[go: up one dir, main page]

TWI690026B - Method of using simulation software to generate circuit layout - Google Patents

Method of using simulation software to generate circuit layout Download PDF

Info

Publication number
TWI690026B
TWI690026B TW108113998A TW108113998A TWI690026B TW I690026 B TWI690026 B TW I690026B TW 108113998 A TW108113998 A TW 108113998A TW 108113998 A TW108113998 A TW 108113998A TW I690026 B TWI690026 B TW I690026B
Authority
TW
Taiwan
Prior art keywords
blocks
reserved space
size
space
circuit layout
Prior art date
Application number
TW108113998A
Other languages
Chinese (zh)
Other versions
TW202040753A (en
Inventor
劉建成
劉時誌
張雲智
高淑怡
Original Assignee
瑞昱半導體股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 瑞昱半導體股份有限公司 filed Critical 瑞昱半導體股份有限公司
Priority to TW108113998A priority Critical patent/TWI690026B/en
Priority to US16/667,925 priority patent/US10860758B2/en
Application granted granted Critical
Publication of TWI690026B publication Critical patent/TWI690026B/en
Publication of TW202040753A publication Critical patent/TW202040753A/en

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/392Floor-planning or layout, e.g. partitioning or placement
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/32Circuit design at the digital level
    • G06F30/33Design verification, e.g. functional simulation or model checking
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/398Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Architecture (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

A method of using simulation software to generate circuit layout includes: (A). determining a plurality of blocks on a circuit board, wherein each block within the blocks includes: operating space and preserved space; (B). determining the size of the preserved space of the blocks according to at least one specific condition; (C). Determining whether the size of the preserved space of the blocks should be adjusted according to at least one determining condition; and (D). When it is determined in Step (C) that the preserved space of the blocks should not be adjusted, generating the circuit layout according to the size of the preserved space of the blocks.

Description

使用模擬軟體產生電路佈局的方法 Method for generating circuit layout using simulation software

本案涉及電源完整性(power integrity,PI)的應用,尤其涉及一種能夠妥善決定電路佈局的方法,以改善電路無法正常運作的問題。 This case relates to the application of power integrity (PI), in particular to a method that can properly determine the circuit layout to improve the problem that the circuit cannot operate normally.

電路佈局,諸如印刷電路板佈局(PCB layout),考量到電壓衰退(又稱IR Drop)的問題,元件之間通常會預留空間來擺放電容(此操作又稱DCAP),作為電路工作異常的解決方案。上述電壓衰退又分靜態電壓衰退以及動態電壓衰退,其中靜態電壓衰退主要跟電源網路的結構和連線細節有關,因此靜態電壓衰退主要考慮電阻效應,分析電阻的影響即可。動態電壓衰退是電源在電路開關切換的時候電流波動引起的電壓壓降。這種現象產生在時脈的觸發沿,往往在短時間內在整個晶片上產生很大的電流,這個瞬間的大電流引起了電壓衰退現象。同時開關的電晶體數量越多,越容易觸發動態電壓衰退現象。 Circuit layout, such as printed circuit board layout (PCB layout), considering the problem of voltage decay (also known as IR Drop), space is usually reserved between components to place capacitors (this operation is also called DCAP), as the circuit works abnormally s solution. The above-mentioned voltage decay is divided into static voltage decay and dynamic voltage decay. The static voltage decay is mainly related to the structure and connection details of the power supply network. Therefore, the static voltage decay mainly considers the resistance effect and analyzes the influence of the resistance. Dynamic voltage decay is the voltage drop caused by current fluctuations when the power supply is switched. This phenomenon occurs at the triggering edge of the clock, and often generates a large current on the entire wafer in a short time. This momentary large current causes a voltage decay phenomenon. At the same time, the greater the number of transistors on the switch, the easier it is to trigger dynamic voltage decay.

然而,先前技術缺乏一種妥善的機制來決定元件之間究竟要預留多少空間來擺放電容,舉例來說,現有機制並未考慮到電路的雙態觸變率(toggle rate),只單純地從現有的空間內儘可能找出挪出可供擺放電容的空間。請參見第1圖,第1圖係為習知技術預留DCAP空間的電路佈局示意圖,由於習知的方法屬 於隨機的預留空間或是根據經驗來猜測,這樣對於減少電壓衰退而言很沒有效率。比方說,如果有些區域已經被擺放得很滿(空間使用度很高),便沒有足夠空間來擺放電容值較高的DCAP(電容的電容值大小與體積成正比)來抑制動態電壓衰退,而偏偏這樣的元件擺放密度較高的區域的雙態觸變率通常較高,例如一些靠近處理晶片(CPU)、顯示晶片(GPU)以及記憶體(DDR)的熱點(hotspot)區域(如圖中所圈選的位置)。相對地,在元件擺放密度不高的空曠區域則有非常充裕的空間擺放DCAP,但這樣的區域通常雙態觸變率不會很高。 However, the prior art lacks a proper mechanism to determine how much space should be reserved between the components for placing capacitors. For example, the existing mechanism does not take into account the toggle rate of the circuit, and simply From the existing space, try to find as much space as possible for capacitors. Please refer to Figure 1. Figure 1 is a schematic diagram of the circuit layout that reserves DCAP space for the conventional technology. To reserve space at random or guess based on experience, this is very inefficient for reducing voltage decay. For example, if some areas have been placed very full (space utilization is high), there is not enough space to place a DCAP with a higher capacitance (capacitance of the capacitor is proportional to the volume) to suppress dynamic voltage degradation However, the dual-state thixotropy rate is usually higher in areas where the density of such devices is higher, such as some hotspot areas near the processing chip (CPU), display chip (GPU) and memory (DDR) ( (Circled in the picture). In contrast, in the open area where the component placement density is not high, there is plenty of room for DCAP, but such an area usually has a low two-state thixotropic rate.

綜上所述,先前技術對於電壓衰減防治的電路佈局效率上非常差,如此一來也造成效能下降以及成本大幅提昇。 In summary, the prior art is very poor in the circuit layout efficiency of the voltage attenuation prevention, which also causes a decrease in performance and a substantial increase in cost.

有鑑於傳統的電路設計方法並沒有考慮雙態觸變率(toggle rate)對電路規劃的影響,本發明提出一種基於雙態觸變率的程度來決定預留DCAP空間的方法,並且透過軟體來分析資訊,以妥善地決定DCAP空間的方案,以達到降低動態電壓的目的,並且實現電路配置的最佳化。 In view of the fact that the traditional circuit design method does not consider the influence of toggle rate on circuit planning, the present invention proposes a method for determining the reserved DCAP space based on the degree of toggle rate, and through software Analyze the information to properly determine the DCAP space plan to achieve the goal of reducing the dynamic voltage and optimizing the circuit configuration.

本發明的一實施例提供了一種使用模擬軟體產生電路佈局的方法,包含以下步驟:(A).在一電路板上規劃出複數個區塊,其中該些區塊中每一區塊包含:一操作空間以及一預留空間;(B).根據至少一特定條件來決定該些區塊中預留空間的大小;(C).根據至少一判斷條件來決定是否調整步驟(B)中所決定出的該些區塊中預留空間的大小;以及(D).當步驟(C)判斷不需要調整時,根據步驟(B)中所決定出的該些區塊中預留空間的大小來產生該電路佈局。 An embodiment of the present invention provides a method for generating a circuit layout using simulation software, including the following steps: (A). Planning a plurality of blocks on a circuit board, wherein each of the blocks includes: An operation space and a reserved space; (B). Determine the size of the reserved space in the blocks according to at least one specific condition; (C). Decide whether to adjust the step (B) according to at least one judgment condition The size of the reserved space in the blocks determined; and (D). When it is determined in step (C) that no adjustment is required, the size of the reserved space in the blocks determined in step (B) To generate the circuit layout.

202~212、502~508:步驟 202~212, 502~508: steps

FFG1~FFG8:區塊群組 FFG1~FFG8: block group

Cell(n)~Cell(n-31):區塊 Cell(n)~Cell(n-31): block

DCAP2~DCAP16:預留的電容擺放空間 DCAP2~DCAP16: reserved capacitor placement space

第1圖係為習知技術預留DCAP空間的電路佈局示意圖。 Figure 1 is a schematic diagram of a circuit layout that reserves DCAP space for conventional technology.

第2圖係為本發明產生電路佈局的方塊圖。 Figure 2 is a block diagram of the circuit layout generated by the present invention.

第3圖係按照區塊的雙態觸變率大小而產生的區塊分類表。 Figure 3 is a block classification table generated according to the size of the two-state thixotropic rate of the block.

第4圖係為使用第2圖所示的架構所得到的電路佈局的示意圖。 Figure 4 is a schematic diagram of a circuit layout obtained using the architecture shown in Figure 2.

第5圖係為根據本發明的一實施例的使用模擬軟體產生電路佈局的方法。 FIG. 5 is a method for generating a circuit layout using simulation software according to an embodiment of the present invention.

請參考第2圖,第2圖係為本發明產生電路佈局的方塊圖,首先,於步驟202中提供電路板上每個區域的雙態觸變率數據(可彙整為雙態觸變率的資料表)。步驟204係根據蒐集到的雙態觸變率數據以及網表(netlist)的資訊來產生初步的區塊配置方案,此時,電路板上會規劃出複數個區塊,其中該些區塊中每一區塊包含用於設置元件的操作空間以及DCAP預留空間,透過雙態觸變率資料表可獲得每一個區塊的存取率。 Please refer to FIG. 2, which is a block diagram of the circuit layout generated by the present invention. First, in step 202, the bi-state thixotropy data of each area on the circuit board is provided (which can be aggregated into the bi-state thixotropic data) Data sheet). Step 204 is to generate a preliminary block allocation scheme based on the collected two-state thixotropy data and netlist information. At this time, a plurality of blocks are planned on the circuit board, among which Each block contains the operation space for setting components and the DCAP reserved space. The access rate of each block can be obtained through the bi-state thixotropic rate data table.

關於步驟204,請參見第3圖,第3圖係按照區塊的雙態觸變率大小而產生的區塊分類表,其中被歸類到區塊群組FFG1的區塊cell(n)、cell(n-1)、cell(n-2)、cell(n-3)具有最高的雙態觸變率,因此被設定為DCAP16(“DCAP”所搭配到的數字越大,便會預留更大的空間供擺放電容)。舉例來說,設定為DCAP8的區塊所分配到的電容預留空間會小於設定為DCAP16的區塊所分配到的電容預留空間,而設定為DCAP4的區塊所分配到的電容預留空間會小於設定為DCAP8的區塊所分配到的電容預留空間,以此類推。請注意,雖然在本發明的舉例中係以電容來作為電壓衰退的解決方案,但本發明並不以此為限,只要能 達到相同效果,電容亦可用別的被動元件來取代。 For step 204, please refer to FIG. 3, which is a block classification table generated according to the size of the two-state thixotropic rate of the block, which is classified into the block cell(n) of the block group FFG1, cell(n-1), cell(n-2), cell(n-3) have the highest two-state thixotropic rate, so it is set to DCAP16 (the larger the number matched with "DCAP", the reserved More space for capacitors). For example, the capacity reserved space allocated to the block set to DCAP8 will be smaller than the capacity reserved space allocated to the block set to DCAP16, and the capacity reserved space allocated to the block set to DCAP4 It will be less than the reserved space of the capacitor allocated to the block set to DCAP8, and so on. Please note that although the example of the present invention uses a capacitor as a solution for voltage decay, the present invention is not limited to this, as long as it can To achieve the same effect, the capacitor can also be replaced with other passive components.

第3圖中間的虛線表示當前的分組只用到FFG1~FFG4四個區塊群組,當需要進行更細的分組時,虛線可作下拉。舉例來說,當虛線下移一列時,區塊的分組即變成了5組。考量到不使預留空間的總面積佔全部區塊的例太高,分組要分到多細(亦即紅線要下拉的幅度)必須有所折衷(Trade off)。請注意,步驟206可進一步透過軟體功能(諸如sdc和floorplan)來優化元件的擺放,以產生候選電路佈局。 The dotted line in the middle of Figure 3 indicates that the current grouping only uses the four block groups FFG1~FFG4. When finer grouping is required, the dotted line can be used as a pull-down. For example, when the dotted line moves down one column, the grouping of blocks becomes 5 groups. Considering that the total area of the reserved space does not account for too much of the entire block, how small the grouping should be divided (that is, the red line to be pulled down) must be traded off (Trade off). Please note that step 206 can further optimize the placement of components through software functions such as sdc and floorplan to generate candidate circuit layouts.

以上係以分別對應多個區塊的雙態觸變率來進行該些區塊的排序,其中區塊被分配到的預留空間與其雙態觸變率成正比,亦即雙態觸變率可能較高的區域會分配到更大的DCAP區域。除此之外,本發明亦可考量區塊是否位於熱點(例如鄰近CPU、GPU、DDR等的位置)或鄰近於熱點,例如考量每一區塊與熱點之間的距離。 The above sequence of the blocks is based on the two-state thixotropic rate corresponding to multiple blocks, wherein the reserved space allocated to the block is proportional to its two-state thixotropic rate, that is, the two-state thixotropic rate Probably higher areas will be allocated to larger DCAP areas. In addition, the present invention can also consider whether the block is located at a hot spot (eg, adjacent to the CPU, GPU, DDR, etc.) or adjacent to the hot spot, such as the distance between each block and the hot spot.

為了儘可能利用多餘的電路空間來作為DCAP的用途,以及在兼顧DCAP之餘能夠不去佔用到重要的元件擺放空間,在步驟208中,本發明可另行以“DCAP區域不佔用所有區塊面積的1%~3%(例如2%)”來作為判斷條件,這是考量到若預留的DCAP空間太大,整體電路的效率將會受到影響。當判斷出預留空間超出總區塊面的預定值(或預定百分比)時,則流程必須回到步驟204、206以重新產生候選電路佈局。 In order to make use of the extra circuit space as possible for the purpose of DCAP, and in addition to taking into account DCAP, it can not occupy the important component placement space. In step 208, the present invention can additionally use the "DCAP area does not occupy all blocks "1%~3% of the area (eg 2%)" is used as the judgment condition. This is to consider that if the reserved DCAP space is too large, the efficiency of the overall circuit will be affected. When it is determined that the reserved space exceeds the predetermined value (or predetermined percentage) of the total block surface, the flow must return to steps 204 and 206 to regenerate the candidate circuit layout.

接著,步驟210繼續對候選電路佈局進行進一步檢視,倘若所決定出的對應區塊的DCAP空間大小能夠令整體的動態電壓衰減(dynamic IR drop)達到 預定目標,則以當前的電路佈局作為輸出最終佈局,其中預定目標可以是令電路佈局能夠正常工作的範圍,等本發明並不以為限。 Then, step 210 continues to further examine the candidate circuit layout, if the determined DCAP space of the corresponding block can make the overall dynamic voltage drop (dynamic IR drop) reach The predetermined target uses the current circuit layout as the final output layout, where the predetermined target may be a range that enables the circuit layout to work normally, etc. The present invention is not limited to this.

請參考第4圖,第4圖係為使用第2圖所示的架構所得到的電路佈局的示意圖,相較於第1圖,圈選的熱點位置具有充足的DCAP區域,且在整體佈局上並沒有未使用到的大片區域。 Please refer to Figure 4. Figure 4 is a schematic diagram of the circuit layout obtained by using the architecture shown in Figure 2. Compared with Figure 1, the circled hot spot location has sufficient DCAP area, and the overall layout There are no large unused areas.

請參考第5圖,第5圖係為根據本發明的一實施例的使用模擬軟體產生電路佈局的方法。請注意,假若可獲得實質上相同的結果,則這些步驟並不一定要遵照第5圖所示的執行次序來執行。第5圖的方法可簡單歸納如下:502:在一電路板上規劃出複數個區塊,其中每一區塊包含:一操作空間以及一預留空間;504:根據至少一特定條件來決定該些區塊中預留空間的大小;506:根據至少一判斷條件來決定是否需要修正所決定出的該些區塊中預留空間的大小,若是,流程回到步驟504;若否,流程進入步驟508;508:根據所決定出的該些區塊中預留空間的大小來產生電路佈局。 Please refer to FIG. 5, which is a method for generating a circuit layout using simulation software according to an embodiment of the present invention. Please note that if substantially the same results are obtained, these steps do not necessarily need to be executed in the order shown in Figure 5. The method in FIG. 5 can be simply summarized as follows: 502: Plan a plurality of blocks on a circuit board, where each block includes: an operation space and a reserved space; 504: determine this according to at least one specific condition The size of the reserved space in these blocks; 506: According to at least one judgment condition, it is determined whether the determined size of the reserved space in the blocks needs to be corrected. If so, the process returns to step 504; if not, the process enters Step 508; 508: Generate a circuit layout according to the determined size of the reserved space in the blocks.

由於熟習技藝者在閱讀完以上段落後應可輕易瞭解第5圖中每一步驟的細節,為簡潔之故,在此將省略進一步的描述。 The skilled person should be able to easily understand the details of each step in Figure 5 after reading the above paragraphs. For the sake of brevity, further description will be omitted here.

綜上所述,透過實施本發明的技術特徵,電路板上多餘的空間可得到妥善地利用。此外,由於本發明是透過軟體來依據雙態觸變率資料表產生對應的電路佈局,因此在產生速度上極為快速,且在空間利用上極為精確,不會 遺留大片無法利用到的區域,也不會犧牲到重要電路元件的擺放。 In summary, by implementing the technical features of the present invention, the extra space on the circuit board can be properly utilized. In addition, since the present invention uses software to generate the corresponding circuit layout based on the two-state thixotropy data table, it is extremely fast in generation speed and extremely accurate in space utilization, without Large areas that cannot be used are left without sacrificing the placement of important circuit components.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above are only the preferred embodiments of the present invention, and all changes and modifications made in accordance with the scope of the patent application of the present invention shall fall within the scope of the present invention.

502~508:步驟 502~508: steps

Claims (9)

一種使用模擬軟體產生電路佈局的方法,包含以下步驟:(A).在一電路板上規劃出複數個區塊,其中該些區塊中每一區塊包含:一操作空間以及一預留空間;(B).根據至少一特定條件來決定該些區塊中預留空間的大小;(C).根據至少一判斷條件來決定是否調整步驟(B)中所決定出的該些區塊中預留空間的大小;以及(D).當步驟(C)判斷不需要調整時,根據步驟(B)中所決定出的該些區塊中預留空間的大小來產生該電路佈局;其中該至少一特定條件包含:對應該些區塊的複數個雙態觸變率(toggle rate),且該至少一判斷條件包含:該些區塊中總預留空間是否超過一預定值。 A method for generating circuit layout using simulation software includes the following steps: (A). Plan a plurality of blocks on a circuit board, wherein each of the blocks includes: an operation space and a reserved space ; (B). Determine the size of the reserved space in the blocks according to at least one specific condition; (C). Determine whether to adjust the blocks determined in step (B) according to at least one judgment condition The size of the reserved space; and (D). When step (C) determines that no adjustment is required, the circuit layout is generated according to the size of the reserved space in the blocks determined in step (B); wherein the At least one specific condition includes: a plurality of toggle rates corresponding to the blocks, and the at least one judgment condition includes whether the total reserved space in the blocks exceeds a predetermined value. 一種使用模擬軟體產生電路佈局的方法,包含以下步驟:(A).在一電路板上規劃出複數個區塊,其中該些區塊中每一區塊包含:一操作空間以及一預留空間;(B).根據至少一特定條件來決定該些區塊中預留空間的大小;(C).根據至少一判斷條件來決定是否調整步驟(B)中所決定出的該些區塊中預留空間的大小;以及(D).當步驟(C)判斷不需要調整時,根據步驟(B)中所決定出的該些區塊中預留空間的大小來產生該電路佈局;其中該至少一特定條件包含:對應該些區塊的複數個雙態觸變率(toggle rate),且該至少一判斷條件包含:步驟(B)中所決定出的該些區塊中預留空間的大小是否令整體的動態電壓衰減是否達到預定目標。 A method for generating circuit layout using simulation software includes the following steps: (A). Plan a plurality of blocks on a circuit board, wherein each of the blocks includes: an operation space and a reserved space ; (B). Determine the size of the reserved space in the blocks according to at least one specific condition; (C). Determine whether to adjust the blocks determined in step (B) according to at least one judgment condition The size of the reserved space; and (D). When step (C) determines that no adjustment is required, the circuit layout is generated according to the size of the reserved space in the blocks determined in step (B); wherein the At least one specific condition includes: a plurality of toggle rates corresponding to the blocks, and the at least one judgment condition includes: the reserved space in the blocks determined in step (B) Whether the size makes the overall dynamic voltage attenuation reach the predetermined goal. 一種使用模擬軟體產生電路佈局的方法,包含以下步驟:(A).在一電路板上規劃出複數個區塊,其中該些區塊中每一區塊包含:一操作空間以及一預留空間;(B).根據至少一特定條件來決定該些區塊中預留空間的大小;(C).根據至少一判斷條件來決定是否調整步驟(B)中所決定出的該些區塊中預留空間的大小;以及(D).當步驟(C)判斷不需要調整時,根據步驟(B)中所決定出的該些區塊中預留空間的大小來產生該電路佈局;其中該至少一特定條件另包含:該些區塊是否位於熱點(hotspot),或該些區塊中每一區塊與熱點之間的距離,且該至少一判斷條件包含:該些區塊中總預留空間是否超過一預定值。 A method for generating circuit layout using simulation software includes the following steps: (A). Plan a plurality of blocks on a circuit board, wherein each of the blocks includes: an operation space and a reserved space ; (B). Determine the size of the reserved space in the blocks according to at least one specific condition; (C). Determine whether to adjust the blocks determined in step (B) according to at least one judgment condition The size of the reserved space; and (D). When step (C) determines that no adjustment is required, the circuit layout is generated according to the size of the reserved space in the blocks determined in step (B); wherein the At least one specific condition further includes: whether the blocks are located in hotspots, or the distance between each block in the blocks and the hotspot, and the at least one judgment condition includes: the total Whether the reserved space exceeds a predetermined value. 一種使用模擬軟體產生電路佈局的方法,包含以下步驟:(A).在一電路板上規劃出複數個區塊,其中該些區塊中每一區塊包含:一操作空間以及一預留空間;(B).根據至少一特定條件來決定該些區塊中預留空間的大小;(C).根據至少一判斷條件來決定是否調整步驟(B)中所決定出的該些區塊中預留空間的大小;以及(D).當步驟(C)判斷不需要調整時,根據步驟(B)中所決定出的該些區塊中預留空間的大小來產生該電路佈局;其中該至少一特定條件另包含:該些區塊是否位於熱點(hotspot),或該些區塊中每一區塊與熱點之間的距離,且該至少一判斷條件包含:步驟(B)中所決定出的該些區塊中預留空間的大小是否令整體的動態 電壓衰減是否達到預定目標。 A method for generating circuit layout using simulation software includes the following steps: (A). Plan a plurality of blocks on a circuit board, wherein each of the blocks includes: an operation space and a reserved space ; (B). Determine the size of the reserved space in the blocks according to at least one specific condition; (C). Determine whether to adjust the blocks determined in step (B) according to at least one judgment condition The size of the reserved space; and (D). When step (C) determines that no adjustment is required, the circuit layout is generated according to the size of the reserved space in the blocks determined in step (B); wherein the At least one specific condition further includes: whether the blocks are located in a hotspot, or the distance between each of the blocks and the hotspot, and the at least one judgment condition includes: the determination in step (B) Does the size of the reserved space in these blocks make the overall dynamic Whether the voltage attenuation has reached the predetermined target. 如請求項1~4所述的方法,其中當步驟(C)判斷需要調整時,跳至步驟(A)。 The method according to claims 1 to 4, wherein when it is determined in step (C) that adjustment is necessary, skip to step (A). 如請求項1~2所述的方法,其中步驟(B)另包含:根據對應該些區塊的該些雙態觸變率的大小來對該些區塊進行排序,其中區塊被分配到的預留空間與其雙態觸變率成正比。 The method according to claim 1 to 2, wherein step (B) further comprises: sorting the blocks according to the magnitude of the two-state thixotropy corresponding to the blocks, wherein the blocks are allocated to The reserved space is proportional to its two-state thixotropic rate. 如請求項1、3所述的方法,其中該預定值係為該些區塊的總面積的一預定百分比,且該預定百分比係為1%~3%。 The method of claim 1, wherein the predetermined value is a predetermined percentage of the total area of the blocks, and the predetermined percentage is 1%~3%. 如請求項2、4所述的方法,其中該預定目標係為該電路佈局能夠維持正常工作的狀態。 The method according to claim 2, wherein the predetermined target is a state where the circuit layout can maintain normal operation. 如請求項1~4所述的方法,其中該些區塊中的預留空間係用來設置電容。 The method according to claim 1 to 4, wherein the reserved space in the blocks is used to set a capacitor.
TW108113998A 2019-04-22 2019-04-22 Method of using simulation software to generate circuit layout TWI690026B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW108113998A TWI690026B (en) 2019-04-22 2019-04-22 Method of using simulation software to generate circuit layout
US16/667,925 US10860758B2 (en) 2019-04-22 2019-10-30 Method of using simulation software to generate circuit layout

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW108113998A TWI690026B (en) 2019-04-22 2019-04-22 Method of using simulation software to generate circuit layout

Publications (2)

Publication Number Publication Date
TWI690026B true TWI690026B (en) 2020-04-01
TW202040753A TW202040753A (en) 2020-11-01

Family

ID=71132533

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108113998A TWI690026B (en) 2019-04-22 2019-04-22 Method of using simulation software to generate circuit layout

Country Status (2)

Country Link
US (1) US10860758B2 (en)
TW (1) TWI690026B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101013697A (en) * 2003-11-04 2007-08-08 松下电器产业株式会社 Semiconductor integrated circuit and method of designing the same
TW201017456A (en) * 2008-09-09 2010-05-01 Nec Electronics Corp System and method for supporting layout design of semiconductor integrated circuit

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4303280B2 (en) * 2006-12-06 2009-07-29 Necエレクトロニクス株式会社 Semiconductor integrated circuit layout method and layout program
CN101661517B (en) * 2008-08-25 2012-02-15 扬智科技股份有限公司 Chip layout method
US8769476B2 (en) * 2012-05-04 2014-07-01 Taiwan Semiconductor Manufacturing Company, Ltd. Method of performing circuit simulation and generating circuit layout
US9064938B2 (en) * 2013-05-30 2015-06-23 Freescale Semiconductor, Inc. I/O cell ESD system
US9569583B2 (en) * 2014-04-07 2017-02-14 TallannQuest LLC Method and system for computer-aided design of radiation-hardened integrated circuits
US9552449B1 (en) * 2016-01-13 2017-01-24 International Business Machines Corporation Dynamic fault model generation for diagnostics simulation and pattern generation
US10109621B2 (en) * 2016-08-08 2018-10-23 Taiwan Semiconductor Manufacturing Company, Ltd. Low-capacitance electrostatic damage protection device and method of designing and making same
TWI664546B (en) * 2018-06-21 2019-07-01 瑞昱半導體股份有限公司 Clock tree synthesis method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101013697A (en) * 2003-11-04 2007-08-08 松下电器产业株式会社 Semiconductor integrated circuit and method of designing the same
TW201017456A (en) * 2008-09-09 2010-05-01 Nec Electronics Corp System and method for supporting layout design of semiconductor integrated circuit

Also Published As

Publication number Publication date
TW202040753A (en) 2020-11-01
US10860758B2 (en) 2020-12-08
US20200334339A1 (en) 2020-10-22

Similar Documents

Publication Publication Date Title
US6523159B2 (en) Method for adding decoupling capacitance during integrated circuit design
WO2009063450A2 (en) Optimized selection of memory units in multi-unit memory devices
US11514972B2 (en) Memory system, data processing system and method of operating the same
CN106990827A (en) Power budget allocation method and power budget allocation device
US12001283B2 (en) Energy efficient storage of error-correction-detection information
CN116167330B (en) Clock tree synthesis method, clock tree synthesis device, electronic equipment and computer readable storage medium
KR102687575B1 (en) Memory system and operation method thereof
JP2001358221A (en) Layout method, layout device, and recording medium
US7755951B2 (en) Data output apparatus, memory system, data output method, and data processing method
TWI690026B (en) Method of using simulation software to generate circuit layout
US20170207697A1 (en) Weighted voltage-capacitor clusters with cloud-charging for ultra-fast voltage scaling with no charge redistribution loss
CN111950222B (en) Method for generating circuit layout by using simulation software
US6148434A (en) Apparatus and method for minimizing the delay times in a semiconductor device
US11409346B2 (en) Control circuit and method for fast setting power mode
TWI815410B (en) Chip power consumption analyzer and analyzing method thereof
CN100483305C (en) System and method for power control of ASIC device
US6622196B1 (en) Method of controlling semiconductor memory device having memory areas with different capacities
US9230686B2 (en) Semiconductor device having roll call circuit
US12142340B2 (en) Testing system and testing method
US20240012974A1 (en) Integrated circuit and layout method thereof
TWI879477B (en) Electrostatic discharge protection device and electrostatic discharge protection method
CN118506822B (en) A processing method and circuit structure
US10283177B1 (en) Method and system for controller hold-margin of semiconductor memory device
US7557638B2 (en) Circuit for suppressing voltage jitter and method thereof
CN118036522A (en) Power integrity simulation system, power integrity simulation method and storage medium