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USD504080S1 - Oscilloscope instrument - Google Patents

Oscilloscope instrument Download PDF

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Publication number
USD504080S1
USD504080S1 US29/204,636 US20463604F USD504080S US D504080 S1 USD504080 S1 US D504080S1 US 20463604 F US20463604 F US 20463604F US D504080 S USD504080 S US D504080S
Authority
US
United States
Prior art keywords
oscilloscope
instrument
oscilloscope instrument
ornamental design
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/204,636
Inventor
Jerry L. Wrisley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/204,636 priority Critical patent/USD504080S1/en
Assigned to TEKTRONIX, INC. reassignment TEKTRONIX, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: WRISLEY, JERRY L.
Application granted granted Critical
Publication of USD504080S1 publication Critical patent/USD504080S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of an oscilloscope instrument;
FIG. 2 is a front elevation view of the oscilloscope instrument;
FIG. 3 is a left side elevation view of the oscilloscope instrument;
FIG. 4 is a right side elevation view of the oscilloscope instrument;
FIG. 5 is a top plan view of the oscilloscope instrument;
FIG. 6 is a bottom plan view of the oscilloscope instrument; and,
FIG. 7 is a rear elevation view of the oscilloscope instrument.

Claims (1)

  1. The ornamental design of a oscilloscope instrument, as shown and described.
US29/204,636 2004-04-30 2004-04-30 Oscilloscope instrument Expired - Lifetime USD504080S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/204,636 USD504080S1 (en) 2004-04-30 2004-04-30 Oscilloscope instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/204,636 USD504080S1 (en) 2004-04-30 2004-04-30 Oscilloscope instrument

Publications (1)

Publication Number Publication Date
USD504080S1 true USD504080S1 (en) 2005-04-19

Family

ID=34434542

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/204,636 Expired - Lifetime USD504080S1 (en) 2004-04-30 2004-04-30 Oscilloscope instrument

Country Status (1)

Country Link
US (1) USD504080S1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD845797S1 (en) * 2016-12-01 2019-04-16 Elma Electronic Ag Versatile casing for electronic equipment
USD987459S1 (en) * 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD413823S (en) * 1998-07-28 1999-09-14 Tektronix, Inc. Electronic test and measurement instrument
USD420607S (en) 1999-04-09 2000-02-15 Tektronix, Inc. Front panel for a measurement instrument
USD460371S1 (en) * 2001-12-20 2002-07-16 Tektronix, Inc. Measurement instrument
USD460703S1 (en) * 2001-12-20 2002-07-23 Tektronix, Inc. Measurement instrument
US6437552B1 (en) * 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
USD472171S1 (en) * 2001-12-20 2003-03-25 Tektronix, Inc. Measurement instrument housing
US6731104B1 (en) * 2002-12-05 2004-05-04 Tektronix, Inc. Measurement probe system with EOS/ESD protection

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD413823S (en) * 1998-07-28 1999-09-14 Tektronix, Inc. Electronic test and measurement instrument
USD420607S (en) 1999-04-09 2000-02-15 Tektronix, Inc. Front panel for a measurement instrument
US6437552B1 (en) * 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
USD460371S1 (en) * 2001-12-20 2002-07-16 Tektronix, Inc. Measurement instrument
USD460703S1 (en) * 2001-12-20 2002-07-23 Tektronix, Inc. Measurement instrument
USD472171S1 (en) * 2001-12-20 2003-03-25 Tektronix, Inc. Measurement instrument housing
US6731104B1 (en) * 2002-12-05 2004-05-04 Tektronix, Inc. Measurement probe system with EOS/ESD protection

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD845797S1 (en) * 2016-12-01 2019-04-16 Elma Electronic Ag Versatile casing for electronic equipment
USD987459S1 (en) * 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer
USD991813S1 (en) 2021-04-26 2023-07-11 Yokogawa Electric Corporation Spectrum analyzer
USD991814S1 (en) 2021-04-26 2023-07-11 Yokogawa Electric Corporation Spectrum analyzer

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