M437952 五、新型說明： 【新型所屬之技術領域】 [0001] 本創作係關於一種光學量測裝置，特指一種可量測待測 物之折射率的量測裝置。 【先前技術】 [0002] 光學量測裝置被普遍地應用於量測待測物之折射率，而 目前，高精密度的折射率量測儀器，是利用光線進入待 測物後產生的光程差，來計算待測物的折射率。但是， φ 可準確量測光程差之設備所費不貲，對一般的研究機構 而言，是一筆不小的開銷，故遂發展出一種如台灣專利 申請號096143789之”光學量測系統”，以低成本提供 高精準度之量測效果。 [0003] 而於台灣專利申請號096143789所揭露之”光學量測系 統”中，其内部待測之玻片由於形狀為長矩形，故其量 測中需要配合雷射光入射位置，故樣品之體積較大，相 對成本較高，且由於該玻片為長矩形之故，因此在量測 ® 上必須額外地利用一旋轉模組之設計，但如此一來除了 成本提高外，且亦容易因為二次折射產生量測誤差，使 得量測解析度與精密度降低，而如何增進前述所提量測 上不足之處亦為產業中技術瓶頸之所在，故综觀前所述 ，本創作之創作人思索並設計一種光學量測裝置，以期 針對現有技術之缺失加以改善，進而增進產業上之實施 利用。 【新型内容】 [0004] 有鑒於前述之現有技術的不足點，本創作係設計一種具 101206951^單編號删1 第 3 頁 / 共 14 頁 1012022723-0 M437952 備新穎性、進步性及產業利用性等專利要件之光學量測 裝置，以期克服現有技術之難點。 [0005]為達到上述目的’本創作所採用的技術手段為設計一種 光學量測裝置，其包含： 一雷射位移模组，其可提供一雷射光，並可接受反射回 歸之雷射光測出一位移量；一極化分光鏡，其對應設於 該雷射位移模組之前方而可將該雷射位移模組射出之雷 射光做極化分光而產生一第一偏極化雷射光與一第二偏 極化雷射光，並令該第一偏極化雷射光直行且讓該第二M437952 V. New description: [New technical field] [0001] This creation is about an optical measuring device, especially a measuring device that can measure the refractive index of a test object. [Prior Art] [0002] An optical measuring device is generally used to measure the refractive index of a test object, and at present, a high-precision refractive index measuring instrument is an optical path generated by using light to enter a test object. Poor, to calculate the refractive index of the object to be tested. However, φ can accurately measure the optical path difference of the equipment, which is not a small expense for the general research institutions. Therefore, an optical measurement system such as Taiwan Patent Application No. 096143789 has been developed. Provide high-precision measurement results at low cost. [0003] In the "optical measurement system" disclosed in Taiwan Patent Application No. 096143789, since the inside of the slide to be tested has a long rectangular shape, it is required to match the incident position of the laser light in the measurement, so the volume of the sample Larger, relatively higher cost, and because the slide is a long rectangle, the design of the rotating module must be additionally used on the measurement®, but in addition to the cost increase, it is also easy because of the second The secondary refraction produces measurement error, which makes the measurement resolution and precision decrease. How to improve the above-mentioned deficiencies in measurement is also the technical bottleneck in the industry. Therefore, the creator of this creation is mentioned above. Thinking and designing an optical measuring device, in order to improve the lack of existing technology, and thus enhance the implementation of the industry. [New content] [0004] In view of the above-mentioned shortcomings of the prior art, the present invention is designed with a 101206951^ single number deletion 1 page 3 / 14 page 1012022723-0 M437952 for novelty, advancement and industrial utilization Optical measuring devices such as patent requirements, in order to overcome the difficulties of the prior art. [0005] In order to achieve the above object, the technical means adopted in the present invention is to design an optical measuring device, which comprises: a laser displacement module capable of providing a laser light and capable of receiving reflection laser light for reflection regression a displacement beam; a polarization beam splitter, which is disposed in front of the laser displacement module, and can polarize the laser light emitted from the laser displacement module to generate a first polarization laser light and a second polarized laser light, and causing the first polarized laser light to go straight and let the second
偏極化雷射光朝一側折射；一第一偶角反射鏡，其對應 I 設於該極化分米鏡之一側處，進而可接受該第二偏極化 雷射光而後反射將該第二偏極化雷射光折回該極化分光 鏡，而後再折射回該雷射位移模組；一分光鏡’其對應 設於該極化分光鏡之前方，且可接受該第一偏極化雷射 光之入射而後產生一校正雷射光束及一量測雷射光束， 立令該校正雷射光束朝前方射出’並令該量測雷射光束 朝一側轉向射出；一第二偶角反射鏡’其設於5亥分光鏡 之前方，對應固定於一多轴式平台上’且該第二偶角反 射鏡接受該校正雷射光束並將該校正雷射光束反射後朝 該雷射位移模組射回’以令該校正雷射光束與該第二偏 極化雷射光合成產生一回饋雷射光’而被該雷射位移模 組接收；複數之反射片，其對應設於該分光鏡之一側， 旅玎將該量測雷射光束做多次反射後射向該多轴式平台 待測玻片組件，其對應設於該量測雷射光束自該反 射片射向該多軸式平台之路徑間，其包含一玻片，該玻 片具有一入射面及一出射面’其中該入射面垂直於該量 束單編號第4頁/共14頁 1012022723-0 !〇!2〇695Γ M437-952 測雷射光束之入射方向，且其中該出射面則對應該入射 面呈現一傾斜角度；及一位置感測模組，其對應設於該 多軸式平台上以接收自該待測玻片組件所折射出之該量 測雷射光束，並可透過電性連接於一運算模組主機而計 算該量測雷射光束照射通過該玻片後產生之位置偏差值 [0006] 其中，該位置感測模組為一位置感測器；其中，該位置 感測模組電性連接於一運算模組；其中，該運算模組為 一電腦；其中，該雷射位移模組為一雷射位移計；其中 ，該傾斜角度為45度；其中，該玻片呈現三角形外觀； 且其中，該玻片中具有一容盛空間。 [0007] 本創作之光學量測裝置於設計上係利用玻片之折射角度 設計，可達到有效地放大折射後距離之特徵，讓本創作 可得以用最簡單的結構配合而精準地量測待測物之折射 率且減少操作上之誤差值，而為了讓上述目的、技術特 徵以及實際實施後之增益性更為明顯易懂，於下文中將 係以較佳之實施範例輔佐對應相關之圖式來進行更詳細 之說明。 【實施方式】 [0008] 為利貴審查員瞭解本創作之創作特徵、内容與優點及其 所能達成之功效，茲將本創作配合附圖，並以實施例之 表達形式詳細說明如下，而其中所使用之圖式，其主旨 僅為示意及輔助說明書之用，未必為本創作實施後之真 實比例與精準配置，故不應就所附之圖式的比例與配置 關係解讀、侷限本創作於實際實施上的權利範圍，合先 1Q12()695i^單編號A0101 第5頁/共14頁 1012022723-0 M437952 敘明。 [0009] 請配合參看第一圖所示，本創作提出一種光學量測裝置 ’其可以較簡易的設備結構之配合而達到將光線折射距 離放大以得到較佳的量測精準度比對效果，其於一較佳 之實施方式可包含一雷射位移模組（10)、一極化分光鏡 (20)、一第一偶角反射鏡（30)、一分光鏡（40)、一第二 偶角反射鏡（50)、複數之反射片（60)、一待測玻片組件 (70)及一位置感測模組（80 )。 [0010] 前述之雷射位移模組（1〇)可提供一雷射光（A)，並接受反 · 射回歸之該雷射光測出一位移量’該雷射位移模組（10) 或可為一雷射位移計。 [0011] 前述之極化分光鏡（20)對應設於該雷射位移模組（10)之 前方而可將該雷射位移模組（10)射出之雷射光做極化分 光而產生一第一偏極化雷射光（B)與一第二偏極化雷射光 (C)，並令該第一偏極化雷射光（B)直行且讓該第二偏極The polarized laser light is refracted toward one side; a first louver mirror whose corresponding I is disposed at one side of the polarized decimeter mirror, thereby accepting the second polarized laser light and then reflecting the second The polarized laser light is folded back to the polarizing beam splitter and then refracted back to the laser displacement module; a beam splitter 'corresponding to the polarizing beam splitter is disposed before the polarized beam splitter, and the first polarized laser light is acceptable The incident then generates a corrected laser beam and a measuring laser beam, and the corrected laser beam is emitted toward the front and the measuring laser beam is turned toward one side; a second angle mirror Positioned in front of the 5 hai beam splitter, correspondingly fixed on a multi-axis platform' and the second loupe mirror receives the corrected laser beam and reflects the corrected laser beam to the laser displacement module Returning to 'the corrected laser beam and the second polarized laser light to generate a feedback laser light' is received by the laser displacement module; a plurality of reflective sheets corresponding to one side of the beam splitter After the tour beam has measured the laser beam multiple times, The slide assembly to be shot to the multi-axis platform is disposed between the path of the measuring laser beam from the reflective sheet to the multi-axis platform, and includes a slide having an incident a face and an exit face 'where the incident face is perpendicular to the beam bundle number 4 page / 14 pages 1012022723-0 !〇! 2〇695Γ M437-952 to measure the incident direction of the laser beam, and wherein the exit face Having a tilt angle corresponding to the incident surface; and a position sensing module correspondingly disposed on the multi-axis platform to receive the measured laser beam refracted from the to-be-measured slide assembly, and Electrically connecting to a computing module host to calculate a positional deviation value generated by the measuring laser beam after passing through the slide glass. [0006] wherein the position sensing module is a position sensor; wherein the position is The sensing module is electrically connected to a computing module; wherein the computing module is a computer; wherein the laser displacement module is a laser displacement meter; wherein the tilt angle is 45 degrees; wherein The slide has a triangular appearance; and wherein the slide has one Rongsheng space. [0007] The optical measuring device of the present invention is designed by using the refraction angle of the slide to achieve the feature of effectively amplifying the distance after refraction, so that the creation can be accurately measured with the simplest structural fit. Measuring the refractive index of the object and reducing the operational error value, and in order to make the above-mentioned purpose, technical features and gain performance after the actual implementation more obvious, in the following, the preferred embodiment is used to assist the corresponding pattern. For a more detailed explanation. [Embodiment] [0008] In order to understand the creative features, contents and advantages of the creation and the effects that can be achieved by the examiner, the present author will be described in detail with reference to the drawings, and the details of the embodiments are as follows. The schematics used are for the purpose of illustration and supplementary instructions. They are not necessarily true proportions and precise configurations after the implementation of the creation. Therefore, the proportions and configuration relationships of the attached drawings should not be interpreted or limited. The scope of the actual implementation, the first 1Q12 () 695i ^ single number A0101 page 5 / a total of 14 pages 1012022723-0 M437952 described. [0009] Please refer to the first figure, the present invention proposes an optical measuring device which can achieve a better measurement precision comparison effect by matching the light refraction distance with a simple device structure. In a preferred embodiment, a laser displacement module (10), a polarization beam splitter (20), a first angle mirror (30), a beam splitter (40), and a second couple may be included. An angle mirror (50), a plurality of reflection sheets (60), a to-be-tested slide assembly (70), and a position sensing module (80). [0010] The foregoing laser displacement module (1〇) can provide a laser light (A), and receives the laser beam from the inverse-returning regression to detect a displacement amount 'the laser displacement module (10) or For a laser displacement meter. [0011] The polarizing beam splitter (20) is disposed in front of the laser displacement module (10), and the laser beam emitted by the laser displacement module (10) is polarized and split to generate a first a polarization laser light (B) and a second polarization laser light (C), and causing the first polarization laser light (B) to go straight and let the second polarization
化雷射光（c)轉向朝一側折射。 IThe laser light (c) turns to refract toward one side. I
[0012] 前述之第一偶角反射鏡（30)對應設於該極化分光鏡（20) 之一側處，進而可接受該第二偏極化雷射光（C)而後經過 光線數次反射將該第二偏極化雷射光（C)折射回該極化分 光鏡（20)，而後再折射回該雷射位移模組（10)。 [0013] 前述之分光鏡（40)對應設於該極化分光鏡（20)之前方’ 且可接受該第一偏極化雷射光（B)之入射而後產生一校正 雷射光束（D)及一量測雷射光束（E)，且令該校正雷射光 束（D )朝前方射出’並令該量測雷射光束（E )朝一側轉向 顧藝产單编號删1 第6頁/共14頁 1012022723-0 M437952 射出。 [0014] 月|J述之第二偶角反射鏡（50)對應設於該分光鏡之前方， 或可對應固定於一多軸式平台（9〇)上，且該第二偶角反 射鏡（50)接爻該校正雷射光束〇)並將該校正雷射光束 (D)作多數次反射後朝該雷射位移模組（1〇)射回，而此時 ，該校正雷射光束（D)之偏振方向與該第一偏極化雷射光 (B)相同，因此與該第二偏極化雷射光（c)合成產生一回 饋雷射光（F)而被該雷射位移模組（1〇)接收。 φ [0015] 前述之反射片（60)對應設於該分光鏡（4〇)之一侧對應於 該量測雷射光束（E)之路徑上，並可將該量測雷射光束 (E)做多次反射後射向該多軸式平台（9〇)。 [0016] • 前述之待測玻片組件（70)對應設於該量測雷射光束（E)自 該反射片（60)射向該多轴式平台（9〇)之路徑間，其包含 一玻片（71 )，該玻片（71)具有一入射面（711)及一出射 面（712) ’其中該入射面（711)垂直於該量測雷射光束 (E)之入射方向’且其中該出射面（712)則對應該入射面 呈現一傾斜角度’該傾斜角度或可為45度，該玻片（71) 可呈現三角形外觀，且再者，該玻片（71)中具有一容盛 空間，而可選擇性注入待測之液體或者是擺放待測之物 質，而請進一步配合參看第二及三圖所示，其中透過該 玻片（71)之入射面（711)與出射面（712)之傾斜角度的設 計，進而可讓該玻片（71)之内容物經過該量測雷射光束 (E)照射後折射角度產生擴大之效果，以利做測量比對。 [0017] 前述之位置感測模組（80)對應設於該多軸式平台（90)上 以接收自該待測玻片組件（7 0 )所折射出之該量測雷射光 10120695^^^^* A0101 ^ T I / λ 14 I 1012022723-0 M437952 束（E)，並可透過電性連接於一運算模組主機（91)而計算 該量測雷射光束（E)照射通過該玻片（71)後產生之位置偏 差值’其中該位置感測模組（8 0 )為一位置感測哭（p s £)) ，且該位置感測模組（80)電性連接於一運算模組（91)， 例如該運算模組（91)為一電腦》 [0018] 而本創作利用雷射位移模組（10)可提供一雷射光（A)予一 極化分光鏡（20)，以進一步產生一第一偏極化雷射光（b) 與一第二偏極化雷射光（C)，第二偏極化雷射光透過 第一偶角反射鏡（30)後傳遞回雷射位移模組（1〇)，第一 偏極化雷射光（B)則透過分光鏡（40)後產生校正雷射光束 (D)及量測雷射光束（E)，而後利用第二偶角反射鏡（5〇) 反射校正雷射光束（D)回雷射位移模組（1〇)，此時，由於 校正雷射光束（D)之偏振方向與第一偏極化雷射光（B)相 同，因此可與第二偏極化雷射光（C)合成產生回饋雷射光 (F) ’此時該雷射位移模組（10)便可根據反射回來的回饋 雷射光（F)量測出一位移量，與此同時到用反射片（6 〇 )讓 該量測雷射光束（E)穿過該待測玻片組件（70)並傳遞到位 置感測模組（8〇)而可運用運算模組（91)計算出該玻片 (71)内所盛裝物之折射率。 [0019] 透過本創作之光學量測裝置於設計上之巧思變化，其利 用玻片（71)之折射角度設計，可達到有效地放大折射後 距離之特徵，讓本創作可得以用最簡單的結構配合而精 準地*量測待測物之折射率，且減少操作上之誤差值，為 習知技術所不能及者，故可見其增益性所在。 [0020] 101206951^^^^ 以上所述之實施例僅係為說明本創作之技術思想及特點 A0101 第8頁/共14頁 1012022723-0 M437952 ，其目的在使熟習此項技藝之人士能夠瞭解本創作之内 容並攄以實施，當不能以之限定本創作之專利範圍，即 大凡依本創作所揭示之精神所作之均等變化或修飾，仍 應涵蓋在本創作之專利範圍内。 [0021] 綜觀上述，可見本創作在突破先前之技術下，確實已達 到所欲增進之功效，且也非熟悉該項技藝者所易於思及 ，其所具之進步性、實用性，顯已符合專利之申請要件 ，爰依法提出專利申請，懇請貴局核准本件創作專利申 請案，以勵創作，至感德便。 【圖式簡單說明】 [0022] 第一圖為本創作之光學量測裝置之配置示意圖。 第二圖為本創作之光學量測裝置之實施例圖。 第三圖為本創作之光學量測裝置之實施例圖。 【主要元件符號說明】 [0023] 雷射位移模組（10) 極化分光鏡（20) ® 第-偶角反射鏡（30) 分光鏡（40) 第二偶角反射鏡（50) 反射片（60) 待測玻片組件（70) 玻片（71) 入射面（711) 出射面（712) 位置感測模組（80) 1012022723-0 1()12()695产單編號A0101 第9頁/共14頁 M437952 多軸式平台（90) 運算模組主機（91) 雷射光（A) 第一偏極化雷射光（B) 第二偏極化雷射光（C) 校正雷射光束（D) 量測雷射光束（E) 回饋雷射光（F)[0012] The first illuminating mirror (30) is disposed at one side of the polarizing beam splitter (20), and then the second polarized laser light (C) is accepted, and then the light is reflected several times. The second polarized laser light (C) is refracted back to the polarization beam splitter (20) and then refracted back to the laser displacement module (10). [0013] The aforementioned beam splitter (40) is disposed in front of the polarization beam splitter (20) and can accept the incident of the first polarization laser light (B) to generate a corrected laser beam (D). And measuring the laser beam (E) and causing the corrected laser beam (D) to be emitted toward the front and rotating the measuring laser beam (E) toward one side. / Total 14 pages 1012022723-0 M437952 shot. [0014] The second even-angle mirror (50) described in FIG. 6 is disposed in front of the beam splitter, or may be correspondingly fixed on a multi-axis platform (9〇), and the second even-angle mirror is (50) contacting the corrected laser beam 〇) and reflecting the corrected laser beam (D) to the laser displacement module (1〇), and at this time, correcting the laser beam (D) is polarized in the same direction as the first polarized laser light (B), and thus combined with the second polarized laser light (c) to generate a feedback laser light (F) by the laser displacement module (1〇) Receive. φ [0015] The aforementioned reflection sheet (60) corresponding to one side of the beam splitter (4〇) corresponds to the path of the measurement laser beam (E), and the measurement laser beam (E) After multiple reflections, it is directed to the multi-axis platform (9〇). [0016] The foregoing test slide assembly (70) is correspondingly disposed between the path of the measuring laser beam (E) from the reflective sheet (60) to the multi-axis platform (9〇), which comprises a slide (71) having an entrance face (711) and an exit face (712) 'where the incident face (711) is perpendicular to the incident direction of the measured laser beam (E) And wherein the exit surface (712) presents an oblique angle corresponding to the incident surface, or the tilt angle may be 45 degrees, the slide (71) may have a triangular appearance, and further, the slide (71) has A space for accommodation, which can be selectively injected into the liquid to be tested or placed on the substance to be tested, and further referred to the second and third figures, wherein the incident surface (711) of the slide (71) is transmitted. The design of the angle of inclination with the exit surface (712), in turn, allows the content of the slide (71) to be enlarged by the angle of refraction of the laser beam (E) to facilitate measurement comparison. [0017] The position sensing module (80) is correspondingly disposed on the multi-axis platform (90) to receive the measured laser light refracted from the to-be-tested slide assembly (70) 10120695^^ ^^* A0101 ^ TI / λ 14 I 1012022723-0 M437952 Beam (E), and can be calculated by electrically connecting to a computing module host (91) to measure the laser beam (E) through the slide (71) a positional deviation value generated after the position sensing module (800) is a position sensing crying (ps £), and the position sensing module (80) is electrically connected to a computing mode Group (91), for example, the computing module (91) is a computer [0018] and the present invention provides a laser beam (A) to a polarizing beam splitter (20) by using a laser displacement module (10). Further generating a first polarized laser light (b) and a second polarized laser light (C), and the second polarized laser light is transmitted back to the laser displacement through the first angle mirror (30) The module (1〇), the first polarized laser light (B) passes through the beam splitter (40) to generate a corrected laser beam (D) and a measuring laser beam (E), and then uses a second dipole reflection Mirror (5 〇) The reflection-corrected laser beam (D) is returned to the laser displacement module (1〇). At this time, since the polarization direction of the corrected laser beam (D) is the same as that of the first polarization laser beam (B), Synthesizing with the second polarized laser light (C) to generate feedback laser light (F) 'At this time, the laser displacement module (10) can measure a displacement amount according to the reflected feedback laser light (F). At the same time, the measuring laser beam (E) is passed through the to-be-tested slide assembly (70) and transmitted to the position sensing module (8〇) by using a reflection sheet (6 〇) to operate the operation module. (91) Calculate the refractive index of the contents contained in the slide (71). [0019] Through the design of the optical measuring device in the design of the ingenious change, the use of the refraction angle design of the slide (71), can achieve the characteristics of effectively magnifying the refraction distance, so that the creation can be used the easiest The structural fit accurately and accurately measures the refractive index of the object to be tested, and reduces the operational error value, which is inaccessible to the prior art, so that the gain is visible. [0020] 101206951^^^^ The above described embodiments are merely illustrative of the technical idea and features of the present invention A0101 page 8 / 14 pages 1012022723-0 M437952, the purpose of which is to enable those skilled in the art to understand The content of this creation is not intended to limit the scope of the patent, that is, the equivalent changes or modifications made by the author in the spirit of this creation should still be covered by the scope of this creation. [0021] Looking at the above, it can be seen that this creation has achieved the desired effect under the previous technology, and it is not familiar with the skill of the artist, and its progress and practicality are obvious. In accordance with the application requirements of the patent, the patent application is filed according to law, and you are requested to approve the creation of the patent application for this article, in order to encourage creation, to the sense of virtue. [Simple Description of the Drawings] [0022] The first figure is a schematic diagram of the configuration of the optical measuring device of the present invention. The second figure is a diagram of an embodiment of the optical measuring device of the present invention. The third figure is a diagram of an embodiment of the optical measuring device of the present invention. [Main component symbol description] [0023] Laser displacement module (10) Polarization beam splitter (20) ® Dipole mirror (30) Beam splitter (40) Second angle mirror (50) Reflector (60) Slider assembly to be tested (70) Slide (71) Incidence surface (711) Exit surface (712) Position sensing module (80) 1012022723-0 1()12()695 Production order number A0101 No. 9 Page / Total 14 pages M437952 Multi-axis platform (90) Computing module host (91) Laser light (A) First polarized laser light (B) Second polarized laser light (C) Corrected laser beam ( D) Measuring the laser beam (E) Retrieving the laser beam (F)
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