TWI735240B - Probe device - Google Patents

Abstract

The invention discloses a probe device and an integrally formed probe. The probe device includes a first guide plate, a second guide plate and a plurality of integrally formed probes. The first guide plate has a plurality of first hole. The second guide plate has a plurality of second hole. Each integrally formed probe has two protruding structures, the body and two protruding structures of each integrally formed probe can be inserted between the first guide plate and the second guide plate through the second hole. Each the two protruding structures of the integrally formed probe can abut the side of the second guide plate, and the two protruding structures can restrict the movement of the one-piece probe with respect to the second guide plate range.

Description

Probe device

The invention relates to a probe device, in particular to a probe device with an integrally formed probe.

Please refer to FIG. 1, which shows a schematic cross-sectional view of a conventional probe device. The existing probe device P includes a base P1, a plurality of integrated probes P2, and a top cover P3. The base P1 includes a plurality of limit perforations P11, and the top cover P3 has a plurality of top cover perforations P31. The installation method of the probe device P is as follows: firstly perform the needle planting operation, so that one end of the multiple integrated probes P2 is correspondingly set in the multiple limit perforations P11 of the base P1; then, the multiple The limit perforation P11 correspondingly passes through the multiple integrated probes P2, so that the top cover P3 and the base P1 can be fixed to each other, and accordingly the movement range of the multiple integrated probes P2 is restricted by the base P1 and the top cover P3 .

As mentioned above, in practical applications, in an embodiment where the number of integrated probes P2 is large, or the size of integrated probes P2 is small, it is easy to cause multiple limit perforations P11 of the top cover P3 to fail. Smoothly pass through a plurality of integrally formed probes P2, and then the problem that the top cover P3 and the base P1 cannot be fixed to each other occurs.

The invention discloses a probe device and an integrated probe, which are mainly used to improve the problem that the top cover is difficult to be fixed to the base provided with a plurality of spring probes during the assembly process of the conventional probe device.

One of the embodiments of the present invention discloses a probe device, which includes: at least one first guide plate having a plurality of first perforations; at least one second guide plate, which is spaced apart from the first guide plate, At least one of the second guide plates has a plurality of second perforations, and each of the second perforations penetrates through the In the second guide plate, a plurality of the second perforations are spaced apart from each other and are not connected to each other and are formed on the second guide plate; a plurality of integrally formed probes, each of the integrally formed probes includes a body and two Two protruding structures, the opposite ends of the body are defined as a contact end and a fixed end, the body forms an elastic structure between the contact end and the fixed end; two protruding ends The structure is formed on both sides of the body; a plurality of the integrally formed probes are arranged between the first guide plate and the second guide plate, and each of the integrally formed probes has two positions The protruding structure abuts against a side surface of the second guide plate facing the first guide plate, and the two protruding structures are not accommodated in two adjacent second through holes, each One end of the body passes through each of the first perforations, and is exposed on the side of the first guide plate opposite to the second guide plate; wherein, when the contact end is pressed, the elastic structure will Elastically deformed, and when the contact end is no longer compressed, the elastic structure will return to an undeformed state; wherein, the body of each of the integrally formed probes, the two protruding structures, and the The elastic structure can pass through each of the second perforations.

One of the embodiments of the present invention discloses an integrally formed probe, which includes a main body, two protruding structures and an elastic structure. The main body is an elongated structure extending in an axial direction. The main body and the protruding structure And the elastic structure are integrally formed, and the two protruding structures are formed by extending outward from the opposite sides of the main body; wherein, when one end of the main body is compressed, the elastic structure will elastically deform, and when one end of the main body is no longer compressed, The elastic structure will return to its uncompressed state.

In summary, the probe device and the integrated probe of the present invention are designed to provide two protruding structures on the integrated probe and multiple second perforations on the second guide plate, so that the probe device Can be assembled easily.

In order to further understand the features and technical content of the present invention, please refer to the following detailed descriptions and drawings about the present invention, but these descriptions and drawings are only used to illustrate the present invention, and do not make any claims about the protection scope of the present invention. limit.

Known technology:

P: Probe device

P1: Base

P11: Limit perforation

P2: Integrated probe

P3: Top cover

P31: Top cover perforation

this invention:

100: Probe device

1: The first guide plate

11: The first perforation

2: Interval frame

21: Piercing

3: The second guide plate

3A: Side

31: second perforation

311: Avoidance Hole

32: limit structure

321: Groove

4: One-piece probe

41: body

411: contact end

412: fixed end

42: protruding structure

43: Elastic structure

5: Auxiliary guide

51: auxiliary perforation group

511: auxiliary perforation

512: snap slot

513: Avoidance Slot

SP: housing space

W1, W2, W4: width

W3: Axial width

W5, W6: radial width

Fig. 1 is a schematic cross-sectional view of a conventional probe device.

Fig. 2 is a three-dimensional schematic diagram of the first embodiment of the probe device of the present invention.

Fig. 3 is an exploded schematic diagram of the first embodiment of the probe device of the present invention.

4 is a schematic partial cross-sectional view of the first embodiment of the probe device of the present invention.

Fig. 5 is a schematic side view of one embodiment of the integrally formed probe of the present invention.

Fig. 6 is a schematic diagram of a partial assembly process of the first embodiment of the probe device of the present invention.

Fig. 7 is a schematic diagram of a partial assembly process of the first embodiment of the probe device of the present invention.

Fig. 8 is a partial exploded schematic view of the second embodiment of the probe device of the present invention.

FIG. 9 is a schematic partial cross-sectional view of the second embodiment of the probe device of the present invention.

Fig. 10 is a partial exploded schematic view of the third embodiment of the probe device of the present invention.

11 is a schematic diagram of a partial assembly process of the third embodiment of the probe device of the present invention.

FIG. 12 is a schematic partial cross-sectional view of the third embodiment of the probe device of the present invention.

FIG. 13 is a schematic partial cross-sectional view of the fourth embodiment of the probe device of the present invention.

In the following description, if it is pointed out, please refer to the specific drawing or as shown in the specific drawing, it is only used to emphasize that in the subsequent description, most of the related content appears in the specific drawing. However, it is not limited that only the specific drawings can be referred to in this subsequent description.

Please refer to FIGS. 2 to 4 together. FIG. 2 is a perspective view of the first embodiment of the probe device of the present invention, and FIG. 3 is an exploded view of the first embodiment of the probe device of the present invention, and FIG. 4 It is a schematic cross-sectional view of the probe device 100 of the present embodiment shown in FIG. 2 taken along the IV-IV section line. The probe device 100 of the present invention includes a first guide plate 1, a spacer frame body 2, a second guide plate 3 and a plurality of integrated probes 4. The first guide plate 1 has a plurality of first through holes 11. Each first The through holes 11 are spaced apart from each other, and each of the first through holes 11 penetrates the first guide plate 1. In the drawing of this embodiment, the probe device 100 includes six integrated probes 4 as an example, but the number of integrated probes 4 is not limited to six.

The spacer frame 2 is arranged on one side of the first guide plate 1, the second guide plate 3 is arranged on the side of the spacer frame 2 opposite to the first guide plate 1, and the second guide plate 3 and the first guide plate 1 are mutually Set at intervals. In practical applications, the first guide plate 1, the spacer frame body 2 and the second guide plate 3 may be fixed to each other by, for example, a plurality of screws, but it is not limited to this. Among them, the spacer frame 2 is mainly used to make the first guide plate 1 and the second guide plate 3 spaced apart from each other. Therefore, the shape and thickness of the spacer frame 2 can be changed according to requirements, not shown in the figure. Shown is the limit. In particular, as long as the first guide plate 1 and the second guide plate 3 are spaced apart, the probe device 100 may not have the spaced frame 2. For example, in different embodiments, the spaced The frame body 2 and the first guide plate 1 may be integrally formed, or the spacer frame 2 and the second guide plate 3 may be integrally formed.

The second guide plate 3 has a plurality of second perforations 31, each of the second perforations 31 penetrates the second guide plate 3, and the plurality of second perforations 31 are spaced apart from each other and not communicated with each other. Wherein, each second perforation 31 is substantially corresponding to each first perforation 11 of the first guide plate 1. Each second perforation 31 is used to provide each integrated probe 4 to pass through. Therefore, the appearance of each second perforation 31 can be changed according to the appearance of the integrated probe 4.

Each integrally formed probe 4 includes a main body 41, two protruding structures 42 and an elastic structure 43, and the main body 41, two protruding structures 42 and the elastic structure 43 are integrally formed. The appearance of the main body 41 may be roughly a long rectangular structure extending in an axial direction, which is commonly known in the industry as a "rectangular probe" or a "square probe", but the appearance of the main body 41 is not based on this. However, in different embodiments, the appearance of the main body 41 may also be a substantially cylindrical structure.

Two protruding structures 42 are formed on two sides of the main body 41 (for example, two sides opposite to each other). In the embodiment where the main body 41 has an elongated rectangular body structure, the two protruding structures 42 may be formed by two opposite sides of the main body 41 extending outward, and the two protruding structures 42 may be They are roughly located on the same axis, and the appearance of each protruding structure 42 may be a rectangular body. In practical applications, the shape, size, and position of each protruding structure 42 and the position formed on the main body 41 can be changed according to requirements, and are not limited to those shown in the drawings of this embodiment.

The opposite ends of the main body 41 are defined as a contact end 411 and a fixed end 412 respectively. The main body 41 has the elastic structure 43 formed between the contact end 411 and the fixed end 412. When the contact end 411 of the body 41 is pressed by an external force, the elastic structure 43 will be elastically deformed and correspondingly generate an elastic restoring force. When the contact end 411 of the body 41 is no longer pressed by an external force, the elastic structure 43 will be compressed. The elastic restoring force will restore the elastic structure 43 to an uncompressed state. Specifically, the maximum amount of change of the elastic structure 43 after being compressed is the maximum stroke of the integrated probe 4.

In the drawings of this embodiment, the shape of the elastic structure 43 is roughly curved rectangular as an example, but the shape of the elastic structure 43 is not limited to this, and the elastic structure 43 is mainly used to make a whole body When one end of the type probe 4 is pressed, it can be elastically deformed in the longitudinal direction of the integral probe 4. Therefore, as long as it can be pressed at one end of the integral probe 4, the integral probe 4 is Elastically deforms in the length direction, and the elastic structure 43 can have any shape. As shown in FIG. 5, which shows a schematic side view of one of the embodiments of the integrated probe 4 of the present invention, the elastic structure 43 of the integrated probe 4 may also be shown in the shape of a fence as shown in FIG. structure.

Please refer to FIGS. 3 and 6 together. FIG. 6 is a schematic diagram of a partial assembly process of the first embodiment of the probe device of the present invention. The sum of the width W1 of the two protruding structures 42 of each integrated probe 4 and the width W2 of the main body 41 is not greater than the axial width W3 of each second perforation 31 of the second guide plate 3, and each integrated probe 4 The body 41 and the two protruding structures 42 of the probe 4 can pass through the second through hole 31. In this embodiment, the body 41 of each integrated probe 4 is a rectangular body, each protruding structure 42 is a rectangular body, and each second perforation 31 is a rectangular perforation as an example, but in the integrated probe When the main body 41 and the protruding structure 42 of 4 are of different shapes, the shape of the second perforation 31 can be changed corresponding to the shape of the main body 41 and the protruding structure 42. For example, in an integrally formed probe In the embodiment where the body 41 of the needle 4 is a cylindrical body, and the two protruding structures are rectangular bodies, the second perforation 31 may be formed by A circular perforation and two square perforations are formed together, and the body 41 of the integrated probe 4 can pass through the circular perforation, and the two protruding structures 42 can pass through the square perforation.

As shown in Figures 3 and 6, the width W4 of the elastic structure 43 of each integrated probe 4 is smaller than the axial width W3 of each second through hole 31, and the elastic structure 43 of each integrated probe 4 can pass through the first Two piercing 31. Each second perforation 31 is used to allow the two protruding structures 42 and the elastic structure 43 of the integrally formed probe 4 to pass through. Therefore, the appearance and size of each second perforation 31 may be based on each integrally formed probe The appearance of the main body 41, the two protruding structures 42 and the elastic structure 43 of 4 is changed. To facilitate the exterior design of the second perforation 31, the elastic structure 43 can be correspondingly located directly below the two protruding structures 42, and the width W4 of the elastic structure 43 of each integrally formed probe 4 is smaller than that of the integrally formed type. The width W2 of the body 41 of the probe 4 and the width W1 of the two protruding structures 42 are sum (that is, W4<W1+W1+W2). In this way, as long as the body 41 of the probe 4 and the two protruding structures are integrally formed The structure 42 can pass through the second through hole 31, and the elastic structure 43 can also pass through the second through hole 31. If the elastic structure 43 is formed by bending the main body 41 to one side, the width W4 of the elastic structure 43 can be smaller than the width W1 of the corresponding protruding structure 42.

Please refer to FIG. 4, FIG. 6 and FIG. 7. FIG. 7 is a part of the first guide plate, a part of the second guide plate, and a single integrated probe of the first embodiment of the probe device of the present invention An exploded schematic view (in order to clearly show the structure of the integrated probe 4, the aforementioned spacer frame 2 is not shown in FIG. 7). The needle planting method of the integrated probe 4 of the probe device of the present invention installed on the first guide plate 1 and the second guide plate 3 can be: as shown in FIG. 6, first make the elastic structure of the integrated probe 4 43 and the two protruding structures 42 sequentially pass through the second perforation 31 of the second guide plate 3; when the two protruding structures 42 pass through the second perforation 31, the two protruding structures 42 are located on the second guide plate 3. After facing the side of the first guide plate 1, rotate the integrated probe 4 (as shown in FIG. 7) so that the two protruding structures 42 are no longer located directly under the second perforation 31, thereby completing the implantation Needle steps. In practical applications, the angle of rotation of the integral probe 4 can be determined based on the positions of the two protruding structures 42, which is not limited here, as shown in FIG. 7 For the integrally formed probe 4 shown, when the integrally formed probe 4 is installed, the integrally formed probe 4 may be rotated by 90 degrees.

In addition, in the process of passing the two protruding structures 42 through the second perforation 31, one end of the integrated probe 4 can be passed through the first perforation 11 of the first guide plate 1, or it can be After the integrated probe 4 is rotated, the integrated probe 4 is moved toward the first guide plate 1 so that one end of the integrated probe 4 passes through the first through hole 11. Of course, in the process of passing the two protruding structures 42 through the second perforation 31, in the embodiment in which one end of the integrally formed probe 4 passes through the first perforation 11, the aperture of the first perforation 11 is slightly larger than that of the integrated structure. The width of one end of the type probe 4, and the integrally formed probe 4 can rotate relative to the first through hole 11. In practical applications, to facilitate the rotation of the integral probe 4 in the first perforation 11, the first perforation 11 may be a circular perforation, or the aperture of the first perforation 11 is larger than the outer diameter of the integral probe 4 . As shown in FIGS. 2 and 3, in practical applications, in an embodiment where at least a part of the body 41 of the integral probe 4 has a rectangular strip structure, the second guide plate 3 may also include a plurality of escape holes. 311. The multiple escape holes 311 and the multiple second perforations 31 communicate with each other, the radial width W6 of each escape hole 311 is greater than the radial width W5 of each second perforation 31, and a part of each integrated probe 4 penetrates each Avoidance holes 311, and each integrally formed probe 4 can rotate corresponding to each escape hole 311. In other words, in order to enable the integrated probe 4 to rotate smoothly relative to the second guide plate 3, in addition to widening the axial width of the second perforation 31, the second guide plate 3 may also be formed with a plurality of Avoid the hole 311.

As shown in Figures 6 and 7, in the process of installing the integrated probe 4 on the first guide plate 1 and the second guide plate 3, external related auxiliary components (not shown, for example, each Type cushion material, etc.), so that a gap is formed between the second guide plate 3 and the spacer frame 2. In this way, it can be ensured that the integrated probe 4 will not be disturbed by the second guide plate 3 during the rotation process. . Of course, if a gap is formed between the second guide plate 3 and the spacer frame 2 during the installation of the integrated probe 4, the integrated probe 4 is rotated to make the two protruding structures 42 Not located directly under the second perforation 31 Later, the relevant auxiliary components must be removed to move the second guide plate 3 in the direction of the first guide plate 1, and accordingly, the two protruding structures 42 correspondingly abut against the second guide plate 3 and face the first guide plate 3. One side 3A of the guide plate 1 (as shown in FIG. 4).

As described above, as shown in FIGS. 3 and 4, after the probe device 100 of this embodiment is assembled, each protruding structure 42 abuts against the side surface 3A of the second guide plate 3 facing the first guide plate 1. The movable range of the integrated probe 4 will be limited between the first guide plate 1 and the second guide plate 3. Wherein, the end of the integrally formed probe 4 that passes through the first through hole 11 may be a contact end 411, which is used to contact the device under test (DUT); in different embodiments, the integrally formed probe 4 The end passing through the first through hole 11 may also be the fixed end 412, which is used to fix the circuit board.

As shown in FIGS. 4 and 5, it is worth mentioning that the center of the spacer frame 2 has a perforation 21, and the perforation 21 is provided through the spacer frame 2. When the first guide plate 1, the spacer frame body 2 and the second guide plate 3 of the probe device 100 are fixed to each other, the first guide plate 1, the spacer frame body 2 and the second guide plate 3 together form an accommodating space SP , And the parts of the two protruding structures 42 of the plurality of integrally formed probes 4 are correspondingly located in the accommodating space SP. The spacer frame 2 is mainly used to make the first guide plate 1 and the second guide plate 3 spaced apart from each other, so that the elastic structure 43 of each integrally formed probe 4 can correspond to the elastic deformation in the accommodating space SP Therefore, the shape and thickness of the spacer frame 2 can be determined according to the shape of each integrated probe 4.

In summary, the probe device 100 of the present invention is designed by the protruding structure 42 of the integrally formed probe 4, the multiple second perforations 31 of the second guide plate 3, etc. After the probe 4 is inserted into the first guide plate 1 and the second guide plate 3 and rotated, the needle planting operation of the integrated probe 4 can be completed, and the probe device 100 of the present invention does not have the one shown in FIG. 1 In the conventional probe device P shown, after multiple integrated probes P2 are implanted in the base P1, when the top cover P3 and the base P1 are to be fixed to each other, the multiple integrated probes P2 may not be worn correctly The problem of multiple top cover perforations P31 over the top cover P3.

Please refer to FIGS. 8-9 together. FIG. 8 shows a partial exploded view of a single integrated probe, the first guide plate and the second guide plate of the second embodiment of the probe device of the present invention. FIG. 9 Shown is a schematic partial cross-sectional view of the second embodiment of the probe device of the present invention. The biggest difference between the probe device 100 of this embodiment and the aforementioned first embodiment is that the side surface 3A of the second guide plate 3 is further formed with a plurality of groups of limiting structures 32, and each group of limiting structures 32 includes two grooves 321. Each groove 321 does not penetrate the second guide plate 3, the two grooves 321 of each group of the limiting structure 32 communicate with each second through hole 31, and the two grooves 321 connected with one second through hole 31 can Correspondingly, the two protruding structures 42 of a single integrated probe 4 are accommodated. In simple terms, the second guide plate 3 is formed with a plurality of grooves 321 as blind holes on the side surface 3A, and each of the second through holes 31 communicates with the two grooves 321.

In practical applications, the needle implantation process of the multiple integrated probes 4 of the probe device 100 of this embodiment may be: first use related mechanisms (for example, a spacer, a member similar to the spacer frame 2, etc.) , The second guide plate 3 and the spacer frame 2 are spaced apart, and then the body 41 and the two protruding structures 42 of each integrated probe 4 are passed through the second perforation 31 of the second guide plate 3, Rotate each integrated probe 4 so that the two protruding structures 42 of each integrated probe 4 are located directly under the two grooves 321; when each integrated probe 4 has two protruding structures 42 are located directly below the two adjacent grooves 321, then the related mechanism originally provided between the second guide plate 3 and the spacer frame 2 is removed, so that the second guide plate 3 is directed to the spacer frame. The direction of the body 2 is moved, so that the two protruding structures 42 of each integrally formed probe 4 are correspondingly accommodated in the two grooves 321 of the second guide plate 3; finally, the first guide plate 1 is separated The frame body 2 and the second guide plate 3 are fixed to each other, so as to complete the needle planting operation. That is to say, in the probe device 100 of this embodiment, after the needle planting operation of each integrated probe 4 is completed, the two protruding structures 42 of each integrated probe 4 will correspondingly engage with the second guide. In the two grooves 321 of the plate 3, it is difficult for each integrally formed probe 4 to rotate relative to the second guide plate 3.

As mentioned above, by forming a plurality of grooves 321 and other designs on the side surface 3A of the second guide plate 3, the two protruding structures 42 of each integrally formed probe 4 can be correspondingly engaged with the two grooves In 321, with this, each integrated probe 4 will not easily rotate relative to the first guide plate 1 and the second guide plate 3. In practical applications, as long as each protruding structure 42 can be correspondingly engaged in the groove 321, and accordingly, each integrated probe 4 is not easily rotated relative to the second guide plate 3, the appearance of each protruding structure 42 , The size and the shape and size of each groove 321 can be set according to requirements.

Please refer to FIGS. 10 to 12 together. FIG. 10 shows a three-dimensional partial exploded schematic view of the third embodiment of the probe device of the present invention, and FIG. 11 shows a schematic diagram of the assembly process of the third embodiment of the probe device of the present invention. 12 shows a schematic partial cross-sectional view of the third embodiment of the probe device of the present invention. The biggest difference between the probe device 100 of this embodiment and the aforementioned first embodiment is that the probe device 100 further includes an auxiliary guide plate 5. The auxiliary guide plate 5 is disposed on the side of the second guide plate 3 facing the first guide plate 1, that is, the auxiliary guide plate 5 is disposed between the first guide plate 1 and the second guide plate 3. In practical applications, the first guide plate 1, the spacer frame 2, the second guide plate 3, and the auxiliary guide plate 5 may be fixed to each other by screws, but the fixing method is not limited to this.

The auxiliary guide 5 has a plurality of auxiliary perforation groups 51. Each auxiliary perforation group 51 includes an auxiliary perforation 511 and two engaging grooves 512. Each auxiliary perforation 511 penetrates through the auxiliary guide plate 5, and each of the engaging grooves 512 is recessed on one side of the auxiliary guide plate 5, and each of the engaging grooves 512 is disposed facing the second guide plate 3, and the auxiliary holes 511 of each auxiliary hole group 51 and the two engaging grooves 512 communicate with each other.

The auxiliary guide plate 5 is fixed on one side of the second guide plate 3, and each of the second perforations 31 and the auxiliary perforations 511 of each group of auxiliary perforation groups 51 communicate with each other. In practical applications, each second perforation 31 and the auxiliary perforation 511 of each group of auxiliary perforation groups 51 may have exactly the same appearance and size, and the two protruding structures 42 and elastic structures of each integrally formed probe 4 43. It can pass through each second perforation 31 and the auxiliary perforation 511 of each group of auxiliary perforation groups 51 successively. The two engaging grooves 512 of each auxiliary perforation group 51 are used for engaging with the two protruding structures 42 of each integrally formed probe 4.

The needle planting process of each integrated probe 4 of the probe device 100 of this embodiment can be as follows: first use related components to form a gap between the second guide plate 3 and the auxiliary guide plate 5, and then make each one integrated The elastic structure 43 of the type probe 4 passes through the second perforation 31 of the second guide plate 3 and the auxiliary The auxiliary perforation 511 of the auxiliary guide plate 5, and the two protruding structures 42 pass through the second perforation 31 to be located between the second guide plate 3 and the auxiliary guide plate 5; then, rotate the integrated probe 4 (for example, Rotate 90 degrees) so that the two protruding structures 42 are no longer directly below the second perforation 31, but the two protruding structures 42 are positioned directly above the two adjacent engaging grooves 512; finally, when all After the integrated probe 4 is inserted through the second guide plate 3 and the auxiliary guide plate 5 and rotated, the components originally arranged between the auxiliary guide plate 5 and the spacer frame 2 are removed to make the auxiliary guide plate 5 and the second guide plate 3 move in the direction of the spacer frame 2, and the two protruding structures 42 of each integrally formed probe 4 will be correspondingly locked in the two adjacent locking grooves 512, and the first The two guide plates 3 will correspondingly abut against the side of the auxiliary guide plate 5 opposite to the first guide plate 1, so that each integrated probe 4 cannot be easily rotated.

As shown in FIG. 10, it is worth mentioning that in the case where the second guide plate 3 has a plurality of avoidance holes 311, the auxiliary guide plate 5 may also have a plurality of corresponding avoidance grooves 513. The radial width is greater than the radial width of each auxiliary perforation 511, and each auxiliary perforation 511 and the two avoiding grooves 513 communicate with each other. Through the design of multiple avoiding holes 311 and avoiding grooves 513, each integrated probe 4 can be more easily rotated relative to the second guide plate 3 and the auxiliary guide plate 5.

Please refer to FIG. 12, which shows a schematic partial cross-sectional view of the fourth embodiment of the probe device of the present invention. As shown in the figure, the biggest difference between the probe device of this embodiment and the aforementioned third embodiment is that the engaging grooves 512 of the multiple auxiliary perforation groups 51 of the auxiliary guide plate 5 face the first One side of the guide plate 1 is concavely formed inward, and when each integrated probe 4 is fixed between the first guide plate 1 and the second guide plate 3, the two protruding structures of the integrated probe 4 42 is correspondingly located between the auxiliary guide plate 5 and the first guide plate 1, and at least a part of the two protruding structures 42 is correspondingly locked in the two adjacent locking grooves 512. In a specific application of this embodiment, each engaging groove 512 may also be provided through the auxiliary guide plate 5.

The installation process of the integrated probe 4 of the probe device 100 of this embodiment may be as follows: first use relevant components to form a gap between the auxiliary guide plate 5 and the spacer frame 2; then, make each integrated probe one by one. The needle 4 passes through each second perforation 31 of the second guide plate 3 and each of the auxiliary guide plate 5 And rotate the integrated probe 4 so that the two protruding structures 42 of each integrated probe 4 are located directly below the two adjacent engaging grooves 512; finally, the extraction is located Related components between the auxiliary guide plate 5 and the spacer frame 2 so that the auxiliary guide plate 5 and the second guide plate 3 move in the direction of the first guide plate 1 together, so that each engaging groove 512 and each protruding structure 42 are snapped together.

It is particularly noted that, in practical applications, the integrated probes 4 referred to in the above embodiments can also be manufactured and sold separately, and each integrated probe 4 is not limited to only being combined with the probe. The device 100 is manufactured and sold together.

In summary, the probe device and the integrated probe of the present invention are designed to provide two protruding structures on the integrated probe and multiple second perforations on the second guide plate, so that the probe device Can be assembled easily.

The above descriptions are only the preferred and feasible embodiments of the present invention, which do not limit the scope of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the protection scope of the present invention. .

100: Probe device

1: The first guide plate

11: The first perforation

2: Interval frame

3: The second guide plate

3A: Side

31: second perforation

4: One-piece probe

41: body

42: protruding structure

43: Elastic structure

SP: housing space

Claims (8)

A probe device comprising: at least one first guide plate with a plurality of first perforations; at least one second guide plate arranged at intervals from the first guide plate, and at least one second guide plate There are a plurality of second perforations, each of the second perforations penetrates the second guide plate, and the plurality of second perforations are spaced apart from each other and are not connected to each other and are formed on the second guide plate; a plurality of integrally formed probes Each of the integrally formed probes includes a body and two protruding structures. The opposite ends of the body are defined as a contact end and a fixed end, respectively. The body is at the contact end and the An elastic structure is formed between the fixed ends; the two protruding structures are formed on both sides of the body; a plurality of the integrally formed probes are arranged between the first guide plate and the second guide plate And the two protruding structures of each of the integrally formed probes abut against a side surface of the second guide plate facing the first guide plate, and the two protruding structures do not accommodate Placed in two adjacent second through holes, one end of each body penetrates through each of the first through holes, and is exposed on the side of the first guide plate opposite to the second guide plate; Wherein, when the contact end is compressed, the elastic structure will be elastically deformed, and when the contact end is no longer compressed, the elastic structure will return to an undeformed state; wherein, each of the integrated probes The body, the two protruding structures and the elastic structure of the needle can pass through each of the second perforations. The probe device according to claim 1, wherein, a side surface of the second guide plate is formed with a plurality of sets of limiting structures, and each set of the limiting structures includes two grooves, and each of the grooves does not penetrate For the second guide plate, each of the second perforations and the two grooves of each group of the limiting structure communicate with each other, and each The two protruding structures of the integrally formed probe are correspondingly arranged in the two grooves of each group of the limiting structure. The probe device according to claim 1, wherein the probe device further comprises an auxiliary guide plate, and the auxiliary guide plate is arranged on a side of the second guide plate facing the first guide plate, The auxiliary guide plate has a plurality of auxiliary perforation groups; each of the auxiliary perforation groups includes an auxiliary perforation and two engaging grooves, each of the auxiliary perforations penetrates the auxiliary guide plate, and each of the engaging grooves is formed by the One side of the auxiliary guide plate is concavely formed, and each of the engaging grooves is disposed facing the first guide plate, and the auxiliary through holes of each of the auxiliary through hole groups are in communication with the two engaging grooves; each The second perforation can communicate with the auxiliary perforations of each group of the auxiliary perforation groups; the two protruding structures of each of the integrally formed probes are engaged and arranged in the auxiliary perforation groups of each group Two of the engaging grooves; wherein, the body, the elastic structure and the two protruding structures of each of the integrally formed probes can pass through one of the second perforations and a set of the auxiliary The auxiliary perforation of the perforation group. The probe device according to claim 3, wherein each of the engaging grooves penetrates the auxiliary guide plate. The probe device according to claim 1, wherein the probe device further comprises an auxiliary guide plate, and the auxiliary guide plate is arranged on a side of the second guide plate facing the first guide plate, The auxiliary guide plate has a plurality of auxiliary perforation groups; each of the auxiliary perforation groups includes an auxiliary perforation and two engaging grooves, each of the auxiliary perforations penetrates the auxiliary guide plate, and each of the engaging grooves is formed by the One side of the auxiliary guide plate is concavely formed, and each of the engaging grooves is disposed facing the second guide plate, and the auxiliary through holes of each of the auxiliary through hole groups and the two engaging grooves can communicate with each other; Each of the second perforations and the auxiliary perforations of each group of the auxiliary perforation groups communicate with each other; the two protruding structures of each of the integrally formed probes are engaged and arranged in each group of the auxiliary perforation groups Two of the engaging grooves, and the two protruding structures of each of the integrally formed probes are correspondingly located between the auxiliary guide plate and the second guide plate; wherein, each of the integrally formed probes The body, the elastic structure, and the two protruding structures of the probe can pass through one second perforation and a set of the auxiliary perforations of the auxiliary perforation group. The probe device according to claim 1, wherein the probe device further includes a spacer frame which is disposed between the first guide plate and the second guide plate, and the first guide plate , The spacer frame and the second guide plate jointly form an accommodating space, and a part of the plurality of integrally formed probes with the elastic structure is located in the accommodating space. The probe device according to claim 1, wherein the sum of the width of the two protruding structures and the width of the body of each of the integrally formed probes is greater than the width of the elastic structure; The sum of the widths of the two protruding structures of the integral probe and the width of the body is smaller than the axial width of each of the second perforations; at least a part of the body of the integral probe is In a rectangular strip structure, the second guide plate further includes a plurality of escape holes, the plurality of escape holes communicate with a plurality of the second perforations, and the radial width of each escape hole is larger than that of each second perforation. For the radial width of the perforation, a part of each of the integrally formed probes penetrates each of the escape holes, and each of the integrally formed probes can rotate in each of the escape holes. The probe device according to claim 1, wherein the elastic structure of each of the integrally formed probes is fence-shaped.

Images