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USD720999S1 - Microscope measurement apparatus - Google Patents

Microscope measurement apparatus Download PDF

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Publication number
USD720999S1
USD720999S1 US29/461,843 US201329461843F USD720999S US D720999 S1 USD720999 S1 US D720999S1 US 201329461843 F US201329461843 F US 201329461843F US D720999 S USD720999 S US D720999S
Authority
US
United States
Prior art keywords
measurement apparatus
microscope measurement
microscope
view
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/461,843
Inventor
Chih-Kuang Chang
Li Jiang
Dong-Hai Li
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hon Hai Precision Industry Co Ltd
Original Assignee
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Precision Industry Co Ltd filed Critical Hon Hai Precision Industry Co Ltd
Assigned to HON HAI PRECISION INDUSTRY CO., LTD. reassignment HON HAI PRECISION INDUSTRY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHANG, CHIH-KUANG, JIANG, LI, LI, DONG-HAI
Application granted granted Critical
Publication of USD720999S1 publication Critical patent/USD720999S1/en
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Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a microscope measurement apparatus showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a microscope measurement apparatus, as shown and described.
US29/461,843 2013-06-27 2013-07-29 Microscope measurement apparatus Active USD720999S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201330297580 2013-06-27
CN201330297580 2013-06-27

Publications (1)

Publication Number Publication Date
USD720999S1 true USD720999S1 (en) 2015-01-13

Family

ID=52248008

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/461,843 Active USD720999S1 (en) 2013-06-27 2013-07-29 Microscope measurement apparatus

Country Status (2)

Country Link
US (1) USD720999S1 (en)
TW (1) TWD164714S (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD737152S1 (en) * 2013-12-09 2015-08-25 Hon Hai Precision Industry Co., Ltd. Image measuring device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7599073B2 (en) * 2005-06-03 2009-10-06 Mitutoyo Corporation Image measuring system and methods of generating and executing non-stop image measuring program
US8303125B2 (en) * 2009-12-18 2012-11-06 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. Focus apparatus of image measuring system
US8559119B2 (en) * 2010-12-10 2013-10-15 Leica Microsystems Cms Gmbh Microscope stage with pivotable objective holder
US8650767B2 (en) * 2010-09-27 2014-02-18 Mitutoyo Corporation Coordinates measuring head unit and coordinates measuring machine
US8749882B2 (en) * 2009-03-26 2014-06-10 University Of Vermont And State Agriculture College Low numerical aperture exclusion imaging

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7599073B2 (en) * 2005-06-03 2009-10-06 Mitutoyo Corporation Image measuring system and methods of generating and executing non-stop image measuring program
US8749882B2 (en) * 2009-03-26 2014-06-10 University Of Vermont And State Agriculture College Low numerical aperture exclusion imaging
US8303125B2 (en) * 2009-12-18 2012-11-06 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. Focus apparatus of image measuring system
US8650767B2 (en) * 2010-09-27 2014-02-18 Mitutoyo Corporation Coordinates measuring head unit and coordinates measuring machine
US8559119B2 (en) * 2010-12-10 2013-10-15 Leica Microsystems Cms Gmbh Microscope stage with pivotable objective holder

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD737152S1 (en) * 2013-12-09 2015-08-25 Hon Hai Precision Industry Co., Ltd. Image measuring device

Also Published As

Publication number Publication date
TWD164714S (en) 2014-12-11

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