスを示す断面図であ る。 第 1 5図は、 実施例 B— 8のプロセスを示す断面図である。 第 1 6図は、 比較例 B— 1のプロセスを示す断面図である。 9 to 11 are cross-sectional views showing the inner substrate used in Example B of the present invention. FIG. 12 is a cross-sectional view showing a part of the process of Example B-1 and the processes of Examples B-4 and B-5. FIG. 13 is a cross-sectional view showing a process of Example B-6. FIG. 14 is a cross-sectional view showing the process of Example B-7. FIG. 15 is a cross-sectional view showing a process of Example B-8. FIG. 16 is a cross-sectional view showing a process of Comparative Example B-1.
さらに、 第 1 7〜1 9図は、 実験例 C一 1〜C一 9の製造工程を示す断面図 である。 Further, FIGS. 17 to 19 are cross-sectional views showing manufacturing steps of Experimental Examples C-11 to C-19.
さらに、 第 2 0図は、 実施例 D— 1のプロセスを示す断面図である。 第 2 1 図は、 実施例 D— 2のプロセスを示す断面図である。 第 2 2図は、 実施例 D— 3のプロセスを示す断面図である。 第 2 3図は、 実施例 D— 4および実施例 D _ 5のプロセスを示す断面図である。 第 2 4図は、 実施例 D— 6のプロセスを 示す断面図である。第 2 5図は、実施例 D— 7のプロセスを示す断面図である。 第 2 6図は、実施例 D— 8および実施例 D— 9のプロセスを示す断面図である。 第 2 7図は、 実施例 D _ 1 0および実施例 D— 1 1のプロセスを示す断面図で ある。 第 2 8図は、 実施例 D— 1 2のプロセスを示す断面図である。 第 2 9図 は、 実施例 D— 1 3のプロセスを示す断面図である。 第 3 0図は、 実施例 D— 1 4および実施例 D— 1 5のプロセスを示す断面図である。 第 3 1図は、 比較 例 D— 1のプロセスを示す断面図である。 発明を実施するための最良の形態 FIG. 20 is a cross-sectional view showing the process of Example D-1. FIG. 21 is a cross-sectional view showing a process of Example D-2. FIG. 22 is a cross-sectional view showing a process of Example D-3. FIG. 23 is a cross-sectional view showing a process of Example D-4 and Example D_5. FIG. 24 is a cross-sectional view showing a process of Example D-6. FIG. 25 is a cross-sectional view showing a process of Example D-7. FIG. 26 is a cross-sectional view showing the process of Example D-8 and Example D-9. FIG. 27 is a cross-sectional view showing a process of Example D_10 and Example D-11. FIG. 28 is a cross-sectional view showing a process of Example D-12. FIG. 29 is a cross-sectional view showing a process of Example D-13. FIG. 30 is a cross-sectional view showing a process of Example D-14 and Example D-15. FIG. 31 is a cross-sectional view illustrating a process of Comparative Example D-1. BEST MODE FOR CARRYING OUT THE INVENTION
(コンデンサ内蔵多層配線板用材料) (Material for multilayer wiring board with built-in capacitor)
.本発明の一実施態様は、 金属箔の表面に比誘電率が 1 0〜2 0 0 0でかつ膜 厚が 0 . 0 5〜2 ^ mの誘電体薄膜が設けられたことを特徴とするコンデンサ 内蔵多層配線板用材料に関する。 この多層配線板用材料では、 金属箔表面に誘 電体薄膜を形成するために、均一な膜厚の誘電体薄膜を得ることが容易であり.、 コンデンサ容量のばらつきが小さい。 One embodiment of the present invention is characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 ^ m is provided on the surface of the metal foil. Capacitor It relates to a material for a built-in multilayer wiring board. With this multilayer wiring board material, it is easy to obtain a dielectric thin film having a uniform film thickness because the dielectric thin film is formed on the surface of the metal foil.
誘電体薄膜の膜厚は、 絶縁性を確保してリーク電流を抑えるためには 0. 0 5 m以上が好ましく、 0. 1 im以上がさらに好ましい。 また、 経済性を考 慮すると 2 m以下の膜厚が好ましく、 1 以下がさらに好ましい。 したが つて、 膜厚としては 0. 05〜2 mが好ましく、 0. l〜l mがさらに好 ましいものである。 500 p F/mm2以上の容量密度を得るために必要な比 誘電率は、 膜厚が 0. 05 mの場合に 2. 9以上、 0. l^mの場合に 5. 7以上、 1 2] 1の場合に57以上、 2 mの場合に 113以上である。 したが つて、 比誘電率として 2. 9〜113の薄膜誘電体を用いれば、 0. 05〜2 mの膜厚で 500 pF/mm2 の薄膜キャパシタを形成可能である。しかし、 薄膜誘電体の比誘電率が高いほど内蔵キャパシ夕の小型化に優位性があり、 1 0〜2000が好ましく、 20〜2000がさらに好ましい。 ここで、 比誘電 率とは、 25 °Cに温度管理された環境の下で I PC— 650 2. 5. 5. 2 に準じて 1 MHzの周波数で測定した値を指し示す。 また、 膜厚の値は、 電極 を形成したコンデンサの断面を走査型電子顕微鏡に挙げられるような 0. 05 m未満の厚みを観察可能な装置を用いて得ることが可能である。 The thickness of the dielectric thin film is preferably at least 0.05 m, more preferably at least 0.1 im, in order to secure insulation and suppress leakage current. In consideration of economy, the film thickness is preferably 2 m or less, more preferably 1 or less. Therefore, the film thickness is preferably from 0.05 to 2 m, more preferably from 0.1 to lm. The relative dielectric constant required to obtain a capacitance density of 500 pF / mm 2 or more is 2.9 or more when the film thickness is 0.05 m, 5.7 or more when the film thickness is 0.1 m, and 1 2] It is 57 or more for 1 and 113 or more for 2 m. Therefore, if a thin film dielectric having a relative dielectric constant of 2.9 to 113 is used, a thin film capacitor of 500 pF / mm 2 can be formed with a thickness of 0.05 to 2 m. However, the higher the relative dielectric constant of the thin film dielectric, the more advantageous the miniaturization of the built-in capacity, and is preferably 10 to 2000, more preferably 20 to 2000. Here, the relative permittivity indicates a value measured at a frequency of 1 MHz in accordance with IPC-650 2.5.5.2 in an environment controlled at 25 ° C. The value of the film thickness can be obtained by using a device capable of observing a cross section of the capacitor on which the electrodes are formed, such as a scanning electron microscope, capable of observing a thickness of less than 0.05 m.
誘電体薄膜としては、 比誘電率が 10〜 2000でかつ膜厚が 0. 05〜 2 ; amの誘電体薄膜を形成できれば限定するものではないが、チタン酸バリウム、 チタン酸ストロンチウム、 チタン酸カルシウム、 チタン酸マグネシウム、 チタ ン酸鉛、 チタン酸ビスマス、 二酸化チタン、 ジルコン酸バリウム、 ジルコン酸 カルシウム、 ジルコン酸鉛、 チタン酸バリウムストロンチウム、 チタン酸ジル コン酸鉛、 ニオブ酸マグネシウム酸鉛一チタン酸鉛などの誘電体からなる膜を 用いることが好ましい。 この時に 2種類以上の固溶体や積層体も用いることが できる。 一般的にベロブスカイト結晶構造を持つ金属酸化物は高い比誘電率を 示すことが知られており、 好ましく用いることができる。 金属箔としては、 例えば、 銅箔、 銀箔、 錫箔、 ニッケル箔、 亜鉛箔が挙げら れる。 これらの中でも、 電気的な特性と経済性考慮すると銅箔が好ましい。 金 属箔の厚さは、 1 0〜5 0 / mが好ましい。 銅箔を用いる場合には、 銅箔の表 面に、銅の酸化保護皮膜となる金属の層および/または安定した自己酸化皮膜を 形成する金属の層を設けることが好ましい。 これらの皮膜は、 0 . l〜3 tm であることが好ましい。 The dielectric thin film is not limited as long as it can form a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 am, but barium titanate, strontium titanate, and calcium titanate , Magnesium titanate, lead titanate, bismuth titanate, titanium dioxide, barium zirconate, calcium zirconate, lead zirconate, barium strontium titanate, lead zirconate titanate, lead magnesium niobate and lead monotitanate It is preferable to use a film made of a dielectric such as. At this time, two or more types of solid solutions and laminates can be used. In general, metal oxides having a belovskite crystal structure are known to exhibit a high dielectric constant, and can be preferably used. Examples of the metal foil include a copper foil, a silver foil, a tin foil, a nickel foil, and a zinc foil. Among them, copper foil is preferable in consideration of electrical characteristics and economy. The thickness of the metal foil is preferably from 10 to 50 / m. When a copper foil is used, it is preferable to provide a metal layer that forms an oxidation protective film of copper and / or a metal layer that forms a stable self-oxidizing film on the surface of the copper foil. These coatings are preferably between 0.1 and 3 tm.
銅の酸化保護皮膜となる金属の層として、 白金、 金、 銀、 パラジウム、 ルテ 二ゥム、ィリジゥムなどの金属膜が好ましい。金属箔として銅箔を用いた場合、 銅の表面に金属酸化物の誘電体薄膜を直接形成すると、 金属酸化物から銅に酸 素が供給されて界面に酸化銅が発生し、 密着性を低減させる。 したがって、 金 属酸化物から供給される酸素を遮断し、 かつ銅との密着性を確保する酸化保護 皮膜を形成することが好ましい。 As a metal layer to be a copper oxide protective film, a metal film such as platinum, gold, silver, palladium, ruthenium, and iridium is preferable. When copper foil is used as the metal foil, if a dielectric thin film of metal oxide is formed directly on the surface of copper, oxygen is supplied from the metal oxide to copper and copper oxide is generated at the interface, reducing adhesion Let it. Therefore, it is preferable to form an oxidation protection film that blocks oxygen supplied from the metal oxide and ensures adhesion to copper.
自己酸化皮膜を形成する金属の層として、 クロム、 モリブデン、 チタン、 二 ッケルなどの金属膜が好ましい。 金属箔に銅箔を用いた場合、 酸化銅の発生に より密着性が低減する可能性があるため、 金属酸化物の誘電体薄膜から供給さ れる酸素を遮断し、 かつ銅との密着性を確保する自己酸化皮膜を形成すること が好ましい。 As the metal layer forming the self-oxidizing film, a metal film of chromium, molybdenum, titanium, nickel or the like is preferable. When copper foil is used as the metal foil, the adhesion may be reduced due to the generation of copper oxide.Therefore, the oxygen supplied from the metal oxide dielectric thin film is blocked, and the adhesion to copper is reduced. It is preferable to form a self-oxidizing film to secure.
金属箔の表面粗さは 0 . 0 1〜0 . 5 mであることが好ましい。 誘電体薄 膜の厚みは、前記 (^通り、好ましくは 0 . 0 5〜2 m、 さらに好ましくは 0 . l〜l zmである。 誘電体薄膜を形成する基板の表面粗さは、 少なくとも誘電 体薄膜の厚みよりも低いことが必要であり、 リ一ク電流等の絶縁膜としての信 頼性を確保するためには、 誘電体薄膜の厚みの 5 0 %未満であることが好まし レ^ したがって 0 . 0 2 5〜0 . 5 x mの表面粗さが好ましいが、 信頼性を確 固とするためには表面粗さを 0 . 0 1〜0 . 5 mとすることが最も好ましい。 ここで、 表面粗さとは、 表面を走査型顕微鏡を用いて観察し、 任意の十点にお け 凹凸の差の平均値を指し示す。 The metal foil preferably has a surface roughness of 0.01 to 0.5 m. The thickness of the dielectric thin film is as described above (preferably, 0.05 to 2 m, more preferably 0.1 to l zm. The surface roughness of the substrate on which the dielectric thin film is formed is at least dielectric constant. It is necessary that the thickness be smaller than the thickness of the body thin film, and in order to ensure reliability as an insulating film such as leakage current, the thickness is preferably less than 50% of the thickness of the dielectric thin film. ^ Therefore, a surface roughness of 0.025 to 0.5 xm is preferable, but a surface roughness of 0.01 to 0.5 m is most preferable for securing reliability. Here, the surface roughness refers to the average value of the difference in unevenness at any ten points when the surface is observed using a scanning microscope.
誘電体薄膜の金属箔への形成方法は、 例えば、 真空蒸着法、 イオンプレーテ ィング法、 C VD (Ch emi c a l Vapo r De p o s i t i on) 法、 スパッタリング法またはゾルゲル法により形成してもよい。 Methods for forming a dielectric thin film on a metal foil include, for example, a vacuum deposition method and an ion plate. It may be formed by a sputtering method, a CVD (Chemical Vapor Deposition) method, a sputtering method, or a sol-gel method.
真空蒸着法は、 1. 3 X 10— 4 P a以下の高真空中で薄膜材料を加熱蒸着 させ、 この蒸発粒子を基板上に付着させて誘電体薄膜を形成する技術である。 イオンプレーティング法は、 真空蒸着膜の基板への付着強度を高めるために、 蒸発粒子をイオン化し電界により加速してから基板に付着させて誘電体薄膜を 形成する技術である。 CVD法は、 薄膜を形成する元素を含むハロゲン化物、 硫化物、水素化物、有機金属化合物などを高温中あるいはプラズマ中で熱分解 · 酸化 ·還元 ·重合あるいは気相化学反応などさせたのちに、 薄膜組成を基板上 に付着させて誘電体薄膜を形成する技術である。 スパッタリング法は、 イオン をターゲットに照射し、 スパッ夕蒸発した夕ーゲット物質を基板上に付着させ て誘電体薄膜を形成する技術である。 ゾルゲル法は、 薄膜を形成する元素を含 むゾル溶液を基板上にコ一ティングし、 縮合反応によりゲル化させたのちに高 温ァニールして誘電体薄膜を形成する技術である。 Vacuum deposition method, 1. a thin film material is heated evaporation in a high vacuum of 3 X 10- 4 P a, it is a technique for forming a dielectric thin film by adhering the vapor particles onto the substrate. The ion plating method is a technique for forming a dielectric thin film by ionizing vaporized particles, accelerating them by an electric field, and then adhering them to the substrate in order to increase the strength of adhesion of the vacuum deposited film to the substrate. The CVD method involves the thermal decomposition, oxidation, reduction, polymerization, or gas phase chemical reaction of halides, sulfides, hydrides, organometallic compounds, etc., containing the elements that form the thin film, at high temperatures or in plasma. This technology forms a dielectric thin film by depositing a thin film composition on a substrate. The sputtering method is a technique of irradiating a target with ions and depositing a sputter-evaporated target material on a substrate to form a dielectric thin film. The sol-gel method is a technique in which a sol solution containing an element for forming a thin film is coated on a substrate, gelled by a condensation reaction, and then annealed at a high temperature to form a dielectric thin film.
誘電体薄膜を金属箔表面に形成する際には、 ロール状の金属箔を用い、 かつ 温度が一定に管理された加熱炉内を連続的に金属箔を移動させながら誘電体薄 膜を形成することが好ましい。 連続処理を行うことにより、 均一の品質の誘電 体薄膜を形成することが可能となり、 経済的にも優れる。 When forming a dielectric thin film on the surface of the metal foil, use a roll-shaped metal foil and form the dielectric thin film while moving the metal foil continuously in a heating furnace where the temperature is kept constant. Is preferred. By performing continuous processing, it is possible to form a dielectric thin film of uniform quality, which is economically excellent.
(コンデンサ内蔵多層配線板用基板) (Substrate for multilayer wiring board with built-in capacitor)
さらに、 本発明の一実施形態は、 基板内部に導体層間を接続するバイァホ一 ルを有し, かつ、 表面に平滑な金属層を有する基板の表面に、 比誘電率が 10 〜2000で、 かつ、 膜厚が 0. 05〜2 mの誘電体薄膜を形成したコンデ ンサ内蔵多層配線板用基板に関する。 Further, in one embodiment of the present invention, the substrate has a via hole for connecting conductive layers inside the substrate, and has a relative dielectric constant of 10 to 2,000 on the surface of the substrate having a smooth metal layer on the surface, and The present invention relates to a multilayer wiring board substrate with a built-in capacitor on which a dielectric thin film having a thickness of 0.05 to 2 m is formed.
この実施形態によると、 基板内部にバイァホールを有する基板を用いること に り、 コンデンサ電極と接続する配線パターンを任意に設計することが可能 となる。 また、 表面が平滑な金属層表面に誘電体薄膜を形成するために均一な 膜厚の誘電体薄膜を得ることが容易であり、 コンデンサ容量のばらつきも小さ い。 According to this embodiment, it is possible to arbitrarily design a wiring pattern connected to a capacitor electrode by using a substrate having a via hole inside the substrate. In addition, a uniform thin film is formed on the surface of the metal layer with a smooth surface. It is easy to obtain a dielectric thin film with a large thickness, and there is little variation in capacitor capacitance.
金属層としては、銅が好ましく、銅箔の表面に酸化保護皮膜および/または自 己酸化皮膜を設けて銅の酸化を防ぐことが好ましい。 誘電体薄膜については、 コンデンサ内蔵多層配線板用材料に用いる誘電体薄膜と同様のものを用いるこ とができ、 前記と同様に形成できる。 The metal layer is preferably copper, and it is preferable to provide an oxidation protective film and / or a self-oxidizing film on the surface of the copper foil to prevent oxidation of copper. As the dielectric thin film, the same as the dielectric thin film used for the material for the multilayer wiring board with a built-in capacitor can be used, and can be formed in the same manner as described above.
バイァホールによる導体層間の接続は、 金属めつきまたは導電性ペース卜に より行うことができる。 The connection between the conductor layers by via holes can be made by metal plating or conductive paste.
金属めつきとしては、 銅、 銀、 ニッケル、 亜鉗、 錫などの金属やそれらの合 金を用いることができる。 金属めつきによる層間の接続方法は、 1 ) 金属張り 積層板にドリル穴明けやレーザ穴明けにより貫通穴を形成、 2 ) めっき触媒付 与、 3 ) 薄付け無電解めつき、 4 ) 厚付け電気めつき、 5 ) 熱硬化性穴埋め樹 脂を貫通穴へ充填、 6 ) 熱硬化性穴埋め樹脂を硬化、 7 ) 基板表面の平滑化を 目的とした研磨、 8 ) めっき触媒付与、 9 ) 薄付け無電解めつき、 1 0 ) 厚付 け電気めつきする方法により、 行ってもよい。 厚付け電気めつきを厚付け無電 解めつきとしてもよい。 Metals such as copper, silver, nickel, sub forceps, tin, and alloys thereof can be used as the metal plating. The method of connection between layers by metal plating is: 1) Through holes are formed by drilling or laser drilling in metal-clad laminates, 2) Plating catalyst, 3) Thin electroless plating, 4) Thickening Electric plating, 5) Filling the through holes with thermosetting resin, 6) Curing thermosetting resin, 7) Polishing for smoothing of substrate surface, 8) Applying plating catalyst, 9) Thin Electroless plating, 10) Thickening may be performed by a method of electrical plating. The thick electric plating may be replaced with a thick electric plating.
導電性ペーストとしては、 金属フィラーと樹脂とからなる導電性ペースト、 または化学的な反応により金属化される導電性ペーストが挙げられる。 Examples of the conductive paste include a conductive paste composed of a metal filler and a resin, and a conductive paste that is metallized by a chemical reaction.
金属フイラ一 (金属粉) と樹脂とからなる導電性べ一ストとしては、 金属フ イラ一と熱硬化性樹脂からものが好ましい。 金属フィラーとしては、 例えば、 銀、 銅、 錫、 亜鉛又はその合金等が挙げられる。 その粒径は、 0 . 5〜1 0 mである。 熱硬化性榭脂としては、 例えばフエノール樹脂、 エポキシ樹脂、 シ ァネ一ト樹脂等が挙げられる。 導電性ペースト中の金属フィラーの含有量は、 6 0 - 8 0体積%であることが好ましい。 熱硬化性樹脂と金属フィラーとから なる導電性べ一ストとしては、市販品として、 D Dペースト(タッタシステム · エ クトロニクス株式会社製、 商品名)、 ドータイト (藤倉化成株式会社製、 商 品名)、 ュエメツク導電性べ一スト (ナミックス株式会社製、 商品名)等を用い ることができる。 The conductive paste made of the metal filler (metal powder) and the resin is preferably made of a metal filler and a thermosetting resin. Examples of the metal filler include silver, copper, tin, zinc, and alloys thereof. Its particle size is between 0.5 and 10 m. Examples of the thermosetting resin include a phenol resin, an epoxy resin, and a sanne resin. The content of the metal filler in the conductive paste is preferably 60 to 80% by volume. Commercially available conductive pastes composed of a thermosetting resin and a metal filler include DD paste (trade name, manufactured by Tatta System Electronics Co., Ltd.), Dortite (trade name, manufactured by Fujikura Kasei Co., Ltd.), Use a conductive paste such as a conductive paste (trade name, manufactured by Namics Corporation) Can be
化学的な反応により金属化される導電性ペーストは、 熱硬化性樹脂と金属 7 ィラーとからなる導電性ペーストに対して体積抵抗率が低く、 電気特性的に有 利である。 このような導電性ペーストとしては、 例えば、 微細な金属粒子、 分 散剤、 溶剤からなるペーストが挙げられる。 この導電性ペースト中の金属粒子 の含有量は、 6 0〜8 0重量%が好ましい。 化学的な反応により金属化される 導電性ペーストの金属粒子としては、例えば、金、 白金、 銀、 銅、パラジウム、 ルテニウムなどが挙げられる。 その平均粒径が 0 . l〜1 0 nmであることが 好ましい。 この導電性べ一ストは、 ガス中蒸発法で形成された非常に微細な金 属粒子が、 分散剤で保護されているため、 室温では、 液体とほとんど同じ挙動 を示し、 印刷、 塗布、含浸等で回路形成などが可能である。 また、一定温度(1 5 0〜2 0 0 °C) まで加熱すると、 補足物質が活性化し、 分散剤を除去するな どの化学的な反応により、微細な金属粒子間を接触させ、融合と融着を加速し、 金属化された電気伝導体を形成する性質を有する。 積層のための加熱加圧時の 温度、 すなわち金属の融点に達しない温度で金属化させるためには、 0 . 1〜 1 0 nmの金属粒子を用いて反応活性を上げることが好ましい。 また、 酸素と の反応を抑制するために、 酸化しにくい金属である金、 白金、 銀、 銅、 パラジ ゥム、 ルテニウムなどの金属粒子を用いることが好ましい。 このような化学的 な反応により金属化される導電性ペーストとして、 ナノペースト (ハリマ化成 株式会社製、 商品名) などの市販品を用いることができるが、 これに限定した ものではない。 A conductive paste that is metallized by a chemical reaction has a lower volume resistivity than a conductive paste composed of a thermosetting resin and a metal foil, and is advantageous in electrical characteristics. Examples of such a conductive paste include a paste made of fine metal particles, a dispersant, and a solvent. The content of the metal particles in the conductive paste is preferably 60 to 80% by weight. Examples of the metal particles of the conductive paste that are metallized by a chemical reaction include gold, platinum, silver, copper, palladium, ruthenium, and the like. Preferably, the average particle size is 0.1 to 10 nm. This conductive paste behaves almost the same as a liquid at room temperature because very fine metal particles formed by gas evaporation method are protected by a dispersant.Printing, coating, impregnation It is possible to form a circuit or the like. When heated to a certain temperature (150 ° C to 200 ° C), the supplementary substance is activated, and the fine metal particles are brought into contact by a chemical reaction such as removal of the dispersant, and fusion and fusion occur. Has the property of accelerating deposition and forming a metallized electrical conductor. In order to metallize at a temperature at the time of heating and pressurizing for lamination, that is, at a temperature below the melting point of the metal, it is preferable to increase the reaction activity by using metal particles of 0.1 to 10 nm. In order to suppress the reaction with oxygen, it is preferable to use metal particles such as gold, platinum, silver, copper, palladium, and ruthenium, which are hardly oxidized metals. Commercially available products such as nanopaste (trade name, manufactured by Harima Chemicals, Inc.) can be used as the conductive paste that is metallized by such a chemical reaction, but the conductive paste is not limited to this.
導電性ペーストを用いた層間の接続方法は、 1 ) 絶縁層となるプリプレダに ドリル穴明けやレーザ穴明けにより貫通穴を形成する工程、 2 ) 導電性ペース トを貫通穴へ充填する工程、 3 ) 金属箔で挟み、 加圧加熱し硬化させる工程を 含んでいてもよい。加熱する温度は、 2 5 °C〜3 5 0 であることが好ましい。 3 5 0 °Cを超えると一般的な樹脂においては、 熱分解が起こるためである。 金属めつきおよび導電性ペーストのいずれによる層間の接続においても、 2 層基板に限定するものではなく、 3層以上の基板においても基板内部に導体層 間を接続するバイァホールが金属により電気的に接続されていてもよい。 基板に用いる絶縁材料は、 樹脂とガラス織布またはガラス不織布からなるこ とが好ましい。 基板の加熱処理を行うためには高温においても基板の剛性を確 保することが必要である。 したがって、 樹脂と無機フィラーのみからなる絶縁 材料や樹脂とセルロースや合成樹脂などの紙からなる絶縁材料等 ¾用いるより も、 樹脂とガラス織布またはガラス不織布からなる絶縁材料を用いることが好 ましいものである。 また、 耐熱性の高いフッ素樹脂やポリエーテルエーテルケ トンなどの熱可塑性樹脂やポリイミドゃポリアミドイミドなどの熱硬化性樹脂 のシートを用いることも可能であるが、経済性に劣る。織布ゃ不織布の材質は、 高温における剛性の高い、 すなわち弾性率の高いものであれば限定するもので はなく、 Dガラス, Eガラスや Sガラスなどが使用可能である。 The method of connecting layers using conductive paste is as follows: 1) a step of forming a through-hole by drilling or laser drilling in the pre-preda to be an insulating layer; 2) a step of filling the through-hole with a conductive paste; ) The method may include a step of sandwiching between metal foils, heating under pressure, and curing. The heating temperature is preferably from 25 ° C. to 350 ° C. If the temperature exceeds 350 ° C, thermal decomposition occurs in general resins. For connection between layers by both metal plating and conductive paste, 2 The present invention is not limited to a layer substrate, and even in a substrate having three or more layers, via holes for connecting conductor layers may be electrically connected to the inside of the substrate by metal. The insulating material used for the substrate is preferably made of resin and glass woven fabric or glass nonwoven fabric. In order to heat the substrate, it is necessary to ensure the rigidity of the substrate even at high temperatures. Therefore, it is preferable to use an insulating material consisting of resin and glass woven fabric or glass nonwoven fabric, rather than an insulating material consisting only of resin and inorganic filler or an insulating material consisting of resin and paper such as cellulose or synthetic resin. It is. It is also possible to use a sheet of a thermoplastic resin such as a fluororesin or a polyetheretherketone having a high heat resistance, or a thermosetting resin such as a polyimide-polyamideimide, but it is economically inferior. The material of the woven fabric / nonwoven fabric is not limited as long as it has high rigidity at high temperature, that is, a material having a high elastic modulus, and D glass, E glass, S glass and the like can be used.
基板の絶縁材料に用いられている樹脂は、 熱硬化性樹脂であり, そのガラス 転移点温度が 170°C以上であることが好ましい。 熱硬化性樹脂とガラス織布 またはガラス不織布からなる絶縁材料を用いた基板は加工性や経済性に優れて いる。 また、 ガラス転移点温度が 170°C以上であることにより、 誘電体薄膜 の形成時の熱による劣化を抑えることが可能となる。 ガラス転移点温度が 17 0°C以上である熱硬化性樹脂としては、 例えば、 エポキシ樹脂、 変性ポリイミ ド樹脂、 変性トリアジン樹脂、 変性ポリフエ二レンオキサイド樹脂、 変性ポリ フエ二レンエーテル樹脂、 変性シァネートエステル樹脂などを用いることがで きるが、 限定するものではない。 エポキシ樹脂を用いた基板材料としては、 市 販のものとして、 MCL— E— 679、 MCL-E- 679 F (以上、 日立化 成工業株式会社製、 商品名)、 R— 1755、 R— 1515 (以上、 松下電工株 式会社製、商品名)、 E LC-4781 (住友べークライト株式会社製、商品名)、 CS- 3665, CS— 3365 S、 CS- 3287 (以上、 利昌工業株式会 社.製、 商品名) などを使用できる。 また、 変性ポリイミド樹脂を用いた銅張積 層板としては、 市販のものとして、 MCL— 1—671 (日立化成工業株式会 社製、 商品名)、 R-4705 (松下電工株式会社製、 商品名) などを使用でき る。 また、 変性トリアジン樹脂を用いた銅張積層板としては、 市販のものとし て、 CCL—830、 CCL— 832、 CCL- 832HS (以上、 三菱ガ ス化学株式会社製、 商品名) などを使用できる。 また、 変性ポリフヱニレンェ 一テル樹脂を用いた銅張積層板としては、 CS— 3376B (利昌工業株式会 社製、 商品名)、 TLC-W- 596 (京セラケミカル株式会社製、'商品名) な どを使用できる。 上記の各々の銅張り積層板に対応する多層化絶縁材料 (プリ プレダ) も、 各メーカから市販されており、 用いることが可能である。 (コンデンサ内蔵多層配線板) The resin used for the insulating material of the substrate is a thermosetting resin, and preferably has a glass transition temperature of 170 ° C or higher. Substrates using an insulating material made of thermosetting resin and glass woven fabric or glass nonwoven fabric are excellent in workability and economy. Further, when the glass transition point temperature is 170 ° C or more, it is possible to suppress deterioration due to heat during the formation of the dielectric thin film. Examples of the thermosetting resin having a glass transition temperature of 170 ° C. or more include epoxy resin, modified polyimide resin, modified triazine resin, modified polyphenylene oxide resin, modified polyphenylene ether resin, and modified shear resin. Nate ester resins and the like can be used, but are not limited. Commercially available substrate materials using epoxy resin include MCL-E-679, MCL-E-679F (these are Hitachi Chemical Industries, Ltd., trade names), R-1755, R-1515 (Matsushita Electric Works, Ltd., trade name), ELC-4781 (Sumitomo Bakelite Co., Ltd., trade name), CS-3665, CS—3365S, CS-3287 (Rissho Kogyo Co., Ltd.) , Product name) can be used. A commercially available copper-clad laminate using a modified polyimide resin is available from MCL-1-671 (Hitachi Chemical Industry Co., Ltd.). R-4705 (made by Matsushita Electric Works, Ltd.) can be used. As the copper-clad laminate using the modified triazine resin, commercially available products such as CCL-830, CCL-832, CCL-832HS (the above names, manufactured by Mitsubishi Gas Chemical Company, Ltd.) can be used. . Examples of copper-clad laminates using a modified polyphenylene ether resin include CS-3376B (trade name, manufactured by Risho Kogyo Co., Ltd.) and TLC-W-596 (trade name, manufactured by Kyocera Chemical Corporation). Can be used. Multi-layered insulating materials (pre-leaders) corresponding to each of the above-mentioned copper-clad laminates are also commercially available from each manufacturer and can be used. (Multilayer wiring board with built-in capacitor)
コンデンサ内蔵多層配線板は、 上記のコンデンサ内蔵多層配線板用材料を用 いて、 この銅箔面に絶縁層を介して導体回路を有する基板を積層し、 コンデン サの形成および銅箔と導体パターンとの導通を行うことにより製造してもよい。 また、 コンデンサ内蔵多層配線板は、 上記のコンデンサ内蔵多層配線板用基板 を用いて、 コンデンサの形成を行うことにより製造してもよい。 さらに、 上記 のコンデンサ内蔵多層配線板用材料の金属箔(以下、 金属箔 Aとする。) に絶縁 層を介して金属箔(以下、 金属箔 Bとする。) を積層し、 コンデンサの形成およ び金属箔 Aおよび金属箔 Bの導通を行うことにより製造してもよい。 以下これ らについて説明する。 The multilayer wiring board with a built-in capacitor uses the above-mentioned material for a multilayer wiring board with a built-in capacitor, and laminates a substrate having a conductor circuit on the copper foil surface via an insulating layer to form a capacitor, and form the copper foil and the conductive pattern. It may be manufactured by conducting the above. The multilayer wiring board with a built-in capacitor may be manufactured by forming a capacitor using the above-described substrate for a multilayer wiring board with a built-in capacitor. Further, a metal foil (hereinafter, referred to as metal foil B) is laminated on a metal foil (hereinafter, referred to as metal foil A) of the above-mentioned material for a multilayer wiring board with a built-in capacitor via an insulating layer to form a capacitor. It may be manufactured by conducting the metal foil A and the metal foil B. These are described below.
(第 1のコンデンサ電極の形成) (Formation of the first capacitor electrode)
基板表面の誘電体薄膜上にコンデンサ電極 (以下、 第 1のコンデンサ電極と する。) を形成する。 A capacitor electrode (hereinafter, referred to as a first capacitor electrode) is formed on a dielectric thin film on a substrate surface.
第 1のコンデンサ電極の厚みは 10〜50 が好ましい。 10 未満の 場合には、 電極 1の外層にさらに絶縁層を形成したときに電極の引き出しパ夕 ーンとして非貫通穴を設ける際、 レーザ加工をすると誘電体薄膜の下の金属層 がダメージを受け、 破損しやすいという問題が発生し易い。 また、 5 を 超えると、 エッチングで電極パターンを形成する際の加工精度が劣る場合があ る。 The thickness of the first capacitor electrode is preferably from 10 to 50. If the thickness is less than 10, when a non-through hole is provided as a lead-out pattern of the electrode when an insulating layer is further formed on the outer layer of the electrode 1, the metal layer below the dielectric thin film is damaged by laser processing. And the problem of easy damage. On the other hand, if it exceeds 5, processing accuracy when forming an electrode pattern by etching may be poor. You.
誘電体薄膜上の所定の位置に第 1のコンデンサ電極を形成する方法としては、 誘電体薄膜上の全面に金属層を形成した後、エッチングにより形成する方法 (第 As a method of forming the first capacitor electrode at a predetermined position on the dielectric thin film, a method in which a metal layer is formed on the entire surface of the dielectric thin film and then formed by etching (
1の方法)、 めっきレジスト形成後、 金属めつきを行う方法 (第 2の方法)、 お よび導電性ペーストにより印刷する方法 (第 3の方法) などがある。 Method 1), metal plating after plating resist formation (second method), and printing with conductive paste (third method).
第 1の方法は、 金属めつきまたはスパッタリングにより 1 0〜5 0 mの金 属層を形成する工程と、 任意の箇所をエッチング除去する工程とを含んでいて もよい。 第 1のコンデンサ電極となる金属層としては、 種々の金属が挙げられ るが、 電気的特性および経済性を考慮すると銅が好ましい。 金属層として銅を 用いる場合は、 誘電体薄膜からの酸素の移動による銅の酸化を防ぐため、 金属 層にクロム、 モリブデン、 チタンまたはニッケルなどをさらに含めるか、 ある いは、 金属層と誘電体薄膜の間にクロム、 モリブデン、 チタンまたはニッケル など自己酸化被膜となる金属層を設けることが好ましい。 The first method may include a step of forming a metal layer of 10 to 50 m by metal plating or sputtering, and a step of etching and removing an arbitrary portion. Various metals can be used as the metal layer to be the first capacitor electrode, but copper is preferable in consideration of electrical characteristics and economy. If copper is used as the metal layer, the metal layer may further include chromium, molybdenum, titanium, nickel, or the like, or the metal layer and the dielectric may be used to prevent oxidation of the copper due to transfer of oxygen from the dielectric thin film. It is preferable to provide a metal layer serving as a self-oxidizing film such as chromium, molybdenum, titanium, or nickel between the thin films.
第 2の方法は、 誘電体薄膜の表面に 0 . 1〜5 /x mの金属層を形成する工程 と、 第 1のコンデンサ電極を含む任意の部分を残して金属めつきレジストを形 成する工程と、 金属めつきにより 1 0〜5 0 / mの第 1のコンデンサ電極を形 成する工程と、 金属めつきレジストをエッチング除去する工程と、 誘電体薄膜 の表面に形成した 0 . 1〜 5 mの金属層をエッチング除去する工程とを含む。 0 . 1〜5 の金属層としては、 種々の金属が挙げられるが、 電気的特性と 経済性を考慮すると銅が好ましい。 銅を用いる場合には、 銅の酸化を防止する ために、 0 . 1〜 5 の金属層との間に自己酸化性被膜を形成する金属層を 設けることが好ましい。 自己酸化性皮膜を形成する金属層は、 クロム、 モリブ デン、 チタン、 ニッケルなどの金属層が好ましい。 金属めつきにより形成され た 1 0〜5 0 mの金属層としては、 電気的特性および経済性を考慮すると、 銅、 銀、 錫、 ニッケルまたは亜鉛を含むことが好ましい。 めっきレジストとし て.は、 例えば、 フォテック H— 9 3 3 0 (商品名、 日立化成工業株式会社製) を使用することができる。 めっきレジストのエッチング液および 0 . 1〜5 mの金属層のエッチング液としては、 公知のものを使用できる。 The second method includes a step of forming a metal layer of 0.1 to 5 / xm on the surface of the dielectric thin film, and a step of forming a metal-plated resist while leaving an arbitrary portion including the first capacitor electrode. Forming a first capacitor electrode of 10 to 50 / m by metal plating; etching and removing a metal-plated resist; and forming a first capacitor electrode on the surface of the dielectric thin film. etching the metal layer of m. Examples of the metal layer of 0.1 to 5 include various metals, and copper is preferable in consideration of electrical characteristics and economy. When copper is used, it is preferable to provide a metal layer for forming a self-oxidizing film between the metal layer and the metal layers of 0.1 to 5 in order to prevent oxidation of copper. The metal layer forming the self-oxidizing film is preferably a metal layer of chromium, molybdenum, titanium, nickel or the like. It is preferable that the metal layer of 10 to 50 m formed by metal plating contains copper, silver, tin, nickel, or zinc in consideration of electrical characteristics and economy. As the plating resist, for example, Photek H-9330 (trade name, manufactured by Hitachi Chemical Co., Ltd.) can be used. Plating resist etchant and 0.1 to 5 As the etching solution for the metal layer of m, a known solution can be used.
第 3の方法は、 誘電体薄膜上の第 1のコンデンサ電極を形成する任意の箇所 に化学的な反応により金属化される導電性ペーストを印刷し、 硬化させる工程 を含んでいてもよい。 また、 第 1のコンデンサ電極となる箇所を含む部分に導 電性ペース卜を印刷し、 不要な箇所をエッチングして第 1のコンデンサ電極を 形成してもよい。 化学的な反応により金属化される導電性ペーストとしては、 コンデンサ内蔵多層配線板用基板に使用できる前記の導電性ペーストが使用で きるが、 特に金属粒子の平均粒径が 0. 1〜10 nmのものが好ましい。 化学 的な反応により金属化される導電性ペーストを用いることにより、 処理工程数 の多いめっきプロセスを用いることなく第 1のコンデンサ電極が形成でき、 コ ンデンサ内蔵多層配線板の製造日数を低減することができる。 The third method may include a step of printing and hardening a conductive paste to be metallized by a chemical reaction at an arbitrary position on the dielectric thin film where the first capacitor electrode is to be formed. Further, a conductive paste may be printed on a portion including a portion to be the first capacitor electrode, and an unnecessary portion may be etched to form the first capacitor electrode. As the conductive paste which is metallized by a chemical reaction, the above-mentioned conductive paste which can be used for a substrate for a multilayer wiring board with a built-in capacitor can be used. Are preferred. By using a conductive paste that is metallized by a chemical reaction, the first capacitor electrode can be formed without using a plating process with many processing steps, and the number of days for manufacturing a multilayer wiring board with a built-in capacitor is reduced. Can be.
(コンデンサ誘電体の形成) (Formation of capacitor dielectric)
前記のコンデンサ内蔵多層配線板用材料または基板の誘電体薄膜を、 コンデ ンサ誘電体となる箇所を残してエツチング除去することにより、 コンデンサ誘 導体を形成する。 The material for the multilayer wiring board with a built-in capacitor or the dielectric thin film of the substrate is removed by etching while leaving a portion serving as a capacitor dielectric, thereby forming a capacitor dielectric.
エッチング除去する方法としては、 例えば、 イオンビームエッチング法、 R I E (Re a c t i v e I on E t c h i ng) 法ゃゥエツトエッチング 法が挙げられる。 Examples of the etching removal method include an ion beam etching method, an R I (Reactiv e IonEtching) method, and an etching method.
イオンビームエッチング法は、 アルゴン等の不活性ガスのイオンを電界によ り加速してから基板に照射し誘電体薄膜を除去する技術である。 The ion beam etching method is a technique in which ions of an inert gas such as argon are accelerated by an electric field and then irradiated on a substrate to remove a dielectric thin film.
R I E法は、 減圧強電界下で、 フロン系ガスなどの反応性のガスプラズマを 発生させ、 それにより誘電体薄膜を除去する技術である。 The RIE method is a technique in which a reactive gas plasma such as a fluorocarbon-based gas is generated under a reduced pressure and a strong electric field, thereby removing the dielectric thin film.
ウエットエッチング法は、 エッチング溶液 (エツチャント) などの誘電体を 溶解せしめることが可能なエッチング溶液 (エツチャント) を用いて誘電体薄 膜を除去する技術である。 エツチャントとしては、 公知のものを用いることが で.き、例えば、フッ酸を含んだ溶液、アンモニアおよび過酸化水素含む水溶液、 および EDT A、アンモニアおよび過酸化水素を含む水溶液などが挙げられる。 しかし、 フッ酸は反応性が高いことから危険性がある。 アンモニアおよび過酸 化水素含む水溶液、 および E D TA、 アンモニアおよび過酸化水素を含む水溶 液は、 アルカリ性である。 そのため、 エッチングによってパターニングを行う 場合、 エッチングレジストには耐アルカリ性のレジスト、 すなわちゴム系レジ ストなどを用いる必要がある。 このようなレジストでは現像液や剥離液に特殊 な薬品や溶剤を用いていることから専用の設備を設ける必要がある。 そこで、 次の 2つの方法によるエツチヤントを用いる方法により誘電体薄膜のエツチン グを行ってもよい。 The wet etching method is a technique for removing a dielectric thin film using an etching solution (etchant) such as an etching solution (etchant) capable of dissolving a dielectric. Known etchants can be used, and examples thereof include a solution containing hydrofluoric acid, an aqueous solution containing ammonia and hydrogen peroxide, and an aqueous solution containing EDTA, ammonia and hydrogen peroxide. However, hydrofluoric acid is dangerous because of its high reactivity. Aqueous solutions containing ammonia and hydrogen peroxide, and aqueous solutions containing EDTA, ammonia and hydrogen peroxide are alkaline. Therefore, when patterning is performed by etching, it is necessary to use an alkali-resistant resist, that is, a rubber-based resist, as the etching resist. Since such a resist uses a special chemical or solvent for a developing solution or a stripping solution, it is necessary to provide a dedicated facility. Therefore, the dielectric thin film may be etched by a method using an etch by the following two methods.
2つの方法とは、 キレート剤と過酸化水素を含むエツチャントを用いる方法 (第 1の方法)、 および硫酸、 塩酸、 りん酸、硝酸及び酢酸からなる群から選ば れる少なくとも 1つの酸と過酸化水素を含むエツチャントを用いる方法 (第 2 の方法) である。 第 1と第 2の方法において行う誘電体薄膜のエッチングはゥ エツトエッチングであり、 ドライプロセスによるエッチングに比べ生産性に優 れている。 また、 大型基板にも対応できるため経済的である。 さらには、 通常 のフォトリソプロセスで使用するアルカリ現像型のエッチングレジストを使用 するため、 専用の設備を設ける必要がなく、 特殊な薬液も使用しないため安価 であり、 かつ効率良く薄膜パターニングを行うことが可能である。 The two methods include a method using an etchant containing a chelating agent and hydrogen peroxide (first method), and at least one acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid, and acetic acid, and hydrogen peroxide. This is a method (second method) that uses an etchant containing Etching of the dielectric thin film performed in the first and second methods is wet etching, and has higher productivity than etching by a dry process. It is economical because it can handle large substrates. Furthermore, the use of an alkali-developed etching resist used in the normal photolithography process eliminates the need for special equipment, and does not use special chemicals, so it is inexpensive and can perform thin film patterning efficiently. It is possible.
第 1の方法では、 誘電体薄膜のエツチャントとして、 キレート剤と過酸化水 素を含むものを用い、 通常、 エツチャントは水溶液である。 フッ酸を用いずに キレート剤と過酸化水素を含む水溶液により誘電体薄膜をエッチングすること ができるため、 薬液の取り扱いが容易であり危険性を低減することができる。 また、 キレ一ト剤ゃ過酸化水素は通常のプリント配線板製造プロセスで使用さ れているものであり、 使用に際して新たに大きな負荷がかかることがない。 ェ ッチャントのキレート剤濃度は、 0 . 0 0 1〜0 . 5 m o l Z lとするのが望 ましい。 誘電体薄膜のエッチングには、 最低 0 . 0 0 l m o 1ノ 1が必要であ り : 限界濃度である 0 . 5 m o 1 1までの範囲で任意に設定することができ る。 さらに望ましくは、 0 . 1〜0 . 3 m o 1 1とすることにより、 安定性 の良いエッチングレートを得ることができる。 また、 過酸化水素濃度は 1〜5 O w t %とするのが望ましい。 この範囲内で過酸化水素濃度を任意に設定する ことでエッチングレートの調整が可能である。 使用上最低限許容されるエッチ ングレ一トを得るためには、 少なくとも l w t %の過酸化水素が必要であり、 薬液の取扱い性に問題のない 5 O w t %までの範囲で任意に設定することがで きる。 さらに望ましくは、 2 0〜3 O w t %とすることで適正なエッチングレ ートを得ることができ、 かつ液濃度の管理も容易に行うことが可能となる。 上 述した濃度に管理されたエツチャントは、 酸性エツチャントであり、 エツチヤ ントの p Hは 2〜 7の範囲で管理されることが望ましい。 なお、 緩衝液により p Hをアルカリ側に調整することも可能であるが、 その場合、 耐アルカリ性の エッチングレジストを用いる必要があり、 耐アルカリ性を有するレジストは一 般に専用の設備や薬液が必要である。 従って、 前記の理由からも、 エッチヤン 卜の p Hは 2〜 7の範囲で管理されることが望ましい。 In the first method, an etchant containing a chelating agent and hydrogen peroxide is used as an etchant for a dielectric thin film. Usually, the etchant is an aqueous solution. Since the dielectric thin film can be etched with an aqueous solution containing a chelating agent and hydrogen peroxide without using hydrofluoric acid, handling of the chemical solution is easy and danger can be reduced. In addition, the chelating agent—hydrogen peroxide is used in a normal printed wiring board manufacturing process, and does not require a large new load when used. Preferably, the chelant concentration of the etchant is between 0.001 and 0.5 mol Zl. For etching of the dielectric thin film, at least 0.001mo1 is required : it can be arbitrarily set up to the limit concentration of 0.5mo1. More desirably, the stability is set to 0.1 to 0.3 mo 11. Good etching rate can be obtained. It is desirable that the concentration of hydrogen peroxide be 1 to 5 O wt%. The etching rate can be adjusted by arbitrarily setting the concentration of hydrogen peroxide within this range. At least lwt% of hydrogen peroxide is necessary to obtain the minimum etch rate for use, and it can be set arbitrarily within the range up to 5 O wt% where there is no problem in handling chemicals. I can do it. More desirably, by setting the content to 20 to 3 O wt%, an appropriate etching rate can be obtained, and the liquid concentration can be easily controlled. The etchant controlled to the concentration described above is an acidic etchant, and the pH of the etchant is desirably controlled in the range of 2 to 7. It is also possible to adjust the pH to the alkaline side by using a buffer solution.However, in this case, it is necessary to use an alkali-resistant etching resist, and a resist having alkali resistance generally requires special equipment and a chemical solution. It is. Therefore, for the above reason, it is desirable that the pH of the etchant is controlled in the range of 2 to 7.
本発明に用いるキレート剤は、 エチレンジァミン四酢酸(E D TA)、 ヒドロ キシェチルイミノ二酢酸 (H I D A)、 イミノニ酢酸 (I DA)、 ジヒドロキシ ェチルグリシン (D H E G) 及びこれらのアルカリ塩の群から選ばれる少なく とも 1つのキレ一ト剤であることが、 好ましい。 前記のキレート剤は水溶性で あることから、 NH 4 0H、 N a 0 Hなどのアル力リ溶液を用いる必要がなレ^ これは前述した酸性エツチャントを得るために有効であり、 レジス卜の選択が 容易であることに加え、 薬液コストの低減にも寄与するものである。 The chelating agent used in the present invention is at least one selected from the group consisting of ethylenediaminetetraacetic acid (EDTA), hydroxyethyliminodiacetic acid (HIDA), iminoniacetic acid (IDA), dihydroxyethylglycine (DHEG) and alkali salts thereof. It is preferably a chelating agent. Since the chelating agent is a water soluble, NH 4 0H, the N a 0 H such as Al force Li solution such need used Le ^ which is effective for obtaining an acidic Etsuchanto described above, Regis Bok of In addition to being easy to select, it also contributes to reducing chemical solution costs.
第 2の方法において用いられる誘電体薄膜のエツチャントは、 硫酸、 塩酸、 りん酸、 硝酸及び酢酸からなる群から選ばれる酸と過酸化水素を含み、 通常、 水溶液である。 前記の酸は、 通常の配線板製造にも使用されるものであり、 フ ッ酸に比べ取り扱いが容易である。 これらの酸と過酸化水素の水溶液により、 容易に誘電体薄膜をエッチングすることが可能となるものである。 The etchant of the dielectric thin film used in the second method contains an acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid and acetic acid and hydrogen peroxide, and is usually an aqueous solution. The above-mentioned acids are also used in the manufacture of ordinary wiring boards, and are easier to handle than hydrofluoric acid. The aqueous solution of these acids and hydrogen peroxide makes it possible to easily etch the dielectric thin film.
ッチャントの硫酸、 塩酸、 りん酸、 硝酸及び酢酸からなる群から少なくと も 1つ選ばれる酸の濃度を 1〜 3 0 w t %とするのが好ましい。 より高濃度に するほどエッチングレートを高くすることが可能であるが、 薬液の取り扱いが 難しくなる。したがって、濃度は 3 O w t %を上限とするのが好ましい。また、. 使用上最低限許容されるエッチングレートを得るためには l w t %以上とする のが好ましい。 さらに好ましくは、 5〜3 O w t %とすることで取扱い性に優 れ、 かつ適正なエッチングレートを得ることが可能である。 また、 薬液の取り 扱いも容易で優れたエッチングレートを得ることが可能となるものである。 第 1と第 2の方法において、 少なくとも基板表面の所定の位置に形成された コンデンサ電極となる金属層上にエッチングレジストが形成されていればよい。 エッチングレジストとしては、 市販の感光性ドライフィルムやアルカリ現像型 レジストインクなどが、 使用できるが、 感光性ドライフィルムを用いることが 好ましい。 感光性ドライフィルムは、 プリント配線板製造プロセスで最も汎用 なレジスト材である。 低コストなレジスト形成が可能なばかりでなく、 作業性 にも非常に優れている。 使用するエッチングレジストは特に限定されるもので はないが、 例えば F X 1 4 0 (デュポン MR Cドライフィルム株式会社製、 商 品名)、 N I T 2 4 0 (二チゴ一 'モートン株式会社製、 商品名)、 H- 9 0 4 0 (日立化成工業株式会社製、 商品名) などを用いることができる。 なお、 市 版のアルカリ現像型レジストインクとしては、 P E R—2 0 (太陽インキ製造 株式会社製、 商品名) などが挙げられる。 エッチングレジストを、 基板表面の コンデンサ電極となる金属層上と誘電体薄膜上に形成し、 回路パターンを焼き 付け、 さらに現像を行う。 なお、 現像には炭酸ナトリウム水溶液、 エッチング レジストの剥離には水酸化ナトリウム水溶液を用いることができ、 環境に対す る負荷が小さいことも特長である。 また、 スクリーン印刷などで、 インク状ェ ツチングレジストを用い、 コンデンサ電極となる金属層上のみに、 エッチング レジストを形成してもかまわない。 It is preferable that the concentration of at least one acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid and acetic acid is 1 to 30 wt%. Higher concentration The higher the etching rate, the higher the etching rate, but the more difficult it is to handle chemicals. Therefore, the concentration is preferably set to 3 O wt% as the upper limit. Further, in order to obtain an etching rate which is at least allowable in use, it is preferable that the content be lwt% or more. More preferably, by setting the content to 5 to 3 wt%, it is possible to obtain excellent etching characteristics and an appropriate etching rate. In addition, the handling of the chemical solution is easy, and an excellent etching rate can be obtained. In the first and second methods, it is sufficient that an etching resist is formed on at least a metal layer serving as a capacitor electrode formed at a predetermined position on the substrate surface. As the etching resist, a commercially available photosensitive dry film or an alkali developing type resist ink can be used, but it is preferable to use a photosensitive dry film. Photosensitive dry film is the most versatile resist material in the printed wiring board manufacturing process. Not only is it possible to form low-cost resists, but it also has excellent workability. The etching resist to be used is not particularly limited. ), H-940 (manufactured by Hitachi Chemical Co., Ltd., trade name) and the like. Examples of commercially available alkaline development type resist inks include PER-20 (trade name, manufactured by Taiyo Ink Mfg. Co., Ltd.). An etching resist is formed on the metal layer to be the capacitor electrode on the substrate surface and on the dielectric thin film, and the circuit pattern is baked and developed. An aqueous sodium carbonate solution can be used for development, and an aqueous sodium hydroxide solution can be used for stripping the etching resist, which is also characterized by a small environmental load. Further, an etching resist may be formed only on the metal layer serving as the capacitor electrode by using an ink-like etching resist by screen printing or the like.
感光性ドライフィルムを用いる場合、 その膜厚は、 コンデンサ電極となる金 属層の 1〜 3倍の厚みであることが望ましい。 保護される金属層の厚みより薄 い場合では、 金属層と被エッチング層表面の段差の埋込み性が悪くボイドが発 生し、 エッチング不良を招きやすい。 また、 3倍を超えると、 エッチング性が 低下するためパターンの微細化が困難となる。 さらに望ましくは金属層の 2〜 3倍とすることである。 2〜3倍とすることで、 段差に対して良好な追従性を 有し、 かつエッチング性にも優れるからである。 When a photosensitive dry film is used, its thickness is desirably 1 to 3 times the thickness of the metal layer to be the capacitor electrode. If the thickness of the metal layer to be protected is smaller than the thickness of the metal layer to be etched, the gap between the metal layer and the surface of the layer to be etched is poorly embedded and voids are generated. And cause poor etching. On the other hand, when the ratio is more than three times, the etching property is reduced, so that it is difficult to miniaturize the pattern. More desirably, the thickness is two to three times the metal layer. By setting it to 2 to 3 times, it has good followability to steps and excellent etching properties.
第 1と第 2の方法において、 誘電体薄膜のエッチングが 2 0〜4 5 °Cで行わ れるコンデンサ内蔵多層配線板の製造方法である。 2 0 °Cを下回るとエツチン グレートが著しく低下するためエッチングに多大な時間を要し不経済である。 また、 4 5 t:を超えるとレジストの密着性が低下し、 エッチング不良を招きや すくなる。 したがって、 エッチング温度は 2 0〜4 5 °Cとするのが好ましい。 より好ましくは 2 0〜3 0 °Cとすることにより良好なエッチングレートとレジ スト密着性を両立でき、 作業性と歩留りの向上が図れるものである。 In the first and second methods, the method is a method for manufacturing a multilayer wiring board with a built-in capacitor, in which the dielectric thin film is etched at 20 to 45 ° C. If the temperature is lower than 20 ° C, the etching rate is remarkably reduced, so that a large amount of time is required for etching, which is uneconomical. On the other hand, if it exceeds 45 t :, the adhesiveness of the resist is reduced, and etching failure is likely to occur. Therefore, the etching temperature is preferably 20 to 45 ° C. More preferably, by setting the temperature to 20 to 30 ° C., a good etching rate and resist adhesion can be achieved at the same time, and workability and yield can be improved.
誘電体薄膜と第 1のコンデンサ電極との間に、 前記の酸化保護皮膜または自 己酸化皮膜として金属層を設けることが好ましい。 コンデンサ内蔵多層配線板 用材料に用いたものと同様のものを用いることができる。 It is preferable to provide a metal layer between the dielectric thin film and the first capacitor electrode as the above-mentioned oxidation protective film or self-oxidizing film. The same material as that used for the material for the multilayer wiring board with a built-in capacitor can be used.
(第 2のコンデンサ電極の形成) (Formation of the second capacitor electrode)
前記のコンデンサ内蔵多層配線板用材料またはコンデンサ内蔵多層配線板用 基板に含まれる金属箔または金属層を、 任意の部分を残してエッチングするこ とにより、 コンデンサ電極 (第 2のコンデンサ電極) を得ることができる。 ェ ツチングは公知の方法により行うことができる。 A capacitor electrode (second capacitor electrode) is obtained by etching a metal foil or a metal layer contained in the above-mentioned material for a multilayer wiring board with a built-in capacitor or a substrate for a multilayer wiring board with a built-in capacitor, leaving an arbitrary portion. be able to. Etching can be performed by a known method.
第 2のコンデンサ電極の形成は、 第 1のコンデンサ電極の形成と同時または 第 1のコンデンサ電極の形成後に行ってもよい。 特に、 第 2のコンデンサ電極 の形成を第 1のコンデンサ電極の形成と同時に行うと、 製造プロセス工程が簡 略化され、 製造日数が低減し、 経済性に優れる。 この場合には、 コンデンサ誘 電体を形成して、 その上に第 1のコンデンサ電極となる金属層を形成した後、 第 1および第 2のコンデンサ電極を同時にエッチングする。 The formation of the second capacitor electrode may be performed simultaneously with the formation of the first capacitor electrode or after the formation of the first capacitor electrode. In particular, when the formation of the second capacitor electrode is performed simultaneously with the formation of the first capacitor electrode, the manufacturing process is simplified, the number of manufacturing days is reduced, and the economy is excellent. In this case, a capacitor dielectric is formed, a metal layer to be a first capacitor electrode is formed thereon, and then the first and second capacitor electrodes are simultaneously etched.
2のコンデンサ電極が多層配線板のグランド層または電源層と共通である 場合には、 第 2のコンデンサ電極をグランド層または電源層の層に用いること が好ましい。 一般的にグランド層または電源層のパターンは配線パターンより も大きな面積を有する。 本発明において作製されるコンデンサ電極の面積は、. 誘電体薄膜上に形成される第 1のコンデンサ電極よりも誘電体薄膜を形成する ときに基板表面を被覆していた金属層をパターニングして形成した第 2のコン デンサ電極の方が大きくなるために、 第 2のコンデンサ電極をグランド層また は電源層に用いることが好ましいとするものである。 If the second capacitor electrode is common to the ground layer or power layer of the multilayer wiring board, use the second capacitor electrode as the ground layer or power layer. Is preferred. Generally, the pattern of the ground layer or the power supply layer has a larger area than the wiring pattern. The area of the capacitor electrode manufactured in the present invention is formed by patterning the metal layer covering the substrate surface when forming the dielectric thin film more than the first capacitor electrode formed on the dielectric thin film. Since the second capacitor electrode becomes larger, it is preferable to use the second capacitor electrode in a ground layer or a power supply layer.
(第 2のコンデンサ電極と導体回路を有する基板の導体との接続) 本発明の一実施形態である、 コンデンサ内蔵多層配線板用材料を用いてコン デンサ内層多層配線板を製造する場合は、 コンデンサ内蔵多層層配線板用材料 の銅箔面に、 絶縁層を介して導体回路を有する基板を積層してもよい。 このコ ンデンサ内層多層配線板においては、 第 2のコンデンサ電極と導体回路との接 続は:絶縁層を除去して電解めつきによって接続してもよいし (第 1の方法) ; 予め導電性ペーストが貫通穴に充填された絶縁層を用いることにより接続させ てもよい (第 2の方法)。 (Connection between Second Capacitor Electrode and Conductor on Substrate Having Conductor Circuit) In the case of manufacturing a capacitor inner-layer multilayer wiring board using a material for a multilayer wiring board with a built-in capacitor according to one embodiment of the present invention, the capacitor A substrate having a conductive circuit may be laminated on the copper foil surface of the built-in multilayer wiring board material via an insulating layer. In this capacitor inner layer multilayer wiring board, the connection between the second capacitor electrode and the conductor circuit may be performed by removing the insulating layer and connecting by electrolytic plating (first method); The connection may be made by using an insulating layer in which the paste is filled in the through holes (second method).
第 1の方法は、 第 1および第 2のコンデンサ電極およびコンデンサ誘電体を 形成後、 レーザ照射により露出された絶縁層を除去して穴を形成し、 内層とな つている導体回路を露出させる工程と;その基板表面に 0 . 1〜5 mの金属 層を形成する工程と;穴を含む任意の箇所を除いてめつきレジストを形成する 工程と;めっきレジストを形成した箇所以外の基板表面に 1 0〜5 0 mの金 属層を形成して層間の回路パターンを電気的に接続させる工程;基板表面に形 成した 0 . 1〜5 mの金属層をエッチング除去する工程と;少なくともコン デンサ誘電体と導体化された穴を含む任意の部分を残してエッチング除去する 工程を含んでいてもよい。 金属層、 めっきレジスト等については、 第 1のコン デンサ電極に用いたものと同様のものを用いることができる。 The first method is a step of forming a hole by removing the insulating layer exposed by laser irradiation after forming the first and second capacitor electrodes and the capacitor dielectric, and exposing a conductor circuit serving as an inner layer. A step of forming a metal layer of 0.1 to 5 m on the surface of the substrate; a step of forming a plating resist except for any part including a hole; and a step of forming a plating resist on the surface of the substrate other than the part where the plating resist is formed. Forming a metal layer of 10 to 50 m and electrically connecting circuit patterns between layers; etching and removing a metal layer of 0.1 to 5 m formed on the substrate surface; The method may include a step of etching and removing an arbitrary portion including a denser dielectric and a hole converted into a conductor. With respect to the metal layer, the plating resist, and the like, those similar to those used for the first capacitor electrode can be used.
第 2の方法は、 絶縁層となるプリプレダ等の絶縁材料にドリルゃレ一ザによ り 通穴を形成する工程と、 化学的な反応により金属化される導電性ペースト を、 スクリーン印刷等を用いて貫通穴へ充填する工程とを備えていてもよい。 導電性ぺ一ストは、 前記のコンデンサ内蔵多層配列用基板に用いる導電性べ一 ストと同様のものを用いることができる。 The second method involves forming a through-hole with a drill laser in an insulating material, such as a pre-preda, which is to be an insulating layer, and printing a conductive paste that is metallized by a chemical reaction on a screen. And filling the through-holes using the holes. As the conductive paste, the same conductive paste as that used for the above-described multilayer array substrate with a built-in capacitor can be used.
本発明の一実施形態である、 コンデンサ内蔵多層配線板用基板を用いてコン デンサ内蔵多層配線板を製造する場合は、 基板内部に導体眉間を接続するバイ ァホールが備えられているので、 特に導通は行わなくてよい。 ' In the case of manufacturing a multilayer wiring board with a built-in capacitor using a substrate for a multilayer wiring board with a built-in capacitor, which is one embodiment of the present invention, since a via hole is provided inside the board to connect between the conductor eyebrows, it is particularly conductive. Need not be performed. '
本発明の一実施形態である、 コンデンサ内蔵多層配線板用材料を用いてコン デンサ内層多層配線板を製造する場合には、 コンデンサ内蔵多層層配線板用材 料の銅箔面に、 絶縁層を介して金属箔 Bを積層することができる。 このコンデ ンサ内層多層配線板においては、 絶縁層および金属箔 Bを除去して穴形成後、 穴内に金属層を形成することにより接続してもよいし(第 1の方法);予め導電 性ペーストが貫通穴に充填された絶縁層を用いることにより接続してもよい In the case of manufacturing a capacitor internal multilayer wiring board by using a capacitor internal multilayer wiring board material according to an embodiment of the present invention, an insulating layer is interposed on the copper foil surface of the capacitor internal multilayer wiring board material. Metal foil B can be laminated. In this capacitor multilayer wiring board, after the insulating layer and the metal foil B are removed and a hole is formed, a connection may be made by forming a metal layer in the hole (first method); May be connected by using an insulating layer filled in a through hole.
(第 2の方法)。 (Second method).
第 1の方法においては、 絶縁層の除去はレ一ザにより行うことができ、 金属 箔 Bの除去はレ一ザまたはェツチングより行うことができる。 レーザを用いて 金属箔 Bと絶縁層を同時に除去して穴を形成すると、 製造プロセス工程が簡略 化され、 製造日数を低減し、 経済性に優れる。 このような製造方法を可能とす る金属箔 Bとしては、 レーザ光のエネルギーを吸収しやすい処理を施されてい ることが好ましい。 銅箔の場合、 このような処理としては、 酸化銅処理、 マイ クロエッチング処理、 粗化めつき処理などの表面粗化処理が有効であり、 その 表面粗さとしては 0 . l〜3 xmが好ましい。 0 . 1 m未満の場合には、 レ 一ザ光の吸収が十分でなく加工性に劣り、 3 /i mを超えると加工精度に劣る。 また銅箔の厚みとしては、 l〜1 8 ^ mが好ましい。 l ^ m未満の銅箔は取り 扱い性に劣り、 1 8 /i mを超える銅箔は加工性に劣る。 また、 銅表面の粗化処 理の他にニッケルなどのレーザ光を吸収しやすい金属層を表面に設けても良い。 このような金属層や基板表面の金属層を形成する方法としては、 例えば、 スパ ッ.夕リング法、 無電解めつき法、 電解めつき法及びこれらの組み合わせた方法 が挙げられる。 次に、 形成した穴に金属層を形成することにより、 金属箔 Bと金属箔 A (コ ンデンサ電極) とを電気的に接続することができる。 この電気的な接続は、 例 えば、 電解めつきにより、 または導電性ペーストの形成により行うことができ る。 第 1の方法は、 穴内を含む基板の両面に 0 . 1〜5 mの金属層を形成す る工程と、 穴部を含む任意の部分を残して基板表面に金属めつきレジストを形 成する工程と、 金属めつきにより、 穴部を含む部分に導体パターンを形成する 工程と、 不要な金属めつきレジストを除去する工程と、 不要な部分に形成され た 0 . 1〜 5 mの金属層を除去する工程とを含んでいてもよい。 金属層、 め つきレジスト等については、 第 1のコンデンサ電極に用いたものと同様のもの を用いることができる。 In the first method, the insulating layer can be removed by a laser, and the metal foil B can be removed by a laser or etching. If holes are formed by removing the metal foil B and the insulating layer at the same time using a laser, the manufacturing process is simplified, the number of manufacturing days is reduced, and the economy is excellent. The metal foil B that enables such a manufacturing method is preferably subjected to a process that easily absorbs the energy of laser light. In the case of copper foil, such a treatment is effective for surface roughening treatment such as copper oxide treatment, microetching treatment, roughening plating treatment, and the surface roughness is 0.1 to 3 xm. preferable. If it is less than 0.1 m, the absorption of laser light is not sufficient, resulting in poor workability. If it exceeds 3 / im, processing accuracy is poor. The thickness of the copper foil is preferably from 1 to 18 ^ m. Copper foil less than l ^ m is inferior in handleability, and copper foil exceeding 18 / im is inferior in workability. In addition to the copper surface roughening treatment, a metal layer such as nickel which easily absorbs laser light may be provided on the surface. Examples of a method for forming such a metal layer or a metal layer on the surface of a substrate include a sputter ring method, an electroless plating method, an electrolytic plating method, and a combination thereof. Next, by forming a metal layer in the formed hole, the metal foil B and the metal foil A (capacitor electrode) can be electrically connected. This electrical connection can be made, for example, by electroplating or by forming a conductive paste. The first method is to form a metal layer of 0.1 to 5 m on both sides of the substrate including the inside of the hole, and to form a metal-plated resist on the surface of the substrate except for an arbitrary portion including the hole. Process, forming a conductive pattern in a portion including a hole by metal plating, removing unnecessary metal-coated resist, and forming a 0.1 to 5 m metal layer in an unnecessary portion. Removing step. As the metal layer, the plating resist, and the like, the same ones as those used for the first capacitor electrode can be used.
なお、 コンデンサ内蔵多層配線板用材料の誘電体薄膜上に金属層 2を形成す る前に、穴を含む基板表面の両面に金属層を形成すると、穴内の金属層形成と、 第 1のコンデンサ電極となる金属層の形成が同時に行われるので好ましい。 金 属層の形成は、 穴内を含む基板の両面に 0 . 1〜5 ii mの金属層を形成するェ 程と、 穴部を含む任意の部分を残して基板表面に金属めつきレジストを形成す る工程と、金属めつきにより穴部を含む部分に導体パターンを形成する工程と、 金属めつきレジストを除去する工程と、 基板表面に露出された 0 . l〜5 i m の金属層をエッチング除去する工程とを備えていてもよい。 また、 金属箔 Bと 金属箔 A (コンデンサ電極) との電気的な接続は、 前に説明した導電性べ一ス トによって行ってもよい。 Before forming the metal layer 2 on the dielectric thin film of the material for the multilayer wiring board with a built-in capacitor, if the metal layers are formed on both sides of the substrate surface including the hole, the formation of the metal layer in the hole and the first capacitor This is preferable because the formation of the metal layer serving as the electrode is performed simultaneously. The metal layer is formed by forming a metal layer of 0.1 to 5 im on both sides of the substrate including the inside of the hole, and forming a metal plating resist on the surface of the substrate except for an arbitrary portion including the hole. Forming a conductive pattern in a portion including a hole by metal plating, removing a metal-plated resist, and etching the metal layer of 0.1 to 5 im exposed on the substrate surface. Removing step. Further, the electrical connection between the metal foil B and the metal foil A (capacitor electrode) may be performed by the conductive base described above.
第 2の方法において、 絶縁層となるプリプレダ等の絶縁材料にドリル穴明け やレーザ穴明けにより貫通穴を形成する工程と、 化学的な反応により金属化さ れる導電性ペーストを、 スクリーン印刷等を用いて貫通穴へ充填する工程とを 備えていてもよい。 導電性ペーストは、 前記のコンデンサ内蔵多層配列用基板 に用いる導電性ペーストと同様である。 In the second method, a step of forming a through-hole by drilling or laser drilling in an insulating material such as a pre-predder serving as an insulating layer, and a screen printing or the like using a conductive paste which is metallized by a chemical reaction. And filling the through-holes by using them. The conductive paste is the same as the conductive paste used for the above-mentioned substrate for a multilayer array with a built-in capacitor.
発明においては、 必要に応じて、 基板の両面または片面に、 さらに絶縁層 を介して回路層を 1層以上形成することにより、 3層以上のコンデンサ内蔵多 層配線板を得ることができる。 In the invention, if necessary, one or more circuit layers are formed on both sides or one side of the substrate with an insulating layer interposed therebetween, so that three or more layers with built-in capacitors can be obtained. A layer wiring board can be obtained.
本発明の一実施態様において、 コンデンサ内蔵多層配線板は、 第 1のコンデ ンサ電極を形成する導体層のパターンは全てコンデンサの電極を形成し、 誘電 体薄膜の投影面は第 1のコンデンサ電極の投影面を含み、 第 2のコンデンサ電 極を形成する導体層には第 2のコンデンサ電極とこの電極と電気的に絶縁され た少なくとも 1つのパタ一ンを有することができる。 In one embodiment of the present invention, in the multilayer wiring board with a built-in capacitor, the pattern of the conductor layer forming the first capacitor electrode forms all the electrodes of the capacitor, and the projection surface of the dielectric thin film is formed of the first capacitor electrode. The conductor layer including the projection surface and forming the second capacitor electrode may include a second capacitor electrode and at least one pattern electrically insulated from the second capacitor electrode.
本発明の一実施態様において、 これらの製造方法により作製したコンデンサ 内蔵多層配線板においては、 第 1のコンデンサ電極を形成する金属層のパター ンの下部には第 2のコンデンサ電極を形成する金属のパターンが存在する。 そ のために、 第 1のコンデンサ電極を形成する金属層に配線パターンを形成する と、 第 2のコンデンサ電極を形成する金属層との間に寄生容量が発生し、 電気 信号の伝送特性が劣化するという問題が発生し、 好ましくない。 したがって、 配線パターンは第 2のコンデンサ電極の金属層に設置することが好ましい。 また、 本発明の一実施態様において、 これらの製造方法により作製したコン デンサ内蔵多層配線板においては、 1 ) コンデンサの誘電体を形成する誘電体 薄膜の投影面に含まれる第 1のコンデンサ電極を有し、 2 ) 誘電体薄膜の端部 は全て第 1のコンデンサ電極を形成する導体層が第 2のコンデンサ電極に電気 的に接続されていてもよい。 これによると、 製造プロセス工程が簡略化され、 製造日数低減や経済性に優れたコンデンサ内蔵多層配線板である。 In one embodiment of the present invention, in the multilayer wiring board with a built-in capacitor manufactured by these manufacturing methods, the metal layer forming the second capacitor electrode is formed below the metal layer pattern forming the first capacitor electrode. There is a pattern. Therefore, if a wiring pattern is formed on the metal layer that forms the first capacitor electrode, a parasitic capacitance is generated between the metal layer and the metal layer that forms the second capacitor electrode, and the electrical signal transmission characteristics deteriorate. This is not preferable. Therefore, it is preferable that the wiring pattern is provided on the metal layer of the second capacitor electrode. Further, in one embodiment of the present invention, in the multilayer wiring board with built-in capacitors manufactured by these manufacturing methods, 1) the first capacitor electrode included in the projection surface of the dielectric thin film forming the dielectric of the capacitor is provided. 2) The conductor layer forming the first capacitor electrode may be electrically connected to the second capacitor electrode at all ends of the dielectric thin film. According to this, it is a multilayer wiring board with a built-in capacitor that simplifies the manufacturing process steps, reduces manufacturing days, and is economical.
本発明の一実施態様においては、 これらの製造方法により作成したコンデン サ内蔵が多層配線板は、 半導体チップを搭載してもよい。 コンデンサを基板に 内蔵しているため、 搭載部品の低減が可能であり、 小型の半導体装置を提供で さる。 In one embodiment of the present invention, a semiconductor chip may be mounted on a multilayer wiring board with a built-in capacitor manufactured by these manufacturing methods. Since the capacitor is built into the board, the number of components to be mounted can be reduced, and a small semiconductor device can be provided.
コンデンサ内蔵多層配線板の製造方法を具体的に挙げる。 A method for manufacturing a multilayer wiring board with a built-in capacitor will be specifically described.
次の製造方法は、金属箔の表面に比誘電率が 1 0〜 2 0 0 0でかつ膜厚が 0 . 0 .5〜 2 の誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を用 いるコンデンサ内蔵多層配線板の製造方法の具体例である。 (a— 1) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダ を介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の表面に 1. 0〜50 の金属層を形成する工程と、 3) その金属層の任意の部分を残し てエッチング除去して所望の第 1のコンデンサ電極を形成する工程と、 4) 誘 電体薄膜の少なくとも第 1のコンデンサ電極を含む任意の部分を残してエッチ ング除去して所望のコンデンサ誘電体を形成する工程と、 5) 誘輋体薄膜を除 去して現れた金属箔の少なくともコンデンサ誘電体を含む任意の部分を残して エッチング除去して所望の第 2のコンデンサ電極を含む導体パターンを形成す る工程を有する。 The following manufacturing method uses a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.5 to 2 is provided on the surface of a metal foil. This is a specific example of a method for manufacturing a multilayer wiring board with a built-in capacitor. (a-1) 1) A step of laminating a metal foil of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader, and 2) A metal of 1.0 to 50 Forming a layer, 3) etching away leaving an arbitrary portion of the metal layer to form a desired first capacitor electrode, and 4) forming at least a first capacitor electrode of the dielectric thin film. 5) forming a desired capacitor dielectric by etching away leaving any part including the capacitor dielectric; and 5) removing the dielectric thin film to leave at least any part of the metal foil that has appeared, including the capacitor dielectric. Forming a conductor pattern including a desired second capacitor electrode by etching.
(a-2) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の表面に 0. 1〜5 mの金属層を形成する工程と、 3) 第 1めコンデンサ電極を含む任意 の部分を残して金属めつきレジストを形成する工程と、 4) 金属めつきにより 10〜 50 z^mの第 1のコンデンサ電極を形成する工程と、 5) 金属めつきレ ジストを除去する工程と、 6) 誘電体薄膜の表面に形成した 0. l〜5 /mの 金属層をエッチング除去する工程と、 7) 誘電体薄膜の少なくとも第 1のコン デンサ電極を含む任意の部分を残してエッチング除去して所望のコンデンサ誘 電体を形成する工程と、 8) 誘電体薄膜を除去して現れた金属箔の少なくとも コンデンサ誘電体を含む任意の部分を残してエッチング除去して所望の第 2の コンデンサ電極を含む導体パターンを形成する工程を有する。 (a-2) 1) a step of laminating on a substrate having a conductor circuit via a pre-preder on a metal foil surface of a material for a multilayer wiring board with a built-in capacitor; and Forming a metal layer; 3) forming a metal-plated resist while leaving any portion including the first capacitor electrode; and 4) forming a first capacitor of 10 to 50 z ^ m by metal-plated. Forming an electrode; 5) removing a metal-plated resist; 6) etching away a 0.1 to 5 / m metal layer formed on the surface of the dielectric thin film; and 7) dielectric. A step of forming a desired capacitor dielectric by etching and removing an arbitrary portion including at least the first capacitor electrode of the body thin film; and8) at least a capacitor of a metal foil that has emerged by removing the dielectric thin film. Etch away leaving any part including the dielectric and leave the desired second Forming a conductor pattern including a capacitor electrode.
(a— 3) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の表面の任意 の部分に化学的な反応により金属化される導電性べ一ストを用いて 10〜50 mの金属層を形成して所望の第 1のコンデンサ電極を形成する工程と、 3) 誘電体薄膜の少なくとも第 1のコンデンサ電極を含む任意の部分を残してエツ チ グ除去して所望のコンデンサ誘電体を形成する工程と、 4) 誘電体薄膜を 除去して現れた金属箔の少なくともコンデンサ誘電体を含む任意の部分を残し てエツチング除去して所望の第 2のコンデンサ電極を含む導体パ夕一ンを形成 する工程を有する。 (a-3) 1) a step of laminating a metal foil surface of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; Forming a desired first capacitor electrode by forming a metal layer of 10 to 50 m using a conductive paste which is metallized by a reaction; and3) at least a first capacitor electrode of a dielectric thin film. Removing the etching to form a desired capacitor dielectric while leaving any part including the following; and 4) removing the dielectric thin film and leaving at least any part of the metal foil that has appeared containing the capacitor dielectric. Forming a conductor pattern including a desired second capacitor electrode by etching.
(a— 4) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の任意の部分 を残してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 3) コンデンサ誘電体を形成した基板表面に 10〜50 xmの金属層を形成するェ 程と、 4) その金属層の任意の部分を残してエッチング除去して所望の第 1の コンデンサ電極、 第 2のコンデンサ電極およびコンデンサ電極と電気的に絶縁 された任意の導体パターンを形成する工程を有する。 (a-4) 1) laminating on a substrate having a conductive circuit via a pre-preder on a metal foil surface of a material for a multilayer wiring board with a built-in capacitor; and 2) etching and removing any part of the dielectric thin film while leaving it 3) forming a metal layer of 10 to 50 xm on the surface of the substrate on which the capacitor dielectric has been formed, and 4) etching leaving any part of the metal layer. Removing to form a desired first capacitor electrode, second capacitor electrode, and any conductive pattern electrically insulated from the capacitor electrode.
(a- 5) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の表面に 10 〜50 の金属層を形成する工程と、 3) その金属層の任意の部分を残して エッチング除去して所望の第 1のコンデンサ電極を形成する工程と、 4) 誘電 体薄膜の少なくとも第 1のコンデンサ電極を含む任意の部分を残してエツチン グ除去して所望のコンデンサ誘電体を形成する工程と、 5) 誘電体薄膜を除去 して現れた金属箔の任意の箇所をエッチング除去して硬化したプリプレダの絶 緣層を露出させる工程と、 6) レーザ照射により露出された絶縁層を除去して 穴を形成し、 内層となっている導体回路を露出させる工程と、 7) その基板表 面に 0. 1〜5 を形成する工程と、 8) 穴を含む任意の箇所を除 いてめつきレジストを形成する工程と、 9) めっきレジストを形成した箇所以 外の基板表面に 10〜50 の金属層を形成して層間の回路パターンを電気 的に接続させる工程と、 10) 基板表面に形成した 0. l〜5 ^mの金属層を エッチング除去する工程と、 11) 少なくともコンデンサ誘電体と導体化され た穴を含む任意の部分を残してエッチング除去して所望の第 2のコンデンサ電 極を含む導体パターンを形成する工程を有する。 (a-5) 1) A step of laminating on a substrate having a conductor circuit via a pre-preder on the surface of a metal foil of a material for a multilayer wiring board with a built-in capacitor; and Forming) a desired first capacitor electrode by etching away leaving any portion of the metal layer; and4) an optional portion including at least the first capacitor electrode of the dielectric thin film. 5) forming a desired capacitor dielectric by etching away leaving a portion, and 5) removing the dielectric thin film to remove any part of the metal foil that has appeared by etching to cure the hardened pre-predeer insulating layer. Exposing; 6) removing the insulating layer exposed by laser irradiation to form a hole to expose the inner conductor circuit; and 7) 0.1 to 5 on the substrate surface. 8) A step of forming a plating resist by removing any part including a hole; and 9) Forming a 10 to 50 metal layer on the substrate surface other than the part where the plating resist is formed. A step of electrically connecting circuit patterns between layers; 10) a step of etching away a metal layer of 0.1-5 m formed on the surface of the substrate; and 11) at least a hole formed as a conductor with a capacitor dielectric. And forming a conductor pattern including a desired second capacitor electrode by etching away leaving any portion including the second capacitor electrode.
( a - 6 ) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の表面に 0. 1〜5 / mの金属層を形成する工程と、 3) 第 1のコンデンサ電極を含む任意 の部分を残して金属めつきレジストを形成する工程と、 4) 金属めつきにより 10〜 50 mの第 1のコンデンサ電極を形成する工程と、 5) 金属めつきレ ジストを除去する工程と、. 6) 誘電体薄膜の表面に形成した 0. 1〜5 mの 金属層をエッチング除去する工程と、 7) 誘電体薄膜の少なくとも第 1のコン デンサ電極を含む任意の部分を残してエッチング除去して所望のコンデンサ誘 電体を形成する工程と、 8) 誘電体薄膜を除去して現れた金属箔の任意の箇所 をエッチング除去して硬化したプリプレダの絶縁層を露出させる工程と、 9) レーザ照射により露出された絶縁層を除去して穴を形成し、 内層となっている 導体回路を露出させる工程と、 10) その基板表面に 0. l〜5 imの金属層 を形成する工程と、 1 1) 穴を含む任意の箇所を除いてめつきレジストを形成 する工程と、 12) めっきレジストを形成した箇所以外の基板表面に 10〜5 0 mの金属層を形成して層間の回路パターンを電気的に接続させる工程と、 13) 基板表面に形成した 0. 1〜5 xmの金属層をエッチング除去する工程 と、 14) 少なくともコンデンサ誘電体と導体化された穴を含む任意の部分を 残してエッチング除去して所望の第 2のコンデンサ電極を含む導体パターンを 形成する工程を有する。 (a-6) 1) laminating on the surface of the metal foil of the material for the multilayer wiring board with a built-in capacitor to the substrate having a conductive circuit via a pre-predader, and 2) applying 0. Forming a metal layer of 1 to 5 / m; 3) forming a metal plating resist while leaving any part including the first capacitor electrode; and 4) forming a metal plating resist of 10 to 50 m. A) forming a first capacitor electrode; 5) removing a metal plating resist; and 6) etching and removing a 0.1 to 5 m metal layer formed on the surface of the dielectric thin film. 7) a step of forming a desired capacitor dielectric by etching away leaving at least an arbitrary portion of the dielectric thin film including at least the first capacitor electrode; and 8) a metal appearing after removing the dielectric thin film. Exposing any part of the foil by etching to expose the cured insulating layer of the pre-preda; and 9) Removing the insulating layer exposed by laser irradiation to form holes and expose the inner conductor circuit. And 10) 0.1 to 5 im metal on the substrate surface Layer forming step, 1 1) step of forming a plating resist except for any part including a hole, and 12) a metal layer of 10 to 50 m on the substrate surface other than the part where the plating resist is formed. Forming and electrically connecting circuit patterns between layers; 13) Etching and removing a 0.1 to 5 xm metal layer formed on the substrate surface; and 14) Conducting at least a capacitor dielectric. Forming a conductor pattern including a desired second capacitor electrode by etching and removing an arbitrary portion including a hole.
(a— 7) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜の表面の任意 の部分に化学的な反応により金属化される導電性ペーストを用いて 10〜50 mの金属層を形成して所望の第 1のコンデンサ電極を形成する工程と、 3 ) 誘電体薄膜の少なくとも第 1のコンデンサ電極を含む任意の部分を残してエツ チング除去して所望のコンデンサ誘電体を形成する工程と、 4) 誘電体薄膜を 除去して現れた金属箔の任意の箇所をエッチング除去して硬化したプリプレダ の絶縁層を露出させる工程と、 5) レーザ照射により露出された絶縁層を除去 し.て穴を形成し、 内層となっている導体回路を露出させる工程と、 6) その基 板表面に 0. 1〜5 の金属層を形成する工程と、 7) 穴を含む任意の箇所 を除いてめつきレジストを形成する工程と、 8) めっきレジストを形成した箇 所以外の基板表面に 10〜50 mの金属層を形成して層間の回路パターンを. 電気的に接続させる工程と、 9) 基板表面に形成した 0. 1〜5 ΠΙの金属層 をエッチング除去する工程と、 10) 少なくともコンデンサ誘電体と導体化さ れた穴を含む任意の部分を残してエッチング除去して所望の第 2のコンデンサ 電極を含む導体パターンを形成する工程を有する。 (a-7) 1) a step of laminating a metal foil surface of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader; A step of forming a desired first capacitor electrode by forming a metal layer of 10 to 50 m using a conductive paste which is metallized by the reaction, and 3) including at least a first capacitor electrode of a dielectric thin film A step of forming a desired capacitor dielectric by etching while leaving an arbitrary portion; and 4) an insulating layer of a pre-preda cured by etching and removing an arbitrary portion of a metal foil that appears by removing a dielectric thin film. 5) removing the insulating layer exposed by the laser irradiation, forming a hole to expose the inner conductor circuit, and 6) exposing the substrate surface to 0.1 to 0.1%. 5) forming a metal layer and 7) including holes Any place 8) forming a 10-50 m metal layer on the surface of the substrate other than where the plating resist is formed, and connecting the circuit patterns between the layers. 9) a step of etching away a 0.1 to 5 mm metal layer formed on the surface of the substrate; and10) a desired step of etching and removing at least an arbitrary portion including at least a capacitor dielectric and a conductive hole. Forming a conductor pattern including the second capacitor electrode.
(a— 8) 1) コンデンサ内蔵多層配線板用材料の金属箔の面にプリプレダを 介して導体回路を有する基板に積層する工程と、 2) 誘電体薄膜任意の部分を 残してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 3) 誘 電体薄膜を除去して現れた金属箔の任意の箇所をエッチング除去して硬化した プリプレダの絶縁層を露出させる工程と、 4) レーザ照射により露出された絶 緣層を除去して穴を形成し、 内層となっている導体回路を露出させる工程と、 5) コンデンサ誘電体を形成した基板表面と穴内の表面に 10〜50 zmの金 属層を形成する工程と、 6) 少なくともコンデンサ誘電体と導体化された穴を 含む任意の部分を残してエッチング除去して所望の第 2のコンデンサ電極を含 む導体パターンを形成する工程を有する。 (a-8) 1) A step of laminating a metal foil surface of a material for a multilayer wiring board with a built-in capacitor on a substrate having a conductive circuit via a pre-predader, and 2) Etching and removing any part of the dielectric thin film 3) a step of forming a desired capacitor dielectric, 3) a step of exposing a hardened pre-preda insulating layer by removing an arbitrary portion of the metal foil that has appeared by removing the dielectric thin film, and 4) laser irradiation. Forming a hole by removing the insulating layer exposed by the step (c), and exposing the conductor circuit as an inner layer; and5) 10 to 50 zm of gold on the surface of the substrate on which the capacitor dielectric is formed and the surface in the hole. Forming a metal layer, and 6) forming a conductor pattern including a desired second capacitor electrode by etching and removing at least an arbitrary portion including a capacitor dielectric and a hole converted into a conductor. .
次の製造方法は、 基板内部に導体層間を接続するバイァホールを有し, か つ、 表面に平滑な金属層を有する基板の表面に比誘電率が 10〜2000で、 かつ、 膜厚が 0. 05〜2 mの誘電体薄膜を形成したことを特徴とするコン デンサ内蔵多層配線板用基板を内層板として用いるコンデンサ内蔵多層配線板 の製造方法の具体例である。 In the following manufacturing method, the substrate has a via hole for connecting the conductor layers inside the substrate, has a smooth metal layer on the surface, has a relative dielectric constant of 10 to 2,000, and has a film thickness of 0. This is a specific example of a method for manufacturing a multilayer wiring board with a built-in capacitor, which uses a substrate for a multilayer wiring board with a built-in capacitor characterized by forming a dielectric thin film of 05 to 2 m as an inner layer board.
(b— 1) 1)誘電体薄膜の表面に 10〜50 mの金属層を形成する工程と、 2) その金属層の任意の部分を残してエッチング除去して所望の第 1のコンデ ンサ電極を形成する工程と、 3) 誘電体薄膜の少なくとも第 1のコンデンサ電 極を含む任意の部分を残してエッチング除去して所望のコンデンサ誘電体を形 成する工程と、 4) 誘電体薄膜を除去して現れた金属層の少なくともコンデン サ誘電体を含む任意の部分を残してエッチング除去して所望の第 2のコンデン サ電極を含む導体パターンを形成する工程を有する。 (b-1) 1) a step of forming a 10 to 50 m metal layer on the surface of the dielectric thin film; and 2) a desired first capacitor electrode by etching and removing any part of the metal layer. Forming a desired capacitor dielectric by etching away the dielectric thin film, leaving at least an arbitrary portion including at least the first capacitor electrode; and 4) removing the dielectric thin film. The metal layer that has appeared is etched away leaving at least an arbitrary portion including the capacitor dielectric to obtain a desired second capacitor. Forming a conductor pattern including the electrode.
(b— 2) 1) 誘電体薄膜の表面に 0. 1〜5 の金属層を形成する工程 と、 2) 第 1のコンデンサ電極を含む任意の部分を残して金属めつきレジスト を形成する工程と、 3) 金属めつきにより 10〜50 mの第 1のコンデンサ 電極を形成する工程と、 4) 金属めつきレジストを除去する工程と、 5) 誘電 体薄膜の表面に形成した 0.1〜5 mの金属層をエッチング除去する工程と、 6) 誘電体薄膜の少なくとも第 1のコンデンサ電極を含む任意の部分を残して エッチング除去して所望のコンデンサ誘電体を形成する工程と、 7) 誘電体薄 膜を除去して現れた金属層の少なくともコンデンサ誘電体を含む任意の部分を 残してエッチング除去して所望の第 2のコンデンサ電極を含む導体パターンを 形成する工程を有する。 (b-2) 1) a step of forming a metal layer of 0.1 to 5 on the surface of the dielectric thin film; and 2) a step of forming a metal plating resist while leaving any part including the first capacitor electrode. 3) a step of forming a 10 to 50 m first capacitor electrode by metal plating; 4) a step of removing the metal plating resist; and 5) a 0.1 to 5 m formed on the surface of the dielectric thin film. 6) etching away the metal layer of 6), forming a desired capacitor dielectric by etching away the dielectric thin film leaving at least an arbitrary portion including at least the first capacitor electrode, and 7) forming the dielectric thin film. Forming a conductive pattern including a desired second capacitor electrode by removing the film by etching away leaving at least an arbitrary portion of the exposed metal layer including the capacitor dielectric.
(b— 3) 1) 誘電体薄膜の表面の任意の部分に化学的な反応により金属化さ れる導電性ペーストを用いて 10〜50 mの金属層を形成して所望の第 1の コンデンサ電極を形成する工程と、 2) 誘電体薄膜の少なくとも第 1のコンデ ンサ電極を含む任意の部分を残してエッチング除去して所望のコンデンサ誘電 体を形成する工程と、 3) 誘電体薄膜を除去して現れた金属層の少なくともコ ンデンサ誘電体を含む任意の部分を残してエッチング除去して所望の第 2のコ ンデンサ電極を含む導体パターンを形成する工程を有することを特徴とするコ ンデンサ内蔵多層配線板の製造方法。 (b-3) 1) Using a conductive paste that is metallized by a chemical reaction on any part of the surface of the dielectric thin film to form a metal layer of 10 to 50 m, and forming the desired first capacitor electrode 2) a step of forming a desired capacitor dielectric by etching and removing any part of the dielectric thin film including at least a portion including the first capacitor electrode; and 3) removing the dielectric thin film. Forming a conductor pattern including a desired second capacitor electrode by etching and removing at least an arbitrary portion including the capacitor dielectric of the metal layer appearing. Manufacturing method of wiring board.
(b— 4) 1) 誘電体薄膜の任意の部分を残してエッチング除去して所望のコ ンデンサ誘電体を形成する工程と、 2) コンデンサ誘電体を形成した基板表面 に 10〜50 の金属層を形成する工程と、 3) その金属層の任意の部分を 残してエッチング除去して所望の第 1のコンデンサ電極、 第 2のコンデンサ電 極およびコンデンサ電極と電気的に絶縁された任意の導体パターンを形成する 工程を有する。 (b-4) 1) a step of forming a desired capacitor dielectric by etching and removing any part of the dielectric thin film; and 2) a 10-50 metal layer on the surface of the substrate on which the capacitor dielectric is formed. And 3) a desired first capacitor electrode, a second capacitor electrode, and any conductor pattern electrically insulated from the capacitor electrode by etching away leaving any portion of the metal layer. Forming a step.
の製造方法は、金属箔の片面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜 2 / mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料を、 金属箔が絶縁材料と接するように絶縁材料の少なくとも片面に設けた基板を用 いるコンデンサ内蔵多層配線板の製造方法の具体例に関する。 The method for manufacturing a material for a multilayer wiring board with a built-in capacitor in which a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 / m is provided on one side of a metal foil, The present invention relates to a specific example of a method for manufacturing a multilayer wiring board with a built-in capacitor using a substrate provided on at least one surface of an insulating material such that a metal foil is in contact with the insulating material.
(c一 1) 1) 基板表面の誘電体薄膜上の所定の位置にコンデンサ電極とな る金属層を形成する工程と、 2) 少なくとも基板表面の前記金属層上にエッチ ングレジストを形成する工程と、 3) キレート剤と過酸化水素を含むエツチヤ ントによって、 誘電体薄膜をウエットエッチングする工程と、 4)'ウエットェ ツチング後にエッチングレジストを除去する工程とを有する。 (c-1) 1) a step of forming a metal layer to be a capacitor electrode at a predetermined position on the dielectric thin film on the substrate surface; and 2) a step of forming an etching resist on at least the metal layer on the substrate surface. And 3) a step of wet-etching the dielectric thin film with an etchant containing a chelating agent and hydrogen peroxide; and 4) a step of removing the etching resist after wet-etching.
(c一 2) 1) 基板表面の誘電体薄膜上の所定の位置にコンデンサ電極とな る金属層を形成する工程と、 2) 少なくとも基板表面の前記金属層上にエッチ ングレジストを形成する工程と、 3) 硫酸、 塩酸、 りん酸、 硝酸及び酢酸から なる群から選ばれる少なくとも 1つの酸と過酸化水素を含むエツチャントによ つて、 誘電体薄膜をウエットエッチングする工程と、 4) ウエットエッチング 後にエッチングレジストを除去する工程とを有する。 (c-1) 1) a step of forming a metal layer serving as a capacitor electrode at a predetermined position on the dielectric thin film on the substrate surface; and 2) a step of forming an etching resist on at least the metal layer on the substrate surface. 3) a step of wet-etching the dielectric thin film with an etchant containing hydrogen peroxide and at least one acid selected from the group consisting of sulfuric acid, hydrochloric acid, phosphoric acid, nitric acid and acetic acid; and 4) after the wet etching. Removing the etching resist.
次の製造方法は、 金属箔 Aの片面に比誘電率が 10〜2000でかつ膜厚が 0. 05〜2 mの誘電体薄膜が設けられたコンデンサ内蔵多層配線板用材料 を用いるコンデンサ内蔵多層配線板の製造方法の具体例である。 The following manufacturing method uses a multilayer wiring board with a built-in capacitor that uses a dielectric multilayer board with a dielectric thin film with a relative dielectric constant of 10 to 2000 and a thickness of 0.05 to 2 m on one side of metal foil A. It is a specific example of a method for manufacturing a wiring board.
(d— 1) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に絶縁材料 を介して金属箔 Bを積層し基板とする工程と、 2) 金属箔 Bの任意の箇所をェ ツチング除去して、 上記絶縁材料から形成された絶縁層を露出させる工程と、 3) レ一ザ照射により、 露出された絶縁層を除去して穴を形成し、 金属箔 Aを 露出させる工程と、 4)穴内を含む基板表面の両面に金属層を形成する工程と、 5) コンデンサ内蔵多層配線板用材料の誘電体薄膜上の金属層から任意の形状 の第 1のコンデンサ電極パターンをエッチングで形成する工程と、 6) 露出さ れた誘電体薄膜から第 1のコンデンサ電極パターンを含む任意の形状のコンデ ンサ誘電体をエッチングで形成する工程と、 7) 誘電体薄膜を除去して現れた 金.属箔 Aからコンデンサ誘電体パターンを含む任意の形状の第 2のコンデンサ 電極をエツチングで形成する工程を有する。 ( d— 2 ) 1 ) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に絶縁材料 を介して金属箔 Bを積層し基板とする工程と、 2 ) 金属箔 Bの任意の箇所にレ 一ザ照射することにより、 金属箔 Bと上記絶縁材料から形成された絶縁層とを 同時に除去して穴を形成し、 金属箔 Aを露出させる工程と、 3 ) 穴内を含む基 板表面の両面に金属層を形成する工程と、 4 ) コンデンサ内蔵多層配線板用材 料の誘電体薄膜上の金属層から任意の形状の第 1のコンデンサ電極パターンを エッチングで形成する工程と、 5 ) 露出された誘電体薄膜から第 1のコンデン サ電極パターンを含む任意の形状のコンデンサ誘電体をエツチングで形成する 工程と、 6 ) 誘電体薄膜を除去して現れた金属箔 Aからコンデンサ誘電体パ夕 ーンを含む任意の形状の第 2のコンデンサ電極をエツチングで形成する工程を 有する。 (d-1) 1) A process of laminating a metal foil B on the surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; 2) Etching an arbitrary portion of the metal foil B Removing the insulating layer formed from the insulating material, and 3) removing the exposed insulating layer by laser irradiation to form a hole and exposing the metal foil A, 4) a step of forming metal layers on both sides of the substrate surface including the inside of the holes, and 5) forming a first capacitor electrode pattern of any shape from the metal layer on the dielectric thin film of the multilayer wiring board material with built-in capacitors by etching. 6) a step of etching a capacitor dielectric of an arbitrary shape including the first capacitor electrode pattern from the exposed dielectric thin film, and 7) a step of removing the dielectric thin film to form gold. . Any including capacitor dielectric pattern from metal foil A A second capacitor electrode of Jo comprising forming at etching. (d-2) 1) a process of laminating a metal foil B on the surface of the metal foil A of the material for the multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; Irradiating the metal foil B and the insulating layer formed from the insulating material at the same time to form a hole, thereby exposing the metal foil A; and 3) forming a hole on both sides of the substrate surface including the inside of the hole. Forming a metal layer; 4) etching a first capacitor electrode pattern of any shape from the metal layer on the dielectric thin film of the multilayer wiring board material with a built-in capacitor; and 5) exposing the exposed dielectric. Forming a capacitor dielectric of an arbitrary shape including the first capacitor electrode pattern by etching from the body thin film; and6) removing the capacitor dielectric pattern from the metal foil A that has appeared after removing the dielectric thin film. Including a second capacitor electrode of any shape A step of forming at Tsuchingu.
( d - 3 ) 1 ) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意の 箇所に貫通穴が設けられかつその貫通穴が熱硬化性樹脂と金属フィラーを含む 導電性ペーストで充填されている絶縁材料を介して金属箔 Bを積層し基板とす る工程と、 2 )基板表面の少なくとも誘電体薄膜側に金属層を形成する工程と、 3 ) コンデンサ内蔵多層配線板用材料の誘電体薄膜上の金属層から任意の形状 の第 1のコンデンサ電極パターンをエッチングで形成する工程と、 4 ) 露出さ れた誘電体薄膜から第 1のコンデンサ電極パターンを含む任意の形状のコンデ ンサ誘電体をエッチングで形成する工程と、 5 ) 誘電体薄膜を除去して現れた 金属箔 Aにコンデンサ誘電体パターンを含む任意の形状の第 2のコンデンサ電 極をエツチングで形成する工程を有する。 (d-3) 1) A through-hole is provided at an arbitrary location on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor, and the through-hole is filled with a conductive paste containing a thermosetting resin and a metal filler. 2) forming a metal layer on at least the dielectric thin film side of the substrate surface, 3) forming a metal layer on at least the dielectric thin film side of the substrate surface, and 3) forming a material for a multilayer wiring board with a built-in capacitor. Forming a first capacitor electrode pattern of an arbitrary shape by etching from a metal layer on the dielectric thin film; and 4) a capacitor of an arbitrary shape including the first capacitor electrode pattern from the exposed dielectric thin film. A step of forming a dielectric by etching; and 5) a step of etching by etching a second capacitor electrode having an arbitrary shape including a capacitor dielectric pattern on the metal foil A that has appeared after removing the dielectric thin film.
( d— 4 ) 1 ) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意の 箇所に貫通穴が設けられかつその貫通穴が化学的な反応により金属化される導 電性ペース卜で充填されている絶縁材料を介して金属箔 Bを積層し基板とする 工程と、 2 ) 基板表面の少なくとも誘電体薄膜側に金属層を形成する工程と、 3 ) コンデンサ内蔵多層配線板用材料の誘電体薄膜上の金属層から任意の形状 の第 1のコンデンサ電極パターンをエッチングで形成する工程と、 4 ) 露出さ れた誘電体薄膜から第 1のコンデンサ電極パターンを含む任意の形状のコンデ ンサ誘電体をエッチングで形成する工程と、 5) 誘電体薄膜を除去して現れた 金属箔 Aからコンデンサ誘電体パターンを含む任意の形状の第 2のコンデンサ 電極をエツチングで形成する工程を有する。 (d-4) 1) A conductive paste in which a through-hole is provided at an arbitrary point on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through-hole is metallized by a chemical reaction. A process of laminating a metal foil B via an insulating material filled with a material to form a substrate, 2) a process of forming a metal layer on at least the dielectric thin film side of the substrate surface, and 3) a material for a multilayer wiring board with a built-in capacitor. Forming a first capacitor electrode pattern of an arbitrary shape from a metal layer on the dielectric thin film by etching, and Forming a capacitor dielectric of an arbitrary shape including the first capacitor electrode pattern from the obtained dielectric thin film by etching; and5) converting the capacitor dielectric pattern from the metal foil A that has appeared after removing the dielectric thin film. And forming a second capacitor electrode of an arbitrary shape by etching.
(d-5) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に絶縁材料 を介して金属箔 Bを積層し基板とする工程と、 2) 金属箔 Bの任意の箇所をェ ツチング除去して、 上記絶縁材料から形成された絶縁層を露出させる工程と、 3) レーザ照射により露出された絶縁層を除去して穴を形成し、 金属箔 Aを露 出させる工程と、 4) 穴内を含む基板の両面に 0. 1〜5 mの金属層を形成 する工程と、 5) 第 1のコンデンサ電極となる部分と穴部を含む任意の部分を 残して基板表面に金属めつきレジストを形成する工程と、 6) 金属めつきによ り、 上記の第 1のコンデンサ電極となる部分と穴部を含む部分に導体パターン を形成する工程と、 7) 金属めつきレジストを除去する工程と、 8) 基板表面 に露出された 0. 1〜 5 mの金属層をエッチング除去する工程と、 9) 露出 された誘電体薄膜から第 1のコンデンサ電極パターンを含む任意の形状のコン デンサ誘電体をエッチングで形成する工程と、 10) 誘電体薄膜を除去して現 れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パターンを含む任意 の形状の第 2のコンデンサ電極を形成する工程と、 11) 露出された金属箔 B をエッチングにより回路形成する。 (d-5) 1) A process of laminating a metal foil B on the surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate, and 2) Etching an arbitrary portion of the metal foil B. Removing to expose the insulating layer formed from the insulating material; 3) removing the insulating layer exposed by laser irradiation to form a hole, thereby exposing the metal foil A; 4). A step of forming a 0.1 to 5 m metal layer on both sides of the substrate including the inside of the hole, and 5) a metal-plated resist on the surface of the substrate except for a portion serving as the first capacitor electrode and an arbitrary portion including the hole. 6) a step of forming a conductor pattern on the part including the first capacitor electrode and the part including the hole by metal plating, and 7) a step of removing the metal plating resist. 8) etching away the 0.1-5 m metal layer exposed on the substrate surface; 9) A step of etching a capacitor dielectric of an arbitrary shape including the first capacitor electrode pattern from the obtained dielectric thin film by etching; and10) etching the metal foil A, which is obtained by removing the dielectric thin film, by etching. Forming a second capacitor electrode having an arbitrary shape including a capacitor dielectric pattern; and 11) forming a circuit by etching the exposed metal foil B.
(d-6) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に絶縁材料 を介して金属箔 Bを積層し基板とする工程と、 2) 金属箔 Bの任意の箇所にレ 一ザ照射することにより、 金属箔 Bと上記絶縁材料から形成された絶緣層とを 同時に除去して穴を形成し、 金属箔 Aを露出させる工程と、 3) 穴内を含む基 板の両面に 0. 1〜5 の金属層を形成する工程と、 4) 第 1のコンデンサ 電極となる部分と穴部を含む任意の部分を残して基板表面に金属めつきレジス ト.を形成する工程と、 5) 金属めつきにより、 上記の第 1のコンデンサ電極と なる部分と穴部を含む部分に導体パターンを形成する工程と、 6) 金属めつき レジストを除去する工程と、 7) 基板表面に露出された 0. l〜5 ^mの金属 層をエッチング除去する工程と、 ) 露出された誘電体薄膜から、 第 1のコン デンサ電極パターンを含む任意の形状のコンデンサ誘電体をエッチングで形成 する工程と、 9) 誘電体薄膜を除去して現れた金属箔 Aから、 コンデンサ誘電 体パターンを含む任意の形状の第 2のコンデンサ電極を形成する工程と、 10) 露出された金属箔 Bをエッチングにより回路形成する工程を有する。 (d-6) 1) a process of laminating a metal foil B on the surface of the metal foil A of the material for the multilayer wiring board with a built-in capacitor via an insulating material to form a substrate; By irradiating, the metal foil B and the insulating layer formed from the insulating material are simultaneously removed to form a hole, thereby exposing the metal foil A. 4) a step of forming a metal layer of 1 to 5; 4) a step of forming a metal plating resist on the surface of the substrate except for a portion to be a first capacitor electrode and any portion including a hole. ) A step of forming a conductive pattern on the portion including the first capacitor electrode and the portion including the hole by metal plating; and 6) metal plating. Removing the resist; 7) etching away the 0.1-5 m metal layer exposed on the substrate surface; and) including the first capacitor electrode pattern from the exposed dielectric thin film. 9) a step of forming a capacitor dielectric of an arbitrary shape by etching, and 9) a step of forming a second capacitor electrode of an arbitrary shape including a capacitor dielectric pattern from the metal foil A that has appeared after removing the dielectric thin film. And 10) forming a circuit by etching the exposed metal foil B.
(d-7) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意の 箇所に貫通穴が設けられかつその貫通穴が熱硬化性樹脂と金属フィラーを含む 導電性ペーストで充填されている絶縁材料を介して金属箔 Bを積層し基板とす る工程と、 2) 基板の少なくとも誘電体薄膜側の表面に 0. l〜5 ^mの金属 層を形成する工程と、 3) 第 1のコンデンサ電極となる部分を含む任意の部分 を残して基板表面に金属めつきレジストを形成する工程と、 4) 金属めつきに より第 1のコンデンサ電極となる部分を含む部分に導体パターンを形成するェ 程と、 5) 金属めつきレジストを除去する工程と、 6) 基板表面に露出された 0. 1〜 5 mの金属層をエッチング除去する工程と、 7) 露出された誘電体 薄膜から、 第 1のコンデンサ電極パターンを含む任意の形状のコンデンサ誘電 体をエツチングで形成する工程と、 8) 誘電体薄膜を除去して現れた金属箔 A から、 エッチングにより、 コンデンサ誘電体パターンを含む任意の形状の第 2 のコンデンサ電極を形成し、 露出された金属箔 Bをエッチングにより回路形成 する工程を有する。 (d-7) 1) On the surface of the metal foil A of the multilayer wiring board with a built-in capacitor, a through hole is provided at an arbitrary position, and the through hole is filled with a conductive paste containing a thermosetting resin and a metal filler. Laminating a metal foil B via a provided insulating material to form a substrate; 2) forming a metal layer of 0.1 to 5 m on at least the surface of the substrate on the side of the dielectric thin film; ) A step of forming a metal-plated resist on the substrate surface, leaving an arbitrary part including a part to be the first capacitor electrode; and4) a conductor in a part including the part to be the first capacitor electrode due to the metallization. Forming a pattern, 5) removing the metal plating resist, 6) etching away the 0.1-5 m metal layer exposed on the substrate surface, and 7) exposing the dielectric. From the thin film, a capacitor of any shape including the first capacitor electrode pattern 8) A step of forming a dielectric by etching, and 8) A second capacitor electrode having an arbitrary shape including a capacitor dielectric pattern is formed by etching from the metal foil A that has appeared after removing the dielectric thin film, and is exposed. Forming a circuit by etching the metal foil B thus etched.
(d-8) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意の 箇所に貫通穴が設けられかつその貫通穴が化学的な反応により金属化される導 電性ペース卜で充填されている絶縁材料を介して金属箔 Bを積層し基板とする 工程と、 2) 基板の少なくとも誘電体薄膜側の表面に 0. l〜5 imの金属層 を形成する工程と、 3) 第 1のコンデンサ電極となる部分を含む任意の部分を 残.して基板表面に金属めつきレジストを形成する工程と、 4) 金属めつきによ り第 1のコンデンサ電極となる部分を含む部分に導体パターンを形成する工程 と、 5 )金属めつきレジストを除去する工程と、 6 )基板表面に露出された 0 . 1〜5 の金属層をエッチング除去する工程と、 7 ) 露出された誘電体薄膜 から、 第 1のコンデンサ電極パターンを含む任意の形状のコンデンサ誘電体を エッチングで形成する工程と、 8 )誘電体薄膜を除去して現れた金属箔 Aから、 エッチングにより、 コンデンサ誘電体パターンを含む任意の形状の第 2のコン デンサ電極を形成し、 露出された金属箔 Bをエッチングにより回 形成するェ 程を有する。 (d-8) 1) A conductive paste in which a through hole is provided at an arbitrary location on the surface of the metal foil A of the material for a multilayer wiring board with a built-in capacitor, and the through hole is metallized by a chemical reaction. A step of laminating a metal foil B via an insulating material filled with to form a substrate; 2) a step of forming a metal layer of 0.1 to 5 im on at least the surface of the substrate on the side of the dielectric thin film; ) A step of forming a metal-plated resist on the substrate surface while leaving an arbitrary part including a part to be the first capacitor electrode; and 4) Including a part to be the first capacitor electrode due to the metal plating. Step of forming conductor pattern on part 5) removing the metal plating resist; 6) etching away the 0.1 to 5 metal layers exposed on the substrate surface; and 7) removing the exposed dielectric thin film from the first 8) forming a capacitor dielectric of any shape including the capacitor electrode pattern by etching; and 8) etching the metal foil A that has appeared by removing the dielectric thin film to form a capacitor of any shape including the capacitor dielectric pattern. The second capacitor electrode is formed, and the exposed metal foil B is formed by etching.
( d— 9 ) 1 ) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意の 箇所に貫通穴が設けられかつその貫通穴が熱硬化性樹脂と金属フイラ一を含む 導電性ペーストで充填されている絶縁材料を介して金属箔 Bを積層し基板とす る工程と、 2 ) 誘電体薄膜の表面の任意の部分に化学的な反応により金属化さ れる導電性ペーストを用いて金属層を形成して所望の第 1のコンデンサ電極を 形成する工程と、 3 ) 誘電体薄膜の少なくとも第 1のコンデンサ電極を含む任 意の部分を残してエッチング除去して所望のコンデンサ誘電体を形成する工程 と、 4 ) 誘電体薄膜を除去して現れた金属箔 Aから、 エッチングにより、 コン デンサ誘電体パターンを含む任意の形状の第 2のコンデンサ電極を形成し、 露 出された金属箔 Bをエッチングにより回路形成する工程を有する。 (d-9) 1) A through hole is provided at an arbitrary position on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor, and the through hole is made of a conductive paste containing a thermosetting resin and a metal filler. Laminating a metal foil B via a filled insulating material to form a substrate; 2) using a conductive paste to metallize any part of the surface of the dielectric thin film by a chemical reaction Forming a layer to form a desired first capacitor electrode; and3) forming a desired capacitor dielectric by etching away the dielectric thin film leaving at least an arbitrary portion including the first capacitor electrode. And 4) forming a second capacitor electrode of any shape including a capacitor dielectric pattern by etching from the metal foil A that appeared after removing the dielectric thin film, and exposing the exposed metal foil B The etching by circuit type Comprising the step of.
( d— 1 0 ) 1 ) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意 の箇所に貫通穴が設けられかつその貫通穴が化学的な反応により金属化される 導電性ペーストで充填されている絶縁材料を介して金属箔 Bを積層し基板とす る工程と、 2 ) 誘電体薄膜の表面の任意の部分に化学的な反応により金属化さ れる導電性ペーストを用いて金属層を形成して所望の第 1のコンデンサ電極を 形成する工程と、 3 ) 誘電体薄膜の少なくとも第 Γのコンデンサ電極を含む任 意の部分を残してエッチング除去して所望のコンデンサ誘電体を形成する工程 と、 4 ) 誘電体薄膜を除去して現れた金属箔 Aから、 エッチングにより、 コン デ サ誘電体パターンを含む任意の形状の第 2のコンデンサ電極を形成し、 露 出された金属箔 Bをエッチングにより回路形成する工程を有する。 (d— 1 1) Γ) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 絶縁 材料を介して金属箔 Bを積層し基板とする工程と、 2) 誘電体薄膜の任意の部 分を残してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 3) 金属箔 Bの任意の箇所をエッチング除去して、 上記絶縁材料から形成された絶 緣層を露出させる工程と、 4) レーザ照射により露出された絶縁層を除去して 穴を形成し、 金属箔 Aを露出させる工程と、 5) 穴内を含む基板 ¾面の両面に 金属層を形成する工程と、 6) その金属層及び金属箔 Aの任意の部分を残して エッチング除去して、 所望の第 1のコンデンサ電極及び第 2のコンデンサ電極 を形成する工程を有する。 (d-10) 1) Conductive paste in which through-holes are provided at arbitrary locations on the surface of metal foil A, which is a material for multilayer wiring boards with built-in capacitors, and the through-holes are metallized by a chemical reaction Laminating a metal foil B via a filled insulating material to form a substrate; 2) using a conductive paste to metallize any part of the surface of the dielectric thin film by a chemical reaction Forming a layer to form a desired first capacitor electrode; and3) forming a desired capacitor dielectric by etching away the dielectric thin film, leaving at least an arbitrary portion including the second capacitor electrode. And 4) forming a second capacitor electrode of any shape including a capacitor dielectric pattern from the metal foil A that appeared by removing the dielectric thin film, and exposing the exposed metal foil. Circuit formation by etching B The step of performing (d—1 1) Γ) A process of laminating a metal foil B on the surface of a metal foil A of a material for a multilayer wiring board with a built-in capacitor via an insulating material to form a substrate, and 2) an arbitrary portion of a dielectric thin film. 3) a step of forming a desired capacitor dielectric by etching away while leaving a portion, 3) a step of etching and removing an arbitrary portion of the metal foil B to expose an insulating layer formed from the insulating material; ) Removing the insulating layer exposed by the laser irradiation to form a hole and exposing the metal foil A; 5) forming a metal layer on both surfaces of the substrate including the hole; and 6) forming the metal. Forming a desired first capacitor electrode and a desired second capacitor electrode by etching and removing the layer and any portion of the metal foil A.
(d— 12) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に絶縁材 料を介して金属箔 Bを積層し基板とする工程と、 2) 誘電体薄膜の任意の部分 を残してエッチング除去して所望のコンデンサ誘電体を形成する工程と、 3) 金属箔 Bの任意の箇所にレーザ照射することにより、 金属箔 Bと上記絶縁材料 から形成された絶縁層とを同時に除去して穴を形成して金属箔 Aを露出させる 工程と、 4) 穴内を含む基板表面の両面に金属層を形成する工程と、 5) その 金属層及び金属箔 Aの任意の部分を残してエッチング除去して、 所望の第 1の コンデンサ電極及び第 2のコンデンサ電極を形成する工程を有する。 (d-12) 1) A step of laminating a metal foil B on the surface of the metal foil A, which is a material for a multilayer wiring board with a built-in capacitor, via an insulating material to form a substrate, and 2) leaving any part of the dielectric thin film 3) irradiating a laser on an arbitrary portion of the metal foil B, thereby simultaneously removing the metal foil B and the insulating layer formed from the insulating material. Forming a hole to expose the metal foil A, 4) forming a metal layer on both sides of the substrate surface including the inside of the hole, and 5) etching leaving an arbitrary portion of the metal layer and the metal foil A. Removing to form desired first and second capacitor electrodes.
(d— 13) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意 の箇所に貫通穴が設けられかつその貫通穴が熱硬化性樹脂と金属フィラーを含 む導電性ペーストで充填されている絶縁材料を介して金属箔 Bを積層し基板と する工程と、 2) 誘電体薄膜の任意の部分を残してエッチング除去して所望の コンデンサ誘電体を形成する工程と、 3) 基板の少なくともコンデンサ誘電体 を有する表面に金属層を形成する工程と、 4) その金属層及び金属箔 Aの任意 の部分を残してエッチング除去して、 所望の第 1のコンデンサ電極及び第 2の コンデンサ電極を形成する工程を有する。 (d-13) 1) On the surface of metal foil A of the multilayer wiring board with a built-in capacitor, through-holes are provided at arbitrary locations and the through-holes are made of conductive paste containing thermosetting resin and metal filler. Laminating a metal foil B via a filled insulating material to form a substrate; 2) etching and removing any part of the dielectric thin film to form a desired capacitor dielectric; 3) Forming a metal layer on at least the surface of the substrate having the capacitor dielectric; 4) etching away the metal layer and any portions of the metal foil A, leaving the desired first capacitor electrode and the second Forming a capacitor electrode.
(d— 14) 1) コンデンサ内蔵多層配線板用材料の金属箔 Aの面に、 任意 の箇所に貫通穴が設けられかつその貫通穴が化学的な反応により金属化される 導電性ペーストで充填されている絶縁材料を介して金属箔 Bを積層し基板とす る工程と、 2) 誘電体薄膜の任意の部分を残してエッチング除去して所望のコ ンデンサ誘電体を形成する工程と、 3) 基板の少なくともコンデンサ誘電体を 有する表面に金属層を形成する工程と、 4) その金属層及び金属箔 Aの任意の 部分を残してエッチング除去して、 所望の第 1のコンデンサ電極及び第 2のコ ンデンサ電極を形成する工程を有する。 . (d-14) 1) A through hole is provided at an arbitrary position on the surface of the metal foil A of the multilayer wiring board material with a built-in capacitor, and the through hole is metallized by a chemical reaction. Laminating a metal foil B via an insulating material filled with a conductive paste to form a substrate; 2) forming a desired capacitor dielectric by etching away leaving any part of the dielectric thin film 3) forming a metal layer on at least the surface of the substrate having the capacitor dielectric; and4) etching away the metal layer and any portion of the metal foil A, leaving the desired first layer. Forming a capacitor electrode and a second capacitor electrode. .
以下に、 本発明の実施例を図面を用いてより具体的に述べる。 Hereinafter, embodiments of the present invention will be described more specifically with reference to the drawings.
(実施例 A) (Example A)
コンデンサ内蔵多層配線板用材料 A— 1 Material for multilayer wiring board with built-in capacitor A-1
銅箔 1 02である厚み 35 の圧延銅箔 M— BNH— 18 (三井金属鉱業 株式会社製、 商品名) の表面にチタンテトライソプロポキシド、 ジルコンテト ラターシャリーブトキシド、 ジピバロィルメタン鉛錯体、 二酸化窒素を用いた マイクロ波プラズマ CVDにより、 基材温度 350°Cの条件下で厚さ 0. 5 β mの ΡΖΤ (チタン酸ジルコン酸鉛) 薄膜 1 0 1を形成した (図 1 (a))。 コンデンサ内蔵多層配線板用材料 A— 2 Rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Mining & Smelting Co., Ltd.) with a thickness of 35 which is copper foil 102, titanium tetraisopropoxide, zirconte tertiary butoxide, dipivaloyl methane lead complex A 0.5 βm thick ΡΖΤ (lead zirconate titanate) thin film 101 was formed by microwave plasma CVD using nitrogen dioxide at a substrate temperature of 350 ° C (Fig. 1 (a )). Material for multilayer wiring board with built-in capacitor A-2
銅箔 1 02である厚み 35 xmの圧延銅箔 M— BNH— 18 (三井金属鉱業 株式会社製、 商品名) の表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 103を形成した。 さらにその基板表面にチタンテトライソプロ ポキシド、 ジルコンテトラタ一シャリーブトキシド、 ジピバロィルメタン鉛錯 体、 二酸化窒素を用いたマイクロ波プラズマ CVDにより、 基材温度 350°C の条件下で厚さ 0. 5 ^11の?2丁 (チタン酸ジルコン酸鉛) 薄膜 101を形 成した (図 1 (b))。 コンデンサ内蔵多層配線板用材料 A— 3 A 0.2-meter ruthenium thin film 103 was formed on the surface of rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) having a thickness of 35 xm, which is a copper foil 102, by DC sputtering. In addition, the substrate surface was subjected to microwave plasma CVD using titanium tetraisopropoxide, zircon tetrabutyrate butoxide, dipivaloyl methane lead complex, and nitrogen dioxide at a substrate temperature of 350 ° C. 0.5? 11? Two (lead zirconate titanate) thin films 101 were formed (Fig. 1 (b)). Material for multilayer wiring board with built-in capacitor A-3
駕箔 1 02である厚み 35 mの圧延銅箔M—BNH— 18 (三井金属鉱業 株式会社製、 商品名) の表面に DCスパッタリング法により、 0. 2 imのル テニゥム薄膜 103を形成した。 さらにその表面に強誘電体薄膜形成材料 P Z T (関東化学株式会社、 商品名) を塗布し、 温度 15 CTCで加熱時間 30分間 のプリべ一クを行った。 塗布とプリべークをさらに 5回繰り返し、 その後に温 度 350°Cで加熱時間 1時間の熱処理を行って、 厚さ 0. 5 111の 2丁薄膜 101を形成した (図 1 (b))。 実施例 A— 1 The surface of rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Mining & Smelting Co., Ltd.) with a thickness of 35 m, which is 102, is 0.2 im by DC sputtering. A thin film 103 was formed. Furthermore, a ferroelectric thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied to the surface, and prebaked at a temperature of 15 CTC for a heating time of 30 minutes. The application and pre-bake were repeated five more times, and then heat treatment was performed at 350 ° C for 1 hour to form two thin films 101 with a thickness of 0.5111 (Fig. 1 (b) ). Example A-1
コンデンサ内蔵多層配線板用材料 A— 2の銅箔 102表面に、多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 2 (a))。 板厚 0. 2mmの両面 銅箔張ガラスエポキシ積層板 MCL— E— 679 F (日立化成工業株式会社製、 商品名) を基材として、 所望の箇所に導体化された接続穴 106と回路パター ンを作製した両面基板 104に、 多層化接着前処理として、 有機酸系マイクロ エッチング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理 を行った後に、 その一方の面に厚み 100 imのガラスエポキシプリプレダ G EA- 679 F (日立化成工業株式会社製、 商品名) を介して、 厚み 18 m の銅箔 GTS— 18 (古河サ一キットフオイル株式会社、 商品名) を、 また他 方の面に厚み 100 mのガラスエポキシプリプレダ GE A— 679 F (日立 化成工業株式会社製、 商品名) を介して前述のコンデンサ内蔵多層配線板用材 料を配し、 温度 170°C、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条 件で積層一体化した (図 2 (b))。 ここで、 符号 105はめつき銅を、 符号 1 07は絶縁樹脂基材 (プリプレダ硬化物) を指す。 さらにその PZT薄膜表面 に DCスパッタリング法により、 0.05 mのクロム薄膜 1.08を形成した。 さらにその表面に電気銅めつきにより 20 mの金属層 109を形成した (図 2 (c))。 この基板の表面に所望のエッチングレジストを形成し、 塩化第二鉄 水溶液を用いて不要な銅の金属層をエッチング除去し、 フェリシアン化力リゥ ム水溶液を用いてクロムの金属層をエッチング除去して、 第 1のコンデンサ電 極のパターンを形成した (図 2 (d))。 続いて、 所望のパターンのレジストを 形成し、 CF4ガスを用いた R I E法によって PZT薄膜とルテニウム薄膜を エッチング除去した (図 2 (e))。 次に、 この基板の表面に所望のエッチング レジストを形成し、 不要な銅箔を塩化第二鉄水溶液を用いてエッチング除去し て、 所望の箇所に Φ 0. 1mmの窓穴を形成し、 窓穴の箇所に三菱電機株式会 社製 ML 505 GT型炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス 幅 100 s、 ショット数 4回の条件でレーザ穴明け 1 10を行った (図 2 ( f ))。 超音波洗浄とアルカリ過マンガン酸液で炭化した樹脂カスを除去後、 触媒付与、密着促進後無電解銅めつきを行い、 0. 5 imの銅薄膜を形成した。 この基板の表面に所望のめっきレジスト 11 1を形成し、電気銅めつきを行い、 内層の回路導体と基板表面の導体層とを電気的に接続する金属層を形成したThe surface of copper foil 102 of multilayer wiring board material with built-in capacitor A-2 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. (Figure 2 (a)). 0.2mm thick double-sided copper foil-clad glass epoxy laminated board MCL—E—679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) The surface of the double-sided substrate 104 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer adhesion. Through im glass epoxy prepredder G EA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.), 18 m thick copper foil GTS-18 (trade name, Furukawa Saichi Kithu Oil Co., Ltd.) On the other side, the above-mentioned material for a multilayer wiring board with a built-in capacitor was placed via a 100 m thick glass epoxy pre-preder GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.). , Pressure 1.5MPa, heating and pressurizing time 60 minutes under press conditions The layers were integrated (Figure 2 (b)). Here, reference numeral 105 denotes plated copper, and reference numeral 107 denotes an insulating resin base material (pre-preda cured product). Furthermore, a 0.05 m chromium thin film 1.08 was formed on the surface of the PZT thin film by DC sputtering. Furthermore, a 20-meter metal layer 109 was formed on the surface by electrolytic copper plating (Fig. 2 (c)). A desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is removed by etching using an aqueous ferric chloride solution, and a chromium metal layer is removed by etching using an aqueous ferricyanide force solution. And the first capacitor A pole pattern was formed (Fig. 2 (d)). Next, a resist with the desired pattern was formed, and the PZT thin film and the ruthenium thin film were etched away by RIE using CF 4 gas (Fig. 2 (e)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is removed by etching using an aqueous solution of ferric chloride to form a window hole having a diameter of 0.1 mm at a desired position. Using a ML505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation at the hole locations, laser drilling 1-10 was performed under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots (Fig. 2 (f )). After ultrasonic cleaning and removal of the resin residue carbonized with an alkali permanganate solution, a catalyst was applied, adhesion was promoted, and then electroless copper plating was performed to form a 0.5 im copper thin film. A desired plating resist 111 was formed on the surface of the substrate, copper electroplating was performed, and a metal layer for electrically connecting the inner circuit conductor and the conductor layer on the substrate surface was formed.
(図 2 (g))。 めっきレジストを剥離後、 基板表面の 0. 5 mの銅薄膜をェ ツチング除去して、 その後、 さらに所望のエッチングレジストを形成し、 塩化 第二鉄溶液によって不要な銅の金属層をエッチング除去して、 第 2のコンデン サ電極を含む回路パターンを形成して回路板を作製した (図 2 (h))。 (Fig. 2 (g)). After stripping the plating resist, the copper thin film of 0.5 m on the substrate surface is removed by etching, and then, a desired etching resist is further formed, and an unnecessary copper metal layer is removed by etching with a ferric chloride solution. Thus, a circuit pattern including a second capacitor electrode was formed to produce a circuit board (FIG. 2 (h)).
この回路板の回路表面に、 多層化接着前処理として、 有機酸系マイクロエツ チング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行 つた。 (1) 35 mキャリア銅箔付き厚み 3 mの銅箔 MT35 S 3 (三井金 属鉱業株式会社製、 商品名)、 (2) 厚み 100 /mのフイラ一入りガラスェポ キシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名)、 (3) 回路板、 (4)絶縁樹脂基材 112として、厚み 100 mのフィラー入りガラ スエポキシプリプレダ GEA— 679 F、(5) 35 mキャリア銅箔付き厚み 3 ^mの銅箔 MT35 S 3 (三井金属鉱業株式会社製、 商品名) の順に重ね、 温度 170 、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一 体化した。 キャリア銅箔を剥がし、 不要な基板端部を切断後、 この基板の表面 に.所望のエッチングレジストを形成し、 不要な銅箔を塩化第二鉄水溶液を用い てエッチング除去して、 所望の箇所に φ θ. 15mmの窓穴を形成した。 この基板表面に設けた窓穴の箇所に三菱電機株式会社製 ML 505 GT型炭 酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 100 2 s、 ショット 数 4回の条件でレ一ザ穴明けを行った。 超音波洗浄とアルカリ過マンガン酸液 で炭化した樹脂カスを除去後、 洗浄触媒付与、 密着促進後無電解銅めつきを行 い、 レーザ穴内壁と銅箔表面に約 20 の無電解銅めつき層を形成した。 こ の基板表面のパッドゃ回路パターンなど必要な箇所にエッチングレジストを形 成し、 不要な銅をエッチング除去して、 外層回路を形成した。 The circuit surface of this circuit board was subjected to a roughening treatment with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion. (1) 3 m thick copper foil MT35S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) with 35 m carrier copper foil, (2) 100 / m thick glass epoxy prepreg with a filler, GEA-679F (Hitachi (3) Circuit board, (4) Insulating resin substrate 112, 100 m thick filler-filled glass epoxy prepreg GEA-679F, (5) 35 m carrier copper foil 3 ^ m thick copper foil MT35 S3 (Mitsui Metal Mining Co., Ltd., trade name) was layered in this order, and the temperature was 170, the pressure was 1.5MPa, and the heating and pressing time was 60 minutes. . After peeling off the carrier copper foil and cutting unnecessary substrate edges, a desired etching resist is formed on the surface of this substrate, and the unnecessary copper foil is removed by etching using a ferric chloride aqueous solution to obtain a desired portion. A window hole of φ θ. Laser holes were drilled in the window holes provided on the surface of this board using Mitsubishi Electric Corporation's ML505 GT type carbon dioxide laser under the conditions of an output power of 26 mJ, a pulse width of 100 2 s, and four shots. Was done. After ultrasonic cleaning and removal of resin residue carbonized with an alkali permanganate solution, a cleaning catalyst is applied, adhesion is promoted, and then electroless copper plating is performed.Approximately 20 electroless copper plating is applied to the inner wall of the laser hole and the copper foil surface. A layer was formed. An etching resist was formed on necessary parts such as pads and circuit patterns on the surface of this substrate, and unnecessary copper was removed by etching to form an outer layer circuit.
この基板表面にソルダーレジスト PSR—4000 AUS 5 (太陽インキ 製造株式会社、 商品名) をロールコ一夕で 30 塗布、 乾燥後に露光 ·現像 して所望の箇所にソルダーレジスト 113を形成した。 その後、 3 mの無電 解ニッケルめっきと 0. 1 mの無電解金めつきを外層回路パターン露出部表 面層に形成して、 コンデンサ内蔵多層配線板を得た (図 2 (i))。 実施例 A— 2 A solder resist PSR-4000 AUS5 (Taiyo Ink Manufacturing Co., Ltd., trade name) was applied to the surface of the substrate 30 by a roll coater, dried, exposed and developed to form a solder resist 113 at a desired position. After that, 3 m of electroless nickel plating and 0.1 m of electroless gold plating were formed on the exposed surface of the outer circuit pattern to obtain a multilayer wiring board with built-in capacitors (Fig. 2 (i)). Example A-2
コンデンサ内蔵多層配線板用材料 A— 2をコンデンサ内蔵多層配線板用材料 A— 3に替えた以外は実施例 A _ 1と同様な工程によりコンデンサ内蔵多層配 線板を得た。 実施例 A— 3 A multilayer wiring board with a built-in capacitor was obtained by the same process as in Example A_1 except that the material A-2 for a multilayer wiring board with a built-in capacitor was changed to the material A-3 for a multilayer wiring board with a built-in capacitor. Example A-3
コンデンサ内蔵多層配線板用材料 A— 3の銅箔 102表面に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 3 (a))。 板厚 0. 2mmの両面 銅箔張ガラスエポキシ積層板 MCL— E— 679 F (日立化成工業株式会社製、 商品名) を基材として、 所望の箇所に導体化された接続穴と回路パターンを作 製した両面基板 104に、 多層化接着前処理として、 有機酸系マイクロエッチ ング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行つ た後に、 その一方の面に絶縁樹脂基材 107である厚み 100 mのガラスェ ポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介 して、 厚み 18 mの銅箔 GTS— 18 (古河サーキットフオイル株式会社、. 商品名) を、 また他方の面に絶縁樹脂基材 107である厚み 100 zmのガラ スエポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介して前述のコンデンサ内蔵多層配線板用材料を配し、 温度 170°C、 圧力 1.5 M P a、加熱加圧時間 60分のプレス条件で積層一体化した(図 3 ( b ) )。 ここで、 105はめつき銅であり 106は穴埋め樹脂である。 さらにその PZ T薄膜 101表面に DCスパッタリング法により、 0. 05 mのクロム薄膜 108を形成した。 さらにその表面に触媒付与、 密着促進後無電解銅めつきを 行い、 0. 5 の銅薄膜を形成した。 この基板の表面に所望のめっきレジス トを形成し、 電気銅めつきを行い、 厚み 20 mの第 1のコンデンサ電極とな る金属層 109を形成した (図 3 (c))。 めっきレジストを剥離後、 基板表面 の 0, 5 111の銅薄膜と0. 05 mのクロム薄膜をエッチング除去して、 第 1のコンデンサ電極のパターンを形成した (図 3 (d))。 続いて、 所望のパタ ーンのレジストを形成し、 CF4ガスを用いた R I E法によって P ZT薄膜と ルテニウム薄膜をエッチング除去した (図 3 (e))。 次に、 この基板の表面に 所望のエッチングレジストを形成し、 不要な銅箔を塩化第二鉄水溶液を用いて エッチング除去して、 所望の箇所に Φ 0. 1mmの窓穴を形成し、 窓穴の箇所 に三菱電機株式会社製 ML 505 GT型炭酸ガスレーザを用いて、 出力パワー 26mJ、 パルス幅 100 s、 ショット数 4回の条件でレーザ穴明け 1 10 を行った (図 3 (ί))。 超音波洗浄とアルカリ過マンガン酸液で炭化した樹脂 カスを除去後、 触媒付与、 密着促進後無電解銅めつきを行い、 0. の銅 薄膜を形成した。 この基板の表面に所望のめっきレジスト 1 11を形成し、 電 気銅めつきを行い、 内層の回路導体と基板表面の導体層とを電気的に接続する 金属層を形成した (図 3 (g))。 めっきレジストを剥離後、 基板表面の 0. 5 の銅薄膜をエッチング除去して、 その後、 さらに所望のエッチングレジス トを形成し、塩化第二鉄溶液によって不要な銅の金属層をエッチング除去して、 第 2のコンデンサ電極を含む回路パターンを形成して回路板を作製した (図 3 (h))。 その後の多層配線板の加工は実施例 A— 1と同様な工程によりコンデ ンサ内蔵多層配線板を得た (図 3 ( i))。 ここで、 112は絶縁樹脂基材であ り、 113はソルダーレジストである。 実施例 A - 4 The surface of copper foil 102 of multilayer wiring board material with built-in capacitor A-3 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. (Figure 3 (a)). Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding, and then one surface was insulated. 100-meter-thick glass substrate 107 Insulates 18m thick copper foil GTS-18 (Furukawa Circuit Oil Co., Ltd.) through POXY Prepreda GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) and the other side The above-mentioned material for a multilayer wiring board with a built-in capacitor is distributed via a resin epoxy material GEA-679F (trade name) manufactured by Hitachi Chemical Co., Ltd. The layers were integrated under a press condition of 1.5 MPa in pressure and 60 minutes in heating and pressing time (Fig. 3 (b)). Here, 105 is plated copper and 106 is filling resin. Further, a 0.05 m chromium thin film 108 was formed on the surface of the PZT thin film 101 by a DC sputtering method. After applying a catalyst to the surface and promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5. A desired plating resist was formed on the surface of the substrate, and copper electroplating was performed to form a metal layer 109 serving as a first capacitor electrode having a thickness of 20 m (FIG. 3 (c)). After removing the plating resist, the copper thin film of 0.5111 and the chromium thin film of 0.05 m on the substrate surface were removed by etching to form the first capacitor electrode pattern (Fig. 3 (d)). Subsequently, a resist of a desired pattern was formed, and the PZT thin film and the ruthenium thin film were removed by etching by RIE using CF 4 gas (FIG. 3 (e)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to form a window hole having a diameter of 0.1 mm at a desired position. Using a ML505 GT carbon dioxide laser manufactured by Mitsubishi Electric Co., Ltd. in the hole locations, laser drilling was performed on the condition of output power 26mJ, pulse width 100s, and 4 shots (Fig. 3 (ί)). . After ultrasonic cleaning and removal of resin residue carbonized with an alkali permanganate solution, a catalyst was applied, adhesion was promoted, and electroless copper plating was performed to form a copper thin film of 0. A desired plating resist 111 was formed on the surface of the substrate, and electroplating was performed, thereby forming a metal layer for electrically connecting the inner circuit conductor and the conductor layer on the substrate surface (FIG. 3 (g). )). After stripping the plating resist, the copper thin film of 0.5 on the substrate surface is etched away, and then a desired etching resist is formed, and an unnecessary copper metal layer is etched away with a ferric chloride solution. , A circuit board including the second capacitor electrode was formed to produce a circuit board (Fig. 3 (h)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor through the same steps as in Example A-1 (FIG. 3 (i)). Here, 112 is an insulating resin base material, and 113 is a solder resist. Example A-4
コンデンサ内蔵多層配線板用材料 A— 3の銅箔表面 102に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 4 (a))。 板厚 0. 2mmの両面 銅箔張ガラスエポキシ積層板 MCL— E— 679 F (日立化成工業株式会社製、 商品名) を基材として、 所望の箇所に導体化された接続穴と回路パターンを作 製した両面基板 104に、 多層化接着前処理として、 有機酸系マイクロエッチ ング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行つ た後に、 その一方の面に絶縁樹脂基材 107として厚み 100 /mのガラスェ ポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介 して、 厚み 18 mの銅箔 GTS— 18 (古河サ一キットフオイル株式会社、 商品名) を、 また他方の面に絶縁樹脂基材 107として厚み 100 mのガラ スエポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介して前述のコンデンサ内蔵多層配線板用材料を配し、 温度 170°C、 圧力 1.5MP a、加熱加圧時間 60分のプレス条件で積層一体化した(図 4 (b))。 ここで、 105はめつき銅であり、 106は穴埋め樹脂である。 さらにその P ZT薄膜表面の所望の箇所にスクリーン印刷により、 化学的な反応により金属 化される導電性ペース卜であるナノペースト ひ、リマ化成株式会社、 商品名) を 40 mの厚みで印刷後、 温度 200°Cで加熱時間 1時間の条件でベ一キン グし、 導電性ペーストを金属化して、 第 1のコンデンサ電極のパターンを形成 し,た (図 4 (c))。 続いて、 所望のパターンのレジストを形成し、 CF4ガス を用いた R I E法によって P ZT薄膜とルテニウム薄膜をエッチング除去した (図 4 (d))。 次に、 この基板の表面に所望のエッチングレジストを形成し、 不要な銅箔を塩化第二鉄水溶液を用いてエツチング除去して、 所望の箇所に φ 0. 1mmの窓穴を形成し、 窓穴の箇所に三菱電機株式会社製 ML 505 GT 型炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 100 s、 ショ ット数 4回の条件でレーザ穴明け 1 10を行った (図 4 (e))。 超音波洗浄と アルカリ過マンガン酸液で炭化した樹脂カスを除去後、 触媒付与、'密着促進後 無電解銅めつきを行い、 0. 5 /zmの銅薄膜を形成した。 この基板の表面に所 望のめっきレジスト 11 1を形成し、 電気銅めつきを行い、 内層の回路導体と 基板表面の導体層とを電気的に接続する金属層を形成した (図 4 (f))。 めつ きレジストを剥離後、 基板表面の 0. 5 /zmの銅薄膜をエッチング除去して、 その後、 さらに所望のエッチングレジストを形成し、 塩化第二鉄溶液によって 不要な銅の金属層をエッチング除去して、 第 2のコンデンサ電極を含む回路パ ターンを形成して回路板を作製した (図 4 (g))。 その後の多層配線板の加工 については実施例 A— 1と同様な工程で行い、 コンデンサ内蔵多層配線板を得 た (図 4 (h))。 The copper foil surface 102 of the multilayer wiring board material A-3 with a built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding. (Figure 4 (a)). Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was subjected to a roughening treatment using an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding, and then one surface was insulated. As a resin base material 107, 18 m thick copper foil GTS—18 (Furukawa Saichi Kit Oil Co., Ltd.) via 100 / m thick glass epoxy prepredder GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) On the other side, and a 100 m-thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd., trade name) as an insulating resin substrate 107 on the other side. Arrange materials for board, temperature 170 ° C, pressure 1. Lamination and integration were performed under press conditions of 5 MPa and a heating and pressing time of 60 minutes (Fig. 4 (b)). Here, 105 is plated copper, and 106 is a filling resin. Furthermore, nano paste (Rima Chemical Co., Ltd.), a conductive paste that is metallized by a chemical reaction, is screen-printed at a desired location on the surface of the PZT thin film with a thickness of 40 m. Then, the substrate was baked at a temperature of 200 ° C for a heating time of 1 hour, and the conductive paste was metallized to form a first capacitor electrode pattern (Fig. 4 (c)). Subsequently, a resist having a desired pattern was formed, and the PZT thin film and the ruthenium thin film were removed by etching by RIE using CF 4 gas. (Fig. 4 (d)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is etched and removed using an aqueous ferric chloride solution to form a φ0.1 mm window hole at a desired position. Using a ML505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation at the hole locations, laser drilling 110 was performed under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots (Fig. 4 ( e)). After ultrasonic cleaning and removal of the resin residue carbonized with the alkali permanganate solution, a catalyst was applied, and after promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5 / zm. The desired plating resist 111 was formed on the surface of the substrate, and copper electroplating was performed to form a metal layer for electrically connecting the inner layer circuit conductor and the conductor layer on the substrate surface (FIG. 4 (f) )). After removing the resist, the copper thin film of 0.5 / zm on the substrate surface is removed by etching, and then a desired etching resist is formed, and the unnecessary copper metal layer is etched with a ferric chloride solution. After removal, a circuit pattern including a second capacitor electrode was formed to produce a circuit board (Fig. 4 (g)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example A-1, and a multilayer wiring board with a built-in capacitor was obtained (FIG. 4 (h)).
ここで、 1 12は絶縁樹脂基材であり、 1 13はソルダーレジストである。 Here, 1 12 is an insulating resin base material, and 1 13 is a solder resist.
【0001】 [0001]
実施例 A— 5 Example A-5
コンデンサ内蔵多層配線板用材料 A— 3を用い、 P ZT薄膜とルテニウム薄 膜をエッチング除去する方法が R I E法ではなく、 PZT薄膜に対して 20% 重フッ化アン乇ニゥム (NH4 F - HF) 水溶液、 ルテニウム薄膜に対してル テニゥムエッチング液 REC— 01 (関東化学株式会社、 商品名) を用いてェ ツチングした以外は実施例 A— 1と同様な工程によりコンデンサ内蔵多層配線 板を得た (図 2 ( i))。 実.施例 A— 6 The method of removing the PZT thin film and the ruthenium thin film using the material A-3 for the multilayer wiring board with a built-in capacitor is not the RIE method. Instead, the PZT thin film is 20% aluminum bifluoride (NH 4 F-HF) ) A multilayer wiring board with a built-in capacitor was obtained by the same process as in Example A-1 except that the aqueous solution and ruthenium thin film were etched using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name). (Fig. 2 (i)). Example A—6
コンデンサ内蔵多層配線板用材料 A— 3の銅箔 102表面に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 5 (a))。 板厚 0. 2mmの両面 銅箔張ガラスエポキシ積層板 MCL - E— 679 F (日立化成工業株式会社製、 商品名) を基材として、 所望の箇所に導体化された接続穴と回路パターンを作 製した両面基板 104に、 多層化接着前処理として、 有機酸系マイクロエッチ ング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行つ た後に、 その一方の面に絶縁樹脂基材 107として厚み 100 imのガラスェ ポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介 して、 厚み 18 の銅箔 GTS— 18 (古河サ一キットフオイル株式会社、 商品名) を、 また他方の面に絶縁樹脂基材 107として厚み 100 mのガラ スエポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介して前述のコンデンサ内蔵多層配線板用材料を配し、 温度 170°C、 圧力 1.5 MP a、加熱加圧時間 60分のプレス条件で積層一体化した(図 5 (b))。 ここで、 105はめつき銅であり、 106は穴埋め樹脂である。 続いて、 所望 のパターンのレジストを形成し、 20 %重フッ化アンモニゥム (NH4 F · H F) 水溶液を用いて P ZT薄膜をエッチング除去し、 ルテニウムエッチング液 REC-01 (関東化学株式会社、 商品名) を用いてルテニウム薄膜をエッチ ング除去して PZT薄膜のパターニングを行った (図 5 (c))。 次に、 この基 板の表面に所望のエッチングレジストを形成し、 不要な銅箔を塩化第二鉄水溶 液を用いてエッチング除去して、 所望の箇所に Φ 0. 1mmの窓穴を形成し、 窓穴の箇所に三菱電機株式会社製 ML 505 GT型炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 100 s、 ショット数 4回の条件でレーザ穴 明け 110を行った (図 5 (d))。 超音波洗浄とアルカリ過マンガン酸液で炭 化した樹脂カスを除去後、 DCスパッタリング法により、 0. 05 mのクロ ム薄膜 108を形成した。 さらにその表面に電気銅めつきにより 20 の金 属.層 109を形成した (図 5 (e))。 この際に、 薄膜誘電体層表面とレーザ穴 内は、 銅の金属層が形成されていた。 この基板の表面に所望のエッチングレジ ストを形成し、 塩化第二鉄水溶液を用いて不要な銅の金属層をエッチング除去 し、 フェリシアン化カリウム水溶液を用いてクロムの金属層をエッチング除去 して、 第 1のコンデンサ電極と第 2のコンデンサ電極およびその他の配線パタ —ンを形成して回路板を作製した (図 5 (f))。 その後の多層配線板の加工に ついては実施例 A— 1と同様な工程で行い、 コンデンサ内蔵多層配線板を得た (図 5 (g))。 ここで、 112絶縁樹脂基材であり、 113はソルダーレジス トである。 実施例 A— 7 Material for multilayer wiring board with built-in capacitor A—3 copper foil 102 surface, before multilayer bonding Roughening treatment was performed using an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) (Fig. 5 (a)). Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) The prepared double-sided substrate 104 was subjected to a roughening treatment using an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding. As a resin substrate 107, a copper foil GTS—18 (Furukawa Saichi Kit Oil Co., Ltd., product) with a thickness of 18 via glass epoxy prepreg GEA-679F (product name, manufactured by Hitachi Chemical Co., Ltd.) For the above-mentioned multilayer wiring board with built-in capacitor via a 100 m thick glass epoxy pre-predeer GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as an insulating resin substrate 107 on the other side. Distribute materials, temperature 170 ° C, pressure 1.5 The laminate was integrated under the pressing conditions of MPa and heating and pressing time of 60 minutes (Fig. 5 (b)). Here, 105 is plated copper, and 106 is a filling resin. Subsequently, a resist having a desired pattern is formed, and the PZT thin film is removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F · HF). A ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd. The PZT thin film was patterned by removing the ruthenium thin film by etching (Fig. 5 (c)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary copper foil is removed by etching using an aqueous solution of ferric chloride to form a window hole having a diameter of 0.1 mm at a desired position. Using a ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation at the window hole, laser drilling 110 was performed under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots (Fig. 5 (d) )). After ultrasonic cleaning and removal of the resin residue carbonized with an alkali permanganate solution, a 0.05 m chromium thin film 108 was formed by DC sputtering. In addition, 20 metal layers 109 were formed on the surface by copper electroplating (Fig. 5 (e)). At this time, a copper metal layer was formed on the surface of the thin-film dielectric layer and inside the laser hole. A desired etching register is provided on the surface of the substrate. A first capacitor electrode and a second capacitor are formed by etching an unnecessary copper metal layer using an aqueous ferric chloride solution and etching away a chromium metal layer using a potassium ferricyanide aqueous solution. Circuit boards were fabricated by forming electrodes and other wiring patterns (Fig. 5 (f)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example A-1, and a multilayer wiring board with a built-in capacitor was obtained (FIG. 5 (g)). Here, 112 is an insulating resin base material, and 113 is a solder resist. Example A-7
コンデンサ内蔵多層配線板用材料 A— 3の銅箔表面 102に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 6 (a))。 板厚 0. 2mmの両面 銅箔張ガラスエポキシ積層板 MCL— E— 679 F (日立化成工業株式会社製、 商品名) を基材として、 所望の箇所に導体化された接続穴と回路パターンを作 製した両面基板 104に、 多層化接着前処理として、 有機酸系マイクロエッチ ング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行つ た後に、 その一方の面に絶縁樹脂基材 107として厚み 100 mのガラスェ ポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介 して、 厚み 18 mの銅箔 GTS— 18 (古河サーキットフオイル株式会社、 商品名) を、 また他方の面に絶縁樹脂基材 107として厚み 100 amの力'ラ スエポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介して前述のコンデンサ内蔵多層配線板用材料を配し、 温度 170 、 圧力 1.5 MP a、加熱加圧時間 60分のプレス条件で積層一体化した(図 6 (b))。 ここで、 105はめつき銅であり、 106は穴埋め樹脂である。 このプリプレ グは、 両面に厚み 25 mのポリエチレンテレフ夕レート (PET) のフィル ム.を温度 100°C, 圧力 1. 5MP a, 加熱加圧時間 10分の条件のホットプ レスで貼り付けた後、 所望の箇所にドリル穴明けを行った後、 スクリーン印刷 により、 銅ペースト NF 2000 (タツ夕システム 'エレクトロニクス株式会 社、 商品名) 116を充填し、 その後に表面の PETフィルムを剥がしたもの を用いた。 この基板の PZT薄膜表面に DCスパッタリング法により、 0. 0 5 mのクロム薄膜 108を形成した。 さらにその表面に電気銅めつきにより 20 mの金属層 109を形成した (図 6 (c))。 この基板の表面に所望のェ ツチングレジストを形成し、 塩化第二鉄水溶液を用いて不要な銅の金属層をェ ツチング除去し、 フェリシアン化カリウム水溶液を用いてクロムの金属層をェ ツチング除去して、第 1のコンデンサ電極のパターンを形成した(図 6 (d))。 続いて、 所望のパターンのレジストを形成し、 CF4ガスを用いた R I E法に よって PZT薄膜とルテニウム薄膜をエッチング除去した(図 6 (e))。次に、 この基板の表面に所望のエッチングレジストを形成し、 塩化第二鉄溶液によつ て不要な銅の金属層をエッチング除去して、 第 2のコンデンサ電極を含む回路 パターンを形成して回路板を作製した (図 6 (ί))。 その後の多層配線板の加 ェは実施例 Α— 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 6 (g))。 ここで、 1 12は絶縁樹脂基材であり、 1 13はソルダーレジストで ある。 実施例 A - 8 The copper foil surface 102 of the multilayer wiring board material A-3 with a built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding. (Fig. 6 (a)). Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was subjected to a roughening treatment using an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding, and then one surface was insulated. As a resin base material 107, a 18 m thick copper foil GTS-18 (Furukawa Circuit Oil Co., Ltd., trade name) via a 100 m thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) ) And on the other side as insulating resin substrate 107, through a 100-mm-thick glass epoxy pre-preda GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) and the above-mentioned multilayer wiring board with a built-in capacitor. For materials, temperature 170, pressure 1.5 The laminate was integrated under the press conditions of MPa and heating and pressing time of 60 minutes (Fig. 6 (b)). Here, 105 is plated copper, and 106 is a filling resin. This prepreg is prepared by applying a 25 m thick polyethylene terephthalate (PET) film on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. After drilling the desired location, screen printing In this method, copper paste NF 2000 (Tatsuyu System Electronics Co., Ltd., trade name) 116 was used, and the PET film on the surface was peeled off. A 0.05-m thick chromium thin film 108 was formed on the PZT thin film surface of this substrate by DC sputtering. Furthermore, a 20-meter metal layer 109 was formed on the surface by electrolytic copper plating (Fig. 6 (c)). A desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is removed using an aqueous ferric chloride solution, and a chromium metal layer is removed using an aqueous potassium ferricyanide solution. Thus, a first capacitor electrode pattern was formed (FIG. 6 (d)). Subsequently, a resist with a desired pattern was formed, and the PZT thin film and the ruthenium thin film were etched away by RIE using CF 4 gas (Fig. 6 (e)). Next, a desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including a second capacitor electrode is formed. A circuit board was fabricated (Fig. 6 (ί)). Subsequent application of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor in the same process as in Example II-1 (FIG. 6 (g)). Here, 1 12 is an insulating resin base material, and 1 13 is a solder resist. Example A-8
コンデンサ内蔵多層配線板用材料 A— 3の銅箔表面 102に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 7 (a))。 板厚 0. 2mmの両面 銅箔張ガラスエポキシ積層板 MCL— E— 679 F (日立化成工業株式会社製、 商品名) を基材として、 所望の箇所に導体化された接続穴と回路パターンを作 製した両面基板 104に、 多層化接着前処理として、 有機酸系マイクロエッチ ング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行つ た^に、 その一方の面に絶緣樹脂基材 107として厚み 100 mのガラスェ ポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介 して、 厚み 18 の銅箔 GTS— 18 (古河サ一キットフオイル株式会社、 商品名) を、 また他方の面に絶縁樹脂基材 107として厚み 100 mのガラ スエポキシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名) を介して前述のコンデンサ内蔵多層配線板用材料を配し、 温度 200 、 圧力 1.5 MP a、加熱加圧時間 60分のプレス条件で積層一体化した(図 7 (b))。 なお、 105はめつき銅を、 106は穴埋め樹脂を示す。 このプリプレダは、 両面に厚み 25 mのポリエチレンテレフタレート (PET) のフィルムを温 度 100°C, 圧力 1. 5MP a, 加熱加圧時間 10分の条件のホットプレスで 貼り付けた後、所望の箇所にドリル穴明けを行つた後、スクリーン印刷により、 化学的な反応により金属化される導電性ペースト 1 17であるナノペースト ひ VJマ化成株式会社、 商品名) を充填し、 その後に表面の PETフィルムを 剥がしたものを用いた。 その後のコンデンサの加工と多層配線板の加工につい ては実施例 A— 1と同様な工程で行い、 コンデンサ内蔵多層配線板を得た (図 7 (c))。 なお、 112は絶縁樹脂基材を、 1 13はソルダ一レジストであう る。 比較例 A— 1 The copper foil surface 102 of the multilayer wiring board material A-3 with a built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding. (Figure 7 (a)). Using 0.2 mm thick double-sided copper foil-clad glass epoxy laminate MCL-E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) as a base material, connecting holes and circuit patterns are The prepared double-sided substrate 104 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding. Through glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) with a thickness of 100 m as an exquisite resin base material 107 Then, a copper foil GTS-18 with a thickness of 18 (Furukawa Sakitoff Oil Co., Ltd., trade name) and a 100 m-thick glass epoxy pre-predeer GEA-679F as an insulating resin substrate 107 on the other surface (Made by Hitachi Chemical Co., Ltd.), the above-mentioned material for a multilayer wiring board with a built-in capacitor was arranged, and laminated and integrated under pressing conditions of a temperature of 200, a pressure of 1.5 MPa, and a heating and pressing time of 60 minutes ( Figure 7 (b). In addition, 105 is copper plating and 106 is filling resin. This prepreder is a 25 m thick polyethylene terephthalate (PET) film attached on both sides by a hot press with a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. Is filled with a conductive paste that is metallized by a chemical reaction, 117, a nanopaste (VJ Ma Kasei Co., Ltd., trade name), and then PET on the surface. The one from which the film was peeled was used. The subsequent processing of the capacitor and the processing of the multilayer wiring board were performed in the same steps as in Example A-1, and a multilayer wiring board with a built-in capacitor was obtained (Fig. 7 (c)). Reference numeral 112 denotes an insulating resin substrate, and reference numeral 113 denotes a solder resist. Comparative Example A-1
板厚 0.2 mmの両面銅箔張ガラスエポキシ積層板 MCL— E— 679 F (日 立化成工業株式会社製、 商品名) を基材として、 厚み 100 mのガラスェポ キシプリプレダ GE A— 679 F (日立化成工業株式会社製、商品名)を用い、 所望の箇所に導体化された接続穴と回路パターンを作製した 4層基板の表面に DCスパッタリング法により、 0. 2 mのルテニウム薄膜を形成した (図 8 (a))。 ここで、 102は銅箔、 105はめつき銅、 106は穴埋め樹脂、 1 07は絶緣榭脂基材である。 所望のパターンのレジストを形成し、 R I E法に よってルテニウム薄膜 103をエッチング除去し、 その後塩化第二鉄水溶液を 用.いて内層基板表面の銅の金属層をエッチング除去し、 第 2のコンデンサ電極 を含む回路パターンを形成した (図 8 (b))。 さらにその基板表面に強誘電体 薄膜形成材料 PZT (関東化学株式会社、 商品名) を塗布し、 温度 150°Cで 加熱時間 30分間のプリべ一クを行った。 塗布とプリべークをさらに 5回繰り. 返し、 その後に温度 250°Cで加熱時間 1時間の熱処理を行って、 厚さ 5 mの PZT薄膜 101を形成した (図 8 (c))。 さらにその PZT薄膜表面 に DCスパッタリング法により、 0. 05 mのクロム薄膜を形成した。 さら にその表面に電気銅めつきにより 20 mの金属層 109を形成した (図 8 (d))。 この基板の表面に所望のエッチングレジストを形成し、 塩化第二鉄水 溶液を用いて不要な銅の金属層をエツチング除去し、 フェリシアン化カリウム 水溶液を用いてクロムの金属層をエッチング除去して、 第 1のコンデンサ電極 のパターンを形成して回路板を作製した (図 8 (e))。 その後の多層配線板の 加工は実施例 A_ 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 8 (f))。 ここで、 1 12は絶縁樹脂基材であり、 1 13はソルダ一レジスト を示す。 試験方法は以下の通りである。 A 100 m thick glass epoxy prepreg GE A—679 F (Hitachi Chemical Co., Ltd.) based on a 0.2 mm thick double-sided copper foil clad glass epoxy laminate MCL—E—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.) Using a trade name (manufactured by Kogyo Co., Ltd.), a 0.2 m ruthenium thin film was formed by DC sputtering on the surface of a four-layer substrate in which conductive holes and circuit patterns were formed at desired locations. 8 (a)). Here, 102 is a copper foil, 105 is a plated copper, 106 is a filling resin, and 107 is a non-greasy base material. A resist having a desired pattern is formed, the ruthenium thin film 103 is removed by etching by RIE, and then the copper metal layer on the inner substrate surface is removed by etching using an aqueous ferric chloride solution, and the second capacitor electrode is removed. A circuit pattern was formed (Fig. 8 (b)). In addition, a ferroelectric substance The thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied and pre-baked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times. Thereafter, a heat treatment was performed at a temperature of 250 ° C for 1 hour to form a PZT thin film 101 having a thickness of 5 m (Fig. 8 (c)). Further, a 0.05 m chromium thin film was formed on the surface of the PZT thin film by DC sputtering. Furthermore, a metal layer 109 of 20 m was formed on the surface by electroplating copper (Fig. 8 (d)). A desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is etched and removed using a ferric chloride aqueous solution, and a chromium metal layer is etched and removed using a potassium ferricyanide aqueous solution. A circuit board was fabricated by forming the pattern of the capacitor electrode in Fig. 1 (Fig. 8 (e)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor through the same steps as in Example A_1 (FIG. 8 (f)). Here, 112 is an insulating resin base material, and 113 is a solder resist. The test method is as follows.
(誘電体の膜厚) (Dielectric thickness)
誘電体の膜厚は、 電極を形成したコンデンサを F o c u s e d I on B e arn s y s t e m (F I B : F B— 2000 A、 (株) 日立製作所製、 商品 名) により切削し、 その断面観察を走査型電子顕微鏡を用いて行い、 膜をはさ む電極と電極の間の距離の 5点平均をとつた。 The dielectric film thickness was measured by cutting the capacitor with the electrodes formed using a Focused Ion Bearn system (FIB: FB-2000A, manufactured by Hitachi, Ltd., trade name). The measurement was performed using a microscope, and the five-point average of the distance between the electrodes sandwiching the membrane was taken.
(比誘電率) (Relative permittivity)
比誘電率は、 25 °Cに温度管理された環境の下で、 I PC— 650 2. 5. 5. 2に準じて 1 MHzの周波数で測定して得た。 The relative permittivity was obtained by measuring at a frequency of 1 MHz according to IPC-650 2.5.5.2 in a temperature controlled environment of 25 ° C.
(コンデンサ容量) (Capacitor capacity)
コンデンサ容量は、 インピーダンスアナライザ 4291 B (アジレントテク ノロジー株式会社製、 商品名) に 50Ω同軸ケーブル SUCOFLEX104 /100 (SUHNER社製、 商品名) を介して高周波信号測定プローブ M I CROPROBE ACP 50 (GSG250型、 Ca s c ade社製、 商品 名) に接続した測定システムを用いた。 キャパシ夕の電極サイズは lmm口と し 1 GH zの容量を測定した。 測定サンプル数は 5とした。 表 1 The capacitance of the capacitor is measured by the impedance analyzer 4291 B (Agilent Noology Co., Ltd., trade name) connected to a high frequency signal measurement probe MI CROPROBE ACP 50 (GSG250, Cascade, trade name) via a 50Ω coaxial cable SUCOFLEX104 / 100 (SUHNER, trade name). A measurement system was used. The electrode size of the capacitor was 1 mm and the capacity of 1 GHz was measured. The number of measurement samples was 5. table 1
実施例 A_ 1〜A— 8は、 いずれも、 金属箔の表面に比誘電率が 10〜20 00でかつ膜厚が 0. 05〜2^mの誘電体薄膜が設けられたことを特徴とす るコンデンサ内蔵多層配線板用材料を用いて作製したコンデンサ内蔵基板であ る。 作製したコンデンサ容量のばらつきは全て ± 10%未満であり、 均一で良 好なコンデンサを作製することができた。 Examples A_1 to A-8 are all characterized in that a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2 ^ m is provided on the surface of the metal foil. This is a substrate with built-in capacitors manufactured using the material for multilayer wiring boards with built-in capacitors. Variations in the capacitance of the manufactured capacitors were all less than ± 10%, and uniform and good capacitors could be manufactured.
また、 比較例 A— 1は、 誘電体薄膜を金属層がパターニングされた基板の表 面に形成されたコンデンサ内蔵基板であるために、 膜厚のばらつきが大きく、 結果としてコンデンサ容量のばらつきも最大 54 %と大きかった。 Further, Comparative Example A-1 is a capacitor built-in substrate in which a dielectric thin film is formed on the surface of a substrate on which a metal layer is patterned, so that the film thickness varies greatly. As a result, the variation of the capacitor capacitance was as large as 54% at the maximum.
上記の実施形態によると、 本発明によって、 コンデンサを形成する誘電体萍 膜の比誘電率が 20〜2000でかつ膜厚が 0. l〜l mであり、 かつ容量 ばらつきの小さなコンデンサを有する多層配線板を提供することができる。 According to the above-described embodiment, according to the present invention, a multilayer wiring having a capacitor having a dielectric constant of 20 to 2000, a film thickness of 0.1 to lm, and a small capacitance variation is provided. Board can be provided.
(実施例 B) (Example B)
内層基板 B— 1 Inner substrate B— 1
銅箔厚 3 zm、 板厚 0. 2mmの両面銅箔張ガラスエポキシ積層板 MCL— E- 679 F (日立化成工業株式会社製、 商品名) に所望のドリル穴明け (直 径 200 xm) を行った。 そして、 この基板に、 超音波洗浄と過マンガン酸ァ ルカリ溶液を用いて炭化した樹脂カスを除去した後、 触媒付与、 密着促進後、 無電解銅めつきを行い、 ドリル穴内壁と銅箔表面に約 15 /mの無電解銅めつ き層 204を形成した。 得られた基板表面に次亜塩素酸ナトリウムを主成分と する黒化処理と、 ジメチルァミノポランを主成分とする還元処理により粗化処 理を行った。 そして、 この基板のドリル穴内にスクリーン印刷によりペースト タイプの熱硬化型絶縁材料 HRP— 700 BA (太陽インキ製造株式会社製、 商品名) を穴埋め樹脂 203として充填し、 170°Cで 60分間の熱処理によ り硬化させた。 この基板をパフブラシにより研磨し、 余分な絶縁材料を除去し た。 この基板に触媒付与、 密着促進後、 無電解銅めつきを行い、 基板表面に約 1 5 の無電解銅めつき層を形成し、 基板内部に導体層間を接続するバイァ ホールを有し、 かつ表面に平滑な金属層を有する基板を作製した。 走査型電子 顕微鏡を用いて観察した像から求めた基板表面の金属層の表面粗さは 0. 3 n mであった。 作製した内層基板の断面図を図 9に示した。 なお、 202は絶縁 樹脂基材を、 201は銅箔を示す。 内層基板 B— 2 Drill a desired hole (diameter 200 xm) in a double-sided copper foil-clad glass epoxy laminate MCL—E-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) with a copper foil thickness of 3 zm and a thickness of 0.2 mm. went. After removing the carbonized resin residue from the substrate using ultrasonic cleaning and alkali permanganate solution, applying a catalyst and promoting adhesion, electroless copper plating was performed, and the inner wall of the drill hole and the copper foil surface were removed. Then, an electroless copper plating layer 204 of about 15 / m was formed. The surface of the obtained substrate was subjected to a roughening treatment by a blackening treatment containing sodium hypochlorite as a main component and a reduction treatment containing dimethylaminoporan as a main component. Then, paste-type thermosetting insulating material HRP-700 BA (manufactured by Taiyo Ink Mfg. Co., Ltd., trade name) is filled into the drilled holes of this board by screen printing as filling resin 203, and heat treatment is performed at 170 ° C for 60 minutes. And cured. This substrate was polished with a puff brush to remove excess insulating material. After applying a catalyst to this substrate and promoting adhesion, electroless copper plating is performed, about 15 electroless copper plating layers are formed on the substrate surface, and via holes are provided inside the substrate to connect conductive layers, and A substrate having a smooth metal layer on the surface was produced. The surface roughness of the metal layer on the substrate surface determined from an image observed with a scanning electron microscope was 0.3 nm. FIG. 9 shows a cross-sectional view of the manufactured inner layer substrate. Here, 202 indicates an insulating resin base material, and 201 indicates a copper foil. Inner substrate B-2
厚み 200 / mのガラスエポキシプリプレダ GEA— 679 F (日立化成ェ 業株式会社製、 商品名) の両面に厚み 25 imのポリエチレンテレフタレ一ト (PET) のフィルムを温度 100°C, 圧力 1. 5MP a, 加熱加圧時間 10 分の条件のホットプレスで貼り付けた。 このプリプレダに所望のドリル穴明け (直径 200 m) を行った後、 スクリーン印刷により、 銅ペースト NF 20 00 (タッタシステム ·エレクトロニクス株式会社製、 商品名) 205を充填 した。 表面の PETフィルムを剥がし、 厚み 18 mの銅箔 GTS— 18 (古 河サーキットフオイル株式会社製、 商品名) で両面から挟み、 温度 170°C、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板内 部に導体層間を接続するバイァホールを有し、 かつ表面に平滑な金属層を有す る基板を作製した。 走査型電子顕微鏡を用いて観察した像から求めた基板表面 の金属層の表面粗さは 0. 2 ^ mであった。 作製した内層基板の断面図を図 1 0に示した。 内層基板 B—3 200 / m-thick glass epoxy prepredder GEA—679 F (Hitachi Chemical A 25 im thick polyethylene terephthalate (PET) film is applied on both sides of a hot press under the conditions of a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. I attached. After performing a desired drilling (diameter 200 m) on the pre-preda, a copper paste NF 20000 (trade name, manufactured by Tatta System Electronics Co., Ltd.) 205 was filled by screen printing. Peel off the PET film on the surface and sandwich it between both sides with 18 m thick copper foil GTS-18 (trade name, manufactured by Furukawa Circuit Oil Co., Ltd.), temperature 170 ° C, pressure 1.5MPa, heating and pressing time 60 The substrate was laminated and integrated under the same press conditions to produce a substrate having a via hole inside the substrate for connecting the conductor layers and having a smooth metal layer on the surface. The surface roughness of the metal layer on the substrate surface determined from images observed with a scanning electron microscope was 0.2 ^ m. FIG. 10 shows a cross-sectional view of the manufactured inner layer substrate. Inner layer substrate B-3
厚み 200 mのガラスエポキシプリプレダ GEA— 679 F (日立化成ェ 業株式会社製、 商品名) の両面に厚み 25 mのポリエチレンテレフ夕レート (PET) のフィルムを温度 100°C, 圧力 1. 5 MP a, 加熱加圧時間 10 分の条件のホットプレスで貼り付けた。 このプリプレダに所望のドリル穴明け (直径 200 ^m) を行った後、 スクリーン印刷により、 化学的な反応により 金属化される導電性ペーストであるナノべ一スト (ハリマ化成株式会社製、 商 品名) 206を充填した。 表面の PETフィルムを剥がし、 厚み 18 mの銅 箔 GTS— 18 (古河サーキットフオイル株式会社、商品名)で両面から挟み、 温度 170 、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一 体化し、 基板内部に導体層間を接続するバイァホールを有し、 かつ表面に平滑 な金属層を有する基板を作製した。 走査型電子顕微鏡を用いて観察した像から 求めた基板表面の金属層の表面粗さは 0. であった。 作製した内層基板 の断面図を図 1 1に示した。 実施例 B— 1 200 m thick glass epoxy pre-predator GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) 25 m thick polyethylene terephthalate (PET) film on both sides at a temperature of 100 ° C and a pressure of 1.5 It was pasted by a hot press under the conditions of MPa, heating and pressurizing time of 10 minutes. After making the desired drilling (diameter 200 ^ m) in this pre-preda, nano paste (manufactured by Harima Chemicals Co., Ltd.) which is a conductive paste that is metallized by chemical reaction by screen printing 206) was filled. Peel off the PET film on the surface and sandwich it between both sides with 18 m thick copper foil GTS-18 (Furukawa Circuit Oil Co., Ltd., trade name), temperature 170, pressure 1.5MPa, pressurization time 60 minutes Then, a substrate having via holes for connecting conductive layers inside the substrate and having a smooth metal layer on the surface was manufactured. The surface roughness of the metal layer on the substrate surface determined from the image observed with a scanning electron microscope was 0. A cross-sectional view of the fabricated inner layer substrate is shown in FIG. Example B-1
内層基板 B— 1の基板表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 207を形成した (図 12 (a))。 さらにその基板表面にチタン テトライソプロポキシド、 ジルコンテトラターシャリーブトキシド、 ジピバロ ィルメタン鉛錯体、 二酸化窒素を用いたマイクロ波プラズマ CVI こより、 基 板温度 250°Cの条件下で厚さ 0. 5 ^111の?2丁 (チタン酸ジルコン酸鉛) 薄膜 208を形成した (図 12 (b))。 さらにその PZT薄膜表面に DCスパ ッ夕リング法により、 0. 05 mのクロム薄膜 209を形成した。 さらにそ の表面に電気銅めつきにより 2 Ο ΠΙの金属層 210を形成した(図 12 (c))。 この基板の表面に所望のエッチングレジストを形成し、 塩化第二鉄水溶液を用 いて不要な銅の金属層 2 1 0をエッチング除去し、 フェリシアン化カリウム水 溶液を用いてクロムの金属層 209をエッチング除去して、 第 1のコンデンサ 電極 2 17のパターンを形成した (図 12 (d))。 続いて、 所望のパターンの レジストを形成し、 CF4ガスを用いた R I E法によって P ZT薄膜 208と ルテニウム薄膜 207をエッチング除去した (図 12 (e))。 次に、 さらに所 望のエッチングレジストを形成し、 塩化第二鉄溶液によって不要な銅の金属層 をエッチング除去して、 第 2のコンデンサ電極 218を含む回路パターンを形 成してコンデンサ内蔵多層配線板に用いる内層板 2 1 9を作製した (図 1 2 (f))。 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 12 (a)). In addition, a microwave plasma CVI using titanium tetraisopropoxide, zircon tetratertiary butoxide, dipivaloyl methane lead complex, and nitrogen dioxide on the substrate surface. of? Two (lead zirconate titanate) thin films 208 were formed (Fig. 12 (b)). Further, a 0.05 m chromium thin film 209 was formed on the PZT thin film surface by a DC sputtering method. Furthermore, a two-layered metal layer 210 was formed on the surface by copper electroplating (Fig. 12 (c)). A desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer 210 is removed by etching using an aqueous ferric chloride solution, and a chromium metal layer 209 is removed by etching using a potassium ferricyanide aqueous solution. Thus, a pattern of the first capacitor electrode 217 was formed (FIG. 12D). Subsequently, a resist having a desired pattern was formed, and the PZT thin film 208 and the ruthenium thin film 207 were etched away by RIE using CF 4 gas (FIG. 12 (e)). Next, a desired etching resist is further formed, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including the second capacitor electrode 218 is formed to form a multilayer wiring with a built-in capacitor. An inner layer plate 219 used for the plate was produced (FIG. 12 (f)).
この内層板の回路表面に、次亜塩素酸ナトリウムを主成分とする黒化処理と、 ジメチルァミノポランを主成分とする還元処理によって、 粗化処理を行った。 (1) 35 キャリア銅箔付き厚み 3 の銅箔 MT35 S 3 (三井金属鉱 業株式会社製、 商品名)、 (2) 絶縁樹脂基材 2 1 1として厚み 100 mのフ イラ一入りガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会 社製、 商品名)、 (3) 内層板 2 1 9、 (4) 絶縁樹脂基材 2 1 1として厚み 10 0 mのフイラ一入りガラスエポキシプリプレダ GEA— 679 F、 (5) 35 mキャリア銅箔付き厚み 3 の銅箔 MT 35 S 3 (三井金属鉱業株式会社 製、 商品名) の順に重ね、 温度 170°C、 圧力 1. 5MPa、 加熱加圧時間 6 0分のプレス条件で積層一体化した。 キャリア銅箔を剥がし、 不要な基板端部 を切断後、 この基板の表面に所望のエッチングレジストを形成し、 不要な銅箔 をエッチング除去して、 所望の箇所に直径 0. 15mmの窓穴を形成した。 この基板表面に設けた窓穴の箇所に三菱電機株式会社製 ML 505 GT型炭 酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 100M s、 ショット 数 4回の条件でレーザ穴明けを行った。 超音波洗浄とアルカリ過マンガン酸液 で炭化した樹脂カスを除去後、 洗浄、 触媒付与、 密着促進後無電解銅めつきを 行い、 レーザ穴内壁と銅箔表面に約 20 mの無電解銅めつき層を形成した。 この基板表面のパッドゃ回路パターンなど必要な箇所にエッチングレジストを 形成し、 不要な銅をエッチング除去して、 外層回路 213を形成した。 The circuit surface of the inner layer plate was subjected to a roughening treatment by a blackening treatment mainly containing sodium hypochlorite and a reduction treatment mainly containing dimethylaminoporan. (1) 35-thick copper foil with 35 carrier copper foil MT35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.), (2) Insulating resin base material 2 1 1 100 m thick glass-filled glass epoxy Pre-Preda GE A—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.), (3) Inner plate 219, (4) Insulating resin substrate 2 1 1 100 m thick glass epoxy containing filler Pre-Preda GEA—679 F, (5) 35 m Copper foil with carrier Copper foil of thickness 3 MT 35 S 3 (Mitsui Metal Mining Co., Ltd., trade name) layered in this order, temperature 170 ° C, pressure 1.5MPa, heating and pressurizing time 60min. Laminated and integrated. After peeling off the carrier copper foil and cutting the unnecessary edge of the substrate, a desired etching resist is formed on the surface of this substrate, the unnecessary copper foil is removed by etching, and a window hole having a diameter of 0.15 mm is formed at a desired position. Formed. Laser holes were drilled in the window holes provided on the substrate surface using a ML 505 GT type carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 Ms, and four shots. . After ultrasonic cleaning and removal of resin residue carbonized with an alkali permanganate solution, cleaning, application of a catalyst, and adhesion promotion, electroless copper plating is performed, and approximately 20 m of electroless copper plating is applied to the inner wall of the laser hole and the copper foil surface. An adhering layer was formed. An outer layer circuit 213 was formed by forming an etching resist on a required portion such as a pad and a circuit pattern on the surface of the substrate, and removing unnecessary copper by etching.
この基板表面にソルダ一レジスト PSR— 4000 AUS 5 (太陽インキ 製造株式会社製、 商品名) を口一ルコ一夕で 30 m塗布、 乾燥後に露光 *現 像して所望の箇所にソルダーレジス卜 212を形成した。 その後、 3 の無 電解ニッケルめっきと 0. 1 mの無電解金めつきを外層回路パターン露出部 表面層に形成して、 コンデンサ内蔵多層配線板 220を得た (図 4 (g))。 実施例 B— 2 Apply a solder resist PSR-4000 AUS 5 (trade name, manufactured by Taiyo Ink Mfg. Co., Ltd.) on the surface of the substrate for 30 m by mouth and mouth, and then dry and expose. * Image and solder resist at desired locations 212 Was formed. After that, electroless nickel plating 3 and electroless gold plating of 0.1 m were formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 4 (g)). Example B-2
内層基板 B— 1を内層基板 B— 2に替えた以外は実施例 B— 1と同様な工程 によりコンデンサ内蔵多層配線板を得た。 実施例 B— 3 A multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example B-1, except that the inner substrate B-1 was changed to the inner substrate B-2. Example B-3
内層基板 B— 1を内層基板 B— 3に替えた以外は実施例 B— 1と同様な工程 によりコンデンサ内蔵多層配線板を得た。 実施例 B—4 内層基板 B— 1の基板表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 207を形成した (図 12 (a))。 さらにその基板表面に強誘電 体薄膜形成材料 P ZT (関東化学株式会社製、商品名)を塗布し、温度 150°C で加熱時間 30分間のプリべークを行った。 塗布とプリべークをさらに 5回繰 り返し、 その後に温度 250°Cで加熱時間 1時間の熱処理を行って、 厚さ 0. 5 mの PZT薄膜 208を形成した (図 12 (b))。 その後のコンデンサの 加工と多層配線板の加工については実施例 B— 1と同様な工程で行い、 コンデ ンサ内蔵多層配線板を得た (図 12 (g))。 実施例 B— 5 A multilayer wiring board with a built-in capacitor was obtained in the same process as in Example B-1, except that the inner substrate B-1 was changed to the inner substrate B-3. Example B-4 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 12 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the surface of the substrate, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, followed by heat treatment at a temperature of 250 ° C for a heating time of 1 hour to form a 0.5 m thick PZT thin film 208 (Fig. 12 (b) ). Subsequent processing of the capacitor and processing of the multilayer wiring board were performed in the same steps as in Example B-1, and a multilayer wiring board with a built-in capacitor was obtained (FIG. 12 (g)). Example B-5
P ZT薄膜 208とルテニウム薄膜 207をエツチング除去する方法が R I E法ではなく、 PZT薄膜に対して 20重量%重フッ化アンモニゥム (NH4F - HF)水溶液、ルテニウム薄膜に対してルテニウムエッチング液 REC— 01 (関 東化学株式会社製、 商品名) を用いてエッチングした以外は実施例 B— 4と同 様な工程によりコンデンサ内蔵多層配線板を得た (図 12 (g))。 実施例 B— 6 The method of removing the PZT thin film 208 and the ruthenium thin film 207 by etching is not the RIE method, but a 20% by weight aqueous solution of ammonium bifluoride (NH 4 F-HF) for the PZT thin film and the ruthenium etching solution REC—for the ruthenium thin film. A multilayer wiring board with a built-in capacitor was obtained by the same process as in Example B-4 except that etching was performed using 01 (manufactured by Kanto Chemical Co., Ltd., trade name) (Fig. 12 (g)). Example B-6
内層基板 B— 1の基板表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 207を形成した (図 13 (a))。 さらにその基板表面に強誘電 体薄膜形成材料 P Z T (関東化学株式会社製、商品名)を塗布し、温度 150 °C で加熱時間 30分間のプリべ一クを行った。 塗布とプリべークをさらに 5回繰 り返し、 その後に温度 250°Cで加熱時間 1時間の熱処理を行って、 厚さ 0. 5 mの PZT薄膜 208を形成した (図 13 (b))。 さらにその PZT薄膜 表面に DCスパッタリング法により、 0. 05 /mのクロム薄膜 209を形成 した。 さらにその表面を洗浄、 触媒付与、 密着促進後無電解銅めつきを行い、 0. 5 mの銅薄膜を形成した。 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 13 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the surface of the substrate, and prebaked at a temperature of 150 ° C. for a heating time of 30 minutes. The application and pre-bake were repeated five more times, and then heat treatment was performed at a temperature of 250 ° C for 1 hour to form a 0.5-m thick PZT thin film 208 (Fig. 13 (b) ). Further, a 0.05 / m chromium thin film 209 was formed on the surface of the PZT thin film by DC sputtering. After cleaning the surface, applying a catalyst and promoting adhesion, electroless copper plating was performed to form a 0.5 m copper thin film.
この基板の表面に所望のめっきレジスト 215を形成し、 電気銅めつきを行 い、 厚み 20 /mの第 1のコンデンサ電極となる金属層 214を形成した (図 13 (c))。 めっきレジスト 215を剥離後、 基板表面の 0. 5 mの銅薄膜 と 0. 05 mのクロム薄膜をエッチング除去して、 第 1のコンデンサ電極 2 17のパターンを形成した (図 13 (d))。 続いて、 所望のパターンのレジス トを形成し、 20重量%重フッ化アンモニゥム (N F 'HF) 水溶液を用いて P ZT薄膜 208をエッチング除去し、ルテニウムエッチング液 REC—01 (関 東化学株式会社製、 商品名) 用いてルテニウム薄膜 207をエッチング除去し た (図 13 (e))。 次に、 さらに所望のエッチングレジストを形成し、 塩化第 二鉄溶液によって不要な銅の金属層をエッチング除去して、 第 2のコンデンサ 電極 21 8を含む回路パターンを形成して内層板 21 9を作製した (図 1 3 ( f ))。 その後の多層配線板の加工は実施例 B— 1と同様な工程によりコンデ ンサ内蔵多層配線板 220を得た (図 13 (g))。 実施例 B— 7 A desired plating resist 215 is formed on the surface of this substrate, and electroplating is performed. Then, a metal layer 214 serving as a first capacitor electrode having a thickness of 20 / m was formed (FIG. 13 (c)). After removing the plating resist 215, the 0.5 m copper thin film and the 0.05 m chromium thin film on the substrate surface were removed by etching to form the pattern of the first capacitor electrode 217 (Fig. 13 (d)). . Subsequently, a resist having a desired pattern is formed, and the PZT thin film 208 is removed by etching using a 20% by weight aqueous solution of ammonium bifluoride (NF'HF), and a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd.) Ruthenium thin film 207 was removed by etching (Fig. 13 (e)). Next, a desired etching resist is further formed, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including the second capacitor electrode 218 is formed to form the inner plate 219. It was fabricated (Fig. 13 (f)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example B-1 to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 13 (g)). Example B-7
内層基板 B— 1の基板表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 207を形成した (図 14 (a))。 さらにその基板表面に強誘電 体薄膜形成材料 PZT (関東化学株式会社製、商品名)を塗布し、温度 150°C で加熱時間 30分間のプリべークを行った。 塗布とプリべークをさらに 5回繰 り返し、 その後に温度 250 Cで加熱時間 1時間の熱処理を行って、 厚さ 5 mの PZT薄膜 208を形成した (図 14 (b))。 さらにその PZT薄膜 表面の所望の箇所にスクリーン印刷により、 化学的な反応により金属化される 導電性ペーストであるナノペースト (八リマ化成株式会社製、 商品名) 216 を 40 mの厚みで印刷後、 温度 200nCで加熱時間 1時間の条件でベ一キン グし、 導電性ペーストを金属化して、 第 1のコンデンサ電極 217のパターン を形成した (図 14 (c))。 続いて、 所望のパターンのレジストを形成し、 2 0重量%重フッ化アンモニゥム (NH4F 'HF) 水溶液を用いて P ZT薄膜をエツ チング除去し、 ルテニウムエッチング液 REC— 01 (関東化学株式会社製、 商品名)を用いてルテニウム薄膜をエッチング除去した(図 14 (d))。次に、 さらに所望のエッチングレジストを形成し、 塩化第二鉄溶液によって不要な銅 の金属層をエッチング除去して、 第 2のコンデンサ電極 218を含む回路パタ —ンを形成して内層板 219を作製した (図 14 (e))。 その後の多層配線板 の加工は実施例 B— 1と同様な工程によりコンデンサ内蔵多層配線板 220を 得た (図 14 (Π)。 実施例 Β— 8 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 14 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, followed by a heat treatment at a temperature of 250 ° C. for a heating time of 1 hour to form a 5 m-thick PZT thin film 208 (FIG. 14 (b)). Furthermore, nano-paste 216, a conductive paste that is metallized by a chemical reaction at a desired position on the surface of the PZT thin film by screen chemical printing (trade name, manufactured by Hachiriima Kasei Co., Ltd.) with a thickness of 40 m, Then, baking was performed at a temperature of 200 nC for a heating time of 1 hour, and the conductive paste was metallized to form a pattern of the first capacitor electrode 217 (FIG. 14 (c)). Subsequently, a resist having a desired pattern is formed, and the PZT thin film is etched and removed using a 20% by weight aqueous solution of ammonium bifluoride (NH 4 F'HF), and a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd.) Made by company, The ruthenium thin film was removed by etching (product name) (Fig. 14 (d)). Next, a desired etching resist is further formed, an unnecessary copper metal layer is removed by etching with a ferric chloride solution, and a circuit pattern including the second capacitor electrode 218 is formed to form the inner layer plate 219. It was fabricated (Fig. 14 (e)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example B-1 to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 14 (Π). Example Β-8)
内層基板 Β— 1の基板表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 207を形成した (図 15 (a))。 さらにその基板表面に強誘電 体薄膜形成材料 P ZT (関東化学株式会社製、商品名)を塗布し、温度 150°C で加熱時間 30分間のプリべ一クを行った。 塗布とプリべ一クをさらに 5回繰 り返し、 その後に温度 250でで加熱時間 1時間の熱処理を行って、 厚さ 0. 5 mの PZT薄膜 208を形成した (図 15 (b))。 続いて、 所望のパ夕一 ンのレジストを形成し、 20重量%重フッ化アンモニゥム (N F · HF) 水溶液 を用いて PZT薄膜 208をエッチング除去し、 ルテニウムエッチング液 RE C-01 (関東化学株式会社製、 商品名) を用いてルテニウム薄膜をエツチン グ除去して PZT薄膜のパターニングを行った (図 15 (c))。 その PZT薄 膜表面に DCスパッタリング法により、 0. 05 z mのクロム薄膜 209を形 成した。 さらにその表面に電気銅めつきにより 20 mの金属層 210を形成 した (図 15 (d))。 この基板の表面に所望のエッチングレジストを形成し、 塩化第二鉄水溶液を用いて不要な銅の金属層をエッチング除去し、 フェリシア ン化カリゥム水溶液を用いてクロムの金属層をエッチング除去して、 第 1のコ ンデンサ電極 217と第 2のコンデンサ電極 218およびその他の配線パター ンを形成して内層板 219を作製した (図 1 5 (e))。 その後の多層配線板の 加工は実施例 B— 1と同様な工程によりコンデンサ内蔵多層配線板 220を得 た (図 15 (f ))。 比較例 B - 1 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner layer substrate 1 by DC sputtering (FIG. 15 (a)). Further, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The coating and prebaking were repeated five more times, and then a heat treatment was performed at 250 at a heating time of 1 hour to form a 0.5 m thick PZT thin film 208 (Fig. 15 (b)). . Subsequently, a desired resist pattern is formed, and the PZT thin film 208 is removed by etching using a 20% by weight aqueous solution of ammonium bifluoride (NF / HF). The PZT thin film was patterned by etching the ruthenium thin film using a company (trade name) (Fig. 15 (c)). A 0.05 zm chromium thin film 209 was formed on the PZT thin film surface by DC sputtering. Furthermore, a 20-meter metal layer 210 was formed on the surface by copper electroplating (Fig. 15 (d)). A desired etching resist is formed on the surface of this substrate, an unnecessary copper metal layer is removed by etching using an aqueous ferric chloride solution, and a chromium metal layer is removed by etching using an aqueous potassium ferricyanide solution. The first capacitor electrode 217, the second capacitor electrode 218, and other wiring patterns were formed to produce an inner layer plate 219 (FIG. 15 (e)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example B-1, to obtain a multilayer wiring board 220 with a built-in capacitor (FIG. 15 (f)). Comparative Example B-1
内層基板 B— 1の基板表面に DCスパッタリング法により、 0. 2 mのル テニゥム薄膜 207を形成した (図 16 (a))。 所望のパターンのレジストを 形成し、 R I E法によってルテニウム薄膜 207をエッチング除去し、 その後 塩化第二鉄水溶液を用いて内層基板表面の銅の金属層をエッチング除去し、 第 2のコンデンサ電極 218を含む回路パターンを形成した (図 16 (b))。 さ らにその基板表面に強誘電体薄膜形成材料 PZT (関東化学株式会社製、 商品 名) を塗布し、 温度 150°Cで加熱時間 30分間のプリべークを行った。 塗布 とプリべークをさらに 5回繰り返し、 その後に温度 250°Cで加熱時間 1時間 の熱処理を行って、厚さ 0.5 mの PZT薄膜 208を形成した(図 16(c))。 さらに、 その PZT薄膜表面に DCスパッタリング法により、 0. 05 zmの クロム薄膜 209を形成した。 さらにその表面に電気銅めつきにより 20 urn の金属層 210を形成した (図 16 (d))。 この基板の表面に所望のエツチン グレジストを形成し、 塩化第二鉄水溶液を用いて不要な銅の金属層をエツチン グ除去し、 フェリシアン化カリウム水溶液を用いてクロムの金属層をエツチン グ除去して、 第 1のコンデンサ電極 217のパターンを形成して内層板 219 を作製した (図 16 (e))。 その後の多層配線板の加工は実施例 B— 1と同様 な工程によりコンデンサ内蔵多層配線板 220を得た (図 16 (f))。 以上で得られたコンデンサ内蔵多層配線板について、 誘電体の膜厚、 非誘電 率およびコンデンサ容量の試験を行った。 試験方法を上記と同様である。 A 0.2 m ruthenium thin film 207 was formed on the surface of the inner substrate B-1 by DC sputtering (FIG. 16 (a)). A resist having a desired pattern is formed, the ruthenium thin film 207 is etched and removed by RIE, and then the copper metal layer on the inner substrate surface is etched and removed using an aqueous ferric chloride solution, and the second capacitor electrode 218 is included. A circuit pattern was formed (Fig. 16 (b)). Furthermore, a ferroelectric thin film forming material PZT (trade name, manufactured by Kanto Chemical Co., Ltd.) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, and then a heat treatment was performed at a temperature of 250 ° C for a heating time of 1 hour to form a PZT thin film 208 having a thickness of 0.5 m (Fig. 16 (c)). Further, a 0.05 zm chromium thin film 209 was formed on the surface of the PZT thin film by DC sputtering. Furthermore, a 20 urn metal layer 210 was formed on the surface by copper electroplating (Fig. 16 (d)). A desired etching resist is formed on the surface of the substrate, an unnecessary copper metal layer is etched and removed using an aqueous ferric chloride solution, and a chromium metal layer is etched and removed using an aqueous potassium ferricyanide solution. An inner layer plate 219 was formed by forming a pattern of the first capacitor electrode 217 (FIG. 16 (e)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board 220 with a built-in capacitor by the same steps as in Example B-1 (FIG. 16 (f)). With respect to the multilayer wiring board with a built-in capacitor obtained as described above, tests were performed on the dielectric film thickness, non-dielectric constant, and capacitor capacity. The test method is the same as described above.
これらの測定結果をまとめて表 2に示した。 表 2 Table 2 summarizes the results of these measurements. Table 2
実施例8— 1〜8 _ 8は、 いずれも、 基板内部に導体層間を接続するバイァ ホールを有し, かつ表面に平滑な金属層を有する基板の表面に比誘電率が 1 0 〜2 0 0 0でかつ膜厚が 0 . 0 5〜 2 mの誘電体薄膜を形成することにより 作製したコンデンサ内蔵基板である。 作製したコンデンサ容量のばらつきは全 て ± 1 0 %未満であり、 均一で良好なコンデンサを作製することができた。 また、 比較例 B— 1は、 誘電体薄膜を金属層がパターニングされた基板の表 面に形成されたコンデンサ内蔵基板であるために、 膜厚のばらつきが大きく、 結果としてコンデンサ容量のばらつきも最大 5 4 %と大きかった。 In all of Examples 8-1 to 8-8, the dielectric constant was 10 to 20 on the surface of the substrate having via holes for connecting conductive layers inside the substrate and having a smooth metal layer on the surface. This is a capacitor built-in substrate manufactured by forming a dielectric thin film having a thickness of 0.00 and a thickness of 0.05 to 2 m. Variations in the capacitance of the manufactured capacitors were all less than ± 10%, and uniform and good capacitors could be manufactured. In Comparative Example B-1, since the dielectric thin film was a substrate with a built-in capacitor formed on the surface of the substrate on which the metal layer was patterned, the thickness variation was large, and as a result, the variation in the capacitor capacitance was also maximum. It was as large as 54%.
上記の実施例によると、 膜厚が均一で、 容量ばらつきの小さなコンデンサを 内蔵したコンデンサ内蔵多層配線板を提供することができる。 According to the above embodiment, it is possible to provide a multilayer wiring board with a built-in capacitor having a built-in capacitor having a uniform film thickness and a small variation in capacitance.
(実験例 C) (Experimental example C)
コンデンサ内蔵多層配線板用材料 C一 1 厚み 35^mの圧延銅箔 M— BNH— 18 (三井金属鉱業株式会社製、 商品 名) 102の表面に: DCスパッタリング法により、 0. 2 mのルテニウム萍 膜 103を形成した。 さらにその表面に強誘電体薄膜形成材料 PZT (関東化 学株式会社、 商品名) を塗布し、 温度 150°Cで加熱時間 30分間のプリべ一 クを行った。 塗布とプリべークをさらに 5回繰り返し、 その後に温度 350°C で加熱時間 1時間の熱処理を行って、 厚さ 0. 5 1!1の?2丁薄膜101を形 成した。 このようにして、 銅箔 2 (金属箔) 102の片面に、 ルテニウム薄膜 103を介して P ZT薄膜 101 (誘電体薄膜) を設けたコンデンサ内蔵多層 配線板用材料 C一 1を作製した(図 1参照)。 このようにして得られた PZT薄 膜の比誘電率は 100であった。 コンデンサ内蔵多層配線板用材料 C一 2 Material for multilayer wiring board with built-in capacitor C-1 Rolled copper foil M—BNH—18 (manufactured by Mitsui Mining & Smelting Co., Ltd., trade name) with a thickness of 35 ^ m. Furthermore, a ferroelectric thin film forming material PZT (Kanto Kagaku Co., Ltd., trade name) was applied to the surface, and pre-baking was performed at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake are repeated five more times, and then heat treatment is performed at 350 ° C for 1 hour to obtain a thickness of 0.5 1! 1. Two thin films 101 were formed. Thus, a material C-11 for a multilayer wiring board with a built-in capacitor in which a PZT thin film 101 (dielectric thin film) was provided on one side of a copper foil 2 (metal foil) 102 via a ruthenium thin film 103 (FIG. 1). The relative dielectric constant of the PZT thin film thus obtained was 100. Material for multilayer wiring board with built-in capacitor C-1
厚み 35 の圧延銅箔 M— BNH— 18 (三井金属鉱業株式会社製、 商品 名) 102の表面に DCスパッタリング法により、 0. 2 mのルテニウム薄 膜 103を形成した。 さらにその表面にチタンテトライソプロポキシド、 ジル コンテトラターシャリ一ブトキシド、 ジピバロィルメタン鉛錯体、 二酸化窒素 を用いたマイクロ波プラズマ CVDにより、 基材温度 350°Cの条件下で厚さ 0. 5 111の?2丁 (チタン酸ジルコン酸鉛) 薄膜 101を形成し、 コンデン サ内蔵多層配線板用材料 C一 2を得た。 このようにして得られた P Z T薄膜の 比誘電率は 7 0であった。 薄膜エツチャント 1 A 0.2 m ruthenium thin film 103 was formed on the surface of a rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Mining & Smelting Co., Ltd.) 102 having a thickness of 35 by DC sputtering. In addition, the surface is subjected to microwave plasma CVD using titanium tetraisopropoxide, zircon tetratert-butoxide, dipivaloyl methane lead complex, and nitrogen dioxide at a substrate temperature of 350 ° C. 0.5 of 111? Two (lead zirconate titanate) thin films 101 were formed to obtain a material C-12 for a multilayer wiring board with a built-in capacitor. The relative permittivity of the PZT thin film thus obtained was 70. Thin film etchant 1
エチレンジァミン四酢酸 '二ナトリウム塩 (EDTA · 2Na)、 過酸化水素 (H2 〇2 )、 水を混合し、 EDTA ' 2Na 0. lmo l/l、 H2 〇2 30 wt %を成分とする pH4. 0の水溶液を作製した。 薄膜エツチャント 2 イミノニ酢酸 (I DA)、 H2 02、 水を混合し、 I DAO. lmo l / l、 H2 02 3 Owt %を成分とする pH2. 0の水溶液を作製した。 薄膜エツチャント 3 Echirenjiamin tetraacetate 'disodium salt (EDTA · 2Na), hydrogen peroxide (H 2 〇 2), were mixed with water, EDTA' to 2Na 0. lmo l / l, and H 2 〇 2 30 wt% and component pH4 An aqueous solution was prepared. Thin film etchant 2 Iminoni acetate (I DA), H 2 0 2, a mixture of water, to produce a pH 2. 0 of the aqueous solution to I DAO. Lmo l / l, H 2 0 2 3 Owt% of component. Thin film etchant 3
エチレンジァミン四酢酸 ·ニナトリウム塩 (EDTA · 2Na)、 H2 〇2 、 水を混合し、 EDTA ' 2Na O. 011110 1ノ 1、 ;«2 02 10 1: %を成 分とする PH4. 2の水溶液を作製した。 薄膜エツチャント 4 Echirenjiamin tetraacetic disodium salt (EDTA-2Na), H 2 〇 2, were mixed with water, EDTA '2Na O. 011110 1 Bruno 1; «2 0 2 10 1:.% Of an Ingredient PH4 2 Was prepared. Thin film etchant 4
りん酸、 H2 〇2、 水を混合し、 りん酸 3 Owt %、 H2 02 2 Owt %を 成分とする水溶液を作製した。 薄膜エツチャント 5 Phosphoric acid, H 2 〇 2, water were mixed to prepare an aqueous solution of phosphoric acid 3 OWT%, and H 2 0 2 2 OWT% of component. Thin film etchant 5
硫酸、 H2 02、 水を混合し、 硫酸 5wt %、 H2 02 1 Owt %を成分と する水溶液を作製した。 実験例 C一 1 Sulfuric acid, H 2 0 2, water were mixed to prepare an aqueous solution of sulfuric acid 5 wt%, the H 2 0 2 1 Owt% and component. Experimental example C-1
コンデンサ内蔵多層配線板用材料 C一 1の銅箔表面に、 多層化接着前処理と して、 有機酸系マイクロエッチング剤 CZ— 810 OB (メック株式会社製、 - 商品名) による粗化処理を行った。 図 17において、 銅箔は 303, ルテニゥ ム薄膜は 302, PZT薄膜 301として示す。 この銅箔 303表面に絶縁樹 脂基材 304 (絶縁材料) となる厚み 1 00 imのガラスエポキシプリプレダ GEA- 679 F (日立化成工業株式会社製、 商品名) を介して、 厚み 18 mの銅箔 5GTS— 18 (古河サーキットフオイル株式会社、 商品名) 305 を配し、 温度 1 70°C、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件 で積層一体化し、 基板を得た (図 1 7 (a) 参照)。 さらにその P ZT薄膜 30 1表面に DCスパッタリング法により、 0. 05 mのクロム膜 306を形成 した。 次に、' この基板の銅箔 305表面にドライフィルムレジスト H— 903 0 (日立化成工業株式会社製、 商品名) をラミネートし、 所望のネガパターン を露光して炭酸ナトリウム水溶液にて現像し、エッチングレジストを形成した。 次に不要な銅箔を塩化第二鉄水溶液を用いてエッチング除去して、 所望の箇所 に φ θ. 1mmの窓穴 307を形成し、 水酸化ナトリウム水溶液にてレジスト を剥離した(図 2 (b)参照)。 続いて窓穴 307の箇所に三菱電機株式会社製 ML 505 GT型炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 1 0 0 u s , ショット数 4回の条件でレーザ穴明け 308を行った(図 17 (c) 参照)。その後、超音波洗浄とアルカリ過マンガン酸液で炭化した樹脂カスを除 去し、 触媒付与、 密着促進後無電解銅めつきを行い、 基板の表面に 0. 5 urn の銅薄膜を形成した。 さらに、 この基板表面に電気銅めつきを行い、 内層の回 路導体と基板表面の導体層とを電気的に接続するめつき銅 309からなる金属 層を形成した (図 17 (d) 参照)。 続いてこの基板の表面に、 膜厚 30 mの ドライフィルムレジスト H— 9030 (日立化成工業株式会社製、 商品名) を ラミネートし所望のネガパターンを露光して炭酸ナトリウム水溶液にて現像し、 エッチングレジストを形成した。 さらに、 塩化第二鉄水溶液を用いて不要なめ つき銅 309をエッチング除去した後、 水酸化ナトリウム水溶液にてレジスト を剥離し、 フェリシアン化カリウム水溶液を用いてクロム膜 306をエツチン グ除去して、第 1のコンデンサ電極(金属層) 3 10のパターンを形成した(図 18 (a) 参照)。 次にこの基板の第 1のコンデンサ電極 3 10側に、 エッチ ングレジスト 31 1となる膜厚 40 i mのドライフィルムレジスト H— 904 0 (日立化成工業株式会社製、 商品名) をラミネートし (図 18 (b) 参照)、 所望のネガパターンを露光して炭酸ナトリゥム水溶液にて現像し、 第 1のコン デンサ電極 3 10上にエッチングレジスト 3 1 1を形成した(図 18 (c)参 照)。 続いて、 薄膜エツチャント (1) を用いて 20°Cで P ZT薄膜 30 1をェ ツチング除去し、ルテニウムエッチング液 REC—0 1 (関東化学株式会社製、 商品名) を用いてルテニウム薄膜 302をエッチング除去して (図 18 (d) 参照)、水酸化ナトリウム水溶液にてエッチングレジスト 31 1を剥離した(図 18 (e)参照)。 この基板にドライフィルムレジスト H— 9040 (日立化成 工業株式会社製、 商品名) をラミネートし、 所望のネガパターンを露光して炭 酸ナトリウム水溶液にて現像し、 エッチングレジストを形成した。 続いて塩化 第二鉄水溶液にて不要な銅箔 303、 不要な銅箔 305及びその上のめっき銅 309をエッチング除去した後、 水酸化ナトリウム水溶液にてレジストを剥離 し、 銅箔 303から形成された第 2のコンデンサ電極 312を含む回路パター ンを形成して回路板を作製した (図 19 (a) 参照)。 Material for multilayer wiring board with built-in capacitor C-11 Surface roughening treatment with organic acid microetching agent CZ—810 OB (Mec Co., Ltd.,-trade name) as a pre-layering adhesion treatment went. In FIG. 17, the copper foil is shown as 303, the ruthenium thin film is shown as 302, and the PZT thin film 301 is shown. The copper foil 303 has a surface of 18 m in thickness through a 100 im thick glass epoxy pre-preda GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes an insulating resin substrate 304 (insulating material) on the surface. Copper foil 5GTS—18 (Furukawa Circuit Oil Co., Ltd., trade name) 305, laminated at a temperature of 170 ° C, pressure of 1.5MPa, and heating and pressing time of 60 minutes to obtain a board and obtain a substrate (See Fig. 17 (a)). Furthermore, a 0.05 m chromium film 306 is formed on the surface of the PZT thin film 301 by DC sputtering. did. Next, a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the copper foil 305 of the substrate, exposed to a desired negative pattern, developed with an aqueous sodium carbonate solution, An etching resist was formed. Next, unnecessary copper foil was removed by etching using an aqueous solution of ferric chloride to form a window hole 307 having a diameter of θ 1 mm at a desired location, and the resist was removed with an aqueous solution of sodium hydroxide (see FIG. 2 ( b)). Subsequently, laser drilling 308 was performed at the window hole 307 using an ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 us, and four shots ( (See Fig. 17 (c)). After that, the resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed, a catalyst was applied, adhesion was promoted, and then electroless copper plating was performed to form a 0.5 urn copper thin film on the surface of the substrate. Further, electrolytic copper plating was performed on the surface of the substrate to form a metal layer made of plated copper 309 for electrically connecting the inner layer circuit conductor and the conductor layer on the substrate surface (see FIG. 17 (d)). Subsequently, a 30 m-thick dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the substrate, exposed to a desired negative pattern, developed with an aqueous sodium carbonate solution, and etched. A resist was formed. Further, after the unnecessary adhered copper 309 is removed by etching using an aqueous ferric chloride solution, the resist is stripped off using an aqueous sodium hydroxide solution, and the chromium film 306 is etched and removed using an aqueous potassium ferricyanide solution. A capacitor electrode (metal layer) 310 pattern was formed (see FIG. 18 (a)). Next, a 40-im-thick dry film resist H—9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.), which becomes the etching resist 311, is laminated on the first capacitor electrode 310 side of this substrate (see FIG. 18 (b)), the desired negative pattern was exposed and developed with an aqueous sodium carbonate solution to form an etching resist 311 on the first capacitor electrode 310 (see FIG. 18 (c)). . Subsequently, the PZT thin film 301 was etched away at 20 ° C using a thin film etchant (1), and the ruthenium thin film 302 was removed using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name). Remove by etching (Fig. 18 (d) ), And the etching resist 311 was removed with an aqueous sodium hydroxide solution (see FIG. 18E). A dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on the substrate, exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate to form an etching resist. Subsequently, after unnecessary copper foil 303, unnecessary copper foil 305 and plated copper 309 thereon are removed by etching with an aqueous ferric chloride solution, the resist is peeled off with an aqueous sodium hydroxide solution to form copper foil 303. A circuit board including the second capacitor electrode 312 was formed to produce a circuit board (see FIG. 19 (a)).
この回路板の回路表面に、 多層化接着前処理として、 有機酸系マイクロエツ チング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行 つた。 (1) 35 mキャリア銅箔付き厚み 3 /xmの銅箔 MT 35 S 3 (三井金 属鉱業株式会社製、 商品名)、 (2) 厚み 10 O ^mのフイラ一入りガラスェポ キシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名)、 (3) 回路板、 (4)厚み 100 mのフィラー入りガラスエポキシプリプレダ GEA _679 F、(5)35 mキャリア銅箔付き厚み 3 mの銅箔 MT 35 S 3 (三 井金属鉱業株式会社製、 商品名) の順に重ね、 温度 170° (、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化することにより、 回路板の 両面上に、 絶縁樹脂基材 313を介して銅箔 314を積層した。 キャリア銅箔 を剥がし、 不要な基板端部を切断後 (図 19 (b)参照)、 この基板の表面にド ライフイルムレジスト H— 9030 (日立化成工業株式会社製、 商品名) をラ ミネートし、所望のネガパターンを露光して炭酸ナ卜リゥム水溶液にて現像し、 エッチングレジストを形成した。 次に不要な銅箔 314を塩化第二鉄水溶液を 用いてエッチング除去して、 所望の箇所に Φ 0. 15mmの窓穴を形成した。 この回路板表面に設けた窓穴の箇所に三菱電機株式会社製 ML 505 GT型 炭酸ガスレ一ザを用いて、 出力パヮ一 26m J、 パルス幅 100 M s、 ショッ ト数 4回の条件でレ一ザ穴明け 310を行った (図 19 (c)参照)。超音波洗 浄とアルカリ過マンガン酸液で炭化した樹脂カスを除去後、 洗浄触媒付与、 密 着促進後無電解銅めつきを行い、 レーザ穴内壁と銅箔表面に約 20 の無電 解めつき銅 3 1 5の層を形成した。 この回路板表面のパッドや回路パターンな ど必要な箇所にドライフィルムレジスト H— 9030 (日立化成工業株式会社 製、 商品名) を用いてエッチングレジストを形成し、 不要な銅をエッチング除 去して、銅箔 314及びめつき銅 3 1 5から形成された外層回路を形成した(図 19 (d) 参照)。 The circuit surface of this circuit board was subjected to a roughening treatment with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion. (1) 3 / xm thick copper foil with 35 m carrier copper foil MT 35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.), (2) Glass epoxy prepreader GEA—679 F (manufactured by Hitachi Chemical Co., Ltd., trade name), (3) circuit board, (4) glass epoxy pre-preda with filler 100 m thick GEA_679F, (5) 3 m thick copper with 35 m carrier copper foil Foil MT 35 S 3 (made by Mitsui Kinzoku Mining Co., Ltd., trade name) in the order of 170 ° (pressure 1.5MPa, heating and pressurizing time 60min. A copper foil 314 was laminated on both sides of the board via an insulating resin substrate 313. The carrier copper foil was peeled off, and unnecessary board edges were cut off (see FIG. 19 (b)). Laminate Life-Ilm Resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) and expose the desired negative pattern. Developed with an aqueous solution of acid sodium to form an etching resist Next, unnecessary copper foil 314 was removed by etching using an aqueous solution of ferric chloride to form a 0.15 mm window hole at a desired location. Using a ML 505 GT type carbon dioxide laser manufactured by Mitsubishi Electric Corporation at the window holes provided on the surface of this circuit board, the output power was 26 mJ, the pulse width was 100 Ms, and the number of shots was four. (Refer to Fig. 19 (c).) After ultrasonic cleaning and removal of resin residue carbonized with an alkaline permanganate solution, a cleaning catalyst was applied, and After promoting the deposition, electroless copper plating was performed, and about 20 layers of electroless copper with copper were formed on the inner wall of the laser hole and the copper foil surface. A dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is used to form an etching resist on necessary parts such as pads and circuit patterns on the circuit board surface, and unnecessary copper is removed by etching. Then, an outer layer circuit formed of copper foil 314 and plated copper 315 was formed (see FIG. 19 (d)).
この回路板表面にソルダ一レジスト PSR— 4000 AUS 5 (太陽イン キ製造株式会社製、 商品名) をロールコ一夕で 30 塗布、 乾燥後に露光' 現像して所望の箇所にソルダーレジスト 3 16を形成した。 その後、 3 βπιの 無電解ニッケルめっきと 0. 1 mの無電解金めつき (N i /Auめっき 3 1 7) を外層回路パターン露出部表面層に形成して、 コンデンサ内蔵多層配線板 を得た (図 1 9 (e) 参照)。 実験例 C一 2 Apply a solder resist PSR-4000 AUS 5 (manufactured by Taiyo Ink Manufacturing Co., Ltd.) on the surface of this circuit board 30 times with a roll coater, dry and expose and develop to form a solder resist 316 at desired locations did. Then, 3 βπι electroless nickel plating and 0.1 m electroless gold plating (Ni / Au plating 3 17) are formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board with a built-in capacitor. (See Fig. 19 (e)). Experimental example C-1 2
コンデンサ内蔵多層配線板用材料 C一 1をコンデンサ内蔵多層配線板用材料 C— 2に替えた以外は、 実験例 C一 1と同様な工程によりコンデンサ内蔵多層 配線板を得た。 実験例 C一 3 A multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental example C-11, except that the material C-11 for the multilayer wiring board with a built-in capacitor was replaced with the material C-2 for the multilayer wiring board with a built-in capacitor. Experimental example C-1 3
薄膜エツチャント (1) を薄膜エツチャント (2) に替えた以外は、 実験例 C- 1と同様な工程によりコンデンサ内蔵多層配線板を得た。 実験例 C一 4 A multilayer wiring board with a built-in capacitor was obtained by the same process as in Experimental Example C-1, except that the thin film etchant (1) was replaced with the thin film etchant (2). Experimental example C-1 4
薄膜エツチャント (1) を薄膜エツチャント (3) に替え、 30°Cで用いた 以外は実験例 C一 1と同様な工程によりコンデンサ内蔵多層配線板を得た。 実験例 C一 5 薄膜エツチャント (1) を薄膜エツチャント (4) に替えた以外は、 実験例 C一 1と同様な工程によりコンデンサ内蔵多層配線板を得た。 実験例 C—6 A multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental Example C-11, except that the thin film etchant (1) was replaced with the thin film etchant (3) and used at 30 ° C. Experimental example C-1 5 A multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental example C-11, except that the thin film etchant (1) was replaced with the thin film etchant (4). Experimental example C-6
薄膜エツチャント (1) を薄膜エツチャント (5) に替えた以外は、 実験例 C一 1と同様な工程によりコンデンサ内蔵多層配線板を得た。 実験例 C一 7 A multilayer wiring board with a built-in capacitor was obtained in the same process as in Experimental Example C-11, except that the thin film etchant (1) was replaced with the thin film etchant (5). Experimental example C-1 7
コンデンサ内蔵多層配線板用材料 C一 1の銅箔 303表面に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ_8100B (メック株式会 社製、 商品名) による粗化処理を行った。 この銅箔 303表面に絶縁樹脂基材 304 (絶縁材料) となる厚み 100 mのガラスエポキシプリプレダ GE A -679 F (日立化成工業株式会社製、 商品名) を介して、 厚み 18 の銅 箔 5GTS— 18 (古河サーキットフオイル株式会社、 商品名) を配し、 温度 170 、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化 し、 基板を得た (図 17 (a)参照)。 さらにその PZT薄膜 301表面に DC スパッタリング法により、 0. 05 z mのクロム膜 306を形成した。 次に、 この基板の銅箔 305表面にドライフィルムレジスト H_ 9030 (日立化成 工業株式会社製、 商品名) をラミネートし、 所望のネガパターンを露光して炭 酸ナトリウム水溶液にて現像し、 エッチングレジストを形成した。 次に不要な 銅箔を塩化第二鉄水溶液を用いてエッチング除去して、 所望の箇所に Φ 0. 1 mmの窓穴 307を形成し (図 17 (b)参照)、 水酸化ナトリウム水溶液にて レジストを剥離した。 続いて窓穴 7の箇所に三菱電機株式会社製 ML 505 G T型炭酸ガスレーザを用いて、 出力パワー 26mJ、 パルス幅 100 S、 シ ョット数 4回の条件でレ一ザ穴 308明けを行った (図 17 (c)参照)。 その 後'、 超音波洗浄とアルカリ過マンガン酸液で炭化した樹脂カスを除去し、 触媒 付与、 密着促進後無電解銅めつきを行い、 基板の両面に 0. 5 mの銅薄膜を 形成した。 さらに、 この基板表面に電気銅めつきを行い、 内層の回路導体と基 板表面の導体層とを電気的に接続するめつき銅 309からなる金属層を形成し た (図 17 (d)参照)。続いてこの基板の表面にドライフィルムレジスト H— 9030 (日立化成工業株式会社製、 商品名) をラミネートし、 所望のネガパ ターンを露光して炭酸ナトリウム水溶液にて現像し、 エッチングレジストを形 成した。 さらに、 塩化第二鉄水溶液を用いて不要なめっき銅 309をエツチン グ除去した後、 水酸化ナトリウム水溶液にてレジストを剥離し、 フェリシアン 化カリウム水溶液を用いてクロム膜 306をエッチング除去して、 第 1のコン デンサ電極 310のパターンを形成した (図 18 (a)参照)。次にこの基板の 第 1のコンデンサ電極 310側にエッチングレジスト 31 1となるアルカリ 現像型レジスト PER— 20 (太陽インキ製造株式会社製、 商品名) を 20 m塗布し (図 18 (b)参照)、 100°Cで 15分プリべークした後所望のネガ パターンを露光して 130°Cで 30分乾燥し、 炭酸ナトリウム水溶液にて現像 し第 1のコンデンサ電極 310上にエッチングレジスト 31 1を形成した(図 18 (c) 参照)。 続いて、 薄膜エツチャント (1) を用いて 20°Cで PZT薄 膜 301をエッチング除去し、 ルテニウムエッチング液 REC— 01 (関東化 学株式会社製、 商品名) を用いてルテニウム薄膜 302をエッチング除去して (図 18 (d)参照)、 水酸化ナトリウム水溶液にてエッチングレジスト 31 1 を剥離した (図 18 (e)参照)。 この基板にドライフィルムレジスト H— 90 40 (日立化成工業株式会社製、 商品名) をラミネートし、 所望のネガパター ンを露光して炭酸ナトリゥム水溶液にて現像し、 エッチングレジストを形成し た。 続いて塩化第二鉄水溶液にて不要な銅箔 303、 不要な銅箔 305及びそ の上のめっき銅 309をエッチング除去した後、 水酸化ナトリウム水溶液にて エッチングレジストを剥離し銅箔 303から形成された第 2のコンデンサ電極 312を含む回路パターンを形成して回路板を作製した (図 19 (a) 参照)。 この回路板を用い、 その後実験例 C— 1と同様な工程によって多層化し、 コ ンデンサ内蔵多層配線板を得た。 実験例 C一 8 The surface of the copper foil 303 of C-11, a material for multilayer wiring boards with built-in capacitors, was roughened with an organic acid-based microetching agent CZ_8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding. This copper foil 303 has a thickness of 18 through a 100 m thick glass epoxy pre-predeer GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes an insulating resin substrate 304 (insulating material) on the surface. 5GTS-18 (Furukawa Circuit Oil Co., Ltd., trade name) was arranged, laminated and integrated under the press conditions of temperature 170, pressure 1.5MPa, heating and pressurizing time 60 minutes to obtain a substrate (Fig. 17 ( a)). Further, a chromium film 306 of 0.05 zm was formed on the surface of the PZT thin film 301 by DC sputtering. Next, a dry film resist H_9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the copper foil 305 of this substrate, exposed to a desired negative pattern, developed with an aqueous solution of sodium carbonate, and etched. Was formed. Next, unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to form a window hole 307 having a diameter of 0.1 mm at a desired position (see FIG. 17 (b)). The resist was stripped off. Subsequently, laser holes 308 were drilled in the 7 windows using Mitsubishi Electric Corporation ML 505 GT carbon dioxide laser under the conditions of 26 mJ output power, 100 S pulse width, and 4 shots. (See Figure 17 (c)). After that, remove the resin residue carbonized by ultrasonic cleaning and alkaline permanganate solution, apply catalyst, promote adhesion, and perform electroless copper plating. Formed. Furthermore, electrolytic copper plating was performed on the substrate surface, and a metal layer made of plated copper 309 was formed to electrically connect the inner layer circuit conductor and the conductor layer on the substrate surface (see FIG. 17 (d)). . Subsequently, a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on the surface of the substrate, exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate to form an etching resist. . Further, after unnecessary plating copper 309 is removed by etching using an aqueous ferric chloride solution, the resist is stripped with an aqueous sodium hydroxide solution, and the chromium film 306 is etched and removed using an aqueous potassium ferricyanide solution. The pattern of the first capacitor electrode 310 was formed (see FIG. 18A). Next, an alkali-developable resist PER-20 (manufactured by Taiyo Ink Mfg. Co., Ltd., trade name) to be the etching resist 311 is applied to the first capacitor electrode 310 side of this substrate for 20 m (see FIG. 18 (b)). After pre-baking at 100 ° C for 15 minutes, the desired negative pattern is exposed, dried at 130 ° C for 30 minutes, developed with an aqueous solution of sodium carbonate, and an etching resist 311 is formed on the first capacitor electrode 310. Formed (see Fig. 18 (c)). Subsequently, the PZT thin film 301 was etched away at 20 ° C using a thin film etchant (1), and the ruthenium thin film 302 was etched away using a ruthenium etchant REC-01 (trade name, manufactured by Kanto Kagaku Co., Ltd.). Then, the etching resist 311 was peeled off with an aqueous sodium hydroxide solution (see FIG. 18 (d)). The substrate was laminated with a dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.), exposed to a desired negative pattern, and developed with an aqueous sodium carbonate solution to form an etching resist. Subsequently, unnecessary copper foil 303, unnecessary copper foil 305 and plated copper 309 thereon are removed by etching with an aqueous ferric chloride solution, and then the etching resist is peeled off with an aqueous sodium hydroxide solution to form copper foil 303. A circuit pattern including the second capacitor electrode 312 thus formed was formed to produce a circuit board (see FIG. 19A). Using this circuit board, multilayering was performed by the same process as in Experimental Example C-1, to obtain a multilayer wiring board with a built-in capacitor. Experimental example C-1 8
コンデンサ内蔵多層配線板用材料 C一 1の銅箔 303表面に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った。 この銅箔 303表面に絶縁樹脂基材 304となる厚み 100 mのガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会社製、 商品名) を介して、 厚み 18 の銅箔 5GTS 一 18 (古河サーキットフオイル株式会社、 商品名) を配し、 温度 170° (:、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を 得た (図 17 (a) 参照)。 さらにその PZT薄膜 301表面に DCスパッタリ ング法により、 0. 05 mのクロム膜 306を形成した。 次に、 この基板の 銅箔 305表面にドライフィルムレジスト H— 9030 (日立化成工業株式会 社製、 商品名) をラミネートし、 所望のネガパターンを露光して炭酸ナトリウ ム水溶液にて現像し、 エッチングレジストを形成した。 次に不要な銅箔を塩化 第二鉄水溶液を用いてエッチング除去して、 所望の箇所に φ 0. 1mmの窓穴 307を形成し、水酸化ナトリウム水溶液にてレジストを剥離した(図 17 (b) 参照)。続いて窓穴 307の箇所に三菱電機株式会社製 ML 505 GT型炭酸ガ スレ一ザを用いて、 出力パワー 26m J、 パルス幅 100 i s、 ショット数 4 回の条件でレーザ穴 308明けを行った (図 17 (c) 参照)。 その後、 超音波 洗浄とアルカリ過マンガン酸液で炭化した樹脂カスを除去し、 触媒付与、 密着 促進後無電解銅めつきを行い、 基板の両面に 0. 5 の銅薄膜を形成した。 さらに、 この基板表面に電気銅めつきを行い、 内層の回路導体と基板表面の導 体層とを電気的に接続するめつき銅 309からなる金属層を形成した (図 17 (d)参照)。続いてこの基板の表面にドライフィルムレジスト H— 9030 (日 立化成工業株式会社製、 商品名) をラミネートし、 所望のネガパターンを露光 して炭酸ナトリウム水溶液にて現像し、 エッチングレジストを形成した。 さら に、塩化第二鉄水溶液を用いて不要なめっき銅 309をエッチング除去した後、 水酸化ナトリゥム水溶液にてレジストを剥離し、 フェリシアン化力リゥム水溶 液を用いてクロム膜 306をエッチング除去して、第 1のコンデンサ電極 31, 0のパターンを形成した (図 18 (a)参照)。次にこの基板の第 1のコンデン サ電極 310側にエッチングレジスト 31 1となる溶剤現像型レジスト AZ 9245 (クラリアントジャパン株式会社製、 商品名) を 12 m塗布し ((図 18 (b)参照)、 110°Cで 10分プリべ一クした後所望のポジパターンを露 光して 120°Cで 10分乾燥し、 AZ 400Kデベロッパー (クラリアントジ ャパン株式会社製、 商品名) にて現像してエッチングレジスト 311を形成し た (図 18 (c) 参照)。 続いて、 20%重フッ化アンモニゥム (NH4 F · Η F) 水溶液を用いて 20°Cで P ZT薄膜 301をエッチング除去し、 ルテニゥ ムエッチング液 REC— 01 (関東化学株式会社製、 商品名) を用いてルテニ ゥム薄膜 302をエッチング除去して (図 3の (d)参照)、 AZリム一バー 7 00 (クラリアントジャパン株式会社製、 商品名) にてエッチングレジスト 3 11を剥離した (図 18 (e)参照)。 この基板にドライフィルムレジスト H— 9040 (日立化成工業株式会社製、 商品名) をラミネートし、 所望のネガパ ターンを露光して炭酸ナトリウム水溶液にて現像し、 エッチングレジストを形 成した。 続いて塩化第二鉄水溶液にて不要な銅箔 303、 不要な銅箔 305及 びその上のめっき銅 309をエッチング除去した後、 水酸化ナトリウム水溶液 にてレジストを剥離し、銅箔 303から形成された第 2のコンデンサ電極 31 2を含む回路パターンを形成して回路板を作製した (図 19 (a) 参照)。 The surface of the copper foil 303 of C-11, a material for multilayer wiring boards with built-in capacitors, was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. . The copper foil 303 has a thickness of 18 G through a glass epoxy pre-preder GE A—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes an insulating resin substrate 304 on the surface of the copper foil 303. Furukawa Circuit Oil Co., Ltd. was distributed and laminated at a temperature of 170 ° (Pressure: 1.5MPa, heating and pressing time: 60 minutes) to obtain a substrate (Fig. 17 (a) Further, a 0.05 m chromium film 306 was formed by DC sputtering on the surface of the PZT thin film 301. Then, a dry film resist H-9030 (Hitachi Chemical Industries, Ltd.) was formed on the surface of the copper foil 305 of this substrate. (Trade name, manufactured by the company), exposed to the desired negative pattern, developed with an aqueous solution of sodium carbonate to form an etching resist, and then etched unnecessary copper foil with an aqueous solution of ferric chloride. Remove and remove φ0.1mm A hole 307 was formed, and the resist was stripped with an aqueous sodium hydroxide solution (see Fig. 17 (b)), and a ML 505 GT type carbon dioxide laser manufactured by Mitsubishi Electric Corporation was used at the window hole 307. The laser hole 308 was drilled under the conditions of an output power of 26 mJ, a pulse width of 100 is, and four shots (see Fig. 17 (c)). After applying a catalyst and promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5 on both sides of the substrate. A metal layer made of plated copper 309 was formed to electrically connect the conductor layer on the substrate surface (see Fig. 17 (d)), and then a dry film resist H-9030 (Hitachi Chemical Industries, Ltd.) (Trade name, manufactured by Co., Ltd.) Was exposed and developed with an aqueous solution of sodium carbonate to form an etching resist, and unnecessary plating copper 309 was removed by etching using an aqueous solution of ferric chloride. The resist was stripped off with an aqueous solution of sodium hydroxide, and the chromium film 306 was removed by etching using an aqueous solution of ferricyanation power to form a pattern of the first capacitor electrodes 31, 0 (see FIG. 18 (a)). ). Next, on the first capacitor electrode 310 side of the substrate, 12 m of a solvent-developable resist AZ 9245 (trade name, manufactured by Clariant Japan KK) to be an etching resist 311 is applied (see FIG. 18 (b)). After pre-baking at 110 ° C for 10 minutes, expose the desired positive pattern, dry at 120 ° C for 10 minutes, and develop with AZ400K Developer (Clariant Japan Co., Ltd., trade name). (Refer to Fig. 18 (c).) Next, the PZT thin film 301 was etched away at 20 ° C using a 20% aqueous solution of ammonium bifluoride (NH 4 F · F). The ruthenium thin film 302 was etched away using a ruthenium etchant REC-01 (trade name, manufactured by Kanto Chemical Co., Ltd.) (see (d) in FIG. 3), and the AZ rim bar 700 (Clariant Japan Stock) Made by company, product name) Etching resist 3 11 (See Fig. 18 (e).) A dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on this substrate, exposed to a desired negative pattern, and developed with an aqueous sodium carbonate solution. Then, unnecessary copper foil 303, unnecessary copper foil 305 and plated copper 309 thereon were removed by etching with an aqueous ferric chloride solution, and then the resist was stripped with an aqueous sodium hydroxide solution. Then, a circuit pattern including the second capacitor electrode 312 formed from the copper foil 303 was formed to produce a circuit board (see FIG. 19A).
この回路板の回路表面に、 多層化接着前処理として、 有機酸系マイクロエツ チング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行 つた。 (1) 35 mキャリア銅箔付き厚み 3 の銅箔 MT 35 S 3 (三井金 属鉱業株式会社製、 商品名)、 (2) 厚み 100 imのフイラ一入りガラスェポ キシプリプレダ GEA— 679 F (日立化成工業株式会社製、 商品名)、 (3) 回 板、 (4)厚み 100 mのフィラ一入りガラスエポキシプリプレダ GE A 一 679 F、(5) 35 mキャリア銅箔付き厚み 3 mの銅箔 MT 35 S 3 (三 井金属鉱業株式会社製、 商品名) の順に重ね、 温度 170° (:、 圧力 1. 5 MP a、 加熱加圧時間 60分のプレス条件で積層一体化することにより、 回路板の. 両面上に、 絶縁樹脂基材 313を介して銅箔 314を積層した。 キャリア銅箔 を剥がし、 不要な基板端部を切断後 (図 19 (b) 参照)、 この基板の表面にド ライフイルムレジスト H— 9030 (日立化成工業株式会社製、 商品名) をラ ミネ一トし、所望のネガパターンを露光して炭酸ナトリゥム水溶液にて現像し、 エッチングレジストを形成した。 次に不要な銅箔 314を塩化第二鉄水溶液を 用いてエッチング除去して、 所望の箇所に Φ 0. 15mmの窓穴を形成した。 この回路板表面に設けた窓穴の箇所に三菱電機株式会社製 ML 505 GT型 炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 100M s、 ショッ ト数 4回の条件でレ一ザ穴明けを行った (図 19 (c)参照)。 超音波洗浄とァ ルカリ過マンガン酸液で炭化した樹脂カスを除去後、 洗浄触媒付与、 密着促進 後無電解銅めつきを行い、 レーザ穴内壁と銅箔表面に約 20 mの無電解銅め つき層を形成した。 この回路板表面のパッドゃ回路パターンなど必要な箇所に ドライフィルムレジスト H— 9030 (日立化成工業株式会社製、 商品名) を 用いてエッチングレジストを形成し、 不要な銅をエッチング除去して、 銅箔 3 14及びめつき銅 31 5から形成された外層回路を形成した (図 19 (d) 参 照)。 この回路板表面にソルダーレジスト P SR— 4000 AUS 5 (太陽ィ ンキ製造株式会社製、商品名)をロールコ一夕で 30 m塗布、乾燥後に露光 - 現像して所望の箇所にソルダーレジスト 316を形成した。 その後、 3 の 無電解ニッケルめっきと 0. 1 mの無電解金めつき(N i ZAuめっき 17) を外層回路パタ一ン露出部表面層に形成して、 コンデンサ内蔵多層配線板を得 た (図 19 (e) 参照)。 実験例 C— 9 The circuit surface of this circuit board was subjected to a roughening treatment with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayering adhesion. (1) Thickness 3 copper foil MT 35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) with 35 m carrier copper foil, (2) Glass imoxy prepredder GEA-679F with a 100 im thickness filler Manufactured by Kogyo Co., Ltd.), (3) Board, (4) 100 m thick glass epoxy pre-preda with filler, GE A-679 F, (5) 35 m copper foil with carrier copper foil, 3 m thickness MT 35 S 3 (three Ii Metal Mining Co., Ltd., product name), temperature 170 ° (:, pressure 1.5MPa, heating and pressurizing time 60min. Then, a copper foil 314 was laminated via an insulating resin base material 313. The carrier copper foil was peeled off, and unnecessary substrate edges were cut off (see FIG. 19 (b)). — Laminate 9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.), expose the desired negative pattern, and develop with sodium carbonate aqueous solution to form an etching resist. Etching was removed using an aqueous solution of ferric chloride to form a 0.15 mm window hole at the desired location The ML 505 GT carbonate manufactured by Mitsubishi Electric Corporation was placed at the window hole provided on the surface of this circuit board. Using a gas laser, output power 26mJ, pulse width 100Ms, (Refer to Fig. 19 (c).) After ultrasonic cleaning and removal of resin residue carbonized with alkali permanganate solution, after applying a cleaning catalyst and promoting adhesion Electroless copper plating was performed to form an electroless copper plating layer of about 20 m on the inner wall of the laser hole and the copper foil surface Dry film resist H-9030 on necessary parts such as pads and circuit patterns on the circuit board surface (Hitachi Kasei Kogyo Co., Ltd., product name) to form an etching resist and remove unnecessary copper by etching to form an outer layer circuit formed from copper foil 314 and plated copper 315 (Fig. (See 19 (d).) Solder resist PSR—4000 AUS5 (manufactured by Taiyo Ink Manufacturing Co., Ltd., trade name) is applied to the surface of this circuit board for 30 m with a roll coater, dried, exposed and developed. Then, solder resist 316 was formed at the position shown in FIG. Electroless nickel plating and 0.1 m of electroless gold plating (NiZAu plating 17) were formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board with a built-in capacitor (Fig. 19 ( e)) Experimental example C-9
コンデンサ内蔵多層配線板用材料 C一 1の銅箔 303表面に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った。 この銅箔 303表面に絶縁樹脂基材 304となる厚み 1 00 のガラスエポキシプリプレダ GEA— 67 9 F (日立化成工業株式会社製、 商品名) を介して、 厚み 1 8 mの銅箔 5GTS 一 18 (古河サ一キットフオイル株式会社、 商品名) を配し、 温度 1 70°C、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を 得た (図 1 7 (a)参照)。 さらにその FZT薄膜 30 1表面に DCスパッタリ ング法により、 0. 05 mのクロム膜 306を形成した。 次に、 この基板の 銅箔 30 5表面にドライフィルムレジスト H— 9030 (日立化成工業株式会 社製、 商品名) をラミネートし、 所望のネガパターンを露光して炭酸ナトリウ ム水溶液にて現像し、 エッチングレジストを形成した。 次に不要な銅箔を塩化 第二鉄水溶液を用いてエッチング除去して、 所望の箇所に Φ 0. 1mmの窓穴 307を形成し、水酸化ナトリウム水溶液にてレジストを剥離した(図 1 7 (b) 参照)。続いて窓穴 307の箇所に三菱電機株式会社製 ML 505 GT型炭酸ガ スレ一ザを用いて、 出力パワー 26m J、 パルス幅 100 s、 ショット数 4 回の条件でレーザ穴 308明けを行った (図 1 7 (c) 参照)。 その後、 超音波 洗浄とアルガリ過マンガン酸液で炭化した樹脂カスを除去し、 触媒付与、 密着 促進後無電解銅めつきを行い、 基板の両面に 0. 5 の銅薄膜を形成した。 さらに、 この基板表面に電気銅めつきを行い、 内層の回路導体と基板表面の導 体層とを電気的に接続するめつき銅 309からなる金属層を形成した (図 1 Ί (d)参照)。続いてこの基板の表面にドライフィルムレジスト H— 9030 (日 立化成工業株式会社製、 商品名) をラミネ一卜し、 所望のネガパターンを露光 して炭酸ナトリウム水溶液にて現像し、 エッチングレジストを形成した。 さら に、塩化第二鉄水溶液を用いて不要なめっき銅 309をエッチング除去した後、 水酸化ナ卜リゥム水溶液にてレジス卜を剥離し、 フェリシアン化力リゥム水溶 液を用いてクロム膜 306をエッチング除去して、第 1のコンデンサ電極 3 1 0のパターンを形成した (図 18 (a)参照)。 次にこの基板の第 1のコンデン サ電極 3 1 0側にエッチングレジスト 3 1 1となる溶剤現像型レジスト AZ 9245 (クラリアントジャパン株式会社製、 商品名) を 12/ m塗布し (図 18 (b)参照)、 110°Cで 10分プリべークした後所望のポジパターンを露 光して 120°Cで 10分乾燥し、 AZ 400Kデベロッパー (クラリアントジ ャパン株式会社製、 商品名) にて現像してエッチングレジスト 31 1を形成し た (図 18 (c) 参照)。 続いて、 CF4ガスを用いた R I E法によって P ZT 薄膜 301とルテニウム薄膜 302をエッチング除去した後 (図 1'8 (d) 参 照)、 AZリムーバー 700 (クラリアントジャパン株式会社製、 商品名) にて エッチングレジスト 311を剥離した (図 18 (e)参照)。 この基板にドライ フィルムレジスト H— 9040 (日立化成工業株式会社製、 商品名) をラミネ ートし、 所望のネガパターンを露光して炭酸ナトリウム水溶液にて現像し、 ェ ツチングレジストを形成した。続いて塩化第二鉄水溶液にて不要な銅箔 303、 不要な銅箔 305及びその上のめっき銅 309をエッチング除去した後、 水酸 化ナトリウム水溶液にてレジストを剥離し、 銅箔 303から形成された第 2の コンデンサ電極 312を含む回路パターンを形成して回路板を作製した(図 1 9 (a) 参照)。 Material for multilayer wiring board with built-in capacitor C-11, copper acid 303 surface, as a pretreatment for multi-layer bonding, an organic acid-based microetchant CZ-8100B (MEC Corporation) (Trade name). The copper foil 303 has an 18 m thick copper foil 5GTS through a glass epoxy pre-preder GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) which becomes an insulating resin substrate 304 on the surface. 18 (Furukawa Saichifuto Oil Co., Ltd., product name), and laminated and integrated under the pressing conditions of a temperature of 170 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 60 minutes to obtain a substrate (Fig. 17 (a)). Further, a 0.05 m chromium film 306 was formed on the surface of the FZT thin film 301 by DC sputtering. Next, a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) is laminated on the surface of the copper foil 305 of this substrate, exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate. An etching resist was formed. Next, unnecessary copper foil was removed by etching using an aqueous ferric chloride solution to form a window hole 307 having a diameter of 0.1 mm at a desired position, and the resist was stripped with an aqueous sodium hydroxide solution (FIG. 17). (b)). Subsequently, a laser hole 308 was drilled at the window hole 307 using a Mitsubishi Electric ML 505 GT type carbon dioxide gas laser with an output power of 26 mJ, a pulse width of 100 s, and four shots. (See Figure 17 (c)). After that, the resin residue carbonized by ultrasonic cleaning and Argali permanganate solution was removed, and after applying a catalyst and promoting adhesion, electroless copper plating was performed to form a copper thin film of 0.5 on both sides of the substrate. Further, the surface of the substrate was plated with copper, and a metal layer made of plated copper 309 was formed to electrically connect the inner layer circuit conductor and the conductor layer on the substrate surface (see Fig. 1 (d)). . Subsequently, a dry film resist H-9030 (trade name, manufactured by Hitachi Chemical Co., Ltd.) was laminated on the surface of the substrate, exposed to a desired negative pattern, developed with an aqueous solution of sodium carbonate, and the etching resist was removed. Formed. Further, after unnecessary plating copper 309 is removed by etching using an aqueous ferric chloride solution, the resist is peeled off using an aqueous solution of sodium hydroxide, and the chromium film 306 is formed using an aqueous solution of ferricyanation power. By etching and removing, a pattern of the first capacitor electrode 310 was formed (see FIG. 18A). Next, a solvent-developable resist AZ to be an etching resist 311 is formed on the first capacitor electrode 310 side of the substrate. 9245 (Clariant Japan Co., Ltd., product name) is applied at 12 / m (see Fig. 18 (b)), prebaked at 110 ° C for 10 minutes, and then exposed to a desired positive pattern at 120 ° C. And developed with AZ400K Developer (trade name, manufactured by Clariant Japan Co., Ltd.) to form an etching resist 311 (see FIG. 18 (c)). Next, after the PZT thin film 301 and ruthenium thin film 302 are removed by etching using the RIE method using CF 4 gas (see Fig. 1'8 (d)), AZ Remover 700 (manufactured by Clariant Japan Co., Ltd., trade name) Then, the etching resist 311 was removed (see FIG. 18 (e)). This substrate was laminated with a dry film resist H-9040 (trade name, manufactured by Hitachi Chemical Co., Ltd.), exposed to a desired negative pattern, and developed with an aqueous solution of sodium carbonate to form an etching resist. Next, the unnecessary copper foil 303, unnecessary copper foil 305 and the plated copper 309 thereon are removed by etching with an aqueous ferric chloride solution, and then the resist is peeled off with an aqueous sodium hydroxide solution to form the copper foil 303. A circuit board including the second capacitor electrode 312 thus formed was formed to produce a circuit board (see FIG. 19 (a)).
この回路板を用い、 その後実験例 C一 8と同様な工程によつてコンデンサ内 蔵多層配線板を得た (図 19 (e) 参照)。 Using this circuit board, a multilayer wiring board with a built-in capacitor was obtained by the same process as in Experimental Example C-18 (see Fig. 19 (e)).
実験例 C— 1〜(: _ 7において、 薄膜のエッチング時にエッチング残渣ゃレ ジストの剥れ等はいずれの基板にもみられず、パターニング性は良好であつた。 次に、 コンデンサ容量を測定した。 コンデンサ容量はインピーダンスアナライ ザ 4291 B (アジレントテクノロジー株式会社製、 商品名) に 50 Ω同軸ケ 一ブル SUCOFLEX 104/100 (SUHNER社製、 商品名) を介し て高周波信号測定プローブ M I CROP ROBE ACP 50 (GSG250 型、 Ca s c ad e社製、 商品名) に接続した測定システムを用いた。 キャパ シ夕の電極サイズは lmm口とし 1 GHzの容量を測定した。 この結果を表 3 に示す。 表 3 In Examples C-1 to (: _7, no etching residue and no resist were peeled off on any of the substrates when the thin film was etched, and the patternability was good. Next, the capacitor capacitance was measured. The capacitance is measured by the impedance analyzer 4291B (manufactured by Agilent Technologies, Inc., trade name) via a 50Ω coaxial cable SUCOFLEX 104/100 (manufactured by SUHNER, trade name) MI CROP ROBE ACP The measurement system was connected to a 50 (GSG250 model, manufactured by Cascade, Inc., trade name) The electrode size of the capacitor was 1 mm, and the capacity at 1 GHz was measured. Table 3
表 3に示したように、 実験例 C— 1〜 C一 7で作製したコンデンサ内蔵多層 配線板のコンデンサ容量のばらつきは、 全て ± 10%未満であり、 均一で良好 なコンデンサを作製することができた。 これは実験例 C一 8〜C一 9と同等の ばらつきであり、 実験例 C一 1〜C— 7を用いても実験例 C一 8〜( — 9と同 等な精度のコンデンサ内蔵多層配線が得られることがわかる。 しかも、 従来の CF4ガスを用いた R I E法 (実験例 C— 9) や 20%重フッ化アンモニゥム As shown in Table 3, the variations in the capacitance of the multilayer wiring boards with built-in capacitors manufactured in Experimental Examples C-1 to C-17 are all less than ± 10%. did it. This is the same variation as the experimental examples C-18 to C-19. In addition, conventional RIE method using CF 4 gas (Experimental example C-9) and 20% ammonium bifluoride ammonium
(NH4 F - HF) 水溶液 (実験例 C— 8) などとは、 異なり、 前述したよう にアルカリ現像型のレジストを用いたゥエツトエッチング法であるため、 従来 のプリント配線板の工程に容易に適用することが可能であり、 作業性及び経済 性の点で優れている。 Unlike the (NH 4 F-HF) aqueous solution (Experimental Example C-8), etc., since it is a wet etching method using an alkali-developed resist as described above, it can be easily applied to conventional printed wiring board processes. It is possible to apply it to the work, and it is excellent in workability and economy.
(実施例 D) コンデンサ内蔵多層配線板用材料 D— 1 (Example D) Material for multilayer wiring board with built-in capacitor D— 1
厚み 1 8 /111の圧延銅箔^[_:8]^^[— 18 (三井金属鉱業株式会社製、 商品 名) の表面にチタンテトライソプロポキシド、 ジルコンテトラターシャリ一ブ トキシド、 ジピバロィルメタン鉛錯体、 二酸化窒素を用いたマイクロ波プラズ マ CVDにより、 基材温度 350 の条件下で厚さ 0. 5 01の?2丁 (チタ ン酸ジルコン酸鉛) 薄膜を形成した。 このようにして、 銅箔 1 02' (金属箔 A) の片面に PZT薄膜 1 01 (誘電体薄膜) が設けられたコンデンサ内蔵多層配 線板用材料 D— 1を得た (図 1 (a))。 コンデンサ内蔵多層配線板用材料 D— 2 18/111 rolled copper foil ^ [_: 8] ^^ [— 18 (manufactured by Mitsui Mining & Smelting Co., Ltd., trade name) on the surface of titanium tetraisopropoxide, zircon tetratertiary butoxide, zippi Microwave plasma CVD using a valylmethane-lead complex and nitrogen dioxide, with a substrate temperature of 350 and a thickness of 0.501? Two (lead zirconate titanate) thin films were formed. In this way, a material D—1 for a multilayer wiring board with a built-in capacitor in which a PZT thin film 101 (dielectric thin film) was provided on one side of a copper foil 102 ′ (metal foil A) (FIG. 1 (a )). Material for multilayer wiring board with built-in capacitor D— 2
厚み 1 8 imの圧延銅箔 M— BNH - 18 (三井金属鉱業株式会社製、 商品 名) の表面に DCスパッタリング法により、 0. 2 mのルテニウム薄膜を形 成した。 さらにその基板表面にチタンテトライソプロポキシド、 ジルコンテト ラターシャリーブトキシド、 ジピバロィルメタン鉛錯体、 二酸化窒素を用いた マイクロ波プラズマ CVDにより、 基材温度 350°Cの条件下で厚さ 0. 5 t mの PZT (チタン酸ジルコン酸鉛) 薄膜を形成した。 このようにして、 銅箔 102 (金属箔 A) の片面に、 ルテニウム薄膜 103を介して PZT薄膜 10 1 (誘電体薄膜) が設けられたコンデンサ内蔵多層配線板用材料 D— 2を得た (図 1 (b))。 コンデンサ内蔵多層配線板用材料 D— 3 A 0.2 m ruthenium thin film was formed on the surface of a 18-im thick rolled copper foil M—BNH-18 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) by DC sputtering. In addition, the thickness of the substrate was reduced to 350 ° C by microwave plasma CVD on the substrate surface using titanium tetraisopropoxide, zirconte tertiary butoxide, dipivaloyl methane lead complex, and nitrogen dioxide. A 5 tm PZT (lead zirconate titanate) thin film was formed. Thus, a material D—2 for a multilayer wiring board with a built-in capacitor, in which the PZT thin film 101 (dielectric thin film) was provided on one side of the copper foil 102 (metal foil A) via the ruthenium thin film 103 ( Figure 1 (b). Material for multilayer wiring board with built-in capacitor D-3
厚み 1 8 ^mの圧延銅箔 M— BNH— 18 (三井金属鉱業株式会社製、 商品 名) の表面に DCスパッタリング法により、 0. 2 mのルテニウム薄膜を形 成した。 さらにその表面に強誘電体薄膜形成材料 PZT (関東化学株式会社、 商品名) を塗布し、 温度 1 50°Cで加熱時間 30分間のプリべ一クを行った。 塗布とプリべークをさらに 5回繰り返し、 その後に温度 350 で加熱時間 1 時間の熱処理を行って、 厚さ 5 mの P ZT薄膜を形成した。 このように して、 銅箔 102 (金属箔 A) の片面に、 ルテニウム薄膜 103を介して PZ T薄膜 101 (誘電体薄膜)が設けられたコンデンサ内蔵多層配線板用材料(3) を得た (図 1 (b))。 実施例 D— 1 A 0.2 m ruthenium thin film was formed on the surface of a rolled copper foil M-BNH-18 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.) having a thickness of 18 ^ m by DC sputtering. Further, a ferroelectric thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied to the surface, and prebaking was performed at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, followed by heat treatment at a temperature of 350 for 1 hour to form a 5 m-thick PZT thin film. in this way As a result, a material (3) for a multilayer wiring board with a built-in capacitor in which a PZT thin film 101 (dielectric thin film) was provided on one side of a copper foil 102 (metal foil A) via a ruthenium thin film 103 (FIG. 1) (b)). Example D-1
コンデンサ内蔵多層配線板用材料 D— 1の銅箔 402 (金属箔 A)の表面に、 多層化接着前処理として、有機酸系マイクロエッチング剤 CZ— 8100B (メ ック株式会社製、 商品名) による粗化処理を行った (図 20 (a))。 このコン デンサ内蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404 (絶 縁層)となる厚み 100 mのガラスエポキシプリプレダ GEA— 679 F (日 立化成工業株式会社製、 商品名) を介して、 厚み 12 mの銅箔 405 (金属 箔 B) GTS- 12 (古河サーキットフオイル株式会社、 商品名) を配し、 温 度 180°C、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体 化し、 基板を得た (図 20 (b))。 次に、 この基板の両面に所望のエッチング レジストを形成し、 不要な銅箔を塩化第二鉄水溶液を用いてエッチング除去し て、 所望の箇所に Ψ 0. 15 mmの窓穴 405 ' を形成した (図 20 (c))。 続いて、 窓穴 405 ' の箇所に三菱電機株式会社製 ML 505 GT型炭酸ガス レーザを用いて、 出力パヮ一 26m J、 ノ\°ルス幅 100 / s、 ショット数 4回 の条件でレーザ照射によってレーザ穴 406を明け、 超音波洗浄とアルカリ過 マンガン酸液で炭化した樹脂カスを除去した (図 20 (d))。 さらにその PZ T薄膜 401 (誘電体薄膜) 表面に DCスパッタリング法により、 0. 05 M mのクロム薄膜 407を形成した。 その後、 基板両面に、 触媒付与剤 (Ne o g an t h 843、 アトテックジャパン(株)製、 商品名) を用いた触媒付与 処理、 密着促進剤 (Ne o g an t h WA、 アトテックジャパン(株)製、 商 品名) を用いた密着促進処理を行なった後、 無電解銅めつきを行い、 0. 5 m.の銅薄膜を形成し、 さらに基板両面に電気銅めつきにより 2 O^mの金属層 を形成し、 めっき銅 408からなる金属層を形成した (図 20 (e))。 この基 板の表面に所望のエッチングレジストを形成し、 塩化第二鉄水溶液を用いて不 要なめっき銅 408をエッチング除去し、 フェリシアン化カリウム水溶液を用 いて露出したクロム薄膜 407をエッチング除去して、 第 1のコンデンサ電極 409のパターンを形成した (図 20 (f);)。 続いて、 所望のパターンのレジ ストを形成し、 CF4ガスを用いた R I E法によって PZT薄膜 401をエツ チング除去し、 コンデンサ誘電体 401 ' を形成した (図 20 (g))。 次に、 この基板の表面に所望のエッチングレジストを形成し、 銅箔 402、 銅箔 40 5及びめつき銅 408の不要部分を塩化第二鉄水溶液を用いてエッチング除去 して、第 2のコンデンサ電極 410を含む回路パターンを形成して回路板を作 製した (図 20 (h))。 . Material for multi-layer wiring board with built-in capacitor D-1 Copper foil 402 (metal foil A) on the surface, as a pretreatment for multi-layer bonding, organic acid-based micro-etching agent CZ-8100B (trade name of MEC Corporation) (Fig. 20 (a)). On the surface of the copper foil 402, which is a material for a multilayer wiring board with a built-in capacitor, a 100 m-thick glass epoxy pre-predeer GEA-679F (made by Hitachi Chemical Co., Ltd., which becomes an insulating resin base material 404 (insulation layer), 12m thick copper foil 405 (metal foil B) GTS-12 (Furukawa Circuit Oil Co., Ltd., trade name) via the product name), temperature 180 ° C, pressure 1.5MPa, heating The substrates were integrated under a press condition of 60 minutes to obtain a substrate (Fig. 20 (b)). Next, a desired etching resist is formed on both sides of the substrate, and unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to form a 窓 0.15 mm window hole 405 ′ at a desired position. (Fig. 20 (c)). Then, using a ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation at the window hole 405 ', laser irradiation was performed under the conditions of an output power of 26mJ, a noise width of 100 / s, and four shots. A laser hole 406 was drilled, and resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 20 (d)). Further, a 0.05 mm chromium thin film 407 was formed on the surface of the PZT thin film 401 (dielectric thin film) by DC sputtering. After that, both sides of the substrate are treated with a catalyst using a catalyst-imparting agent (Neog an th 843, manufactured by Atotech Japan Co., Ltd., trade name), and an adhesion promoter (Neog an th WA, manufactured by Atotech Japan Co., Ltd.) After performing the adhesion promotion treatment using (trade name), electroless copper plating is performed, a 0.5 m. Copper thin film is formed, and a 2 O ^ m metal layer is formed on both surfaces of the substrate by electrolytic copper plating. Was formed to form a metal layer made of plated copper 408 (FIG. 20 (e)). This group A desired etching resist is formed on the surface of the plate, unnecessary copper plating 408 is removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricyanide solution. The pattern of the capacitor electrode 409 was formed (FIG. 20 (f);). Subsequently, a resist having a desired pattern was formed, and the PZT thin film 401 was etched and removed by RIE using CF 4 gas to form a capacitor dielectric 401 ′ (FIG. 20 (g)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402, the copper foil 405, and the plated copper 408 are removed by etching using an aqueous ferric chloride solution, thereby forming a second capacitor. A circuit board including the electrode 410 was formed to produce a circuit board (Fig. 20 (h)). .
この回路板の回路表面に、 多層化接着前処理として、 有機酸系マイクロエツ チング剤 CZ— 8100B (メック株式会社製、 商品名) による粗化処理を行 つた。 (1) 35 mキャリア銅箔付き厚み 3 mの銅箔 MT35 S 3 (三井金 属鉱業株式会社製、 商品名)、 (2) 絶縁樹脂基材 412となる厚み 100 m のフイラ一入りガラスエポキシプリプレダ GEA— 679 F (日立化成工業株 式会社製、 商品名)、 (3) 回路板、 (4) 絶縁樹脂基材 412となる厚み 100 mのフィラ一入りガラスエポキシプリプレダ GE A— 679 F、 (5) 35 mキヤリァ銅箔付き厚み 3 の銅箔 MT 35 S 3 (三井金属鉱業株式会社製、 商品名) の順に重ね、 温度 180°C、 圧力 1. 5MP a、 加熱加圧時間 60分 のプレス条件で積層一体化した。 キャリア銅箔を剥がし、 不要な基板端部を切 断後、 この基板の表面に所望のエッチングレジストを形成し、 不要な銅箔を塩 化第二鉄水溶液を用いてエッチング除去して、 所望の箇所に Φ 0. 15mmの 窓穴を形成した。 The circuit surface of this circuit board was subjected to a roughening treatment using an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multi-layer bonding. (1) 3 m thick copper foil with 35 m carrier copper foil MT35 S3 (trade name, manufactured by Mitsui Kinzoku Mining Co., Ltd.), (2) 100 m thick glass epoxy with a thickness of 100 m to become insulating resin substrate 412 Pre-Preda GEA-679 F (manufactured by Hitachi Chemical Co., Ltd., trade name), (3) Circuit board, (4) Insulating resin base material 412 glass epoxy pre-preda with filler with a thickness of 100 m GE A-679 F, (5) 35 m carrier copper foil with thickness 3 copper foil MT 35 S 3 (manufactured by Mitsui Kinzoku Mining Co., Ltd., trade name), temperature 180 ° C, pressure 1.5MPa, heating and pressurizing time The laminate was integrated under a pressing condition of 60 minutes. After peeling off the carrier copper foil and cutting unnecessary substrate edges, a desired etching resist is formed on the surface of the substrate, and the unnecessary copper foil is removed by etching using an aqueous ferric chloride solution to obtain a desired etching resist. A hole with a diameter of 0.15 mm was formed at the location.
この基板表面に設けた窓穴の箇所に三菱電機株式会社製 ML 505 GT型炭 酸ガスレ一ザを用いて、 出力パワー 26m J、 ノ\°ルス幅 100 S、 ショット 数 4回の条件でレーザ穴明けを行つた。 超音波洗浄とアル力リ過マンガン酸液 で炭化した樹脂カスを除去後、 洗浄触媒付与、 密着促進後無電解銅めつきを行 レ 、 レーザ穴内壁と銅箔表面に約 20 の無電解銅めつき層を形成した。 こ の基板表面のパッドゃ回路パターンなど必要な箇所にエッチングレジストを形 成し、 不要な銅をエッチング除去して、 外層回路を形成した。 Using a ML 505 GT type carbon dioxide gas laser manufactured by Mitsubishi Electric Corporation at the window hole provided on the surface of this board, the laser was operated under the conditions of an output power of 26 mJ, a noise width of 100 S, and four shots. Drilled. Ultrasonic cleaning and removal of carbonized resin residue with permanganate solution, application of cleaning catalyst, adhesion promotion and electroless copper plating Then, about 20 electroless copper plating layers were formed on the inner wall of the laser hole and the copper foil surface. An etching resist was formed on necessary parts such as pads and circuit patterns on the surface of this substrate, and unnecessary copper was removed by etching to form an outer layer circuit.
この基板表面にソルダーレジスト P SR— 4000 AUS 5 (太陽インキ 製造株式会社、 商品名) をロールコ一夕で 30 m塗布、 乾燥後に露光 ·現像 して所望の箇所にソルダーレジスト 411を形成した。 その後、 3 mの無電 解ニッケルめっきと 0. 1 mの無電解金めつき (N i— Auめっき 420) を外層回路パターン露出部表面層に形成して、 コンデンサ内蔵多層配線板を得 た (図 20 ( i))。 実施例 D— 2 Solder resist PSR-4000 AUS5 (Taiyo Ink Mfg. Co., Ltd., trade name) was applied to the surface of the substrate by a roll coater for 30 m, dried and exposed and developed to form a solder resist 411 at a desired position. Then, 3 m electroless nickel plating and 0.1 m electroless gold plating (Ni-Au plating 420) were formed on the surface layer of the exposed portion of the outer circuit pattern to obtain a multilayer wiring board with built-in capacitors ( Figure 20 (i)). Example D-2
コンデンサ内蔵多層配線板用材料 D— 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会社製、 商品名) による粗化処理を行った (図 21 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 00 zmのガラスエポキシプリプレダ GEA— 679 F (日立化成工業株式会 社製、 商品名) を介して、 厚み 12 mの銅箔 5 GTS— 12 (古河サーキッ トフオイル株式会社、 商品名) を配し、 温度 180° (:、 圧力 1. 5MP a、 加 熱加圧時間 60分のプレス条件で積層一体化し、基板を形成した(図 2 l (b))。 次に、 この基板の両面に所望のエッチングレジストを形成し、 不要な銅箔を塩 化第二鉄水溶液を用いてエッチング除去して、 所望の箇所に Φ 0. 15mmの 窓穴 405 ' を形成した (図 21 (c))。 続いて、 窓穴 405 ' の箇所に三菱 電機株式会社製 ML 505 GT型炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 100 s、 ショット数 4回の条件でレーザ照射してレーザ穴 4 06を明け、 超音波洗浄とアルカリ過マンガン酸液で炭化した樹脂カスを除去 した (図 21 (d))。 さらにその PZT薄膜 401の表面に DCスパッタリン グ法により、 0. 05 mのクロム薄膜 407を形成した。 その後、 基板両面 に触媒付与、密着促進後無電解銅めつきを行い、 0. 5 mの銅薄膜を形成し、 さらに基板両面に電気銅めつきにより 20 /mの金属層を形成し、 めっき銅 4 08からなる金属層を形成した (図 21 (e))。 この基板の表面に所望のエツ チングレジストを形成し、 塩化第二鉄水溶液を用いてめっき銅 408の不要部 分をエッチング除去し、 フェリシアン化カリウム水溶液を用いて露出したクロ ム薄膜 407をエッチング除去して、第 1のコンデンサ電極 409のパ夕一ン を形成した (図 21 (f))。 続いて、 所望のパターンのレジストを形成し、 C F4ガスを用いた R I E法によって PZT薄膜 401とルテニウム薄膜 403 の不要部分をエッチング除去し、 コンデンサ誘電体 401 ' を形成した (図 2 1 (g))。 次に、 この基板の表面に所望のエッチングレジストを形成し、 銅箔 402、 銅箔 405及びめつき銅 408の不要部分を塩化第二鉄水溶液を用い てエッチング除去して、第 2のコンデンサ電極 410を含む回路パターンを形 成して回路板を作製した (図 21 (h))。 その後の多層配線板の加工は実施例 D— 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 21 (i))。 実施例 D— 3 The surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multilayer bonding. (Figure 21 (a)). A 100-zm-thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) serving as an insulating resin base material 404 is provided on the surface of the copper foil 402, which is a material for a multilayer wiring board containing a capacitor. A 12 m thick copper foil 5 GTS-12 (Furukawa Circuit Oil Co., Ltd., trade name) is placed at a temperature of 180 ° (Pressure: 1.5 MPa, heating and pressurizing time: 60 minutes under press conditions) Next, a desired etching resist was formed on both sides of this substrate, and unnecessary copper foil was removed by etching using an aqueous ferric chloride solution. Then, a window hole 405 'with a diameter of 0.15mm was formed at the desired location (Fig. 21 (c)) Then, a ML505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation was used at the window hole 405'. Laser irradiation was performed under the conditions of 26 mJ output power, 100 s pulse width, and 4 shots, and laser holes 4006 were drilled. The resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 21 (d)), and a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by DC sputtering. After that, both sides of the substrate After applying catalyst and promoting adhesion, electroless copper plating is performed to form a 0.5 m copper thin film, and a 20 / m metal layer is formed on both surfaces of the substrate by electrolytic copper plating. A metal layer was formed (Fig. 21 (e)). A desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 are removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricyanide solution. Thus, a pattern of the first capacitor electrode 409 was formed (FIG. 21 (f)). Subsequently, a resist having a desired pattern was formed, and unnecessary portions of the PZT thin film 401 and the ruthenium thin film 403 were removed by etching by RIE using CF 4 gas to form a capacitor dielectric 401 ′ (FIG. 21 (g )). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402, the copper foil 405, and the plated copper 408 are removed by etching using an aqueous ferric chloride solution to form a second capacitor electrode. A circuit board was fabricated by forming a circuit pattern including 410 (Fig. 21 (h)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-1 (FIG. 21 (i)). Example D-3
コンデンサ内蔵多層配線板用材料 D— 2の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会社製、 商品名) による粗化処理を行った (図 22 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 0 O^mのガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会 社製、 商品名) を介して、 35 キャリア銅箔付き厚み 3 mの銅箔 5 MT 35M3 (三井金属鉱業株式会社製、商品名) を配し、温度 180°C、圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を形成した (図 22 (b))。 次に、 キャリア銅箔を手作業により剥離後、 三菱電機株式会 社 ML 505 GT型炭酸ガスレーザを用いて、 基板の銅箔 405の面に出力 パワー 30m J、 ノ、°ルス幅 15 s、 ショット数 6回の条件でレ一ザ穴明けを 行い、 Φ Ο. 15 mmのレーザ穴 406を作製した。 その後、 超音波洗浄とァ ルカリ過マンガン酸液で炭化した榭脂カスを除去した (図 22 (c))。 さらに その P ZT薄膜 401の表面に DCスパッタリング法により、 0. 05 mの クロム薄膜 407を形成した。 その後、 基板両面に触媒付与、 密着促進後無電 解銅めつきを行い、 0. 5 の銅薄膜を形成し、 さらに基板両面に電気銅め つきにより 20 mの金属層を形成し、 めっき銅 408からなる金属層を形成 した (図 22 (d))。 この基板の表面に所望のエッチングレジストを形成し、 塩ィ匕第二鉄水溶液を用いてめっき銅 408からなる金属層の不要部分をエッチ ング除去し、 フェリシアン化カリウム水溶液を用いて露出したクロム薄膜 40 7をエッチング除去して、第 1のコンデンサ電極 409のパターンを形成した (図 22 (e))。 続いて、 所望のパターンのレジストを形成し、 20%重フッ 化アンモニゥム (NH4 F - HF) 水溶液を用いて PZT薄膜 401の不要部 分をエッチング除去して P ZT薄膜のパターニングを行い、 コンデンサ誘電体 401 ' を形成した (図 22 (f))。 続いて、 ルテニウムエッチング液 R EC 一 01 (関東化学株式会社、 商品名) を用いて、 露出したルテニウム薄膜 40 3をエッチング除去した (図 22 (g))。 次に、 この基板の表面に所望のエツ チングレジストを形成し、 銅箔 402、 銅箔 405及びめつき銅 408の不要 部分を塩化第二鉄水溶液を用いてエッチング除去して、 第 2のコンデンサ電極 410を含む回路パターンを形成して回路板を作製した (図 22 (h))。 その 後の多層配線板の加工は実施例 D— 1と同様な工程によりコンデンサ内蔵多層 配線板を得た (図 22 (i))。 実施例 D— 4 The surface of the copper foil 402 of the multilayer wiring board material with built-in capacitor D-2 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. (Fig. 22 (a)). On the surface of the copper foil 402, which is a material for a multilayer wiring board having a built-in capacitor, a glass epoxy pre-predeer GE A-679F (Hitachi Chemical Industry Co., Ltd. 3) Thick copper foil 5 MT 35M3 (trade name, manufactured by Mitsui Mining & Smelting Co., Ltd.) with 35 carrier copper foil, temperature 180 ° C, pressure 1.5MPa, heating and pressurizing time The substrates were laminated and integrated under the press conditions for 60 minutes to form a substrate (Figure 22 (b)). Next, after the carrier copper foil was manually peeled off, the output power was 30 mJ on the surface of the copper foil 405 on the board using Mitsubishi Electric Corporation ML 505 GT carbon dioxide laser. Laser drilling under conditions of several 6 times Then, a laser hole 406 having a diameter of 15 mm was manufactured. After that, the resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 22 (c)). Further, a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by a DC sputtering method. Then, a catalyst is applied to both sides of the substrate, electroless copper plating is performed after promoting adhesion, a copper thin film of 0.5 is formed, and a 20 m metal layer is formed on both surfaces of the substrate by electrolytic copper plating. A metal layer consisting of was formed (Fig. 22 (d)). A desired etching resist is formed on the surface of this substrate, an unnecessary portion of the metal layer made of plated copper 408 is removed by etching using an aqueous solution of ferric chloride, and the chromium thin film 40 exposed using an aqueous solution of potassium ferricyanide is removed. 7 was removed by etching to form a pattern of the first capacitor electrode 409 (FIG. 22 (e)). Subsequently, a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium fluoride (NH 4 F-HF) to pattern the PZT thin film. A dielectric 401 'was formed (FIG. 22 (f)). Subsequently, the exposed ruthenium thin film 403 was removed by etching using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name) (FIG. 22 (g)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402, the copper foil 405, and the plated copper 408 are removed by etching using an aqueous ferric chloride solution to form a second capacitor. A circuit pattern including the electrode 410 was formed to produce a circuit board (FIG. 22 (h)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor in the same process as in Example D-1 (FIG. 22 (i)). Example D-4
コンデンサ内蔵多層配線板用材料 C— 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会†土製、 商品名) による粗化処理を行った (図 23 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 00 mのガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会 社製、 商品名) を介して、 35 キャリア銅箔付き厚み 3 mの銅箔 5 MT 35 S 3 (三井金属鉱業株式会社製、商品名) を配し、温度 180 °C、圧力 1. 5MPa、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を形成した (図 23 (b))。 このプリプレダは、 両面に厚み 25 z mのポリエチレンテレ フタレート (PET) のフィルムを温度 100°C、 圧力 1. 5MP a、 加熱加 圧時間 10分の条件のホットプレスで貼り付けた後、 所望の箇所にドリル穴明 けを行った後、 スクリーン印刷により、 熱硬化性樹脂に銅粉が分散された導電 性ペースト 13 AE 1650 (タツ夕システム ·エレクトロニクス株式会社、 商品名) を充填し、 その後に表面の PETフィルムを剥がしたものを用いた。 次に、 P ZT薄膜 401の表面に DCスパッタリング法により、 0. 05 m のクロム薄膜 407を形成したのち、 基板の両面に電気銅めつきにより 20 mのめつき銅 408からなる金属層を形成した (図 23 (c))。 この基板の表 面に所望のエッチングレジストを形成し、 塩化第二鉄水溶液を用いてめっき銅 408からなる金属層の不要部分をエッチング除去し、 フェリシアン化力リウ ム水溶液を用いて露出したクロム薄膜 7をエッチング除去して、 第 1のコンデ ンサ電極 409のパターンを形成した (図 23 (d))。続いて、 所望のパター ンのレジストを形成し、 20 %重フッ化アンモニゥム (NH4 F - HF) 水溶 液を用いて P Z T薄膜 401の不要部分をエッチング除去して P Z T薄膜のパ 夕一ニングを行い、 コンデンサ誘電体 401 ' を形成した (図 23 (e))。 続 いて、 ルテニウムエッチング液 REC— 01 (関東化学株式会社、 商品名) を 用いて、露出したルテニウム薄膜 403をエッチング除去した(図 23 (f))。 次に、 この基板の表面に所望のエッチングレジストを形成し、 銅箔 402、 銅 箔 405及びめつき銅 408の不要部分を塩ィヒ第二鉄水溶液を用いてエツチン グ除去して、第 2のコンデンサ電極 410を含む回路パターンを形成して回路 板き作製した (図 23 (g))。 その後の多層配線板の加工は実施例 D— 1と同 様な工程によりコンデンサ内蔵多層配線板を得た (図 23 (h))。 実施例 D— 5 The surface of copper foil 402 of C-3, a material for multilayer wiring boards with built-in capacitors, is roughened with an organic acid-based micro-etching agent CZ-8100B (Mec Co., Ltd., made by Todo Co., Ltd.) as a pretreatment for multi-layer bonding. (Fig. 23 (a)). On the surface of the copper foil 402 of the material for a multilayer wiring board with a built-in capacitor, a thickness 1 serving as an insulating resin base material 404 is provided. Via a 00 m glass epoxy pre-preda GE A—679 F (trade name, manufactured by Hitachi Chemical Co., Ltd.), 3 m thick copper foil with 35 carrier copper foil 5 MT 35 S 3 (Mitsui Metal Mining Co., Ltd.) (Trade name, product name), laminated at a temperature of 180 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 60 minutes to form a substrate (Fig. 23 (b)). This prepreder is a 25-zm-thick polyethylene terephthalate (PET) film attached on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. After drilling a hole, fill the screen with a conductive paste 13 AE 1650 (Tatsuyu System Electronics Co., Ltd., trade name) in which copper powder is dispersed in a thermosetting resin by screen printing. The PET film was peeled off. Next, a 0.05 m chromium thin film 407 is formed on the surface of the PZT thin film 401 by DC sputtering, and then a metal layer made of 20 m plated copper 408 is formed on both sides of the substrate by electrolytic copper plating. (Fig. 23 (c)). A desired etching resist is formed on the surface of the substrate, an unnecessary portion of the metal layer made of plated copper 408 is removed by etching using an aqueous ferric chloride solution, and the exposed chromium is exposed using an aqueous solution of lithium ferricyanide. The thin film 7 was removed by etching to form a pattern of the first capacitor electrode 409 (FIG. 23D). Subsequently, a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F-HF) to perform patterning of the PZT thin film. As a result, a capacitor dielectric 401 'was formed (FIG. 23 (e)). Subsequently, the exposed ruthenium thin film 403 was etched away using the ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 23 (f)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402, the copper foil 405, and the plated copper 408 are removed by etching using a ferric chloride aqueous solution. A circuit pattern including the capacitor electrode 410 was formed to produce a circuit board (FIG. 23 (g)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same process as in Example D-1 (Fig. 23 (h)). Example D-5
コンデンサ内蔵多層配線板用材料と積層するプリプレダの穴に充填する導電 性べ一ストを化学的な反応により金属化される導電性ペーストであるナノべ一 スト (ハリマ化成株式会社、 商品名) に替えた以外は実施例 D— 4と同様なェ 程によりコンデンサ内蔵多層配線板を得た。 実施例 D— 6 Nano paste (Harima Kasei Co., Ltd.), a conductive paste that is metalized by a chemical reaction into the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors A multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example D-4, except that the replacement was performed. Example D-6
コンデンサ内蔵多層配線板用材 D— 3の銅箔 402の表面に、 多層化接着前 処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式会 社製、 商品名) による粗化処理を行った (図 24 (a))。 このコンデンサ内蔵 多層配線板用材料の銅箔 402の表面に、 絶緣樹脂基材 404となる厚み 10 0 mのガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会社 製、 商品名) を介して、 3 キャリア銅箔付き厚み の銅箔 5MT3 5 S 3 (三井金属鉱業株式会社製、 商品名) を配し、 温度 180 、 圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を形成した (図 24 (b))。 次に、 キャリア銅箔を剥がした基板の銅箔 405の表面に所 望のエッチングレジストを形成し、 不要な銅箔を塩化第二鉄水溶液を用いてェ ツチング除去して、所望の箇所に Φ 0. 1 5mmの窓穴 405 ' を形成した(図 24 (c))。 続いて、 窓穴 405 ' の箇所に三菱電機株式会社製 ML 505 G T型炭酸ガスレーザを用いて、 出力パワー 26mJ、 パルス幅 100 z s、 シ ョット数 4回の条件でレーザ照射してレーザ穴 406を明け、 超音波洗浄とァ ルカリ過マンガン酸液で炭化した樹脂カスを除去した (図 24 (d))。 さらに その PZT薄膜 401の表面に DCスパッタリング法により、 0. 05 imの クロム薄膜 407を形成した。 その後、 この基板両面に触媒付与、 密着促進後 無.電解銅めつきを行い、 0. 5 mの銅薄膜 19を形成した。 このようにして 形成した 0. 0 5 imのクロム薄膜 407と 0. 5 mの銅薄膜 41 9とが、 セミアディティブ法の下地金属層(厚さ 0. 1〜5 の金属層)を形成する。 この基板の両面に所望のめっきレジスト 414を形成し、電気銅めつきを行い、. 厚み 20 mの第 1のコンデンサ電極 409及びレーザ穴 406を含む部分の 回路となるめっき銅 415からなる導体パターンを形成した (図 24 (e))。 めっきレジスト 414を剥離後、 基板両面の 0. 5 zzmの銅薄膜 419の不要 部分と 0. 05 mのクロム薄膜 407の不要部分をエッチング除去して、 第 1のコンデンサ電極 409のパターンを形成した。このときに 3 m厚の銅箔 405もパターニングして回路を形成した (図 24 (f))。 続いて、 所望のパ ターンのレジストを形成し、 20%重フッ化アンモニゥム (NH4 F ' HF) 水溶液を用いて PZT薄膜 401の不要部分をエッチング除去して PZT薄膜 401のパターニングを行い、 コンデンサ誘電体 401 ' を形成した (図 24 (g))。 続いて、 ルテニウムエッチング液 REC— 01 (関東化学株式会社、 商品名) を用いて、 露出したルテニウム薄膜 403をエッチング除去した (図The surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding. (Figure 24 (a)). A 100 m thick glass epoxy prepreg GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.), which becomes an insulating resin base material 404, is provided on the surface of the copper foil 402 of the material for the multilayer wiring board with a built-in capacitor. 3 Carrier copper foil with thickness 5MT3 5S3 (made by Mitsui Mining & Smelting Co., Ltd., trade name), laminated under pressing conditions of temperature 180, pressure 1.5MPa, heating and pressing time 60 minutes They were integrated to form a substrate (Fig. 24 (b)). Next, a desired etching resist is formed on the surface of the copper foil 405 of the substrate from which the carrier copper foil has been peeled off, and unnecessary copper foil is removed by etching using an aqueous ferric chloride solution, and Φ A window hole 405 ′ of 0.15 mm was formed (FIG. 24 (c)). Subsequently, a laser beam was applied to the window hole 405 ′ using the ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 zs, and a number of shots of 4 times. At dawn, the resin residue carbonized by ultrasonic cleaning and alkali permanganate solution was removed (Fig. 24 (d)). Further, a 0.05 im chromium thin film 407 was formed on the surface of the PZT thin film 401 by DC sputtering. Thereafter, a catalyst was applied to both surfaces of the substrate, and after promoting adhesion, electroless copper plating was performed to form a copper thin film 19 of 0.5 m. The thus formed 0.55 im chromium thin film 407 and 0.5 m copper thin film 419 are A base metal layer (metal layer having a thickness of 0.1 to 5) is formed by a semi-additive method. A desired plating resist 414 is formed on both sides of the substrate, and electro-copper plating is performed. A conductive pattern made of plated copper 415 which becomes a circuit including the first capacitor electrode 409 having a thickness of 20 m and the laser hole 406. Was formed (Fig. 24 (e)). After peeling off the plating resist 414, unnecessary portions of the 0.5 zzm copper thin film 419 and unnecessary portions of the 0.05 m chromium thin film 407 on both sides of the substrate were removed by etching to form the pattern of the first capacitor electrode 409. . At this time, a circuit was also formed by patterning the 3 m-thick copper foil 405 (Fig. 24 (f)). Subsequently, a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F′HF), and the PZT thin film 401 is patterned to form a capacitor. A dielectric 401 'was formed (FIG. 24 (g)). Subsequently, the exposed ruthenium thin film 403 was etched away using the ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig.
24 (h))。 次に、 この基板の表面に所望のエッチングレジストを形成し、 銅 箔 402の不要部分を塩化第二鉄水溶液を用いてエッチング除去して、 第 2の コンデンサ電極 410を含む回路パターンを形成して回路板を作製した(図 2 4 ( i))。 その後の多層配線板の加工は実施例 D— 1と同様な工程によりコン デンサ内蔵多層配線板を得た (図 24 (j ))。 実施例 D - 7 24 (h)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402 are removed by etching using an aqueous ferric chloride solution to form a circuit pattern including the second capacitor electrode 410. A circuit board was fabricated (Fig. 24 (i)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor through the same steps as in Example D-1 (FIG. 24 (j)). Example D-7
コンデンサ内蔵多層配線板用材料 C一 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会社製、 商品名) による粗化処理を行った (図 25 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 00 mのガラスエポキシプリプレダ GEA— 679 F (日立化成工業株式会 社 、 商品名) を介して、 35 キャリア銅箔付き厚み 3 /zmの銅箔 5MT The surface of copper foil 402 of C-13, a material for multilayer wiring boards with built-in capacitors, was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding. (Figure 25 (a)). A 100 m thick glass epoxy prepreg GEA-679F (trade name, Hitachi Chemical Co., Ltd.), which becomes the insulating resin base material 404, is formed on the surface of the copper foil 402 of the material for the multilayer wiring board having the capacitor. With 35 carrier copper foil thickness 3 / zm copper foil 5MT
35M3 (三井金属鉱業株式会社製、商品名) を配し、温度 180 、圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を形成した (図 25 (b))。 キャリア銅箔を手作業により剥離後、 三菱電機株式会社製 M L 505 GT型炭酸ガスレ一ザを用いて、 出力パワー 30m J、 パルス幅 15 s , ショット数 6回の条件でレ一ザ穴明けを行い、 Φ 0. 15 mmのレーザ 穴 406を作製した。 その後、 超音波洗浄とアルカリ過マンガン酸液で炭化し た樹脂カスを除去した (図 25 (c))。 さらに PZT薄膜 401の表面に DC スパッタリング法により、 0. 05 mのクロム薄膜 407を形成した。 さら にこの基板の両面に触媒付与、 密着促進後無電解銅めつきを行い、 0. 35M3 (Mitsui Metal Mining Co., Ltd., trade name), temperature 180, pressure 1. The substrates were laminated and integrated under press conditions of 5 MPa and a heating and pressing time of 60 minutes to form a substrate (Fig. 25 (b)). After the carrier copper foil was manually peeled off, laser drilling was performed using Mitsubishi Electric Corporation's ML505 GT type carbon dioxide laser under the conditions of an output power of 30 mJ, pulse width of 15 s, and 6 shots. Then, a laser hole 406 having a diameter of 0.15 mm was produced. After that, resin residue carbonized by ultrasonic cleaning and alkaline permanganate solution was removed (Fig. 25 (c)). Further, a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by a DC sputtering method. Furthermore, a catalyst was applied to both sides of this substrate, and after promoting adhesion, electroless copper plating was performed.
の銅薄膜 419を形成した。 このようにして形成した 0. 05 mのクロム薄 膜 407と 0. 5 mの銅薄膜 419とが、 セミアディティブ法の下地金属層 (厚さ l〜5 zmの金属層) を形成する。 この基板の表面に所望のめっき レジスト 414を形成し、 電気銅めつきを行い、 厚み 20 mの第 1のコンデ ンサ電極 409及びレ一ザ穴 406を含む部分の回路となるめっき銅 415か らなる導体パターンを形成した (図 25 (d))。 めっきレジスト 414を剥離 後、 基板表面に露出した 0. 5 の銅薄膜 419と 0. 05 zmのクロム薄 膜 407の露出部分をエッチング除去して、第 1のコンデンサ電極 409及び レーザ穴 406を含む部分の回路パターンを形成した。 このときに 3 m厚の 銅箔 405もパターニングして回路を形成した (図 25 (e))。 続いて、 所望 のパターンのレジストを形成し、 20 %重フッ化アンモニゥム (NH4 F · H F) 水溶液を用いて PZT薄膜 401をエッチング除去して PZT薄膜 401 のパ夕一ニングを行い、コンデンサ誘電体 401 ' を形成した(図 25 (f ))。 その後、 ルテニウムエッチング液 REC— 01 (関東化学株式会社、 商品名) を用いてルテニウム薄膜 403の露出部分をエッチング除去した(図 25 (g))。 次に、 この基板の表面に所望のエッチングレジストを形成し、 銅箔 402の不 要部分を塩ィヒ第二鉄水溶液を用いてエッチング除去して、 第 2のコンデンサ電 極. 410を含む回路パターンを形成して回路板を作製した(図 25 (h))。そ の後の多層配線板の加工は実施例 D— 1と同様な工程によりコンデンサ内蔵多 層配線板を得た (図 2 5 ( i))。 実施例 D— 8 A copper thin film 419 was formed. The thus formed 0.05 m thin chromium film 407 and 0.5 m thin copper film 419 form a semi-additive base metal layer (metal layer having a thickness of l to 5 zm). A desired plating resist 414 is formed on the surface of this substrate, electrolytic copper plating is performed, and the plated copper 415 which becomes a circuit of the portion including the first capacitor electrode 409 having a thickness of 20 m and the laser hole 406 is formed. A conductive pattern was formed (Fig. 25 (d)). After removing the plating resist 414, the exposed portions of the 0.5 copper thin film 419 and 0.05 zm chromium thin film 407 exposed on the substrate surface are removed by etching to include the first capacitor electrode 409 and the laser hole 406. Partial circuit patterns were formed. At this time, a 3 m thick copper foil 405 was also patterned to form a circuit (Fig. 25 (e)). Subsequently, a resist having a desired pattern is formed, and the PZT thin film 401 is removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F · HF) to perform patterning of the PZT thin film 401, thereby forming a capacitor dielectric. The body 401 'was formed (FIG. 25 (f)). Then, the exposed part of the ruthenium thin film 403 was etched away using a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 25 (g)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402 are removed by etching using an aqueous solution of ferric chloride, and a circuit including the second capacitor electrode. A circuit board was fabricated by forming a pattern (Fig. 25 (h)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example D-1. A multilayer wiring board was obtained (Fig. 25 (i)). Example D-8
コンデンサ内蔵多層配線板用材料 D— 3の銅箔 40 2の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8 1 0 0 B (メック株式 会社製、 商品名) による粗化処理を行った (図 2 6 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 40 2の表面に、 絶縁樹脂基材 404となる厚み 1 0 0 mのガラスエポキシプリプレダ GE A— 6 7 9 F (日立化成工業株式会 社製、 商品名) を介して、 厚み 1 8 mの銅箔 5 GTS— 1 8 (古河サーキッ トフオイル株式会社、 商品名) を配し、 温度 1 8 0°C、 圧力 1. 5MP a、 加 熱加圧時間 6 0分のプレス条件で積層一体化し、基板を形成した(図 2 6 (b))0 このプリプレダは、 両面に厚み 2 5 /imのポリエチレンテレフタレート (PE T) のフィルムを温度 1 0 0° (:、 圧力 1. 5MP a、 加熱加圧時間 1 0分の条 件のホットプレスで貼り付けた後、 所望の箇所にドリル穴明けを行った後、 ス クリーン印刷により、 熱硬化性樹脂に銅粉が分散された導電性ペースト 1 3A E 1 6 5 0 (タッタシステム ·エレクトロニクス株式会社、商品名)を充填し、 その後に表面の PETフィルムを剥がしたものを用いた。 次に、 P ZT薄膜 4 0 1の表面に DCスパッタリング法により 0. 0 5 mのクロム薄膜 40 7を 形成した。 その後、 この基板両面に触媒付与、 密着促進後、 無電解銅めつきを 行い、 0. 5 mの銅薄膜 4 1 9を形成した。 このようにして形成した 0. 0 5 mのクロム薄膜 40 7と 0. 5 mの銅薄膜 4 1 9とが、 セミアディティ ブ法の下地金属層 (厚さ 1〜5 mの金属層) を形成する。 その後、 基板 両面に所望のめっきレジスト 4 14を形成し、 電気銅めつきを行い、 厚み 2 0 mの第 1のコンデンサ電極 40 9となる導体パターンを形成した (図 2 6 (c))。 めっきレジスト 4 14を剥離後、 基板表面の露出した 0. 5 mの銅 薄膜 4 1 9を塩化第二鉄水溶液でエッチング除去し、 露出した 0. 0 5 βΐηの クロム薄膜 40 7をフェリシアン化カリゥム水溶液を用いてェッチング除去し て、 第 1のコンデンサ電極 409のパ夕一ンを形成した (図 26 (d))。続い て、 所望のパターンのレジストを形成し、 20%重フッ化アンモニゥム (N J 4 F - HF) 水溶液を用いて PZT薄膜 401の不要部分をエッチング除去し て PZT薄膜 401のパターニングを行い、 コンデンサ誘電体 401 ' を形成 した (図 26 (e))。 続いて、 ルテニウムエッチング液 REC— 01 (関東化 学株式会社、 商品名) を用いて露出したルテニウム薄膜 403をエッチング除 去した (図 26 (f))。 次に、 この基板の表面に所望のエッチングレジストを 形成し、 銅箔 402及び銅箔 405の不要部分を塩化第二鉄水溶液を用いてェ ツチング除去して、第 2のコンデンサ電極 410を含む回路パターンを形成し て回路板を作製した (図 26 (g))。 その後の多層配線板の加工は実施例 D_ 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 26 (h))。 実施例 D— 9 Material for multilayer wiring board with a built-in capacitor D-3 Copper foil 402 Surface of the layer 2 Adhesion as a pretreatment by organic acid micro-etching agent CZ-8100B (Mec Co., Ltd., trade name) (Fig. 26 (a)). On the surface of the copper foil 402 of the multilayer wiring board material with a built-in capacitor, a 100-m-thick glass epoxy pre-preder GE A—6979F (Hitachi Chemical Industry Co., Ltd.) 18 Gm-thick copper foil 5 GTS- 18 (Furukawa Circuit Oil Co., Ltd., trade name) is placed at a temperature of 180 ° C, a pressure of 1.5 MPa, and heating. The substrate was formed by laminating and unifying under press conditions of 60 minutes (Fig. 26 (b)). 0 This pre-predeer was prepared by applying a 25 / im thick polyethylene terephthalate (PET) film to both sides at a temperature of 10 0 ° (: Pressure 1.5MPa, heating and pressurizing time 10 minutes after applying by hot press, drilling at desired location, then thermosetting by screen printing Conductive paste in which copper powder is dispersed in resin 1 3A E 1650 (Tutter System Electronics Co., Ltd., trade name) Next, a 0.05 m-thick chromium thin film 407 was formed on the surface of the PZT thin film 401 by a DC sputtering method. After applying a catalyst to both sides of the substrate and promoting adhesion, electroless copper plating was performed to form a 0.5 m copper thin film 419. The thus formed 0.05 m chromium thin films 407 and 0 A 5 m copper thin film 4 19 forms a base metal layer (metal layer with a thickness of 1 to 5 m) by the semi-additive method, and then a desired plating resist 414 is formed on both sides of the substrate. Electroplated copper was used to form a conductor pattern to become the first capacitor electrode 409 with a thickness of 20 m (Fig. 26 (c)) After the plating resist 414 was peeled off, the surface of the substrate was exposed. The 5 m copper thin film 419 was etched away with an aqueous ferric chloride solution, and the exposed 0.05 βΐη chromium thin film 407 was removed. And Etchingu removed using cyanide Kariumu solution Thus, a pattern of the first capacitor electrode 409 was formed (FIG. 26 (d)). Subsequently, a resist of a desired pattern, 20% bifluoride Anmoniumu - perform patterning of the PZT thin film 401 and unnecessary portions of the PZT thin film 401 is etched away using (NJ 4 F HF) aqueous solution, the capacitor dielectric The body 401 'was formed (Fig. 26 (e)). Subsequently, the exposed ruthenium thin film 403 was removed by etching using a ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 26 (f)). Next, a desired etching resist is formed on the surface of the substrate, unnecessary portions of the copper foil 402 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and a circuit including the second capacitor electrode 410 is formed. A circuit board was fabricated by forming a pattern (Fig. 26 (g)). Subsequent processing of the multilayer wiring board was performed in the same process as in Example D_1 to obtain a multilayer wiring board with a built-in capacitor (FIG. 26 (h)). Example D-9
コンデンサ内蔵多層配線板用材料と積層するプリプレダの穴に充填する導電 性ペーストを化学的な反応により金属化される導電性ペーストであるナノべ一 スト (八リマ化成株式会社、 商品名) に替えた以外は実施例 D— 8と同様なェ 程によりコンデンサ内蔵多層配線板を得た。 実施例 D— 10 Replaced the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors with a nano paste (Hachirima Kasei Co., Ltd., trade name), a conductive paste that is metallized by a chemical reaction. Except for this, a multilayer wiring board with a built-in capacitor was obtained in the same manner as in Example D-8. Example D-10
コンデンサ内蔵多層配線板用材料 D— 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会社製、 商品名) による粗化処理を行った (図 27 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 00 mのガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会 社製、 商品名) を介して、 厚み 18 mの銅箔 5 GTS— 18 (古河サ一キッ トフオイル株式会社、 商品名) を配し、 温度 180で、 圧力 1. 5MP a、 加 熱加圧時間 60分のプレス条件で積層一体化し、基板を形成した(図 27(b))。 このプリプレダは、 両面に厚み 25 mのポリエチレンテレフタレ一ト (PE T) のフィルムを温度 100°C、 圧力 1. 5MP a、 加熱加圧時間 10分の条 件のホットプレスで貼り付けた後、 所望の箇所にドリル穴明けを行った後、 ス クリーン印刷により、 熱硬化性樹脂に銅粉が分散された導電性ペース卜 AE 1 650 (タツ夕システム ·エレクトロニクス株式会社、 商品名) を充填し、 そ の後に表面の PETフィルムを剥がしたものを用いた。 次に、 PZT薄膜 40 1の表面の所望の箇所に、 スクリーン印刷により、 化学的な反応により金属化 される導電性ペーストであるナノペースト (ハリマ化成株式会社、 商品名) を 40 mの厚みで印刷後、 温度 200°Cで加熱時間 1時間の条件でベーキング し、導電性ペーストを金属化して、第 1のコンデンサ電極 416のパターンを 形成した(図 27 (c))。続いて、所望のパターンのレジストを形成し、 20% 重フッ化アンモニゥム (NH4 F * HF) 水溶液を用いて PZT薄膜 401の 不要部分をエッチング除去して P ZT薄膜のパターニングを行ってコンデンサ 誘電体 401 ' を形成した後、 ルテニウムエッチング液 REC— 01 (関東化 学株式会社、 商品名) を用いてルテニウム薄膜 403の露出部分をエッチング 除去した (図 27 (d))。 次に、 この基板の表面に所望のエッチングレジスト を形成し、 銅箔 402及び銅箔 405の不要部分を塩化第二鉄水溶液を用いて エッチング除去して、第 2のコンデンサ電極 410を含む回路パターンを形成 して回路板を作製した (図 27 (e))。 その後の多層配線板の加工は実施例 D 一 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 27 (f))。 実施例 D— 11 The surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multilayer bonding. (Fig. 27 (a)). A 100-meter-thick glass epoxy prepreg GE A-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes the insulating resin base material 404 on the surface of the copper foil 402, which is a material for a multilayer wiring board with a built-in capacitor. 18 Gm-thick copper foil 5 GTS-18 (Furukawa Sakittofu Oil Co., Ltd., trade name) is placed at a temperature of 180, a pressure of 1.5 MPa, and a heating and pressing time of 60 minutes. To form a substrate (FIG. 27 (b)). This prepreder is made by applying a 25 m thick polyethylene terephthalate (PET) film on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. After drilling at the desired location, the screen is filled with conductive paste AE 1650 (Tatsuyu System Electronics Co., Ltd., trade name) in which copper powder is dispersed in thermosetting resin by screen printing. The PET film on the surface was then peeled off. Next, at a desired location on the surface of the PZT thin film 401, nano-paste (Harima Chemical Co., Ltd., a trade name), which is a conductive paste that is metallized by a chemical reaction by screen printing, with a thickness of 40 m. After printing, baking was performed at a temperature of 200 ° C. for a heating time of 1 hour, and the conductive paste was metallized to form a pattern of the first capacitor electrode 416 (FIG. 27 (c)). Subsequently, a resist having a desired pattern is formed, and unnecessary portions of the PZT thin film 401 are removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F * HF), and the PZT thin film is patterned to perform capacitor dielectric. After forming the body 401 ', the exposed portion of the ruthenium thin film 403 was removed by etching using a ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 27 (d)). Next, a desired etching resist is formed on the surface of the substrate, and unnecessary portions of the copper foil 402 and the copper foil 405 are removed by etching using an aqueous solution of ferric chloride to form a circuit pattern including the second capacitor electrode 410. Then, a circuit board was fabricated (Fig. 27 (e)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-11 (FIG. 27 (f)). Example D—11
コンデンサ内蔵多層配線板用材料と積層するプリプレダの穴に充填する導電 性べ一ストを化学的な反応により金属化される導電性ペーストであるナノべ一 スト (ハリマ化成株式会社、 商品名) に替えた以外は実施例 D— 1 0と同様な 工程によりコンデンサ内蔵多層配線板を得た。 実施例 D - 12 Nano paste (Harima Kasei Co., Ltd.), a conductive paste that is metalized by a chemical reaction into the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors A multilayer wiring board with a built-in capacitor was obtained by the same steps as in Example D-10 except for the change. Example D-12
コンデンサ内蔵多層配線板用材料 D— 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会社製、 商品名) による粗化処理を行った (図 28 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 00 mのガラスエポキシプリプレダ GEA— 679 F (日立化成工業株式会 社製、 商品名) を介して、 厚み 12 ^mの銅箔 5GTS— 12 (古河サーキッ トフオイル株式会社、 商品名) を配し、 温度 180°C、 圧力 1. 5MP a、 加 熱加圧時間 60分のプレス条件で積層一体化し、基板を形成した(図 28(b))。 次に、 所望のパターンのレジストを形成し、 20 %重フッ化アンモニゥム (N H4 F · HF) 水溶液を用いて PZT薄膜 401をエッチング除去して P Z T 薄膜のパ夕一ニングを行ってコンデンサ誘電体 401 ' を形成した後、 ルテニ ゥムエッチング液 REC— 01 (関東化学株式会社、 商品名) を用いてルテニ ゥム薄膜 403をエッチング除去した (図 28 (c))。 この基板の両面に所望 のエッチングレジストを形成し、 銅箔 405の不要部分を塩化第二鉄水溶液を 用いてエッチング除去して、 所望の箇所に Φ 0. 15mmの窓穴 405' を形 成した (図 28 (d))。 続いて、 窓穴 405' の箇所に三菱電機株式会社製 M L 505 GT型炭酸ガスレーザを用いて、 出力パワー 26m J、 パルス幅 10 0 s、 ショット数 4回の条件でレ一ザ照射してレ一ザ穴 406を明け、 超音 波洗浄とアルカリ過マンガン酸液で炭化した樹脂カスを除去した(図 28 (e))。 さらに基板のコンデンサ誘電体 401 ' 側の面に、 DCスパッタリング法によ り、 0. 05 のクロム薄膜 407を形成した。 その後、 基板の両面に、 触 媒付与、 密着促進後無電解銅めつきを行い、 0. 5 の銅薄膜を形成し、 さ らにその上に電気銅めつきにより 20 mの金属層を形成し、 めっき銅 408 からなる金属層を形成した (図 28 (f))。 この基板の表面に所望のエツチン グ ジストを形成し、 塩化第二鉄水溶液を用いてめっき銅 408及び銅箔 40 5の不要部分をエッチング除去し、 フェリシアン化力リゥム水溶液を用いて露 出したクロム薄膜 407をエッチング除去し、 さらに塩化第二鉄水溶液を用い て露出した銅箔 402をエッチング除去して、第 1のコンデンサ電極 409と 第 2のコンデンサ電極 410を含む回路パターンを形成した (図 28 (g))。 その後の多層配線板の加工は実施例 D— 1と同様な工程によりコンデンサ内蔵 多層配線板を得た (図 28 (h))。 実施例 D— 13 The surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 was roughened with an organic acid-based microetching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multilayer bonding. (Figure 28 (a)). On the surface of the copper foil 402, which is a material for a multilayer wiring board with a built-in capacitor, a 100 m thick glass epoxy prepreg GEA-679F (trade name, manufactured by Hitachi Chemical Co., Ltd.), which becomes the insulating resin base material 404, 12 Gm-thick copper foil 5GTS-12 (Furukawa Circuit Oil Co., Ltd., trade name) is placed, and laminated under the press conditions of temperature 180 ° C, pressure 1.5MPa, heating and pressurizing time 60 minutes. The substrates were integrated to form a substrate (FIG. 28 (b)). Next, a resist having a desired pattern is formed, and the PZT thin film 401 is removed by etching using a 20% aqueous solution of ammonium bifluoride (NH 4 F · HF), and the PZT thin film is patterned to perform capacitor dielectric. After forming 401 ', the ruthenium thin film 403 was etched away using a ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 28 (c)). A desired etching resist was formed on both sides of the substrate, and unnecessary portions of the copper foil 405 were removed by etching using an aqueous ferric chloride solution to form window holes 405 'having a diameter of 0.15 mm at desired positions. (Fig. 28 (d)). Subsequently, laser irradiation was performed at the window hole 405 'using a ML 505 GT carbon dioxide laser manufactured by Mitsubishi Electric Corporation under the conditions of an output power of 26 mJ, a pulse width of 100 s, and four shots. A hole 406 was drilled, and resin residue carbonized with ultrasonic cleaning and an alkali permanganate solution was removed (Fig. 28 (e)). Further, a 0.05 thin chromium film 407 was formed on the surface of the substrate on the side of the capacitor dielectric 401 'by DC sputtering. Then, on both surfaces of the substrate, electroless copper plating is performed after applying a catalyst and promoting adhesion to form a copper thin film of 0.5, and then a 20 m metal layer is formed thereon by electrolytic copper plating. Then, a metal layer made of plated copper 408 was formed (FIG. 28 (f)). A desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and the exposed portion is exposed using an aqueous ferricyanide force aqueous solution. The removed chromium thin film 407 was removed by etching, and the exposed copper foil 402 was further removed by etching using an aqueous ferric chloride solution to form a circuit pattern including the first capacitor electrode 409 and the second capacitor electrode 410. (Figure 28 (g)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor through the same steps as in Example D-1 (FIG. 28 (h)). Example D-13
コンデンサ内蔵多層配線板用材料 D— 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100B (メック株式 会社製、 商品名) による粗化処理を行った (図 29 (a))0 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 404となる厚み 1 00 mのガラスエポキシプリプレダ GEA— 679 F (日立化成工業株式会 社製、 商品名) を介して、 35 キャリア銅箔付き厚み 3 の銅箔 5MTThe surface of copper foil 402 of material D-3 with built-in capacitor was roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by Mec Co., Ltd.) as a pretreatment for multi-layer bonding. (Fig. 29 (a)) 0 A 100 m thick glass epoxy prepreg GEA-679F (Hitachi Chemical Industry Co., Ltd.) Through the company, brand name), 35 carrier copper foil with thickness 3 copper foil 5MT
35M3 (三井金属鉱業株式会社製、商品名) を配し、温度 180°C、圧力 1. 5MP a、 加熱加圧時間 60分のプレス条件で積層一体化して基板を得た (図35M3 (manufactured by Mitsui Kinzoku Mining Co., Ltd., trade name) was arranged and laminated under a pressing condition of temperature 180 ° C, pressure 1.5MPa, heating and pressing time 60 minutes to obtain a substrate (Fig.
29 (b))。 次に、 所望のパターンのレジストを形成し、 20%重フッ化アン モニゥム (NH4 F ' HF) 水溶液を用いて PZT薄膜 401をエッチング除 去して PZT薄膜のパターニングを行ってコンデンサ誘電体 401 ' を形成し た後、 ルテニウムエッチング液 REC— 01 (関東化学株式会社、 商品名) を 用いてルテニウム薄膜 403の露出部分をエッチング除去した(図 29(c))。 キャリア銅箔を手作業により剥離後、 銅箔 405の所定の表面に三菱電機株式 会社製 ML 505 GT型炭酸ガスレーザを用いて、 出力パワー 30m J、 パル ス幅 15 S、 ショット数 6回の条件でレーザ照射し、 Φ 0. 15 mmのレ一 ザ穴 406を作製した。 その後、 超音波洗浄とアルカリ過マンガン酸液で炭化 した樹脂カスを除去した (図 29 (d))。 さらにその基板のコンデンサ誘電体29 (b)). Next, a resist having a desired pattern is formed, and the PZT thin film 401 is etched and removed using a 20% aqueous solution of ammonium bifluoride (NH 4 F′HF), and the PZT thin film is patterned to form a capacitor dielectric 401. After forming ', the exposed part of the ruthenium thin film 403 was etched away using the ruthenium etchant REC-01 (Kanto Chemical Co., Ltd., trade name) (Fig. 29 (c)). After the carrier copper foil was manually peeled off, the specified surface of the copper foil 405 was output using a Mitsubishi Electric Corporation ML 505 GT carbon dioxide laser with an output power of 30 mJ, a pulse width of 15 S, and six shots. Laser irradiation was performed to produce a laser hole 406 having a diameter of 0.15 mm. After that, resin residue carbonized by ultrasonic cleaning and alkaline permanganate solution was removed (Fig. 29 (d)). Furthermore, the capacitor dielectric of the substrate
4.01 ' を形成した面上に、 DCスパッタリング法により、 0. 05 mのク ロム薄膜 407を形成した。 その後、 基板両面に触媒付与、 密着促進後無電解 銅めつきを行い、 0. 5 の銅薄膜を形成し、 さらにその上に電気銅めつき により 20 mの金属層を形成し、 めっき銅 408からなる金属層を形成した (図 29 (e))。 この基板の表面に所望のエッチングレジストを形成し、 塩化 第二鉄水溶液を用いてめっき銅 408及び銅箔 405の不要部分をエッチング 除去し、 フェリシアン化カリウム水溶液を用いて露出したクロム薄膜 407を エッチング除去し、 さらに塩化第二鉄水溶液を用いて露出した銅箔 402をェ ツチング除去して、 第 1のコンデンサ電極 409と第 2のコンデンサ電極 4 10を含む回路パターンを形成した (図 29 (f))。 その後の多層配線板の加 ェは実施例 D— 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 2 9 (g))。 実施例 D— 14 On the surface on which 4.01 ′ was formed, a 0.05 m chromium thin film 407 was formed by DC sputtering. After that, catalyst is applied to both sides of the substrate, and after promoting adhesion, electroless Copper plating was performed, a copper thin film of 0.5 was formed, a metal layer of 20 m was formed thereon by electrolytic copper plating, and a metal layer of plated copper 408 was formed (FIG. 29 (e) ). A desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricyanide solution. Further, the exposed copper foil 402 was removed by etching using an aqueous ferric chloride solution to form a circuit pattern including the first capacitor electrode 409 and the second capacitor electrode 410 (FIG. 29 (f)). ). Subsequent application of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-1 (Fig. 29 (g)). Example D-14
コンデンサ内蔵多層配線板用材料 D— 3の銅箔 402の表面に、 多層化接着 前処理として、 有機酸系マイクロエッチング剤 CZ— 8100 B (メック株式 会社製、 商品名) による粗化処理を行った (図 30 (a))。 このコンデンサ内 蔵多層配線板用材料の銅箔 402の表面に、 絶縁樹脂基材 40 となる厚み 1 00 mのガラスエポキシプリプレダ GE A— 679 F (日立化成工業株式会 社製、 商品名) を介して、 35 / mキャリア銅箔付き厚み 3 mの銅箔 5 MT 3553 (三井鉱山株式会社、 商品名) を配し、 温度 180°C、 圧力 1. 5M P a、 加熱加圧時間 60分のプレス条件で積層一体化し、 基板を得た (図 30 (b);)。 このプリプレダは、 両面に厚み 25 のポリエチレンテレフタレー ト (PET) のフィルムを温度 100°C、 圧力 1. 5MP a、 加熱加圧時間 1 0分の条件のホットプレスで貼り付けた後、 所望の箇所にドリル穴明けを行つ た後、 スクリーン印刷により、 熱硬化性樹脂に銅粉が分散された導電性ペース ト AE 1650 (タッタシステム ·エレクトロニクス株式会社、 商品名) を充 填!^、 その後に表面の PETフィルムを剥がしたものを用いた。 The surface of copper foil 402 of multilayer wiring board material with built-in capacitor D-3 is roughened with an organic acid-based micro-etching agent CZ-8100B (trade name, manufactured by MEC Corporation) as a pretreatment for multilayer bonding. (Fig. 30 (a)). On the surface of the copper foil 402, which is a material for a multilayer wiring board with a built-in capacitor, a 100-m-thick glass epoxy pre-predeer GE A—679F (trade name, manufactured by Hitachi Chemical Co., Ltd.) that becomes the insulating resin base material 40 Via a 35 / m carrier copper foil with 3 m thick copper foil 5 MT 3553 (Mitsui Mining Co., Ltd., trade name), temperature 180 ° C, pressure 1.5M Pa, heating and pressurizing time 60 The substrates were laminated and integrated under the same pressing conditions to obtain a substrate (Fig. 30 (b);). This pre-predeer is prepared by applying a 25-thick polyethylene terephthalate (PET) film on both sides by hot pressing at a temperature of 100 ° C, a pressure of 1.5 MPa, and a heating and pressing time of 10 minutes. After drilling holes, conductive paste AE 1650 (Tutter System Electronics Co., Ltd., trade name) in which copper powder is dispersed in thermosetting resin is filled by screen printing! ^ Then, the PET film on the surface was peeled off.
次に、所望のパ夕一ンのレジストを形成し、 20 %重フッ化アンモニゥム(N H4 F · HF) 水溶液を用いて PZT薄膜 401をエッチング除去して P Z T 薄膜のパターニングを行ってコンデンサ誘電体 401 ' を形成した後、 ルテニ ゥムエッチング液 REC— 01 (関東化学株式会社、 商品名) を用いてルテニ ゥム薄膜 403の露出部分をエッチング除去した (図 30 (c))。 さらに基板 のコンデンサ誘電体 401 ' の面側に、 DCスパッタリング法により、 0. 0 5 mのクロム薄膜 407を形成したのち、 触媒付与、 密着促進後無電解銅め つきを行い、 0. 5 の銅薄膜を形成した。 さらに基板両面に電気銅めつき により 20 mのめつき銅 408からなる金属層を形成した (図 30 (d))。 この基板の表面に所望のエッチングレジス卜を形成し、 塩化第二鉄水溶液を用 いてめつき銅 408及び銅箔 405の不要部分をエッチング除去し、 フエリシ アン化カリウム水溶液を用いて露出したクロム薄膜 7をエッチング除去し、 さ らに塩化第二鉄水溶液を用いて露出した銅箔 402エッチング除去して、 第 1 のコンデンサ電極 409と第 2のコンデンサ電極 410を含む回路パターン を形成した (図 30 (e))。 その後の多層配線板の加工は実施例 D— 1と同様 な工程によりコンデンサ内蔵多層配線板を得た (図 30 ( ))。 実施例 D— 15 Next, a desired resist pattern is formed, and 20% ammonium bifluoride (N H 4 F · HF) aqueous solution to remove the PZT thin film 401 by etching and patterning the PZT thin film to form a capacitor dielectric 401 ′, then use a ruthenium etching solution REC-01 (Kanto Chemical Co., Ltd., trade name) The exposed portion of the ruthenium thin film 403 was removed by etching (FIG. 30 (c)). Further, a 0.05 m chromium thin film 407 is formed on the surface of the capacitor dielectric 401 ′ of the substrate by a DC sputtering method, then a catalyst is applied, adhesion is promoted, and then electroless copper plating is performed. A copper thin film was formed. Furthermore, a metal layer made of plated copper 408 of 20 m was formed on both sides of the substrate by electrolytic copper plating (Fig. 30 (d)). A desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 and the copper foil 405 are removed by etching using an aqueous ferric chloride solution, and the chromium thin film is exposed using an aqueous potassium fluoric acid solution. 7 was removed by etching, and the exposed copper foil 402 was further removed by etching using an aqueous ferric chloride solution to form a circuit pattern including the first capacitor electrode 409 and the second capacitor electrode 410 (FIG. 30). (e)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same process as in Example D-1 (Fig. 30 ()). Example D-15
コンデンサ内蔵多層配線板用材料と積層するプリプレダの穴に充填する導電 性ペーストを化学的な反応により金属化される導電性ペーストであるナノべ一 スト (八リマ化成株式会社、 商品名) に替えた以外は実施例 D—14と同様な 工程によりコンデンサ内蔵多層配線板を得た。 比較例 D— 1 Replaced the conductive paste that fills the holes of the pre-predder laminated with the material for multilayer wiring boards with built-in capacitors with a nano paste (Hachiriima Kasei Co., Ltd., trade name), a conductive paste that is metallized by a chemical reaction. Except for this, a multilayer wiring board with a built-in capacitor was obtained by the same steps as in Example D-14. Comparative Example D-1
両面の回路パターンを接続する導体穴 (穴内は穴うめ樹脂 418にて充填さ れている)を有する板厚 0. 2 mmの両面回路基板(図 31 (a))を用意した。 こ.の基板の片面に、 DCスパッタリング法により、 0. 2 mのルテニウム薄 膜 403を形成した。所望のパターンのレジストを形成し、 R I E法によって、 回路上以外のルテニウム薄膜 403をエッチング除去し、 第 2のコンデンサ電 極 421を含む回路パターンを形成した (図 31 (b))。 さらにその基板表面 に強誘電体薄膜形成材料 PZT (関東化学株式会社、 商品名) を塗布し、 温度 150°Cで加熱時間 30分間のプリべークを行った。 塗布とプリべークをさら に 5回繰り返し、 その後に温度 250°Cで加熱時間 1時間の熱処理を行って、 厚さ 0. 5 mの P ZT薄膜 401を形成した (図 31 (c))。 さらにその P ZT薄膜 401の表面に、 DCスパッタリング法により、 0. 05 mのクロ ム薄膜 407を形成した。 さらにその表面に電気銅めつきにより 20 rnのめ つき銅 408からなる金属層を形成した (図 31 (d))。 この基板の表面に所 望のエッチングレジストを形成し、 塩化第二鉄水溶液を用いてめっき銅 408 の不要部分をエツチング除去し、 フェリシァン化カリゥム水溶液を用いて露出 したクロム薄膜 407をエッチング除去して、第 1のコンデンサ電極 422の パターンを形成して回路板を作製した (図 31 (e))。 その後の多層配線板の 加工は実施例 D— 1と同様な工程によりコンデンサ内蔵多層配線板を得た (図 31 ( f );)。 実施例 D— 1〜D_ 15および比較例 D— 1で得られたコンデンサ内蔵多層 配線板について、 誘電体の膜厚、 比誘電率およびコンデンサ容量を測定した。 各測定方法は前記と同様である。 以下の表 4に測定結果を示す。 A 0.2 mm-thick double-sided circuit board (Fig. 31 (a)) having conductor holes for connecting circuit patterns on both sides (the inside of the hole was filled with resin 418) was prepared. On one surface of this substrate, a 0.2 m ruthenium thin film 403 was formed by DC sputtering. Form resist of desired pattern, and by RIE method, The ruthenium thin film 403 other than on the circuit was removed by etching to form a circuit pattern including the second capacitor electrode 421 (FIG. 31 (b)). Furthermore, a ferroelectric thin film forming material PZT (Kanto Chemical Co., Ltd., trade name) was applied to the substrate surface, and prebaked at a temperature of 150 ° C for a heating time of 30 minutes. The application and pre-bake were repeated five more times, and then a heat treatment was performed at a temperature of 250 ° C for a heating time of 1 hour to form a 0.5 m thick PZT thin film 401 (Fig. 31 (c) ). Further, a 0.05 m chromium thin film 407 was formed on the surface of the PZT thin film 401 by DC sputtering. Further, a metal layer made of plated copper 408 having a thickness of 20 rn was formed on the surface by electrolytic copper plating (FIG. 31 (d)). A desired etching resist is formed on the surface of the substrate, unnecessary portions of the plated copper 408 are removed by etching using an aqueous ferric chloride solution, and the exposed chromium thin film 407 is removed by etching using an aqueous potassium ferricinated solution. Then, a circuit board was fabricated by forming a pattern of the first capacitor electrode 422 (FIG. 31 (e)). Subsequent processing of the multilayer wiring board yielded a multilayer wiring board with a built-in capacitor by the same steps as in Example D-1 (FIG. 31 (f);). With respect to the multilayer wiring board with a built-in capacitor obtained in Examples D-1 to D_15 and Comparative Example D-1, the thickness of the dielectric, the relative dielectric constant, and the capacitance of the capacitor were measured. Each measuring method is the same as described above. Table 4 below shows the measurement results.
表 4 Table 4
実施例 D— 1〜D— 1 5は、 いずれも、 金属箔の表面に比誘電率が 1 0〜2 0 0 0でかつ膜厚が 0 . 0 5〜2 _i mの誘電体薄膜が設けられたことを特徴と するコンデンサ内蔵多層配線板用材料を用いて作製したコンデンサ内蔵基板で ある。 作製したコンデンサ容量のばらつきは全て ± 1 0 %未満であり、 均一で 良好なコンデンサを作製することができた。 In each of Examples D-1 to D-15, a dielectric thin film having a relative dielectric constant of 10 to 2000 and a film thickness of 0.05 to 2_im was provided on the surface of the metal foil. This is a substrate with a built-in capacitor manufactured using a material for a multilayer wiring board with a built-in capacitor. Variations in the capacitance of the manufactured capacitors were all less than ± 10%, and uniform and good capacitors could be manufactured.
また、 比較例は、 誘電体薄膜を金属層がパターニングされた基板の表面に形 成されたコンデンサ内蔵基板であるために、 膜厚のばらつきが大きく、 結果と してコンデンサ容量のばらつきも最大 5 4 %と大きかった。 前述したところがこの発明の好ましい実施態様であること、 多くの変更およ び修正をこの発明の精神と範囲にそむくことなくなく実行できることは当業者 にとつて了解されよう。 In the comparative example, a dielectric thin film was formed on the surface of the substrate on which the metal layer was patterned. Because of the built-in capacitor built-in substrate, the variation in film thickness was large, and as a result, the variation in capacitor capacitance was as large as 54% at the maximum. Those skilled in the art will appreciate that what has been described above is the preferred embodiment of the invention and that many changes and modifications can be made without departing from the spirit and scope of the invention.
Claims
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005503751A JP4192946B2 (en) | 2003-03-20 | 2004-03-19 | MATERIAL FOR MULTILAYER WIRING BOARD CONTAINING CAPACITOR, MULTILAYER WIRING BOARD SUBSTRATE, MULTILAYER WIRING BOARD AND METHOD FOR PRODUCING THE SAME |
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003-078324 | 2003-03-20 | ||
| JP2003078324 | 2003-03-20 | ||
| JP2003077695 | 2003-03-20 | ||
| JP2003-077695 | 2003-03-20 | ||
| JP2003-368857 | 2003-10-29 | ||
| JP2003368857 | 2003-10-29 | ||
| JP2003-376604 | 2003-11-06 | ||
| JP2003376604 | 2003-11-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2004084597A1 true WO2004084597A1 (en) | 2004-09-30 |
Family
ID=33033269
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2004/003729 Ceased WO2004084597A1 (en) | 2003-03-20 | 2004-03-19 | Material for multilayer printed circuit board with built-in capacitor, substrate for multilayer printed circuit board, multilayer printed circuit board and methods for producing those |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP4192946B2 (en) |
| TW (1) | TWI251536B (en) |
| WO (1) | WO2004084597A1 (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006210908A (en) * | 2004-12-28 | 2006-08-10 | Ngk Spark Plug Co Ltd | Wiring board and manufacturing method thereof |
| JP2006229214A (en) * | 2005-01-21 | 2006-08-31 | Ngk Spark Plug Co Ltd | Method for manufacturing wiring board |
| JP2007096226A (en) * | 2005-09-30 | 2007-04-12 | Fujitsu Ltd | Interposer and manufacturing method thereof |
| JP2007165854A (en) * | 2005-10-21 | 2007-06-28 | E I Du Pont De Nemours & Co | Barium titanate thin films with titanium partially substituted by zirconium, tin or hafnium |
| JP2011210983A (en) * | 2010-03-30 | 2011-10-20 | Jx Nippon Mining & Metals Corp | Copper foil for printed wiring board which forms circuit with superior electrical transmission characteristic, and layered body using the same |
| KR20150081155A (en) * | 2014-01-03 | 2015-07-13 | 삼성전기주식회사 | Package board, method of manufacturing the same and semiconductor package using the same |
| KR20150137829A (en) * | 2014-05-30 | 2015-12-09 | 삼성전기주식회사 | Package board and method for manufacturing the same |
| KR20210021234A (en) * | 2019-08-16 | 2021-02-25 | 주식회사 솔루에타 | High dielectric film and manufacturing method thereof |
| CN113611799A (en) * | 2020-09-24 | 2021-11-05 | 联芯集成电路制造(厦门)有限公司 | Metal-insulator-metal capacitor |
| WO2024161884A1 (en) * | 2023-01-31 | 2024-08-08 | 株式会社Adeka | Etching liquid composition, etching method and method for producing base material |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5232823B2 (en) * | 2010-03-30 | 2013-07-10 | Jx日鉱日石金属株式会社 | Copper foil for printed wiring board excellent in etching property and laminate using the same |
| WO2021033786A1 (en) * | 2019-08-16 | 2021-02-25 | 주식회사 솔루에타 | High-dielectric film and manufacturing method therefor |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11260148A (en) * | 1998-03-13 | 1999-09-24 | Hitachi Ltd | Thin film dielectric, multilayer wiring board using the same, and method of manufacturing the same |
| JP2003011270A (en) * | 2001-07-02 | 2003-01-15 | Jsr Corp | Dielectric layer with conductive foil, capacitor using the same, and method of forming the same |
| JP2003526880A (en) * | 2000-03-04 | 2003-09-09 | エナージーニアス,インコーポレイテッド | Composite with a dielectric thin film of lead zirconate titanate formed on metal foil |
| JP2004103615A (en) * | 2002-07-18 | 2004-04-02 | Hitachi Chem Co Ltd | Multilayer wiring board, semiconductor device, and radio electronic equipment |
-
2004
- 2004-03-17 TW TW93107141A patent/TWI251536B/en not_active IP Right Cessation
- 2004-03-19 JP JP2005503751A patent/JP4192946B2/en not_active Expired - Fee Related
- 2004-03-19 WO PCT/JP2004/003729 patent/WO2004084597A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11260148A (en) * | 1998-03-13 | 1999-09-24 | Hitachi Ltd | Thin film dielectric, multilayer wiring board using the same, and method of manufacturing the same |
| JP2003526880A (en) * | 2000-03-04 | 2003-09-09 | エナージーニアス,インコーポレイテッド | Composite with a dielectric thin film of lead zirconate titanate formed on metal foil |
| JP2003011270A (en) * | 2001-07-02 | 2003-01-15 | Jsr Corp | Dielectric layer with conductive foil, capacitor using the same, and method of forming the same |
| JP2004103615A (en) * | 2002-07-18 | 2004-04-02 | Hitachi Chem Co Ltd | Multilayer wiring board, semiconductor device, and radio electronic equipment |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006210908A (en) * | 2004-12-28 | 2006-08-10 | Ngk Spark Plug Co Ltd | Wiring board and manufacturing method thereof |
| JP2006229214A (en) * | 2005-01-21 | 2006-08-31 | Ngk Spark Plug Co Ltd | Method for manufacturing wiring board |
| JP2007096226A (en) * | 2005-09-30 | 2007-04-12 | Fujitsu Ltd | Interposer and manufacturing method thereof |
| JP2007165854A (en) * | 2005-10-21 | 2007-06-28 | E I Du Pont De Nemours & Co | Barium titanate thin films with titanium partially substituted by zirconium, tin or hafnium |
| JP2011210983A (en) * | 2010-03-30 | 2011-10-20 | Jx Nippon Mining & Metals Corp | Copper foil for printed wiring board which forms circuit with superior electrical transmission characteristic, and layered body using the same |
| KR102186146B1 (en) * | 2014-01-03 | 2020-12-03 | 삼성전기주식회사 | Package board, method of manufacturing the same and semiconductor package using the same |
| KR20150081155A (en) * | 2014-01-03 | 2015-07-13 | 삼성전기주식회사 | Package board, method of manufacturing the same and semiconductor package using the same |
| KR20150137829A (en) * | 2014-05-30 | 2015-12-09 | 삼성전기주식회사 | Package board and method for manufacturing the same |
| KR102254874B1 (en) * | 2014-05-30 | 2021-05-24 | 삼성전기주식회사 | Package board and method for manufacturing the same |
| KR20210021234A (en) * | 2019-08-16 | 2021-02-25 | 주식회사 솔루에타 | High dielectric film and manufacturing method thereof |
| KR102266563B1 (en) * | 2019-08-16 | 2021-06-21 | 주식회사 솔루에타 | High dielectric film and manufacturing method thereof |
| CN113611799A (en) * | 2020-09-24 | 2021-11-05 | 联芯集成电路制造(厦门)有限公司 | Metal-insulator-metal capacitor |
| WO2024161884A1 (en) * | 2023-01-31 | 2024-08-08 | 株式会社Adeka | Etching liquid composition, etching method and method for producing base material |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2004084597A1 (en) | 2006-06-29 |
| TWI251536B (en) | 2006-03-21 |
| JP4192946B2 (en) | 2008-12-10 |
| TW200424059A (en) | 2004-11-16 |
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