TWI759208B - Circuit and method for improving chip soft failure prevention capability, control chip and information processing device - Google Patents

Abstract

The present invention mainly discloses a chip soft failure prevention capability enhancement circuit, which is applied to a control chip including a microcontroller, a static random access memory and an inspection unit; wherein, the circuit is coupled to the circuit. Between the checking unit and the SRAM, and mainly includes a delay unit, which is configured to make the checking unit perform a data encoding check on the SRAM after a start time Delaying a predetermined time, so that the verification unit can avoid data verification failure caused by abnormal or unstable communication of the SRAM while waiting for the predetermined time to pass. Finally, after the result of the data coding inspection shows that the inspection is passed, the microcontroller is started, so that the control chip starts to work normally.

Description

Circuit and method for improving chip soft failure prevention capability, control chip and information processing device

The present invention relates to the related field of control chips, and particularly relates to a circuit and method for improving the ability to prevent soft failure of chips.

At present, touch devices have been widely used in various electronic devices with touch requirements. FIG. 1 shows a block diagram of a conventional touch device. As shown in FIG. 1, the conventional touch device 1a includes: a touch panel 11a and at least one touch chip 12a. FIG. 2 is a block diagram of a microcontroller 121a, a SRAM 122a and a flash memory 123a included in the touch chip shown in FIG. 1 . Electronic engineers familiar with the design and manufacture of touch devices must know that the typical startup process of the touch chip 12a includes the following steps:

(1) The touch chip 12a is powered on or reset;

(2) Load the required file (eg bin file) stored in the flash memory 123a into the static random access memory 122a. If the required file is not pre-stored in the flash memory 123a, a The external host processor 10a loads the required files into the SRAM 122a;

(3) Checking the correctness of data encoding on the file loaded into the SRAM 122a;

(4) When the data encoding of the file is correct, start the microcontroller 121a, so that the touch chip 12a starts to work normally.

Practical experience shows that when a finger touches the touch panel 11a, the electrostatic discharge (Electro Static Discharge, ESD) charges generated at the fingertip may be transmitted to the touch chip 12a through the lines of the touch panel 11a. Since the SRAM 122a includes a plurality of latch cells, and the bit state of each latch cell is 0 or 1, the pulse current generated by ESD will cause the bit state of the latch cell to jump suddenly. In other words, at the moment when a finger touches the touch panel 11a, ESD may cause errors in the data encoding of the files loaded into the SRAM 122a, thereby causing the touch chip 12a to have a soft failure ( Soft fail). Of course, the existing touch chip 12a includes an ESD protection circuit design, but it still cannot completely prevent soft failure.

In view of this, a solution for improving the soft failure of the touch chip is proposed. FIG. 3 shows a block diagram of the internal cells of the touch chip 12a with improved soft fail capability. After comparing FIG. 3 and FIG. 2 , it should be easily found that the internal unit of the touch chip 12 a shown in FIG. 3 further includes an inspection unit 124 a for inspecting the data of the files in the SRAM 122 a Is the encoding correct. If the data code of the file jumps or fails due to the influence of ESD (that is, the inspection fails), the touch chip 12a is to perform the aforementioned steps (1)-(4) again, so that the touch chip 12a recovers itself and returns to the to normal working condition.

Unfortunately, the low-cost touch chip 12a usually does not include a flash memory (flash) 123a, so the solution shown in FIG. 3 cannot be applied to the low-cost touch chip 12a so that the touch chip 12a can achieve self-recovery . On the other hand, in the case of the touch chip 12a including the solution shown in FIG. 3, if the duration of the ESD event is long, it may be caused by static random access during the process of the inspection unit 124a performing the data encoding inspection of the file The abnormality or instability of the communication of the memory 122a causes data verification failure, so that the touch chip 12a cannot realize self-recovery by restarting the microcontroller 121a. In this case, the touch chip 12a has a soft failure.

It can be seen from the above description that there is an urgent need in the art for a circuit and method for improving the capability of preventing chip soft failure.

The main object of the present invention is to provide a chip soft failure prevention capability improvement circuit, which is applied to a control chip including a microcontroller, a static random access memory and an inspection unit; wherein the circuit is coupled to is connected between the checking unit and the SRAM, and mainly includes a delay unit, which is configured to enable the checking unit to perform a start of a data encoding check on the SRAM The time is delayed by a predetermined time, so that the verification unit can avoid data verification failure caused by abnormal or unstable communication of the SRAM while waiting for the predetermined time to pass. Finally, after the result of the data coding inspection shows that the inspection is passed, the microcontroller is started, so that the control chip starts to work normally.

In order to achieve the above object, the present invention proposes an embodiment of the chip soft failure prevention capability improvement circuit, which is applied to a control chip including a microcontroller, a static random access memory and an inspection unit. ; wherein, the chip soft failure prevention capability improvement circuit is coupled between the inspection unit and the SRAM, and includes:

a delay unit configured to delay a start time of a data encoding check performed by the checking unit to the SRAM by a first time.

In one embodiment, a loop control unit is configured to make the verification unit repeatedly perform the data encoding verification to the SRAM a for N times, where N is a positive integer; During the coding check, the delay unit delays the start time of each data coding check by a second time, and the second time is smaller than the first time.

In one embodiment, after completing N times of the data encoding inspection, the control chip interrupts a startup procedure of the microcontroller when the result of the data encoding inspection indicates that the inspection fails.

In another embodiment, after completing the N times of the data encoding inspection, the control chip notifies an external host processor through a signal communication pin when the result of the data encoding inspection indicates that the inspection fails, The host processor is caused to directly load at least one file into the SRAM, or store the file into a flash memory included in the control chip.

At the same time, the present invention also provides an embodiment of a method for improving the ability of preventing soft failure of a chip, which is realized by a control chip; wherein, the control chip includes a microcontroller, a static random access memory and an inspection unit. , and the method for improving the ability to prevent soft failure of the wafer includes the following steps:

(1) when the checking unit performs a data coding check on the SRAM, delaying a start time of the data coding check by a preset time; and

(2) When the result of the data coding inspection shows that the inspection is passed, start the microcontroller to make the control chip start to work normally.

In one embodiment, after completing N times of the data code inspection, the control chip notifies an external host processor through a signal communication pin when the result of the data code inspection shows that the inspection fails, so that the The host processor directly loads at least one file into the SRAM, or stores the file in a flash memory included in the control chip.

In addition, the present invention provides another embodiment of the method for improving the chip soft failure prevention capability, which is implemented by a control chip; wherein the control chip includes a microcontroller, a static random access memory and a An inspection unit, and the method for improving the capability of preventing soft failure of a wafer includes the following steps:

(1) when the checking unit performs a data encoding check on the SRAM, causing the checking unit to repeatedly perform the data encoding checking on the SRAM N times, where N is a positive integer; In the process of performing N times of the data coding check, a start time of each data coding check is delayed by a preset time; and

(2) In the process of performing N times of the data coding inspection, if the result of any one of the data coding inspections shows that the inspection is passed, start the microcontroller to make the control chip start to work normally.

In one embodiment, after completing N times of the data code inspection, the control chip notifies an external host processor through a signal communication pin when the result of the data code inspection shows that the inspection fails, so that the The host processor directly loads at least one file into the SRAM, or stores the file in a flash memory included in the control chip.

Further, the present invention also provides a control chip, which has a microcontroller, a static random access memory and an inspection unit; it is characterized in that the control chip further has the chip soft fail function of the present invention as described above. Prevent the ability to enhance the circuit.

Furthermore, the present invention further provides an information processing device, which is characterized by having a touch panel and at least one control chip of the present invention as described above. In a feasible embodiment, the information processing device is selected from the group consisting of touch devices, smart phones, smart watches, smart bracelets, tablet computers, notebook computers, all-in-one computers, and access control devices of an electronic device.

In order to enable your examiners to further understand the structure, characteristics, purpose, and advantages of the present invention, drawings and detailed descriptions of preferred embodiments are attached as follows.

The present invention aims to disclose a chip soft failure prevention capability improvement circuit, which is applied in a control chip, and the control chip includes a microcontroller, a static random access memory and an inspection unit. In the present invention, the circuit is coupled between the checking unit and the SRAM, so that a start time of a data encoding check performed by the checking unit to the SRAM is later than Delaying a predetermined time, so that the verification unit can avoid data verification failure caused by abnormal or unstable communication of the SRAM while waiting for the predetermined time to pass. Finally, after the result of the data coding inspection shows that the inspection is passed, the microcontroller is started, so that the control chip starts to work normally.

first embodiment

4 shows a block diagram of a touch device including a touch chip of the present invention, wherein the touch chip includes the chip soft failure prevention capability enhancement circuit of the present invention. As shown in FIG. 1 , in the first embodiment, the touch device 1 includes: a touch panel 11 and at least one touch chip 12 of the present invention. FIG. 2 is a block diagram of a microcontroller 121 , a SRAM 122 and a flash memory 123 included in the touch chip shown in FIG. 1 . FIG. 5 shows a first block diagram of the internal unit of the touch chip of the present invention. According to the design of the present invention, the touch chip 12 includes: a microcontroller 121, a static random access memory 122, an inspection unit 124, and a chip soft failure prevention capability enhancement circuit 125 of the present invention, and the The chip soft failure prevention capability enhancement circuit 125 mainly includes a delay unit 1251 , which is configured to delay a start time of a data code inspection performed by the inspection unit 124 to the SRAM 122 by a delay. first timing.

FIG. 6 shows a flow chart of a method for improving the prevention capability of a chip soft failure according to the present invention implemented by the circuit shown in FIG. 5 . As shown in FIG. 5 and FIG. 6 , the method for improving the chip soft failure prevention capability of the present invention is realized by a touch chip 12 , the touch chip 12 includes a microcontroller 121 , a static random access memory 122 , An inspection unit 124 and a chip soft failure prevention capability enhancing circuit 125 including a delay unit 1251 of the present invention. After the touch chip 12 is powered on or reset (Reset), the required files (eg bin files) stored in the flash memory 123 must be loaded into the SRAM 122, and the inspection unit 124 It is used to check whether the file loaded in the SRAM 122a is affected by external force (eg: ESD) and has data coding errors. In short, the verification unit 124 is used to perform a data encoding verification on the SRAM 122a.

As shown in FIG. 5 and FIG. 6 , the method of the present invention first executes step S1: when the checking unit 124 performs a data coding check on the SRAM 122a, set a start time of the data coding check to after a preset time delay. Next, step S2 is executed: when the result of the data coding inspection shows that the inspection is passed, the microcontroller 121 is activated, so that the touch control chip 12 starts to work normally. It should be understood that after the chip soft failure prevention capability enhancement circuit 125 (including the delay unit 1251 ) of the present invention is coupled between the inspection unit 124 and the SRAM 122 , the inspection unit 124 will When the touch chip 12 is reset and activated, the start time of performing the data coding inspection will be delayed by a first time. In this way, the checking unit 124 can avoid abnormal or unstable communication of the SRAM 122 while the checking unit 124 is waiting for the first time to elapse, so that the SRAM 122 is not started until the communication is stable. The body 122 performs the data encoding check, so as to avoid a situation in which the data encoding check fails due to the impact of a sudden ESD. Finally, after the result of the data coding inspection shows that the inspection is passed, the microcontroller 121 is activated, so that the touch control chip 12 starts to work normally.

Second Embodiment

7 shows a second block diagram showing the internal unit of the touch chip of the present invention, wherein the touch chip includes the chip soft failure prevention capability enhancement circuit of the present invention. According to the design of the present invention, in the second embodiment, the chip soft failure prevention capability enhancement circuit 125 included in the touch chip 12 includes a delay unit 1251 and a loop control unit 1252 . The delay unit 1251 is configured to delay a start time of a data encoding check performed by the checking unit 124 to the SRAM 122 by a first time. In addition, the loop control unit 1252 is configured to make the checking unit 124 repeatedly perform the data encoding checking on the SRAM 122a for N times, where N is a positive integer. In more detail, in the process of performing N times of the data encoding check, the delay unit 1251 delays the start time of each data encoding check by a second time, which is smaller than the aforementioned first time. The first time used by an embodiment.

FIG. 8 shows a flow chart of a method for improving the prevention capability of a chip soft failure according to the present invention implemented by the circuit shown in FIG. 7 . As shown in FIG. 7 and FIG. 8 , the method for improving the chip soft failure prevention capability of the present invention is realized by a touch chip 12 , the touch chip 12 includes a microcontroller 121 , a static random access memory 122 , An inspection unit 124 and a chip soft failure prevention capability enhancing circuit 125 including a delay unit 1251 and a loop control unit 1252 of the present invention. After the touch chip 12 is powered on or reset (Reset), the required files (eg bin files) stored in the flash memory 123 must be loaded into the SRAM 122, and the inspection unit 124 It is used to check whether the file loaded in the SRAM 122a is affected by external force (eg: ESD) and has data coding errors. In short, the verification unit 124 is used to perform a data encoding verification on the SRAM 122a.

As shown in FIG. 7 and FIG. 8 , the method of the present invention firstly executes step S1a: when the checking unit 124 performs a data code check on the SRAM 122, the checking unit 124 sends the SRAM to the SRAM 122. The memory 122 repeatedly executes the data encoding check N times, where N is a positive integer; in the process of executing the data encoding check N times, a start time of each data encoding check is delayed by a preset time time. Next, step S2a is performed: in the process of performing the N times of the data encoding inspection, if the result of any one of the data encoding inspections shows that the inspection is passed, the microcontroller 121 is activated to start the touch control chip 12 normal work.

In particular, in the method used in the aforementioned first embodiment, the longer the first time is set, the easier it is to avoid abnormal or unstable communication of the SRAM. However, setting the first time that is too long may give the user a feeling of sluggish touch response in the system operation of the touch device, but setting the first time that is too short may fail to avoid the communication expiration period. For this reason, in the method of the second embodiment, the present invention adds a loop control unit 1252 in the wafer soft failure prevention capability improvement circuit 125, and is configured to make the inspection unit 124 access the static random access The memory 122a repeatedly performs the data encoding check N times. It should be understood that the cyclic check is to solve the problem that the set time of the first time is too long, shorten the waiting time (that is, the second time) and increase the number of cyclic checks at the same time, as long as the data code check passes once, it can be considered that The verification is successful, and the loop is jumped out. In this way, not only can this reduce the waiting time, but also can improve the system response speed.

It should be added that, in a possible embodiment, after completing the N times of the data encoding inspection, the touch chip 12 interrupts the operation of the microcontroller 121 when the result of the data encoding inspection indicates that the inspection fails. a start the program. In addition, in another possible embodiment, after completing the N times of the data encoding inspection, the touch chip 12 notifies an external device through a signal communication pin when the result of the data encoding inspection indicates that the inspection fails. a host processor, enabling the host processor to directly load at least one file into the SRAM 122 , or store the file in a flash memory 123 included in the touch chip 12 middle.

In addition, since the chip soft failure prevention capability improvement circuit of the present invention can effectively solve the problem of chip soft failure, the present invention can also be applied to control in other fields such as information processing, screen display, power control, etc. in addition to touch chips In the chip, that is, the application of the present invention is not limited to the touch chip.

In this way, the above has completely and clearly described a chip soft failure prevention capability enhancement circuit of the present invention; and, from the above, it can be known that the present invention has the following advantages:

(1) The present invention discloses a circuit for improving the capability of preventing chip soft failure, which is applied to a control chip including a microcontroller, a static random access memory and an inspection unit; wherein the circuit is coupled to is connected between the checking unit and the SRAM, and mainly includes a delay unit, which is configured to enable the checking unit to perform a start of a data encoding check on the SRAM The time is delayed by a predetermined time, so that the verification unit can avoid data verification failure caused by abnormal or unstable communication of the SRAM while waiting for the predetermined time to pass. Finally, after the result of the data coding inspection shows that the inspection is passed, the microcontroller is started, so that the control chip starts to work normally.

(2) The present invention also discloses a control chip, which has a microcontroller, a static random access memory and an inspection unit; it is characterized in that the control chip further has the chip soft failure function of the present invention as described above. Prevent the ability to enhance the circuit.

(3) The present invention also provides an information processing device, which is characterized by having a touch panel and at least one control chip of the present invention as described above. In a feasible embodiment, the information processing device is selected from the group consisting of touch devices, smart phones, smart watches, smart bracelets, tablet computers, notebook computers, all-in-one computers, and access control devices of an electronic device.

It must be emphasized that the above-mentioned disclosure in this case is a preferred embodiment, and any partial changes or modifications originating from the technical ideas of this case and easily inferred by those who are familiar with the art are within the scope of the patent of this case. category of rights.

To sum up, regardless of the purpose, means and effect of this case, it shows that it is completely different from the conventional technology, and its first invention is suitable for practical use, and it does meet the requirements of a patent for invention. Society is to pray for the best.

1a: Touch device 11a: Touch Panel 12a: Touch chip 121a: Microcontrollers 122a: Static random access memory 123a: Flash memory 124a: Inspection unit 1: Touch device 11: Touch panel 12: Touch Chip 121: Microcontroller 122: Static random access memory 123: flash memory 124: Inspection unit 125: Chip Soft Failure Prevention Ability Enhancement Circuit 1251: Delay unit 1252: Cycle Control Unit S1: When the checking unit performs a data coding check on the SRAM, delay a start time of the data coding check by a preset time. S2: When the result of the data coding inspection shows that the inspection is passed, start the microcontroller to make the touch control chip start to work normally S1a: when the checking unit performs a data coding check on the SRAM, make the checking unit repeatedly perform the data coding check on the SRAM N times, where N is a positive integer; In the process of performing N times of the data coding check, a start time of each data coding check is delayed by a preset time. S2a: In the process of performing N times of the data coding inspection, when the result of any one of the data coding inspections shows that the inspection is passed, start the microcontroller, so that the touch control chip starts to work normally

FIG. 1 is a block diagram of a conventional touch device; 2 is a block diagram showing a microcontroller, a SRAM and a flash memory included in the touch chip shown in FIG. 1; 3 is a block diagram of an internal unit of a touch chip with improved soft failure capability; 4 is a block diagram of a touch device including a touch chip of the present invention; 5 is a first block diagram of an internal unit of the touch chip of the present invention; FIG. 6 is a flow chart of a method for improving the ability to prevent soft failure of a chip of the present invention executed by using the circuit shown in FIG. 5; 7 is a second block diagram of the internal unit of the touch chip of the present invention; and FIG. 8 is a flow chart of a method for improving the capability of preventing soft failure of a chip according to the present invention, executed by the circuit shown in FIG. 7 .

12: Touch Chip

121: Microcontroller

122: Static random access memory

123: flash memory

124: Inspection unit

125: Chip Soft Failure Prevention Ability Enhancement Circuit

1251: Delay unit

Claims (10)

A circuit for improving the ability to prevent chip soft failure, which is applied to a control chip including a microcontroller, a static random access memory and an inspection unit; wherein, the circuit for improving the ability to prevent chip soft failure is coupled between the verification unit and the SRAM, and includes: a delay unit configured to delay a start time of a data encoding check performed by the checking unit to the SRAM by a first time. The circuit for improving the capability of preventing chip soft failure as claimed in claim 1, further comprising: a loop control unit, configured to make the checking unit repeatedly perform the data encoding checking on the SRAM N times, where N is a positive integer; Wherein, in the process of performing N times of the data coding check, the delay unit delays the start time of each data coding check by a second time, and the second time is smaller than the first time. The chip soft failure prevention capability improvement circuit as claimed in claim 2, wherein after completing N times of the data code inspection, the control chip interrupts the microchip when the result of the data code inspection shows that the inspection fails. A start-up procedure for the controller. The circuit for improving the capability of preventing chip soft failure as claimed in claim 2, wherein after completing N times of the data code inspection, the control chip transmits a signal when the result of the data code inspection shows that the inspection fails. The communication pin notifies an external host processor, so that the host processor directly loads at least one file into the static random access memory, or stores the file in a flash memory contained in the control chip in the body. A method for improving the ability to prevent soft failure of a chip is realized by a control chip; wherein, the control chip includes a microcontroller, a static random access memory and an inspection unit, and the ability to prevent soft failure of the chip is realized. The lifting method includes the following steps: (1) when the checking unit performs a data coding check on the SRAM, delaying a start time of the data coding check by a preset time; and (2) When the result of the data coding inspection shows that the inspection is passed, start the microcontroller to make the control chip start to work normally. The method for improving the capability of preventing soft failure of a chip as claimed in claim 5, wherein, after completing the N times of the data code inspection, the control chip transmits a signal when the result of the data code inspection shows that the inspection fails. The communication pin notifies an external host processor, so that the host processor directly loads at least one file into the static random access memory, or stores the file in a flash memory contained in the control chip in the body. A method for improving the ability to prevent soft failure of a chip is realized by a control chip; wherein, the control chip includes a microcontroller, a static random access memory and an inspection unit, and the ability to prevent soft failure of the chip is realized. The lifting method includes the following steps: (1) when the checking unit performs a data encoding check on the SRAM, causing the checking unit to repeatedly perform the data encoding checking on the SRAM N times, where N is a positive integer; In the process of performing N times of the data coding check, a start time of each data coding check is delayed by a preset time; and (2) In the process of performing N times of the data coding inspection, if the result of any one of the data coding inspections shows that the inspection is passed, start the microcontroller to make the control chip start to work normally. The method for improving the ability to prevent soft failure of a chip as claimed in claim 7, wherein after completing the N times of the data code inspection, the control chip transmits a signal when the result of the data code inspection indicates that the inspection fails. The communication pin notifies an external host processor, so that the host processor directly loads at least one file into the static random access memory, or stores the file in a flash memory contained in the control chip in the body. A control chip has a microcontroller, a static random access memory and an inspection unit; it is characterized in that, the control chip further has the chip soft failure according to any one of claim 1 to claim 4 Prevent the ability to enhance the circuit. An information processing device is characterized by having a touch panel and at least one control chip according to claim 9.

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