TWI852435B - A method and equipment for producing a heterogeneous dopant containing plasma organic compound thin film - Google Patents
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- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 48
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Abstract
Description
一種有機薄膜之製造方法與其設備,特別是一種異質摻雜電漿有機薄膜之製造方法與其設備。 A method for manufacturing an organic thin film and an apparatus thereof, in particular, a method for manufacturing a heterogeneous doped plasma organic thin film and an apparatus thereof.
表面改質技術係指僅針對材料表面進行處理之技術,如滲碳、滲氮、滲硼、雷射處理、離子佈植、粗糙化、官能基化及鍍膜等。其中,利用鍍膜技術進行材料之表面改質已廣泛應用於民生工業、光電、半導體及生醫等領域。 Surface modification technology refers to the technology that only processes the surface of materials, such as carburizing, nitriding, boronizing, laser treatment, ion implantation, roughening, functionalization and coating. Among them, the use of coating technology to modify the surface of materials has been widely used in the fields of civil industry, optoelectronics, semiconductors and biomedicine.
除了鍍膜材料選擇為決定鍍膜所能賦予之表面特性外,隨著對於多功能且獨特表面特性需求之增加,藉由多元材料進行複合、調控表面結構或先進鍍膜技術開發等觀念相繼提出。 In addition to the choice of coating materials determining the surface properties that coating can impart, with the increasing demand for multifunctional and unique surface properties, concepts such as composite materials, control of surface structure, or development of advanced coating technologies have been proposed one after another.
以各式醫療導管為例,矽膠因具生物惰性、質軟且高可撓曲特性而廣為採用,然而矽膠之易沾黏及高摩擦力之特性,致使於實際臨床應用時,須將其表面進行改質,被覆具良好生物相容性、無細胞毒性及乾性潤滑等特性之聚對二甲苯(Parylene)薄膜,以降低病患對侵入之痛苦及異物感。 Taking various medical catheters as an example, silicone is widely used because of its biological inertness, softness and high flexibility. However, due to its easy adhesion and high friction, silicone needs to be modified on the surface in actual clinical applications. It is coated with Parylene film with good biocompatibility, no cytotoxicity and dry lubricity to reduce the pain and foreign body sensation of the patient.
然而,病患因使用醫療器材而造成細菌感染之狀況屢見不鮮,嚴重的細菌感染可能會引發敗血症導致多重器官衰竭,進而造成患者死亡;箇中原因包含各式醫療導管由於需長期與人體軟組織及體液直接接觸,為發生細菌 感染機會最高之醫療產品,而聚對二甲苯薄膜對於抗菌效果之提供有限,頂多僅能達到抑菌(Bacteria inhibition)的效果。 However, it is not uncommon for patients to contract bacterial infections from the use of medical equipment. Severe bacterial infections may lead to sepsis and multiple organ failure, which may lead to the patient's death. The reasons include that various medical catheters are in direct contact with human soft tissues and body fluids for a long time, making them the medical products with the highest chance of bacterial infection. The antibacterial effect of polyparaxylene film is limited, and at most it can only achieve the effect of bacteria inhibition.
如於該聚對二甲苯薄膜中摻雜具有抗菌能力之銀金屬,其將可賦予聚對二甲苯薄膜額外之抗菌功效,進而有效降低患者進行侵入性醫療行為及術後發生細菌感染的風險。 If silver metal with antibacterial properties is doped into the polyparaxylene film, it will give the polyparaxylene film additional antibacterial properties, thereby effectively reducing the risk of patients undergoing invasive medical procedures and postoperative bacterial infections.
在導入銀金屬摻雜源於電漿聚對二甲苯薄膜之製程選項中,選用有機金屬化合物雖為一有效作為銀金屬提供之前驅物,然而有機金屬化合物之成本相對較高,且通常為有劇毒之化合物,故不適用於與人體接觸之醫療器材應用。如考慮使用磁控濺鍍搭配銀金屬靶材進行摻雜,習知磁控濺鍍之製程壓力為~10-3Torr,其與電漿聚合製程慣用之製程壓力~10-1Torr相差甚巨,故也不適合做為銀金屬導入之製程方式。 Among the process options for introducing silver metal doping sources into plasma polyparaxylene film, the use of organic metal compounds is an effective precursor for providing silver metal, but the cost of organic metal compounds is relatively high and they are usually highly toxic compounds, so they are not suitable for medical devices that come into contact with the human body. If you consider using magnetron sputtering with silver metal targets for doping, it is known that the process pressure of magnetron sputtering is ~10 -3 Torr, which is very different from the process pressure of ~10 -1 Torr commonly used in plasma polymerization processes, so it is not suitable as a process method for introducing silver metal.
利用濕式化學製程雖然可以生長銀金屬於電漿聚對二甲苯薄膜表面,但其需要兩階段製程,且濕式化學所生長之銀金屬附著力不佳,故有脫落甚至導致人體細胞產生毒性之風險。 Although silver metal can be grown on the surface of plasma polyparaxylene film using wet chemical process, it requires a two-stage process, and the silver metal grown by wet chemical process has poor adhesion, so there is a risk of falling off and even causing toxicity to human cells.
有鑑於此,目前急需要一種能夠於該聚對二甲苯薄膜中摻雜具有抗菌能力之銀金屬,同時又具有製程與設備優勢的技術。 In view of this, there is an urgent need for a technology that can dope the polyparaxylene film with silver metal that has antibacterial properties and has process and equipment advantages.
為了改善既有製備銀金屬摻雜之聚對二甲苯薄膜,選用有機金屬化合物成本相對較高,且可能具有劇毒之化合物,而磁控濺鍍之製程與電漿聚合製程慣用之製程壓力相差甚巨,又濕式化學製程相對複雜且銀金屬附著力不佳等種種問題,本發明提供一種異質摻雜電漿有機薄膜之製造設備,其包含一電漿反應腔體、一電漿化學反應電源供應器、一中空陰極放電單元以及一真空單元,其中: 該電漿反應腔體為真空可密封之腔室,其中設置二平行電極板,分為一第一電極板與一第二電極板,該電漿化學反應電源供應器與該第二電極板電性連接;該中空陰極放電單元包含一固定絕緣套、一真空封合機構、一法蘭、一陰極濺射管、一陽極遮蔽罩及一中空陰極放電電源供應器;該陰極濺射管為一管型結構,其與該中空陰極放電電源供應器電性連接,該陰極濺射管包含一氣體入口與一中空陰極電漿出口;該固定絕緣套套設於該氣體入口處的該陰極濺射管上,並且該陰極濺射管以該固定絕緣套將其固定於該法蘭上;該陰極濺射管利用該真空封合機構將該陰極濺射管與該法蘭進行真空封合;以及該陽極遮蔽罩套設於該陰極濺射管外部並固定於該法蘭上。 In order to improve the existing preparation of silver-doped polyparaxylene film, the cost of using organic metal compounds is relatively high and may be highly toxic. The process pressure of magnetron sputtering and plasma polymerization is very different. The wet chemical process is relatively complicated and the silver metal adhesion is poor. The present invention provides a heterogeneous doped electroplating film. A plasma organic film manufacturing device comprises a plasma reaction chamber, a plasma chemical reaction power supply, a hollow cathode discharge unit and a vacuum unit, wherein: The plasma reaction chamber is a vacuum sealable chamber, in which two parallel electrode plates are arranged, divided into a first electrode plate and a second electrode plate, the plasma chemical reaction power supply and the second The electrode plate is electrically connected; the hollow cathode discharge unit includes a fixed insulating sleeve, a vacuum sealing mechanism, a flange, a cathode sputtering tube, an anode shielding cover and a hollow cathode discharge power supply; the cathode sputtering tube is a tubular structure, which is electrically connected to the hollow cathode discharge power supply, and the cathode sputtering tube includes a gas inlet and a hollow cathode Plasma outlet; the fixed insulating sleeve is sleeved on the cathode sputtering tube at the gas inlet, and the cathode sputtering tube is fixed on the flange by the fixed insulating sleeve; the cathode sputtering tube uses the vacuum sealing mechanism to vacuum seal the cathode sputtering tube and the flange; and the anode shielding cover is sleeved on the outside of the cathode sputtering tube and fixed on the flange.
其中,該第一電極板與該第二電極板為上下平行面對面設置。 Wherein, the first electrode plate and the second electrode plate are arranged face to face in parallel up and down.
其中,該電漿化學反應電源供應器與該中空陰極放電電源供應器包含直流電源供應器、脈衝直流電源供應器、射頻電源供應器或超高頻電源供應器。 Among them, the plasma chemical reaction power supply and the hollow cathode discharge power supply include a direct current power supply, a pulsed direct current power supply, a radio frequency power supply or an ultra-high frequency power supply.
其中,該第一電極板包含一氣體擴散板。 Wherein, the first electrode plate includes a gas diffusion plate.
其中,該陽極遮蔽罩套設於該陰極濺射管外部,兩者管壁間具有1mm~5mm之一間隙。 The anode shielding cover is sleeved on the outside of the cathode sputtering tube, and there is a gap of 1mm~5mm between the two tube walls.
其中,陰極濺射管內徑介於1mm~100mm,材質包含金屬、陶瓷或其組合。 Among them, the inner diameter of the cathode sputtering tube is between 1mm and 100mm, and the material includes metal, ceramic or a combination thereof.
其中,該真空單元將該電漿反應腔體內之壓力降低。 The vacuum unit reduces the pressure in the plasma reaction chamber.
本發明進一步提供利用前述製造設備進行異質摻雜電漿有機薄膜之製造方法,其步驟包含: 將一基材置於該第二電極板上;將一反應前驅物透過該第一電極板通入該電漿反應腔體中;將該第二電極板利用該電漿化學反應電源供應器產生電漿於該電漿反應腔體,並使該反應前驅物進行電漿化學反應形成一電漿有機薄膜物種於該電漿反應腔體中;將該陰極濺射管利用該中空陰極放電電源供應器激發出一中空陰極電漿,並濺射該陰極濺射管形成一濺射物種;以及將一惰性氣體自該氣體入口通入該陰極濺射管內,使該陰極濺射管內之該中空陰極電漿的該濺射物種自該中空陰極電漿出口移轉到管外之該電漿反應腔體的電漿化學反應環境,以摻混於該電漿有機薄膜物種中形成一異質摻雜電漿有機薄膜物種,並生長於該基材表面得到該異質摻雜電漿有機薄膜。 The present invention further provides a method for manufacturing heterogeneous doped plasma organic thin films using the aforementioned manufacturing equipment, the steps of which include: Placing a substrate on the second electrode plate; passing a reaction precursor through the first electrode plate into the plasma reaction chamber; using the second electrode plate to generate plasma in the plasma reaction chamber using the plasma chemical reaction power supply, and allowing the reaction precursor to undergo a plasma chemical reaction to form a plasma organic thin film species in the plasma reaction chamber; placing the cathode sputtering tube using the hollow cathode The power supply excites a hollow cathode plasma and sputters the cathode sputtering tube to form a sputtering species; and an inert gas is introduced into the cathode sputtering tube from the gas inlet, so that the sputtering species of the hollow cathode plasma in the cathode sputtering tube is transferred from the hollow cathode plasma outlet to the plasma chemical reaction environment of the plasma reaction chamber outside the tube, so as to be mixed with the plasma organic film species to form a heterogeneous doped plasma organic film species, and grow on the surface of the substrate to obtain the heterogeneous doped plasma organic film.
其中,該中空陰極放電單元與該電漿反應腔體同時、獨立或是交替進行運作,以進行該濺射物種整體摻雜或是部分摻雜於該電漿有機薄膜物種中。 The hollow cathode discharge unit and the plasma reaction chamber operate simultaneously, independently or alternately to perform the overall doping or partial doping of the sputtering species into the plasma organic film species.
其中,該反應前驅物之氣體以一氣體流量計進行流量控制。 The gas of the reaction precursor is flow-controlled by a gas flow meter.
其中,該反應前驅物包含聚對二甲苯或類鑽碳之前驅物;該金屬靶材為銀靶材;以及該惰性氣體包含氦氣、氬氣及/或氪氣。 Wherein, the reaction precursor comprises polyparaxylene or diamond-like carbon precursor; the metal target is a silver target; and the inert gas comprises helium, argon and/or krypton.
其中,該惰性氣體以一氣體流量計進行流量控制。 The inert gas is flow-controlled by a gas flow meter.
藉由上述說明可知,本發明提出一異質摻雜電漿有機薄膜之製備方法,利用複合式電漿鍍膜技術,摻雜銀金屬於電漿聚對二甲苯薄膜及類鑽碳薄膜,使其具有抗菌之能力。因此,此異質摻雜電漿有機薄膜製程將可實現複合成分薄膜製備,並提供多功能表面特性。 From the above description, it can be seen that the present invention proposes a method for preparing a heterogeneous doped plasma organic film, which utilizes a composite plasma coating technology to dope silver metal into a plasma polyparaxylene film and a diamond-like carbon film to make it have antibacterial properties. Therefore, this heterogeneous doped plasma organic film process will be able to achieve the preparation of a composite composition film and provide multifunctional surface properties.
10:異質摻雜電漿有機薄膜之製造設備 10: Manufacturing equipment for heterogeneous doped plasma organic films
11:電漿反應腔體 11: Plasma reaction chamber
111:板電極 111: Plate electrode
111A:第一電極板 111A: First electrode plate
111B:第二電極板 111B: Second electrode plate
12:電漿化學反應電源供應器 12: Plasma chemical reaction power supply
13:中空陰極放電單元 13: Hollow cathode discharge unit
131:固定絕緣套 131:Fixed insulation sleeve
132:真空封合機構 132: Vacuum sealing mechanism
133:法蘭 133:France
134:陰極濺射管 134: Cathode sputtering tube
134A:氣體入口 134A: Gas inlet
134B:中空陰極電漿出口 134B: Hollow cathode plasma outlet
135:陽極遮蔽罩 135: Anode shield
136:中空陰極放電電源供應器 136: Hollow cathode discharge power supply
14:真空單元 14: Vacuum unit
20:反應前驅物 20: Reaction precursors
30:異質摻雜電漿有機薄膜 30: Heterogeneous doped plasma organic film
40:基材 40: Base material
50:電漿有機薄膜物種 50: Plasma organic film species
60:濺射物種 60: Splash species
70:異質摻雜電漿有機薄膜物種 70: Heterogeneous doped plasma organic film species
80:惰性氣體 80: Inert gas
S1~S5:步驟 S1~S5: Steps
為了更清楚地說明本發明實施例的技術方案,下面將對實施例描述中所需要使用的附圖作簡單的介紹。顯而易見地,下面描述中的附圖僅僅是本發明的一些示例或實施例,並非絕對用以限定本發明的技術範圍。除非從前後文顯而易見或另做說明,圖中相同標號代表相同結構或操作。其中:圖1為本發明異質摻雜電漿有機薄膜之製造設備一較佳實施例示意圖。 In order to more clearly explain the technical solution of the embodiment of the present invention, the following will briefly introduce the drawings required for the description of the embodiment. Obviously, the drawings described below are only some examples or embodiments of the present invention, and are not absolutely used to limit the technical scope of the present invention. Unless it is obvious from the previous and following texts or otherwise explained, the same reference numerals in the figures represent the same structure or operation. Among them: Figure 1 is a schematic diagram of a preferred embodiment of the manufacturing equipment of the heterogeneous doped plasma organic film of the present invention.
圖2為本發明中空陰極放電單元一較佳實施例示意圖。 Figure 2 is a schematic diagram of a preferred embodiment of the hollow cathode discharge unit of the present invention.
圖3為本發明異質摻雜電漿有機薄膜製造方法一較佳實施例流程圖。 Figure 3 is a flow chart of a preferred embodiment of the heterogeneous doped plasma organic film manufacturing method of the present invention.
圖4A、4B為本發明實施例一利用複合式電漿鍍膜技術生長電漿聚對二甲苯薄膜及銀摻雜電漿聚對二甲苯薄膜之截面微觀形貌。 Figures 4A and 4B show the cross-sectional microscopic morphology of plasma polyparaxylene film and silver-doped plasma polyparaxylene film grown by composite plasma plating technology in Example 1 of the present invention.
圖4C、4D為本發明實施例二利用複合式電漿鍍膜技術生長電漿類鑽碳薄膜及銀摻雜電漿類鑽碳薄膜之截面微觀形貌。 Figures 4C and 4D show the cross-sectional microscopic morphology of plasma diamond-like carbon film and silver-doped plasma diamond-like carbon film grown by composite plasma plating technology in the second embodiment of the present invention.
圖5為本發明利用X光光電子能譜儀進行實施例一銀摻雜電漿聚對二甲苯薄膜之成分縱深分析。 Figure 5 shows the compositional depth analysis of the silver-doped plasma polyparaxylene film in Example 1 of the present invention using an X-ray photoelectron spectrometer.
圖6為本發明利用能量色散X光譜,分析不同銀金屬中空陰極功率生長銀摻雜電漿類鑽碳薄膜之銀摻雜量。 Figure 6 shows the analysis of the silver doping content of the silver-doped plasma diamond-like carbon film grown at different silver metal hollow cathode powers using energy dispersive X-ray spectroscopy in the present invention.
圖7A、7B為本發明利用複合式電漿鍍膜技術生長電漿聚對二甲苯薄膜及銀摻雜電漿聚對二甲苯薄膜於平板培養24h後之大腸桿菌菌落生長狀況。 Figures 7A and 7B show the growth of E. coli colonies on plasma polyparaxylene films and silver-doped plasma polyparaxylene films grown by the composite plasma coating technology of the present invention after 24 hours of plate culture.
本發明以下將以數個較佳實施例進行技術詳細的說明與描述,所附圖示僅僅是本發明的一些示例性代表或實施例,對於本發明所屬領域具有通常知識者來講,在不付出進步性勞動的前提下,還可以根據這些附圖將本發明應用於其它類似情形。 The present invention will be described in detail below with several preferred embodiments. The attached diagrams are only some exemplary representatives or embodiments of the present invention. For those with ordinary knowledge in the field to which the present invention belongs, the present invention can also be applied to other similar situations based on these attached diagrams without making any progressive efforts.
以下本發明使用的“系統”、“裝置”、“單元”和/或“模組”是用於區分不同級別的不同組件、元件、部件、部分或裝配的一種方法。然而,如果其他詞語可實現相同的目的,則可通過其他表達來替換所述詞語。如本發明中所示,除非上下文明確提示例外情形,“一”、“一個”、“一種”和/或“該”等詞並非特指單數,也可包括複數。一般說來,術語“包括”與“包含”僅提示包括已明確標識的步驟和元素,而這些步驟和元素不構成一個排它性的羅列,方法或者設備也可能包含其它的步驟或元素。 The "system", "device", "unit" and/or "module" used in the present invention below are a method for distinguishing different components, elements, parts, parts or assemblies at different levels. However, if other words can achieve the same purpose, the words can be replaced by other expressions. As shown in the present invention, unless the context clearly indicates an exception, the words "one", "a", "a kind" and/or "the" do not specifically refer to the singular, but may also include the plural. Generally speaking, the terms "including" and "comprising" only indicate that the steps and elements that have been clearly identified are included, and these steps and elements do not constitute an exclusive list. The method or device may also include other steps or elements.
本發明中使用了流程圖用來說明根據本發明的實施例的系統所執行的操作。應當理解的是,前面或後面操作不一定按照順序來精確地執行。相反,可以按照倒序或同時處理各個步驟。同時,也可以將其他操作添加到這些過程中,或從這些過程移除某一步或數步操作。 Flowcharts are used in the present invention to illustrate the operations performed by the system according to the embodiments of the present invention. It should be understood that the preceding or succeeding operations are not necessarily performed in exact order. Instead, the steps may be processed in reverse order or simultaneously. At the same time, other operations may be added to these processes, or one or more operations may be removed from these processes.
<異質摻雜電漿有機薄膜之製造設備> <Equipment for manufacturing heterogeneous doped plasma organic thin films>
請參考圖1,本發明一種異質摻雜電漿有機薄膜之製造設備10,其包含一電漿反應腔體11、一電漿化學反應電源供應器12、一中空陰極放電單元13以及一真空單元14。 Please refer to FIG. 1 , the present invention discloses a heterogeneous doped plasma organic thin film manufacturing device 10, which includes a plasma reaction chamber 11, a plasma chemical reaction power supply 12, a hollow cathode discharge unit 13 and a vacuum unit 14.
其中,該電漿反應腔體11為真空可密封之腔室,其中設置二平行電極板111,如圖1所示,二該電極板111一較佳實施例是平行面對面設置,分為一第一電極板111A與一第二電極板111B,該電漿化學反應電源供應器12較佳以負極與該第二電極板111B電性連接。較佳地,該第一電極板111A與該第二電極板111B為上下平行面對面設置。 The plasma reaction chamber 11 is a vacuum sealable chamber, in which two parallel electrode plates 111 are arranged, as shown in FIG1 . A preferred embodiment of the two electrode plates 111 is to be arranged face to face in parallel, and to be divided into a first electrode plate 111A and a second electrode plate 111B. The plasma chemical reaction power supply 12 is preferably electrically connected to the second electrode plate 111B with a negative electrode. Preferably, the first electrode plate 111A and the second electrode plate 111B are arranged face to face in parallel up and down.
該電漿化學反應電源供應器12可為直流電源供應器、脈衝直流電源供應器、射頻電源供應器或超高頻電源供應器等。 The plasma chemical reaction power supply 12 can be a DC power supply, a pulsed DC power supply, a radio frequency power supply or an ultra-high frequency power supply, etc.
該第一電極板111A較佳為一氣體擴散板,以將一反應前驅物20之氣體均勻通入該電漿反應腔體11中。 The first electrode plate 111A is preferably a gas diffusion plate to evenly pass the gas of a reaction precursor 20 into the plasma reaction chamber 11.
進一步搭配圖2,該中空陰極放電單元13包含一固定絕緣套131、一真空封合機構132、一法蘭133、一陰極濺射管134、一陽極遮蔽罩135及一中空陰極放電電源供應器136。 Further with FIG. 2 , the hollow cathode discharge unit 13 includes a fixed insulating sleeve 131, a vacuum sealing mechanism 132, a flange 133, a cathode sputtering tube 134, an anode shielding cover 135 and a hollow cathode discharge power supply 136.
該陰極濺射管134為一管型結構,其與該中空陰極放電電源供應器136電性連接,該陰極濺射管134包含一氣體入口134A與一中空陰極電漿出口134B。 The cathode sputtering tube 134 is a tubular structure, which is electrically connected to the hollow cathode discharge power supply 136. The cathode sputtering tube 134 includes a gas inlet 134A and a hollow cathode plasma outlet 134B.
該固定絕緣套131套設於該氣體入口134A處的該陰極濺射管134上;並且該陰極濺射管134以該固定絕緣套131將其固定於該法蘭133上,並達成電性絕緣。該陰極濺射管134利用該真空封合機構132將該陰極濺射管134與該法蘭133進行真空封合。 The fixed insulating sleeve 131 is sleeved on the cathode sputtering tube 134 at the gas inlet 134A; and the cathode sputtering tube 134 is fixed on the flange 133 by the fixed insulating sleeve 131 to achieve electrical insulation. The cathode sputtering tube 134 uses the vacuum sealing mechanism 132 to vacuum seal the cathode sputtering tube 134 and the flange 133.
該陽極遮蔽罩135套設於該陰極濺射管134外部並固定於該法蘭133上,兩者管壁間較佳具有一間隙1mm~5mm,以進行電性絕緣。本發明該陰極濺射管134較佳內徑介於1mm~100mm,材質包含金屬、陶瓷或其組合。 The anode shielding cover 135 is sleeved on the outside of the cathode sputtering tube 134 and fixed on the flange 133. There is preferably a gap of 1mm~5mm between the two tube walls for electrical insulation. The cathode sputtering tube 134 of the present invention preferably has an inner diameter of 1mm~100mm, and the material includes metal, ceramic or a combination thereof.
該中空陰極放電電源供應器136包含直流電源供應器、脈衝直流電源供應器、射頻電源供應器或超高頻電源供應器等。該真空單元14將該電漿反應腔體11內之壓力降低,較佳至壓力低於一大氣壓之減壓環境。 The hollow cathode discharge power supply 136 includes a DC power supply, a pulsed DC power supply, a radio frequency power supply or an ultra-high frequency power supply. The vacuum unit 14 reduces the pressure in the plasma reaction chamber 11, preferably to a decompression environment with a pressure lower than one atmosphere.
<異質摻雜電漿有機薄膜之製造方法> <Method for manufacturing heterogeneous doped plasma organic film>
請參考圖3,本發明利用上述該異質摻雜電漿有機薄膜之製造設備10製備一異質摻雜電漿有機薄膜30的製造方法,其步驟包含:步驟S1)將一基材40置於該第二電極板111B;步驟S2)將該反應前驅物20透過該第一電極板111A通入該電漿反應腔體11中; 步驟S3)將該第二電極板111B利用該電漿化學反應電源供應器12產生電漿於該電漿反應腔體11,並使該反應前驅物20進行電漿化學反應形成一電漿有機薄膜物種50於該電漿反應腔體11中;步驟S4)將該陰極濺射管134利用該中空陰極放電電源供應器136激發出一中空陰極電漿137,並濺射該陰極濺射管134內壁形成一濺射物種60;步驟S5)將一惰性氣體80自該氣體入口134A通入該陰極濺射管134內,使該陰極濺射管134內之該中空陰極電漿137的該濺射物種60自該中空陰極電漿出口134B移轉到管外之該電漿反應腔體11的電漿化學反應環境,以摻混於該電漿有機薄膜物種50中形成一異質摻雜電漿有機薄膜物種70,並生長於該基材40表面得到該異質摻雜電漿有機薄膜30。 Referring to FIG. 3 , the present invention uses the above-mentioned heterogeneous doped plasma organic film manufacturing equipment 10 to prepare a manufacturing method of a heterogeneous doped plasma organic film 30, and the steps include: step S1) placing a substrate 40 on the second electrode plate 111B; step S2) passing the reaction precursor 20 through the first electrode plate 111A into the electrode plate 111B; In the plasma reaction chamber 11; Step S3) the second electrode plate 111B is used to generate plasma in the plasma reaction chamber 11 by using the plasma chemical reaction power supply 12, and the reaction precursor 20 is subjected to a plasma chemical reaction to form a plasma organic thin film species 50 in the plasma reaction chamber 11; Step S4) the cathode sputtering tube In step S5), an inert gas 80 is introduced into the cathode sputtering tube 134 from the gas inlet 134A to make the hollow cathode discharge plasma 137 in the cathode sputtering tube 134. The sputtering species 60 of the plasma 137 is transferred from the hollow cathode plasma outlet 134B to the plasma chemical reaction environment of the plasma reaction chamber 11 outside the tube to be mixed with the plasma organic film species 50 to form a heterogeneous doped plasma organic film species 70, and grows on the surface of the substrate 40 to obtain the heterogeneous doped plasma organic film 30.
較佳地,前述步驟S2中該反應前驅物20之氣體較佳以一氣體流量計進行流量控制。該反應前驅物20包含聚對二甲苯或類鑽碳之前驅物,例如對二甲苯或碳氫化合物。該惰性氣體80包含氦氣、氬氣及/或氪氣,更佳者為氬氣。該惰性氣體80較佳以一氣體流量計進行流量控制。 Preferably, the gas of the reaction precursor 20 in the aforementioned step S2 is preferably flow-controlled by a gas flow meter. The reaction precursor 20 includes polyparaxylene or a diamond-like carbon precursor, such as paraxylene or a hydrocarbon. The inert gas 80 includes helium, argon and/or krypton, preferably argon. The inert gas 80 is preferably flow-controlled by a gas flow meter.
進一步地,本發明步驟S4與S5之該中空陰極放電單元13可以與該電漿反應腔體11同時、獨立或是交替進行運作,以進行異質材料整體摻雜或是部分摻雜於該電漿有機薄膜中。 Furthermore, the hollow cathode discharge unit 13 of steps S4 and S5 of the present invention can operate simultaneously, independently or alternately with the plasma reaction chamber 11 to perform overall or partial doping of heterogeneous materials into the plasma organic film.
<實施例與確效性測試> <Implementation examples and validation tests>
本實施例一係以該異質摻雜電漿有機薄膜30為銀摻雜電漿聚對二甲苯薄膜。所述電漿聚對二甲苯薄膜乃以液態對二甲苯為該反應前驅物20,利用氬氣攜帶其蒸汽通入該電漿反應腔體11內,利用短脈衝電漿電源供應器做為該電漿化學反應電源供應器12,進行電漿聚合化學反應而得。所述銀金屬之摻雜乃以銀金屬管為該中空陰極放電單元13之該陰極濺射管134,此實施例該銀金屬管內徑為6mm,利用脈衝直流電漿電源供應器做為該中空陰極放電電源供 應器136激發出該中空陰極電漿137,搭配氬氣做為該惰性氣體80將銀濺射物種60吹出管外,以摻混於該電漿反應腔體11的電漿聚合化學環境中,所述銀金屬摻雜於電漿聚對二甲苯薄膜生長過程中,僅於電漿聚合化學反應生長電漿聚對二甲苯薄膜之最後10分鐘,方開啟銀金屬中空陰極裝置以進行銀金屬摻雜於電漿有機薄膜之極表層。 In the first embodiment, the heterogeneous doped plasma organic film 30 is a silver doped plasma polyparaxylene film. The plasma polyparaxylene film is obtained by using liquid paraxylene as the reaction precursor 20, using argon to carry its vapor into the plasma reaction chamber 11, using a short pulse plasma power supply as the plasma chemical reaction power supply 12, and performing plasma polymerization chemical reaction. The silver metal doping is to use a silver metal tube as the cathode sputtering tube 134 of the hollow cathode discharge unit 13. In this embodiment, the inner diameter of the silver metal tube is 6 mm. A pulsed DC plasma power supply 136 is used to excite the hollow cathode plasma 137, and argon is used as the inert gas 80 to sputter the silver. The seed 60 is blown out of the tube to be mixed in the plasma polymerization chemical environment of the plasma reaction chamber 11. During the growth process of the plasma polyparaxylene film, the silver metal is doped in the plasma polyparaxylene film. Only in the last 10 minutes of the plasma polymerization chemical reaction growth of the plasma polyparaxylene film, the silver metal hollow cathode device is opened to perform silver metal doping in the extreme surface of the plasma organic film.
請參考圖4A、圖4B,其分別為利用本發明前述製造設備與製造方法製得的純電漿聚對二甲苯薄膜(無銀摻雜的對比例)及本發明實施例一之銀摻雜電漿聚對二甲苯薄膜之截面微觀形貌;其中,該電漿聚合化學反應生長電漿聚對二甲苯薄膜之參數乃一樣。圖中可以得知,由於銀金屬摻雜於電漿聚對二甲苯薄膜內,因此所得薄膜厚度較厚。進一步利用能量色散X光譜分析銀摻雜電漿聚對二甲苯薄膜可知,銀金屬於電漿聚對二甲苯薄膜之摻雜量為1.15at.%,並可證實銀金屬確實摻雜於電漿聚對二甲苯薄膜內。 Please refer to FIG. 4A and FIG. 4B, which are respectively the cross-sectional microscopic morphologies of a pure plasma polyparaxylene film (comparative example without silver doping) and a silver doped plasma polyparaxylene film of Example 1 of the present invention made by the aforementioned manufacturing apparatus and manufacturing method of the present invention; wherein the parameters of the plasma polyparaxylene film grown by the plasma polymerization chemical reaction are the same. It can be seen from the figure that since silver metal is doped in the plasma polyparaxylene film, the obtained film thickness is thicker. Further analysis of the silver-doped plasma polyparaxylene film using energy dispersive X-ray spectroscopy revealed that the doping amount of silver metal in the plasma polyparaxylene film was 1.15at.%, and it was confirmed that silver metal was indeed doped in the plasma polyparaxylene film.
本發明提供另一較佳實施例二,以該異質摻雜電漿有機薄膜30為銀摻雜電漿類鑽碳薄膜為例。所述電漿類鑽碳薄膜乃以乙炔及氬氣為該反應前驅物20,利用脈衝直流電漿電源供應器為該電漿化學反應電源供應器12,進行電漿化學反應而得。所述銀金屬之摻雜乃以銀金屬管為該中空陰極放電單元13之該陰極濺射管134,該銀金屬管內徑為6mm,利用脈衝直流電漿電源供應器做為該中空陰極放電電源供應器136激發出該中空陰極電漿137,搭配氬氣做為該惰性氣體80將銀濺射物種60吹出管外,以摻混於該電漿反應腔體11的電漿聚合化學環境中,所述銀金屬摻雜於電漿類鑽碳薄膜生長過程中,僅於電漿化學反應生長電漿類鑽碳薄膜之最後10分鐘,方開啟銀金屬中空陰極裝置以進行銀金屬摻雜於電漿類鑽碳薄膜之極表層。 The present invention provides another preferred embodiment 2, taking the heterogeneous doped plasma organic film 30 as a silver doped plasma diamond-carbon film as an example. The plasma diamond-carbon film is obtained by using acetylene and argon as the reaction precursors 20 and a pulsed DC plasma power supply as the plasma chemical reaction power supply 12 to perform a plasma chemical reaction. The silver metal doping is to use a silver metal tube as the cathode sputtering tube 134 of the hollow cathode discharge unit 13. The inner diameter of the silver metal tube is 6 mm. A pulsed DC plasma power supply 136 is used to excite the hollow cathode plasma 137. Argon is used as the inert gas 80 to sputter the silver. The seed 60 is blown out of the tube to be mixed in the plasma polymerization chemical environment of the plasma reaction chamber 11. During the growth process of the plasma diamond-carbon film, the silver metal is doped in the plasma. Only in the last 10 minutes of the plasma chemical reaction growth of the plasma diamond-carbon film, the silver metal hollow cathode device is opened to perform silver metal doping in the extreme surface of the plasma diamond-carbon film.
圖4C、圖4D為其分別為利用本發明前述製造設備與製造方法製得的電漿類鑽碳薄膜(無銀摻雜的對比例)及本發明實施例二銀摻雜電漿類鑽碳 薄膜之截面微觀形貌;其中,該電漿化學反應生長電漿類鑽碳薄膜之參數乃一樣。圖中可以得知,由於銀金屬摻雜於電漿類鑽碳薄膜內,因此所得薄膜厚度較厚。 Figure 4C and Figure 4D are cross-sectional microscopic morphologies of a plasma diamond-carbon film (comparative example without silver doping) and a silver-doped plasma diamond-carbon film of Example 2 of the present invention respectively produced by the aforementioned production equipment and production method of the present invention; wherein the parameters of the plasma diamond-carbon film grown by plasma chemical reaction are the same. It can be seen from the figure that since silver metal is doped in the plasma diamond-carbon film, the obtained film thickness is thicker.
圖5為利用X光光電子能譜儀進行前述實施例一銀摻雜電漿聚對二甲苯薄膜之成分縱深分析,圖中可以得知所得鍍膜之極表層具有一富含銀金屬之區域,其與本實施例之鍍製結果相符。 Figure 5 is a compositional depth analysis of the silver-doped plasma polyparaxylene film of the aforementioned Example 1 using an X-ray photoelectron spectrometer. It can be seen from the figure that the surface layer of the obtained coating film has a region rich in silver metal, which is consistent with the coating result of this example.
圖6為利用能量色散X光譜,分析不同銀金屬中空陰極功率生長銀摻雜電漿類鑽碳薄膜之銀摻雜量。圖中可以得知,隨著銀金屬中空陰極功率之增加,所得銀摻雜電漿類鑽碳薄膜之銀摻雜量近乎線性增加;當銀金屬中空陰極功率為150W時,銀金屬於電漿類鑽碳薄膜之摻雜量為1.60at.%,並可證實銀金屬確實摻雜於電漿類鑽碳薄膜內。 Figure 6 uses energy dispersive X-ray spectroscopy to analyze the silver doping amount of the silver-doped plasma diamond-carbon film grown at different silver metal hollow cathode powers. It can be seen from the figure that with the increase of the silver metal hollow cathode power, the silver doping amount of the obtained silver-doped plasma diamond-carbon film increases almost linearly; when the silver metal hollow cathode power is 150W, the silver metal doping amount in the plasma diamond-carbon film is 1.60at.%, and it can be confirmed that silver metal is indeed doped in the plasma diamond-carbon film.
圖7A、圖7B利用複合式電漿鍍膜技術生長電漿聚對二甲苯薄膜對比例及銀摻雜電漿聚對二甲苯薄膜實施例於平板培養24h後之大腸桿菌菌落生長狀況,圖中可以明顯發現大腸桿菌菌落生成於電漿聚對二甲苯薄膜表面,但一當進行銀金屬摻雜後,所得銀摻雜電漿聚對二甲苯薄膜即可顯著降低菌落之生成,而無大腸桿菌菌落生成。進一步以JIS Z 2801進行定量抗菌活性值計算可知,電漿聚對二甲苯薄膜及銀摻雜電漿聚對二甲苯薄膜之抗菌活性值分別為0及5.95,抗菌活性值>2.0及代表具有抗菌功效,故可知此銀摻雜電漿聚對二甲苯薄膜具有優異抗菌效果。 FIG7A and FIG7B show the growth of E. coli colonies on a comparative example of a plasma polyparaxylene film grown using a composite plasma coating technology and an example of a silver-doped plasma polyparaxylene film after 24 hours of plate culture. It can be clearly seen in the figure that E. coli colonies are generated on the surface of the plasma polyparaxylene film, but once silver metal doping is performed, the resulting silver-doped plasma polyparaxylene film can significantly reduce the formation of colonies, and no E. coli colonies are generated. Further quantitative antibacterial activity value calculation using JIS Z 2801 shows that the antibacterial activity values of plasma polyparaxylene film and silver-doped plasma polyparaxylene film are 0 and 5.95 respectively. Antibacterial activity value > 2.0 indicates antibacterial efficacy, so it can be seen that this silver-doped plasma polyparaxylene film has excellent antibacterial effect.
一些實施例中使用了描述成分、屬性數量的數字,應當理解的是,此類用於實施例描述的數字,在一些示例中使用了修飾詞“大約”、“近似”或“大體上”來修飾。除非另外說明,“大約”、“近似”或“大體上”表明所述數字允許有±20%的變化。相應地,在一些實施例中,說明書和請求項中使用的數值參數均為近似值,該近似值根據個別實施例所需特點可以發生改變。在一些實施 例中,數值參數應考慮規定的有效數位並採用一般位數保留的方法。儘管本發明一些實施例中用於確認其範圍廣度的數值域和參數為近似值,在具體實施例中,此類數值的設定在可行範圍內盡可能精確。 In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of the embodiments are modified by the modifiers "approximately", "approximately" or "substantially" in some examples. Unless otherwise specified, "approximately", "approximately" or "substantially" indicate that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and the claim are approximate values, which may vary according to the required features of the individual embodiments. In some embodiments, the numerical parameters should consider the specified significant digits and adopt the general digit retention method. Although the numerical domains and parameters used to confirm the breadth of the scope of the invention in some embodiments are approximate values, in specific embodiments, the settings of such numerical values are as accurate as possible within the feasible range.
最後,應當理解的是,本發明中所述實施例僅用以說明本發明實施例的原則。其他的變形也可能屬本發明的範圍。因此,作為示例而非限制,本發明實施例的替代配置可視為與本發明的教導一致。相應地,本發明的實施例不僅限於本發明明確介紹和描述的實施例。 Finally, it should be understood that the embodiments described in the present invention are intended only to illustrate the principles of the embodiments of the present invention. Other variations may also fall within the scope of the present invention. Therefore, as an example and not a limitation, alternative configurations of the embodiments of the present invention may be considered consistent with the teachings of the present invention. Accordingly, the embodiments of the present invention are not limited to the embodiments explicitly introduced and described in the present invention.
10:異質摻雜電漿有機薄膜之製造設備 10: Manufacturing equipment for heterogeneous doped plasma organic films
11:電漿反應腔體 11: Plasma reaction chamber
111:電極板 111:Electrode plate
111A:第一電極板 111A: First electrode plate
111B:第二電極板 111B: Second electrode plate
12:電漿化學反應電源供應器 12: Plasma chemical reaction power supply
13:中空陰極放電單元 13: Hollow cathode discharge unit
131:固定絕緣套 131:Fixed insulation sleeve
132:真空封合機構 132: Vacuum sealing mechanism
133:法蘭 133:France
134:陰極濺射管 134: Cathode sputtering tube
134A:氣體入口 134A: Gas inlet
134B:中空陰極電漿出口 134B: Hollow cathode plasma outlet
135:陽極遮蔽罩 135: Anode shield
136:中空陰極放電電源供應器 136: Hollow cathode discharge power supply
14:真空單元 14: Vacuum unit
20:反應前驅物 20: Reaction precursors
30:異質摻雜電漿有機薄膜 30: Heterogeneous doped plasma organic film
40:基材 40: Base material
50:電漿有機薄膜物種 50: Plasma organic film species
60:濺射物種 60: Splash species
70:異質摻雜電漿有機薄膜物種 70: Heterogeneous doped plasma organic film species
80:惰性氣體 80: Inert gas
Claims (12)
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Citations (5)
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| US20070251819A1 (en) * | 2006-05-01 | 2007-11-01 | Kardokus Janine K | Hollow cathode magnetron sputtering targets and methods of forming hollow cathode magnetron sputtering targets |
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| US20150332893A1 (en) * | 1999-12-07 | 2015-11-19 | Komatsu Ltd. | Surface Treatment Apparatus |
| US20070251819A1 (en) * | 2006-05-01 | 2007-11-01 | Kardokus Janine K | Hollow cathode magnetron sputtering targets and methods of forming hollow cathode magnetron sputtering targets |
| TW201222667A (en) * | 2010-11-29 | 2012-06-01 | Univ Nat Taiwan Science Tech | Methods of forming hydrophobic silicon dioxide layer and forming organic thin film transistor |
| WO2019093779A2 (en) * | 2017-11-08 | 2019-05-16 | 한국기초과학지원연구원 | Anode active material or cathode active material for lithium secondary battery, manufacturing method thereof, and manufacturing method of anode active material composite material, and lithium secondary battery comprising anode active material, composite material or cathode active material |
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