US2651009A - Transistor design - Google Patents
Transistor design Download PDFInfo
- Publication number
- US2651009A US2651009A US285992A US28599252A US2651009A US 2651009 A US2651009 A US 2651009A US 285992 A US285992 A US 285992A US 28599252 A US28599252 A US 28599252A US 2651009 A US2651009 A US 2651009A
- Authority
- US
- United States
- Prior art keywords
- layer
- layers
- transistor
- transistors
- lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 229910052732 germanium Inorganic materials 0.000 description 5
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 5
- 239000012535 impurity Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910052703 rhodium Inorganic materials 0.000 description 3
- 239000010948 rhodium Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- -1 helium ions Chemical class 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 150000003283 rhodium Chemical class 0.000 description 2
- 241000511582 Actinomyces meyeri Species 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910000906 Bronze Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910052699 polonium Inorganic materials 0.000 description 1
- HZEBHPIOVYHPMT-UHFFFAOYSA-N polonium atom Chemical compound [Po] HZEBHPIOVYHPMT-UHFFFAOYSA-N 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/185—Joining of semiconductor bodies for junction formation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24942—Structurally defined web or sheet [e.g., overall dimension, etc.] including components having same physical characteristic in differing degree
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31678—Of metal
Definitions
- This invention relates to transistors, and more particularly to methods for attaching leads to a thin p-layer section sandwiched between two nlayer sections in a triode system.
- Transistors constructed so as to have a thin p-layer sandwiched between two n-layers are known, but have been extremely difficult to prepare, because of the precision required and, among other factors, because of the difficulty of attaching a lead to the dividing zone between nand p-layer without causing shorts, and still having a good contact with the lead.
- a loop of metal wire is immersed in a p-layer melt, heated to a temperature moderately above its melting point. This is not extremely critical; however, the temperature must be above the melting point of the said p-layer composition. Generally the higher the viscosity of this layer, the easier is the practice of the invention. However, it may in some cases be carried out at temperatures even a couple of hundred degrees over the melting point of the p-layer.
- the loop is rapidly dipped into the p-layer, and because of the surface tension conditions, a film of p-layer will form in the loop. This film will solidify and is then carefully placed between two layers of the n-layer.
- the ring which was originally used for forming this p-layer membrane now forms a lead. Dimensions are selected in such a manner that the ring does not touch either of the n-layers, thereby avoiding a short.
- Figure l is a perspective drawing of the finished assembly, I being the ring, 2 being the p-layer, 3 being the n-layers (or 2 being the n-layer, 3 being the p-layers), and in Figure 2, which shows these same elements before assembly, and in Figure 3, which shows in cross-section an embodiment having n-layers of different diameters.
- This invention is applicable to germanium as well as to silicon type of transistors.
- transistor impurity a small amount of an element of group III. such as boron, aluminum, gallium or indium, or mixtures thereof, and in the n-layers a small amount of transistor impurities of group V, such as nitrogen, phosphorus, antimony or arsenic, or mixtures thereof.
- This technique is generally applicable to the preparation of intermediate layers in transistors and is not necessarily confined to the specific materials and conditions mentioned above by way of illustration and not of limitation.
- the blocks of n-type material are of different cross section at the point of contact with the p-layer.
- reference numeral 4 indicates the nlayer of smaller diameter, 5 the n-layer of larger diameter, and B the p-layer.
- the p-layer is in this case applied to the larger block of n-layer by evaporation, dipping, solution casting or any other applicable technique for depositing a thin film.
- the n-layer of smaller diameter is then superimposed by deposit, or by mechanical application.
- the part of the p-layer 6 which protrudes beyond the smaller layer 4 and is supported by the larger layer 5 on which it rests, is then attached to a lead for connection to the other elements in the circuit in which the transistor is employed.
- One way of achieving the attachment of such a lead is to apply a metal coating 1 to the said protruding p-layer, for example, by evaporation with rhodium vapor, until a lead 8 can be soldered, or make surface contact, to this rhodium coated area.
- Phosphor bronze contacts are found to be particularly suitable as leads to this rhodium layer.
- Application of a stop off coating or wax will prevent short circuits to the n-layers.
- One method for preparing the layers in question is to withdraw the crystals slowly from the melt at such a rate as to have a stationary interface between the solid and liquid only slightly above the liquid surface. This procedure eliminates stresses in the silicon or germanium due to solidification within inflexible walls while the simple planar thermal gradient produced in this manner minimizes thermal stresses.
- Bombardment of silicon and germanium by helium ions up to 30 kv. or by alpha particles from polonium are known to greatly enhance the rectifying action of diodes based on the properties of these substances.
- I may also employ a construction having an n-layer between two p-layers.
- the method of preparing a transistor of sandwich type construction which comprises the step of dipping an annular member into a fused bath of a substance selected from the group consisting of silicon and germanium, allowing said substance to form a membrane within said ring, and mounting said membrane between two layers of the same substance, differing from the said center layer only in the type of impurities pres-- ent.
- triode transistor having a center layer mounted within a metal ring and adhered thereto in the melted.
- a transistor having two side layers and a center layer, the center layer containing transistor impurities of 4 a type differing from that present in the side layers, one of said side layers having a larger surface than the other at the areas of maximal proximity, the protruding rim of the said larger :ide layer being coated with a metallic conduc- 7.
- the method of making transistors which comprises the step. of preparing a relatively large surface of a p-l'ayer, coating this surface with an n-layer, superposing a p-layer having a surface smaller than the first p-layer, metal coating the. margin of the n-layer which protrudes around the smaller p-layer, and attaching a connection to.- the said metal coated n-layer.
- transistors which comprises thestep of preparing a relatively large surface of n.-layer, coating this surface with a p-layer, superposing an n-layer having a surface smaller than the first n -layer, metal coating the margin of the p-layer which protrudes around the smaller n-la'yer, and attaching a connection to the said metal coated p-layer.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
- Die Bonding (AREA)
Description
Sept. 1, 1953 E. A. MEYER 2,651,009
TRANSISTOR DESIGN INVEN TOR.
BY W
/ AGENT Patented Sept. 1, 1953 TRANSISTOR DESIGN Earl A. Meyer, Madison, Wis., assignor to Bjorksten Research Laboratories, Inc., a corporation of Illinois Application May 3, 1952, Serial No. 285,992
8 Claims. 1
This invention relates to transistors, and more particularly to methods for attaching leads to a thin p-layer section sandwiched between two nlayer sections in a triode system.
Transistors constructed so as to have a thin p-layer sandwiched between two n-layers are known, but have been extremely difficult to prepare, because of the precision required and, among other factors, because of the difficulty of attaching a lead to the dividing zone between nand p-layer without causing shorts, and still having a good contact with the lead.
In accordance with my invention, this is accomplished in the following manner: A loop of metal wire is immersed in a p-layer melt, heated to a temperature moderately above its melting point. This is not extremely critical; however, the temperature must be above the melting point of the said p-layer composition. Generally the higher the viscosity of this layer, the easier is the practice of the invention. However, it may in some cases be carried out at temperatures even a couple of hundred degrees over the melting point of the p-layer.
The loop is rapidly dipped into the p-layer, and because of the surface tension conditions, a film of p-layer will form in the loop. This film will solidify and is then carefully placed between two layers of the n-layer. The ring which was originally used for forming this p-layer membrane now forms a lead. Dimensions are selected in such a manner that the ring does not touch either of the n-layers, thereby avoiding a short.
In this fashion, an exceedingly thin p-layer is accomplished, with a lead to all sides of it.
The invention is further shown in Figure l, which is a perspective drawing of the finished assembly, I being the ring, 2 being the p-layer, 3 being the n-layers (or 2 being the n-layer, 3 being the p-layers), and in Figure 2, which shows these same elements before assembly, and in Figure 3, which shows in cross-section an embodiment having n-layers of different diameters.
This invention is applicable to germanium as well as to silicon type of transistors. In the player I may use as transistor impurity a small amount of an element of group III. such as boron, aluminum, gallium or indium, or mixtures thereof, and in the n-layers a small amount of transistor impurities of group V, such as nitrogen, phosphorus, antimony or arsenic, or mixtures thereof.
This technique is generally applicable to the preparation of intermediate layers in transistors and is not necessarily confined to the specific materials and conditions mentioned above by way of illustration and not of limitation.
I In another embodiment of the invention, the blocks of n-type material are of different cross section at the point of contact with the p-layer. In Figure 3 reference numeral 4 indicates the nlayer of smaller diameter, 5 the n-layer of larger diameter, and B the p-layer.
The p-layer is in this case applied to the larger block of n-layer by evaporation, dipping, solution casting or any other applicable technique for depositing a thin film. The n-layer of smaller diameter is then superimposed by deposit, or by mechanical application. The part of the p-layer 6 which protrudes beyond the smaller layer 4 and is supported by the larger layer 5 on which it rests, is then attached to a lead for connection to the other elements in the circuit in which the transistor is employed. One way of achieving the attachment of such a lead is to apply a metal coating 1 to the said protruding p-layer, for example, by evaporation with rhodium vapor, until a lead 8 can be soldered, or make surface contact, to this rhodium coated area. Phosphor bronze contacts are found to be particularly suitable as leads to this rhodium layer. Application of a stop off coating or wax will prevent short circuits to the n-layers.
One method for preparing the layers in question is to withdraw the crystals slowly from the melt at such a rate as to have a stationary interface between the solid and liquid only slightly above the liquid surface. This procedure eliminates stresses in the silicon or germanium due to solidification within inflexible walls while the simple planar thermal gradient produced in this manner minimizes thermal stresses.
Bombardment of silicon and germanium by helium ions up to 30 kv. or by alpha particles from polonium are known to greatly enhance the rectifying action of diodes based on the properties of these substances.
Such irradiation of the contact surfaces with helium ions was found to exert a beneficial influence on the performance of the silicon and germanium transistors.
While reference has been made above to transistors having p-layer between two n-layers, I may also employ a construction having an n-layer between two p-layers.
It is thus seen that the invention is broad in scope and is not to be limited, excepting by the claims in which it is my intention to cover all novelty inherent in this invention as broadly as possible in view of prior art.
3. The transistor described in claim '1, the base' material of both pand n-layers being silicon.
4. The method of preparing a transistor of sandwich type construction which comprises the step of dipping an annular member into a fused bath of a substance selected from the group consisting of silicon and germanium, allowing said substance to form a membrane within said ring, and mounting said membrane between two layers of the same substance, differing from the said center layer only in the type of impurities pres-- ent.
5. As an article of manufacture, a triode transistor having a center layer mounted within a metal ring and adhered thereto in the melted.
state; and adjoining on each side a side layer, said side layers and center layer differing from each other in the type of transistor impurities.
6. Asan article of manufacture, a transistor having two side layers and a center layer, the center layer containing transistor impurities of 4 a type differing from that present in the side layers, one of said side layers having a larger surface than the other at the areas of maximal proximity, the protruding rim of the said larger :ide layer being coated with a metallic conduc- 7. The method of making transistors, which comprises the step. of preparing a relatively large surface of a p-l'ayer, coating this surface with an n-layer, superposing a p-layer having a surface smaller than the first p-layer, metal coating the. margin of the n-layer which protrudes around the smaller p-layer, and attaching a connection to.- the said metal coated n-layer.
8.'The" method: of making transistors, which comprises thestep of preparing a relatively large surface of n.-layer, coating this surface with a p-layer, superposing an n-layer having a surface smaller than the first n -layer, metal coating the margin of the p-layer which protrudes around the smaller n-la'yer, and attaching a connection to the said metal coated p-layer.
EARL A.. MEYER.
References Cited the file of this patent UNITED STATES- PATENTS Number Name Date 2,623,102 Shockley Dec. 23', 1952 2,623,103 Shockley Dec. 23, 1952
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US285992A US2651009A (en) | 1952-05-03 | 1952-05-03 | Transistor design |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US285992A US2651009A (en) | 1952-05-03 | 1952-05-03 | Transistor design |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US2651009A true US2651009A (en) | 1953-09-01 |
Family
ID=23096572
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US285992A Expired - Lifetime US2651009A (en) | 1952-05-03 | 1952-05-03 | Transistor design |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | US2651009A (en) |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2736849A (en) * | 1951-12-31 | 1956-02-28 | Hazeltine Research Inc | Junction-type transistors |
| US2798013A (en) * | 1955-08-05 | 1957-07-02 | Siemens Ag | Method of producing junction-type semi-conductor devices, and apparatus therefor |
| US2803569A (en) * | 1953-12-03 | 1957-08-20 | Jacobs Harold | Formation of junctions in semiconductors |
| US2896137A (en) * | 1953-06-25 | 1959-07-21 | Sprague Electric Co | Radio active electrode construction |
| US2900584A (en) * | 1954-06-16 | 1959-08-18 | Motorola Inc | Transistor method and product |
| US2937962A (en) * | 1957-03-20 | 1960-05-24 | Texas Instruments Inc | Transistor devices |
| US2948836A (en) * | 1955-03-30 | 1960-08-09 | Raytheon Co | Electrode connections to semiconductive bodies |
| US2999195A (en) * | 1952-06-14 | 1961-09-05 | Gen Electric | Broad area transistors |
| US3024140A (en) * | 1960-07-05 | 1962-03-06 | Space Technology Lab Inc | Nonlinear electrical arrangement |
| US3056073A (en) * | 1960-02-15 | 1962-09-25 | California Inst Res Found | Solid-state electron devices |
| US3069644A (en) * | 1959-02-16 | 1962-12-18 | Itt | Bolometers |
| US3449642A (en) * | 1968-02-27 | 1969-06-10 | Int Rectifier Corp | O-bend lead for semiconductor packages |
| US3523222A (en) * | 1966-09-15 | 1970-08-04 | Texas Instruments Inc | Semiconductive contacts |
| US4169908A (en) * | 1976-02-23 | 1979-10-02 | Interpace Corporation | Method and apparatus for decorating surfaces of ceramic ware |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2623103A (en) * | 1949-06-09 | 1952-12-23 | Bell Telephone Labor Inc | Semiconductor signal translating device |
| US2623102A (en) * | 1948-06-26 | 1952-12-23 | Bell Telephone Labor Inc | Circuit element utilizing semiconductive materials |
-
1952
- 1952-05-03 US US285992A patent/US2651009A/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2623102A (en) * | 1948-06-26 | 1952-12-23 | Bell Telephone Labor Inc | Circuit element utilizing semiconductive materials |
| US2623103A (en) * | 1949-06-09 | 1952-12-23 | Bell Telephone Labor Inc | Semiconductor signal translating device |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2736849A (en) * | 1951-12-31 | 1956-02-28 | Hazeltine Research Inc | Junction-type transistors |
| US2999195A (en) * | 1952-06-14 | 1961-09-05 | Gen Electric | Broad area transistors |
| US2896137A (en) * | 1953-06-25 | 1959-07-21 | Sprague Electric Co | Radio active electrode construction |
| US2803569A (en) * | 1953-12-03 | 1957-08-20 | Jacobs Harold | Formation of junctions in semiconductors |
| US2900584A (en) * | 1954-06-16 | 1959-08-18 | Motorola Inc | Transistor method and product |
| US2948836A (en) * | 1955-03-30 | 1960-08-09 | Raytheon Co | Electrode connections to semiconductive bodies |
| US2798013A (en) * | 1955-08-05 | 1957-07-02 | Siemens Ag | Method of producing junction-type semi-conductor devices, and apparatus therefor |
| US2937962A (en) * | 1957-03-20 | 1960-05-24 | Texas Instruments Inc | Transistor devices |
| US3069644A (en) * | 1959-02-16 | 1962-12-18 | Itt | Bolometers |
| US3056073A (en) * | 1960-02-15 | 1962-09-25 | California Inst Res Found | Solid-state electron devices |
| US3024140A (en) * | 1960-07-05 | 1962-03-06 | Space Technology Lab Inc | Nonlinear electrical arrangement |
| US3523222A (en) * | 1966-09-15 | 1970-08-04 | Texas Instruments Inc | Semiconductive contacts |
| US3449642A (en) * | 1968-02-27 | 1969-06-10 | Int Rectifier Corp | O-bend lead for semiconductor packages |
| US4169908A (en) * | 1976-02-23 | 1979-10-02 | Interpace Corporation | Method and apparatus for decorating surfaces of ceramic ware |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US2651009A (en) | Transistor design | |
| US3196058A (en) | Method of making semiconductor devices | |
| US3223904A (en) | Field effect device and method of manufacturing the same | |
| US2781481A (en) | Semiconductors and methods of making same | |
| US2743201A (en) | Monatomic semiconductor devices | |
| US2701326A (en) | Semiconductor translating device | |
| US3028655A (en) | Semiconductive device | |
| US2944321A (en) | Method of fabricating semiconductor devices | |
| US3200490A (en) | Method of forming ohmic bonds to a germanium-coated silicon body with eutectic alloyforming materials | |
| US3380155A (en) | Production of contact pads for semiconductors | |
| US3300339A (en) | Method of covering the surfaces of objects with protective glass jackets and the objects produced thereby | |
| US2708646A (en) | Methods of making germanium alloy semiconductors | |
| US3013955A (en) | Method of transistor manufacture | |
| US2959501A (en) | Silicon semiconductor device and method of producing it | |
| US2929750A (en) | Power transistors and process for making the same | |
| US2857296A (en) | Methods of forming a junction in a semiconductor | |
| US2947924A (en) | Semiconductor devices and methods of making the same | |
| US2938819A (en) | Intermetallic semiconductor device manufacturing | |
| US3298093A (en) | Bonding process | |
| US2855334A (en) | Method of preparing semiconducting crystals having symmetrical junctions | |
| US3301716A (en) | Semiconductor device fabrication | |
| US2998334A (en) | Method of making transistors | |
| US3041508A (en) | Tunnel diode and method of its manufacture | |
| US3069297A (en) | Semi-conductor devices | |
| US4159215A (en) | Droplet migration doping using reactive carriers and dopants |