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TWI560714B - Resistance random access memory - Google Patents

Resistance random access memory

Info

Publication number
TWI560714B
TWI560714B TW103145154A TW103145154A TWI560714B TW I560714 B TWI560714 B TW I560714B TW 103145154 A TW103145154 A TW 103145154A TW 103145154 A TW103145154 A TW 103145154A TW I560714 B TWI560714 B TW I560714B
Authority
TW
Taiwan
Prior art keywords
random access
access memory
resistance random
resistance
memory
Prior art date
Application number
TW103145154A
Other languages
Chinese (zh)
Other versions
TW201624485A (en
Inventor
Myung Chan Mickey Choi
Original Assignee
Winbond Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Winbond Electronics Corp filed Critical Winbond Electronics Corp
Priority to TW103145154A priority Critical patent/TWI560714B/en
Publication of TW201624485A publication Critical patent/TW201624485A/en
Application granted granted Critical
Publication of TWI560714B publication Critical patent/TWI560714B/en

Links

TW103145154A 2014-12-24 2014-12-24 Resistance random access memory TWI560714B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103145154A TWI560714B (en) 2014-12-24 2014-12-24 Resistance random access memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103145154A TWI560714B (en) 2014-12-24 2014-12-24 Resistance random access memory

Publications (2)

Publication Number Publication Date
TW201624485A TW201624485A (en) 2016-07-01
TWI560714B true TWI560714B (en) 2016-12-01

Family

ID=56984819

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103145154A TWI560714B (en) 2014-12-24 2014-12-24 Resistance random access memory

Country Status (1)

Country Link
TW (1) TWI560714B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI832182B (en) * 2021-08-12 2024-02-11 台灣積體電路製造股份有限公司 Physically unclonable function device, semiconductor device, and operating method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6714464B2 (en) * 2002-06-26 2004-03-30 Silicon Graphics, Inc. System and method for a self-calibrating sense-amplifier strobe
TW201135731A (en) * 2010-02-18 2011-10-16 Sandisk 3D Llc Step soft program for reversible resistivity-switching elements
US20120300532A1 (en) * 2011-05-24 2012-11-29 Shinobu Yamazaki Method of forming process for variable resistive element and non-volatile semiconductor memory device
TWI430273B (en) * 2009-03-12 2014-03-11 Toshiba Kk Nonvolatile semiconductor memory device and method for resetting it
US20140071770A1 (en) * 2012-09-13 2014-03-13 Winbond Electronics Corp. Burst Sequence Control And Multi-Valued Fuse Scheme In Memory Device
TW201417102A (en) * 2012-10-23 2014-05-01 Ind Tech Res Inst Resistive random-access memory devices
TWI445004B (en) * 2009-03-12 2014-07-11 Toshiba Kk Semiconductor memory device
TWI451419B (en) * 2008-07-30 2014-09-01 Toshiba Kk Semiconductor memory device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6714464B2 (en) * 2002-06-26 2004-03-30 Silicon Graphics, Inc. System and method for a self-calibrating sense-amplifier strobe
TWI451419B (en) * 2008-07-30 2014-09-01 Toshiba Kk Semiconductor memory device
TWI430273B (en) * 2009-03-12 2014-03-11 Toshiba Kk Nonvolatile semiconductor memory device and method for resetting it
TWI445004B (en) * 2009-03-12 2014-07-11 Toshiba Kk Semiconductor memory device
TW201135731A (en) * 2010-02-18 2011-10-16 Sandisk 3D Llc Step soft program for reversible resistivity-switching elements
US20120300532A1 (en) * 2011-05-24 2012-11-29 Shinobu Yamazaki Method of forming process for variable resistive element and non-volatile semiconductor memory device
US20140071770A1 (en) * 2012-09-13 2014-03-13 Winbond Electronics Corp. Burst Sequence Control And Multi-Valued Fuse Scheme In Memory Device
TW201417102A (en) * 2012-10-23 2014-05-01 Ind Tech Res Inst Resistive random-access memory devices

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI832182B (en) * 2021-08-12 2024-02-11 台灣積體電路製造股份有限公司 Physically unclonable function device, semiconductor device, and operating method
US12249371B2 (en) 2021-08-12 2025-03-11 Taiwan Semiconductor Manufacturing Company, Ltd. Reconfigurable in-memory physically unclonable function

Also Published As

Publication number Publication date
TW201624485A (en) 2016-07-01

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