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TWI849892B - Method and system for measuring the length of microneedles - Google Patents

Method and system for measuring the length of microneedles Download PDF

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TWI849892B
TWI849892B TW112116977A TW112116977A TWI849892B TW I849892 B TWI849892 B TW I849892B TW 112116977 A TW112116977 A TW 112116977A TW 112116977 A TW112116977 A TW 112116977A TW I849892 B TWI849892 B TW I849892B
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microneedle
image data
length value
length
array structure
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TW202445123A (en
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蔡孟燦
張峰瑜
黃柏慧
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芯聖科技股份有限公司
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Abstract

A method for measuring the length of microneedles which is suitable for measuring the length of a microneedle in a microneedle array structure through a system host, wherein the microneedle array structure is arranged in a first axial direction and has a plurality of microneedle. The method includes the following steps: projecting a laser scanning beam to a first end of the microneedle, and moving the laser scanning beam to a second end of the microneedle parts to obtain a first tomographic image data corresponding to the microneedle; and analyzing the first tomographic image data by a system host to obtain a first length value corresponding to the microneedle. Thereby, the method for measuring the length of microneedles of the present invention can be used to measure the structure of the microneedle array, and solve the problem that the internal structure of the microneedle cannot be inspected and the length of the microneedle cannot be measured. The system for measuring the length of microneedles is also provided.

Description

量測微針長度的方法及其系統 Method and system for measuring microneedle length

本發明係關於一種量測微針的方法及其系統,特別是一種量測微針長度的方法及其系統。 The present invention relates to a method and system for measuring microneedles, and in particular to a method and system for measuring the length of microneedles.

由於微針的長度介於幾十微米到幾毫米之間,直徑在微米等級左右,所以不會觸及皮下神經系統痛覺感受器,具有無痛、無針傷及微生物入侵率低等優點,因此微針被廣泛應用在生物醫學及醫學美容等領域。 Since the length of microneedles ranges from tens of micrometers to several millimeters, and the diameter is around micrometers, they will not touch the pain receptors of the subcutaneous nervous system. They have the advantages of being painless, non-injurious to needles, and having a low rate of microbial invasion. Therefore, microneedles are widely used in the fields of biomedicine and medical cosmetology.

一般來說,在微針製造完成後,會透過數位顯微鏡的放大倍率功能與旋轉角度功能來觀察微針的表面與形狀,以檢查微針的外部結構是否具有缺陷。 Generally speaking, after the microneedles are manufactured, the surface and shape of the microneedles are observed through the magnification function and rotation angle function of a digital microscope to check whether the external structure of the microneedles has defects.

本發明的一目的在於解決:採用數位顯微鏡的觀察方式,雖然可以檢查出微針的外觀缺陷,但是,無法量測微針長度的問題。 One purpose of the present invention is to solve the problem that although the appearance defects of microneedles can be detected by using a digital microscope, the length of the microneedles cannot be measured.

本發明的另一目的在於解決:採用數位顯微鏡的觀察方式,雖然可以檢查出微針的外觀缺陷,但是,無法檢查出微針的內部結構問題。 Another purpose of the present invention is to solve the problem that although the appearance defects of microneedles can be detected by using a digital microscope, the internal structural problems of the microneedles cannot be detected.

本發明的又一目的在於解決:當微針插入至皮膚後,由於微針的材質(例如,可溶性)關係而使長度產生變化,採用數位顯微鏡的觀察方式無法量測微針插入皮膚後的長度變化的問題。 Another purpose of the present invention is to solve the problem that after the microneedle is inserted into the skin, the length of the microneedle changes due to the material of the microneedle (for example, solubility), and the length change after the microneedle is inserted into the skin cannot be measured by observation using a digital microscope.

為達上述目的及其他目的,本發明係提供一種量測微針長度的方法,適用於量測微針陣列結構的微針長度,其中微針陣列結構是以第一軸向設置,並且具有複數個微針,所述方法包括下列步驟:投射雷射掃描光束至所述微針的第一端,並移動雷射掃描光束至所述微針的第二端,以取得對應所述微針的第一斷層影像資料;及由系統主機解析第一斷層影像資料,以取得對應所述微針的第一長度值。 To achieve the above and other purposes, the present invention provides a method for measuring the length of microneedles, which is suitable for measuring the length of microneedles of a microneedle array structure, wherein the microneedle array structure is arranged in a first axial direction and has a plurality of microneedles. The method comprises the following steps: projecting a laser scanning beam to the first end of the microneedle, and moving the laser scanning beam to the second end of the microneedle to obtain first cross-sectional image data corresponding to the microneedle; and parsing the first cross-sectional image data by a system host to obtain a first length value corresponding to the microneedle.

在一些實施例中,還包括下列步驟:轉動微針陣列結構以第二軸向設置,第二軸向與第一軸向垂直;再次投射雷射掃描光束至所述微針的第一端與第二端,以取得對應所述微針的第二斷層影像資料;由系統主機解析第二斷層影像資料,以取得對應所述微針的第一光程長度值;由系統主機根據第一光程長度值與第一長度值之比值,計算出折射率;將微針陣列結構插入至皮膚,並投射雷射掃描光束至微針陣列結構,以取得第三斷層影像資料;由系統主機解析第三斷層影像資料,以取得對應所述微針的第二光程長度值;及由系統主機根據折射率與第二光程長度值計算出對應所述微針的第二長度。 In some embodiments, the method further comprises the following steps: rotating the microneedle array structure to be arranged in a second axial direction, the second axial direction being perpendicular to the first axial direction; projecting the laser scanning beam to the first end and the second end of the microneedle again to obtain second tomographic image data corresponding to the microneedle; analyzing the second tomographic image data by the system host to obtain a first optical path length value corresponding to the microneedle; and determining by the system host based on the first optical path length value. The refractive index is calculated by the ratio of the optical path length value to the first length value; the microneedle array structure is inserted into the skin, and a laser scanning beam is projected onto the microneedle array structure to obtain third-layer image data; the system host analyzes the third-layer image data to obtain a second optical path length value corresponding to the microneedle; and the system host calculates the second length corresponding to the microneedle according to the refractive index and the second optical path length value.

在一些實施例中,系統主機解析第一斷層影像資料與第二斷層影像資料二者中的一者,以獲得第一影像像素值與像素解析度,並根據第一影像像素值與像素解析度計算出第一長度值與第一光程長度值;系統主機解析第三斷層影像資料以獲得第二影像像素值,並根據第二影像像素值與像素解析度計算出第二光程長度值。 In some embodiments, the system host parses one of the first slice image data and the second slice image data to obtain the first image pixel value and pixel resolution, and calculates the first length value and the first optical path length value according to the first image pixel value and pixel resolution; the system host parses the third slice image data to obtain the second image pixel value, and calculates the second optical path length value according to the second image pixel value and pixel resolution.

在一些實施例中,以光學同調斷層掃描儀器產生雷射掃描光束。 In some embodiments, the laser scanning beam is generated by an optical coherent tomography scanner.

在一些實施例中,以連接纜線連接光學同調斷層掃描儀器與系統主機。 In some embodiments, a connecting cable is used to connect the optical coherence tomography scanner and the system host.

為達上述目的及其他目的,本發明係提供一種量測微針長度的系統,適用於量測微針陣列結構的微針長度,其中微針陣列結構是以第一軸向設置,並且具有複數個微針,所述系統包括:光學同調斷層掃描儀器,用以投射雷射掃描光束至所述微針的第一端,並移動雷射掃描光束至所述微針的第二端,以取得對應所述微針的第一斷層影像資料;及系統主機,與光學同調斷層掃描儀器連接,用以解析第一斷層影像資料,以取得對應所述微針的第一長度值。 To achieve the above-mentioned and other purposes, the present invention provides a system for measuring the length of microneedles, which is suitable for measuring the length of microneedles of a microneedle array structure, wherein the microneedle array structure is arranged in a first axial direction and has a plurality of microneedles. The system comprises: an optical coherence tomography scanner for projecting a laser scanning beam to the first end of the microneedle and moving the laser scanning beam to the second end of the microneedle to obtain first tomographic image data corresponding to the microneedle; and a system host connected to the optical coherence tomography scanner for analyzing the first tomographic image data to obtain a first length value corresponding to the microneedle.

在一些實施例中,系統主機包括:光源模組,經由連接纜線連接光學同調斷層掃描儀器,用以提供光學掃描系統光源至光學同調斷層掃描儀器,以致光學同調斷層掃描儀器據以產生雷射掃描光束;光譜分析儀,與連接纜線連接,用以對雷射掃描光束經由所述微針散射或反射回到連接纜線的光訊號進行分析,以得到第一斷層影像資料;及處理模組,與光譜分析儀連接,用以解析第一斷層影像資料,以計算並取得第一長度值。 In some embodiments, the system host includes: a light source module connected to the optical coherence tomography scanner via a connecting cable to provide an optical scanning system light source to the optical coherence tomography scanner, so that the optical coherence tomography scanner generates a laser scanning beam; a spectrometer connected to the connecting cable to analyze the optical signal of the laser scanning beam scattered or reflected back to the connecting cable by the microneedle to obtain the first tomographic image data; and a processing module connected to the spectrometer to analyze the first tomographic image data to calculate and obtain the first length value.

在一些實施例中,將微針陣列結構以第二軸向設置,第二軸向與第一軸向垂直;光學同調斷層掃描儀器再次投射雷射掃描光束至所述微針的第一端與第二端,以取得對應所述微針的第二斷層影像資料;系統主機解析第二斷層影像資料,以取得對應所述微針的該第一光程長度值,並根據第一光程長度值與第一長度值之比值,計算出折射率。 In some embodiments, the microneedle array structure is arranged in a second axial direction, which is perpendicular to the first axial direction; the optical coherence tomography scanner projects the laser scanning beam to the first end and the second end of the microneedle again to obtain the second tomographic image data corresponding to the microneedle; the system host analyzes the second tomographic image data to obtain the first optical path length value corresponding to the microneedle, and calculates the refractive index according to the ratio of the first optical path length value to the first length value.

在一些實施例中,系統主機解析第一斷層影像資料與第二斷層影像資料二者中的一者,以獲得第一影像像素值與像素解析度,並根據第一影像像素值與像素解析度計算出第一長度值與第一光程長度值。 In some embodiments, the system host analyzes one of the first tomographic image data and the second tomographic image data to obtain the first image pixel value and pixel resolution, and calculates the first length value and the first optical path length value according to the first image pixel value and pixel resolution.

在一些實施例中,於微針陣列結構被插入至皮膚後,光學同調斷層掃描儀器投射雷射掃描光束至微針陣列結構,以取得第三斷層影像資料;系統主機解析第三斷層影像資料,以取得對應所述微針的第二光程長度值,並根據折射率與第二光程長度值計算出對應所述微針的第二長度值。 In some embodiments, after the microneedle array structure is inserted into the skin, the optical coherence tomography scanner projects a laser scanning beam to the microneedle array structure to obtain third-layer image data; the system host analyzes the third-layer image data to obtain the second optical path length value corresponding to the microneedle, and calculates the second length value corresponding to the microneedle based on the refractive index and the second optical path length value.

在一些實施例中,系統主機解析第三斷層影像資料以獲得第二影像像素值,並根據第二影像像素值與像素解析度計算出第二光程長度值。 In some embodiments, the system host parses the third tomographic image data to obtain the second image pixel value, and calculates the second optical path length value based on the second image pixel value and the pixel resolution.

藉此,本發明的量測微針長度的方法及其系統,利用光學斷層掃描(Optical Coherence Tomography,OCT)儀器取得斷層影像資料,並透過影像解析程序與公式計算程序,獲得微針的第一長度值與折射率,解決習知技術無法量測微針長度的問題,且本發明實施例採用非侵入式方式量測微針長度,盡可能減少量測過程對微針的結構造成影響。另外,本發明利用OCT儀器取得的斷層影像資料,可供檢查與確認微針內部結構是否有缺陷,解決習知技術無法檢查微針內部結構的問題,進而提升微針的品質控管。另外,透過解析微針插入至皮膚後的斷層影像資料與公式計算程序,計算出微針插入皮膚後的長度,解決習知技術無法在當微針插入至皮膚後量測微針長度的問題。 Thus, the method and system for measuring the length of microneedles of the present invention utilizes an optical coherence tomography (OCT) instrument to obtain cross-sectional image data, and obtains the first length value and refractive index of the microneedle through an image analysis program and a formula calculation program, thereby solving the problem that the conventional technology cannot measure the length of the microneedle, and the embodiment of the present invention uses a non-invasive method to measure the length of the microneedle, thereby minimizing the impact of the measurement process on the structure of the microneedle. In addition, the cross-sectional image data obtained by the present invention using the OCT instrument can be used to check and confirm whether the internal structure of the microneedle is defective, thereby solving the problem that the conventional technology cannot check the internal structure of the microneedle, thereby improving the quality control of the microneedle. In addition, by analyzing the cross-sectional image data after the microneedle is inserted into the skin and using a formula calculation program, the length of the microneedle after it is inserted into the skin is calculated, solving the problem that conventional technology cannot measure the length of the microneedle after it is inserted into the skin.

10:微針陣列結構 10: Microneedle array structure

100:量測微針長度的系統 100: System for measuring microneedle length

12、14:微針 12, 14: Microneedle

121:針尖端 121: Needle tip

122:針末端 122: Needle end

12a:像素單元 12a: Pixel unit

20:光學同調斷層掃描儀器 20: Optical coherence tomography scanner

22:雷射掃描光束 22: Laser scanning beam

200:第一斷層影像資料 200: First slice image data

30:系統主機 30: System host

32:光源模組 32: Light source module

34:光譜分析儀 34: Spectrometer

36:處理模組 36: Processing module

300:第二斷層影像資料 300: Second slice image data

310:第三斷層影像資料 310: Third-layer image data

40:連接纜線 40: Connecting cables

50:皮膚 50: Skin

60:轉向機構 60: Steering mechanism

L1:第一長度值 L1: first length value

L2:第二長度值 L2: Second length value

X、Y、Z:軸向 X, Y, Z: axial direction

S600,S602,S604:步驟 S600, S602, S604: Steps

S606,S608,S610,S612,S614,S616,S618:步驟 S606, S608, S610, S612, S614, S616, S618: Steps

[圖1]是根據本發明實施例之量測微針長度的系統示意圖。 [Figure 1] is a schematic diagram of a system for measuring the length of microneedles according to an embodiment of the present invention.

[圖2]是根據本發明實施例之第一斷層影像資料的解析示意圖。 [Figure 2] is a schematic diagram of the analysis of the first slice image data according to the embodiment of the present invention.

[圖3]是根據本發明實施例之量測微針陣列結構的另一示意圖。 [Figure 3] is another schematic diagram of the measurement microneedle array structure according to an embodiment of the present invention.

[圖4]是根據本發明圖3實施例的微針陣列結構的俯視示意圖。 [Figure 4] is a schematic top view of the microneedle array structure according to the embodiment of Figure 3 of the present invention.

[圖5]是根據本發明實施例之第二斷層影像資料的解析示意圖。 [Figure 5] is a schematic diagram of the analysis of the second tomographic image data according to an embodiment of the present invention.

[圖6]是根據本發明實施例之第三斷層影像資料的解析示意圖。 [Figure 6] is a schematic diagram of the analysis of the third slice image data according to the embodiment of the present invention.

[圖7]是根據本發明實施例的量測微針長度的方法流程圖。 [Figure 7] is a flow chart of a method for measuring the length of microneedles according to an embodiment of the present invention.

[圖8A]與[圖8B]是根據本發明另一實施例的量測微針長度的方法流程圖。 [Figure 8A] and [Figure 8B] are flow charts of a method for measuring the length of microneedles according to another embodiment of the present invention.

為充分瞭解本發明之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本發明做一詳細說明,說明如後:請參考圖1,圖1是根據本發明實施例之量測微針之長度與折射率的系統示意圖。量測微針長度的系統100包括:微針陣列結構10、光學同調斷層掃描儀器20、系統主機30及連接纜線40。 In order to fully understand the purpose, features and effects of the present invention, the present invention is described in detail by means of the following specific embodiments and the attached drawings. The description is as follows: Please refer to FIG. 1, which is a schematic diagram of a system for measuring the length and refractive index of microneedles according to an embodiment of the present invention. The system 100 for measuring the length of microneedles includes: a microneedle array structure 10, an optical coherence tomography scanner 20, a system host 30 and a connecting cable 40.

微針陣列結構10,以第一軸向設置。所述第一軸向是指微針12的針尖端121朝向X軸方向,但不以此為限制。在其他實施例中,所述第一軸向也可以是指微針12的針尖端121朝向Y軸方向。微針陣列結構10,可固定並設置於轉向機構60上。在其他實施例中,微針陣列結構10也可固定並設置於機械移動/旋轉機構(圖未示,例如,升降平台或機械手臂)上,實現以第一軸向設置的目的。微針陣列結構10,具有複數個微針12。各微針12彼此為交錯排列,但不以此為限制。在其他實施例中,各微針12彼此為非交錯排列。 The microneedle array structure 10 is arranged in a first axial direction. The first axial direction refers to the needle tip 121 of the microneedle 12 facing the X-axis direction, but it is not limited to this. In other embodiments, the first axial direction may also refer to the needle tip 121 of the microneedle 12 facing the Y-axis direction. The microneedle array structure 10 can be fixed and arranged on the turning mechanism 60. In other embodiments, the microneedle array structure 10 can also be fixed and arranged on a mechanical moving/rotating mechanism (not shown, for example, a lifting platform or a robotic arm) to achieve the purpose of being arranged in the first axial direction. The microneedle array structure 10 has a plurality of microneedles 12. The microneedles 12 are arranged in a staggered manner, but it is not limited to this. In other embodiments, the microneedles 12 are arranged in a non-staggered manner.

轉向機構60,與微針陣列結構10連接。轉向機構60,用以控制微針陣列結構10的轉動方向。轉向機構60可以例如是升降平台或機械手臂。本實施例中,以轉向機構60實現微針陣列結構10的固定與轉動方向控制,但不以此為限制。 The turning mechanism 60 is connected to the microneedle array structure 10. The turning mechanism 60 is used to control the rotation direction of the microneedle array structure 10. The turning mechanism 60 can be, for example, a lifting platform or a robotic arm. In this embodiment, the turning mechanism 60 is used to realize the fixation and rotation direction control of the microneedle array structure 10, but it is not limited to this.

光學同調斷層掃描儀器20,設置於微針陣列結構10的上方。光學同調斷層掃描儀器20,用以產生並投射雷射掃描光束22至微針12,並且光學同調斷層掃描儀器20透過連接纜線40與系統主機30連接。光學同調斷層掃描儀器20根據光學掃描系統光源(未繪示)產生雷射掃描光束22,並投射雷射掃描光束22至微針陣列結構10上的微針12。所述雷射掃描光束22的投射方向(例如,Z軸)與第一軸向(例如,X軸)為垂直。在其他實施例中,所述雷射掃描光束22的投射方向與第一軸向大致上為垂直。所述雷射掃描光束22例如為近紅外光束。另外,光學同調斷層掃描儀器20,可固定並設置於另一機械移動/旋轉/轉向機構(圖未示,例如,升降平台或機械手臂)上,實現投射的雷射掃描光束22從微針12的第一端(例如,針末端122)至第二端(例如,針尖端121)的移動。在其他實施例中,投射的雷射掃描光束22可從微針12的針尖端121移動至針末端122。在其他實施例中,投射的雷射掃描光束22可在微針12的針尖端121與針末端122之間來回移動。在其他實施例中,光學同調斷層掃描儀器20例如也可以是手持式光學同調斷層掃描儀器。 The optical coherence tomography scanner 20 is disposed above the microneedle array structure 10. The optical coherence tomography scanner 20 is used to generate and project a laser scanning beam 22 to the microneedles 12, and the optical coherence tomography scanner 20 is connected to the system host 30 via a connecting cable 40. The optical coherence tomography scanner 20 generates the laser scanning beam 22 according to the optical scanning system light source (not shown), and projects the laser scanning beam 22 to the microneedles 12 on the microneedle array structure 10. The projection direction (e.g., Z axis) of the laser scanning beam 22 is perpendicular to the first axis (e.g., X axis). In other embodiments, the projection direction of the laser scanning beam 22 is substantially perpendicular to the first axis. The laser scanning beam 22 is, for example, a near-infrared beam. In addition, the optical coherence tomography scanner 20 can be fixed and disposed on another mechanical moving/rotating/turning mechanism (not shown, for example, a lifting platform or a robotic arm) to achieve the movement of the projected laser scanning beam 22 from the first end (for example, the needle end 122) to the second end (for example, the needle tip 121) of the microneedle 12. In other embodiments, the projected laser scanning beam 22 can move from the needle tip 121 of the microneedle 12 to the needle end 122. In other embodiments, the projected laser scanning beam 22 can move back and forth between the needle tip 121 and the needle end 122 of the microneedle 12. In other embodiments, the optical coherence tomography scanner 20 may also be, for example, a handheld optical coherence tomography scanner.

系統主機30,透過連接纜線40與光學同調斷層掃描儀器20連接。系統主機30包括光源模組32、光譜分析儀34及處理模組36。另外,系統主機30中亦設有儀控電路(未繪示)或其他具有電腦控制、運算及/或儲存等功能的必要構件。 The system host 30 is connected to the optical coherence tomography scanner 20 via a connecting cable 40. The system host 30 includes a light source module 32, a spectrometer 34, and a processing module 36. In addition, the system host 30 is also provided with an instrumentation circuit (not shown) or other necessary components with computer control, calculation and/or storage functions.

光源模組32,與連接纜線40連接。光源模組32,用以提供光學掃描系統光源至光學同調斷層掃描儀器20,以供光學同調斷層掃描儀器20產生雷射掃描光束22。 The light source module 32 is connected to the connecting cable 40. The light source module 32 is used to provide the optical scanning system light source to the optical coherence tomography scanner 20, so that the optical coherence tomography scanner 20 generates a laser scanning beam 22.

光譜分析儀34,與連接纜線40連接。光譜分析儀34,用以透過連接纜線40接收雷射掃描光束22經由微針12散射或反射的光訊號以進行分析,以得到第一斷層影像資料200(見圖2)、第二斷層影像資料300(見圖5)或第三斷層影像資料310(見圖6)。第一斷層影像資料200係對應於微針12以第一軸向設置時掃描取得的影像資料。第二斷層影像資料300係對應於微針12以第二軸向設置時掃描取得的影像資料。第三斷層影像資料310係對應於微針12插入皮膚後掃描取得的影像資料。 The spectrometer 34 is connected to the connecting cable 40. The spectrometer 34 is used to receive the optical signal scattered or reflected by the microneedle 12 through the connecting cable 40, so as to analyze the optical signal, so as to obtain the first tomographic image data 200 (see FIG. 2 ), the second tomographic image data 300 (see FIG. 5 ) or the third tomographic image data 310 (see FIG. 6 ). The first tomographic image data 200 corresponds to the image data obtained by scanning when the microneedle 12 is set in the first axial direction. The second tomographic image data 300 corresponds to the image data obtained by scanning when the microneedle 12 is set in the second axial direction. The third cross-sectional image data 310 corresponds to the image data obtained by scanning after the microneedle 12 is inserted into the skin.

處理模組36,與光譜分析儀34連接。處理模組36,用以解析第一斷層影像資料200、第二斷層影像資料300或第三斷層影像資料310,以計算並取得對應微針12的第一長度值L1(見圖2、圖5)、第二長度值L2(見圖6)、第一光程長度值、第二光程長度值或折射率。處理模組36,可包含通用處理器、專用處理器、中央處理器、數位訊號處理器、微處理器、記憶體、記憶體控制器與/或硬碟等。 The processing module 36 is connected to the spectrometer 34. The processing module 36 is used to analyze the first cross-sectional image data 200, the second cross-sectional image data 300 or the third cross-sectional image data 310 to calculate and obtain the first length value L1 (see Figure 2, Figure 5), the second length value L2 (see Figure 6), the first optical path length value, the second optical path length value or the refractive index corresponding to the microneedle 12. The processing module 36 may include a general-purpose processor, a dedicated processor, a central processing unit, a digital signal processor, a microprocessor, a memory, a memory controller and/or a hard disk, etc.

詳細來說,處理模組36解析該第一斷層影像資料200與該第二斷層影像資料300二者中的一者,以獲得第一影像像素值與像素解析度,並可根據下列公式(1)計算出第一長度值L1或折射率:第一長度值L1×折射率=第一影像像素值×像素解析度......(1) Specifically, the processing module 36 analyzes one of the first slice image data 200 and the second slice image data 300 to obtain the first image pixel value and pixel resolution, and can calculate the first length value L1 or refractive index according to the following formula (1): first length value L1×refractive index=first image pixel value×pixel resolution......(1)

其中,第一影像像素值是指從針尖端121至針末端122之間的像素單元12a(如圖2所示)的數量。像素解析度是指一個像素單元12a代表的長度。所述 第一影像像素值×像素解析度=第一長度值。前述的像素解析度例如是以圖2的X軸方向為計算基礎。另外,像素解析度的計算方式可藉由標準片量測取得。 The first image pixel value refers to the number of pixel units 12a (as shown in FIG. 2 ) between the needle tip 121 and the needle end 122. The pixel resolution refers to the length represented by one pixel unit 12a. The first image pixel value × pixel resolution = first length value. The aforementioned pixel resolution is, for example, based on the calculation of the X-axis direction of FIG. 2 . In addition, the calculation method of the pixel resolution can be obtained by measuring the standard film.

基於上述公式(1),可得知第一長度值L1的計算方式為像素解析度×第一影像像素值÷折射率。處理模組36可根據上述計算公式(1)進行運算,並取得對應微針12的第一長度值L1或折射率。由於本發明實施例中的第一長度值L1係根據第一斷層影像資料200解析取得,因雷射掃描光束22主要投射在微針12的一側表面(例如,上表面)上,且第一長度值L1皆在同一水平面,受折射率的影響非常小,故可以忽略折射率。因此,可將公式(1)修正為下列公式(2):第一長度值L1=像素解析度×第一影像像素值......(2) Based on the above formula (1), it can be known that the calculation method of the first length value L1 is pixel resolution × first image pixel value ÷ refractive index. The processing module 36 can perform operations according to the above calculation formula (1) and obtain the first length value L1 or refractive index corresponding to the microneedle 12. Since the first length value L1 in the embodiment of the present invention is obtained by analyzing the first tomographic image data 200, because the laser scanning beam 22 is mainly projected on one side surface of the microneedle 12 (for example, the upper surface), and the first length value L1 is on the same horizontal plane, the influence of the refractive index is very small, so the refractive index can be ignored. Therefore, formula (1) can be corrected to the following formula (2): first length value L1 = pixel resolution × first image pixel value......(2)

連接纜線40,分別連接光學同調斷層掃描儀器20及系統主機30。連接纜線40包括光纖(圖中未示)及電線(圖中未示)。連接纜線40用以傳輸光訊號與/或電訊號。 The connecting cable 40 is connected to the optical coherence tomography scanner 20 and the system host 30 respectively. The connecting cable 40 includes an optical fiber (not shown in the figure) and an electric wire (not shown in the figure). The connecting cable 40 is used to transmit optical signals and/or electric signals.

請參照圖2,圖2是根據本發明實施例之第一斷層影像資料的解析示意圖。在第一斷層影像資料200中具有微針陣列結構10的影像。以單一個微針12為例,處理模組36根據第一斷層影像資料200進行解析程序。解析程序可以例如是透過影像辨識軟體,將包含微針12的影像數據,根據影像特徵值進行辨識,以解析出微針12的針尖端121及針末端122。接著,處理模組36計算出從針尖端121至針末端122之間具有多少個像素單元12a,以計算出第一影像像素值。最後,處理模組36根據公式(2)即可計算出第一長度值L1。藉此,解決習知技術無法量測微針長度的問題,且本發明實施例採用非侵入式方式量測微針長度,盡可能減少量測過程對微針的結構造成影響。另外,第一斷層影像資料200的斷層截面影 像,可供檢查與確認微針內部結構是否有缺陷,解決習知技術無法檢查微針內部結構的問題。 Please refer to FIG. 2, which is a schematic diagram of the analysis of the first tomographic image data according to an embodiment of the present invention. The first tomographic image data 200 contains an image of the microneedle array structure 10. Taking a single microneedle 12 as an example, the processing module 36 performs an analysis procedure based on the first tomographic image data 200. The analysis procedure can, for example, be to use image recognition software to identify the image data containing the microneedle 12 according to the image feature value to analyze the needle tip 121 and the needle end 122 of the microneedle 12. Then, the processing module 36 calculates the number of pixel units 12a between the needle tip 121 and the needle end 122 to calculate the first image pixel value. Finally, the processing module 36 can calculate the first length value L1 according to formula (2). In this way, the problem that the conventional technology cannot measure the length of the microneedle is solved, and the embodiment of the present invention adopts a non-invasive method to measure the length of the microneedle, which minimizes the impact of the measurement process on the structure of the microneedle. In addition, the cross-sectional image of the first tomographic image data 200 can be used to check and confirm whether the internal structure of the microneedle is defective, solving the problem that the conventional technology cannot check the internal structure of the microneedle.

請參照圖3,圖3是根據本發明實施例之量測微針陣列結構的另一示意圖。微針陣列結構10以第二軸向設置。所述第二軸向與第一軸向垂直。所述第二軸向是指微針12的針尖端121朝向Z軸方向。同樣的,微針陣列結構10,可固定並設置於機械移動/旋轉/轉向機構(例如,升降平台或機械手臂)上,實現以第二軸向設置的目的。光學同調斷層掃描儀器20,用以產生並投射雷射掃描光束22至微針12。更具體的說,投射的雷射掃描光束22從微針12的針尖端121至針末端122,再經由針末端122、針尖端121、光學同調斷層掃描儀器20、連接纜線40的路徑返回至系統主機30的光譜分析儀34,以致光譜分析儀34據以取得第二斷層影像資料300。所述雷射掃描光束22的投射方向(例如,Z軸)與第二軸向(例如,Z軸為平行。在其他實施例中,所述雷射掃描光束22的投射方向與第二軸向大致上為平行。在其他實施例中,當要量測微針陣列結構10上的其他微針時,可控制光學同調斷層掃描儀器20沿量測方向從微針12的上方移動至微針14的上方,以取得對應微針12至微針14之間各微針的第二斷層影像資料300。 Please refer to Figure 3, which is another schematic diagram of the measurement microneedle array structure according to an embodiment of the present invention. The microneedle array structure 10 is arranged in a second axial direction. The second axial direction is perpendicular to the first axial direction. The second axial direction refers to the needle tip 121 of the microneedle 12 facing the Z-axis direction. Similarly, the microneedle array structure 10 can be fixed and set on a mechanical moving/rotating/turning mechanism (for example, a lifting platform or a robotic arm) to achieve the purpose of being set in the second axial direction. The optical coherence tomography scanner 20 is used to generate and project a laser scanning beam 22 to the microneedle 12. More specifically, the projected laser scanning beam 22 is transmitted from the needle tip 121 of the microneedle 12 to the needle end 122, and then returns to the spectrometer 34 of the system host 30 via the path of the needle end 122, the needle tip 121, the optical coherence tomography scanner 20, and the connecting cable 40, so that the spectrometer 34 obtains the second tomographic image data 300. The projection direction (e.g., Z axis) of the laser scanning beam 22 is parallel to the second axis (e.g., Z axis). In other embodiments, the projection direction of the laser scanning beam 22 is substantially parallel to the second axis. In other embodiments, when other microneedles on the microneedle array structure 10 are to be measured, the optical coherence tomography scanner 20 can be controlled to move from above the microneedle 12 to above the microneedle 14 along the measurement direction to obtain the second tomographic image data 300 corresponding to each microneedle between microneedle 12 and microneedle 14.

請參照圖4,圖4是根據本發明圖3實施例的微針陣列結構的俯視示意圖。可更清楚的看到,各微針為交錯排列。光學同調斷層掃描儀器20沿量測方向從微針12的上方移動至微針14的上方,以取得對應微針12至微針14之間各微針的第二斷層影像資料300。在其他實施例中,量測方向也可以是從微針14的上方移動至微針12的上方。在其他實施例中,也可以一次量測多排的微針,節省量測時間。 Please refer to FIG. 4, which is a top view schematic diagram of the microneedle array structure according to the embodiment of FIG. 3 of the present invention. It can be seen more clearly that the microneedles are arranged in a staggered manner. The optical coherence tomography scanner 20 moves from the top of the microneedle 12 to the top of the microneedle 14 along the measurement direction to obtain the second tomographic image data 300 corresponding to each microneedle between microneedle 12 and microneedle 14. In other embodiments, the measurement direction can also be from the top of the microneedle 14 to the top of the microneedle 12. In other embodiments, multiple rows of microneedles can also be measured at one time to save measurement time.

請參照圖5,圖5是根據本發明實施例之第二斷層影像資料的解析示意圖。在第二斷層影像資料300中具有微針陣列結構10的影像。以單一個微針12為例,處理模組36根據第二斷層影像資料300進行解析程序。解析程序可以例如是透過影像辨識軟體,將包含微針12的影像數據,根據影像特徵值進行辨識,以解析出微針12的針尖端121及針末端122。接著,處理模組36計算出從針尖端121至針末端122之間具有多少個像素單元12a,以計算出第一影像像素值,再將像素解析度×第一影像像素值後,可以得到第一光程長度值。由於投射的雷射掃描光束22從針尖端121進入至針末端122,再從針末端122返回針尖端121,因此,所得到的第二斷層影像資料300受到折射率的影響,故根據公式(1)即可計算出折射率。舉例來說,處理模組36將像素解析度(例如,以Z軸方向為計算基礎)、第一影像像素值及第一長度值L1輸入公式(1)後,即可計算出折射率。 Please refer to FIG. 5 , which is a schematic diagram of the analysis of the second tomographic image data according to an embodiment of the present invention. The second tomographic image data 300 includes an image of the microneedle array structure 10. Taking a single microneedle 12 as an example, the processing module 36 performs an analysis procedure based on the second tomographic image data 300. The analysis procedure can be, for example, through image recognition software, to identify the image data containing the microneedle 12 according to the image feature value to analyze the needle tip 121 and the needle end 122 of the microneedle 12. Then, the processing module 36 calculates how many pixel units 12a there are from the needle tip 121 to the needle end 122 to calculate the first image pixel value, and then after multiplying the pixel resolution by the first image pixel value, the first optical path length value can be obtained. Since the projected laser scanning beam 22 enters from the needle tip 121 to the needle end 122 and then returns from the needle end 122 to the needle tip 121, the obtained second tomographic image data 300 is affected by the refractive index, so the refractive index can be calculated according to formula (1). For example, the processing module 36 inputs the pixel resolution (for example, based on the Z axis direction), the first image pixel value and the first length value L1 into formula (1) to calculate the refractive index.

請參照圖6,圖6是根據本發明實施例之第三斷層影像資料的解析示意圖。在第三斷層影像資料310中具有微針陣列結構10的影像,而微針陣列結構10被插入至皮膚50。由於微針12的材質(例如,可溶性)關係,而使微針12的長度產生變化,透過本實施例可以量測微針12長度變化後的第二長度值L2。以單一個微針12為例,處理模組36根據第三斷層影像資料310進行解析程序。解析程序可以例如是透過影像辨識軟體,將包含微針12的影像數據,根據影像特徵值進行辨識,以解析出微針12的針尖端121及針末端122。接著,處理模組36解析該第三斷層影像資料310以獲得第二影像像素值。詳細來說,處理模組36計算出從針尖端121至針末端122之間具有多少個像素單元12a,以計算出第二影像像素值,再將像素解析度×第二影像像素值後,可以得到第二光程長度值。由於投射的雷射掃描光束22從針尖端121進入至針末端122,再從針末端122返回針尖端121,因 此,所得到的第三斷層影像資料310受到折射率的影響,又所述折射率已於圖5實施例計算取得,故第二長度值L2亦可採用公式(1)計算方式取得,只是將公式(1)中的第一長度值L1替換為第二長度值L2、將第一影像像素值替換為第二影像像素值。在本實施例中,第二影像像素值小於第一影像像素值。接著,將折射率帶入公式(1)後,即可計算出第二長度值L2。舉例來說,處理模組36將像素解析度、第二影像像素值及折射率輸入公式(1)後,即可計算出第二長度值L2。另外,像素解析度的計算方式可藉由將反射鏡放在另一機械移動/旋轉/轉向機構上,原位置量測反射鏡一次,並將反射鏡上升一段預定距離(例如,500μm)後,再量測一次。兩次量測的物體介面高度相減後得像素差為空氣中500μm的距離,將500μm除以像素差即為像素解析度。 Please refer to FIG. 6 , which is a schematic diagram of the analysis of the third tomographic image data according to an embodiment of the present invention. The third tomographic image data 310 contains an image of the microneedle array structure 10, and the microneedle array structure 10 is inserted into the skin 50. Due to the material (e.g., solubility) of the microneedle 12, the length of the microneedle 12 changes. Through this embodiment, the second length value L2 after the length of the microneedle 12 changes can be measured. Taking a single microneedle 12 as an example, the processing module 36 performs an analysis procedure based on the third tomographic image data 310. The analysis procedure can, for example, be to identify the image data containing the microneedle 12 based on the image feature value through image recognition software to analyze the needle tip 121 and the needle end 122 of the microneedle 12. Next, the processing module 36 analyzes the third slice image data 310 to obtain the second image pixel value. Specifically, the processing module 36 calculates the number of pixel units 12a between the needle tip 121 and the needle end 122 to calculate the second image pixel value, and then multiplies the pixel resolution by the second image pixel value to obtain the second optical path length value. Since the projected laser scanning beam 22 enters from the needle tip 121 to the needle end 122 and then returns from the needle end 122 to the needle tip 121, the obtained third slice image data 310 is affected by the refractive index. The refractive index has been calculated and obtained in the embodiment of FIG5 , so the second length value L2 can also be obtained by using the calculation method of formula (1), except that the first length value L1 in formula (1) is replaced by the second length value L2 and the first image pixel value is replaced by the second image pixel value. In this embodiment, the second image pixel value is less than the first image pixel value. Then, after the refractive index is substituted into formula (1), the second length value L2 can be calculated. For example, after the processing module 36 inputs the pixel resolution, the second image pixel value and the refractive index into formula (1), the second length value L2 can be calculated. In addition, the pixel resolution can be calculated by placing the reflector on another mechanical moving/rotating/turning mechanism, measuring the reflector once in the original position, and then raising the reflector a predetermined distance (for example, 500μm) and measuring it again. The pixel difference obtained by subtracting the two measured object interface heights is a distance of 500μm in the air, and 500μm divided by the pixel difference is the pixel resolution.

以下舉例說明本發明實施例如何以非侵入性的方式,觀察微針陣列結構10插入皮膚50後的狀況(例如,是否穿透角質層、表皮層)。 The following example illustrates how the present invention can be used to observe the condition of the microneedle array structure 10 after it is inserted into the skin 50 in a non-invasive manner (e.g., whether it penetrates the stratum corneum or epidermis).

首先,微針陣列結構10未插入皮膚前,微針12的第一長度值L1為616μm、第一光程長度值為801μm及折射率為1.3。接著,將微針陣列結構10插入皮膚50,並利用光學同調斷層掃描儀器20掃描取得微針12插入皮膚50後的第三斷層影像資料310。處理模組36由第三斷層影像資料310可解析出微針12具有129個像素單元12a並將129乘上像素解析度(例如,6μm)後,可得到第二光程長度值。處理模組36再將第二光程長度值除以折射率(例如,1.3),即可得到微針12的第二長度值L2。因此,第二長度值L2為:129×6÷1.3

Figure 112116977-A0305-02-0013-1
595μm。藉此,可以得知,微針12的長度由616μm縮短至595μm。 First, before the microneedle array structure 10 is inserted into the skin, the first length value L1 of the microneedle 12 is 616 μm, the first optical path length value is 801 μm, and the refractive index is 1.3. Then, the microneedle array structure 10 is inserted into the skin 50, and the optical coherence tomography scanner 20 is used to scan and obtain the third tomographic image data 310 after the microneedle 12 is inserted into the skin 50. The processing module 36 can analyze the third tomographic image data 310 to find that the microneedle 12 has 129 pixel units 12a and multiply 129 by the pixel resolution (for example, 6 μm) to obtain the second optical path length value. The processing module 36 then divides the second optical path length value by the refractive index (for example, 1.3) to obtain the second length value L2 of the microneedle 12. Therefore, the second length value L2 is: 129×6÷1.3
Figure 112116977-A0305-02-0013-1
Thus, it can be known that the length of the microneedle 12 is shortened from 616 μm to 595 μm.

此外,由第三斷層影像資料310可解析出微針12暴露在空氣中的長度具有56個像素單元12a。處理模組36將56乘上像素解析度(例如,6μm)後,可 得到微針12暴露在空氣中的長度為:56×6=336μm。處理模組36將第二長度值L2減去微針12暴露在空氣中的長度,即可獲得微針插入皮膚50後的長度為:595-336=259μm。藉此,以非侵入性的方式,觀察微針陣列結構10插入皮膚50後的狀況,以確認微針陣列結構10是否穿透角質層或表皮層,並解決習知技術無法量測微針插入皮膚後之長度的問題。 In addition, the third tomographic image data 310 can be analyzed to show that the length of the microneedle 12 exposed to the air has 56 pixel units 12a. The processing module 36 multiplies 56 by the pixel resolution (e.g., 6μm) to obtain the length of the microneedle 12 exposed to the air: 56×6=336μm. The processing module 36 subtracts the length of the microneedle 12 exposed to the air from the second length value L2 to obtain the length of the microneedle after being inserted into the skin 50: 595-336=259μm. In this way, the state of the microneedle array structure 10 after being inserted into the skin 50 is observed in a non-invasive manner to confirm whether the microneedle array structure 10 penetrates the stratum corneum or the epidermis, and solves the problem that the conventional technology cannot measure the length of the microneedle after being inserted into the skin.

請參照圖7,圖7是根據本發明實施例的量測微針長度的方法流程圖。步驟S600,將微針陣列結構10以第一軸向設置,微針陣列結構10具有複數個微針12。 Please refer to FIG. 7, which is a flow chart of a method for measuring the length of a microneedle according to an embodiment of the present invention. Step S600, the microneedle array structure 10 is arranged in a first axial direction, and the microneedle array structure 10 has a plurality of microneedles 12.

步驟S602,投射雷射掃描光束22至所述微針12的第一端(例如,針末端122),並移動雷射掃描光束22至所述微針的第二端(例如,針尖端121),以取得對應所述微針的第一斷層影像資料200。所述雷射掃描光束22的投射方向與所述第一軸向為垂直。 Step S602, projecting a laser scanning beam 22 to the first end of the microneedle 12 (e.g., the needle end 122), and moving the laser scanning beam 22 to the second end of the microneedle (e.g., the needle tip 121) to obtain the first cross-sectional image data 200 corresponding to the microneedle. The projection direction of the laser scanning beam 22 is perpendicular to the first axis.

步驟S604,由系統主機30解析第一斷層影像資料200,以取得對應所述微針的第一長度值L1。所述第一長度值L1根據公式(2)計算取得。 In step S604, the system host 30 analyzes the first cross-sectional image data 200 to obtain the first length value L1 corresponding to the microneedle. The first length value L1 is calculated according to formula (2).

請參照圖8A、8B,其為本發明另一實施例的量測微針長度的方法流程圖,圖8A之步驟S600、步驟S602及步驟S604與圖7實施例相同,於此不再贅述。步驟S606,轉動微針陣列結構10以第二軸向設置。所述第二軸向與第一軸向垂直。 Please refer to Figures 8A and 8B, which are flow charts of a method for measuring the length of microneedles in another embodiment of the present invention. Steps S600, S602, and S604 in Figure 8A are the same as those in the embodiment of Figure 7 and are not described in detail here. Step S606: Rotate the microneedle array structure 10 to set it in a second axial direction. The second axial direction is perpendicular to the first axial direction.

步驟S608,再次投射雷射掃描光束22至所述微針12第一端與第二端,以取得對應所述微針12的第二斷層影像資料300。所述雷射掃描光束22的投射方向與所述第二軸向為平行。由於第二斷層影像資料300可同時呈現微針的外部與內部結構的影像特徵,因此,可供檢查與確認微針內部結構是否有瑕疵。藉 此,解決習知技術僅能觀察微針外部結構而無法檢查微針內部結構的問題。另外,在其他實施例中,可以先執行步驟S606、步驟S608及步驟608後,再執行步驟S600、步驟S602及步驟S604。換言之,取得第一斷層影像資料200與第二斷層影像資料300的步驟,並無先後順序。 In step S608, the laser scanning beam 22 is projected again to the first end and the second end of the microneedle 12 to obtain the second cross-sectional image data 300 corresponding to the microneedle 12. The projection direction of the laser scanning beam 22 is parallel to the second axial direction. Since the second cross-sectional image data 300 can simultaneously present the image features of the external and internal structures of the microneedle, it can be used to check and confirm whether the internal structure of the microneedle has defects. In this way, the problem that the conventional technology can only observe the external structure of the microneedle but cannot check the internal structure of the microneedle is solved. In addition, in other embodiments, steps S606, S608 and 608 can be executed first, and then steps S600, S602 and S604 can be executed. In other words, there is no order in the steps of obtaining the first slice image data 200 and the second slice image data 300.

步驟S610,由系統主機30解析第二斷層影像資料300,以取得對應所述微針12的第一光程長度值。所述第一光程長度值根據像素解析度×第一影像像素值計算取得。 In step S610, the system host 30 analyzes the second cross-sectional image data 300 to obtain the first optical path length value corresponding to the microneedle 12. The first optical path length value is calculated based on the pixel resolution × the first image pixel value.

步驟S612,由系統主機30根據第一光程長度值與第一長度值L1之比值,計算出折射率。系統主機30根據公式(1)即可計算出折射率。 In step S612, the system host 30 calculates the refractive index based on the ratio of the first optical path length value to the first length value L1. The system host 30 can calculate the refractive index based on formula (1).

步驟S614,將微針陣列結構10插入至皮膚50,並投射雷射掃描光束22至微針陣列結構10,以取得第三斷層影像資料310。 Step S614, insert the microneedle array structure 10 into the skin 50, and project the laser scanning beam 22 onto the microneedle array structure 10 to obtain the third tomographic image data 310.

步驟S616,由系統主機30解析第三斷層影像資料310,以取得對應所述微針12的第二光程長度值。第二光程長度值根據像素解析度×第二影像像素值計算取得。 In step S616, the system host 30 analyzes the third tomographic image data 310 to obtain the second optical path length value corresponding to the microneedle 12. The second optical path length value is calculated based on the pixel resolution × the second image pixel value.

步驟S618,由系統主機30根據折射率與第二光程長度值計算出對應所述微針12的第二長度值L2。第二長度值L2根據第二光程長度值÷折射率計算取得。 In step S618, the system host 30 calculates the second length value L2 corresponding to the microneedle 12 according to the refractive index and the second optical path length value. The second length value L2 is calculated according to the second optical path length value ÷ the refractive index.

綜上所述,本發明的量測微針長度的方法及其系統,利用OCT儀器(例如,包括光學同調斷層掃描儀器20與光譜分析儀34)取得斷層影像資料,並透過影像解析程序與公式計算程序,獲得微針的第一長度值L1與折射率,解決習知技術無法量測微針長度的問題,且本發明實施例採用非侵入式方式量測微針長度,盡可能減少量測過程對微針的結構造成影響。另外,本發明利用OCT儀 器取得的斷層影像資料,可供檢查與確認微針內部結構是否有缺陷,解決習知技術無法檢查微針內部結構的問題,進而提升微針的品質控管。另外,透過解析微針插入至皮膚後的斷層影像資料與公式計算程序,計算出微針插入皮膚後的長度,解決習知技術無法在當微針插入至皮膚後量測微針長度的問題。 In summary, the method and system for measuring the length of microneedles of the present invention utilizes an OCT instrument (e.g., including an optical coherence tomography scanner 20 and a spectrometer 34) to obtain cross-sectional image data, and obtains the first length value L1 and the refractive index of the microneedle through an image analysis program and a formula calculation program, thereby solving the problem that the conventional technology cannot measure the length of the microneedle, and the embodiment of the present invention uses a non-invasive method to measure the length of the microneedle, thereby minimizing the impact of the measurement process on the structure of the microneedle. In addition, the cross-sectional image data obtained by the present invention using the OCT instrument can be used to check and confirm whether the internal structure of the microneedle is defective, thereby solving the problem that the conventional technology cannot check the internal structure of the microneedle, thereby improving the quality control of the microneedle. In addition, by analyzing the cross-sectional image data after the microneedle is inserted into the skin and using a formula calculation program, the length of the microneedle after it is inserted into the skin is calculated, solving the problem that conventional technology cannot measure the length of the microneedle after it is inserted into the skin.

本發明在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本發明,而不應解讀為限制本發明之範圍。應注意的是,舉凡與該實施例等效之變化與置換,均應設為涵蓋於本發明之範疇內。因此,本發明之保護範圍當以申請專利範圍所界定者為準。 The present invention has been disclosed in the above text with a preferred embodiment, but those familiar with the present technology should understand that the embodiment is only used to describe the present invention and should not be interpreted as limiting the scope of the present invention. It should be noted that all changes and substitutions equivalent to the embodiment should be included in the scope of the present invention. Therefore, the scope of protection of the present invention shall be based on the scope defined by the patent application.

S600,S602,S604:步驟 S600, S602, S604: Steps

Claims (8)

一種量測微針長度的方法,適用於量測一微針陣列結構的微針長度,其中該微針陣列結構是以一第一軸向設置,並且具有複數個微針,該方法包括下列步驟:投射一雷射掃描光束至所述微針的一第一端,並移動該雷射掃描光束至所述微針的一第二端,以取得對應所述微針的一第一斷層影像資料;由一系統主機解析該第一斷層影像資料,以取得對應所述微針的一第一長度值;轉動該微針陣列結構以一第二軸向設置,該第二軸向與該第一軸向垂直;再次投射該雷射掃描光束至所述微針的該第一端與該第二端,以取得對應所述微針的一第二斷層影像資料;由該系統主機解析該第二斷層影像資料,以取得對應所述微針的一第一光程長度值;由該系統主機根據該第一光程長度值與該第一長度值之比值,計算出一折射率;將該微針陣列結構插入至一皮膚,並投射該雷射掃描光束至該微針陣列結構,以取得一第三斷層影像資料;由該系統主機解析該第三斷層影像資料,以取得對應所述微針的一第二光程長度值;及 由該系統主機根據該折射率與該第二光程長度值計算出對應所述微針的一第二長度值。 A method for measuring the length of a microneedle is applicable to measuring the length of a microneedle of a microneedle array structure, wherein the microneedle array structure is arranged in a first axial direction and has a plurality of microneedles. The method comprises the following steps: projecting a laser scanning beam to a first end of the microneedle, and moving the laser scanning beam to a second end of the microneedle to obtain a first tomographic image data corresponding to the microneedle; parsing the first tomographic image data by a system host to obtain a first length value corresponding to the microneedle; rotating the microneedle array structure to be arranged in a second axial direction, the second axial direction being perpendicular to the first axial direction; projecting the laser scanning beam again to the first end of the microneedle and the second end of the microneedle; and The second end is connected to the microneedle array structure to obtain a second cross-sectional image data corresponding to the microneedle; the system host analyzes the second cross-sectional image data to obtain a first optical path length value corresponding to the microneedle; the system host calculates a refractive index according to the ratio of the first optical path length value to the first length value; the microneedle array structure is inserted into a skin, and the laser scanning beam is projected to the microneedle array structure to obtain a third cross-sectional image data; the system host analyzes the third cross-sectional image data to obtain a second optical path length value corresponding to the microneedle; and the system host calculates a second length value corresponding to the microneedle according to the refractive index and the second optical path length value. 如請求項1所述之量測微針長度的方法,其中該系統主機解析該第一斷層影像資料與該第二斷層影像資料二者中的一者,以獲得一第一影像像素值與一像素解析度,並根據該第一影像像素值與該像素解析度計算出該第一長度值與該第一光程長度值;該系統主機解析該第三斷層影像資料以獲得一第二影像像素值,並根據該第二影像像素值與該像素解析度計算出該第二光程長度值。 A method for measuring the length of a microneedle as described in claim 1, wherein the system host parses one of the first cross-sectional image data and the second cross-sectional image data to obtain a first image pixel value and a pixel resolution, and calculates the first length value and the first optical path length value based on the first image pixel value and the pixel resolution; the system host parses the third cross-sectional image data to obtain a second image pixel value, and calculates the second optical path length value based on the second image pixel value and the pixel resolution. 如請求項1所述之量測微針長度的方法,更包括以一光學同調斷層掃描儀器產生該雷射掃描光束。 The method for measuring the length of a microneedle as described in claim 1 further includes generating the laser scanning beam using an optical coherent tomography scanner. 如請求項3所述之量測微針長度的方法,更包括以一連接纜線連接該光學同調斷層掃描儀器與該系統主機。 The method for measuring the length of a microneedle as described in claim 3 further includes connecting the optical coherence tomography scanner and the system host with a connecting cable. 一種量測微針長度的系統,適用於量測一微針陣列結構的微針長度,其中該微針陣列結構是以一第一軸向設置,並且具有複數個微針,該系統包括:一光學同調斷層掃描儀器,用以投射一雷射掃描光束至所述微針的一第一端,並移動該雷射掃描光束至所述微針的一第二端,以取得對應所述微針的一第一斷層影像資料;一系統主機,與該光學同調斷層掃描儀器連接,用以解析該第一斷層影像資料,以取得對應所述微針的一第一長度值; 一光源模組,經由一連接纜線連接該光學同調斷層掃描儀器,用以提供一光學掃描系統光源至該光學同調斷層掃描儀器,以致該光學同調斷層掃描儀器據以產生該雷射掃描光束;一光譜分析儀,與該連接纜線連接,用以對該雷射掃描光束經由所述微針散射或反射回到該連接纜線的光訊號進行分析,以得到該第一斷層影像資料;及一處理模組,與該光譜分析儀連接,用以解析該第一斷層影像資料,以計算並取得該第一長度值;其中將該微針陣列結構以一第二軸向設置,該第二軸向與該第一軸向垂直;該光學同調斷層掃描儀器再次投射該雷射掃描光束至所述微針的該第一端與該第二端,以取得對應所述微針的一第二斷層影像資料;該系統主機解析該第二斷層影像資料,以取得對應所述微針的一第一光程長度值,並根據該第一光程長度值與該第一長度值之比值,計算出一折射率。 A system for measuring the length of microneedles is suitable for measuring the length of microneedles of a microneedle array structure, wherein the microneedle array structure is arranged in a first axial direction and has a plurality of microneedles. The system comprises: an optical coherence tomography scanner for projecting a laser scanning beam to a first end of the microneedles and moving the laser scanning beam to a second end of the microneedles to obtain a first cross-sectional view corresponding to the microneedles. a system host connected to the optical coherence tomography scanner to analyze the first tomography image data to obtain a first length value corresponding to the microneedle; a light source module connected to the optical coherence tomography scanner via a connecting cable to provide an optical scanning system light source to the optical coherence tomography scanner so that the optical coherence tomography scanner generates the laser scanning light. beam; a spectrometer connected to the connecting cable, used to analyze the optical signal of the laser scanning beam scattered or reflected by the microneedle back to the connecting cable to obtain the first tomographic image data; and a processing module connected to the spectrometer, used to analyze the first tomographic image data to calculate and obtain the first length value; wherein the microneedle array structure is arranged in a second axial direction, the second axis The optical coherence tomography scanner projects the laser scanning beam to the first end and the second end of the microneedle again to obtain a second tomographic image data corresponding to the microneedle; the system host analyzes the second tomographic image data to obtain a first optical path length value corresponding to the microneedle, and calculates a refractive index according to the ratio of the first optical path length value to the first length value. 如請求項5所述之量測微針長度的系統,其中該系統主機解析該第一斷層影像資料與該第二斷層影像資料二者中的一者,以獲得一第一影像像素值與一像素解析度,並根據該第一影像像素值與該像素解析度計算出該第一長度值與該第一光程長度值。 A system for measuring the length of a microneedle as described in claim 5, wherein the system host analyzes one of the first cross-sectional image data and the second cross-sectional image data to obtain a first image pixel value and a pixel resolution, and calculates the first length value and the first optical path length value based on the first image pixel value and the pixel resolution. 如請求項6所述之量測微針長度的系統,其中於該微針陣列結構被插入至一皮膚後,該光學同調斷層掃描儀器投射該雷射掃描光束至該微針陣列結構,以取得一第三斷層影像資料;該系統 主機解析該第三斷層影像資料,以取得對應所述微針的一第二光程長度值,並根據該折射率與該第二光程長度值計算出對應所述微針的一第二長度值。 A system for measuring the length of microneedles as described in claim 6, wherein after the microneedle array structure is inserted into a skin, the optical coherence tomography scanner projects the laser scanning beam to the microneedle array structure to obtain a third tomographic image data; the system host analyzes the third tomographic image data to obtain a second optical path length value corresponding to the microneedle, and calculates a second length value corresponding to the microneedle based on the refractive index and the second optical path length value. 如請求項7所述之量測微針長度的系統,其中該系統主機解析該第三斷層影像資料以獲得一第二影像像素值,並根據該第二影像像素值與該像素解析度計算出第二光程長度值。 A system for measuring the length of a microneedle as described in claim 7, wherein the system host analyzes the third tomographic image data to obtain a second image pixel value, and calculates a second optical path length value based on the second image pixel value and the pixel resolution.
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