[go: up one dir, main page]

WO2003090281A3 - Membranes en silicium monocristallin pour applications microelectromecaniques - Google Patents

Membranes en silicium monocristallin pour applications microelectromecaniques Download PDF

Info

Publication number
WO2003090281A3
WO2003090281A3 PCT/US2003/011720 US0311720W WO03090281A3 WO 2003090281 A3 WO2003090281 A3 WO 2003090281A3 US 0311720 W US0311720 W US 0311720W WO 03090281 A3 WO03090281 A3 WO 03090281A3
Authority
WO
WIPO (PCT)
Prior art keywords
single crystal
substrate
crystal silicon
membrane layer
silicon membranes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2003/011720
Other languages
English (en)
Other versions
WO2003090281A2 (fr
Inventor
Kevin S Jones
Mark E Law
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Florida
Original Assignee
University of Florida
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Florida filed Critical University of Florida
Priority to AU2003221959A priority Critical patent/AU2003221959A1/en
Publication of WO2003090281A2 publication Critical patent/WO2003090281A2/fr
Publication of WO2003090281A3 publication Critical patent/WO2003090281A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00134Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
    • B81C1/00158Diaphragms, membranes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00Specific applications of microelectromechanical systems
    • B81B2201/02Sensors
    • B81B2201/0257Microphones or microspeakers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2203/00Basic microelectromechanical structures
    • B81B2203/03Static structures
    • B81B2203/0315Cavities
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2201/00Manufacture or treatment of microstructural devices or systems
    • B81C2201/01Manufacture or treatment of microstructural devices or systems in or on a substrate
    • B81C2201/0101Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
    • B81C2201/0111Bulk micromachining
    • B81C2201/0116Thermal treatment for structural rearrangement of substrate atoms, e.g. for making buried cavities

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Micromachines (AREA)
  • Pressure Sensors (AREA)

Abstract

L'invention concerne un procédé de formation de dispositifs MEMS et des systèmes associés, le procédé consistant à fournir un substrat monocristallin, à attaquer un substrat de manière à y former plusieurs orifices et à recuire le substrat dans une ambiance réductrice à une température équivalant à son point de fusion. Les orifices coalescent dans au moins une couche de la cavité et forment au moins une couche de membrane monocristalline. La couche de membrane confère une densité de dislocation d'au plus 106 dislocations/cm2. Au moins une structure MEMS comprenant au moins une partie mobile est formée sur la couche de membrane. Des dispositifs microélectroniques peuvent également être formés sur le substrat monocristallin. Ledit procédé peut également être utilisé pour la formation de dispositifs MEMS possédant des couches de membrane superposées.
PCT/US2003/011720 2002-04-15 2003-04-15 Membranes en silicium monocristallin pour applications microelectromecaniques Ceased WO2003090281A2 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003221959A AU2003221959A1 (en) 2002-04-15 2003-04-15 Single crystal silicon membranes for microelectromechanical applications

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US37265102P 2002-04-15 2002-04-15
US60/372,651 2002-04-15

Publications (2)

Publication Number Publication Date
WO2003090281A2 WO2003090281A2 (fr) 2003-10-30
WO2003090281A3 true WO2003090281A3 (fr) 2004-01-08

Family

ID=29250887

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/011720 Ceased WO2003090281A2 (fr) 2002-04-15 2003-04-15 Membranes en silicium monocristallin pour applications microelectromecaniques

Country Status (2)

Country Link
AU (1) AU2003221959A1 (fr)
WO (1) WO2003090281A2 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100722686B1 (ko) 2006-05-09 2007-05-30 주식회사 비에스이 부가적인 백 챔버를 갖고 기판에 음향홀이 형성된 실리콘콘덴서 마이크로폰
KR100722687B1 (ko) 2006-05-09 2007-05-30 주식회사 비에스이 부가적인 백 챔버를 갖는 지향성 실리콘 콘덴서 마이크로폰
CN103935953B (zh) 2014-04-25 2016-04-13 上海先进半导体制造股份有限公司 复合腔体及其形成方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5672449A (en) * 1994-08-16 1997-09-30 Ims Ionen Mikrofabrikations Systeme Gmbh Silicon membrane and method of making same
US5963788A (en) * 1995-09-06 1999-10-05 Sandia Corporation Method for integrating microelectromechanical devices with electronic circuitry
US6128961A (en) * 1995-12-24 2000-10-10 Haronian; Dan Micro-electro-mechanics systems (MEMS)
US6355498B1 (en) * 2000-08-11 2002-03-12 Agere Systems Guartian Corp. Thin film resonators fabricated on membranes created by front side releasing

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5672449A (en) * 1994-08-16 1997-09-30 Ims Ionen Mikrofabrikations Systeme Gmbh Silicon membrane and method of making same
US5963788A (en) * 1995-09-06 1999-10-05 Sandia Corporation Method for integrating microelectromechanical devices with electronic circuitry
US6128961A (en) * 1995-12-24 2000-10-10 Haronian; Dan Micro-electro-mechanics systems (MEMS)
US6355498B1 (en) * 2000-08-11 2002-03-12 Agere Systems Guartian Corp. Thin film resonators fabricated on membranes created by front side releasing

Also Published As

Publication number Publication date
AU2003221959A1 (en) 2003-11-03
WO2003090281A2 (fr) 2003-10-30

Similar Documents

Publication Publication Date Title
KR100369324B1 (ko) 평면형 마이크로 공동구조 제조 방법
US7309620B2 (en) Use of sacrificial layers in the manufacture of high performance systems on tailored substrates
US8367451B2 (en) Method and structures for fabricating MEMS devices on compliant layers
US7615788B2 (en) Method for monolithically integrating silicon carbide microelectromechanical devices with electronic circuitry
US20020020053A1 (en) Deposited thin films and their use in separation and sacrificial layer applications
EP0955668A3 (fr) Procédé de fabrication de composants microélectromécaniques à haute isolation
CA2406214A1 (fr) Films minces deposes et leur utilisation dans des applications de couches sacrificielles et de separation
WO2003002450A3 (fr) Technique de couche sacrificielle servant a pratiquer des creux dans des structures micro-electromecaniques
GR1004040B (el) Μεθοδος για την κατασκευη αιωρουμενων μεμβρανων πορωδους πυριτιου και εφαρμογης της σε αισθητηρες αεριων
WO2000016041A3 (fr) Formation de barreaux suspendus au moyen de substrats soi et application a la fabrication d'un gyrometre vibrant
WO2002095800A3 (fr) Procede de fabrication d'un appareil micromecanique par retrait d'une couche sacrificielle dotee de multiples agents de gravure sequentiels
WO2003044833A3 (fr) Procede de limitation de formation d'evidement dans des processus d'isolation par tranchee peu profonde
WO2005077012A3 (fr) Dispositifs cmut et procedes de fabrication
WO2002057180A3 (fr) Procede soi/verre de formation de structures minces de silicium micro-usinees
EP1794789B1 (fr) Structures destinees a des applications de microelectronique et de microsystemes et procede de fabrication associe
AU2003247130A1 (en) Method of transferring of a layer of strained semiconductor material
WO2005001904A3 (fr) Procede de formation d'une couche flottante de semi-conducteur
US8030133B2 (en) Method of fabricating a bonded wafer substrate for use in MEMS structures
WO2007015951A3 (fr) Structures semi-conductrices formees sur des substrats, et procedes pour les realiser
FI20011922A0 (fi) Menetelmä ontelorakenteen muodostamiseksi SOI-kiekolle sekä SOI-kiekko ontelorakenne
US6022754A (en) Electronic device and method for forming a membrane for an electronic device
Li et al. Germanium as a versatile material for low-temperature micromachining
Du et al. Single crystal silicon MEMS fabrication based on smart-cut technique
JP2006509229A (ja) ディスプレイの製造方法
WO2003090281A3 (fr) Membranes en silicium monocristallin pour applications microelectromecaniques

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ OM PH PL PT RO RU SC SD SE SG SK SL TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
122 Ep: pct application non-entry in european phase
NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP