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WO1988002847A3 - Mesure du contour de surfaces par des techniques de moirage a plage etendue - Google Patents

Mesure du contour de surfaces par des techniques de moirage a plage etendue Download PDF

Info

Publication number
WO1988002847A3
WO1988002847A3 PCT/US1987/002563 US8702563W WO8802847A3 WO 1988002847 A3 WO1988002847 A3 WO 1988002847A3 US 8702563 W US8702563 W US 8702563W WO 8802847 A3 WO8802847 A3 WO 8802847A3
Authority
WO
WIPO (PCT)
Prior art keywords
priori knowledge
extended
range
location
moire contouring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US1987/002563
Other languages
English (en)
Other versions
WO1988002847A2 (fr
Inventor
John Edward Greivenkamp Jr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eastman Kodak Co
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of WO1988002847A2 publication Critical patent/WO1988002847A2/fr
Anticipated expiration legal-status Critical
Publication of WO1988002847A3 publication Critical patent/WO1988002847A3/fr
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)

Abstract

La plage de mesure du contour de surfaces par des techniques de moirage est étendue au-delà de la limite de fréquence de Nyquist en forçant la reconstruction d'un contour de surface en fonction d'une connaissance préalable de la surface. Dans un exemple, la connaissance préalable est que la surface est lisse et est décrite par une fonction possédant des dérivées continues, et l'emplacement d'une région où les variations de la surface sont inférieures à C/2 par échantillon. Dans un autre échantillon, la connaissance préalable est l'emplacement et la hauteur d'une discontinuité de pas inférieure ou égale à C/2, C étant l'intervalle de contour.
PCT/US1987/002563 1986-10-15 1987-10-08 Mesure du contour de surfaces par des techniques de moirage a plage etendue Ceased WO1988002847A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/918,950 US4794550A (en) 1986-10-15 1986-10-15 Extended-range moire contouring
US918,950 1986-10-15

Publications (2)

Publication Number Publication Date
WO1988002847A2 WO1988002847A2 (fr) 1988-04-21
WO1988002847A3 true WO1988002847A3 (fr) 1989-07-13

Family

ID=25441216

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1987/002563 Ceased WO1988002847A2 (fr) 1986-10-15 1987-10-08 Mesure du contour de surfaces par des techniques de moirage a plage etendue

Country Status (4)

Country Link
US (1) US4794550A (fr)
EP (1) EP0327567A1 (fr)
JP (1) JPH02500217A (fr)
WO (1) WO1988002847A2 (fr)

Families Citing this family (105)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2624600B1 (fr) * 1987-12-09 1990-04-13 Snecma Procede et dispositif de controle de contours geometriques sans contact
US5243542A (en) * 1987-12-29 1993-09-07 Asahi Kogaku Kogyo Kabushiki Kaisha Interferometer employing reference images
CA1313040C (fr) * 1988-03-31 1993-01-26 Mitsuaki Uesugi Methode et dispositif de mesure dans les trois dimensions d'objets a surface courbe
JPH061167B2 (ja) * 1988-05-17 1994-01-05 日本鋼管株式会社 ３次元曲面形状の測定方法及び装置
US5130555A (en) * 1988-11-28 1992-07-14 Matsushita Electric Industrial Co., Ltd. Tape crease inspecting method and apparatus having a stripe shaped pattern reflection plate
US4988886A (en) * 1989-04-06 1991-01-29 Eastman Kodak Company Moire distance measurement method and apparatus
FR2664377A1 (fr) * 1990-07-03 1992-01-10 Bertin & Cie Appareil pour la determination de la forme tridimensionnelle d'un objet par voie optique sans contact.
US5069548A (en) * 1990-08-08 1991-12-03 Industrial Technology Institute Field shift moire system
US5075562A (en) * 1990-09-20 1991-12-24 Eastman Kodak Company Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface
US5075560A (en) * 1990-09-20 1991-12-24 Eastman Kodak Company Moire distance measurements using a grating printed on or attached to a surface
US5189493A (en) * 1990-11-02 1993-02-23 Industrial Technology Institute Moire contouring camera
US5309222A (en) * 1991-07-16 1994-05-03 Mitsubishi Denki Kabushiki Kaisha Surface undulation inspection apparatus
US5818957A (en) * 1991-10-08 1998-10-06 Computed Anatomy Incorporated Processing of keratoscopic images
US5796859A (en) * 1991-10-08 1998-08-18 Computed Anatomy Incorporated Processing of keratoscopic images employing local spatial phase
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
US5671042A (en) * 1992-02-18 1997-09-23 Illinois Institute Of Technology Holomoire strain analyzer
US5321497A (en) * 1992-03-09 1994-06-14 Wyko Corporation Interferometric integration technique and apparatus to confine 2π discontinuity
GB2265458A (en) * 1992-03-28 1993-09-29 Rover Group Multi-wavelength photoelastic stress analysis
JP2711042B2 (ja) * 1992-03-30 1998-02-10 シャープ株式会社 クリーム半田の印刷状態検査装置
US5311286A (en) * 1992-04-01 1994-05-10 Materials Technologies Corporation Apparatus and method for optically measuring a surface
GB9216743D0 (en) * 1992-08-07 1992-09-23 Epstein Ruth A device to calibrate adsolute size in endoscopy
US5319445A (en) * 1992-09-08 1994-06-07 Fitts John M Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications
US5307152A (en) * 1992-09-29 1994-04-26 Industrial Technology Institute Moire inspection system
US5870179A (en) * 1993-06-25 1999-02-09 The Regents Of The University Of Colorado Apparatus and method for estimating range
US5521695A (en) * 1993-06-25 1996-05-28 The Regents Of The University Of Colorado Range estimation apparatus and method
US5406375A (en) * 1993-07-23 1995-04-11 Grumman Aerospace Corporation Angular distortion measurements by moire fringe patterns
US5436462A (en) * 1993-12-21 1995-07-25 United Technologies Optical Systems Video contour measurement system employing moire interferometry having a beat frequency pattern
GB9405457D0 (en) * 1994-03-19 1994-05-04 British Aerospace Testing a metal component for cold compression of the metal
CA2172284C (fr) * 1994-08-08 1999-09-28 Richard J. Mammone Traitement d'images keratoscopiques par phase spatiale locale
US5615003A (en) * 1994-11-29 1997-03-25 Hermary; Alexander T. Electromagnetic profile scanner
US6911638B2 (en) 1995-02-03 2005-06-28 The Regents Of The University Of Colorado, A Body Corporate Wavefront coding zoom lens imaging systems
US20020118457A1 (en) * 2000-12-22 2002-08-29 Dowski Edward Raymond Wavefront coded imaging systems
US20020195548A1 (en) 2001-06-06 2002-12-26 Dowski Edward Raymond Wavefront coding interference contrast imaging systems
US7218448B1 (en) 1997-03-17 2007-05-15 The Regents Of The University Of Colorado Extended depth of field optical systems
US5680215A (en) * 1995-02-27 1997-10-21 Lockheed Missiles & Space Company, Inc. Vision inspection system and method
KR19990029064A (ko) * 1995-07-18 1999-04-15 낸시 엘. 후체슨 확장된 영상 깊이를 갖는 모아레 간섭 시스템 및 방법
US6705526B1 (en) 1995-12-18 2004-03-16 Metrologic Instruments, Inc. Automated method of and system for dimensioning objects transported through a work environment using contour tracing, vertice detection, corner point detection, and corner point reduction methods on two-dimensional range data maps captured by an amplitude modulated laser scanning beam
US20020014533A1 (en) 1995-12-18 2002-02-07 Xiaxun Zhu Automated object dimensioning system employing contour tracing, vertice detection, and forner point detection and reduction methods on 2-d range data maps
US5703680A (en) * 1996-01-16 1997-12-30 The Goodyear Tire & Rubber Company Method for dynamic interference pattern testing
US5646733A (en) * 1996-01-29 1997-07-08 Medar, Inc. Scanning phase measuring method and system for an object at a vision station
US5661559A (en) * 1996-03-14 1997-08-26 Phase Metrics, Inc. Optical surface detection for magnetic disks
US5847832A (en) * 1996-03-15 1998-12-08 Hughes Aircraft Company Moire topographic measurement
DE19643018B4 (de) * 1996-10-18 2010-06-17 Isra Surface Vision Gmbh Verfahren und Vorrichtung zum Messen des Verlaufs reflektierender Oberflächen
US5767959A (en) * 1997-03-28 1998-06-16 Nikon Corporation Lens distortion measurement using moire fringes
US6873340B2 (en) 1997-05-15 2005-03-29 Visimatix, Inc. Method and apparatus for an automated reference indicator system for photographic and video images
AU7720798A (en) * 1997-06-05 1998-12-21 Electronic Packaging Services Ltd. Co. Measuring surface flatness using shadow moire technology and phase-stepping image processing
US5988815A (en) * 1997-10-24 1999-11-23 Tomey Co., Ltd. Pattern illumination device
US5909271A (en) * 1997-10-24 1999-06-01 Computed Anatomy, Incorporated Device for performing ophthalmic procedures with improved alignment
USD427243S (en) * 1997-12-15 2000-06-27 Visimatix, Inc. Reference indicator patch for use in an automated reference indicator system for photographic and video images
DE19757791C2 (de) * 1997-12-29 2003-07-24 Deutsch Zentr Luft & Raumfahrt MoirE-Verfahren und MoirE-Anordnung zum Vermessen einer Oberfläche
US6438272B1 (en) * 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US6084712A (en) * 1998-11-03 2000-07-04 Dynamic Measurement And Inspection,Llc Three dimensional imaging using a refractive optic design
US6122062A (en) * 1999-05-03 2000-09-19 Fanuc Robotics North America, Inc. 3-D camera
CA2277855A1 (fr) * 1999-07-14 2001-01-14 Solvision Methode et systeme de mesure de la hauteur des billes de soudure d'un circuit imprime
US6268923B1 (en) * 1999-10-07 2001-07-31 Integral Vision, Inc. Optical method and system for measuring three-dimensional surface topography of an object having a surface contour
CA2301822A1 (fr) 2000-03-24 2001-09-24 9071 9410 Quebec Inc. Projection simultanee de plusieurs patrons avec acquisition simultanee pour l'inspection d'objets en trois dimensions
US6536898B1 (en) * 2000-09-15 2003-03-25 The Regents Of The University Of Colorado Extended depth of field optics for human vision
FR2817042B1 (fr) * 2000-11-22 2003-06-20 Saint Gobain Procede et dispositif d'analyse de la surface d'un substrat
US6873733B2 (en) 2001-01-19 2005-03-29 The Regents Of The University Of Colorado Combined wavefront coding and amplitude contrast imaging systems
US20020163573A1 (en) * 2001-04-11 2002-11-07 Bieman Leonard H. Imaging system
US6937350B2 (en) * 2001-06-29 2005-08-30 Massachusetts Institute Of Technology Apparatus and methods for optically monitoring thickness
GB0119036D0 (en) * 2001-08-06 2001-09-26 South Bank Univ Entpr Ltd Three dimensional imaging
US6842297B2 (en) 2001-08-31 2005-01-11 Cdm Optics, Inc. Wavefront coding optics
US7344082B2 (en) * 2002-01-02 2008-03-18 Metrologic Instruments, Inc. Automated method of and system for dimensioning objects over a conveyor belt structure by applying contouring tracing, vertice detection, corner point detection, and corner point reduction methods to two-dimensional range data maps of the space above the conveyor belt captured by an amplitude modulated laser scanning beam
GB0200819D0 (en) * 2002-01-15 2002-03-06 Cole Polytechnique Federale De Microscopy imaging apparatus and method for generating an image
US6667826B1 (en) 2002-03-01 2003-12-23 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Chromatic modulator for high resolution CCD or APS devices
US7286246B2 (en) * 2003-03-31 2007-10-23 Mitutoyo Corporation Method and apparatus for non-contact three-dimensional surface measurement
US20050219553A1 (en) * 2003-07-31 2005-10-06 Kelly Patrick V Monitoring apparatus
US7289224B2 (en) * 2003-09-15 2007-10-30 Zygo Corporation Low coherence grazing incidence interferometry for profiling and tilt sensing
WO2006044185A2 (fr) * 2004-10-13 2006-04-27 Akrometrix, Llc Systemes et procedes de mesure de planeite de surface echantillonnee d'echantillons en mouvement continu
US7557932B2 (en) * 2005-04-19 2009-07-07 Texas Instruments Incorporated Characterization of micromirror array devices using interferometers
US7630085B2 (en) * 2005-04-19 2009-12-08 Texas Instruments Incorporated Interferometers of high resolutions
US20060232784A1 (en) * 2005-04-19 2006-10-19 Regis Grasser Interferometers of high resolutions
US7489408B2 (en) * 2005-11-15 2009-02-10 General Electric Company Optical edge break gage
US7705970B2 (en) * 2006-06-05 2010-04-27 The Regents Of The University Of Colorado Method and system for optical imaging and ranging
WO2008033329A2 (fr) 2006-09-15 2008-03-20 Sciammarella Cesar A Système et procédé pour une analyse de déformations et de courbes de surfaces
US20080117438A1 (en) * 2006-11-16 2008-05-22 Solvision Inc. System and method for object inspection using relief determination
US20080129984A1 (en) * 2006-12-01 2008-06-05 Sol Focus, Inc. Inspection of optical elements
EP2063260A1 (fr) * 2007-11-19 2009-05-27 Lambda-X Système et procédé de déflectométrie de transformation de Fourier
KR100972640B1 (ko) * 2008-05-07 2010-07-30 선문대학교 산학협력단 모아레를 이용한 3차원 측정장치의 기준격자 획득방법 및장치
US8693742B2 (en) 2008-12-17 2014-04-08 The Regents Of The University Of Colorado Three-dimensional single-molecule fluorescence imaging beyond the diffraction limit using a double-helix point spread function
JP4715944B2 (ja) * 2009-04-03 2011-07-06 オムロン株式会社 三次元形状計測装置、三次元形状計測方法、および三次元形状計測プログラム
CA2771727C (fr) 2009-11-04 2013-01-08 Technologies Numetrix Inc. Dispositif et procede d'obtention de donnees de surface d'objet tridimensionnelles
JP5538936B2 (ja) * 2010-02-10 2014-07-02 キヤノン株式会社 解析方法、プログラム、記憶媒体、ｘ線位相イメージング装置
US8620065B2 (en) 2010-04-09 2013-12-31 The Regents Of The University Of Colorado Methods and systems for three dimensional optical imaging, sensing, particle localization and manipulation
CN102867328B (zh) * 2011-01-27 2014-04-23 深圳泰山在线科技有限公司 一种物体表面重建的系统
CN102831642B (zh) * 2011-01-27 2014-04-23 深圳泰山在线科技有限公司 一种物体表面重建的系统和方法
CN102867329B (zh) * 2011-01-27 2014-04-23 深圳泰山在线科技有限公司 一种物体表面重建的系统和方法
CA2872898A1 (fr) 2012-05-09 2013-11-14 Seagate Technology Llc Mappage de caracteristiques d'une surface
GB2518548B (en) 2012-06-22 2015-12-23 Univ Colorado Regents Imaging or measurement methods and systems
US9212900B2 (en) * 2012-08-11 2015-12-15 Seagate Technology Llc Surface features characterization
US9297751B2 (en) 2012-10-05 2016-03-29 Seagate Technology Llc Chemical characterization of surface features
US9297759B2 (en) 2012-10-05 2016-03-29 Seagate Technology Llc Classification of surface features using fluorescence
US9377394B2 (en) * 2012-10-16 2016-06-28 Seagate Technology Llc Distinguishing foreign surface features from native surface features
US9217714B2 (en) 2012-12-06 2015-12-22 Seagate Technology Llc Reflective surfaces for surface features of an article
WO2014144820A1 (fr) 2013-03-15 2014-09-18 The Regents Of The University Of Colorado Localisation et imagerie tridimensionnelles (3d) de réseaux denses de particules
US9274064B2 (en) 2013-05-30 2016-03-01 Seagate Technology Llc Surface feature manager
US9513215B2 (en) 2013-05-30 2016-12-06 Seagate Technology Llc Surface features by azimuthal angle
US9201019B2 (en) 2013-05-30 2015-12-01 Seagate Technology Llc Article edge inspection
US9217715B2 (en) 2013-05-30 2015-12-22 Seagate Technology Llc Apparatuses and methods for magnetic features of articles
WO2015031395A1 (fr) 2013-08-26 2015-03-05 The Regents Of The University Of Colorado Imagerie à travers des milieux de diffusion à rapport signal/bruit élevé et haute résolution
WO2016073785A1 (fr) 2014-11-05 2016-05-12 The Regents Of The University Of Colorado Suivi, télémétrie et/ou imagerie 3d à l'aide de l'ingénierie à fonction d'étalement de point et d'éclairage actif
JP6027220B1 (ja) * 2015-12-22 2016-11-16 Ckd株式会社 三次元計測装置
WO2020176394A1 (fr) * 2019-02-25 2020-09-03 Arizona Board Of Regents On Behalf Of The University Of Arizona Dispositifs, systèmes et procédés de déflectométrie
US20240426701A1 (en) * 2023-06-26 2024-12-26 Brookhaven Science Associates, Llc Collimated Phase Measuring Deflectometry

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4452534A (en) * 1981-09-01 1984-06-05 Gribanov Dmitry D Method of determining geometric parameters of object's surface and device therefor
EP0182469A1 (fr) * 1984-09-14 1986-05-28 New York Institute Of Technology Appareil et procédé de la génération d'une métrologie de profil superficiel et de contours de surface en trois dimensions

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3943278A (en) * 1974-08-22 1976-03-09 Stanford Research Institute Surface deformation gauging system by moire interferometry
DE2514930A1 (de) * 1975-04-05 1976-10-14 Opto Produkte Ag Verfahren zur optischen ermittlung und zum vergleich von formen und lagen von objekten
US4169980A (en) * 1977-04-19 1979-10-02 Zygo Corporation Method and apparatus for interference fringe center sensing
US4155098A (en) * 1977-06-28 1979-05-15 Rca Corporation Groove depth estimation system using diffractive groove effects
US4212073A (en) * 1978-12-13 1980-07-08 Balasubramanian N Method and system for surface contouring
US4498770A (en) * 1979-05-29 1985-02-12 Beta Industries, Inc. Apparatus and method for determining the configuration of a reflective surface
US4564295A (en) * 1983-03-07 1986-01-14 New York Institute Of Technology Apparatus and method for projection moire topography
US4697927A (en) * 1985-11-29 1987-10-06 Kabushiki Kaisha Toshiba Method and apparatus for measuring a forming error of an object

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4452534A (en) * 1981-09-01 1984-06-05 Gribanov Dmitry D Method of determining geometric parameters of object's surface and device therefor
EP0182469A1 (fr) * 1984-09-14 1986-05-28 New York Institute Of Technology Appareil et procédé de la génération d'une métrologie de profil superficiel et de contours de surface en trois dimensions

Also Published As

Publication number Publication date
WO1988002847A2 (fr) 1988-04-21
EP0327567A1 (fr) 1989-08-16
JPH02500217A (ja) 1990-01-25
US4794550A (en) 1988-12-27

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