WO2001015225A1 - A combined heat sink/electromagnetic shield - Google Patents
A combined heat sink/electromagnetic shield Download PDFInfo
- Publication number
- WO2001015225A1 WO2001015225A1 PCT/SE2000/001544 SE0001544W WO0115225A1 WO 2001015225 A1 WO2001015225 A1 WO 2001015225A1 SE 0001544 W SE0001544 W SE 0001544W WO 0115225 A1 WO0115225 A1 WO 0115225A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- component
- substrate
- heat sink
- electromagnetic shield
- fixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Definitions
- the invention relates generally to flip chip semiconductor components and more specifically to a combined heat sink/electromagnetic shield for such components.
- flip chip technology One such assembly technology, which enables both size and cost reduction is flip chip technology.
- the semiconductor component or chip is mounted upside down, and the electrical connections from the component are established by so-called flip chip solder bumps.
- the upside down mounting of the component imposes a problem related to heat dissipation and cooling of the component.
- the normal or traditional method of cooling components is to mount them onto a material with high thermal conductivity, which effectively transports the heat away from the component.
- the solder bumps have a very limited ability to conduct the heat away from the chip due to the limited area they constitute relative to the total component area.
- the object of the invention is to improve the cooling as well as the shielding of semiconductor components assembled by flip chip technology.
- FIG. 1 shows an embodiment of a combined heat sink/electrical shield according to the invention.
- Fig. 1 shows an embodiment of a combined heat sink/electromagnetic shield 1 for a flip chip semiconductor component 2 mounted upside down by means of solder bumps 3 on a circuit board or substrate 4.
- the solder bumps 3 have a very limited ability to conduct heat away from the component 2 due to the fact that the contact area of the bumps 3 are much smaller than the area of the component 2.
- the combined heat sink/electromagnetic shield 1 comprises a strip of a metal, preferably Cu, having high thermal and electrical conductivity, and extending outside the component 2.
- the thickness of the metal strip 1 can be about 0.2 mm.
- the metal strip 1 is fixed both to the whole backside of the component 2 and to the substrate 4 around the component 2.
- the metal strip 1 can be fixed to the component 2 and the substrate 4 by means of solder or electrically conductive adhesive or a combination thereof. Typically, the metal strip 1 is fixed to the backside of the component 2 by means of electrically conductive adhesive 5 and to the substrate 4 by means of solder 6.
- solder 6 will be applied in the same operation as for other components to be mounted on the substrate 4, while the electrically conductive adhesive 5 will typically be printed onto the metal strip 1 prior to the assembly of the strip 1 onto the component 2. Typically, the adhesive 5 will be printed onto the strip 1 as part of the fabrication of the strip 1.
- solder 6 extends all around the component 2.
- the metal strip 1 in Fig. 1 functions not just as a heat sink but also as an electromagnetic shield to effectively shield high frequency components mounted on the flip chip semiconductor component 2 or on the substrate 4, such as a component 7 mounted under the metal strip 1.
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
Description
Claims
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU64866/00A AU6486600A (en) | 1999-08-25 | 2000-08-04 | A combined heat sink/electromagnetic shield |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE9902998A SE9902998L (en) | 1999-08-25 | 1999-08-25 | Cooler |
| SE9902998-5 | 1999-08-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2001015225A1 true WO2001015225A1 (en) | 2001-03-01 |
Family
ID=20416743
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/SE2000/001544 Ceased WO2001015225A1 (en) | 1999-08-25 | 2000-08-04 | A combined heat sink/electromagnetic shield |
Country Status (4)
| Country | Link |
|---|---|
| AU (1) | AU6486600A (en) |
| SE (1) | SE9902998L (en) |
| TW (1) | TW432649B (en) |
| WO (1) | WO2001015225A1 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10129388A1 (en) * | 2001-06-20 | 2003-01-09 | Infineon Technologies Ag | Electronic component and method for its production |
| US6713878B2 (en) * | 2001-05-30 | 2004-03-30 | Stmicroelectronics | Electronic element with a shielding |
| US6836022B2 (en) | 2003-02-13 | 2004-12-28 | Medtronic, Inc. | High voltage flip-chip component package and method for forming the same |
| US8664756B2 (en) | 2012-07-24 | 2014-03-04 | Medtronic, Inc. | Reconstituted wafer package with high voltage discrete active dice and integrated field plate for high temperature leakage current stability |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02288255A (en) * | 1989-04-28 | 1990-11-28 | Hitachi Ltd | semiconductor equipment |
| US5175613A (en) * | 1991-01-18 | 1992-12-29 | Digital Equipment Corporation | Package for EMI, ESD, thermal, and mechanical shock protection of circuit chips |
| US5371404A (en) * | 1993-02-04 | 1994-12-06 | Motorola, Inc. | Thermally conductive integrated circuit package with radio frequency shielding |
| EP0812015A1 (en) * | 1996-06-04 | 1997-12-10 | MAGNETI MARELLI S.p.A. | A heat dissipator for integrated circuits |
-
1999
- 1999-08-25 SE SE9902998A patent/SE9902998L/en not_active Application Discontinuation
- 1999-09-27 TW TW088116505A patent/TW432649B/en active
-
2000
- 2000-08-04 AU AU64866/00A patent/AU6486600A/en not_active Abandoned
- 2000-08-04 WO PCT/SE2000/001544 patent/WO2001015225A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02288255A (en) * | 1989-04-28 | 1990-11-28 | Hitachi Ltd | semiconductor equipment |
| US5175613A (en) * | 1991-01-18 | 1992-12-29 | Digital Equipment Corporation | Package for EMI, ESD, thermal, and mechanical shock protection of circuit chips |
| US5371404A (en) * | 1993-02-04 | 1994-12-06 | Motorola, Inc. | Thermally conductive integrated circuit package with radio frequency shielding |
| EP0812015A1 (en) * | 1996-06-04 | 1997-12-10 | MAGNETI MARELLI S.p.A. | A heat dissipator for integrated circuits |
Non-Patent Citations (1)
| Title |
|---|
| PATENT ABSTRACTS OF JAPAN vol. 015, no. 062 14 February 1991 (1991-02-14) * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6713878B2 (en) * | 2001-05-30 | 2004-03-30 | Stmicroelectronics | Electronic element with a shielding |
| DE10129388A1 (en) * | 2001-06-20 | 2003-01-09 | Infineon Technologies Ag | Electronic component and method for its production |
| US7064429B2 (en) | 2001-06-20 | 2006-06-20 | Infineon Technologies Ag | Electronic package having integrated cooling element with clearance for engaging package |
| DE10129388B4 (en) * | 2001-06-20 | 2008-01-10 | Infineon Technologies Ag | Method for producing an electronic component |
| US6836022B2 (en) | 2003-02-13 | 2004-12-28 | Medtronic, Inc. | High voltage flip-chip component package and method for forming the same |
| US8664756B2 (en) | 2012-07-24 | 2014-03-04 | Medtronic, Inc. | Reconstituted wafer package with high voltage discrete active dice and integrated field plate for high temperature leakage current stability |
Also Published As
| Publication number | Publication date |
|---|---|
| TW432649B (en) | 2001-05-01 |
| AU6486600A (en) | 2001-03-19 |
| SE9902998L (en) | 2001-02-26 |
| SE9902998D0 (en) | 1999-08-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101317268B (en) | Stacked multi-chip package with EMI shielding | |
| US7445968B2 (en) | Methods for integrated circuit module packaging and integrated circuit module packages | |
| US6455925B1 (en) | Power transistor package with integrated flange for surface mount heat removal | |
| US11895769B2 (en) | Module, terminal assembly, and method for producing module | |
| EP3327767B1 (en) | Mount structure, method of manufacturing mount structure, and wireless device | |
| JP2000174204A (en) | RF circuit module | |
| US6490173B2 (en) | Method and apparatus for providing electromagnetic shielding | |
| JP2000307289A (en) | Electronic component assembly | |
| JP2004071670A (en) | IC package, connection structure, and electronic device | |
| US20070053167A1 (en) | Electronic circuit module and manufacturing method thereof | |
| EP2398302B1 (en) | Semiconductor device | |
| US6861746B1 (en) | Electrical circuit apparatus and methods for assembling same | |
| US20060214278A1 (en) | Shield and semiconductor die assembly | |
| US10971455B2 (en) | Ground shield plane for ball grid array (BGA) package | |
| JP2006510235A (en) | Inexpensive high-frequency package | |
| MY128653A (en) | Electronic component of a high frequency current suppression type and bonding wire for the same | |
| US6417576B1 (en) | Method and apparatus for attaching multiple metal components to integrated circuit modules | |
| CN100562990C (en) | Substrates for mounting microwave monolithic integrated circuits and microwave communication transmitters and transceivers | |
| WO2001015225A1 (en) | A combined heat sink/electromagnetic shield | |
| JP2003017879A (en) | Heat dissipation device | |
| CN213213956U (en) | Circuit board assembly and radar device | |
| US5369880A (en) | Method for forming solder deposit on a substrate | |
| HK1045624A1 (en) | A method and an arrangement for the electrical contact of components | |
| EP1548827A1 (en) | Integrated circuit package arrangement and method | |
| EP0996155A2 (en) | Radio frequency integrated circuit apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG UZ VN YU ZA ZW |
|
| AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
| REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
| 122 | Ep: pct application non-entry in european phase | ||
| NENP | Non-entry into the national phase |
Ref country code: JP |