TWI687887B - Micro pollution management system - Google Patents
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Abstract
本發明為一種微污染管理系統,包括至少一感測裝置設置在一空間中,以在一工作時間內,偵測空間中的複數微汙染數據,使感測裝置將複數微汙染數據傳遞中央處理裝置,使其判斷微汙染數據是否超過第一微汙染限定值,或擷取產品正常良率期間之微汙染數據中最大值,但小於第一微汙染限定值的數值成為一第二微汙染限制值,藉此判斷微汙染數據是否超過第二微汙染限制值,以分別產生第一警示訊號與第二警示訊號至顯示器中顯示。本發明可控管環境中微污染的數據,並輔以二維地理位置資訊顯示,以適時進行提醒並預測更換濾網後之表現值,且能主動學習修正微汙染限制值,令微污染的控管更加智慧化與效率化。The invention is a micro-pollution management system, including at least one sensing device arranged in a space to detect a plurality of micro-pollution data in the space within a working time, so that the sensing device transmits the plurality of micro-pollution data to central processing The device enables it to determine whether the micro-pollution data exceeds the first micro-pollution limit value, or to extract the maximum value of the micro-pollution data during the normal yield of the product, but a value less than the first micro-pollution limit value becomes a second micro-pollution limit Value to determine whether the micro-pollution data exceeds the second micro-pollution limit value to generate the first warning signal and the second warning signal to the display for display. The invention can control and control micro-pollution data in the environment, supplemented by two-dimensional geographic information display, timely remind and predict the performance value after replacing the filter, and can actively learn to modify the micro-pollution limit value, so that the micro-pollution Control is more intelligent and efficient.
Description
本發明係有關一種監測技術,特別是指擷取大量數據,以進行微污染數據控管之一種微污染管理系統。The invention relates to a monitoring technology, in particular to a micro-pollution management system for capturing large amounts of data for micro-pollution data control.
半導體問世之後,大幅改變了電子產品使用的形式,且半導體的發明使行動裝置、計算機等相關的電子產品變得更小、更輕巧以方便攜帶。且半導體的發明更被譽為與印刷機、電力、盤尼西林併列為四大重要發明之一。After the advent of semiconductors, the use of electronic products has changed dramatically, and the invention of semiconductors has made mobile devices, computers, and other related electronic products smaller, lighter, and easier to carry. Moreover, the invention of semiconductors has been hailed as one of the four important inventions in parallel with printing presses, electricity, and penicillin.
然而半導體屬極為精密的零件,任何一點的雜質都可能改變半導體的特性,因此半導體需在無塵室中進行製作,且隨著科技日益發展,半導體的體積可被製作的更小,目前的半導體的體積能逐漸縮小到5奈米(nm)以下,但相對來說,製作半導體之無塵室內的微污染限制條件也就的更加嚴苛。However, semiconductors are extremely precise parts, and impurities at any point may change the characteristics of semiconductors. Therefore, semiconductors need to be manufactured in clean rooms. With the development of technology, the volume of semiconductors can be made smaller. The current semiconductors The volume can be gradually reduced to below 5 nanometers (nm), but relatively speaking, the micro-pollution limit conditions for the production of semiconductor clean rooms are also more stringent.
無塵室內微污染可被分為微塵粒子(Particle)、氣體、以及靜電荷(Electric static charge)等微污染物,氣體又分為酸性氣體(Molecular Acids,MA)、鹼性氣體(Molecular Bases,MB)、可凝結氣體(Molecular Condensable,MC)以及雜質氣體(Molecular Dopants,MD)。上述的微污染物與半導體接觸時,都可能會產生物理反應或化學反應,進而影響到半導體製作的良率。Micro-pollution in a clean room can be divided into fine pollutants (Particle), gas, and electrostatic static charge (Electric static charge) and other micro-pollutants. The gas is further divided into acid gases (Molecular Acids, MA) and alkaline gases (Molecular Bases, MB), condensable gas (Molecular Condensable, MC) and impurity gas (Molecular Dopants, MD). When the above-mentioned micro-pollutants come into contact with semiconductors, physical or chemical reactions may occur, which in turn affect the yield of semiconductor manufacturing.
因此,若能即時監控無塵室中各種微污染的濃度,並有效針對微污染的數據進行分析,就能有效控管並掌握無塵室內微污染對半導體的影響,以提升半導體等電子產品的良率。雖目前有部分監控系統可對無塵室內的微污染數據進行監控,但現行的監控系統都僅使用單一的污染限制值進行污染數值的控管,無法自動學習不同區域中最佳的污染限制值,且目前的監控系統也不具有預測更換過濾材料後,該區域的空氣品質預測值。Therefore, if the concentration of various micro-pollution in the clean room can be monitored in real time, and the data of the micro-pollution can be effectively analyzed, the effect of the micro-pollution in the clean room on the semiconductor can be effectively controlled and mastered to improve the electronic products such as semiconductors Yield. Although there are currently some monitoring systems that can monitor the micro-pollution data in clean rooms, the current monitoring systems only use a single pollution limit value to control the pollution value, and cannot automatically learn the best pollution limit value in different areas. And, the current monitoring system also does not have the predicted value of air quality in the area after the replacement of filter materials.
有鑑於此,本發明遂針對上述習知技術之缺失,提出一種微污染管理系統,以有效克服上述之該等問題。In view of this, the present invention proposes a micro-pollution management system in order to effectively overcome the aforementioned problems in view of the above-mentioned lack of conventional technology.
本發明之主要目的在提供一種微污染管理系統,其可有效控管無塵室中的微污染數據,且本發明之系統除了在微污染數據超出最大的第一微污染限制值進行警示之外,更具有主動學習功能,能主動記憶在正常空氣範圍的區間中,最大值但小於第一微污染限制的微污染數據,並設定該微污染數據的值為第二微污染限制,當微污染數據超出第二微污染限制時,即可先進行警示。The main purpose of the present invention is to provide a micro-pollution management system that can effectively control micro-pollution data in a clean room, and the system of the present invention not only warns when the micro-pollution data exceeds the maximum first micro-pollution limit value , It also has an active learning function, which can actively memorize the micro pollution data in the normal air range, the maximum value is less than the first micro pollution limit, and set the value of the micro pollution data to the second micro pollution limit, when the micro pollution When the data exceeds the second micro-pollution limit, you can be alerted first.
本發明之另一目的在提供一種微污染管理系統,其可產生微污染設數據的濃度分布圖,提供管理者明顯得知產生微污染問題之位置,以進行對應的處理。Another object of the present invention is to provide a micro-pollution management system, which can generate a concentration distribution map of micro-pollution design data, and provide managers with a clear knowledge of the location of micro-pollution problems for corresponding processing.
本發明之再一目的在提供一種微污染管理系統,其可記錄設置濾網的位置,及預測更換新的濾網後,環境中可能產生的微污染數據,有利管理者進行微污染的控管。Another object of the present invention is to provide a micro-pollution management system that can record the location of the filter and predict the micro-pollution data that may be generated in the environment after the new filter is replaced, which is beneficial for the administrator to control the micro-pollution .
為達上述之目的,本發明係提供一種微污染管理系統,其包括至少一感測裝置設置在一空間中,感測裝置中具有對應的一身份資訊,且感測裝置可在一工作時間內,偵測空間之環境以產生複數微汙染數據,令感測裝置一併將身份資訊以及複數微汙染數據傳遞至一中央處理裝置中,中央處理裝置連接感測裝置,且中央處理裝置內設有一第一微汙染限定值,當微汙染數據超過第一微汙染限定值時,則產生一第一警示訊號,同時中央處理裝置可擷取微汙染數據中最大值,但小於第一微汙染限定值的數值成為一第二微汙染限制值,當微汙染數據超過第二微汙染限制值時,則產生一第二警示訊號,以及一顯示裝置連接中央處理裝置,以接收並顯示第二警示訊號與第一警示訊號。To achieve the above purpose, the present invention provides a micro-pollution management system, which includes at least one sensing device disposed in a space, the sensing device has corresponding identity information, and the sensing device can be in a working time , To detect the environment of the space to generate a plurality of micro-polluted data, so that the sensing device transmits the identity information and the plurality of micro-polluted data to a central processing device, the central processing device is connected to the sensing device, and the central processing device is provided with a The first micro-pollution limit value, when the micro-pollution data exceeds the first micro-pollution limit value, a first warning signal is generated, and the central processing device can retrieve the maximum value in the micro-pollution data, but less than the first micro-pollution limit value The value of becomes a second micro-pollution limit value. When the micro-pollution data exceeds the second micro-pollution limit value, a second warning signal is generated, and a display device is connected to the central processing device to receive and display the second warning signal and The first warning signal.
微汙染數據更包括一微塵粒子濃度數據、一氣體濃度數據及一靜電荷濃度數據。感測裝置則包括一微塵粒子感測器、至少一氣體感測器以及一靜電荷感測器,以分別產生微塵粒子濃度數據、氣體濃度數據及靜電荷濃度數據。The micro pollution data further includes a micro dust particle concentration data, a gas concentration data and an electrostatic charge concentration data. The sensing device includes a fine dust particle sensor, at least one gas sensor, and an electrostatic charge sensor to generate fine dust particle concentration data, gas concentration data, and static charge concentration data, respectively.
氣體濃度數據更包括一酸性氣體濃度數據、一鹼性氣體濃度數據及一有機氣體濃度數據、一雜質氣體濃度數據。氣體感測器則包括一酸性氣體(Molecular Acid,MA)感測器、鹼性氣體(Molecular Base,MB)感測器、有機氣體(Molecular Condensable,MC)感測器及雜質氣體(Molecular Dopant,MD)感測器,以分別產生該酸性氣體濃度數據、該鹼性氣體濃度數據、該有機氣體濃度數據及該雜質氣體濃度數據。The gas concentration data further includes an acid gas concentration data, an alkaline gas concentration data, an organic gas concentration data, and an impurity gas concentration data. The gas sensor includes a sour gas (Molecular Acid, MA) sensor, alkaline gas (Molecular Base, MB) sensor, organic gas (Molecular Condensable, MC) sensor and impurity gas (Molecular Dopant, MD) sensors to generate the acid gas concentration data, the alkaline gas concentration data, the organic gas concentration data, and the impurity gas concentration data, respectively.
感測裝置更可為複數感測裝置,複數感測裝置分布設置在空間中,且中央處理裝置中存有對應每一感測裝置的身分資訊及其對應的第二微汙染限制值,以及每一感測裝置位於空間中的位置資訊。The sensing device may be a plurality of sensing devices. The plurality of sensing devices are distributed in the space, and the central processing device stores identity information corresponding to each sensing device and its corresponding second micro-pollution limit value, and each A location information of the sensing device in the space.
中央處理裝置更包括一微汙染濃度顯示模組,其根據每一感測裝置之位置資訊及對應微汙染數據產生一濃度分布圖,並傳遞至顯示裝置顯示,濃度分布圖係將微汙染數據之數值由高至低區分出不同區間,且每一區間以不同圖層顯示。The central processing device further includes a micro pollution concentration display module, which generates a concentration distribution map based on the position information of each sensing device and corresponding micro pollution data, and transmits it to the display device for display. The values are divided into different intervals from high to low, and each interval is displayed on a different layer.
底下藉由具體實施例詳加說明,當更容易瞭解本發明之目的、技術內容、特點及其所達成之功效。The detailed description will be given below through specific embodiments, so that it is easier to understand the purpose, technical content, characteristics and achieved effects of the present invention.
本發明提供一種可有效控管無塵室中的微污染數據之微污染管理系統,其內本身存有最大的第一微污染限制,令微污染數據超出第一微污染限制時進行警示,同時本發明更可主動記憶一在正常空氣範圍區間中,最大值但小於第一微污染限制的微污染數據,並設定該微污染數據的值為第二微污染限制,當微污染數據先超出第二微污染限制時,即可進行警示。The present invention provides a micro-pollution management system that can effectively control micro-pollution data in a clean room. It has the largest first micro-pollution limit in itself, so that when the micro-pollution data exceeds the first micro-pollution limit, a warning will be given. The invention can also actively memorize the micro-pollution data with the maximum value in the normal air range but less than the first micro-pollution limit, and set the value of the micro-pollution data as the second micro-pollution limit. When the second micro-pollution is restricted, a warning can be issued.
接下來請參照第一圖,以說明本發明如何達到上述之功效,如圖所示,其係為微污染管理系統1之架構,微污染管理系統1包括至少一感測裝置10信號連接一中央處理裝置20,以及一顯示裝置30信號連接中央處理裝置20。本實施例舉例具有複數個感測裝置10信號連接一中央處理裝置20,且複數感測裝置10可分布設置在一空間中,本實施例舉例複數感測裝置10分布在一無塵室中,每一感測裝置10中皆具有對應的一身份資訊,且每一感測裝置10可在一工作時間內,偵測空間之環境以產生複數微汙染數據,令每一感測裝置10可一併將身份資訊及微汙染數據傳遞至中央處理裝置20中,使中央處理裝置20儲存每一感測裝置10的複數微污染數據,並可根據複數微污染數據進行控管。Next, please refer to the first figure to illustrate how the present invention achieves the above-mentioned effects. As shown in the figure, it is the architecture of the
每一感測裝置10皆包括有一微塵粒子感測器12、至少一氣體感測器14以及一靜電荷感測器16,微塵粒子感測器12產生微污染數據中的微塵粒子濃度數據,氣體感測器14產生微污染數據中的氣體濃度數據及靜電荷感測器16產生微污染數據中的靜電荷濃度數據汙染數據,且感測裝置10之氣體感測器14中更包括一酸性氣體(Molecular Acid,MA)感測器142、一鹼性氣體(Molecular Base,MB)感測器144、一有機氣體(Molecular Condensable,MC)感測器146及一雜質氣體(Molecular Dopant,MD)感測器148,以分別產生氣體濃度數據中的酸性氣體濃度數據、鹼性氣體濃度數據、有機氣體濃度數據及雜質氣體濃度數據。每一感測裝置10中更包括一傳輸裝置18,傳輸裝置18可將包括有微塵粒子濃度數據、氣體濃度數據及靜電荷濃度數據的複數微汙染數據,傳遞至中央處理裝置20中儲存以進行控管。Each
請持續參照第一圖,並同時配合參照第二圖至第五圖,中央處理裝置20可為電腦主機,中央處理裝置20內設有微汙染濃度顯示模組22、濾網位置顯示模組24以及更新濾網微污染預測模組26,且中央處理裝置20中紀錄有每一台感測裝置10的身分資訊,及其對應的位置資訊。請參照第一圖與第二圖,中央處理裝置20接收每一台感測裝置10的身分資訊及複數微汙染數據,並根據身分資訊判斷出每一台感測裝置10的位置,使微汙染濃度顯示模組22可根據身分資訊在對應的位置顯示出複數微汙染數據,以產生一濃度分布圖,並傳遞至顯示裝置30中顯示,其中顯示裝置30可為螢幕。Please continue to refer to the first figure, and at the same time refer to the second to fifth figures. The
除此之外,中央處理裝置20內設有一第一微汙染限定值,當微汙染數據超過第一微汙染限定值時,則產生一第一警示訊號;同時中央處理裝置20亦可擷取微汙染數據中最大值,但小於第一微汙染限定值的數值成為一第二微汙染限制值,當感測裝置10所傳遞的微汙染數據超過第二微汙染限制值時,則產生一第二警示訊號。舉例來說,本實施例舉例第一污染限定值的數值為5,當微污染數據超過5時,會發出第一警示訊號,但有時候部分特定區域的微污染數據不一定都會到達5,部分特定區域的微污染數據可能只會在一定範圍值內,如經長期空氣汙染的紀錄發現,微污染數據只會在1~3之間浮動,此時即可定義最大值3為第二微污染限制值,此時,雖微污染數據並未超過5,但微污染數據只超過3時就發出第二警示訊號。雖然無塵室內的微汙染數據只要維持低於第一微汙染限定值就屬於在正常空氣範圍內,也就是只要維持低於第一微汙染限定值,無塵室中所製造出產品就維持正常的良率,但本發明使用自動學習判斷出在正常空氣範圍內的第二微污染限制值,能使無塵室內的空氣更加穩定,使產品的良率能更加被提升。In addition, the
請配合參照第一圖與第三圖,其中顯示裝置30顯示第一警示訊號與第二警示訊號的方式,可以聲音或影像的方式呈現,本實施例舉例第一警示訊號與第二警示訊號係以影像的顯示方式,其中第一警示訊號與第二警示訊號的顯示方式相同,僅以第一警示訊號作為實施例說明。請參照第三圖,第一警示訊號顯示的方式係將超出第一微污染限制值的感測裝置10之位置以明顯框表示。Please refer to the first picture and the third picture together, in which the
接下來請配合參照第一圖與第四圖,值得注意的是,每一個感測裝置10係根據本身所偵測到的微污染數據範圍產生出第二微污染限制值,因此每一感測裝置10的第二微污染限制值也會有所不同,故中央處理裝置20可令微污染濃度顯示模組22根據每一感測裝置10之位置資訊,對應微汙染數據及第二汙染限制值產生一相對濃度分布圖,並傳遞至顯示裝置30顯示。相對濃度分布圖可將每一感測裝置10內對應的第二微汙染限制值設為最大值,以將第二微汙染限制值以下的複數微汙染數據之數值,由高至低區分出不同區間,每一區間則不同圖層顯示。舉例來說,如第四圖所示,位置A之感測裝置10的第二污染限制值為3,位置B之感測裝置10的第二污染限制值為2,因此位置A的感測裝置10則將數值3調整成密度最濃的圖層,3~0之間的區間的圖層濃度則逐漸變淡;位置B的感測裝置10則將數值2調整成密度最濃的圖層,2~0之間的區間的圖層濃度則逐漸變淡。Next, please refer to the first and fourth figures together. It is worth noting that each
請持續參照第一圖,中央處理裝置20之濾網位置顯示模組24,則係用以記錄無塵室的空間中設置複數濾網的位置,並據其產生一濾網位置分布圖,以傳遞至顯示裝置30顯示。請參照第一圖與第五圖,中央處理裝置20之更新濾網微汙染預測模組24則是用以預測更新濾網後,空間中的微汙染數據,以產生一微汙染預測分布圖,並傳遞至顯示裝置30顯示。如第五圖所示,微汙染預測分布圖可預測更新濾網後的微污染數據,令管理者判斷更新濾網後是否仍有超出微污染限制值的位置。Please continue to refer to the first figure, the filter
上述之濃度分布圖皆以微污染數據中氣體濃度數據的酸性氣體濃度數據進行舉例說明,當然微污染數據中的微塵粒子濃度數據、氣體濃度數據、靜電荷濃度數據汙染數據、鹼性氣體濃度數據、有機氣體濃度數據及雜質氣體濃度數據皆可分別以濃度分布圖顯示,但顯示方式皆與上述實施例相同,故不重複敘述。The above concentration distribution diagrams are all exemplified by the acid gas concentration data of the gas concentration data in the micro pollution data. Of course, the micro dust particle concentration data, gas concentration data, electrostatic charge concentration data pollution data, and alkaline gas concentration data in the micro pollution data , The concentration data of the organic gas and the concentration data of the impurity gas can be displayed in a concentration distribution diagram, but the display mode is the same as the above embodiment, so the description will not be repeated.
綜上所述,本發明可有效控管無塵室中的微污染數據,除了在微污染數據超出最大的第一微污染限制值進行警示之外,更具有主動學習功能,本發明能主動記憶正常空氣範圍區間中,最大值但小於第一微污染限制的微污染數據,並設定該微污染數據的值為第二微污染限制,當微污染數據超出第二微污染限制時先進行警示,且本發明之中央處理裝置可產生微污染設數據的濃度分布圖,提供管理者明顯得知產生微污染問題之位置,以進行對應的處理,同時可記錄設置濾網的位置,及預測更換新的濾網後,環境中可能產生的微污染數據,有利管理者進行微污染的控管。In summary, the present invention can effectively control the micro-pollution data in the clean room. In addition to warning when the micro-pollution data exceeds the maximum first micro-pollution limit value, it also has an active learning function, and the present invention can actively memorize In the normal air range, the maximum pollution data is less than the first micro-pollution limit, and the value of the micro-pollution data is set to the second micro-pollution limit. When the micro-pollution data exceeds the second micro-pollution limit, a warning will be given first. Moreover, the central processing device of the present invention can generate the concentration distribution map of the micro-pollution equipment data, providing the administrator with a clear knowledge of the location of the micro-pollution problem for corresponding processing, and at the same time can record the location of the filter screen and predict the replacement of the new After the filter, the micro-pollution data that may be generated in the environment is beneficial to managers to control micro-pollution.
唯以上所述者,僅為本發明之較佳實施例而已,並非用來限定本發明實施之範圍。故即凡依本發明申請範圍所述之特徵及精神所為之均等變化或修飾,均應包括於本發明之申請專利範圍內。The above are only preferred embodiments of the present invention and are not intended to limit the scope of the present invention. Therefore, any changes or modifications based on the features and spirit described in the application scope of the present invention should be included in the patent application scope of the present invention.
1:微污染管理系統1: Micro pollution management system
10:感測裝置10: Sensing device
12:微塵粒子感測器12: Fine dust particle sensor
14:氣體感測器14: Gas sensor
142:酸性氣體感測器142: Acid gas sensor
144:鹼性氣體感測器144: alkaline gas sensor
146:有機氣體感測器146: Organic gas sensor
148:雜質氣體感測器148: Impurity gas sensor
16:靜電荷感測器16: Static charge sensor
18:傳輸裝置18: Transmission device
20:中央處理裝置20: central processing unit
22:微污染濃度顯示模組22: Micro pollution concentration display module
24:濾網位置顯示模組24: Filter position display module
26:更新濾網微污染預測模組26: Update filter micro-pollution prediction module
30:顯示裝置30: display device
第一圖係為本發明實施例之系統方塊圖。 第二圖係為本發明實施例之濃度分布圖。 第三圖係為本發明實施例之濃度分布圖警示狀態示意圖。 第四圖係為本發明實施例之相對濃度分布圖。 第五圖係為本發明實施例之微污染預測分布圖。The first figure is a system block diagram of an embodiment of the present invention. The second graph is a concentration distribution diagram of an embodiment of the present invention. The third diagram is a schematic diagram of the warning state of the concentration distribution diagram of the embodiment of the present invention. The fourth graph is a relative concentration distribution diagram of an embodiment of the present invention. The fifth diagram is a micro-pollution prediction distribution diagram according to an embodiment of the present invention.
1:微污染管理系統 1: Micro pollution management system
10:感測裝置 10: Sensing device
12:微塵粒子感測器 12: Fine dust particle sensor
14:氣體感測器 14: Gas sensor
142:酸性氣體感測器 142: Acid gas sensor
144:鹼性氣體感測器 144: alkaline gas sensor
146:有機氣體感測器 146: Organic gas sensor
148:雜質氣體感測器 148: Impurity gas sensor
16:靜電荷感測器 16: Static charge sensor
18:傳輸裝置 18: Transmission device
20:中央處理裝置 20: central processing unit
22:微污染濃度顯示模組 22: Micro pollution concentration display module
24:濾網位置顯示模組 24: Filter position display module
26:更新濾網微污染預測模組 26: Update filter micro-pollution prediction module
30:顯示裝置 30: display device
Claims (9)
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| TW107143992A TWI687887B (en) | 2018-12-06 | 2018-12-06 | Micro pollution management system |
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