WO1999034434A1 - Epoxy bleeding inhibitor and method of preventing epoxy bleeding - Google Patents
Epoxy bleeding inhibitor and method of preventing epoxy bleeding Download PDFInfo
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- WO1999034434A1 WO1999034434A1 PCT/JP1998/005897 JP9805897W WO9934434A1 WO 1999034434 A1 WO1999034434 A1 WO 1999034434A1 JP 9805897 W JP9805897 W JP 9805897W WO 9934434 A1 WO9934434 A1 WO 9934434A1
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- carboxylic acid
- epoxy
- thiol
- carbon atoms
- inhibitor
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12044—OLED
Definitions
- the present invention relates to an epoxy pre-dating agent and a method for preventing a semiconductor device such as a lead frame or a printed wiring board from being bonded to an IC chip with an epoxy resin in a die bonding step.
- the bonding surface (usually plated with gold, silver, copper, palladium, etc.). If the surface roughness is too large, or if the surface is contaminated with an organic substance such as a discoloration inhibitor or a sealing agent, the resin or additive oozes out when the epoxy resin is applied (epoxy bleed out). ) Occurs. This epoxy bleed-out lowers the die bonding strength and causes a defect in the subsequent wire bonding process.
- An object of the present invention is to establish a method of preventing epoxy pre-dating which does not adversely affect die bonding strength and assembly characteristics and does not impair the discoloration prevention treatment / sealing treatment effect. Disclosure of the invention
- the present invention is based on this finding,
- Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain carboxylic acid or thiol having a benzene ring, carboxylic acid having a mercapto group or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule.
- An epoxy predout inhibitor in a die bonding process in a semiconductor manufacturing process characterized by containing a nitrogen-containing heterocyclic compound containing the compound or one or more organic compounds selected from these derivatives.
- the wiring substrate is immersed in an epoxy bleed-gate inhibitor in the die bonding step of the semiconductor manufacturing process, which contains a nitrogen-containing heterocyclic compound containing at least one or an organic compound selected from these derivatives.
- a method for preventing epoxy bleeding which comprises spraying the epoxy bleeding inhibitor on a wiring substrate.
- the wiring substrate is immersed in an epoxy bleed-gate inhibitor in the die-bonding step of the semiconductor manufacturing process, which contains a nitrogen-containing heterocyclic compound or one or more organic compounds selected from these derivatives.
- Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain portion carboxylic acid or thiol having a benzene ring, carboxylic acid having a mechabutate or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule
- a wiring base material and a semiconductor package characterized in that at least one organic compound selected from nitrogen-containing heterocyclic compounds containing these or derivatives thereof is adsorbed on the surface.
- Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain carboxylic acid or thiol having a benzene ring, carboxylic acid having a mechabutate or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule
- the epoxy pre-drying inhibitor of the present invention is particularly applicable to semiconductor devices such as a lead frame and a printed wiring board, but is not necessarily limited thereto, and may be used in an epoxy bonding step in a die bonding step. Applicable to any product that may cause a blowout.
- Examples of the organic compound having the epoxy pre-dite prevention function contained in the epoxy pre-dite prevention agent of the present invention include the following organic compounds.
- C A carbon atom in a linear portion A carboxylic acid or thiol having at least 3
- Pentane thiol C s H ii SH
- octanethiol C S H: L 7 SH
- decane thiol C 1 0 H 2 1 SH
- hexadecyl mercaptan C ie H 3 a SH
- mercaptopropyl main Tokishishiran HS (CH 2) a S i (OCH
- HSCH s COOH mercapto acid
- HOOC (CHOH) 4 COOH mucinic acid
- butynediol HOCH 2 C ® CH 2 OH
- thiobarbituric acid For example, thiobarbituric acid.
- An epoxy pre-outout inhibitor containing one or more organic compounds selected from the above organic compounds or derivatives thereof is included in the present invention.
- the epoxy bleeding inhibitor of the present invention contains the above organic compound in an amount of 0.1 mg / L to 100 g_L, preferably 10 mg / L to 10 g "L. If the concentration of the compound is too low, there is no effect of preventing epoxy bleeding, and if the concentration is too high, no further effect can be expected, which is not preferable.
- organic compound When the organic compound is hardly soluble in water, an organic solvent such as alcohol and ketone is added as necessary.
- a boric acid-based, phosphate-based, or organic acid-based pH buffer is added in an amount of 0.1 to 100 g / L, preferably 1 to 50 g / L.
- any one of anionic, cationic, and nonionic surfactants or a mixture thereof is used in an amount of 1 ⁇ g / L to 10 g / L, preferably 1. Add ⁇ g / L to 1 g / L.
- the pH of the epoxy bleed inhibitor solution does not need to be particularly limited.
- the temperature of the epoxy bleedout inhibitor solution should be 580 ° C, preferably 10 to 50 ° C. If the temperature is too low, the epoxy bleed-out effect is low, and if the temperature is too high, no further effect can be expected, which is not preferable.
- the method for preventing epoxy bleed out is to immerse the wiring substrate in an epoxy bleed out inhibitor solution or to spray the epoxy bleed out inhibitor solution onto the substrate (shower, spray, etc.). After contacting with water, wash and dry. Further, the same effect can be exerted by adding the above-mentioned organic compound which is a main component of the epoxy bleeding inhibitor to the discoloration inhibitor and the sealing agent.
- the above organic compound is adsorbed on the adhered surface of the wiring base material, and a film made of an organic compound having a thickness of about one to several molecules is formed. Is done. Therefore, it is possible to increase the contact angle between the plating surface and the epoxy resin, and to suppress the bleeding of the epoxy resin. Since the organic compound film to be adsorbed is very thin, it does not adversely affect the assembly characteristics such as wire bonding and molding. In addition, the effect of preventing discoloration and the effect of sealing treatment are not impaired.
- Wiring substrates and semiconductor packages that have been subjected to the epoxy bleedout prevention treatment by the above method are also included in the present invention.
- the discoloration prevention treatment was performed under the following conditions.
- Anti-tarnish liquid Main component Benzotriazole 0 g / L
- the sealing treatment was performed under the following conditions.
- the evaluation of the epoxy bleed was performed by the following method.
- the evaluation of the wire bonding characteristics was performed by the following method.
- thermocompression bonding method using ultrasonic waves temperature: 200 ° (:, load: 50 g, time: .10 ms)
- the pull strength was measured with a bull tester.
- the evaluation of the molding characteristics was performed by the following method.
- the samples subjected to the discoloration prevention treatment or the sealing treatment were evaluated for the discoloration prevention effect or the sealing treatment effect.
- the discoloration prevention effect was evaluated by the following method for spot-plated parts and copper strike-plated parts for spot silver-plated products, and for plated parts for whole-plated products.
- the evaluation of the sealing effect was performed on the plated surface of each of the spot-plated product and the fully-plated product by the following method.
- Lactic acid 1.1 mL / L
- Copper alloy (Cu: 97.7%-Sn: 2.0% -Ni: 0.2% - ⁇ : 0 03%) lead frame base material with silver, gold, copper or palladium plating Either was given.
- the sample in the — part was subjected to a discoloration prevention treatment or a sealing treatment.
- the discoloration prevention treatment was performed under the following conditions.
- Anti-discoloration liquid Main component Benzotriazole 0. g ZL
- the sealing treatment was performed under the following conditions.
- An epoxy bleeding prevention treatment for adsorbing an organic compound having an epoxy prepreg prevention function onto the surface of a semiconductor device such as a lead frame or a brim kneading plate using the epoxy bleeding preventing agent of the present invention By doing so, it is possible to prevent epoxy bridging in the die bonding step without impairing the discoloration prevention effect and the sealing effect. Also, there is no adverse effect on wire bonding characteristics and assembly characteristics such as molding characteristics.
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Epoxy Resins (AREA)
- Die Bonding (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
明 細 書 エポキシブリ ー ドアウ ト防止剤及び防止方法 Description Epoxy bleedout inhibitor and prevention method
技術分野 Technical field
本発明は、 リ ー ドフ レームやプリ ン ト配線板等の半導体装置と I Cチップとを エポキシ樹脂によって接着固定するダイボンディ ング工程におけるエポキシプリ 一ドアゥ ト防止剤及ぴ防止方法に関する。 背景技術 TECHNICAL FIELD The present invention relates to an epoxy pre-dating agent and a method for preventing a semiconductor device such as a lead frame or a printed wiring board from being bonded to an IC chip with an epoxy resin in a die bonding step. Background art
リー ドフ レームやブ リ ン ト配線板等の半導体装置と I Cチップと をエポキシ樹 脂によって接着固定するダイボンディ ング工程においては、 接着面 (通常、 金、 銀、 銅、 パラジウム等のめっきが施されている) の表面粗さが大き過ぎたり 、 表 面が変色防止剤、 封孔処理剤等の有機物で汚染されている と、 エポキシ樹脂塗布 時に、 樹脂または添加剤の滲み出し (エポキシブリー ドアウ ト) が発生する。 こ のエポキシブリ ー ドアウ トは、 ダイボンディ ング強度を低下させたり 、 その後の ワイヤーボンディ ング工程での不良原因となっている。 In a die bonding process in which an IC chip is bonded and fixed to a semiconductor device such as a lead frame or a printed wiring board with an epoxy resin, the bonding surface (usually plated with gold, silver, copper, palladium, etc.). If the surface roughness is too large, or if the surface is contaminated with an organic substance such as a discoloration inhibitor or a sealing agent, the resin or additive oozes out when the epoxy resin is applied (epoxy bleed out). ) Occurs. This epoxy bleed-out lowers the die bonding strength and causes a defect in the subsequent wire bonding process.
従来、 このよ う なエポキシブリー ドアウ トを防止するために、 接着面の表面粗 さを小さ く し、 毛細管現象を抑制したり、 表面を洗浄し汚染物を取り 除いていた。 しかし、 接着面の表面粗さは、 ダイボンディ ング強度や、 アセンブリマシンの画 像認識能力に影響を与えるため、 一概に小さ くすることはできない。 また、 表面 を洗浄する こ とは、 変色防止処理ゃ封孔処理効果まで損なってしま う ため問題で あった。 Conventionally, in order to prevent such epoxy bleed out, the surface roughness of the bonding surface has been reduced to suppress the capillary phenomenon, and the surface has been cleaned to remove contaminants. However, since the surface roughness of the bonding surface affects the die-bonding strength and the image recognition ability of the assembly machine, it cannot be reduced unconditionally. In addition, cleaning the surface is a problem because it impairs the discoloration prevention treatment and the sealing effect.
本発明は、 ダイボンディ ング強度や、 アセンブリ特性に悪影響を与えず、 変色 防止処理ゃ封孔処理効果を損なう ことのないよ う なエポキシプリ一 ドアゥ ト防止 方法を確立することである。 発明の開示 An object of the present invention is to establish a method of preventing epoxy pre-dating which does not adversely affect die bonding strength and assembly characteristics and does not impair the discoloration prevention treatment / sealing treatment effect. Disclosure of the invention
本発明者は、 鋭意研究を行った結果、 特定の有機化合物を含有する溶液に基材 を浸漬し、 めっき面の表面に有機被膜を吸着させる ことによってエポキシブリー ドアゥ トを効果的に防止できるこ とを見い出した。. As a result of intensive studies, the present inventors have found that a solution containing a specific organic compound It has been found that epoxy bleeding can be effectively prevented by immersing the coating and adsorbing the organic coating on the surface of the plating surface. .
本発明は、 この知見に基づき、 The present invention is based on this finding,
1 . 直鎖部分の炭素原子が 3個以上であるカルボン酸またはチオール、 ベンゼン 環を有するカルボン酸またはチオール、 メルカブ ト基または水酸基を有するカル ボン酸、 多価不飽和アルコール、 分子中に硫黄を含む含窒素複素環状化合物、 ま たはこれらの誘導体から選択された 1種以上の有機化合物を含有する こと を特徴 とする半導体製造工程のダイボンディ ング工程におけるエポキシプリ 一 ドアウ ト 防止剤 1. Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain, carboxylic acid or thiol having a benzene ring, carboxylic acid having a mercapto group or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule. An epoxy predout inhibitor in a die bonding process in a semiconductor manufacturing process, characterized by containing a nitrogen-containing heterocyclic compound containing the compound or one or more organic compounds selected from these derivatives.
2 . 直鎖部分の炭素原子が 3個以上であるカルボン酸またはチオール、 ベンゼン 環を有するカルボン酸またはチオール、 メ ルカブ ト基または水酸基を有するカル ボン酸、 多価不飽和アルコール、 分子中に硫黄を含む含窒素複素環状化合物、 ま たはこれらの誘導体から選択された 1種以上の有機化合物を含有する、 半導体製 造工程のダイボンディ ング工程におけるエポキシブリー ドアゥ ト防止剤に配線基 材を浸漬するかまたは該エポキシブリー ドアゥ ト防止剤を配線基材に散布するこ とを特徴とするエポキシブリー ドアゥ ト防止方法 2. Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain portion, carboxylic acid or thiol having a benzene ring, carboxylic acid having a mechabutate or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule The wiring substrate is immersed in an epoxy bleed-gate inhibitor in the die bonding step of the semiconductor manufacturing process, which contains a nitrogen-containing heterocyclic compound containing at least one or an organic compound selected from these derivatives. Or a method for preventing epoxy bleeding, which comprises spraying the epoxy bleeding inhibitor on a wiring substrate.
3 . 直鎖部分の炭素原子が 3個以上であるカルボン酸またはチオール、 ベンゼン 澴を有するカルボン酸またはチオール、 メルカプ ト基または水酸基を有するカル ボン酸、 多価不飽和アルコール、 分子中に硫黄を含む含窒素複素環状化合物、 ま たはこれらの誘導体から選択された 1種以上の有機化合物を含有する、 半導体製 造工程のダイボンディ ング工程におけるエポキシブリー ドア ゥ ト防止剤に配線基 材を浸漬するかまたは該エポキシブリー ドアウ ト防止.剤を配線基材に散布するこ とによ りエポキシブリ ー ドアウ ト防止処理を施したこ と を特徴とする配線基材ぉ よび半導体パッケージ 3. Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain part, carboxylic acid or thiol having benzene group, carboxylic acid having mercapto group or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule. The wiring substrate is immersed in an epoxy bleed-gate inhibitor in the die-bonding step of the semiconductor manufacturing process, which contains a nitrogen-containing heterocyclic compound or one or more organic compounds selected from these derivatives. A wiring base material and a semiconductor package, which have been subjected to an epoxy bleed out prevention treatment by spraying an agent to the wiring base material.
4 . 直鎖部分の炭素原子が 3個以上であるカルボン酸またはチオール、 ベンゼン 環を有するカルボン酸またはチオール、 メ ルカブ ト基または水酸基を有するカル ボン酸、 多価不飽和アルコール、 分子中に硫黄を含む含窒素複素環状化合物、 ま たはこれらの誘導体から選択された 1種以上の有機化合物が表面に吸着している こ とを特徴とする配線基材および半導体パッケージ P T/JP98/05897 4. Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain portion, carboxylic acid or thiol having a benzene ring, carboxylic acid having a mechabutate or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule A wiring base material and a semiconductor package, characterized in that at least one organic compound selected from nitrogen-containing heterocyclic compounds containing these or derivatives thereof is adsorbed on the surface. PT / JP98 / 05897
5. 直鎖部分の炭素原子が 3個以上であるカルボン酸またはチオール、 ベンゼン 環を有するカルボン酸またはチオール、 メ ルカブ ト基または水酸基を有するカル ボン酸、 多価不飽和アルコール、 分子中に硫黄を含む含窒素複素環状化合物、 ま たはこれらの誘導体から選択された 1種以上の有機化合物からなるエポキシプリ — ドアウ ト防止剤を含有するこ と を特徴とする変色防止液または封孔処理液 を提供するものである。 発明の実施の形態 5. Carboxylic acid or thiol having 3 or more carbon atoms in the straight chain, carboxylic acid or thiol having a benzene ring, carboxylic acid having a mechabutate or hydroxyl group, polyunsaturated alcohol, sulfur in the molecule A discoloration-preventing solution or a pore-sealing solution containing an epoxy pre-dosing inhibitor comprising a nitrogen-containing heterocyclic compound containing at least one or an organic compound selected from these derivatives. Is provided. Embodiment of the Invention
本発明のエポキシプリ一 ドアゥ ト防止剤は、 特にリ ー ドフ レームやプリ ン ト配 線板などの半導体装置に適用可能であるが、 必ずしもこれに限定されるものでは なく 、 ダイボンディ ング工程におけるエポキシブリ ー ドアゥ トの発生する可能性 のある製品のいずれに対しても適用することができる。 The epoxy pre-drying inhibitor of the present invention is particularly applicable to semiconductor devices such as a lead frame and a printed wiring board, but is not necessarily limited thereto, and may be used in an epoxy bonding step in a die bonding step. Applicable to any product that may cause a blowout.
本発明のエポキシプリ一 ドアゥ ト防止剤に含まれ、 エポキシプリ一ドアゥ ト防 止機能を有する有機化合物と しては、 下記の有機化合物を例示する ことができる c A : 直鎖部分の炭素原子が 3個以上であるカルボン酸またはチオール Examples of the organic compound having the epoxy pre-dite prevention function contained in the epoxy pre-dite prevention agent of the present invention include the following organic compounds. C A: carbon atom in a linear portion A carboxylic acid or thiol having at least 3
例えば、 カブロ ン酸 ( C s H i i C O O H) 、 酪酸 ( C 3 H 7 C O O H) 、 ェ ナン ト酸 ( C E H 1 3 C O O H ) 、 ペラルゴン酸 ( C S H :L 7 C O O H ) 、 カブ リ ン酸 ( C s H 1 9 C O O H) 、 ゥンデシル酸 ( C l c» H 2 1 C O O H) 、 ラウ リ ン酸 ( C i i H s a C O O H) 、 ト リデシル酸 ( C 1 2 H 2 S C O O H) 、 ミ リ スチン酸 ( C 1 3 H 2 7 C O O H) 、 ペンタ'デシル酸 ( C 1 4 H 2 9 C O O H ) 、 パルミチン酸 ( C 1 5 H 3 1 C O O H) 、 ヘプタデシル酸 ( C i s H s s C O O H ) 、 ステア リ ン酸 ( C 1 7 H 3 5 C O O H ) 、 ノナデカン酸 ( C 1 S H 3 τ C O O H ) 、 ベヘン酸 ( C 2 1 H 4 3 C O O H) 、 ォレイ ン酸 ( C 1 7 H 3 a C O O H) 、 エル力酸 ( C 2 1 H 4 1 C O O HV 、 リ ノール酸 ( C i 7 H 3 1 C O O H) 、 リ ノ レン酸 ( C i H s s C O O H) などのカルボン酸、 For example, Kaburo phosphate (C s H ii COOH), butyric acid (C 3 H 7 COOH), E Nan preparative acid (C E H 1 3 COOH) , pelargonic acid (C S H: L 7 COOH ), turnip Li down acid (C s H 1 9 COOH) , Undeshiru acid (C lc »H 2 1 COOH ), Lau-phosphate (C ii H sa COOH), preparative Rideshiru acid (C 1 2 H 2 S COOH ), millimeter cystine acid (C 1 3 H 2 7 COOH ), pentamethylene 'decyl acid (C 1 4 H 2 9 COOH ), palmitic acid (C 1 5 H 3 1 COOH ), heptadecyl acid (C is H ss COOH), stearic Li down acid (C 1 7 H 3 5 COOH ), nonadecanoic (C 1 S H 3 τ COOH ), behenic acid (C 2 1 H 4 3 COOH ), Orei phosphate (C 1 7 H 3 a COOH ), El force acid (C 2 1 H 4 1 COO HV, Li Nord acid (C i 7 H 3 1 COOH ), carboxylic acids such as Li Bruno Len acid (C i H ss COOH),
ペンタンチオール ( C s H i i S H) 、 オクタンチオール ( C S H :L 7 S H ) 、 デカンチオール ( C 1 0 H 2 1 S H) 'キサデシルメルカプタン ( C i e H 3 a S H ) 、 メルカプトプロピルメ トキシシラン (H S ( C H 2 ) a S i (O C HPentane thiol (C s H ii SH), octanethiol (C S H: L 7 SH ), decane thiol (C 1 0 H 2 1 SH ) ' hexadecyl mercaptan (C ie H 3 a SH) , mercaptopropyl main Tokishishiran (HS (CH 2) a S i (OCH
3 ) 3 ) などのチオール類。 B : ベンゼン環を有するカルボン酸またはチオール 3) Thiols such as 3). B: Carboxylic acid or thiol having a benzene ring
例えば、 ニ ト ロ安息香酸 (〇 2 N C 6 H 4 C O O H) 、 ベンジルメ ルカブタ ン ( C e H 5 C H 2 S H) など。 For example, two collected by filtration benzoate (〇 2 NC 6 H 4 COOH), Benjirume Rukabuta emissions (C e H 5 CH 2 SH ) and the like.
C : メルカプ ト基または水酸基を有するカルボン酸、 C: a carboxylic acid having a mercapto group or a hydroxyl group,
例えば、 メルカプ ト齚酸 (H S C H s C O O H) 、 ムチン酸 (H O O C ( C H O H ) 4 C O O H ) など。 For example, mercapto acid (HSCH s COOH) and mucinic acid (HOOC (CHOH) 4 COOH).
D : 多価不飽和ァノレコ—ノレ D: Polyunsaturated Anoleco
例えば、 ブチンジオール ( H O C H 2 Cョ C H 2 O H ) 、 ブテンジオール ( H O C H 2 C H = C H C H 2 O H) など。 For example, butynediol (HOCH 2 C ® CH 2 OH), such as butenediol (HOCH 2 CH = CHCH 2 OH ).
E : 分子中に硫黄を含む含窒素複素環状化合物 E: Nitrogen-containing heterocyclic compound containing sulfur in the molecule
例えば、 チォバルビツール酸など。 For example, thiobarbituric acid.
上記の有機化合物またはこれらの誘導体から選択された 1種以上の有機化合物 を含有するエポキシプリ 一 ドアウ ト防止剤は本発明に包含される。 An epoxy pre-outout inhibitor containing one or more organic compounds selected from the above organic compounds or derivatives thereof is included in the present invention.
本発明のエポキシブリー ドアゥ ト防止剤は上記の有機化合物を 0 . l m g / L 〜 1 0 0 g _ L、 好ま しく は 1 0 m g / L~ l 0 g " L含有するものである。 上記有機化合物の濃度が低すぎる場合にはエポキシブリー ドアゥ ト防止効果が なく 、 また、 濃度が高すぎてもそれ以上の効果は期待するこ とができないため好 ま しく ない。 The epoxy bleeding inhibitor of the present invention contains the above organic compound in an amount of 0.1 mg / L to 100 g_L, preferably 10 mg / L to 10 g "L. If the concentration of the compound is too low, there is no effect of preventing epoxy bleeding, and if the concentration is too high, no further effect can be expected, which is not preferable.
なお、 上記有機化合物が水に溶け難い場合には必要に応じてアルコール、 ケ ト ン等の有機溶剤を添加する。 When the organic compound is hardly soluble in water, an organic solvent such as alcohol and ketone is added as necessary.
また、 必要に応じて、 ホウ酸系、 リ ン酸系、 有機酸系の p H緩衝剤を 0 . 1〜 1 0 0 g / L、 好ま しく は l ~ 5 0 g / L添加する。 If necessary, a boric acid-based, phosphate-based, or organic acid-based pH buffer is added in an amount of 0.1 to 100 g / L, preferably 1 to 50 g / L.
さ らに、 必要に応じて、 ァニオン系、 カチオン系、 ノニオン系の界面活性剤の いずれかまたはこれらの混合物を 1 β g / L〜 l 0 g / L、 好ましく は 1。 β g / L〜 1 g / L添加する。 Further, if necessary, any one of anionic, cationic, and nonionic surfactants or a mixture thereof is used in an amount of 1 βg / L to 10 g / L, preferably 1. Add β g / L to 1 g / L.
エポキシブリー ドアゥ ト防止剤溶液の p Hは特に限定する必要はない。 The pH of the epoxy bleed inhibitor solution does not need to be particularly limited.
エポキシブリー ドアウ ト防止剤溶液の温度は 5 8 0 °C、 好ま しく は 1 0〜 5 0 °Cとする。 温度が低すぎるとエポキシブリ ー ドアウ ト効果が低く 、 温度が高す ぎてもそれ以上の効果は期待することができないため好ま しく ない。 また、 エポキシブリ ー ドアウ ト防止方法は、 エポキシブリ ー ドアウ ト防止剤溶 液に配線基材を浸漬するかまたはエポキシブリー ドアウ ト防止剤溶液を基材に散 布 (シャ ワー、 スプ レー等) するなどして接触させた後、 水洗、 乾燥すれば良い。 また、 エポキシブリー ドアゥ ト防止剤の主成分である上記有機化合物を変色防 止剤ゃ封孔処理剤に添加することによつても同様の効果を発揮する ことができる。 上記のよ う なエポキシブリー ドアウ ト防止処理を行う こと によって、 配線基材 表面のめつき面には上記有機化合物が吸着し、 1 〜数分子程度の厚さの有機化合 物からなる被膜が形成される。 そのため、 めっき面とエポキシ樹脂との接触角を 增加させ、 エポキシ樹脂の滲み出 しを抑制することが可能となる。 なお、 吸着す る有機化合物の被膜は非常に薄いため、 ワイヤ一ボンディ ング性、 モールディ ン グ性等のアセンブリ特性には悪影響を与えない。 また、 変色防止効果ゃ封孔処理 効果'を損なう こ と もない。 The temperature of the epoxy bleedout inhibitor solution should be 580 ° C, preferably 10 to 50 ° C. If the temperature is too low, the epoxy bleed-out effect is low, and if the temperature is too high, no further effect can be expected, which is not preferable. The method for preventing epoxy bleed out is to immerse the wiring substrate in an epoxy bleed out inhibitor solution or to spray the epoxy bleed out inhibitor solution onto the substrate (shower, spray, etc.). After contacting with water, wash and dry. Further, the same effect can be exerted by adding the above-mentioned organic compound which is a main component of the epoxy bleeding inhibitor to the discoloration inhibitor and the sealing agent. By performing the above-described epoxy bleed out prevention treatment, the above organic compound is adsorbed on the adhered surface of the wiring base material, and a film made of an organic compound having a thickness of about one to several molecules is formed. Is done. Therefore, it is possible to increase the contact angle between the plating surface and the epoxy resin, and to suppress the bleeding of the epoxy resin. Since the organic compound film to be adsorbed is very thin, it does not adversely affect the assembly characteristics such as wire bonding and molding. In addition, the effect of preventing discoloration and the effect of sealing treatment are not impaired.
上記の方法によってエポキシブリー ドアウ ト防止処理を施した配線基材および 半導体パッケージも本発明に包含される。 Wiring substrates and semiconductor packages that have been subjected to the epoxy bleedout prevention treatment by the above method are also included in the present invention.
実施例 Example
以下、 実施例に基づいて説明するが、 本発明はこれらの実施例に限定されるも のではない。 Hereinafter, the present invention will be described based on examples, but the present invention is not limited to these examples.
(実施例 1〜 1 5 ) (Examples 1 to 15)
銅合金 (Cu : 97. 7%-S n : 2. 0%-N i : 0. 2%-Ρ : 0 · 03%) 製リー ドフ レーム基材に密着性 上昇のために下地として銅ス トライクめつきを行った後、 ノ ッ ド部とイ ンナ一リ — ド部の一部にスポッ ト銀めっきまたはリー ドフレーム全面に銅めつき、 金めつ き、 パラジウムめっきのいずれかを施した。 Copper alloy (Cu: 97.7% -Sn: 2.0% -Ni: 0.2% -Ρ: 0 · 03%) After performing the trike plating, the tip part and inner part are plated with silver on the spot or copper plating, gold plating or palladium plating on the entire lead frame. did.
その後、 表 1 〜表 3 に記載したエポキシプリ一 ドアゥ ト防止処理を行った。 【表 1 】 After that, the epoxy pre-drying prevention treatment described in Tables 1 to 3 was performed. 【table 1 】
エポキシブリードアゥト評価 Epoxy bleed-art evaluation
O: 0 II m , 厶:≤ 1 0 0 y m X 0 0 « m 変色防止効果の評価 O: 0 II m, m: ≤ 1 0 0 y m X 0 0 «m Evaluation of discoloration prevention effect
〇:変色なし, X :変色あり 〇: No discoloration, X: Discoloration
封孔処理効果の評価 Evaluation of sealing effect
O:腐食なし、 X :腐食あり 【表 2 】 O: No corrosion, X: Corrosion [Table 2]
エポキシブリードアゥ卜評価 Epoxy bleed-out evaluation
0: 0 « m . Δ:≤ 1 0 0 u X :≥ 1 0 0 w m 変色防止効果の評価 0: 0 «m. Δ: ≤ 1 0 0 u X: ≥ 1 0 0 w m Evaluation of discoloration prevention effect
〇:変色なし, X :変色あり 〇: No discoloration, X: Discoloration
封孔処理効果の評価 Evaluation of sealing effect
0:腐盘なし、 X :腐食あり 【表 3 】 0: No corrosion, X: Corrosion [Table 3]
O: 0 M m , Δ:≤ 1 0 0 w m 1 0 0 w 変色防止効¾の評価 O: 0 M m, Δ: ≤ 1 0 0 w m 1 0 0 w Evaluation of discoloration prevention effect
〇: ¾色なし、 X :変色あり 〇: No color, X: Discolored
封孔処理効果の評価 Evaluation of sealing effect
〇:腐 なし, X :腐食あり なお、 このエポキシブリー ドアウ ト防止処理を行う前に、 一部の試料について は、 変色防止処理または封孔処理を行った。 〇: No rot, X: Corrosion Before the epoxy bleed out prevention treatment, some samples were subjected to a discoloration prevention treatment or a sealing treatment.
変色防止処理は、 下記の条件で行った。 The discoloration prevention treatment was performed under the following conditions.
変色防止液 : 主成分 ベンゾ ト リアゾ一ル 0 g / L Anti-tarnish liquid: Main component Benzotriazole 0 g / L
p H : 9 - 0 pH: 9-0
浴温 : 2 5 °C Bath temperature: 25 ° C
時間 : 1 0 s Time: 10 s
方法 : 浸漬 Method: Immersion
また、 封孔処理は、 下記の条件で行った。 The sealing treatment was performed under the following conditions.
封孔処理液 主成分 ト リエタノールァ ミ ン 0 g / L Sealing solution Main component Triethanolamine 0 g / L
P H 9 . 0 P H 9.0
浴温 2 5 °C Bath temperature 25 ° C
時間 1 0 s Time 1 0 s
方法 浸漬 Method Immersion
これらの基材について、 ダイボンディ ング、 ワイヤーボンディ ングを行い、 ェ ポキシプリ一 ドアウ ト、 ワイヤーボンディ ング特性、 モ一ルディ ング特性の評価 を行った。 Die-bonding and wire-bonding were performed on these base materials, and epoxide pre-dout, wire-bonding characteristics, and molding characteristics were evaluated.
エポキシブリ ー ドアゥ トの評価は、 下記の方法で行った。 The evaluation of the epoxy bleed was performed by the following method.
市販の低応力ダイ ボンディ ング用エポキシ樹脂をめつき面に塗布後、 2 0 0 °C, 6 0 m i n加熱硬化した後、 エポキシ塗布部を顕微鏡 ( 3 0倍) で観察し、 ェポ キシブリ ー ドアゥ ト量を測定した。 After applying a commercially available epoxy resin for low stress die bonding to the plated surface, heat-curing at 200 ° C for 60 min, observe the epoxy-applied part with a microscope (30 times), and use epoxy resin. The door lift was measured.
ワイヤーボンディ ング特性の評価は、 下記の方法で行った。 The evaluation of the wire bonding characteristics was performed by the following method.
超音波併用熱圧着方式 (温度 : 2 0 0 ° (:、 荷重 : 5 0 g、 時間 :. 1 0 m S ) で ワイヤ一ボンディ ングを行った後、 ブルテスターでプル強度を測定した。 After bonding the wires with a thermocompression bonding method using ultrasonic waves (temperature: 200 ° (:, load: 50 g, time: .10 ms)), the pull strength was measured with a bull tester.
モールディ ング特性の評価は、 下記の方法で行った。 The evaluation of the molding characteristics was performed by the following method.
市販のモールディ ング用エポキシ樹脂をめつき面に塗布後、 1 7 5 °C、 5 h加 熱硬化した後、 シェア強度を測定した。 After applying a commercially available epoxy resin for molding to the surface to be plated, it was cured by heating at 175 ° C for 5 hours, and the shear strength was measured.
さ らに、 変色防止処理または封孔処理を行った試料については変色防止効果ま たは封孔処理効果についての評価を行った。 変色防止効果の評価は、 スポッ ト銀めっき品ではスポッ トめっき部及び銅ス ト ライクめつき部について、 全面めつき品についてはめっき部について下記の方法 で行った。 In addition, the samples subjected to the discoloration prevention treatment or the sealing treatment were evaluated for the discoloration prevention effect or the sealing treatment effect. The discoloration prevention effect was evaluated by the following method for spot-plated parts and copper strike-plated parts for spot silver-plated products, and for plated parts for whole-plated products.
煮沸純水中に 1 O m i n浸漬後のめっき表面を目視観察した。 The plating surface after immersion in 1 O min in boiling pure water was visually observed.
封孔処理効果の評価は、 スポッ トめっき品、 全面めつき品のいずれも、 めっき 面について下記の方法で行った。 The evaluation of the sealing effect was performed on the plated surface of each of the spot-plated product and the fully-plated product by the following method.
下記の人工汗液に 4 0 °C、 2 4 h浸漬後のめっき表面を目視観察した。 The plating surface after immersion in the following artificial sweat solution at 40 ° C. for 24 hours was visually observed.
人工汗液組成 Artificial sweat composition
塩化ナ ト リ ウム : 9. 9 g / L Sodium chloride: 9.9 g / L
硫化ナ ト リ ウム : 0. 8 g / L Sodium sulfide: 0.8 g / L
尿素 : 1 . 7 g / L Urea: 1.7 g / L
乳酸 : 1 . 1 m L / L Lactic acid: 1.1 mL / L
アンモニア水 : 0. 2 7 m L / L Ammonia water: 0.27 mL / L
P H : 5 PH: 5
これらの結果を表 1 3に併せて示す。 The results are shown in Table 13.
(実施例 1 6〜 2 0 ) (Examples 16 to 20)
鋦合金 (.Cu:97.7%-Sn:2.0%-Ni:0.2%-Ρ:0· 03%) 製リ ー ドフ レーム基材に銀めつ き、 金めつき、 銅めつき、 またはパラジウムめっきのいずれかを施した。 鋦 Alloy (.Cu: 97.7% -Sn: 2.0% -Ni: 0.2% -Ρ: 0 03%) Lead frame base material with silver, gold, copper, or palladium plating Was applied.
これらの配線基材に対して、 変色防止処理または封孔処理を行った。 その際、 表 4に記載するよ う に変色防止液または封孔処理液に本発明のエポキシプリ一 ド ァゥ ト防止剤を添加した。 These wiring substrates were subjected to a discoloration prevention treatment or a sealing treatment. At that time, as described in Table 4, the epoxy predite inhibitor of the present invention was added to the discoloration preventing solution or the sealing treatment solution.
【表 4】 [Table 4]
エポキシブリードアゥ卜評 Epoxy bleed-out comment
0: 0 w m , Δ:≤ 1 0 0 w m X :≥ 1 0 0 / 変色防止効果の評価 0: 0 w m, Δ: ≤ 1 0 0 w m X: ≥ 1 0 0 / Evaluation of discoloration prevention effect
〇:変色なし、 X :変色あり 〇: No discoloration, X: Discoloration
封孔処理効架の評価 Evaluation of sealing effect
O:腐食なし, X :腐食あり これらの基材についてダイボンディ ング、 ワイ ヤ一ボンディ ングを行い、 実施 例 1〜 1 5 と同様にエポキシブリー ドアウ ト、 ワイ ヤーボンディ ング特性、 モ一 ルディ ング特性、 及び変色防止効果または封孔処理効果についての評価を行った, これらの結果を表 4に併せて示す。 O: No corrosion, X: Corrosion Die-bonding and wire-bonding were performed on these base materials, and epoxy bleed-out, wire-bonding properties, molding properties, and a discoloration preventing or sealing effect were performed in the same manner as in Examples 1 to 15. Was evaluated. Table 4 shows the results.
(比較例 1 〜 5 ) (Comparative Examples 1 to 5)
銅合金 (Cu:97.7%- Sn:2.0%-Ni:0.2%-Ρ:0· 03%) 製リー ドフ レーム基 '材に銀めつ き、 金めつき、 銅めつき、 またはパラジウムめっきのいずれかを施した。 Copper alloy (Cu: 97.7%-Sn: 2.0% -Ni: 0.2% -Ρ: 0 03%) lead frame base material with silver, gold, copper or palladium plating Either was given.
—部の試料については、 変色防止処理または封孔処理を行った。 The sample in the — part was subjected to a discoloration prevention treatment or a sealing treatment.
変色防止処理は、 下記の条件で行った。 The discoloration prevention treatment was performed under the following conditions.
変色防止液 : 主成分 ベンゾ ト リ アゾ一ル 0. g Z L Anti-discoloration liquid: Main component Benzotriazole 0. g ZL
ρ Η : 9. 0 ρ 9.: 9.0
浴温 : 2 5 Bath temperature: 2 5
時間 : 1 0 s Time: 10 s
方法 : 浸漬 Method: Immersion
また、 封孔処理は、 下記の条件で行った。 The sealing treatment was performed under the following conditions.
封孔処理液 主成分 ト リ エタ ノ ールァ ミ ン 0 g / L Sealing solution Main ingredient Triethanolamine 0 g / L
P H 9. 0 P H 9.0
浴温 2 5 °C Bath temperature 25 ° C
時間 1 0 s Time 1 0 s
方法 浸漬 Method Immersion
これらの基材についてダイボンディ ング、 ワイヤ一ボンディ ングを行い、 実施 例と同様にエポキシプリ一 ドアウ ト、 ワイヤ一ボンディ ング特性、 モールディ ン グ特性、 及び変色防止効果または封孔処理効果についての評価を行った。 Die-bonding and wire-bonding were performed on these substrates, and evaluation of epoxy pre-out, wire-bonding characteristics, molding characteristics, and the effect of preventing discoloration or sealing treatment was performed in the same manner as in the examples. went.
これらの結果を表 5 に併せて示す。 【表 5 】 The results are shown in Table 5. [Table 5]
エポキシブリードアゥト評価 Epoxy bleed-art evaluation
0: 0 t m , 厶:≤ 1 0 0 m X :≥ 1 0 0 μ m 変色防止効果の評価 0: 0 t m, mm: ≤ 100 m X: ≥ 100 μm Evaluation of discoloration prevention effect
〇:変色なし, X:変色あり 〇: No discoloration, X: Discoloration
封孔処理効果の評価 Evaluation of sealing effect
O :腐食なし、 X O: No corrosion, X
(結果) (Result)
本発明のエポキシプリ 一 ドアゥ ト防止剤を用いてエポキシブリー ドアゥ ト防止 処理を行った配線基材 (実施例 1〜 1 5 ) は、 ダイ ボンディ ング工程においてェ ポキシブリー ドアウ トの発生は見られなかった。 また、 変色防止液または封孔処 理液に本発明のエポキシブリー ドアウ ト防止剤を添加した場合 (実施例 1 6〜 2 0 ) も同様に、 ダイボンディ ング工程においてエポキシプリ 一 ドアウ トの発生は 見られなかった。 実施例のいずれの場合においてもワイヤーボンディ ング特性、 モールディ ング特性は良好であった。 変色防止効果または封孔処理効果を行った 基材は期待された通り の変色防止効果、 封孔処理効果を有していた。 In the wiring base material (Examples 1 to 15) on which the epoxy bleeding prevention treatment was performed using the epoxy pre-dipping prevention agent of the present invention, generation of epoxy bleedout was not observed in the die bonding step. Was. Similarly, when the epoxy bleedout inhibitor of the present invention was added to the anti-tarnish solution or the sealing solution (Examples 16 to 20), the occurrence of epoxy pre-dout in the die bonding step was also reduced. I couldn't see it. In all of the examples, the wire bonding characteristics and the molding characteristics were good. The base material having the discoloration preventing effect or the sealing treatment effect had the expected discoloration preventing effect and the sealing treatment effect.
—方、 エポキシブリー ドアウ ト防止処理を行わなかった場合 (比較例 1〜 5 ) には、 ダイボンディ ング工程におけるエポキシブリ ー ドアゥ トの発生が観察され た。 発明の効果 On the other hand, when the epoxy bleed out prevention treatment was not performed (Comparative Examples 1 to 5), the occurrence of epoxy bleed out in the die bonding step was observed. The invention's effect
本発明のエポキシブリ一 ドアゥ ト防止剤を用いてリー ドフ レーム、 ブリ ン ト配 練板等の半導体装置表面にエポキシプリ— ドアゥ ト防止機能を有する有機化合物 を吸着させるエポキシブリー ドアゥ ト防止処理を行う ことによって、 変色防止効 果ゃ封孔処理効果を損な う ことなく ダイボンディ ング工程におけるエポキシブリ 一ドアゥ トを防止するこ とが可能である。 また、 ワイ ヤ一ボンディ ング特性ゃモ —ルディング性等のアセンブリ特性にも悪影響を与えることがない。 An epoxy bleeding prevention treatment for adsorbing an organic compound having an epoxy prepreg prevention function onto the surface of a semiconductor device such as a lead frame or a brim kneading plate using the epoxy bleeding preventing agent of the present invention. By doing so, it is possible to prevent epoxy bridging in the die bonding step without impairing the discoloration prevention effect and the sealing effect. Also, there is no adverse effect on wire bonding characteristics and assembly characteristics such as molding characteristics.
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP36660597A JP3343210B2 (en) | 1997-12-26 | 1997-12-26 | Epoxy bleed-out inhibitor and prevention method |
| JP9/366605 | 1997-12-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO1999034434A1 true WO1999034434A1 (en) | 1999-07-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP1998/005897 Ceased WO1999034434A1 (en) | 1997-12-26 | 1998-12-25 | Epoxy bleeding inhibitor and method of preventing epoxy bleeding |
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|---|---|
| JP (1) | JP3343210B2 (en) |
| KR (1) | KR100337396B1 (en) |
| CN (1) | CN1247633A (en) |
| TW (1) | TW396465B (en) |
| WO (1) | WO1999034434A1 (en) |
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| MY157869A (en) | 2006-01-17 | 2016-07-29 | Jx Nippon Mining & Metals Corp | Preventing agent for epoxy resin bleeding out |
| KR101076118B1 (en) * | 2007-05-21 | 2011-10-21 | 닛코킨조쿠 가부시키가이샤 | Resin-bleedout preventing agent and method for preventing resin-bleedout |
| MY163131A (en) * | 2009-12-17 | 2017-08-15 | Jx Nippon Mining & Metals Corp | Resin-bleedout preventing agent |
| KR102190964B1 (en) | 2014-03-18 | 2020-12-15 | 해성디에스 주식회사 | Bleed-out preventing agent, composition for preventing bleed-out including the same and method for preventing bleed-out |
| JPWO2020085372A1 (en) * | 2018-10-24 | 2021-09-02 | 住友ベークライト株式会社 | Conductive resin compositions and semiconductor devices |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0669257A (en) * | 1992-08-21 | 1994-03-11 | Hitachi Chem Co Ltd | Adhesive for semiconductor element and semiconductor device |
| JPH09165566A (en) * | 1995-12-14 | 1997-06-24 | Sumitomo Bakelite Co Ltd | Die bonding material |
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1997
- 1997-12-26 JP JP36660597A patent/JP3343210B2/en not_active Expired - Lifetime
-
1998
- 1998-12-23 TW TW087121498A patent/TW396465B/en not_active IP Right Cessation
- 1998-12-25 WO PCT/JP1998/005897 patent/WO1999034434A1/en not_active Ceased
- 1998-12-25 KR KR1019997006125A patent/KR100337396B1/en not_active Expired - Lifetime
- 1998-12-25 CN CN98802475A patent/CN1247633A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0669257A (en) * | 1992-08-21 | 1994-03-11 | Hitachi Chem Co Ltd | Adhesive for semiconductor element and semiconductor device |
| JPH09165566A (en) * | 1995-12-14 | 1997-06-24 | Sumitomo Bakelite Co Ltd | Die bonding material |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3343210B2 (en) | 2002-11-11 |
| JPH11195662A (en) | 1999-07-21 |
| CN1247633A (en) | 2000-03-15 |
| KR20000069912A (en) | 2000-11-25 |
| TW396465B (en) | 2000-07-01 |
| KR100337396B1 (en) | 2002-05-22 |
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