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WO1998052012A3 - Measuring device and method for cleaning contaminated areas of a measuring device - Google Patents

Measuring device and method for cleaning contaminated areas of a measuring device Download PDF

Info

Publication number
WO1998052012A3
WO1998052012A3 PCT/EP1998/002722 EP9802722W WO9852012A3 WO 1998052012 A3 WO1998052012 A3 WO 1998052012A3 EP 9802722 W EP9802722 W EP 9802722W WO 9852012 A3 WO9852012 A3 WO 9852012A3
Authority
WO
WIPO (PCT)
Prior art keywords
measuring device
contaminated areas
sample input
input device
cleaning contaminated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP1998/002722
Other languages
German (de)
French (fr)
Other versions
WO1998052012A2 (en
Inventor
Horst-Henning Grotheer
Harald Oser
Reinhold Thanner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Deutsches Zentrum fuer Luft und Raumfahrt eV
Original Assignee
Deutsches Zentrum fuer Luft und Raumfahrt eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsches Zentrum fuer Luft und Raumfahrt eV filed Critical Deutsches Zentrum fuer Luft und Raumfahrt eV
Publication of WO1998052012A2 publication Critical patent/WO1998052012A2/en
Publication of WO1998052012A3 publication Critical patent/WO1998052012A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0029—Cleaning of the detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28—Electrolytic cell components
    • G01N27/30—Electrodes, e.g. test electrodes; Half-cells
    • G01N27/38—Cleaning of electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32—Processing objects by plasma generation

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Molecular Biology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biomedical Technology (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)

Abstract

The invention relates to a measuring device comprising a measuring apparatus especially for gaseous samples and a sample input device by means of which samples can be introduced into the measuring device. To improve such a device in such a way as to ensure that the measurement and/or analysis results of the measuring apparatus are not influenced by possible contamination, the invention provides for the sample input device to be fitted with a cleaning device for cleaning contaminated areas of the sample input device by transforming impurities in said contaminated areas by a chemical reaction, and for the reaction products to be removed from the sample input device.
PCT/EP1998/002722 1997-05-12 1998-05-09 Measuring device and method for cleaning contaminated areas of a measuring device Ceased WO1998052012A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19719903.8 1997-05-12
DE1997119903 DE19719903A1 (en) 1997-05-12 1997-05-12 Measuring device and method for cleaning contamination areas of a measuring device

Publications (2)

Publication Number Publication Date
WO1998052012A2 WO1998052012A2 (en) 1998-11-19
WO1998052012A3 true WO1998052012A3 (en) 1999-04-01

Family

ID=7829262

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP1998/002722 Ceased WO1998052012A2 (en) 1997-05-12 1998-05-09 Measuring device and method for cleaning contaminated areas of a measuring device

Country Status (2)

Country Link
DE (1) DE19719903A1 (en)
WO (1) WO1998052012A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10061828B4 (en) * 2000-12-12 2011-03-31 Plasmatreat Gmbh Method for introducing material into a plasma jet and plasma nozzle for carrying out the method
DE102005054605B4 (en) * 2005-11-16 2010-09-30 Bruker Daltonik Gmbh Automatic cleaning of ion sources
DE202008008729U1 (en) * 2008-07-02 2009-11-19 Melitta Haushaltsprodukte Gmbh & Co. Kg Device for cleaning objects
DE202008008731U1 (en) 2008-07-02 2009-11-19 Melitta Haushaltsprodukte Gmbh & Co. Kg Arrangement for the production of plasma
CN106324197B (en) * 2016-08-22 2018-03-23 芜湖市神龙新能源科技有限公司 A kind of atmosphere pollution detection means for being easy to cleaning
CN108802290A (en) * 2018-06-22 2018-11-13 温州市骐邦环保科技有限公司 A kind of atmosphere pollution detection device convenient for cleaning

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3516158A1 (en) * 1985-05-06 1986-11-06 Grün Optik Wetzlar GmbH, 6330 Wetzlar Dissociation chamber for splitting off atomic mercury
EP0280539A1 (en) * 1987-02-24 1988-08-31 Semiconductor Energy Laboratory Co., Ltd. A method of removing undesired carbon deposits from the inside of a CVD reaction chamber
US4956024A (en) * 1988-01-11 1990-09-11 The Perkin Elmer Corporation Non-contacting method of cleaning surfaces with a planoar gas bearing
DE4030130A1 (en) * 1990-09-24 1992-04-02 Hartmann & Braun Ag Flue gas pretreatment appts. - for removing sulphur di:oxide prior to di:nitrogen oxide analysis
DE4302657C1 (en) * 1993-01-30 1994-03-03 Holstein & Kappert Maschf Detecting contaminants in containers, e.g. reusable bottles - removing air from container on conveyor and analysing it in pre=sensor and mass spectrometer.
US5364795A (en) * 1993-06-11 1994-11-15 The United States Of America As Represented By The Secretary Of The Army Laser-based detection of nitro-containing compounds
US5517943A (en) * 1993-12-16 1996-05-21 Mitsubishi Denki Kabushiki Kaisha Vacuum CVD apparatus
DE4441972A1 (en) * 1994-11-25 1996-08-14 Deutsche Forsch Luft Raumfahrt Detecting sample molecules in carrier gas with continuum and molecular jet zones

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1468934A (en) * 1965-11-22 1967-02-10 Lafarge Ciments Sa Continuous dosing of the elements of mixtures, and in particular of cement raw materials
GB1382254A (en) * 1971-02-05 1975-01-29 Pye Ltd Flame spectrometry apparatus
DE2433690C2 (en) * 1974-07-12 1984-04-26 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Device for the surface treatment of a metallographic sample
DD114865A1 (en) * 1974-08-14 1975-08-20
DE2732746A1 (en) * 1977-07-20 1979-03-01 Leybold Heraeus Gmbh & Co Kg Separation and isolation of substances - using gas chromatographic sepn. column and secondary ion mass spectrometer
JPS59109840A (en) * 1982-12-16 1984-06-25 Hitachi Koki Co Ltd Method for pretreating biological sample for scanning type electron microscope
DE4031020A1 (en) * 1990-10-01 1992-04-02 Bela Medvey Analysis sample prepn. appts. - has microwave source for selective sample constituent evapn. from solvent
DE19519890A1 (en) * 1995-05-31 1996-07-11 Bosch Gmbh Robert Electromagnetically operated valve, e.g. for motor vehicle automatic transmission

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3516158A1 (en) * 1985-05-06 1986-11-06 Grün Optik Wetzlar GmbH, 6330 Wetzlar Dissociation chamber for splitting off atomic mercury
EP0280539A1 (en) * 1987-02-24 1988-08-31 Semiconductor Energy Laboratory Co., Ltd. A method of removing undesired carbon deposits from the inside of a CVD reaction chamber
US4956024A (en) * 1988-01-11 1990-09-11 The Perkin Elmer Corporation Non-contacting method of cleaning surfaces with a planoar gas bearing
DE4030130A1 (en) * 1990-09-24 1992-04-02 Hartmann & Braun Ag Flue gas pretreatment appts. - for removing sulphur di:oxide prior to di:nitrogen oxide analysis
DE4302657C1 (en) * 1993-01-30 1994-03-03 Holstein & Kappert Maschf Detecting contaminants in containers, e.g. reusable bottles - removing air from container on conveyor and analysing it in pre=sensor and mass spectrometer.
US5364795A (en) * 1993-06-11 1994-11-15 The United States Of America As Represented By The Secretary Of The Army Laser-based detection of nitro-containing compounds
US5517943A (en) * 1993-12-16 1996-05-21 Mitsubishi Denki Kabushiki Kaisha Vacuum CVD apparatus
DE4441972A1 (en) * 1994-11-25 1996-08-14 Deutsche Forsch Luft Raumfahrt Detecting sample molecules in carrier gas with continuum and molecular jet zones

Also Published As

Publication number Publication date
WO1998052012A2 (en) 1998-11-19
DE19719903A1 (en) 1998-11-19

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