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WO2003002997A1 - Nonuniform-density sample analyzing method, device, and system - Google Patents

Nonuniform-density sample analyzing method, device, and system Download PDF

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Publication number
WO2003002997A1
WO2003002997A1 PCT/JP2002/006013 JP0206013W WO03002997A1 WO 2003002997 A1 WO2003002997 A1 WO 2003002997A1 JP 0206013 W JP0206013 W JP 0206013W WO 03002997 A1 WO03002997 A1 WO 03002997A1
Authority
WO
WIPO (PCT)
Prior art keywords
nonuniform
ray scattering
density sample
plane
scattering curve
Prior art date
Application number
PCT/JP2002/006013
Other languages
English (en)
French (fr)
Inventor
Kazuhiko Omote
Original Assignee
Rigaku Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Corporation filed Critical Rigaku Corporation
Priority to DE60230631T priority Critical patent/DE60230631D1/de
Priority to EP02738736A priority patent/EP1413878B1/en
Priority to KR10-2003-7015865A priority patent/KR20040020915A/ko
Priority to US10/482,022 priority patent/US7116755B2/en
Publication of WO2003002997A1 publication Critical patent/WO2003002997A1/ja

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Definitions

  • 3 ⁇ 4 3 ⁇ 4 ⁇ ⁇ ⁇ ⁇ 4 ⁇ mm is mx ⁇ ⁇ ⁇ - ⁇ ⁇ ⁇ 3 ⁇ 4 ⁇ ⁇ ⁇ ⁇ 3 ⁇ 4 3 ⁇ 4 , f ) (o L s ⁇ ⁇ .) Oshio ⁇ 3 ⁇ 4 ⁇ — ⁇ -

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Cosmetics (AREA)

Description

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Claims

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y ^ - ^ m ^ ^ ^ o ^ ^ · ε
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Cl090/Z0df/X3d .66100/fO ΟΛ\ 8ΐ
m ^ ^ m χ W: m co η η - ± m 、 ι こ ¾
° g ^ ½ ¾ ^ ¾ — ε Ml * W r w ^ — 《\/ 、 ベ ^ 乙 鞣 阖 is 磲 -
° m ^ n n
^ 厘 呦 士 ?! ^ ^ ー ^ 鄆 ^) & ー ゝ t 、 y ^ 乙 ^ : つ ー
m m ' - ? n w is ^ ^ H 一
Ί 5 <« 、 : ^ ベ CD m m
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- f -I m m ^ a) hd - ± ^ ¾ ? ^ -^- ? ϋ ¾: < y ^ co ^ ^ ^ - ^ ^ m m ^ 獏 鹩 X iii 棄 ? 鹩 ¾ 鹩 X — /! て ミ 、 っ ^
^ べ ^ ^ ? c マ 鹩 W ¾ 蓰 鹩 X i 葦 : 鹩 ¾ 鹆 鹩 Χ - Λ ^
¾ «5 ¾ π Μ ^ ¾ ^ - ^ ^ .\/ ^ 乙
、 ? ¾ ^! - て 莨 獏 鹩 X
^ - /1 ^ 5 < i ¾ I 111 ? ¾ ¾ fil? (2) H W IS 嗨 鹩 X ίϊ; ^ fi ニ1 :? S ¾ ¾ 凝 阖 ¾ 镍 <5
fT090/Z0df/13d .66Ζ00/Γ0 OAV 6T
° Ύ ^ ^ Μ η η - ± ^
½ 回 べ 一 ^ べ 回 べ 一 ^ べ
CT090/Z0df/X3d .66Z00/C0 OAV
PCT/JP2002/006013 2001-06-27 2002-06-17 Nonuniform-density sample analyzing method, device, and system WO2003002997A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE60230631T DE60230631D1 (de) 2001-06-27 2002-06-17 Verfahren, vorrichtung und system zur analyse einer probe mit ungleichmässiger dichte
EP02738736A EP1413878B1 (en) 2001-06-27 2002-06-17 Nonuniform-density sample analyzing method, device,and system
KR10-2003-7015865A KR20040020915A (ko) 2001-06-27 2002-06-17 밀도불균일 시료 해석방법, 그 장치 및 시스템
US10/482,022 US7116755B2 (en) 2001-06-27 2002-06-17 Non-uniform density sample analyzing method, device and system

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JP2001-195112 2001-06-27
JP2001195112A JP3953754B2 (ja) 2001-06-27 2001-06-27 密度不均一試料解析方法ならびにその装置およびシステム

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JP4224376B2 (ja) 2003-10-20 2009-02-12 株式会社リガク 膜構造解析方法およびその装置
JP3927960B2 (ja) * 2004-03-04 2007-06-13 株式会社リガク 空孔率の測定方法及び装置並びに粒子率の測定方法及び装置
FR2904421B1 (fr) * 2006-07-28 2008-10-31 Areva Np Sas Procede de caracterisation non destructif, notammenent pour les particules de combustible nucleaire pour reacteur a haute temperature
US7848483B2 (en) * 2008-03-07 2010-12-07 Rigaku Innovative Technologies Magnesium silicide-based multilayer x-ray fluorescence analyzers
FI20095843A7 (fi) * 2009-08-14 2011-02-15 Con Boys Oy Menetelmä ja järjestelmä epäjärjestäytyneestä materiaalista sirontamittauksilla mitatun aineiston analysoimiseksi
JP5658219B2 (ja) * 2012-11-21 2015-01-21 住友ゴム工業株式会社 高分子材料のエネルギーロス、耐チッピング性能及び耐摩耗性能を評価する方法
JP7221536B2 (ja) * 2019-12-27 2023-02-14 株式会社リガク 散乱測定解析方法、散乱測定解析装置、及び散乱測定解析プログラム
CN112630611B (zh) * 2020-12-14 2022-04-22 华南理工大学 一种超声纵波反射法检测盆式绝缘子均匀性的试验方法

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JP3953754B2 (ja) 2007-08-08
US20040195498A1 (en) 2004-10-07
TW562922B (en) 2003-11-21
JP2003014663A (ja) 2003-01-15
DE60230631D1 (de) 2009-02-12
EP1413878B1 (en) 2008-12-31
KR20040020915A (ko) 2004-03-09
CN1293382C (zh) 2007-01-03
CN1520513A (zh) 2004-08-11
EP1413878A4 (en) 2007-12-05
US7116755B2 (en) 2006-10-03

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