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WO1997021224A3 - Eeprom and method of controlling same - Google Patents

Eeprom and method of controlling same Download PDF

Info

Publication number
WO1997021224A3
WO1997021224A3 PCT/DE1996/002239 DE9602239W WO9721224A3 WO 1997021224 A3 WO1997021224 A3 WO 1997021224A3 DE 9602239 W DE9602239 W DE 9602239W WO 9721224 A3 WO9721224 A3 WO 9721224A3
Authority
WO
WIPO (PCT)
Prior art keywords
memory cells
eeprom
word lines
erasing
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE1996/002239
Other languages
German (de)
French (fr)
Other versions
WO1997021224A2 (en
Inventor
Holger Sedlak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Siemens Corp
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Priority to EP96946005A priority Critical patent/EP0808500B1/en
Priority to AT96946005T priority patent/ATE222020T1/en
Priority to DE59609541T priority patent/DE59609541D1/en
Publication of WO1997021224A2 publication Critical patent/WO1997021224A2/en
Priority to US08/907,211 priority patent/US5963478A/en
Publication of WO1997021224A3 publication Critical patent/WO1997021224A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0416Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0433Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • Electrotherapy Devices (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)

Abstract

The EEPROM has several memory cells arranged in a memory cell region. The memory cells are accessed via word, bit and source lines for writing, reading out and erasing of data. The memory is divided into groups by memory cells accessed via individual word lines. A separate source line is provided for each group. The EEPROM is operated by group writing, readout, and/or erasing of data via individual word lines. The word lines are composed of a selection line and a control line. The memory cells are composed of a selection transistor and a storage transistor with their drains connected to each other.
PCT/DE1996/002239 1995-12-06 1996-11-21 Eeprom and method of controlling same Ceased WO1997021224A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP96946005A EP0808500B1 (en) 1995-12-06 1996-11-21 Eeprom and method of controlling same
AT96946005T ATE222020T1 (en) 1995-12-06 1996-11-21 EEPROM AND METHOD FOR CONTROLLING THE SAME
DE59609541T DE59609541D1 (en) 1995-12-06 1996-11-21 EEPROM AND METHOD FOR CONTROLLING THE SAME
US08/907,211 US5963478A (en) 1995-12-06 1997-08-06 EEPROM and method of driving the same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19545523A DE19545523C2 (en) 1995-12-06 1995-12-06 EEPROM and method for controlling the same
DE19545523.1 1995-12-06

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US08/907,211 Continuation US5963478A (en) 1995-12-06 1997-08-06 EEPROM and method of driving the same

Publications (2)

Publication Number Publication Date
WO1997021224A2 WO1997021224A2 (en) 1997-06-12
WO1997021224A3 true WO1997021224A3 (en) 1997-08-07

Family

ID=7779359

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE1996/002239 Ceased WO1997021224A2 (en) 1995-12-06 1996-11-21 Eeprom and method of controlling same

Country Status (6)

Country Link
EP (2) EP0808500B1 (en)
AT (2) ATE259536T1 (en)
DE (3) DE19545523C2 (en)
ES (2) ES2215838T3 (en)
IN (1) IN190505B (en)
WO (1) WO1997021224A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8320191B2 (en) 2007-08-30 2012-11-27 Infineon Technologies Ag Memory cell arrangement, method for controlling a memory cell, memory array and electronic device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0387889A2 (en) * 1989-03-17 1990-09-19 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory
US5033023A (en) * 1988-04-08 1991-07-16 Catalyst Semiconductor, Inc. High density EEPROM cell and process for making the cell
DE4233248A1 (en) * 1991-11-07 1993-05-13 Mitsubishi Electric Corp NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE WHICH CAN DELETE DATA IN BLOCKS, AND BLOCK-BASED DATA DELETION METHOD IN A NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE
EP0637035A1 (en) * 1993-07-29 1995-02-01 STMicroelectronics S.r.l. Circuit structure for a memory matrix and corresponding manufacturing method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5065364A (en) * 1989-09-15 1991-11-12 Intel Corporation Apparatus for providing block erasing in a flash EPROM

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5033023A (en) * 1988-04-08 1991-07-16 Catalyst Semiconductor, Inc. High density EEPROM cell and process for making the cell
EP0387889A2 (en) * 1989-03-17 1990-09-19 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory
DE4233248A1 (en) * 1991-11-07 1993-05-13 Mitsubishi Electric Corp NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE WHICH CAN DELETE DATA IN BLOCKS, AND BLOCK-BASED DATA DELETION METHOD IN A NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE
EP0637035A1 (en) * 1993-07-29 1995-02-01 STMicroelectronics S.r.l. Circuit structure for a memory matrix and corresponding manufacturing method

Also Published As

Publication number Publication date
DE19545523C2 (en) 2001-02-15
DE59610916D1 (en) 2004-03-18
DE19545523A1 (en) 1997-06-26
WO1997021224A2 (en) 1997-06-12
IN190505B (en) 2003-08-02
ES2181934T3 (en) 2003-03-01
EP0808500A2 (en) 1997-11-26
ES2215838T3 (en) 2004-10-16
ATE259536T1 (en) 2004-02-15
ATE222020T1 (en) 2002-08-15
EP1191541A2 (en) 2002-03-27
DE59609541D1 (en) 2002-09-12
EP1191541A3 (en) 2002-08-14
EP0808500B1 (en) 2002-08-07
EP1191541B1 (en) 2004-02-11

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