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WO2003052398A1 - Procede et dispositif pour l'etalonnage - Google Patents

Procede et dispositif pour l'etalonnage Download PDF

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Publication number
WO2003052398A1
WO2003052398A1 PCT/NZ2002/000283 NZ0200283W WO03052398A1 WO 2003052398 A1 WO2003052398 A1 WO 2003052398A1 NZ 0200283 W NZ0200283 W NZ 0200283W WO 03052398 A1 WO03052398 A1 WO 03052398A1
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WIPO (PCT)
Prior art keywords
attenuation
reference material
measurement
energy output
penetrative
Prior art date
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Ceased
Application number
PCT/NZ2002/000283
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English (en)
Inventor
Geordie Robert Burling-Claridge
Geoffrey John Keith Mercer
Philip Edward Petch
Serguei Timofeevich Zavtrak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
New Zealand Institute for Bioeconomy Science Ltd
Original Assignee
AgResearch Ltd
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Filing date
Publication date
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Priority to AU2002359097A priority Critical patent/AU2002359097A1/en
Publication of WO2003052398A1 publication Critical patent/WO2003052398A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Definitions

  • the present invention relates generally to a method of non-destructive analysis and apparatus pertaining thereto, and in particular to a means of improving the accuracy and calibration of X-ray analysis machines.
  • X-ray analysis has become a prime investigative and measuring tool for use in a variety of industries and applications, including industrial process quality control, industrial inspection systems such as airport baggage scanners and medical systems such as bone densitometers.
  • industrial process quality control industrial inspection systems
  • industrial inspection systems such as airport baggage scanners
  • medical systems such as bone densitometers.
  • dual energy detectors found in Dual energy X-ray Absorptiometry (DXA) machines are employed in systems seeking to distinguish between sample materials containing multiple constituents.
  • DXA Dual energy X-ray Absorptiometry
  • Composition information of a sample material may be determined by measurement of x-ray energy attenuated by a sample material in two distinct energy bands.
  • Photoelectric absorption and Compton scattering are the two mechanisms generally responsible for the absorption of x-rays. Moreover, the degree of absorption by each of these mechanisms is a function of x-ray energy and differs among materials of different atomic numbers. Consequently, measurements at two distinct energies can be used to distinguish between two different constituent sample materials. DXA techniques can, for example, be used to distinguish bones from soft tissue in medical imaging, to identify hazardous materials in baggage scanning or to calculate the Chemical Lean (CL) ratio of fat to meat for meat produce processed by meat works and the like.
  • CL Chemical Lean
  • the voltage on the x-ray tube is periodically changed from a high to low voltage, thus shifting the energy spectrum of the resultant x-ray beam. This enables measurements of the imaged sample material at the different energy outputs to be obtained from a single set of solid state detectors illuminated by the x-ray beam.
  • An alternative involves the use of a broad spectrum x-ray beam produced with multiple output energies, and relies on the detectors to discriminate between x-ray energies whereby separate detectors output separate signals for high and low x-ray energies received.
  • the various types of detectors used include those with two detector elements stacked on top of each other, i.e., a 'stacked array' and 'side-by-side' detectors which, as implied by the name, involves two rows of detectors placed 'side-by-side', each row having a different energy sensitivity, corresponding to the high and low energy values.
  • the accuracy of the results is wholly dependent on the accurate calibration of the DXA machine itself and on maintenance of that calibration.
  • x-rays analysis devices capable of emitting an x-ray beam and measuring the absorption or attenuation of that beam by a sample material are predominately stable.
  • attempts to use such devices to perform low tolerance measurements can be affected by transient changes in the x-ray environment. These transient changes, which can affect the device's x-rays emission and/or detection, may have duration of up to several seconds.
  • Such changes to the x-ray environment might include:
  • Temperature changes to critical components for example, warming of the x-ray detector module, whose performance is temperature dependant;
  • MRI magnetic resonance imaging
  • CT computed tomography
  • ultrasound ultrasound
  • manufactured meat represents the most significant portion of beef sold. Such meat is packed and shipped from a meat plant in a plurality of plastic bags located within large cardboard boxes.
  • a method of providing enhanced calibration of a sample material analysis device capable of emitting a penetrative energy output detectable by one or more detectors, said device including reference material with a known attenuation response to said penetrative energy,
  • sample material is passed through said penetrative energy output and a corresponding first attenuation measurement indicative of said sample material composition is measured by one or more detectors
  • a penetrative energy beam sample material analysis device capable of performing the above-described method.
  • the accuracy of composition measurement performed is improved by correcting the initial attenuation measurement of the sample material from the effects of offset errors, i.e. the erroneous signal or 'correction factor' measured by the detectors umelated to the incident penetrative energy beam.
  • offset errors i.e. the erroneous signal or 'correction factor' measured by the detectors umelated to the incident penetrative energy beam.
  • the above method is pertinent to measurement systems where offset is the predominant measurement error factor and the effects of gain error (i.e. the correlation variations in the detector output according changes in the penetrative energy beam incident on the detectors) are negligible.
  • said correction factor may be positive or negative and may vary with respect to time.
  • the term 'attenuation response' of a material denotes the variation in attenuation of an penetrative energy beam incident on the material as a function of a given parameter of the energy beam such as (but not limited to) input energy, wavelength, voltage, amplitude, and so forth.
  • the term 'reference material portion' refers to that portion of the refernce material impinged by said penetrative energy beam during the respective attenuation measurements and includes the case where all the reference material is thus impinged.
  • said reference material may be formed from one or more reference material portions.
  • reference material portions may be formed with different attenuation responses by varying the portion's constituent materials, thicknesses or both. This variation may be achieved by physically separate portions and or by presenting different aspects of an asymmetrical and/or non-homogenous potion to the penetrative energy beam.
  • the term 'penetrative energy output' includes any radiation or emission capable of at least partial penetration of, transmission through, and/or absorption by the sample material without direct physical contact between the sample material and the material analysis device. Any appropriate energy mechanism or medium may be used including any electromagnetic, sonic, nuclear and/or radioactive transmission or emission.
  • sample material' indicates any material whose composition is sought, typically being a material with an irregular surface and which may be of a variable consistency and of non-uniform size.
  • the sample material would typically be composed of two or more constituents of differing molecular characteristics. Dependent on the particular application, the nature of the constituent material information to be ascertained may differ. In the case of airport baggage scanners, the items of interest may be explosives that may appear as contaminates concealed within other materials. In the determination of meat Chemical Lean (CL) the sample material would be a combination of lean meat and fat, the accurate determination of which is the information sought.
  • CL Chemical Lean
  • said analysis device includes an x-ray source capable of outputting penetrative energy in the form of an x-ray beam.
  • the invention is not necessarily limited to x-rays and associated apparatus, but is equally applicable for use with other non-destructive/non-invasive material analysis methods including, but not limited to ultrasonic scans, MRI, CT and the like.
  • the reference material is formed from one or more constituent materials that in combination simulate the attenuation properties of said sample material to the penetrative energy beam.
  • said first attenuation response of said first reference material portion is selected to closely match that of the sample material.
  • the variation the reference material x-ray attenuation as a function of incident x- ray energy has a relationship substantially similar to that of the sample material, or to constituents of interest within said sample material.
  • said reference material x-ray attenuation response is scaled to be substantially congruent with that of said sample material.
  • said scaling is provided by appropriate variation in the quantity of reference material matter.
  • the or each said reference material portion is introduced into the x-ray beam immediately before and/or after passing the sample material through said x-ray beam.
  • the or each reference material portion is moved linearly into and out ofthe penetrative energy output.
  • the indicative composition measurement of the sample material may be further enhanced by recording an x-ray attenuation measurement ofthe unimpeded x-ray beam.
  • said sample material analysis device is a Dual energy X-ray Absorptiometry (DXA) device.
  • DXA Dual energy X-ray Absorptiometry
  • said detectors include detectors configured with optimum sensitivity for low energy attenuation measurements and detectors with optimum sensitivity for high-energy attenuation measurements.
  • the low and high energy attenuation measurements are typically performed in energy bands of approximately 50-80 KeV and 90 — 140 KeV respectively.
  • the underpinning principle behind the use of two separate energy level measurement is to ensure the utilization of the Photoelectric effect and Compton scattering mechanisms to permit composition analysis in known manner.
  • the analysis device is configured such that by being introduced into said penetrating energy output the or each said reference material portion is interposed between the penetrating energy output source and each detector.
  • a said first attenuation measurement is recorded for each individual detector.
  • a said first correction factor is applied to each individual first attenuation measurement of each detector.
  • the penetrative energy output beam path, detector settings and penetrative energy output emission settings of the penetrative energy output material analysis system should be identical for both the reference material and sample material attenuation measurements.
  • the or each reference material portion is moved into, and out of, the penetrative energy beam output path, whilst the remainder of the material analysis device remains static. Reducing the moving parts by this mechanical configuration minimizes the number of the error inducing system variations associated with moving componentry.
  • said penetrative energy output and the or each detector may remain operational during and between successive analysis of different sample materials.
  • the above measurement method may be yield insufficient accuracy.
  • a two-step correction utilizing at least two reference material portions of different attenuation responses is required to take account ofthe two unknowns present
  • said method is characterized by the further steps of:
  • said first and second reference material portions are configured to be physically distinct with differing attenuation responses.
  • said first and second reference material portions are physically connected and are defined by moving different regions and/or orientations of the reference material into the penetrative energy output.
  • said reference material is formed from regions of different thickness and/or composition.
  • said first reference material portion produces a total attenuation of said penetrative energy output of a factor of at least 2 less than said second reference material potion.
  • said first and second attenuation responses of said first and second reference material portions respectively are chosen to bracket the range of attenuation measurement variation likely due to variations in sample material thickness and composition.
  • first and second reference material portions need not be formed from the same constituents, it is desirable, though not essential for both the first and second attenuation response are substantially matched to the anticipated attenuation characteristics of the sample material in the operational attenuation regions ofthe reference material portions.
  • said method is characterized by the further steps of:
  • both the gain and offset can drift with time, these can be corrected in a DXA material analysis system (for example) by using at least two reference material portions of differing attenuation response to provide two set of values for equation 1 above. Solution of these two simultaneous equations can be used to yield the corrective gain and offset values to apply to the said first attenuation measurement obtained from the sample material.
  • Al is said known first attenuation response corresponding to said first reference material portion
  • Bl is said second attenuation measurement for the first reference material portion
  • B2 is said third attenuation measurement for the second reference material portion are related by simultaneous equations 2 and 3;
  • the detector measurement error is largely quantum and thus related to the square root of the photon count received by the detectors. Therefore, the smaller the received signal by the detectors, the larger the error.
  • a relatively rapid increase in the magnitude of said first correction factor applied to said first attenuation measurement could indicate the impending failure if the x-ray source for example.
  • a historical record of each said first correction factor applied to said first attenuation measurement is recorded to provide a preventative maintenance database.
  • Figure 1 Shows a perspective view in partial section of a preferred embodiment of the present invention of a DXA analysis device and housing;
  • Figure 2 Shows a side elevation ofthe DXA analysis device shown in figure 1;
  • Figure 3 Shows a plan view ofthe DXA analysis device shown in figure 1 ;
  • Figure 4 Shows a perspective view ofthe DXA analysis device shown in figure 1 ;
  • Figure 5 Shows an exploded perspective view of the components of the DXA analysis device shown in figure 4.
  • Figure 6 Shows a plan view in section ofthe DXA analysis device shown in figure 1 with the reference tile in the x-ray beam;
  • Figure 7 Shows a plan view in section ofthe DXA analysis device shown in figure 1 with the reference tile out of the x-ray beam, and
  • Figure 8 a-f Shows different configurations of reference tile in accordance further embodiments ofthe present invention.
  • the figures illustrate one embodiment of the present invention of a penetrative energy beam analysis device in the form of a Dual Energy X-ray Absorptiometry (DXA) device (1).
  • DXA Dual Energy X-ray Absorptiometry
  • the embodiment illustrated relates to the analysis of meat to establish the Chemical Lean (CL) of manufactured meat.
  • Figure 1-7 illustrates a DXA (1) device (shown in figures 2-7 without a shroud or other distracting encumbrance) consisting, in essence, of an x-ray generator (2) and a plurality of detectors (3).
  • the x-ray generator (2) produces a fan-shaped x-ray beam (4), emitted in a plane orthogonal to the direction of movement (represented by the direction of arrow A) of a conveyor belt (5) transporting sample material in the form of meat boxes (6) through the x-ray beam (4).
  • the x-ray generator (2) componentry includes an enlarged substantially cuboid base unit (7), with a substantially planar inverted triangular x-ray beam guide (8) extending transversely from the upper surface.
  • the fan shaped x-ray beam (4) is emitted from, and co-planar with, the top ofthe x-ray guide (8), extending vertically until intersecting the detectors (3).
  • detector (3) which may be used is a stacked array detector (3) in which two detector elements are stacked on top of each other. Typically, a forward detector will measure total x-ray flux and a rearward detector will measure only higher energy x-ray photons not stopped by an intervening filter. Low energy photons may be deduced from these two measurements.
  • Alternative detectors (3) include side-by-side detector construction, whereby two rows of detector elements (3) are placed side-by-side and scanned along the imaged sample material (6) in a direction perpendicular to the rows.
  • the detector (3) elements of the first row has a different energy sensitivity from that of the second row. Scanning the sample material (6) causes the two rows to pass over the same areas of the imaged object, each making measurements.
  • Figure 1 is partially sectioned to show the DXA device (1) located within a housing (9) configured to pass the sample materials to be analyzed (i.e. meat boxes (6)) along a conveyor belt (5), which runs orthogonally (vertically and horizontally) through the x-ray beam (4).
  • the housing (9) is apertured to accept the passage of the meat boxes (6), and contains appropriate radiation shielding.
  • the reference material is in the form of a first reference tile (10) composed of an elongated aluminum u-shaped channel (11), into which is inserted an elongated rectangular cross- sectioned polythene bar (12).
  • the reference tile assembly (11, 12) is moveably located within an actuator assembly (13), in which dual solenoids (14) are attached to the actuator framework (15) and to each end ofthe first reference tile (10). Application of the appropriate drive signals to the solenoids (14) moves the first reference tile (10) laterally into or out of alignment with the x-ray beam (4).
  • Figure 5 shows an exploded view ofthe DXA (1) components shown in figure 4, showing the reference tile (10) and actuator assembly (13) constituents in more detail.
  • Figures 6 and 7 show a plan view ofthe DXA (1) device viewed from below the detectors (3) looking downwards to the actuator assembly (13) and x-ray generator (2).
  • the first reference tile (10) is shown in figure 6 located directly in the x-ray beam (4), whilst in figure 7, the solenoids (14) have moved the reference tile (10) within the actuator assembly (13) to a position outside the x-ray beam (4).
  • the solenoids (14) may rapidly cycle the first reference tile (10) into and out of the x-ray beam (4) immediately before, immediately after, or before and after a sample meat box (6) moving along the conveyor (5) passes through the x-ray beam (4).
  • a measurement of the detector (3) response to the unimpeded x-ray beam is taken, i.e., an 'empty field' measurement for use in calibration calculations as detailed below.
  • the meat box (6) is passed through the x-ray beam (4) and a corresponding first attenuation measurement is measured by the detectors (3) and recorded.
  • the first reference tile (10) is then moved into said penetrative energy output, i.e. the x-ray beam (4) immediately after the meat box (6) has cleared the x-ray beam (4) and a corresponding second attenuation measurement is made by said detectors (3) and recorded.
  • the reference tile (10) may be moved into the x-ray beam (4) immediately before, or before and after the meat box (6) has cleared the x-ray beam (4), with corresponding second attenuation measurements being taken in each instance.
  • the second attenuation measurement is then compared to the known attenuation response of the first reference tile (10) and a first correction factor is calculated based on from any difference.
  • a first correction factor is calculated based on from any difference.
  • the present invention is directed to the removal of the effects of such a unspecified event.
  • m s the mass of sample material (6) in the beam path.
  • K s The actual intensity ratio before the event is denoted by K s and the intensity ratio being currently measured (i.e. during the event) for some target sample (6), measured after the event is denoted by Q s .
  • ⁇ R is the current effective attenuation coefficient for the Reference Tile.
  • This relationship can readily be generalised to multiple detector (3) cases e.g. dual or multiple energy detection systems.
  • the above attenuation correction calculation are repeated for different energy regions as required, corresponding to the points of maximum (3) detector sensitivity for the detector configuration ofthe particular system being considered.
  • this technique could account for quite large changes in the x-ray environment, but in practice the reference tile is chosen to match the attenuation curve of a particular sample material (6). Individual sample material (6) may differ to each other and, to a lesser or greater extent, to the sample material attenuation curve.
  • the ability to use the first reference tile (10) to account for x-ray environment changes is limited by the degree to which the reference tile (10) attenuation curve matches those ofthe individual sample material (6).
  • the range of different reference tiles (10) is chosen to provide an incremental range of different attenuation curves, from which the appropriate reference tile (10) is chosen to match the attenuation response characteristics ofthe sample material (10) being analysed.
  • the calibration errors affecting the accuracy of the sample material analysis device manifest themselves as two main effects, namely gain and offset errors.
  • a second reference tile (110) with a differing attenuation, response to the first reference tile (10) is used to obtain a second set of measurement data, a set of two simultaneous equation 1 is generated and may be solved in known manner to give the offset and gain error.
  • This method is an extension of the above described method used for a single reference tile (10) and consists ofthe further steps of;
  • Al is said known first attenuation response corresponding to said first reference tile (10).
  • Bl is said second attenuation measurement for the first reference tile (10)
  • B2 is said third attenuation measurement for the second reference tile (110)
  • the second reference tile (110) may be introduced into the x ray beam (4) by a second actuator mechanism (not shown) substantially identical to the actuator assembly/solenoids (13, 14) used with the first reference tile (10).
  • Alternative actuator mechanisms are of course possible and as such fall within the scope of the invention.
  • the reference tiles (10, 110) have been referred to as physically distinct entities. It should be appreciated however that this need not necessarily be the case.
  • the reference tiles may be considered as reference material portions whose key properties is their attenuation response, and in particular that the attenuation responses differ from each other.
  • Figure 8a shows a schematic representation where the first and second reference tiles (10, 110) are physically separate objects.
  • the individual tiles are inserted into the x-ray beam (4) immediately before or after, or before and after the attenuation measurement of the sample material (e.g a meat box (6)) to perform the above-described calibration correction.
  • sample material e.g a meat box (6)
  • the first and second reference tiles (10, 110) are formed as single physical entity, with different attenuation responses according to the particular portion and/or orientation ofthe reference material inserted into the x-ray beam (4).
  • Figure 8b shows a stepped reference tile whereby two different attenuation responses are obtained by laterally moving the reference material in direction X to place the different thicknesses of the first and second reference tile portions (10, 110) into the x-ray beam (4).
  • the whole reference tile (10,110) may be formed from the same constituents in this embodiment.
  • Figure 8c shows a similar configuration to figure 8 b, with the exception that the two reference tile portions (10, 110) are of the same thickness, but formed from different constituents.
  • Figure 8d shows a further alternative whereby both the fist and second reference tiles (10, 110) are physically distinct, though each with a stepped portion.
  • both the fist and second reference tiles (10, 110) are physically distinct, though each with a stepped portion.
  • effectively four reference tile portions with different possible attenuation responses are available. This may be beneficial for circumstances where the variation of thickness and/or constituents in the sample materials is significant.
  • Figure 8e shows a multi-stepped reference tile with three different thicknesses, effectively providing three different reference tile portions (10, 110, 1110).
  • Figure 8f shows an alternative means of moving the reference tiles (10, 110) into the x-ray beam (4). Instead of moving a stepped tiles laterally (as described above), the combined reference tile portions (10, 110) are rotated in direction Y to place the different thicknesses of the respective first and second reference tile portions (10, 110) into the x-ray beam (4).
  • a reference tile is brought into the x-ray beam at the same time as the sample is being measured.
  • a reference material is on a different optical path to that ofthe target material.
  • the present invention addresses all these deficiencies.

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  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

L'invention concerne l'étalonnage d'un dispositif d'analyse de matériau échantillon (1), qui fournit une sortie d'énergie de pénétration (4) susceptible d'être détectée par un ou plusieurs détecteurs (3). Pour l'étalonnage, on introduit au moins un premier matériau de référence ayant une première réponse d'affaiblissement dans la sortie d'énergie de pénétration (4) et on enregistre une mesure d'affaiblissement correspondante, laquelle est comparée avec la première réponse d'affaiblissement. Tout écart déterminé tient lieu de premier facteur de corrélation qui est ensuite appliqué à une mesure d'affaiblissement représentative de la composition d'un matériau échantillon (6) mesuré par le ou les détecteurs. On parvient ainsi à améliorer la précision de la mesure de la composition du matériau échantillon.
PCT/NZ2002/000283 2001-12-19 2002-12-19 Procede et dispositif pour l'etalonnage Ceased WO2003052398A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002359097A AU2002359097A1 (en) 2001-12-19 2002-12-19 Calibration method and apparatus

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NZ516281 2001-12-19
NZ51628101 2001-12-19

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WO2003052398A1 true WO2003052398A1 (fr) 2003-06-26

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US8009800B2 (en) 2006-10-02 2011-08-30 Optosecurity Inc. Tray for assessing the threat status of an article at a security check point
US8014493B2 (en) 2007-10-01 2011-09-06 Optosecurity Inc. Method and devices for assessing the threat status of an article at a security check point
US8116428B2 (en) 2006-09-18 2012-02-14 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
DE102012215991A1 (de) * 2012-09-10 2014-03-13 Siemens Aktiengesellschaft Überprüfung der Bildqualität von mittels eines Aufnahmesystems durchgeführten Aufnahmen
US8831331B2 (en) 2009-02-10 2014-09-09 Optosecurity Inc. Method and system for performing X-ray inspection of a product at a security checkpoint using simulation
US8867816B2 (en) 2008-09-05 2014-10-21 Optosecurity Inc. Method and system for performing X-ray inspection of a liquid product at a security checkpoint
US8879791B2 (en) 2009-07-31 2014-11-04 Optosecurity Inc. Method, apparatus and system for determining if a piece of luggage contains a liquid product
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WO2021128999A1 (fr) * 2019-12-24 2021-07-01 清华大学 Dispositif et procédé d'étalonnage de rayons
US11172907B2 (en) 2020-02-24 2021-11-16 GE Precision Healthcare LLC Systems and methods for cross calibration in dual energy x-ray absorptiometry
US12171605B2 (en) 2015-02-26 2024-12-24 Hologic, Inc. Methods for physiological state determination in body scans
US12226250B2 (en) 2017-03-31 2025-02-18 Hologic, Inc. Multiple modality body composition analysis
US12329563B2 (en) 2019-05-28 2025-06-17 Hologic, Inc. System and method for continuous calibration of X-ray scans

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Cited By (17)

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Publication number Priority date Publication date Assignee Title
US8116428B2 (en) 2006-09-18 2012-02-14 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
US8781066B2 (en) 2006-09-18 2014-07-15 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
US8009799B2 (en) 2006-10-02 2011-08-30 Optosecurity Inc. Tray for use in assessing the threat status of an article at a security check point
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