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USD1079499S1 - Image measuring device - Google Patents

Image measuring device Download PDF

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Publication number
USD1079499S1
USD1079499S1 US29/914,714 US202329914714F USD1079499S US D1079499 S1 USD1079499 S1 US D1079499S1 US 202329914714 F US202329914714 F US 202329914714F US D1079499 S USD1079499 S US D1079499S
Authority
US
United States
Prior art keywords
measuring device
image measuring
view
elevational view
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/914,714
Inventor
Kenji Iwamoto
Manami Kurihara
Hidekazu Sano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: IWAMOTO, KENJI, Kurihara, Manami, SANO, HIDEKAZU
Application granted granted Critical
Publication of USD1079499S1 publication Critical patent/USD1079499S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, left side, bottom perspective view of the image measuring device showing our new design;
FIG. 2 is a front, right side, top perspective view thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a top plan view thereof; and,
FIG. 8 is a bottom plan view thereof.
The dashed broken lines in the drawings depict portions of the image measuring device that form no part of the claimed design. All contour lines shown in the drawings are lines representing surfaces of the solid body and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an image measuring device as shown and described.
US29/914,714 2023-05-24 2023-10-20 Image measuring device Active USD1079499S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023010505F JP1760104S (en) 2023-05-24 2023-05-24 image measuring machine
JP2023-010505D 2023-05-24

Publications (1)

Publication Number Publication Date
USD1079499S1 true USD1079499S1 (en) 2025-06-17

Family

ID=89189956

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/914,714 Active USD1079499S1 (en) 2023-05-24 2023-10-20 Image measuring device

Country Status (2)

Country Link
US (1) USD1079499S1 (en)
JP (1) JP1760104S (en)

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD341330S (en) * 1992-01-23 1993-11-16 United States Surgical Corporation Tensiometer
US20100315731A1 (en) * 2009-06-05 2010-12-16 Mitutoyo Corporation Optical apparatus
USD706847S1 (en) * 2013-01-09 2014-06-10 Mitutoyo Corporation Microscope
CN303603829S (en) * 2016-03-02
JP1563236S (en) * 2016-03-04 2016-11-14
USD806585S1 (en) * 2016-03-04 2018-01-02 Mitutoyo Corporation Image measuring device
USD847675S1 (en) * 2017-07-14 2019-05-07 Mitutoyo Corporation Hardness tester
USD848882S1 (en) * 2017-07-14 2019-05-21 Mitutoyo Corporation Hardness tester
US10445894B2 (en) 2016-05-11 2019-10-15 Mitutoyo Corporation Non-contact 3D measuring system
USD912553S1 (en) * 2018-11-06 2021-03-09 Sick Stegmann Gmbh Optoelectronic sensor
USD941165S1 (en) * 2018-04-06 2022-01-18 Orbis Intelligent Systems, Inc. Location sensor and flow rate meter
US20220138976A1 (en) * 2020-10-30 2022-05-05 Mitutoyo Corporation Metrology system with projected pattern for points-from-focus type processes
US20250029228A1 (en) * 2023-07-20 2025-01-23 Mitutoyo Corporation Machine vision system with objective lens and collision protection

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN303603829S (en) * 2016-03-02
CN303737160S (en) * 2016-07-06
CN307346801S (en) * 2022-05-17
USD341330S (en) * 1992-01-23 1993-11-16 United States Surgical Corporation Tensiometer
US20100315731A1 (en) * 2009-06-05 2010-12-16 Mitutoyo Corporation Optical apparatus
USD706847S1 (en) * 2013-01-09 2014-06-10 Mitutoyo Corporation Microscope
JP1563236S (en) * 2016-03-04 2016-11-14
USD783424S1 (en) * 2016-03-04 2017-04-11 Mitutoyo Corporation Image measuring device
USD806585S1 (en) * 2016-03-04 2018-01-02 Mitutoyo Corporation Image measuring device
US10445894B2 (en) 2016-05-11 2019-10-15 Mitutoyo Corporation Non-contact 3D measuring system
USD847675S1 (en) * 2017-07-14 2019-05-07 Mitutoyo Corporation Hardness tester
USD848882S1 (en) * 2017-07-14 2019-05-21 Mitutoyo Corporation Hardness tester
USD941165S1 (en) * 2018-04-06 2022-01-18 Orbis Intelligent Systems, Inc. Location sensor and flow rate meter
USD912553S1 (en) * 2018-11-06 2021-03-09 Sick Stegmann Gmbh Optoelectronic sensor
US20220138976A1 (en) * 2020-10-30 2022-05-05 Mitutoyo Corporation Metrology system with projected pattern for points-from-focus type processes
US20250029228A1 (en) * 2023-07-20 2025-01-23 Mitutoyo Corporation Machine vision system with objective lens and collision protection

Non-Patent Citations (9)

* Cited by examiner, † Cited by third party
Title
3D White Light Interferometer, accelonix.nl, No date, [site visited: Mar. 12, 2025], Available from URL: https://accelonix.nl/product/metrology/cybertechnologies/optical-sensors/interferometer-for-thickness-measurement-copy/ (Year: 2025). *
GBS High Speed Smart WLI System, plnano.com, No date, [site visited: Mar. 12, 2025], Available from URL: https://www.plnano.com/smartwhitelightinterferometer (Year: 2025). *
Interferometer Units, shop.mitutoyo.eu, No date, [site visited: Mar. 12, 2025], Available from URL: https://shop.mitutoyo.eu/web/mitutoyo/en/mitutoyo/interferometer_units/Interferometer%20Units/index.xhtml (Year: 2025). *
LEM Series Camera Endpoint Monitor, horiba.com, No date, [site visited: Mar. 12, 2025], Available from URL: https://www.horiba.com/int/semiconductor/products/detail/action/show/Product/lem-series-3254/ (Year: 2025). *
Office Communication Decision to Grant issued on Dec. 5, 2023 in the counterpart JP Design Application No. 2023-010505.
Publication Material No. HA1801056500, published Aug. 1, 2006, cited in Office Communication issued on Dec. 5, 2023 in the counterpart JP Design Application No. 2023-010505.
Publication Material No. HA1803265000, published Feb. 1, 2007, cited in Office Communication issued on Dec. 5, 2023 in the counterpart JP Design Application No. 2023-010505.
Publication Material No. HA3100440100, published Jul. 1, 2019, cited in Office Communication issued on Dec. 5, 2023 in the counterpart JP Design Application No. 2023-010505.
Publication Material No. HC3100682600, published Jul. 24, 2019, cited in Office Communication issued on Dec. 5, 2023 in the counterpart JP Design Application No. 2023-010505.

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Publication number Publication date
JP1760104S (en) 2023-12-22

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