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WO2001009980A3 - Interconnexion a pas fin et a conformite reglee - Google Patents

Interconnexion a pas fin et a conformite reglee Download PDF

Info

Publication number
WO2001009980A3
WO2001009980A3 PCT/US2000/020748 US0020748W WO0109980A3 WO 2001009980 A3 WO2001009980 A3 WO 2001009980A3 US 0020748 W US0020748 W US 0020748W WO 0109980 A3 WO0109980 A3 WO 0109980A3
Authority
WO
WIPO (PCT)
Prior art keywords
electrical contacts
circuit
electrical
housing
circuit member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2000/020748
Other languages
English (en)
Other versions
WO2001009980A2 (fr
Inventor
James J Rathburn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gryphics Inc
Original Assignee
Gryphics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gryphics Inc filed Critical Gryphics Inc
Priority to JP2001514505A priority Critical patent/JP2003506833A/ja
Priority to EP00955283A priority patent/EP1204988A2/fr
Priority to US10/031,422 priority patent/US6830460B1/en
Priority to AU67509/00A priority patent/AU6750900A/en
Publication of WO2001009980A2 publication Critical patent/WO2001009980A2/fr
Publication of WO2001009980A3 publication Critical patent/WO2001009980A3/fr
Anticipated expiration legal-status Critical
Priority to US10/992,482 priority patent/US7160119B2/en
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
    • H05K3/326—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor the printed circuit having integral resilient or deformable parts, e.g. tabs or parts of flexible circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50—Fixed connections
    • H01R12/51—Fixed connections for rigid printed circuits or like structures
    • H01R12/52—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
    • H01R12/523—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures by an interconnection through aligned holes in the boards or multilayer board

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Metallurgy (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
  • Wire Bonding (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

L'invention concerne un procédé et un dispositif d'exécution d'une interconnexion à pas très fin entre un élément de circuit flexible et un autre élément de circuit, au moyen de contacts électriques extrêmement coplanaires, possédant une grande souplesse de conformité. L'invention concerne également un ensemble d'interconnexion électrique que l'on peut utiliser en tant que sonde d'essai de niveau de puce, en tant que sonde de plaquette et de circuit imprimé. Le second élément de circuit peut être une plaquette de circuit imprimé, un autre circuit flexible, un dispositif de puce nue, un dispositif de circuit intégré, un substrat organique ou minéral, un circuit rigide et virtuellement n'importe quel type de composant électrique. Selon l'invention, plusieurs contacts électriques sont agencés dans un boîtier, de manière aléatoire ou selon une matrice uni ou bidimensionnelle. Le boîtier agit en tant que réceptacle servant à placer individuellement les contacts électriques et à les aligner, tout en empêchant des contacts adjacents de se toucher. Les premières extrémités des contacts électriques sont couplées électriquement à un élément de circuit flexible. Ces contacts électriques sont libres de se déplacer dans le boîtier, le long d'un axe central de celui-ci. Les secondes extrémités des contacts électriques sont libres de se coupler électriquement avec au moins un second élément de circuit, sans utilisation de soudure.
PCT/US2000/020748 1999-08-02 2000-07-31 Interconnexion a pas fin et a conformite reglee Ceased WO2001009980A2 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2001514505A JP2003506833A (ja) 1999-08-02 2000-07-31 コンプライアンスを制御したファインピッチ配線
EP00955283A EP1204988A2 (fr) 1999-08-02 2000-07-31 Interconnexion a pas fin et a conformite reglee
US10/031,422 US6830460B1 (en) 1999-08-02 2000-07-31 Controlled compliance fine pitch interconnect
AU67509/00A AU6750900A (en) 1999-08-02 2000-07-31 Controlled compliance fine pitch interconnect
US10/992,482 US7160119B2 (en) 1999-08-02 2004-11-17 Controlled compliance fine pitch electrical interconnect

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14682599P 1999-08-02 1999-08-02
US60/146,825 1999-08-02

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US10031422 A-371-Of-International 2000-07-31
US10/992,482 Division US7160119B2 (en) 1999-08-02 2004-11-17 Controlled compliance fine pitch electrical interconnect

Publications (2)

Publication Number Publication Date
WO2001009980A2 WO2001009980A2 (fr) 2001-02-08
WO2001009980A3 true WO2001009980A3 (fr) 2001-08-30

Family

ID=22519150

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/020748 Ceased WO2001009980A2 (fr) 1999-08-02 2000-07-31 Interconnexion a pas fin et a conformite reglee

Country Status (4)

Country Link
EP (1) EP1204988A2 (fr)
JP (1) JP2003506833A (fr)
AU (1) AU6750900A (fr)
WO (1) WO2001009980A2 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6939143B2 (en) 2000-01-20 2005-09-06 Gryphics, Inc. Flexible compliant interconnect assembly
US6957963B2 (en) 2000-01-20 2005-10-25 Gryphics, Inc. Compliant interconnect assembly
US7160119B2 (en) 1999-08-02 2007-01-09 Gryphics, Inc. Controlled compliance fine pitch electrical interconnect

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6409521B1 (en) 1997-05-06 2002-06-25 Gryphics, Inc. Multi-mode compliant connector and replaceable chip module utilizing the same
ATE284601T1 (de) 1999-02-02 2004-12-15 Gryphics Inc Verbinder mit geringer oder niedriger einsteckkraft für leiterplatten und elektrische vorrichtungen
JP2003315361A (ja) * 2002-04-26 2003-11-06 Japan Electronic Materials Corp プローブの製造方法、このプローブの製造用マスク及びプローブ
EP1642364A1 (fr) 2003-07-07 2006-04-05 Gryphics, Inc. Connecteur a force d'insertion nulle ferme normalement
DE102004027886A1 (de) * 2004-05-28 2005-12-22 Feinmetall Gmbh Prüfeinrichtung zur elektrischen Prüfung eines Prüflings sowie Verfahren zur Herstellung einer Prüfeinrichtung
JP4838658B2 (ja) * 2006-08-01 2011-12-14 日本電産リード株式会社 基板検査用治具及び基板検査用治具の電極部構造
JP2010145381A (ja) * 2008-12-22 2010-07-01 Nippon Mektron Ltd 基板検査装置及び検査治具の製造方法
JP2013002976A (ja) * 2011-06-17 2013-01-07 Hioki Ee Corp プローブユニット、回路基板検査装置およびプローブユニット製造方法
KR20140020627A (ko) * 2012-08-10 2014-02-19 삼성전기주식회사 전기 검사용 지그의 제조방법

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4118090A (en) * 1977-05-23 1978-10-03 Luigi Giovanni Del Mei Electrical contact devices
EP0310302A2 (fr) * 1987-09-25 1989-04-05 Minnesota Mining And Manufacturing Company Socle multifonction
US5252916A (en) * 1992-01-27 1993-10-12 Everett Charles Technologies, Inc. Pneumatic test fixture with springless test probes
US5299090A (en) * 1993-06-29 1994-03-29 At&T Bell Laboratories Pin-fin heat sink
US5410260A (en) * 1992-11-09 1995-04-25 Nhk Spring Co., Ltd. Coil spring-pressed needle contact probe
US5412329A (en) * 1991-11-18 1995-05-02 Tokyo Electron Yamanashi Limited Probe card
US5521519A (en) * 1992-07-30 1996-05-28 International Business Machines Corporation Spring probe with piloted and headed contact and method of tip formation
US5637539A (en) * 1996-01-16 1997-06-10 Cornell Research Foundation, Inc. Vacuum microelectronic devices with multiple planar electrodes
US5723347A (en) * 1993-09-30 1998-03-03 International Business Machines Corp. Semi-conductor chip test probe and process for manufacturing the probe
WO1998013695A1 (fr) * 1996-09-26 1998-04-02 Primeyield Systems, Inc. Contacteur de controle a reseau en grille

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118977A (ja) * 1984-11-13 1986-06-06 シチズン時計株式会社 多電極コネクタ−構造
JP3400051B2 (ja) * 1993-11-10 2003-04-28 ザ ウィタカー コーポレーション 異方性導電膜、その製造方法及びそれを使用するコネクタ
JP2602623B2 (ja) * 1993-12-17 1997-04-23 山一電機株式会社 Ｉｃソケット
JPH0973934A (ja) * 1995-09-01 1997-03-18 Whitaker Corp:The コネクタ
JP3640268B2 (ja) * 1995-10-06 2005-04-20 ザ ウィタカー コーポレーション コネクタ及びコネクタ製造方法
JP4040206B2 (ja) * 1999-04-28 2008-01-30 信越ポリマー株式会社 電気コネクタ

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4118090A (en) * 1977-05-23 1978-10-03 Luigi Giovanni Del Mei Electrical contact devices
EP0310302A2 (fr) * 1987-09-25 1989-04-05 Minnesota Mining And Manufacturing Company Socle multifonction
US5412329A (en) * 1991-11-18 1995-05-02 Tokyo Electron Yamanashi Limited Probe card
US5252916A (en) * 1992-01-27 1993-10-12 Everett Charles Technologies, Inc. Pneumatic test fixture with springless test probes
US5521519A (en) * 1992-07-30 1996-05-28 International Business Machines Corporation Spring probe with piloted and headed contact and method of tip formation
US5410260A (en) * 1992-11-09 1995-04-25 Nhk Spring Co., Ltd. Coil spring-pressed needle contact probe
US5299090A (en) * 1993-06-29 1994-03-29 At&T Bell Laboratories Pin-fin heat sink
US5723347A (en) * 1993-09-30 1998-03-03 International Business Machines Corp. Semi-conductor chip test probe and process for manufacturing the probe
US5637539A (en) * 1996-01-16 1997-06-10 Cornell Research Foundation, Inc. Vacuum microelectronic devices with multiple planar electrodes
WO1998013695A1 (fr) * 1996-09-26 1998-04-02 Primeyield Systems, Inc. Contacteur de controle a reseau en grille

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7160119B2 (en) 1999-08-02 2007-01-09 Gryphics, Inc. Controlled compliance fine pitch electrical interconnect
US6939143B2 (en) 2000-01-20 2005-09-06 Gryphics, Inc. Flexible compliant interconnect assembly
US6957963B2 (en) 2000-01-20 2005-10-25 Gryphics, Inc. Compliant interconnect assembly
US7114960B2 (en) 2000-01-20 2006-10-03 Gryhics, Inc. Compliant interconnect assembly
US7121839B2 (en) 2000-01-20 2006-10-17 Gryphics, Inc. Compliant interconnect assembly
US7900347B2 (en) 2000-01-20 2011-03-08 Cascade Microtech, Inc. Method of making a compliant interconnect assembly

Also Published As

Publication number Publication date
EP1204988A2 (fr) 2002-05-15
AU6750900A (en) 2001-02-19
JP2003506833A (ja) 2003-02-18
WO2001009980A2 (fr) 2001-02-08

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