TWM269454U - IC lead scanner - Google Patents

Description

M269454 IV. Creation Instructions (1) [Technical Field to which the New Type belongs] This creation is about an appearance inspection device for an IC device, in particular, two inspection stations are arranged along a slide rail, and one inspection station is set between the two inspection stations. Rotating mechanism 'in order to quickly detect the appearance inspection device of the four sides of the IC component. [Previous technology] The development of conventional IC imaging technology is used to detect various appearance dimensions of various types of J c after encapsulation. As shown in Figures 1 and 2, the appearance dimensions of general IC components 9 include the foot distance D1. 〔Pi tch〕, foot row bend D2 〔sweep〕, foot span d3 〔spread〕, foot height D4 〔stand f〕, foot bend D5 〔bend〕, foot coplanar D6 〔coplanarity], 9 colinear D7 〔col ine], inside bend D8 [toe in] and other defects. The above-mentioned defects related to the pin 91 are related to the three-dimensional appearance dimension, so the first issue is how to establish the imaging technology of the three-dimensional appearance dimension of the IC component 9. In order to test the appearance and dimensions of I C element 9, the industry has developed a custom C element

Such as the appearance inspection device, which is composed of a machine, a slider, an image capture unit and a light imaging module, which are mainly provided on both sides of the position of a detection station in the slide rail Light the imaging module, and set the image capture unit on the upper and lower sides of the same detection station. During the inspection operation, the IC element 9 is allowed to slide one by one to the inspection station on the slide rail to capture the top-view and two-side images of the process element 9. However, the above-mentioned appearance detection device is only suitable for detecting c-component 9 with pins 9 丨 on the two sides, but it is not suitable for detecting 1 (: component 9) with pins 9 丨 on all sides. The appearance detection The reason why the device is not applicable is that when all four sides of the IC component 9 are provided with pins 91, there must be pins 9 1 on both sides facing the longitudinal direction of the slider.

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Fourth, the creation instructions (2) method of fixing any lighting imaging module, so the pin 9 1 image on the benefit. In order to obtain n, +, λ / 1, in order to obtain the 1C component 9 in the longitudinal direction, it is necessary to first perform two sides on a machine ^ Wang cloth has W feet 91 to 1C material tube, and then the IC material tube is distributed to another _, w /, 彳, then collect the detection of the side pin 9 1. In this way, not only is it greatly limited; it is not conducive to simplification: 22: It ’s not easy to simplify: i voxels, it is always necessary to further improve the above ^ pieces u = "In view of this, this creation improves the above shortcomings It is based on the setting of two inspection stations, and the gates of the two inspection stations < 2 :: / month nine / mouth line IC components carried by the first rotation mechanism, when the pin on the slider side detection. With this, The component's other two-speed detection process and the expansion of the camera will increase the convenience and increase the [new content] / M The main purpose of this creation is to provide _ species! C component appearance inspection system-at least two detections along the slide rail Stand and set a rotating mechanism between the two detections, the rotating mechanism is used for 90. Rotate the IC component to quickly detect the four pins of the 1C component, so that this creation has increased detection convenience and speeded up the detection process. And the effect of broadening the scope of application. ^ The secondary purpose of this creation is to provide a c component appearance inspection device, which is divided into at least two inspection stations along the second slide rail, and one is placed below the last inspection station. Rotating mechanism ' Turn the 丨 c component so that the IC component is correctly returned to the IC material tube, so that the creation has an accelerated detection flow

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Page 6 M269454 IV. Creation instructions (3) Cheng's efficacy system: H 2 and T systems provide a 1 c component appearance inspection device, Amami, to the second parent inspection station and at least-rotation mechanism set, its Πΐ: to The free-fall method is used to allow the 1c element to slide at the slip, so that the creation has the effect of reducing the electrical energy required for transmission. Slide on the track ^ According to the ic element appearance detection device created by this creation, it includes a "" station, a rotating mechanism and a second detection station. The machine; a right slanted base plate and a slide rail. The slide rail is located at On the inclined substrate, Long: Yes-Send 1c components to be tested. The slide rail is provided with a wheel detection station, a rotation mechanism and a second detection station in order from top to bottom. The first detection station uses two 1 — 忒 ICs. The second side pin of the 7G piece. The rotating mechanism is used for g 0. Rotate the 1C element of the first inspection station in Shuanggang to allow it to be located under the rotation mechanism and pass the second inspection station to successfully detect the 1 (: element of The other two pins. Fang Zhi [Implementation] [* In order to make the above and other purposes, features, and advantages of this creation more understandable, the following exemplifies the preferred embodiment of this creation and cooperates with the "", f The detailed description is as follows: As shown in Fig. 3, the component c appearance inspection device of this creation includes a machine 1, a feeding and separating mechanism 2, a first detection station 3, a g. Rotating mechanism 4, a second detection station 5, a second rotating mechanism 6, a sorting output 7 and a computer 8, which are used to detect the packaged 1 (: component 9 (as shown in Figure 6), especially the Ic component 9 with pins on all sides, for example using PLCC [plastic leaded chip carrier, plastic IC chip 9 packaged with a leaded chip carrier], all four sides of this type of IC package element 9 have

M269454 4. Creation instructions u) Several IC pins 9 i bent towards the same side. Please refer to FIGS. 3 and 4 again, the machine 1 of this creation is provided with an inclined base plate 11 °, and the inclined base plate 丨 丨 is fixed with a slide rail 12. The feeding and separating mechanism 2, the first detecting station 3, the first rotating mechanism 4, the second detecting station 5, the second rotating mechanism 6 and the sorting and discharging area 7 are sequentially arranged along the line from top to bottom. The feeding and separating mechanism 2 is a conventional technology, and is roughly divided into a feeding area 21 and a separation area 22. The feeding area 21 is located at the platform above the inclined substrate. It uses a conveying structure (not labeled) such as a pneumatic cylinder and a pulley to extract at least one 1 C material tube 90 one by one so as to be contained in the IC material tube 90. Take out the IC element 9 and feed the IC element 9 into the slider 2. The separation area 22 is located on the inclined substrate 11 '. First, a large number of 1C elements 9 are temporarily positioned on the slider 12 by using a pneumatic cylinder 221 (as shown in FIG. 4), and then a stopper 222 and another are used. A pneumatic cylinder 2 23 releases a single 1C element 9 one by one to the first detection station 3 below. Since the 1 C element slides on the slider 12 in a free-fall manner, the power required for transmission can be relatively reduced. Please refer to FIG. 3 to FIG. 6 again. The first detection station 3 of this creation includes a light imaging module 31 and a positioning stop 32. The lighting imaging module 31 is provided with two sets of image manipulation units 311 and 312, two sets of first light sources 313, two sets of second light sources 314, one set of backlight light sources 315, two sets of reflectors 316, and two sets of diffusers 3 1 7 ° This slide holder 2 is provided with a glass plate corresponding to the first detection station 3 to form a detection area. The positioning stopper 32 is located at the bottom edge of the detection area, and is lifted or lowered by a pneumatic cylinder, so as to position the c element 9 in the detection area, or pass the detection area to the first rotating mechanism 4. As shown in FIG. 6, the image capturing unit 3 11 pairs are located directly above the detection area.

M269454

The first light source 313, the second light source 314, the reflecting mirror 316, and the diffusion plate 3 1 7 are disposed on two sides of the detection area. The image capturing unit 3 丨 2 is located on two sides directly below the detection area. The backlight light source 3 1 5 is disposed directly below the detection area. The image capturing units 311 and 312 are digital image capturing units using a CCD type [Charge Coupled Device] or a CMOS type [Complementary Metal Oxide Conductor] to output digital image files to a computer 8 for image analysis and processing. The first light source 3 1 3 and the backlight light source 3 1 5 are red LED lights, and the second light source 3 1 4 are green LED lights. As shown in FIGS. 6 and 7, the first light source 313 and the backlight light source 315 are used to provide the projection light (red light) required by the image capturing unit 3 11 so as to capture the pins 9 of the IC component 9 respectively. 1 the inner and outer edges of the image, and turn out the image ^^ image digital file to the computer 8 for image analysis processing to determine whether the pin 91 ^^ meets the standard. The second light source 3 1 4 is disposed behind the reflecting mirror 3 1 6 and the diffuser plate 3 1 7. The projected light (green light) of the second light source 3 丨 4 is uniformized by the diffuser plate 317 and then lowered. Angle projection to the pin 91 of the ic element 9 and imaging. Then the projected light (green light) is reflected by the translucent mirror 3 1 6 to the image capturing unit 312 below to capture the innermost edge position of the pin 91 Point the image, and output the image digital file to the computer 8 for image analysis and processing 'to determine whether the pin 9 1 meets the standard. In addition, the lower image capturing unit 3 1 2 adds a filter that filters out red light to avoid being interfered by red light; and the upper image capturing unit 3 丨 1 adds a filter that filters out green light. In order to avoid interference from green light, the image capturing units 311 and 3 1 2 can simultaneously perform image capturing operations under the projection of red and green light. Please refer to Figures 3 to 5, 7, and 8 again, the first rotating mechanism of this creation

M269454 Fourth, the creation instructions (6) 4 is provided with a driving device 41 and a cylinder-shaped square turntable 42. The driving device 41 is used to form a 9 ° with a turntable 42. Turn. The rotating disk 42 is provided with an L-shaped gate block 422. Before the rotating disk 42 rotates, the L-shaped guide 421: the opening-connects the sliding handle 12 above, so it can be used to introduce the 10 component 9 that has just passed the detection station 3. After entering the L-shaped guide rail ⑵, the heart X β stop 422 is properly positioned. After the rotating disk 42 is rotated, one of the openings of the L-shaped rail 421 is connected to the slider 12 below, so that the 忒 1C το member 9 can be easily slid to the second detection station 6 through the slide rail 12. Regarding the first party, the movement of the branch 4 is performed. When the lighting imaging module 31 of the first detection station 3 finishes detecting the two side pins 91 of the 1C element 9, the first rotation mechanism is used. 4 proceed to 90. The rotation of the slide rail 12 causes the pins 9 1 on the other side of the slide rail 12 to rotate toward the two sides of the slide rail 2. In this way, the pin 9 1 which has not been shot and captured can be successfully tested at the second testing station 5. With sighs, as shown in Figures 3 to 6 and 9, the architecture of the second detection station 5 is the same as that of the first detection station 3. It also includes a light imaging module 5 and a positioning block 5 2 . The second detection station 5 is used to detect the IC component 9 through 90. After the rotation, the other pin 9 1 on the side of the slide rail 12 is output to the computer 8 for image analysis processing to determine whether the pin 91 meets the standard. Please refer to Figs. 3 to 5, 10 and 11, the structure of the second rotating mechanism 6 is the same as that of the first rotating mechanism 4, and it also includes a driving device (not shown) and a rotating disk. 61. The driving device is used to drive the rotary disk 61 to rotate 90 ° again. The rotating disc 61 is also provided with an L-shaped guide 611 and two

C: \ Logo-5 \ Five Continents \ PK9678. Ptd page 10 M269454 3. Creation instructions (7) Stop block 6 1 2. This sorting and discharging area 7 is a conventional technology, and is provided with a positioning stop 71, a sucker-type robot arm 72, a good product recovery area 73, and a defective product recovery area 74. ^ As shown in Fig. 10 and Fig. 11, regarding the operation of the second rotating mechanism 6, before the detection, the feeding area 21 is an I c tube 9 with the opening facing downwards, and the 1C is taken out. Element 9. However, after passing through the two inspection stations 3 and 5, the C pipe 9 at the good product recovery area 73 and the defective product recovery area 74 recovers the far IC component 9 with the opening facing upward. Therefore, the 1C element 9 is rotated by 180 through the two rotation mechanisms 4, 6 in total. In this way, it will be advantageous to recover the 1 (: component 9 into the 1C material tube 90 according to the original material direction. Moreover, after the 1C component 9 passes the second and rotating mechanism 6, the 1C component 9 is temporarily positioned at the first Position the stopper 71 to wait for the computer 8 to determine whether it is good or defective. If it is judged to be good, the injury stopper 71 will fall, causing the ic element 9 to slide into the good product along the slide rail ^ Recovery area 73 1C material tube 90. If it is judged that the product is defective, the positioning block 71 will maintain a lifted state, and the sucker robot arm 72 will suck the ic element 9 into the 1C material tube 90 of the defective product recovery area 74. As described above, compared to the conventional IC component appearance inspection device, the four sides of the IC component cannot be detected on the same machine, so that only the IC component with two side pins can be used. By creating the first and second detection stations 3, 5 along the slide 12 and creating the first rotation mechanism 4 between the first and second detection stations 3, 5, the creation The first rotating mechanism 4 rotates the IC component 9 by 90 °, which can indeed facilitate the IC component 9 by the second detection station 5. Pin detection side. In this way, this creation can really increase the ease of detection, speed detection process and broaden the scope of application.

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M269454

Brief Description of the Drawings [Simplified Illustration of the Drawings Figure 1 Figure 2 Figure 3 Figure 4 Side view of defects related to conventional 1C components. Another-View of defects related to conventional I-C components. This creative IC component appearance detection device. This creative IC component appearance is 浐 ,, 丨, ,,,, and 3D. A three-dimensional perspective view of the structure. 14. Detecting Station and Rotating Machine Figure 5: This is a stereoscopic bottom view of the components outside the I c of this creation. Inspection station and rotating machine of Buguan detection device Figure 6: Schematic diagram of the appearance detection device of the IC component of this creation. J Yizhi's principle of image acquisition at the inspection station Figure 7: This is a perspective view of the 1C component appearance inspection device during the first inspection. The inspection station enters' Figure 8: This is a perspective perspective view of the 1C component appearance inspection device during the first rotation. Figure 9: Three-dimensional perspective view of the 1C component appearance inspection device during inspection.彳, 立体 占 进 仃 Figure 10: This is a stereo perspective view of the IC component's appearance detection during rotation. A is placed in the second rotation mechanism! Figure 1: A perspective view of the good quality of the K-component appearance inspection device when returning materials. Gen. Oral inlet Main component symbol description 1 Machine 12 Slide rail 11 Inclined base plate 2 Feeding and separating mechanism

C: \ Logo-5 \ Five Continents \ PK9678. Ptd Page 13 M269454 # Brief description of the drawing 21 Feed area 22 Separation 221 Pneumatic cylinder 222 Stopper 223 Pneumatic cylinder 3 First inspection station 31 Lighting imaging module 311 Image Capture unit 312 Image capture XSXJ Early morning 313 First light source 314 Second light source 315 Backlight light source 316 Reflector 317 Diffuser plate 32 Positioning stopper 4 First rotation mechanism 41 Zone motion device 42 Rotating disk 421 L-shaped guide 422 Stopper 5 Second inspection station 51 Lighting imaging module 52 Positioning stopper 6 Second rotation mechanism 61 Rotating disc 611 L-shaped guide 612 Stopper 7 Sorting out area 71 Positioning stopper 72 Suction robot arm 73 Good product recovery area 74 Defective product recycling area 8 Computer 9 1C component 90 1C material tube 91 pin

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Claims (1)

M269454 An IC unit, a tilted substrate, the first inspection and detection of the IC, at least one rotating measuring station, the first one, the second one, which is under the image capture, the second, which is the source, and the light source, which is the first The second inspection of 1C, the side guide, please take the first single reflection glass, please the shadow, the second image is located on the outside of the second light, please set up the station component, the second leg of the component station. The inspection device includes: an inclined substrate and a slider, the slider is configured to convey the I c element to be detected; 'it is arranged on the slide rail, and two pins of the first detection station; 'It is arranged on the slide rail and is located on the second rotation mechanism for 90. The rotation has passed the first; and 'It is provided on the slider, and is located at the rotation detection station for detecting 90 °. Rotate one element, mirror, and plate in the first range of the c-benefit range, and the Lifan image capture two light capture detection Lifan one light source, the station is equipped with one or two first light sources and two diffusers to form the detection area second item. The unit alignment source and the reflector unit are located directly below the inspection area. The second source and the backlight light use different IC component appearance detection and lighting imaging modules, which include, a second light source, A backlight and the slider correspond to the first inspection area. The 1C component appearance inspection is installed directly above the inspection area, and the diffuser plate is located on the two sides directly below the inspection area of the inspection area. The 0 is used for inspection of one inspection mechanism. Stand, the first and second sides are set with backlight, light, and the IC component appearance detection device mentioned above uses the same first color and second color light. M269454 5. Scope of patent application 5. According to the IC device appearance inspection device described in item 4 of the scope of patent application, the first light source and the backlight light source are red LED lights, and the second light source is a green L £ d light. 6. According to the IC device appearance inspection device described in item 2 of the scope of the patent application, the image capture unit selects a CCD-type or CMOS-type digital image capture unit in order to output an image digital file to a computer for image analysis deal with. 7. According to item 1 (: component appearance inspection device) described in item 1 of the scope of patent application, wherein the first inspection station is provided with a positioning stopper, which is located at the bottom edge of the inspection area of the first inspection station, and is lifted by a pneumatic cylinder And descending, so that the IC component is selected to be positioned in the detection area and passed through the detection area to the rotating mechanism. 8. According to the 1C component appearance inspection dress described in the first scope of the patent application__, the rotating mechanism is provided with a A driving device and a rotating disk, the driving device is used to drive the rotating disk to form a 90 ° rotation. 9. According to the IC component appearance detection device described in item 8 of the scope of patent application, wherein the rotating disk is provided with an L-shaped guide Before the rotary disk is rotated, one of the openings of the L-shaped guide rail is connected to the upper slide to introduce the IC component. After the rotary disk is rotated, one of the openings of the [shaped guide rail is connected to the lower one. Slide to get IC components. I 1 0. According to the appearance inspection of I c components described in item 1 of the scope of the patent application, the second detection station is provided with a light-emitting imaging module, which includes three acoustic image captures. Take unit, A first light source, two second light sources, a backlight light 5, two mirrors and two diffusion plate, and the slide should be performed on a second detection station ' C: \ Logo-5 \ Five Continents \ PK9678.ptd Page 16 M269454 V. Scope of patent application Set up a glass plate to form a detection area. 11. The IC component appearance inspection device according to Item 10 of the declared patent scope, wherein the image capturing unit pair is located directly above the detection area, and the first light source, the second light source, the reflector, and the diffusion plate are disposed in the detection area. Second, the image capturing unit is located on two sides directly below the detection area, and the north two light source is located directly below the detection area. / Moonlight 1 2. According to the c-component appearance inspection device described in Item 10 of the scope of the patent application, wherein the first light source and the backlight light source use the same first light, and the second light source uses a different light source. Two shades of light. 1 3. According to the IC device appearance detection device described in Item 12 of the scope of the patent application, the first light source and the backlight light source are red sLEE) lamps, and the second light source is a green LED lamp. 14. According to the I c component appearance inspection device described in Item 10 of the scope of patent application, wherein the image capture unit selects the use of a CCD type, a CMOS type digital, and an image capture unit in order to output an image digital file to a computer Perform image analysis processing. 15. According to the I c component appearance inspection device described in item 1 of the scope of the patent application, the first inspection station is provided with a positioning block, which is located at the bottom edge of the inspection area of the second inspection station. It is lifted by a pneumatic cylinder. And down so that the IC component is selectively positioned in the detection area and passes through the detection area. 16. The appearance inspection device for IC components according to item 1 of the scope of the patent application, wherein the second inspection station includes another rotating mechanism for rotating the IC that has passed the second inspection station again by 90. Components in order to recycle the IC components into each I c material tube in the original material direction. M269454 Fifth, the scope of the applied patent 17, the appearance inspection of the 1C component according to item 16 of the scope of the applied patent 18, where the rotating mechanism is provided with a driving device and a rotating disk, ^ ^, the device is used to drive the rotating disk to form 9 0. Turn. Λ drives the appearance inspection of the 1C component described in item Η of the patent scope. The rotary disk is provided with an L-shaped guide and _: I. Before the disk rotates: one of the openings of the L-shaped guide; Introduce 1C 70 pieces' after the rotation of the rotary disk—connect the slide rails below to derive the opening of "components." C: \ Logo-5 \ Five Continents \ PK9678.ptd Page 18