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US12472587B2 - Laser processing method, semiconductor member manufacturing method, and laser processing device - Google Patents

Laser processing method, semiconductor member manufacturing method, and laser processing device

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Publication number
US12472587B2
US12472587B2 US17/414,668 US201917414668A US12472587B2 US 12472587 B2 US12472587 B2 US 12472587B2 US 201917414668 A US201917414668 A US 201917414668A US 12472587 B2 US12472587 B2 US 12472587B2
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United States
Prior art keywords
modified spots
semiconductor
laser processing
virtual plane
processing method
Prior art date
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US17/414,668
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US20220055156A1 (en
Inventor
Atsushi Tanaka
Chiaki Sasaoka
Hiroshi Amano
Daisuke Kawaguchi
Yotaro WANI
Yasunori Igasaki
Toshiki Yui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Tokai National Higher Education and Research System NUC
Original Assignee
Hamamatsu Photonics KK
Tokai National Higher Education and Research System NUC
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Publication of US20220055156A1 publication Critical patent/US20220055156A1/en
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Publication of US12472587B2 publication Critical patent/US12472587B2/en
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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/0006—Working by laser beam, e.g. welding, cutting or boring taking account of the properties of the material involved
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • B23K26/0622—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • B23K26/0622—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
    • B23K26/0624—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses using ultrashort pulses, i.e. pulses of 1ns or less
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08—Devices involving relative movement between laser beam and workpiece
    • B23K26/0823—Devices involving rotation of the workpiece
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08—Devices involving relative movement between laser beam and workpiece
    • B23K26/083—Devices involving movement of the workpiece in at least one axial direction
    • B23K26/0853—Devices involving movement of the workpiece in at least in two axial directions, e.g. in a plane
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36—Removing material
    • B23K26/38—Removing material by boring or cutting
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/50—Working by transmitting the laser beam through or within the workpiece
    • B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B28—WORKING CEMENT, CLAY, OR STONE
    • B28D—WORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
    • B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B28—WORKING CEMENT, CLAY, OR STONE
    • B28D—WORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67092—Apparatus for mechanical treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67098—Apparatus for thermal treatment
    • H01L21/67115—Apparatus for thermal treatment mainly by radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00—Articles made by soldering, welding or cutting
    • B23K2101/36—Electric or electronic devices
    • B23K2101/40—Semiconductor devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00—Materials to be soldered, welded or cut
    • B23K2103/50—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
    • B23K2103/56—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26 semiconducting

Definitions

  • the present disclosure relates to a laser processing method, a semiconductor member manufacturing method, and a laser processing apparatus.
  • Patent Literatures 1 and 2 There is known a processing method of cutting out a semiconductor member such as a semiconductor wafer from a semiconductor object in a manner of irradiating a semiconductor object such as a semiconductor ingot with laser light to form a modified region in the semiconductor object and to develop a fracture extending from the modified region (see Patent Literatures 1 and 2, for example).
  • the manner of forming the modified region has a great influence on the state of the obtained semiconductor member.
  • An object of the present disclosure is to provide a laser processing method, a semiconductor member manufacturing method, and a laser processing apparatus capable of acquiring a suitable semiconductor member.
  • a laser processing method for cutting a semiconductor object along a virtual plane facing a surface of the semiconductor object in the semiconductor object.
  • the laser processing method includes a first step of forming a plurality of first modified spots along the virtual plane to obtain first formation density, by causing laser light to enter into the semiconductor object from the surface, and a second step of forming a plurality of second modified spots along the virtual plane so as to obtain second formation density higher than the first formation density, by causing laser light to enter into the semiconductor object from the surface after the first step.
  • the plurality of first modified spots are formed along the virtual plane so as to obtain first formation density
  • the plurality of second modified spots are formed along the virtual plane so as to obtain second formation density higher than the first formation density.
  • the plurality of first modified spots may be formed so that a plurality of fractures respectively extending from the plurality of first modified spots are not connected to each other. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of first modified spots, it is possible to suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
  • the plurality of second modified spots may be formed so that the plurality of fractures respectively extending from the plurality of second modified spots are connected to each other. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of second modified spots, it is possible to reliably suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
  • the plurality of second modified spots may be formed to be connected to each other. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of second modified spots, it is possible to reliably suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
  • the plurality of first modified spots may be formed by moving a converging point of the laser light pulse-oscillated at a first pulse pitch along the virtual plane.
  • the plurality of second modified spots may be formed by moving a converging point of the laser light pulse-oscillated at a second pulse pitch along the virtual plane, the second pulse pitch being smaller than the first pulse pitch.
  • a material of the semiconductor object may contain gallium.
  • gallium is deposited on the plurality of fractures respectively extending from the plurality of first modified spots by irradiation with laser light, the laser light is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of first modified spots and forming of the plurality of second modified spots in order to form the fracture crossing over the virtual plane, along the virtual plane with high precision.
  • the material of the semiconductor object may contain gallium nitride.
  • gallium nitride is decomposed by the irradiation with laser light, gallium is deposited on the plurality of fractures respectively extending from the plurality of first modified spots, and the laser light is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of first modified spots and forming of the plurality of second modified spots in order to form the fracture crossing over the virtual plane, along the virtual plane with high precision.
  • gallium nitride is decomposed by irradiation with laser light, a nitrogen gas is generated in the plurality of fractures. Therefore, it is possible to easily form the fracture crossing over the virtual plane by using pressure (internal pressure) of the nitrogen gas.
  • a semiconductor member manufacturing method includes the first step and the second step included in the laser processing method described above, and a third step of acquiring a semiconductor member from the semiconductor object by using the fracture crossing over the virtual plane, as a boundary.
  • the semiconductor member manufacturing method with the first step and the second step, it is possible to form the fracture crossing over the virtual plane with high precision. Thus, it is possible to acquire a suitable semiconductor member.
  • a plurality of the virtual planes may be set to be arranged in a direction facing the surface. According to this configuration, it is possible to acquire a plurality of the semiconductor members from one semiconductor object.
  • the semiconductor object may be a semiconductor ingot, and the semiconductor member may be a semiconductor wafer. According to this configuration, it is possible to acquire a plurality of suitable semiconductor wafers.
  • a plurality of the virtual planes may be set to be arranged in a direction in which the surface extends. According to this configuration, it is possible to acquire a plurality of the semiconductor members from one semiconductor object.
  • the semiconductor object may be a semiconductor wafer, and the semiconductor member may be a semiconductor device. According to this configuration, it is possible to acquire a plurality of suitable semiconductor devices.
  • a laser processing apparatus for cutting a semiconductor object along a virtual plane facing a surface of the semiconductor object in the semiconductor object.
  • the laser processing apparatus includes a stage configured to support the semiconductor object, and a laser irradiation unit configured to form a plurality of first modified spots and a plurality of second modified spots along the virtual plane by causing laser light to enter into the semiconductor object from the surface.
  • the plurality of first modified spots are formed along the virtual plane so as to obtain first formation density.
  • the plurality of second modified spots are formed along the virtual plane so as to obtain second formation density higher than the first formation density.
  • the laser processing apparatus it is possible to form the fracture crossing over the virtual plane, along the virtual plane with high precision. Thus, it is possible to acquire a suitable semiconductor member.
  • FIG. 1 is a configuration diagram illustrating a laser processing apparatus according to an embodiment.
  • FIG. 2 is a side view illustrating a GaN ingot which is an object of a laser processing method and a semiconductor member manufacturing method according to a first embodiment.
  • FIG. 3 is a plan view illustrating the GaN ingot illustrated in FIG. 2 .
  • FIG. 4 is a longitudinal sectional view of a portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 5 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 6 is a longitudinal sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 7 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 8 is a longitudinal sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 9 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 10 is a longitudinal sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 11 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 12 is a side view illustrating the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 13 is a side view illustrating a GaN wafer in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 14 shows an image of a modified spot and a fracture formed by a laser processing method and a semiconductor member manufacturing method in an example.
  • FIG. 15 is a schematic diagram illustrating a modified spot and a fracture formed by a second step in the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • FIG. 16 is a plan view illustrating a GaN wafer which is an object of a laser processing method and a semiconductor member manufacturing method according to a second embodiment.
  • FIG. 17 is a side view illustrating a portion of the GaN wafer in one step of the laser processing method and the semiconductor member manufacturing method in the second embodiment.
  • FIG. 18 is a side view illustrating the portion of the GaN wafer in one step of the laser processing method and the semiconductor member manufacturing method in the second embodiment.
  • FIG. 19 is a side view illustrating a semiconductor device in one step of the laser processing method and the semiconductor member manufacturing method in the second embodiment.
  • FIG. 20 is a plan view illustrating a GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in a modification example.
  • FIG. 21 is a plan view illustrating the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the modification example.
  • a laser processing apparatus 1 includes a stage 2 , a light source 3 , a spatial light modulator 4 , a converging lens 5 , and a control unit 6 .
  • the laser processing apparatus 1 is a device that forms a modified region 12 on an object 11 by irradiating the object 11 with laser light L.
  • a first horizontal direction is referred to as an X direction below, and a second horizontal direction perpendicular to the first horizontal direction is referred to as a Y direction below.
  • the vertical direction is referred to as a Z direction.
  • the stage 2 supports the object 11 by, for example, adsorbing a film attached to the object 11 .
  • the stage 2 is movable along each of the X direction and the Y direction.
  • the stage 2 is rotatable about an axis parallel to the Z direction.
  • the light source 3 outputs the laser light L having transparency to the object 11 , for example, by a pulse oscillation method.
  • the spatial light modulator 4 modulates the laser light L output from the light source 3 .
  • the spatial light modulator 4 is, for example, a spatial light modulator (SLM) of a reflective liquid crystal (LCOS: Liquid Crystal on Silicon).
  • the converging lens 5 converges the laser light L modulated by the spatial light modulator 4 .
  • the spatial light modulator 4 and the converging lens 5 are movable along the Z direction as a laser irradiation unit.
  • the modified region 12 is a region in which the density, the refractive index, the mechanical strength, and other physical properties are different from those of the surrounding non-modified region.
  • Examples of the modified region 12 include a melting treatment region, a fracture region, a dielectric breakdown region, and a refractive index change region.
  • a plurality of modified spots 13 are formed to be arranged in one row along the X-direction.
  • One modified spot 13 is formed by irradiation with the laser light L of one pulse.
  • the modified region 12 in one row is a set of a plurality of modified spots 13 arranged in one row.
  • Adjacent modified spots 13 may be connected to each other or separated from each other, depending on the relative movement speed of the converging point C with respect to the object 11 and the repetition frequency of the laser light L.
  • the control unit 6 controls the stage 2 , the light source 3 , the spatial light modulator 4 , and the converging lens 5 .
  • the control unit 6 is configured as a computer device including a processor, a memory, a storage, a communication device, and the like.
  • software program read into the memory or the like is executed by the processor, and thus reading and writing of data in the memory and the storage and communication by a communication device are controlled by the processor.
  • the control unit 6 realizes various functions.
  • An object 11 of a laser processing method and a semiconductor member manufacturing method is a GaN ingot (semiconductor ingot, semiconductor object) 20 illustrated in FIGS. 2 and 3 .
  • the GaN ingot 20 is made of gallium nitride (GaN) and has, for example, a disc shape.
  • the diameter of the GaN ingot 20 is 2 in and the thickness of the GaN ingot 20 is 2 mm.
  • a plurality of virtual planes 15 are set in the GaN ingot 20 .
  • Each of the plurality of virtual planes 15 is a plane facing the surface 20 a of the GaN ingot 20 in the GaN ingot 20 , and is set to be arranged in a direction facing the surface 20 a .
  • each of the plurality of virtual planes 15 is a plane parallel to the surface 20 a , and has, for example, a circular shape.
  • a plurality of peripheral edge regions 16 are set to surround the plurality of virtual planes 15 , respectively. That is, each of the plurality of virtual planes 15 does not reach a side surface 20 b of the GaN ingot 20 .
  • the distance between the adjacent virtual planes 15 is 100 ⁇ m
  • the width (in the first embodiment, distance between the outer edge and the side surface 20 b of the virtual plane 15 ) of the peripheral edge region 16 is equal to or more than 30 ⁇ m.
  • the plurality of modified spots 13 are formed along each of the plurality of virtual planes 15 , by using the laser processing apparatus 1 described above.
  • the stage 2 supports the GaN ingot 20 .
  • a laser irradiation unit including the spatial light modulator 4 and the converging lens 5 causes laser light L to enter into the GaN ingot 20 from the surface 20 a , thereby forming the plurality of modified spots 13 along each of the plurality of virtual planes 15 .
  • a plurality of GaN wafers (semiconductor members) 30 are acquired from the GaN ingot 20 by cutting the GaN ingot 20 along each of the plurality of virtual planes 15 .
  • the GaN wafer 30 is made of GaN and has, for example, a disc shape. As an example, the diameter of the GaN wafer 30 is 2 in and the thickness of the GaN wafer 30 is 100 ⁇ m.
  • the plurality of modified spots 13 may be sequentially formed for each one virtual plane 15 from an opposite side of the surface 20 a , by irradiation with laser light L having a wavelength of 532 nm, for example.
  • the plurality of modified spots 13 are formed in each of the plurality of virtual planes 15 in a similar manner.
  • the formation of the plurality of modified spots 13 along the virtual plane 15 which is the closest to the surface 20 a will be described in detail with reference to FIGS. 4 to 11 . In FIGS.
  • an arrow indicates the trajectory of the converging point C of the laser light L.
  • modified spots 13 a , 13 b , 13 c , and 13 d described later may be collectively referred to as the modified spot 13
  • fractures 14 a , 14 b , 14 c , and 14 d described later may be collectively referred to as a fracture 14 .
  • a plurality of modified spots (first modified spots) 13 a are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15 ) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (first step).
  • the plurality of modified spots 13 a are formed so that the plurality of fractures 14 a respectively extending from the plurality of modified spots 13 a are not connected to each other.
  • a plurality of rows of modified spots 13 a are formed by moving the converging point C of the laser light L pulse-oscillated along the virtual plane 15 .
  • the modified spot 13 a is indicated by a white outline (without hatching), and a range in which the fracture 14 a extends is indicated by a broken line (this is similarly applied to FIGS. 6 to 11 ).
  • the laser light L pulse-oscillated is modulated by the spatial light modulator 4 so as to be converged at a plurality (for example, six) of converging points C arranged in the Y direction.
  • the plurality of converging points C are relatively moved on the virtual plane 15 along the X direction.
  • the distance between the converging points C adjacent to each other in the Y direction is 8 ⁇ m.
  • the pulse pitch (that is, value obtained by dividing the relative movement speed of the plurality of converging points C by the repetition frequency of the laser light L) of the laser light L is 10 ⁇ m.
  • the pulse energy of the laser light L per converging point C (simply referred to as “pulse energy of the laser light L” below) is 0.33 ⁇ J.
  • the center-to-center distance between the modified spots 13 a adjacent to each other in the Y direction is 8 ⁇ m
  • the center-to-center distance between the modified spots 13 a adjacent to each other in the X direction is 10 ⁇ m.
  • a plurality of modified spots (first modified spots) 13 b are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15 ) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (first step).
  • the plurality of modified spots 13 b are formed so that the plurality of modified spots 13 b do not overlap the plurality of modified spots 13 a and the plurality of fractures 14 a , and a plurality of fractures 14 b respectively extending from the plurality of modified spots 13 b are not connected to each other.
  • a plurality of rows of modified spots 13 b are formed by moving the converging point C of the laser light L pulse-oscillated along the virtual plane 15 between the rows of the plurality of rows of modified spots 13 a .
  • the modified spot 13 b is indicated by dot hatching, and a range in which the fracture 14 b extends is indicated by a broken line (this is similarly applied to FIGS. 8 to 11 ).
  • the laser light L pulse-oscillated is modulated by the spatial light modulator 4 so as to be converged at a plurality (for example, six) of converging points C arranged in the Y direction.
  • the plurality of converging points C are relatively moved on the virtual plane 15 along the X direction at the center between the rows of the plurality of rows of modified spots 13 a .
  • the distance between the converging points C adjacent to each other in the Y direction is 8 ⁇ m
  • the pulse pitch of the laser light L is 10 ⁇ m
  • the pulse energy of the laser light L is 0.33 ⁇ J.
  • the center-to-center distance between the modified spots 13 b adjacent to each other in the Y direction is 8 ⁇ m
  • the center-to-center distance between the modified spots 13 b adjacent to each other in the X direction is 10 ⁇ m.
  • a plurality of modified spots (second modified spots) 13 c are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15 ) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (second step).
  • the plurality of modified spots 13 c are formed to be connected to each other.
  • a plurality of modified spots (second modified spots) 13 d are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15 ) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (second step).
  • the plurality of modified spots 13 d are formed to be connected to each other.
  • the plurality of modified spots 13 c and 13 d are formed so as not to overlap the plurality of modified spots 13 a and 13 b .
  • a plurality of rows of modified spots 13 c and 13 d are formed by moving the converging point C of the laser light L pulse-oscillated along the virtual plane 15 between the rows of the plurality of rows of modified spots 13 a and 13 b .
  • the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d may be connected to the plurality of fractures 14 a and 14 b .
  • the modified spot 13 c is indicated by solid-line hatching, and a range in which the fracture 14 c extends is indicated by a broken line (this is similarly applied to FIGS. 10 and 11 ).
  • the modified spot 13 d is indicated by solid-line hatching (solid-line hatching inclined opposite to the solid-line hatching of the modified spot 13 c ), and a range in which the fracture 14 d extends is indicated by a broken line.
  • the laser light L pulse-oscillated is modulated by the spatial light modulator 4 so as to be converged at a plurality (for example, six) of converging points C arranged in the Y direction.
  • the plurality of converging points C are relatively moved on the virtual plane 15 along the X direction at the center between the rows of the plurality of rows of modified spots 13 a and 13 b .
  • the distance between the converging points C adjacent to each other in the Y direction is 8 ⁇ m
  • the pulse pitch of the laser light L is 1 ⁇ m
  • the pulse energy of the laser light L is 0.33 ⁇ J.
  • the center-to-center distance between the modified spots 13 c adjacent to each other in the Y direction is 8 ⁇ m
  • the center-to-center distance between the modified spots 13 c adjacent to each other in the X direction is 1 ⁇ m.
  • the center-to-center distance between the modified spots 13 d adjacent to each other in the Y direction is 8 ⁇ m
  • the center-to-center distance between the modified spots 13 d adjacent to each other in the X direction is 1 ⁇ m.
  • the plurality of modified spots 13 a and 13 bd are formed along each of the plurality of virtual planes 15 so as to obtain the first formation density.
  • the first formation density corresponds to the “number of modified spots 13 a and 13 b per unit area” in a case of focusing on one virtual plane 15 .
  • the plurality of modified spots 13 c and 13 d are formed along each of the plurality of virtual planes 15 so as to obtain the second formation density higher than the first formation density.
  • the second formation density corresponds to the “number of modified spots 13 c and 13 d per unit area” in a case of focusing on one virtual plane 15 .
  • the converging point C of the laser light L pulse-oscillated is moved at a first pulse pitch (for example, 10 ⁇ m) along each of the plurality of virtual planes 15 .
  • the converging point C of the laser light L pulse-oscillated is moved at a second pulse pitch (for example, 1 ⁇ m) along each of the plurality of virtual planes 15 .
  • the second pulse pitch is smaller than the first pulse pitch.
  • the GaN ingot 20 is heated by using a heating device including a heater or the like, and thus the plurality of fractures 14 respectively extending from the plurality of modified spots 13 are connected to each other in each of the plurality of virtual planes 15 .
  • a fracture 17 crossing over the virtual plane 15 (simply referred to as a “fracture 17 ” below) is formed in each of the plurality of virtual planes 15 .
  • the plurality of modified spots 13 and the plurality of fractures 14 , and a range in which the fracture 17 is formed are indicated by broken lines.
  • a certain force may be caused to act on the GaN ingot 20 by a method other than heating, and thereby the plurality of fractures 14 may be connected to each other to form the fracture 17 .
  • the plurality of fractures 14 may be connected to each other to form the fracture 17 .
  • the GaN ingot 20 a nitrogen gas is generated in the plurality of fractures 14 respectively extending from the plurality of modified spots 13 . Therefore, by heating the GaN ingot 20 to expand the nitrogen gas, the fracture 17 can be formed by using the pressure (internal pressure) of the nitrogen gas.
  • the peripheral edge region 16 prevents development of the plurality of fractures 14 to the outside (for example, side surface 20 b of the GaN ingot 20 ) of the virtual plane 15 surrounded by the peripheral edge region 16 . Thus, it is possible to suppress escape of the nitrogen gas generated in the plurality of fractures 14 to the outside of the virtual plane 15 .
  • the peripheral edge region 16 is a non-modified region that does not include the modified spot 13 , and is a region that prevents development of the plurality of fractures 14 to the outside of the virtual plane 15 surrounded by the peripheral edge region 16 when the fracture 17 is formed in the virtual plane 15 surrounded by the peripheral edge region 16 . Therefore, the width of the peripheral edge region 16 is preferably equal to or more than 30 ⁇ m.
  • a portion of the GaN ingot 20 which corresponds to each of the plurality of peripheral edge regions 16 and the plurality of virtual planes 15 is ground (polished) by using a grinding device to acquire a plurality of GaN wafers 30 from the GaN ingot 20 by using each of the plurality of fractures 17 as a boundary, as illustrated in FIG. 13 (third step).
  • the GaN ingot 20 is cut along each of the plurality of virtual planes 15 .
  • Portions of the GaN ingot 20 which correspond to the plurality of peripheral edge regions 16 may be removed by machining other than grinding, laser processing, or the like.
  • steps up to the step of forming the plurality of modified spots 13 along each of the plurality of virtual planes 15 correspond to the laser processing method in the first embodiment.
  • steps up to the step of acquiring the plurality of GaN wafers 30 from the GaN ingot 20 by using each of the plurality of fractures 17 as a boundary correspond to the semiconductor member manufacturing method in the first embodiment.
  • the plurality of modified spots 13 a and 13 b are formed along the virtual plane 15 so as to obtain the first formation density.
  • the plurality of modified spots 13 c and 13 d are formed along the virtual plane 15 so as to obtain the second formation density higher than the first formation density.
  • the laser processing method in the first embodiment it is possible to acquire a plurality of suitable GaN wafers 30 by acquiring a plurality of GaN wafers 30 from the GaN ingot 20 by using each of the plurality of fractures 17 as a boundary.
  • each of the plurality of virtual planes 15 it is possible to form the fracture 17 along the virtual plane 15 with high precision.
  • the plurality of modified spots 13 a and 13 b are formed so that the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b are not connected to each other.
  • the plurality of modified spots 13 c and 13 d are formed to be connected to each other.
  • the plurality of modified spots 13 a and 13 b are formed by moving the converging point C of the laser light L pulse-oscillated at a first pulse pitch along the virtual plane 15 .
  • the plurality of modified spots 13 c and 13 d are formed by moving the converging point C of the laser light L pulse-oscillated at a second pulse pitch along the virtual plane 15 .
  • the second pulse pitch is smaller than the first pulse pitch.
  • each of the plurality of virtual planes 15 it is possible to reliably suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d . As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
  • gallium nitride contained in the material of the GaN ingot 20 is decomposed by irradiation with the laser light L, gallium is deposited on the plurality of fractures 14 respectively extending from the plurality of modified spots 13 , and the laser light L is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of modified spots 13 a and 13 b and forming of the plurality of modified spots 13 c and 13 d in order to form the fracture 17 along the virtual plane 15 with high precision.
  • gallium nitride contained in the material of the GaN ingot 20 is decomposed by irradiation with the laser light L, a nitrogen gas is generated in the plurality of fractures 14 . Therefore, it is possible to easily form the fracture 17 by using pressure (internal pressure) of the nitrogen gas.
  • the semiconductor member manufacturing method in the first embodiment with the step included in the laser processing method in the first embodiment, it is possible to form the fracture 17 along each of the plurality of virtual planes 15 with high precision. Thus, it is possible to acquire a plurality of suitable GaN wafers 30 .
  • the plurality of virtual planes 15 are set to be arranged in a direction facing the surface 20 a of the GaN ingot 20 . This makes it possible to acquire a plurality of GaN wafers 30 from one GaN ingot 20 .
  • FIG. 14 shows images of modified spots and fractures formed by a laser processing method and a semiconductor member manufacturing method in an example.
  • the plurality of modified spots 13 were formed along the virtual plane 15 in the same conditions as those in the above-described laser processing method in the first embodiment except that the pulse pitch of the laser light L when the plurality of modified spots 13 c and 13 d were formed along with the virtual plane 15 was set to 5 ⁇ m.
  • the extension width in the direction perpendicular to the virtual plane 15 was about 100 ⁇ m.
  • Example 2 illustrated in FIG. 14 , the plurality of modified spots 13 were formed along the virtual plane 15 in the same conditions as those in the above-described laser processing method in the first embodiment except that the pulse pitch of the laser light L when the plurality of modified spots 13 c and 13 d were formed along with the virtual plane 15 was set to 2.5 ⁇ m.
  • Example 2 corresponds to a case where the plurality of modified spots 13 c and 13 d are formed so that the plurality of modified spots 13 c and 13 d are not connected to each other and the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d are connected to each other.
  • the extension width in the direction perpendicular to the virtual plane 15 was about 100 ⁇ m.
  • Example 3 illustrated in FIG. 14 , the plurality of modified spots 13 were formed along the virtual plane 15 in the same conditions as those in the above-described laser processing method in the first embodiment, including the point that the pulse pitch of the laser light L when the plurality of modified spots 13 c and 13 d were formed along with the virtual plane 15 was set to 1 ⁇ m.
  • Example 3 corresponds to a case where the plurality of modified spots 13 c and 13 d are formed so that the plurality of modified spots 13 c and 13 d are connected to each other.
  • the extension width in the direction perpendicular to the virtual plane 15 was about 25 ⁇ m.
  • the 15 illustrates the modified spots 13 c among the modified spots 13 c and 13 d ) so that a plurality of stress change regions 18 illustrated in FIG. 15 are connected to each other, or a plurality of light converging regions Cr illustrated in FIG. 15 are connected to each other.
  • the stress change region 18 is a region around each of the modified spots 13 , and is a region where internal stress is generated in the object 11 by the formation of each of the modified spots 13 .
  • the light converging region Cr is a region including the converging point C of the laser light L, and is a region where the laser light L is converged in order to form each of the modified spots 13 .
  • An object 11 of a laser processing method and a semiconductor member manufacturing method according to a second embodiment is a GaN wafer (semiconductor wafer, semiconductor object) 30 illustrated in FIG. 16 .
  • the GaN wafer 30 is made of GaN and has, for example, a disc shape. As an example, the diameter of the GaN wafer 30 is 2 in and the thickness of the GaN wafer 30 is 100 ⁇ m.
  • a plurality of virtual planes 15 are set in the GaN wafer 30 . Each of the plurality of virtual planes 15 is a plane facing a surface 30 a of the GaN wafer 30 in the GaN wafer 30 , and is set to be arranged in a direction in which the surface 30 a extends.
  • each of the plurality of virtual planes 15 is a plane parallel to the surface 30 a , and has, for example, a rectangular shape.
  • the plurality of virtual planes 15 are set to be two-dimensionally arranged in a direction parallel to an orientation flat 31 of the GaN wafer 30 and a direction perpendicular to the orientation flat 31 .
  • a plurality of peripheral edge regions 16 are set to surround the plurality of virtual planes 15 , respectively. That is, each of the plurality of virtual planes 15 does not reach a side surface 30 b of the GaN wafer 30 .
  • the width (in the second embodiment, half of the distance between the adjacent virtual planes 15 ) of the peripheral edge region 16 corresponding to each of the plurality of virtual planes 15 is equal to or more than 30 ⁇ m.
  • the plurality of modified spots 13 are formed along each of the plurality of virtual planes 15 , by using the laser processing apparatus 1 described above.
  • the stage 2 supports the GaN wafer 30 .
  • the laser irradiation unit including the spatial light modulator 4 and the converging lens 5 causes laser light L to enter into the GaN wafer 30 from the surface 30 a , thereby forming the plurality of modified spots 13 along each of the plurality of virtual planes 15 .
  • a plurality of semiconductor devices (semiconductor members) 40 are acquired from the GaN wafer 30 by cutting the GaN wafer 30 along each of the plurality of virtual planes 15 .
  • the substrate portion of the semiconductor device 40 is made of GaN and has, for example, a rectangular shape.
  • the outer shape of the substrate portion of the semiconductor device 40 is 1 mm ⁇ 1 mm, and the thickness of the substrate portion of the semiconductor device 40 is several tens of ⁇ m.
  • a plurality of modified spots 13 are formed along each of the plurality of virtual planes 15 by using the laser processing apparatus 1 described above.
  • the plurality of modified spots 13 are formed along each of the plurality of virtual planes 15 in a similar manner to the first step and the second step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
  • the GaN wafer 30 as illustrated in FIG.
  • the plurality of modified spots 13 that is, modified spots 13 a , 13 b , 13 c , and 13 d
  • a plurality of fractures 14 that is, fractures 14 a , 14 b , 14 c , and 14 d
  • a range in which the plurality of modified spots 13 and the plurality of fractures 14 are formed is indicated by a broken line.
  • a plurality of functional elements 32 are formed on the surface 30 a of the GaN wafer 30 by using a semiconductor manufacturing device.
  • Each of the plurality of functional elements 32 is formed so that one functional element 32 is included in one virtual plane 15 when viewed from a thickness direction of the GaN wafer 30 .
  • the functional element 32 is, for example, a light receiving element such as a photodiode, a light emitting element such as a laser diode, a circuit element such as a memory, or the like.
  • the semiconductor manufacturing device functions as a heating device. That is, when the plurality of functional elements 32 are formed on the surface 30 a of the GaN wafer 30 , the GaN wafer 30 is heated by the semiconductor manufacturing device, and thus the plurality of fractures 14 respectively extending from the plurality of modified spots 13 are connected to each other in each of the plurality of virtual planes 15 . In this manner, a fracture 17 (that is, fracture 17 crossing over the virtual plane 15 ) is formed in each of the plurality of virtual planes 15 .
  • a fracture 17 that is, fracture 17 crossing over the virtual plane 15
  • the plurality of modified spots 13 and the plurality of fractures 14 , and a range in which the fracture 17 is formed are indicated by broken lines.
  • a heating device different from the semiconductor manufacturing device may be used.
  • a certain force may be caused to act on the GaN wafer 30 by a method other than heating, and thereby the plurality of fractures 14 may be connected to each other to form the fracture 17 .
  • the plurality of fractures 14 may be connected to each other to form the fracture 17 .
  • a nitrogen gas is generated in the plurality of fractures 14 respectively extending from the plurality of modified spots 13 . Therefore, by heating the GaN ingot 20 to expand the nitrogen gas, the fracture 17 can be formed by using the pressure of the nitrogen gas.
  • the peripheral edge region 16 prevents development of the plurality of fractures 14 to the outside (for example, adjacent virtual plane 15 , side surface 30 b of the GaN wafer 30 ) of the virtual plane 15 surrounded by the peripheral edge region 16 . Thus, it is possible to suppress escape of the nitrogen gas generated in the plurality of fractures 14 to the outside of the virtual plane 15 .
  • the peripheral edge region 16 is a non-modified region that does not include the modified spot 13 , and is a region that prevents development of the plurality of fractures 14 to the outside of the virtual plane 15 surrounded by the peripheral edge region 16 when the fracture 17 is formed in the virtual plane 15 surrounded by the peripheral edge region 16 . Therefore, the width of the peripheral edge region 16 is preferably equal to or more than 30 ⁇ m.
  • the GaN wafer 30 is cut for each functional element 32 by using the laser processing apparatus, and a portion corresponding to each of the plurality of virtual planes 15 is ground by the grinding device.
  • the plurality of semiconductor devices 40 are acquired from the GaN wafer 30 by using each of the plurality of fractures 17 as a boundary (third step).
  • the GaN wafer 30 is cut along each of the plurality of virtual planes 15 .
  • the GaN wafer 30 may be cut for each functional element 32 by machining (for example, blade dicing) other than laser processing.
  • steps up to the step of forming the plurality of modified spots 13 along each of the plurality of virtual planes 15 correspond to the laser processing method in the second embodiment.
  • steps up to the step of acquiring the plurality of semiconductor devices 40 from the GaN wafer 30 by using each of the plurality of fractures 17 as a boundary correspond to the semiconductor member manufacturing method in the second embodiment.
  • the laser processing method in the second embodiment similarly to the laser processing method in the first embodiment, in each of the plurality of virtual planes 15 , it is possible to suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d . As a result, it is possible to form the fracture 17 along the virtual plane 15 with high precision. Therefore, according to the laser processing method in the second embodiment, it is possible to acquire a plurality of suitable semiconductor devices 40 by acquiring a plurality of semiconductor devices 40 from the GaN wafer 30 by using each of the plurality of fractures 17 as a boundary.
  • each of the plurality of virtual planes 15 it is possible to form the fracture 17 along the virtual plane 15 with high precision.
  • the plurality of modified spots 13 a and 13 b are formed so that the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b are not connected to each other.
  • the plurality of modified spots 13 c and 13 d are formed to be connected to each other.
  • the plurality of modified spots 13 a and 13 b are formed by moving the converging point C of the laser light L pulse-oscillated at a first pulse pitch along the virtual plane 15 .
  • the plurality of modified spots 13 c and 13 d are formed by moving the converging point C of the laser light L pulse-oscillated at a second pulse pitch along the virtual plane 15 .
  • the second pulse pitch is smaller than the first pulse pitch.
  • each of the plurality of virtual planes 15 it is possible to reliably suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d . As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
  • gallium nitride contained in the material of the GaN wafer 30 is decomposed by irradiation with the laser light L, gallium is deposited on the plurality of fractures 14 respectively extending from the plurality of modified spots 13 , and the laser light L is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of modified spots 13 a and 13 b and forming of the plurality of modified spots 13 c and 13 d in order to form the fracture 17 along the virtual plane 15 with high precision.
  • gallium nitride contained in the material of the GaN wafer 30 is decomposed by irradiation with the laser light L, a nitrogen gas is generated in the plurality of fractures 14 . Therefore, it is possible to easily form the fracture 17 by using pressure of the nitrogen gas.
  • the semiconductor member manufacturing method in the second embodiment with the step included in the laser processing method in the second embodiment, it is possible to form the fracture 17 along each of the plurality of virtual planes 15 with high precision. Thus, it is possible to acquire a plurality of suitable semiconductor devices 40 .
  • the plurality of virtual planes 15 are set to be arranged in a direction in which the surface 30 a of the GaN wafer 30 extends. Accordingly, it is possible to acquire a plurality of semiconductor devices 40 from one GaN wafer 30 .
  • the present disclosure is not limited to the above embodiments.
  • various numerical values related to the laser light L are not limited to those described above.
  • the pulse energy of the laser light L be 0.1 ⁇ J to 1 ⁇ J and the pulse width of the laser light L be 200 fs to 1 ns.
  • the semiconductor object to be processed by the laser processing method and the semiconductor member manufacturing method according to one aspect of the present disclosure is not limited to the GaN ingot 20 in the first embodiment and the GaN wafer 30 in the second embodiment.
  • the semiconductor member manufactured by the semiconductor member manufacturing method according to one aspect of the present disclosure is not limited to the GaN wafer 30 in the first embodiment and the semiconductor device 40 in the second embodiment.
  • the material of the semiconductor object may be SiC.
  • one virtual plane may be set for one semiconductor object.
  • the method of forming the plurality of modified spots 13 a , 13 b , 13 c , and 13 d is not limited to the above description.
  • the plurality of modified spots 13 and 13 b may be formed along the virtual plane 15 so as to obtain the first formation density.
  • the plurality of modified spots 13 c and 13 d may be formed along the virtual plane 15 so as to obtain the second formation density higher than the first formation density.
  • the plurality of modified spots 13 a and 13 b may be formed so that the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b are connected to each other. As illustrated in FIG.
  • a plurality of rows of modified spots 13 are formed, for example, by rotating the GaN ingot 20 to relatively rotate a plurality of converging points arranged in a radial direction (arrow indicated by a dashed-dotted line). Further, as illustrated in FIG. 21 , in a state where each of the plurality of converging points is located between the rows of the plurality of rows of modified spots 13 , the plurality of rows of modified spots 13 may be formed by relatively rotating the plurality of converging points arranged in the radial direction (arrow indicated by a dashed-dotted line).
  • the plurality of modified spots 13 may be sequentially formed for each of the plurality of virtual planes 15 from the opposite side of the surface 20 a .
  • the plurality of modified spots 13 may be formed along one or the plurality of virtual planes 15 on the surface 20 a side. After one or a plurality of GaN wafers 30 are cut out, the surface 20 a of the GaN ingot 20 may be ground, and then the plurality of modified spots 13 may be formed again along one or the plurality of virtual planes 15 on the surface 20 a side.
  • the peripheral edge region 16 may not be formed.
  • the peripheral edge region 16 is not formed in the laser processing method and the semiconductor member manufacturing method in the first embodiment, it is possible to acquire a plurality of GaN wafers 30 by forming a plurality of modified spots 13 along each of the plurality of virtual planes 15 , and then etching the GaN ingot 20 , for example.
  • the laser processing apparatus 1 is not limited to a device having the above-described configuration.
  • the laser processing apparatus 1 may not include the spatial light modulator 4 .

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Abstract

There is provided a laser processing method for cutting a semiconductor object along a virtual plane facing a surface of the semiconductor object in the semiconductor object. The laser processing method includes a first step of forming a plurality of first modified spots along the virtual plane to obtain first formation density, by causing laser light to enter into the semiconductor object from the surface, and a second step of forming a plurality of second modified spots along the virtual plane so as to obtain second formation density higher than the first formation density, by causing laser light to enter into the semiconductor object from the surface after the first step.

Description

TECHNICAL FIELD
The present disclosure relates to a laser processing method, a semiconductor member manufacturing method, and a laser processing apparatus.
BACKGROUND ART
There is known a processing method of cutting out a semiconductor member such as a semiconductor wafer from a semiconductor object in a manner of irradiating a semiconductor object such as a semiconductor ingot with laser light to form a modified region in the semiconductor object and to develop a fracture extending from the modified region (see Patent Literatures 1 and 2, for example).
CITATION LIST Patent Literature
    • Patent Literature 1: Japanese Unexamined Patent Publication No. 2017-183600
    • Patent Literature 2: Japanese Unexamined Patent Publication No. 2017-057103
SUMMARY OF INVENTION Technical Problem
In the processing method as described above, the manner of forming the modified region has a great influence on the state of the obtained semiconductor member.
An object of the present disclosure is to provide a laser processing method, a semiconductor member manufacturing method, and a laser processing apparatus capable of acquiring a suitable semiconductor member.
Solution to Problem
According to an aspect of the present disclosure, there is provided a laser processing method for cutting a semiconductor object along a virtual plane facing a surface of the semiconductor object in the semiconductor object. The laser processing method includes a first step of forming a plurality of first modified spots along the virtual plane to obtain first formation density, by causing laser light to enter into the semiconductor object from the surface, and a second step of forming a plurality of second modified spots along the virtual plane so as to obtain second formation density higher than the first formation density, by causing laser light to enter into the semiconductor object from the surface after the first step.
In the laser processing method, the plurality of first modified spots are formed along the virtual plane so as to obtain first formation density, and then the plurality of second modified spots are formed along the virtual plane so as to obtain second formation density higher than the first formation density. Thus, regarding a plurality of fractures respectively extending from the plurality of second modified spots, it is possible to suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with high precision. Thus, according to the laser processing method, it is possible to acquire a suitable semiconductor member by acquiring the semiconductor member from the semiconductor object with a fracture crossing over the virtual plane as a boundary.
In the laser processing method in the aspect of the present disclosure, in the first step, the plurality of first modified spots may be formed so that a plurality of fractures respectively extending from the plurality of first modified spots are not connected to each other. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of first modified spots, it is possible to suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
In the laser processing method in the aspect of the present disclosure, in the second step, the plurality of second modified spots may be formed so that the plurality of fractures respectively extending from the plurality of second modified spots are connected to each other. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of second modified spots, it is possible to reliably suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
In the laser processing method in the aspect of the present disclosure, in the second step, the plurality of second modified spots may be formed to be connected to each other. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of second modified spots, it is possible to reliably suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
In the laser processing method in the aspect of the present disclosure, in the first step, the plurality of first modified spots may be formed by moving a converging point of the laser light pulse-oscillated at a first pulse pitch along the virtual plane. In the second step, the plurality of second modified spots may be formed by moving a converging point of the laser light pulse-oscillated at a second pulse pitch along the virtual plane, the second pulse pitch being smaller than the first pulse pitch. According to this configuration, regarding a plurality of fractures respectively extending from the plurality of second modified spots, it is possible to reliably suppress a width extending in a direction perpendicular to the virtual plane. As a result, it is possible to form a fracture crossing over the virtual plane, along the virtual plane with higher precision.
In the laser processing method in the aspect of the present disclosure, a material of the semiconductor object may contain gallium. In this case, if gallium is deposited on the plurality of fractures respectively extending from the plurality of first modified spots by irradiation with laser light, the laser light is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of first modified spots and forming of the plurality of second modified spots in order to form the fracture crossing over the virtual plane, along the virtual plane with high precision.
In the laser processing method in the aspect of the present disclosure, the material of the semiconductor object may contain gallium nitride. In this case, if gallium nitride is decomposed by the irradiation with laser light, gallium is deposited on the plurality of fractures respectively extending from the plurality of first modified spots, and the laser light is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of first modified spots and forming of the plurality of second modified spots in order to form the fracture crossing over the virtual plane, along the virtual plane with high precision. Further, if gallium nitride is decomposed by irradiation with laser light, a nitrogen gas is generated in the plurality of fractures. Therefore, it is possible to easily form the fracture crossing over the virtual plane by using pressure (internal pressure) of the nitrogen gas.
According to another aspect of the present disclosure, a semiconductor member manufacturing method includes the first step and the second step included in the laser processing method described above, and a third step of acquiring a semiconductor member from the semiconductor object by using the fracture crossing over the virtual plane, as a boundary.
According to the semiconductor member manufacturing method, with the first step and the second step, it is possible to form the fracture crossing over the virtual plane with high precision. Thus, it is possible to acquire a suitable semiconductor member.
In the semiconductor member manufacturing method in the aspect of the present disclosure, a plurality of the virtual planes may be set to be arranged in a direction facing the surface. According to this configuration, it is possible to acquire a plurality of the semiconductor members from one semiconductor object.
In the semiconductor member manufacturing method in the aspect of the present disclosure, the semiconductor object may be a semiconductor ingot, and the semiconductor member may be a semiconductor wafer. According to this configuration, it is possible to acquire a plurality of suitable semiconductor wafers.
In the semiconductor member manufacturing method in the aspect of the present disclosure, a plurality of the virtual planes may be set to be arranged in a direction in which the surface extends. According to this configuration, it is possible to acquire a plurality of the semiconductor members from one semiconductor object.
In the semiconductor member manufacturing method in the aspect of the present disclosure, the semiconductor object may be a semiconductor wafer, and the semiconductor member may be a semiconductor device. According to this configuration, it is possible to acquire a plurality of suitable semiconductor devices.
According to another aspect of the present disclosure, there is provided a laser processing apparatus for cutting a semiconductor object along a virtual plane facing a surface of the semiconductor object in the semiconductor object. The laser processing apparatus includes a stage configured to support the semiconductor object, and a laser irradiation unit configured to form a plurality of first modified spots and a plurality of second modified spots along the virtual plane by causing laser light to enter into the semiconductor object from the surface. The plurality of first modified spots are formed along the virtual plane so as to obtain first formation density. After the plurality of first modified spots are formed, the plurality of second modified spots are formed along the virtual plane so as to obtain second formation density higher than the first formation density.
According to the laser processing apparatus, it is possible to form the fracture crossing over the virtual plane, along the virtual plane with high precision. Thus, it is possible to acquire a suitable semiconductor member.
Advantageous Effects of Invention
According to the present disclosure, it is possible to provide a laser processing method, a semiconductor member manufacturing method, and a laser processing apparatus capable of acquiring a suitable semiconductor member.
BRIEF DESCRIPTION OF DRAWINGS
FIG. 1 is a configuration diagram illustrating a laser processing apparatus according to an embodiment.
FIG. 2 is a side view illustrating a GaN ingot which is an object of a laser processing method and a semiconductor member manufacturing method according to a first embodiment.
FIG. 3 is a plan view illustrating the GaN ingot illustrated in FIG. 2 .
FIG. 4 is a longitudinal sectional view of a portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 5 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 6 is a longitudinal sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 7 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 8 is a longitudinal sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 9 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 10 is a longitudinal sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 11 is a cross-sectional view of the portion of the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 12 is a side view illustrating the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 13 is a side view illustrating a GaN wafer in one step of the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 14 shows an image of a modified spot and a fracture formed by a laser processing method and a semiconductor member manufacturing method in an example.
FIG. 15 is a schematic diagram illustrating a modified spot and a fracture formed by a second step in the laser processing method and the semiconductor member manufacturing method in the first embodiment.
FIG. 16 is a plan view illustrating a GaN wafer which is an object of a laser processing method and a semiconductor member manufacturing method according to a second embodiment.
FIG. 17 is a side view illustrating a portion of the GaN wafer in one step of the laser processing method and the semiconductor member manufacturing method in the second embodiment.
FIG. 18 is a side view illustrating the portion of the GaN wafer in one step of the laser processing method and the semiconductor member manufacturing method in the second embodiment.
FIG. 19 is a side view illustrating a semiconductor device in one step of the laser processing method and the semiconductor member manufacturing method in the second embodiment.
FIG. 20 is a plan view illustrating a GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in a modification example.
FIG. 21 is a plan view illustrating the GaN ingot in one step of the laser processing method and the semiconductor member manufacturing method in the modification example.
 DESCRIPTION OF EMBODIMENTS
Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. The same or corresponding parts in the respective drawings are denoted with the same reference signs, and repetitive descriptions will be omitted.
[Configuration of Laser Processing Device]
As illustrated in FIG. 1 , a laser processing apparatus 1 includes a stage 2, a light source 3, a spatial light modulator 4, a converging lens 5, and a control unit 6. The laser processing apparatus 1 is a device that forms a modified region 12 on an object 11 by irradiating the object 11 with laser light L. A first horizontal direction is referred to as an X direction below, and a second horizontal direction perpendicular to the first horizontal direction is referred to as a Y direction below. The vertical direction is referred to as a Z direction.
The stage 2 supports the object 11 by, for example, adsorbing a film attached to the object 11. In the present embodiment, the stage 2 is movable along each of the X direction and the Y direction. The stage 2 is rotatable about an axis parallel to the Z direction.
The light source 3 outputs the laser light L having transparency to the object 11, for example, by a pulse oscillation method. The spatial light modulator 4 modulates the laser light L output from the light source 3. The spatial light modulator 4 is, for example, a spatial light modulator (SLM) of a reflective liquid crystal (LCOS: Liquid Crystal on Silicon). The converging lens 5 converges the laser light L modulated by the spatial light modulator 4. In the present embodiment, the spatial light modulator 4 and the converging lens 5 are movable along the Z direction as a laser irradiation unit.
If the laser light L is converged in the object 11 supported by the stage 2, the laser light L is particularly absorbed at a portion corresponding to a converging point C of the laser light L, and thus the modified region 12 is formed in the object 11. The modified region 12 is a region in which the density, the refractive index, the mechanical strength, and other physical properties are different from those of the surrounding non-modified region. Examples of the modified region 12 include a melting treatment region, a fracture region, a dielectric breakdown region, and a refractive index change region.
As an example, if the stage 2 is moved along the X-direction and the converging point C is moved relative to the object 11 along the X-direction, a plurality of modified spots 13 are formed to be arranged in one row along the X-direction. One modified spot 13 is formed by irradiation with the laser light L of one pulse. The modified region 12 in one row is a set of a plurality of modified spots 13 arranged in one row. Adjacent modified spots 13 may be connected to each other or separated from each other, depending on the relative movement speed of the converging point C with respect to the object 11 and the repetition frequency of the laser light L.
The control unit 6 controls the stage 2, the light source 3, the spatial light modulator 4, and the converging lens 5. The control unit 6 is configured as a computer device including a processor, a memory, a storage, a communication device, and the like. In the control unit 6, software (program) read into the memory or the like is executed by the processor, and thus reading and writing of data in the memory and the storage and communication by a communication device are controlled by the processor. Thus, the control unit 6 realizes various functions.
[Laser Processing Method and Semiconductor Member Manufacturing Method in First Embodiment]
An object 11 of a laser processing method and a semiconductor member manufacturing method according to a first embodiment is a GaN ingot (semiconductor ingot, semiconductor object) 20 illustrated in FIGS. 2 and 3 . The GaN ingot 20 is made of gallium nitride (GaN) and has, for example, a disc shape. As an example, the diameter of the GaN ingot 20 is 2 in and the thickness of the GaN ingot 20 is 2 mm. A plurality of virtual planes 15 are set in the GaN ingot 20. Each of the plurality of virtual planes 15 is a plane facing the surface 20 a of the GaN ingot 20 in the GaN ingot 20, and is set to be arranged in a direction facing the surface 20 a. As an example, each of the plurality of virtual planes 15 is a plane parallel to the surface 20 a, and has, for example, a circular shape. In the GaN ingot 20, a plurality of peripheral edge regions 16 are set to surround the plurality of virtual planes 15, respectively. That is, each of the plurality of virtual planes 15 does not reach a side surface 20 b of the GaN ingot 20. As an example, the distance between the adjacent virtual planes 15 is 100 μm, and the width (in the first embodiment, distance between the outer edge and the side surface 20 b of the virtual plane 15) of the peripheral edge region 16 is equal to or more than 30 μm.
In the laser processing method and the semiconductor member manufacturing method in the first embodiment, the plurality of modified spots 13 are formed along each of the plurality of virtual planes 15, by using the laser processing apparatus 1 described above. Specifically, the stage 2 supports the GaN ingot 20. A laser irradiation unit including the spatial light modulator 4 and the converging lens 5 causes laser light L to enter into the GaN ingot 20 from the surface 20 a, thereby forming the plurality of modified spots 13 along each of the plurality of virtual planes 15. In the semiconductor member manufacturing method in the first embodiment, a plurality of GaN wafers (semiconductor members) 30 are acquired from the GaN ingot 20 by cutting the GaN ingot 20 along each of the plurality of virtual planes 15. The GaN wafer 30 is made of GaN and has, for example, a disc shape. As an example, the diameter of the GaN wafer 30 is 2 in and the thickness of the GaN wafer 30 is 100 μm.
A laser processing method and a semiconductor member manufacturing method in the first embodiment will be described below in detail. In the laser processing method and the semiconductor member manufacturing method in the first embodiment, the plurality of modified spots 13 may be sequentially formed for each one virtual plane 15 from an opposite side of the surface 20 a, by irradiation with laser light L having a wavelength of 532 nm, for example. The plurality of modified spots 13 are formed in each of the plurality of virtual planes 15 in a similar manner. Thus, in the following description, the formation of the plurality of modified spots 13 along the virtual plane 15 which is the closest to the surface 20 a will be described in detail with reference to FIGS. 4 to 11 . In FIGS. 5, 7, 9, and 11 , an arrow indicates the trajectory of the converging point C of the laser light L. In addition, modified spots 13 a, 13 b, 13 c, and 13 d described later may be collectively referred to as the modified spot 13, and fractures 14 a, 14 b, 14 c, and 14 d described later may be collectively referred to as a fracture 14.
Firstly, as illustrated in FIGS. 4 and 5 , a plurality of modified spots (first modified spots) 13 a are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (first step). At this time, the plurality of modified spots 13 a are formed so that the plurality of fractures 14 a respectively extending from the plurality of modified spots 13 a are not connected to each other. In addition, a plurality of rows of modified spots 13 a are formed by moving the converging point C of the laser light L pulse-oscillated along the virtual plane 15. In FIGS. 4 and 5 , the modified spot 13 a is indicated by a white outline (without hatching), and a range in which the fracture 14 a extends is indicated by a broken line (this is similarly applied to FIGS. 6 to 11 ).
In the first embodiment, in order to form the plurality of modified spots 13 a, the laser light L pulse-oscillated is modulated by the spatial light modulator 4 so as to be converged at a plurality (for example, six) of converging points C arranged in the Y direction. The plurality of converging points C are relatively moved on the virtual plane 15 along the X direction. As an example of forming the plurality of modified spots 13 a, the distance between the converging points C adjacent to each other in the Y direction is 8 μm. The pulse pitch (that is, value obtained by dividing the relative movement speed of the plurality of converging points C by the repetition frequency of the laser light L) of the laser light L is 10 μm. The pulse energy of the laser light L per converging point C (simply referred to as “pulse energy of the laser light L” below) is 0.33 μJ. In this case, the center-to-center distance between the modified spots 13 a adjacent to each other in the Y direction is 8 μm, and the center-to-center distance between the modified spots 13 a adjacent to each other in the X direction is 10 μm.
Then, as illustrated in FIGS. 6 and 7 , a plurality of modified spots (first modified spots) 13 b are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (first step). At this time, the plurality of modified spots 13 b are formed so that the plurality of modified spots 13 b do not overlap the plurality of modified spots 13 a and the plurality of fractures 14 a, and a plurality of fractures 14 b respectively extending from the plurality of modified spots 13 b are not connected to each other. In addition, a plurality of rows of modified spots 13 b are formed by moving the converging point C of the laser light L pulse-oscillated along the virtual plane 15 between the rows of the plurality of rows of modified spots 13 a. In FIGS. 6 and 7 , the modified spot 13 b is indicated by dot hatching, and a range in which the fracture 14 b extends is indicated by a broken line (this is similarly applied to FIGS. 8 to 11 ).
In the first embodiment, in order to form the plurality of modified spots 13 b, the laser light L pulse-oscillated is modulated by the spatial light modulator 4 so as to be converged at a plurality (for example, six) of converging points C arranged in the Y direction. The plurality of converging points C are relatively moved on the virtual plane 15 along the X direction at the center between the rows of the plurality of rows of modified spots 13 a. As an example of forming the plurality of modified spots 13 b, the distance between the converging points C adjacent to each other in the Y direction is 8 μm, the pulse pitch of the laser light L is 10 μm, and the pulse energy of the laser light L is 0.33 μJ. In this case, the center-to-center distance between the modified spots 13 b adjacent to each other in the Y direction is 8 μm, and the center-to-center distance between the modified spots 13 b adjacent to each other in the X direction is 10 μm.
Then, as illustrated in FIGS. 8 and 9 , a plurality of modified spots (second modified spots) 13 c are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (second step). At this time, the plurality of modified spots 13 c are formed to be connected to each other. Furthermore, as illustrated in FIGS. 10 and 11 , a plurality of modified spots (second modified spots) 13 d are formed along the virtual plane 15 (for example, so as to be two-dimensionally arranged along all virtual planes 15) by causing laser light L to enter into the GaN ingot 20 from the surface 20 a (second step). At this time, the plurality of modified spots 13 d are formed to be connected to each other. When the plurality of modified spots 13 c and 13 d are formed, the plurality of modified spots 13 c and 13 d are formed so as not to overlap the plurality of modified spots 13 a and 13 b. In addition, a plurality of rows of modified spots 13 c and 13 d are formed by moving the converging point C of the laser light L pulse-oscillated along the virtual plane 15 between the rows of the plurality of rows of modified spots 13 a and 13 b. At this time, the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d may be connected to the plurality of fractures 14 a and 14 b. In FIGS. 8 and 9 , the modified spot 13 c is indicated by solid-line hatching, and a range in which the fracture 14 c extends is indicated by a broken line (this is similarly applied to FIGS. 10 and 11 ). In FIGS. 10 and 11 , the modified spot 13 d is indicated by solid-line hatching (solid-line hatching inclined opposite to the solid-line hatching of the modified spot 13 c), and a range in which the fracture 14 d extends is indicated by a broken line.
In the first embodiment, the laser light L pulse-oscillated is modulated by the spatial light modulator 4 so as to be converged at a plurality (for example, six) of converging points C arranged in the Y direction. The plurality of converging points C are relatively moved on the virtual plane 15 along the X direction at the center between the rows of the plurality of rows of modified spots 13 a and 13 b. As an example of forming the plurality of modified spots 13 c and 13 d, the distance between the converging points C adjacent to each other in the Y direction is 8 μm, the pulse pitch of the laser light L is 1 μm, and the pulse energy of the laser light L is 0.33 μJ. In this case, the center-to-center distance between the modified spots 13 c adjacent to each other in the Y direction is 8 μm, and the center-to-center distance between the modified spots 13 c adjacent to each other in the X direction is 1 μm. In addition, the center-to-center distance between the modified spots 13 d adjacent to each other in the Y direction is 8 μm, and the center-to-center distance between the modified spots 13 d adjacent to each other in the X direction is 1 μm.
As described above, in the first step of forming the plurality of modified spots 13 a and 13 b along each of the plurality of virtual planes 15, the plurality of modified spots 13 a and 13 bd are formed along each of the plurality of virtual planes 15 so as to obtain the first formation density. The first formation density corresponds to the “number of modified spots 13 a and 13 b per unit area” in a case of focusing on one virtual plane 15. In the second step of forming the plurality of modified spots 13 c and 13 d along each of the plurality of virtual planes 15, the plurality of modified spots 13 c and 13 d are formed along each of the plurality of virtual planes 15 so as to obtain the second formation density higher than the first formation density. The second formation density corresponds to the “number of modified spots 13 c and 13 d per unit area” in a case of focusing on one virtual plane 15. In the first embodiment, in the first step of forming the plurality of modified spots 13 a and 13 b along each of the plurality of virtual planes 15, the converging point C of the laser light L pulse-oscillated is moved at a first pulse pitch (for example, 10 μm) along each of the plurality of virtual planes 15. In the second step of forming the plurality of modified spots 13 c and 13 d along each of the plurality of virtual planes 15, the converging point C of the laser light L pulse-oscillated is moved at a second pulse pitch (for example, 1 μm) along each of the plurality of virtual planes 15. The second pulse pitch is smaller than the first pulse pitch.
The GaN ingot 20 is heated by using a heating device including a heater or the like, and thus the plurality of fractures 14 respectively extending from the plurality of modified spots 13 are connected to each other in each of the plurality of virtual planes 15. In this manner, as illustrated in FIG. 12 , a fracture 17 crossing over the virtual plane 15 (simply referred to as a “fracture 17” below) is formed in each of the plurality of virtual planes 15. In FIG. 12 , the plurality of modified spots 13 and the plurality of fractures 14, and a range in which the fracture 17 is formed are indicated by broken lines. A certain force may be caused to act on the GaN ingot 20 by a method other than heating, and thereby the plurality of fractures 14 may be connected to each other to form the fracture 17. In addition, by forming the plurality of modified spots 13 along the virtual plane 15, the plurality of fractures 14 may be connected to each other to form the fracture 17.
Here, in the GaN ingot 20, a nitrogen gas is generated in the plurality of fractures 14 respectively extending from the plurality of modified spots 13. Therefore, by heating the GaN ingot 20 to expand the nitrogen gas, the fracture 17 can be formed by using the pressure (internal pressure) of the nitrogen gas. In addition, the peripheral edge region 16 prevents development of the plurality of fractures 14 to the outside (for example, side surface 20 b of the GaN ingot 20) of the virtual plane 15 surrounded by the peripheral edge region 16. Thus, it is possible to suppress escape of the nitrogen gas generated in the plurality of fractures 14 to the outside of the virtual plane 15. That is, the peripheral edge region 16 is a non-modified region that does not include the modified spot 13, and is a region that prevents development of the plurality of fractures 14 to the outside of the virtual plane 15 surrounded by the peripheral edge region 16 when the fracture 17 is formed in the virtual plane 15 surrounded by the peripheral edge region 16. Therefore, the width of the peripheral edge region 16 is preferably equal to or more than 30 μm.
Then, a portion of the GaN ingot 20, which corresponds to each of the plurality of peripheral edge regions 16 and the plurality of virtual planes 15 is ground (polished) by using a grinding device to acquire a plurality of GaN wafers 30 from the GaN ingot 20 by using each of the plurality of fractures 17 as a boundary, as illustrated in FIG. 13 (third step). In this manner, the GaN ingot 20 is cut along each of the plurality of virtual planes 15. Portions of the GaN ingot 20, which correspond to the plurality of peripheral edge regions 16 may be removed by machining other than grinding, laser processing, or the like.
Among the above steps, steps up to the step of forming the plurality of modified spots 13 along each of the plurality of virtual planes 15 correspond to the laser processing method in the first embodiment. Among the above steps, steps up to the step of acquiring the plurality of GaN wafers 30 from the GaN ingot 20 by using each of the plurality of fractures 17 as a boundary correspond to the semiconductor member manufacturing method in the first embodiment.
As described above, in the laser processing method in the first embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 a and 13 b are formed along the virtual plane 15 so as to obtain the first formation density. Then, the plurality of modified spots 13 c and 13 d are formed along the virtual plane 15 so as to obtain the second formation density higher than the first formation density. Thus, in each of the plurality of virtual planes 15, regarding the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d, it is possible to suppress a width extending (simply referred to as an “extension width” below) in the direction perpendicular to the virtual plane 15. As a result, it is possible to form the fracture 17 along the virtual plane 15 with high precision. It is supposed that the extension widths of the plurality of fractures 14 c and 14 d are suppressed because the plurality of formed fractures 14 a and 14 b function as guides. Therefore, according to the laser processing method in the first embodiment, it is possible to acquire a plurality of suitable GaN wafers 30 by acquiring a plurality of GaN wafers 30 from the GaN ingot 20 by using each of the plurality of fractures 17 as a boundary.
Similarly, according to the laser processing apparatus 1 that performs the laser processing method in the first embodiment, in each of the plurality of virtual planes 15, it is possible to form the fracture 17 along the virtual plane 15 with high precision. Thus, it is possible to acquire a plurality of suitable GaN wafers 30.
In addition, in the laser processing method in the first embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 a and 13 b are formed so that the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b are not connected to each other. Thus, in each of the plurality of virtual planes 15, it is possible to suppress the extension widths of the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b. As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
In addition, in the laser processing method in the first embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 c and 13 d are formed to be connected to each other. Thus, in each of the plurality of virtual planes 15, it is possible to reliably suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d. As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
In the laser processing method in the first embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 a and 13 b are formed by moving the converging point C of the laser light L pulse-oscillated at a first pulse pitch along the virtual plane 15. Then, the plurality of modified spots 13 c and 13 d are formed by moving the converging point C of the laser light L pulse-oscillated at a second pulse pitch along the virtual plane 15. The second pulse pitch is smaller than the first pulse pitch. Thus, in each of the plurality of virtual planes 15, it is possible to reliably suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d. As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
In addition, in the laser processing method in the first embodiment, if gallium nitride contained in the material of the GaN ingot 20 is decomposed by irradiation with the laser light L, gallium is deposited on the plurality of fractures 14 respectively extending from the plurality of modified spots 13, and the laser light L is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of modified spots 13 a and 13 b and forming of the plurality of modified spots 13 c and 13 d in order to form the fracture 17 along the virtual plane 15 with high precision. Furthermore, if gallium nitride contained in the material of the GaN ingot 20 is decomposed by irradiation with the laser light L, a nitrogen gas is generated in the plurality of fractures 14. Therefore, it is possible to easily form the fracture 17 by using pressure (internal pressure) of the nitrogen gas.
Further, according to the semiconductor member manufacturing method in the first embodiment, with the step included in the laser processing method in the first embodiment, it is possible to form the fracture 17 along each of the plurality of virtual planes 15 with high precision. Thus, it is possible to acquire a plurality of suitable GaN wafers 30.
In addition, in the semiconductor member manufacturing method in the first embodiment, the plurality of virtual planes 15 are set to be arranged in a direction facing the surface 20 a of the GaN ingot 20. This makes it possible to acquire a plurality of GaN wafers 30 from one GaN ingot 20.
FIG. 14 shows images of modified spots and fractures formed by a laser processing method and a semiconductor member manufacturing method in an example. In Example 1 illustrated in FIG. 14 , the plurality of modified spots 13 were formed along the virtual plane 15 in the same conditions as those in the above-described laser processing method in the first embodiment except that the pulse pitch of the laser light L when the plurality of modified spots 13 c and 13 d were formed along with the virtual plane 15 was set to 5 μm. In Example 1, regarding the plurality of fractures 14 respectively extending from the plurality of modified spots 13, the extension width in the direction perpendicular to the virtual plane 15 was about 100 μm.
In Example 2 illustrated in FIG. 14 , the plurality of modified spots 13 were formed along the virtual plane 15 in the same conditions as those in the above-described laser processing method in the first embodiment except that the pulse pitch of the laser light L when the plurality of modified spots 13 c and 13 d were formed along with the virtual plane 15 was set to 2.5 μm. Example 2 corresponds to a case where the plurality of modified spots 13 c and 13 d are formed so that the plurality of modified spots 13 c and 13 d are not connected to each other and the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d are connected to each other. In Example 2, regarding the plurality of fractures 14 respectively extending from the plurality of modified spots 13, the extension width in the direction perpendicular to the virtual plane 15 was about 100 μm.
In Example 3 illustrated in FIG. 14 , the plurality of modified spots 13 were formed along the virtual plane 15 in the same conditions as those in the above-described laser processing method in the first embodiment, including the point that the pulse pitch of the laser light L when the plurality of modified spots 13 c and 13 d were formed along with the virtual plane 15 was set to 1 μm. Example 3 corresponds to a case where the plurality of modified spots 13 c and 13 d are formed so that the plurality of modified spots 13 c and 13 d are connected to each other. In Example 3, regarding the plurality of fractures 14 respectively extending from the plurality of modified spots 13, the extension width in the direction perpendicular to the virtual plane 15 was about 25 μm.
From the above results, it has been understood that, in addition to a point that the plurality of modified spots 13 c and 13 d are formed along the virtual plane 15 so as to obtain density (second formation density) higher than the formation density (first formation density) of the plurality of modified spots 13 a and 13 b, it is more preferable to form the plurality of modified spots 13 c and 13 d so that the plurality of fractures 14 c and 14 d are connected to each other, or the plurality of modified spots 13 c and 13 d are connected to each other. When the plurality of modified spots 13 c and 13 d are formed along the virtual plane 15, the plurality of modified spots 13 c and 13 d may be formed (FIG. 15 illustrates the modified spots 13 c among the modified spots 13 c and 13 d) so that a plurality of stress change regions 18 illustrated in FIG. 15 are connected to each other, or a plurality of light converging regions Cr illustrated in FIG. 15 are connected to each other. The stress change region 18 is a region around each of the modified spots 13, and is a region where internal stress is generated in the object 11 by the formation of each of the modified spots 13. The light converging region Cr is a region including the converging point C of the laser light L, and is a region where the laser light L is converged in order to form each of the modified spots 13.
[Laser Processing Method and Semiconductor Member Manufacturing Method in Second Embodiment]
An object 11 of a laser processing method and a semiconductor member manufacturing method according to a second embodiment is a GaN wafer (semiconductor wafer, semiconductor object) 30 illustrated in FIG. 16 . The GaN wafer 30 is made of GaN and has, for example, a disc shape. As an example, the diameter of the GaN wafer 30 is 2 in and the thickness of the GaN wafer 30 is 100 μm. A plurality of virtual planes 15 are set in the GaN wafer 30. Each of the plurality of virtual planes 15 is a plane facing a surface 30 a of the GaN wafer 30 in the GaN wafer 30, and is set to be arranged in a direction in which the surface 30 a extends. As an example, each of the plurality of virtual planes 15 is a plane parallel to the surface 30 a, and has, for example, a rectangular shape. As an example, the plurality of virtual planes 15 are set to be two-dimensionally arranged in a direction parallel to an orientation flat 31 of the GaN wafer 30 and a direction perpendicular to the orientation flat 31. In the GaN wafer 30, a plurality of peripheral edge regions 16 are set to surround the plurality of virtual planes 15, respectively. That is, each of the plurality of virtual planes 15 does not reach a side surface 30 b of the GaN wafer 30. As an example, the width (in the second embodiment, half of the distance between the adjacent virtual planes 15) of the peripheral edge region 16 corresponding to each of the plurality of virtual planes 15 is equal to or more than 30 μm.
In the object 11 of the laser processing method and the semiconductor member manufacturing method in the second embodiment, the plurality of modified spots 13 are formed along each of the plurality of virtual planes 15, by using the laser processing apparatus 1 described above. Specifically, the stage 2 supports the GaN wafer 30. The laser irradiation unit including the spatial light modulator 4 and the converging lens 5 causes laser light L to enter into the GaN wafer 30 from the surface 30 a, thereby forming the plurality of modified spots 13 along each of the plurality of virtual planes 15. In the semiconductor member manufacturing method in the second embodiment, a plurality of semiconductor devices (semiconductor members) 40 are acquired from the GaN wafer 30 by cutting the GaN wafer 30 along each of the plurality of virtual planes 15. The substrate portion of the semiconductor device 40 is made of GaN and has, for example, a rectangular shape. As an example, the outer shape of the substrate portion of the semiconductor device 40 is 1 mm×1 mm, and the thickness of the substrate portion of the semiconductor device 40 is several tens of μm.
The laser processing method and the semiconductor member manufacturing method in the second embodiment will be described below in detail. Firstly, a plurality of modified spots 13 are formed along each of the plurality of virtual planes 15 by using the laser processing apparatus 1 described above. The plurality of modified spots 13 are formed along each of the plurality of virtual planes 15 in a similar manner to the first step and the second step of the laser processing method and the semiconductor member manufacturing method in the first embodiment. Thus, in the GaN wafer 30, as illustrated in FIG. 17 , the plurality of modified spots 13 (that is, modified spots 13 a, 13 b, 13 c, and 13 d) and a plurality of fractures 14 (that is, fractures 14 a, 14 b, 14 c, and 14 d) are formed along each of the plurality of virtual planes 15. In FIG. 17 , a range in which the plurality of modified spots 13 and the plurality of fractures 14 are formed is indicated by a broken line.
Then, as illustrated in FIG. 18 , a plurality of functional elements 32 are formed on the surface 30 a of the GaN wafer 30 by using a semiconductor manufacturing device. Each of the plurality of functional elements 32 is formed so that one functional element 32 is included in one virtual plane 15 when viewed from a thickness direction of the GaN wafer 30. The functional element 32 is, for example, a light receiving element such as a photodiode, a light emitting element such as a laser diode, a circuit element such as a memory, or the like.
In the second embodiment, when the plurality of functional elements 32 are formed on the surface 30 a of the GaN wafer 30, the semiconductor manufacturing device functions as a heating device. That is, when the plurality of functional elements 32 are formed on the surface 30 a of the GaN wafer 30, the GaN wafer 30 is heated by the semiconductor manufacturing device, and thus the plurality of fractures 14 respectively extending from the plurality of modified spots 13 are connected to each other in each of the plurality of virtual planes 15. In this manner, a fracture 17 (that is, fracture 17 crossing over the virtual plane 15) is formed in each of the plurality of virtual planes 15. In FIG. 18 , the plurality of modified spots 13 and the plurality of fractures 14, and a range in which the fracture 17 is formed are indicated by broken lines. A heating device different from the semiconductor manufacturing device may be used. In addition, a certain force may be caused to act on the GaN wafer 30 by a method other than heating, and thereby the plurality of fractures 14 may be connected to each other to form the fracture 17. In addition, by forming the plurality of modified spots 13 along the virtual plane 15, the plurality of fractures 14 may be connected to each other to form the fracture 17.
Here, in the GaN wafer 30, a nitrogen gas is generated in the plurality of fractures 14 respectively extending from the plurality of modified spots 13. Therefore, by heating the GaN ingot 20 to expand the nitrogen gas, the fracture 17 can be formed by using the pressure of the nitrogen gas. In addition, the peripheral edge region 16 prevents development of the plurality of fractures 14 to the outside (for example, adjacent virtual plane 15, side surface 30 b of the GaN wafer 30) of the virtual plane 15 surrounded by the peripheral edge region 16. Thus, it is possible to suppress escape of the nitrogen gas generated in the plurality of fractures 14 to the outside of the virtual plane 15. That is, the peripheral edge region 16 is a non-modified region that does not include the modified spot 13, and is a region that prevents development of the plurality of fractures 14 to the outside of the virtual plane 15 surrounded by the peripheral edge region 16 when the fracture 17 is formed in the virtual plane 15 surrounded by the peripheral edge region 16. Therefore, the width of the peripheral edge region 16 is preferably equal to or more than 30 μm.
Then, the GaN wafer 30 is cut for each functional element 32 by using the laser processing apparatus, and a portion corresponding to each of the plurality of virtual planes 15 is ground by the grinding device. In this manner, as illustrated in FIG. 19 , the plurality of semiconductor devices 40 are acquired from the GaN wafer 30 by using each of the plurality of fractures 17 as a boundary (third step). In this manner, the GaN wafer 30 is cut along each of the plurality of virtual planes 15. The GaN wafer 30 may be cut for each functional element 32 by machining (for example, blade dicing) other than laser processing.
Among the above steps, steps up to the step of forming the plurality of modified spots 13 along each of the plurality of virtual planes 15 correspond to the laser processing method in the second embodiment. Among the above steps, steps up to the step of acquiring the plurality of semiconductor devices 40 from the GaN wafer 30 by using each of the plurality of fractures 17 as a boundary correspond to the semiconductor member manufacturing method in the second embodiment.
As described above, according to the laser processing method in the second embodiment, similarly to the laser processing method in the first embodiment, in each of the plurality of virtual planes 15, it is possible to suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d. As a result, it is possible to form the fracture 17 along the virtual plane 15 with high precision. Therefore, according to the laser processing method in the second embodiment, it is possible to acquire a plurality of suitable semiconductor devices 40 by acquiring a plurality of semiconductor devices 40 from the GaN wafer 30 by using each of the plurality of fractures 17 as a boundary.
Similarly, according to the laser processing apparatus 1 that performs the laser processing method in the second embodiment, in each of the plurality of virtual planes 15, it is possible to form the fracture 17 along the virtual plane 15 with high precision. Thus, it is possible to acquire a plurality of suitable semiconductor devices 40.
In addition, in the laser processing method in the second embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 a and 13 b are formed so that the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b are not connected to each other. Thus, in each of the plurality of virtual planes 15, it is possible to suppress the extension widths of the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b. As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
In addition, in the laser processing method in the second embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 c and 13 d are formed to be connected to each other. Thus, in each of the plurality of virtual planes 15, it is possible to reliably suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d. As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
In the laser processing method in the second embodiment, in each of the plurality of virtual planes 15, the plurality of modified spots 13 a and 13 b are formed by moving the converging point C of the laser light L pulse-oscillated at a first pulse pitch along the virtual plane 15. Then, the plurality of modified spots 13 c and 13 d are formed by moving the converging point C of the laser light L pulse-oscillated at a second pulse pitch along the virtual plane 15. The second pulse pitch is smaller than the first pulse pitch. Thus, in each of the plurality of virtual planes 15, it is possible to reliably suppress the extension widths of the plurality of fractures 14 c and 14 d respectively extending from the plurality of modified spots 13 c and 13 d. As a result, it is possible to form the fracture 17 along the virtual plane 15 with higher precision.
In addition, in the laser processing method in the second embodiment, if gallium nitride contained in the material of the GaN wafer 30 is decomposed by irradiation with the laser light L, gallium is deposited on the plurality of fractures 14 respectively extending from the plurality of modified spots 13, and the laser light L is easily absorbed by the gallium. Therefore, it is effective to adjust forming of the plurality of modified spots 13 a and 13 b and forming of the plurality of modified spots 13 c and 13 d in order to form the fracture 17 along the virtual plane 15 with high precision. Furthermore, if gallium nitride contained in the material of the GaN wafer 30 is decomposed by irradiation with the laser light L, a nitrogen gas is generated in the plurality of fractures 14. Therefore, it is possible to easily form the fracture 17 by using pressure of the nitrogen gas.
Further, according to the semiconductor member manufacturing method in the second embodiment, with the step included in the laser processing method in the second embodiment, it is possible to form the fracture 17 along each of the plurality of virtual planes 15 with high precision. Thus, it is possible to acquire a plurality of suitable semiconductor devices 40.
In addition, in the semiconductor member manufacturing method in the second embodiment, the plurality of virtual planes 15 are set to be arranged in a direction in which the surface 30 a of the GaN wafer 30 extends. Accordingly, it is possible to acquire a plurality of semiconductor devices 40 from one GaN wafer 30.
MODIFICATION EXAMPLES
The present disclosure is not limited to the above embodiments. For example, various numerical values related to the laser light L are not limited to those described above. In order to suppress extension of the fracture 14 from the modified spot 13 to the incident side and the opposite side of the laser light L, it is preferable that the pulse energy of the laser light L be 0.1 μJ to 1 μJ and the pulse width of the laser light L be 200 fs to 1 ns.
In addition, the semiconductor object to be processed by the laser processing method and the semiconductor member manufacturing method according to one aspect of the present disclosure is not limited to the GaN ingot 20 in the first embodiment and the GaN wafer 30 in the second embodiment. In addition, the semiconductor member manufactured by the semiconductor member manufacturing method according to one aspect of the present disclosure is not limited to the GaN wafer 30 in the first embodiment and the semiconductor device 40 in the second embodiment. As an example, the material of the semiconductor object may be SiC. Also in this case, according to the laser processing method and the semiconductor member manufacturing method in one aspect of the present disclosure, it is possible to form a fracture crossing over a virtual plane, along the virtual plane with high precision. In addition, one virtual plane may be set for one semiconductor object.
The method of forming the plurality of modified spots 13 a, 13 b, 13 c, and 13 d is not limited to the above description. The plurality of modified spots 13 and 13 b may be formed along the virtual plane 15 so as to obtain the first formation density. Then, the plurality of modified spots 13 c and 13 d may be formed along the virtual plane 15 so as to obtain the second formation density higher than the first formation density. For example, the plurality of modified spots 13 a and 13 b may be formed so that the plurality of fractures 14 a and 14 b respectively extending from the plurality of modified spots 13 a and 13 b are connected to each other. As illustrated in FIG. 20 , for example, a plurality of rows of modified spots 13 are formed, for example, by rotating the GaN ingot 20 to relatively rotate a plurality of converging points arranged in a radial direction (arrow indicated by a dashed-dotted line). Further, as illustrated in FIG. 21 , in a state where each of the plurality of converging points is located between the rows of the plurality of rows of modified spots 13, the plurality of rows of modified spots 13 may be formed by relatively rotating the plurality of converging points arranged in the radial direction (arrow indicated by a dashed-dotted line).
Further, in the laser processing method and the semiconductor member manufacturing method in the first embodiment, the plurality of modified spots 13 may be sequentially formed for each of the plurality of virtual planes 15 from the opposite side of the surface 20 a. In addition, in the laser processing method and the semiconductor member manufacturing method in the first embodiment, the plurality of modified spots 13 may be formed along one or the plurality of virtual planes 15 on the surface 20 a side. After one or a plurality of GaN wafers 30 are cut out, the surface 20 a of the GaN ingot 20 may be ground, and then the plurality of modified spots 13 may be formed again along one or the plurality of virtual planes 15 on the surface 20 a side.
In the laser processing method and the semiconductor member manufacturing method in the first embodiment and the second embodiment, the peripheral edge region 16 may not be formed. When the peripheral edge region 16 is not formed in the laser processing method and the semiconductor member manufacturing method in the first embodiment, it is possible to acquire a plurality of GaN wafers 30 by forming a plurality of modified spots 13 along each of the plurality of virtual planes 15, and then etching the GaN ingot 20, for example.
The laser processing apparatus 1 is not limited to a device having the above-described configuration. For example, the laser processing apparatus 1 may not include the spatial light modulator 4.
Various materials and shapes can be applied to each configuration in the above-described embodiment without being limited to the above-described materials and shapes. Further, the configurations in the embodiment or the modification examples described above can be randomly applied to the configuration in another embodiment or modification examples.
REFERENCE SIGNS LIST
    • 1 laser processing apparatus
    • 2 stage
    • 4 spatial light modulator (laser irradiation unit)
    • 5 converging lens (laser irradiation unit)
    • 13 modified spot
    • 13 a, 13 b modified spot (first modified spot)
    • 13 c, 13 d modified spot (second modified spot)
    • 14, 14 a, 14 b, 14 c, 14 d fracture
    • 15 virtual plane
    • 17 fracture crossing over virtual plane
    • 20 GaN ingot (semiconductor ingot, semiconductor object)
    • 20 a surface
    • 30 GaN wafer (semiconductor wafer, semiconductor member, semiconductor object)
    • 30 a surface
    • 40 semiconductor device (semiconductor member)
    • C converging point
    • L laser light

Claims (12)

The invention claimed is:
1. A laser processing method for cutting a semiconductor object along a virtual plane facing a surface of the semiconductor object in the semiconductor object, the method comprising:
a first step of forming a plurality of first modified spots along the virtual plane to obtain first formation density, by causing laser light to enter into the semiconductor object from the surface, and forming a plurality of rows of first modified spots; and
a second step of forming a plurality of second modified spots along the virtual plane so as to obtain second formation density higher than the first formation density and such that the second modified spots are not connected to each other, by causing laser light to enter into the semiconductor object from the surface after the first step, and forming a plurality of rows of second modified spots each positioned between the rows of the plurality of rows of first modified spots,
wherein in the first step, the plurality of rows of first modified spots are formed along the virtual plane such that the plurality of rows of first modified spots do not overlap each other when viewed from a direction perpendicular to the surface, and
wherein in the second step, the plurality of rows of second modified spots are formed along the virtual plane such that the plurality of rows of second modified spots do not overlap each other when viewed from the direction perpendicular to the surface and such that at least one row of the plurality of rows of second modified spots is positioned between the rows of the plurality of rows of first modified spots when viewed from the direction perpendicular to the surface.
2. The laser processing method according to claim 1, wherein in the first step, the first modified spots are formed so that a plurality of fractures respectively extending from the plurality of first modified spots are not connected to each other.
3. The laser processing method according to claim 1, wherein in the second step, the plurality of second modified spots are formed so that a plurality of fractures respectively extending from the plurality of second modified spots are connected to each other.
4. The laser processing method according to claim 1, wherein
in the first step, the plurality of first modified spots are formed by moving a converging point of the laser light pulse-oscillated at a first pulse pitch along the virtual plane, and
in the second step, the plurality of second modified spots are formed by moving a converging point of the laser light pulse-oscillated at a second pulse pitch along the virtual plane, the second pulse pitch being smaller than the first pulse pitch.
5. The laser processing method according to claim 1, wherein a material of the semiconductor object contains gallium.
6. The laser processing method according to claim 5, wherein the material of the semiconductor object contains gallium nitride.
7. A semiconductor member manufacturing method comprising:
the first step and the second step included in the laser processing method according to claim 1; and
a third step of acquiring a semiconductor member from the semiconductor object by using a fracture crossing over the virtual plane as a boundary.
8. The semiconductor member manufacturing method according to claim 7, wherein a plurality of the virtual planes are set to be arranged in a direction facing the surface.
9. The semiconductor member manufacturing method according to claim 8, wherein
the semiconductor object is a semiconductor ingot, and
the semiconductor member is a semiconductor wafer.
10. The semiconductor member manufacturing method according to claim 7, wherein a plurality of the virtual planes are set to be arranged in a direction in which the surface extends.
11. The semiconductor member manufacturing method according to claim 10, wherein
the semiconductor object is a semiconductor wafer, and
the semiconductor member is a semiconductor device.
12. The laser processing method according to claim 1,
wherein, in the first step, the laser light is converged at a plurality of first converging points, and the plurality of first converging points are relatively moved along a direction intersecting a direction in which the plurality of first converging points are arranged, and
in the second step, the laser light is converged at a plurality of second converging points each positioned between the rows of the plurality of rows of first modified spots, and the plurality of second converging points are relatively moved along a direction intersecting a direction in which the plurality of second converging points are arranged.
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