TWI789660B - Fabrication method of flexible electronic package device - Google Patents
Fabrication method of flexible electronic package device Download PDFInfo
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- TWI789660B TWI789660B TW109144857A TW109144857A TWI789660B TW I789660 B TWI789660 B TW I789660B TW 109144857 A TW109144857 A TW 109144857A TW 109144857 A TW109144857 A TW 109144857A TW I789660 B TWI789660 B TW I789660B
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/02—Feeding of components
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/81986—Specific sequence of steps, e.g. repetition of manufacturing steps, time sequence
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Abstract
Description
本發明是有關於一種電子裝置的製造方法,且特別是有關於一種軟性電子封裝裝置的製造方法。The present invention relates to a manufacturing method of an electronic device, and in particular to a manufacturing method of a flexible electronic packaging device.
隨著電子技術不斷演進,將電子裝置在日常生活中的應用日益廣泛。軟性封裝的技術更是日漸受到重視。不過,採用軟性封裝技術,必須面臨電子元件容易損壞或脫落進而導致良率不佳和使用壽命不長的問題。With the continuous evolution of electronic technology, the application of electronic devices in daily life is becoming more and more extensive. The technology of flexible packaging is getting more and more attention. However, the use of flexible packaging technology must face the problem that electronic components are easily damaged or fall off, resulting in poor yield and short service life.
本發明提供一種軟性電子封裝裝置的製造方法,有助於確保軟性電子封裝裝置的功能正常運作及延長使用壽命。The invention provides a method for manufacturing a flexible electronic packaging device, which helps to ensure the normal operation of the flexible electronic packaging device and prolong the service life.
本發明的軟性電子封裝裝置的製造方法包括以下步驟,但不以此為限。求取軟性電子封裝裝置的可容許彎曲半徑。求取應用載體的選定部分的最小表面曲率半徑。確定所述可容許彎曲半徑小於等於所述最小表面曲率半徑。將所述軟性電子封裝裝置設置於所述選定部分上。The manufacturing method of the flexible electronic packaging device of the present invention includes the following steps, but is not limited thereto. Obtain the allowable bending radius of the flexible electronic packaging device. Finds the minimum surface radius of curvature for the selected portion of the application carrier. It is determined that the allowable bending radius is less than or equal to the minimum surface curvature radius. The flexible electronic packaging device is disposed on the selected portion.
本發明的另一軟性電子封裝裝置的製造方法包括以下步驟,但不以此為限。求取應用載體的選定部分的最小表面曲率半徑。依據所述最小表面曲率半徑來決定設置於選定部分上的軟性電子封裝裝置,其中所述軟性電子封裝裝置包括多個構件。決定所述軟性電子封裝裝置的方法包括:設定一初始彎曲半徑,並計算在所述彎曲半徑下所述軟性電子封裝裝置中各所述構件的彎曲應力值,其中所述彎曲半徑小於所述最小表面曲率半徑;決定各所述構件的可容許最大應力值;以及各所述構件的所述彎曲應力值都小於所述可容許最大應力值即決定所述軟性電子封裝裝置。接著,將所述軟性電子封裝裝置設置於所述選定部分上。Another method for manufacturing a flexible electronic packaging device of the present invention includes the following steps, but is not limited thereto. Finds the minimum surface radius of curvature for the selected portion of the application carrier. The flexible electronic packaging device disposed on the selected portion is determined according to the minimum surface curvature radius, wherein the flexible electronic packaging device includes a plurality of components. The method for determining the flexible electronic packaging device includes: setting an initial bending radius, and calculating the bending stress value of each member in the flexible electronic packaging device under the bending radius, wherein the bending radius is smaller than the minimum surface curvature radius; determine the allowable maximum stress value of each of the components; and determine the flexible electronic packaging device if the bending stress value of each of the components is less than the allowable maximum stress value. Next, disposing the flexible electronic packaging device on the selected portion.
基於上述,本揭露實施例的方法考量應用載體的選定部分的曲率半徑與軟性電子封裝裝置的可容許彎曲半徑來確定軟性電子封裝裝置可否設置在應用載體上,藉此可確保軟性電子封裝裝置在應用載體上的使用壽命。Based on the above, the method of the disclosed embodiment considers the curvature radius of the selected part of the application carrier and the allowable bending radius of the flexible electronic packaging device to determine whether the flexible electronic packaging device can be placed on the application carrier, thereby ensuring that the flexible electronic packaging device can be placed on the application carrier. The service life on the application carrier.
圖1為本揭露一實施例的軟性電子封裝裝置的製造方法。如圖1所示,在步驟S110中,求取軟性電子封裝裝置的可容許彎曲半徑(R tol_ Sip)。軟性電子封裝裝置具備可撓曲的特性,但彎曲所造成的應力過大時,軟性電子封裝裝置仍有可能損壞。因此,軟性電子封裝裝置對彎曲的耐受性是需要的考量因素。 FIG. 1 shows a method for manufacturing a flexible electronic packaging device according to an embodiment of the present disclosure. As shown in FIG. 1 , in step S110 , the allowable bending radius (R tol — Sip ) of the flexible electronic packaging device is obtained. The flexible electronic packaging device has the property of being flexible, but the flexible electronic packaging device may still be damaged when the stress caused by bending is too large. Therefore, the resistance of flexible electronic packaging devices to bending is a necessary consideration.
在本實施例中,軟性電子封裝裝置預定要設置於應用載體上而供使用。換言之,本文中所述的應用載體是指軟性電子封裝裝置預定要設置其上的物體。舉例而言,應用載體可以為穿戴物品或是其他立體物。為了可確定軟性電子封裝裝置設置於應用載體之後的正常運作,可將應用載體的特徵作為製造軟性電子封裝裝置時需考量的參數。因此,在步驟S120中,求取應用載體的選定部分的最小表面曲率半徑(R min_ C)。在一些實施例中,應用載體本身為立體物時,步驟120可包括掃描應用載體中預定要設置軟性電子封裝裝置的選定部分,以取得選定部分中個別表面的表面曲率半徑,並且由這些表面曲率半徑中選取出最小者作為選定部分的最小表面曲率半徑(R min_ C)。在另一些實施例中,應用載體本身為織物或是穿戴物品時,可將應用載體先定位成被穿戴狀態,再掃描應用載體被穿戴狀態下的選定部分的個別表面,以由掃描取得的個別表面的表面曲率半徑中選取出最小者作為選定部分的最小表面曲率半徑(R min_ C)。舉例而言,應用載體為覆蓋人體軀幹的衣物,例如T恤、襯衫、運動緊身褲等時,可先將應用載體穿戴在人體造型的模具之後,再掃描應用載體的選定部分以取得選定部分的最小表面曲率半徑(R min_ C)。 In this embodiment, the flexible electronic packaging device is intended to be disposed on an application carrier for use. In other words, the application carrier mentioned herein refers to the object on which the flexible electronic packaging device is intended to be installed. For example, the application carrier may be a wearable article or other three-dimensional objects. In order to determine the normal operation of the flexible electronic packaging device after it is installed on the application carrier, the characteristics of the application carrier can be used as parameters to be considered when manufacturing the flexible electronic packaging device. Therefore, in step S120, the minimum surface curvature radius (R min _ C ) of the selected portion of the application carrier is calculated. In some embodiments, when the application carrier itself is a three-dimensional object, step 120 may include scanning the selected part of the application carrier where the flexible electronic packaging device is scheduled to be placed, so as to obtain the surface curvature radii of individual surfaces in the selected part, and from these surface curvatures Select the smallest radius as the minimum surface curvature radius (R min _ C ) of the selected part. In some other embodiments, when the application carrier itself is a fabric or a wearable article, the application carrier can be positioned in the worn state first, and then the individual surface of the selected part of the application carrier in the worn state can be scanned to obtain individual Select the smallest surface radius of curvature of the surface as the minimum surface radius of curvature (R min _ C ) of the selected part. For example, when the application carrier is clothing covering the torso of the human body, such as T-shirts, shirts, sports leggings, etc., the application carrier can be worn behind the mold of the human body, and then the selected part of the application carrier can be scanned to obtain the selected part. Minimum surface radius of curvature (R min _ C ).
接著,可進行步驟S130,確定軟性電子封裝裝置的可容許彎曲半徑(R tol_ Sip)是否小於應用載體的選定部分的最小表面曲率半徑(R min_ C)的關係。軟性電子封裝裝置的可容許彎曲半徑(R tol_ Sip)小於應用載體的選定部分的最小表面曲率半徑(R min_ C),表示軟性電子封裝裝置設置在選定部分的表面時所受到的撓曲應力可小於軟性電子封裝裝置本身的容忍度。換言之,軟性電子封裝裝置設置在應用載體的選定部分上較不容易因為選定部分的表面彎曲不平而發生損壞。因此,步驟S130判斷得出軟性電子封裝裝置的可容許彎曲半徑(R tol_ Sip)小於應用載體的選定部分的最小表面曲率半徑(R min_ C)後,可進行步驟S140,將軟性電子封裝裝置設置於上述選定部分上。如此,設置有軟性電子封裝裝置的應用載體在使用過程中雖被彎曲或是應用載體本身具有彎曲的表面,但軟性電子封裝裝置不易損壞,從而達成較高的製造良率,以及較佳的使用壽命。 Next, step S130 may be performed to determine whether the allowable bending radius (R tol — Sip ) of the flexible electronic packaging device is smaller than the minimum surface curvature radius (R min — C ) of the selected portion of the application carrier. The allowable bending radius (R tol _ Sip ) of the flexible electronic packaging device is smaller than the minimum surface curvature radius (R min _ C ) of the selected part of the application carrier, which means that the flexible electronic packaging device is subjected to flexure when it is placed on the surface of the selected part The stress can be less than the tolerance of the flexible electronic packaging device itself. In other words, the flexible electronic packaging device disposed on the selected portion of the application carrier is less likely to be damaged due to uneven surface curvature of the selected portion. Therefore, after step S130 judges that the allowable bending radius (R tol _ Sip ) of the flexible electronic packaging device is smaller than the minimum surface curvature radius (R min _ C ) of the selected part of the application carrier, step S140 can be performed to place the flexible electronic packaging The device is arranged on the above-mentioned selected part. In this way, although the application carrier provided with the flexible electronic packaging device is bent during use or the application carrier itself has a curved surface, the flexible electronic packaging device is not easily damaged, thereby achieving a higher manufacturing yield and better usage life.
另外,步驟S130判斷為否,也就是,軟性電子封裝裝置的可容許彎曲半徑(R tol_ Sip)大於應用載體的選定部分的最小表面曲率半徑(R min_ C),表示應用載體的選定部分的表面彎曲程度可能等於或大於軟性電子封裝裝置的容受程度。此時,可進行步驟S150,重新設計軟性電子封裝裝置。在一些實施例中,重新設計軟性電子封裝裝置的方法包括圖2所示之方法,以使重新設計後的軟性電子封裝裝置可符合可容許彎曲半徑(R tol_ Sip)小於等於選定部分的最小表面曲率半徑(R min_ C)。重新設計後的軟性電子封裝裝置可經由圖1的步驟S110至步驟S130檢視,直到可進入步驟S140以將軟性電子封裝裝置設置於選定部分中上。如此,設置有軟性電子封裝裝置的應用載體在使用過程中雖被彎曲或是應用載體本身具有彎曲的表面,但軟性電子封裝裝置不易損壞,從而達成較高的製造良率,以及較佳的使用壽命。 In addition, step S130 judges as NO, that is, the allowable bending radius (R tol_Sip ) of the flexible electronic packaging device is greater than the minimum surface curvature radius (R min _ C ) of the selected part of the application carrier, indicating that the selected part of the application carrier The degree of surface curvature may be equal to or greater than the tolerance of flexible electronic packaging devices. At this point, step S150 can be performed to redesign the flexible electronic packaging device. In some embodiments, the method for redesigning a flexible electronic packaging device includes the method shown in FIG. 2 , so that the redesigned flexible electronic packaging device can meet the allowable bending radius (R tol_Sip ) less than or equal to the minimum of the selected part. Radius of surface curvature (R min _ C ). The redesigned flexible electronic packaging device can be viewed through step S110 to step S130 in FIG. 1 until step S140 can be entered to place the flexible electronic packaging device on the selected part. In this way, although the application carrier provided with the flexible electronic packaging device is bent during use or the application carrier itself has a curved surface, the flexible electronic packaging device is not easily damaged, thereby achieving a higher manufacturing yield and better usage life.
圖2示意性的繪示根據一些實施例的求取軟性電子封裝裝置的可容許最小彎曲半徑的方法。一般來說,軟性電子封裝裝置可包括多個構件,且每個構件的材料特性、配置位置以及構件之間的堆疊關係都會影響軟性電子封裝裝置對撓曲應力的容受程度。因此,可採用圖2的方式來求取軟性電子封裝裝置的可容許最小彎曲半徑(R tol_ Sip)。具體而言,在步驟S112中,可設定一初始彎曲半徑(R i),並計算軟性電子封裝裝置中各構件所受的彎曲應力值(S max)。並且,在步驟S114中,訂定各構件的破壞準則,以決定各構件的可容許最大應力值(S limit+ FS)。在此,S limit例如是個別構件的降伏強度或極限強度,而FS例如是安全係數(factor of safety)。在一些實施例中,安全係數可定義為S limit×安全百分比,其中安全百分比可設定為大於0%且最大至100%。以安全百分比設定為100%為例,各構件的可容許最大應力值可以約為S limit+ S limit×100%,也就是個別構件的降伏強度的兩倍。以安全百分比設定為50%為例,各構件的可容許最大應力值可以約為S limit+ S limit×50%,也就是個別構件的降伏強度的1.5倍。 FIG. 2 schematically illustrates a method for obtaining the allowable minimum bending radius of a flexible electronic packaging device according to some embodiments. In general, a flexible electronic packaging device may include a plurality of components, and the material properties of each component, the arrangement position, and the stacking relationship between the components will affect the tolerance of the flexible electronic packaging device to flexural stress. Therefore, the allowable minimum bending radius (R tol — Sip ) of the flexible electronic packaging device can be obtained by using the method shown in FIG. 2 . Specifically, in step S112, an initial bending radius (R i ) can be set, and the bending stress value (S max ) suffered by each component in the flexible electronic packaging device can be calculated. Furthermore, in step S114, the failure criterion of each component is determined to determine the allowable maximum stress value (S limit + FS) of each component. Here, S limit is, for example, the yield strength or ultimate strength of individual components, and FS is, for example, a factor of safety. In some embodiments, the safety factor can be defined as S limit ×safety percentage, wherein the safety percentage can be set to be greater than 0% and up to 100%. Taking the safety percentage as 100% as an example, the allowable maximum stress value of each component can be about S limit + S limit × 100%, which is twice the yield strength of individual components. Taking the safety percentage as 50% as an example, the allowable maximum stress value of each component can be about S limit + S limit × 50%, which is 1.5 times the yield strength of individual components.
在步驟S116中,可判斷各構件的彎曲應力值(S max)是否都小於等於可容許最大應力值。各構件在初始彎曲半徑(R i)下的彎曲應力值(S max)小於等於可容許最大應力值,則表示此構件在初始彎曲半徑(R i)的彎曲程度下所受到的應力尚未達到其可容忍程度。此時,構件不容易因彎曲而損壞。因此,軟性電子封裝裝置的所有構件在初始彎曲半徑(R i)下都符合彎曲應力值(S max)小於等於可容許最大應力值時,也就是步驟S116判斷為是,可進行步驟S118,決定以設定的初始彎曲半徑R i做為軟性電子封裝裝置之可容許最小彎曲半徑(R tol_ SiP)。決定出來的可容許彎曲半徑(R tol_ SiP)可以應用於圖1中步驟S110。在圖1的步驟S130中,如果決定出來的軟性電子封裝裝置之可容許最小彎曲半徑(R tol_ SiP)小於等於最小表面曲率半徑(R min_ C),就可將這個軟性電子封裝裝置設置在應用載體的選定部分。在圖1的步驟S130中,如果決定出來的可容許最小彎曲半徑(R tol_ SiP)大於最小表面曲率半徑(R min_ C),就需要改變軟性電子封裝裝置設置的設計,並且重新依照圖2的方式求取更新設計後的最小表面曲率半徑(R min_ C),再進行圖1的判斷流程。 In step S116, it may be determined whether the bending stress values (S max ) of each member are less than or equal to the allowable maximum stress value. If the bending stress value (S max ) of each member at the initial bending radius (R i ) is less than or equal to the allowable maximum stress value, it means that the stress on the member at the bending degree of the initial bending radius (R i ) has not reached its tolerable level. At this time, the member is not easily damaged by bending. Therefore, when all components of the flexible electronic packaging device meet the bending stress value (S max ) less than or equal to the allowable maximum stress value under the initial bending radius (R i ), that is, step S116 judges yes, and step S118 can be performed to determine The set initial bending radius R i is used as the allowable minimum bending radius (R tol — SiP ) of the flexible electronic packaging device. The determined allowable bending radius (R tol — SiP ) can be applied to step S110 in FIG. 1 . In step S130 of FIG. 1, if the allowable minimum bending radius (R tol _ SiP ) of the determined flexible electronic packaging device is less than or equal to the minimum surface curvature radius (R min _ C ), the flexible electronic packaging device can be set In the selected part of the application vector. In step S130 of FIG. 1 , if the determined allowable minimum bending radius (R tol _ SiP ) is greater than the minimum surface curvature radius (R min _ C ), it is necessary to change the design of the flexible electronic packaging device and re-according to the figure 2 to obtain the minimum surface curvature radius (R min _ C ) after the updated design, and then proceed to the judgment process in Figure 1.
另外,若有構件在初始彎曲半徑(R i)下的彎曲應力值S max大於可容許最大應力值,也就是步驟S116判斷為否,表示初始彎曲半徑(R i)的狀態可能導致某些構件受到的應力大於其容許程度,而容易發生構件因彎曲而損壞的可能。因此,經判斷得出有構件在初始彎曲半徑(R i)下的彎曲應力值(S max)大於可容許最大應力值,可繼續步驟S112,重新設定另一彎曲半徑(R i’)。重新設定的另一彎曲半徑可比前一次所設定的初始彎曲半徑(R i)更大,以找出符合彎曲應力值(S max)小於可容許最大應力值的條件。 In addition, if the bending stress value S max of any component at the initial bending radius (R i ) is greater than the allowable maximum stress value, that is, the judgment of step S116 is no, it means that the state of the initial bending radius (R i ) may cause some components The stress received is greater than its allowable level, and the possibility of component damage due to bending is prone to occur. Therefore, if it is determined that the bending stress value (S max ) of the component at the initial bending radius (R i ) is greater than the allowable maximum stress value, step S112 can be continued to reset another bending radius (R i '). Another newly set bending radius may be larger than the previously set initial bending radius (R i ) to find a condition that the bending stress value (S max ) is smaller than the allowable maximum stress value.
在一些實施例中,步驟S112的初始彎曲半徑(Ri)可以依據圖1的步驟S120所求取的應用載體選定部位之最小表面曲率半徑(R min_ C)來設定。舉例而言,軟性電子封裝裝置預定要設置於應用載體的部位是事先選定的。此時,可採用圖1的步驟S120來掃描應用載體的選定部位以獲得這個選定部位的最小表面曲率半徑(R min_ C)。之後,可依據應用載體的選定部分的最小表面曲率半徑(R min_ C)來設定步驟S112的初始彎曲半徑(Ri),以決定軟性合適安裝在載體的選定部分上的電子封裝裝置。具體來說,決定合適安裝在載體的選定部分上的電子封裝裝置的方法包括:依據步驟S112,設定初始彎曲半徑(Ri),使設定的初始彎曲半徑(Ri)小於載體表面選定部分之最小表面曲率半徑(R min_ C),且計算在上述初始彎曲半徑(Ri)下,軟性電子封裝裝置中各構件的彎曲應力值。接著,如步驟S114所述,決定各所述構件的可容許最大應力值,並且依據步驟S116的步驟進行判斷。若圖2的步驟S116判斷得到所有構件的個別彎曲應力值(S max)都小於等於個別可容許最大應力值,則決定這個電子封裝裝置為合適安裝在載體的選定部分上。既然設定初始彎曲半徑(Ri)時就設定成初始彎曲半徑(Ri)小於最小表面曲率半徑(R min_ C),步驟S116判斷通過之後,即可進入步驟S140。因此,可將這個軟性電子封裝裝置設置在應用載體的選定部分上。 In some embodiments, the initial bending radius (Ri) in step S112 can be set according to the minimum surface curvature radius (R min — C ) of the selected part of the application carrier obtained in step S120 of FIG. 1 . For example, the location where the flexible electronic packaging device is intended to be disposed on the application carrier is selected in advance. At this time, step S120 in FIG. 1 can be used to scan the selected portion of the application carrier to obtain the minimum surface curvature radius (R min — C ) of the selected portion. Afterwards, the initial bending radius (Ri) of step S112 can be set according to the minimum surface curvature radius (R min — C ) of the selected portion of the application carrier, so as to determine the electronic packaging device that is flexibly mounted on the selected portion of the carrier. Specifically, the method for determining an electronic package device suitable for installation on a selected portion of the carrier includes: according to step S112, setting an initial bending radius (Ri), so that the set initial bending radius (Ri) is smaller than the minimum surface of the selected portion of the carrier surface Radius of curvature (R min _ C ), and calculate the bending stress value of each component in the flexible electronic packaging device under the above initial bending radius (Ri). Next, as described in step S114, the allowable maximum stress value of each of the components is determined, and the determination is made according to the steps in step S116. If the step S116 of FIG. 2 determines that the individual bending stress values (S max ) of all components are less than or equal to the individual allowable maximum stress values, then it is determined that the electronic packaging device is suitable for mounting on the selected portion of the carrier. Since the initial bending radius (Ri) is set so that the initial bending radius (Ri) is smaller than the minimum surface curvature radius (R min _ C ), step S140 can be entered after the judgment of step S116 is passed. Thus, this flexible electronic packaging device can be placed on selected parts of the application carrier.
圖3示意性的說明各構件的彎曲應力值的求得方法。換言之,圖3用說明步驟S112的具體方式,但不以此為限。在圖3中,軟性電子封裝裝置200例如處於彎曲的狀態且具有中性面202,其中中性面202是指彎曲狀態下所受到的彎曲應力為零的點所構成的面。另外,在本實施例中,曲率半徑ρ定義為曲率中心O至中性面202的距離。軟性電子封裝裝置200中的構件210與中性面202在Y方向上相隔距離d,且中性面202位於曲率中心O與構件210之間,則構件210在X方向受到的彎曲應力值σ
x可由公式:σ
x=-E×d/ρ計算而得,其中E為構件210的楊氏係數。由此可知,構件210所受的彎曲應力會與距中性面202的距離d及楊氏係數E成正比,且與曲率半徑ρ成反比。
Fig. 3 schematically illustrates the calculation method of the bending stress value of each component. In other words, FIG. 3 illustrates the specific manner of step S112, but not limited thereto. In FIG. 3 , the flexible
圖4與圖5為本揭露一些實施例的軟性電子封裝裝置的示意圖。在圖4中,軟性電子封裝裝置300可包括多個構件310~380。具體而言,構件310例如是電子元件,其例如包括積體電路晶片、被動元件、感測元件等。構件320例如是第一軟性載板,其例如為具有可撓性質且具備足夠支撐性而可穩定承載電子元件310的基板。構件330例如是第二軟性載板,其用於承載第一軟性載板且第二軟性載板的尺寸可大於第一軟性載板。構件310可接合於構件320上,且構件320可接合於構件330上而形成第一軟性載板位於第二軟性載板與電子元件之間的堆疊結構。此外,構件310可與構件320電性連接且構件320可與構件330電性連接。也就是說,電子元件、第一軟性載板與第二軟性載板彼此之間可存在電性連接。4 and 5 are schematic diagrams of flexible electronic packaging devices according to some embodiments of the present disclosure. In FIG. 4 , the flexible
另外,構件340可以為導電接合件,其用於將構件310接合至構件320上。在一些實施例中,構件340可以為導電凸塊、焊料、導電球或類似者。構件350可設置於構件310與構件320之間並且用於填充構件340之間的間隙。在一些實施例中,構件350例如為填充劑,例如包括環氧樹脂、聚醯亞胺等材料。構件340可將構件310電連接構件320。在一些實施例中,構件320例如具有導電貫孔,構件360例如為設置於構件320表面的導電接墊。構件340可利用構件320中的導電貫孔電性連接至對向側的構件360。構件370例如是設置於構件330上的導電接墊,且構件370與構件360彼此相向。構件380例如為具有導電粒子接合件,且配置於構件360與構件370之間,以將構件360結構電性連接至構件370。如此,構件310可以透過構件340、構件320的導電貫孔、構件360、構件380及構件370電連接至構件330中的導電線路。構件380可以為異方性導電膠,但不以此為限。Additionally,
在圖5中,軟性電子封裝裝置400包括圖4的軟性電子封裝裝置300的所有構件310~380,且更包括構件390。構件390例如是感測電極。構件390(感測電極)配置於構件330(第二軟性載板)上,且位於構件330(第二軟性載板)的遠離構件320(第一軟性載板)的一側。感測電極的材料包括生物相容性材料。軟性電子封裝裝置400設置於應用載體的表面時,構件390可以朝向使用者,且設置與使用者接觸。舉例而言,應用載體為穿戴物品時,軟性電子封裝裝置400在穿戴物品的設置方式是讓構件390位於靠近穿戴者的一側。In FIG. 5 , a flexible
圖4的軟性電子封裝裝置300可採用圖1與圖2的方法來設計。以圖4的軟性電子封裝裝置300而言,可依圖2的步驟S112,針對構件310~380分別求出在設定的初始彎曲半徑(Ri)下的彎曲應力值(S
max),並且如步驟S116與步驟S118所述,決定出軟性電子封裝裝置的可容許彎曲半徑(R
tol_
Sip)。之後,可依圖1的方法確定軟性電子封裝裝置300是否合適安裝於應用載體的選定部分上。當然,圖5的軟性電子封裝裝置400也可採用上述方法來設計。
The flexible
圖6為本揭露一些實施例的軟性電子封裝裝置的示意圖。在圖6中,軟性電子封裝裝置500包括前述軟性電子封裝裝置400的所有構件310~390外,還包括構件312、構件342以及構件352。構件312例如是電子元件,其包括積體電路、被動元件、感測元件等。構件342可以為導電接合件,其用於將構件312接合至構件320上且將構件342電性連接構件320。構件352可設置於構件312與構件320之間並且用於填充構件342之間的間隙。在一些實施例中,構件310與構件312同樣為電子元件,但可用於進行不同的功能操作。構件342與構件340同樣是導電接合件,且可具有相同或是不同的結構及/或材質。構件352與構件350同樣為填充劑,但可具有相同或不同的材質。圖6的軟性電子封裝裝置500可採用圖1與圖2的方法設計與製造,使得軟性電子封裝裝置500設置於應用載體之後可具有理想的使用壽命。FIG. 6 is a schematic diagram of a flexible electronic packaging device according to some embodiments of the present disclosure. In FIG. 6 , the flexible
圖7為本揭露一實施例的軟性電子封裝裝置設置於應用載體上的示意圖。在圖7中,軟性電子封裝裝置600例如要設置於應用載體700上。具體來說,應用載體700在實際使用狀態下,具有表面曲率不同的選定部分710與選定部分720,其中圖7示意性的以選定部分710的最小表面曲率大於選定部分720的最小表面曲率來說明,且軟性電子封裝裝置600預定以橫越選定部分710與選定部分720的方式設置於應用載體700上。換言之,軟性電子封裝裝置600的第一部分610例如要設置在選定部分710上而軟性電子封裝裝置600的第二部分620例如要設置在選定部分720上。FIG. 7 is a schematic diagram of a flexible electronic packaging device disposed on an application carrier according to an embodiment of the present disclosure. In FIG. 7 , the flexible
製造軟性電子封裝裝置600時,可先依據圖1的方法,決定出軟性電子封裝裝置600的第一部分610是否合適配置於選定部分710,並且再次依據圖1的方法決定出軟性電子封裝裝置600的第二部分620是否合適配置於選定部分720。在第一部分610與第二部分620都經圖1的步驟S130判斷為是之後,即可將軟性電子封裝裝置600設置於應用載體700上。也就是說,軟性電子封裝裝置600的不同部分可以分別依據其預定設置的選定部分的表面形狀來設計。When manufacturing the flexible
舉例而言,可根據圖1的步驟S110以及圖2的方法求取軟性電子封裝裝置600的第一部分610的可容許彎曲半徑(R
tol_
Sip)。並且,根據圖1的步驟S120,求取選定部分710的最小表面曲率半徑(R
min_
C)。接著,以圖1的步驟S130對第一部分610的可容許彎曲半徑(R
tol_
Sip)與選定部分710的最小表面曲率半徑(R
min_
C)進行判斷。判斷結果為可容許彎曲半徑(R
tol_
Sip)大於最小表面曲率半徑(R
min_
C),則需要改變電子封裝裝置600的第一部分610的設計。舉例而言,需要改變第一部分610的結構、材料或兩者,並在改變之後重新進行上述步驟直到步驟S130的判定結果為是。
For example, the allowable bending radius (R tol — Sip ) of the
此外,軟性電子封裝裝置600的第二部分620以及選定部分720也依據上述步驟進行分析、判斷,甚至重新設計,直到第二部分620的可容許彎曲半徑(R
tol_
Sip)小於等於選定部分720的最小表面曲率半徑(R
min_
C)為止(通過步驟S130的判斷且可進入步驟S140)。在第一部分610與第二部分620都經圖1的步驟130判斷為“是”之後,即可將軟性電子封裝裝置600設置於應用載體700上,使第一部分610對應設置在選定部分710上且第二部分620對應設置在選定部分720上。如此,應用載體700的選定部分710與選定部分720在使用及/或穿戴狀態下雖具有非平面,軟性電子封裝裝置600並不容易因為彎曲應力而損壞。因此,軟性電子封裝裝置600可以具有理想的使用壽命。
In addition, the
圖8至圖11示意性的說明軟性電子封裝裝置設置於應用載體的實施方式。在圖8中,軟性電子封裝裝置810例如設置於應用載體820上,其中應用載體820例如為頭帶。應用載體820被穿戴時,應用載體820例如會順應著穿戴者的頭部的曲線彎曲。因此,軟性電子封裝裝置810所設置的部分的最小表面曲率半徑例如大致與使用者的頭部曲線相應。軟性電子封裝裝置810可依據圖1與圖2的方法製造,其中,在進行圖1的步驟S120時,可以先將應用載體820套設在人頭造型的模具830上,再掃描選定部分的表面曲率半徑以獲得最小表面曲率半徑(R
min_
C)。
8 to 11 schematically illustrate the implementation of the flexible electronic packaging device disposed on the application carrier. In FIG. 8 , the flexible
在圖9中,軟性電子封裝裝置910例如設置於應用載體920上,其中應用載體920例如為上部軀幹衣物,且軟性電子封裝裝置910例如要設置於衣物的胸部部分(選定部分)。應用載體920被穿戴時,應用載體920例如會順應著穿戴者的上部軀幹的曲線彎曲。因此,軟性電子封裝裝置910所要設置的選定部分的最小表面曲率半徑例如大致與使用者的胸部部分的曲線相應。在一些實施例中,軟性電子封裝裝置910可依據圖1與圖2的方法製造,其中可以使用人體造型的模具930將應用載體920撐開成被穿戴狀態,再掃描軟性電子封裝裝置910所要設置的選定部分(胸部部分)的表面以進行圖1的步驟S120,獲得最小表面曲率半徑(R
min_
C)。
In FIG. 9 , the flexible
在圖10中,軟性電子封裝裝置1010例如設置於應用載體1020上,其中應用載體1020例如為運動褲,且軟性電子封裝裝置1010例如要設置於運動褲的髖部部分。應用載體1020被穿戴時,應用載體1020例如會順應著穿戴者的髖部與腿部的曲線彎曲。因此,軟性電子封裝裝置1010所要設置的選定部分的最小表面曲率半徑例如大致與使用者的髖部部分的曲線相應。在一些實施例中,軟性電子封裝裝置1010可依據圖1與圖2的方法製造,其中可以使用人體造型的模具1030將應用載體1020撐開成被穿戴狀態,再掃描軟性電子封裝裝置1010所要設置的選定部分的表面以進行圖1的步驟S120,獲得最小表面曲率半徑(R
min_
C)。
In FIG. 10 , the flexible
在圖11中,軟性電子封裝裝置1110與軟性電子封裝裝置1120例如設置於應用載體1130上,其中應用載體1130例如為鞋,軟性電子封裝裝置1110例如要設置於鞋的鞋跟部份且軟性電子封裝裝置1120例如要設置於鞋的足弓部分。應用載體1130本身為立體物,其在鞋跟部分與足弓部分都具有曲面。因此,軟性電子封裝裝置1110可對應於鞋跟部分的曲面設計而軟性電子封裝裝置1120可對應於足弓部分的曲面設計。換言之,進行圖1的方法時,可掃描鞋的鞋跟部分與足弓部分以獲得對應的最小表面曲率半徑(R
min_
C)。
In FIG. 11, the flexible
綜上所述,本揭露實施例的軟性電子封裝裝置的製造方法依據軟性電子封裝裝置的特性與應用載體的表面狀態判斷軟性電子封裝裝置是否合適設置在應用載體的選定部分上,而使軟性電子封裝裝置不易因應用載體在使用狀態時的彎曲狀態而損壞,從而具有理想的使用壽命。To sum up, the manufacturing method of the flexible electronic packaging device according to the disclosed embodiment judges whether the flexible electronic packaging device is properly arranged on the selected part of the application carrier according to the characteristics of the flexible electronic packaging device and the surface state of the application carrier, and makes the flexible electronic packaging device The packaging device is not easy to be damaged due to the bending state of the application carrier in the use state, so it has an ideal service life.
200、300、400、500、600、810、910、1010、1110、1120:軟性電子封裝裝置
202:中性面
210、310~390、312、342、352:構件
610:第一部分
620:第二部分
700、820、920、1020、1130:應用載體
710、720:選定部分
830、930、1030:模具
d:距離
O:曲率中心
S110~S150、S112~S118:步驟
X、Y:方向
ρ:曲率半徑
200, 300, 400, 500, 600, 810, 910, 1010, 1110, 1120: flexible electronic packaging device
202:
圖1為本揭露一實施例的軟性電子封裝裝置的製造方法。 圖2示意性的繪示根據一些實施例的求取軟性電子封裝裝置的可容許最小彎曲半徑的方法。 圖3示意性的說明各構件的彎曲應力值的求得方法。 圖4與圖5為本揭露一些實施例的軟性電子封裝裝置的示意圖。 圖6為本揭露一些實施例的軟性電子封裝裝置的示意圖。 圖7為本揭露一實施例的軟性電子封裝裝置設置於應用載體上的示意圖。 圖8至圖11示意性的說明軟性電子封裝裝置設置於應用載體的實施方式。 FIG. 1 shows a method for manufacturing a flexible electronic packaging device according to an embodiment of the present disclosure. FIG. 2 schematically illustrates a method for obtaining the allowable minimum bending radius of a flexible electronic packaging device according to some embodiments. Fig. 3 schematically illustrates the calculation method of the bending stress value of each component. 4 and 5 are schematic diagrams of flexible electronic packaging devices according to some embodiments of the present disclosure. FIG. 6 is a schematic diagram of a flexible electronic packaging device according to some embodiments of the present disclosure. FIG. 7 is a schematic diagram of a flexible electronic packaging device disposed on an application carrier according to an embodiment of the present disclosure. 8 to 11 schematically illustrate the implementation of the flexible electronic packaging device disposed on the application carrier.
S110~S150:步驟 S110~S150: steps
Claims (19)
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| CN106031308A (en) * | 2013-12-24 | 2016-10-12 | 破立纪元有限公司 | Support structures for an attachable, two-dimensional flexible electronic device |
| TWM541182U (en) * | 2016-08-29 | 2017-05-01 | 創王光電股份有限公司 | Flexible electronic device |
| TW202005006A (en) * | 2018-05-17 | 2020-01-16 | 美商康寧公司 | Singulated electronic substrates on a flexible or rigid carrier and related methods |
| CN111816063A (en) * | 2020-08-10 | 2020-10-23 | 京东方科技集团股份有限公司 | Pressing device, pressing jig and preparation method of curved display panel |
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| CN107452982B (en) * | 2017-06-17 | 2019-05-24 | 华为技术有限公司 | A kind of flexible battery and preparation method thereof |
| CN108548729B (en) * | 2018-03-30 | 2021-02-19 | 佛山市诺威科技有限公司 | Method and device for measuring maximum bending stress of material |
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| CN106031308A (en) * | 2013-12-24 | 2016-10-12 | 破立纪元有限公司 | Support structures for an attachable, two-dimensional flexible electronic device |
| TWM541182U (en) * | 2016-08-29 | 2017-05-01 | 創王光電股份有限公司 | Flexible electronic device |
| TW202005006A (en) * | 2018-05-17 | 2020-01-16 | 美商康寧公司 | Singulated electronic substrates on a flexible or rigid carrier and related methods |
| CN111816063A (en) * | 2020-08-10 | 2020-10-23 | 京东方科技集团股份有限公司 | Pressing device, pressing jig and preparation method of curved display panel |
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