[go: up one dir, main page]

TWM401779U - Positioning structure of testing machine - Google Patents

Positioning structure of testing machine

Info

Publication number
TWM401779U
TWM401779U TW099220957U TW99220957U TWM401779U TW M401779 U TWM401779 U TW M401779U TW 099220957 U TW099220957 U TW 099220957U TW 99220957 U TW99220957 U TW 99220957U TW M401779 U TWM401779 U TW M401779U
Authority
TW
Taiwan
Prior art keywords
testing machine
positioning structure
positioning
testing
machine
Prior art date
Application number
TW099220957U
Other languages
Chinese (zh)
Inventor
Rigen Tsuchiya
Seiichi Hori
Original Assignee
Tkkhioki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tkkhioki Co Ltd filed Critical Tkkhioki Co Ltd
Priority to TW099220957U priority Critical patent/TWM401779U/en
Publication of TWM401779U publication Critical patent/TWM401779U/en

Links

TW099220957U 2010-10-29 2010-10-29 Positioning structure of testing machine TWM401779U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW099220957U TWM401779U (en) 2010-10-29 2010-10-29 Positioning structure of testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW099220957U TWM401779U (en) 2010-10-29 2010-10-29 Positioning structure of testing machine

Publications (1)

Publication Number Publication Date
TWM401779U true TWM401779U (en) 2011-04-11

Family

ID=60592679

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099220957U TWM401779U (en) 2010-10-29 2010-10-29 Positioning structure of testing machine

Country Status (1)

Country Link
TW (1) TWM401779U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI418818B (en) * 2012-10-29 2013-12-11 King Yuan Electronics Co Ltd Improved press bar of a testing socket and a testing equipment using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI418818B (en) * 2012-10-29 2013-12-11 King Yuan Electronics Co Ltd Improved press bar of a testing socket and a testing equipment using the same

Similar Documents

Publication Publication Date Title
EP2539355A4 (en) Polytag probes
ZA201204966B (en) Inter-frequency positioning measurements
EP2681855A4 (en) Over-the-air test
SG11201401212TA (en) Probe unit
GB201118773D0 (en) Probe
GB201010891D0 (en) Inspection
GB2480558B (en) Testing apparatus
EP2588930A4 (en) Measurement arrangement for field devices
EP2561795A4 (en) Probe
SG10201706003QA (en) Direct-docking probing device
GB201116131D0 (en) Probe
EP2659606A4 (en) Over-the-air test
EP2526744A4 (en) Improved biomarker generator
EP2596548A4 (en) Field probe
SG11201402812TA (en) Turbine apparatus
GB201005624D0 (en) Probe
EP2633796A4 (en) Probe
TWM402972U (en) Improved structure for positioning device
GB201102171D0 (en) Inspection of holes
EP2783197A4 (en) Padeye tester
TWM402949U (en) Fast positioning apparatus
GB201018434D0 (en) Testing device
EP2653090A4 (en) Probe
GB2481541B (en) Electrochemical test devices
EP2522269A4 (en) Probe

Legal Events

Date Code Title Description
MK4K Expiration of patent term of a granted utility model