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WO2002031433A8 - Systeme de detection - Google Patents

Systeme de detection

Info

Publication number
WO2002031433A8
WO2002031433A8 PCT/DE2001/003031 DE0103031W WO0231433A8 WO 2002031433 A8 WO2002031433 A8 WO 2002031433A8 DE 0103031 W DE0103031 W DE 0103031W WO 0231433 A8 WO0231433 A8 WO 0231433A8
Authority
WO
WIPO (PCT)
Prior art keywords
sensor
sensors
housing
functions
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2001/003031
Other languages
German (de)
English (en)
Other versions
WO2002031433A1 (fr
Inventor
Franz Hrubes
Norbert Reindl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micro Epsilon Messtechnik GmbH and Co KG
Original Assignee
Micro Epsilon Messtechnik GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micro Epsilon Messtechnik GmbH and Co KG filed Critical Micro Epsilon Messtechnik GmbH and Co KG
Priority to JP2002534772A priority Critical patent/JP4059766B2/ja
Priority to EP01960157A priority patent/EP1342048A1/fr
Publication of WO2002031433A1 publication Critical patent/WO2002031433A1/fr
Publication of WO2002031433A8 publication Critical patent/WO2002031433A8/fr
Priority to US10/408,989 priority patent/US6822442B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
    • G01B7/085—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

L'invention concerne un système de détection comprenant un premier détecteur (1) qui présente de préférence une bobine de mesure (2) fonctionnant notamment selon le principe du courant de Foucault, ainsi qu'un second détecteur (3). Les deux détecteurs (1, 3) sont montés dans un boîtier (4). Afin de réduire l'influence mutuelle des détecteurs, ledit système de détection est conçu et perfectionné de manière à former une couche (7) sur la face de mesure du boîtier (4), ladite couche étant un composant actif du second détecteur (3).
PCT/DE2001/003031 2000-10-09 2001-08-08 Systeme de detection Ceased WO2002031433A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002534772A JP4059766B2 (ja) 2000-10-09 2001-08-08 センサ装置
EP01960157A EP1342048A1 (fr) 2000-10-09 2001-08-08 Systeme de detection
US10/408,989 US6822442B2 (en) 2000-10-09 2003-04-08 Sensor arrangement for detecting properties of a target

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10050193.1 2000-10-09
DE10050193A DE10050193A1 (de) 2000-10-09 2000-10-09 Sensoranordnung

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/408,989 Continuation US6822442B2 (en) 2000-10-09 2003-04-08 Sensor arrangement for detecting properties of a target

Publications (2)

Publication Number Publication Date
WO2002031433A1 WO2002031433A1 (fr) 2002-04-18
WO2002031433A8 true WO2002031433A8 (fr) 2002-07-25

Family

ID=7659301

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2001/003031 Ceased WO2002031433A1 (fr) 2000-10-09 2001-08-08 Systeme de detection

Country Status (5)

Country Link
US (1) US6822442B2 (fr)
EP (1) EP1342048A1 (fr)
JP (1) JP4059766B2 (fr)
DE (1) DE10050193A1 (fr)
WO (1) WO2002031433A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004007314A1 (de) * 2004-02-14 2005-08-25 Robert Bosch Gmbh Verfahren und Messgerät zur Ortung von in einem Medium eingeschlossenen Objekten
DE102005039152A1 (de) * 2005-08-17 2007-02-22 Robert Bosch Gmbh Mechanische Trägereinrichtung sowie Messgerät mit einer mechanischen Trägereinrichtung
CN102356296B (zh) * 2009-03-17 2014-05-07 Abb公司 一种测量设置在金属物件上的金属层的厚度的方法和装置
JP5403524B2 (ja) * 2010-12-08 2014-01-29 レーザーテック株式会社 電池用電極材の厚さ測定装置、及び厚さ測定方法
US20140002069A1 (en) * 2012-06-27 2014-01-02 Kenneth Stoddard Eddy current probe
MX2018007209A (es) 2015-12-28 2018-08-01 Eaton Intelligent Power Ltd Sensor de junta de corriente parasita.
CN107014896B (zh) * 2017-03-28 2020-04-03 中国人民解放军国防科学技术大学 一种集成式电磁电容平面阵列传感器及其制备方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3077858A (en) * 1960-03-17 1963-02-19 Gen Electric Canada Apparatus for controlling and measuring the thickness of thin electrically conductive films
FR1318027A (fr) * 1962-01-29 1963-02-15 Wayne Kerr Lab Ltd Appareil pour mesurer l'épaisseur d'une couche d'un matériau, par exemple une pellicule ou une feuille
US4168464A (en) * 1978-05-04 1979-09-18 General Dynamics Corporation Set point sensing system for numerically controlled machine tools
DE2829851A1 (de) * 1978-07-07 1980-01-24 Precitec Gmbh Anordnung zur messung des abstands zwischen einem metallischen werkstueck und einem bearbeitungswerkzeug
DE3134342A1 (de) * 1981-08-31 1983-03-10 Ingenieure Block + Seichter, 3000 Hannover Elektronischer kapazitiver messkopf fuer distanzmessungen
US4686454A (en) * 1984-08-22 1987-08-11 Pasar, Inc. Conductor tracer with improved open circuit detection, close-range discrimination and directionality
GB8607747D0 (en) * 1986-03-27 1986-04-30 Duracell Int Device
JPH071313B2 (ja) * 1986-12-23 1995-01-11 松下電工株式会社 壁の背後部材検知装置
DE3910297A1 (de) * 1989-03-30 1990-10-04 Micro Epsilon Messtechnik Beruehrungslos arbeitendes wegmesssystem
ATE160864T1 (de) * 1992-02-10 1997-12-15 Syel Di Franchi A Martolini A Elektronische kapazitive sensorstangeneinrichtung
US5337353A (en) * 1992-04-01 1994-08-09 At&T Bell Laboratories Capacitive proximity sensors
US5717332A (en) * 1993-05-03 1998-02-10 General Electric Company System and method using eddy currents to acquire positional data relating to fibers in a composite
FR2705145B1 (fr) * 1993-05-10 1995-08-04 Exa Ingenierie Dispositif de mesure de rectitude.
DE4327712C2 (de) * 1993-08-18 1997-07-10 Micro Epsilon Messtechnik Sensoranordnung und Verfahren zum Erfassen von Eigenschaften der Oberflächenschicht eines metallischen Targets
DE19511939C2 (de) * 1995-03-31 2000-05-18 Micro Epsilon Messtechnik Sensor zur berührungslosen Dickenmessung an Folien
AT408580B (de) * 1997-11-21 2002-01-25 Bierbaumer Hans Peter Dr Messvorrichtung zumindest zur ermittlung der dicke einer bahn sowie verfahren hierfür
DE19757575C1 (de) * 1997-12-23 1999-07-15 Siemens Ag Elektromagnetische Untersuchungseinrichtung, geeignet für Materialuntersuchung, mit Wirbelstrommeßkopf sowie Verfahren zum Betrieb derselben

Also Published As

Publication number Publication date
US6822442B2 (en) 2004-11-23
WO2002031433A1 (fr) 2002-04-18
JP4059766B2 (ja) 2008-03-12
EP1342048A1 (fr) 2003-09-10
JP2004510997A (ja) 2004-04-08
DE10050193A1 (de) 2002-04-18
US20030169036A1 (en) 2003-09-11

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