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TWI885189B - Radiographic image processing method, learning completion model, radiographic image processing module, radiographic image processing program, radiographic image processing system, and machine learning method - Google Patents

Radiographic image processing method, learning completion model, radiographic image processing module, radiographic image processing program, radiographic image processing system, and machine learning method Download PDF

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TWI885189B
TWI885189B TW110129134A TW110129134A TWI885189B TW I885189 B TWI885189 B TW I885189B TW 110129134 A TW110129134 A TW 110129134A TW 110129134 A TW110129134 A TW 110129134A TW I885189 B TWI885189 B TW I885189B
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radiation
image processing
image
learning
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TW202307465A (en
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大西達也
須山敏康
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日商濱松赫德尼古斯股份有限公司
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Abstract

本發明提供一種可有效地去除放射線圖像之雜訊之放射線圖像處理方法、學習完成模型、放射線圖像處理模組、放射線圖像處理程式及放射線圖像處理系統。控制裝置20具備:輸入部201,其受理表示照射X射線並拍攝對象物F時之X射線之產生源之動作條件、或對象物F之攝像時之攝像條件之任一者之條件資訊之輸入;算出部202,其基於條件資訊,算出穿透對象物F之X射線之平均能量;及篩選部203,其基於平均能量,自預先使用圖像資料藉由機器學習而分別構建之複數個學習完成模型206之中,篩選學習完成模型206之候選者。The present invention provides a radiographic image processing method, a learning model, a radiographic image processing module, a radiographic image processing program, and a radiographic image processing system that can effectively remove noise from radiographic images. The control device 20 includes: an input unit 201 that receives input of condition information indicating either an operation condition of an X-ray source when irradiating X-rays and photographing an object F, or an imaging condition when photographing the object F; a calculation unit 202 that calculates the average energy of the X-rays penetrating the object F based on the condition information; and a screening unit 203 that screens candidates for the learning model 206 from a plurality of learning models 206 that are constructed by machine learning using image data in advance based on the average energy.

Description

放射線圖像處理方法、學習完成模型、放射線圖像處理模組、放射線圖像處理程式、放射線圖像處理系統及機器學習方法Radiographic image processing method, learning completion model, radiographic image processing module, radiographic image processing program, radiographic image processing system, and machine learning method

實施形態之一態樣係關於一種放射線圖像處理方法、學習完成模型、放射線圖像處理模組、放射線圖像處理程式、放射線圖像處理系統及機器學習方法。 One embodiment of the present invention relates to a radiation image processing method, a learning completion model, a radiation image processing module, a radiation image processing program, a radiation image processing system, and a machine learning method.

自先前已知以圖像資料為對象使用藉由深度學習等之機器學習而構建之學習完成模型進行雜訊去除之手法(例如,參照下述專利文獻1)。根據該手法,由於自動地去除來自圖像資料之雜訊,因此可高精度地觀察對象物。 It is previously known that a method of removing noise using a learned model constructed by machine learning such as deep learning is used for image data (for example, refer to the following patent document 1). According to this method, since noise from image data is automatically removed, the object can be observed with high accuracy.

[先前技術文獻] [Prior Art Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本特開2019-91393號公報 [Patent Document 1] Japanese Patent Publication No. 2019-91393

於如上述之先前之手法中,於以藉由使X射線等放射線穿透對象物而 產生之放射線圖像為對象之情形下,有時雜訊之去除不充分。例如,有如下之傾向:根據X射線源等放射線產生源之條件、所使用之濾光器之種類等條件,圖像之亮度與雜訊之關係容易變動,而無法有效地去除雜訊。 In the above-mentioned previous methods, when the object is a radiographic image generated by allowing radiation such as X-rays to penetrate an object, noise removal is sometimes insufficient. For example, there is a tendency that the relationship between image brightness and noise is easily changed depending on the conditions of the radiation generating source such as the X-ray source, the type of filter used, etc., and noise cannot be effectively removed.

因此,實施形態之一態樣係鑒於所述課題而完成者,其課題在於提供一種可有效地去除放射線圖像之雜訊之放射線圖像處理方法、學習完成模型、放射線圖像處理模組、放射線圖像處理程式、放射線圖像處理系統及機器學習方法。 Therefore, one embodiment of the present invention is completed in view of the above-mentioned subject, which is to provide a radiation image processing method, a learning completion model, a radiation image processing module, a radiation image processing program, a radiation image processing system and a machine learning method that can effectively remove the noise of radiation images.

實施形態之一態樣之放射線圖像處理方法具備如下之步驟:輸入表示照射放射線並拍攝對象物時之放射線之產生源之條件、或攝像條件之任一者之條件資訊;基於條件資訊,算出與穿透對象物之放射線相關之平均能量;及基於平均能量,自預先使用圖像資料藉由機器學習而分別構建之複數個學習完成模型之中,篩選學習完成模型之候選者。 A radiation image processing method of one embodiment includes the following steps: inputting condition information indicating the conditions of the radiation source or the imaging conditions when irradiating radiation and photographing an object; calculating the average energy associated with the radiation penetrating the object based on the condition information; and selecting a candidate for a learning model from a plurality of learning models that are constructed by machine learning using image data in advance based on the average energy.

或者,實施形態之另一態樣之學習完成模型,係於上述之放射線圖像處理方法中所使用之學習完成模型,使用圖像資料藉由機器學習而構建,使處理器執行自對象物之放射線圖像去除雜訊之圖像處理。 Alternatively, another embodiment of the learning completion model is a learning completion model used in the above-mentioned radiation image processing method, which is constructed by machine learning using image data, so that the processor performs image processing to remove noise from the radiation image of the object.

或者,實施形態之另一態樣之放射線圖像處理模組具備:輸入部,其受理表示照射放射線並拍攝對象物時之放射線之產生源之條件、或攝像條件之任一者之條件資訊之輸入;算出部,其基於條件資訊,算出與穿透 對象物之放射線相關之平均能量;及篩選部,其基於平均能量,自預先使用圖像資料藉由機器學習而分別構建之複數個學習完成模型之中,篩選學習完成模型之候選者。 Alternatively, a radiation image processing module of another embodiment includes: an input unit that receives input of condition information indicating the conditions of the radiation source or the imaging conditions when the object is irradiated with radiation; a calculation unit that calculates the average energy related to the radiation penetrating the object based on the condition information; and a screening unit that screens candidates for the learning model from a plurality of learning models that are constructed in advance by machine learning using image data based on the average energy.

或者,實施形態之另一態樣之放射線圖像處理程式使處理器作為輸入部、算出部、篩選部發揮功能,該輸入部受理表示照射放射線並拍攝對象物時之放射線之產生源之條件、或攝像條件之任一者之條件資訊之輸入;該算出部基於條件資訊,算出與穿透對象物之放射線相關之平均能量;該篩選部基於平均能量,自預先使用圖像資料藉由機器學習而分別構建之複數個學習完成模型之中,篩選學習完成模型之候選者。 Alternatively, a radiation image processing program of another embodiment enables a processor to function as an input unit, a calculation unit, and a screening unit. The input unit receives input of condition information indicating the conditions of the radiation source or the imaging conditions when the object is irradiated with radiation and photographed; the calculation unit calculates the average energy related to the radiation penetrating the object based on the condition information; and the screening unit screens candidates for the learning model from a plurality of learning models that are constructed by machine learning using image data in advance based on the average energy.

或者,實施形態之另一態樣之放射線圖像處理系統具備:上述之放射線圖像處理模組;產生源,其向對象物照射放射線;及攝像裝置,其拍攝穿透對象物之放射線並取得放射線圖像。 Alternatively, a radiation image processing system of another embodiment includes: the above-mentioned radiation image processing module; a source that irradiates radiation to an object; and a camera that captures radiation that penetrates the object and obtains a radiation image.

或者,實施形態之另一態樣之機器學習方法,具備藉由機器學習構建學習完成模型之步驟,該學習完成模型係將跟基於表示照射放射線並拍攝對象物時之放射線之產生源之條件或攝像條件之任一者之條件資訊,而算出之平均能量,且係與穿透對象物之放射線相關之平均能量對應之對象物之放射線圖像之訓練圖像,作為訓練資料使用,輸出基於訓練圖像而去除雜訊後之圖像資料。 Alternatively, a machine learning method of another embodiment includes a step of constructing a learning model by machine learning, wherein the learning model uses a training image of a radiographic image of an object corresponding to the average energy of radiation penetrating the object, which is calculated based on condition information representing either a condition of a radiation source or an imaging condition when the object is irradiated with radiation and photographed, as training data, and outputs image data after noise removal based on the training image.

根據上述一態樣或者另一態樣之任一者,基於取得對象物之放射線 圖像時之放射線之產生源之條件或攝像條件,算出穿透對象物之放射線之平均能量。然後,基於該平均能量,自預先構建之學習完成模型之中篩選雜訊去除所使用之學習完成模型之候選者。藉此,由於與攝像對象之放射線之平均能量對應之學習完成模型使用於雜訊去除,因此可實現跟放射線圖像之亮度與雜訊之關係對應之雜訊去除。其結果為,可有效地去除放射線圖像之雜訊。 According to one or the other of the above aspects, the average energy of radiation penetrating the object is calculated based on the conditions of the radiation source or the imaging conditions when the radiation image of the object is obtained. Then, based on the average energy, the candidate of the learned model used for noise removal is screened from the pre-constructed learned models. In this way, since the learned model corresponding to the average energy of the radiation of the imaged object is used for noise removal, noise removal corresponding to the relationship between the brightness and noise of the radiation image can be realized. As a result, the noise of the radiation image can be effectively removed.

根據實施形態,可有效地去除對象物之放射線圖像之雜訊。 Depending on the implementation form, the noise of the radiation image of the object can be effectively removed.

1:圖像取得裝置 1: Image acquisition device

10:X射線檢測相機(攝像裝置) 10: X-ray detection camera (photographic device)

11a,11b:閃爍器 11a,11b: Flasher

12a,12b:線掃描相機 12a,12b: Line scanning camera

13:感測器控制部 13: Sensor control unit

14a,14b:放大器 14a,14b:Amplifier

15a,15b:AD轉換器 15a,15b:AD converter

16a,16b:修正電路 16a,16b: Correction circuit

17a,17b:輸出介面 17a,17b: Output interface

18:放大器控制部 18: Amplifier control unit

19:濾光器 19: Light filter

20,20A:控制裝置(放射線圖像處理模組) 20,20A: Control device (radiation image processing module)

30:顯示裝置 30: Display device

40:輸入裝置 40: Input device

50:X射線照射器(放射線產生源) 50: X-ray irradiator (radiation source)

51:濾光器 51: Light filter

60:帶式輸送機(搬送機構) 60: Belt conveyor (transport mechanism)

101:CPU 101:CPU

102:RAM 102: RAM

103:ROM 103:ROM

104:通訊模組 104: Communication module

106:輸入輸出模組 106: Input and output module

201:輸入部 201:Input Department

202,202A:算出部 202,202A: Calculation Department

203,203A:篩選部 203,203A: Screening Department

204:選擇部 204: Selection Department

205:處理部 205: Processing Department

206:學習完成模型 206: Learning completion model

207:測定部 207: Measurement Department

F:對象物 F: Object

G1,G2,G3,GT:特性曲線圖 G 1 ,G 2 ,G 3, G T :Characteristic curve diagram

P1:構件 P1: Components

P2:異物 P2: Foreign objects

R1,R2:圖像區域 R1, R2: Image area

S1~S11,S101~S108:步驟 S1~S11,S101~S108: Steps

TD:搬送方向 TD: Transport direction

圖1係實施形態之圖像取得裝置1之概略構成圖。 Figure 1 is a schematic diagram of the image acquisition device 1 in an implementation form.

圖2係顯示圖1之控制裝置20之硬體構成之一例之方塊圖。 FIG2 is a block diagram showing an example of the hardware structure of the control device 20 of FIG1.

圖3係顯示圖1之控制裝置20之功能構成之方塊圖。 FIG3 is a block diagram showing the functional structure of the control device 20 of FIG1.

圖4係顯示用於圖3之學習完成模型206之構建之示教資料即圖像資料之一例之圖。 FIG. 4 is a diagram showing an example of teaching data, i.e., image data, used to construct the learning completion model 206 of FIG. 3 .

圖5係顯示用於圖3之學習完成模型206之構建之示教資料即圖像資料之製作步序之流程圖。 FIG. 5 is a flow chart showing the steps for producing teaching data, i.e., image data, for constructing the learning completion model 206 of FIG. 3 .

圖6係顯示圖3之選擇部204之解析對象之X射線穿透圖像之一例之圖。 FIG6 is a diagram showing an example of an X-ray transmission image of the analysis target of the selection section 204 of FIG3 .

圖7係顯示圖3之選擇部204所取得之厚度-亮度之特性曲線圖之一例之圖。 FIG. 7 is a diagram showing an example of a thickness-brightness characteristic curve obtained by the selection unit 204 of FIG. 3 .

圖8係顯示圖3之選擇部204所取得之亮度-SNR之特性曲線圖之一例 之圖。 FIG8 is a diagram showing an example of a characteristic curve diagram of brightness-SNR obtained by the selection unit 204 of FIG3.

圖9(a)、(b)係用於說明基於圖3之選擇部204所取得之圖像特性之學習完成模型之選擇功能之圖。 Figures 9(a) and (b) are diagrams for explaining the selection function of the learning completion model based on the image characteristics obtained by the selection unit 204 in Figure 3.

圖10係顯示用於評估圖3之選擇部204所取得之解析度之X射線穿透圖像之一例之圖。 FIG. 10 is a diagram showing an example of an X-ray transmission image used to evaluate the resolution obtained by the selection unit 204 of FIG. 3 .

圖11係顯示用於評估圖3之選擇部204所取得之亮度-雜訊比之治具之構造之一例之立體圖。 FIG. 11 is a three-dimensional diagram showing an example of the structure of a jig for evaluating the brightness-noise ratio obtained by the selection unit 204 of FIG. 3 .

圖12係顯示以圖11之治具為對象而獲得之雜訊去除處理後之X射線穿透圖像之圖。 Figure 12 shows an X-ray penetration image obtained after noise removal processing using the fixture in Figure 11 as the object.

圖13係顯示使用圖像取得裝置1之觀察處理之步序之流程圖。 FIG. 13 is a flow chart showing the steps of observation processing using the image acquisition device 1.

圖14係顯示由圖像取得裝置1取得之雜訊去除處理之前後之X射線穿透圖像之例之圖。 FIG. 14 is a diagram showing an example of an X-ray transmission image obtained by the image acquisition device 1 before and after noise removal processing.

圖15係顯示由圖像取得裝置1取得之雜訊去除處理之前後之X射線穿透圖像之例之圖。 FIG. 15 is a diagram showing an example of an X-ray transmission image obtained by the image acquisition device 1 before and after noise removal processing.

圖16係顯示本揭示之變化例之控制裝置20A之功能構成之方塊圖。 FIG. 16 is a block diagram showing the functional structure of the control device 20A of the variation of the present disclosure.

圖17係顯示使用變化例之圖像取得裝置1之觀察處理之步序之流程圖。 FIG. 17 is a flow chart showing the steps of observation processing of the image acquisition device 1 using a variation.

以下,參照附圖詳細地說明本發明之實施形態。再者,於說明中對相同要素或具有相同功能之要素使用相同符號,且省略重複之說明。 The following is a detailed description of the implementation of the present invention with reference to the attached drawings. In addition, the same symbols are used for the same elements or elements with the same functions in the description, and repeated descriptions are omitted.

圖1係本實施形態之放射線圖像處理系統即圖像取得裝置1之構成 圖。如圖1所示般,圖像取得裝置1係對沿搬送方向TD搬送之對象物F照射X射線(放射線),並取得基於穿透對象物F之X射線拍攝對象物F所得之X射線穿透圖像(放射線圖像)之裝置。圖像取得裝置1使用X射線穿透圖像,進行以對象物F為對象之異物檢查、重量檢查、驗貨檢查等,作為用途,可舉出食品檢查、隨身行李檢查、基板檢查、電池檢查、材料檢查等。圖像取得裝置1構成為具備:帶式輸送機(搬送機構)60、X射線照射器(放射線產生源)50、X射線檢測相機(攝像裝置)10、控制裝置(放射線圖像處理模組)20、顯示裝置30、及用於進行各種輸入之輸入裝置40。再者,本發明之實施形態之放射線圖像並不限於X射線圖像,亦包含藉由γ線等X射線以外之電磁放射線而產生之圖像。 FIG1 is a configuration diagram of the image acquisition device 1, which is a radiation image processing system of the present embodiment. As shown in FIG1, the image acquisition device 1 is a device that irradiates an object F conveyed along a conveying direction TD with X-rays (radiation) and acquires an X-ray penetration image (radiation image) obtained by photographing the object F based on the X-rays that penetrate the object F. The image acquisition device 1 uses the X-ray penetration image to perform foreign body inspection, weight inspection, and cargo inspection on the object F. Examples of the uses include food inspection, carry-on baggage inspection, substrate inspection, battery inspection, and material inspection. The image acquisition device 1 is composed of: a belt conveyor (transport mechanism) 60, an X-ray irradiator (radiation source) 50, an X-ray detection camera (imaging device) 10, a control device (radiation image processing module) 20, a display device 30, and an input device 40 for various inputs. Furthermore, the radiation image of the embodiment of the present invention is not limited to X-ray images, but also includes images generated by electromagnetic radiation other than X-rays such as gamma rays.

帶式輸送機60具有供對象物F載置之帶部,藉由使該帶部沿搬送方向TD移動,而將對象物F以特定之搬送速度沿搬送方向TD搬送。對象物F之搬送速度例如為48m/分鐘。帶式輸送機60可根據需要,將搬送速度變更為例如24m/分鐘、或96m/分鐘等之搬送速度。又,帶式輸送機60可適當變更帶部之高度位置,而變更X射線照射器50與對象物F之距離。再者,作為由帶式輸送機60搬送之對象物F,例如可舉出食用肉、魚類和貝類、農作物、點心等食品,輪胎等橡膠產品,樹脂產品、金屬產品、礦物等資源材料,廢棄物、及電子零件或電子基板等各種物品。X射線照射器50係作為X射線源將X射線朝對象物F照射(輸出)之裝置。X射線照射器50係點光源,沿一定之照射方向於特定之角度範圍使X射線擴散地照射。X射線照射器50以X射線之照射方向照向帶式輸送機60,且擴散之X射線照及對象物F之寬度方向(與搬送方向TD交叉之方向)整體之方式自帶式輸送機60 離開特定之距離地配置於帶式輸送機60之上方。又,X射線照射器50於對象物F之長度方向(與搬送方向TD平行之方向)上,將長度方向上之特定之分割範圍設為照射範圍,且對象物F被帶式輸送機60朝搬送方向TD搬送,藉此向對象物F之長度方向整體照射X射線。X射線照射器50由控制裝置20設定管電壓及管電流,將與所設定之管電壓及管電流相應之特定之能量、放射線量之X射線向帶式輸送機60照射。又,於X射線照射器50之帶式輸送機60側之附近,設置有使X射線之特定波長頻帶穿透之濾光器51。 The belt conveyor 60 has a belt portion for carrying the object F, and by moving the belt portion along the conveying direction TD, the object F is conveyed along the conveying direction TD at a specific conveying speed. The conveying speed of the object F is, for example, 48 m/min. The belt conveyor 60 can change the conveying speed to, for example, 24 m/min or 96 m/min as needed. In addition, the belt conveyor 60 can appropriately change the height position of the belt portion to change the distance between the X-ray irradiator 50 and the object F. Furthermore, as the object F conveyed by the belt conveyor 60, for example, there can be cited various items such as edible meat, fish and shellfish, agricultural products, snacks, rubber products such as tires, resource materials such as resin products, metal products, minerals, waste, and electronic parts or electronic substrates. The X-ray irradiator 50 is a device that irradiates (outputs) X-rays toward the object F as an X-ray source. The X-ray irradiator 50 is a point light source that diffusely irradiates X-rays in a specific angle range along a certain irradiation direction. The X-ray irradiator 50 irradiates the belt conveyor 60 in the irradiation direction of X-rays, and the diffused X-rays are arranged above the belt conveyor 60 at a specific distance from the belt conveyor 60 in the entire width direction (the direction intersecting the conveying direction TD) of the object F. In addition, the X-ray irradiator 50 sets a specific segmented range in the longitudinal direction of the object F (the direction parallel to the conveying direction TD) as the irradiation range, and the object F is conveyed in the conveying direction TD by the belt conveyor 60, thereby irradiating the entire longitudinal direction of the object F with X-rays. The control device 20 sets the tube voltage and tube current of the X-ray irradiator 50, and irradiates the belt conveyor 60 with X-rays of specific energy and radiation amount corresponding to the set tube voltage and tube current. In addition, a filter 51 is installed near the belt conveyor 60 side of the X-ray irradiator 50 to allow a specific wavelength band of X-rays to pass through.

X射線檢測相機10檢測由X射線照射器50照射至對象物F之X射線中之穿透對象物F之X射線,並輸出基於該X射線之信號。X射線檢測相機10之檢測X射線之構成係配置2組之雙線路X射線相機。於本實施形態之圖像取得裝置1中,基於由雙線路X射線相機各自之線路(第1線路及第2線路)檢測到之X射線,分別產生X射線穿透圖像。而且,藉由對於所產生之2個X射線穿透圖像進行平均處理或加算處理等,而與基於由1條線路檢測到之X射線產生X射線穿透圖像之情形相比,可以較少之X射線量取得鮮明之(亮度大之)圖像。 The X-ray detection camera 10 detects X-rays that penetrate the object F among the X-rays irradiated to the object F by the X-ray irradiator 50, and outputs a signal based on the X-rays. The X-ray detection camera 10 is configured with two sets of dual-line X-ray cameras for detecting X-rays. In the image acquisition device 1 of this embodiment, X-ray penetration images are generated based on the X-rays detected by the respective lines (the first line and the second line) of the dual-line X-ray cameras. Moreover, by performing averaging processing or addition processing on the two generated X-ray penetration images, a clear (brighter) image can be obtained with a smaller amount of X-rays compared to the case where an X-ray penetration image is generated based on X-rays detected by one line.

X射線檢測相機10具有:濾光器19、閃爍器11a、11b、線掃描相機12a、12b、感測器控制部13、放大器14a、14b、AD轉換器15a、15b、修正電路16a、16b、輸出介面17a、17b、及放大器控制部18。閃爍器11a、線掃描相機12a、放大器14a、AD轉換器15a、修正電路16a、及輸出介面17a分別電性連接,係第1線路之構成。又,閃爍器11b、線掃描相機12b、放大器14b、AD轉換器15b、修正電路16b、及輸出介面17b分別電 性連接,係第2線路之構成。第1線路之線掃描相機12a與第2線路之線掃描相機12b沿著搬送方向TD排列地配置。再者,以下對於在第1線路與第2線路中共通之構成以第1線路之構成為代表進行說明。 The X-ray detection camera 10 includes a filter 19, scintillators 11a, 11b, line scan cameras 12a, 12b, a sensor control unit 13, amplifiers 14a, 14b, AD converters 15a, 15b, correction circuits 16a, 16b, output interfaces 17a, 17b, and an amplifier control unit 18. The scintillator 11a, line scan camera 12a, amplifier 14a, AD converter 15a, correction circuit 16a, and output interface 17a are electrically connected to form a first circuit. In addition, the scintillator 11b, line scan camera 12b, amplifier 14b, AD converter 15b, correction circuit 16b, and output interface 17b are electrically connected to form a second circuit. The line scanning camera 12a of the first line and the line scanning camera 12b of the second line are arranged in a row along the conveying direction TD. In addition, the following describes the common structure of the first line and the second line, taking the structure of the first line as a representative.

閃爍器11a藉由接著等固定於線掃描相機12a上,將穿透對象物F之X射線轉換成閃爍光。閃爍器11a將閃爍光輸出至線掃描相機12a。濾光器19使X射線之特定波長頻帶往向閃爍器11a並穿透。 The scintillator 11a is fixed to the line scan camera 12a, and converts the X-rays that penetrate the object F into scintillation light. The scintillator 11a outputs the scintillation light to the line scan camera 12a. The filter 19 allows a specific wavelength band of the X-rays to pass through the scintillator 11a.

線掃描相機12a檢測來自閃爍器11a之閃爍光,並轉換成電荷,作為檢測信號(電信號)輸出至放大器14a。線掃描相機12a具有沿與搬送方向TD交叉之方向並列之複數個線性感測器。線性感測器例如係CCD(Charge Coupled Device,電荷耦合元件)影像感測器或CMOS(Complementary Metal-Oxide Semiconductor,互補式金屬氧化物半導體)影像感測器等,包含複數個光電二極體。 The line scan camera 12a detects the flash light from the scintillator 11a, converts it into electric charge, and outputs it to the amplifier 14a as a detection signal (electrical signal). The line scan camera 12a has a plurality of linear sensors arranged in parallel along a direction intersecting the conveying direction TD. The linear sensor is, for example, a CCD (Charge Coupled Device) image sensor or a CMOS (Complementary Metal-Oxide Semiconductor) image sensor, which includes a plurality of photodiodes.

感測器控制部13以線掃描相機12a、12b可拍攝穿透對象物F之相同區域之X射線之方式,將線掃描相機12a、12b以特定之檢測週期重複拍攝之方式進行控制。特定之檢測週期例如可基於線掃描相機12a、12b間之距離、帶式輸送機60之速度、X射線照射器50與帶式輸送機60上之對象物F之距離(FOD(Focus Object Distance:線源物體間距離))、以及X射線照射器50與線掃描相機12a、12b之距離(FDD(Focus Detector Distance:線源感測器間距離)),設定線掃描相機12a、12b共通之週期。又,特定之週期亦可基於與線掃描相機12a、12b各自之線性感測器之像素排列方向正交 之方向之光電二極體之像素寬度,分別個別地設定。該情形下,可根據線掃描相機12a、12b間之距離、帶式輸送機60之速度、X射線照射器50與帶式輸送機60上之對象物F之距離(FOD)、以及X射線照射器50與線掃描相機12a、12b之距離(FDD),特定線掃描相機12a、12b間之檢測週期之偏移(延遲時間),分別設定個別之週期。放大器14a以特定之設定放大率將檢測信號予以放大並產生放大信號,且將該放大信號輸出至AD轉換器15a。設定放大率係由放大器控制部18設定之放大率。放大器控制部18基於特定之攝像條件,設定放大器14a、14b之設定放大率。 The sensor control unit 13 controls the line scan cameras 12a and 12b to repeatedly shoot at a specific detection cycle so that the line scan cameras 12a and 12b can shoot X-rays that penetrate the same area of the object F. The specific detection cycle can be set as a common cycle for the line scan cameras 12a and 12b based on, for example, the distance between the line scan cameras 12a and 12b, the speed of the belt conveyor 60, the distance between the X-ray irradiator 50 and the object F on the belt conveyor 60 (FOD (Focus Object Distance: source object distance)), and the distance between the X-ray irradiator 50 and the line scan cameras 12a and 12b (FDD (Focus Detector Distance: source detector distance)). In addition, the specific cycle can also be set individually based on the pixel width of the photodiode in the direction orthogonal to the pixel arrangement direction of the linear sensor of each line scan camera 12a and 12b. In this case, the detection cycle offset (delay time) between the specific line scan cameras 12a and 12b can be set according to the distance between the line scan cameras 12a and 12b, the speed of the belt conveyor 60, the distance (FOD) between the X-ray irradiator 50 and the object F on the belt conveyor 60, and the distance (FDD) between the X-ray irradiator 50 and the line scan cameras 12a and 12b, and the individual cycles can be set respectively. The amplifier 14a amplifies the detection signal with a specific set amplification factor and generates an amplified signal, and outputs the amplified signal to the AD converter 15a. The set amplification factor is the amplification factor set by the amplifier control unit 18. The amplifier control unit 18 sets the set amplification factors of the amplifiers 14a and 14b based on specific imaging conditions.

AD轉換器15a將由放大器14a輸出之放大信號(電壓信號)轉換成數位信號,並輸出至修正電路16a。修正電路16a對數位信號進行信號放大等特定之修正,並將修正後之數位信號輸出至輸出介面17a。輸出介面17a將數位信號輸出至X射線檢測相機10外部。圖1中,AD轉換器、修正電路、或輸出介面分別個別地存在,但亦可彙集成一個。 The AD converter 15a converts the amplified signal (voltage signal) output by the amplifier 14a into a digital signal and outputs it to the correction circuit 16a. The correction circuit 16a performs specific corrections such as signal amplification on the digital signal and outputs the corrected digital signal to the output interface 17a. The output interface 17a outputs the digital signal to the outside of the X-ray detection camera 10. In FIG1 , the AD converter, the correction circuit, or the output interface exist separately, but they can also be integrated into one.

控制裝置20例如係PC(Personal Computer,個人電腦)等電腦。控制裝置20基於自X射線檢測相機10(更詳細而言為輸出介面17a、17b)輸出之數位信號(放大信號)產生X射線穿透圖像。控制裝置20藉由將自輸出介面17a、17b輸出之2個數位信號進行平均處理或加算處理,而產生1個X射線穿透圖像。所產生之X射線穿透圖像經施加後述之雜訊去除處理之後被輸出至顯示裝置30,並由顯示裝置30顯示。又,控制裝置20控制X射線照射器50、放大器控制部18、及感測器控制部13。再者,本實施形態之控制裝置20係獨立地設置於X射線檢測相機10之外部之裝置,但亦可於X射線 檢測相機10之內部一體化。 The control device 20 is, for example, a computer such as a PC (Personal Computer). The control device 20 generates an X-ray transmission image based on the digital signal (amplified signal) output from the X-ray detection camera 10 (more specifically, the output interfaces 17a, 17b). The control device 20 generates an X-ray transmission image by averaging or adding the two digital signals output from the output interfaces 17a, 17b. The generated X-ray transmission image is output to the display device 30 after applying the noise removal process described later, and is displayed by the display device 30. In addition, the control device 20 controls the X-ray irradiator 50, the amplifier control unit 18, and the sensor control unit 13. Furthermore, the control device 20 of this embodiment is an independent device disposed outside the X-ray detection camera 10, but it can also be integrated inside the X-ray detection camera 10.

圖2顯示控制裝置20之硬體構成。如圖2所示般,控制裝置20在實體上係包含作為處理器之CPU(Central Processing Unit,中央處理單元)101、作為記錄媒體之RAM(Random Access Memory,隨機存取記憶體)102或ROM(Read Only Memory,唯讀記憶體)103、通訊模組104、及輸入輸出模組106等之電腦等,各者電性連接。再者,控制裝置20亦可包含顯示器、鍵盤、滑鼠、觸控面板顯示器等作為輸入裝置40及顯示裝置30,還可包含硬碟驅動器、半導體記憶體等資料記錄裝置。又,控制裝置20亦可包含複數個電腦。 FIG2 shows the hardware structure of the control device 20. As shown in FIG2, the control device 20 physically includes a CPU (Central Processing Unit) 101 as a processor, a RAM (Random Access Memory) 102 or a ROM (Read Only Memory) 103 as a recording medium, a communication module 104, and an input/output module 106, etc., each of which is electrically connected. Furthermore, the control device 20 may also include a display, a keyboard, a mouse, a touch panel display, etc. as an input device 40 and a display device 30, and may also include a data recording device such as a hard disk drive and a semiconductor memory. In addition, the control device 20 may also include a plurality of computers.

圖3係顯示控制裝置20之功能構成之方塊圖。控制裝置20具備輸入部201、算出部202、篩選部203、選擇部204、及處理部205。圖3所示之控制裝置20之各功能部藉由在CPU 101及RAM 102等之硬體上讀入程式(本實施形態之放射線圖像處理程式),在CPU 101之控制之下,使通訊模組104、及輸入輸出模組106等動作,且進行RAM 102之資料之讀出及寫入,藉此而實現。控制裝置20之CPU 101藉由執行該電腦程式而使控制裝置20作為圖3之各功能部發揮功能,依次執行與後述之放射線圖像處理方法對應之處理。再者,CPU可為單體之硬體,亦可如軟體處理器般安裝於如FPGA之可程式化邏輯器之中者。關於RAM或ROM,可為單體之硬體,亦可內置於如FPGA之可程式化邏輯器之中者。該電腦程式之執行所需之各種資料、及藉由該電腦程式之執行而產生之各種資料全部儲存於ROM 103、RAM 102等內置記憶體、或硬碟驅動器等記憶媒體。 FIG3 is a block diagram showing the functional configuration of the control device 20. The control device 20 includes an input unit 201, a calculation unit 202, a screening unit 203, a selection unit 204, and a processing unit 205. Each functional unit of the control device 20 shown in FIG3 is realized by reading a program (radiation image processing program of this embodiment) on hardware such as the CPU 101 and the RAM 102, and operating the communication module 104 and the input/output module 106 under the control of the CPU 101, and reading and writing data from the RAM 102. The CPU 101 of the control device 20 executes the computer program to make the control device 20 function as each functional unit of FIG. 3, and sequentially executes the processing corresponding to the radiation image processing method described later. Furthermore, the CPU can be a single hardware, or it can be installed in a programmable logic device such as FPGA like a software processor. Regarding RAM or ROM, it can be a single hardware, or it can be built into a programmable logic device such as FPGA. All kinds of data required for the execution of the computer program and all kinds of data generated by the execution of the computer program are stored in built-in memories such as ROM 103 and RAM 102, or storage media such as hard disk drives.

又,於控制裝置20,藉由利用CPU 101讀入,而於CPU 101中預先儲存複數個以X射線穿透圖像為對象執行雜訊去除處理之學習完成模型206。複數個學習完成模型206分別係以圖像資料為示教資料預先構建之由機器學習產生之學習模型。關於機器學習,有示教學習、深層學習(深度學習)、或者強化學習、神經網路學習等。於本實施形態中,作為深度學習之算法之一例,採用張凱(Kai Zhang)等之論文「Beyonda Gaussian Denoiser:Residual Learning of Deep CNN for Image Denoising」所記載之二維之卷積神經網路。複數個學習完成模型206可由外部之電腦等產生並下載至控制裝置20,亦可在控制裝置20內產生。 Furthermore, in the control device 20, a plurality of learning models 206 for performing noise removal processing on X-ray transmission images are read by the CPU 101 and stored in advance in the CPU 101. The plurality of learning models 206 are learning models generated by machine learning that are pre-constructed using image data as teaching data. Machine learning includes teaching learning, deep learning (deep learning), or reinforcement learning, neural network learning, and the like. In this embodiment, as an example of a deep learning algorithm, a two-dimensional convolutional neural network described in the paper "Beyond Gaussian Denoiser: Residual Learning of Deep CNN for Image Denoising" by Kai Zhang et al. is used. A plurality of learning completed models 206 can be generated by an external computer and downloaded to the control device 20, or can be generated within the control device 20.

圖4顯示用於學習完成模型206之構建之示教資料即圖像資料之一例。作為示教資料,可使用以各種厚度、各種材質、及各種解析度之圖案為攝像對象之X射線穿透圖像。圖4所示之例係以雞肉為對象而產生之X射線穿透圖像之例。該圖像資料可使用實際使用圖像取得裝置1以複數種對象物為對象而產生之X射線穿透圖像,亦可使用藉由模擬計算而產生之圖像資料。關於X射線穿透圖像,亦可為使用與圖像取得裝置1不同之裝置而取得者。又,亦可組合使用X射線穿透圖像與藉由模擬計算而產生之圖像資料。複數個學習完成模型206分別係以平均能量不同之穿透X射線為對象而獲得之圖像資料,雜訊分佈使用已知之圖像資料預先構建。圖像資料之X射線之平均能量分別藉由設定圖像取得裝置1之X射線照射器(放射線產生源)50之動作條件、或圖像取得裝置1之攝像條件等,或者藉由設定模擬計算時之X射線照射器50之動作條件或攝像條件,而預先設定成不同 之值(關於因動作條件或攝像條件所致之平均能量之設定方法將於後述)。即,複數個學習完成模型206係將跟基於表示拍攝對象物F之X射線穿透圖像時之X射線照射器(放射線產生源)50之動作條件、或X射線檢測相機10之攝像條件等之條件資訊而算出之與穿透對象物F之X射線相關之平均能量對應之X射線圖像即訓練圖像,作為訓練資料使用,藉由機器學習而構建(構建步驟)。例如,於本實施形態中,複數個學習完成模型206係分別使用複數圖框(例如,20,000圖框)平均能量設定為10keV、20keV、30keV、…之10keV刻度之值之複數種圖像資料而構建。 FIG. 4 shows an example of teaching data, i.e., image data, used for learning to construct the completed model 206. As teaching data, X-ray penetration images with various thicknesses, various materials, and various resolutions as the photographic object can be used. The example shown in FIG. 4 is an example of an X-ray penetration image generated with chicken as the object. The image data can use X-ray penetration images generated with multiple objects as the object using the image acquisition device 1, or image data generated by simulation calculation. Regarding the X-ray penetration image, it can also be obtained using a device different from the image acquisition device 1. In addition, the X-ray penetration image and the image data generated by simulation calculation can be used in combination. The plurality of learning completed models 206 are image data obtained by using penetrating X-rays of different average energies as the object, and the noise distribution is pre-constructed using known image data. The average energy of the X-rays in the image data is pre-set to different values by setting the operating conditions of the X-ray irradiator (radiation source) 50 of the image acquisition device 1, or the imaging conditions of the image acquisition device 1, or by setting the operating conditions or imaging conditions of the X-ray irradiator 50 during simulation calculation (the setting method of the average energy due to the operating conditions or imaging conditions will be described later). That is, the plurality of learned models 206 are constructed by machine learning using, as training data, an X-ray image corresponding to the average energy of the X-rays penetrating the object F calculated based on the condition information such as the operation conditions of the X-ray irradiator (radiation source) 50 when shooting the X-ray penetration image of the object F, or the shooting conditions of the X-ray detection camera 10 (construction step). For example, in this embodiment, the plurality of learned models 206 are constructed using a plurality of image data with the average energy of a plurality of frames (e.g., 20,000 frames) set to 10keV, 20keV, 30keV, ..., and 10keV scale values.

圖5顯示用於學習完成模型206之構建之示教資料即圖像資料之製作步序之流程圖。 FIG. 5 shows a flow chart of the steps for producing teaching data, i.e., image data, for learning to construct the completed model 206.

示教資料即圖像資料(亦稱為示教圖像資料),係由電腦按照以下之步序而製作。首先,製作具有特定構造之構造體之圖像(構造體圖像)(步驟S101)。例如,可藉由模擬計算來製作具有特定構造之構造體之圖像。又,亦可取得具有特定構造之圖表等構造體之X射線圖像而製作構造體圖像。接著,就自構成該構造體圖像之複數個像素中所選擇之一個像素,算出像素值之標準偏差即Σ值(步驟S102)。然後,基於在步驟S102中所求得之Σ值,設定表示雜訊分佈之正態分佈(泊松分佈)(步驟S103)。如此般,藉由基於Σ值設定正態分佈,而可產生各種雜訊條件之示教資料。繼而,依照在步驟S103中基於Σ值所設定之正態分佈,算出隨機設定之雜訊值(步驟S104)。進而,藉由對一個像素之像素值附加步驟S104中所求得之雜訊值,而產生構成示教資料即圖像資料之像素值(步驟S105)。對於構成構 造體圖像之複數個像素各者,進行步驟S102至步驟S105之處理(步驟S106),產生成為示教資料之示教圖像資料(步驟S107)。又,於進一步需要示教圖像資料之情形下,判斷對別的構造體圖像進行步驟S101至步驟S107之處理(步驟S108),產生成為示教資料之別的示教圖像資料。再者,別的構造體圖像可為具有相同構造之構造體之圖像,亦可為具有別的構造之構造體之圖像。 The teaching data, i.e., image data (also referred to as teaching image data), is produced by a computer according to the following steps. First, an image of a structure having a specific structure (structure image) is produced (step S101). For example, an image of a structure having a specific structure can be produced by simulation calculation. In addition, an X-ray image of a structure such as a chart having a specific structure can be obtained to produce a structure image. Next, for a pixel selected from a plurality of pixels constituting the structure image, the standard deviation of the pixel value, i.e., the Σ value, is calculated (step S102). Then, based on the Σ value obtained in step S102, a normal distribution (Poisson distribution) representing the noise distribution is set (step S103). In this way, by setting the normal distribution based on the Σ value, teaching data of various noise conditions can be generated. Then, according to the normal distribution set based on the Σ value in step S103, the noise value set randomly is calculated (step S104). Furthermore, by adding the noise value obtained in step S104 to the pixel value of one pixel, the pixel value constituting the teaching data, i.e., the image data, is generated (step S105). For each of the plurality of pixels constituting the structure image, the processing from step S102 to step S105 is performed (step S106), and the teaching image data as the teaching data is generated (step S107). Furthermore, when teaching image data is further needed, it is determined that the processing of steps S101 to S107 is performed on other structural body images (step S108) to generate other teaching image data as teaching data. Furthermore, the other structural body images can be images of structures with the same structure or images of structures with different structures.

再者,用於學習完成模型206之構建之示教資料即圖像資料需要準備多數個。又,構造體圖像之雜訊少之圖像為較佳,理想而言無雜訊之圖像為較佳。因此,若藉由模擬計算而產生構造體圖像,則可產生較多數量之無雜訊之圖像,因此藉由模擬計算產生構造體圖像有效。 Furthermore, a large number of teaching data, i.e., image data, used for learning to construct the completed model 206 need to be prepared. Also, images with less noise are better for structural body images, and ideally, images without noise are better. Therefore, if structural body images are generated by simulation calculation, a larger number of noise-free images can be generated, so it is effective to generate structural body images by simulation calculation.

以下,返回圖3,對於控制裝置20之各功能部之功能之詳情進行說明。 Next, return to Figure 3 to explain the details of the functions of each functional unit of the control device 20.

輸入部201自圖像取得裝置1之使用者受理表示拍攝對象物F之X射線穿透圖像時之X射線照射器(放射線產生源)50之動作條件、或者X射線檢測相機10之攝像條件等之條件資訊之輸入。作為動作條件,可舉出管電壓、靶角度、靶之材料等中之全部或一部分。作為表示攝像條件之條件資訊,可舉出配置於X射線照射器50與X射線檢測相機10之間之濾光器51、19(用於對象物之拍攝之相機所具備之濾光器或者產生源所具備之濾光器)之材質及厚度、X射線照射器50與X射線檢測相機10之距離(FDD)、X射線檢測相機10之視窗材料之種類、及與X射線檢測相機10之閃爍器11a、 11b之材料及厚度相關之資訊、X射線檢測相機資訊(例如,增益設定值、電路雜訊值、飽和電荷量、轉換係數值(電子數/count)、相機之行頻(Hz)或線速度(m/min))、對象物之資訊等中之全部或一部分。輸入部201可將條件資訊之輸入作為數值等之資訊之直接輸入而受理,亦可作為對預先設定於內部記憶體之數值等之資訊之選擇輸入而受理。輸入部201自使用者受理上述之條件資訊之輸入,但亦可根據由控制裝置20執行之控制狀態之檢測結果而取得一部分條件資訊(管電壓等)。 The input unit 201 receives input of condition information indicating the operating conditions of the X-ray irradiator (radiation source) 50 or the imaging conditions of the X-ray detection camera 10 when capturing the X-ray penetration image of the object F from the user of the image acquisition device 1. The operating conditions may include all or part of the tube voltage, target angle, target material, etc. As condition information indicating the imaging conditions, the material and thickness of the filters 51, 19 (filters provided by the camera for photographing the object or filters provided by the source) disposed between the X-ray irradiator 50 and the X-ray detection camera 10, the distance (FDD) between the X-ray irradiator 50 and the X-ray detection camera 10, the window of the X-ray detection camera 10, etc. can be cited. The type of material, the material and thickness of the scintillator 11a, 11b of the X-ray detection camera 10, the X-ray detection camera information (for example, the gain setting value, the circuit noise value, the saturation charge, the conversion coefficient value (number of electrons/count), the line frequency (Hz) or the line speed (m/min) of the camera), the information of the object, etc. All or part of the information. The input unit 201 can accept the input of the condition information as a direct input of information such as a numerical value, or as a selective input of information such as a numerical value pre-set in the internal memory. The input unit 201 accepts the input of the above-mentioned condition information from the user, but can also obtain part of the condition information (tube voltage, etc.) based on the detection result of the control state executed by the control device 20.

算出部202基於由輸入部201受理之條件資訊,算出使用圖像取得裝置1使對象物F穿透並由X射線檢測相機10檢測出之X射線(放射線)之平均能量之值。例如,算出部202基於條件資訊所含之管電壓、靶角度、靶之材料、濾光器之材質及厚度及其有無、視窗材料之種類及其有無、X射線檢測相機10之閃爍器11a、11b之材料及厚度等之資訊,使用例如周知之塔克(Tucker)等之近似式算出由X射線檢測相機10檢測出之X射線之光譜。然後,算出部202根據X射線之光譜,進一步算出光譜強度積分值與光子數積分值,將光譜強度積分值以光子數積分值相除,藉此算出X射線之平均能量之值。 The calculation unit 202 calculates the average energy value of the X-rays (radiation) that are transmitted through the object F using the image acquisition device 1 and detected by the X-ray detection camera 10, based on the condition information received by the input unit 201. For example, the calculation unit 202 calculates the spectrum of the X-rays detected by the X-ray detection camera 10 using, for example, a well-known approximate formula such as Tucker, based on information such as tube voltage, target angle, target material, material and thickness of the filter and the presence or absence of the window material, and the material and thickness of the scintillators 11a and 11b of the X-ray detection camera 10 included in the condition information. Then, the calculation unit 202 further calculates the spectrum intensity integral value and the photon number integral value based on the X-ray spectrum, and divides the spectrum intensity integral value by the photon number integral value to calculate the average energy value of the X-ray.

對於使用周知之塔克(Tucker)之近似式之算出方法進行記載。例如,算出部202在將靶特定為鎢、將靶角度特定為25°時,可決定Em:電子靶碰撞時之運動能量、T:靶中之電子運動能量、A:由靶物質之原子序數決定之比例常數、ρ:靶之密度、μ(E):靶物質之線減弱係數、B:和緩地變化之Z與T之函數、C:湯姆孫-魏定頓(Thomson-Whiddington)常數、 θ:靶角度、c:真空中之光速度。進而,算出部202藉由基於該等計算下述式(1),而可算出照射X射線光譜。 The calculation method using the well-known Tucker approximation is described. For example, when the target is specified as tungsten and the target angle is specified as 25°, the calculation unit 202 can determine Em: the kinetic energy of the electron-target collision, T: the kinetic energy of the electron in the target, A: the proportional constant determined by the atomic number of the target material, ρ: the density of the target, μ(E): the linear attenuation coefficient of the target material, B: the function of Z and T that changes slowly, C: the Thomson-Whiddington constant, θ: the target angle, and c: the speed of light in a vacuum. Furthermore, the calculation unit 202 can calculate the irradiated X-ray spectrum by calculating the following formula (1) based on these calculations.

Figure 110129134-A0305-12-0015-1
Figure 110129134-A0305-12-0015-1

再者,Em可根據管電壓之資訊而決定,A、ρ、μ(E)可根據靶之材料之資訊而決定,θ可根據靶角度之資訊而決定。 Furthermore, Em can be determined based on information about tube voltage, A, ρ, and μ(E) can be determined based on information about target material, and θ can be determined based on information about target angle.

接著,算出部202可使用下述式(2)之X射線之減弱式算出穿透濾光器及對象物F且由閃爍器吸收之X射線能量光譜。 Next, the calculation unit 202 can use the X-ray attenuation formula of the following formula (2) to calculate the energy spectrum of the X-rays that pass through the filter and the object F and are absorbed by the scintillator.

[數2]I=I O e -μx (2) [Number 2] I = I O e - μx (2)

此處,μ係對象物質、濾光器、閃爍器等之減弱係數,x係對象物質、濾光器、閃爍器等之厚度。μ可根據對象物、濾光器、及閃爍器之材質之資訊決定,x可根據對象物、濾光器、及閃爍器之厚度之資訊決定。X射線光子數光譜藉由將該X射線能量光譜以各X射線之能量相除而求得。算出部202藉由將能量強度之積分值以光子數之積分值相除,使用下述式(3)而算出X射線之平均能量。 Here, μ is the attenuation coefficient of the target object, filter, scintillator, etc., and x is the thickness of the target object, filter, scintillator, etc. μ can be determined based on information about the materials of the target object, filter, and scintillator, and x can be determined based on information about the thickness of the target object, filter, and scintillator. The X-ray photon number spectrum is obtained by dividing the X-ray energy spectrum by the energy of each X-ray. The calculation unit 202 calculates the average energy of the X-ray by dividing the integral value of the energy intensity by the integral value of the photon number using the following formula (3).

平均能量E=光譜強度積分值/光子數積分值…(3) Average energy E = spectral intensity integral value / photon number integral value…(3)

藉由上述之計算過程,算出部202算出X射線之平均能量。再者,關於X射線光譜之算出,亦可使用周知之克拉莫(Kramers)、或貝赫(Birch)等之近似式。 Through the above calculation process, the calculation unit 202 calculates the average energy of the X-ray. Furthermore, for the calculation of the X-ray spectrum, the well-known approximate formulas such as Kramers or Birch can also be used.

篩選部203基於由算出部202算出之平均能量之值,自預先構建之複數個學習完成模型206之中,篩選學習完成模型之候選者。亦即,篩選部203對所算出之平均能量之值與用於複數個學習完成模型206之構建之圖像資料中之X射線之平均能量之值予以比較,將藉由平均能量之值相近之圖像資料而構建之複數個學習完成模型206篩選為候選者。更具體而言,於由算出部202算出之平均能量之值為53keV時,篩選部203將藉由與該值與之差未達特定之臨限值(例如15keV)之平均能量值40keV、50keV、60keV之圖像資料而構建之學習完成模型206設為學習完成模型之候選者。 The screening unit 203 screens candidates for the learning model from the plurality of pre-constructed learning models 206 based on the average energy value calculated by the calculation unit 202. That is, the screening unit 203 compares the calculated average energy value with the average energy value of X-rays in the image data used to construct the plurality of learning models 206, and screens the plurality of learning models 206 constructed by the image data having similar average energy values as candidates. More specifically, when the average energy value calculated by the calculation unit 202 is 53keV, the screening unit 203 sets the learning completion model 206 constructed by the image data of the average energy values of 40keV, 50keV, and 60keV whose difference from the value does not reach a specific critical value (e.g., 15keV) as a candidate for the learning completion model.

選擇部204自經篩選部203篩選之候選者之中選擇最終用於對象物F之X射線穿透圖像之雜訊去除處理之學習完成模型206。詳細而言,選擇部204取得於圖像取得裝置1中以治具為對象照射X射線並拍攝之X射線穿透圖像,且基於該X射線穿透圖像之圖像特性,選擇最終使用之學習完成模型206。此時,選擇部204解析能量特性、雜訊特性、或者解析度特性等作為X射線穿透圖像之圖像特性,並基於其解析結果選擇學習完成模型206。 The selection unit 204 selects the final learning model 206 for noise removal processing of the X-ray transmission image of the object F from the candidates filtered by the screening unit 203. Specifically, the selection unit 204 obtains the X-ray transmission image taken by irradiating X-rays with the jig as the object in the image acquisition device 1, and selects the final learning model 206 based on the image characteristics of the X-ray transmission image. At this time, the selection unit 204 analyzes energy characteristics, noise characteristics, or resolution characteristics as image characteristics of the X-ray transmission image, and selects the learning model 206 based on the analysis results.

更具體而言,選擇部204以作為治具之已知厚度及材質、且已知X射線之平均能量與X射線穿透率之關係之平板狀構件為對象取得X射線穿透圖像,將穿透治具之X射線像之亮度與穿透空氣之X射線像之亮度予以比較,算出治具之1點(或者複數點之平均)之X射線之穿透率。例如,於穿透 治具之X射線像之亮度為5,550,穿透空氣之X射線像之亮度為15,000之情形下,算出穿透率37%。然後,選擇部204將根據穿透率37%而推定之穿透X射線之平均能量(例如,50keV)特定為治具之X射線穿透圖像之能量特性。選擇部204選擇一個藉由最接近特定之平均能量之值之平均能量之圖像資料而構建之學習完成模型206。 More specifically, the selection unit 204 obtains an X-ray transmission image for a flat plate-shaped member of a known thickness and material as a jig and a known relationship between the average energy of X-rays and the X-ray transmission rate, compares the brightness of the X-ray image that penetrates the jig with the brightness of the X-ray image that penetrates the air, and calculates the transmission rate of X-rays at one point (or the average of multiple points) of the jig. For example, when the brightness of the X-ray image that penetrates the jig is 5,550 and the brightness of the X-ray image that penetrates the air is 15,000, the transmission rate is calculated to be 37%. Then, the selection unit 204 specifies the average energy of the penetrating X-rays (e.g., 50 keV) estimated based on the transmission rate of 37% as the energy characteristic of the X-ray transmission image of the jig. The selection unit 204 selects a learning completion model 206 constructed by image data with average energy that is closest to a specific average energy value.

又,選擇部204亦可解析厚度或者材質變化之治具之複數點之特性,作為治具之X射線穿透圖像之能量特性。圖6係顯示選擇部204之解析對象之X射線穿透圖像之一例之圖。圖6係以厚度階狀變化之形狀之治具為對象之X射線穿透圖像。選擇部204自如此之X射線穿透圖像選擇厚度不同之複數個測定區域(ROI:Region Of Interest,感興趣區域),解析複數個測定區域每一者之亮度平均值,將厚度-亮度之特性曲線圖作為能量特性而取得。圖7顯示選擇部204所取得之厚度-亮度之特性曲線圖之一例。 In addition, the selection unit 204 can also analyze the characteristics of multiple points of the jig with thickness or material changes as the energy characteristics of the X-ray transmission image of the jig. Figure 6 is a diagram showing an example of an X-ray transmission image of the analysis object of the selection unit 204. Figure 6 is an X-ray transmission image of a jig with a shape with a step-like change in thickness. The selection unit 204 selects multiple measurement regions (ROI: Region Of Interest) with different thicknesses from such an X-ray transmission image, analyzes the average brightness of each of the multiple measurement regions, and obtains a thickness-brightness characteristic curve as an energy characteristic. Figure 7 shows an example of a thickness-brightness characteristic curve obtained by the selection unit 204.

進而,選擇部204同樣地,以用於經篩選部203篩選之學習完成模型206之構建之圖像資料為對象,取得厚度-亮度之特性曲線圖,將藉由具有最接近以治具為對象而取得之特性曲線圖之特性之圖像資料而構建之學習完成模型206選作最終之學習完成模型206。然而,用於該學習完成模型206之構建之圖像資料之圖像特性亦可參照預先於控制裝置20之外部算出者。如此般,藉由設定複數個測定區域,可選擇在對象物F之X射線穿透圖像之雜訊去除上最佳之學習完成模型。特別是,可高精度地推定X射線穿透圖像之測定時之X射線光譜之不同或者濾光器之效果之不同。 Furthermore, the selection unit 204 similarly obtains the thickness-brightness characteristic curve graph with the image data used for constructing the learned model 206 screened by the screening unit 203, and selects the learned model 206 constructed by the image data having the characteristics closest to the characteristic curve graph obtained with the jig as the object as the final learned model 206. However, the image characteristics of the image data used for constructing the learned model 206 may also refer to those calculated in advance outside the control device 20. In this way, by setting a plurality of measurement areas, the best learned model in noise removal of the X-ray transmission image of the object F can be selected. In particular, differences in X-ray spectra or filter effects when measuring X-ray penetration images can be estimated with high accuracy.

又,選擇部204可解析複數個測定區域每一者之亮度值與雜訊作為治具之X射線穿透圖像之雜訊特性,且將亮度-雜訊比之特性曲線圖作為雜訊特性而取得。亦即,選擇部204自X射線穿透圖像選擇厚度或者材質不同之複數個測定區域ROI,解析複數個測定區域ROI之亮度值之標準偏差及亮度值之平均值,並將亮度-SNR(SN比)之特性曲線圖作為雜訊特性而取得。此時,選擇部204藉由SNR=(亮度值之平均值)÷(亮度值之標準偏差)而算出每個測定區域ROI之SNR。圖8顯示選擇部204所取得之亮度-SNR之特性曲線圖之一例。然後,選擇部204將藉由具有最接近所取得之特性曲線圖之雜訊特性之圖像資料而構建之學習完成模型206選作最終之學習完成模型206。 Furthermore, the selection unit 204 can analyze the brightness value and noise of each of the plurality of measurement areas as the noise characteristics of the X-ray transmission image of the fixture, and obtain the characteristic curve diagram of the brightness-noise ratio as the noise characteristics. That is, the selection unit 204 selects a plurality of measurement areas ROIs of different thicknesses or materials from the X-ray transmission image, analyzes the standard deviation of the brightness values of the plurality of measurement areas ROIs and the average value of the brightness values, and obtains the characteristic curve diagram of the brightness-SNR (SNR ratio) as the noise characteristics. At this time, the selection unit 204 calculates the SNR of each measurement area ROI by SNR=(average value of brightness value) ÷ (standard deviation of brightness value). FIG. 8 shows an example of the characteristic curve diagram of brightness-SNR obtained by the selection unit 204. Then, the selection unit 204 selects the learning completion model 206 constructed by the image data having the noise characteristics closest to the obtained characteristic curve as the final learning completion model 206.

此處,選擇部204亦可取得將縱軸設為根據亮度值之標準偏差而計算出之雜訊之特性曲線圖取代上述之亮度-SNR之特性曲線圖作為雜訊特性。藉由使用如此之亮度-雜訊之特性曲線圖,可針對由X射線檢測相機10檢測出之各信號量,根據各信號量之區域之曲線圖之斜率特定支配性之雜訊要因(散粒雜訊、讀出雜訊等),且基於該特定之結果選擇學習完成模型206。 Here, the selection unit 204 can also obtain a characteristic curve diagram of noise calculated based on the standard deviation of the brightness value instead of the above-mentioned brightness-SNR characteristic curve diagram as the noise characteristic. By using such a brightness-noise characteristic curve diagram, the dominant noise factor (shot noise, readout noise, etc.) can be specified for each signal amount detected by the X-ray detection camera 10 according to the slope of the curve diagram of the area of each signal amount, and the learning completion model 206 is selected based on the specified result.

圖9係用於說明由選擇部204執行之基於圖像特性之學習完成模型之選擇功能之圖。於圖9中,(a)部顯示用於複數個學習完成模型206之構建之各個圖像資料之亮度-SNR之特性曲線圖G1、G2、G3,(b)部除了該等之特性曲線圖G1、G2、G3以外,亦顯示拍攝治具之X射線穿透圖像之亮度-SNR之特性曲線圖GT。於以如此之特性曲線圖G1、G2、G3、GT為對象之 情形下,選擇部204以選擇藉由最接近特性曲線圖GT之特性之特性曲線圖G2之圖像資料而構建之學習完成模型206之方式發揮功能。於選擇時,選擇部204於各特性曲線圖G1、G2、G3與特性曲線圖GT間,計算一定間隔之每個亮度值之SNR之誤差,且計算該等之誤差之均方誤差(RMSE:Root Mean Squared Error),選擇與均方誤差為最小之特性曲線圖G1、G2、G3對應之學習完成模型206。又,選擇部204於使用能量特性進行選擇之情形下,亦可同樣地選擇學習完成模型206。 FIG9 is a diagram for explaining the selection function of the learning model based on the image characteristics performed by the selection unit 204. In FIG9, part (a) shows the characteristic curve graphs G1 , G2 , and G3 of brightness-SNR of each image data used for the construction of a plurality of learning models 206, and part (b) shows the characteristic curve graph GT of brightness-SNR of the X-ray transmission image of the captured jig in addition to the characteristic curve graphs G1 , G2 , and G3 . When such characteristic curve graphs G1 , G2 , G3 , and GT are used as the object, the selection unit 204 functions in a manner of selecting the learning model 206 constructed by the image data of the characteristic curve graph G2 having the characteristics closest to the characteristic curve graph GT . During the selection, the selection unit 204 calculates the error of the SNR of each brightness value at a certain interval between each characteristic graph G 1 , G 2 , G 3 and the characteristic graph GT , and calculates the root mean square error (RMSE) of the errors, and selects the learned model 206 corresponding to the characteristic graph G 1 , G 2 , G 3 with the smallest root mean square error. In addition, the selection unit 204 can also select the learned model 206 in the same manner when selecting using energy characteristics.

選擇部204亦可以治具之X射線穿透圖像為對象基於應用複數個學習完成模型執行雜訊去除處理之後之圖像之特性,選擇學習完成模型206。 The selection unit 204 can also select the learned model 206 based on the characteristics of the image after applying multiple learned models to perform noise removal processing on the X-ray transmission image of the fixture.

例如,選擇部204使用拍攝具有各種解析度之圖表之治具之X射線穿透圖像,對該圖像應用複數個學習完成模型206,評估其結果產生之雜訊去除後之圖像。然後,選擇部204選擇用於雜訊去除處理前後之解析度之變化最小之圖像之學習完成模型206。圖10顯示用於解析度之評估之X射線穿透圖像之一例。於該X射線穿透圖像中,將解析度沿著一方向階狀變化之圖表設為攝像對象。X射線穿透圖像之解析度可使用MTF(Modulation Transfer Function,調製轉換函數)或CTF(Contrast Transfer Function,對比轉換函數)測定。 For example, the selection unit 204 uses an X-ray transmission image of a jig with graphs of various resolutions, applies a plurality of learning models 206 to the image, and evaluates the resulting image after noise removal. Then, the selection unit 204 selects the learning model 206 for the image with the smallest change in resolution before and after noise removal. FIG. 10 shows an example of an X-ray transmission image used for resolution evaluation. In the X-ray transmission image, a graph with a step-wise change in resolution along one direction is set as an imaging object. The resolution of the X-ray transmission image can be measured using MTF (Modulation Transfer Function) or CTF (Contrast Transfer Function).

除了上述之解析度之變化之評估以外,選擇部204亦可評估雜訊去除後之圖像之亮度-雜訊比之特性,且選擇用於該特性為最高之圖像之產生之學習完成模型206。圖11顯示用於亮度-雜訊比之評估之治具之構造之一 例。例如,作為治具,可使用在厚度沿一方向階狀變化之構件P1中散佈具有各種材質及各種大小之異物P2者。圖12顯示以圖11之治具為對象獲得之雜訊去除處理後之X射線穿透圖像。選擇部204在X射線穿透圖像中選擇包含異物P2之像之圖像區域R1與該區域R1之附近之不含異物P2之像之圖像區域R2,計算圖像區域R1之亮度之最小值LMIN與圖像區域R2之亮度之平均值LAVE及圖像區域R2之亮度之標準偏差LSD。然後,選擇部204使用下述式:CNR=(LAVE-LMIN)/LSD,算出亮度-雜訊比CNR。進而,選擇部204以應用複數個學習完成模型206後之X射線穿透圖像各者為對象算出亮度-雜訊比CNR,選擇用於亮度-雜訊比CNR為最高之X射線穿透圖像之產生之學習完成模型206。 In addition to the evaluation of the change in resolution described above, the selection unit 204 can also evaluate the brightness-noise ratio characteristics of the image after noise removal, and select the learning model 206 for generating the image with the highest characteristic. FIG11 shows an example of the structure of a jig used for the evaluation of the brightness-noise ratio. For example, as a jig, a member P1 with a stepwise change in thickness along one direction can be used, in which foreign objects P2 of various materials and sizes are scattered. FIG12 shows an X-ray transmission image obtained after noise removal processing using the jig of FIG11 as the object. The selection unit 204 selects the image region R1 including the image of the foreign body P2 and the image region R2 near the region R1 not including the image of the foreign body P2 in the X-ray transmission image, and calculates the minimum value L MIN of the brightness of the image region R1, the average value L AVE of the brightness of the image region R2, and the standard deviation L SD of the brightness of the image region R2. Then, the selection unit 204 uses the following formula: CNR=(L AVE -L MIN )/L SD to calculate the brightness-noise ratio CNR. Furthermore, the selection unit 204 calculates the brightness-noise ratio CNR for each of the X-ray transmission images after applying a plurality of learning completion models 206, and selects the learning completion model 206 used for generating the X-ray transmission image with the highest brightness-noise ratio CNR.

或者,選擇部204亦可基於圖像區域R1之亮度之平均值LAVE_R1與圖像區域R2之亮度之平均值LAVE_R2及圖像區域R2之亮度之標準偏差LSD,藉由下述式進行計算。 Alternatively, the selection unit 204 may also perform calculation using the following formula based on the average value L AVE — R1 of the brightness of the image region R1 , the average value L AVE — R2 of the brightness of the image region R2 , and the standard deviation L SD of the brightness of the image region R2 .

CNR=(LAVE_R1-LMIN_R2)/LSD CNR=(L AVE_R1 -L MIN_R2 )/L SD

處理部205藉由將由選擇部204選擇之學習完成模型206應用於以對象物F為對象而取得之X射線穿透圖像,並執行去除雜訊之圖像處理而產生輸出圖像。然後,處理部205將所產生之輸出圖像輸出至顯示裝置30等。 The processing unit 205 generates an output image by applying the learned model 206 selected by the selection unit 204 to the X-ray transmission image obtained with the object F as the object and performing image processing for removing noise. Then, the processing unit 205 outputs the generated output image to the display device 30, etc.

接著,對於使用本實施形態之圖像取得裝置1之對象物F之X射線穿透像之觀察處理之步序、亦即本實施形態之放射線圖像處理方法之流程進行 說明。圖13係顯示由圖像取得裝置1執行之觀察處理之步序之流程圖。 Next, the sequence of observation and processing of the X-ray transmission image of the object F using the image acquisition device 1 of the present embodiment, that is, the flow of the radiation image processing method of the present embodiment, is described. FIG. 13 is a flow chart showing the sequence of observation and processing performed by the image acquisition device 1.

首先,藉由控制裝置20,自圖像取得裝置1之操作員(使用者)受理表示X射線照射器50之動作條件、或者由X射線檢測相機10執行之攝像條件等之條件資訊之輸入(步驟S1)。接著,藉由控制裝置20基於條件資訊算出由X射線檢測相機10檢測出之X射線之平均能量之值(步驟S2)。 First, the control device 20 receives input of condition information indicating the operating conditions of the X-ray irradiator 50 or the imaging conditions performed by the X-ray detection camera 10 from the operator (user) of the image acquisition device 1 (step S1). Then, the control device 20 calculates the average energy value of the X-rays detected by the X-ray detection camera 10 based on the condition information (step S2).

進而,藉由控制裝置20,特定用於儲存於控制裝置20之學習完成模型206之構建之圖像資料之X射線之平均能量之值(步驟S3)。其後,對於儲存於控制裝置20之全部之學習完成模型206,重複X射線之平均能量之值之特定(步驟S4)。 Furthermore, the control device 20 specifies the value of the average energy of the X-rays for the image data constructed by the learning model 206 stored in the control device 20 (step S3). Thereafter, the specification of the value of the average energy of the X-rays is repeated for all the learning models 206 stored in the control device 20 (step S4).

接著,藉由利用控制裝置20比較所算出之X射線之平均能量之值,來篩選複數個學習完成模型206之候選者(步驟S5)。進而,藉由在圖像取得裝置1中設置治具並拍攝該治具,而取得治具之X射線穿透圖像(步驟S6)。 Next, the control device 20 compares the calculated average energy values of the X-rays to screen out a plurality of candidates for the learning completion model 206 (step S5). Furthermore, the X-ray penetration image of the jig is obtained by setting the jig in the image acquisition device 1 and photographing the jig (step S6).

其後,藉由控制裝置20取得治具之X射線穿透圖像之圖像特性(X射線之平均能量之值、厚度-亮度之特性、亮度-雜訊比之特性、亮度-雜訊之特性、解析度變化之特性等)(步驟S7)。然後,藉由控制裝置20基於所取得之圖像特性,選擇最終之學習完成模型206(步驟S8)。 Afterwards, the image characteristics of the X-ray penetration image of the fixture (the average energy value of the X-ray, the thickness-brightness characteristics, the brightness-noise ratio characteristics, the brightness-noise characteristics, the resolution change characteristics, etc.) are obtained by the control device 20 (step S7). Then, the control device 20 selects the final learning completion model 206 based on the obtained image characteristics (step S8).

進而,藉由在圖像取得裝置1中設置對象物F且拍攝對象物F,而取得 對象物F之X射線穿透圖像(步驟S9)。接著,藉由利用控制裝置20將最終選擇之學習完成模型206應用於對象物F之X射線穿透圖像,而以X射線穿透圖像為對象執行雜訊去除處理(步驟S10)。最後,藉由控制裝置20將經實施雜訊去除處理之X射線穿透圖像之輸出圖像輸出至顯示裝置30(步驟S11)。 Furthermore, by setting the object F in the image acquisition device 1 and photographing the object F, an X-ray transmission image of the object F is acquired (step S9). Then, by using the control device 20 to apply the finally selected learning model 206 to the X-ray transmission image of the object F, noise removal processing is performed on the X-ray transmission image (step S10). Finally, the output image of the X-ray transmission image after the noise removal processing is output to the display device 30 by the control device 20 (step S11).

根據以上所說明之圖像取得裝置1,基於取得對象物F之X射線穿透圖像時之X射線之產生源之動作條件或X射線穿透圖像之攝像條件,算出穿透對象物F之X射線之平均能量。然後,基於該平均能量,自預先構建之學習完成模型206之中篩選用於雜訊去除之學習完成模型206之候選者。藉此,由於與攝像對象之X射線之平均能量對應之學習完成模型206使用於雜訊去除,因此可實現跟X射線穿透圖像之亮度與雜訊之關係對應之雜訊去除。其結果為,可有效地去除X射線穿透圖像之雜訊,例如可提高異物檢測性能。特別是,X射線穿透圖像根據管電壓、濾光器、閃爍器、X射線檢測相機之條件(增益設定值、電路雜訊值、飽和電荷量、轉換係數值(e-/count)、相機之行頻)、對象物等之不同而雜訊之態樣變化。因此,於欲藉由機器學習來實現雜訊去除之情形下,需要事先準備在各種條件下學習之複數個學習模型。先前,尚未實現配合X射線穿透圖像之測定時之條件而自複數個學習模型之中選擇符合雜訊之態樣之學習模型。根據本實施形態,藉由選擇與攝像對象之X射線之平均能量對應之學習完成模型206,而實現始終符合雜訊之態樣之學習模型之選擇。 According to the image acquisition device 1 described above, the average energy of the X-rays penetrating the object F is calculated based on the motion conditions of the X-ray generation source when acquiring the X-ray penetrating image of the object F or the imaging conditions of the X-ray penetrating image. Then, based on the average energy, the candidate of the learning model 206 for noise removal is screened from the pre-constructed learning model 206. In this way, since the learning model 206 corresponding to the average energy of the X-rays of the photographed object is used for noise removal, noise removal corresponding to the relationship between the brightness and noise of the X-ray penetrating image can be realized. As a result, the noise of the X-ray penetrating image can be effectively removed, for example, the foreign body detection performance can be improved. In particular, the noise pattern of X-ray transmission images varies depending on the tube voltage, filter, scintillator, X-ray detection camera conditions (gain setting value, circuit noise value, saturation charge, conversion coefficient value (e-/count), camera line frequency), and object. Therefore, in the case of using machine learning to achieve noise removal, it is necessary to prepare multiple learning models learned under various conditions in advance. Previously, it has not been possible to select a learning model that matches the noise pattern from multiple learning models in accordance with the conditions when measuring X-ray transmission images. According to this embodiment, by selecting the learning model 206 corresponding to the average energy of the X-ray of the imaging object, the selection of a learning model that always conforms to the state of noise is achieved.

一般而言,於X射線穿透圖像中,含有X射線產生緣由之雜訊。考量 為了提高X射線穿透圖像之SN比而增加X射線量,但該情形下,若增加X射線量則感測器之被照射量增加,而有感測器之壽命變短、X射線產生源之壽命變短之問題,而難以兼顧SN比之提高與長壽命化。於本實施形態中,無需增加X射線量,因此可兼顧SN比之提高與長壽命化。 Generally speaking, X-ray penetration images contain noise caused by X-ray generation. Consideration In order to improve the SN ratio of X-ray penetration images, the X-ray dose is increased, but in this case, if the X-ray dose is increased, the exposure dose of the sensor increases, which has the problem of shortening the life of the sensor and the life of the X-ray generation source, and it is difficult to take into account both the improvement of the SN ratio and the longevity. In this embodiment, there is no need to increase the X-ray dose, so the improvement of the SN ratio and the longevity can be taken into account.

又,本實施形態之控制裝置20具有執行圖像處理之功能,該圖像處理使用所選擇之學習完成模型206自對象物F之X射線穿透圖像去除雜訊。藉由如此之功能,可實現跟X射線穿透圖像之亮度與雜訊之關係對應之雜訊去除,且可有效地去除X射線穿透圖像之雜訊。 Furthermore, the control device 20 of the present embodiment has a function of performing image processing, which uses the selected learning model 206 to remove noise from the X-ray transmission image of the object F. With such a function, noise removal corresponding to the relationship between the brightness and noise of the X-ray transmission image can be achieved, and the noise of the X-ray transmission image can be effectively removed.

又,本實施形態之控制裝置20具有如下之功能:藉由比較根據選擇資訊算出之X射線之平均能量之值、與自用於學習完成模型206之構建之圖像資料特定之平均能量之值,來篩選學習完成模型之候選者。藉由如此之功能,可確實地實現跟X射線穿透圖像之亮度與雜訊之關係對應之雜訊去除。 In addition, the control device 20 of the present embodiment has the following function: by comparing the average energy value of the X-ray calculated based on the selection information with the average energy value specified in the image data used to construct the learning model 206, the candidate for the learning model is screened. With such a function, noise removal corresponding to the relationship between the brightness and noise of the X-ray penetration image can be achieved reliably.

進而,本實施形態之控制裝置20具有基於治具之X射線穿透圖像之圖像特性自候選者中選擇學習完成模型206之功能。藉由如此之功能,可於對象物F之X射線穿透圖像之雜訊去除上選擇最佳之學習完成模型206。其結果為,可更確實地實現跟X射線穿透圖像之亮度與雜訊之關係對應之雜訊去除。 Furthermore, the control device 20 of this embodiment has a function of selecting a learned model 206 from candidates based on the image characteristics of the X-ray transmission image of the fixture. With such a function, the best learned model 206 can be selected for noise removal of the X-ray transmission image of the object F. As a result, noise removal corresponding to the relationship between the brightness and noise of the X-ray transmission image can be more accurately achieved.

圖14及圖15顯示由圖像取得裝置1取得之雜訊去除處理之前後之X射 線穿透圖像之例。圖14及圖15分別顯示以被賦予金屬、玻璃等異物之乳酪為對象之圖像、以殘存有各種大小之骨頭之雞肉為對象之圖像,分別於左側顯示雜訊處理前之圖像,於右側顯示雜訊處理後之圖像。如此般,可知根據本實施形態,對各種對象物有效地進行雜訊去除。 Figures 14 and 15 show examples of X-ray penetration images obtained by the image acquisition device 1 before and after noise removal processing. Figures 14 and 15 respectively show images of cheese with foreign matter such as metal and glass as the object and images of chicken with bones of various sizes remaining as the object, with the image before noise processing being shown on the left and the image after noise processing being shown on the right. As can be seen, according to this embodiment, noise removal is effectively performed on various objects.

以上,對於本發明之各種實施形態進行了說明,但本發明並不限定於上述實施形態,可在不變更記載於各申請專利範圍之要旨之範圍內進行變化,或可為應用於其他實施形態者。 The various embodiments of the present invention have been described above, but the present invention is not limited to the above embodiments and can be modified within the scope of the gist of each patent application, or can be applied to other embodiments.

例如,以X射線檢測相機10為雙線路X射線相機進行了說明,但並不限定於此,亦可為單線路X射線相機、雙能量X射線相機、TDI(Time Delay Integration,時間延遲積分)掃描X射線相機、具有2條線路以上之複數條線路之多線路X射線相機、二維X射線相機、X射線平板感測器、X射線I.I、不使用閃爍器之直接轉換型X射線相機(a-Se、Si、CdTe、CdZnTe、TlBr、PbI2等)、使用藉由透鏡耦合而實現之光學透鏡來觀察閃爍器之方式的相機。又,X射線檢測相機10亦可為對放射線具有感度之攝像管、或對放射線具有感度之點感測器。 For example, the X-ray detection camera 10 is described as a dual-line X-ray camera, but is not limited to this, and may also be a single-line X-ray camera, a dual-energy X-ray camera, a TDI (Time Delay Integration) scanning X-ray camera, a multi-line X-ray camera having more than two lines, a two-dimensional X-ray camera, an X-ray flat panel sensor, X-ray I.I, a direct conversion X-ray camera that does not use a scintillator (a-Se, Si, CdTe, CdZnTe, TlBr, PbI2, etc.), or a camera that uses an optical lens achieved by lens coupling to observe a scintillator. Furthermore, the X-ray detection camera 10 may also be a radioactive tube or a point sensor that is sensitive to radioactive rays.

又,上述實施形態之控制裝置20,係基於根據條件資訊算出之X射線之平均能量之值,來選擇學習完成模型206之候選者,但亦可如以下所示之變化例之控制裝置20A般,具有對應X射線檢測相機10之性能劣化、X射線照射器50之輸出變動或性能劣化之功能。 Furthermore, the control device 20 of the above-mentioned embodiment selects the candidate of the learning completion model 206 based on the value of the average energy of the X-ray calculated according to the condition information, but it can also have the function of responding to the performance degradation of the X-ray detection camera 10, the output change or performance degradation of the X-ray irradiator 50, as in the control device 20A of the variation shown below.

又,關於圖像取得裝置1,亦不限定於上述實施形態,亦可為CT(Computed Tomography,電腦斷層攝影)裝置等在使對象物F靜止之狀態下進行拍攝之放射線圖像處理系統。進而,亦可為一面使對象物F旋轉,一面進行拍攝之放射線圖像處理系統。 Furthermore, the image acquisition device 1 is not limited to the above-mentioned embodiment, and may be a radiation image processing system such as a CT (Computed Tomography) device that takes images while the object F is stationary. Furthermore, it may be a radiation image processing system that takes images while the object F is rotated.

圖16顯示變化例之控制裝置20A之功能構成之方塊圖。控制裝置20A與上述實施形態之控制裝置20比較,於具有測定部207之點、以及算出部202A及篩選部203A之功能上不同。 FIG16 is a block diagram showing the functional configuration of the control device 20A of the variation. The control device 20A is different from the control device 20 of the above-mentioned embodiment in that it has a measuring unit 207 and the functions of the calculation unit 202A and the screening unit 203A.

於控制裝置20中,在將X射線檢測相機10之性能劣化及X射線照射器50之輸出變動或性能劣化設為無,而可根據X射線之平均能量推定X射線穿透圖像之亮度與雜訊之關係之前提下,篩選學習完成模型206。相對於此,於本變化例之控制裝置20A中,具有如下之功能:考量X射線檢測相機10之性能劣化、X射線照射器50之輸出變動、或其性能劣化,算出X射線轉換係數,且基於X射線轉換係數篩選學習完成模型206。X射線轉換係數係表示在X射線以閃爍器轉換成可見光之後,直至以相機之感測器轉換成電子(電信號)之效率之參數。 In the control device 20, the performance degradation of the X-ray detection camera 10 and the output variation or performance degradation of the X-ray irradiator 50 are set to none, and the relationship between the brightness and noise of the X-ray penetration image can be estimated based on the average energy of the X-rays, and the learning completion model 206 is screened. In contrast, in the control device 20A of this variation, the following functions are provided: considering the performance degradation of the X-ray detection camera 10, the output variation of the X-ray irradiator 50, or its performance degradation, the X-ray conversion coefficient is calculated, and the learning completion model 206 is screened based on the X-ray conversion coefficient. The X-ray conversion coefficient is a parameter that represents the efficiency of the X-ray from being converted into visible light by the scintillator to being converted into electrons (electrical signals) by the camera sensor.

一般而言,在將X射線之平均能量設為E[keV],將閃爍器發光量設為EM〔photon/keV]、將感測器之耦合效率設為C、將感測器之量子效率設為QE時,可藉由下述式:FT=E×EM×C×QE Generally speaking, when the average energy of X-rays is set to E [keV], the luminescence of the scintillator is set to EM [photon/keV], the coupling efficiency of the sensor is set to C, and the quantum efficiency of the sensor is set to QE, the following formula can be used: FT = E × EM × C × QE

計算X射線轉換係數FT。又,由於使用X射線轉換係數FT與X射線光 子數NP及相機之讀出雜訊Nr藉由下述式:SNR=FTNP/{(FTNP+Nr2)1/2} Calculate the X-ray conversion coefficient FT . In addition, by using the X-ray conversion coefficient FT , the number of X-ray photons NP and the camera readout noise Nr , the following formula is used: SNR = FTNP /{( FTNP + Nr2 ) 1/2 }

求得X射線穿透圖像之SN比(SNR),因此可基於X射線轉換係數FT推定考量了相機之性能劣化後之X射線穿透圖像之亮度與雜訊之關係。 The signal-to-noise ratio (SNR) of the X-ray transmission image is obtained, and the relationship between the brightness and noise of the X-ray transmission image after the performance degradation of the camera is considered can be estimated based on the X-ray conversion coefficient FT .

控制裝置20A之測定部207具有測定作為閃爍器11a、11b之性能劣化之發光量EM之下降量、作為線掃描相機12a、12b之性能劣化之感測器之量子效率QE之下降量、作為X射線照射器50之輸出變動及性能劣化之平均能量E之變化量之功能。例如,測定部207測定閃爍器11a、11b之無性能劣化之狀態(新品時之狀態)與當前之閃爍器11a、11b之間之發光量之下降量,且根據該下降量推定當前之發光量EM。又,測定部207測定線掃描相機12a、12b之無性能劣化之狀態(新品時之狀態)與當前之線掃描相機12a、12b之間之亮度下降量,且根據該下降量推定當前之量子效率QE。又,測定部207根據X射線照射器50之無性能劣化之狀態(新品時之狀態)與當前之X射線照射器50之間之平均能量之變化量推定當前之平均能量E。平均能量E可根據厚度及材質為已知、且X射線之平均能量與X射線穿透率之關係為已知之平板狀構件之攝像資料而求得,或可根據厚度或者材質變化之治具之複數點之攝像資料而求得等。 The measuring unit 207 of the control device 20A has a function of measuring a decrease in the amount of light emitted EM as a performance degradation of the scintillators 11a and 11b, a decrease in the quantum efficiency QE of the sensor as a performance degradation of the line scan cameras 12a and 12b, and a change in the average energy E as an output variation and performance degradation of the X-ray irradiator 50. For example, the measuring unit 207 measures a decrease in the amount of light emitted between the state of the scintillators 11a and 11b without performance degradation (new state) and the current state of the scintillators 11a and 11b, and estimates the current amount of light emitted EM based on the decrease. Furthermore, the measuring unit 207 measures the brightness reduction between the state of the line scan cameras 12a and 12b without performance degradation (new state) and the current line scan cameras 12a and 12b, and estimates the current quantum efficiency QE based on the reduction. Furthermore, the measuring unit 207 estimates the current average energy E based on the change in average energy between the state of the X-ray irradiator 50 without performance degradation (new state) and the current X-ray irradiator 50. The average energy E can be obtained based on the imaging data of a flat plate component whose thickness and material are known and the relationship between the average energy of the X-ray and the X-ray transmittance is known, or can be obtained based on the imaging data of multiple points of a jig whose thickness or material changes, etc.

控制裝置20A之算出部202A使用所算出之X射線之平均能量E與由測定部207推定之發光量EM及量子效率QE算出X射線轉換係數FT。控制裝置20A之篩選部203具有如下之功能:藉由對所算出之X射線轉換係數FT與用於學習完成模型206之構建之圖像資料之X射線轉換係數FT予以比 較,而篩選學習完成模型206之候選者。 The calculation unit 202A of the control device 20A calculates the X-ray conversion coefficient FT using the calculated average energy E of the X-rays and the emission amount EM and quantum efficiency QE estimated by the measurement unit 207. The screening unit 203 of the control device 20A has a function of screening candidates for the learning completion model 206 by comparing the calculated X-ray conversion coefficient FT with the X-ray conversion coefficient FT of the image data used for construction of the learning completion model 206.

又,上述實施形態之控制裝置20係在篩選了學習完成模型之候選者之後,基於拍攝治具所得之圖像特性來選擇學習完成模型,但亦可不進行治具之拍攝而執行針對對象物之X射線穿透圖像之雜訊去除處理。圖17係顯示由變化例之圖像取得裝置1執行之觀察處理之步序之流程圖。如此般,亦可省略圖13中之步驟S6~S8之處理,而使用基於平均能量篩選之學習完成模型執行雜訊去除處理。 Furthermore, the control device 20 of the above-mentioned embodiment selects the learned model based on the characteristics of the image obtained by photographing the jig after screening the candidates of the learned model, but it is also possible to perform noise removal processing on the X-ray penetration image of the object without photographing the jig. FIG. 17 is a flow chart showing the sequence of observation processing performed by the image acquisition device 1 of the variation. In this way, the processing of steps S6 to S8 in FIG. 13 can also be omitted, and the learned model based on the average energy screening can be used to perform noise removal processing.

於上述之實施形態中,較佳的是進而具備執行使用候選者自對象物之放射線圖像去除雜訊之圖像處理之步驟。於上述實施形態中,較佳的是進而具備執行使用候選者自對象物之放射線圖像去除雜訊之圖像處理之處理部。藉此,可實現跟放射線圖像之亮度與雜訊之關係對應之雜訊去除,且可有效地去除放射線圖像之雜訊。 In the above-mentioned embodiment, it is preferable to further include a step of performing image processing for removing noise from a radiation image of an object using a candidate. In the above-mentioned embodiment, it is preferable to further include a processing unit for performing image processing for removing noise from a radiation image of an object using a candidate. In this way, noise removal corresponding to the relationship between brightness and noise of a radiation image can be achieved, and noise of a radiation image can be effectively removed.

又,於篩選之步驟中,較佳的是藉由比較平均能量與根據圖像資料特定之平均能量來篩選候選者。又,篩選部較佳的是藉由對平均能量與根據圖像資料特定之平均能量進行比較而篩選候選者。該情形下,藉由與根據用於學習完成模型之構建之圖像資料特定之平均能量比較,來篩選學習完成模型,因此可確實地實現跟放射線圖像之亮度與雜訊之關係對應之雜訊去除。 Furthermore, in the step of filtering, it is preferred to filter the candidates by comparing the average energy with the average energy specified based on the image data. Furthermore, the filtering unit preferably filters the candidates by comparing the average energy with the average energy specified based on the image data. In this case, the learned model is filtered by comparing with the average energy specified based on the image data used to construct the learned model, so that noise removal corresponding to the relationship between the brightness and noise of the radiation image can be reliably achieved.

進而,於條件資訊中較佳的是至少包含產生源之管電壓、用於對象 物之拍攝之相機所具備之濾光器之資訊、產生源所具備之濾光器之資訊、相機所具備之閃爍器之資訊、產生源與攝像裝置之間之距離、與用於對象物之拍攝之X射線檢測相機相關資訊、及與對象物相關之資訊中任一者。該情形下,由於可高精度地計算穿透對象物之放射線之平均能量,因此可進行跟放射線圖像之亮度與雜訊之關係對應之雜訊去除。 Furthermore, the condition information preferably includes at least one of the tube voltage of the generating source, the filter information of the camera used to photograph the object, the filter information of the generating source, the strobe information of the camera, the distance between the generating source and the imaging device, the information related to the X-ray detection camera used to photograph the object, and the information related to the object. In this case, since the average energy of the radiation penetrating the object can be calculated with high accuracy, noise removal corresponding to the relationship between the brightness and noise of the radiation image can be performed.

又,進而,較佳的是進而具備如下之步驟:照射放射線並拍攝治具且取得放射線圖像,基於該放射線圖像之圖像特性自候選者選擇學習完成模型。又,進而,較佳的是進而具備選擇部,該選擇部照射放射線並拍攝治具且取得放射線圖像,基於該放射線圖像之圖像特性自候選者選擇學習完成模型。根據所述構成,由於基於拍攝實際之治具而獲得之放射線圖像之圖像特性選擇學習完成模型,因此可在對象物之放射線圖像之雜訊去除上選擇最佳之學習完成模型。其結果為,可更確實地實現跟放射線圖像之亮度與雜訊之關係對應之雜訊去除。 Furthermore, it is preferable to further include the following steps: irradiating the jig with radiation, photographing the jig, and obtaining a radiation image, and selecting a learned model from candidates based on the image characteristics of the radiation image. Furthermore, it is preferable to further include a selection unit, which irradiates the jig with radiation, photographs the jig, and obtains a radiation image, and selects a learned model from candidates based on the image characteristics of the radiation image. According to the above structure, since the learned model is selected based on the image characteristics of the radiation image obtained by photographing the actual jig, the best learned model can be selected for noise removal of the radiation image of the object. As a result, noise removal corresponding to the relationship between the brightness and noise of the radiation image can be more reliably achieved.

[產業上之可利用性] [Industrial availability]

實施形態係以放射線圖像處理方法、學習完成模型、放射線圖像處理模組、放射線圖像處理程式及放射線圖像處理系統為使用用途,可有效地去除放射線圖像之雜訊者。 The implementation form is to use a radiation image processing method, a learning completion model, a radiation image processing module, a radiation image processing program, and a radiation image processing system, which can effectively remove noise from radiation images.

20:控制裝置(放射線圖像處理模組) 201:輸入部 202:算出部 203:篩選部 204:選擇部 205:處理部 206:學習完成模型 20: Control device (radiation image processing module) 201: Input unit 202: Calculation unit 203: Screening unit 204: Selection unit 205: Processing unit 206: Learning completion model

Claims (18)

一種放射線圖像處理方法,其包含如下之步驟: 輸入表示照射放射線並拍攝對象物時之前述放射線之產生源之條件、或攝像條件之任一者之條件資訊; 基於前述條件資訊,算出與穿透前述對象物之前述放射線相關之平均能量; 基於前述平均能量,自預先使用圖像資料藉由機器學習而對複數個平均能量每一者分別構建之複數個學習完成模型之中,篩選學習完成模型之候選者;及 執行使用前述候選者自前述對象物之放射線圖像去除雜訊之圖像處理。 A radiographic image processing method comprises the following steps: Inputting condition information representing either the condition of the radiation source or the imaging condition when irradiating radiation and photographing an object; Based on the condition information, calculating the average energy associated with the radiation penetrating the object; Based on the average energy, selecting a candidate for a learned model from a plurality of learned models constructed by machine learning using image data in advance for each of the plurality of average energies; and Performing image processing for removing noise from the radiographic image of the object using the candidate. 如請求項1之放射線圖像處理方法,其中在前述篩選之步驟中,藉由比較前述平均能量與根據前述圖像資料而特定之平均能量,來篩選前述候選者。A radiographic image processing method as claimed in claim 1, wherein in the aforementioned screening step, the aforementioned candidates are screened by comparing the aforementioned average energy with an average energy specified based on the aforementioned image data. 如請求項1之放射線圖像處理方法,其中前述條件資訊至少包含:前述產生源之管電壓、用於前述對象物之拍攝之相機所具備之濾光器之資訊、前述產生源所具備之濾光器之資訊、前述相機所具備之閃爍器之資訊、前述產生源與攝像裝置之間之距離、與用於前述對象物之拍攝之X射線檢測相機相關之資訊、及與前述對象物相關之資訊中任一者。A radiation image processing method as claimed in claim 1, wherein the aforementioned conditional information includes at least: the tube voltage of the aforementioned generating source, information of a filter possessed by a camera used for photographing the aforementioned object, information of a filter possessed by the aforementioned generating source, information of a strobe possessed by the aforementioned camera, the distance between the aforementioned generating source and an imaging device, information related to an X-ray detection camera used for photographing the aforementioned object, and any one of information related to the aforementioned object. 如請求項2之放射線圖像處理方法,其中前述條件資訊至少包含:前述產生源之管電壓、用於前述對象物之拍攝之相機所具備之濾光器之資訊、前述產生源所具備之濾光器之資訊、前述相機所具備之閃爍器之資訊、前述產生源與攝像裝置之間之距離、與用於前述對象物之拍攝之X射線檢測相機相關之資訊、及與前述對象物相關之資訊中任一者。A radiation image processing method as claimed in claim 2, wherein the aforementioned conditional information includes at least: the tube voltage of the aforementioned generating source, information of a filter possessed by a camera used for photographing the aforementioned object, information of a filter possessed by the aforementioned generating source, information of a strobe possessed by the aforementioned camera, the distance between the aforementioned generating source and an imaging device, information related to an X-ray detection camera used for photographing the aforementioned object, and any one of information related to the aforementioned object. 如請求項1至4中任一項之放射線圖像處理方法,其進而具備如下之步驟:照射放射線並拍攝治具取得放射線圖像,基於該放射線圖像之圖像特性,自前述候選者選擇學習完成模型。The radiographic image processing method of any one of claims 1 to 4 further comprises the following steps: irradiating the fixture with radiation and photographing the fixture to obtain a radiographic image, and selecting a learning completion model from the aforementioned candidates based on the image characteristics of the radiographic image. 如請求項1至4中任一項之放射線圖像處理方法,其中前述機器學習係深度學習。A radiographic image processing method as claimed in any one of claims 1 to 4, wherein the machine learning is deep learning. 如請求項5之放射線圖像處理方法,其中前述機器學習係深度學習。A radiographic image processing method as claimed in claim 5, wherein the machine learning is deep learning. 一種學習完成模型,其係程式,上述程式使電腦執行請求項1至7中任一項之放射線圖像處理方法,且 其係使用圖像資料藉由機器學習而構建,使前述電腦之處理器執行自前述對象物之放射線圖像去除雜訊之圖像處理。 A learning completion model is a program that enables a computer to execute a radiation image processing method of any one of claim items 1 to 7, and is constructed by machine learning using image data, so that a processor of the aforementioned computer executes image processing for removing noise from the radiation image of the aforementioned object. 一種放射線圖像處理模組,其包含:輸入部,其受理表示照射放射線並拍攝對象物時之前述放射線之產生源之條件、或攝像條件之任一者之條件資訊; 算出部,其基於前述條件資訊,算出與穿透前述對象物之前述放射線相關之平均能量; 篩選部,其基於前述平均能量,自預先使用圖像資料藉由機器學習而對複數個平均能量每一者分別構建之複數個學習完成模型之中,篩選學習完成模型之候選者;及 處理部,其執行:使用前述候選者自前述對象物之放射線圖像去除雜訊之圖像處理。 A radiation image processing module comprises: an input unit that receives condition information indicating the conditions of the radiation source or the imaging conditions when irradiating radiation and photographing an object; a calculation unit that calculates the average energy associated with the radiation that penetrates the object based on the condition information; a screening unit that screens candidates for a learning model from a plurality of learning models that are constructed by machine learning using image data for each of the plurality of average energies based on the average energy; and a processing unit that performs image processing for removing noise from the radiation image of the object using the candidate. 如請求項9之放射線圖像處理模組,其中藉由比較前述平均能量與根據前述圖像資料而特定之平均能量,來篩選前述候選者。A radiation image processing module as claimed in claim 9, wherein the aforementioned candidate is screened by comparing the aforementioned average energy with an average energy specified based on the aforementioned image data. 如請求項9之放射線圖像處理模組,其中前述條件資訊至少包含:前述產生源之管電壓、用於前述對象物之拍攝之相機所具備之濾光器之資訊、前述產生源所具備之濾光器之資訊、前述相機所具備之閃爍器之資訊、前述產生源與攝像裝置之間之距離、與用於前述對象物之拍攝之X射線檢測相機相關之資訊、及與前述對象物相關之資訊中任一者。A radiation image processing module as claimed in claim 9, wherein the aforementioned conditional information includes at least: the tube voltage of the aforementioned generating source, information of a filter possessed by a camera used for photographing the aforementioned object, information of a filter possessed by the aforementioned generating source, information of a strobe possessed by the aforementioned camera, the distance between the aforementioned generating source and an imaging device, information related to an X-ray detection camera used for photographing the aforementioned object, and any one of information related to the aforementioned object. 如請求項10之放射線圖像處理模組,其中前述條件資訊至少包含:前述產生源之管電壓、用於前述對象物之拍攝之相機所具備之濾光器之資訊、前述產生源所具備之濾光器之資訊、前述相機所具備之閃爍器之資訊、前述產生源與攝像裝置之間之距離、與用於前述對象物之拍攝之X射線檢測相機相關之資訊、及與前述對象物相關之資訊中任一者。A radiation image processing module as claimed in claim 10, wherein the aforementioned conditional information includes at least: the tube voltage of the aforementioned generating source, information of a filter possessed by a camera used for photographing the aforementioned object, information of a filter possessed by the aforementioned generating source, information of a strobe possessed by the aforementioned camera, the distance between the aforementioned generating source and an imaging device, information related to an X-ray detection camera used for photographing the aforementioned object, and any one of information related to the aforementioned object. 如請求項9至12中任一項之放射線圖像處理模組,其進而包含選擇部,該選擇部照射放射線並拍攝治具取得放射線圖像,基於該放射線圖像之圖像特性,自前述候選者選擇學習完成模型。A radiation image processing module as claimed in any one of claims 9 to 12, further comprising a selection unit, which irradiates radiation and photographs the fixture to obtain a radiation image, and selects a learning completion model from the aforementioned candidates based on the image characteristics of the radiation image. 如請求項9至12中任一項之放射線圖像處理模組,其中前述機器學習係深度學習。A radiographic image processing module as claimed in any one of claims 9 to 12, wherein the machine learning is deep learning. 如請求項13之放射線圖像處理模組,其中前述機器學習係深度學習。A radiographic image processing module as claimed in claim 13, wherein the aforementioned machine learning is deep learning. 一種放射線圖像處理程式,其使處理器作為輸入部、算出部、篩選部及處理部而發揮功能, 該輸入部係受理表示照射放射線並拍攝對象物時之前述放射線之產生源之條件、或攝像條件之任一者之條件資訊; 該算出部係基於前述條件資訊,算出與穿透前述對象物之前述放射線相關之平均能量; 該篩選部係基於前述平均能量,自預先使用圖像資料藉由機器學習而對複數個平均能量每一者分別構建之複數個學習完成模型之中,篩選學習完成模型之候選者; 該處理部執行:使用前述候選者自前述對象物之放射線圖像去除雜訊之圖像處理。 A radiographic image processing program, which enables a processor to function as an input unit, a calculation unit, a screening unit, and a processing unit. The input unit receives condition information indicating the conditions of the source of the aforementioned radiation or any one of the imaging conditions when irradiating radiation and photographing an object; The calculation unit calculates the average energy associated with the aforementioned radiation penetrating the aforementioned object based on the aforementioned condition information; The screening unit screens candidates for a learning model from among a plurality of learning models constructed for each of a plurality of average energies by machine learning using image data in advance based on the aforementioned average energy; The processing unit performs image processing for removing noise from the radiographic image of the aforementioned object using the aforementioned candidate. 一種放射線圖像處理系統,其包含:請求項9至15中任一項之放射線圖像處理模組; 前述產生源,其向前述對象物照射放射線;及 攝像裝置,其拍攝穿透前述對象物之放射線,取得前述放射線圖像。 A radiation image processing system, comprising: a radiation image processing module of any one of claims 9 to 15; the aforementioned generating source, which irradiates the aforementioned object with radiation; and an imaging device, which captures the radiation that penetrates the aforementioned object and obtains the aforementioned radiation image. 一種機器學習方法,其包含藉由機器學習構建學習完成模型之構建步驟,該學習完成模型係將跟基於表示照射放射線並拍攝對象物時之前述放射線之產生源之條件、或攝像條件之任一者之條件資訊,而算出之平均能量、且係與穿透前述對象物之前述放射線相關之前述平均能量對應之前述對象物之放射線圖像即訓練圖像,作為訓練資料而使用,輸出基於前述訓練圖像而去除雜訊後之圖像資料; 前述訓練圖像具有:基於前述平均能量之已知之雜訊分佈。 A machine learning method includes a step of constructing a learning model by machine learning, wherein the learning model uses a radiation image of the object corresponding to the average energy calculated based on condition information representing the condition of the source of the radiation or the imaging condition when the object is irradiated with radiation, and the average energy related to the radiation penetrating the object, i.e., a training image, as training data, and outputs image data after noise is removed based on the training image; The training image has: a known noise distribution based on the average energy.
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