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WO2002086578A3 - Objective-type dark field scattering microscope - Google Patents

Objective-type dark field scattering microscope Download PDF

Info

Publication number
WO2002086578A3
WO2002086578A3 PCT/IL2002/000323 IL0200323W WO02086578A3 WO 2002086578 A3 WO2002086578 A3 WO 2002086578A3 IL 0200323 W IL0200323 W IL 0200323W WO 02086578 A3 WO02086578 A3 WO 02086578A3
Authority
WO
WIPO (PCT)
Prior art keywords
objective
focal plane
beam stop
dark field
back focal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/IL2002/000323
Other languages
French (fr)
Other versions
WO2002086578A2 (en
Inventor
Ido Braslavsky
Joel Stavans
Roee Amit
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yeda Research and Development Co Ltd
Original Assignee
Yeda Research and Development Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Research and Development Co Ltd filed Critical Yeda Research and Development Co Ltd
Priority to AU2002307784A priority Critical patent/AU2002307784A1/en
Publication of WO2002086578A2 publication Critical patent/WO2002086578A2/en
Anticipated expiration legal-status Critical
Publication of WO2002086578A3 publication Critical patent/WO2002086578A3/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

A dark field microscope comprising an objective (18) lens which both illuminates and images a sample carried by a substrate (21), by means of a beam stop (22) located such that it blocks light back-reflected from the substrate, leaving only the scattered light to be detected. The microscope, in its most convenient embodiment, has an additional optical element (23) for forming a conjugate image of the back focal plane (BFP)) of the objective at an equivalent back focal plane located outside of the objective. A beam stop located in the region of this equivalent back focal plane, being outside of the objective lens, can be conveniently shaped and installed. This use of a spatial beam stop obviates the need for fluorescence techniques thus providing means of tracking particles of only tens of nanometers in size for long periods without the bleaching effects typical of fluorescence microscopy.
PCT/IL2002/000323 2001-04-24 2002-04-24 Objective-type dark field scattering microscope Ceased WO2002086578A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002307784A AU2002307784A1 (en) 2001-04-24 2002-04-24 Objective-type dark field scattering microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL142782 2001-04-24
IL14278201A IL142782A0 (en) 2001-04-24 2001-04-24 Objective-type dark field scattering microscope

Publications (2)

Publication Number Publication Date
WO2002086578A2 WO2002086578A2 (en) 2002-10-31
WO2002086578A3 true WO2002086578A3 (en) 2004-03-18

Family

ID=11075348

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2002/000323 Ceased WO2002086578A2 (en) 2001-04-24 2002-04-24 Objective-type dark field scattering microscope

Country Status (3)

Country Link
AU (1) AU2002307784A1 (en)
IL (1) IL142782A0 (en)
WO (1) WO2002086578A2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5726490B2 (en) * 2010-11-26 2015-06-03 オリンパス株式会社 Light intensity measurement unit and microscope equipped with the same
WO2014184793A1 (en) * 2013-05-16 2014-11-20 Yeda Research And Development Co. Ltd. Method and system for use in inspection of samples by detection of optically excited emission from the sample
DE102013222562B4 (en) 2013-11-06 2023-01-26 Leica Microsystems Cms Gmbh Microscope and method and use of a microscope for evanescent illumination and point grid illumination
JP6357317B2 (en) * 2014-01-30 2018-07-11 オリンパス株式会社 Microscope illumination device, microscope illumination method, and microscope
CN107783267B (en) * 2016-08-30 2024-04-26 北京大学 Microscope magnification system
GB201819029D0 (en) * 2018-11-22 2019-01-09 Cambridge Entpr Ltd Optical microscopy
CN113406842A (en) * 2021-06-23 2021-09-17 湘潭大学 Ultramicro stacked dark field photography system and method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4062623A (en) * 1975-04-07 1977-12-13 Canon Kabushiki Kaisha Device for observing an object
US4871257A (en) * 1982-12-01 1989-10-03 Canon Kabushiki Kaisha Optical apparatus for observing patterned article
US5220403A (en) * 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
EP1054282A2 (en) * 1999-05-21 2000-11-22 Leica Microsystems Wetzlar GmbH Transducer for producing optical contrasts

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4062623A (en) * 1975-04-07 1977-12-13 Canon Kabushiki Kaisha Device for observing an object
US4871257A (en) * 1982-12-01 1989-10-03 Canon Kabushiki Kaisha Optical apparatus for observing patterned article
US5220403A (en) * 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
EP1054282A2 (en) * 1999-05-21 2000-11-22 Leica Microsystems Wetzlar GmbH Transducer for producing optical contrasts

Also Published As

Publication number Publication date
WO2002086578A2 (en) 2002-10-31
IL142782A0 (en) 2002-03-10
AU2002307784A1 (en) 2002-11-05

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