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WO2004059266A3 - Mesure de birefringence hors plan - Google Patents

Mesure de birefringence hors plan Download PDF

Info

Publication number
WO2004059266A3
WO2004059266A3 PCT/US2003/040366 US0340366W WO2004059266A3 WO 2004059266 A3 WO2004059266 A3 WO 2004059266A3 US 0340366 W US0340366 W US 0340366W WO 2004059266 A3 WO2004059266 A3 WO 2004059266A3
Authority
WO
WIPO (PCT)
Prior art keywords
plane birefringence
sample
beams
birefringence measurement
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2003/040366
Other languages
English (en)
Other versions
WO2004059266A2 (fr
Inventor
Baoliang Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hinds Instruments Inc
Original Assignee
Hinds Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/364,006 external-priority patent/US7016039B2/en
Application filed by Hinds Instruments Inc filed Critical Hinds Instruments Inc
Priority to CN2003801088823A priority Critical patent/CN1739007B/zh
Priority to AU2003299695A priority patent/AU2003299695A1/en
Priority to EP03799977A priority patent/EP1573287A4/fr
Priority to JP2005510008A priority patent/JP4657105B2/ja
Publication of WO2004059266A2 publication Critical patent/WO2004059266A2/fr
Publication of WO2004059266A3 publication Critical patent/WO2004059266A3/fr
Priority to US11/155,825 priority patent/US7312869B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

L'invention concerne une mesure précise de propriétés de biréfringence hors plan d'échantillons d'un matériau optique transparent. Deux faisceaux lumineux à angle distinct passent à travers un emplacement sélectionné d'un élément optique échantillon. L'un des faisceaux est incident à la surface de l'échantillon. Les caractéristiques des faisceaux sont détectées après leur passage à travers l'échantillon, et les informations détectées sont traitées pour déterminer la biréfringence hors plan.
PCT/US2003/040366 2002-12-20 2003-12-19 Mesure de birefringence hors plan Ceased WO2004059266A2 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN2003801088823A CN1739007B (zh) 2002-12-20 2003-12-19 测定透明样品的平面外双折射的方法和装置
AU2003299695A AU2003299695A1 (en) 2002-12-20 2003-12-19 Out-of-plane birefringence measurement
EP03799977A EP1573287A4 (fr) 2002-12-20 2003-12-19 Mesure de birefringence hors plan
JP2005510008A JP4657105B2 (ja) 2002-12-20 2003-12-19 面外複屈折の測定
US11/155,825 US7312869B2 (en) 2002-12-20 2005-06-16 Out-of-plane birefringence measurement

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US43558802P 2002-12-20 2002-12-20
US60/435,588 2002-12-20
US10/364,006 2003-02-10
US10/364,006 US7016039B2 (en) 2003-02-10 2003-02-10 Purging light beam paths in optical equipment
US49283803P 2003-08-06 2003-08-06
US60/492,838 2003-08-06

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/155,825 Continuation US7312869B2 (en) 2002-12-20 2005-06-16 Out-of-plane birefringence measurement

Publications (2)

Publication Number Publication Date
WO2004059266A2 WO2004059266A2 (fr) 2004-07-15
WO2004059266A3 true WO2004059266A3 (fr) 2004-10-21

Family

ID=32685986

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/040366 Ceased WO2004059266A2 (fr) 2002-12-20 2003-12-19 Mesure de birefringence hors plan

Country Status (6)

Country Link
EP (1) EP1573287A4 (fr)
JP (1) JP4657105B2 (fr)
KR (1) KR20050093790A (fr)
CN (1) CN1739007B (fr)
AU (1) AU2003299695A1 (fr)
WO (1) WO2004059266A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9375158B2 (en) 2007-07-31 2016-06-28 The General Hospital Corporation Systems and methods for providing beam scan patterns for high speed doppler optical frequency domain imaging

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101263432B (zh) * 2005-09-14 2011-07-27 卡尔蔡司Smt有限责任公司 微光刻曝光系统的光学系统
TWI331213B (en) 2005-11-29 2010-10-01 Horiba Ltd Sample analyzing method, sample analyzing apparatus,and recording medium
JP4317558B2 (ja) * 2006-08-23 2009-08-19 株式会社堀場製作所 試料解析方法、試料解析装置及びプログラム
US7746465B2 (en) 2007-01-18 2010-06-29 Hinds Instruments, Inc. Sample holder for an optical element
KR100911626B1 (ko) * 2007-07-13 2009-08-12 서강대학교산학협력단 바이오 센서 측정 장치
JP5140451B2 (ja) * 2008-02-05 2013-02-06 富士フイルム株式会社 複屈折測定方法及び装置並びにプログラム
JP2009229229A (ja) * 2008-03-21 2009-10-08 Fujifilm Corp 複屈折測定装置及び複屈折測定方法
WO2010005874A1 (fr) * 2008-07-08 2010-01-14 Hinds Instruments, Inc. Mesure de biréfringence à haut rendement
JP2012150107A (ja) * 2010-12-27 2012-08-09 Nippon Zeon Co Ltd 光学異方性膜の評価方法、光学異方性膜の光学特性の測定装置および光学異方性膜の製造方法
GB201308434D0 (en) * 2013-05-10 2013-06-19 Innovia Films Sarl Authentication apparatus and method
WO2014189967A2 (fr) * 2013-05-23 2014-11-27 Hinds Instruments, Inc. Systèmes d'imagerie de propriétés de polarisation

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956146A (en) * 1997-01-29 1999-09-21 Victor Company Of Japan, Ltd. Birefringence measuring apparatus for optical disc substrate

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3106818A1 (de) * 1981-02-24 1982-09-09 Basf Ag, 6700 Ludwigshafen Verfahren zur kontinuierlichen bestimmung mehrachsiger orientierungszustaende von verstreckten folien oder platten
JPH0623689B2 (ja) * 1988-12-12 1994-03-30 株式会社オーク製作所 複屈折測定方法
JPH0545278A (ja) * 1991-08-09 1993-02-23 Matsushita Electric Ind Co Ltd 複屈折測定装置
JPH08201277A (ja) * 1995-01-31 1996-08-09 New Oji Paper Co Ltd 複屈折測定方法及び装置
JPH10267831A (ja) * 1997-03-25 1998-10-09 Unie Opt:Kk 複屈折測定光学系および高空間分解能偏光解析装置
CA2319729A1 (fr) * 1998-02-20 1999-08-26 Hinds Instruments, Inc. Systeme de mesure de birefringence
US5864403A (en) * 1998-02-23 1999-01-26 National Research Council Of Canada Method and apparatus for measurement of absolute biaxial birefringence in monolayer and multilayer films, sheets and shapes
US6268914B1 (en) * 2000-01-14 2001-07-31 Hinds Instruments, Inc. Calibration Process For Birefringence Measurement System

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956146A (en) * 1997-01-29 1999-09-21 Victor Company Of Japan, Ltd. Birefringence measuring apparatus for optical disc substrate

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1573287A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9375158B2 (en) 2007-07-31 2016-06-28 The General Hospital Corporation Systems and methods for providing beam scan patterns for high speed doppler optical frequency domain imaging

Also Published As

Publication number Publication date
EP1573287A2 (fr) 2005-09-14
CN1739007B (zh) 2013-06-19
AU2003299695A1 (en) 2004-07-22
JP2006511823A (ja) 2006-04-06
JP4657105B2 (ja) 2011-03-23
WO2004059266A2 (fr) 2004-07-15
KR20050093790A (ko) 2005-09-23
CN1739007A (zh) 2006-02-22
AU2003299695A8 (en) 2004-07-22
EP1573287A4 (fr) 2009-11-11

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