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USD665681S1 - Cartridge for an ion density measuring instrument - Google Patents

Cartridge for an ion density measuring instrument Download PDF

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Publication number
USD665681S1
USD665681S1 US29/385,955 US201129385955F USD665681S US D665681 S1 USD665681 S1 US D665681S1 US 201129385955 F US201129385955 F US 201129385955F US D665681 S USD665681 S US D665681S
Authority
US
United States
Prior art keywords
cartridge
measuring instrument
density measuring
ion density
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/385,955
Inventor
Hideaki Nishimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Assigned to HITACHI CHEMICAL COMPANY, LTD. reassignment HITACHI CHEMICAL COMPANY, LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NISHIMOTO, HIDEAKI
Application granted granted Critical
Publication of USD665681S1 publication Critical patent/USD665681S1/en
Assigned to SHOWA DENKO MATERIALS CO., LTD. reassignment SHOWA DENKO MATERIALS CO., LTD. CHANGE OF NAME Assignors: HITACHI CHEMICAL COMPANY, LTD.
Assigned to RESONAC CORPORATION reassignment RESONAC CORPORATION CHANGE OF NAME Assignors: SHOWA DENKO MATERIALS CO., LTD.
Assigned to RESONAC CORPORATION reassignment RESONAC CORPORATION CHANGE OF ADDRESS Assignors: RESONAC CORPORATION
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front elevational view of a cartridge for an ion density measuring instrument showing my new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side elevational view thereof; and,
FIG. 6 is a left side elevational view thereof; and
FIG. 7 is a top, left and front side perspective view thereof; and,
FIG. 8 is a bottom, right and front side perspective view thereof.

Claims (1)

  1. The ornamental design for cartridge for an ion density measuring instrument, as shown.
US29/385,955 2010-08-23 2011-02-23 Cartridge for an ion density measuring instrument Active USD665681S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010020325 2010-08-23
JPD2010-020325 2010-08-23

Publications (1)

Publication Number Publication Date
USD665681S1 true USD665681S1 (en) 2012-08-21

Family

ID=46641847

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/385,955 Active USD665681S1 (en) 2010-08-23 2011-02-23 Cartridge for an ion density measuring instrument

Country Status (1)

Country Link
US (1) USD665681S1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD680455S1 (en) * 2011-11-18 2013-04-23 Campbell Scientific, Inc. Device for measuring velocity and concentration of gases

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6656752B1 (en) * 1999-03-17 2003-12-02 Hitachi, Ltd. Ion current density measuring method and instrument, and semiconductor device manufacturing method
USD522145S1 (en) * 2003-06-18 2006-05-30 The Secretary Of State For Defence, Dtsl Sample processing device
USD634659S1 (en) * 2010-01-29 2011-03-22 Shiseido Co., Ltd. Column for chromatograph

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6656752B1 (en) * 1999-03-17 2003-12-02 Hitachi, Ltd. Ion current density measuring method and instrument, and semiconductor device manufacturing method
USD522145S1 (en) * 2003-06-18 2006-05-30 The Secretary Of State For Defence, Dtsl Sample processing device
USD634659S1 (en) * 2010-01-29 2011-03-22 Shiseido Co., Ltd. Column for chromatograph

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Co-pending U.S. Appl. No. 29/385,944, filed Feb. 23, 2011, Nishimoto et al.
Co-pending U.S. Appl. No. 29/385,949, filed Feb. 23, 2011, Nishimoto et al.
Co-pending U.S. Appl. No. 29/385,952, filed Feb. 23, 2011, Nishimoto et al.
Notice of Allowance of U.S. Appl. No. 29/385,944 dated Apr. 3, 2012.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD680455S1 (en) * 2011-11-18 2013-04-23 Campbell Scientific, Inc. Device for measuring velocity and concentration of gases

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