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TWI697234B - Self-calibrating optical detector - Google Patents

Self-calibrating optical detector Download PDF

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TWI697234B
TWI697234B TW108116599A TW108116599A TWI697234B TW I697234 B TWI697234 B TW I697234B TW 108116599 A TW108116599 A TW 108116599A TW 108116599 A TW108116599 A TW 108116599A TW I697234 B TWI697234 B TW I697234B
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detection threshold
calibration
optical detector
memory
initial detection
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TW108116599A
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TW201935916A (en
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特洛伊 庫克
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美商Tt電子公司
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Abstract

The present disclosure includes systems and methods for calibration of an optical sensor package, including setting an initial detection threshold of a detector, gradually increasing a power level of a signal generator that is in communication with a detector to cause a detected power at the detector to exceed the initial detection threshold, storing in a memory a first power level of the signal generator at which the detected power at the detector exceeds the initial detection threshold, and adjusting the initial detection threshold of the detector to an adjusted detection threshold to include a detection buffer amount within the adjusted detection threshold.

Description

自行校準光學偵測器 Self-calibration of optical detector [相關申請案之交互參考] [Cross-reference of related applications]

本申請案聲明擁有於2016年6月1日提出申請的美國專利申請案15/170,511的優先權,而該專利申請案聲明擁有於2016年5月31日提出申請的美國臨時專利申請案62/343,657的優先權之權益,本申請案特此引用該臨時專利申請案之完整內容以供參照,猶如在下文中完全述及該臨時專利申請案,且供所有所有適用的用途。 This application declares that it has the priority of the US patent application 15/170,511 filed on June 1, 2016, and the patent application declares that it has the US temporary patent application 62/filed on May 31, 2016. 343,657 Priority rights and interests, this application hereby cites the entire content of the provisional patent application for reference, as if the provisional patent application is fully described below, and for all applicable uses.

本發明的揭露係大致有關被用於偵測目標介質中之改變的自行校準光學感測器組合的系統及技術。 The disclosure of the present invention is generally related to a system and technique for self-calibrating optical sensor combinations used to detect changes in a target medium.

在各種工業中,需要能夠以高速率偵測通過一信號產生器與一偵測器之間的材料中之改變的感測器組合。例如,使用者可能希望在有貼在一張背紙(backing paper)的一面之自黏標籤(adhesive label)運行通過一感測器組合時 計算貼在一張背紙的自黏標籤之數目。藉由感測標籤與背紙之間的透明度的改變,該感測器組合可在每一標籤通過該信號產生器(例如,一發光二極體)與該偵測器(例如,一光偵測器(photodetector))之間時偵測該標籤。 In various industries, there is a need for sensor combinations that can detect changes in the material passing between a signal generator and a detector at a high rate. For example, a user may wish to run a sensor combination when an adhesive label attached to a side of a backing paper is run through a sensor Count the number of self-adhesive labels attached to a piece of backing paper. By sensing the change in transparency between the label and the backing paper, the sensor combination can pass the signal generator (eg, a light emitting diode) and the detector (eg, a light detection) at each label Between the detector (photodetector).

該感測器組合尋找的改變可能是極小的,因而需要非常敏感的偵測。在某些應用中,該改變可能小到足以使製造該感測器組合的零件時之變異、該感測器組合之溫度變異、材料通過該感測器組合時的材料路徑之變化等的因素可能導致偵測的錯誤。因此,必須根據使用該感測器組合的特定環境以及用於組裝該感測器組合的特定組件而校準該感測器組合。通常,係以人工方式執行該校準,且係根據目標環境中之測試而執行該感測器組合的一次性永久調整。因此,希望能夠改善此種校準方法。 The changes that the sensor combination looks for may be extremely small, requiring very sensitive detection. In some applications, the change may be small enough to cause variations in the manufacture of parts of the sensor assembly, variations in the temperature of the sensor assembly, changes in the material path when the material passes through the sensor assembly, etc. May cause detection errors. Therefore, the sensor combination must be calibrated according to the specific environment in which the sensor combination is used and the specific components used to assemble the sensor combination. Usually, the calibration is performed manually, and a one-time permanent adjustment of the sensor combination is performed based on the test in the target environment. Therefore, it is hoped that such a calibration method can be improved.

因此,希望能夠有可自行校準感測器組合的系統及方法,且希望該系統及方法自行校準感測器組合的方式為:設定一偵測器的偵測臨界值,逐漸增加(ramping up)一信號產生器的功率位準,使該偵測器接收超過正常操作條件下的該偵測臨界值之信號能量,且將一偵測緩衝量加到該偵測臨界值,以便保證即使在該系統中有減少該偵測器接收的信號能量之變異時也將能執行偵測。 Therefore, it is desirable to have a system and method that can calibrate a sensor combination by itself, and the method of the system and method to calibrate a sensor combination by itself is: setting a detection threshold of a detector and gradually ramping up The power level of a signal generator enables the detector to receive signal energy exceeding the detection threshold under normal operating conditions, and adds a detection buffer to the detection threshold to ensure that even in the The system can also perform detection when there is variation in the signal energy received by the detector.

在本發明揭露的一觀點中,一種校準方法包含:由一控制器設定一偵測器的一初始偵測臨界值。該方法進一步 包含:逐漸增加與該偵測器及該控制器通訊的一信號產生器之功率位準,使該偵測器上被偵測到的功率超過該初始偵測臨界值。該方法進一步包含:由該控制器將該偵測器上被偵測到的功率超過該初始偵測臨界值時的該信號產生器之一第一功率位準儲存在一記憶體。該方法進一步包含:在該信號產生器的功率位準到達該第一功率位準之後,由該控制器將該偵測器的該初始偵測臨界值調整成使一調整後的偵測臨界值將一偵測緩衝量包含在該調整後的偵測臨界值內。 In one aspect disclosed by the present invention, a calibration method includes: a controller sets an initial detection threshold of a detector. The method further Including: gradually increasing the power level of a signal generator communicating with the detector and the controller, so that the detected power on the detector exceeds the initial detection threshold. The method further includes: storing, by the controller, a first power level of the signal generator when the detected power on the detector exceeds the initial detection threshold in a memory. The method further includes: after the power level of the signal generator reaches the first power level, the controller adjusts the initial detection threshold of the detector to make an adjusted detection threshold A detection buffer amount is included in the adjusted detection threshold.

在本發明揭露的另一觀點中,一種電腦程式產品具有可有形地記錄用於校準偵測器及信號產生器的電腦程式邏輯之電腦可讀取的媒體。該電腦程式產品包含用於自一使用者接收包括該初始偵測臨界值的一偵測臨界值設定信號之程式碼。該電腦程式產品進一步包含用於自該使用者接收用於指示該電腦程式產品開始逐漸增加該信號產生器的功率位準的一校準信號之程式碼。該電腦程式產品進一步包含用於自該使用者接收包括用於調整該初始偵測臨界值的使用者可程式化的量的一臨界值改變信號之程式碼。 In another aspect disclosed by the present invention, a computer program product has a computer-readable medium that can tangibly record computer program logic for calibrating a detector and a signal generator. The computer program product includes program code for receiving a detection threshold setting signal including the initial detection threshold from a user. The computer program product further includes program code for receiving a calibration signal from the user to instruct the computer program product to gradually increase the power level of the signal generator. The computer program product further includes code for receiving from the user a threshold change signal including a user programmable amount for adjusting the initial detection threshold.

在本發明揭露的又一觀點中,一種計算裝置包含用於容納機器可讀取的媒體之記憶體,該機器可讀取的媒體包含機器可執行碼,該機器可執行碼具有被儲存於其中的用於執行一校準感測器及信號產生器的方法之指令。該計算裝置進一步包含被耦合到該記憶體的一處理器,該處理器被配置成執行用於使該處理器設定該感測器的一初始偵測 臨界值之機器可執行碼。該處理器被進一步配置成執行用於逐漸增加與該感測器通訊的該信號產生器的功率位準而使該感測器上被偵測到的功率超過該初始偵測臨界值之機器可執行碼。該處理器被進一步配置成執行用於將該感測器上被偵測到的功率超過該初始偵測臨界值時的該信號產生器之一第一功率位準儲存在一記憶體之機器可執行碼。該處理器被進一步配置成執行用於在該信號產生器到達該第一功率位準之後將該感測器的該初始偵測臨界值調整成使一調整後的偵測臨界值將一偵測緩衝量包含在該調整後的偵測臨界值內之機器可執行碼。 In yet another aspect disclosed by the present invention, a computing device includes a memory for accommodating a machine-readable medium, the machine-readable medium includes machine-executable code, and the machine-executable code has been stored therein For executing a method of calibrating a sensor and a signal generator. The computing device further includes a processor coupled to the memory, the processor configured to perform an initial detection for the processor to set the sensor Machine executable code for critical values. The processor is further configured to execute a machine for gradually increasing the power level of the signal generator communicating with the sensor so that the detected power on the sensor exceeds the initial detection threshold Execution code. The processor is further configured to execute a machine for storing a first power level of the signal generator in a memory when the detected power on the sensor exceeds the initial detection threshold Execution code. The processor is further configured to execute the initial detection threshold of the sensor after the signal generator reaches the first power level such that an adjusted detection threshold will detect The amount of buffer contains the machine executable code within the adjusted detection threshold.

100‧‧‧光學感測器組合 100‧‧‧Optical sensor combination

102‧‧‧發光二極體 102‧‧‧ LED

104‧‧‧光二極體 104‧‧‧ Photodiode

106‧‧‧槽 106‧‧‧slot

108‧‧‧目標介質 108‧‧‧Target medium

112‧‧‧第一部分 112‧‧‧Part 1

114‧‧‧第二部分 114‧‧‧Part Two

202‧‧‧電源 202‧‧‧Power

204‧‧‧振盪器 204‧‧‧Oscillator

206‧‧‧能帶隙參考電壓 206‧‧‧ bandgap reference voltage

208‧‧‧類比前端 208‧‧‧ Analog front end

210‧‧‧比較器 210‧‧‧Comparator

222‧‧‧發光二極體驅動器 222‧‧‧ LED driver

226‧‧‧狀態機 226‧‧‧ State machine

228‧‧‧多工器 228‧‧‧Multiplexer

214‧‧‧記憶體 214‧‧‧ memory

216‧‧‧通訊介面 216‧‧‧Communication interface

218‧‧‧校準狀態接腳 218‧‧‧ Calibration status pin

220‧‧‧輸出接腳 220‧‧‧Output pin

302‧‧‧安定模式 302‧‧‧stable mode

304‧‧‧操作模式 304‧‧‧Operation mode

306‧‧‧發光二極體驅動器啟用模式 306‧‧‧Enable mode of LED driver

308‧‧‧發光二極體驅動器未啟用模式 308‧‧‧LED driver not enabled mode

310‧‧‧校準模式 310‧‧‧Calibration mode

312‧‧‧狀態模式 312‧‧‧ Status mode

502‧‧‧無調整的校準偵測臨界值 502‧‧‧No adjustment calibration detection threshold

504‧‧‧最小偵測臨界值 504‧‧‧Minimum detection threshold

508‧‧‧偵測臨界值 508‧‧‧Detection threshold

510‧‧‧調整後的校準偵測臨界值 510‧‧‧Adjusted calibration detection threshold

第1A圖示出根據本發明揭露的一實施例的一光學感測器組合。 FIG. 1A shows an optical sensor combination according to an embodiment disclosed by the present invention.

第1B圖示出根據本發明揭露的一實施例的一替代光學感測器組合。 FIG. 1B shows an alternative optical sensor combination according to an embodiment disclosed by the present invention.

第2圖示出根據本發明揭露的一實施例的該光學感測器組合之一控制系統。 FIG. 2 shows a control system of the optical sensor combination according to an embodiment disclosed by the present invention.

第3圖示出根據本發明揭露的一實施例的一狀態機的操作之一狀態圖。 FIG. 3 shows a state diagram of the operation of a state machine according to an embodiment disclosed by the present invention.

第4圖示出根據本發明揭露的一實施例的用於自行校準該感測器組合的一方法之一方塊圖。 FIG. 4 shows a block diagram of a method for self-calibrating the sensor combination according to an embodiment disclosed by the present invention.

第5A圖示出一光二極體在室溫下接收的功率之一圖形。 Figure 5A shows a graph of the power received by a photodiode at room temperature.

第5B圖示出一光二極體在高溫下接收的功率之一圖形。 Figure 5B shows a graph of the power received by a photodiode at high temperature.

下文中將以與各圖式有關之方式述及的詳細說明將意圖作為對各種組態的說明,且不意圖代表可實施本發明所述的觀念之僅有的組態。該詳細說明包含為了提供對各種觀念的徹底了解之特定細節。然而,熟悉此項技術者當可了解:可在沒有這些特定細節的情形下實施這些觀念。 The detailed description, which will be described in the following in connection with the drawings, is intended to be a description of various configurations, and is not intended to represent the only configurations that can implement the concepts described in the present invention. This detailed description contains specific details in order to provide a thorough understanding of various concepts. However, those skilled in the art should understand that these concepts can be implemented without these specific details.

本發明的揭露說明了用於自行校準包含一信號產生器及一偵測器的一感測器系統以便偵測目標介質中之改變的系統及方法。為了簡化,本發明所述的實施例將使用將一發光二極體(Light Emitting Diode;簡稱LED)用來作為該信號產生器且將一光二極體用來作為該偵測器的一光學感測器組合,但是各實施例的範圍可包括任何適當的信號產生器或光子偵測器。 The disclosure of the present invention describes a system and method for self-calibrating a sensor system including a signal generator and a detector to detect changes in a target medium. For simplicity, the embodiments of the present invention will use a light emitting diode (Light Emitting Diode; LED for short) as the signal generator and a light diode as an optical sensor of the detector Detector combination, but the scope of the embodiments may include any suitable signal generator or photon detector.

在某些應用中,該感測器組合可被用於偵測該光二極體上接收的光之小改變。例如,貼在一背紙的一標籤與該背紙本身之間的透明度(transparency)(或透射率(transmittance))之差異可能是很小的。該感測器組合應能夠感測透明度的此種輕微改變。然而,該改變可能是小到使該感測器組合製造時的變化以及環境的變化可能導致錯誤偵測。例如,該LED輸出或光二極體靈敏度的變化、該LED封裝之透鏡或該光二極體封裝的變化、該LED或光二 極體在該感測器組合內之放置的變化、該感測器組合中之溫度的變化、或目標介質通過感測器組合的路徑的變化等的變化可能各自單獨地或合起來地足以導致偵測錯誤。 In some applications, the sensor combination can be used to detect small changes in the light received on the photodiode. For example, the difference in transparency (or transmittance) between a label affixed to a backing paper and the backing paper itself may be very small. The sensor combination should be able to sense this slight change in transparency. However, the change may be so small that changes in the sensor assembly and environmental changes may cause false detection. For example, the change in the LED output or the sensitivity of the photodiode, the change in the lens of the LED package or the change in the photodiode package, the LED or the photodiode Changes in the placement of the polar body within the sensor combination, changes in the temperature in the sensor combination, or changes in the path of the target medium through the sensor combination, etc. may each be sufficient alone or together to cause Detect errors.

為了防止由於這些變化導致的偵測錯誤,希望能夠校準該感測器組合。在一實施例中,該感測器組合被設計成自行校準。可由來自使用者的一命令啟動自行校準,或者可在該感測器組合通電之後立即自動地自行校準。在某些實施例中,如將於下文中進一步說明的,使用者可在校準之前將各種參數供應到該感測器組合。 In order to prevent detection errors due to these changes, it is desirable to be able to calibrate the sensor combination. In one embodiment, the sensor combination is designed to calibrate itself. The self-calibration can be initiated by a command from the user, or can be automatically calibrated immediately after the sensor combination is powered on. In some embodiments, as will be explained further below, the user can supply various parameters to the sensor combination before calibration.

本發明揭露的實施例說明了用於校準光學感測器組合以便偵測兩目標材料通過該感測器時的該等兩目標材料之間的改變之系統及方法。在接收到一校準要求後,立即逐漸增加一LED的輸出功率,直到一光二極體上接收的來自該LED的光超過一預設偵測臨界值為止。然後將執行偵測時的LED功率位準儲存為一校準參數。然而,當使用上述偵測臨界值及LED功率位準操作該感測器組合以便感測目標材料時,將減少該光二極體上接收的光的量之該系統中之變化即使是小量的變化,也將會減少被接收的光至低於該偵測臨界值,而導致所需偵測的失敗。 The embodiments disclosed in the present invention describe a system and method for calibrating an optical sensor combination so as to detect changes between two target materials as they pass through the sensor. After receiving a calibration request, the output power of an LED is gradually increased until the light received from the LED on a photodiode exceeds a preset detection threshold. Then, the LED power level when performing the detection is stored as a calibration parameter. However, when using the above detection threshold and LED power level to operate the sensor combination in order to sense the target material, the amount of light received on the photodiode will be reduced by even a small amount of variation in the system Changes will also reduce the received light below the detection threshold, resulting in the failure of the required detection.

為了解決該問題,以超過預期變化的一量調整該偵測臨界值,而提供一偵測緩衝量。例如,如果變化可能將該光二極體上接收的光的量減少15%,則將該偵測臨界值減少20%時將保證變化將不會導致被接收的光的量減少到低於該偵測臨界值。在該例子中,該偵測緩衝量是該調整後 的偵測臨界值與變化對該偵測器的預期影響之間的5%差異。 To solve this problem, the detection threshold is adjusted by an amount that exceeds the expected change, and a detection buffer amount is provided. For example, if the change may reduce the amount of light received on the photodiode by 15%, reducing the detection threshold by 20% will ensure that the change will not cause the amount of received light to decrease below the detection Measure the critical value. In this example, the detection buffer amount is the adjusted The 5% difference between the detection threshold of the detector and the expected effect of the change on the detector.

當然,前文提供的百分率是例子,這是因為其他的系統可能包含適當之不同的偵測緩衝量。在各實施例中,可透過測試、模擬、或其他方式,容許該偵測臨界值被調整,使變化的影響與調整後的偵測臨界值之間的差異將錯誤偵測的機會減少到特定應用可接受的程度。該調整後的偵測臨界值被儲存為一校準參數。在諸如斷電之後對該光學感測器組合供電時,使用該LED功率位準及調整後的偵測臨界值,因而不需要重新校準。 Of course, the percentages provided above are examples, because other systems may include appropriately different detection buffers. In various embodiments, the detection threshold can be adjusted by testing, simulation, or other methods, so that the difference between the impact of the change and the adjusted detection threshold reduces the chance of false detection to a specific Acceptable degree of application. The adjusted detection threshold is stored as a calibration parameter. When power is supplied to the optical sensor combination after power off, for example, the LED power level and the adjusted detection threshold are used, so no recalibration is required.

本發明揭露的一實施例包含一控制器,該控制器具有用於儲存校準值以及儲存將那些校準值用於正常偵測操作期間的電腦可讀取的程式碼之記憶體位址。在一例子中,使用者將一第一偵測臨界值設定在該控制器的一記憶體位址中,而開始一校準操作。該系統然後逐漸增加一信號產生器的放大器位準,直到該偵測器偵測到到達該第一臨界值的該信號為止,而驗證該第一臨界值。如果該偵測器並未偵測到使用該第一臨界值的該信號,則該使用者可改變該第一臨界值,使得在該信號產生器的基於其可用放大器位準的操作範圍內可偵測到該信號。 An embodiment disclosed in the present invention includes a controller having a memory address for storing calibration values and storing computer-readable program codes that use those calibration values during normal detection operations. In one example, the user sets a first detection threshold in a memory address of the controller and starts a calibration operation. The system then gradually increases the amplifier level of a signal generator until the detector detects the signal that reaches the first threshold, and verifies the first threshold. If the detector does not detect the signal using the first threshold, the user can change the first threshold so that the signal generator can operate within the operating range based on its available amplifier level The signal is detected.

假定已利用一成功的偵測驗證了該第一臨界位準,此時該控制器儲存對應於到達該第一臨界位準的一點之放大器位準,而繼續該校準操作。該使用者然後可設定其中有一偵測緩衝量的一第二偵測臨界值,而調整該偵測位準。 下文中將進一步詳細說明該偵測緩衝量,且在本實施例中,該偵測緩衝量對應於代表預期變化的影響與該第二臨界位準之間的差異避免了錯誤偵測及/或無法偵測的一量。該控制器然後將該放大器位準及該第二臨界值儲存在被用於該控制器的正常操作期間的記憶體位址中。在重開機之後或在後來某一其他適當的時間,該控制器然後將該放大器位準及該第二臨界值用於執行偵測,且被建入該第二臨界值的該偵測緩衝量將可減少或最小化變化導致的不必要的操作。 Assuming that the first threshold level has been verified by a successful detection, the controller stores the amplifier level corresponding to a point at which the first threshold level is reached, and continues the calibration operation. The user can then set a second detection threshold with a detection buffer, and adjust the detection level. The detection buffer amount will be described in further detail below, and in this embodiment, the detection buffer amount corresponds to the difference between the effect representing the expected change and the second threshold level to avoid false detection and/or An undetectable quantity. The controller then stores the amplifier level and the second threshold in memory addresses used during normal operation of the controller. After rebooting or at some other appropriate time later, the controller then uses the amplifier level and the second threshold to perform detection, and the detection buffer amount built into the second threshold is Unnecessary operations caused by changes will be reduced or minimized.

現在請參閱第1A圖,圖中示出根據本發明揭露的一實施例的一光學感測器組合100。在該實施例中,感測器組合100包含一發光二極體(LED)102以及一光二極體104,該LED 102與該光二極體104之間有一槽106,且如方向箭頭110所示,一目標介質108可通過該槽106。在某些實施例中,LED 102可以是一紅外線(infrared;簡稱IR)LED或其他適當波長的LED。LED 102輸出方向朝向光二極體104的光。當目標介質108通過槽106時,透射通過目標介質108的光的量根據目標介質108在LED 102與光二極體104之間的部分之透射率而改變。在某些實施例中,目標介質108的一第一部分112可能比目標介質108的一第二部分114更不透明或更有反射性。例如,目標介質108可能是有自黏標籤貼在其上的一張背紙。在該例子中,該等標籤是目標介質108的第一部分112,比係為目標介質108的第二部分114之該背紙更不透明。 Referring now to FIG. 1A, an optical sensor assembly 100 according to an embodiment disclosed by the present invention is shown. In this embodiment, the sensor assembly 100 includes a light-emitting diode (LED) 102 and a light-emitting diode 104 with a slot 106 between the LED 102 and the light-emitting diode 104, as shown by the directional arrow 110 , A target medium 108 can pass through the slot 106. In some embodiments, the LED 102 may be an infrared (IR) LED or other LEDs with appropriate wavelengths. The LED 102 outputs light toward the photodiode 104. When the target medium 108 passes through the groove 106, the amount of light transmitted through the target medium 108 changes according to the transmittance of the portion of the target medium 108 between the LED 102 and the photodiode 104. In some embodiments, a first portion 112 of the target medium 108 may be more opaque or reflective than a second portion 114 of the target medium 108. For example, the target medium 108 may be a piece of backing paper with a self-adhesive label attached to it. In this example, the labels are the first portion 112 of the target media 108, which is more opaque than the backing paper that is the second portion 114 of the target media 108.

現在請參閱第1B圖,圖中示出根據本發明揭露的一實施例的一光學感測器組合100之一替代實施例。在該實施例中,一LED 102及光二極體104被定位成相互靠近,且如方向箭頭110所示,一目標介質108在LED 102及光二極體104之上通過。在該實施例中,LED 102輸出方向朝向目標介質108的光,且光二極體104偵測自目標介質108反射的光。當目標介質108沿著方向箭頭110在感測器組合100之上通過時,自目標介質108反射的光的量根據目標介質108在LED 102與光二極體104之間的部分之反射率(reflectance)而改變。 Referring now to FIG. 1B, there is shown an alternative embodiment of an optical sensor assembly 100 according to an embodiment disclosed by the present invention. In this embodiment, an LED 102 and a photodiode 104 are positioned close to each other, and as indicated by the directional arrow 110, a target medium 108 passes over the LED 102 and the photodiode 104. In this embodiment, the LED 102 outputs light toward the target medium 108, and the light diode 104 detects the light reflected from the target medium 108. When the target medium 108 passes over the sensor assembly 100 along the directional arrow 110, the amount of light reflected from the target medium 108 is based on the reflectance of the portion of the target medium 108 between the LED 102 and the photodiode 104 ) And change.

現在請參閱第2圖,圖中示出根據本發明揭露的一實施例的光學感測器組合100之一控制系統。可將該控制系統實施為執行用於執行第3圖的狀態機所示的行動的邏輯之一特定應用積體電路(Application Specific Integrated Circuit;簡稱ASIC)。然而,各實施例的範圍可包括諸如執行用於執行本發明所述的校準及偵測行動的機器可讀取的程式碼之一般用途中央處理單元等的任何種類的邏輯電路。一電源202供電給該電路。一振盪器204產生一時鐘信號,用以提供感測器組合100的該電路的操作之時序。在某些實施例中,振盪器204可提供諸如4百萬赫(MHz)信號等的一高頻時鐘信號。一能帶隙參考電壓206產生獨立於電源202供應的電壓且獨立於該系統中的溫度變化之一固定電壓。該固定電壓被饋送到將受益於固定電壓的該系統之諸如振盪器204、類比前端208、比較器210、及LED驅 動器222等的其他元件。 Referring now to FIG. 2, a control system of an optical sensor assembly 100 according to an embodiment disclosed by the present invention is shown. The control system can be implemented as an application specific integrated circuit (ASIC for short), which is one of the logics for executing the actions shown in the state machine of FIG. 3. However, the scope of the various embodiments may include any kind of logic circuit such as a general-purpose central processing unit that executes machine-readable program code for performing calibration and detection actions according to the present invention. A power supply 202 supplies power to the circuit. An oscillator 204 generates a clock signal for providing the timing of the operation of the circuit of the sensor assembly 100. In some embodiments, the oscillator 204 may provide a high frequency clock signal such as a 4 million hertz (MHz) signal. An energy bandgap reference voltage 206 generates a fixed voltage independent of the voltage supplied by the power source 202 and independent of the temperature change in the system. The fixed voltage is fed to the system such as oscillator 204, analog front end 208, comparator 210, and LED driver that will benefit from the fixed voltage Other elements such as actuator 222.

類比前端208自LED 102接收類比信號,且如將於下文中進一步說明的,處理該等類比信號以供在比較器210上與一使用者決定的偵測臨界值比較。在某些實施例中,光二極體104是類比前端208的一部分,但是應當理解:光二極體104可以是被連接到類比前端208的一離散元件。類比前端208進一步包含一跨阻抗放大器(transimpedance amplifier)、一積分器級(integrator stage)、一增益級(gain stage)、以及具有可程式參考信號產生器的一比較器。該跨阻抗放大器被用於將光二極體104的輸出放大到該系統的其餘部分可使用的電壓。 The analog front end 208 receives analog signals from the LED 102 and, as will be explained further below, processes the analog signals for comparison on the comparator 210 with a detection threshold determined by a user. In some embodiments, the photodiode 104 is part of the analog front end 208, but it should be understood that the photodiode 104 may be a discrete element connected to the analog front end 208. The analog front end 208 further includes a transimpedance amplifier, an integrator stage, a gain stage, and a comparator with a programmable reference signal generator. The transimpedance amplifier is used to amplify the output of the photodiode 104 to a voltage that can be used by the rest of the system.

類比前端208的該跨阻抗放大器可具有被一帶通濾波回饋迴路控制的其本身之增益,以便補償光二極體104回應環境光而產生的電流。如將於下文中參照第4圖而進一步說明的,該跨阻抗放大器的增益可進一步被校準期間根據光二極體104自LED 102接收的信號的強度而自動增加該跨阻抗放大器的增益之一自動增益選擇電路控制。該自動增益選擇電路亦可設有在已經執行了校準的情形下將被狀態機226使用之一增益等級(gain level)。在某些實施例中,該自動增益選擇電路可具有3個增益設定值,但是在某些實施例中可使用任何適當數目的增益設定值。 The transimpedance amplifier of the analog front end 208 may have its own gain controlled by a bandpass filter feedback loop to compensate for the current generated by the photodiode 104 in response to ambient light. As will be further explained with reference to FIG. 4 below, the gain of the transimpedance amplifier can be further automatically increased by one of the gains of the transimpedance amplifier during calibration according to the intensity of the signal received by the photodiode 104 from the LED 102 Gain selection circuit control. The automatic gain selection circuit may also be provided with a gain level that will be used by the state machine 226 if calibration has been performed. In some embodiments, the automatic gain selection circuit may have 3 gain settings, but in some embodiments any suitable number of gain settings may be used.

類比前端208的該積分器級執行諸如消除低頻雜訊及電源漣波(power supply ripple)、使光二極體104信號參照到能帶隙參考電壓206、以及自光二極體104的輸出(可能 是一脈波)產生一鋸齒波信號因而減少光二極體104的輸出中之頻寬變化的影響等的各種功能。類比前端208的該增益級將輸出信號升壓到適用於比較器210的位準。 The integrator stage of the analog front end 208 performs operations such as eliminating low frequency noise and power supply ripple, making the optical diode 104 signal reference to the bandgap reference voltage 206, and output from the optical diode 104 (possibly It is a pulse wave) to generate a sawtooth wave signal and thus reduce the various functions such as the influence of the bandwidth variation in the output of the optical diode 104. This gain stage of the analog front end 208 boosts the output signal to a level suitable for the comparator 210.

比較器210接收類比前端208的輸出以及一預先編程的參考位準,且比較以上兩者。比較器210的輸出狀態根據該比較而改變。例如,當類比前端208的輸出超過該預先編程的參考位準時,該輸出狀態可以是二進制一,或者當類比前端208的輸出低於該參考位準時,該輸出狀態可以是二進制零(反之亦然)。換言之,當類比前端208的輸出位準改變到高於或低於該參考位準時,該輸出狀態可改變。該參考位準因而可被用來作為一偵測臨界值。在一實施例中,使用者可自16個可用參考位準(例如,每一參考位準與次一參考位準之間有大約7%的改變)的一範圍中選擇該預先編程的參考位準,但是各實施例的範圍包括任何適當數目的參考位準。 The comparator 210 receives the output of the analog front end 208 and a pre-programmed reference level, and compares the two. The output state of the comparator 210 changes according to this comparison. For example, when the output of the analog front end 208 exceeds the pre-programmed reference level, the output state may be a binary one, or when the output of the analog front end 208 is lower than the reference level, the output state may be a binary zero (or vice versa) ). In other words, when the output level of the analog front end 208 changes above or below the reference level, the output state may change. The reference level can thus be used as a detection threshold. In one embodiment, the user can select the pre-programmed reference level from a range of 16 available reference levels (for example, a change of approximately 7% between each reference level and the next reference level) Standards, but the scope of the embodiments includes any suitable number of reference levels.

比較器210的輸出被傳送到一過濾器212。過濾器212被用於過濾掉由於偵測到目標介質108的所需部分以外的事件而導致比較器210的狀態之改變。此類事件可包括:導致類比前端208的輸出超過比較器210上的該參考位準之入射在光二極體104上的環境光、或導致比較器210輸出一狀態改變的感測器組合100中之電氣雜訊等的事件。過濾器212可能需要在多個連續的週期中於其輸入上檢視到一狀態改變,然後才將該狀態改變傳送到其輸出。在某些實施例中,過濾器212可等候到輸入在一適當數目的時鐘週 期(例如,2個週期)中保持在一改變的狀態,然後才輸出該狀態改變。該狀態改變可被輸出到狀態機226及多工器228,且將於下文中進一步說明這兩種情況。 The output of the comparator 210 is sent to a filter 212. The filter 212 is used to filter out changes in the state of the comparator 210 due to the detection of an event outside the desired portion of the target medium 108. Such events may include ambient light incident on the light diode 104 that causes the output of the analog front end 208 to exceed the reference level on the comparator 210, or the sensor combination 100 that causes the comparator 210 to output a state change Events such as electrical noise. The filter 212 may need to view a state change on its input in multiple consecutive cycles before transmitting the state change to its output. In some embodiments, the filter 212 may wait until the input is within an appropriate number of clock cycles During a period (for example, 2 cycles), a state of change is maintained before the state change is output. This state change can be output to the state machine 226 and the multiplexer 228, and these two cases will be further explained below.

記憶體214儲存感測器組合100使用的各種資訊區塊。在本實施例中,記憶體214是一電氣可抹除可程式唯讀記憶體(Electrically Erasable Programmable Read Only Memory;簡稱EEPROM),但是可以是任何其他適當的記憶體裝置。在一例子中,記憶體214儲存用於提供狀態機226的邏輯之將被處理器讀取及執行的電腦可讀取的程式碼。在某些實施例中,在執行了校準之後,與感測器組合100的校準有關之各種資訊區塊被儲存在記憶體214中,且如將於下文中參照第3及6圖說明的,狀態機226存取記憶體214,以便在感測器組合100通電之後立即擷取校準資訊。例如,記憶體214可儲存LED驅動器222的一驅動位準、類比前端208之跨阻抗放大器增益的一自動增益選擇值、用於指示是否已預先校準過感測器組合100的一校準位元(或旗標)、一輸出類型及極性、比較器210的一偵測臨界值、振盪器204的一內部振盪器校準因數(calibration factor)、以及偏壓產生器224的一溫度補償因數(temperature compensation factor)。 The memory 214 stores various information blocks used by the sensor combination 100. In this embodiment, the memory 214 is an Electrically Erasable Programmable Read Only Memory (EEPROM), but it can be any other suitable memory device. In one example, the memory 214 stores computer-readable program code that provides the logic of the state machine 226 to be read and executed by the processor. In some embodiments, after the calibration is performed, various information blocks related to the calibration of the sensor combination 100 are stored in the memory 214, and will be described below with reference to FIGS. 3 and 6, The state machine 226 accesses the memory 214 to retrieve calibration information immediately after the sensor assembly 100 is powered on. For example, the memory 214 may store a driving level of the LED driver 222, an automatic gain selection value of the transimpedance amplifier gain of the analog front end 208, and a calibration bit for indicating whether the sensor combination 100 has been previously calibrated ( (Or flag), an output type and polarity, a detection threshold of the comparator 210, an internal oscillator calibration factor of the oscillator 204, and a temperature compensation factor of the bias generator 224 factor).

通訊介面216針對諸如校準等的功能促進感測器組合100與使用者之間的通訊。通訊介面216可以是諸如內部積體電路(I2C)匯流排的一介面。使用者控制的一外部微控制器可經由校準狀態接腳218及輸出接腳220而連接到感測 器組合100。在一實施例中,經由校準狀態接腳218接收至通訊介面216的輸入,且如將於下文中進一步說明的,該等輸入被傳送到狀態機226。自狀態機226接收輸出,且該等輸出根據輸出的類型而經由校準狀態接腳218或輸出接腳220傳送到該使用者微控制器。如將於下文中進一步說明的,多工器228可將被傳送到輸出接腳220的通訊介面216之輸出與比較器210之輸出多工化。 The communication interface 216 facilitates communication between the sensor assembly 100 and the user for functions such as calibration. The communication interface 216 may be an interface such as an internal integrated circuit (I2C) bus. An external microcontroller controlled by the user can be connected to the sensing via calibration status pin 218 and output pin 220 器组合100。 100 combination. In one embodiment, the input to the communication interface 216 is received via the calibration status pin 218, and as will be explained further below, these inputs are transmitted to the state machine 226. The output is received from the state machine 226, and the outputs are transmitted to the user microcontroller via the calibration state pin 218 or the output pin 220 according to the type of output. As will be described further below, the multiplexer 228 can multiplex the output of the communication interface 216 transmitted to the output pin 220 and the output of the comparator 210.

如將於下文中進一步說明的,LED驅動器222根據自狀態機226接收的輸入而驅動LED 102。在某些實施例中,LED驅動器222可在室溫下將LED 102驅動到95毫安(mA),但是在某些實施例中可使用任何適當的最大或最小電流。如將於下文中進一步說明的,可由狀態機226的輸出控制LED驅動器222。 As will be explained further below, the LED driver 222 drives the LED 102 according to input received from the state machine 226. In some embodiments, the LED driver 222 may drive the LED 102 to 95 milliamperes (mA) at room temperature, but in some embodiments any suitable maximum or minimum current may be used. As will be explained further below, the LED driver 222 can be controlled by the output of the state machine 226.

偏壓產生器224可以是根據感測器組合100的內部溫度而將一電流提供給LED驅動器222的一正比於絕對溫度(Proportional To Absolute Temperature;簡稱PTAT)偏壓產生器。被供應到LED驅動器222的電流可使LED驅動器222的輸出大小在感測器組合100的內部溫度改變時增減。此種方式可諸如補償由於溫度的改變而造成的LED 102輸出之變異。 The bias voltage generator 224 may be a Proportional To Absolute Temperature (PTAT) bias voltage generator that provides a current to the LED driver 222 according to the internal temperature of the sensor assembly 100. The current supplied to the LED driver 222 may increase or decrease the output size of the LED driver 222 when the internal temperature of the sensor combination 100 changes. Such a method may, for example, compensate for variations in the output of the LED 102 due to changes in temperature.

狀態機226於通電時自動管理感測器組合100的各零件之功能,且根據經由校準狀態接腳218接收的使用者輸入而動態地管理感測器組合100的各零件之功能。在本實施例中,狀態機226管理其中包括記憶體214、通訊介面 216、LED驅動器222、及多工器228的各元件之功能。狀態機226代表該ASIC或其他處理器執行本發明所述的校準程序時的邏輯功能。雖然並未將一處理器明確地示出為第2圖中之一硬體部分,但是應當理解:可將第2圖的該系統實施為包含輸入、輸出、及電源端的一ASIC或其他處理器。 The state machine 226 automatically manages the functions of the components of the sensor assembly 100 when powered on, and dynamically manages the functions of the components of the sensor assembly 100 according to user input received via the calibration status pin 218. In this embodiment, the state machine 226 manages the memory 214 and the communication interface. 216. Functions of each element of the LED driver 222 and the multiplexer 228. The state machine 226 represents the logic function of the ASIC or other processor when executing the calibration procedure described in the present invention. Although a processor is not explicitly shown as a hardware part in Figure 2, it should be understood that the system of Figure 2 can be implemented as an ASIC or other processor including input, output, and power supply terminals .

多工器228自過濾器212及通訊介面216接收輸入,且將該等輸入多工到輸出接腳220。狀態機226將選擇器輸入提供給多工器228,因而選擇要使該等輸入中之哪一輸入通過多工器228到輸出接腳220。通常,過濾器212的輸出將被選擇為輸出。此種方式可讓使用者讀取光二極體104的已處理輸出,以便決定是否已偵測到一目標介質。在某些實施例中,該使用者控制器可將一讀取要求傳送到狀態機226(例如,對記憶體214的校準資訊之讀取要求),在此種情形中,狀態機226將自記憶體214擷取被要求的資訊,且經由通訊介面216將該資訊傳送到多工器228,然後選擇來自該通訊介面的輸入為自該多工器到輸出接腳220的輸出。 The multiplexer 228 receives input from the filter 212 and the communication interface 216, and multiplexes the input to the output pin 220. The state machine 226 provides the selector input to the multiplexer 228, and thus selects which of these inputs to pass through the multiplexer 228 to the output pin 220. Generally, the output of the filter 212 will be selected as the output. This method allows the user to read the processed output of the photodiode 104 to determine whether a target medium has been detected. In some embodiments, the user controller may send a read request to the state machine 226 (eg, a read request for the calibration information of the memory 214). In this case, the state machine 226 will The memory 214 retrieves the requested information, and transmits the information to the multiplexer 228 via the communication interface 216, and then selects the input from the communication interface as the output from the multiplexer to the output pin 220.

現在請參閱第3圖,圖中示出根據本發明揭露的一實施例的狀態機226的操作之一狀態圖300。在感測器組合100通電之後,狀態機226立即在可讓記憶體214安定到一穩定狀態的期間中進入安定模式302。根據振盪器204的頻率,該期間可自EEPROM記憶體214的大約2.5毫秒至大約26毫秒。然而,應當理解:各實施例中可使用安定模式 302的任何適當之持續時間。在安定模式302中,校準狀態接腳218成為狀態機226的輸出,且校準狀態接腳218被設定為向該使用者微控制器指示感測器組合100係處於安定模式302的一狀態。在某些實施例中,校準狀態接腳218可為了該目的而被設定為一低二進制狀態(邏輯"0")。在容許記憶體214安定的最大可能的時間量之後,狀態機226可自記憶體214擷取該自動增益選擇,且將該自動增益選擇提供給類比前端208的該跨阻抗放大器,以便調整增益設定值。在某些實施例中,可以有任何適當數目的可能之增益設定值,且記憶體214中之2個或更多個位元可容納該自動增益選擇值。該自動增益選擇值的擷取可能耗用自10微秒至102微秒,但是於操作中,各實施例可使用任何適當量的時間。 Referring now to FIG. 3, there is shown a state diagram 300 of one of the operations of the state machine 226 according to an embodiment of the invention. Immediately after the sensor assembly 100 is powered on, the state machine 226 enters the stability mode 302 during a period that allows the memory 214 to settle to a stable state. Depending on the frequency of the oscillator 204, this period may be from about 2.5 ms to about 26 ms from the EEPROM memory 214. However, it should be understood that the stability mode may be used in various embodiments 302 any suitable duration. In the stability mode 302, the calibration state pin 218 becomes the output of the state machine 226, and the calibration state pin 218 is set to indicate to the user microcontroller that the sensor assembly 100 is in a state of the stability mode 302. In some embodiments, the calibration state pin 218 may be set to a low binary state (logic "0") for this purpose. After allowing the maximum possible amount of time for the memory 214 to settle, the state machine 226 may retrieve the automatic gain selection from the memory 214 and provide the automatic gain selection to the transimpedance amplifier of the analog front end 208 to adjust the gain setting value. In some embodiments, there may be any suitable number of possible gain settings, and two or more bits in the memory 214 may accommodate the automatic gain selection value. The acquisition of the automatic gain selection value may take from 10 microseconds to 102 microseconds, but in operation, each embodiment may use any appropriate amount of time.

在該安定期間結束且擷取了該自動增益選擇值之後,狀態可自動轉變到操作模式304。在操作模式304期間,校準狀態接腳218成為狀態機226的一輸入,且通訊介面216被啟用,而自使用者接收通訊。在某些實施例中,在操作模式304時,一內部上拉電阻器(pull-up resistor)可將校準狀態接腳218上拉到高位準(上拉到邏輯"1")。狀態機226然後自記憶體214讀取用於指示是否已發生了先前的校準之一校準旗標。 After the stabilization period ends and the automatic gain selection value is captured, the state may automatically transition to the operation mode 304. During the operation mode 304, the calibration status pin 218 becomes an input of the state machine 226, and the communication interface 216 is enabled to receive communication from the user. In some embodiments, during operation mode 304, an internal pull-up resistor can pull the calibration status pin 218 to a high level (pull to logic "1"). The state machine 226 then reads from the memory 214 a calibration flag indicating whether one of the previous calibrations has occurred.

如果該校準旗標被設定(例如,一旗標位元被設定為"真"或邏輯"1"),則狀態機226轉變到LED驅動器啟用模式306。狀態機226自記憶體214讀取一已校準LED驅動器位 準,且啟用LED驅動器222而開始傳送該已校準位準下的脈波。 If the calibration flag is set (eg, a flag bit is set to "true" or logic "1"), the state machine 226 transitions to the LED driver enable mode 306. State machine 226 reads a calibrated LED driver bit from memory 214 And enable the LED driver 222 to start transmitting the pulse wave at the calibrated level.

如果該校準旗標未被設定(例如,該旗標位元被設定為"假"或邏輯"0"),則狀態機226轉變到LED驅動器未啟用模式308。在該狀態中,LED驅動器222被停用,且狀態機226只須等候來自使用者的校準要求。 If the calibration flag is not set (eg, the flag bit is set to "false" or logic "0"), the state machine 226 transitions to the LED driver inactive mode 308. In this state, the LED driver 222 is disabled, and the state machine 226 only has to wait for a calibration request from the user.

當在LED驅動器啟用模式306或LED驅動器未啟用模式308中經由校準狀態接腳218自該使用者(例如,自該使用者控制的微控制器)接收到一校準要求時,狀態機226轉變到校準模式310。當進入校準模式310時,狀態機226使校準狀態接腳218回到被提升到高位準。此外,狀態機226指示記憶體214清除與校準有關的值(例如,LED驅動器位準、自動增益選擇值、及校準旗標),且容許記憶體214有安定的時間(例如,大約5毫秒)。 When a calibration request is received from the user (eg, from a microcontroller controlled by the user) via the calibration status pin 218 in the LED driver enabled mode 306 or the LED driver disabled mode 308, the state machine 226 transitions to Calibration mode 310. When entering the calibration mode 310, the state machine 226 returns the calibration state pin 218 back to being raised to a high level. In addition, the state machine 226 instructs the memory 214 to clear calibration-related values (eg, LED driver level, automatic gain selection value, and calibration flag), and allows the memory 214 to have a stable time (eg, approximately 5 ms) .

狀態機226指引將於下文中參照第4圖而進一步說明的該校準程序。在成功的校準之後,狀態機226指示記憶體214儲存各種校準值。例如,記憶體214可儲存由於該校準而導致的該LED驅動器位準、被用於成功的校準的該自動增益選擇值,且其可將該校準旗標設定成指示成功的校準(例如,設定為"真"或邏輯"1")。如果校準是不成功的,則狀態機226可使記憶體214保持不變。 The state machine 226 guides the calibration procedure described further below with reference to FIG. 4. After successful calibration, the state machine 226 instructs the memory 214 to store various calibration values. For example, the memory 214 may store the LED driver level due to the calibration, the automatic gain selection value used for successful calibration, and it may set the calibration flag to indicate successful calibration (eg, setting Is "true" or logical "1"). If the calibration is unsuccessful, the state machine 226 can keep the memory 214 unchanged.

在完成了校準之後,不論是否成功,狀態機226都可進入狀態模式312。校準耗用一已知的時間量。在諸如第4圖所示的方法中,校準可能耗用大約10毫秒。在經過了該 記憶體安定時間及該校準時間(總共可能耗用大約15毫秒)之後,該使用者控制器可被程式化成在一被選擇的時間窗期間尋找一校準完成信號。如果成功地完成了校準,則狀態機226可在該被選擇的時間窗期間將校準狀態接腳218驅動到低位準(例如,邏輯"0"),而向該使用者指示校準是成功的。如果校準是不成功的,則則狀態機226可在該被選擇的時間窗期間使校準狀態接腳218保持在高位準(例如,邏輯"1")。在經過了該被選擇的時間窗之後,狀態機226自動轉變回到操作模式304,直到接收到諸如另一校準要求等的進一步的使用者輸入為止。 After the calibration is completed, the state machine 226 can enter the state mode 312 whether or not it is successful. Calibration takes a known amount of time. In a method such as that shown in Figure 4, calibration may take about 10 milliseconds. After passing this After the memory settling time and the calibration time (which may take about 15 milliseconds in total), the user controller can be programmed to look for a calibration completion signal during a selected time window. If the calibration is successfully completed, the state machine 226 may drive the calibration state pin 218 to a low level (eg, logic "0") during the selected time window, and indicate to the user that the calibration was successful. If the calibration is unsuccessful, the state machine 226 may keep the calibration state pin 218 at a high level (eg, logic "1") during the selected time window. After the selected time window has passed, the state machine 226 automatically transitions back to the operating mode 304 until further user input such as another calibration request is received.

現在請參閱第4圖,圖中示出根據本發明揭露的一實施例的用於自行校準感測器組合100的一方法400之一方塊圖。為了便於說明,將參照感測器組合100被設計成偵測光二極體104上接收的光減少(例如,偵測目標介質108的透射率何時減少)之一實施例。在該實施例中,以槽106中之目標介質108的最透射部分執行校準。應當理解:也可以槽106中之目標介質108的最不透射部分執行校準。也應當理解:其他實施例可使用一類似方法偵測該光二極體上接收的光增加(例如,偵測目標介質108的透射率何時增加)。 Referring now to FIG. 4, a block diagram of a method 400 for self-calibrating the sensor assembly 100 according to an embodiment disclosed by the present invention is shown. For ease of description, the reference sensor assembly 100 is designed to detect an example of a decrease in light received on the photodiode 104 (eg, when the transmittance of the target medium 108 decreases). In this embodiment, calibration is performed with the most transmissive portion of the target medium 108 in the groove 106. It should be understood that calibration can also be performed on the least radiopaque portion of the target medium 108 in the slot 106. It should also be understood that other embodiments may use a similar method to detect an increase in light received on the photodiode (for example, to detect when the transmittance of the target medium 108 increases).

在方塊402中,諸如狀態機226等的一控制器將一參考位準供應到比較器210。如前文所述,可由使用者自一組可用參考位準預先編程該參考位準。在前文所述的一實施例中,該裝置可具有從中選擇的16個參考位準。例如,使 用者可指示狀態機226將該參考位準設定為7,且該狀態機可將一經適當增減的電壓信號供應到比較器210。 In block 402, a controller such as state machine 226 supplies a reference level to comparator 210. As mentioned above, the reference level can be pre-programmed by the user from a set of available reference levels. In an embodiment described above, the device may have 16 reference levels selected from it. For example, make The user can instruct the state machine 226 to set the reference level to 7, and the state machine can supply an appropriately increased or decreased voltage signal to the comparator 210.

在方塊404中,狀態機226將一自動增益選擇應用於類比前端208的該跨阻抗放大器。在該例子中,有為該自動增益選擇而選擇的3個可能的增益等級,且狀態機226在最低的增益選擇下開始校準。該自動增益選擇被用於調整類比前端208對光二極體104上接收的光之靈敏度。該增益越高,該前端208對來自光二極體104的輸出越靈敏。 In block 404, the state machine 226 applies an automatic gain selection to the transimpedance amplifier of the analog front end 208. In this example, there are 3 possible gain levels selected for the automatic gain selection, and the state machine 226 starts calibration with the lowest gain selection. This automatic gain selection is used to adjust the sensitivity of the analog front end 208 to the light received on the optical diode 104. The higher the gain, the more sensitive the front end 208 is to the output from the photodiode 104.

在方塊406中,狀態機226指示LED驅動器222將被供應到LED 102的電流自諸如0毫安等的一開始電流輸出逐漸增加到諸如95毫安等的一最大電流輸出。在某些實施例中,可指示LED驅動器222將電流脈波傳送到LED 102,同時在一些離散的步級中增加電流輸出,且在每一電流步級上重複該脈波一預先編程的次數。例如,可指示LED驅動器222在1000個步級或位準中將電流輸出自0毫安逐漸增加到95毫安,(因而在每一步級中將電流輸出增加95微安),且在每一電流步級上將該電流脈波傳送到LED 102五次。亦可預先編程每一脈波的寬度,且該寬度可以是諸如250奈秒。每一脈波可以有諸如150奈秒的一空檔期間,而導致每一電流步級有2微秒的期間,且逐漸增加到完成所有1000步級時有2毫秒的總期間。然而,步級的數目、電流的量、及脈波的寬度在其他實施例中可以是不同的。 In block 406, the state machine 226 instructs the LED driver 222 to gradually increase the current supplied to the LED 102 from the initial current output such as 0 mA to a maximum current output such as 95 mA. In some embodiments, the LED driver 222 may be instructed to transmit a current pulse to the LED 102, while increasing the current output in discrete steps, and repeating the pulse for a preprogrammed number of times at each current step . For example, the LED driver 222 may be instructed to gradually increase the current output from 0 mA to 95 mA in 1000 steps or levels (thus increasing the current output by 95 μA in each step), and at each step The current pulse is transmitted to the LED 102 five times in the current step. The width of each pulse can also be pre-programmed, and the width can be such as 250 nanoseconds. Each pulse can have a neutral period such as 150 nanoseconds, resulting in a period of 2 microseconds per current step, and gradually increasing to a total period of 2 milliseconds when completing all 1000 steps. However, the number of steps, the amount of current, and the width of the pulse wave may be different in other embodiments.

在決定方塊408中,狀態機226在LED驅動器222逐漸增加其供應到LED 102的電流輸出時監視過濾器212的輸出 是否有輸出狀態的改變。如前文所述,被供應到比較器210的參考位準有效地被用來作為一偵測臨界值,且過濾器212運行而過濾掉由於干擾而導致的超過該偵測臨界值的值之異常的偵測。因此,過濾器212的輸出之狀態改變指示超過類比前端208處理的光二極體104的偵測臨界值的光之一成功的偵測。如果LED驅動器222逐漸增加一直到其最大電流輸出,且沒有成功的偵測,則方法400移到決定方塊410。如果有一成功的偵測,則方法400移到方塊416。下文中將依次說明每一方塊。 In decision block 408, the state machine 226 monitors the output of the filter 212 as the LED driver 222 gradually increases its current output supplied to the LED 102 Is there any change in output status? As mentioned above, the reference level supplied to the comparator 210 is effectively used as a detection threshold, and the filter 212 operates to filter out abnormalities that exceed the detection threshold due to interference Detection. Therefore, the state change of the output of the filter 212 indicates the successful detection of one of the light exceeding the detection threshold of the photodiode 104 processed by the analog front end 208. If the LED driver 222 gradually increases up to its maximum current output without successful detection, then the method 400 moves to decision block 410. If there is a successful detection, the method 400 moves to block 416. Each block will be explained in turn below.

在決定方塊410中,狀態機226檢查自動增益選擇是否在其最大值。如果自動增益選擇不是在其最大值,則方法400移到方塊412。如果自動增益選擇已在最大值(例如,自動增益選擇是諸如3個可能位準中之位準3),則校準失敗,且方法400移到方塊414。下文中將依次說明每一方塊。 In decision block 410, the state machine 226 checks whether the automatic gain selection is at its maximum value. If the automatic gain selection is not at its maximum value, the method 400 moves to block 412. If the automatic gain selection is already at the maximum value (eg, the automatic gain selection is such as level 3 of 3 possible levels), the calibration fails, and the method 400 moves to block 414. Each block will be explained in turn below.

在方塊412中,狀態機226增加類比前端208的該跨阻抗放大器之自動增益選擇,以便增加類比前端208的靈敏度。例如,如果自動增益選擇被設定為1,則狀態機226將其增加到2。方法400然後回到方塊406,且在被供應到類比前端208的該新的自動增益選擇下再度逐漸增加LED驅動器222的電流。 In block 412, the state machine 226 increases the automatic gain selection of the transimpedance amplifier of the analog front end 208 in order to increase the sensitivity of the analog front end 208. For example, if the automatic gain selection is set to 1, the state machine 226 increases it to 2. The method 400 then returns to block 406 and gradually increases the current of the LED driver 222 again under the new automatic gain selection supplied to the analog front end 208.

回到決定方塊410,如果自動增益選擇是在其最大值,則該方法移到方塊414。 Returning to decision block 410, if the automatic gain selection is at its maximum value, the method moves to block 414.

在方塊414中,狀態機226使該系統回到前文中參照第 3圖所述的正常操作模式304,且等候諸如另一校準要求等的進一步的使用者輸入。 In block 414, the state machine 226 returns the system to the previous section The normal operating mode 304 described in FIG. 3 and awaiting further user input such as another calibration request.

回到決定方塊408,如果有一成功的偵測,則方法400移到方塊416。 Returning to decision block 408, if there is a successful detection, the method 400 moves to block 416.

在方塊416中,狀態機226輸出一校準成功信號。 In block 416, the state machine 226 outputs a calibration success signal.

在方塊418中,在成功的偵測後,狀態機226立即將該比較器上的參考位準減少一預先編程的量(或者在諸如以槽106中之目標介質108的最不透射部分執行校準時,增加參考位準),而產生一調整後的校準參考位準,且相應地在該調整後的校準參考位準中納入一偵測緩衝量。在某些實施例中,可由使用者在校準之前供應該預先編程的量可以是參考位準的總量之大約10%到25%。例如,使用者在成功的偵測之後可立即指示該狀態機將參考位準減少總共16個參考位準中之參考位準2。該調整後的校準參考位準減少該偵測臨界值,而產生一偵測緩衝量。如將於下文中參照第5A及5B圖說明的,減少該偵測臨界值時引進了對抗由於諸如內部溫度改變、目標介質108通過槽106的路徑改變、光學組件表面的灰塵累積等的該系統中之變化而導致的錯誤偵測之強韌性。 In block 418, after a successful detection, the state machine 226 immediately reduces the reference level on the comparator by a pre-programmed amount (or performs a calibration such as in the least radiopaque portion of the target medium 108 in the slot 106 On time, increase the reference level) to generate an adjusted calibration reference level, and accordingly incorporate a detection buffer into the adjusted calibration reference level. In some embodiments, the pre-programmed amount that can be supplied by the user before calibration may be about 10% to 25% of the total amount of reference levels. For example, after a successful detection, the user can immediately instruct the state machine to reduce the reference level to reference level 2 of a total of 16 reference levels. The adjusted calibration reference level reduces the detection threshold and generates a detection buffer. As will be described below with reference to FIGS. 5A and 5B, the system is introduced to reduce the detection threshold due to changes such as changes in internal temperature, changes in the path of the target medium 108 through the groove 106, accumulation of dust on the surface of optical components, etc. The strength of false detection caused by changes in the system.

在方塊420中,狀態機226將起因於成功的校準之值儲存到記憶體214,以供未來於感測器組合100通電時使用。被儲存的值可包括諸如成功的偵測發生時的LED驅動器位準(例如,1000個可能的功率位準/步級中之位準/步級650)、成功的偵測發生時的自動增益選擇(例如,3個可能 的自動增益選擇位準中之2個)、調整後的校準參考位準(例如,16個可能的參考位準中之參考位準7)、以及用於指示已成功地校準了該系統的一"真"旗標。 At block 420, the state machine 226 stores the value resulting from the successful calibration in the memory 214 for future use when the sensor assembly 100 is powered on. The stored values may include, for example, the LED driver level when a successful detection occurs (eg, 1000 possible power levels/steps among steps/step 650), automatic gain when a successful detection occurs Choice (for example, 3 possible 2 of the automatic gain selection levels), the adjusted calibration reference level (for example, reference level 7 of the 16 possible reference levels), and one used to indicate that the system has been successfully calibrated "True" flag.

在一實施例中,自1000個可能的電流位準中選擇該LED驅動器位準,且使用記憶體214的10位元儲存;可自3個可能的等級中選擇該自動增益選擇,且需要2位元以供儲存;自16個可能的位準中選擇該調整後的校準參考位準,且需要5位元以供儲存;以及自兩個可能的值中選擇該校準旗標,且需要1位元以供儲存。在成功的校準且將校準值儲存在記憶體214之後,方法400可移到前文所述之方塊414,而恢復正常操作模式304。 In one embodiment, the LED driver level is selected from 1000 possible current levels, and 10-bit storage of memory 214 is used; the automatic gain selection can be selected from 3 possible levels, and 2 Bits for storage; select the adjusted calibration reference level from 16 possible levels and require 5 bits for storage; and select the calibration flag from two possible values and require 1 Bits for storage. After successful calibration and storing the calibration values in the memory 214, the method 400 may move to the aforementioned block 414, and the normal operating mode 304 is restored.

現在請參閱第5A圖,圖中示出係為被驅動到LED 102的功率的百分率之光二極體104上接收的功率之一圖形500。在該例子中,在槽106中有較透射的第二部分114之情形下以第4圖所示的方法自行校準已導致無調整的校準偵測臨界值502集合,因而當目標介質108的第二部分114是在LED 102與光二極體104之間時,光二極體104上接收到被驅動到LED 102的功率之85%。偶然地,當目標介質108的第一部分112是在LED 102與光二極體104之間時,光二極體104上接收到被驅動到LED 102的功率之65%。因此,如果該偵測臨界值被設定為最小偵測臨界值504時,當目標介質108的第一部分112或第二部分114是在LED 102與光二極體104之間時,感測器組合100都將記錄一成功的偵測,這是一不可取的結果。因此,方法400的方塊416之 調整後的校準參考位準應保持高到足以將一偵測臨界值保持在高於最小偵測臨界值504。 Referring now to FIG. 5A, there is shown a graph 500 of the power received on the light diode 104 as a percentage of the power driven to the LED 102. In this example, self-calibration with the method shown in FIG. 4 in the case where there is a more transmissive second portion 114 in the slot 106 has resulted in a set of calibration detection thresholds 502 without adjustment, so when the target medium 108 The second portion 114 is between the LED 102 and the photodiode 104, and the photodiode 104 receives 85% of the power driven to the LED 102. Occasionally, when the first portion 112 of the target medium 108 is between the LED 102 and the photodiode 104, 65% of the power driven to the LED 102 is received on the photodiode 104. Therefore, if the detection threshold is set to the minimum detection threshold 504, when the first portion 112 or the second portion 114 of the target medium 108 is between the LED 102 and the photodiode 104, the sensor combination 100 Both will record a successful detection, which is an undesirable result. Therefore, block 416 of method 400 The adjusted calibration reference level should be kept high enough to maintain a detection threshold above the minimum detection threshold 504.

現在請參閱第5B圖,圖中示出在灰塵累積在LED 102的透鏡之後係為被驅動到LED 102的功率的百分率之光二極體104上接收的功率之一圖形506。在該例子中,透鏡上的雜物使LED 102輸出比在相同驅動電流下而透鏡上沒有灰塵時的操作少10%的功率。因此,光二極體104上接收的功率也減少大約10%。因此,如果該校準參考位準未被調整(亦即,保持在偵測臨界值502),則感測器組合100將無法偵測到目標介質108的第二部分114之出現,這是因為光二極體104上接收的功率將不會超過偵測臨界值502。 Referring now to FIG. 5B, there is shown a graph 506 of the power received on the light diode 104 as a percentage of the power driven to the LED 102 after dust has accumulated in the lens of the LED 102. In this example, the debris on the lens causes the LED 102 to output 10% less power than the operation at the same drive current without dust on the lens. Therefore, the power received on the optical diode 104 is also reduced by about 10%. Therefore, if the calibration reference level is not adjusted (ie, remains at the detection threshold 502), the sensor combination 100 will not be able to detect the presence of the second portion 114 of the target medium 108, because the light two The power received on the pole body 104 will not exceed the detection threshold 502.

該參考位準可被降低到使該偵測臨界值被設定為偵測臨界值508,在此種情形中,感測器組合100將能夠成功地偵測到目標介質108的第二部分114,且同時能夠區別目標介質108的第一部分112。然而,因為該偵測臨界值508將低於最小偵測臨界值504,所以如果自LED 102的透鏡去除了雜物,則將導致第一部分112的不可取的偵測(亦即,當感測器組合100認為其正在偵測第二部分114時,將偵測到第一部分112)。 The reference level can be lowered so that the detection threshold is set to the detection threshold 508. In this case, the sensor combination 100 will be able to successfully detect the second portion 114 of the target medium 108, At the same time, the first portion 112 of the target medium 108 can be distinguished. However, because the detection threshold 508 will be lower than the minimum detection threshold 504, if debris is removed from the lens of the LED 102, it will cause undesirable detection of the first part 112 (ie, when sensing When the combination 100 considers that it is detecting the second part 114, it will detect the first part 112).

或者,該參考位準可被降低到使該偵測臨界值被設定為調整後的校準偵測臨界值510,在此種情形中,感測器組合100將能夠成功地偵測到目標介質108的第二部分114,且不論LED 102的透鏡上是否累積灰塵,都同時能夠區別目標介質108的第一部分112。換言之,在LED 102的 透鏡的一模糊範圍下,當目標介質108的第二部分114出現在LED 102與光二極體104之間時,感測器組合100將記錄在使用校準偵測臨界值510的成功的偵測,且不論透鏡是否模糊,當目標介質108的第一部分112出現在LED 102與光二極體104之間時,感測器組合100將不記錄在使用校準偵測臨界值510的成功的偵測。 Alternatively, the reference level can be lowered to set the detection threshold to the adjusted calibration detection threshold 510. In this case, the sensor combination 100 will be able to successfully detect the target medium 108 The second portion 114 of the LED, and regardless of whether dust accumulates on the lens of the LED 102, can also distinguish the first portion 112 of the target medium 108 at the same time. In other words, the LED 102 Under a blur range of the lens, when the second portion 114 of the target medium 108 appears between the LED 102 and the photodiode 104, the sensor combination 100 will record the successful detection using the calibration detection threshold 510, Regardless of whether the lens is blurred or not, when the first portion 112 of the target medium 108 appears between the LED 102 and the photodiode 104, the sensor combination 100 will not record successful detection using the calibration detection threshold 510.

因此,使用者可測試目標介質108的透射率,以便決定第一部分112與第二部分114之間的差異,且可將所得到的資訊用於選擇將被應用於方法400的方塊416的參考位準之減少量,以便得到一適當的調整後的校準參考位準。例如,如第5A及5B圖所示,如果在第一部分112是在LED 102與光二極體104之間時,光二極體104上偵測到的光的量比第二部分114是在LED 102與光二極體104之間時減少了20%,則將該參考位準減少超過20%時,將導致如前文中參照第5B圖所述,不論目標介質108的哪一部分是在LED 102與光二極體104之間,光二極體104上偵測到的光總是超過該偵測位準。 Therefore, the user can test the transmittance of the target medium 108 in order to determine the difference between the first portion 112 and the second portion 114, and the obtained information can be used to select the reference position to be applied to the block 416 of the method 400 The amount of reduction in the standard, so as to obtain an appropriate adjusted calibration reference level. For example, as shown in FIGS. 5A and 5B, if the first portion 112 is between the LED 102 and the photodiode 104, the amount of light detected on the photodiode 104 is greater than the second portion 114 is on the LED 102 When it is reduced by 20% between the photodiode 104 and the reference level is reduced by more than 20%, it will result in the above-mentioned reference to FIG. 5B, no matter which part of the target medium 108 is between the LED 102 and the photodiode. Between the polar bodies 104, the light detected on the photodiode 104 always exceeds the detection level.

應當理解:在某些實施例中,目標介質108的第一部分112可能比目標介質108的第二部分114更透明或更有反射性,且可能因而要顛倒用於偵測目標介質108的所需部分之條件。感測器組合100可被設計成或校準成偵測不透明度(opacity)的減少(亦即,透射率或透明度的增加)。例如,當光二極體104上接收的光增加到高於一偵測臨界值時,感測器組合100可指示一成功的偵測。 It should be understood that in some embodiments, the first portion 112 of the target medium 108 may be more transparent or reflective than the second portion 114 of the target medium 108, and may therefore need to be reversed for detecting the target medium 108 Part of the conditions. The sensor combination 100 can be designed or calibrated to detect a decrease in opacity (ie, an increase in transmittance or transparency). For example, when the light received on the photodiode 104 increases above a detection threshold, the sensor combination 100 may indicate a successful detection.

本發明揭露的各實施例可包括勝過先前解決方案的優點。常見的光學感測器組合被須在製造之後被篩選,這是因為在製造中有太多變化的組合無法被用於靈敏的應用。通過篩選的光學感測器組合必須仍然被以人工方式校準,以供用於特定的環境。相比之下,可易於校準本申請案的光學感測器組合,而應對製造中及使用環境中之變化。 The disclosed embodiments of the invention may include advantages over previous solutions. Common optical sensor combinations must be screened after manufacturing, because combinations that change too much during manufacturing cannot be used for sensitive applications. The combination of optical sensors that pass the screening must still be manually calibrated for use in a specific environment. In contrast, the optical sensor combination of the present application can be easily calibrated to deal with changes in manufacturing and usage environments.

可使用各種不同的技術及技巧中之任一種技術及技巧表現資訊及信號。例如,可以電壓、電流、電磁波、磁場或磁粒子、光場(Optical field)或光粒子、或以上各項的任何組合表現可能在前文說明中提到的資料、指令、命令、資訊、信號、位元、符號、及分段(chip)。 Information and signals can be expressed using any of various techniques and techniques. For example, data, instructions, commands, information, signals, which may be mentioned in the previous description, can be represented by voltages, currents, electromagnetic waves, magnetic fields or magnetic particles, optical fields or optical particles, or any combination of the above Bits, symbols, and chips.

可以一般用途處理器、數位信號處理器(DSP)、特定應用積體電路(ASIC)、現場可程式閘陣列(FPGA)或其他可程式邏輯裝置、離散閘或電晶體邏輯、離散硬體組件、或被設計成執行本發明所述之功能的以上各項的任何組合實施或執行以與本發明的揭露有關的方式說明之該等各例示方塊及模組。一般用途處理器可以是微處理器,但是在替代實施例中,該處理器可以是任何常見的處理器、控制器、微控制器、或狀態機。亦可將一處理器實施為一些計算裝置的一組合(例如,一DSP及一微處理器的一組合、多個微處理器的一組合、與一DSP核心協力的一或多個微處理器的一組合、或任何其他此種組態)。 It can be general purpose processor, digital signal processor (DSP), application specific integrated circuit (ASIC), field programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, Or any combination of the above items designed or designed to perform the functions described in the present invention is implemented or executed in a manner related to the disclosure of the present invention. A general-purpose processor may be a microprocessor, but in alternative embodiments, the processor may be any common processor, controller, microcontroller, or state machine. A processor may also be implemented as a combination of computing devices (eg, a combination of a DSP and a microprocessor, a combination of multiple microprocessors, one or more microprocessors in conjunction with a DSP core A combination of, or any other such configuration).

100‧‧‧光學感測器組合 100‧‧‧Optical sensor combination

102‧‧‧發光二極體 102‧‧‧ LED

104‧‧‧光二極體 104‧‧‧ Photodiode

106‧‧‧槽 106‧‧‧slot

108‧‧‧目標介質 108‧‧‧Target medium

112‧‧‧第一部分 112‧‧‧Part 1

114‧‧‧第二部分 114‧‧‧Part Two

Claims (18)

一種使用光學偵測器系統的控制器實施的校準方法,該方法包含:藉由增加信號產生器之功率位準,使在光學偵測器偵測到的功率超過初始偵測臨界值;在該光學偵測器超過該初始偵測臨界值之後,將該偵測器之第一功率位準的指示儲存在記憶體中,該第一功率位準對應於超過該初始偵測臨界值的該偵測到的功率;藉由施加來自於該記憶體的偵測緩衝量至該初始偵測臨界值,調整該初始偵測臨界值成為調整後的偵測臨界值;以及將該調整後的偵測臨界值儲存在該記憶體中。 A calibration method implemented by a controller using an optical detector system. The method includes: increasing the power level of the signal generator so that the power detected by the optical detector exceeds the initial detection threshold; After the optical detector exceeds the initial detection threshold, an indication of the first power level of the detector is stored in memory, the first power level corresponding to the detection exceeding the initial detection threshold The measured power; by applying the detection buffer from the memory to the initial detection threshold, adjusting the initial detection threshold to become the adjusted detection threshold; and the adjusted detection The threshold value is stored in the memory. 如申請專利範圍第1項的方法,其中該光學偵測器包含光偵測器,且該信號產生器包含發光二極體(LED)。 A method as claimed in item 1 of the patent application, wherein the optical detector includes a photodetector and the signal generator includes a light emitting diode (LED). 如申請專利範圍第1項的方法,其中:調整該初始偵測臨界值包含:減少該偵測臨界值。 For example, the method of claim 1, wherein: adjusting the initial detection threshold value includes: reducing the detection threshold value. 如申請專利範圍第1項的方法,其中:調整該偵測臨界值包含:增加該偵測臨界值。 For example, the method of claim 1, wherein: adjusting the detection threshold value includes: increasing the detection threshold value. 如申請專利範圍第1項的方法,進一步包含:在增加 該信號產生器之該功率位準之前,將目標介質放置在該信號產生器與該偵測器之間的通訊路徑中。 If the method of applying for item 1 of the patent scope further includes: Before the power level of the signal generator, the target medium is placed in the communication path between the signal generator and the detector. 如申請專利範圍第1項的方法,進一步包含:接收指示該控制器開始逐漸增加該信號產生器的該功率位準的校準信號。 The method of claim 1 of the patent scope further includes: receiving a calibration signal instructing the controller to gradually increase the power level of the signal generator. 如申請專利範圍第1項的方法,進一步包含:在儲存該第一功率位準的該指示及該調整後的偵測臨界值之後,在該記憶體中設定校準旗標。 The method of claim 1 of the patent scope further includes: setting the calibration flag in the memory after storing the indication of the first power level and the adjusted detection threshold. 一種光學偵測器系統,包含:光子產生裝置,用於產生光子;光子偵測裝置,用於偵測光子;以及校準裝置,用於校準該光學偵測器系統,該校準該光學偵測器系統包含:藉由增加該光子產生裝置之功率位準,使在該光子偵測裝置偵測到的功率超過初始偵測臨界值;將該光子產生裝置之第一功率位準的指示儲存在記憶體中,該第一功率位準對應於超過該初始偵測臨界值的該偵測到的功率;藉由施加偵測緩衝量至該初始偵測臨界值,調整該初始偵測臨界值成為調整後的偵測臨界值;以及將該調整後的偵測臨界值儲存在該記憶體中。 An optical detector system includes: a photon generation device for generating photons; a photon detection device for detecting photons; and a calibration device for calibrating the optical detector system, which calibrates the optical detector The system includes: by increasing the power level of the photon generating device, the power detected by the photon detecting device exceeds the initial detection threshold; storing the indication of the first power level of the photon generating device in memory In the body, the first power level corresponds to the detected power exceeding the initial detection threshold; by applying a detection buffer to the initial detection threshold, adjusting the initial detection threshold becomes an adjustment The detected threshold value; and the adjusted detection threshold value is stored in the memory. 如申請專利範圍第8項之光學偵測器系統,其中該光 子產生裝置包含發光二極體(LED)。 For example, the optical detector system in the 8th scope of patent application, in which the light The sub-generating device includes a light emitting diode (LED). 如申請專利範圍第8項之光學偵測器系統,其中該光子偵測裝置包含光電二極體。 For example, the optical detector system of claim 8 of the patent application, wherein the photon detection device includes a photodiode. 如申請專利範圍第8項之光學偵測器系統,該光學偵測器系統被配置成用以偵測在該光子產生裝置與該光子偵測裝置之間的通訊路徑中的目標介質之反射率。 Such as the optical detector system of claim 8 of the patent scope, the optical detector system is configured to detect the reflectance of the target medium in the communication path between the photon generating device and the photon detecting device . 如申請專利範圍第8項之光學偵測器系統,該光學偵測器系統被配置成用以偵測在該光子產生裝置與該光子偵測裝置之間的通訊路徑中的目標介質之透射率。 As in the optical detector system of claim 8, the optical detector system is configured to detect the transmittance of the target medium in the communication path between the photon generating device and the photon detecting device . 一種計算裝置,包含:容納非暫態機器可讀取的媒體之記憶體,該非暫態機器可讀取的媒體包含機器可執行碼,該機器可執行碼具有被儲存於其中的用於執行校準光學偵測器系統的方法之指令;被耦合到該記憶體的處理器,該處理器被配置成執行該機器可執行碼,用於使該處理器執行下列操作:逐漸增加信號產生器的輸出;偵測於逐漸增加該輸出期間在光學感測器接收到的功率已超過初始偵測臨界值;將該信號產生器之第一位準的指示儲存在該記憶體 中,該第一位準對應於超過該初始偵測臨界值的該接收到的功率;藉由施加補償緩衝量至該初始偵測臨界值,產生調整後的偵測臨界值;以及將該調整後的偵測臨界值儲存在該記憶體中。 A computing device includes: a memory containing a non-transitory machine-readable medium, the non-transitory machine-readable medium includes machine-executable code having stored therein for performing calibration Instructions for the method of the optical detector system; a processor coupled to the memory, the processor configured to execute the machine executable code for causing the processor to perform the following operations: gradually increase the output of the signal generator Detect that the power received by the optical sensor during the gradual increase of the output has exceeded the initial detection threshold; store the indication of the first level of the signal generator in the memory In this, the first level corresponds to the received power exceeding the initial detection threshold; by applying a compensation buffer to the initial detection threshold, an adjusted detection threshold is generated; and the adjustment The later detection threshold is stored in the memory. 如申請專利範圍第13項的計算裝置,該處理器被進一步配置成執行該機器可執行碼,用於使該處理器執行下列操作:接收來自使用者的包括係為複數個離散位準中之一位準的偵測臨界值設定信號;接收來自該使用者的用於指示該處理器開始逐漸增加該信號產生器的該輸出的校準信號;以及接收來自該使用者的包括該補償緩衝量的臨界值改變信號。 As in the computing device of claim 13, the processor is further configured to execute the machine-executable code for causing the processor to perform the following operations: receiving from the user includes one of a plurality of discrete levels A level of detection threshold setting signal; receiving a calibration signal from the user instructing the processor to gradually increase the output of the signal generator; and receiving a signal from the user including the compensation buffer Threshold change signal. 如申請專利範圍第13項的計算裝置,該處理器被進一步配置成執行該機器可執行碼,用於使該處理器執行下列操作:在逐漸增加該輸出之前,在該光學感測器的類比前端放大器上設定增益;回應判定在逐漸增加該信號產生器的該輸出到最大輸出位準之後尚未超過該初始偵測臨界值,增加在該類比前端放大器的該增益;以及 增加該信號產生器的該輸出位準,以使在該光學感測器的被偵測到的該功率超過該初始偵測臨界值。 As in the computing device of claim 13, the processor is further configured to execute the machine-executable code for causing the processor to perform the following operations: before gradually increasing the output, the analogy of the optical sensor Set the gain on the front-end amplifier; in response to determining that the output of the signal generator is gradually increased to the maximum output level before the initial detection threshold has been exceeded, increase the gain on the analog front-end amplifier; and The output level of the signal generator is increased so that the detected power at the optical sensor exceeds the initial detection threshold. 如申請專利範圍第13項的計算裝置,其中該機器可執行碼用以施加該補償緩衝量,使該初始偵測臨界值被減少。 A computing device as claimed in item 13 of the patent application, wherein the machine executable code is used to apply the compensation buffer amount, so that the initial detection threshold is reduced. 如申請專利範圍第13項的計算裝置,其中該機器可執行碼用以施加該補償緩衝量,使該初始偵測臨界值被增加。 A computing device as claimed in item 13 of the patent application, wherein the machine executable code is used to apply the compensation buffer amount so that the initial detection threshold is increased. 如申請專利範圍第13項的計算裝置,其中該光學偵測器包含光偵測器,且該信號產生器包含發光二極體(LED)。 A computing device as claimed in item 13 of the patent application, wherein the optical detector includes a photodetector, and the signal generator includes a light emitting diode (LED).
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070188337A1 (en) * 2004-07-09 2007-08-16 Tyco Safety Products Canada Ltd. Smoke detector calibration
US20100085199A1 (en) * 2008-10-03 2010-04-08 Universal Security Instruments, Inc. Dynamic Alarm Sensitivity Adjustment and Auto-Calibrating Smoke Detection

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