TWI408381B - - Google Patents
Info
- Publication number
- TWI408381B TWI408381B TW99134236A TW99134236A TWI408381B TW I408381 B TWI408381 B TW I408381B TW 99134236 A TW99134236 A TW 99134236A TW 99134236 A TW99134236 A TW 99134236A TW I408381 B TWI408381 B TW I408381B
- Authority
- TW
- Taiwan
- Prior art keywords
- electronic product
- carrier
- target region
- predetermined lights
- carries
- Prior art date
Links
- 238000010187 selection method Methods 0.000 abstract 1
Landscapes
- Geophysics And Detection Of Objects (AREA)
- Packaging Frangible Articles (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99134236A TW201215899A (en) | 2010-10-07 | 2010-10-07 | Selection method for electronic product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99134236A TW201215899A (en) | 2010-10-07 | 2010-10-07 | Selection method for electronic product |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201215899A TW201215899A (en) | 2012-04-16 |
| TWI408381B true TWI408381B (zh) | 2013-09-11 |
Family
ID=46787000
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW99134236A TW201215899A (en) | 2010-10-07 | 2010-10-07 | Selection method for electronic product |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201215899A (zh) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI494560B (zh) * | 2013-11-12 | 2015-08-01 | Mpi Corp | 晶粒選擇方法及壞晶地圖產生方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6476629B1 (en) * | 2000-02-23 | 2002-11-05 | Micron Technology, Inc. | In-tray burn-in board for testing integrated circuit devices in situ on processing trays |
| TWI247898B (en) * | 2000-11-21 | 2006-01-21 | Phoenix Prec Technology Corp | Device and method for labeling grade of IC substrate |
| US20060166380A1 (en) * | 2005-01-26 | 2006-07-27 | Youngtek Electronics Corporation | Method of integration testing for packaged electronic components |
| TW200819366A (en) * | 2006-10-20 | 2008-05-01 | Stack Devices Corp | Method for using shipping tray for electronic products |
| TW200905213A (en) * | 2007-04-12 | 2009-02-01 | Chroma Ate Inc | Method for testing micro SD devices |
-
2010
- 2010-10-07 TW TW99134236A patent/TW201215899A/zh not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6476629B1 (en) * | 2000-02-23 | 2002-11-05 | Micron Technology, Inc. | In-tray burn-in board for testing integrated circuit devices in situ on processing trays |
| TWI247898B (en) * | 2000-11-21 | 2006-01-21 | Phoenix Prec Technology Corp | Device and method for labeling grade of IC substrate |
| US20060166380A1 (en) * | 2005-01-26 | 2006-07-27 | Youngtek Electronics Corporation | Method of integration testing for packaged electronic components |
| TW200819366A (en) * | 2006-10-20 | 2008-05-01 | Stack Devices Corp | Method for using shipping tray for electronic products |
| TW200905213A (en) * | 2007-04-12 | 2009-02-01 | Chroma Ate Inc | Method for testing micro SD devices |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201215899A (en) | 2012-04-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |