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TWI880030B - Photosensitive resin composition, method for producing photosensitive resin composition, and method for producing polyimide cured film - Google Patents

Photosensitive resin composition, method for producing photosensitive resin composition, and method for producing polyimide cured film Download PDF

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TWI880030B
TWI880030B TW110134871A TW110134871A TWI880030B TW I880030 B TWI880030 B TW I880030B TW 110134871 A TW110134871 A TW 110134871A TW 110134871 A TW110134871 A TW 110134871A TW I880030 B TWI880030 B TW I880030B
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photosensitive resin
resin composition
polyimide
cured film
resin layer
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TW202217456A (en
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松本涼香
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日商旭化成股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0387Polyamides or polyimides
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1067Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
    • C08G73/1071Wholly aromatic polyimides containing oxygen in the form of ether bonds in the main chain
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials

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Abstract

本發明之課題在於提供一種表現出低介電損耗正切、保存穩定性優異且能夠以高解像度形成硬化凹凸圖案之感光性樹脂組合物。 The subject of the present invention is to provide a photosensitive resin composition that exhibits low dielectric loss tangent, excellent storage stability, and is capable of forming a hardened concave-convex pattern with high resolution.

本發明之感光性樹脂組合物包含(A)以下通式(1):

Figure 110134871-A0305-11-0001-1
The photosensitive resin composition of the present invention comprises (A) the following general formula (1):
Figure 110134871-A0305-11-0001-1

{式中,X1、Y1、n1、R1、R2由請求項1規定}所表示之聚醯亞胺前驅物:100質量份;(B)感光劑:0.5~10質量份;及(D)溶劑:100~300質量份;對該感光性樹脂組合物進行脫溶劑而獲得之將要曝光前之感光性樹脂層的紅外吸收光譜中之1380cm-1附近波峰強度除以1500cm-1附近波峰強度所得之該感光性樹脂層之醯亞胺化指數,除以將該感光性樹脂組合物以350℃進行加熱、硬化而獲得之聚醯亞胺硬化膜之醯亞胺化指數所得之值即醯亞胺化率為15%~50%,且於該聚醯亞胺硬化膜之聚醯亞胺中,相對於每個重複單元,醯亞胺基所占之比率即醯亞胺基濃度為12wt%~30wt%。 (B) a photosensitive agent: 0.5 to 10 parts by weight; and (D) a solvent: 100 to 300 parts by weight. The peak intensity of the infrared absorption spectrum of the photosensitive resin layer before exposure obtained by removing the solvent from the photosensitive resin composition is divided by the peak intensity of 1500 cm - 1. The value obtained by dividing the imidization index of the photosensitive resin layer obtained by the peak intensity near -1 by the imidization index of the polyimide cured film obtained by heating and curing the photosensitive resin composition at 350°C, that is, the imidization rate is 15%~50%, and in the polyimide of the polyimide cured film, the ratio of the imide group to each repeating unit, that is, the imide group concentration is 12wt%~30wt%.

Description

感光性樹脂組合物、感光性樹脂組合物之製造方法及聚醯亞胺硬化膜之製造方法 Photosensitive resin composition, method for producing photosensitive resin composition, and method for producing polyimide cured film

本發明係關於一種感光性樹脂組合物。更詳細而言,本發明係關於一種表現出低介電損耗正切、保存穩定性優異且能夠以高解像度形成硬化凹凸圖案之負型感光性樹脂組合物、其製法、以及使用該負型感光性樹脂組合物之聚醯亞胺硬化膜之製造方法。 The present invention relates to a photosensitive resin composition. More specifically, the present invention relates to a negative photosensitive resin composition that exhibits low dielectric loss tangent, excellent storage stability, and is capable of forming a hardened concave-convex pattern with high resolution, a preparation method thereof, and a method for preparing a polyimide hardened film using the negative photosensitive resin composition.

先前,電子零件之絕緣材料及半導體裝置之鈍化膜、表面保護膜、層間絕緣膜等使用兼具優異之耐熱性、電特性及機械特性之聚醯亞胺樹脂。該聚醯亞胺樹脂之中,以感光性聚醯亞胺前驅物組合物之形態提供者可藉由該組合物之塗佈、曝光、顯影、及基於固化之熱醯亞胺化處理而容易地形成耐熱性硬化凹凸圖案皮膜。此種感光性聚醯亞胺前驅物組合物具有與先前之非感光型聚醯亞胺材料相比能夠大幅縮減步驟之特徵。 Previously, insulating materials for electronic parts and passivation films, surface protection films, and interlayer insulating films for semiconductor devices used polyimide resins with excellent heat resistance, electrical properties, and mechanical properties. Among the polyimide resins, the photosensitive polyimide precursor composition provides a form that can easily form a heat-resistant hardened concave-convex pattern film by coating, exposing, developing, and curing-based thermal imidization treatment of the composition. This photosensitive polyimide precursor composition has the characteristic of greatly reducing the number of steps compared to previous non-photosensitive polyimide materials.

且說,半導體裝置(以下,亦稱為「元件」)對應於目的以各種方法安裝於印刷基板。先前之元件通常係藉由自元件之外部端子(焊墊)至引線框架以較細之金屬線連接之打線接合法而製作,但最近,就高速傳輸化及封裝高度之薄型化等觀點而言,提出有被稱為扇出型晶圓級封裝(FOWLP)之半導體晶片安裝技術。所謂FOWLP,係對已完成前步驟之晶圓進行切割而製造單片晶片,於支持體上對單片晶片進行重組後利用塑模樹脂進行 密封,並將支持體剝離後形成再配線層之安裝技術。 Semiconductor devices (hereinafter also referred to as "components") are mounted on printed circuit boards in various ways according to their purpose. Previously, components were usually manufactured by wire bonding, which connects the external terminals (pads) of the components to the lead frame with relatively fine metal wires. However, recently, from the perspective of high-speed transmission and thinner package height, a semiconductor chip mounting technology called fan-out wafer level packaging (FOWLP) has been proposed. The so-called FOWLP is a mounting technology that manufactures single chips by dicing the wafer that has completed the previous step, reassembles the single chips on a support, seals them with a mold resin, and forms a redistribution layer after peeling off the support.

近年來,當務之急係開發面向作為新通信標準之第5代移動通信系統(5G)之封裝。5G與先前技術之4G不同,藉由使用毫米波(10Gz~80GHz)之頻帶,能夠實現先前之通信所不存在之高速大容量化/信號之低延遲/多終端之同時連接。毫米頻帶於印刷配線板之信號配線中傳輸損耗之影響較大,存在發熱或傳輸延遲之顧慮。因此,為了降低傳輸損耗,將進行電波收發之前端模組(FEM)與天線一體化而開發出天線封裝(AiP)(例如,參照以下專利文獻1)。AiP由於配線長度較短,故而能夠抑制與配線長度成比例增大之傳輸損耗。 In recent years, it has become imperative to develop packages for the fifth generation mobile communication system (5G), which is a new communication standard. Unlike the previous 4G technology, 5G uses the millimeter wave (10Gz~80GHz) frequency band to achieve high speed and large capacity/low signal latency/simultaneous connection of multiple terminals that did not exist in previous communications. The millimeter frequency band has a greater impact on transmission loss in the signal wiring of the printed wiring board, and there are concerns about heat generation or transmission delay. Therefore, in order to reduce transmission loss, the front-end module (FEM) that performs radio wave transmission and reception is integrated with the antenna to develop an antenna package (AiP) (for example, refer to the following patent document 1). AiP has shorter wiring length, so it can suppress the transmission loss that increases proportionally with the wiring length.

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Literature]

[專利文獻1]美國專利申請公開第2016/0104940號說明書 [Patent Document 1] U.S. Patent Application Publication No. 2016/0104940

另一方面,封裝設計上之傳輸損耗之抑制亦存在極限,亦期待材料方面之改善。於用於形成配線之絕緣材料之介電常數或介電損耗正切(tanδ)較高之情形時,介電損耗增大,以總和計傳輸損耗增加。聚醯亞胺雖然絕緣性能或膜物性優異,但由於醯亞胺基本身為極性官能基,進而感光性聚醯亞胺前驅物組合物含有光聚合起始劑或交聯劑等大量極性化合物,故而介電常數或介電損耗正切之值較高,需要降低介電特性。 On the other hand, there is a limit to the suppression of transmission loss in packaging design, and improvements in materials are also expected. When the dielectric constant or dielectric loss tangent (tanδ) of the insulating material used to form the wiring is higher, the dielectric loss increases, and the total transmission loss increases. Although polyimide has excellent insulation performance or film properties, since the imide group itself is a polar functional group, and the photosensitive polyimide precursor composition contains a large amount of polar compounds such as photopolymerization initiators or crosslinking agents, the dielectric constant or dielectric loss tangent is high, and the dielectric properties need to be reduced.

鑒於技術之現狀,本發明所欲解決之課題在於提供一種表現出低介電損耗正切、保存穩定性優異且能夠以高解像度形成硬化凹凸圖案之負型感光性樹脂組合物、其製法、使用該感光性樹脂組合物之聚醯亞胺硬化膜、硬化凹凸圖案之製造方法、以及具有該硬化凹凸圖案而成之半導體裝置。 In view of the current state of the art, the problem to be solved by the present invention is to provide a negative photosensitive resin composition that exhibits low dielectric loss tangent, excellent storage stability, and is capable of forming a hardened concave-convex pattern with high resolution, a preparation method thereof, a polyimide hardened film using the photosensitive resin composition, a method for manufacturing a hardened concave-convex pattern, and a semiconductor device having the hardened concave-convex pattern.

本發明者等人意外發現:於包含聚醯亞胺前驅物之感光性樹脂組合物中,藉由調整感光性樹脂組合物之特性,能夠解決上述課題,從而完成了本發明。 The inventors of the present invention unexpectedly discovered that the above-mentioned problem can be solved by adjusting the properties of the photosensitive resin composition containing a polyimide precursor, thereby completing the present invention.

即,本發明如下所述。 That is, the present invention is as follows.

[1]一種感光性樹脂組合物,其包含: [1] A photosensitive resin composition comprising:

(A)以下通式(1)所表示之聚醯亞胺前驅物:100質量份;

Figure 110134871-A0305-12-0003-4
(A) 100 parts by weight of a polyimide precursor represented by the following general formula (1);
Figure 110134871-A0305-12-0003-4

{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,n1為2~150之整數,R1與R2分別獨立地為氫原子或碳數1~40之一價有機基;其中,R1與R2中之至少一個為以下通式(2)所表示之基:

Figure 110134871-A0305-12-0003-5
{wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, n1 is an integer of 2 to 150, R1 and R2 are independently a hydrogen atom or a monovalent organic group having 1 to 40 carbon atoms; wherein at least one of R1 and R2 is a group represented by the following general formula (2):
Figure 110134871-A0305-12-0003-5

(式中,R3、R4及R5分別獨立地為氫原子或碳數1~3之一價有機基,並且m1為2~10之整數)} (wherein, R 3 , R 4 and R 5 are independently a hydrogen atom or a monovalent organic group having 1 to 3 carbon atoms, and m1 is an integer of 2 to 10)}

(B)感光劑:0.5~10質量份;及 (B) Photosensitizer: 0.5~10 parts by mass; and

(D)溶劑:100~300質量份;對該感光性樹脂組合物進行脫溶劑而獲得之曝光前之感光性樹脂層藉由ATR(Attenuated Total Reflection,衰減全反射)法而獲得之紅外吸收光譜中之1380cm-1附近波峰強度除以1500cm-1附近波峰強度所獲得之該感光性樹脂層之醯亞胺化指數除以將該感光性樹脂組合物以350℃進行加熱、硬化所獲得之硬化膜之醯亞胺化指數所得之值即醯亞胺化率b為15%~50%,且於該聚醯亞胺硬化膜之聚醯亞胺中,相對於包含源自四羧酸與二胺之結構之重複單元之分子量,醯亞胺基所占之比率即醯亞胺基濃度a為12wt%~30wt%。 (D) Solvent: 100-300 parts by weight; the peak intensity of the infrared absorption spectrum of the photosensitive resin layer before exposure obtained by ATR (Attenuated Total Reflection) method at around 1380 cm -1 is divided by 1500 cm-1. The value obtained by dividing the imidization index of the photosensitive resin layer obtained by the peak intensity near -1 by the imidization index of the cured film obtained by heating and curing the photosensitive resin composition at 350°C, that is, the imidization rate b is 15%~50%, and in the polyimide of the polyimide cured film, the ratio of the imide group to the molecular weight of the repeating unit containing the structure derived from tetracarboxylic acid and diamine, that is, the imide group concentration a is 12wt%~30wt%.

[2]如上述[1]之感光性樹脂組合物,其中上述醯亞胺基濃度a與醯亞胺化率b滿足以下式(1):0.10≦a×(1-b)≦0.17 (1)。 [2] A photosensitive resin composition as described in [1] above, wherein the above-mentioned imide group concentration a and imidization rate b satisfy the following formula (1): 0.10≦a×(1-b)≦0.17 (1).

[3]如上述[1]或[2]之感光性樹脂組合物,其中於上述聚醯亞胺硬化膜之聚醯亞胺中,相對於包含源自四羧酸與二胺之結構之重複單元之分子量,醯亞胺基所占之比率即醯亞胺基濃度a為12wt%~24wt%。 [3] A photosensitive resin composition as described in [1] or [2] above, wherein in the polyimide of the polyimide cured film, the ratio of the imide group to the molecular weight of the repeating unit comprising a structure derived from tetracarboxylic acid and diamine, i.e., the imide group concentration a, is 12wt% to 24wt%.

[4]如上述[1]至[3]中任一項之感光性樹脂組合物,其於350℃下加熱、硬化而獲得之上述聚醯亞胺硬化膜之醯亞胺化指數為0.10~0.54。 [4] The photosensitive resin composition of any one of [1] to [3] above, wherein the polyimide cured film obtained by heating and curing at 350°C has an imidization index of 0.10 to 0.54.

[5]如上述[1]至[4]中任一項之感光性樹脂組合物,其中於將上述感光性樹脂組合物塗佈於石英玻璃上,並以110℃加熱3分鐘所得之感光性樹脂層之每1μm之365nm之吸光度為0.02~0.09。 [5] A photosensitive resin composition as described in any one of [1] to [4] above, wherein the absorbance of the photosensitive resin layer obtained by coating the photosensitive resin composition on quartz glass and heating it at 110°C for 3 minutes at 365nm is 0.02-0.09 per 1μm.

[6]如上述[1]至[5]中任一項之感光性樹脂組合物,其中上述通式(1) 中之Y1係由以下式所表示:

Figure 110134871-A0305-12-0005-6
[6] The photosensitive resin composition of any one of [1] to [5] above, wherein Y1 in the general formula (1) is represented by the following formula:
Figure 110134871-A0305-12-0005-6

{式中,Rz分別獨立地為可包含鹵素原子之碳數1~10之一價有機基,a為0~4之整數,A為氧原子或硫原子,並且B為下述式中之1種:

Figure 110134871-A0305-12-0005-48
}。 {wherein, Rz is independently a monovalent organic group having 1 to 10 carbon atoms which may contain a halogen atom, a is an integer of 0 to 4, A is an oxygen atom or a sulfur atom, and B is one of the following formulae:
Figure 110134871-A0305-12-0005-48
}.

[7]如上述[6]之感光性樹脂組合物,其中上述Y1係由以下式所表示:

Figure 110134871-A0305-12-0005-9
[7] The photosensitive resin composition of [6] above, wherein Y1 is represented by the following formula:
Figure 110134871-A0305-12-0005-9

Figure 110134871-A0305-12-0005-10
or
Figure 110134871-A0305-12-0005-10

Figure 110134871-A0305-12-0005-11
or
Figure 110134871-A0305-12-0005-11

[8]如上述[1]至[7]中任一項之感光性樹脂組合物,其中上述通式(1)中之X1係由以下式所表示:[化8]

Figure 110134871-A0305-12-0006-12
[8] The photosensitive resin composition of any one of [1] to [7] above, wherein X1 in the general formula (1) is represented by the following formula:
Figure 110134871-A0305-12-0006-12

{式中,Ry分別獨立地為可包含鹵素原子之碳數1~10之一價有機基,a為0~4之整數,C為氧原子或硫原子,並且D為以下式中之1種:

Figure 110134871-A0305-12-0006-50
}。 {wherein, Ry is independently a monovalent organic group having 1 to 10 carbon atoms which may contain a halogen atom, a is an integer of 0 to 4, C is an oxygen atom or a sulfur atom, and D is one of the following formulae:
Figure 110134871-A0305-12-0006-50
}.

[9]如上述[8]之感光性樹脂組合物,其中上述X1係由以下式所表示:

Figure 110134871-A0305-12-0006-14
[9] The photosensitive resin composition of [8], wherein X1 is represented by the following formula:
Figure 110134871-A0305-12-0006-14

Figure 110134871-A0305-12-0006-15
or
Figure 110134871-A0305-12-0006-15

[10]如上述[1]至[9]中任一項之感光性樹脂組合物,其中上述感光性樹脂組合物為負型,且含有(A)聚醯亞胺前驅物:50~85質量份、(B)感光劑:0.5~10質量份、及(D)溶劑:100~300質量份,且含有15質量%~50質量%之上述聚醯亞胺前驅物,且該聚醯亞胺前驅物係分子內具有以下通式(11)所表示之結構之上述通式(1)所表示之聚醯亞胺前驅物:

Figure 110134871-A0305-12-0006-51
[10] A photosensitive resin composition as described in any one of [1] to [9] above, wherein the photosensitive resin composition is a negative type and contains (A) 50-85 parts by weight of a polyimide precursor, (B) 0.5-10 parts by weight of a photosensitive agent, and (D) 100-300 parts by weight of a solvent, and contains 15% by weight to 50% by weight of the polyimide precursor, and the polyimide precursor is a polyimide precursor represented by the general formula (1) having a structure represented by the following general formula (11) in the molecule:
Figure 110134871-A0305-12-0006-51

{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,並且m為2~150之整數}。 {wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, and m is an integer of 2 to 150}.

[11]如上述[1]至[9]中任一項之感光性樹脂組合物,其中上述感光性樹脂組合物為負型,且含有(A)聚醯亞胺前驅物:50~85質量份、(B)感光劑:0.5~10質量份、及(D)溶劑:100~300質量份,且含有15質量%~50質量%之上述聚醯亞胺前驅物,且該聚醯亞胺前驅物係上述通式(1)所表示之聚醯亞胺前驅物與具有以下通式(11)所表示之結構之聚醯亞胺之摻合物:

Figure 110134871-A0305-12-0007-17
[11] A photosensitive resin composition as described in any one of [1] to [9] above, wherein the photosensitive resin composition is a negative type and contains (A) 50-85 parts by weight of a polyimide precursor, (B) 0.5-10 parts by weight of a photosensitive agent, and (D) 100-300 parts by weight of a solvent, and contains 15% by weight to 50% by weight of the polyimide precursor, and the polyimide precursor is a blend of the polyimide precursor represented by the general formula (1) and a polyimide having a structure represented by the following general formula (11):
Figure 110134871-A0305-12-0007-17

{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,並且m為2~150之整數}。 {wherein, X 1 is a tetravalent organic group having 6 to 40 carbon atoms, Y 1 is a divalent organic group having 6 to 40 carbon atoms, and m is an integer of 2 to 150}.

[12]如上述[1]至[11]中任一項之感光性樹脂組合物,其進而包含(C)選自有機鈦化合物或有機鋯化合物之至少一種有機化合物:0.01~5質量份。 [12] A photosensitive resin composition as described in any one of [1] to [11] above, further comprising (C) 0.01 to 5 parts by weight of at least one organic compound selected from an organic titanium compound or an organic zirconium compound.

[13]如上述[12]之感光性樹脂組合物,其中上述(C)有機化合物係有機鈦化合物。 [13] The photosensitive resin composition of [12] above, wherein the organic compound (C) is an organic titanium compound.

[14]如上述[12]或[13]之感光性樹脂組合物,其中上述有機鈦化合物係選自由四烷氧基鈦化合物、鈦螯合物化合物、醯化鈦化合物、及二茂鈦化合物所組成之群中之至少一種化合物。 [14] A photosensitive resin composition as described in [12] or [13] above, wherein the organic titanium compound is at least one compound selected from the group consisting of tetraalkoxy titanium compounds, titanium chelate compounds, titanium acylate compounds, and titanocene compounds.

[15]如上述[14]之感光性樹脂組合物,其中上述有機鈦化合物係具有2個以上之烷氧基之鈦螯合物或四烷氧基鈦。 [15] A photosensitive resin composition as described in [14] above, wherein the organic titanium compound is a titanium chelate or a titanium tetraalkoxide having two or more alkoxy groups.

[16]如上述[1]至[15]中任一項之感光性樹脂組合物,其用於形成再配線層用層間絕緣膜。 [16] A photosensitive resin composition as described in any one of [1] to [15] above, which is used to form an interlayer insulating film for a redistribution layer.

[17]如上述[1]至[16]中任一項之感光性樹脂組合物,其進而包含(E)單體:0.5~15質量份。 [17] A photosensitive resin composition as described in any one of [1] to [16] above, further comprising (E) monomer: 0.5 to 15 parts by weight.

[18]如上述[17]之感光性樹脂組合物,其中上述(E)單體含有選自由羥基及胺基所組成之群中之至少一種基。 [18] A photosensitive resin composition as described in [17] above, wherein the (E) monomer contains at least one group selected from the group consisting of a hydroxyl group and an amino group.

[19]一種如上述[1]至[18]中任一項之感光性樹脂組合物之製造方法,其包括以下步驟:將上述(A)聚醯亞胺前驅物、上述(B)感光劑、及上述(D)溶劑進行混合之步驟;及將所獲得之混合物於23℃~50℃下老化24小時~360小時,而將醯亞胺化率調整為15%~50%之步驟。 [19] A method for preparing a photosensitive resin composition as described in any one of [1] to [18] above, comprising the following steps: a step of mixing the above (A) polyimide precursor, the above (B) photosensitive agent, and the above (D) solvent; and a step of aging the obtained mixture at 23°C to 50°C for 24 hours to 360 hours to adjust the imidization rate to 15% to 50%.

[20]一種聚醯亞胺硬化膜之製造方法,其包括以下步驟(1)~(5):(1)將如上述[1]至[17]中任一項之感光性樹脂組合物塗佈於基板上,於該基板上形成感光性樹脂層之步驟;(2)對所獲得之感光性樹脂層進行加熱、乾燥之步驟;(3)對加熱、乾燥後之感光性樹脂層進行曝光之步驟;(4)對曝光後之感光性樹脂層進行顯影之步驟;及(5)對顯影後之感光性樹脂層進行加熱處理而形成聚醯亞胺硬化膜之步驟。 [20] A method for producing a polyimide cured film, comprising the following steps (1) to (5): (1) coating a photosensitive resin composition as described in any one of [1] to [17] on a substrate to form a photosensitive resin layer on the substrate; (2) heating and drying the obtained photosensitive resin layer; (3) exposing the heated and dried photosensitive resin layer; (4) developing the exposed photosensitive resin layer; and (5) heating the developed photosensitive resin layer to form a polyimide cured film.

[21]如上述[20]之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺硬化膜利用擾動方式分體圓柱共振器法以10GHz進行測定時之介電損耗正切為0.0021~0.007。 [21] A method for manufacturing a polyimide cured film as described in [20] above, wherein the dielectric loss tangent of the polyimide cured film measured at 10 GHz using a perturbation split cylindrical resonator method is 0.0021 to 0.007.

[22]如上述[20]或[21]之聚醯亞胺硬化膜之製造方法,其中上述聚醯 亞胺硬化膜利用擾動方式分體圓柱共振器法以28GHz進行測定時之介電損耗正切為0.0021~0.008。 [22] A method for manufacturing a polyimide cured film as described in [20] or [21] above, wherein the dielectric loss tangent of the polyimide cured film is 0.0021 to 0.008 when measured at 28 GHz using a perturbation split cylindrical resonator method.

[23]如上述[20]至[22]中任一項之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺硬化膜利用擾動方式分體圓柱共振器法以40GHz進行測定時之介電損耗正切為0.0021~0.008。 [23] A method for producing a polyimide cured film as described in any one of [20] to [22] above, wherein the dielectric loss tangent of the polyimide cured film measured at 40 GHz using a perturbation split cylindrical resonator method is 0.0021 to 0.008.

[24]如上述[20]至[23]中任一項之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺硬化膜利用擾動方式分體圓柱共振器法以60GHz進行測定時之介電損耗正切為0.0021~0.009。 [24] A method for producing a polyimide cured film as described in any one of [20] to [23] above, wherein the dielectric loss tangent of the polyimide cured film measured at 60 GHz using a perturbation split cylindrical resonator method is 0.0021 to 0.009.

[25]一種聚醯亞胺硬化膜之製造方法,其係使用如下感光性樹脂組合物之聚醯亞胺硬化膜之製造方法,上述感光性樹脂組合物包含: [25] A method for producing a polyimide cured film, which is a method for producing a polyimide cured film using the following photosensitive resin composition, wherein the photosensitive resin composition comprises:

(A)以下通式(1)所表示之聚醯亞胺前驅物:100質量份;

Figure 110134871-A0305-12-0009-18
(A) 100 parts by weight of a polyimide precursor represented by the following general formula (1);
Figure 110134871-A0305-12-0009-18

{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,n1為2~150之整數,R1與R2分別獨立地為氫原子或碳數1~40之一價有機基;其中,R1與R2中之至少一個為以下通式(2)所表示之基:

Figure 110134871-A0305-12-0009-19
{wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, n1 is an integer of 2 to 150, R1 and R2 are independently a hydrogen atom or a monovalent organic group having 1 to 40 carbon atoms; wherein at least one of R1 and R2 is a group represented by the following general formula (2):
Figure 110134871-A0305-12-0009-19

(式中,R3、R4及R5分別獨立地為氫原子或碳數1~3之一價有機基,並且m1為2~10之整數)} (wherein, R 3 , R 4 and R 5 are independently a hydrogen atom or a monovalent organic group having 1 to 3 carbon atoms, and m1 is an integer of 2 to 10)}

(B)感光劑:0.5~10質量份;及 (B) Photosensitizer: 0.5~10 parts by mass; and

(D)溶劑:100~300質量份;上述製造方法包括以下步驟(1)~(5):(1)將上述感光性樹脂組合物塗佈於基板上,而於該基板上形成感光性樹脂層之步驟;(2)對所獲得之感光性樹脂層進行加熱、乾燥並脫溶劑之步驟;(3)對經脫溶劑之感光性樹脂層進行曝光之步驟;(4)對曝光後之感光性樹脂層進行顯影之步驟;及(5)對顯影後之感光性樹脂層進行加熱處理而形成聚醯亞胺硬化膜之步驟;該步驟(2)中之加熱、乾燥後進行脫溶劑所獲得之曝光前之感光性樹脂層之醯亞胺化率為15~50%。 (D) solvent: 100-300 parts by weight; the above-mentioned manufacturing method comprises the following steps (1)-(5): (1) coating the above-mentioned photosensitive resin composition on a substrate to form a photosensitive resin layer on the substrate; (2) heating and drying the obtained photosensitive resin layer to remove the solvent; (3) treating the photosensitive resin layer after the solvent is removed. (4) developing the exposed photosensitive resin layer; and (5) heating the developed photosensitive resin layer to form a polyimide cured film. The imidization rate of the photosensitive resin layer before exposure obtained by heating and drying and then removing the solvent in step (2) is 15-50%.

只要使用本發明之感光性樹脂組合物,便可於維持厚膜之凹凸圖案之解像度之情況下製造出介電損耗正切優異之硬化樹脂膜。於一實施方式中,藉由將由感光性樹脂組合物獲得之感光性樹脂層之醯亞胺化率提高至特定範圍內,源自聚醯亞胺前驅物之側鏈之極性化合物於加熱步驟中容易被去除,可降低所獲得之硬化膜之介電損耗正切、減小頻率依存性,又,藉由將由感光性樹脂組合物獲得之感光性樹脂層之吸光度調整為特定範圍內,可維持厚膜之凹凸圖案之解像度。 By using the photosensitive resin composition of the present invention, a cured resin film with excellent dielectric loss tangent can be produced while maintaining the resolution of the concave-convex pattern of the thick film. In one embodiment, by increasing the imidization rate of the photosensitive resin layer obtained from the photosensitive resin composition to a specific range, the polar compound derived from the side chain of the polyimide precursor is easily removed during the heating step, which can reduce the dielectric loss tangent of the obtained cured film and reduce the frequency dependence. In addition, by adjusting the absorbance of the photosensitive resin layer obtained from the photosensitive resin composition to a specific range, the resolution of the concave-convex pattern of the thick film can be maintained.

以下,對用以實施本發明之方式(以下,簡記為「實施方式」)詳細地 進行說明。再者,本發明並不限定於以下實施方式,可於其主旨之範圍內進行各種變化後實施。通過本說明書,通式中由相同符號表示之結構於在分子中存在複數個之情形時,只要未另行規定,則分別獨立地選擇,可相互相同,亦可不同。又,在不同通式中由共用之符號表示之結構亦只要未另行規定,則分別獨立地選擇,可相互相同,亦可不同。 The following is a detailed description of the method for implementing the present invention (hereinafter referred to as "implementation method"). Furthermore, the present invention is not limited to the following implementation method, and can be implemented after various changes within the scope of its main purpose. In this specification, when there are multiple structures represented by the same symbol in the general formula in the molecule, unless otherwise specified, they are independently selected and can be the same or different. In addition, structures represented by common symbols in different general formulas are also independently selected and can be the same or different unless otherwise specified.

[感光性樹脂組合物] [Photosensitive resin composition]

本實施方式之感光性樹脂組合物包含(A)聚醯亞胺前驅物、(B)感光劑(光聚合起始劑)、及(D)溶劑,視需要進而包含(C)有機化合物、例如鈦或鋯化合物、(E)單體、其他成分。 The photosensitive resin composition of this embodiment includes (A) a polyimide precursor, (B) a photosensitive agent (photopolymerization initiator), and (D) a solvent, and optionally further includes (C) an organic compound, such as a titanium or zirconium compound, (E) a monomer, and other components.

以下,依序對各成分進行說明。 Below, each component is explained in order.

就下述A)聚醯亞胺前驅物之物性之觀點而言,感光性樹脂組合物較佳為負型。 From the perspective of the physical properties of the polyimide precursor described below (A), the photosensitive resin composition is preferably negative.

可較佳地用作本發明中之感光性樹脂組合物者係365nm(i射線)之吸光度於每1μm中為0.02~0.09者。 The photosensitive resin composition that can be preferably used in the present invention is one whose absorbance at 365nm (i-ray) is 0.02~0.09 per 1μm.

厚1μm之膜之i射線吸光度可對將感光性聚醯亞胺前驅物單獨形成於石英玻璃上而成之塗膜進行預烘烤後,藉由通常之分光光度計進行測定。於所形成之膜之厚度並非為1μm之情形時,依據朗伯-比爾定律將針對該膜而獲得之吸光度換算成厚1μm,藉此可求出厚1μm之i射線吸光度。 The i-ray absorbance of a film with a thickness of 1μm can be measured by pre-baking a coating formed by forming a photosensitive polyimide precursor alone on quartz glass, and then using a conventional spectrophotometer. When the thickness of the formed film is not 1μm, the absorbance obtained for the film is converted to a thickness of 1μm according to the Lambert-Beer law, and the i-ray absorbance of a film with a thickness of 1μm can be obtained.

i射線吸光度更佳為0.04以上,就抑制反射光之觀點而言,進而較佳為0.05以上。所謂反射光,係不會於膜中被吸收而行進至膜底部,並於基板反射之光,會導致圖案不良。若i射線吸光度為0.09以下,則光到達至 感光性樹脂層之底部,可確保可溶部與不溶部之溶解度之差。 The i-ray absorbance is preferably 0.04 or more, and from the perspective of suppressing reflected light, it is more preferably 0.05 or more. The so-called reflected light is light that is not absorbed in the film and travels to the bottom of the film and is reflected by the substrate, which will cause poor patterning. If the i-ray absorbance is 0.09 or less, the light reaches the bottom of the photosensitive resin layer, which can ensure the difference in solubility between the soluble part and the insoluble part.

[(A)聚醯亞胺前驅物] [(A) Polyimide precursor]

於本實施方式中,(A)聚醯亞胺前驅物係包含於感光性樹脂組合物中之樹脂成分,且係具有以下通式(1)所表示之結構單元之聚醯胺:

Figure 110134871-A0305-12-0012-20
In the present embodiment, (A) the polyimide precursor is a resin component contained in the photosensitive resin composition and is a polyimide having a structural unit represented by the following general formula (1):
Figure 110134871-A0305-12-0012-20

{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,n1為2~150之整數,R1與R2分別獨立地為氫原子或碳數1~40之一價有機基;其中,R1與R2中之至少一個為以下通式(2)所表示之基:

Figure 110134871-A0305-12-0012-21
{wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, n1 is an integer of 2 to 150, R1 and R2 are independently a hydrogen atom or a monovalent organic group having 1 to 40 carbon atoms; wherein at least one of R1 and R2 is a group represented by the following general formula (2):
Figure 110134871-A0305-12-0012-21

(式中,R3、R4及R5分別獨立地為氫原子或碳數1~3之一價有機基,並且m1為2~10之整數)}。再者,通式(1)中之R1及R2亦稱為聚醯亞胺前驅物之側鏈或側鏈結構。 (wherein, R 3 , R 4 and R 5 are independently hydrogen atoms or monovalent organic groups having 1 to 3 carbon atoms, and m1 is an integer of 2 to 10)}. Furthermore, R 1 and R 2 in the general formula (1) are also referred to as the side chain or side chain structure of the polyimide precursor.

就感光性樹脂組合物之感光特性及機械特性之觀點而言,上述通式(1)中之n1較佳為3~100之整數,更佳為5~70之整數。 From the perspective of the photosensitivity and mechanical properties of the photosensitive resin composition, n1 in the above general formula (1) is preferably an integer of 3 to 100, and more preferably an integer of 5 to 70.

上述通式(1)中,就兼顧耐熱性與感光特性之方面而言,X1所表示之 四價有機基較佳為碳數6~40之有機基,更佳為-COOR1基及-COOR2基與-CONH-基相互位於鄰位之芳香族基或脂環式脂肪族基。作為X1所表示之四價有機基,具體而言,可例舉含有芳香族環之碳原子數6~40之有機基,例如具有下述通式(20)所表示之結構之基:

Figure 110134871-A0305-12-0013-22
In the above general formula (1), in terms of both heat resistance and photosensitivity, the tetravalent organic group represented by X1 is preferably an organic group having 6 to 40 carbon atoms, and more preferably an aromatic group or alicyclic aliphatic group in which -COOR1 and -COOR2 are adjacent to -CONH-. As the tetravalent organic group represented by X1 , specifically, an organic group having 6 to 40 carbon atoms containing an aromatic ring, for example, a group having a structure represented by the following general formula (20):
Figure 110134871-A0305-12-0013-22

[化19]

Figure 110134871-A0305-12-0014-23
[Chemistry 19]
Figure 110134871-A0305-12-0014-23

{式(20)中,R6係選自由氫原子、氟原子、C1~C10之烴基、及C1~C10之含氟烴基所組成之群中之一價基,1為0~2之整數,m為0~3之整數,並且n為0~4之整數},但並不限定於該等。又,X1之結構可為1種,亦可為2種以上之組合。就兼顧耐熱性與感光特性之方面而言,尤佳為具有上述式(20)所表示之結構之X1基。 {In formula (20), R6 is a monovalent group selected from the group consisting of a hydrogen atom, a fluorine atom, a C1-C10 alkyl group, and a C1-C10 fluorine-containing alkyl group, 1 is an integer of 0-2, m is an integer of 0-3, and n is an integer of 0-4}, but is not limited thereto. In addition, the structure of X1 may be one type or a combination of two or more types. In terms of both heat resistance and photosensitivity, the X1 group having the structure represented by the above formula (20) is particularly preferred.

上述通式(1)中,就兼顧耐熱性與感光特性之方面而言,Y1所表示之二價有機基較佳為碳數6~40之芳香族基,例如可例舉下述通式(21)所表示之結構:[化20]

Figure 110134871-A0305-12-0015-24
In the above general formula (1), in terms of both heat resistance and photosensitivity, the divalent organic group represented by Y1 is preferably an aromatic group having 6 to 40 carbon atoms, for example, the structure represented by the following general formula (21):
Figure 110134871-A0305-12-0015-24

Figure 110134871-A0305-12-0015-25
Figure 110134871-A0305-12-0015-25

{式(21)中,R6係選自由氫原子、氟原子、C1~C10之烴基、及C1~ C10之含氟烴基所組成之群中之一價基,m為0~3之整數,並且n為0~4之整數},但並不限定於該等。又,Y1之結構可為1種,亦可為2種以上之組合。就兼顧耐熱性及感光特性之方面而言,尤佳為具有上述式(21)所表示之結構之Y1基。 {In formula (21), R6 is a monovalent group selected from the group consisting of a hydrogen atom, a fluorine atom, a C1-C10 alkyl group, and a C1-C10 fluorine-containing alkyl group, m is an integer of 0-3, and n is an integer of 0-4}, but is not limited thereto. In addition, the structure of Y1 may be one type or a combination of two or more types. In terms of both heat resistance and photosensitivity, a Y1 group having a structure represented by the above formula (21) is particularly preferred.

作為Y1基,就低介電損耗正切、低介電常數、微影性之觀點而言,上述式(21)所表示之結構之中,尤佳為下述式所表示之結構:

Figure 110134871-A0305-12-0016-26
As the Y1 group, from the viewpoint of low dielectric loss tangent, low dielectric constant, and lithographic properties, among the structures represented by the above formula (21), the structure represented by the following formula is particularly preferred:
Figure 110134871-A0305-12-0016-26

Figure 110134871-A0305-12-0016-27
Figure 110134871-A0305-12-0016-27

{式中,R6係選自由氫原子、氟原子、C1~C10之烴基、及C1~C10之含氟烴基所組成之群中之一價基,m為0~3之整數,並且n為0~4之整數}。 {In the formula, R6 is a univalent group selected from the group consisting of a hydrogen atom, a fluorine atom, a C1-C10 alkyl group, and a C1-C10 fluorine-containing alkyl group, m is an integer of 0-3, and n is an integer of 0-4}.

上述通式(2)中之R3較佳為氫原子或甲基,就感光特性之觀點而言,R4及R5較佳為氫原子。又,就感光特性之觀點而言,m1為2以上且10以下之整數,較佳為2以上且4以下之整數。 In the general formula (2), R3 is preferably a hydrogen atom or a methyl group. From the viewpoint of photosensitivity, R4 and R5 are preferably hydrogen atoms. From the viewpoint of photosensitivity, m1 is an integer of 2 to 10, preferably an integer of 2 to 4.

本說明書中,用語「醯亞胺基濃度」係指於對本實施方式之感光性樹脂組合物進行加熱、硬化而獲得之聚醯亞胺硬化膜之聚醯亞胺中,相對於包含源自四羧酸與二胺之結構之重複單元之分子量,醯亞胺基所占之質量之比率。 In this specification, the term "imide group concentration" refers to the ratio of the mass of imide groups in the polyimide of the polyimide cured film obtained by heating and curing the photosensitive resin composition of the present embodiment, relative to the molecular weight of the repeating units containing the structure derived from tetracarboxylic acid and diamine.

再者,本說明書中,用語「聚醯亞胺前驅物」包含一部分正在醯亞胺化之聚醯亞胺前驅物。 Furthermore, in this specification, the term "polyimide precursor" includes a portion of the polyimide precursor that is undergoing imidization.

於本實施方式中,所獲得之聚醯亞胺硬化膜之醯亞胺基濃度為12wt%~30wt%,較佳為12wt%~24wt%。若醯亞胺基濃度為12wt%以上,則有塑模樹脂與硬化凹凸圖案之密接性變得良好之傾向。醯亞胺基濃度較佳為12.5wt%以上,更佳為13.5wt%以上。另一方面,藉由使醯亞胺基濃度為30wt%以下,有所獲得之聚醯亞胺硬化膜之介電損耗正切變得良好之傾向。醯亞胺基濃度更佳為23.0wt%以下,進而較佳為21.0wt%以下。 In this embodiment, the obtained polyimide cured film has an amide group concentration of 12wt% to 30wt%, preferably 12wt% to 24wt%. If the amide group concentration is 12wt% or more, the adhesion between the molding resin and the cured concave-convex pattern tends to be good. The amide group concentration is preferably 12.5wt% or more, and more preferably 13.5wt% or more. On the other hand, by making the amide group concentration below 30wt%, the dielectric loss tangent of the obtained polyimide cured film tends to be good. The amide group concentration is more preferably 23.0wt% or less, and further preferably 21.0wt% or less.

聚醯亞胺之各重複單元中之醯亞胺基濃度係使用聚醯亞胺前驅物之調整時所使用之四羧酸與二胺之分子量,並由下述式(I)所表示:70.02×2/[Mw(A)+Mw(B)]×100 (I) The imide group concentration in each repeating unit of polyimide is the molecular weight of the tetracarboxylic acid and diamine used in the adjustment of the polyimide precursor, and is represented by the following formula (I): 70.02×2/[Mw(A)+Mw(B)]×100 (I)

{式(I)中,Mw(A)表示四羧酸之分子量,並且Mw(B)表示二胺之分子量}。再者,於使用2種以上之四羧酸及/或二胺類之情形時,例如於使用2種四羧酸及/或二胺類進行調整時,係由下述式(II)所表示:70.02×2/[Mw(A1)×a1+Mw(A2)×a2+Mw(B1)×b1+Mw(B2)×b2]×100 (II) {In formula (I), Mw(A) represents the molecular weight of the tetracarboxylic acid, and Mw(B) represents the molecular weight of the diamine}. Furthermore, when two or more tetracarboxylic acids and/or diamines are used, for example, when two tetracarboxylic acids and/or diamines are used for adjustment, it is represented by the following formula (II): 70.02×2/[Mw(A1)×a 1 +Mw(A2)×a 2 +Mw(B1)×b 1 +Mw(B2)×b 2 ]×100 (II)

{式(II)中,Mw(A1)表示第一四羧酸之分子量,Mw(A2)表示第二四 羧酸之分子量,a1表示第一四羧酸之含量,a2表示第二四羧酸之含量,Mw(B1)表示第一二胺之分子量,Mw(B2)表示第二二胺之分子量,b1表示第一二胺之含量,並且b2表示第二二胺之含量;其中,a1、a2、b1、b2分別滿足a1+a2=1、b1+b2=1}。 {In formula (II), Mw(A1) represents the molecular weight of the first tetracarboxylic acid, Mw(A2) represents the molecular weight of the second tetracarboxylic acid, a1 represents the content of the first tetracarboxylic acid, a2 represents the content of the second tetracarboxylic acid, Mw(B1) represents the molecular weight of the first diamine, Mw(B2) represents the molecular weight of the second diamine, b1 represents the content of the first diamine, and b2 represents the content of the second diamine; wherein a1 , a2 , b1 , and b2 satisfy a1 + a2 =1 and b1 + b2 =1, respectively}.

於使用3種以上之四羧酸及/或二胺類之情形時,以相同方式求出。於將四羧酸二酐用作原料之情形時,換算成四羧酸後進行計算。 When three or more tetracarboxylic acids and/or diamines are used, the same method is used for calculation. When tetracarboxylic dianhydride is used as a raw material, it is calculated after conversion to tetracarboxylic acid.

藉由ATR法對由感光性樹脂組合物獲得之硬化膜進行測定時之1380cm-1與1500cm-1之波峰強度比(硬化膜之醯亞胺化指數)表示硬化膜中所存在之醯亞胺基(1380cm-1)相對於芳香環(1500cm-1)之比率。於本實施方式中,通式(1)中之X1與Y1較佳為選自硬化膜之醯亞胺化指數為0.10~0.54之結構,就低介電損耗正切化之觀點而言,較佳為0.10~0.53,就微影性之觀點而言,更佳為0.35~0.53。 The peak intensity ratio of 1380 cm -1 to 1500 cm -1 (imidization index of the cured film) measured by the ATR method for the cured film obtained from the photosensitive resin composition represents the ratio of the imide group (1380 cm -1 ) to the aromatic ring (1500 cm -1 ) in the cured film. In the present embodiment, X 1 and Y 1 in the general formula (1) are preferably selected from structures having an imidization index of 0.10 to 0.54 for the cured film, preferably 0.10 to 0.53 from the viewpoint of low dielectric loss tangent, and more preferably 0.35 to 0.53 from the viewpoint of lithographic properties.

(A)聚醯亞胺前驅物之製備方法 (A) Preparation method of polyimide precursor

本實施方式中之包含上述通式(1)所表示之結構之聚醯亞胺前驅物例如係藉由包含如下之方法而獲得:使上述包含碳數6~40之四價有機基X1之四羧酸二酐與(a)具有上述通式(2)所表示之一價有機基與羥基鍵結之結構之醇類、及視需要之(b)具有上述通式(2)所表示之基以外之結構之醇類反應,製備局部經酯化之四羧酸(以下,亦稱為酸/酯體);繼而,使所獲得之酸/酯體與上述包含碳數6~40之二價有機基Y1之二胺類縮聚。 The polyimide precursor having a structure represented by the general formula (1) in the present embodiment is obtained, for example, by a method comprising: reacting the tetracarboxylic dianhydride having a tetravalent organic group X1 having 6 to 40 carbon atoms with (a) an alcohol having a structure in which a monovalent organic group represented by the general formula (2) is bonded to a hydroxyl group, and optionally (b) an alcohol having a structure other than the group represented by the general formula (2) to prepare a partially esterified tetracarboxylic acid (hereinafter also referred to as an acid/ester); and then condensing the obtained acid/ester with the diamine having a divalent organic group Y1 having 6 to 40 carbon atoms.

(酸/酯體之製備) (Preparation of acid/ester)

於本實施方式中,作為包含碳數6~40之四價有機基X1之四羧酸二酐,例如可例舉:均苯四甲酸二酐、二苯醚-3,3',4,4'-四羧酸二酐、二苯甲酮-3,3',4,4'-四羧酸二酐、聯苯-3,3',4,4'-四羧酸二酐、二苯基碸-3,3',4,4'-四羧酸二酐、二苯甲烷-3,3',4,4'-四羧酸二酐、2,2-雙(3,4-鄰苯二甲酸酐)丙烷、2,2-雙(3,4-鄰苯二甲酸酐)-1,1,1,3,3,3-六氟丙烷、4,4'-(4,4'-亞異丙基二苯氧基)酸二酐等。又,該等可單獨使用1種或將2種以上混合後使用。 In the present embodiment, the tetracarboxylic dianhydride containing a tetravalent organic group X1 having 6 to 40 carbon atoms may be, for example, pyromellitic dianhydride, diphenyl ether-3,3',4,4'-tetracarboxylic dianhydride, benzophenone-3,3',4,4'-tetracarboxylic dianhydride, biphenyl-3,3',4,4'-tetracarboxylic dianhydride, diphenylsulfone-3,3',4,4'-tetracarboxylic dianhydride, diphenylmethane-3,3',4,4'-tetracarboxylic dianhydride, 2,2-bis(3,4-phthalic anhydride)propane, 2,2-bis(3,4-phthalic anhydride)-1,1,1,3,3,3-hexafluoropropane, 4,4'-(4,4'-isopropylidene diphenoxy) acid dianhydride, and the like. These may be used alone or in combination of two or more.

作為(b)具有上述通式(2)所表示之基以外之結構之醇類,例如可例舉碳數5~30之脂肪族或碳數6~30之芳香族醇類,例如1-戊醇、2-戊醇、3-戊醇、新戊醇、1-庚醇、2-庚醇、3-庚醇、1-辛醇、2-辛醇、3-辛醇、1-壬醇、三乙二醇單甲醚、三乙二醇單乙醚、四乙二醇單甲醚、四乙二醇單乙醚、苄醇等。 As (b) alcohols having a structure other than the group represented by the above general formula (2), for example, aliphatic alcohols having 5 to 30 carbon atoms or aromatic alcohols having 6 to 30 carbon atoms, such as 1-pentanol, 2-pentanol, 3-pentanol, neopentyl alcohol, 1-heptanol, 2-heptanol, 3-heptanol, 1-octanol, 2-octanol, 3-octanol, 1-nonanol, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether, tetraethylene glycol monomethyl ether, tetraethylene glycol monoethyl ether, benzyl alcohol, etc.

聚醯亞胺前驅物中之通式(2)之有機基之含量相對於通式(1)中R1及R2之總含量,較佳為50莫耳%以上。若通式(2)之有機基之含量超過50莫耳%,則可獲得所需感光特性,因此較佳。 The content of the organic group of the general formula (2) in the polyimide precursor is preferably 50 mol% or more relative to the total content of R1 and R2 in the general formula (1). If the content of the organic group of the general formula (2) exceeds 50 mol%, the desired photosensitivity can be obtained, which is preferred.

感光性樹脂組合物中之通式(2)之有機基之含量相對於通式(1)中R1及R2之總含量,較佳為75莫耳%以上。 The content of the organic group of the general formula (2) in the photosensitive resin composition is preferably 75 mol% or more relative to the total content of R1 and R2 in the general formula (1).

使上述四羧酸二酐與上述(a)之醇類於吡啶等鹼性觸媒之存在下於反應溶劑中溶解及混合,藉此進行酸二酐之半酯化反應,可獲得所需酸/酯體。反應條件較佳為於反應溫度20~50℃下攪拌4~10小時。 The above-mentioned tetracarboxylic dianhydride and the alcohols (a) are dissolved and mixed in a reaction solvent in the presence of an alkaline catalyst such as pyridine, thereby carrying out a half-esterification reaction of the dianhydride to obtain the desired acid/ester. The preferred reaction conditions are stirring at a reaction temperature of 20~50℃ for 4~10 hours.

作為上述反應溶劑,較佳為使該酸/酯體、及作為該酸/酯體與二胺類之縮聚產物之聚醯亞胺前驅物溶解者。反應溶劑例如可例舉:N-甲基-2-吡咯啶酮、N,N-二甲基乙醯胺、N,N-二甲基甲醯胺、二甲基亞碸、四甲基脲、γ-丁內酯、酮類、酯類、內酯類、醚類、鹵化烴類、烴類、丙酮、甲基乙基酮、甲基異丁基酮、環己酮、乙酸甲酯、乙酸乙酯、乙酸丁酯、草酸二乙酯、乙二醇二甲醚、二乙二醇二甲醚、四氫呋喃、二氯甲烷、1,2-二氯乙烷、1,4-二氯丁烷、氯苯、鄰二氯苯、己烷、庚烷、苯、甲苯、二甲苯等。該等可視需要單獨使用,亦可將2種以上混合使用。 The reaction solvent is preferably one that dissolves the acid/ester and a polyimide precursor that is a condensation product of the acid/ester and a diamine. Examples of the reaction solvent include: N-methyl-2-pyrrolidone, N,N-dimethylacetamide, N,N-dimethylformamide, dimethyl sulfoxide, tetramethylurea, γ-butyrolactone, ketones, esters, lactones, ethers, halogenated hydrocarbons, hydrocarbons, acetone, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone, methyl acetate, ethyl acetate, butyl acetate, diethyl oxalate, ethylene glycol dimethyl ether, diethylene glycol dimethyl ether, tetrahydrofuran, dichloromethane, 1,2-dichloroethane, 1,4-dichlorobutane, chlorobenzene, o-dichlorobenzene, hexane, heptane, benzene, toluene, xylene, etc. These can be used alone or in combination of two or more as needed.

(聚醯亞胺前驅物之製備) (Preparation of polyimide precursor)

於上述酸/酯體(典型而言為上述反應溶劑中之溶液)中,於冰冷下混合已知之脫水縮合劑而將酸/酯體製成多酸酐後,向其中滴加投入使包含碳數6~40之二價有機基Y1之二胺類另外溶解或分散於溶劑中而成者並進行縮聚,藉此可獲得聚醯亞胺前驅物。作為脫水縮合劑,例如可例舉:二環己基碳二醯亞胺、1-乙氧基羰基-2-乙氧基-1,2-二氫喹啉、1,1-羰基二氧基-二-1,2,3-苯并三唑、N,N'-二丁二醯亞胺碳酸酯等。 A known dehydration condensation agent is mixed with the above acid/ester body (typically a solution in the above reaction solvent) under ice cooling to convert the acid/ester body into a polyanhydride, and then a diamine containing a divalent organic group Y1 having 6 to 40 carbon atoms dissolved or dispersed in the solvent is added dropwise thereto for condensation to obtain a polyimide precursor. Examples of the dehydration condensation agent include dicyclohexylcarbodiimide, 1-ethoxycarbonyl-2-ethoxy-1,2-dihydroquinoline, 1,1-carbonyldioxy-di-1,2,3-benzotriazole, and N,N'-disuccinimidyl carbonate.

作為包含碳數6~40之二價有機基Y1之二胺類,例如亦可例舉:對苯二胺、間苯二胺、4,4-二胺基二苯醚、3,4'-二胺基二苯醚、3,3'-二胺基二苯醚、4,4'-二胺基二苯硫醚、3,4'-二胺基二苯硫醚、3,3'-二胺基二苯硫醚、4,4'-二胺基二苯基碸、3,4'-二胺基二苯基碸、3,3'-二胺基二苯基碸、4,4'-二胺基聯苯、3,4'-二胺基聯苯、3,3'-二胺基聯苯、4,4'-二胺基二苯甲 酮、3,4'-二胺基二苯甲酮、3,3'-二胺基二苯甲酮、4,4'-二胺基二苯甲烷、3,4'-二胺基二苯甲烷、3,3'-二胺基二苯甲烷、1,4-雙(4-胺基苯氧基)苯、1,3-雙(4-胺基苯氧基)苯、1,3-雙(3-胺基苯氧基)苯、雙[4-(4-胺基苯氧基)苯基]碸、雙[4-(3-胺基苯氧基)苯基]碸、4,4-雙(4-胺基苯氧基)聯苯、4,4-雙(3-胺基苯氧基)聯苯、雙[4-(4-胺基苯氧基)苯基]醚、雙[4-(3-胺基苯氧基)苯基]醚、1,4-雙(4-胺基苯基)苯、1,3-雙(4-胺基苯基)苯、9,10-雙(4-胺基苯基)蒽、2,2-雙(4-胺基苯基)丙烷、2,2-雙(4-胺基苯基)六氟丙烷、2,2-雙[4-(4-胺基苯氧基)苯基]丙烷、2,2-雙[4-(4-胺基苯氧基)苯基]六氟丙烷、1,4-雙(3-胺基丙基二甲基矽烷基)苯、鄰-聯甲苯胺碸、9,9-雙(4-胺基苯基)茀、2,2-雙{3-甲基-4-(4-胺基苯氧基)苯基}丙烷、雙{4-(4-胺基苯氧基)苯基}酮、及該等之苯環上之氫原子之一部分被取代為甲基、乙基、羥甲基、羥乙基、鹵素等者、例如3,3'-二甲基-4,4'-二胺基聯苯、2,2'-二甲基-4,4'-二胺基聯苯、3,3'-二甲基-4,4'-二胺基二苯甲烷、2,2'-二甲基-4,4'-二胺基二苯甲烷、3,3'-二甲氧基-4,4'-二胺基聯苯、3,3'-二氯-4,4'-二胺基聯苯、及該等之混合物等。然而,二胺類並不限定於該等。 Examples of the diamines containing a divalent organic group Y1 having 6 to 40 carbon atoms include p-phenylenediamine, m-phenylenediamine, 4,4-diaminodiphenyl ether, 3,4'-diaminodiphenyl ether, 3,3'-diaminodiphenyl ether, 4,4'-diaminodiphenyl sulfide, 3,4'-diaminodiphenyl sulfide, 3,3'-diaminodiphenyl sulfide, 4,4'-diaminodiphenyl sulfide, 3,4'-diaminodiphenyl sulfide, 3,3'-diaminodiphenyl sulfide, 4,4'-diaminodiphenyl sulfone, 3,4'-diaminodiphenyl sulfone, 3,3'-diaminodiphenyl sulfone, 4,4'-diaminobiphenyl, 3,4'-diaminobiphenyl, 3,3'-diaminobiphenyl, 4,4'-diaminobenzophenone, 3,4'-diaminobenzophenone, 3,3 '-Diaminobenzophenone, 4,4'-diaminodiphenylmethane, 3,4'-diaminodiphenylmethane, 3,3'-diaminodiphenylmethane, 1,4-bis(4-aminophenoxy)benzene, 1,3-bis(4-aminophenoxy)benzene, 1,3-bis(3-aminophenoxy)benzene, bis[4-(4-aminophenoxy)phenyl]sulfone, bis[4-(3-aminophenoxy)phenyl]sulfone, 4,4-bis(4-aminophenoxy)biphenyl, 4,4-bis(3-aminophenoxy)biphenyl, bis[4-(4-aminophenoxy)phenyl]ether, bis[4-(3-aminophenoxy) phenyl] ether, 1,4-bis(4-aminophenyl)benzene, 1,3-bis(4-aminophenyl)benzene, 9,10-bis(4-aminophenyl)anthracene, 2,2-bis(4-aminophenyl)propane, 2,2-bis(4-aminophenyl)hexafluoropropane, 2,2-bis[4-(4-aminophenoxy)phenyl]propane, 2,2-bis[4-(4-aminophenoxy)phenyl]hexafluoropropane, 1,4-bis(3-aminopropyldimethylsilyl)benzene, o-toluidine, 9,9-bis(4-aminophenyl)fluorene, 2,2-bis{3-methyl-4-(4-aminophenoxy)phenyl] )phenyl}propane, bis{4-(4-aminophenoxy)phenyl}ketone, and those in which a part of the hydrogen atoms on the benzene ring is substituted with methyl, ethyl, hydroxymethyl, hydroxyethyl, halogen, etc., such as 3,3'-dimethyl-4,4'-diaminobiphenyl, 2,2'-dimethyl-4,4'-diaminobiphenyl, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 2,2'-dimethyl-4,4'-diaminodiphenylmethane, 3,3'-dimethoxy-4,4'-diaminobiphenyl, 3,3'-dichloro-4,4'-diaminobiphenyl, and mixtures thereof. However, the diamines are not limited to these.

為了提高藉由將本實施方式之感光性樹脂組合物塗佈於基板上而形成於基板上之感光性樹脂層與各種基板之密接性,於(A)聚醯亞胺前驅物之製備時,亦可使1,3-雙(3-胺基丙基)四甲基二矽氧烷、1,3-雙(3-胺基丙基)四苯基二矽氧烷等二胺基矽氧烷類共聚。 In order to improve the adhesion between the photosensitive resin layer formed on the substrate by coating the photosensitive resin composition of the present embodiment on the substrate and various substrates, diaminosiloxanes such as 1,3-bis(3-aminopropyl)tetramethyldisiloxane and 1,3-bis(3-aminopropyl)tetraphenyldisiloxane may be copolymerized during the preparation of (A) the polyimide precursor.

上述縮聚反應結束後,亦可視需要對該反應液中所共存之脫水縮合劑之吸水副產物進行過濾分離,然後將水、脂肪族低級醇或其混合液等不 良溶劑投入反應液中而使聚合物成分析出。進而,亦可藉由反覆進行上述再溶解及再沈澱析出操作等而對聚合物進行精製。接下來,可對聚合物進行真空乾燥而將聚醯亞胺前驅物單離。為了提高精製度,亦可使該聚合物之溶液通過利用適當之有機溶劑使陰離子及/或陽離子交換樹脂膨潤後填充之管柱而將離子性雜質去除。 After the polycondensation reaction is completed, the water-absorbing byproducts of the dehydration condensation agent coexisting in the reaction solution can be filtered and separated as needed, and then a poor solvent such as water, aliphatic lower alcohol or a mixture thereof can be added to the reaction solution to precipitate the polymer components. Furthermore, the polymer can be purified by repeatedly performing the above-mentioned re-dissolution and re-precipitation operations. Next, the polymer can be vacuum dried to isolate the polyimide precursor. In order to improve the degree of purification, the polymer solution can also be passed through a column filled with an anion and/or cation exchange resin swollen with a suitable organic solvent to remove ionic impurities.

於(A)聚醯亞胺前驅物之分子量係以藉由凝膠滲透層析法(GPC)所得之聚苯乙烯換算重量平均分子量測得之情形時,較佳為8,000~150,000,更佳為9,000~50,000,尤佳為18,000~40,000。若重量平均分子量為8,000以上,則機械物性良好,故而較佳,另一方面,若為150,000以下,則對顯影液之分散性及凹凸圖案之解像性能良好,故而較佳。作為凝膠滲透層析法之展開溶劑,推薦四氫呋喃、N-甲基-2-吡咯啶酮。又,分子量係根據使用標準單分散聚苯乙烯而製作之校準曲線求出。作為標準單分散聚苯乙烯,推薦選自昭和電工公司製造之有機溶劑系標準試樣STANDARD SM-105。 When the molecular weight of the polyimide precursor (A) is measured as a weight average molecular weight in terms of polystyrene obtained by gel permeation chromatography (GPC), it is preferably 8,000 to 150,000, more preferably 9,000 to 50,000, and particularly preferably 18,000 to 40,000. If the weight average molecular weight is 8,000 or more, the mechanical properties are good, so it is preferred. On the other hand, if it is 150,000 or less, the dispersibility in the developer and the resolution performance of the concave-convex pattern are good, so it is preferred. As developing solvents for gel permeation chromatography, tetrahydrofuran and N-methyl-2-pyrrolidone are recommended. In addition, the molecular weight is obtained based on a calibration curve prepared using standard monodisperse polystyrene. As the standard monodisperse polystyrene, it is recommended to select the organic solvent standard sample STANDARD SM-105 manufactured by Showa Denko Co., Ltd.

使用(A)聚醯亞胺前驅物之感光性樹脂組合物藉由感光性樹脂組合物中所含有之化合物醯亞胺化、及/或於感光性樹脂組合物之製造步驟中,(A)聚醯亞胺前驅物之一部分於樹脂組合物中醯亞胺化。 The photosensitive resin composition using the (A) polyimide precursor is imidized by a compound contained in the photosensitive resin composition, and/or in the manufacturing step of the photosensitive resin composition, a part of the (A) polyimide precursor is imidized in the resin composition.

於本實施方式中,於利用ATR法測定之情形時,就低介電損耗正切化、吸光度、及解像度之觀點而言,樹脂組合物中之(A)聚醯亞胺前驅物之醯亞胺化率為15%~50%,較佳為15%~40%。聚醯亞胺前驅物之吸光度與醯亞胺化率相關,若醯亞胺化率上升,則吸光度亦會上升。再者,本 說明書中,用語「醯亞胺化率」係將紅外線光譜中1380cm-1之波峰強度除以1500cm-1之波峰強度所得之值設為「感光性樹脂層之醯亞胺化指數」時,作為將感光性樹脂層之醯亞胺化指數除以將該感光性樹脂組合物於350℃下硬化所得之「硬化膜之醯亞胺化指數」所得之值而算出。 In this embodiment, when measured by the ATR method, from the perspective of low dielectric loss tangent, absorbance, and resolution, the imidization rate of the (A) polyimide precursor in the resin composition is 15% to 50%, preferably 15% to 40%. The absorbance of the polyimide precursor is related to the imidization rate, and if the imidization rate increases, the absorbance will also increase. In this specification, the term "imidization rate" is calculated as a value obtained by dividing the peak intensity of 1380 cm -1 in the infrared spectrum by the peak intensity of 1500 cm -1 as the "imidization index of the photosensitive resin layer" by the "imidization index of the cured film" obtained by curing the photosensitive resin composition at 350°C.

若聚醯亞胺前驅物醯亞胺化,則隨著閉環反應,相當於通式(1)中之R1與R2之側鏈脫離,並分散於樹脂組合物中。於本實施方式中,由於感光性樹脂組合物中之聚醯亞胺前驅物之一部分醯亞胺化,加熱硬化前該側鏈已經分散於該樹脂組合物中,故而樹脂組合物中之甲基丙烯酸酯濃度不會改變而能夠維持微影性,另一方面,該甲基丙烯酸酯容易藉由加熱硬化步驟之加熱揮發,故而可減少硬化膜中之極性化合物之殘存量。 If the polyimide precursor is imidized, the side chains of R1 and R2 in the general formula (1) are detached and dispersed in the resin composition along with the ring-closing reaction. In the present embodiment, since a portion of the polyimide precursor in the photosensitive resin composition is imidized, the side chains are already dispersed in the resin composition before heat curing, so the concentration of methacrylate in the resin composition does not change and the lithography can be maintained. On the other hand, the methacrylate is easily volatilized by the heat of the heat curing step, so the residual amount of polar compounds in the cured film can be reduced.

就低介電損耗正切化與吸光度之觀點而言,較佳為醯亞胺基濃度a與醯亞胺化率b滿足下述式(1):0.10≦a×(1-b)≦0.17 (1)。 From the perspective of low dielectric loss tangent and absorbance, it is preferred that the imide group concentration a and the imide rate b satisfy the following formula (1): 0.10≦a×(1-b)≦0.17 (1).

不受理論約束,藉由使a×(1-b)處於0.1~0.17之範圍,從而減少聚醯亞胺前驅物側鏈於聚醯亞胺硬化膜中之殘留量而實現低介電損耗正切化。此外,可將隨著醯亞胺化之進行而上升之吸光度保持在一定值以下。 Without theoretical constraints, by making a×(1-b) in the range of 0.1~0.17, the residual amount of the polyimide precursor side chain in the polyimide cured film is reduced to achieve low dielectric loss tangent. In addition, the absorbance that increases with the progress of imidization can be kept below a certain value.

[(B)感光劑] [(B) Photosensitizer]

本實施方式之感光性樹脂組合物含有感光劑。於一實施方式中,感光劑亦可為光聚合起始劑。光聚合起始劑促進基於光照射之凹凸圖案之硬化,故而較佳。作為光聚合起始劑,較佳為光自由基聚合起始劑,可較佳地例舉:二苯甲酮、鄰苯甲醯苯甲酸甲酯、4-苯甲醯基-4'-甲基二苯基 酮、二苄基酮、茀酮等二苯甲酮衍生物;2,2'-二乙氧基苯乙酮、2-羥基-2-甲基苯丙酮、1-羥基環己基苯基酮等苯乙酮衍生物;9-氧硫

Figure 110134871-A0305-12-0024-76
、2-甲基9-氧硫
Figure 110134871-A0305-12-0024-77
、2-異丙基9-氧硫
Figure 110134871-A0305-12-0024-82
、二乙基9-氧硫
Figure 110134871-A0305-12-0024-80
等9-氧硫
Figure 110134871-A0305-12-0024-81
衍生物;苯偶醯、苯偶醯二甲基縮酮、苯偶醯-β-甲氧基乙基縮醛等苯偶醯衍生物;安息香、安息香甲醚等安息香衍生物;1-苯基-1,2-丁二酮-2-(鄰甲氧基羰基)肟、1-苯基-1,2-丙二酮-2-(鄰甲氧基羰基)肟、1-苯基-1,2-丙二酮-2-(鄰乙氧基羰基)肟、1-苯基-1,2-丙二酮-2-(鄰苯甲醯基)肟、1,3-二苯基丙三酮-2-(鄰乙氧基羰基)肟、1-苯基-3-乙氧基丙三酮-2-(鄰苯甲醯基)肟等肟類;N-苯基甘胺酸等N-芳基甘胺酸類;過氯化苯甲醯等過氧化物類;芳香族聯咪唑類、二茂鈦類、α-(正辛磺醯氧基亞胺基)-4-甲氧基苄基氰化物等光酸產生劑類等;但並不限定於該等。於上述光聚合起始劑之中,尤其是就感光度之方面而言,更佳為肟類。 The photosensitive resin composition of this embodiment contains a photosensitive agent. In one embodiment, the photosensitive agent can also be a photopolymerization initiator. The photopolymerization initiator promotes the hardening of the concave-convex pattern based on light irradiation, so it is preferred. As the photopolymerization initiator, it is preferably a photo-free radical polymerization initiator, and preferably exemplified are: benzophenone derivatives such as benzophenone, methyl o-benzoylbenzoate, 4-benzoyl-4'-methyldiphenyl ketone, dibenzyl ketone, and fluorenone; acetophenone derivatives such as 2,2'-diethoxyacetophenone, 2-hydroxy-2-methylpropiophenone, and 1-hydroxycyclohexylphenyl ketone; 9-oxysulfuron
Figure 110134871-A0305-12-0024-76
, 2-methyl 9-oxosulfur
Figure 110134871-A0305-12-0024-77
, 2-isopropyl 9-oxysulfide
Figure 110134871-A0305-12-0024-82
, diethyl 9-sulfoxide
Figure 110134871-A0305-12-0024-80
9-Oxosulfur
Figure 110134871-A0305-12-0024-81
derivatives; benzoyl derivatives such as benzoyl dimethyl ketal and benzoyl-β-methoxyethyl acetal; benzoin derivatives such as benzoin and benzoin methyl ether; 1-phenyl-1,2-butanedione-2-(o-methoxycarbonyl)oxime, 1-phenyl-1,2-propanedione-2-(o-methoxycarbonyl)oxime, 1-phenyl-1,2-propanedione-2-(o-ethoxycarbonyl)oxime, 1-phenyl-1,2-propanedione-2- Oxime such as (o-benzoyl) oxime, 1,3-diphenylpropanetrione-2-(o-ethoxycarbonyl) oxime, 1-phenyl-3-ethoxypropanetrione-2-(o-benzoyl) oxime; N-arylglycine such as N-phenylglycine; peroxide such as perchlorinated benzoyl; photoacid generator such as aromatic biimidazoles, titanocene, α-(n-octylsulfonyloxyimino)-4-methoxybenzyl cyanide, etc., but not limited to them. Among the above-mentioned photopolymerization initiators, oximes are more preferred in terms of sensitivity.

相對於(A)聚醯亞胺前驅物100質量份,光聚合起始劑之調配量為0.5質量份以上且10質量份以下,較佳為1質量份以上且8質量份以下。就感光度或圖案化性之觀點而言,上述調配量為0.5質量份以上,另一方面,就感光性樹脂組合物硬化後之感光性樹脂層之物性之觀點而言,較佳為10質量份以下。 The amount of the photopolymerization initiator is 0.5 to 10 parts by mass, preferably 1 to 8 parts by mass, relative to 100 parts by mass of the polyimide precursor (A). From the perspective of photosensitivity or patterning, the amount is 0.5 parts by mass or more, and from the perspective of the physical properties of the photosensitive resin layer after the photosensitive resin composition is cured, it is preferably 10 parts by mass or less.

[(C)有機化合物] [(C) Organic compounds]

於本實施方式中,亦可使感光性樹脂組合物中含有(C)有機化合物。(C)有機化合物較佳為於一分子中包含選自由鈦及鋯所組成之群中之至少一種金屬元素。較佳為包含烴基、含有雜原子之烴基作為有機基。藉由含有上述有機化合物,感光性樹脂組合物中所包含之聚醯亞胺前驅物之醯亞 胺化率上升,硬化膜之介電損耗正切降低。 In this embodiment, the photosensitive resin composition may also contain (C) an organic compound. The (C) organic compound preferably contains at least one metal element selected from the group consisting of titanium and zirconium in one molecule. Preferably, the organic group contains a hydrocarbon group or a hydrocarbon group containing a heteroatom. By containing the above-mentioned organic compound, the imidization rate of the polyimide precursor contained in the photosensitive resin composition increases, and the dielectric loss tangent of the cured film decreases.

作為可使用之有機鈦或鋯化合物,例如可例舉有機基經由共價鍵或離子鍵鍵結於鈦原子或鋯原子者。 As the organic titanium or zirconium compounds that can be used, for example, there are those in which an organic group is bonded to a titanium atom or a zirconium atom via a covalent bond or an ionic bond.

將有機鈦或鋯化合物之具體例示於以下I)~VII):作為I)螯合物化合物,就感光性樹脂組合物之保存穩定性及獲得良好之圖案之方面而言,更佳為具有2個以上之烷氧基之化合物。作為螯合物化合物,具體例可例舉:雙(三乙醇胺)二異丙醇鈦、雙(2,4-戊二酸)二正丁醇鈦、雙(2,4-戊二酸)二異丙醇鈦、雙(四甲基庚二酸)二異丙醇鈦、二異丙醇鈦雙(乙醯乙酸乙酯)、該等化合物之鈦原子被取代為鋯原子之化合物;但並不限定於該等。 Specific examples of organic titanium or zirconium compounds are shown in the following I) to VII): As I) chelate compounds, compounds having two or more alkoxy groups are more preferred in terms of the storage stability of the photosensitive resin composition and the acquisition of good patterns. Specific examples of chelate compounds include: titanium bis(triethanolamine)diisopropoxide, titanium bis(2,4-pentanedioate)di-n-butanol, titanium bis(2,4-pentanedioate)diisopropoxide, titanium bis(tetramethylpimelate)diisopropoxide, titanium diisopropoxidedi(ethyl acetylacetate), and compounds in which the titanium atoms of these compounds are replaced by zirconium atoms; but they are not limited to these.

作為II)四烷氧基化合物,例如可例舉:四正丁醇鈦、四乙醇鈦、四(2-乙基己醇)鈦、四異丁醇鈦、四異丙醇鈦、四甲醇鈦、四甲氧基丙醇鈦、四甲基苯酚鈦、四正壬醇鈦、四正丙醇鈦、四硬脂醇鈦、四[雙{2,2-(烯丙氧基甲基)丁醇}]鈦、該等化合物之鈦原子被取代為鋯原子之化合物;但並不限定於該等。 Examples of II) tetraalkoxy compounds include: titanium tetra-n-butoxide, titanium tetraethanol, titanium tetra(2-ethylhexyl)ol, titanium tetraisobutoxide, titanium tetraisopropoxide, titanium tetramethylol, titanium tetramethoxypropoxide, titanium tetramethylphenol, titanium tetra-n-nonoxide, titanium tetra-n-propoxide, titanium tetrastearylol, titanium tetra[bis{2,2-(allyloxymethyl)butanol}], and compounds in which the titanium atoms of these compounds are replaced by zirconium atoms; however, the compounds are not limited to these.

作為III)二茂鈦或二茂鋯化合物,例如可例舉:五甲基環戊二烯基三甲醇鈦、雙(η5-2,4-環戊二烯-1-基)雙(2,6-二氟苯基)鈦、雙(η5-2,4-環戊二烯-1-基)雙(2,6-二氟-3-(1H-吡咯-1-基)苯基)鈦、該等化合物之鈦原子被取代為鋯原子之化合物;但並不限定於該等。 Examples of the titanium or zirconium cyclopentadienyl compound (III) include titanium pentamethylcyclopentadienyltrimethoxide, titanium bis(η 5 -2,4-cyclopentadien-1-yl)bis(2,6-difluorophenyl)bis(η 5 -2,4-cyclopentadien-1-yl)bis(2,6-difluoro-3-(1H-pyrrol-1-yl)phenyl)titanium, and compounds wherein the titanium atom of these compounds is substituted with a zirconium atom; however, the present invention is not limited to these.

作為IV)單烷氧基化合物,例如可例舉:三(二辛基磺酸)異丙醇鈦、三(十二烷基苯磺酸)異丙醇鈦、該等化合物之鈦原子被取代為鋯原子之化合物;但並不限定於該等。 Examples of IV) monoalkoxy compounds include: titanium tri(dioctylsulfonate)isopropoxide, titanium tri(dodecylbenzenesulfonate)isopropoxide, and compounds in which the titanium atom is replaced by a zirconium atom; but the compounds are not limited to these.

作為V)氧鈦或氧鋯化合物,例如可例舉:雙(戊二酸)氧鈦、雙(四甲基庚二酸)氧鈦、酞菁氧鈦、該等化合物之鈦原子被取代為鋯原子之化合物;但並不限定於該等。 Examples of V) titanium or zirconium oxide compounds include: bis(glutaric acid)titanium oxide, bis(tetramethylpimelic acid)titanium oxide, phthalocyanine oxidetitanium oxide, and compounds in which the titanium atoms of these compounds are replaced by zirconium atoms; but the compounds are not limited to these.

作為VI)四乙醯丙酮酸鈦或四乙醯丙酮酸鋯化合物,例如可例舉:四乙醯丙酮酸鈦、該等化合物之鈦原子被取代為鋯原子之化合物;但並不限定於該等。 Examples of titanium tetraacetylpyruvate or zirconium tetraacetylpyruvate compounds (VI) include titanium tetraacetylpyruvate and compounds in which the titanium atom of these compounds is replaced by a zirconium atom; however, the compounds are not limited to these.

作為VII)鈦酸酯偶合劑,例如可例舉三(十二烷基苯磺醯基)鈦酸異丙酯等,但並不限定於該等。 As VII) titanium ester coupling agent, for example, tri(dodecylbenzenesulfonyl)titanium isopropyl ester can be cited, but it is not limited to them.

上述I)~VII)之中,就實現更良好之介電損耗正切之觀點而言,有機鈦化合物較佳為選自由上述I)鈦螯合物化合物、II)四烷氧基鈦化合物、及III)二茂鈦化合物所組成之群中之至少1種化合物。尤佳為鈦二異丙醇雙(乙醯乙酸乙酯)、四正丁醇鈦、及雙(η5-2,4-環戊二烯-1-基)雙(2,6-二氟-3-(1H-吡咯-1-基)苯基)鈦。 Among the above I) to VII), from the viewpoint of achieving a better dielectric loss tangent, the organic titanium compound is preferably at least one compound selected from the group consisting of the above I) titanium chelate compound, II) tetraalkoxy titanium compound, and III) titanocene compound. Titanium diisopropyl alcohol bis(ethyl acetate), titanium tetra-n-butoxide, and bis(η 5 -2,4-cyclopentadien-1-yl)bis(2,6-difluoro-3-(1H-pyrrol-1-yl)phenyl)titanium are particularly preferred.

相對於(A)樹脂100質量份,調配有機鈦或鋯化合物之情形時之調配量為0.01質量份~5質量份,較佳為0.1質量份~3質量份。若該調配量為 0.01質量份以上,則表現出良好之樹脂組合物之醯亞胺化率及硬化膜之介電損耗正切,另一方面,若為10質量份以下,則保存穩定性優異,故而較佳。 The amount of the organic titanium or zirconium compound to be mixed with 100 parts by mass of the resin (A) is 0.01 to 5 parts by mass, preferably 0.1 to 3 parts by mass. If the amount is 0.01 parts by mass or more, the imidization rate of the resin composition and the dielectric loss tangent of the cured film are good. On the other hand, if it is 10 parts by mass or less, the storage stability is excellent, so it is better.

本實施方式之感光劑樹脂組合物藉由含有上述(C)有機化合物,可提高樹脂組合物中所含有之聚醯亞胺前驅物之醯亞胺化率,且可降低使用該樹脂組合物之硬化膜之介電損耗正切。不受理論約束,認為提高聚醯亞胺前驅物之醯亞胺化率之原因在於:(C)有機化合物中所含有之金屬元素配位於聚醯亞胺前驅物之酯基及/或源自羧基之羰基,因此使得羰基之碳原子之電子密度降低,促進閉環反應。認為介電損耗正切降低之原因在於:閉環反應於用於樹脂組合物硬化之加熱處理前局部進行,因此於下述通式(1):

Figure 110134871-A0305-12-0027-28
The photosensitive resin composition of the present embodiment can increase the imidization rate of the polyimide precursor contained in the resin composition by containing the above-mentioned (C) organic compound, and can reduce the dielectric loss tangent of the cured film using the resin composition. Without being bound by theory, it is believed that the reason for increasing the imidization rate of the polyimide precursor is that the metal element contained in the (C) organic compound coordinates to the ester group and/or the carbonyl group derived from the carboxyl group of the polyimide precursor, thereby reducing the electron density of the carbon atom of the carbonyl group and promoting the ring closing reaction. The reason for reducing the dielectric loss tangent is believed to be that the ring closing reaction is locally carried out before the heat treatment used for curing the resin composition, so in the following general formula (1):
Figure 110134871-A0305-12-0027-28

{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,n1為2~150之整數,並且R1與R2分別獨立地為氫原子或碳數1~40之一價有機基}所表示之聚醯亞胺前驅物中,R1及/或R2藉由聚醯亞胺前驅物之閉環而自聚合物結構中脫離,於硬化膜製造步驟中之加熱步驟中容易揮發。此外,於R1及/或R2具有聚合性官能基之情形時,於硬化膜製造步驟中之曝光步驟中會殘存於膜中,故而即便進行醯亞胺化率,膜中之聚合性 官能基濃度亦不會變化,而不會對解像度造成影響。 In the polyimide precursor represented by {wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, n1 is an integer of 2 to 150, and R1 and R2 are independently a hydrogen atom or a monovalent organic group having 1 to 40 carbon atoms}, R1 and/or R2 are separated from the polymer structure by the ring closure of the polyimide precursor and are easily volatilized in the heating step in the curing film manufacturing step. Furthermore, when R1 and/or R2 have a polymerizable functional group, it will remain in the film during the exposure step in the hardened film manufacturing step. Therefore, even if the imidization rate is adjusted, the concentration of the polymerizable functional group in the film will not change, and will not affect the resolution.

[(D)溶劑] [(D) Solvent]

本實施方式之感光性樹脂組合物含有(D)溶劑(亦稱為溶劑)。作為溶劑,就對(A)聚醯亞胺前驅物之溶解性之方面而言,較佳為使用極性有機溶劑。作為溶劑,具體而言,可例舉:N,N-二甲基甲醯胺、N-甲基-2-吡咯啶酮、N-乙基-2-吡咯啶酮、N,N-二甲基乙醯胺、二甲基亞碸、二乙二醇二甲醚、環戊酮、γ-丁內酯、α-乙醯基-γ-丁內酯、四甲基脲、1,3-二甲基-2-咪唑啉酮、N-環己基-2-吡咯啶酮、2-辛酮等;該等可單獨或以2種以上之組合使用。 The photosensitive resin composition of this embodiment contains (D) a solvent (also referred to as a solvent). As the solvent, a polar organic solvent is preferably used in terms of solubility in the (A) polyimide precursor. Specifically, the solvent may include: N,N-dimethylformamide, N-methyl-2-pyrrolidone, N-ethyl-2-pyrrolidone, N,N-dimethylacetamide, dimethyl sulfoxide, diethylene glycol dimethyl ether, cyclopentanone, γ-butyrolactone, α-acetyl-γ-butyrolactone, tetramethylurea, 1,3-dimethyl-2-imidazolidinone, N-cyclohexyl-2-pyrrolidone, 2-octanone, etc.; these may be used alone or in combination of two or more.

於本實施方式中,上述(D)溶劑對應於感光性樹脂組合物之所需塗佈膜厚及黏度,相對於(A)聚醯亞胺前驅物100質量份,為100~300質量份之範圍。 In this embodiment, the above-mentioned (D) solvent corresponds to the required coating film thickness and viscosity of the photosensitive resin composition, and is in the range of 100 to 300 parts by mass relative to 100 parts by mass of (A) polyimide precursor.

就提高感光性樹脂組合物之保存穩定性之觀點而言,較佳為包含醇類之溶劑。可較佳地使用之醇類典型而言為分子內具有醇性羥基但不具有烯烴系雙鍵之醇,作為具體例,可例舉:甲醇、乙醇、正丙醇、異丙醇、正丁醇、異丁醇、第三丁醇等烷醇類;乳酸乙酯等乳酸酯類;丙二醇-1-甲醚、丙二醇-2-甲醚、丙二醇-1-乙醚、丙二醇-2-乙醚、丙二醇-1-(正丙基)醚、丙二醇-2-(正丙基)醚等丙二醇單烷基醚類;乙二醇甲醚、乙二醇乙醚、乙二醇-正丙醚等單醇類;2-羥基異丁酸酯類;乙二醇、丙二醇等二醇類。該等之中,較佳為乳酸酯類、丙二醇單烷基醚類、2-羥基異丁酸 酯類、乙醇,尤佳為乳酸乙酯、丙二醇-1-甲醚、丙二醇-1-乙醚、丙二醇-1-(正丙基)醚。 From the viewpoint of improving the storage stability of the photosensitive resin composition, a solvent containing an alcohol is preferred. Alcohols that can be preferably used are typically alcohols having an alcoholic hydroxyl group in the molecule but not having an olefinic double bond, and specific examples include: alkanols such as methanol, ethanol, n-propanol, isopropanol, n-butanol, isobutanol, and t-butanol; lactic acid esters such as ethyl lactate; propylene glycol monoalkyl ethers such as propylene glycol-1-methyl ether, propylene glycol-2-methyl ether, propylene glycol-1-ethyl ether, propylene glycol-2-ethyl ether, propylene glycol-1-(n-propyl) ether, and propylene glycol-2-(n-propyl) ether; monoalcohols such as ethylene glycol methyl ether, ethylene glycol ethyl ether, and ethylene glycol-n-propyl ether; 2-hydroxy isobutyric acid esters; and diols such as ethylene glycol and propylene glycol. Among them, lactic acid esters, propylene glycol monoalkyl ethers, 2-hydroxy isobutyric acid esters, and ethanol are preferred, and ethyl lactate, propylene glycol-1-methyl ether, propylene glycol-1-ethyl ether, and propylene glycol-1-(n-propyl) ether are particularly preferred.

於溶劑含有不具有烯烴系雙鍵之醇之情形時,將總溶劑之質量作為基準,總溶劑中之不具有烯烴系雙鍵之醇之含量較佳為5質量%~50質量%,更佳為10質量%~30質量%。若不具有烯烴系雙鍵之醇之上述含量為5質量%以上,則感光性樹脂組合物之保存穩定性變得良好,另一方面,若為50質量%以下,則(A)聚醯亞胺前驅物之溶解性變得良好。 When the solvent contains an alcohol without an olefinic double bond, the content of the alcohol without an olefinic double bond in the total solvent is preferably 5% to 50% by mass, and more preferably 10% to 30% by mass, based on the mass of the total solvent. If the content of the alcohol without an olefinic double bond is 5% by mass or more, the storage stability of the photosensitive resin composition becomes good. On the other hand, if it is 50% by mass or less, the solubility of the (A) polyimide precursor becomes good.

[(E)單體] [(E) Monomer]

於本實施方式中,為了提高凹凸圖案之解像度,感光性樹脂組合物可任意包含具有光聚合性不飽和鍵之(E)單體。作為此種單體,較佳為藉由光聚合起始劑進行自由基聚合反應之(甲基)丙烯酸化合物,並非特別限定於以下,可例舉以二乙二醇二甲基丙烯酸酯、四乙二醇二甲基丙烯酸酯為代表之乙二醇或聚乙二醇之單或二丙烯酸酯或甲基丙烯酸酯、丙二醇或聚丙二醇之單或二丙烯酸酯或甲基丙烯酸酯、甘油之單、二或三丙烯酸酯或甲基丙烯酸酯、環己烷二丙烯酸酯或二甲基丙烯酸酯、1,4-丁二醇之二丙烯酸酯或二甲基丙烯酸酯、1,6-己二醇之二丙烯酸酯或二甲基丙烯酸酯、新戊二醇之二丙烯酸酯或二甲基丙烯酸酯、雙酚A之單或二丙烯酸酯或甲基丙烯酸酯、苯三甲基丙烯酸酯、丙烯酸異

Figure 110134871-A0305-12-0029-75
酯或甲基丙烯酸酯、丙烯醯胺、其衍生物、甲基丙烯醯胺、其衍生物、三羥甲基丙烷三丙烯酸酯或甲基丙烯酸酯、甘油之二或三丙烯酸酯或甲基丙烯酸酯、季戊四醇之二、三或四丙烯酸酯或甲基丙烯酸酯、該等化合物之環氧乙烷或環氧丙烷 加成物等化合物。又,該等單體可使用1種,亦可以2種以上之混合物使用。 In this embodiment, in order to improve the resolution of the concavo-convex pattern, the photosensitive resin composition may arbitrarily contain a (E) monomer having a photopolymerizable unsaturated bond. As such a monomer, a (meth)acrylic compound that undergoes a free radical polymerization reaction by a photopolymerization initiator is preferred, and is not particularly limited to the following, and examples thereof include mono- or di-acrylates or methacrylates of ethylene glycol or polyethylene glycol represented by diethylene glycol dimethacrylate and tetraethylene glycol dimethacrylate, mono- or di-acrylates or methacrylates of propylene glycol or polypropylene glycol, mono-, di- or tri-acrylates or methacrylates of glycerol, cyclohexane diacrylate or dimethacrylate, diacrylate or dimethacrylate of 1,4-butanediol, diacrylate or dimethacrylate of 1,6-hexanediol, diacrylate or dimethacrylate of neopentyl glycol, mono- or di-acrylate or methacrylate of bisphenol A, benzyltrimethacrylate, isoacrylate,
Figure 110134871-A0305-12-0029-75
esters or methacrylates, acrylamide, its derivatives, methacrylamide, its derivatives, trihydroxymethylpropane triacrylate or methacrylate, glycerol di- or triacrylate or methacrylate, pentaerythritol di-, tri- or tetraacrylate or methacrylate, ethylene oxide or propylene oxide adducts of these compounds, etc. These monomers may be used alone or as a mixture of two or more.

若藉由對樹脂組合物進行老化而使樹脂組合物中所包含之聚醯亞胺前驅物閉環,則側鏈分子會脫離,但脫離後之側鏈分子可作為單體存在於樹脂組合物中。單體較佳為具有選自羥基、胺基中之至少1種基,更佳為下述通式(3)所表示之結構:

Figure 110134871-A0305-12-0030-29
If the polyimide precursor contained in the resin composition is ring-closed by aging the resin composition, the side chain molecules will be separated, but the separated side chain molecules can exist as monomers in the resin composition. The monomer preferably has at least one group selected from hydroxyl group and amino group, and more preferably has a structure represented by the following general formula (3):
Figure 110134871-A0305-12-0030-29

{式(3)中,Z係選自由羥基及胺基所組成之群中之至少一種基,R7、R8及R9分別獨立地為氫原子或碳數1~3之一價有機基,並且m2為2~10之整數}。 {In formula (3), Z is at least one group selected from the group consisting of hydroxyl groups and amino groups, R 7 , R 8 and R 9 are independently hydrogen atoms or monovalent organic groups having 1 to 3 carbon atoms, and m 2 is an integer of 2 to 10}.

於本實施方式中,相對於(A)聚醯亞胺前驅物100質量份,具有光聚合性不飽和鍵之單體之調配量為0.5質量份~15質量份。 In this embodiment, the amount of the monomer having a photopolymerizable unsaturated bond is 0.5 to 15 parts by mass relative to 100 parts by mass of (A) polyimide precursor.

[其他成分] [Other ingredients]

本實施方式之感光性樹脂組合物亦可進而含有上述(A)~(E)成分以外之成分。作為其他成分,例如可例舉:(A)聚醯亞胺前驅物以外之樹脂成分;增感劑;具有光聚合性不飽和鍵之單體;接助劑;熱聚合抑制劑;唑化合物;及受阻酚化合物等。 The photosensitive resin composition of this embodiment may further contain components other than the above-mentioned (A) to (E) components. Examples of other components include: (A) resin components other than polyimide precursors; sensitizers; monomers having photopolymerizable unsaturated bonds; photopolymerization aids; thermal polymerization inhibitors; azole compounds; and hindered phenol compounds, etc.

於一實施方式中,感光性樹脂組合物亦可進而含有(A)聚醯亞胺前驅物以外之樹脂成分。作為可含於感光性樹脂組合物中之樹脂成分,例如可例舉:聚醯亞胺、聚

Figure 110134871-A0305-12-0031-72
唑、聚
Figure 110134871-A0305-12-0031-73
唑前驅物、酚系樹脂、聚醯胺、環氧樹脂、矽氧烷樹脂、丙烯酸系樹脂等。相對於(A)聚醯亞胺前驅物100質量份,該等樹脂成分之調配量較佳為0.01質量份~20質量份之範圍。 In one embodiment, the photosensitive resin composition may further contain a resin component other than the (A) polyimide precursor. Examples of the resin component that may be contained in the photosensitive resin composition include polyimide, poly
Figure 110134871-A0305-12-0031-72
Azoles, poly
Figure 110134871-A0305-12-0031-73
The amount of the resin components is preferably in the range of 0.01 to 20 parts by weight relative to 100 parts by weight of the (A) polyimide precursor.

於一併使用(A)聚醯亞胺前驅物以及聚

Figure 110134871-A0305-12-0031-74
唑前驅物來製備正型感光性樹脂組合物之情形時,作為正型感光材,可將具有醌二疊氮基之化合物、例如具有1,2-苯醌二疊氮結構或1,2-萘醌二疊氮結構之化合物等併用。 (A) a polyimide precursor and a polyimide
Figure 110134871-A0305-12-0031-74
When a positive-type photosensitive resin composition is prepared by using an azole precursor, a compound having a quinone diazide group, such as a compound having a 1,2-benzoquinone diazide structure or a 1,2-naphthoquinone diazide structure, can be used in combination as a positive-type photosensitive material.

於一實施方式中,為了提高感光度,感光性樹脂組合物可任意包含增感劑。作為增感劑,例如可例舉:米其勒酮、4,4'-雙(二乙基胺基)二苯甲酮、2,5-雙(4'-二乙胺基苯亞甲基)環戊烷、2,6-雙(4'-二乙基胺基苯亞甲基)環己酮、2,6-雙(4'-二乙基胺基苯亞甲基)-4-甲基環己酮、4,4'-雙(二甲基胺基)查耳酮、4,4'-雙(二乙基胺基)查耳酮、對二甲基胺基亞桂皮基、對二甲基胺基亞苄基茚酮、2-(對二甲基胺基苯基伸聯苯基)-苯并噻唑、2-(對二甲基胺基苯基伸乙烯基)苯并噻唑、2-(對二甲基胺基苯基伸乙烯基)異萘并噻唑、1,3-雙(4'-二甲基胺基苯亞甲基)丙酮、1,3-雙(4'-二乙基胺基苯亞甲基)丙酮、3,3'-羰基-雙(7-二乙基胺基香豆素)、3-乙醯基-7-二甲基胺基香豆素、3-乙氧基羰基-7-二甲基胺基香豆素、3-苄氧基羰基-7-二甲基胺基香豆素、3-甲氧基羰基-7-二乙基胺基香豆素、3-乙氧基羰基-7-二乙基胺基香豆素、N-苯基-N'-乙基乙醇胺、N-苯基二乙醇胺、N-對甲苯基二乙醇胺、N-苯基乙醇胺、4-嗎啉基二苯甲酮、二甲基胺基苯甲酸異戊 酯、二乙基胺基苯甲酸異戊酯、2-巰基苯并咪唑、1-苯基-5-巰基四唑、2-巰基苯并噻唑、2-(對二甲基胺基苯乙烯基)苯并

Figure 110134871-A0305-12-0032-71
唑、2-(對二甲基胺基苯乙烯基)苯并噻唑、2-(對二甲基胺基苯乙烯基)萘并(1,2-d)噻唑、2-(對二甲基胺基苯甲醯基)苯乙烯等。該等可單獨或以複數種(例如2~5種)之組合使用。 In one embodiment, in order to improve the sensitivity, the photosensitive resin composition may optionally contain a sensitizer. Examples of the sensitizer include: michler's ketone, 4,4'-bis(diethylamino)benzophenone, 2,5-bis(4'-diethylaminobenzylidene)cyclopentane, 2,6-bis(4'-diethylaminobenzylidene)cyclohexanone, 2,6-bis(4'-diethylaminobenzylidene)-4-methylcyclohexanone, 4,4'-bis(dimethylamino)chalcone, 4, 4'-Bis(diethylamino)chalcone, p-dimethylaminocinnamylene, p-dimethylaminobenzylideneindanone, 2-(p-dimethylaminophenylbiphenylene)-benzothiazole, 2-(p-dimethylaminophenylvinylene)benzothiazole, 2-(p-dimethylaminophenylvinylene)isonaphthothiazole, 1,3-bis(4'-dimethylaminobenzylidene)acetone, 1,3-bis(4'-diethylaminobenzylidene)acetone, 3,3'-carbonyl-bis(7-diethylaminocoumarin), 3-acetyl-7-dimethylaminocoumarin, 3-ethoxycarbonyl-7-dimethylaminocoumarin, 3-benzyloxycarbonyl-7-dimethylaminocoumarin, 3-methoxycarbonyl-7-diethylaminocoumarin, 3-ethoxycarbonyl-7-diethyl Aminocumarin, N-phenyl-N'-ethylethanolamine, N-phenyldiethanolamine, N-p-tolyldiethanolamine, N-phenylethanolamine, 4-morpholinylbenzophenone, isoamyl dimethylaminobenzoate, isoamyl diethylaminobenzoate, 2-butylbenzimidazole, 1-phenyl-5-butyltetrazole, 2-butylbenzothiazole, 2-(p-dimethylaminostyryl)benzo
Figure 110134871-A0305-12-0032-71
azole, 2-(p-dimethylaminophenylvinyl)benzothiazole, 2-(p-dimethylaminophenylvinyl)naphtho(1,2-d)thiazole, 2-(p-dimethylaminophenylvinyl)styrene, etc. These can be used alone or in combination of plural types (e.g., 2 to 5 types).

相對於(A)聚醯亞胺前驅物100質量份,增感劑之調配量較佳為0.1質量份~25質量份。 Relative to 100 parts by weight of (A) polyimide precursor, the preferred amount of sensitizer is 0.1 to 25 parts by weight.

於一實施方式中,為了提高使用感光性樹脂組合物而形成之膜與基材之接著性,感光性樹脂組合物可任意包含接著助劑。作為接著助劑,例如可例舉:γ-胺基丙基二甲氧基矽烷、N-(β-胺基乙基)-γ-胺基丙基甲基二甲氧基矽烷、γ-縮水甘油氧基丙基甲基二甲氧基矽烷、γ-巰基丙基甲基二甲氧基矽烷、3-甲基丙烯醯氧基丙基二甲氧基甲基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、二甲氧基甲基-3-哌啶基丙基矽烷、二乙氧基-3-縮水甘油氧基丙基甲基矽烷、N-(3-二乙氧基甲基矽烷基丙基)丁二醯亞胺、N-[3-(三乙氧基矽烷基)丙基]鄰苯二甲醯胺酸、二苯甲酮-3,3'-雙(N-[3-三乙氧基矽烷基]丙基醯胺)-4,4'-二羧酸、苯-1,4-雙(N-[3-三乙氧基矽烷基]丙基醯胺)-2,5-二羧酸、3-(三乙氧基矽烷基)丙基丁二酸酐、N-苯基胺基丙基三甲氧基矽烷等矽烷偶合劑、及三(乙基乙醯乙酸)鋁、三(乙醯丙酮酸)鋁等鋁系接著助劑等。又,該等接著助劑可使用1種,亦可以2種以上之混合物使用。 In one embodiment, in order to improve the adhesion between the film formed using the photosensitive resin composition and the substrate, the photosensitive resin composition may arbitrarily contain a bonding aid. Examples of the bonding aid include: γ-aminopropyl dimethoxysilane, N-(β-aminoethyl)-γ-aminopropyl methyl dimethoxysilane, γ-glycidyloxypropyl methyl dimethoxysilane, γ-butyl propyl methyl dimethoxysilane, 3-methacryloxypropyl dimethoxymethyl silane, 3-methacryloxypropyl trimethoxysilane, dimethoxymethyl-3-piperidinylpropyl silane, diethoxy-3-glycidyloxypropyl methyl silane, N-(3-diethoxymethylsilyl)propyl Silane coupling agents such as 3-(triethoxysilyl) succinimide, N-[3-(triethoxysilyl)propyl]phthalamide, benzophenone-3,3'-bis(N-[3-triethoxysilyl]propylamide)-4,4'-dicarboxylic acid, benzene-1,4-bis(N-[3-triethoxysilyl]propylamide)-2,5-dicarboxylic acid, 3-(triethoxysilyl)propylsuccinic anhydride, N-phenylaminopropyltrimethoxysilane, and aluminum-based bonding agents such as tris(ethylacetoacetate)aluminum and tris(acetylacetonate)aluminum. These bonding agents may be used alone or as a mixture of two or more.

該等接著助劑之中,就接著力之方面而言,更佳為使用矽烷偶合 劑。相對於(A)聚醯亞胺前驅物100質量份,接著助劑之調配量較佳為0.5質量份~25質量份之範圍。 Among these bonding aids, silane coupling agents are more preferred in terms of bonding strength. The amount of bonding aid is preferably in the range of 0.5 to 25 parts by weight relative to 100 parts by weight of (A) polyimide precursor.

於一實施方式中,為了提高尤其是以包含溶劑之溶液之狀態保存時之感光性樹脂組合物之黏度及感光度之穩定性,感光性樹脂組合物可任意包含熱聚合抑制劑。作為熱聚合抑制劑,例如使用:對苯二酚、N-亞硝基二苯基胺、對第三丁基鄰苯二酚、啡噻

Figure 110134871-A0305-12-0033-70
、N-苯基萘基胺、乙二胺四乙酸、1,2-環己烷二胺四乙酸、二醇醚二胺四乙酸、2,6-二-第三丁基-對甲基苯酚、5-亞硝基-8-羥基喹啉、1-亞硝基-2-萘酚、2-亞硝基-1-萘酚、2-亞硝基-5-(N-乙基-N-磺丙基胺基)苯酚、N-亞硝基-N-苯基羥基胺銨鹽、N-亞硝基-N(1-萘基)羥基胺銨鹽等。又,該等熱聚合抑制劑可使用1種,亦可以2種以上之混合物使用。 In one embodiment, in order to improve the stability of the viscosity and sensitivity of the photosensitive resin composition, especially when stored in a solution containing a solvent, the photosensitive resin composition may optionally contain a thermal polymerization inhibitor. As the thermal polymerization inhibitor, for example, hydroquinone, N-nitrosodiphenylamine, p-tert-butyl o-cyclopentylphenol, phenanthridine,
Figure 110134871-A0305-12-0033-70
, N-phenylnaphthylamine, ethylenediaminetetraacetic acid, 1,2-cyclohexanediaminetetraacetic acid, glycol ether diaminetetraacetic acid, 2,6-di-tert-butyl-p-methylphenol, 5-nitroso-8-hydroxyquinoline, 1-nitroso-2-naphthol, 2-nitroso-1-naphthol, 2-nitroso-5-(N-ethyl-N-sulfopropylamino)phenol, N-nitroso-N-phenylhydroxylamine ammonium salt, N-nitroso-N(1-naphthyl)hydroxylamine ammonium salt, etc. In addition, these thermal polymerization inhibitors may be used alone or as a mixture of two or more.

作為熱聚合抑制劑之調配量,相對於(A)聚醯亞胺前驅物100質量份,較佳為0.005質量份~12質量份之範圍。 The amount of thermal polymerization inhibitor to be added is preferably in the range of 0.005 to 12 parts by weight relative to 100 parts by weight of (A) polyimide precursor.

例如,於使用包含銅或銅合金之基板之情形時,為了抑制基板變色,感光性樹脂組合物可任意包含唑化合物。作為唑化合物,例如可例舉:1H-三唑、5-甲基-1H-三唑、5-乙基-1H-三唑、4,5-二甲基-1H-三唑、5-苯基-1H-三唑、4-第三丁基-5-苯基-1H-三唑、5-羥基苯基-1H-三唑、苯基三唑、對乙氧基苯基三唑、5-苯基-1-(2-二甲基胺基乙基)三唑、5-苄基-1H-三唑、羥基苯基三唑、1,5-二甲基三唑、4,5-二乙基-1H-三唑、1H-苯并三唑、2-(5-甲基-2-羥基苯基)苯并三唑、2-[2-羥基-3,5-雙(α,α-二甲基苄基)苯基]-苯并三唑、2-(3,5-二-第三丁基-2-羥基苯基)苯并 三唑、2-(3-第三丁基-5-甲基-2-羥基苯基)-苯并三唑、2-(3,5-二-第三戊基-2-羥基苯基)苯并三唑、2-(2'-羥基-5'-第三辛基苯基)苯并三唑、羥基苯基苯并三唑、甲苯基三唑、5-甲基-1H-苯并三唑、4-甲基-1H-苯并三唑、4-羧基-1H-苯并三唑、5-羧基-1H-苯并三唑、1H-四唑、5-甲基-1H-四唑、5-苯基-1H-四唑、5-胺基-1H-四唑、1-甲基-1H-四唑等。尤佳為甲苯基三唑、5-甲基-1H-苯并三唑、4-甲基-1H-苯并三唑。又,該等唑化合物可使用1種,亦可以2種以上之混合物使用。 For example, when a substrate comprising copper or a copper alloy is used, the photosensitive resin composition may optionally contain an azole compound in order to suppress discoloration of the substrate. Examples of the azole compound include 1H-triazole, 5-methyl-1H-triazole, 5-ethyl-1H-triazole, 4,5-dimethyl-1H-triazole, 5-phenyl-1H-triazole, 4-tert-butyl-5-phenyl-1H-triazole, 5-hydroxyphenyl-1H-triazole, phenyltriazole, p-ethoxyphenyltriazole, 5-phenyl-1-(2-dimethylaminoethyl)triazole, 5-benzyl-1H-triazole, hydroxyphenyltriazole, 1,5-dimethyltriazole, 4,5-diethyl-1H-triazole, 1H-benzotriazole, 2-(5-methyl-2-hydroxyphenyl)benzotriazole, 2-[2-hydroxy-3,5-bis(α,α-dimethylbenzyl)phenyl] -benzotriazole, 2-(3,5-di-tert-butyl-2-hydroxyphenyl)benzotriazole, 2-(3-tert-butyl-5-methyl-2-hydroxyphenyl)-benzotriazole, 2-(3,5-di-tert-pentyl-2-hydroxyphenyl)benzotriazole, 2-(2'-hydroxy-5'-tert-octylphenyl)benzotriazole, hydroxyphenylbenzotriazole, tolyltriazole, 5-methyl-1H-benzotriazole, 4-methyl-1H-benzotriazole, 4-carboxyl-1H-benzotriazole, 5-carboxyl-1H-benzotriazole, 1H-tetrazole, 5-methyl-1H-tetrazole, 5-phenyl-1H-tetrazole, 5-amino-1H-tetrazole, 1-methyl-1H-tetrazole, etc. Particularly preferred are tolyltriazole, 5-methyl-1H-benzotriazole, and 4-methyl-1H-benzotriazole. Moreover, these azole compounds may be used alone or as a mixture of two or more.

相對於(A)聚醯亞胺前驅物100質量份,唑化合物之調配量較佳為0.1質量份~20質量份,就感光度特性之觀點而言,更佳為0.5質量份~5質量份。若唑化合物相對於(A)聚醯亞胺前驅物100質量份之調配量為0.1質量份以上,則於銅或銅合金之上形成感光性樹脂組合物時,銅或銅合金表面之變色得到抑制,另一方面,若為20質量份以下,則感光度優異,故而較佳。 The amount of the azole compound to be added is preferably 0.1 to 20 parts by mass relative to 100 parts by mass of the polyimide precursor (A), and more preferably 0.5 to 5 parts by mass from the viewpoint of sensitivity characteristics. If the amount of the azole compound to be added is 0.1 parts by mass or more relative to 100 parts by mass of the polyimide precursor (A), discoloration of the surface of copper or copper alloy is suppressed when a photosensitive resin composition is formed on copper or copper alloy. On the other hand, if it is 20 parts by mass or less, the sensitivity is excellent, so it is preferred.

於本實施方式中,為了抑制銅上之變色,感光性樹脂組合物可包含受阻酚化合物。作為受阻酚化合物,例如可例舉:2,6-二-第三丁基-4-甲基苯酚、2,5-二-第三丁基-對苯二酚、3-(3,5-二-第三丁基-4-羥基苯基)丙酸十八烷基酯、3-(3,5-二-第三丁基-4-羥基苯基)丙酸異辛酯、4,4'-亞甲基雙(2,6-二-第三丁基苯酚)、4,4'-硫代-雙(3-甲基-6-第三丁基苯酚)、4,4'-亞丁基-雙(3-甲基-6-第三丁基苯酚)、三乙二醇-雙[3-(3-第三丁基-5-甲基-4-羥基苯基)丙酸酯]、1,6-己二醇-雙[3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯]、2,2-硫代-二伸乙基雙[3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯]、 N,N'-六亞甲基雙(3,5-二-第三丁基-4-羥基-苯丙醯胺)、2,2'-亞甲基-雙(4-甲基-6-第三丁基苯酚)、2,2'-亞甲基-雙(4-乙基-6-第三丁基苯酚)、季戊四醇基-四[3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯]、三-(3,5-二-第三丁基-4-羥基苄基)-異三聚氰酸酯、1,3,5-三甲基-2,4,6-三(3,5-二-第三丁基-4-羥基苄基)苯、1,3,5-三(3-羥基-2,6-二甲基-4-異丙基苄基)-1,3,5-三

Figure 110134871-A0305-12-0035-55
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-3-羥基-2,6-二甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-56
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第二丁基-3-羥基-2,6-二甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-57
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三[4-(1-乙基丙基)-3-羥基-2,6-二甲基苄基]-1,3,5-三
Figure 110134871-A0305-12-0035-58
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三[4-三乙基甲基-3-羥基-2,6-二甲基苄基]-1,3,5-三
Figure 110134871-A0305-12-0035-59
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(3-羥基-2,6-二甲基-4-苯基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-60
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-3-羥基-2,5,6-三甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-61
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-5-乙基-3-羥基-2,6-二甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-62
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-6-乙基-3-羥基-2-甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-63
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-6-乙基-3-羥基-2,5-二甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-64
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-5,6-二乙基-3-羥基-2-甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-65
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-3-羥基-2-甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-66
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-3-羥基-2,5-二甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-67
-2,4,6-(1H,3H,5H)-三酮、1,3,5-三(4-第三丁基-5-乙基-3-羥基-2-甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-68
-2,4,6-(1H,3H,5H)-三酮等;但並不限定於此。該等之中,尤佳為1,3,5-三(4-第三丁基-3-羥基-2,6-二甲基苄基)-1,3,5-三
Figure 110134871-A0305-12-0035-69
-2,4,6-(1H,3H,5H)-三酮。 In the present embodiment, in order to suppress discoloration on copper, the photosensitive resin composition may include a hindered phenol compound. Examples of the hindered phenol compound include: 2,6-di-tert-butyl-4-methylphenol, 2,5-di-tert-butyl-hydroquinone, 3-(3,5-di-tert-butyl-4-hydroxyphenyl) propionate octadecyl ester, 3-(3,5-di-tert-butyl-4-hydroxyphenyl) propionate isooctyl ester, 4,4'-methylenebis(2,6-di-tert-butylphenol), 4,4'-thio-bis(3-methyl- 6-tert-butylphenol), 4,4'-butylene-bis(3-methyl-6-tert-butylphenol), triethylene glycol-bis[3-(3-tert-butyl-5-methyl-4-hydroxyphenyl) propionate], 1,6-hexanediol-bis[3-(3,5-di-tert-butyl-4-hydroxyphenyl) propionate], 2,2-thio-diethylene bis[3-(3,5-di-tert-butyl-4-hydroxyphenyl) propionate], N,N'-hexamethylenebis(3,5-di-tert-butyl-4-hydroxy-phenylpropionamide), 2,2'-methylenebis(4-methyl-6-tert-butylphenol), 2,2'-methylenebis(4-ethyl-6-tert-butylphenol), pentaerythritol-tetrakis[3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate], tris-(3,5-di-tert-butyl-4-hydroxybenzyl)-isocyanurate, 1,3,5-trimethyl-2,4,6-tris(3,5-di-tert-butyl-4-hydroxybenzyl)benzene, 1,3,5-tris(3-hydroxy-2,6-dimethyl-4-isopropylbenzyl)-1,3,5-tris(3-hydroxy-2,6-dimethyl-4-isopropylbenzyl)-1,3,5-tris(3-hydroxy-2,6-dimethyl-4-isopropylbenzyl)-
Figure 110134871-A0305-12-0035-55
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-3-hydroxy-2,6-dimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-56
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tri(4-sec-butyl-3-hydroxy-2,6-dimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-57
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris[4-(1-ethylpropyl)-3-hydroxy-2,6-dimethylbenzyl]-1,3,5-tri
Figure 110134871-A0305-12-0035-58
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris[4-triethylmethyl-3-hydroxy-2,6-dimethylbenzyl]-1,3,5-tri
Figure 110134871-A0305-12-0035-59
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(3-hydroxy-2,6-dimethyl-4-phenylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-60
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-3-hydroxy-2,5,6-trimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-61
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-5-ethyl-3-hydroxy-2,6-dimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-62
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-6-ethyl-3-hydroxy-2-methylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-63
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-6-ethyl-3-hydroxy-2,5-dimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-64
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-5,6-diethyl-3-hydroxy-2-methylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-65
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-3-hydroxy-2-methylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-66
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-3-hydroxy-2,5-dimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-67
-2,4,6-(1H,3H,5H)-trione, 1,3,5-tris(4-tert-butyl-5-ethyl-3-hydroxy-2-methylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-68
-2,4,6-(1H,3H,5H)-trione, etc., but not limited thereto. Among them, 1,3,5-tris(4-tert-butyl-3-hydroxy-2,6-dimethylbenzyl)-1,3,5-tri
Figure 110134871-A0305-12-0035-69
-2,4,6-(1H,3H,5H)-trione.

相對於(A)聚醯亞胺前驅物100質量份,受阻酚化合物之調配量較佳為0.1質量份~20質量份,就感光度特性之觀點而言,更佳為0.5質量份~10質量份。若受阻酚化合物相對於(A)聚醯亞胺前驅物100質量份之調配量為0.1質量份以上,則於例如於銅或銅合金之上形成有感光性樹脂組合物之情形時,銅或銅合金之變色、腐蝕得以防止,另一方面,若為20質量份以下,則感光度優異,故而較佳。 The amount of the hindered phenol compound to be added is preferably 0.1 to 20 parts by mass relative to 100 parts by mass of the polyimide precursor (A). From the perspective of photosensitivity characteristics, it is more preferably 0.5 to 10 parts by mass. If the amount of the hindered phenol compound to be added is 0.1 parts by mass or more relative to 100 parts by mass of the polyimide precursor (A), when a photosensitive resin composition is formed on copper or a copper alloy, discoloration and corrosion of the copper or a copper alloy can be prevented. On the other hand, if it is less than 20 parts by mass, the photosensitivity is excellent, so it is preferred.

本實施方式之感光性樹脂組合物可藉由包括以下步驟之製造方法製造:將上述(A)聚醯亞胺前驅物、上述(B)感光劑、及上述(D)溶劑進行混合之步驟;及將所獲得之混合物於23℃~50℃下老化24小時~360小時,而將醯亞胺化率調整為15%~50%之步驟。 The photosensitive resin composition of the present embodiment can be manufactured by a manufacturing method comprising the following steps: a step of mixing the above-mentioned (A) polyimide precursor, the above-mentioned (B) photosensitive agent, and the above-mentioned (D) solvent; and a step of aging the obtained mixture at 23°C to 50°C for 24 hours to 360 hours to adjust the imidization rate to 15% to 50%.

「老化」係將感光性樹脂組合物於某一固定溫度下靜置一定期間之步驟。老化溫度為23℃~50℃,較佳為30~50℃。老化時間為24小時~360小時,較佳為48小時~280小時。可藉由該老化進行感光性樹脂組合物之消泡,且可將感光性樹脂組合物中之(A)聚醯亞胺前驅物之醯亞胺化率調整為特定範圍。 "Aging" is a step of leaving the photosensitive resin composition at a fixed temperature for a certain period of time. The aging temperature is 23℃~50℃, preferably 30~50℃. The aging time is 24 hours~360 hours, preferably 48 hours~280 hours. The photosensitive resin composition can be defoamed by the aging, and the imidization rate of the (A) polyimide precursor in the photosensitive resin composition can be adjusted to a specific range.

[聚醯亞胺] [Polyimide]

由上述聚醯亞胺前驅物組合物形成之硬化凹凸圖案中所包含之聚醯亞胺較佳為具有下述通式(11)所表示之結構:

Figure 110134871-A0305-12-0037-30
The polyimide contained in the hardened concave-convex pattern formed by the polyimide precursor composition preferably has a structure represented by the following general formula (11):
Figure 110134871-A0305-12-0037-30

{通式(11)中,X1及Y1與通式(1)中之X1及Y1相同,並且m為正整數}。 {In the general formula (11), X1 and Y1 are the same as X1 and Y1 in the general formula (1), and m is a positive integer}.

通式(1)中之較佳之X1與Y1因相同原因,於通式(11)之聚醯亞胺中亦為較佳者。通式(11)之重複單元數m並無特別限定,可為2~150之整數。 Preferred X1 and Y1 in the general formula (1) are also preferred in the polyimide of the general formula (11) for the same reason. The number of repeating units m in the general formula (11) is not particularly limited and can be an integer of 2 to 150.

[硬化膜及其製造方法] [Curing film and its manufacturing method]

本發明之另一實施方式係包括將上述感光性樹脂組合物轉換成聚醯亞胺之步驟之聚醯亞胺硬化膜之製造方法。 Another embodiment of the present invention is a method for producing a polyimide cured film, which includes the step of converting the above-mentioned photosensitive resin composition into polyimide.

即,本實施方式之聚醯亞胺硬化膜之製造方法包括以下步驟(1)~(5):(1)將上述感光性樹脂組合物塗佈於基板上,於該基板上形成感光性樹脂層之步驟;(2)對所獲得之感光性樹脂層進行加熱、乾燥之步驟;(3)對加熱、乾燥後之感光性樹脂層進行曝光之步驟;(4)對曝光後之感光性樹脂層進行顯影之步驟;及(5)對顯影後之感光性樹脂層進行加熱處理而形成聚醯亞胺硬化膜之步驟;於本發明之另一實施方式中,提供一種由上述所說明之感光性樹脂組合物獲得之聚醯亞胺硬化膜、及其製造方法,該硬化膜利用擾動方式分 體圓柱共振器法以10GHz測定之情形時之介電損耗正切較佳為0.0021~0.007,進而較佳為0.0030~0.0065。以28GHz測定之情形時之介電損耗正切較佳為0.0021~0.008,就頻率依存性之觀點而言,更佳為0.0030~0.0075。以40GHz測定之情形時之介電損耗正切較佳為0.0021~0.008,就頻率依存性之觀點而言,更佳為0.0030~0.0075。並且以60GHz測定之情形時之介電損耗正切較佳為0.0021~0.009,就頻率依存性之觀點而言,更佳為0.0030~0.0085。再者,介電損耗正切可藉由下述實施例所示之擾動方式分體圓柱共振器法進行測定。 That is, the method for producing a polyimide cured film of the present embodiment comprises the following steps (1) to (5): (1) coating the above-mentioned photosensitive resin composition on a substrate to form a photosensitive resin layer on the substrate; (2) heating and drying the obtained photosensitive resin layer; (3) exposing the heated and dried photosensitive resin layer; (4) developing the exposed photosensitive resin layer; and (5) developing the developed photosensitive resin layer. The present invention further comprises a step of heat-treating the photosensitive resin layer to form a polyimide cured film. In another embodiment of the present invention, a polyimide cured film obtained from the photosensitive resin composition described above and a method for producing the same are provided. The dielectric loss tangent of the cured film is preferably 0.0021 to 0.007 when measured at 10 GHz using a perturbation split cylindrical resonator method, and more preferably 0.0030 to 0.0065. The dielectric loss tangent is preferably 0.0021 to 0.008 when measured at 28 GHz, and more preferably 0.0030 to 0.0075 from the viewpoint of frequency dependence. The dielectric loss tangent when measured at 40 GHz is preferably 0.0021 to 0.008, and from the perspective of frequency dependence, it is more preferably 0.0030 to 0.0075. And the dielectric loss tangent when measured at 60 GHz is preferably 0.0021 to 0.009, and from the perspective of frequency dependence, it is more preferably 0.0030 to 0.0085. Furthermore, the dielectric loss tangent can be measured by the perturbation split cylindrical resonator method shown in the following embodiment.

硬化膜之製造方法中所使用之感光性樹脂組合物較佳為包含聚醯亞胺前驅物:100質量份、感光劑:0.5~10質量份、及溶劑:100~300質量份,更佳為包含光自由基聚合起始劑作為感光劑,進而較佳為感光性樹脂組合物為負型。 The photosensitive resin composition used in the method for manufacturing the hardened film preferably comprises 100 parts by mass of a polyimide precursor, 0.5 to 10 parts by mass of a photosensitive agent, and 100 to 300 parts by mass of a solvent, and more preferably comprises a photo-radical polymerization initiator as a photosensitive agent, and further preferably the photosensitive resin composition is a negative type.

硬化膜之製造方法中之具體步驟可依據上述硬化膜之製造方法之步驟(1)~(5)來進行。 The specific steps in the method for manufacturing the hardened film can be carried out according to steps (1) to (5) of the above-mentioned method for manufacturing the hardened film.

以下,對各步驟進行說明。 The following describes each step.

[(1)將上述感光性樹脂組合物塗佈於基板上,而於該基板上形成感光性樹脂層之步驟] [(1) The above-mentioned photosensitive resin composition is applied on a substrate to form a photosensitive resin layer on the substrate]

於本步驟中,將本實施方式之感光性樹脂組合物塗佈於基材上,視需要其後使之乾燥,形成感光性樹脂層。作為塗佈方法,可使用先前以來用於塗佈感光性樹脂組合物之方法,例如利用旋轉塗佈機、棒式塗佈機、 刮刀塗佈機、簾幕式塗佈機、網版印刷機等塗佈之方法、利用噴霧塗佈機進行噴霧塗佈之方法等。 In this step, the photosensitive resin composition of the present embodiment is applied to the substrate and then dried as needed to form a photosensitive resin layer. As the coating method, a method previously used for coating the photosensitive resin composition can be used, such as a coating method using a rotary coater, a rod coater, a doctor blade coater, a curtain coater, a screen printer, etc., a method of spray coating using a spray coater, etc.

[(2)對所獲得之感光性樹脂層進行加熱、乾燥之步驟] [(2) Heating and drying the obtained photosensitive resin layer]

可視需要使由感光性樹脂組合物構成之塗膜乾燥,並且作為乾燥方法,例如使用風乾、藉由烘箱或加熱板進行之加熱乾燥、真空乾燥等方法。又,塗膜之乾燥較理想為於不會產生感光性樹脂組合物中之(A)聚醯亞胺前驅物之醯亞胺化之條件下進行。具體而言,於進行風乾或加熱乾燥之情形時,可於20℃~140℃且1分鐘~1小時之條件下進行乾燥。藉由以上,可於基板上形成感光性樹脂層。 The coating composed of the photosensitive resin composition can be dried as needed, and as a drying method, air drying, heat drying by an oven or a heating plate, vacuum drying, etc. are used. In addition, the drying of the coating is preferably carried out under conditions that do not produce imidization of the (A) polyimide precursor in the photosensitive resin composition. Specifically, when air drying or heat drying is carried out, the drying can be carried out under conditions of 20°C to 140°C and 1 minute to 1 hour. By the above, a photosensitive resin layer can be formed on the substrate.

[(3)對加熱、乾燥後之感光性樹脂層進行曝光之步驟] [(3) The step of exposing the heated and dried photosensitive resin layer]

於本步驟中,使用接觸式對準機、鏡面投影曝光機、步進機等曝光裝置,並藉由紫外線光源等經由具有圖案之光罩或主光罩(reticle)或直接對經過上述(2)步驟之感光性樹脂層進行曝光。 In this step, an exposure device such as a contact aligner, a mirror projection exposure machine, a stepper, etc. is used, and an ultraviolet light source is used to expose the photosensitive resin layer that has passed through the above (2) step through a patterned mask or a main mask (reticle) or directly.

此後,為了提高感光度等,亦可視需要以任意溫度及時間之組合實施曝光後烘烤(PEB)及/或顯影前烘烤。關於烘烤條件之範圍,溫度較佳為40℃~120℃,時間較佳為10秒~240秒,但並不限定於該範圍,只要無損負型感光性樹脂組合物之各特性即可。聚醯亞胺前驅物之醯亞胺化率於烘烤前後不會改變。 After that, in order to improve the sensitivity, etc., post-exposure baking (PEB) and/or pre-development baking can be performed at any temperature and time combination as needed. Regarding the range of baking conditions, the temperature is preferably 40℃~120℃, and the time is preferably 10 seconds~240 seconds, but it is not limited to this range as long as the properties of the negative photosensitive resin composition are not damaged. The imidization rate of the polyimide precursor will not change before and after baking.

[(4)對曝光後之感光性樹脂層進行顯影之步驟] [(4) The step of developing the exposed photosensitive resin layer]

於本步驟中,對曝光後之感光性樹脂層進行顯影,形成凹凸圖案。 In this step, the exposed photosensitive resin layer is developed to form a concave-convex pattern.

於本步驟中,於感光性樹脂組合物為負型之情形時,將曝光後之感光性樹脂層中之未曝光部顯影去除。作為對曝光(照射)後之感光性樹脂層進行顯影之顯影方法,可自先前已知之光阻之顯影方法、例如旋轉噴霧法、覆液法、伴有超音波處理之浸漬法等中選擇任意方法來使用。又,顯影後,為了調整凹凸圖案之形狀等,亦可視需要以任意溫度及時間之組合實施顯影後烘烤。作為用於顯影之顯影液,例如較佳為針對負型感光性樹脂組合物之良溶劑或該良溶劑與不良溶劑之組合。作為良溶劑,例如較佳為N-甲基-2-吡咯啶酮、N-環己基-2-吡咯啶酮、N,N-二甲基乙醯胺、環戊酮、環己酮、γ-丁內酯、α-乙醯基-γ-丁內酯等。作為不良溶劑,例如較佳為甲苯、二甲苯、甲醇、乙醇、異丙醇、乳酸乙酯、丙二醇甲醚乙酸酯及水等。於將良溶劑與不良溶劑混合使用之情形時,較佳為根據負型感光性樹脂組合物中之聚合物之溶解性調整不良溶劑相對於良溶劑之比率。又,亦可將2種以上、例如數種各溶劑組合使用。 In this step, when the photosensitive resin composition is negative, the unexposed part of the photosensitive resin layer after exposure is developed and removed. As a developing method for developing the photosensitive resin layer after exposure (irradiation), any method can be selected from previously known photoresist developing methods, such as a rotary spray method, a liquid coating method, an immersion method accompanied by ultrasonic treatment, etc. In addition, after development, in order to adjust the shape of the concave-convex pattern, post-development baking can be performed at any combination of temperature and time as needed. As a developer used for development, for example, a good solvent for a negative photosensitive resin composition or a combination of the good solvent and a poor solvent is preferred. As good solvents, for example, N-methyl-2-pyrrolidone, N-cyclohexyl-2-pyrrolidone, N,N-dimethylacetamide, cyclopentanone, cyclohexanone, γ-butyrolactone, α-acetyl-γ-butyrolactone, etc. are preferred. As poor solvents, for example, toluene, xylene, methanol, ethanol, isopropanol, ethyl lactate, propylene glycol methyl ether acetate, and water are preferred. When a good solvent and a poor solvent are mixed for use, it is preferred to adjust the ratio of the poor solvent to the good solvent according to the solubility of the polymer in the negative photosensitive resin composition. In addition, two or more solvents, for example, several solvents, may be used in combination.

[(5)對顯影後之感光性樹脂層進行加熱處理而形成聚醯亞胺硬化膜之步驟] [(5) The step of heat-treating the developed photosensitive resin layer to form a polyimide cured film]

於本步驟中,對藉由上述顯影而獲得之凹凸圖案進行加熱而使感光成分分散,並且使(A)聚醯亞胺前驅物醯亞胺化,藉此轉化成包含聚醯亞胺之硬化凹凸圖案。作為加熱硬化之方法,例如可選擇藉由加熱板之方法、使用烘箱之方法、使用可設定溫度程式之升溫式烘箱之方法等各種方法。加熱例如可於150℃~400℃且30分鐘~5小時之條件下進行。作為加熱硬化時之環境氣體,可使用空氣,亦可使用氮氣、氬氣等惰性氣體。 In this step, the concave-convex pattern obtained by the above-mentioned development is heated to disperse the photosensitive components, and the (A) polyimide precursor is imidized to convert it into a hardened concave-convex pattern containing polyimide. As a method of heat curing, various methods can be selected, such as a method using a heating plate, a method using an oven, and a method using a temperature-raising oven with a settable temperature program. Heating can be performed at 150°C to 400°C for 30 minutes to 5 hours. As an ambient gas during heat curing, air can be used, and inert gases such as nitrogen and argon can also be used.

[半導體裝置] [Semiconductor devices]

亦可使用本實施方式之感光性樹脂組合物提供一種具有藉由上述硬化凹凸圖案之製造方法而獲得之硬化凹凸圖案的半導體裝置。因此,可提供一種具有作為半導體元件之基材、及藉由上述硬化凹凸圖案製造方法形成於該基材上之聚醯亞胺之硬化凹凸圖案的半導體裝置。又,另一實施方式亦可應用於將半導體元件用作基材且包含上述硬化凹凸圖案之製造方法作為步驟之一部分的半導體裝置之製造方法。本實施方式之半導體裝置可藉由如下方式製造:形成利用上述硬化凹凸圖案製造方法而形成之硬化凹凸圖案作為表面保護膜、層間絕緣膜、再配線用絕緣膜、覆晶裝置用保護膜或具有凸塊結構之半導體裝置之保護膜等,並與已知之半導體裝置之製造方法進行組合。 The photosensitive resin composition of this embodiment can also be used to provide a semiconductor device having a hardened concave-convex pattern obtained by the above-mentioned method for manufacturing a hardened concave-convex pattern. Therefore, a semiconductor device having a substrate as a semiconductor element and a hardened concave-convex pattern of polyimide formed on the substrate by the above-mentioned method for manufacturing a hardened concave-convex pattern can be provided. In addition, another embodiment can also be applied to a method for manufacturing a semiconductor device that uses a semiconductor element as a substrate and includes the above-mentioned method for manufacturing a hardened concave-convex pattern as a part of the steps. The semiconductor device of this embodiment can be manufactured by forming the hardened concave-convex pattern formed by the above-mentioned hardened concave-convex pattern manufacturing method as a surface protective film, an interlayer insulating film, an insulating film for redistribution, a protective film for a flip chip device, or a protective film for a semiconductor device with a bump structure, etc., and combining it with a known semiconductor device manufacturing method.

[顯示體裝置] [Display device]

亦可使用本實施方式之感光性樹脂組合物提供一種顯示體裝置,其係具備顯示體元件及設置於該顯示體元件之上部之硬化膜者,且該硬化膜係上述硬化凹凸圖案。此處,該硬化凹凸圖案可與該顯示體元件直接相接地積層,亦可隔著其他層積層。例如,作為該硬化膜,可例舉:TFT(Thin Film Transistor,薄膜電晶體)液晶顯示元件及彩色濾光片元件之表面保護膜、絕緣膜、及平坦化膜、MVA(Multi-Domain Vertical Alignment,多域垂直配向)型液晶顯示裝置用之突起、以及有機EL(Electroluminescence,電致發光)元件陰極用之間隔壁。 The photosensitive resin composition of the present embodiment can also be used to provide a display device having a display element and a cured film disposed on the upper portion of the display element, and the cured film is the above-mentioned cured concave-convex pattern. Here, the cured concave-convex pattern can be directly laminated with the display element or sandwiched by other layers. For example, the cured film can be exemplified as: surface protection films, insulating films, and planarization films of TFT (Thin Film Transistor) liquid crystal display elements and color filter elements, protrusions for MVA (Multi-Domain Vertical Alignment) type liquid crystal display devices, and partitions for cathodes of organic EL (Electroluminescence) elements.

本實施方式之感光性樹脂組合物除可應用於如上述之半導體裝置以 外,亦可用於多層電路之層間絕緣、可撓性覆銅板之覆蓋塗層、阻焊劑膜、及液晶配向膜等用途。 In addition to being applicable to the semiconductor devices described above, the photosensitive resin composition of this embodiment can also be used for interlayer insulation of multilayer circuits, covering coatings of flexible copper-clad boards, solder resist films, and liquid crystal alignment films.

[實施例] [Implementation example]

以下,藉由實施例對本發明具體地進行說明,但本發明並不限定於實施例。於實施例、比較例及製造例中,依據以下方法對感光性樹脂組合物之物性進行測定及評價。 The present invention is described in detail below by way of examples, but the present invention is not limited to the examples. In the examples, comparative examples and manufacturing examples, the physical properties of the photosensitive resin composition are measured and evaluated according to the following methods.

[測定及評價方法] [Measurement and evaluation methods] (1)重量平均分子量 (1) Weight average molecular weight

利用凝膠滲透層析法(標準聚苯乙烯換算)測定各樹脂之重量平均分子量(Mw)。用於測定之管柱為昭和電工(股)製造之商標名「Shodex 805M/806M串聯」,標準單分散聚苯乙烯選擇昭和電工(股)製造之商標名「Shodex STANDARD SM-105」,展開溶劑為N-甲基-2-吡咯啶酮,檢測器使用昭和電工(股)製造之商標名「Shodex RI-930」。 The weight average molecular weight (Mw) of each resin was determined by gel permeation chromatography (converted to standard polystyrene). The column used for the determination was the "Shodex 805M/806M series" manufactured by Showa Denko (Co., Ltd.), the standard monodisperse polystyrene was the "Shodex STANDARD SM-105" manufactured by Showa Denko (Co., Ltd.), the developing solvent was N-methyl-2-pyrrolidone, and the detector was the "Shodex RI-930" manufactured by Showa Denko (Co., Ltd.).

(2)硬化膜之醯亞胺化指數之測定 (2) Determination of the imidization index of the hardened film

使用濺鍍裝置(型號L-440S-FHL,CANON ANELVA公司製造)於6英吋矽晶圓(Fujimi電子工業股份有限公司製造,厚度625±25μm)上依序濺鍍厚200nm之Ti、厚400nm之Cu。繼而,使用塗佈顯影器(型號D-Spin60A,SOKUDO公司製造)將藉由下述方法而製備之感光性樹脂組合物旋轉塗佈於該晶圓上,於加熱板上以110℃加熱乾燥3分鐘,藉此形成厚約15μm之感光性樹脂層。使用附試驗圖案之光罩,並藉由安裝有i射線 過濾器之Prisma GHI(Ultratech公司製造)對該感光性樹脂層照射200mJ/cm2之能量。 A 6-inch silicon wafer (Fujimi Electronics Co., Ltd., thickness 625±25 μm) was sputter-coated with 200 nm thick Ti and 400 nm thick Cu in sequence using a sputtering device (model L-440S-FHL, manufactured by CANON ANELVA). Then, a photosensitive resin composition prepared by the following method was spin-coated on the wafer using a coating developer (model D-Spin60A, manufactured by SOKUDO), and dried by heating at 110°C on a heating plate for 3 minutes to form a photosensitive resin layer with a thickness of about 15 μm. Using a photomask with a test pattern, the photosensitive resin layer was irradiated with an energy of 200 mJ/ cm2 by a Prisma GHI (manufactured by Ultratech) equipped with an i-ray filter.

使用升溫程式式熱化爐(型號VF-2000,Koyo Lindberg公司製造)將於Cu上形成有該凹凸圖案之晶圓於氮氣氛圍下於350℃下進行2小時加熱處理,藉此於Cu上獲得由厚約10μm之樹脂構成之硬化凹凸圖案。 The wafer with the concave-convex pattern formed on Cu was heated at 350°C for 2 hours in a nitrogen atmosphere using a temperature-programmed thermal furnace (model VF-2000, manufactured by Koyo Lindberg), thereby obtaining a hardened concave-convex pattern composed of a resin with a thickness of about 10μm on Cu.

利用ATR-FTIR測定裝置(Nicolet Continuum、Thermo Fisher Scientific公司製造)並使用Si稜鏡對該硬化凹凸圖案進行測定,於測定範圍4000~700cm-1以測定次數50次進行測定。藉由求出硬化膜之1380cm-1附近(1350~1450cm-1,於存在複數個波峰之情形時為波峰強度最大者)之波峰高度與1500cm-1附近(1460~1550cm-1,於存在複數個波峰之情形時為波峰強度最大者)之波峰高度而算出。 The hardened concavoconvex pattern was measured using an ATR-FTIR measuring device (Nicolet Continuum, manufactured by Thermo Fisher Scientific) and a Si prism, and the measurement was performed 50 times in the measurement range of 4000-700 cm -1 . The peak height near 1380 cm -1 (1350-1450 cm -1 , when there are multiple peaks, the peak intensity is the largest) and the peak height near 1500 cm -1 (1460-1550 cm -1 , when there are multiple peaks, the peak intensity is the largest) of the cured film were calculated.

(3)感光性樹脂組合物之醯亞胺化率測定 (3) Determination of the imidization rate of photosensitive resin compositions

使用濺鍍裝置(型號L-440S-FHL,CANON ANELVA公司製造)於6英吋矽晶圓(Fujimi電子工業股份有限公司製造,厚度625±25μm)上依序濺鍍厚200nm之Ti、厚400nm之Cu。繼而,使用塗佈顯影器(型號D-Spin60A,SOKUDO公司製造)將藉由下述方法而製備之感光性樹脂組合物旋轉塗佈於該晶圓上,於加熱板上以110℃加熱乾燥3分鐘,藉此形成厚約10μm之感光性樹脂層。 A sputtering device (model L-440S-FHL, manufactured by CANON ANELVA) was used to sequentially sputter-coat 200nm thick Ti and 400nm thick Cu on a 6-inch silicon wafer (manufactured by Fujimi Electronics Co., Ltd., thickness 625±25μm). Then, a coating developer (model D-Spin60A, manufactured by SOKUDO) was used to spin-coat the photosensitive resin composition prepared by the following method on the wafer, and dried at 110°C on a heating plate for 3 minutes to form a photosensitive resin layer with a thickness of about 10μm.

利用ATR-FTIR測定裝置(Nicolet Continuum、Thermo Fisher Scientific公司製造)並使用Si稜鏡對上述感光性樹脂層進行測定,於測定範圍4000~700cm-1以測定次數50次進行測定。算出硬化膜之1380cm-1附近(1350~1450cm-1,於存在複數個波峰之情形時為波峰強度最大者) 之波峰高度與除以1500cm-1附近(1460~1550cm-1,於存在複數個波峰之情形時為波峰強度最大者)之波峰高度所得之值作為感光性樹脂層之醯亞胺化指數,算出各實施例及比較例之樹脂組合物之感光性樹脂層之醯亞胺化指數除以將該樹脂組合物於350℃下硬化而成之硬化膜之醯亞胺化指數所得之值作為醯亞胺化率。 The photosensitive resin layer was measured using an ATR-FTIR measuring device (Nicolet Continuum, manufactured by Thermo Fisher Scientific) and a Si prism, and the measurement was performed 50 times in the measurement range of 4000 to 700 cm -1 . The value obtained by calculating the peak height of the cured film at around 1380 cm -1 (1350-1450 cm -1 , the peak intensity is the largest when multiple peaks exist) and dividing it by the peak height at around 1500 cm -1 (1460-1550 cm -1 , the peak intensity is the largest when multiple peaks exist) is taken as the imidization index of the photosensitive resin layer. The value obtained by dividing the imidization index of the photosensitive resin layer of the resin composition of each Example and Comparative Example by the imidization index of the cured film formed by curing the resin composition at 350° C. is taken as the imidization rate.

(4)Cu上之硬化凹凸圖案之解像度 (4) Resolution of hardened concave-convex pattern on Cu

使用濺鍍裝置(型號L-440S-FHL,CANON ANELVA公司製造)於6英吋矽晶圓(Fujimi電子工業股份有限公司製造,厚度625±25μm)上依序濺鍍厚200nm之Ti、厚400nm之Cu。繼而,使用塗佈顯影器(型號D-Spin60A,SOKUDO公司製造)將藉由下述方法而製備之感光性樹脂組合物旋轉塗佈於該晶圓上,於加熱板上以110℃加熱乾燥3分鐘,藉此形成厚約25μm之感光性樹脂層。使用附試驗圖案之光罩,並藉由安裝有i射線過濾器之Prisma GHI(Ultratech公司製造)對該感光性樹脂層照射200mJ/cm2之能量。繼而,使用環戊酮作為顯影液並利用塗佈顯影器(型號D-Spin60A,SOKUDO公司製造)對該感光性樹脂層進行噴霧顯影,並用丙二醇甲醚乙酸酯進行沖洗,藉此獲得Cu上之凹凸圖案。 A 6-inch silicon wafer (Fujimi Electronics Co., Ltd., thickness 625±25 μm) was sputter-coated with 200 nm thick Ti and 400 nm thick Cu in sequence using a sputtering device (model L-440S-FHL, manufactured by CANON ANELVA). Then, a photosensitive resin composition prepared by the following method was spin-coated on the wafer using a coating developer (model D-Spin60A, manufactured by SOKUDO), and dried by heating at 110°C on a heating plate for 3 minutes to form a photosensitive resin layer with a thickness of about 25 μm. Using a photomask with a test pattern, the photosensitive resin layer was irradiated with an energy of 200 mJ/ cm2 by a Prisma GHI (manufactured by Ultratech) equipped with an i-ray filter. Then, the photosensitive resin layer was spray developed using cyclopentanone as a developer and a coating developer (model D-Spin60A, manufactured by SOKUDO) and rinsed with propylene glycol methyl ether acetate to obtain a concave-convex pattern on Cu.

使用升溫程式式熱化爐(型號VF-2000,Koyo Lindberg公司製造)將於Cu上形成有該凹凸圖案之晶圓於氮氣氛圍下於230℃下進行2小時加熱處理,藉此於Cu上獲得由厚約20μm之樹脂構成之硬化凹凸圖案。 The wafer with the concave-convex pattern formed on Cu was heated at 230°C for 2 hours in a nitrogen atmosphere using a temperature-programmed thermal furnace (model VF-2000, manufactured by Koyo Lindberg), thereby obtaining a hardened concave-convex pattern composed of a resin with a thickness of about 20μm on Cu.

於光學顯微鏡下對所製作之凹凸圖案進行觀察,求出最小開口圖案之尺寸。此時,若所獲得之圖案之開口部之面積為對應圖案光罩開口面積之1/2以上,則視作經解像者,基於與經解像之開口部中具有最小面積者 對應之光罩開口邊之長度(開口圖案之尺寸)並以以下評價基準測定解像度。 The produced concave-convex pattern is observed under an optical microscope to find the size of the smallest opening pattern. At this time, if the area of the opening of the obtained pattern is more than 1/2 of the opening area of the corresponding pattern mask, it is considered to be resolved. Based on the length of the mask opening side corresponding to the opening with the smallest area among the resolved openings (the size of the opening pattern), the resolution is measured according to the following evaluation criteria.

(評價基準) (Evaluation criteria)

「優」:最小開口圖案之尺寸未達25μm "Excellent": The minimum opening pattern size is less than 25μm

「良」:最小開口圖案之尺寸為25μm以上且未達30μm "Good": The minimum opening pattern size is greater than 25μm and less than 30μm

「合格」:最小開口圖案之尺寸為30μm以上且未達35μm "Qualified": The minimum opening pattern size is greater than 30μm and less than 35μm

「不合格」:最小開口圖案之尺寸為35μm以上。 "Unqualified": The minimum opening pattern size is greater than 35μm.

(5)比介電常數(Dk)、介電損耗正切(Df)之測定 (5) Determination of relative dielectric constant (Dk) and dielectric loss tangent (Df)

使用濺鍍裝置(型號L-440S-FHL,CANON ANELVA公司製造)於6英吋矽晶圓(Fujimi電子工業股份有限公司製造,厚度625±25μm)上濺鍍厚100nm之鋁(Al),準備濺鍍Al晶圓基板。 A sputtering device (model L-440S-FHL, manufactured by CANON ANELVA) was used to sputter-coat 100nm thick aluminum (Al) on a 6-inch silicon wafer (manufactured by Fujimi Electronics Co., Ltd., thickness 625±25μm) to prepare a sputter-coated Al wafer substrate.

使用旋轉塗佈裝置(型號D-spin60A,SOKUDO公司製造)將負型感光性樹脂組合物旋轉塗佈於上述濺鍍Al晶圓基板,以110℃加熱乾燥180秒,製作旋轉塗佈膜。其後,使用對準機(PLA-501F,Canon公司製造)以曝光量600mJ/cm2之ghi射線進行整面曝光,使用縱型熱化爐(Koyo Lindberg製造,型號名VF-2000B)於氮氣氛圍下於230℃下實施2小時加熱硬化處理,製作硬化膜。硬化膜之膜厚利用下述方法進行測定。使用晶圓切割機(DISCO製造,型號名DAD-2H/6T)將該硬化膜切成長80mm、寬60mm或長40mm、寬30mm,浸漬於10%鹽酸水溶液中並自矽晶圓上剝離,製成膜樣品。 The negative photosensitive resin composition was spin-coated on the above-mentioned sputtered Al wafer substrate using a spin coater (model D-spin60A, manufactured by SOKUDO), and dried by heating at 110°C for 180 seconds to form a spin-coated film. Thereafter, the entire surface was exposed to ghi rays at an exposure amount of 600mJ/ cm2 using an aligner (PLA-501F, manufactured by Canon), and heat-cured at 230°C for 2 hours in a nitrogen atmosphere using a longitudinal thermal furnace (model VF-2000B manufactured by Koyo Lindberg) to form a cured film. The film thickness of the cured film was measured by the following method. The hardened film was cut into 80 mm long and 60 mm wide or 40 mm long and 30 mm wide using a wafer dicing machine (manufactured by DISCO, model name DAD-2H/6T), immersed in a 10% hydrochloric acid aqueous solution and peeled off from a silicon wafer to prepare a film sample.

針對膜樣品,利用共振微擾法分別測定10、28、40、60GHz下之比 介電常數(Dk)與介電損耗正切(Df)。測定方法之詳細內容如下。 For the film samples, the relative dielectric constant (Dk) and dielectric loss tangent (Df) at 10, 28, 40, and 60 GHz were measured using the resonance perturbation method. The details of the measurement method are as follows.

(測定方法) (Measurement method)

擾動方式分體圓柱共振器法 Perturbation method: split cylindrical resonator method

(裝置構成) (Device structure)

網路分析儀:PNA Network analyzer E5224B Network analyzer: PNA Network analyzer E5224B

(Agilent technologies公司製造) (Made by Agilent technologies)

分體圓柱共振器:CR-710(關東電子應用開發公司製造,測定頻率:約10GHz)、CR-728(關東電子應用開發公司製造,測定頻率:約28GHz)、CR-740(關東電子應用開發公司製造,測定頻率:約40GHz)、CR-760(關東電子應用開發公司製造,測定頻率:約60GHz) Split cylindrical resonator: CR-710 (manufactured by Kanto Electronics Application Development Co., Ltd., measured frequency: about 10GHz), CR-728 (manufactured by Kanto Electronics Application Development Co., Ltd., measured frequency: about 28GHz), CR-740 (manufactured by Kanto Electronics Application Development Co., Ltd., measured frequency: about 40GHz), CR-760 (manufactured by Kanto Electronics Application Development Co., Ltd., measured frequency: about 60GHz)

(6)吸光度 (6) Absorbance

使用手動旋轉塗佈機(ELS306MA、SEBACS公司製造)將負型感光性樹脂組合物旋轉塗佈於石英玻璃(長50mm、寬50mm、厚1mm)上,以110℃加熱乾燥180秒,製作旋轉塗佈膜。手動旋轉塗佈機之轉數以旋轉塗佈膜成為10μm之方式設定。 A manual spin coater (ELS306MA, manufactured by SEBACS) was used to spin coat the negative photosensitive resin composition on quartz glass (50 mm long, 50 mm wide, 1 mm thick), and dried at 110°C for 180 seconds to produce a spin-coated film. The rotation speed of the manual spin coater was set so that the spin-coated film would be 10 μm.

所獲得之旋轉塗佈膜係使用紫外可見(UV-VIS)分光光度計(UV-1800,島津製作所製造)進行測定。測定365nm下之吸光度,並依據朗伯-比爾定律換算成1μm,求出吸光度。 The obtained spin-coated film was measured using an ultraviolet visible (UV-VIS) spectrophotometer (UV-1800, manufactured by Shimadzu Corporation). The absorbance at 365nm was measured and converted to 1μm according to the Lambert-Beer law to obtain the absorbance.

[(A)聚醯亞胺前驅物之製造] [(A) Production of polyimide precursors] <製造例1>((A)聚醯亞胺前驅物(聚合物A-1)之合成) <Production Example 1> ((A) Synthesis of polyimide precursor (polymer A-1))

將4,4'-氧二鄰苯二甲酸二酐(ODPA)155.1g放入2升容量之可分離式 燒瓶中,添加甲基丙烯酸2-羥基乙酯(HEMA)134.0g及γ-丁內酯400ml,一面於室溫下進行攪拌,一面添加吡啶79.1g,獲得反應混合物。基於反應之發熱結束後,放冷至室溫為止,進而靜置16小時。 Place 155.1 g of 4,4'-oxydiphthalic anhydride (ODPA) in a 2-liter separable flask, add 134.0 g of 2-hydroxyethyl methacrylate (HEMA) and 400 ml of γ-butyrolactone, and add 79.1 g of pyridine while stirring at room temperature to obtain a reaction mixture. After the heat of the reaction ends, cool to room temperature and let stand for 16 hours.

繼而,於冰冷下,一面進行攪拌,一面將使二環己基碳二醯亞胺(DCC)206.3g溶解於γ-丁內酯180ml中而成之溶液歷時40分鐘添加至反應混合物中,繼而一面進行攪拌,一面歷時60分鐘添加將4,4'-氧二苯胺(ODA)93.0g懸浮於γ-丁內酯350ml中而成之懸浮液。進而於室溫下攪拌2小時後,添加乙醇30ml並攪拌1小時,然後添加γ-丁內酯400ml。藉由過濾將反應混合物中所產生之沈澱物去除,獲得反應液。 Next, under ice cooling, a solution of 206.3 g of dicyclohexylcarbodiimide (DCC) dissolved in 180 ml of γ-butyrolactone was added to the reaction mixture over 40 minutes while stirring, and then a suspension of 93.0 g of 4,4'-oxydiphenylamine (ODA) suspended in 350 ml of γ-butyrolactone was added over 60 minutes while stirring. After stirring at room temperature for 2 hours, 30 ml of ethanol was added and stirred for 1 hour, and then 400 ml of γ-butyrolactone was added. The precipitate produced in the reaction mixture was removed by filtration to obtain a reaction solution.

將所獲得之反應液添加至3升之乙醇中,生成包含粗聚合物之沈澱物。對所生成之粗聚合物進行濾取,將其溶解於四氫呋喃1.5升中,獲得粗聚合物溶液。使用陰離子交換樹脂(Organo股份有限公司製造之「AmberlystTM 15」)對所獲得之粗聚合物溶液進行精製,獲得聚合物溶液。將所獲得之聚合物溶液滴加至28升之水中而使聚合物沈澱,濾取所獲得之沈澱物後進行真空乾燥,藉此獲得粉末狀聚合物A-1。 The obtained reaction solution was added to 3 liters of ethanol to generate a precipitate containing a crude polymer. The generated crude polymer was filtered and dissolved in 1.5 liters of tetrahydrofuran to obtain a crude polymer solution. The obtained crude polymer solution was purified using an anion exchange resin ("Amberlyst TM 15" manufactured by Organo Co., Ltd.) to obtain a polymer solution. The obtained polymer solution was added dropwise to 28 liters of water to precipitate the polymer, and the obtained precipitate was filtered and vacuum dried to obtain a powdered polymer A-1.

測定該聚合物A-1之重量平均分子量(Mw),結果為22,000。由聚合物A-1獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為27.4wt%。 The weight average molecular weight (Mw) of the polymer A-1 was measured to be 22,000. The imide group concentration of each repeating unit of the polyimide obtained from polymer A-1 was 27.4wt%.

<製造例2>(聚醯亞胺前驅物(聚合物A-2)之合成) <Production Example 2> (Synthesis of polyimide precursor (polymer A-2))

於上述製造例1中,使用2,2-雙{4-(4-胺基苯氧基)苯基}丙烷(BAPP)175.9g代替ODA93.0g,除此以外,以與製造例1所記載之方法相 同之方式進行反應,藉此獲得聚合物A-2。 In the above-mentioned Preparation Example 1, 175.9 g of 2,2-bis{4-(4-aminophenoxy)phenyl}propane (BAPP) was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1 to obtain polymer A-2.

測定該聚合物A-2之重量平均分子量(Mw),結果為24,000。由聚合物A-2獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為19.4wt%。 The weight average molecular weight (Mw) of the polymer A-2 was measured to be 24,000. The imide group concentration of each repeating unit of the polyimide obtained from polymer A-2 was 19.4wt%.

<製造例3>(聚醯亞胺前驅物(聚合物A-3)之合成) <Production Example 3> (Synthesis of polyimide precursor (polymer A-3))

於上述製造例1中,使用雙{4-(4-胺基苯氧基)苯基}酮(BAPK)169.9g代替ODA93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-3。 In the above-mentioned Preparation Example 1, 169.9 g of bis{4-(4-aminophenoxy)phenyl}ketone (BAPK) was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1 to obtain polymer A-3.

測定該聚合物A-3之重量平均分子量(Mw),結果為21,000。由聚合物A-3獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為21.5wt%。 The weight average molecular weight (Mw) of the polymer A-3 was measured to be 21,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-3 was 21.5wt%.

<製造例4>(聚醯亞胺前驅物(聚合物A-4)之合成) <Production Example 4> (Synthesis of polyimide precursor (polymer A-4))

於上述製造例1中,使用4,4'-(4,4'-亞異丙基二苯氧基)酸二酐(BPADA)260.2g代替ODPA 155.1g,使用BAPP 175.9g代替ODA 93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-4。 In the above-mentioned Preparation Example 1, 260.2 g of 4,4'-(4,4'-isopropyldiphenoxy) acid dianhydride (BPADA) was used instead of 155.1 g of ODPA, and 175.9 g of BAPP was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1, thereby obtaining polymer A-4.

測定該聚合物A-4之重量平均分子量(Mw),結果為29,000。由聚合物A-4獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為15.0wt%。 The weight average molecular weight (Mw) of the polymer A-4 was measured to be 29,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-4 was 15.0wt%.

<製造例5>(聚醯亞胺前驅物(聚合物A-5)之合成) <Production Example 5> (Synthesis of polyimide precursor (polymer A-5))

於上述製造例2中,使用BPADA 260.2g代替ODPA 155.1g,使用BAPK 169.9g代替ODA 93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-5。 In the above-mentioned Preparation Example 2, 260.2 g of BPADA was used instead of 155.1 g of ODPA, and 169.9 g of BAPK was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1, thereby obtaining polymer A-5.

測定該聚合物A-5之重量平均分子量(Mw),結果為28,000。由聚合物A-5獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為16.3wt%。 The weight average molecular weight (Mw) of the polymer A-5 was measured to be 28,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-5 was 16.3wt%.

<製造例6>(聚醯亞胺前驅物(聚合物A-6)之合成) <Production Example 6> (Synthesis of polyimide precursor (polymer A-6))

於上述製造例1中,使用ODPA 77.6g、BPADA 130.1g代替ODPA 155.1g,使用BAPP 175.9g代替ODA 93.0g,除此以外以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-6。 In the above-mentioned Preparation Example 1, 77.6 g of ODPA and 130.1 g of BPADA were used instead of 155.1 g of ODPA, and 175.9 g of BAPP was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1, thereby obtaining polymer A-6.

測定該聚合物A-6之重量平均分子量(Mw),結果為24,000。由聚合物A-6獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為17.0wt%。 The weight average molecular weight (Mw) of the polymer A-6 was measured to be 24,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-6 was 17.0wt%.

<製造例7>(聚醯亞胺前驅物(聚合物A-7)之合成) <Production Example 7> (Synthesis of polyimide precursor (polymer A-7))

於上述製造例1中,使用二苯基-3,3',4,4'-四羧酸二酐(BPDA)73.6g、BPADA 130.1g代替ODPA 155.1g,使用BAPP 175.9g代替ODA 93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-7。 In the above-mentioned Preparation Example 1, 73.6 g of diphenyl-3,3',4,4'-tetracarboxylic dianhydride (BPDA) and 130.1 g of BPADA were used instead of 155.1 g of ODPA, and 175.9 g of BAPP was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1, thereby obtaining polymer A-7.

測定該聚合物A-7之重量平均分子量(Mw),結果為24,000。由聚合物A-7獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為17.1wt%。 The weight average molecular weight (Mw) of the polymer A-7 was measured to be 24,000. The imide group concentration of each repeating unit of the polyimide obtained from polymer A-7 was 17.1wt%.

<製造例8>(聚醯亞胺前驅物(聚合物A-8)之合成) <Production Example 8> (Synthesis of polyimide precursor (polymer A-8))

於上述製造例1中,使用2,2-雙{3-甲基-4-(4-胺基苯氧基)苯基}丙烷(MBAPP)219.3g代替ODA 93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-8。 In the above-mentioned Preparation Example 1, 219.3 g of 2,2-bis{3-methyl-4-(4-aminophenoxy)phenyl}propane (MBAPP) was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1 to obtain polymer A-8.

測定該聚合物A-8之重量平均分子量(Mw),結果為25,000。由聚合 物A-8獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為18.7wt%。 The weight average molecular weight (Mw) of the polymer A-8 was measured to be 25,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-8 was 18.7 wt%.

<製造例9>(聚醯亞胺前驅物(聚合物A-9)之合成) <Production Example 9> (Synthesis of polyimide precursor (polymer A-9))

於上述製造例1中,使用2,2'-二甲基聯苯基-4,4'-二胺(m-TB)92.88g代替ODA 93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-9。 In the above-mentioned Preparation Example 1, 92.88 g of 2,2'-dimethylbiphenyl-4,4'-diamine (m-TB) was used instead of 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1 to obtain polymer A-9.

測定該聚合物A-9之重量平均分子量(Mw),結果為24,000。由聚合物A-9獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為26.8wt%。 The weight average molecular weight (Mw) of the polymer A-9 was measured to be 24,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-9 was 26.8wt%.

<製造例10>(聚醯亞胺前驅物(聚合物A-10)之合成) <Production Example 10> (Synthesis of polyimide precursor (polymer A-10))

於上述製造例1中,使用4,4'-(4,4'-亞異丙基二苯氧基)酸二酐(BPADA)260.2g代替ODPA 155.1g,使用2,2'-二甲基聯苯基-4,4'-二胺(m-TB)92.88g代替BAPP 175.9g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-10。 In the above-mentioned Preparation Example 1, 260.2 g of 4,4'-(4,4'-isopropyldiphenoxy) acid dianhydride (BPADA) was used instead of 155.1 g of ODPA, and 92.88 g of 2,2'-dimethylbiphenyl-4,4'-diamine (m-TB) was used instead of 175.9 g of BAPP. The reaction was carried out in the same manner as the method described in Preparation Example 1, thereby obtaining polymer A-10.

測定該聚合物A-10之重量平均分子量(Mw),結果為23,000。由聚合物A-10獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為19.1wt%。 The weight average molecular weight (Mw) of the polymer A-10 was measured to be 23,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-10 was 19.1wt%.

<製造例11>(聚醯亞胺前驅物(聚合物A-11)之合成) <Production Example 11> (Synthesis of polyimide precursor (polymer A-11))

將BPADA 260.2g放入2升容量之可分離式燒瓶中,於氮氣氛圍下添加γ-丁內酯400ml,一面於室溫下進行攪拌,一面添加m-TB,獲得聚醯胺酸溶液。 Put 260.2g of BPADA into a 2-liter separable flask, add 400ml of γ-butyrolactone under a nitrogen atmosphere, and add m-TB while stirring at room temperature to obtain a polyamide solution.

繼而,於185℃下攪拌4小時,確認到理論量之水被去除後冷卻至室溫為止,獲得聚合物A-11。 Then, the mixture was stirred at 185°C for 4 hours until the theoretical amount of water was removed and then cooled to room temperature to obtain polymer A-11.

測定該聚合物A-11之重量平均分子量(Mw),結果為22,000。由聚合物A-11獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為19.1wt%。 The weight average molecular weight (Mw) of the polymer A-11 was measured to be 22,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-11 was 19.1wt%.

<製造例12>(聚醯亞胺前驅物(聚合物A-12)之合成) <Production Example 12> (Synthesis of polyimide precursor (polymer A-12))

將ODPA 155.1g放入2升容量之可分離式燒瓶中,添加甲基丙烯酸2-羥基乙酯(HEMA)134.0g及γ-丁內酯400ml,一面於室溫下進行攪拌,一面添加吡啶79.1g,獲得反應混合物。 Place 155.1 g of ODPA in a 2-liter separable flask, add 134.0 g of 2-hydroxyethyl methacrylate (HEMA) and 400 ml of γ-butyrolactone, and add 79.1 g of pyridine while stirring at room temperature to obtain a reaction mixture.

繼而,將反應混合物冷卻至-10℃,一面將溫度保持在-10℃,一面歷時60分鐘添加124.4g之SOCl2。繼而一面進行攪拌,一面歷時60分鐘添加將4,4'-氧二苯胺(ODA)93.0g懸浮於γ-丁內酯350ml中而成之懸浮液。進而於室溫下攪拌2小時後,添加乙醇30ml並攪拌1小時,然後添加γ-丁內酯400ml。將所獲得之反應液添加至3升之乙醇中,生成包含粗聚合物之沈澱物。將所生成之粗聚合物溶解於四氫呋喃1.5升中,獲得粗聚合物溶液。將陰離子交換樹脂(Organo股份有限公司製造之「AmberlystTM 15」)與陽離子交換樹脂(Organo股份有限公司製造之「IRA96SB」)混合後使用來對所獲得之粗聚合物溶液進行精製,獲得聚合物溶液。將所獲得之聚合物溶液滴加至28升之水中而使聚合物沈澱,濾取所獲得之沈澱物後進行真空乾燥,藉此獲得粉末狀之聚合物A-12。 Next, the reaction mixture was cooled to -10°C, and while the temperature was maintained at -10°C, 124.4 g of SOCl2 was added over 60 minutes. Then, while stirring, a suspension of 93.0 g of 4,4'-oxydiphenylamine (ODA) suspended in 350 ml of γ-butyrolactone was added over 60 minutes. After stirring at room temperature for 2 hours, 30 ml of ethanol was added and stirred for 1 hour, and then 400 ml of γ-butyrolactone was added. The obtained reaction solution was added to 3 liters of ethanol to generate a precipitate containing a crude polymer. The generated crude polymer was dissolved in 1.5 liters of tetrahydrofuran to obtain a crude polymer solution. The obtained crude polymer solution was purified by mixing an anion exchange resin ("Amberlyst TM 15" manufactured by Organo Co., Ltd.) and a cation exchange resin ("IRA96SB" manufactured by Organo Co., Ltd.) to obtain a polymer solution. The obtained polymer solution was added dropwise to 28 liters of water to precipitate the polymer, and the obtained precipitate was filtered and vacuum dried to obtain a powdered polymer A-12.

測定該聚合物A-12之重量平均分子量(Mw),結果為9,000。由聚合物A-12獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為27.4wt%。 The weight average molecular weight (Mw) of the polymer A-12 was measured to be 9,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-12 was 27.4wt%.

<製造例13>(聚醯亞胺前驅物(聚合物A-13)之合成) <Production Example 13> (Synthesis of polyimide precursor (polymer A-13))

於上述製造例12中,使用2,2'-二甲基聯苯基-4,4'-二胺(m-TB)92.88g 作為ODA93.0g,除此以外,以與製造例1所記載之方法相同之方式進行反應,藉此獲得聚合物A-13。 In the above-mentioned Preparation Example 12, 92.88 g of 2,2'-dimethylbiphenyl-4,4'-diamine (m-TB) was used as 93.0 g of ODA. The reaction was carried out in the same manner as the method described in Preparation Example 1, thereby obtaining polymer A-13.

測定該聚合物A-13之重量平均分子量(Mw),結果為8,000。由聚合物A-13獲得之聚醯亞胺之各重複單元之醯亞胺基濃度為26.8wt%。 The weight average molecular weight (Mw) of the polymer A-13 was measured to be 8,000. The imide group concentration of each repeating unit of the polyimide obtained from the polymer A-13 was 26.8wt%.

[感光性樹脂組合物之製造] [Manufacturing of photosensitive resin composition]

實施例、比較例中使用下述化合物。 The following compounds are used in the examples and comparative examples.

光聚合起始劑B-1:TR-PBG-304(常州強力電子公司製造) Photopolymerization initiator B-1: TR-PBG-304 (manufactured by Changzhou Qiangli Electronics Co., Ltd.)

光聚合起始劑B-2:TR-PBG-305(常州強力電子公司製造) Photopolymerization initiator B-2: TR-PBG-305 (manufactured by Changzhou Qiangli Electronics Co., Ltd.)

光聚合起始劑B-3:TR-PBG-3057(常州強力電子公司製造) Photopolymerization initiator B-3: TR-PBG-3057 (manufactured by Changzhou Qiangli Electronics Co., Ltd.)

有機化合物C-1:(雙-2,4-戊二酸)二正丁醇鈦 Organic compound C-1: (bis-2,4-pentanedioic acid) di-n-butanol titanium

有機化合物C-2:二異丙醇鈦雙(乙醯乙酸乙酯) Organic compound C-2: Titanium diisopropylate (ethyl acetate)

溶劑D-1:γ-丁內酯(GBL) Solvent D-1: γ-butyrolactone (GBL)

溶劑D-2:二甲基亞碸(DMSO) Solvent D-2: dimethyl sulfoxide (DMSO)

<實施例1> <Implementation Example 1>

使用聚醯亞胺前驅物A-2以以下方法製備負型感光性樹脂組合物,並進行所製備之組合物之評價。溶解於作為(A)聚醯亞胺前驅物之A-2:100g、作為(B)光聚合起始劑之B-1:5g、(D)GBL:100g中。進而添加少量GBL,藉此將所獲得之溶液之黏度調整為約40泊。進而將組合物於40℃之保溫箱IN601(Yamato Scientific股份有限公司製造)中靜置48小時進行老化,製成負型感光性樹脂組合物。依據上述方法對該組合物進行評價。將結果示於以下表1-1中。 A negative photosensitive resin composition was prepared using the polyimide precursor A-2 in the following method, and the prepared composition was evaluated. Dissolved in (A) A-2 as a polyimide precursor: 100 g, (B) B-1 as a photopolymerization initiator: 5 g, and (D) GBL: 100 g. A small amount of GBL was then added to adjust the viscosity of the obtained solution to about 40 poise. The composition was then aged for 48 hours in an incubator IN601 (manufactured by Yamato Scientific Co., Ltd.) at 40°C to prepare a negative photosensitive resin composition. The composition was evaluated according to the above method. The results are shown in the following Table 1-1.

<實施例2> <Implementation Example 2>

製備除將老化條件設為40℃ 144小時以外與實施例1相同之負型感光性樹脂組合物,並進行與實施例1相同之評價。將結果示於以下表1-1中。 A negative photosensitive resin composition identical to Example 1 was prepared except that the aging conditions were set to 40°C for 144 hours, and the same evaluation as Example 1 was performed. The results are shown in Table 1-1 below.

<實施例3> <Implementation Example 3>

製備除添加作為(C)有機化合物之C-1:1g並將老化條件設為23℃ 48小時以外與實施例1相同之負型感光性樹脂組合物,並進行與實施例1相同之評價。將結果示於以下表1-1中。 A negative photosensitive resin composition was prepared in the same manner as in Example 1 except that 1 g of C-1 was added as the (C) organic compound and the aging conditions were set to 23°C for 48 hours, and the same evaluation as in Example 1 was performed. The results are shown in Table 1-1 below.

<實施例4~21、比較例1~12> <Implementation Examples 4 to 21, Comparative Examples 1 to 12>

製備除以如以下表1與表2所示之調配比製備並進行老化以外與實施例1~3相同之負型感光性樹脂組合物,並進行與實施例1相同之評價。再者,表中,關於老化溫度、老化時間記載有「-」者表示未進行老化。將結果示於以下表1與表2中。 The negative photosensitive resin composition was prepared in the same manner as in Examples 1 to 3 except that the composition was prepared and aged according to the mixing ratios shown in Tables 1 and 2 below, and the same evaluation as in Example 1 was performed. In addition, in the table, the "-" for the aging temperature and aging time indicates that no aging was performed. The results are shown in Tables 1 and 2 below.

Figure 110134871-A0305-12-0054-31
Figure 110134871-A0305-12-0054-31

Figure 110134871-A0305-12-0055-32
Figure 110134871-A0305-12-0055-32

如表1與表2所示,實施例1~21之感光性樹脂組合物之醯亞胺化率顯示出高於比較例1~7、及11、12之感光性樹脂組合物之醯亞胺化率之值。於比較例8與9中,吸光度顯示出較高之值,解像度成為「不合格」。於比較例8中,醯亞胺化率為52.6%,係超過50%之值。於比較例10中,樹脂組合物凝膠化而未能實施評價。 As shown in Tables 1 and 2, the imidization rate of the photosensitive resin composition of Examples 1 to 21 showed a higher value than that of the photosensitive resin composition of Comparative Examples 1 to 7, and 11 and 12. In Comparative Examples 8 and 9, the absorbance showed a higher value, and the resolution became "unqualified". In Comparative Example 8, the imidization rate was 52.6%, which was a value exceeding 50%. In Comparative Example 10, the resin composition gelled and could not be evaluated.

[產業上之可利用性] [Industrial availability]

藉由使用本發明之感光性樹脂組合物,能夠獲得厚膜之解像度較高且顯示出低介電損耗正切之硬化膜。因此,本發明之感光性樹脂組合物能夠良好地用於例如對製造半導體裝置、多層配線基板等電氣、電子材料有用之感光性材料之領域。 By using the photosensitive resin composition of the present invention, a cured film having a high resolution of a thick film and exhibiting a low dielectric loss tangent can be obtained. Therefore, the photosensitive resin composition of the present invention can be well used in the field of photosensitive materials useful for manufacturing electrical and electronic materials such as semiconductor devices and multi-layer wiring substrates.

Figure 110134871-A0305-11-0002-47
Figure 110134871-A0305-11-0002-47

Claims (23)

一種感光性樹脂組合物,其包含:(A)以下通式(1)所表示之聚醯亞胺前驅物:100質量份;
Figure 110134871-A0305-13-0001-33
{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,n1為2~150之整數,R1與R2分別獨立地為氫原子或碳數1~40之一價有機基;其中,R1與R2中之至少一個為以下通式(2)所表示之基:
Figure 110134871-A0305-13-0001-34
(式中,R3、R4與R5分別獨立地為氫原子或碳數1~3之一價有機基,並且m1為2~10之整數)}(B)感光劑:0.5~10質量份;及(D)溶劑:100~300質量份;對該感光性樹脂組合物進行脫溶劑而獲得之曝光前之感光性樹脂層藉由ATR(Attenuated Total Reflection,衰減全反射)法所得之紅外吸收光譜中之1380cm-1附近波峰強度除以1500cm-1附近波峰強度所獲得之該感光性樹脂層之醯亞胺化指數,除以將該感光性樹脂組合物以350℃進行加熱、硬化而獲得之硬化膜之醯亞胺化指數所得之值即醯亞胺化率b為15% ~50%,且於該硬化膜之聚醯亞胺中,相對於包含源自四羧酸與二胺之結構之重複單元之分子量,醯亞胺基所占之比率即醯亞胺基濃度a為12wt%~30wt%。
A photosensitive resin composition comprising: (A) 100 parts by weight of a polyimide precursor represented by the following general formula (1);
Figure 110134871-A0305-13-0001-33
{wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, n1 is an integer of 2 to 150, R1 and R2 are independently a hydrogen atom or a monovalent organic group having 1 to 40 carbon atoms; wherein at least one of R1 and R2 is a group represented by the following general formula (2):
Figure 110134871-A0305-13-0001-34
(wherein, R 3 , R 4 and R 5 are independently hydrogen atoms or monovalent organic groups having 1 to 3 carbon atoms, and m 1 is an integer of 2 to 10)}(B) 0.5 to 10 parts by weight of a photosensitive agent; and (D) 100 to 300 parts by weight of a solvent; the peak intensity of the infrared absorption spectrum of the photosensitive resin layer before exposure obtained by ATR (Attenuated Total Reflection) method is divided by the peak intensity of 1380 cm -1 in the vicinity of 1500 cm The value obtained by dividing the imidization index of the photosensitive resin layer obtained by the peak intensity near -1 by the imidization index of the cured film obtained by heating and curing the photosensitive resin composition at 350°C, that is, the imidization rate b is 15%~50%, and in the polyimide of the cured film, the ratio of the imide group to the molecular weight of the repeating unit containing the structure derived from tetracarboxylic acid and diamine, that is, the imide group concentration a is 12wt%~30wt%.
如請求項1之感光性樹脂組合物,其中上述醯亞胺基濃度a與醯亞胺化率b滿足以下式(1):0.10≦a×(1-b)≦0.17 (1)。 The photosensitive resin composition of claim 1, wherein the above-mentioned imide group concentration a and imidization rate b satisfy the following formula (1): 0.10≦a×(1-b)≦0.17 (1). 如請求項1或2之感光性樹脂組合物,其中於上述硬化膜之聚醯亞胺中,相對於包含源自四羧酸與二胺之結構之重複單元之分子量,醯亞胺基所占之比率即醯亞胺基濃度a為12wt%~24wt%。 The photosensitive resin composition of claim 1 or 2, wherein in the polyimide of the hardened film, the ratio of the imide group to the molecular weight of the repeating unit containing the structure derived from tetracarboxylic acid and diamine, i.e., the imide group concentration a, is 12wt%~24wt%. 如請求項1或2之感光性樹脂組合物,其中以350℃進行加熱、硬化而獲得之上述聚醯亞胺硬化膜之醯亞胺化指數為0.10~0.54。 As in the photosensitive resin composition of claim 1 or 2, the imidization index of the polyimide cured film obtained by heating and curing at 350°C is 0.10~0.54. 如請求項1或2之感光性樹脂組合物,其中於將上述感光性樹脂組合物塗佈於石英玻璃上,並以110℃加熱3分鐘所得之感光性樹脂層之每1μm之365nm之吸光度為0.02~0.09。 The photosensitive resin composition of claim 1 or 2, wherein the absorbance of the photosensitive resin layer obtained by coating the photosensitive resin composition on quartz glass and heating it at 110°C for 3 minutes is 0.02~0.09 per 1μm at 365nm. 如請求項1或2之感光性樹脂組合物,其中上述通式(1)中之Y1係由以下式所表示:[化3]
Figure 110134871-A0305-13-0003-35
{式中,Rz分別獨立地為可包含鹵素原子之碳數1~10之一價有機基,a為0~4之整數,A為氧原子或硫原子,並且B為下述式中之1種:
Figure 110134871-A0305-13-0003-52
}。
The photosensitive resin composition of claim 1 or 2, wherein Y1 in the general formula (1) is represented by the following formula:
Figure 110134871-A0305-13-0003-35
{wherein, Rz is independently a monovalent organic group having 1 to 10 carbon atoms which may contain a halogen atom, a is an integer of 0 to 4, A is an oxygen atom or a sulfur atom, and B is one of the following formulae:
Figure 110134871-A0305-13-0003-52
}.
如請求項6之感光性樹脂組合物,其中上述Y1係由以下式所表示:
Figure 110134871-A0305-13-0003-38
Figure 110134871-A0305-13-0003-39
Figure 110134871-A0305-13-0003-40
The photosensitive resin composition of claim 6, wherein the Y1 is represented by the following formula:
Figure 110134871-A0305-13-0003-38
or
Figure 110134871-A0305-13-0003-39
or
Figure 110134871-A0305-13-0003-40
如請求項1或2之感光性樹脂組合物,其中上述通式(1)中之X1係由以下式所表示:
Figure 110134871-A0305-13-0004-41
{式中,Ry分別獨立地為可包含鹵素原子之碳數1~10之一價有機基,a為0~4之整數,C為氧原子或硫原子,並且D為以下式中之1種:
Figure 110134871-A0305-13-0004-53
}。
The photosensitive resin composition of claim 1 or 2, wherein X1 in the above general formula (1) is represented by the following formula:
Figure 110134871-A0305-13-0004-41
{wherein, Ry is independently a monovalent organic group having 1 to 10 carbon atoms which may contain a halogen atom, a is an integer of 0 to 4, C is an oxygen atom or a sulfur atom, and D is one of the following formulae:
Figure 110134871-A0305-13-0004-53
}.
如請求項8之感光性樹脂組合物,其中上述X1係由以下式所表示:
Figure 110134871-A0305-13-0004-43
Figure 110134871-A0305-13-0004-44
The photosensitive resin composition of claim 8, wherein the X1 is represented by the following formula:
Figure 110134871-A0305-13-0004-43
or
Figure 110134871-A0305-13-0004-44
如請求項1或2之感光性樹脂組合物,其進而包含(C)選自有機鈦化合物或有機鋯化合物之至少一種有機化合物:0.01~5質量份。 The photosensitive resin composition of claim 1 or 2 further comprises (C) at least one organic compound selected from an organic titanium compound or an organic zirconium compound: 0.01 to 5 parts by weight. 如請求項10之感光性樹脂組合物,其中上述(C)有機化合物為有機鈦化合物。 As in claim 10, the photosensitive resin composition, wherein the above-mentioned (C) organic compound is an organic titanium compound. 如請求項10之感光性樹脂組合物,其中上述有機鈦化合物係選自由四烷氧基鈦化合物、鈦螯合物化合物、醯化鈦化合物、及二茂鈦化合物所組成之群中之至少一種化合物。 The photosensitive resin composition of claim 10, wherein the organic titanium compound is at least one compound selected from the group consisting of tetraalkoxy titanium compounds, titanium chelate compounds, titanium acylate compounds, and titanocene compounds. 如請求項12之感光性樹脂組合物,其中上述有機鈦化合物係具有2個以上之烷氧基之鈦螯合物或四烷氧基鈦。 As in claim 12, the photosensitive resin composition, wherein the organic titanium compound is a titanium chelate or a tetraalkoxy titanium having two or more alkoxy groups. 如請求項1或2之感光性樹脂組合物,其用於形成再配線層用層間絕緣膜。 A photosensitive resin composition as claimed in claim 1 or 2, which is used to form an interlayer insulating film for a redistribution layer. 如請求項1或2之感光性樹脂組合物,其進而包含(E)單體:0.5~15質量份。 The photosensitive resin composition of claim 1 or 2 further comprises (E) monomer: 0.5-15 parts by weight. 如請求項15之感光性樹脂組合物,其中上述(E)單體含有選自由羥基及胺基所組成之群中之至少一種基。 As in claim 15, the photosensitive resin composition, wherein the above-mentioned (E) monomer contains at least one group selected from the group consisting of hydroxyl groups and amino groups. 一種如請求項1至16中任一項之感光性樹脂組合物之製造方法,其包括以下步驟:將上述(A)聚醯亞胺前驅物、上述(B)感光劑、及上述(D)溶劑進行混合之步驟;及將所獲得之混合物於23℃~50℃下老化24小時~360小時,而將醯亞胺化率調整為15%~50%之步驟。 A method for preparing a photosensitive resin composition as claimed in any one of claims 1 to 16, comprising the following steps: a step of mixing the above-mentioned (A) polyimide precursor, the above-mentioned (B) photosensitive agent, and the above-mentioned (D) solvent; and a step of aging the obtained mixture at 23°C to 50°C for 24 hours to 360 hours to adjust the imidization rate to 15% to 50%. 一種聚醯亞胺硬化膜之製造方法,其包括以下步驟(1)~(5):(1)將如請求項1至15中任一項之感光性樹脂組合物塗佈於基板上,於該基板上形成感光性樹脂層之步驟;(2)對所獲得之感光性樹脂層進行加熱、乾燥之步驟;(3)對加熱、乾燥後之感光性樹脂層進行曝光之步驟;(4)對曝光後之感光性樹脂層進行顯影之步驟;及(5)對顯影後之感光性樹脂層進行加熱處理而形成聚醯亞胺硬化膜之步驟。 A method for producing a polyimide cured film comprises the following steps (1) to (5): (1) coating a photosensitive resin composition as described in any one of claims 1 to 15 on a substrate to form a photosensitive resin layer on the substrate; (2) heating and drying the obtained photosensitive resin layer; (3) exposing the heated and dried photosensitive resin layer; (4) developing the exposed photosensitive resin layer; and (5) heating the developed photosensitive resin layer to form a polyimide cured film. 如請求項18之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺硬化膜利用擾動方式分體圓柱共振器法以10GHz進行測定時之介電損耗正切為0.0021~0.007。 As in claim 18, the manufacturing method of polyimide cured film, wherein the dielectric loss tangent of the polyimide cured film is 0.0021~0.007 when measured at 10 GHz using a perturbation split cylindrical resonator method. 如請求項18或19之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺硬化膜利用擾動方式分體圓柱共振器法以28GHz進行測定時之介電損耗正切為0.0021~0.008。 A method for manufacturing a polyimide cured film as claimed in claim 18 or 19, wherein the dielectric loss tangent of the polyimide cured film is 0.0021 to 0.008 when measured at 28 GHz using a perturbation split cylindrical resonator method. 如請求項18或19之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺硬化膜利用擾動方式分體圓柱共振器法以40GHz進行測定時之介電損耗正切為0.0021~0.008。 A method for manufacturing a polyimide cured film as claimed in claim 18 or 19, wherein the dielectric loss tangent of the polyimide cured film measured at 40 GHz using a perturbation split cylindrical resonator method is 0.0021 to 0.008. 如請求項18或19之聚醯亞胺硬化膜之製造方法,其中上述聚醯亞胺 硬化膜利用擾動方式分體圓柱共振器法以60GHz進行測定時之介電損耗正切為0.0021~0.009。 A method for manufacturing a polyimide cured film as claimed in claim 18 or 19, wherein the dielectric loss tangent of the polyimide cured film is 0.0021 to 0.009 when measured at 60 GHz using a perturbation split cylindrical resonator method. 一種聚醯亞胺硬化膜之製造方法,其係使用如下感光性樹脂組合物之聚醯亞胺硬化膜之製造方法,上述感光性樹脂組合物包含:(A)以下通式(1)所表示之聚醯亞胺前驅物:100質量份;
Figure 110134871-A0305-13-0007-45
{式中,X1為碳數6~40之四價有機基,Y1為碳數6~40之二價有機基,n1為2~150之整數,R1與R2分別獨立地為氫原子或碳數1~40之一價有機基;其中,R1與R2中之至少一個為以下通式(2)所表示之基:
Figure 110134871-A0305-13-0007-46
(式中,R3、R4與R5分別獨立地為氫原子或碳數1~3之一價有機基,並且m1為2~10之整數)}(B)感光劑:0.5~10質量份;及(D)溶劑:100~300質量份;上述製造方法包括以下步驟(1)~(5):(1)將上述感光性樹脂組合物塗佈於基板上,於該基板上形成感光性樹脂層之步驟; (2)對所獲得之感光性樹脂層進行加熱、乾燥並脫溶劑之步驟;(3)對經脫溶劑之感光性樹脂層進行曝光之步驟;(4)對曝光後之感光性樹脂層進行顯影之步驟;及(5)對顯影後之感光性樹脂層進行加熱處理而形成聚醯亞胺硬化膜之步驟;該步驟(2)中之加熱、乾燥後進行脫溶劑而獲得之曝光前之感光性樹脂層之醯亞胺化率為15~50%。
A method for producing a polyimide cured film is a method for producing a polyimide cured film using the following photosensitive resin composition, wherein the photosensitive resin composition comprises: (A) 100 parts by weight of a polyimide precursor represented by the following general formula (1);
Figure 110134871-A0305-13-0007-45
{wherein, X1 is a tetravalent organic group having 6 to 40 carbon atoms, Y1 is a divalent organic group having 6 to 40 carbon atoms, n1 is an integer of 2 to 150, R1 and R2 are independently a hydrogen atom or a monovalent organic group having 1 to 40 carbon atoms; wherein at least one of R1 and R2 is a group represented by the following general formula (2):
Figure 110134871-A0305-13-0007-46
(wherein, R 3 , R 4 and R 5 are independently a hydrogen atom or a monovalent organic group having 1 to 3 carbon atoms, and m 1 is an integer of 2 to 10)}(B) a photosensitive agent: 0.5 to 10 parts by weight; and (D) a solvent: 100 to 300 parts by weight. The above-mentioned manufacturing method comprises the following steps (1) to (5): (1) applying the above-mentioned photosensitive resin composition on a substrate to form a photosensitive resin layer on the substrate; (2) heating, drying and desolventizing the obtained photosensitive resin layer; (3) exposing the desolventized photosensitive resin layer; (4) developing the exposed photosensitive resin layer; and (5) heating the developed photosensitive resin layer to form a polyimide cured film; the imidization rate of the photosensitive resin layer before exposure obtained by heating, drying and desolventizing in step (2) is 15-50%.
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