TWI810063B - Process inspection system for rack and server in rack - Google Patents
Process inspection system for rack and server in rack Download PDFInfo
- Publication number
- TWI810063B TWI810063B TW111134562A TW111134562A TWI810063B TW I810063 B TWI810063 B TW I810063B TW 111134562 A TW111134562 A TW 111134562A TW 111134562 A TW111134562 A TW 111134562A TW I810063 B TWI810063 B TW I810063B
- Authority
- TW
- Taiwan
- Prior art keywords
- server
- cabinet
- inspection
- stage
- detection device
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 208
- 238000007689 inspection Methods 0.000 title claims abstract description 121
- 238000001514 detection method Methods 0.000 claims abstract description 179
- 238000012360 testing method Methods 0.000 claims description 24
- 238000012423 maintenance Methods 0.000 claims description 12
- 238000009662 stress testing Methods 0.000 claims 6
- 238000010586 diagram Methods 0.000 description 14
- 230000000694 effects Effects 0.000 description 3
- 238000013102 re-test Methods 0.000 description 2
- 238000012956 testing procedure Methods 0.000 description 1
Images
Landscapes
- Automatic Analysis And Handling Materials Therefor (AREA)
- Hardware Redundancy (AREA)
Abstract
Description
一種檢測系統,尤其是指一種提供機櫃與機櫃內伺服器的工序檢測系統。A detection system, especially a process detection system for providing a cabinet and a server in the cabinet.
現有對於機櫃與機櫃內設置的伺服器檢測,分別進行L10階段的伺服器工序檢測以及L11階段的機櫃工序檢測,不論在L10階段的伺服器工序檢測或是L11階段的機櫃工序檢測中出現檢測問題時,L10階段的伺服器工序檢測或是L11階段的機櫃工序檢測都會被中斷,需要將伺服器與機櫃的綁定關係解除後以解決對應的問題後,機櫃與機櫃內設置的伺服器重新進行L10階段的伺服器工序檢測以及L11階段的機櫃工序檢測,這會導致機櫃與機櫃內設置的伺服器檢測耗費多餘的檢測時間。Currently, for the inspection of the cabinet and the servers installed in the cabinet, the server process inspection at the L10 stage and the cabinet process inspection at the L11 stage are respectively carried out. No matter whether there are detection problems in the server process inspection at the L10 stage or the cabinet process inspection at the L11 stage At this time, the server process detection in the L10 stage or the cabinet process detection in the L11 stage will be interrupted. After the binding relationship between the server and the cabinet needs to be released to solve the corresponding problem, the cabinet and the server installed in the cabinet will be re-executed. The server process detection in the L10 stage and the cabinet process detection in the L11 stage will cause the cabinet and the server installed in the cabinet to consume redundant detection time.
綜上所述,可知先前技術中長期以來一直存在現有對於機櫃與機櫃內設置的伺服器檢測流程過於費時的問題,因此有必要提出改進的技術手段,來解決此一問題。To sum up, it can be seen that there has been a long-standing problem in the prior art that the detection process of the cabinet and the server installed in the cabinet is too time-consuming, so it is necessary to propose an improved technical means to solve this problem.
有鑒於先前技術存在現有對於機櫃與機櫃內設置的伺服器檢測流程過於費時的問題,本發明遂揭露一種提供機櫃與機櫃內伺服器的工序檢測系統,其中:In view of the problem in the prior art that the detection process of the cabinet and the servers installed in the cabinet is too time-consuming, the present invention discloses a process detection system for providing the cabinet and the servers in the cabinet, wherein:
本發明所揭露第一實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,其包含:機櫃以及檢測裝置,機櫃設置有多個伺服器;及檢測裝置與機櫃建立連線,檢測裝置執行下列檢測過程:The first embodiment disclosed in the present invention provides a process detection system for a cabinet and servers in the cabinet, which includes: a cabinet and a detection device, the cabinet is provided with a plurality of servers; and the detection device establishes a connection with the cabinet, and the detection device executes The following testing procedures:
檢測裝置對機櫃中每一個伺服器進行L10階段的伺服器工序檢測;機櫃中伺服器於L10階段的伺服器工序檢測被檢測裝置檢測出伺服器工序失敗時,該伺服器自機櫃下架以進行維修;維修完成後的該伺服器重新上架於機櫃,檢測裝置對重新上架的該伺服器進行L10階段的伺服器工序檢測;當機櫃中所有伺服器於L10階段的伺服器工序檢測皆被檢測裝置檢測出伺服器工序成功時,檢測裝置對機櫃進行L11階段的機櫃工序檢測;機櫃中伺服器於L11階段的機櫃工序檢測被檢測裝置檢測出機櫃工序失敗時,該伺服器自機櫃下架以進行維修;及維修完成後的該伺服器重新上架於機櫃,檢測裝置先對重新上架的該伺服器進行L10階段的伺服器工序檢測且檢測出伺服器工序成功時,檢測裝置重新對機櫃進行L11階段的機櫃工序檢測。The detection device detects the server process at the L10 stage for each server in the cabinet; when the server in the cabinet detects that the server process at the L10 stage fails, the server is removed from the cabinet to perform Maintenance; after the repair is completed, the server is re-installed in the cabinet, and the detection device performs the server process inspection of the L10 stage on the re-installed server; when all the servers in the cabinet are detected in the L10 stage of the server process, they are detected by the detection device When it is detected that the server process is successful, the detection device detects the cabinet process at the L11 stage of the cabinet; when the server in the cabinet detects that the cabinet process at the L11 stage fails, the server is removed from the cabinet to perform Maintenance; and after the repair is completed, the server is re-installed in the cabinet. The detection device first performs the server process detection of the L10 stage on the re-installed server and detects that the server process is successful. The detection device re-performs the L11 stage of the cabinet Cabinet process detection.
本發明所揭露第二實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,其包含:機櫃、備用機櫃以及檢測裝置,機櫃設置有多個伺服器;備用機櫃設置有多個備用伺服器;及檢測裝置與機櫃建立連線,檢測裝置執行下列檢測過程:The second embodiment disclosed in the present invention provides a process detection system for a cabinet and servers in the cabinet, which includes: a cabinet, a backup cabinet and a detection device, the cabinet is provided with multiple servers; the backup cabinet is provided with multiple backup servers ; and the detection device establishes a connection with the cabinet, and the detection device performs the following detection process:
檢測裝置對機櫃中每一個伺服器進行L10階段的伺服器工序檢測;機櫃中伺服器於L10階段的伺服器工序檢測被檢測裝置檢測出伺服器工序失敗時,自備用機櫃選定備用伺服器與該伺服器相互替換;檢測裝置對機櫃中該備用伺服器進行L10階段的伺服器工序檢測;當機櫃中所有伺服器於L10階段的伺服器工序檢測皆被檢測裝置檢測出伺服器工序成功時,檢測裝置對機櫃進行L11階段的機櫃工序檢測;機櫃中伺服器於L11階段的機櫃工序檢測被檢測裝置檢測出機櫃工序失敗時,自備用機櫃選定未被替換的備用伺服器與該伺服器相互替換;及檢測裝置先對機櫃中該備用伺服器進行L10階段的伺服器工序檢測且檢測出伺服器工序成功時,檢測裝置重新對機櫃進行L11階段的機櫃工序檢測。The detection device detects the server process of the L10 stage for each server in the cabinet; when the server in the cabinet detects that the server process fails in the L10 stage, the detection device detects that the server process fails, and selects the backup server from the backup cabinet and The servers are replaced with each other; the detection device detects the server process in the L10 stage for the standby server in the cabinet; The detection device detects the cabinet process of the L11 stage of the cabinet; when the server in the cabinet detects that the cabinet process fails in the L11 stage of the cabinet process, the detected device detects that the cabinet process fails, and the standby server that has not been replaced is selected from the standby cabinet to communicate with the server. Replacement; and the detection device first detects the server process of the L10 stage on the standby server in the cabinet and detects that the server process is successful, the detection device re-performs the cabinet process detection of the L11 stage on the cabinet.
本發明所揭露第三實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,其包含:機櫃、備用機櫃以及檢測裝置,機櫃設置有多個伺服器;備用機櫃設置有多個備用伺服器;及檢測裝置分別與機櫃以及備用機櫃建立連線,檢測裝置執行下列檢測過程:The third embodiment disclosed in the present invention provides a process detection system for a cabinet and servers in the cabinet, which includes: a cabinet, a backup cabinet and a detection device, the cabinet is provided with multiple servers; the backup cabinet is provided with multiple backup servers ; and the detection device establishes connections with the cabinet and the standby cabinet respectively, and the detection device performs the following detection process:
檢測裝置對機櫃中每一個伺服器進行L10階段的伺服器工序檢測;檢測裝置對備用機櫃中每一個備用伺服器進行L10階段的伺服器工序檢測;機櫃中伺服器於L10階段的伺服器工序檢測被檢測裝置檢測出伺服器工序失敗時,自備用機櫃選取於L10階段的伺服器工序檢測被檢測裝置檢測出工序成功的備用伺服器以替換該伺服器;當機櫃中所有伺服器於L10階段的伺服器工序檢測皆被檢測裝置檢測出伺服器工序成功時,檢測裝置對機櫃進行L11階段的機櫃工序檢測;機櫃中伺服器於L11階段的機櫃工序檢測被檢測裝置檢測出機櫃工序失敗時,自備用機櫃選定未被替換的備用伺服器與該伺服器相互替換;及檢測裝置重新對機櫃進行L11階段的機櫃工序檢測。The detection device detects the server process of the L10 stage for each server in the cabinet; the detection device detects the server process of the L10 stage for each standby server in the standby cabinet; the server in the cabinet detects the server process of the L10 stage When the detected device detects that the server process has failed, the server process in the L10 stage is selected from the backup cabinet to detect the backup server whose process has been detected by the detected device to replace the server; when all the servers in the cabinet are in the L10 stage When the detection device detects that the server process is successful, the detection device detects the cabinet process at the L11 stage of the server; when the server in the cabinet detects that the cabinet process fails at the L11 stage, the detection device detects that the cabinet process fails. A backup server selected from the backup cabinet that has not been replaced is replaced with the server; and the detection device re-tests the cabinet in the L11 stage of the cabinet process.
本發明所揭露的系統如上,與先前技術之間的差異在於檢測裝置對機櫃中每一個伺服器進行L10階段的伺服器工序檢測,再進行L11階段的機櫃工序檢測,機櫃中伺服器於L10階段的伺服器工序檢測被檢測裝置檢測出伺服器工序失敗或是機櫃於L11階段的機櫃工序檢測被檢測裝置檢測出機櫃工序失敗時,提供伺服器進行維修或是以備用伺服器以替換伺服器,維修後的伺服器以及未進行L10階段的伺服器工序檢測的備用伺服器先進行L10階段的伺服器工序檢測再接續進行檢測流程,已進行L10階段的伺服器工序檢測的備用伺服器則可接續進行檢測流程。The system disclosed in the present invention is as above, and the difference between it and the prior art is that the detection device detects the server process at the L10 stage for each server in the cabinet, and then performs the cabinet process detection at the L11 stage. The servers in the cabinet are at the L10 stage When the server process detection device detects that the server process fails or the cabinet process detection device at the L11 stage detects that the cabinet process fails, the server is provided for maintenance or a spare server is used to replace the server. The server after maintenance and the backup server that has not undergone the server process inspection of the L10 stage first undergo the server process inspection of the L10 stage and then continue the inspection process, and the backup server that has undergone the server process inspection of the L10 stage can continue Carry out the detection process.
透過上述的技術手段,本發明可以達成降低機櫃與機櫃內設置的伺服器檢測流程時長的技術功效。Through the above-mentioned technical means, the present invention can achieve the technical effect of reducing the detection process time of the cabinet and the server installed in the cabinet.
以下將配合圖式及實施例來詳細說明本發明的實施方式,藉此對本發明如何應用技術手段來解決技術問題並達成技術功效的實現過程能充分理解並據以實施。The implementation of the present invention will be described in detail below in conjunction with the drawings and examples, so as to fully understand and implement the implementation process of how the present invention uses technical means to solve technical problems and achieve technical effects.
以下說明為本發明所揭露第一實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,並請參考「第1圖」所示,「第1圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第一實施態樣的架構示意圖。The following description is the process inspection system for providing the cabinet and the server in the cabinet according to the first embodiment disclosed by the present invention, and please refer to "Fig. 1", which shows the cabinet and the cabinet provided by the present invention A schematic structural diagram of the first implementation aspect of the internal server process inspection.
本發明所揭露第一實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,其包含:機櫃100以及檢測裝置300,機櫃100設置有第一伺服器101、第二伺服器102以及第三伺服器103,在此僅為舉例說明之,並不以此侷限本發明的應用範疇;及檢測裝置300與機櫃100建立連線,檢測裝置300執行下列檢測過程:The process inspection system for providing cabinets and servers in the cabinet disclosed in the first embodiment of the present invention includes: a
檢測裝置300對機櫃100中第一伺服器101、第二伺服器102以及第三伺服器103進行L10階段的伺服器工序檢測,L10階段的伺服器工序檢測包含伺服器組裝檢測、伺服器初步檢測、伺服器升級固件檢測、伺服器基本功能檢測、伺服器配置檢測、伺服器壓力測試檢測、伺服器壓測後二次基本功能檢測以及伺服器系統日誌檢測,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。The
在第一實施態樣中,機櫃100中第一伺服器101於L10階段的伺服器工序檢測被檢測裝置300檢測出伺服器工序失敗,第一伺服器101自機櫃100下架以進行維修,維修完成後的第一伺服器101重新上架於機櫃100,檢測裝置300對重新上架的第一伺服器101進行L10階段的伺服器工序檢測。In the first embodiment, the
當機櫃100中第一伺服器101、第二伺服器102以及第三伺服器103於L10階段的伺服器工序檢測皆被檢測裝置300檢測出伺服器工序成功,檢測裝置300對機櫃100進行L11階段的機櫃工序檢測,L11階段的機櫃工序檢測包含機櫃組裝檢測、機櫃壓力測試檢測、機櫃壓測後基本功能檢測以及機櫃壓測後配置檢測,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。When the
機櫃100中第三伺服器103於L11階段的機櫃工序檢測被檢測裝置300檢測出機櫃100工序失敗,第三伺服器103自機櫃100下架以進行維修,維修完成後的第三伺服器103重新上架於機櫃100,檢測裝置300先對重新上架的第三伺服器103進行L10階段的伺服器工序檢測且檢測出伺服器工序成功時,檢測裝置300重新對機櫃100進行L11階段的機櫃工序檢測。The
以下說明為本發明所揭露第二實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,並請參考「第2A圖」所示,「第2A圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第二實施態樣的架構示意圖。The following description is the process inspection system for providing the cabinet and the server in the cabinet according to the second embodiment disclosed by the present invention, and please refer to "Figure 2A", which shows the cabinet and the cabinet provided by the present invention A schematic diagram of the structure of the second embodiment of the internal server process inspection.
本發明所揭露第二實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,其包含:機櫃100、備用機櫃200以及檢測裝置300,機櫃100設置有第一伺服器101、第二伺服器102以及第三伺服器103,在此僅為舉例說明之,並不以此侷限本發明的應用範疇;備用機櫃200設置有第一備用伺服器201、第二備用伺服器202以及第三備用伺服器203,在此僅為舉例說明之,並不以此侷限本發明的應用範疇;及檢測裝置300與機櫃100建立連線,檢測裝置300執行下列檢測過程:The second embodiment disclosed in the present invention provides a process detection system for a cabinet and a server in the cabinet, which includes: a
檢測裝置300對機櫃100中第一伺服器101、第二伺服器102以及第三伺服器103進行L10階段的伺服器工序檢測,L10階段的伺服器工序檢測包含伺服器組裝檢測、伺服器初步檢測、伺服器升級固件檢測、伺服器基本功能檢測、伺服器配置檢測、伺服器壓力測試檢測、伺服器壓測後二次基本功能檢測以及伺服器系統日誌檢測,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。The
在第二實施態樣中,機櫃100中第一伺服器101於L10階段的伺服器工序檢測被檢測裝置300檢測出伺服器工序失敗,自備用機櫃200選定第二備用伺服器202與第一伺服器101相互替換,檢測裝置300再對機櫃100中第二備用伺服器202進行L10階段的伺服器工序檢測,第一伺服器101與第二備用伺服器202相互替換的示意請參考「第2B圖」所示,「第2B圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第二實施態樣的伺服器替換示意圖。In the second embodiment, the
當機櫃100中第二備用伺服器202、第二伺服器102以及第三伺服器103於L10階段的伺服器工序檢測皆被檢測裝置300檢測出伺服器工序成功時,檢測裝置300對機櫃100進行L11階段的機櫃工序檢測,L11階段的機櫃工序檢測包含機櫃組裝檢測、機櫃壓力測試檢測、機櫃壓測後基本功能檢測以及機櫃壓測後配置檢測,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。When the
機櫃100中第三伺服器103於L11階段的機櫃工序檢測被檢測裝置300檢測出機櫃100工序失敗時,自備用機櫃200選定未被替換的第三備用伺服器203與第三伺服器103相互替換,第三伺服器103與第三備用伺服器203相互替換的示意請參考「第2C圖」所示,「第2C圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第二實施態樣的伺服器替換示意圖。When the
檢測裝置300先對機櫃100中第三備用伺服器203進行L10階段的伺服器工序檢測且檢測出伺服器工序成功時,檢測裝置300重新對機櫃100進行L11階段的機櫃工序檢測。The
以下說明為本發明所揭露第三實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,並請參考「第3A圖」所示,「第3A圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第三實施態樣的架構示意圖。The following description is the process inspection system for providing the cabinet and the server in the cabinet according to the third embodiment disclosed by the present invention, and please refer to "Figure 3A", which shows the cabinet and the cabinet provided by the present invention A schematic diagram of the structure of the third embodiment of the internal server process inspection.
本發明所揭露第三實施態樣的提供機櫃與機櫃內伺服器的工序檢測系統,其包含:機櫃100、備用機櫃200以及檢測裝置300,機櫃100設置有第一伺服器101、第二伺服器102以及第三伺服器103,在此僅為舉例說明之,並不以此侷限本發明的應用範疇;備用機櫃200設置有第一備用伺服器201、第二備用伺服器202以及第三備用伺服器203,在此僅為舉例說明之,並不以此侷限本發明的應用範疇;及檢測裝置300分別與機櫃100以及備用機櫃200建立連線,檢測裝置300執行下列檢測過程:The third embodiment disclosed in the present invention provides a process detection system for cabinets and servers in the cabinet, which includes: a
檢測裝置300對機櫃100中第一伺服器101、第二伺服器102以及第三伺服器103進行L10階段的伺服器工序檢測,並且檢測裝置300對備用機櫃200中第一備用伺服器201、第二備用伺服器202以及第三備用伺服器203進行L10階段的伺服器工序檢測,L10階段的伺服器工序檢測包含伺服器組裝檢測、伺服器初步檢測、伺服器升級固件檢測、伺服器基本功能檢測、伺服器配置檢測、伺服器壓力測試檢測、伺服器壓測後二次基本功能檢測以及伺服器系統日誌檢測,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。The
在第三實施態樣中,機櫃100中第一伺服器101於L10階段的伺服器工序檢測被檢測裝置300檢測出伺服器工序失敗,自備用機櫃200選取於L10階段的伺服器工序檢測被檢測裝置300檢測出工序成功的第二備用伺服器202以替換第一伺服器101,由於第二備用伺服器202已被檢測裝置300檢測出伺服器工序成功,故而第二備用伺服器202替換第一伺服器101時,並不需要再次對第二備用伺服器202進行L10階段的伺服器工序檢測,第一伺服器101與第二備用伺服器202相互替換的示意請參考「第3B圖」所示,「第3B圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第三實施態樣的伺服器替換示意圖。In the third embodiment, the
當機櫃100中第二備用伺服器202、第二伺服器102以及第三伺服器103於L10階段的伺服器工序檢測皆被檢測裝置300檢測出伺服器工序成功時,檢測裝置300對機櫃100進行L11階段的機櫃工序檢測,L11階段的機櫃工序檢測包含機櫃組裝檢測、機櫃壓力測試檢測、機櫃壓測後基本功能檢測以及機櫃壓測後配置檢測,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。When the
機櫃100中第三伺服器103於L11階段的機櫃工序檢測被檢測裝置300檢測出機櫃100工序失敗,自備用機櫃200選定未被替換的第三備用伺服器203與第三伺服器103相互替換,由於第三備用伺服器203已被檢測裝置300檢測出伺服器工序成功,故而第三備用伺服器203替換第三伺服器103時,並不需要再次對第三備用伺服器203進行L10階段的伺服器工序檢測,第三伺服器103與第三備用伺服器203相互替換的示意請參考「第3C圖」所示,「第3C圖」繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第三實施態樣的伺服器替換示意圖,檢測裝置300重新對機櫃100進行L11階段的機櫃工序檢測。The
綜上所述,可知本發明與先前技術之間的差異在於檢測裝置對機櫃中每一個伺服器進行L10階段的伺服器工序檢測,再進行L11階段的機櫃工序檢測,機櫃中伺服器於L10階段的伺服器工序檢測被檢測裝置檢測出伺服器工序失敗或是機櫃於L11階段的機櫃工序檢測被檢測裝置檢測出機櫃工序失敗時,提供伺服器進行維修或是以備用伺服器以替換伺服器,維修後的伺服器以及未進行L10階段的伺服器工序檢測的備用伺服器先進行L10階段的伺服器工序檢測再接續進行檢測流程,已進行L10階段的伺服器工序檢測的備用伺服器則可接續進行檢測流程。In summary, it can be seen that the difference between the present invention and the prior art is that the detection device detects the server process at the L10 stage for each server in the cabinet, and then performs the cabinet process detection at the L11 stage. The servers in the cabinet are at the L10 stage When the server process detection device detects that the server process fails or the cabinet process detection device at the L11 stage detects that the cabinet process fails, the server is provided for maintenance or a spare server is used to replace the server. The server after maintenance and the backup server that has not undergone the server process inspection of the L10 stage first undergo the server process inspection of the L10 stage and then continue the inspection process, and the backup server that has undergone the server process inspection of the L10 stage can continue Carry out the detection process.
藉由此一技術手段可以來解決先前技術所存在現有對於機櫃與機櫃內設置的伺服器檢測流程過於費時的問題,進而達成降低機櫃與機櫃內設置的伺服器檢測流程時長的技術功效。This technical means can solve the time-consuming problem existing in the prior art for the detection process of the cabinet and the servers installed in the cabinet, and then achieve the technical effect of reducing the time of the detection process of the cabinet and the servers installed in the cabinet.
雖然本發明所揭露的實施方式如上,惟所述的內容並非用以直接限定本發明的專利保護範圍。任何本發明所屬技術領域中具有通常知識者,在不脫離本發明所揭露的精神和範圍的前提下,可以在實施的形式上及細節上作些許的更動。本發明的專利保護範圍,仍須以所附的申請專利範圍所界定者為準。Although the embodiments disclosed in the present invention are as above, the content described above is not intended to directly limit the patent protection scope of the present invention. Anyone with ordinary knowledge in the technical field to which the present invention belongs can make some changes in the forms and details of the implementation without departing from the disclosed spirit and scope of the present invention. The scope of patent protection of the present invention must still be defined by the appended patent application scope.
100:機櫃100: cabinet
101:第一伺服器101: The first server
102:第二伺服器102:Second server
103:第三伺服器103: The third server
200:備用機櫃200: spare cabinet
201:第一備用伺服器201: First backup server
202:第二備用伺服器202:Second backup server
203:第三備用伺服器203: The third backup server
300:檢測裝置300: detection device
第1圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第一實施態樣的架構示意圖。 第2A圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第二實施態樣的架構示意圖。 第2B圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第二實施態樣的伺服器替換示意圖。 第2C圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第二實施態樣的伺服器替換示意圖。 第3A圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第三實施態樣的架構示意圖。 第3B圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第三實施態樣的伺服器替換示意圖。 第3C圖繪示為本發明提供機櫃與機櫃內伺服器的工序檢測第三實施態樣的伺服器替換示意圖。 FIG. 1 is a schematic diagram of the structure of the first embodiment of the process detection of the cabinet and the server in the cabinet provided by the present invention. FIG. 2A is a schematic diagram of the structure of the second embodiment of the process detection of the cabinet and the server in the cabinet provided by the present invention. FIG. 2B is a schematic diagram of server replacement for the second embodiment of process detection of the cabinet and the server in the cabinet provided by the present invention. FIG. 2C is a schematic diagram of server replacement for the second embodiment of process detection of the cabinet and the server in the cabinet provided by the present invention. FIG. 3A is a schematic diagram of the structure of the third embodiment of the process detection of the cabinet and the server in the cabinet provided by the present invention. FIG. 3B is a schematic diagram of server replacement for the third embodiment of the process inspection of the cabinet and the server in the cabinet provided by the present invention. FIG. 3C is a schematic diagram of server replacement for the third embodiment of the process inspection of the cabinet and the server in the cabinet provided by the present invention.
100:機櫃 100: cabinet
101:第一伺服器 101: The first server
102:第二伺服器 102:Second server
103:第三伺服器 103: The third server
300:檢測裝置 300: detection device
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111134562A TWI810063B (en) | 2022-09-13 | 2022-09-13 | Process inspection system for rack and server in rack |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111134562A TWI810063B (en) | 2022-09-13 | 2022-09-13 | Process inspection system for rack and server in rack |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI810063B true TWI810063B (en) | 2023-07-21 |
| TW202412596A TW202412596A (en) | 2024-03-16 |
Family
ID=88149533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111134562A TWI810063B (en) | 2022-09-13 | 2022-09-13 | Process inspection system for rack and server in rack |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI810063B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM404381U (en) * | 2010-12-22 | 2011-05-21 | Inventec Corp | Server with line connection inspection device |
| TW201406270A (en) * | 2012-07-16 | 2014-02-01 | Delta Electronics Inc | Control device and rack using same |
| US20180100812A1 (en) * | 2016-10-12 | 2018-04-12 | Fujitsu Limited | Inspection system and inspection method |
| US20220187822A1 (en) * | 2016-05-09 | 2022-06-16 | Strong Force Iot Portfolio 2016, Llc | Systems and methods for enabling user selection of components for data collection in an industrial environment |
-
2022
- 2022-09-13 TW TW111134562A patent/TWI810063B/en active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM404381U (en) * | 2010-12-22 | 2011-05-21 | Inventec Corp | Server with line connection inspection device |
| TW201406270A (en) * | 2012-07-16 | 2014-02-01 | Delta Electronics Inc | Control device and rack using same |
| US20220187822A1 (en) * | 2016-05-09 | 2022-06-16 | Strong Force Iot Portfolio 2016, Llc | Systems and methods for enabling user selection of components for data collection in an industrial environment |
| US20180100812A1 (en) * | 2016-10-12 | 2018-04-12 | Fujitsu Limited | Inspection system and inspection method |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202412596A (en) | 2024-03-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106933693A (en) | A kind of data-base cluster node failure self-repairing method and system | |
| CN106650942A (en) | Fault diagnosis method based on electronic equipment testability model | |
| TWI810063B (en) | Process inspection system for rack and server in rack | |
| CN105260274A (en) | Method for detecting random hot plug stability of hard disk based on linux | |
| CN107643964A (en) | A kind of method of automatic batch test whole machine cabinet server performance | |
| CN101414273A (en) | Method for evaluating storage system RAID redundant data risk | |
| CN103049345A (en) | Magnetic disk state transition detection method and device based on asynchronous communication mechanism | |
| CN107907838A (en) | A kind of redundant power module tests system and method | |
| US12278662B2 (en) | Systems and methods for identifying fiber link failures in an optical network | |
| CN101283243B (en) | System and method for detecting sensor fault in refrigeration system | |
| CN105354102A (en) | File system maintenance and repairing method and apparatus | |
| CN101271419A (en) | Method, device and system for detecting and processing failure of random access memory | |
| CN111273932A (en) | A component refresh method, system and computer-readable storage medium | |
| CN109918235B (en) | A kind of method of calibration for Safety-Critical System software upgrading | |
| CN107807868A (en) | A kind of dual control storage system disaster dump method of testing and system | |
| CN117851136A (en) | High availability method applied to space wing cloud backup service | |
| CN111459734A (en) | A testing method, system and computer storage medium for fault monitoring period | |
| CN118349404A (en) | Fault processing method and device | |
| CN117707860A (en) | Process detection system for providing cabinet and server in cabinet | |
| CN117289657A (en) | Circulation control system and method for wafer loading jig | |
| CN107832178A (en) | A kind of automated testing method of server stability | |
| CN111290920B (en) | System, method and storage medium for testing CPU temperature based on PECI bus | |
| CN113987065A (en) | Database drift method, system, electronic device and storage medium | |
| KR20200106124A (en) | Test automation framework for dbms for analysis of bigdata and method of test automation | |
| CN223637038U (en) | A valve leakage detection fixture |